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ATE388482T1 - Örtliche erwärmung und kühlung von substraten - Google Patents

Örtliche erwärmung und kühlung von substraten

Info

Publication number
ATE388482T1
ATE388482T1 AT01912062T AT01912062T ATE388482T1 AT E388482 T1 ATE388482 T1 AT E388482T1 AT 01912062 T AT01912062 T AT 01912062T AT 01912062 T AT01912062 T AT 01912062T AT E388482 T1 ATE388482 T1 AT E388482T1
Authority
AT
Austria
Prior art keywords
cooling
gas
wafer
substrates
local heating
Prior art date
Application number
AT01912062T
Other languages
English (en)
Inventor
Andreas Tillman
Dieter Zernickel
Sohaila Shooshtarian
Narasimha Acharya
Mike Elbert
Original Assignee
Mattson Thermal Products Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mattson Thermal Products Inc filed Critical Mattson Thermal Products Inc
Application granted granted Critical
Publication of ATE388482T1 publication Critical patent/ATE388482T1/de

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/324Thermal treatment for modifying the properties of semiconductor bodies, e.g. annealing, sintering
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67098Apparatus for thermal treatment
    • H01L21/67109Apparatus for thermal treatment mainly by convection

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Chemical Vapour Deposition (AREA)
  • Formation Of Insulating Films (AREA)
  • Non-Reversible Transmitting Devices (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
AT01912062T 2000-03-17 2001-03-15 Örtliche erwärmung und kühlung von substraten ATE388482T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US09/527,873 US7037797B1 (en) 2000-03-17 2000-03-17 Localized heating and cooling of substrates

Publications (1)

Publication Number Publication Date
ATE388482T1 true ATE388482T1 (de) 2008-03-15

Family

ID=24103294

Family Applications (1)

Application Number Title Priority Date Filing Date
AT01912062T ATE388482T1 (de) 2000-03-17 2001-03-15 Örtliche erwärmung und kühlung von substraten

Country Status (8)

Country Link
US (1) US7037797B1 (de)
EP (1) EP1264333B1 (de)
JP (1) JP5511115B2 (de)
KR (1) KR100784580B1 (de)
AT (1) ATE388482T1 (de)
DE (1) DE60133092T2 (de)
TW (1) TW495813B (de)
WO (1) WO2001069656A2 (de)

Families Citing this family (63)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6380751B2 (en) 1992-06-11 2002-04-30 Cascade Microtech, Inc. Wafer probe station having environment control enclosure
US5345170A (en) 1992-06-11 1994-09-06 Cascade Microtech, Inc. Wafer probe station having integrated guarding, Kelvin connection and shielding systems
US6232789B1 (en) 1997-05-28 2001-05-15 Cascade Microtech, Inc. Probe holder for low current measurements
US5561377A (en) 1995-04-14 1996-10-01 Cascade Microtech, Inc. System for evaluating probing networks
US5914613A (en) 1996-08-08 1999-06-22 Cascade Microtech, Inc. Membrane probing system with local contact scrub
US6002263A (en) 1997-06-06 1999-12-14 Cascade Microtech, Inc. Probe station having inner and outer shielding
US6578264B1 (en) 1999-06-04 2003-06-17 Cascade Microtech, Inc. Method for constructing a membrane probe using a depression
US6445202B1 (en) 1999-06-30 2002-09-03 Cascade Microtech, Inc. Probe station thermal chuck with shielding for capacitive current
US6838890B2 (en) 2000-02-25 2005-01-04 Cascade Microtech, Inc. Membrane probing system
US6965226B2 (en) 2000-09-05 2005-11-15 Cascade Microtech, Inc. Chuck for holding a device under test
US6914423B2 (en) 2000-09-05 2005-07-05 Cascade Microtech, Inc. Probe station
DE10143173A1 (de) 2000-12-04 2002-06-06 Cascade Microtech Inc Wafersonde
AU2002327490A1 (en) 2001-08-21 2003-06-30 Cascade Microtech, Inc. Membrane probing system
WO2003020467A1 (en) 2001-08-31 2003-03-13 Cascade Microtech, Inc. Optical testing device
US6777964B2 (en) 2002-01-25 2004-08-17 Cascade Microtech, Inc. Probe station
JP2003307458A (ja) * 2002-04-15 2003-10-31 Akifumi Ito 基材の温度測定方法および温度測定装置
US6843201B2 (en) 2002-05-08 2005-01-18 Asm International Nv Temperature control for single substrate semiconductor processing reactor
US7427329B2 (en) 2002-05-08 2008-09-23 Asm International N.V. Temperature control for single substrate semiconductor processing reactor
AU2003233659A1 (en) 2002-05-23 2003-12-12 Cascade Microtech, Inc. Probe for testing a device under test
FR2846786B1 (fr) * 2002-11-05 2005-06-17 Procede de recuit thermique rapide de tranches a couronne
US6847219B1 (en) 2002-11-08 2005-01-25 Cascade Microtech, Inc. Probe station with low noise characteristics
US6724205B1 (en) 2002-11-13 2004-04-20 Cascade Microtech, Inc. Probe for combined signals
US7250779B2 (en) 2002-11-25 2007-07-31 Cascade Microtech, Inc. Probe station with low inductance path
US6861856B2 (en) 2002-12-13 2005-03-01 Cascade Microtech, Inc. Guarded tub enclosure
JP4264084B2 (ja) * 2003-03-03 2009-05-13 株式会社日立国際電気 基板処理装置および半導体装置の製造方法
JP3910151B2 (ja) * 2003-04-01 2007-04-25 東京エレクトロン株式会社 熱処理方法及び熱処理装置
US7221172B2 (en) 2003-05-06 2007-05-22 Cascade Microtech, Inc. Switched suspended conductor and connection
US7057404B2 (en) 2003-05-23 2006-06-06 Sharp Laboratories Of America, Inc. Shielded probe for testing a device under test
US7492172B2 (en) 2003-05-23 2009-02-17 Cascade Microtech, Inc. Chuck for holding a device under test
US7250626B2 (en) 2003-10-22 2007-07-31 Cascade Microtech, Inc. Probe testing structure
US7187188B2 (en) 2003-12-24 2007-03-06 Cascade Microtech, Inc. Chuck with integrated wafer support
DE202005021434U1 (de) 2004-06-07 2008-03-20 Cascade Microtech, Inc., Beaverton Thermooptische Einspannvorrichtung
US7330041B2 (en) 2004-06-14 2008-02-12 Cascade Microtech, Inc. Localizing a temperature of a device for testing
US20060286807A1 (en) * 2005-06-16 2006-12-21 Jack Hwang Use of active temperature control to provide emmisivity independent wafer temperature
TWI366234B (en) * 2004-06-30 2012-06-11 Intel Corp Method, apparatus and system to control temperature of a wafer edge or wafer edge support during heating, and machine-readable medium having data therein
US20060004493A1 (en) * 2004-06-30 2006-01-05 Jack Hwang Use of active temperature control to provide emmisivity independent wafer temperature
US7368927B2 (en) 2004-07-07 2008-05-06 Cascade Microtech, Inc. Probe head having a membrane suspended probe
DE202005021435U1 (de) 2004-09-13 2008-02-28 Cascade Microtech, Inc., Beaverton Doppelseitige Prüfaufbauten
US7535247B2 (en) 2005-01-31 2009-05-19 Cascade Microtech, Inc. Interface for testing semiconductors
DE102005013831B4 (de) * 2005-03-24 2008-10-16 Siltronic Ag Siliciumscheibe und Verfahren zur thermischen Behandlung einer Siliciumscheibe
US7745762B2 (en) 2005-06-01 2010-06-29 Mattson Technology, Inc. Optimizing the thermal budget during a pulsed heating process
US7449899B2 (en) 2005-06-08 2008-11-11 Cascade Microtech, Inc. Probe for high frequency signals
EP1932003A2 (de) 2005-06-13 2008-06-18 Cascade Microtech, Inc. Breitbandige aktiv-passiv-differenzsignalsonde
WO2007146285A2 (en) 2006-06-09 2007-12-21 Cascade Microtech, Inc. Differential signal probe with integral balun
US7443186B2 (en) 2006-06-12 2008-10-28 Cascade Microtech, Inc. On-wafer test structures for differential signals
US7403028B2 (en) 2006-06-12 2008-07-22 Cascade Microtech, Inc. Test structure and probe for differential signals
JP4870604B2 (ja) * 2007-03-29 2012-02-08 株式会社ニューフレアテクノロジー 気相成長装置
KR100870567B1 (ko) * 2007-06-27 2008-11-27 삼성전자주식회사 플라즈마를 이용한 이온 도핑 방법 및 플라즈마 이온 도핑장치
JP5456257B2 (ja) * 2008-01-08 2014-03-26 大日本スクリーン製造株式会社 熱処理装置
US8410806B2 (en) 2008-11-21 2013-04-02 Cascade Microtech, Inc. Replaceable coupon for a probing apparatus
US8490419B2 (en) * 2009-08-20 2013-07-23 United States Thermoelectric Consortium Interlocked jets cooling method and apparatus
US20110155058A1 (en) * 2009-12-18 2011-06-30 Applied Materials, Inc. Substrate processing apparatus having a radiant cavity
JP5982758B2 (ja) * 2011-02-23 2016-08-31 東京エレクトロン株式会社 マイクロ波照射装置
US20120225203A1 (en) * 2011-03-01 2012-09-06 Applied Materials, Inc. Apparatus and Process for Atomic Layer Deposition
DE102012101923B4 (de) * 2012-03-07 2019-11-07 Osram Opto Semiconductors Gmbh Substratträgeranordnung, Beschichtungsanlage mit Substratträgeranordnung und Verfahren zur Durchführung eines Beschichtungsverfahrens
DE102012205616B4 (de) * 2012-04-04 2016-07-14 Siltronic Ag Vorrichtung zum Abscheiden einer Schicht auf einer Halbleiterscheibe mittels Gasphasenabscheidung
US20150331338A1 (en) * 2012-12-17 2015-11-19 Asml Netherlands B.V. Substrate Support for a Lithographic Apparatus and Lithographic Apparatus
JPWO2014174803A1 (ja) * 2013-04-22 2017-02-23 株式会社Joled El表示装置の製造方法
US9511549B2 (en) 2014-06-02 2016-12-06 Toyota Motor Engineering & Manufacturing North America, Inc. Anisotropic thermal energy guiding shells and methods for fabricating thermal energy guiding shells
US10458962B2 (en) * 2016-07-22 2019-10-29 Pulmostics Limited Temperature control for surface acoustic wave sensor
US11127607B2 (en) * 2019-11-11 2021-09-21 Xia Tai Xin Semiconductor (Qing Dao) Ltd. Heat processing system
CN113234914B (zh) * 2021-04-16 2022-07-19 北京钢研高纳科技股份有限公司 基于加热气体精确控温的梯度热处理炉及热处理方法
JP7565252B2 (ja) 2021-08-26 2024-10-10 芝浦メカトロニクス株式会社 加熱処理装置

Family Cites Families (41)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3862397A (en) 1972-03-24 1975-01-21 Applied Materials Tech Cool wall radiantly heated reactor
JPS62282437A (ja) * 1986-05-31 1987-12-08 Shinku Riko Kk 半導体ウエハ処理用急速加熱冷却装置
JPS63124528A (ja) * 1986-11-14 1988-05-28 Hitachi Ltd 半導体製造装置
US5228501A (en) 1986-12-19 1993-07-20 Applied Materials, Inc. Physical vapor deposition clamping mechanism and heater/cooler
JPS63291419A (ja) 1987-05-24 1988-11-29 Tatsumo Kk 加熱処理装置
US4836138A (en) 1987-06-18 1989-06-06 Epsilon Technology, Inc. Heating system for reaction chamber of chemical vapor deposition equipment
JPH0623935B2 (ja) * 1988-02-09 1994-03-30 大日本スクリーン製造株式会社 再現性を高めた熱処理制御方法
US4914276A (en) 1988-05-12 1990-04-03 Princeton Scientific Enterprises, Inc. Efficient high temperature radiant furnace
US5160545A (en) 1989-02-03 1992-11-03 Applied Materials, Inc. Method and apparatus for epitaxial deposition
DE3943482C2 (de) * 1989-05-08 1994-07-07 Balzers Hochvakuum Werkstückträger für ein scheibenförmiges Werkstück, sowie Vakuumprozeßkammer
JP2935474B2 (ja) 1989-05-08 1999-08-16 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 平坦な基板を処理する装置及び方法
JPH02301173A (ja) 1989-05-16 1990-12-13 Tokin Corp 圧電磁器組成物
US5002010A (en) 1989-10-18 1991-03-26 Varian Associates, Inc. Vacuum vessel
JPH0693440B2 (ja) 1990-01-19 1994-11-16 ジー スクウェアード セミコンダクター コーポレイション 急速加熱装置及び方法
US5252366A (en) 1990-01-24 1993-10-12 The United States Of America As Represented By The Secretary Of The Air Force Chemical vapor deposition method using an actively cooled effuser to coat a substrate having a heated surface layer
US5129360A (en) 1990-01-24 1992-07-14 The United States Of America As Represented By The Secretary Of The Air Force Actively cooled effusion cell for chemical vapor deposition
US5108792A (en) 1990-03-09 1992-04-28 Applied Materials, Inc. Double-dome reactor for semiconductor processing
KR940011708B1 (ko) 1990-04-09 1994-12-23 니찌덴 아네루바 가부시끼가이샤 기판온도제어기구
JPH045822A (ja) 1990-04-23 1992-01-09 Sumitomo Electric Ind Ltd ランプアニール装置および方法
US5673750A (en) 1990-05-19 1997-10-07 Hitachi, Ltd. Vacuum processing method and apparatus
JPH04266015A (ja) * 1991-02-21 1992-09-22 Fuji Electric Co Ltd 水素化非晶質シリコン膜の作成方法
US5199483A (en) 1991-05-15 1993-04-06 Applied Materials, Inc. Method and apparatus for cooling wafers
US5436172A (en) * 1991-05-20 1995-07-25 Texas Instruments Incorporated Real-time multi-zone semiconductor wafer temperature and process uniformity control system
US5449883A (en) 1992-08-07 1995-09-12 Mitsubishi Materials Corporation Continuous heat treatment system of semiconductor wafers for eliminating thermal donor
JP3380988B2 (ja) 1993-04-21 2003-02-24 東京エレクトロン株式会社 熱処理装置
KR100356438B1 (ko) 1993-12-17 2002-12-12 부룩스 오토메이션, 인코포레이티드 웨이퍼가열장치또는냉각장치
JP3234091B2 (ja) 1994-03-10 2001-12-04 株式会社日立製作所 表面処理装置
US5431700A (en) 1994-03-30 1995-07-11 Fsi International, Inc. Vertical multi-process bake/chill apparatus
JPH0845909A (ja) * 1994-07-26 1996-02-16 Sony Corp 試料台
JPH08191059A (ja) * 1995-01-09 1996-07-23 Hitachi Ltd プラズマ処理装置
JP3288200B2 (ja) 1995-06-09 2002-06-04 東京エレクトロン株式会社 真空処理装置
US6239038B1 (en) * 1995-10-13 2001-05-29 Ziying Wen Method for chemical processing semiconductor wafers
US5881208A (en) * 1995-12-20 1999-03-09 Sematech, Inc. Heater and temperature sensor array for rapid thermal processing thermal core
US5851929A (en) * 1996-01-04 1998-12-22 Micron Technology, Inc. Controlling semiconductor structural warpage in rapid thermal processing by selective and dynamic control of a heating source
US6209480B1 (en) * 1996-07-10 2001-04-03 Mehrdad M. Moslehi Hermetically-sealed inductively-coupled plasma source structure and method of use
US5846375A (en) 1996-09-26 1998-12-08 Micron Technology, Inc. Area specific temperature control for electrode plates and chucks used in semiconductor processing equipment
US6027244A (en) * 1997-07-24 2000-02-22 Steag Rtp Systems, Inc. Apparatus for determining the temperature of a semi-transparent radiating body
US5814365A (en) 1997-08-15 1998-09-29 Micro C Technologies, Inc. Reactor and method of processing a semiconductor substate
US6018616A (en) 1998-02-23 2000-01-25 Applied Materials, Inc. Thermal cycling module and process using radiant heat
US6105274A (en) 1999-03-18 2000-08-22 International Business Machines Corporation Cryogenic/phase change cooling for rapid thermal process systems
US6100506A (en) * 1999-07-26 2000-08-08 International Business Machines Corporation Hot plate with in situ surface temperature adjustment

Also Published As

Publication number Publication date
JP5511115B2 (ja) 2014-06-04
JP2003526940A (ja) 2003-09-09
EP1264333B1 (de) 2008-03-05
US7037797B1 (en) 2006-05-02
DE60133092D1 (de) 2008-04-17
WO2001069656A3 (en) 2002-03-14
KR20030007466A (ko) 2003-01-23
EP1264333A2 (de) 2002-12-11
KR100784580B1 (ko) 2007-12-10
TW495813B (en) 2002-07-21
WO2001069656A2 (en) 2001-09-20
DE60133092T2 (de) 2009-02-19

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