ELECTRONIC MEASUREMENTS AND

INSTRUMENTATION

Prepared By
Ms. C.Deepthi, Asst. Prof, Dept of ECE
Ms.L.Shruthi, Asst. Prof, Dept of ECE
Mr. S.Rambabu, Asst. Prof, Dept of ECE
Mr. M.Lakshmi Ravi Teja, Asst. Prof, Dept of
ECE
 UNIT –
I
Block Schematics of Measuring Systems
 Typical Measurement System
Architecture Noise and Interference

Process Signal
Sensor
or or Amp Conditioner
Tes Transduc
er
t

ADC
Converter
OUR TOPIC IS
Proces
s HERE
PC comp
and
Controller data
… and control storage
over the process or experiment
 INTRODUCTION

• Instrumentation is a technology of measurement

which serves sciences, engineering, medicine and etc.

• Measurement is the process of determining the

amount, degree or capacity by comparison with the
accepted standards of the system units being used.

• Instrument is a device for determining the value

or magnitude of a quantity or variable.

• Electronic instrument is based on electrical or

electronic principles for its measurement functions.
 FUNCTION AND ADVANTAGES

• The 3 basic functions of instrumentation :-

• Indicating – visualize the process/operation
• Recording – observe and save the measurement
reading
• Controlling – to control measurement and process

• Advantages of electronic measurement

• Results high sensitivity rating – the use of amplifier
• Increase the input impedance – thus lower loading
effects
• Ability to monitor remote signal
 PERFORMANCE CHARACTERISTICS

• Performance Characteristics - characteristics that show

the performance of an instrument.

• Eg: accuracy, precision, resolution, sensitivity.

• Allows users to select the most suitable instrument for a

specific
measuring jobs.

• Two basic characteristics :

• Static – measuring a constant process condition.
• Dynamic - measuring a varying process condition.
 PERFORMANCE CHARACTERISTICS
• Accuracy – the degree of exactness (closeness) of
measurement compared to the expected (desired) value.
• Resolution – the smallest change in a measurement variable
to which an instrument will respond.
• Precision – a measure of consistency or repeatability
of measurement, i.e successive reading do not differ.
• Sensitivity – ratio of change in the output (response)
of instrument to a change of input or measured
variable.
• Expected value – the design value or the most probable
value that expect to obtain.
• Error – the deviation of the true value from the desired
value.
 ERROR IN MEASUREMENT
• Measurement always introduce error
• Error may be expressed either as absolute or percentage of error

Absolute error, e
Yn Xn
=
where Yn–expected value
Xn –
measured value
Yn  X n 100
% error = Yn
 ERROR IN
MEASUREMENT
Relative
accuracy, A  1 Yn YnX n
% Accuracy, a = 100% - %
error = A100

Precision, P = 1
X n  Xn
Xn

where X n-value of the nth measurement

X - average set of measurement
n
PRECISION
• The precision of a measurement is a quantitative or numerical
indication of the closeness with which a repeated set of
measurement of the same variable agree with the average set
of measurements.
 Example

Given expected voltage value across a resistor is

80V.

The measurement is 79V. Calculate,

i. The absolute error
ii. The % of error
iii. The relative accuracy
iv. The % of accuracy
 Solution (Example
1.1)
Given that , expected value = 80V
measurement value = 79V

i. Absolute error, e = = 80V – 79V = 1V

Y n X n 80  79
100
Y n  X n 1=00 80 = 1.25%
ii. % error =
Yn

iii. Relative accuracy, A  1 Yn YnX n = 0.9875

iv. % accuracy, a = A x 100% = 0.9875 x

100%=98.75%
 Example
1.2
From the value in table 1.1 calculate Table
1.1
the precision of 6th measurement? No Xn
1 98
2 101
Solution 3 102
4 97

the average of measurement value 5 101

6 100
X n  98 101 ....  99  1005  100.5
10 10 7 103
8 98
the 6th reading 9 106
1 100 100.5 1  0.995 10 99
Precision 100.5 100.5
= 0.5
 LIMITING
ERROR
• The accuracy of measuring instrument is guaranteed
within a certain percentage (%) of full scale reading
• E.g manufacturer may specify the instrument to be
accurate at 2 % with full scale deflection
• For reading less than full scale, the limiting error increases
 LIMITING ERROR
(cont)
Example 1.6

Given a 600 V voltmeter with accuracy 2% full scale.

Calculate limiting error when the instrument is used to measure a
voltage of 250V?

Solution

The magnitude of limiting error, 0.02 x 600 = 12V

Therefore, the limiting error for 250V = 12/250 x 100 =
4.8%
 LIMITING ERROR
(cont)
Example 1.7

Given for certain measurement, a limiting error for voltmeter at

70V is 2.143% and a limiting error for ammeter at 80mA is
2.813%. Determine the limiting error of the power.

Solution

The limiting error for the power = 2.143% + 2.813%

= 4.956%
Exercise

• A voltmeter is accurate 98% of its full scale reading.

i. If the voltmeter reads 200V on 500V range, what is the absolute
error?
ii. What is the percentage error of the reading in (i).
 Significant
Figures
• Significant figures convey actual information regarding the
magnitude and precision of quantity
• More significant figure represent greater precision of
measurement

Example 1.3

Find the precision value of X1 and X2?

X n  101

X1  98 ===>> 2
X 2 98.5 ===>> 3 s.f
s.f
 Solution (Example
1.3)
X n 101

X 1  98===>> 2 s.f

X 2  98.=5==>> 3 s.f
98
X1Precision 1 
101
101 0.97
=
X2 Precision 98.5 101
1 101  0.975= ==>more precise
 =
 TYPES OF STATIC
ERROR
• Types of static error

1) Gross error/human error

2) Systematic Error
3) Random Error
 TYPES OF STATIC ERROR
1) Gross Error
 cause by human mistakes in reading/using instruments
may also occur due to incorrect adjustment of
the instrument and the computational mistakes
 cannot be treated mathematically
 cannot eliminate but can minimize
 Eg: Improper use of an instrument.
This error can be minimized by taking proper care
in reading and recording measurement parameter.
In general, indicating instruments change ambient
conditions to some extent when connected into a
complete circuit.
Therefore, several readings (at three readings) must be
taken to minimize the effect of ambient condition
changes.
 TYPES OF STATIC ERROR (cont)
2) Systematic Error
- due to shortcomings of the instrument (such as
defective or worn parts, ageing or effects of
the environment on the instrument)
• In general, systematic errors can be subdivided into static
and dynamic errors.
• Static – caused by limitations of the measuring device or
the physical laws governing its behavior.
• Dynamic – caused by the instrument not responding very
fast enough to follow the changes in a measured
variable.
 TYPES OF STATIC ERROR (cont)

3 types of systematic error :-

(i) Instrumental error
(ii) Environmental error
(iii) Observational error
 TYPES OF STATIC ERROR
(cont)
(i) Instrumental error
Inherent while measuring instrument because of
their mechanical structure (eg: in a D‘Arsonval meter,
friction in the bearings of various moving
component, irregular spring tension, stretching of
spring, etc)
Error can be avoid by:
(a)selecting a suitable instrument for the particular
measurement application
(b) apply correction factor by determining
instrumental error
(c) calibrate the instrument against standard
 TYPES OF STATIC ERROR
(ii) (cont)
Environmental error
- due to external condition effecting the
measurement including surrounding area
condition such as change in temperature,
humidity,
barometer pressure, etc
- to avoid the error :-
(a) use air conditioner
(b) sealing certain component in the instruments
(c) use magnetic shields
(iii) Observational error
- introduce by the
- observer
most common : parallax error and estimation
error (while reading the scale)
- Eg: an observer who tend to hold his head too far to
the left while reading the position of the needle on the
scale.
 TYPES OF STATIC
ERROR
3) Random error
(cont)
- due to unknown causes, occur when all systematic
error has accounted
- accumulation of small effect, require at high degree of
accuracy
- can be avoid by
(a) increasing number of reading
(b) use statistical means to obtain best
approximation
of true value
 Dynamic
•
Characteristics
Dynamic – measuring a varying process condition.
• Instruments rarely respond instantaneously to changes in the measured
variables due to such things as mass, thermal capacitance, fluid
capacitance or electrical capacitance.

• Pure delay in time is often encountered where the instrument waits for
some reaction to take place.
• Such industrial instruments are nearly always used for measuring
quantities that fluctuate with time.

• Therefore, the dynamic and transient behavior of the instrument

is important.
Dynamic
Characteristics
• The dynamic behavior of an instrument is determined by subjecting its primary
element (sensing element) to some unknown and predetermined variations in
the measured quantity.

• The three most common variations in the measured quantity:

• Step change
• Linear change
• Sinusoidal change
Dynamic
Characteristics
• Step change-in which the primary element is subjected to an instantaneous
and finite change in measured variable.

• Linear change-in which the primary element is following the measured

variable,
changing linearly with time.
• Sinusoidal change-in which the primary element follows a measured variable,
the magnitude of which changes in accordance with a sinusoidal function of
constant amplitude.
Dynamic
Ch• Tahreadycnatmeircipsertfiocrmsancecharacteristics of an
instrument are: Speed of response- The rapidity with
instrument
which an responds changes in measured quantity.

• Dynamic error-The difference between the true

and measured value with no static error.
• Lag – delay in the response of an instrument to
changes in the measured variable.
• Fidelity – the degree to which an instrument indicates
the changes in the measured variable without dynamic
error (faithful reproduction).
 ELECTRONIC
INSTRUMENT
• Basic elements of an electronics
instrument
Signal Indicatin
Transducer Modifier g
Device
1) Transducer
- convert a non electrical signal into an electrical signal
- e.g: a pressure sensor detect pressure and convert it
to electricity for display at a remote gauge.
2) Signal modifier
- convert input signal into a suitable signal for the indicating
device
3) Indicating device
- indicates the value of quantity being measure
 INSTRUMENT APPLICATION
GUIDE
• Selection, care and use of the instrument :-
 Before using an instrument, students should be
thoroughly familiar with its operation ** read the manual
carefully
 Select an instrument to provide the degree of accuracy
required (accuracy + resolution + cost)
 Before used any selected instrument, do the inspection
for any physical problem
 Before connecting the instrument to the circuit, make
sure the ‗function switch‘ and the ‗range selector
switch‘ has been set-up at the proper function or range
INSTRUMENT APPLICATION
GUIDE

Analog
Multimeter
INSTRUMENT APPLICATION
GUIDE

Digital Multimeter
DC AND AC METER

35
 D’ARSORVAL METER MOVEMENT

• Also called Permanent-Magnet Moving Coil (PMMC).

• Based on the moving-coil galvanometer constructed by

Jacques d’ Arsonval in 1881.

• Can be used to indicate the value of DC and AC

quantity.
• Basic construction of modern PMMC can be seen
in Figure .

36
 Operation of D‘Arsonval
Meter
• When current flows through the coil, the core will rotate.
• Amount of rotation is proportional to the amount of current flows through
the coil.

• The meter requires low current (~50uA) for a full scale deflection, thus
consumes very low power (25-200 uw).

• Its accuracy is about 2% -5% of full scale deflection

37
 Pointer

Permanent magnet

Coil
Core
Air
Gap

Fig: Modern D’Arsonval

Movement
38
 DC
AMMETE
• The PMMC galvanometer constitutes the basic
Rammeter.
movement of a dc
• The coil winding of a basic movement is small and
light, so it can carry only very small currents.
• A low value resistor (shunt resistor) is used in DC
ammeter to measure large current.
• Basic DC ammeter:

39
+
I Ish Im
+
Rsh Rm
_
D’Arsonval
_ Movement

Figure : Basic DC Ammeter

40
• Referring to Fig.
Rm = internal resistance of the
movement
Rsh = shunt resistance
Ish =shunt current
Im = full scale deflection current
of the movement
I = full scale current of the
ammeter + shunt (i.e. total current
)

41
I sh Rsh  I m Rm
Ish  I  Im
Rsh  I m Rm
I m
I
42
 EXAMP
LE
A 1mA meter movement with an internal resistance of 100Ω is to be
converted into a 0-100 mA. Calculate the value of shunt resistance
required. (ans: 1.01Ω)

43
 MULTIRANGE AMMETER
 The range of the dc ammeter is extended by a
number of shunts, selected by a range switch.
The resistors is placed in parallel to give different
current ranges

 Switch S (multi-position switch) protects the meter

movement from being damage during range changing.

Increase cost of the meter.

44
+
+
R1 R2 R3 R4 Rm
_
D’Arsonval
Movement

Figure : Multirange Ammeter

45
 Aryton shunt or universal
shunt
Aryton shunt eliminates the possibility of having the meter in the circuit without a
shunt.

 Reduce cost

 Position of the switch:

a)‘1’: Ra parallel with series combination of Rb, Rc and the meter movement. Current
through the shunt is more than the current through the meter movement, thereby
protecting the meter movement and reducing its sensitivity.

b)‘2’: Ra and Rb in parallel with the series combination of Rc and the meter
movement. The current through the meter is more than the current through the shunt
resistance.

c)‘3’: Ra, Rb and Rc in parallel with the meter. Maximum current flows through the meter
movement and very little through the shunt. This will increase the sensitivity.

46
 Rc

+
3
Rm
+ 2 Rb _
1 D’Arsonval
Meter

Ra

_ Figure :

Aryton Shunt

47
 EXAMPLE
• Design an Aryton shunt to provide an ammeter with a
current range of 0-1 mA, 10 mA, 50 mA and 100 mA.
AD’ Arsonval movement with an internal resistance of
100Ω and full scale current of 50 uA is used.

1mA

+
R4

10mA
R3
+
50mA _
R2 D’Arsonval
Movemen
t
100mA
R1

48
 REQUIREMENT OF A
SHUNT
1) Minimum Thermal Dielectric Voltage Drop
Soldering of joint should not cause a voltage drop.
2) Solderability
-never connect an ammeter across a source of
e.m.f
-observe the correct polarity
-when using the multirange meter, first
use the highest current range.

49
BASIC METER AS ADC VOLTMETER
 To use the basic meter as a dc voltmeter, must know the amount

of current (Ifsd) required to deflect the basic meter to full scale.

The sensitivity is based on the fact that the full scale current should

results whenever a certain amount of resistance is present in the meter

circuit for each voltage applied.

1
S
I fsd

50
 EXAMP
LE
Calculate the sensitivity of a 200 uA meter
movement which is to be used as a dc voltmeter.

Solution:
1 1
S  
200uA 5k /V
I fsd

51
 DC VOLTMETER
A basic D‘Arsonval movement can be converted into a
DC voltmeter by adding a series resistor (multiplier) as
shown in R s
+ Figure.
Multiplier Im
V Rm

_
Figure : Basic DC Voltmeter

Im =full scale deflection current of the movement (Ifsd)

Rm=internal resistance of the movement
Rs =multiplier resistance
V =full range voltage of the instrument
52
• From the circuit of Figure

V  I m (R s  R m )

Rs  V  I m Rm  V  R m
Im Im

V
R  I Rm
s
m

53
 EXAMP
A basic D’ ArsonvLalEmovement with a full-
scale deflection of 50 uA and internal
resistance of 500Ω is used as a DC voltmeter.
Determine the value of the multiplier
resistance needed to measure a voltage range
of 0-10V.
Solution:

Rs  IV  m 10V
 50uA  500 
m
R 199.5k

54
• Sensitivity and voltmeter range can be used to
calculate the multiplier resistance, Rs of a DC
voltmeter.
Rs=(S x Range) - Rm
• From example 2.4:
Im= 50uA, Rm=500Ω, Range=10V
Sensitivity,
1 1
S   20k/V
Im
50uA

So, Rs = (20kΩ/V x 10V) – 500 Ω

= 199.5 kΩ
55
 MULTI-RANGE VOLTMETER
• DC voltmeter can be converted into a multi-range voltmeter by
connecting a number of resistors (multipliers) in series with
the meter movement.

• A practical multi-range DC voltmeter is shown in Figure

R1 R2 R3
R4
Im
V2
V1
V3 Rm

+
V4

Figure: Multirange voltmeter

56
 EXAMPLE

Convert a basic D‘ Arsonval movement with an internal

resistance of 50Ω and a full scale deflection current of 2
mA into a multirange dc voltmeter with voltage ranges
of 0-10V, 0-50V,

0-100V and 0-250V.

57
 VOLTMETER LOADING EFFECTS
• When a voltmeter is used to measure the voltage across a
circuit component, the voltmeter circuit itself is in parallel
with the circuit component.

• Total resistance will decrease, so the voltage across

component
will also decrease. This is called voltmeter loading.

• The resulting error is called a loading error.

• The voltmeter loading can be reduced by using a high

sensitivity voltmeter.

• How about ammeter?? 58

 AMMETER INSERTION EFFECTS

• Inserting Ammeter in a circuit always increases the resistance of the circuit

and, thus always reduces the current in the circuit. The expected current:
E
Ie 
R1

• Placing the meter in series with R1 causes the current to reduce to a value
equal to:

E
I m 
R1  R m

59
 AMMETER INSERTION EFFECTS

• Dividing equation 1 by 2
yields: Im R1

Ie R1  R
m

• The Ammeter insertion error is given by :

Insertion Error  I m  X 1 0 0
  1
 Ie 

60
 OHMMETER (Series Type)
• Current flowing through meter movements depends on the magnitude of
the unknown resistance.
• The meter deflection is non-linearly related to the value of the unknown
Resistance, Rx.
• A major drawback – as the internal voltage decreases, reduces the
currentand meter will not get zero Ohm.
• R2 counteracts the voltage drop to achieve zero ohm. How do you get
zero Ohm?
• R1 and R2 are determined by the value of Rx = Rh where Rh = half of full scale
deflection resistance.
R2 Rm
R h  R 1  ( R 2 // R m )  R 1 
R2  R m

• The total current of the circuit, It=V/Rh

• The shunt current through R2 is I2=It-Ifsd
61
 OHMMETER (Series Type)
• The voltage across the shunt, Vsh= Vm

So,
I2 R2=Ifsd Rm
Since
I2=It-Ifsd
I fsd Rm
Then, R2 I 
t fsd
I

Since It=V/Rh I
I fsd Rm Rh R1  Rh  fsd Rm Rh
So,
R2 
VI fsd Rh V

62
Figure : Measuring circuit resistance with an ohmmeter

63
Example:
1) A 50µA full scale deflection current meter
movementis to be used in an Ohmmeter. The meter
movement has an internal resistance Rm = 2kΩ and a
1.5V battery is used in the circuit. Determine Rz at full
scale deflection.
2) A 100Ω basic movement is to be used as an
ohmmeter requiring a full scale deflection of 1mA
and internal battery voltage of 3V . Ahalf scale
deflection marking of 2k is desired. Calculate:
i. value of R1 and R2
ii. the maximum value of R2 to compensate for a 5%
drop in battery voltage

64
 MULTIMETER

• Multimeter consists of an ammeter, voltmeter and ohmmeter in one

unit.
• It has a function switch to connect the appropriate circuit to the
D’Arsonval movement.
• Fig.4.33 (in text book) shows DC miliammeter, DC voltmeter, AC
voltmeter, microammeter and ohmmeter.

65
AC VOLTMETER USING HALF-WAVE RECTIFIER
• The D’Arsonval meter movement can be used to measure alternating
current by the use of a diode rectifier to produce unidirectional current
flow.
• In case of a half wave rectifier, if given input voltage, Ein = 10 Vrms,
then:
Peak
E p  10Vrms 1.414 14.14V
voltage,
Average Eave  Edc  0.636 Ep  8.99V
voltage,

o Since the diode conducts only during the positive half cycle as shown in Fig
4.18(in text book), the average voltage is given by:
Eave / 2=4.5V

66
AC VOLTMETER USING HALF-WAVE RECTIFIER
• Therefore, the pointer will deflect for a full scale if 10 Vdc is
applied and only 4.5 V when a 10 Vrms sinusoidal signal is
applied.
• The DC voltmeter sensitivity is given by:
1
S dc  1  
Im 1k /V
1mA
• For the circuit in Figure 4.18, the AC voltmeter sensitivity is given
by:
Sac  0.45Sdc  0.45k /V

• This means that an AC voltmeter is not as sensitive as a DC

voltmeter.

67
AC VOLTMETER USING HALF-WAVE RECTIFIER
• To get the multiplier resistor, Rs
value:

Edc  0.45 Erms

E dc  Rm 0.45 E rms  Rm
R  I
s  I dc
dc
o The AC meter scale is usually calibrated to give the RMS value of
analternating sine wave input.

• A more general AC voltmeter circuit is shown in Fig. 4.17 (in text book)

• A shunt resistor, Rsh is used to draw more current from the diode D1 to move
its operating point to a linear region.

• Diode D2 is used to conduct the current during the negative half cycle.

• The sensitivity of AC voltmeter can be doubled by using a full wave rectifier.

68
 Important statistical
definitionsd  X  X
 Deviation n n
N

 Average X nX
DN  n
N
deviation
N

 Standard deviationS N  1  X )2 
N
n X
(X
n1 
 Signal-to-noise Ratio

X X
SNR   N  N
X
n  X )
2
1
N (X
n1
X
SNR improves
SNR  
as X
N
Sensitivity, Span,
• Sensitivity is a parameter extracted from the instrument response
Precision(based on the assumption that the response is linear). If input quantity
changes by  Q , resulting in the output quantity change of 
INP
QOUT, then the sensitivity is

S  Qout
Qinp

• Span of the Instrument is the difference between the upper and the
lower limits of operation
span = Upper – Lower
• Precision Measurement requires a measurement system capable of
resolving very small signals, (say, one part in 107). In other words, the
precise measurement is such for which
Span / Resolution » 1
Signal
Analyzers
UNIT-II
INTRODUCTION

• In the CRO we discussed measurement techniques in the time domain, that is,
measurement of parameters that vary with time. Electrical signals contain a great
deal of interesting and valuable information in the frequency domain as well.
Analysis of signals in the frequency domain is called spectrum analysis, which is
defined as the study of the distribution of a signal's energy as a function of
frequency.
 INTRODUCTION
• This analysis provides both electrical and physical system
information which is very useful in performance testing of both
mechanical and electrical systems. This chapter discusses the
basic theory and applications of the principal instruments used
for frequency domain analysis: distortion analyzers. wave
analyzers. spectrum analyzers, and Fourier analyzers

• Each of these instruments quantifies the magnitude of the signal

of interest through a specific bandwidth, but each measurement
technique is different as will be seen in the discussion that
follows.
 DISTORTION
•
The extent to which ht e o upt ut
from the waveform at theA
input is a measure of N A
the distortion intro-
RducSed by the inherent nonlinear characteristics of active
wa ve ofr m of an amplifier differs
L Y Z E
-

devices
such as bipolar or field-effect transistors or by passive circuit
components. The amount of distortion can be measured with a
distortion analyzer.

• Applying a sinusoidal signal to the input of an ideal linear amplifier

will produce a sinusoidal output waveform. However, in most cases
the output waveform is not an exact replica of the input signal
DISTORTION ANALYZERS

• When an amplifier is not operating in a linear fashion, the output

signal will be distorted. Distortion caused by nonlinear operation
is called amplitude distortion or harmonic distortion. It can be
shown mathematically that an amplitude-distorted sine wave is
made up of pure sine-wave components including the
fundamental frequency f of the input signal and harmonic
multiples of the fundamental frequency, 2f, 3f, 4f . . . , and so on.
DISTORTION ANALYZERS

• When harmonics are present in considerable amount, their presence

can be observed with an oscilloscope. The waveform displayed will
either have unequal positive and negative peak values or will exhibit
a change in shape. In either case, the oscilloscope will provide a
qualitative check of harmonic distortion. However. the distortion
must be fairly severe (around 10%) to be noted by an untrained
observer.
 DISTORTION
• In addition, ANALYZERS
most testing situations require a better quantitative measure of
harmonic distortion. Harmonic distortion can be quantitatively measured very
accurately with a harmonic distortion analyzer, which is generally referred to
simply as a distortion analyzer.
DISTORTION
ANALYZERS
• A block diagram for a fundamental-suppression harmonic
analyzer is shown in Fig. 1. When the instrument is used.
switch S, is set to the "set level" position, the band pass filter is
adjusted to the fundamental frequency and the attenuator
network is adjusted to obtain a full-scale voltmeter reading.

Fig. 1 Block diagram of a distortion

analyzer.
DISTORTION ANALYZERS

• Switch S, is then set to the "distortion" position, the rejection

f:1ter is turned to the fundamental frequency, and the attenuator
is adjusted for a maximum reading on the voltmeter.

• The total harmonic distortion (THD). which is frequently

expressed as a percentage, is defined as the ratio of the rms
value of all the harmonics to the rms value of the fundamental,

or (harmonics) 2
THD
 fundamental
DISTORTION ANALYZERS

• This defining equation is somewhat inconvenient from the standpoint of

measurement. An alternative working equation expresses total harmonic distortion
as the ratio of the rms value of all the harmonics to the rms value of the
total signal including distortion. That is,

(2)
(harmonics) 2
THD
 ( funsamental) 2  (harmonics)
2
DISTORTION ANALYZERS

⚫ On the basis of the assumption that any distortion caused by the

components within the analyzer itself or by the oscillator signal
are small enough to be neglected. Eq. 2 can be expressed as

E E
2
2
E
2
(3)
THD 2 3
 ... n

where   E f

THD = the total harmonic

distortion
Ef = the amplitude of the fundamental frequency including the
harmonics
E2E3En = the amplitude of the individual
harmonics THD = E(harmonics) fundamental
DISTORTION ANALYZERS

• EXAMPLE 1:
Compute the total harmonic distortion of a signal that contains a
fundamental signal with an rms value of 10 V, a second harmonic
with an rms value of 3 V, a third harmonic with an rms value of
1.5 V, and a fourth harmonic with an rms value of 0.6 V.
SOLUTION:

32 1.5 2 0.6 2
THD
 10

 11.6  34.07%
10
DISTORTION
ANALYZERS
A typical laboratory-quality distortion analyzer is shown in Fig. 2.
The instrument shown, a Hewlett-Packard Model 334A. is capable
of measuring total distortion as small as 0.1% of full scale at any
frequency between 5 Hz and 600 kHz. Harmonics up to 3 MHz can
be measured.

Fig. 15-2 Laboratory-quality distortion analyzer.

(Courtesy Hewlett – Packard Company)

WAVE
ANALYZERS
• Harmonic distortion analyzers measure the total harmonic content in waveforms.
It is frequently desirable to measure the amplitude of each harmonic individually.
This is the simplest form of analysis in the frequency domain and can be
performed with a set of tuned filters and a voltmeter.
 WAVE ANALYZERS
• Such analyzes have various names, including frequency-selective
voltmeters, carrier frequency voltmeters selective level meters and
wave analyzers. Any of these names is quite descriptive of the
instrument‘s primary function and mode of operation.

Fig. 3 Basic wave analyzer

circuit
WAVE
ANALYZERS
• A very basic wave analyzer is shown in Fig. 3. The primary detector is a simple
LC circuit which is adjusted for resonance at the frequency of the particular
harmonic component to be measured. The intermediate stage is a full-wave
rectifier, and the indicating device may be a simple do voltmeter that has been
calibrated to read the peak value of a sinusoidal input voltage.
WAVE
ANALYZERS
• Since the LC filter in Fig. 3 passes only the frequency to which it is tuned and
provides a high attenuation to all other frequencies. many tuned filters
connected to the indicating device through a selector switch would be required
for a useful wave analyzer.
• Since wave analyzers sample successive portions of the
frequency spectrum through a movable "window." as shown in
Fig. 4, they are called non-real-time analyzers. However. if the
signal being sampled is a periodic waveform. its energy
distribution as a function of frequency does not change with
time. Therefore, this sampling technique is completely
satisfactory.

• Rather than using a set of tuned filters, the heterodyne wave

analyzer shown in Fig. 5 uses a single. tunable, narrow-
bandwidth filter, which may be regarded as the window
through which a small portion of the frequency spectrum is
 WAVE ANALYZERS
⚫In this system, the signal from the internal, variable-frequency
oscillator will heterodyne with the input signal to produce output
signals having frequencies equal to the sum and difference of the
oscillator frequency fo and the input frequency fi.

Fig. 15-4 Wave analyzer tunable filter or

"window."
Heterodyne-type wave
analyzer
• In a typical heterodyne wave analyzer, the band pass filter is
tuned to a frequency higher than the maximum oscillator
frequency. Therefore, the "sum frequency" signal expressed as
is passed by the filter to the amplifier.
Fs = fo +fi
Heterodyne-type wave
analyzer
• As the frequency of the oscillator is decreased from its maximum frequency. a
point will be reached where fo + fi is within the band of frequencies that the band
pass filter will pass. The signal out of the filter is amplified and rectified.
 Heterodyne-type wave
•
T he i nd i ca ted q uantity is amplified and
a n a l y z e r
quantity is then proportional to the peak amplitude of the
rectified. The indicated
fundamental component of the input signal. As the frequency of the
oscillator is further decreased, the second harmonic and higher
harmonics will be indicated.

• The bandwidth of the filter is very narrow, typically about 1 % of the

frequency of interest. The attenuation characteristics of a typical
commercial audio-frequency analyzer is shown in Fig. As can be
seen, at 0.5f and at 2f, attenuation is approximately 75 dB. The
bandwidth of a heterodyne wave analyzer is usually constant.
 An introduction to
RF Spectrum Analysers
What is a RF Spectrum Analyser?
The name says it all – it is an instrument that
enables the analysis of a spectrum.

In our case this is the Radio Frequency (RF)

spectrum.

In its simplest form, a Spectrum Analyser is

simply a radio receiver with a calibrated ‘S
meter’.
• Spectrum analysers are widely used to measure the frequency
response, noise and distortion characteristics of all kinds of RF
circuits by comparing the input and output spectra.

• In telecommunications applications, spectrum analysers can be

used to determine the occupied bandwidth and track
interference sources. In EMC testing applications, a spectrum
analyser can be used for basic pre-compliance testing (detecting
radiated and conducted emissions) .

• With suitable additions, such as a Tracking Generator and a

VSWR Bridge, RF filters and band limited functions can be easily
checked and transmission line losses/impedance mismatches
plus antenna matching measurements at multiple frequencies is
simply achieved.
A spectrum analyser may be used to determine if a wireless
transmitter is working according to licence defined standards
for purity of emissions.

Output signals at frequencies other than the intended

communications frequency (harmonics) will be apparent on
the display.

The analyser may also be used to determine, by direct

observation, the bandwidth of a digital or analogue signal.
A spectrum analyser interface is a device that connects to a
wireless receiver or a personal computer to allow visual
detection and analysis of electromagnetic signals over a
defined band of frequencies.

This is called panoramic reception and it is used to determine

the frequencies of sources of interference to wireless
networking equipment, such as Wi-Fi and wireless routers.

Spectrum analysers can also be used to assess RF shielding.

This is particularly important for high RF power devices such as
transmitters, where poor shielding can lead to unwanted cross
coupling between units, or even danger to nearby personnel.
Difference between a Spectrum Analyser and an Oscilloscope

Both items enable measurement of the level of a signal,

but, An RF Spectrum Analyser measures a signal with

respect to
frequency, i.e. in the FREQUENCY DOMAIN

An Oscilloscope measures a signal with respect to time, i.e. in

the TIME DOMAIN

An RF Spectrum Analyser usually presents a terminated input to

the signal to be measured at a defined impedance – usually
50Ω

An Oscilloscope usually presents a high impedance input to the

Signal Analysis, frequency and time domains
Oscilloscope Display, amplitude modulated
signal
Spectrum Analyser Display, amplitude modulated
signa
l
Spectrum Analyser Display, Harmonic Distortion
Spectrum Analyser Display, data signal
 Spectrum Analyser
types
Spectrum analyser types are defined by the methods used to
obtain
the spectrum of a signal.

Fundamentally, there are swept-tuned and FFT (Fast

Fourier Transform) based spectrum analysers

Older instruments tend to be swept-tuned, whilst modern

day instruments are usually FFT based, which take
advantage of modern signal processing techniques.
 Swept Tuned Spectrum Analyser
A swept-tuned spectrum analyser uses a super hetrodyne
receiver to down convert all, or a portion of the input signal
spectrum, using a voltage controlled oscillator (VCO) and a
mixer to the centre frequency of a band pass filter.
With this super heterodyne architecture, the VCO is swept
through a range of frequencies, as selected by the
instrument‘s SPAN control.
The bandwidth of the band pass filter dictates the resolution
bandwidth, which is related to the minimum bandwidth
detectable by the instrument.
 FFT Spectrum

Analyser
A FFT spectrum analyser computes the Discrete Fourier
Transform (DFT), a mathematical process that transforms
the input signal waveform into the components of its
frequency spectrum.
 Some spectrum analysers, such as real-time spectrum
analysers, use a hybrid technique where the incoming signal is
first down converted to a lower frequency using super
heterodyne techniques and then analysed using Fast Fourier
Transformation (FFT) techniques.
Spectrum Analyser, typical Block Diagram
 Terminology, Centre Frequency & Span
In a typical spectrum analyser there are options to set the
start, stop, and centre frequency.

The frequency halfway between the stop and start frequencies

on a spectrum analyser display is known as the centre
frequency.
This is the frequency that is in the middle of the
display‘s frequency axis.

The Span specifies the range between the start and

stop frequencies.

These two parameters allow for adjustment of the display within

the frequency range of the instrument to enhance the visibility of
the spectrum being measured.
 Terminology, resolution bandwidth
•The bandwidth of the band pass filter dictates the resolution
bandwidth, which is related to the minimum bandwidth
detectable by the instrument.
• However, there is a trade-off between how quickly the
display can update the full frequency span being examined
and the frequency resolution presented, which is relevant for
distinguishing frequency components that are close together.
• Here, selecting a slower rate (longer time) to traverse the
selected frequency span enhances the achieved resolution.
Spectrum
Analyzer
INTRODUCTION
• A spectrum in the practical sense is a collection of sine waves ,
when combined properly produces the required time domain
signal.
• The frequency domain also has its measurement strengths.
• The frequency domain is better for determining the harmonic
content of a signal.
Amplitud
e
(power)

Timedomain
Measurem FrequencyDo
ents main
Measurements
• A spectrum analyzer is a device used to examine the spectral
composition of some electrical, acoustic, or optical waveform.
• Mostly it finds application in measurement of power spectrum .
 Analog &
Digital

• An analog spectrum analyzer uses either a variable band pass filter

whose mid-frequency is automatically tuned (shifted, swept) through
the range of frequencies of which the spectrum is to be measured or a
super heterodyne receiver where the local oscillator is swept through
a range of frequencies.A digital spectrum analyzer computes the Fast
Fourier transform (FFT), a mathematical process that transforms a
waveform into the components of its frequency spectrum
Spectrum
Analysis
• In various field operations involving signals there is need to
ascertain the nature of the signal at several points.
• Signal characteristics affect the parameters of operation of a
system.
• Spectrum analysis mostly involves study of the signal entering a
system or that produced by it .
• Spectrum analyzers usually display raw, unprocessed signal
information such as voltage, power, period, wave shape,
sidebands, and frequency. They can provide you with a clear and
precise window into the frequency spectrum.
The basic
t• yFpFTeSspectrum Paralelfiltersmeasuredsimultaneousl

The Fourier analyzer basically A y

takes a
Analyzer time-domain
signal, digital sampling,
using digitizes it
and then
performs the mathematics required
to convert it to the frequency
domain, and display the resulting
spectrum.
• Swept Spectrum Analyzer f 1 f2
The most common type of spectrum
analyzer is the swept-tuned receiver. f Filter'
sweeps'over
rangeofinterest
It is the most widely accepted,
general-purpose tool for frequency-
domain measurements. The
technique most widely used is super
heterodyne.
FFT Spectrum
Analyzer
THE MEASUREMENT SYSTEM
• The analyzer is looking at the entire frequency range at the same
time using parallel filters measuring simultaneously.
• It is actually capturing the time domain information which
contains all the frequency information in it.
• With its real-time signal analysis capability, the Fourier analyzer
is able to capture periodic as well as random and transient
events.
• It also can provide significant speed improvement over the more
traditional swept analyzer and can measure phase as well as
magnitude.
Swept Spectrum
Analyzer
• Very basically, these analyzers "sweep" across the frequency
range of interest, displaying all the frequency components present.
• The swept-tuned analyzer works just like the AM radio in your
home except that on your radio, the dial controls the tuning and
instead of a display, your radio has a speaker.
• The swept receiver technique enables frequency domain
measurements to be made over a large dynamic range and a wide
frequency range.
• It has significant contributions to frequency-domain signal
analysis for numerous applications, including the manufacture
and maintenance of microwave communications links, radar,
telecommunications equipment, cable TV systems, and broadcast
equipment; mobile communication systems; EMI diagnostic
testing; component testing; and signal surveillance.
 Theory of Operation
Spectrum Analyzer Block
Diagram
RFinp
ut
attenuat IF gain
or mixe IFfilter detecto
Input signal r r

Log
Pre-Selector
OrLowP
ass Am
vide
Filter
p o
local filte
oscilla r
tor sweep
generat
Crystal or
Referenc CRTdisplay
e
• The major components in a spectrum analyzer are
the
• RF input attenuator, mixer,
• IF (Intermediate Frequency) gain,
• IF filter, detector,
• video filter
• local oscillator,
• sweep generator
• CRT display.
 TheoryofOperatio
n MIXE
Mixer R
inpu
t

RF fLO-fsig fLO+fsig

fsig IF L
O fsig f LO

fLO
MIXER
• A mixer is a device that converts a signal from one frequency
to another.
• It is sometimes called a frequency-translation device.
• A mixer is a non-linear device (frequencies are present at
the output that were not present at the input).
• The output of a mixer consists of the two original signals (fsig and
fLO) as well as the sum (fLO+fsig) and difference (fLO-fsig)
frequencies of these two signals.
• In a spectrum analyzer, the difference frequency is actually the
frequency of interest. The mixer has converted our RF input
signal to an IF (Intermediate Frequency) signal that the
analyzer can now filter, amplify and detect for the purpose of
displaying the signal on the screen.
TheoryofOperatio
n IFFILT
ER
IFFilter

Input
Spectrum

IF
Bandwidth
(RBW)

Display
IF FILTER

• The IF filter is a band pass filter which is used as the "window"

for detecting signals.
• It's bandwidth is also called the resolution bandwidth (RBW) of
the analyzer and can be changed via the front panel of the
analyzer.
• By giving a broad range of variable resolution bandwidth settings
, the instrument can be optimized for the sweep and signal
conditions, letting trade-off frequency selectivity (the ability to
resolve signals), signal-to-noise ratio (SNR), and measurement
speed.
• As RBW is narrowed, selectivity is improved (we are able to
resolve the two input signals). This will also often improve SNR.
 TheoryofOperatio
n DETECTOR
Detector

amplitude

"bins Positivedetection:largestvalue
" inbindisplayed
Negativedetection:smalestvalu
e inbindisplayed
Sampledetection:lastvalueinbin
displayed
Continued...

• In sample detection mode, a random value for each "bin" of data

(also called a trace element) is produced. This detector mode is
best for computing the rms value of noise or noise-like signals,
but it may miss the peaks of burst signals and narrowband signals
when the RBW is narrower than the frequency spacing of the
bins.

• For displaying both signals and noise, a detector mode called the
normal detector mode
DETECTOR
• The analyzer must convert the IF signal to a baseband or video
signal so it can be viewed on the instrument's display. This is
accomplished with an envelope detector which then deflects the
CRT beam on the y-axis, or amplitude axis. Many modern
spectrum analyzers have digital displays which first digitize the
video signal with an analog-to-digital converter (ADC). The
positive-peak detector mode captures and displays the peak value
of the signal over the duration of one trace element

• The negative-peak detector mode captures the minimum value of

the signal for each bin.
TheoryofOperatio
n
VideoFilter
VIDEOFILTE
R
VIDEO FILTER

• The video filter is a low-pass filter that is located after the envelope detector and
before the ADC.

• This filter determines the bandwidth of the video amplifier, and is used to
average
or smooth the trace seen on the screen.

• By changing the video bandwidth (VBW) setting, we can decrease the peak-to-
peak variations of noise.
 TheoryofOperatio
n
Other Components

LO
SWEEPGE
N
frequency
RFINPUT CRTDISP
IFGAI LAY
ATTENUA
TOR N
THE
AUXILLARIES
• The local oscillator is a Voltage Controlled Oscillator (VCO)
which in effect tunes the analyzer.
• The sweep generator actually tunes the LO so that its frequency
changes in proportion to the ramp voltage.
• This also deflects the CRT beam horizontally across the
screen from left to right, creating the frequency domain in
the x-axis.
• The RF input attenuator is a step attenuator located between the
input connector and the first mixer. It is also called the RF
attenuator.
• This is used to adjust the level of the signal incident upon the
first mixer.
• This is important in order to prevent mixer gain compression and
distortion due to high-level and/or broadband signals.
Continued...
• The IF gain is located after the mixer but before the IF, or RBW,
filter.

• This is used to adjust the vertical position of signals on

the
display without affecting the signal level at the input mixer.

• When it changed, the value of the reference level is

changed
accordingly.

• The IF gain will automatically be changed to compensate for

input attenuator changes, so signals remain stationary on the CRT
 TheoryofOperatio
nowit
H
fs allworkstogether
SignalRang LORange
e
fLO-f s f + f
2 f LO LO
0 1 3(GHz fs
) s
IFfilter
mixe 0 1 3 4 5 6 detector
fs 2 3.6
r 6.5
input

3.6

f IF
sweepgenerator A

LO

fLO
0 1 2 f
3(GHz
3 4 5 6 (GH CRTdispl )
3.6 6.5 z) ay
• First of all, the signal to be analyzed is connected to the input of
the spectrum analyzer. This input signal is then combined with
the LO through the mixer, to convert (or translate) it to an
intermediate frequency (IF).These signals are then sent to the IF
filter.
• The output of this filter is detected, indicating the presence of a
signal component at the analyzer's tuned frequency. The output
voltage of the detector is used to drive the vertical axis
(amplitude) of the analyzer display.
• The sweep generator provides synchronization between the
horizontal axis of the display (frequency) and tuning of the LO.
The resulting display shows amplitude versus frequency of
spectral components of each incoming signal.
• The horizontal arrows are intended to illustrate the "sweeping" of
the analyzer. Starting with LO at 3.6 GHz, the output of the
mixer has four signals, one of which is at 3.6 GHz (fLO).
• IF filter is also at 3.6 GHz (it's shape has been imposed onto the
frequency graph for clarity). Therefore, we expect to see this signal
on the display. At 0 Hz on the CRT, we do indeed see a signal -
this is called "LO Feedthrough".
• Sweep generator moving to the right, causes the LO to sweep
upward in frequency. As the LO sweeps, so two will three of the
mixer output signals (the input signal is stationary).
• As the LO Feedthrough moves out of the IF filter bandwidth, we
see it taper off on the display. As soon as the difference frequency
(fLO-fs) comes into the envelop of the IF filter, we start to see it.
• When it is at the center (e.g. 3.6 GHz) we see the full amplitude
of this signal on the display.
• And, as it moves further to the right, it leaves the filter envelop,
and no signal is seen on the display.
• The signal is being swept through the fixed IF filter, and
properly displayed on the analyzer screen.
 TheoryofOperatio
n Primaryfunctions
FrontPanelOperation (Frequency,Amplitude,Span)

Softkeys

8563A SPECTRUM ANALYZER 9 kHz- 26.5GHz

Controlfunctions
(RBW,sweeptime,
VBW)

RFInp Num
ut eri c
 SIGNAL
•
CGONEVNENETIRONAATLOSG
I RNSA
L GENERATOR:
• Highest freq. ranges are provided by RF Oscillator (34MHz –
• 80MHz).

• „ Lowest freq. ranges are obtained by using frequency divider.

• ‰ 34MHz – 80MHz divided by 512 (29) Æ 67kHz – 156kHz.

• „ Buffer amplifiers (B1, B2, B3) provide isolation

between the master oscillator and power amplifier.
• ‰ Eliminates frequency effects (signal distortion)
between input and output circuits.
 Compared to conventional std. signal gen, modern
signal generator uses same oscillator on all bands.‰

 Eliminates range switching effects.

‰ Master oscillator is tuned by motor driven

variable
a capacitor.

„ Coarse freq. tuning – 7% frequency changes per second.

„ Fine tuning – at 0.01% of the main dial.

„ Modulation process is done at the power amplifier stage.

‰ Two internally generated signal are used (400Hz &1kHz)
for modulation.
 FUNCTION GENERATOR
• „A function generator produces different waveforms
of
• adjustable frequency.
• The common output waveforms are the sine, square, triangular.

• „Theblock diagram of a function generator is shown in Figure

3.
• Freq. Control – regulates two currents sources (control
the freq).
• Upper current source – supplies constant current to
• Lower current source – supplies a reverse current to
• the integrator,
integrator so that its produces
output an
decreases output
linearly voltage .
with
the
FUNCTION
GENERATOR
t

•Frequency is controlled by varying upper and lower currents.

•An increase or decrease in the current will increase or

decrease the slope of the output voltage, hence controls
the frequency.

• The voltage comparator – changes states at a pre-determined

maximum and minimum level of the integrator output

voltage.
• ‰Whenthe pre-determined level is reached, it changes the state
and switches the current source.
• ‰Producesa square wave.
• The integrator output is a triangular waveform whose
frequency is determined by the magnitude of the
constant current sources.

• he comparator output delivers a square wave of the

same frequency.
• The resistance diode network produces a sine wave from

the triangular wave with less than 1% distortion.

PULSE GENERATOR
• Pulse generators are instruments that produce a
rectangular waveform similar to a square wave but with a
different duty cycle.

• Duty cycle = pulse width/pulse period„

• A square wave generator has a 50% duty cycle.
• The basic circuit for pulse generation is the asymmetrical multi-
vibrator.
• Figure . shows block diagram of a pulse generator.
PULSE
GENERATOR
• „Theduty cycle can be varied from 25 to 75%
• Two independent outputs:
• 50Ω - supplies pulses with a rise and fall time of 5ns at 5Vp.
• 600Ω-supplies pulses with a rise and fall time of 70ns at
30Vp.
• The instrument can operate as a free-running or can be
Basic generating loop consists of the current sources, the
ramp capacitor, the Schmitt trigger, and the current
switching

circuit
PULSE
GENERATOR
PULSE GENERATOR
• „Upper current source – supplies a constant current to the
ramp capacitor and the capacitor voltage increases linearly.
• When the positive slope of the ramp reaches the upper limit
• Schmitt trigger will change a state
• Reverses the condition of the current switch.
• Capacitor discharges linearly. (lower current source takes
part)
• When the negative slope of the ramp reaches the lower limit,
upper current will control the circuit.
• The process is repeated.
• The ratio i1/i2 determines the duty cycle, and is controlled by
symmetry control.The sum of i1 and i2 determines the
frequency.
• The size of the capacitor is selected by the
multiplier switch.
 SWEEP
•GENERATOR
Sweep frequency generators are instruments that provide a sine wave in
the RF range.
•Its frequency can be varied smoothly and continuously over an
entire frequency band.
•Figure 8 shows the block diagram of the sweep generator.
•The frequency sweeper provides a varying sweep voltage for
synchronization to drive the horizontal deflection plates of
the CRO.
•„ A sweep rate can be of the order of 20 sweeps/sec.
• „ Figure 9 shows the modulated sinewave by a voltage-
controlled oscillator (VCO).
• 22
SWEEP
GENERATOR
• Radio Frequency Generator
• Radio frequency generators are designed to provide an output
signal over a wide range of frequencies from approximately 30
kHz to nearly 3000 MHz.
• Contain a precision output attenuator network that permits
selection of output voltages from 1 uV to 3V in precise steps.

output impedance= 50Ω.

• „Figure. shows a block diagram for a basic RF signal
generator.
• The frequency range is selected with the band selector and
exact freq. is selected with the Vernier freq. selector.
• Broadband amplifier – provides buffering between the
oscillator and the load connected to the output terminal.
• The output of the attenuator is monitored by the output
meter.
 UNIT
OSCILLOSCOPES
-II
I
Objectives:
 This final chapter discusses the key instruments of electronic
measurement with special emphasis on the most versatile instrument
of electronic measurement—the cathode-ray oscilloscope (CRO).
⚫ The objective of this book will remain unrealized without a discussion
on the CRO.
⚫ The chapter begins with the details of construction of the CRO, and
proceeds to examine the active and passive mode input–output
waveforms for filter circuits and lead-lag network delay.
⚫ This will be followed by a detailed study of the dual beam CRO and
its uses in op-amp circuit integrator, differentiator, inverting and non-
inverting circuits, comparative waveform study, and accurate
measurement with impeccable visual display.
 In addition to the CRO, the chapter also examines the sweep
frequency generator, the function generator, the sine wave generator,
the
square wave generator and the AF signal generator.
INTRODUCTION:
⚫ The cathode-ray oscilloscope (CRO) is a multipurpose display
instrument used for the observation, measurement , and analysis of
waveforms by plotting amplitude along y-axis and time along x-
axis.
⚫ CRO is generally an x-y plotter; on a single screen it can display
different signals applied to different channels. It can measure
amplitude, frequencies and phase shift of various signals. Many
physical quantities like temperature, pressure
⚫ and strain can be converted into electrical signals by the use
of transducers, and the signals can be displayed on the CRO.
⚫ A moving luminous spot over the screen displays the signal.
CROs are used to study waveforms, and other time-varying
phenomena from very low to very high frequencies.
⚫ The central unit of the oscilloscope is the cathode-ray tube (CRT),
and the remaining part of the CRO consists of the circuitry
required to operate the cathode-ray tube.
Block diagram of a cathode-ray
oscilloscope:
COMPONENTS OF THE CATHODE-RAY
OSCILLOSCOPE:

The CRO consists of the following:

• (i) CRT
• (ii) Vertical amplifier
• (iii) Delay line
• (iv) Horizontal amplifier
• (v) Time-base generator
• (vi) Triggering circuit
• (vii) Power supply
CATHODE-RAY
TUBE:
•The electron gunor electron emitter, the deflecting system
and the fluorescent screen are the three major components of a
general purpose CRT. A detailed diagram of the cathode-ray oscilloscope is
given in Fig. 14-2.
Electron Gun:
• In the electron gun of the CRT, electrons are emitted, converted into a sharp
beam and focused upon the fluorescent screen.

• The electron beam consists of an indirectly heated cathode, a control grid, an

accelerating electrode and a focusing anode.

• The electrodes are connected to the base pins. The cathode emitting
the electrons is surrounded by a control grid with a fine hole at its
center.

• The accelerated electron beam passes through the fine hole.

• The negative voltage at the control grid controls the flow of electrons in the
electron beam, and consequently, the brightness of the spot on the CRO
screen is controlled.
Deflection
Systems:
• Electrostatic deflection of an electron beam is used in a
general purpose oscilloscope. The deflecting system consists
of a pair of horizontal and vertical deflecting plates.

 Let us consider two parallel vertical deflecting plates P1

and P2. The beam is focused at point O on the screen in the
absence of a deflecting plate voltage.

 If a positive voltage is applied to plate P1 with respect to

plate P2, the negatively charged electrons are attracted
towards the positive plate P1, and these electrons will come
to focus at point Y1 on the fluorescent screen.
Deflection
Systems:
 The deflection is proportional to the deflecting voltage
between the plates. If the polarity of the deflecting voltage
is reversed, the spot appears at the point Y2, as shown in
Fig.
 Deflection
Systems:
• To deflect the beam horizontally, an alternating voltage is
applied to the horizontal deflecting plates and the spot on the
screen horizontally, as shown in Fig. 14-3(b).
• The electrons will focus at point X2. By changing the polarity
of voltage, the beam will focus at point X1. Thus, the
horizontal movement is controlled along X1OX2 line.
Spot Beam Deflection
Sensitivity:
Electrostatic
Deflection:
Electrostatic
Deflection:
Electrostatic
Deflection:
Electrostatic
Deflection:
Fluorescent
Screen:
 Phosphor is used as screen material on the inner surface of a
CRT. Phosphor absorbs the energy of the incident electrons.
The spot of light is produced on the screen where the electron
beam hits.
⚫The bombarding electrons striking the screen, release secondary
emission electrons. These electrons are collected or trapped by
an aqueous solution of graphite called ―Aquadag‖ which is
connected to the second anode.
⚫ Collection of the secondary electrons is necessary to keep
the screen in a state of electrical equilibrium.
 The type of phosphor used, determines the color of the light
spot. The brightest available phosphor isotope, P31, produces
yellow– green light with relative luminance of 99.99%.
Display waveform on the screen:
 Figure 14-5(a) shows a sine wave applied to vertical deflecting plates and a repetitive ramp or
saw-tooth applied to the horizontal plates.
 The ramp waveform at the horizontal plates causes the electron beam to be deflected
horizontally across the screen.
 If the waveforms are perfectly synchronized then the exact sine wave applied to the vertical
display appears on the CRO display screen.
Triangular
•
wSimailarvly thee dfispolayrofmthe t:riangular waveform is
as shown in Fig. 14-5(b).
TIME-BASE
G be• Th
E
accurately
e CRO N is uEthe
reproduced, sedRbeam diAsplay
to should T a wOavefo
have a constant
R
horizontalrm tShat v:aries as a
velocity.
• As the beam velocity is a function of the deflecting voltage, the deflecting voltage must
function of time. If the wave form is to
increase linearly with time.
• A voltage with such characteristics is called a ramp voltage. If the voltage decreases rapidly to
zero—with the waveform repeatedly produced, as shown in Fig. 14-6—we observe a pattern
which is generally called a saw-tooth waveform.
• The time taken to return to its initial value is known as fly back or return time.
Simple saw-tooth generator & associated
waveforms:
 The circuit shown in Fig. 14-7(a) is a simple sweep circuit, in which the capacitor C
charges through the resistor R.
 The capacitor discharges periodically through the transistor T1, which causes the
waveform shown in Fig. 14-7(b) to appear across the capacitor.
 The signal voltage, Vi which must be applied to the base of the transistor to turn it
ON for short time intervals is also shown in Fig. 14-7(b).
Time-base generator using UJT:
• The continuous sweep CRO uses the UJT as a time-base generator. When power is first
applied to the UJT, it is in the OFF state and CT changes exponentially through RT .
 The UJT emitter voltage VE rises towards VBB and VE reaches the plate voltage VP.
• The emitter-to-base diode becomes forward biased and the UJT triggers ON. This
provides a low resistance discharge path and the capacitor discharges rapidly.
• When the emitter voltage VE reaches the minimum value rapidly, the UJT goes OFF.
The capacitor recharges and the cycles repeat.

 To improve the sweep linearity, two separate voltage

supplies are used; a low voltage supply for the UJT
and a high voltage supply for the RTCT circuit. This
circuit is as shown in Fig. 14-7(c).

• RT is used for continuous control of frequency

within a range and CT is varied or changed in
steps.
They are sometimes known as
timing resistor and timing capacitor.
 Oscilloscope
•Amplifiers:
The purpose of an oscilloscope is to produce a faithful representation of the signals applied to its
input terminals.
 Considerable attention has to be paid to the design of these amplifiers for this purpose. The
oscillographic amplifiers can be classified into two major categories.
(i) AC-coupled amplifiers
(ii) DC-coupled amplifiers
• The low-cost oscilloscopes generally use ac-coupled amplifiers. The ac amplifiers, used in
oscilloscopes, are required for laboratory purposes. The dc-coupled amplifiers are quite
expensive. They
offer the advantage of responding to dc voltages, so it is possible to measure dc voltages as
pure signals
and ac signals superimposed upon the dc signals.
• DC-coupled amplifiers have another advantage. They eliminate the problems of low-frequency
phase shift and waveform distortion while observing low-frequency pulse train.
• The amplifiers can be classified according to bandwidth use also:
(i) Narrow-bandwidth amplifiers
(ii) Broad-bandwidth amplifiers
Vertical
•Amplifiers:
Vertical amplifiers determines the sensitivity and bandwidth of an oscilloscope.
Sensitivity, which is expressed in terms of V/cm of vertical deflection at the mid-band
frequency.

• The gain of the vertical amplifier determines the smallest signal that the
oscilloscope can
satisfactorily measure by reproducing it on the CRT screen.

• The sensitivity of an oscilloscope is directly proportional to the gain of the

vertical amplifier. So, as the gain increases the sensitivity also increases.

• The vertical sensitivity measures how much the electron beam will be deflected for
a specified input signal. The CRT screen is covered with a plastic grid pattern called
a graticule.

 The spacing between the grids lines is typically 10 mm. Vertical sensitivity is
generally
expressed in volts per division.

• The vertical sensitivity of an oscilloscope measures the smallest deflection factor

that can be selected with the rotary switch.
Frequency
response:
• The bandwidth of an oscilloscope detects the range of frequencies that can be
accurately reproduced on the CRT screen. The greater the bandwidth, the wider is the
range of observed frequencies.
• The bandwidth of an oscilloscope is the range of frequencies over which the gain of the
vertical amplifier stays within 3 db of the mid-band frequency gain, as shown in Fig. 14-
8.
• Rise time is defined as the time required for the edge to rise from 10–90% of
its maximum amplitude. An approximate relation is given as follows:
MEASUREMENTS USING THE CATHODE-RAY
OSCILLOSCOPE:
1) Measurement of Frequency:
• 2) Measurement of
Phase:

• 3 Measurement of Phase Using Lissajous Figures:

Measurement of Phase Using Lissajous
Figures:
Measurement of Phase Using Lissajous
Figures:
Measurement of Phase Using Lissajous
Figures:
Measurement of Phase Using Lissajous
Figures:
 TYPES OF THE CATHODE-RAY
• OSCILLThOe cSateCgoOzrai PotiEn Sof :CROs is done on the basis of whether
they are digital or analog. Digital CROs can be further classified as storage
oscilloscopes.
• 1. Analog CRO: In an analog CRO, the amplitude, phase and frequency
are measured from the displayed waveform, through direct manual
reading.
• 2. Digital CRO: A digital CRO offers digital read-out of signal information,
i.e., the time, voltage or frequency along with signal display. It consists of an
electronic counter along with the main body of the CRO.
• 3. Storage CRO: A storage CRO retains the display up to a substantial
amount of time after the first trace has appeared on the screen. The storage
CRO is also useful for the display of waveforms of low-frequency signals.
• 4. Dual-Beam CRO: In the dual-beam CRO two electron beams fall on a single
CRT. The dual-gun CRT generates two different beams.
• These two beams produce two spots of light on the CRT screen which make
the simultaneous observation of two different signal waveforms possible. The
comparison of input and its corresponding output becomes easier using the
dual-beam CRO.
SWEEP FREQUENCY
G• AEsweNeEp RerfqAueTncOy

geneR:rator is a signal generator which can

automatically vary its frequency smoothly and
continuously over an entire frequency range.
• Figure 14-15 shows the basic block diagram of
a sweep frequency generator.
The sweep frequency generator has the
ramp generator and the voltage-tuned oscillator
as its basic components.
Applications of the Sweep Frequency
Generator:
Lissajous’
Figures
• Lissajous’ figure can be displayed by applying two a.c. signals
simultaneously to the X-plates and Y-plates of an oscilloscope.
• As the frequency, amplitude and phase difference are altered,
different patterns are seen on the screen of the CRO.
Lissajous’
Figures
Same amplitude but different frequencies
Rise t••iLimitations
Amsl ecei antof
nfioscilloscope
di systems
probes • inadequate sensitivity
• Usually no problem because except most sensitive digital network, we
cnbstraunmed w id t h o f C R O
n aretshwellavabove
e m ilthe minimum
tia ti on s (analogue system is more
sensitivity
sensitive)
• insufficient range of input voltage?
• No problem. Usually within range
• limited bandwidth?
• some problems because all veridical amplifier and probe have a
limited
bandwidth
• Two probes having different bandwidth will show different
response.
Using faster probe

Using slower probe (6 MHz)

High-speed logic: ment 187

Measure (v.9a)
O scil
systems• oC so•c mo p
Input o p ne
signal e nt p s
o rfo os b ci e lo
• Probe
• Vertical amplifier
sscope • We assume a razor thin rising edge. Both probe and
vertical amplifier degrade the rise time of the input
signals.

High-speed logic: Measurement 188

(v.9a)
• Combined effects: approximation
• Serial delay
• The frequency response of a probe, being a combination of several
random filter poles near each other in frequency, is Gaussian.
1
T  (T  T      T 2
2 2

rise_ composite 1 2 )2
N
 Rise time is 10-90% rise time
 When figuring a composite rise time, the squares of 10-90% rise times add
 Manufacturer usually quotes 3-db bandwidth F3db
 approximations T10-90= 0.338/F3dB for each stage (obtained by simulation)

High-speed logic: Measurement 189

(v.9a)
Exampl
e:
Given: Bandwidth of probe and scope = 300 MHz
Tr signal = 2.0ns

Tr scope = 0.338/300 MHz = 1.1 ns

Tr probe = 0.338/300 MHz = 1.1 ns
Tdisplayed = (1.12 + 1.12 +2.02)1/2
= 2.5 ns

For the same system, if Tdisplayed = 2.2 ns, what is the actual rise

time? Tactual = (2.22 - 1.12 – 1.12)1/2

= 1.6 ns
High-speed logic: Measurement 190
(v.9a)
Self- • Current into the probe must traverse the ground loop on the way back to
loop source
ind u c t a n c e o f a p r o b e g r
• A P •ri The
m equivalent
ary f actocircuit
r deofgra
the probe
din g is th
a RCecircuit
per fo r
• The self-inductance of the ground loop, represented on our schematic by
series inductance L1, impedes these current.
ou n d
m a nc e

High-speed logic: Measurement 191

(v.9a)
• Typically, 3 inches (of 0.02” Gauge wire loop) wire on
ground plane equals to (approx) 200 nH
• Input C = 10pf
• TLC = (LC)1/2 = 1.4ns
• T10-90 = 3.4 TLC = 4.8ns
• This will slow down the response a lot.
High-speed logic: Measurement 192
(v.9a)
Estimation of circuit
• Output resistance of source combine with the loop inductance & input
Q capacitance is a ringing circuit.
• Where

(L / C)1/
Q2
Rs

• Q is the ratio of energy stored in the loop to energy lost per radian during
resonant decay.
• Fast digital signals will exhibit overshoots. We need the right Rs to damp the
circuit. On the other hand, it slows down the response.
High-speed logic: Measurement 193
(v.9a)
• Impact: probe having ground wires, when using to view very fast signals
from low-impedance source, will display artificial ringing and
overshoot.
• A 3” ground wire used with a 10 pf probe induces a 2.8 ns 10-90%
rise time. In addition, the response will ring when driven from a low-
impedance source.

High-speed logic: Measurement 194

(v.9a)
Remed•y Try to minimize the earth loop
wire • Grounding the probe close to the signal source

High-speed logic: Measurement Back to page 195

(v.9a) 29
Spurious signal pickup from probe ground loops
• Mutual inductance between
Signal loop A and Loop B

LM  5.08 A1 3
r
A2
where
• A1 (A2) = areas of loops
• r = separation of loops
• Refer to figure for values.
• In this example, LM = 0.17nH
• Typically IC outputs
• max dl/dt = 7.0 * 107 A/s

dI  (0.17nh)(7.0107 V / s)  12mV
Vnoise  LM dt

 12mV is not a lot until you have a 32-bit bus; must try to minimize loop
area
High-speed logic: Measurement 196
(v.9a)
A Magn•eMtiackfeiealdmdagenteetcitcofrielddetector
to test for noise

High-speed logic: Measurement 197

(v.9a)
How probes load down a
circuit
• Common experience
• Circuit works when probe is inserted. It fails when probe is removed.
• Effect is due to loading effect, impendence of the circuit has changed.
The frequency response of the circuit will change as a result.
• To minimize the effect, the probe should have no more than 10%
effect on the circuit under test.
• E.g. the probe impedance must be 10 times higher than the source
impedance of the circuit under test.

High-speed logic: Measurement 198

(v.9a)
An experiment showing the probe loading effect

A 10 pf probe loading a 25 ohm

circuit

• A 10 pf probe looks like 100 ohms to a 3 ns rising edge

• Less probe capacitance means less circuit loading and better measurements.
High-speed logic: Measurement 199
(v.9a)
Special probing
fixtures
• Typical probes with 10 pf inputs and one 3” to 6” ground wire are
not good enough for anything with faster than 2ns rising edges
• Three possible techniques to attack this problem
• Shop built 21:1 probe
• Fixtures for a low-inductance ground loop
• Embedded Fixtures for probing

High-speed logic: Measurement 200

(v.9a)
Shop-b•uiMlta2ke1:f1romproorbdeinary50 ohm
cable • Soldered to both the signal (source) and local ground
coaxial
• Terminates at the scope into a 50-ohm BNC connector

 Total impedance = 1K + 50 ohms;

if the scope is set to 50 mv/divison,
the measured value is = 50 * (1050/50) = 1.05
High-speed logic: Measurement 201
V/division (v.9a)
Advantages of the 21:1
probe
• High input impedance = 1050 ohm
• Shunt capacitance of a 0.25 W 1K resistor is around 0.5 pf, that is
small enough.
• But when the frequency is really high, this shunt capacitance may create
extra loading to the signal source.
• Very fast rise time, the signal source is equivalent to connecting to a
1K load, the L/R rise time degradation is much smaller than
connecting the signal to a standard 10 pf probe.

High-speed logic: Measurement 202

(v.9a)
Fixtures• Rfoeref artloofwgi -
loop • Tektronix manufactures a probe fixture specially
uirnedouncptaagnec1e9ground
designed to connect a probe tip to a circuit under
test.

High-speed logic: Measurement 203

(v.9a)
Embe•dRdeemdoFviaxbtuel reprfoo
bin disturb a circuit under
grePsro test.
b Why not having a
permanent probe fixture?
• The example is a very
similar to the 21:1 probe.
It has a very low
parasitic capacitance of
the order 1 pf, much
better than the 10 pf
probe.
• Use the jumper to
select external probe or
internal terminator.

High-speed logic: Measurement 204

(v.9a)
Avoidng pickup from probe shield t
i curren s

• Shield is also part of a current path.

• Voltage difference exists between logic ground and scope
chassis; current will flow.
• This “shield current * shield resistance R shield“ will produce
noise Vshield
High-speed logic: Measurement 205
(v.9a)
• VShield is proportional to shield resistance, not to shield inductance
because the shield and the centre conductor are magnetically
coupled. Inductive voltage appear on both signal and shield wires.
• To observe VShield
• Connect your scope tip and ground together
• Move the probe near a working circuit without touching anything. At
this point you see only the magnetic pickup from your probe sense loop
• Cover the end of the probe with Al foil, shorting the tip directly to the
probe’s
metallic ground shield. This reduces the magnetic pickup to near zero.
• Now touch the shorted probe to the logic ground. You should see only
the VShield 206
High-speed logic: Measurement
(v.9a)
Solving•VLSohwei edl rpshrioelbdlreemsistance(not possible with
probes) • Add a shunt impedance between the scope and logic ground.
standard • Not always possible because of difficulties in finding a good
grounding point
• Turn off unused part during observation to reduce
voltage
difference
• Not easy
• Use a big inductance (magnetic core) in series with
the shield
• Good for high frequency noise.
• But your inductor may deteriorate at very high frequency.
• Redesign board to reduced radiated field.
• Use more layers
• Disconnect the scope safety ground
• Not safe
High-speed logic: Measurement 207
(v.9a)
• Use a 1:1 probe to avoid the 10 time magnification
when using 10X probe
• Use a differential probe arrangement

High-speed logic: Measurement 208

(v.9a)
Viewing• additive noise.
and
• To study signal, probe point D and use this as trigger
Jaitseerroaias
blsewell.
draveat ddrt uaentsominitsesrisoymnbsoylsitnete

mrference

High-speed logic: Measurement 209

(v.9a)
• No jitter at trigger point due to repeated syn with
positive-going edge.
• This could be misleading
• For proper measurement, trigger with the source
clock
• The jitter is around half of the previous one.
• If source clock is not available, trigger on the source data signal
point A or B (where is minimal jitter)

High-speed logic: Measurement 210

(v.9a)
Slowing Down the System
clock
 Not easy to observe high speed digital signals which
include ringing, crosstalk and other noises.
 Trigger on a slower clock (divide the system clock)
allows better observations because it allows all signals to
decay before starting the next cycle.
 It will help debugging timing problems.

High-speed logic: Measurement 211

(v.9a)
Observ•inCgrocsrsotasls
altli • Reduce logic margins due to ringing
kw • Affect marginal compliance with setup and hold requirements
kl • Reduce the number of lines that can be packed together
• Use a 21:1 probe to check crosstalk
• Connect probe and turn off machine; measure and make sure
there is minimal environment noise.
• Select external trigger using the suspected noise source
• Then turn on machine to observe the signal which is a
combination of primary signal, ringing due to primary signal,
crosstalk and the noise present in our measurement system

High-speed logic: Measurement 212

(v.9a)
High-speed logic: Measurement 213
(v.9a)
• Try one of the followings to observe the cross talk
• Turn off primary signal (or short the bus drivers)
• Varying the possible noise source signal (e.g. signal patterns for thebus)

• Compare signals when noise source is on and off

• Talk photos with the suspected noise source ON and source OFF.
• The difference is the crosstalk

• Generating artificial crosstalk

• Turn off, disabled, short the driving end of the primary signal. Induce a
step edge of know rise time on the interfering trace and measure the
induced voltage.

• Useful technique when measuring empty board without components.

High-speed logic: Measurement 214

(v.9a)
POINTS TO
REMEMBER:
• 1. CRO is used to study waveforms.

• 2. CRT is the main component of a CRO.

• 3. Prosperous P31 is used for the fluorescent screen of a CRO.

• 4. A CRO has the following components:

• (a) Electron gun

• (b) Deflecting system

• (c) Florescent screen

• 5. Lissajous figures are used to measure frequency and phase of the waves
under study.

• 6. A time-base generator produces saw-tooth voltage.

• 7. An oscilloscope amplifier is used to provide a faithful representation of

input signal applied to its input terminals.
IMPORTAN
T
FORMULAE:
SPECIAL PURPOSE
OSCILLOSCOPES
DUAL BEAM OSCILLOSCOPE
•This is the Another method of studying two voltages simultaneously on the screen is to

use special cathode ray

•Tube having two separate electron guns generating two separate beam Each electron

beam has its

•Own vertical deflection plates.

•But the two beams are deflected horizontally by the common set of horizontal plate\

The time base circuit may be same or different. Such an oscilloscope is called Dual
Beam Oscilloscope.
•The oscilloscope has two vertical deflection plates and two separate channels A

and B for the two

•separate input signals. Each channel consists of a preamplifier and an attenuator.

A delay line,

•main vertical amplifier and a set of vertical deflection plates together forms a
single
channel. There is a single set of horizontal plates and single time base circuit.
•The sweep generator drives the horizontal amplifier which in turn drives the
plates. The' horizontal plates sweep both the beams across the screen at the
same rate. The sweep generator can be triggered internally by the channel A
signal or .channel B signal. Similarly it' can also be triggered from an external
signal or line frequency signal. This is possible with the help of trigger selector
switch, a front panel control.

•Such an oscilloscope may have separate time base circuit for separate
channel. This allows

•different sweep rates for the two channels but increases the size and

•weight of the oscilloscope.

DUAL TRACE
OSCILLOSCOPE
•The comparison of two or more voltages is very much ,necessary in the analysis and study of

many electronic circuits and systems.

•This is possible by using more than one oscilloscope but in such a case it is difficult to trigger the

sweep of each oscilloscope precisely at the same time.

•A common and less costly method to solve this problem is to use dual trace or multi trace

oscilloscopes.

•In this method, the same electron beam is used to generate two traces which can be
deflected

from two independent vertical sources.

•The methods are used to generate two independent traces which the alternate sweep method and

other is chop method.

DIGITAL STORAGE
OSCILLOSCOPE
• The input signal is digitized and stored in memory in
digital form.
• In this state it is capable of being analyzed
to produce a varietyof different information.
• To view the display on the CRT the data from memory
is reconstructed in analog form.
• The analog input voltage is sampled at adjustable
rates (up to 100,000 samples per
• second) and data points are read onto the
memory.
• If the memory is read out rapidly and repetitively, an
input event which is a single shot transient becomes a
repetitive or continuous waveform that can be observed
easily on an ordinary scope (not a storage scope).

• The digital memory also may be read directly (without

going through DAC) to, say, a computer where a
stored program can manipulate the data in almost any
way desired
COMPLETE BLOCK DIAGRAM OF
DSO
SAMPLING
OSCILLOSCOPE
• An ordinary oscilloscope has a B.W. of 10 MHz the HF
performance can be improved by means of sampling the input
waveform and reconstructing its shape from the sample, i.e. the
signal to be observed is sampled and after a few cycles
sampling point is advanced and another sample is taken.

• The shape of the wave form is reconstructed by joining the sample

levels together. The sampling frequency may be as low as 1/10th of
the input signal frequency (if the input signal frequency is 100
MHz, the bandwidth of the CRO vertical amplifier can be as low
as 10 MHz). As many as 1000 samples are used to reconstruct the
original waveform.
• The input is applied to the sampling gate. The input waveform
is sampled whenever a sampling pulse opens the sampling
gate.

• The sampling must be synchronized with the input

signal frequency.

• The signal is delayed in the vertical amplifier, allowing

the horizontal sweep to be initiated by the input signal.

• At the beginning of each sampling cycle, the trigger pulse

activates an oscillator and a linear ramp voltage is
generated.
• This ramp voltage is applied to a voltage comparator which
compares the ramp voltage to a staircase generate-When the
two voltages are equal in amplitude, the staircase advances
one step and a sampling pulse is generated, which opens the
sampling gate for a sample of input voltage.

• The resolution of the final image depends upon the size of the
steps of the staircase generator. The smaller the size of the
steps the larger the number of samples and higher the
resolution of the image.
 UNIT-4
TRANSDUCERS
INTRODUCTION OF
TRANSDUCERS
• A transducer is a device that convert one form of
energy to other form. It converts the measurand to a
usable electrical signal.
• In other word it is a device that is capable of
converting the physical quantity into a proportional
electrical quantity such as voltage or current.

Pressure Voltage
 BLOCK DIAGRAM OF TRANSDUCERS

• Transducer contains two parts that are closely related

to each other i.e. the sensing element and transduction
element.
• The sensing element is called as the sensor. It is
device producing measurable response to change in
physical conditions.
• The transduction element convert the sensor output
to suitable electrical form.
CHARACTERISTICS OF
TRANSDUCERS
1. Ruggedness
2. Linearity
3. Repeatability
4. Accuracy
5. High stability and
reliability
6. Speed of response
7. Sensitivity
8. Small size
TRANSDUCERS SELECTION FACTORS
1. Operating Principle: The transducer are many times selected on
the basis of operating principle used by them. The operating
principle used may be resistive, inductive, capacitive ,
optoelectronic, piezo electric etc.
2. Sensitivity: The transducer be sensitive enough
must produce detectable output. to
3. Operating Range: The transducer should maintain the range
requirement and have a good resolution over the entire range.
4. Accuracy: High accuracy is assured.
5. Cross sensitivity: It has to be taken into account when
measuring mechanical quantities. There are situation where the
actual quantity is being measured is in one plane and the
transducer is subjected to variation in another plan.
6. Errors: The transducer should maintain the expected input-
output relationship as described by the transfer function so as
to avoid errors.
Contd.
7. Transient and frequency response : The transducer should meet
the desired time domain specification like peak overshoot, rise
time, setting time and small dynamic error.

8. Loading Effects: The transducer should have a high input

impedance and low output impedance to avoid loading effects.

9. Environmental Compatibility: It should be assured that the

transducer selected to work under specified environmental
conditions maintains its input- output relationship and does not
break down.

10. Insensitivity to unwanted signals: The transducer should be

minimally sensitive to unwanted signals and highly sensitive to
desired signals.
 CLASSIFICATION OF TRANSDUCERS

The transducers can be classified as:

I. Active and passive transducers.

II. Analog and digital transducers.

III. On the basis of transduction principle

used.

IV. Primary and secondary transducer

V. Transducers and inverse transducers.

 ACTIVE AND PASSIVE TRANSDUCERS
• Active transducers :
• These transducers do not need any external source of power for
their operation. Therefore they are also called as self
generating type transducers.

I. The active transducer are self generating devices which

operate under the energy conversion principle.

II. As the output of active transducers we get an equivalent

electrical output signal e.g. temperature or strain to electric
potential, without any external source of energy being used.
Piezoelectric
Transduc
er
CLASSIFICATION OF ACTIVE
TRANSDUCERS
 ACTIVE AND PASSIVE TRANSDUCERS
• Passive Transducers :
I. These transducers need external source
of power for their operation. So they
are not self generating type
transducers.
II. A DC power supply or an audio
frequency generator is used as
an external power source.
III. These transducers produce the output
signal in the form of variation in
resistance, capacitance, inductance or
some other electrical parameter in
response to the quantity to be
measured.
CLASSIFICATION OF PASSIVE
TRANSDUCERS
 PRIMARY AND
SECONDARY
TRANSDUCERS
•Some transducers contain the mechanical as well as electrical
device. The mechanical device converts the physical quantity to
be measured into a mechanical signal. Such mechanical device
are called as the primary transducers, because they deal with the
physical quantity to be measured.

•The electrical device then convert this mechanical signal into a

corresponding electrical signal. Such electrical device are known

as secondary transducers.
 CONTD

•Ref fig in which the diaphragm act as primary

transducer. It convert pressure (the quantity to be

measured) into displacement(the mechanical
signal).
•The displacement is then converted into change in

resistance using strain gauge. Hence strain gauge acts

as the secondary transducer.
CLASSIFICATION OF TRANSDUCERS
According to Transduction Principle
 CLASSIFICATION OF TRANSDUCERS
According to Transduction Principle
CAPACITIVE TRANSDUCER:
• In capacitive transduction transducers the measurand is converted
atochange in the capacitance.
•A typical capacitor is comprised of two parallel plates of
d
conducting material separated by an electrical insulating
material called a dielectric. The plates and the dielectric may be
either flattened or rolled. Area=A
•The purpose of the dielectric is to help the two parallel plates
maintain their stored electrical charges.
•The relationship between the capacitance and the size of
capacitor plate, amount of plate separation, and the dielectric is
given by
Either A, d or ε can be varied.
dC is=the
ε0 εseparation
rA / d distance of plates
(m)
C is the capacitance (F, Farad)
ε0 : absolute permittivity of
A is the effective
vacuum (overlapping)
εr : relative permittivityarea of capacitor plates
(m2)
 CLASSIFICATION OF TRANSDUCERS
According to Transduction Principle
ELECTROMAGNETIC TRANSDUCTION:
•In electromagnetic transduction, the measurand is
converted to voltage induced in conductor by change
in the magnetic flux, in absence of excitation.
•The electromagnetic transducer are self generating
active transducers
•The motion between a piece of magnet and an
electromagnet is responsible for the change in
flux
Current induced in a coil.
 CLASSIFICATION OF TRANSDUCERS
According to Transduction Principle

INDUCTIVE TRANSDUCER:

•In inductive transduction, the measurand is converted into a

change in the self inductance of a single coil. It is achieved

by displacing the core of the coil that is attached to a
mechanical sensing element
 CLASSIFICATION OF TRANSDUCERS
According to Transduction Principle
PIEZO ELECTRIC INDUCTION :

•In piezoelectric induction the measurand is

converted into a change in electrostatic charge q or

voltage V generated by crystals when mechanically it
is stressed as shown in fig.
 CLASSIFICATION OF TRANSDUCERS
According to Transduction Principle
PHOTOVOLTAIC TRANSDUCTION :

•In photovoltaic transduction the measurand is

converted to voltage generated when the junction
between dissimilar material is illuminated as shown
in fig.
Physics of Photovoltaic Generation

n-type
semiconductor
+ + + + + + + + + + + + + + + Depletion Zone
- - - - - - - - - - - - - - - - - -
p-type
semiconductor
 CLASSIFICATION OF TRANSDUCERS
According to Transduction Principle
PHOTO CONDUCTIVE TRANSDUCTION :

•In photoconductive transduction the measurand is

converted to change in resistance of semiconductor
material by the change in light incident on the
material.
CLASSIFICATION OF TRANSDUCERS
Transducer and Inverse Transducer

TRANSDUCER:

•Transducers convert non electrical quantity

to electrical quantity.

INVERSE TRANSDUCER:

•Inverse transducers convert electrical quantity to a

non electrical quantity
PASSIVE
TRANSDUCERS
• Resistive transducers :
• Resistive transducers are those transducers in which the resistance change
due
to the change in some physical phenomenon.
• The resistance of a metal conductor is expressed by a simple equation.
• R = ρL/A Where R = resistance of
conductor in Ω L = length
of conductor in m
A = cross sectional area of
conductor in m2
ρ = resistivity of conductor
material in Ω-m.
RESISTIVE TRANSDUCER
There are 4 type of resistive transducers.

1. Potentiometers (POT)
2. Strain gauge
3. Thermistors
4. Resistance thermometer
POTENTIOMETER
• The potentiometer are used for voltage division. They consist
of a resistive element provided with a sliding contact. The
sliding contact is called as wiper.
• The contact motion may be linear or rotational or combination
of the two. The combinational potentiometer have their
resistive element in helix form and are called helipots.
• Fig shows a linear pot and a rotary pot.
STRAIN GAUGE
• The strain gauge is a passive, resistive transducer which
converts the mechanical elongation and compression into
a resistance change.
• This change in resistance takes place due to variation in
length and cross sectional area of the gauge wire, when an
external force acts on it.
TYPES OF STRAIN GAUGE

• The type of strain gauge are

as
1. Wire gauge
a) Unbonded
b) Bonded
c) Foil type
2. Semiconductor gauge
UNBONDED STRAIN GAUGE
• An unbonded meter strain gauge is shown in fig
• This gauge consist of a wire stretched between two
point in an insulating medium such as air. The wires
may be
made of various copper, nickel, crome nickle or nickle
iron alloys.
• In fig the element is connected via a rod to
diaphragm which is used for sensing the pressure.
The wire are
tensioned to avoid buckling when they experience
the compressive force.
• The unbounded meter wire gauges used almost exclusively
in transducer application employ preloaded resistance wire
connected in Wheatstone bridge as shown in fig.
• At initial preload the strain and resistance of the four arms are
nominally equal with the result the output voltage of the
bridge is equal to zero.
• Application of pressure produces a small displacement , the
displacement increases a tension in two wire and decreases it
in the other two thereby increase the resistance of two wire
which are in tension and decreasing the resistance of the
remaining two wire .
• This causes an unbalance of the bridge producing an output
voltage which is proportional to the input displacement
and hence to the applied pressure .
BONDED STRAIN GAUGE
• The bonded metal wire strain gauge are used for
both stress analysis and for construction of
transducer.
• A resistance wire strain gauge consist of a grid of fine
resistance wire. The grid is cemented to carrier which
may be a thin sheet of paper Bakelite or Teflon.
• The wire is covered on top with a thin sheet of material
so as to prevent it from any mechanical damage.
• The carrier is bonded with an adhesive material to
the specimen which permit a good transfer of strain
from carrier to grid of wires.
BONDED METAL FOIL STRAIN
GAUGE
• It consist of following parts:
1. Base (carrier) Materials: several types of base material are used to support the wires.
Impregnated paper is used for room temp. applications.
2. Adhesive: The adhesive acts as bonding materials. Like other bonding operation,
successful strain gauge bonding depends upon careful surface preparation and use of
the correct bonding agent.
In order that the strain be faithfully transferred on to the strain gauge, the bond has
to be formed between the surface to be strained and the plastic backing material on
which the gauge is mounted .
.
It is important that the adhesive should be suited to this backing and
adhesive material should be quick drying type and also
insensitive to moisture.

3. Leads: The leads should be of such materials which have low

and stable resistivity and also a low resistance temperature
coefficient.
Contd.
• This class of strain gauge is only an extension of
the bonded metal wire strain gauges.
• The bonded metal wire strain gauge have been
completely superseded by bonded metal foil strain
gauges.
• Metal foil strain gauge use identical material to wire
strain gauge and are used for most general purpose stress
analysis application and for many transducers.
SEMICONDUCTOR GAUGE
• Semiconductor gauge are used in application where a high gauge
factor is desired. A high gauge factor means relatively higher
change in resistance that can be measured with good accuracy.
• The resistance of the semiconductor gauge change as strain is
applied
to it. The semiconductor gauge depends for their action upon the
piezo-resistive effect i.e. change in value of resistance due to change
in resistivity.
• Silicon and germanium are used as resistive material for
semiconductor gauges.
RESISTANCE
THERMOMETER
• Resistance of metal increase with increases
in temperature. Therefore metals are said to
have a positive temperature coefficient of
resistivity.
• Fig shows the simplest type of open wire construction
of platinum résistance thermometer. The platinum wire
is wound in the form of spirals on an insulating
material such as mica or ceramic.
• This assembly is then placed at the tip of probe
• This wire is in direct contact with the gas or
liquid whose temperature is to be measured.
• The resistance of the platinum wire changes with
the change in temperature of the gas or liquid
• This type of sensor have a positive temperature
coefficient of resistivity as they are made from metals
they are also known as resistance temperature detector

• Resistance thermometer are generally of probe type

for immersion in medium whose temperature is to be
measured or controlled.
 THERMISTO
R
•Thermistor is a contraction of a term ―thermal resistor‖.
•Thermistor are temperature dependent resistors. They are

made of semiconductor material which have negative

temperature coefficient of resistivity i.e. their resistance
decreases with increase of temperature.
•Thermistor are widely used in application which involve

measurement in the range of 0-60º Thermistor are composed

of sintered mixture of metallic oxides such as manganese,
Nickle, cobalt, copper, iron and uranium.
 Contd.
•The thermistor may be in the form of beads, rods
and discs.
•The thermistor provide a large change in resistance
for small change in temperature. In some cases the
resistance of thermistor at room temperature may
decreases as much as 6% for each 1ºC rise in
temperature.
Thermocouples
See beck Effect
When a pair of dissimilar metals are joined at one end, and there is
a temperature difference between the joined ends and the open
ends, thermal emf is generated, which can be measured in the open
ends.
This forms the basis of thermocouples.
 VARIABLE-INDUCTANCE
TRANSDUCERS
• Aninductive electromechanical
transducer
is a transducer which converts the physical
motion into the change in inductance.
•Inductive transducers are mainly used for
displacement measurement.
• The inductive transducers are of the self generating or
the passive type. The self generating inductive
transducers use the basic generator principle i.e. the
motion between a conductor and magnetic field
induces a voltage in the conductor.

• The variable inductance transducers work on the

following principles.

• Variation in self inductance

• Variation in mutual inductance

PRINCIPLE OF VARIATION OF SELF
INDUCTANCE
• Let us consider an inductive transducer having N turns
and reluctance R. when current I is passed through the
transducer, the flux produced is
• Φ = Ni / R
• Differentiating w.r.t. to t,
• dΦ/dt = N/R * di/dt
• The e.m.f. induced in a coil is given by
• e = N * dΦ/dt
• e = N * N/R * di/dt
• e = N2 / R * di/dt
• Self inductance is given by
• L = e/di/dt = N2 /R
• The reluctance of the magnetic circuit is R = Ɩ/μA
• Therefore L = N2 / Ɩ/μA = N2 μA / Ɩ
• From eqn we can see that the self inductance may vary
i. due to Change in number of turns N
ii. Change in geometric configuration
iii. Change in permeability of magnetic circuit
CHANGE IN SELF INDUCTANCE WITH CHANGE IN
NUMBER OF TURNS N
• From eqn we can see the output may vary with the
variation in the number of turns. As inductive
transducers are mainly used for displacement
measurement, with change in number of turns the
self inductance of the coil changes in-turn
changing the displacement
• Fig shows transducers used for linear and angular
displacement fig a shows an air cored transducer
for the measurement of linear displacement and fig
b shows an iron cored transducer used for angular
displacement measurement.
CHANGE IN SELF INDUCTANCE WITH CHANGE IN
PERMEABILITY
• An inductive transducer that works on the principle of
change in self inductance of coil due to change in the
permeability is shown in fig
• As shown in fig the iron core is surrounded by a winding. If
the iron core is inside the winding then the permeability
increases otherwise permeability decreases. This cause the self
inductance of the coil to increase or decrease depending on the
permeability.
• The displacement can be measured using this transducer
Ferromagneti
c former

displacement coil
VARIABLE RELUCTANCE INDUCTIVE
TRANSDUCER
• Fig shows a variable reluctance inductive transducer.
• As shown in fig the coil is wound on the ferromagnetic iron.
The target and core are not in direct contact with each other.
They are separated by an air gap.
• The displacement has to be measured is applied to the ferromagnetic
core
• The reluctance of the magnetic path is found by the size of the
air gap.
• The self inductance of coil is given by
• L = N2 / R =N2 / Ri +
• Ra
N : number of turns
• R : reluctance of coil
• Ri : reluctance of iron path
• Ra : reluctance of air gap
CONTD.
• The reluctance of iron path is negligible
• L = N2 / Ra
• Ra = la / μoA
• Therefore L œ 1 / la i.e. self inductance of the coil is
inversely proportional to the air gap la.
• When the target is near the core, the length is small. Hence
the self inductance is large. But when the target is away from
the core, the length is large. So reluctance is also large. This
result in decrease in self inductance i.e. small self inductance.
• Thus inductance is function of the distance of the target from
the core. Displacement changes with the length of the air gap,
the self inductance is a function of the displacement.
 PRINCIPLE OF CHANGE IN MUTUAL
INDUCTANCE
• Multiple coils are required for inductive transducers
that operate on the principle of change in mutual
inductance.
• The mutual inductance between two coils is given
by
• M = KsqrtL1L2
• Where M K : coefficient
mutual inductance
of coupling
• L1:self inductance of coil
• 1L2 : self inductance of coil
• By varying
2 the self inductance or the coefficient of
coupling the mutual inductance can be varied
 DIFFERENTIAL
OUTPUT
TRANSDUCERS
• Usually the change in self inductance ΔL for inductive
transducers is insufficient for the detection of stages of
an instrumentation system.
• The differential arrangement comprises of a coil that is
divided in two parts as shown in fig a and b.
• In response to displacement, the inductance of one
part increases from L to L+ΔL while the inductance
of the other part decreases from L to L- ΔL. The
difference of two is measured so to get output 2 ΔL.
This will increase the sensitivity and minimize error.
•.
• Fig c shows an inductive transducer that provides differential
output. Due to variation in the reluctance, the self inductance of the
coil changes. This is the principle of operation of differential output
inductive transducer
LINEAR VARIABLE DIFFERENTIAL
TRANSFORMER(LVDT)
• AN LVDT transducer
comprises a coil former on
to which three coils are
wound.
• The primary coil is excited
with an AC current, the
secondary coils are wound
such that when a ferrite
core is in the central linear
position, an equal voltage is
induced in to each coil.
• The secondary are connected
in opposite so that in the
central position the outputs
of the secondary cancels
each other out.
 LVDT
contd…
• The excitation is applied to the
primary winding and the armature
assists the induction of current in to
secondary coils.
• When the core is exactly at the center of
the coil then the flux linked to both the
secondary winding will be equal. Due
to equal flux linkage the secondary
induced voltages (eo1 & eo2) are equal
but they have opposite polarities.
Output voltage eo is therefore zero.
This position is called ―null position‖
• Now if the core is displaced from its null position toward sec1
then flux linked to sec1 increases and flux linked to sec2
decreases. Therefore eo1 > eo2 and the output voltage of LVDT eo
will be positive
• Similarly if the core is displaced toward sec2 then the eo2 > eo1
and the output voltage of LVDT eo will be negative.
Transduce
rs

301
 Terminolog
•
Tyransducers convert one form of energy into another
• Sensors/Actuators are input/output transducers
• Sensors can be passive (e.g. change in resistance) or active
(output is a voltage or current level)
• Sensors can be analog (e.g. thermocouples) or digital
(e.g. digital tachometer)

Sensor Actuator
302
 Transducer
typ
Quantity es Input Device Output
being Device
Measured (Sensor)
(Actuator)

Light Level Light Dependant Resistor (LDR), Lights & Lamps, LED's &
Photodiode, Phototransistor, Solar Cell Displays, Fiber Optics
Thermocouple, Thermistor, Heater, Fan,
Temperature Thermostat, Resistive temperature Peltier
detectors (RTD) Elements
Force/Pressur Strain Gauge, Pressure Switch, Load Lifts & Jacks,
e Cells Electromagnetic, Vibration
Position Potentiometer, Encoders, Motor, Solenoid,
Reflective/Slotted Opto-switch, LVDT Panel Meters
Speed Tacho-generator, Reflective/Slotted AC and DC Motors, Stepper
Opto-coupler, Doppler Effect Sensors Motor, Brake
Sound Carbon Microphone, Piezo-electric Bell, Buzzer, Loudspeaker
Crystal 303
 Positional Sensors:
p o t e n t ier
Can be L omet
inea r o r Ro tatio na l

Processing
circuit

304
 Positional Sensors:
LVDT
Linear Variable
Differential
Transformer

305
Positional Sensors: Inductive Proximity
S•wDitectehcts the presence of metallic objects (non-contact)
via changing inductance
• Sensor has 4 main parts: field producing Oscillator via a
Coil; Detection Circuit which detects change in the field;
and Output Circuit generating a signal (NO or NC)
Used in traffic lights (inductive loop buried under the road). Sense
objects in dirty environment.
Does not work for non-metallic objects. Omni-directional.

306
Positional Sensors: Rotary
E• nInccroemdeentrasl and absolute types
• Incremental encoder needs a counter, loses absolute
position between power glitches, must be re-
homed
• Absolute encoders common in CD/DVD drives

307
Temperature
S• eBnimsetoalrlisc switch (electro-mechanical) –
used in thermostats. Can be ―creep‖ or ―snap‖
Creep-action: coil or spiral that unwinds or coils with changing
temperature
action.

• Thermistors (thermally sensitive resistors); Platinum

Resistance Thermometer (PRT), very high accuracy.

308
Thermocoupl
e• sTwo dissimilar metals induce voltage difference (few
mV per 10K) – electro-thermal or Seebeck effect

• Use op-amp to process/amplify the voltage

• Absolute accuracy of 1K is difficult

309
310
Light sensors: photoconductive
c•eLlilgsht dependent resistor (LDR) cell

311
Light level sensitive
switch

312
Photojunction
devices
phototransistor
photodiode

313
Photovoltaic Solar
C• eClalnsconvert about 20% of light power into
• Voltage is low (diode drop,
electricity
~0.6V)

Solar power is 1.4kW/m^2

314
Photomultiplier tubes
(•PMMosTt s)ensitive of light sensors (can detect
individual photons)
• Acts as a current source

electrons

315
Motion
s•eSnwsitcoherss,
s/•ortMotors
leanonidss,dreulacyse, mrsotors, etc.
• DC
• Brushed/brushless
Stepper motor
• Servo
• Stepper motors
• AC

Brushed motor – permanent magnets on armature, rotor acts as electromagnet

316
Brushless motor – permanent magnet on the rotor, electromagnets on armature are switched
Sound
transducers
microphone speaker

• Note: voice coil can also be used to generate fast motion

317
Piezo
t•raDnetsecdt muoctieonr(shigh and
• Sound (lab this week), pressure, fast motion
low frequency)
• Cheap, reliable but has a very limited range of
motion

318
 UNIT-
V

Bridges, Measurement of Physical

parameters
 Introduction to Bridge.
 Bridge circuits are the instrument s for making comparisons

measurements, are widely used to measure resistance,

inductance, capacitance and impedance.

 Bridge circuits operate on a null-indication principle, the

indication is independent of the calibration of the indicating

device or any characteristics of it. It is very accurate.
The Wheatstone Bridge.

 The Wheatstone bridge consists of two parallel resistance branches with each
branch containing two series resistor elements.
 A DC voltage source is connected across the resistance network to provide a
source of current through the resistance network.
 A null detector is the galvanometer which is connected between the parallel
branches to detect the balance condition.
 The Wheatstone bridge is an accurate and reliable instrument and heavily used
in the industries.
The Wheatstone Bridge.

 Operation
(i) We want to know the value of R4, vary one of the remaining resistor
until the current through the null detector decreases to zero.
(ii)the bridge is in balance condition, the voltage across resistor R3 is
equal to the voltage drop across R4.
 At balance the voltage drop at R1 and R2 must be equalto.

I 3 R3  I 4 R 4
Cont’d…

 No current go through the galvanometer G, the bridge is in balance

so,
I1 R1  I 2 R2

I1  I 3 I2 I
4

 This equation, R1R4 = R2R3 , states the

condition for a balance Wheatstone I1 R3  I 2 R4
bridge and can be used to compute R1  R2
the value of unknown resistor.
R3
R4
or
R1R4 
Example 5.1: Wheatstone Bridge.
Determine the value of unknown resistor, Rx in the circuit.
assuming a null exist ; current through the galvanometer is zero.

Solution:
From the circuit, the product of the resistance in opposite arms of the bridge is
balance, so solving for Rx

R2 R3
Rx 
R x R1  R 2 R 3 R1

 15K * 32K 
Sensitivity of the Wheatstone Bridge.
 When the bridge is in unbalance condition, current flows through
the galvanometer causing a deflection of its pointer.
 The amount of deflection is a function of the sensitivity of
the galvanometer.
 Sensitivity is the deflection per unit current.
 The more sensitive the galvanometer will deflect more with the same
amount of current.

S
milimeters  degrees  radian
μΑ μΑ μΑ

Total
deflection, D
SI
Unbalanced Wheatstone Bridge.
• The current flows through the galvanometer can determine
by using Thevenin theorem.

RTh  Ra b  R1 // R3  R2 // R4


 R   R4 
 E R  R
3
VTh  Vab  E
R  R 
 1 3   2 4 
Unbalanced Wheatstone
Bridge.

The deflection current in the galvanometer

is
Ig  Vth

R th  R g

Rg = the internal resistance in the

galvanometer
 Kelvin Bridge.
 The Kelvin Bridge is the modified version of the Wheatstone Bridge.

 The modification is done to eliminate the effect of contact and lead

resistance when measuring unknown low resistance.

 By using Kelvin bridge, resistor within the range of 1  to approximately

1 can be measured with high degree of accuracy.

 Figure below is the basic Kelvin bridge. The resistor Ric represent the lead

and contact resistance present in the Wheatstone bridge.

Cont’d
…

Full Wave Bridge Rectifier Used in

AC Voltmeter Circuit.

R x  R 2 R3
1
 The second set of Ra and Rb compensates for this R
relatively low lead contact resistance Rx R3
 At balance the ratio of Ra and Rb must be equalto R2 R1
the ratio of R1 to R3.
R x  RR
1 3 Ra

Rb R2
Example : Kelvin Bridge.
Figure below is the Kelvin Bridge, the ratio of Ra to Rb is 1000. R1 is 5 Ohm and R1
=0.5 R2.
Solution:
Find the value of Rx. Calculate the resistance of Rx,

Rx  R b  1
R2 Ra
R1 =0.5 R2, 1000
so calculate R2

R2 R1 5
 10  0.5 
0.5
Calculate the value of Rx
1 
R x  R2 
  1000 

1 
 10
1000 
 0.01
Introduction to AC Bridge.
 AC bridge are used to measure impedances.
 All the AC bridges are based on the Wheatstone bridge.
 In the AC bridge the bridge circuit consists of four impedances and an
ac voltage source.
 The impedances can either be pure resistance or complex impedance.
Cont’d
…

 When the specific circuit conditions apply, the detector current becomes zero,
which is known as null or balance zero.

 bridge circuits can be constructed to measure about any device value desired,
be it capacitance, inductance, resistance

 the unknown component's value can be determined directly from the setting
of the calibrated standard value
A simple bridge circuits are shown
below;

inductanc capacitance
e
Similar angle Bridge.
 used to measure the impedance of a capacitance circuit.
 Sometimes called the capacitance comparison bridge or series
resistance capacitance bridge

R2
R  R R3
x
1

R
C x  R 1 C3
2
Opposite angle Bridge.
 From similar angle bridge, capacitor is replaced by inductance
 used to measure the impedance of a inductive circuit.
 Sometimes called a Hay bridge

 2
R R R C 2
Rx  1□ 2 3 21 2
1 2 R1 C1
R2R3C1
Lx 
1 2 R12C12
Wien Bridge.
 uses a parallel capacitor-resistor standard impedance to
balance out an unknown series capacitor-resistor
combination.
 All capacitors have some amount of internal resistance.

R1  1 
Rs   Rx  2 
R  R xC x 
2

2 
R2 1 
Cs   2 
Cx
R 1  Rx C x 
2 2

1 

R2 Rs 
Rx 
R 1 2 s 2C s 2 
1 1 
2 R
1 
R 
C x  1  Cs  2 R 2C 2 
R2  s s 

Maxwell-Wien Bridge.
 used to measure unknown inductances in terms of calibrated resistance
and capacitance.
 Because the phase shifts of inductors and capacitors are exactly opposite
each other, a capacitive impedance can balance out an inductive
impedance if they are located in opposite legs of a bridge

 Sometimes called a Maxwell bridge

R x
3 Rs Please
Lx  R2 R3Cs prove
R 2 R3 it !!!

2
Measurement of Physical
parameters

338
 Transduc
er
 Transducer is defined as a device which convert energy or
information from one form to another. Transducer may be
mechanical, electrical, magnetic, optical, chemical, thermal
or combination of two or more of these.

339
Electrical
Transd•uMceosrtsquantities to be measured are
non-electrical such displacement,
temperature, pressure, as humidity, fluid flow,
speed, pH, etc., but these quantities cannot be measured
directly. Hence such quantities are required to be sensed and
changed into some other form of quantities.

• Therefore, for measurement of non-electrical quantities these

are to be converted into electrical quantities (because these are
easily measurable). This conversion is done by device called
Electrical Transducer
340
 Classification of transducers

1. Based on principle of transduction

2. Active & passive

3. Analog & digital

4. Inverse transducer

341
Based on principle used

• Thermo electric

• Magneto
resistive
• Electro kinetic

• Optical

342
Passive
transducer
Device which need external power for
transduction from auxiliary power source

Eg : resistive, inductive,
capacitive Without power they
will not work

343
Active
transducer
• No extra power required.

• Self generating

• Draw power from input applied

• Eg. Piezo electric x’tal used for acceleration measurement

344
 Resistive
Transducer
 In this transducer, the resistance of the output terminal
of the transducer gets varied according to the
measurand.

Some resistive transducers are:-

Potentiometer

Strain gauge

Resistance Thermometer

345
RESISTIVITE POTENTIOMETERS

A resistance element provided with a movable contact. This is

very simple and cheap form of transducer and is widely used. It
convert linear or rotational displacement into a voltage.
The contact motion can be
 Linear

 rotatio
n
 combination of the two such as helical

346
347
Strain
 It is a device
strain and which
one is used
of the for measuring
most mechanical
extensively used surface
electrical
Gauge s
transducer. It can detect and convert force or small mechanical
displacement into electrical signal. Many other quantities such
as torque, pressure, weight and tension etc, which involve the
effect of force or displacement can be measured with string
gauge.

 Gauge Factor (G) = Change in resistance per unit strain.

Strain Gauge can be of four types:-

1. Wire strain gauge
2. Foil strain gauge
3. Thin film strain gauge
4. Semiconductor strain gauge
348
 INDUCTIVE TRANSDUCERS
 Inductive transducers are those in which SELF INDUCTANCE of a
coil or the MUTUAL INDUCTANCE of a pair of coil is altered due
to variation in the measurand.
 Change in inductance ∆L is measured.

 The self inductance of a coil refers to the flux linkage within the
coil due to current in the same coil.

 Mutual inductance refers to the flux linkages in a coil due to

current in adjacent coil.

349
350
CAPACITIVE TRANSDUCERS

A capacitor is an electrical component which

essentially consists of two plates separated by an
insulator.

The property of a capacitor to store an electric

charge when its plates are at different potential is
referred to as capacitance.
351
 Q
Capacitance C =
V
If the capacitance is large, more charge is needed
to establish a given voltage difference.
The between two parallel
capacitance metallic

plates of area

C
.
 0 r A  0  8.85 1012 F
d  m

 352
353
354
Linear Variable Differential
Transformer
(LVDT)

355
356
•There is one primary winding connected to an ac source (50
Hz – 20 kHz), excitation 3 – 15 Vrms.
• Core is made of high permeability soft iron or nickel
iron.
• Two secondary windings are connected in
series
opposition

357
358
Geometric centre of coil arrangement is called the
NULL position. The output voltage at the null position
is ideally zero.
However it is small but nonzero (null voltage).
Why?

1.Harmonics in the excitation voltage and stray

capacitance coupling between the primary and
the secondary
2. Manufacturing 359
Advantages
1. Wide range of displacement from µm to cm.
2. Frictionless and electrical isolation.
3. High output.
4. High sensitivity [sensitivity is expressed in mV
(output voltage)/ mm (input core displacement)].

360
Disadvantages
1. Sensitive to stray magnetic fields.
2. Affected by vibrations.
3. Dynamic response is limited mechanically by the mass of
core and electrically by frequency of excitation voltage.

361
Pressure
Measurement
 The measurement of force or pressure can be done by
converting the applied force or pressure into displacement by
elastic element ( such as diaphragam, capsule, bellows or
bourdon tube) which act as primary transducer.

 This displacement, which is function of pressure is measured

by transducer which act as secondary transducer (these
may be potentiometer, strain gauge, LVDT, piezoelectric,etc.).

362
Output of
LVDT

363
 Bourdon Tube Pressure
Gauge
⚫Perhaps the most common device around today is the
pressure gauge which utilizes a bourdon tube as its
sensing elements.
⚫Bourdon : A bourdon tube is a curved, hollow tube with
the process pressure applied to the fluid in the tube. The
pressure in the tube causes the tube to deform or uncoil. The
pressure can be determined from the mechanical
displacement of the pointer connected to the Bourdon
tube. Typical shapes for the tube are ―C‖ (normally
for local display), spiral and helical.
5/9/2012 PUNJAB EDUSAT 364
SOCIETY
 Bourdon Tube Pressure Gauge
Bourdon tubes are generally
are of three types;
1. C-type
2. Helical type
3. Spiral type

5/9/2012 PUNJAB EDUSAT 365

SOCIETY
 Thermo-
couple

1 2

The thermocouple is one of the most commonly used method for

measuring the process temperature. The operation is based on
seebeck effect.
Thermo-couple consists of two dissimilar metals joined together
as shown. It forms two junctions 1 and 2 in which one junction is
hot and other is cold. Due to this difference in temperature, an
e.m.f. is generated and electric current flow in circuit.

366
Flow
M•
This is suitable for measurement of slurries, sludge and any
electrical conducting liquid.
Eel ectaromsaugnreectimFol ew

mnetter:-

flow

367
Electromagnetic flow meter consist of insulated electrodes pair buried
in opposite sides of non conducting pipe placed in magnetic field of
electromagnet.
The voltage induced across electrodes is E=Blv volts

368
Liquid Level
Measurement
• Gamma Ray Method

Geiger
Muller
tube

Source of
Gamma rays

The liquid level can be measured with ultrasonic method and by using float
also
369
PIEZOELECTRI
C AND
HALL EFFECT
TRANSDUCERS

370
Piezoelectricity
Phenomenon of generating an electric charge in a material
when subjecting it to a mechanical stress (direct effect).
and
Generating a mechanical strain in response to an applied electric field

(converse effect).

Piezoelectric materials are Anisotropic – Electrical and mechanical

properties differ along different directions

371
372
There are two families of constants: ‘g’ constants and ‘d’
constants. In the constants the first subscript refers to the
direction of electrical effect
and the second to that of the mechanical effect according
to the axis systems. 373
374
375
Commercially available Hall generators made
of :

• Bulk Indium Arsenide (InAs)

• Thin Film InAs

• Gallium Arsenide (GaAs)

• Indium Antimonide (InSb).

376
 RESISTANCE TEMPERATURE
DETECTOR (RTD)
⚫Resistance temperature detector (RTD) devices are
conductors used for temperature sensing.
⚫They can be used in bridge method as well as
ohmmeter method to take the output.
⚫The change in resistance of material per unit change in
temperature should be as large as possible.

5/9/2012 PUNJAB EDUSAT SOCIETY 377

 RESISTANCE TEMPERATURE
DETECTOR (RTD)
• The material should have high value of resistivity to get
required value in less space.
• Resistance and temperature relation should be
continuous and stable.
• Platinum, nickel and copper are the most commonly
used.
• Tungsten and nickel alloy are also used.

5/9/2012 PUNJAB EDUSAT SOCIETY 378

APPLICATIONS OF RTD
• They can be used in average and differential temp.
measurement.
• Differential temp. sensing to an accuracy of 0.05º have
been accomplished in a nuclear reactor coolant heat rise
application.

5/9/2012 PUNJAB EDUSAT SOCIETY 379

Humidity
Meas• uHurmedi mtiyesi nthte amount of water vapour in
the air and Humidity Measurement is a measure
of relative amount of water vapour present in the
air or a gas.
The humidity can be expressed in different ways:
• Absolute Humidity
• Relative Humidity
• Dew Point

5/9/2012 PUNJAB EDUSAT SOCIETY 380

 Humidity
•MDeevaciess uthraet ni mdri eecntyl t measure
humidity by sensing changes in physical or
electrical properties in materials due to
their moisture content are called
hygrometers.
• The three major instruments used for measuring
humidity in industry are:
• The Electrical Hygrometer
• The Psychrometer
• The Dew Point Meter

5/9/2012 PUNJAB EDUSAT SOCIETY 381

Humidity
Measurement

5/9/2012 PUNJAB EDUSAT SOCIETY 382

 Resistance
•HTyhisgisroanmeleecttreicarl hygrometer.
• It is an active transducer.
• These instruments are suitable for measuring
moisture levels between 15% and 95%.
• It has typical measurement uncertainty of
3%.
• Atmospheric contaminates and operation in saturation
conditions both cause characteristics drift.

5/9/2012 PUNJAB EDUSAT SOCIETY 383

 Principle Of Resistance
H•ySgomreoHmygerotsceorpci Salts exhibit a change in
resistivity with humidity. Resistive hygrometer
humidity sensors use the change in resistance of a
hygroscopic material between two electrodes on
an insulating substrate.
• The hygroscopic salt is deposited between two
electrodes. The resistance of the element changes
when it is exposed to variations in humidity.

5/9/2012 PUNJAB EDUSAT SOCIETY 384

 Resistance
H• TyhegRreosismtaneceteHyrgrometer
should not be exposed to conditions of 100%
humidity as the resulting condensation may
damage the device.
• These are accurate to within ± 2.5 % or ± 1.5 %
in some cases.
• Response times are typically of the order of a
few seconds.

5/9/2012 PUNJAB EDUSAT SOCIETY 385

APPLICATI
OHumidity
• sensors can be used not only to measure the humidity in an
atmosphere but also to automatically control:
NS
-> Humidifiers
-> Dehumidifiers
-> Air conditioners for adjustment.

5/9/2012 PUNJAB EDUSAT SOCIETY 386

Data Acquisition
System
PC-based Data
Acquisition System
Overview
• In the last few years, industrial PC I/O interface products have become
increasingly reliable, accurate and affordable. PC-based data acquisition
and control systems are widely used in industrial and laboratory
applications like monitoring, control, data acquisition and automated
testing.

• Selecting and building a DA&C (Data Acquisition and Control) system that
actually does what you want it to do requires some knowledge of electrical
and computer engineering.

• Transducers and actuators

• Signal conditioning
• Data acquisition and control hardware
• Computer systems software
 Data Acquisition System
Introduction I
A data acquisition system consists of many components that are
integrated to:
• Sense physical variables (use of transducers)
• Condition the electrical signal to make it readable by an A/D
board
 Data Acquisition System
Introduction II
• Convert the signal into a digital format acceptable by a computer
• Process, analyze, store, and display the acquired data with the help of
software
Data Acquisition
System
Block Diagram
 Transduce
rs
Sense physical phenomena and translate
it into electric signal.

 Temperature  Displacement
 Pressure  Level
 Light  Electric signals
 Force  ON/OFF switch
Transducers and Actuators
• A transducer converts temperature, pressure, level, length,
position, etc. into voltage, current, frequency, pulses or other
signals.
• An actuator is a device that activates process control equipment by
using pneumatic, hydraulic or electrical power. For example, a valve
actuator opens and closes a valve to control fluid rate.
Signal
Conditioning
• Signal conditioning circuits improve the quality of signals generated
by transducers before they are converted into digital signals by the
PC's data-acquisition hardware.
• Examples of signal conditioning are signal scaling, amplification,
linearization, cold-junction compensation, filtering, attenuation,
excitation, common-mode rejection, and so on.
Signal
•COonenodf thiteimoonsticnomgmon signal conditioning
functions is amplification.
• For maximum resolution, the voltage range of the input signals
should be approximately equal to the maximum input range of
the A/D converter. Amplification expands the range of the
transducer signals so that they match the input range of the
A/D converter. For example, a x10 amplifier maps transducer
signals which range from 0 to 1 V into the range 0 to 10 V
before they go into the A/D converter.
Signal
Conditioning
Electrical signals are conditioned so they can be
used by an analog input board. The following
features may be available:

 Amplification  Filtering
 Isolation Linearization
Data
Acquisition
•
Data acquisition and control hardware generally performs one or
more of the following functions:
• analog input,
• analog output,
• digital input,
• digital output and
• counter/timer functions.
Analog Inputs (A/D)
• Analog to digital (A/D) conversion changes analog
voltage or current levels into digital information. The
conversion is necessary to enable the computer to
process or store the signals.
Analog Inputs (A/D)
• The most significant criteria when selecting A/D hardware are:
• 1. Number of input channels
• 2. Single-ended or differential input signals
• 3. Sampling rate (in samples per second)
• 4. Resolution (usually measured in bits of resolution)
• 5. Input range (specified in full-scale volts)
• 6. Noise and nonlinearity
 Analog to Digital
(A/D)
Converter
• Input signal  Resolution
• Sampling rate  Range
• Throughput  Gain
A/D
ICnopuntvSei
rget nra:•l Analog
 Signal is continuous
Example: strain gage. Most of transducers
produce analog signals

 Digital
 Signal is either ON or
OFF Example: light
switch.
A/D
Converter:
Sampling Rate
 Determines how often conversions take place.
 The higher the sampling rate, the better.

16 Samples/cycle
Analog
8 Samples/cycle
Input
A/D
SCaomnvpelintrger
R:ate • Aliasing.
Acquired signal gets distorted if sampling
rate is too small.
A/D
CThornovueg
htrpeu:rt
Effective rate of each individual channel is inversely
proportional to the number of channels sampled.
Example:
• 100 KHz maximum.
• 16 channels.
100 KHz/16 = 6.25 KHz per channel.
A/D
Converter:
Range
• Minimum and maximum voltage levels that the
A/D converter can quantize

 Ranges are selectable (either

hardware or software) to
accurately measure the signal
A/D
Converter:
Resolution
Analog Outputs (D/A)
• The opposite of analog to digital conversion is digital to
analog (D/A) conversion. This operation converts digital
information into analog voltage or current. D/A devices
allow the computer to control real-world events.
• Analog output signals may directly control process
equipment. The process can give feedback in the form of
analog input signals. This is referred to as a closed loop
control system with PID control.

• Analog outputs can also be used to generate waveforms. In

this case, the device behaves as a function generator.
Analog Outputs (D/A)
 Data Acquisition
Software
• It can be the most critical factor in obtaining reliable, high
performance operation.
• Transforms the PC and DAQ hardware into a complete DAQ, analysis,
and display system.
• Different alternatives:
• Programmable software.
• Data acquisition software packages.
 Programmable
Software
• Involves the use of a programming language, such as:
• C++, visual C++
• BASIC, Visual Basic + Add-on tools (such as VisuaLab with VTX)
• Fortran
• Pascal
 Advantage: flexibility
 Disadvantages: complexity and steep learning curve
 Data Acquisition
Software
• Does not require programming.
• Enables developers to design the custom instrument
best suited to their application.
Examples: TestPoint, SnapMaster, LabView, DADISP,
DASYLAB, etc.
Designing a DAS: Factors to
Consider
 Is it a fixed or a mobile application?
 Type of input/output signal: digital or analog?
 Frequency of input signal ?
 Resolution, range, and gain?
 Continuous operation?
Compatibility between hardware and software. Are the
drivers available?
 Overall price.