Image Dimension Measurement System
Advanced measurements made simple!
High-Precision Model
Measurement Examples
STEP STEP
1 Place 2 Press
Image Dimension Measurement System
(High-Precision Model)
LM Series
POINT
High-precision
measurement in just
2 steps!
Problems with conventional
high-precision measurement systems Solutions with the LM Series
Conventional Problems
Using conventional measuring microscopes
and optical CMMs opens the door to a
variety of problems.
Optical CMM
Measuring with high accuracy is not easy
Configuring settings is difficult
Measurement takes a long time
Measuring microscope
CAS E 1 Conventional image LM image
Precision processed
metal component
Superior clarity makes it possible to
confirm the cutting marks on the
surface of the part.
30× magnification High-magnification camera with
1.5 × 3 mm field of view
100× magnification
CAS E 2 Conventional image
Chip capacitor electrode
The higher magnification provides a
clearer look at the electrode portion
of the capacitor on the PCB. LM image
High-magnification camera with
0.5 × 0.9 mm field of view
2
Solutions with the LM Series
The LM Series enables easy high-precision
measurement for all operators.
Easy, accurate measurement
Easily configurable settings
Measurements in as little as 3 seconds
Image Dimension Measurement
System (High-Accuracy Model)
LM Series
Measure the distances from
end surfaces, hole pitches,
corner radii, and chamfered
surfaces all at the same time.
Measure not only the vertical,
horizontal, and height dimensions
of capacitors but also the electrode
dimensions simultaneously.
3
Easy to use for anyone
Process & Worksite Measurement Examples
CASE 1
Inspection of prototypes and first
off-tool parts
Improved productivity with shortened set-up times
Measurement that does not depend on experience level
Measurement based on traceability of international
standards
Timepiece components
High-resolution images over a wide field of view enable
accurate measurement of detailed shapes of timepiece
components and other processed products.
CASE 2
In-process inspections and
sampling
Improved capacity with reduced inspection times
Improved yield with improved equipment accuracy
In-process defect detection management
Probe pins
Measurement of sharp-tipped points such as a needle is
possible with the LM Series. Stable measurement of the
outer diameter of the cylinder is also possible with no light
wraparound thanks to parallel transmitted light.
4
CASE 3
Pre-shipping inspections
Meet tight shipping inspection deadlines
Reduce time spent producing inspection records
Reduced labour costs and time spent training users
Cutting tools
Measure not only the inscribed circle but also the distance
from the inscribed circle to the vertex, the tip radius, and
the honing width all at the same time.
CASE 4
Incoming inspections
Acceptance inspection of multiple product types
according to a fixed standard
Reduced risk of defects even with increased inspection
quantities
Improved quality through measurement of previously
un-inspected points
Connector case (plastic moulded product)
Measure the centre-to-centre pitch distance of terminal
insertion openings and external dimensions all at once.
5
Easy to use for anyone
High Speed & High Accuracy Measurement Examples
Lead frames
Typical measurement Individual pattern measurement
Position measurement from reference hole
Accurate measurement is possible even for complex
pressed parts by using lighting equipment suited to the
measurement location.
Flexible PCBs and camera modules
Typical measurement Device position misalignment measurement
Position measurement of mounted parts
The LM Series is equipped with an auto-focus function.
The LM Series enables high-precision measurement even for parts
with height differences by capturing focused images at each height.
6
Connectors, cases, and plastic precision moulded parts
Typical measurement Measurement using reference lines
Pitch measurement
Up to 300 points can be measured simultaneously without
the need for positioning. The illumination conditions are
also reproduced automatically, making it possible to
perform measurements with no variations between users.
Ceramic capacitors, crystal oscillators, ICs,
and other mounted parts
Typical measurement Measurement using reference lines
Pitch measurement
The LM Series is capable of 0.1 μm repeatability, enabling “place-
and-press measurement” even for microscopic parts.
7
Place and Press
Two choices for fast dimensional measurements
For users of For users of
Optical Comparators, Vernier Measuring Microscopes and
Calipers, and Micrometers Optical CMMs
Fast and easy measurement High-precision measurement
over a large area regardless of user
NEW Image Dimension Measurement System NEW Image Dimension Measurement System
(Wide Field of View Model) (High-Precision Model)
IM Series LM Series
SAFETY INFORMATION
Please visit: www.keyence.com Please read the instruction manual carefully in
order to safely operate any KEYENCE product.
GLOBAL NETWORK CONTACT YOUR NEAREST OFFICE FOR RELEASE STATUS
AUSTRIA CZECH REPUBLIC INDIA MALAYSIA ROMANIA TAIWAN
BELGIUM FRANCE INDONESIA MEXICO SINGAPORE THAILAND
BRAZIL GERMANY ITALY NETHERLANDS SLOVAKIA UK & IRELAND
CANADA HONG KONG JAPAN PHILIPPINES SLOVENIA USA
CHINA HUNGARY KOREA POLAND SWITZERLAND VIETNAM
The information in this publication is based on KEYENCE’s internal research/evaluation at the time of release and is subject to change without notice. WW11-1039
Company and product names mentioned in this catalogue are either trademarks or registered trademarks of their respective companies. Unauthorised reproduction of this catalogue is strictly prohibited.
Copyright © 2021 KEYENCE CORPORATION. All rights reserved. LMhighprecisionex-WW-TG2-GB 2021-1 601077
