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Quality Control

The document presents an analysis of control charts and quality improvement tools in Total Quality Management. It includes calculations for X-bar and P charts, showing control limits and process stability, along with visual tools like histograms, Pareto diagrams, Ishikawa diagrams, and scatter plots to identify and analyze defects and manufacturing delays. The findings indicate that the processes are under control and highlight areas for potential improvement.

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Bijay Bista
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5 views7 pages

Quality Control

The document presents an analysis of control charts and quality improvement tools in Total Quality Management. It includes calculations for X-bar and P charts, showing control limits and process stability, along with visual tools like histograms, Pareto diagrams, Ishikawa diagrams, and scatter plots to identify and analyze defects and manufacturing delays. The findings indicate that the processes are under control and highlight areas for potential improvement.

Uploaded by

Bijay Bista
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
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Download as PDF, TXT or read online on Scribd
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Control Chart, Attribute Chart, and Quality

Improvement Tools
Name: Sudarshan Pandey
Roll Number: 13
Course Name: Total Quality Management (BIOT 403)
Instructor Name: Bishnu Maya KC, PhD
Submission Date: 6th January, 2024

1. Control Chart

● X-bar Chart

Dataset:
subgroup Measureme Measurement 2 Measurement
nt 1 x-bar
3

1 48.80 53.70 49.97 50.82

2 47.88 51.65 47.56 49.03

3 50.42 46.08 47.34 47.95

4 50.39 51.48 50.34 50.74

5 49.77 49.40 47.04 48.74

Steps:

1. The average (X-bar) for each subgroup was calculated.


2. The grand average was determined using the formula:
3. UCL and LCL were calculated using the formula:
where is the average range, and is a constant based on subgroup size.

Control Limits:
● UCL:51.49
● CL (Grand Average): 49.46
● LCL: 47.42
2. Attribute Chart

● P Chart

Dataset:
Sample Sample size Defective items Proportion
defective(p)

1 100 7 0.07

2 100 4 0.04

3 100 13 0.13

4 100 11 0.11

5 100 8 0.08

Steps:
1. The proportion defective (p) for each sample was calculated using the
formula 2. The average proportion defective was computed
3. UCL and LCL were calculated

Control Limits:
● Average Proportion Defective (p-bar): 0.086
● Upper Control Limit (UCL): 0.170
● Lower Control Limit (LCL): 0.002

The P chart is plotted above, showing the proportion defective for each sample. All points
are within the control limits, indicating the process is under control.

Quality Improvement Tools:

Tool 1: Histogram

From this dataset:

A histogram to visualize the defect frequencies

Defect type Frequency

a 18

b 30
c 12

d 25

e 15

Tool 2: Pareto Diagram

Dataset:
Defect type Frequency Cumulative
Cumulative
frequency
percentage(%)

f 30 30 30

h 25 55 55

e 18 73 73

i 15 88 88

g 12 100 100
Steps:

1. Defect types were ranked by frequency in descending order.


2. Cumulative frequency and percentage were calculated.
3. A bar graph with cumulative percentage as a line graph was plotted.

Tool 3: Ishikawa Diagram

Explore potential causes of delays in manufacturing.

● Main problem: Manufacturing Delays


● Cause categories:
○ Manpower: Insufficient training, absenteeism.
○ Machines: Breakdowns, lack of maintenance.
○ Materials: Low quality, delivery delays.
○ Methods: Inefficient processes, lack of standardization.
○ Environment: Poor working conditions, temperature issues.
Ishikawa Diagram: A cause-and-effect diagram for "Manufacturing Delays.
Tool 4: Scatter Diagram

Dataset:

○ Machine Speed (RPM): [10, 20, 30, 40, 50]


○ Number of Defects: [8, 6, 4, 5, 2]
Scatter Plot: This shows the relationship between machine speed and the number
of defects. As machine speed increases, defects tend to decrease, with some
variability

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