Micron Confidential and Proprietary aan cron 2Gb: x8, x16 NAND Flash Memory Features Part Numbering Information Micron NAND Flash devices are available in different configurations and densities. Verily valid part numbers by using Micron’s part catalog search at www-micron.com. To compare features and specifications by device type, visit www.micron.com/products, Contact the factory for devices not found. A WP oe om x ESE Design Revision (shrink) Production status reduction Engineering sample lechanical ample 5 = Qualification sample Reserved for Future Use Blank Operating Temperature Range Blank = Commercial 0°C te #70") TT industrial 40" to 485°C) Speed Grade Blank Package Code Figure 1: Marketing Part Number Chart MT 29F 26 08 A BOA E Micron Technology Product Family 29F = NAND Flash memary Density 26-260 Device width ob=s.it 16= 16-bit Level Classification Mark [Die | nCE | RnB | 16 Channel HC= 63-ball VEGA (105 13 1.0mm) Ha = 63-ball FBGA (9x11 x Lom) ‘Operating Voltage Range sv @7-36) Interface B= 18 (17-495) A= Asynconl Feature Set 2 Tio ale ncaaMicron Confidential and Proprietary aan cron 2Gb: x8, x16 NAND Flash Memory Features READ FOR INTERNAL DATA MOVE (00h-35h) 73 PROGRAM FOR INTERNAL DATA MO! 10h) "a PROGRAM FOR INTERNAL DATA MOVE TWO-PLANE (85h-11h) ..... - . sosnne TB: Block Lock Feature 76 WP# and Block Lock ..... . - . ecnes 76 UNLOCK (23h-24h) ..... oe oe oe one 76 LOCK (2h) 79 LOCK TIGHT (2Ch .... : a . 7 omseimesensens BO BLOCK LOCK READ STATUS (7Ab) ...... ose ose ose al One-Time Programmable (OTP) Operations 83 Legacy OTP Commands on . os 83 OTP DATA PROGRAM (80h- 10h)... oe a 84 RANDOM DATA INPUT (85h) 85 OTP DATA PROTECT (80h-10) oe ose ose soon 86 OTP DATA READ (00h-30h) oe - vo ces BB ‘Two-Plane Operations 90 ‘Two-Plane Addressing ...... ose soe oe oes 90) Interleaved Die (Multi-LUN) Operations 99 Error Management 100 Internal ECC and Spare Area Mapping for ECC . so - 102 Electrical Specifications 104 Electrical Specifications — DC Characteristics and Operating Conditions 106 lectrical Specifications — AC Characteristics and Operating Conditions . - 108 Electrical Specifications ~ Program/Erase Characteristics M1 Asynchronous Interface Timing Diagrams 12 Revision History . oe - oa vee 124 Rev. H, Production- 9/10 124 Rev. G, Preliminary - 8/10... os . . - . soon V2 Rev. F, Preliminary ~6/10 ...... sineinennnnnnninninnaninnnneinennanieninnnmnsnnsnans 2A Rev. E, Advance ~ 5/10 124 Rev. D, Advance~3/10 124 Rev. C, Advance - 1/10 124 Rev. B, Advance - 9/09 124 Rev. A, Advance — 7/09 os snrn sinnnnnninninaninnennitinnnnninnninaninnsniennennsnnnennnennersnes 12M a Tio aialog ncaaMicron Confidential and Proprietary aan cron 2Gb: x8, x16 NAND Flash Memory Features List of Figures Figure 1: Marketing Part Number Chatt «...0.0.nssssnnnsnnnnninnnnnnnnnnnnnnsnnnnnnnnsnnnnnnesnnnnie 2 Figure 2: 48-Pin TSOP - Type 1, CPL (Top VieW) «..nsnnnesnnnnnnninnnninninnnninnnnnnsn sonenenesnne 9 Figure 3: 63-Ball VFBGA, x8 (Balls Down, Top View) 10 Figure 4: 63-Ball VEBGA, x16 (Balls Down, Top View)... ny Figure 5: 48-Pin TSOP - Type 1, CPL ... oo . ee 12 Figure 6: 63-Ball VFBGA (10.5mm x 13mm) 13 Figure 7: 63-Ball VFBGA (9mmx Lmm) ...... ossnnnenenininnannnnmnnnnannennenens Hh Figure 8: NAND Flash Die (LUN) Functional Block Diagram .. . ot nnnnennse we AS Figure 9: Array Organization - MT29F2G08 (x8) 16 Figure 10: Array Organization - MI29F2G16 (x16) .... sssnnnnnnsnnnnnanonnnnnnse sonnei IT Figure 11: Asynchronous Command Latch Cycle . - nes 19 Figure 12: Asynchronous Address Latch Cycle 20 Figure 13; Asynchronous Data Input Cycles ....csseesnnoe sessennnnses ons soe BL Figure 14: Asynchronous Data Output Cycles 22 Figure 15: Asynchronous Data Output Cycles (EDO Mode) 23 Figure 16: READ/BUSY# Open Drain... oneness sosneinnnninaninnnemesnenens 2 Figure 17: ‘Fall and ‘Rise (3.3V Vcc) 25 Figure 18: ‘Fall and ‘Rise (1.8V Vcc) 25 Figure 19: Ioy,vs. Rp (Vcc = 3.3V Vee) — seen seen oneness 26 Figure 20: Torys. Rp (1.8V Veo) 26 Figure 21: TCs. Rp ot sentence sonnnaniannnenennenens BT Figure 22: R/B# Power-On Behavior «......0snnnnnnnnnnne oneness snesene 2B Figure 23: RESET (FFh) Operation 32 Figure 24; READ ID (90h) with 00h Address Operation .. 33 Figure 25: READ ID (90h) with 20h Address Operation .. - se 33 Figure 26: READ PARAMETER (ECh) Operation 36 Figure 27; READ UNIQUE ID (EDh) Operation... son soon 41 Figure 28: SET FEATURES (EFh) Operation oes . - os 43 Figure 29: GET FEATURES (FFh) Operation 44 Figure 30; READ STATUS (70h) Operation... a oe one 48 Figure 31: READ STATUS ENHANCED (78h) Operation vo ee oe) Figure 32: RANDOM DATA READ (05h-FOh) Operation 50 Figure 33; RANDOM DATA READ TWO-PLANE (06h-E0h) Operation .... . - - ow SL Figure 34: RANDOM DATA INPUT (85h) Operation 52 Figure 35: PROGRAM FOR INTERNAL DATA INPUT (85h) Operation 54 Figure 36; READ PAGE (00h-30h) Operation - - 58 Figure 37: READ PAGE (00h-30h) Operation with Internal ECC Enabled 58 Figure 38: READ PAGE CACHE SEQUENTIAL (31h) Operation 59 Figure 39: READ PAGE CACHE RANDOM (00h-31h) Operation . . . oneness 60 Figure 40: READ PAGE CACHE LAST (3Fh) Operation 61 Figure 41: READ PAGE TWO-PLANE (00h-00h-30h) Operation ...... . penne, 68 Figure 42: PROGRAM PAGE (80h-10h) Operation oe oe one 65 Figure 43: PROGRAM PAGE CACHE (80h-15h) Operation (Start) 67 Figure 44: PROGRAM PAGE CACHE (80h-15h) Operation (End) : - a 87 Figure 45: PROGRAM PAGE TWO-PLANE (80h-11h) Operation ose ose 63 ERASE BLOCK (60h-Doh) Operation 70 ERASE BLOCK TWO-PLANE (60h-D1h) Operation. sone oo 7 Figure 48: READ FOR INTERNAL DATA MOVE (00h-35h) Operation oes 3B Figure 49; READ FOR INTERNAL DATA MOVE (00h-35h) with RANDOM DATA READ (051 B Figure 50: INTERNAL DATA MOVE (85h-10h) with Internal ECC Enabled ee ovens TA $ Tio iaialog ncaadicron Micron Confidential and Proprietary 2Gb: x8, x16 NAND Flash Memory General Description General Description Micron NAND Flash devices include an asynchronous data interface for high-perform- ance I/O operations. These devices use a highly multiplexed 8-bit bus (1/03 to transfer commands, address, and data. There are five control signals used to implement the asyn- chronous data interface CLE, ALE, WE#, and RE#. Additional signals control hardware write protection and monitor device status (R/B#) ‘This hardware interface creates a low pin-count device with a standard pinout that re- mains the same from one density to another, enabling future upgrades to higher densi- ties with no board redesign. A target is the unit of memory accessed by a chip enable signal. A target contains one or more NAND Flash die. A NAND Flash die is the minimum unit that can independently execute commands and report status. ANAND Flash die, in the ONFI specification, is referred to as a logical unit (LUN). There is at least one NAND Flash die per chip enable signal. For further details, see Device and Array Organization. ‘This device has an internal 4-bit ECC that can be enabled using the G or by factory (always enabled). See Internal ECC and Spare Area Mapping for ECC for more information, Signal Descriptions Table 1: Signal Definitions ignal? Type __[Description® ALE Input Address latch enable: Loads an address from /0(7.0] into the address register. cee input [Chip enable: Enables or disables one or more die (LUNS) in a target cle Input __|Command latch enable: Loads a command from VOI7:0] into the command register. Lock Input [When LOCK is HIGH during power-up, the BLOCK LOCK function is enabled. To disable the BLOCK LOCK, connect LOCK to Vss during power-up, or leave it disconnected (internal pull ldown). REF Input |Read enable: Transfers serial data from the NAND Flash to the host system Wee Input |Write enable: Transfers commands, addresses, and serial data from the host system to the| INAND Flash Writ Input |Write protect: Enables or disables array PROGRAM and ERASE operations WOL7-0] 68) VO _ [Data inputs/outputs: The bidirectional VOs transfer address, data, and command informa-| VOL15:0] (16) tion. Rib Output [Ready/busy: An open-drain, active-low output that requires an external pull-up resistor. [This signal indicates target array activity. Vee Supply _|Vee: Core power supply Vis Supply _|Vss: Core ground connection NC = _|No connect: NCS are not internally connected. They can be driven or left unconnected DNU = __ [Bo not use: DNUs must be left unconnected Notes: 1. See Device and Array Organization for detailed signal connections. 2. See Asynchronous Interface Bus Operation for detailed asynchronous interface signal de- scriptions. 3 Tio alog nc aaRMicron Confidential and Proprietary aan cron 2Gb: x8, x16 NAND Flash Memory Signal Assignments Figure 3: 63-Ball VFBGA, x8 (Balls Down, Top iew) Notes: 1, For the 3V device, G5 changes to DNU. NO LOCK function is available on the 3.3V device, 2, These pins might not be bonded in the package; however, Micron recommends that the customer connect these pins to the designated external sources for ONFI compatibility To Ter Talo nc rareMicron Confidential and Proprietary aan cron 2Gb: x8, x16 NAND Flash Memory Package Dimensi Package Dimensions Figure 5: 48-in TSOP Type 1, CPL a = 3 = RAR AR AR AAR AR AA AAA AA AR PEEEEEEEEELELELEELELE) | Lense Ses 7] = Detail A Note: 1. All dimensions are in millimeters. 2 erieMicron Confidential and Proprietary aan cron 2Gb: x8, x16 NAND Flash Memory Package Dimensions Figure 7: 63-Ball VEBGA (9mm x 11mm) seating lane 0.65 20.05, esx 004s sottertall material SACO. forotuer bal pon Salat Ball ANID era oy es saa a! SMD bal pes saints IE : oo} oO oo fe 00000 Ic 0000 o oo000 fe ---.29.919.9. fF sac 88388 sna0s 00000 IH 0000 I t 000100 t an 7 # O ' oo |t feo 86} ee _|m 1 | (BI cere el -| Jae tomax 22cx—=| ale 025mm | 5201 ——o| Note: 1. Alldimensions are in millimeters. nama, 14Micron Confidential and Proprietary aa cron 2Gb: x8, x16 NAND Flash Memory Device and Array Organization Device and Array Organization Figure 9: Array Organization - MT29F2G08 (x8) +2112 bytes re 2112 bytes —> - > ==7q_——+007 cache Register Joas ea] 2088 eae Data Register 204864] 2008 =e r tpage = (K+ 64byte) tos blocks block = +64 bytes 64 pages = zek's aK) bytes per plane 1 block 1 block ‘ er plane = (128K 44k) bytes 1024 blocks 2048 blocks {128K per device 1 device = 1056Mb x2 planes diame A> Plane of Plane of evennumbered blocks odd-numbered blocks (0.2 406, 2088, 2046) (13,517, 2085, 2087) Table 2: Array Addressing — MT29F2G08 (x8) Gee | __v07 06 105 0a 03 102 Tm 100 First car cas cas cas cas ca cal cao Second | Low [tow [| tow | tow | can [ caw [cas cas Third BAT BAS PAS PAA PAS PAL PAL PAO Fourth | eats | sara | eats| earz | sait | eato BAS BAS fifth | wow [| tow | tow | tow | wow | tow | .ow | ate Notes: 1. Block address concatenated with page address = actual page address. CAx = column adh dress; PAX = page address; BAx = block address, 2. IFCAIT is 1, then CA[10:6] must be 0 3. BAG controls plane selection. 16 Tio alo ncaaMicron Confidential and Proprietary aa cron 2Gb: x8, x16 NAND Flash Memory Asynchronous Interface Bus Operation Asynchronous Interface Bus Operation ‘The bus on the device is multiplexed. Data 1/0, addresses, and commands all share the same pins. 1/O(15:8] are used only for data in the x16 configuration. Addresses and com- mands are always supplied on 1/07:0] ‘The command sequence typically consists of aCOMMAND LATCH eycle, address input cycles, and one or more data cycles, either READ or WRITE. Table 4: Asynchronous Interface Mode Selection Mode? cee CLE ALE WER REF Vox wea standby? H x x x x x OVNec [Command input L H L F 4 x H [Address input u L H iF 4 x 4 Data input u t v LF H x 4 Data output L L L 4 WT x x Write protect x x x x x x L Notes: 1. Mode selection settings for this table: H = Logic level HIGH; L = Logic level LOW; X = Vin or Vi 2. WPA should be biased to CMOS LOW or HIGH for standby. Asynchronous Enable/Standby When the device is not performing an operation, the CB# pin is typically driven HIGH and the device enters standby mode. The memory will enter standby if CE# goes HIGH while data is being transferred and the device is not busy. This helps reduce power con- sumption, ‘The CE# “Don’t Care” operation enables the NAND Flash to reside on the same asyn- chronous memory bus as other Flash or SRAM devices. Other devices on the memory bus can then be accessed while the NAND Flash is busy with internal operations. This capability is important for designs that require multiple NAND Flash devices on the same bus. ATIGH CLE signal indicates that a command cycle is taking place. A HIGH ALE signal signifies that an ADDRESS INPUT cycle is occurring. Asynchronous Commands An asynchronous command is written from I/0[7:0] to the command register on the rising edge of WE# when CE# is LOW, ALE is LOW, CLE is HIGH, and RE# is HIGH. Commands are typically ignored by die (LUNs) that are busy (RDY = 0); however, some commands, including READ STATUS (70h) and READ STATUS ENHANCED (78h), are accepted by die (LUNs) even when they are busy. For devices with a x16 interface, I/0[15:8) must be written with zeros when a command is issued, 8dicron Asynchronous Addresses Micron Confidential and Proprietary 2Gb: x8, x16 NAND Flash Memory Asynchronous Interface Bus Operation An asynchronous address is written from 1/0{7:0] to the address register on the rising edge of WE# when CE# is LOW, ALE is HIGH, CLE is LOW, and RE¢# is HIGH. Bits that are not part of the address space must be LOW (see Device and Array Organiza- tion). The number of cycles required for each command varies. Refer to the command descriptions to determine addressing requirements. Addresses are typically ignored by die (LUNs) that are busy (RDY = 0); however, some addresses are accepted by die (LUNs) even when they are busy; for example, like ad- dress cycles that follow the READ STATUS ENHANCED (78h) command. Figure 12: Asynchronous Address Latch Cycle 0 Tiong ncaaMicron Confidential and Proprietary aan cron 2Gb: x8, x16 NAND Flash Memory Asynchronous Interface Bus Operation Asynchronous Data Output Data can be output from a die (LUN) if is in a READY state, Data output is supported following a READ operation from the NAND Flash array. Data is output from the cache register of the selected die (LUN) to 1/0[7-0] on the falling edge of RE# when CE# is LOW, ALE is LOW, CLE is LOW, and WE# is HIGH. Ifthe host controller is using a ‘RC of 30ns or greater, the host can latch the data on the rising edge of RE# (see the figure below for proper timing). Ifthe host controller is using a ‘RC of less than 30ns, the host can latch the data on the next falling edge of RE#. ‘Using the READ STATUS ENHANCED (78h) command prevents data contention follow- ing an interleaved die (multi-LUN) operation, After issuing the READ STATUS HANCED (78h) command, to enable data output, issue the READ MODE (00h) command, Data output requests are typically ignored by a die (LUN) that is busy (RDY = 0); howev- er, itis possible to output data from the status register even when a die (LUN) is busy by first issuing the READ STATUS or READ STATUS ENHANCED (78h) command, Figure 14: Asynchronous Data Output Cycles ‘cea eH WL rf d ty ity ty RH tap *ReH tcoH, ne ? teu, TRHZ SRHOH, vor aus {ban} Keen RR tre wor U ery Tiong ncaaMicron Confidential and Proprietary aan cron 2Gb: x8, x16 NAND Flash Memory Asynchronous Interface Bus Operation driver enables multiple R/B# outputs to be OR-tied. Typically, R/B# is connected to an interrupt pin onthe system controller. The combination of Rp and capacitive loading of the R/B# circuit determines the rise time of the R/B# signal. The actual value used for Rp depends on the system timing re- quirements. Large values of Rp cause R/B# to be delayed significantly. Between the 10% and 30% points on the R/B# waveform, the rise time is approximately two time con- stants (TC) TC=RxC p (resistance of pull-up resistor), and C Where R ‘otal capacitive load. ‘The fall time of the R/B# signal is determined mainly by the output impedance of the R/B# signal and the total load capacitance. Approximate Rp values using a circuit load of 100pF are provided in Figure 21 (page 27). ‘The minimum value for Rp is determined by the output drive capability of the R/B# signal, the output voltage swing, and Voc. fap = Vac (MAY) - Voy (MAX) Tou +E Where 2), is the sum of the input currents of all devices tied to the R/B# pin. Figure 16: READ/BUSY# Open Drain Ret Open drain output Device ey Tiong ncaaMicron Confidential and Proprietary aan cron 2Gb: x8, x16 NAND Flash Memory Asynchronous Interface Bus Operation igure 19: lo. vs. Rp (Vcc = 3-3V Vee) 3.50 200 + oY sis X 1.00 0.50 0.00 , , © 2000 4000 6000-8000 10,000 12,000 Rp (2) | Hoy @t Vcc (MAX) igure 20: lot VS. RP (1.8V Veco) 3.50 3.00 250 2.00 | (mA) (MA) 5g 1.00 050 0.00 T T T T T T © 2000 ©4000-6000 8000 10,000 12,000 Rp (Q) Noy at Vee (MAX) 6 Tiong ncaaMicron Confidential and Proprietary aan cron 2Gb: x8, x16 NAND Flash Memory Device Initialization Device Initialization Micron NAND Flash devices are designed to prevent data corruption during power tran- sitions. Vec is internally monitored. (The WP# signal supports additional hardware protection during power transitions.) When ramping Vcc, use the following procedure {o initialize the device: 1, Ramp Vcc. 2, The host must wait for R/B# to be valid and HIGH before issuing RESET (FFh) to any target. The R/BF signal becomes valid when 50ps has elapsed since the begin- ning the Vec ramp, and 10ps has elapsed since Vec teaches Vcc (MIN). 3. Ifnot monitoring R/Bé, the host must wait at least 100ps after Vcc reaches Voc (MIN). If monitoring R/B¢, the host must wait until R/B# is HIGH, 4, The asynchronous interface is active by default for each target. Each LUN draws less than an average of 10mA (Ist) measured over intervals of 1ms until the RESET (FFh) command is issued, 5, The RESET (FFh) command must be the first command issued to all targets (CE#S) after the NAND Flash device is powered on. Each target will be busy for Ims after a RESET command is issued, The RESET busy time can be monitored by polling R/ B# or issuing the READ STATUS (70h) command to poll the status register. 6. The device is now initialized and ready for normal operation. igure 22: R/B# Power-On Beha\ 50) (MIND Vegtame Toop (MA Reset (Fh) si iid BB invaia 2% Tiong ncaadicron Table 5: Command Set (Continued) Micron Confidential and Proprietary 2Gb: x8, x16 NAND Flash Memory Command Definitions STATUS Number of Valid Data Valid Whi Command| Address | Input | Command | Selected LUN | Other LUNs Command cycle tt | Cycles cyctes_| cycle #2 | isBusy? | are Busy? | Notes Block Lock Operations [BLOCK UNLOCK LOW 23h 3 = = No Yes [BLOCK UNLOCK HIGH 2ah 3 = = No Yes BLOCK Lock 2Ah = = = No Yes BLOCK LOCK-TIGHT 2ch = = = No Yes IBLOCK LOCK READ 7Ah 3 = = No Yes [One-Time Programmable (OTP) Operations JOTP DATA LOCK BY 80h 5 No 10h No No 7 IBLOCK (ONFI) loTP DATA PROGRAM 0h 3 Yes 10h No No 7 (ONE!) JOTP DATA READ (ONF) | 00h 5 No 30h No No 7 Table 6: Two: Notes: 1. Busy means RDY. 2. These commands can be used for interleaved die (multi-LUN) operations (see on page ). 3. Do not cross plane address boundaries when using READ for INTERNAL DATA MOVE and PROGRAM for INTERNAL DATA MOVE 4. These commands supported only with ECC disabled. 5. Issuing a READ PAGE CACHE series (31h, 00h-31h, 3Fh) command when the array is busy (ROY = 1, ARDY = 0) is supported if the previous command was a READ PAGE (00h-30h) ‘or READ PAGE CACHE series command; otherwise, it is prohibited. 6, Issuing a PROGRAM PAGE CACHE (80h-15h) command when the array is busy (RDY = 1, ‘ARDY = 0) is supported if the previous command was a PROGRAM PAGE CACHE (80h-15h) command; otherwise, itis prohibited 7. OTP commands can be entered only after issuing the SET FEATURES command with the feature address. ne Command Set Note 4 applies to all parameters and conditions Command com- mand | Address | mand cycle #1 | Cycles _| cycle #2 Number of, Number of Valid | com- | Valid | Com- | Valid While | Valid While Selected | Other LUNs LUN is Busy| are Busy |Notes READ PAGE TWO- ‘00h 5 ooh No Yes PLANE READ FOR TWO- (00h 5 ooh 5 35h No Yes 1 PLANE INTERNAL DA-| [TA MOVE RANDOM DATA (06h 5 Eon = = No Yes 2 READ TWO-PLANE 30 Tio alg ncaadicron Micron Confidential and Proprietary 2Gb: x8, x16 NAND Flash Memory Reset Operations Reset Operations RESET (FFh) The RESET command is used to put the memory device into a known condition and to abort the command sequence in progress READ, PROGRAM, and ERASE commands can be aborted while the device is in the busy state. The contents of the memory location being programmed or the block being erased are no longer valid. The data may be partially erased or programmed, and is inva- lid. The command register is cleared and is ready for the next command. The data register and cache register contents are marked invalid. ‘The status register contains the value Edh when WP# is HIGH; otherwise itis written ‘with a 60h value. R/B# goes LOW for ‘RST after the RESET command is written to the command register. ‘The RESET command must be issued to all CE#s as the first command after power-on. ‘The device will be busy for a maximum of ms. Figure 23: RESET (FFh) Operation vor7:0) ‘we. ‘RST RBH 7) Tiong ncaaMicron Confidential and Proprietary aa cron 2Gb: x8, x16 NAND Flash Memory READ ID Parameter Tables READ ID Parameter Tables Table 7: READ ID Parameters for Address 00h [options vo7 | vos | wos | woa | wos | voz | vot Byte 0- Manufacturer ID [Manufacturer [Micron ofo[+[o[1[+][eo][o]wam Byte 1 Device ID IMT29F2GOBABBEA Rab, x8, 1 av t+lo[+[eo][+][o][1] 0] Am Mi29F2G16ABBEA 2s, x16, 1.8V 1{efs+ f+ [a [else [ban Mi29F2GOBABAEA 2G, x8, 33V [4 1 [1 [eo] 7 |. | bmn MT29F2G16ABAEA 26b, x16, 33V 1[4 Cs Byte 2 [Number of die per CE ft o [0 | ob celltype ste oe 0b Number of simultaneously |2 ofa Otb programmed pages Interleaved operations [Not supported ° 0b between multiple die [cache programming [Supported 1 tb Byte value imrasracosassca | 1 | 0 [| o| 1 | 0 | o | o | o | son IMT29F2G16ABBEA t{ofof+[eo]ofol|o | 20m iuraarzcosaeaca | 1 | 0 | 0 | 1 | 0 | 0 | 0 | 0 | 90h jurasracieaeaca | + | 0 | o | 1 | 0 | o | o | o | 90m Byte 3 Page size fake. o [1 | % Spare area size (bytes) eae 1 1b Block size without spare) _|128KB oft on organization he ° ob hte 1 1b Serial access | _18V___[25ns 2 ° eb (ain 33V__[20ns 1 ° “hox0b Byte value iuraarzcosassca | 0 | o | o | +o |1 0/1 | 15h rearzcieassea | o | 1 | o [1] o|1 | 0/1 | 55h Iizsr2cosasaca | 1 | o | o | 1] o© | 1 | 0 | 1 | 95h iwrasracreasaca | 1 | 1 | o [+] o | 1/0 | 1 | 05h Byte @ ECC level [abit ECoS12 (main) + tT] o] 10 4 (spare) + 8 (pari- tydbytes Planes per CE# 2 ofa on Plane size Gb ofolo 0006 3a Tie aap nc raneMicron Confidential and Proprietary aan cron 2Gb: x8, x16 NAND Flash Memory READ PARAMETER PAGE (ECI READ PARAMETER PAGE (ECh) ‘The READ PARAMETER PAGE (ECh) command is used to read the ONFI parameter page programmed into the target. This command is accepted by the target only when all die (LUNs) on the target are idle. Writing ECh to the command register puts the target in read parameter page mode. The target stays in this mode until another valid command is issued ‘When the ECh command is followed by an 00h address cycle, the target goes busy for 'R If the READ STATUS (70h) command is used to monitor for command completion, the READ MODE (00h) command must be used to re-enable data output mode. Use of the READ STATUS ENHANCED (78h) command is prohibited while the target is busy and during data output. Aminimum of three copies of the parameter page are stored in the device. Each param- eter page is 256 bytes. If desired, the RINDOM DATA READ (05h-E0h) command can be ‘used to change the location of data output. igure 26: READ PARAMETER (ECh) Operation yale type vorr.9) Ree 36 Tiong ncaaMicron Confidential and Proprietary dicron Table 9: Parameter Page Data Structure (Continued) 2Gb: x8, x16 NAND Flash Memory Parameter Page Data Structure Tables Byte [Description Value? 44-63 [Device model MT29F2GOBABAEA3W | 4Dh, Sah, 32h, 39h, 46h, 32h, 47h, 30h, 38h, 41h, J42h, 41h, 45h, 41h, 33h, 57h, 20h, 20h, 20h, 20h MT29F2GOBABBEA3W | 4Dh, 54h, 32h, 39h, 46h, 32h, 47h, 20h, 38h, 41h, J42h, 42h, 45h, 41h, 33h, 57h, 20h, 20h, 20h, 20h MT29F2G16ABAEA3W | 4Dh, Sah, 32h, 39h, 46h, 32h, 47h, 31h, 36h, 41h, J42h, 41h, 45h, 41h, 33h, 57h, 20h, 20h, 20h, 20h MT29F2G16ABBEA3W | 4Dh, 54h, 32h, 39h, 4Gh, 32h, 47h, 31h, 36h, 41h, |42h, 42h, 45h, 41h, 33h, 57h, 20h, 20h, 20h, 20h MT29F2G08ABBEAHA /4Dh, 54h, 32h, 39h, 46h, 32h, 47h, 30h, 38h, 41h, J42h, 42h, 45h, 41h, 48h, 34h, 20h, 20h, 20h, 20h MT29F2G16ABBEAHA J4Dh, 54h, 32h, 39h, 46h, 32h, 47h, 31h, 36h, 41h, J42h, 42h, 45h, 41h, 48h, 34h, 20h, 20h, 20h, 20h MIZ9F2GOBABAEAWP | 4Dh, 54h, 32h, 39h, 46h, 32h, 47h, 30h, 38h, 41h, J42h, 4th, 45h, 41h, 57h, 50h, 20h, 20h, 20h, 20h MI29F2G16ABAEAWP | 4Dh, 54h, 32h, 39h, 46h, 32h, 47h, 31h, 36h, 41h, |42h, 41h, 45h, 41h, 57h, 50h, 20h, 20h, 20h, 20h MT29F2GOBABAEAHS /4Dh, 54h, 32h, 39h, 46h, 32h, 47h, 30h, 38h, 41h, 42h, 4th, 45h, 41h, 48h, 34h, 20h, 20h, 20h, 20h MT29F2G08ABBEAHC J4Dh, 54h, 32h, 39h, 46h, 32h, 47h, 30h, 38h, 41h, |42h, 42h, 45h, 41h, 48h, 34h, 20h, 20h, 20h, 20h MT29F2G16ABBEAHC [4Dh, 54h, 32h, 39h, 46h, 32h, 47h, 31h, 36h, 41h, 42h, 42h, 45h, 41h, 48h, 34h, 20h, 20h, 20h, 20h 64__ [Manufacturer ID ach 65-66 [Date code [o0h, ooh 67-79 |Reserved [00h, 00h, Ooh, 00h, 00h, OOh, OOh, Oh, OOh, OO, ]00h, 00h, ooh 80-83 [Number of data bytes per page [00h, 08h, Ooh, Ooh. 84-85 [Number of spare bytes per page [40h, Ooh 86-89 [Number of data bytes per partial page [00h, 02h, Ooh, Ooh. 90-1 [Number of spare bytes per partial page 10h, OOh 92-95 [Number of pages per block [40h, 00h, Ooh, Ooh 96-99 [Number of blocks per unit [00h, 08h, Ooh, Ooh, 100 _ [Number of logical units loth 101 [Number of address cycles 23h 102 _ [Number of bits per cell loth 103-104 [Bad blocks maximum per unit [28h, ooh 105-106 [Block endurance foth, 05h 107 __|Suaranteed valid blocks at beginning of target loth 108-108 [Block endurance for guaranteed valid blocks [00h, ooh 110 [Number of programs per page foah 111 [Partial programming attributes [ooh 38Micron Confidential and Proprietary aa cron 2Gb: x8, x16 NAND Flash Memory Parameter Page Data Structure Tables Table 9: Parameter Page Data Structure (Continued) Byte [Description Value? 166-253 |Vendor-specific oth, 00h, 00h, O2h, 04h, BO, Oth, 81h, 04h, O1, J02h, 01h,0Ah, 00h, 00h, 00h, 00h, OOh, OOh, Ooh, ]00h, 00h, 00h, 00h,00h, 00h, OOh, OOh, OOh, OO, J00h, 00h, Ooh, 00h, 00h, O0h,00h, OOh, Ooh, OO, J00h, 00h, Ooh, 00h, 00h, OOh, Ooh, 0h, Ooh, Ooh, J00h, 0h, Ooh, 00h, 00h, OOh, Ooh, Oh, OOh, OO, 00h, 254-255 integrity CRC Set at test 256-511 [Value of bytes 0-255 512-767 |Value of bytes 0-255 768+ [Additional redundant parameter pages Note: 1. h= hexadecimal 70 Tio alg ncaaMicron Confidential and Proprietary aan cron 2Gb: x8, x16 NAND Flash Memory Feature Operations Feature Operations ‘The SET FEATURES (EFh) and GET FEATURES (Eh) commands are used to modify the ‘arget’s default power-on behavior. These commands use a one-byte feature address to determine which subfeature parameters will be read or modified. Each feature address ‘n the 00h to FFh range) is defined in below. The SET FEATURES (EFh) command writes subfeature parameters (P1-P4) to the specified feature address. The GET FE TURES command reads the subfeature parameters (P1-P4) at the specified feature address. ‘When a feature is set, by default it remains active until the device is power cycled. Itis volatile. Unless otherwise specified in the features table, once a device is set it remains set, even if a RESET (FFh) command is issued. GET/SET FEATURES commands can be used after required RESET to enable features before system BOOT ROM process. Internal ECC can be enabled/disabled using SET FEATURES (EFh). The SET FEATURES command (EFh), followed by address 90h, followed by four data bytes (only the first data byte is used) will enable/disable internal ECC. ‘The sequence to enable internal ECC with SET FEATURES is EFh(cmd)-90h(addr)- 8h(data)-00h(data)-00h (data)-00h(data)-wait('FEAI The sequence to disable internal ECC with SET FEATURES is BFh(cmd)-0h(addr)- 0h (data)-00h(data)-00h (data)-00h(data)-waitFEAT). The GET FEATURES command EER. Table 1 Feature Address [Definition (00h Reserved oth [Timing mode O2h-7Fh Reserved 0h Programmable output drive strength 81h Programmable R8# pull-down strength ‘82h-FF Reserved 90h [Array operation mode @D Tiong ncaaMicron Confidential and Proprietary aan cron 2Gb: x8, x16 NAND Flash Memory Feature Operations GET FEATURES (EEh) ‘The GET FEATURES (EEh) command reads the subfeature parameters (P1-P4) from the specified feature address. This command is accepted by the target only when all die (LUNs) on the target are idle. Writing Eh to the command register puts the target in get features mode. The target stays in this mode until another valid command is issued. ‘When the EEh command is followed by a feature address, the target goes busy for ‘FEAT. If the READ STATUS (70h) command is used to monitor for command comple- tion, the READ MODE (00h) command must be used to re-enable data output mode. After ‘FEAT completes, the host enables data output mode to read the subfeature param- eters. Figure 29: GET FEATURES (EEh) Operation vox wa Tiong ncaaMicron Confidential and Proprietary aa cron 2Gb: x8, x16 NAND Flash Memory Feature Operations Table 13: Feature Addresses 80h: Programmable U/O Drive Strength [Subfeature Parameter Options vo7 | vos | vos | voa | vos | voz | vor | voo | value| Notes Pa VO drive strength [Full (default) Reserved (0) 0 o [oh [ 1 Three-quarters Reserved (0) ° 1 [oth lone-half, Reserved (0) 1 0 | oh [one-quarter Reserved (0) 1 1 [03h Pz. Reserved (0) oh, PS. Reserved (0) 0h Pa. Reserved (0) oh Table 14: Feature Addresses 81h: Programmable R/B# Pull-Down Strength Note: 1. The programmable drive strength feature address is used to change the default /O drive strength, Drive strength should be selected based on expected loading of the mem- ‘ory bus. This table shows the four supported output drive strength settings. The default drive strength is full strength, The device returns to the default drive strength mode when the device is power cycled. AC timing parameters may need to be relaxed if !O drive strength is not set to full [Subfeature Parameter JOptions vo7 | vos | vos | voa | vos | voz | vor | voo | vatue| Notes Pa R/8# pull-down [Full (default) ° 0 [oh | 1 strength Three-quarters ° 1 [oth [one-half 1 0 [02h [one-quarter 1 1 [0h Pa. Reserved (0) oh PS. Reserved (0) oh. Pa. Reserved (0) 00h Note: 1. This feature address is used to change the default R/B# pull-down strength. Its strength should be selected based on the expected loading of R/BH. Full strength is the default, power-on value. 7% Tio alog nc aaRMicron Confidential and Proprietary aan cron 2Gb: x8, x16 NAND Flash Memory Status Operations READ STATUS (70h) ‘The READ STATUS (70h) command retums the status of the last-selected die (LUN) on a target. This command is accepted by the last-selected die (LUN) even when itis busy (RDY=0) If there is only one die (LUN) per target, the READ STATUS (70h) command can be used ‘to return status following any NAND command. In devices that have more than one die (LUN) per target, during and following inter- leaved die (multi-LUN) operations, the READ STATUS ENHANCED (78h) command must be used to select the die (LUN) that should report status. In this situation, using the READ STATUS (70h) command will result in bus contention, as two or more die (LUNs) could respond until the next operation is issued. The READ STATUS (70h) com- mand can be used following all single-die (LUN) operations. igure 30: READ STATUS (70h) Operation Cycle type —€ommand "WHR votr:0} {on i) READ STATUS ENHANCED (78h) ‘The READ STATUS ENHANCED (78h) command returns the status of the addressed die (LUN) ona target even when it is busy (RDY = 0). This command is accepted by all die (LUN), even when they are BUSY (RDY = 0). ‘Writing 78h to the command register, followed by three row address cycles containing the page, block, and LUN addresses, puts the selected die (LUN) into read status mode. The selected die (LUN) stays in this mode until another valid command is issued. Die (LUNs) that are not addressed are deselected to avoid bus contention. ‘The selected LUN's status is returned when the host requests data output. The RDY and ARDY bits of the status register are shared for all planes on the selected die (LUN). The FAILC and FAIL bits are specific to the plane specified in the row address. ‘The READ STATUS ENHANCED (78h) command also enables the selected die (LUN) for data output, To begin data output following a READ-series operation after the selected die (LUN) is ready (RDY = 1), issue the READ MODE (00h) command, then begin data output. If the host needs to change the cache register that will output data, use the RAN- DOM DATA READ TWO-PLANE (06h-E0h) command after the die (LUN) is ready. Use of the READ STATUS ENIIANCED (78h) command is prohibited during the power- on RESET (Fh) command and when OTP mode is enabled. It is also prohibited follow- ing some of the other reset, identification, and configuration operations. See individual operations for specific details, rT) Tiong ncaaMicron Confidential and Proprietary 5 2Gb: x8, x16 NAND Flash Memot a cron Column Address Operations Column Address Operations ‘The column address operations affect how data is input to and output from the cache registers within the selected die (LUNs). These features provide host flexibility for man- aging data, especially when the host internal butfer is smaller than the number of data bytes or words in the cache register. When the asynchronous interface is active, column address operations can address any byte in the selected cache register. RANDOM DATA READ (05h-E0h) ‘The RANDOM DATA READ (05h-E0h) command changes the column address of the se- lected cache register and enables data output from the last selected die (LUN). This command is accepted by the selected die (LUN) when itis ready (RDY = 1; ARDY = 1), It is also accepted by the selected die (LUN) during CACHE READ operations (RDY= 1; ARDY=0) Writing 05h to the command register, followed by two column address cycles contain- ing the column address, followed by the Eh command, puts the selected die (LUN) into data output mode. After the Eh command cycle is issued, the host must wait at least ‘WHR before requesting data output. The selected die (LUN) stays in data output mode until another valid command is issued. In devices with more than one die (LUN) per target, during and following interleaved die (multi-LUN) operations, the READ STATUS ENHANCED (78h) command must be issued prior to issuing the RANDOM DATA READ (05h-E0h). In this situation, using the RANDOM DATA READ (05h-E0h) command without the READ STATUS ENHANCED (78h) command will result in bus contention because two or more die (LUNs) could output data igure 32: RANDOM DATA READ (05h-E0h) Operation cycle type —( Dour {Dour Command Address (Address \Command) Dour {Pour {Pour *RHW ‘wie vot7:0] {da ){bn+1 Osh a a 0h ee Heroes T T T SRI6] 7) Tio aalog ncaadicron Micron Confidential and Proprietary 2Gb: x8, x16 NAND Flash Memory Column Address Operations RANDOM DATA INPUT (85h) ‘The RANDOM DATA INPUT (85h) command changes the column address of the selec- ted cache register and enables data input on the last-selected die (LUN). This command is accepted by the selected die (LUN) when itis ready (RDY = 1; ARDY = 1). Itis also accepted by the selected die (LUN) during cache program operations (RDY= 1; ARDY=0) Writing 85h to the command register, followed by two column address cycles contain- ing the column address, puts the selected die (LUN) into data input mode. After the second address cycle is issued, the host must wait at least ‘ADL before inputting data. The selected die (LUN) stays in data input mode until another valid command is issued, ‘Though data input mode is enabled, data input from the host is optional. Data input begins at the column address specified. ‘The RANDOM DATA INPUT (85h) command is allowed after the required address cy- cles are specified, but prior to the final command cycle (10h, 11h, 15h) of the following commands while data input is permitted: PROGRAM PAGE (80h-10h), PROGRAM PAGE CACHE (80h-15h), PROGRAM FOR INTERNAL DATA MOVE (85h-10h), and PROGRAM FOR TWO-PLANE INTERNAL DATA MOVE (85h-11h) In devices that have more than one die (LUN) per target, the RANDOM DATA INPUT (85h) command can be used with other commands that support interleaved die (multi- LUN) operations. igure 34: RANDOM DATA INPUT (85h) Operation As defined for PAGE As defined for PAGE (CACHE) PROGRAM (CACHE) PROGRAM, cycle type {Bw {Bw ) Command) Adaress Address Dw Ow XO) t— tao. wol7:0) +{ on Xone 1) ash X_ ct @ Dk {bk + 1){Dk +2) — RDY 3 Tiong ncaaMicron Confidential and Proprietary aan cron 2Gb: x8, x16 NAND Flash Memory Column Address Operations Figure 35: PROGRAM FOR INTERNAL DATA INPUT (85h) Operation (exSt8 meccnan (extuchmeoctaae cycleype {Bi Ba) fonnand) Rares) hares Aes) Rares (Rares Bw xX Bw H— voir0) or ore oh Xa Xe Xe Ke ok Hors era} aor rn 3a Tio alo ncaaMicron Confidential and Proprietary aan cron 2Gb: x8, x16 NAND Flash Memory Read Operations ‘Two-Plane Read Operations ‘Two-plane read page operations improve data throughput by copying data from more than one plane simultaneously to the specified cache registers. This is done by prepend- ing one ot more READ PAGE TWO-PLANE (00h-00h-30h) commands in front of the READ PAGE (00h-30h) command. ‘When the die (LUN) is ready, the RANDOM DATA READ TWO-PLANE (06h-E0h) com- mand determines which plane outputs data. During data output, the following com- mands can be used to read and modify the data in the cache registers: RANDOM DATA READ (05h-E0h) and RANDOM DATA INPUT (85h), ‘Two-Plane Read Cache Operations ‘Two-plane read cache operations can be used to output data from more than one cache register while concurrently copying one or more pages from the NAND Flash array to the data register. This is done by prepending READ PAGE TWO-PLANE (00h-00h-30h) commands in front of the PAGE READ CACHE RANDOM (00h-31h) command. To begin a two-plane read page cache sequence, begin by issuing a READ PAGE TWO- PLANE operation using the READ PAGE 1WO-PLANE (00h-00h-30h) and READ PAGE (00h-30h} commands. R/B# goes LOW during'R and the selected die (LUN) is busy (RDY=0, ARDY = 0). After'R (R/B# is HIGH and RDY = 1, ARDY = 1), issue either of, these commands: + READ PAGE CACHE SEQUENTIAL (31h) - copies the next sequential pages from the previously addressed planes from the NAND Flash array to the data registers. + READ PAGE TWO-PLANE (00h-00h-30h) [in some cases, followed by READ PAGE CACHE RANDOM (00b-31h}] ~ copies the pages specified from the NAND Flash array to the corresponding data registers. After the READ PAGE CACHE series (31h, 00h-31h) command has been issued, R/B# goes LOW on the target, and RDY = 0 and ARDY = 0 on the die (LUN) for ‘RCBSY while the next pages begin copying data from the array to the data registers. After ‘RCBSY, R/B# goes HIGH and the LUN’s status register bits indicate the device is busy with a cache operation (RDY = 1, ARDY = 0). The cache registers become available and the pa- ges requested in the READ PAGE CACHE operation are transferred to the data registers. Issue the RANDOM DATA READ TWO-PLANE (06h-E0h) command to determine which cache register will output data. After data is output, the RANDOM DATA READ TWO- PLANE (06h-E0h) command can be used to output data from other cache registers. After a cache register has been selected, the RANDOM DATA READ (05h-E0h) com- mand can be used to change the column address of the data output. After outputting data from the cache registers, either an additional TWO-PLANE READ. CACHE series (31h, 00h-31h) operation can be started or the READ PAGE CACHE LAST (3Fh) command can be issued. Ifthe READ PAGE CACHE LAST (3Fh) command is issued, R/B# goes LOW on the tar- get, and RDY=0 and ARDY = 0 on the die (LUN) for ‘RCBSY while the data registers are copied into the cache registers. After 'RCBSY, R/B# goes HIGH and RDY = 1 and ARDY = 1, indicating that the cache registers are available and that the die (LUN) is ready. Issue the RANDOM DATA READ TWO-PLANE (06h-E0h) command to determine which cache register will output data. After data is output, the RANDOM DATA READ TWO- PLANE (06h-E0h) command can be used to output data from other cache registers. Alter a cache register has been selected, the RANDOM DATA READ (05h-E0h) com- mand can be used to change the column address of the data output. 7 Tiong ncaaMicron Confidential and Proprietary aan cron 2Gb: x8, x16 NAND Flash Memory Read Operations output begins at the column address last specified in the READ PAGE (00h-30h) com- mand. The RANDOM DATA READ TWO-PLANE (06h-EOh) command is used to enable data output in the other cache registers. Figure 36: READ PAGE (00h-30h) Opera ‘cycle type —Eommand)( Address )(Aderess )( Address (Address X Address )Command) pa GaGa vorr:0) {oon Xa @ Rt @ m3 X_ 30h Dn X Ona XOmae RDY Figure 37: READ PAGE (00h-30h) Operation with Internal ECC Enabled > \ (as {as rs {al){(5) —} {7 au) { =) —| aor) SRbTO=0READ steer SRbtt 2a READ error READ PAGE CACHE SEQUENTIAL (31h) ‘The READ PAGE CACHE SEQUENTIAL (31h) command reads the next sequential page within a block into the data register while the previous page is output from the cache register. This command is accepted by the die (LUN) when itis ready (RDY = 1, ARDY = 1). Itis also accepted by the die (LUN) during READ PAGE CACHE 1h, 0Oh-31h) operations (RDY = 1 and ARDY = 0). issue this command, write 31h to the command register. After this command is is- sued, R/B# goes LOW and the die (LUN) is busy (RDY = 0, ARDY = 0) for 'RCBSY. After 'RCBSY, R/BY goes HIGH and the die (LUN) is busy with a cache operation (RDY= 1, ARDY = 0), indicating that the cache register is available and that the specified page is copying from the NAND Flash array to the data register. At this point, data can be output from the cache register beginning at column address 0. The RANDOM DATA READ (05h-E0h) command can be used to change the column address of the data being output from the cache register. ‘The READ PAGE CACHE SEQUENTIAL (31h) command can be used to cross block boun- daries. Ifthe READ PAGE CACHE SEQUENTIAL (31h) command is issued after the last page of a block is read into the data register, the next page read will be the next logical block in which the 31h command was issued. Do not issue the READ PAGE CACHE SE- QUENTIAL (31h) to cross die (LUN) boundaries. Instead, issue the READ PAGE CACHE LAST (3Fh) command. 38 Tiong ncaaMicron Confidential and Proprietary aan cron 2Gb: x8, x16 NAND Flash Memory Read Operations Figure 39: READ PAGE CACHE RANDOM (00h-31h) Operation xe ype Gonna Taare onan) oo _enane dates fornard "Bip vor) ae =p in (Pose aaaren (3th “ae — vow79o1-{_ bn * ‘oh XPage Acre PX igh be oy J] U Paget $0 erieMicron Confidential and Proprietary aan cron 2Gb: x8, x16 NAND Flash Memory Read Operations READ PAGE TWO-PLANE 00h-00h-30h ‘The READ PAGE TWO-PLANE (00h-00h-30h) operation is similar to the PAGE READ (00h-30h) operation. It transfers two pages of data from the NAND Flash array to the data registers. Each page must be from a different plane on the same die. To enter the READ PAGE TWO-PLANE mode, write the 00h command to the command register, and then write five address cycles for plane 0 (BAG = 0). Next, write the 00h command to the command register, and five address cycles for plane 1 (BA6 = 1). Final- ly, issue the 30h command. The first-plane and second-plane addresses must meet the ‘two-plane addressing requirements, and, in addition, they must have identical column addresses. After the 30h command is written, page data is transferred from both planes to their respective data registers in "R. During these transfers, R/B# goes LOW. When the trans- fers are complete, R/B# goes HIGH. To read out the data from the plane 0 data register, pulse RE¥ repeatedly. After the data cycle from the plane 0 address completes, issue a RANDOM DATA READ TWO-PLANE (06h-E0h) command to select the plane | address, then repeatedly pulse RE# to read out the data from the plane 1 data register. Alternatively, the READ STATUS (70h) command can monitor data transfers. When the transfers are complete, status register bit 6is set to 1. To read data from the first of the two planes, the user must first issue the RANDOM DATA READ TWO-PLANE (06h-E0h) command and pulse RE# repeatedly. When the data cycle is complete, issue a RANDOM DATA READ TWO-PLANE (06h-E0h) command to select the other plane. To output the data beginning at the specified col- ‘umn address, pulse RE# repeatedly. Use of the READ STATUS ENHANCED (78h) command is prohibited during and follow- ing a PAGE READ TWO-PLANE operation. @ Tio aalog ncaaMicron Confidential and Proprietary aan cron 2Gb: x8, x16 NAND Flash Memory Program Operations Program Operations Program operations are used to move data from the cache or data registers to the NAND array. During a program operation the contents of the cache and/or data regis- ters are modified by the internal control logic. Within a block, pages must be programmed sequentially from the least significant page address to the most significant page address (0, 1,2, ..... 63). During a program opera- tion, the contents of the cache and/or data registers are modified by the internal control logic. Program Operations ‘The PROGRAM PAGE (80h-10h) command, when not preceded by the PROGRAM PAGE ‘TWO-PLANE (80h-11h) command, programs one page from the cache register to the NAND Flash array. When the die (LUN) is ready (RDY = 1, ARDY = 1), the host should check the FAIL bit to verily that the operation has completed successfully. Program Cache Operations ‘The PROGRAM PAGE CACHE (80h-15h) command can be used to improve program op- eration system performance. When this command is issued, the die (LUN) goes busy (RDY= 0, ARDY = 0) while the cache register contents are copied to the data register, and the die (LUN) is busy with a program cache operation (RDY = 1, ARDY = 0. While the contents of the data register ate moved to the NAND Flash array, the cache register is available for an additional PROGRAM PAGE CACHE (80h-15h) or PROGRAM PAGE (80h-10h) command, For PROGRAM PAGE CACHE series (80h-15h) operations, during the die (LUN) busy ‘times, ‘CBSY and 'LPROG, when RDY = 0 and ARDY = 0, the only valid commands are status operations (70h, 78h) and reset (FFh). When RDY = 1 and ARDY = 0, the only valid commands during PROGRAM PAGE CACHE series (80h-15h) operations are status oper- ations (70h, 78h), PROGRAM PAGE CACHE (80h-15h), PROGRAM PAGE (80h- 10h), RANDOM DATA INPUT (85h), PROGRAM FOR INTERNAL DATA INPUT (85h), and RE- SET (FFh), ‘Two-Plane Program Operations ‘The PROGRAM PAGE TWO-PLANE (80h-11h) command can be used to improve pro- gram operation system performance by enabling multiple pages to be moved from the cache registers to different planes of the NAND Flash array. This is done by prepending one or more PROGRAM PAGE TWO-PLANE (80h-11h) commands in front of the PRO- GRAM PAGE (#0h-10h) command. ‘Two-Plane Program Cache Operations ‘The PROGRAM PAGE TWO-PLANE (80h-11h) command can be used to improve pro- gram cache operation system performance by enabling multiple pages to be moved from the cache registers to the data registers and, while the pages are being transferred from the data registers to different planes of the NAND Flash array, free the cache regis- ters to receive data input from the host. This is done by prepending one or more PROGRAM PAGE TWO-PLANE (80h-11h) commands in front of the PROGRAM PAGE CACHE (80h-15h) command. eA Tiong ncaadicron Micron Confidential and Proprietary 2Gb: x8, x16 NAND Flash Memory Program Operations able for additional PROGRAM PAGE CACHE (80h-15h) or PROGRAM PAGE (80h-10h) commands. The PROGRAM PAGE CACHE (80h-15h) command is accepted by the die (LUN) when itis teady (RDY=1, ARDY = 1) Itis also accepted by the die (LUN) when busy with a PROGRAM PAGE CACHE (80h-15h) operation (RDY = 1, ARDY = 0) ‘To input a page to the cache register to move it to the NAND array at the block and page address specified, write 80h to the command register. Unless this command has been preceded by a PROGRAM PAGE TWO-PLANE (80h-11h) command, issuing the 80h to the command register clears all of the cache registers’ contents on the selected target. Then write n address cycles containing the column address and row address. Data in- put cycles follow. Serial data is input beginning at the column address specified. At any time during the data input cycle the RANDOM DATA INPUT (85h) and PROGRAM FOR INTERNAL DATA INPUT (85h) commands may be issued, When data input is complete write 15h to the command register. The selected LUN will go busy (RDY = 0, ARDY = 0) for ‘CBSY to allow the data register to become available from a previous program cache operation, to copy data from the cache register to the data reg- ister, and then to begin moving the data register contents to the specified page and block address. To determine the progress of ‘CBSY, the host can monitor the target's R/B# signal or, alternatively, the status operations (70h, 78h) can be used, When the LUN’s status shows that it is busy with a PROGRAM CACHE operation (RDY = 1, ARDY = 0), the host should check the status of the FAILCbit to see ifa previous cache operation was successful If, after 'CBSY, the host wants to wait for the program cache operation to complete, with- out issuing the PROGRAM PAGE (80h-10h) command, the host should monitor ARDY until itis 1. The host should then check the status of the FAIL and FAILC bits. In devices with more than one die (LUN) per target, during and following interleaved die (multi-LUN) operations, the READ STATUS ENHANCED (78h) command must be used to select only one die (LUN) for status output. Use of the READ STATUS (70h) com- mand could cause more than one die (LUN) to respond, resulting in bus contention, ‘The PROGRAM PAGE CACHE (80h-15h) command is used as the final command of a two- plane program cache operation. Itis preceded by one or more PROGRAM PAGE TWO- PLANE (80h-11h) commands. Data for all of the addressed planes is transferred from the cache registers to the corresponding data registers, then moved to the NAND Flash array. The host should check the status of the operation by using the status operations (7b, 78h), 7 Tiong ncaaMicron Confidential and Proprietary aan cron 2Gb: x8, x16 NAND Flash Memory Program Operations PROGRAM PAGE TWO-PLANE (80h-11h) ‘The PROGRAM PAGE TWO-PLANE (80h-11h) command enables the host to input data to the addressed plane's cache register and queue the cache register to ultimately be moved to the NAND Flash array. This command can be issued one or more times. Each ‘time a new plane address is specified that plane is also queued for data transfer. To in- put data for the final plane and to begin the program operation for all previously queued planes, issue either the PROGRAM PAGE (80h-10h) command or the PROGRAM PAGE CACHE (80h-15h) command, All of the queued planes will move the data to the NAND Flash array. This command is accepted by the die (LUN) when it is ready (RDY=1) ‘To input a page to the cache register and queue it to be moved to the NAND Flash array at the block and page address specified, write 80h to the command register. Unless this command has been preceded by a PROGRAM PAGE TWO-PLANE (80h-1 1h) command, issuing the 80h to the command register clears all of the cache registers’ contents on the selected target. Write five address cycles containing the column address and row ad- dress; data input cycles follow. Serial data is input beginning at the column address specified. At any time during the data input cycle, the RANDOM DATA INPUT (85h) and PROGRAM FOR INTERNAL DATA INPUT (85h) commands can be issued. When data input is complete, write 11h to the command register. The selected die (LUN) will go busy (RDY = 0, ARDY = 0) for ‘DBSY. To determine the progress of ‘DBSY, the host can monitor the target's R/BE signal or, alternatively, the status operations (70h, 78h) can be used. When the LUN’s status shows that it is ready (RDY = 1), additional PROGRAM PAGE TWO-PLANE (80h-11h) commands can be issued to queue additional planes for data transfer. Alternatively, the PROGRAM PAGE (80h- 10h) or PROGRAM PAGE CACHE (80h-15h) commands can be issued ‘When the PROGRAM PAGE (80h-10h) command is used as the final command of a two- plane program operation, data is transferred from the cache registers to the NAND_ Flash array for all of the addressed planes during PROG. When the die (LUN) is ready (RDY = 1, ARDY = 1, the host should check the status of the FAIL bit for each of the planes to verify that programming completed successfully. ‘When the PROGRAM PAGE CACHE (80h-15h) command is used as the final command of a program cache two-plane operation, data is transferred from the cache registers to the data registers after the previous array operations finish. The data is then moved from the data registers to the NAND Flash array for all of the addressed planes. This occurs during ‘CBSY. After 'CBSY, the host should check the status of the FAILC bit for each of the planes from the previous program cache operation, if any, to verify that pro- gramming completed successfully For the PROGRAM PAGE TWO-PLANE (80h-11h), PROGRAM PAGE (80h-10h), and PRO- GRAM PAGE CACHE (80h-15h) commands, see Two-Plane Operations for two-plane addressing requirements. rr) Tiong ncaadicron Micron Confidential and Proprietary 2Gb: x8, x16 NAND Flash Memory Erase Operations Erase Operations Erase operations are used to clear the contents of a block in the NAND Flash array to prepare its pages for program operations. Erase Operations ‘The ERASE BLOCK (60h-Doh) command, when not preceded by the ERASE BLOCK TWO- PLANE (60h-D1h) command, erases one block in the NAND Flash array. When the die (LUN) is ready (RDY = 1, ARDY = 1), the host should check the FAIL bit to verify that this operation completed successfully. ‘TWO-PLANE ERASE Operations ‘The ERASE BLOCK TWO-PLANE (60h-D1h) command can be used to further system perlormance of erase operations by allowing more than one block to be erased in the NAND array. This is done by prepending one or more ERASE BLOCK TWO-PLANE (60h- D1h) commands in front of the ERASE BLOCK (60h-D0h) command. See Two-Plane Operations for details. ERASE BLOCK (60h-D0h) The ERASE BLOCK (60h-DOh) command erases the specified block in the NAND Flash array. This command is accepted by the die (LUN) when it is ready (RDY = 1, ARDY = 1). To erase a block, write 60h to the command register. Then write three address cycles containing the row address; the page address is ignored. Conclude by writing Doh to the command register. The selected die (LUN) will go busy (RDY = 0, ARDY = 0) for 'BERS while the block is erased. To determine the progress of an ERASE operation, the host can monitor the target's R/ Bf signal, or alternatively, the status operations (70h, 78h) can be used. When the die (LUN) is ready (RDY = 1, ARDY = 1) the host should check the status of the FAIL bit. In devices that have more than one die (LUN) per target, during and following inter- Jeaved die (multi-LUN) operations, the READ STATUS ENHANCED (78h) command must be used to select only one die (LUN) for status output. Use of the READ STATUS. (70h) command could cause more than one die (LUN) to respond, resulting in bus con- tention, ‘The ERASE BLOCK (60h-D0h) command is used as the final command of an erase two- plane operation. It is preceded by one or more ERASE BLOCK TWO-PLANE (60h-D1h} commands. All blocks in the addressed planes are erased. The host should check the status of the operation by using the status operations (70h, 78h). See Two-Plane Opera- tions for two-plane addressing requirements. jure 46: ERASE BLOCK (60h-DOh) Operation ‘we ‘BERS RDY LT 70 Tio aalog ncaaMicron Confidential and Proprietary aan cron 2Gb: x8, x16 NAND Flash Memory Internal Data Move Operations Internal Data Move Operations Internal data move operations make it possible to transfer data within a device from one page to another using the cache register. This is particularly useful for block man- agement and wear leveling, ‘The INTERNAL DATA MOVE operation is a two-step process consisting of a READ FOR INTERNAL DATA MOVE (00h-35h) and a PROGRAM FOR INTERNAL DATA MOVE (85h-10h) command. To move data from one page to another on the same plane, first issue the READ FOR INTERNAL DATA MOVE (00h-35h) command. When the die (LUN) is ready (RDY = 1, ARDY = 1), the host can transfer the data to a new page by issuing the PROGRAM FOR INTERNAL DATA MOVE (85h-10h) command, When the die (LUN) is again ready (RDY = 1, ARDY= 1), the host should check the FAIL bit to verily that this operation completed successfully. To prevent bit errors from accumulating over multiple INTERNAL DATA MOVE opera- tions, itis recommended that the host read the data out of the cache register after the READ FOR INTERNAL DATA MOVE (00h-35h) completes and prior to issuing the PRO- GRAM FOR INTERNAL DATA MOVE (85h-10h) command. The RANDOM DATA READ (05h-E0h) command can be used to change the column address. The host should check the data for ECC errors and correct them. When the PROGRAM FOR INTERNAL DATA. MOVE (85h-10h) command is issued, any corrected data can be input. The PROGRAM FORINTERNAL DATA INPUT (85h) command can be used to change the column address. Itis not possible to use the READ FOR INTERNAL DATA MOVE operation to move data from one plane to another or from one die (LUN) to another. Instead, use a READ PAGE (Oh-30h) or READ FOR INTERNAL DATA MOVE (00h-35h) command to read the data out of the NAND, and then use a PROGRAM PAGE (80h-10h) command with data input to program the data to a new plane or die (LUN). Between the READ FOR INTERNAL DATA MOVE (00h-35h) and PROGRAM FOR INTER- NAL DATA MOVE (85h-10h) commands, the following commands are supported: status operations (70h, 78h) and column address operations (0Sh-E0h, 06h-EOh, 85h). The RE- SET operation (Fh) can be issued after READ FOR INTERNAL DATA MOVE (00h-35h), but the contents of the cache registers on the target are not valid. In devices that have more than one die (LUN) per target, once the READ FOR INT! NAL DATA MOVE (00h-35h) is issued, interleaved die (multi-LUN) operations are pro- hibited until after the PROGRAM FOR INTERNAL DATA MOVE (85h-10h) command is issued, ‘Two-Plane Read for Internal Data Move Operations ‘Two-plane internal data move read operations improve read data throughput by copy- ing data simultaneously from more than one plane to the specified cache registers. This is done by issuing the READ PAGE TWO-PLANE (00h-00h-30h) command or the READ FOR INTERNAL DATA MOVE (00h-00h-35h) command. ‘The INTERNAL DATA MOVE PROGRAM TWO-PLANE (85h-11h) command can be used to further system performance of PROGRAM FOR INTERNAL DATA MOVE operations by enabling movement of multiple pages from the cache registers to different planes of the NAND Flash array. This is done by prepending one or more PROGRAM FOR INTER- NAL DATA MOVE (85h-11h) commands in front of the PROGRAM FOR INTERNAL '85h-10h) command. See Two-Plane Operations for details. 7 Tiong ncaaMicron Confidential and Proprietary aan cron 2Gb: x8, x16 NAND Flash Memory Internal Data Move Operations Figure 50: INTERNAL DATA MOVE (85h-10h) with Internal ECC Enabled nce, spnoc.teg wotr on) REE os) (Gon) -savor Yo.) 6a | sn) BERR 160) ——{on)( ar (om) — Figure 51: INTERNAL DATA MOVE (85h-10h) with RANDOM DATA INPUT with Internal ECC Enabled £2291 BEE) XX) $$} | NEE) OY ERDED©) $0 PROGRAM FOR INTERNAL DATA MOVE (85h-10h) ‘The PROGRAM FOR INTERNAL DATA MOVE (85h-10h) command is functionally iden- tical to the PROGRAM PAGE (80b-10h) command, except that when 85h is written to the command register, cache register contents are not cleared. Figure 52: PROGRAM FOR INTERNAL DATA MOVE (85h-10h) Operation ice cype — een) ES) TE) ES) (ER) rnd) vor) uh Xa Xa Xm me Xe twa, 06. nov er re 7a Tio alo ncaaMicron Confidential and Proprietary aan cron 2Gb: x8, x16 NAND Flash Memory Block Lock Feature Block Lock Feature ‘The block lock feature protects either the entire device or ranges of blocks from being programmed and erased. Using the block lock feature is preferable to using WP# to pre- vent PROGRAM and ERASE operations. Block lock is enabled and disabled at power-on through the LOCK pin. At power-on, if, LOCK is LOW, all BLOCK LOCK commands are disabled. However if LOCK is HIGH at power-on, the BLOCK LOCK commands are enabled and, by default, all the blocks on. the device are protected, or locked, from PROGRAM and ERASE operations, even if WP# is HIGH, Before the contents of the device can be modified, the device must first be unlocked. Either a range of blocks or the entire device may be unlocked. PROGRAM and ERASE operations complete successfully only in the block ranges that have been unlocked. Blocks, once unlocked, can be locked again to protect them from further PROGRAM and ERASE operations. Blocks that are locked can be protected further, or locked tight. When locked tight, the device's blocks can no longer be locked or unlocked until the device is power cycled. WP# and Block Lock The following is true when the block lock feature is enabled: + Holding WP# LOW locks all blocks, provided the blocks are not locked tight. + If WP# is held LOW to lock blocks, then returned to HIGH, a new UNLOCK command must be issued to unlock blocks. UNLOCK (23h-24h) By default at power-on, if LOCK is HIGH, all the blocks are locked and protected from PROGRAM and ERASE operations. The UNLOCK (23h) command is used to unlock a range of blocks. Unlocked blocks have no protection and can be programmed or erased. ‘The UNLOCK command uses two registers, a lower boundary block address register and an upper boundary block address register, and the invert area bit to determine what range of blocks are unlocked. When the invert area bit = 0, the range of blocks within the lower and upper boundary address registers are unlocked, When the invert area bit = 1, the range of blocks outside the boundaries of the lower and upper boun- dary address registers are unlocked. The lower boundary block address must be less than the upper boundary block address. The figures below show examples of how the lower and upper boundary address registers work with the invert area bit. To unlock a range of blocks, issue the UNLOCK (23h) command followed by the appro- priate address cycles that indicate the lower boundary block address. Then issue the 24h command followed by the appropriate address cycles that indicate the upper boun- dary block address. The least significant page address bit, PAO, should be set to 1 if, setting the invert area bit; otherwise, it should be 0. The other page address bits should beo. Only one range of blocks can be specified in the lower and upper boundary block ad- dress registers. If after unlocking a range of blocks the UNLOCK command is again issued, the new block address range determines which blocks are unlocked. The previ- ous unlocked block address range is not retained. 76 Tiong ncaaMicron Confidential and Proprietary aa cron 2Gb: x8, x16 NAND Flash Memory Block Lock Feature Table 16: Block Lock Address Cycle As: nments [ALE Cycle [volts:s]"| wo7 | vos | wos | wos | wos | woz | VOT 00. First Low. BAT eas_| tow | tow | tow | tow | Low | invert areabit® Second vow | eas | sara | sais | sar2 | Bart | Baio | BAS BAS Third tow | tow [ tow | tow | tow | tow | tow | sai BATE Notes: 1. VO[15:8] is applicable only for x16 devices. 2. Invert area bit is applicable for 24h command; it may be LOW or HIGH for 23h command. Figure 57: UNLOCK Operation wee ce > co \ Rew vox Cae SE 8) {28h } CSE Rss X36) Rew 78 Ties log nc ana i a ps pba aaMicron Confidential and Proprietary aan cron 2Gb: x8, x16 NAND Flash Memory Block Lock Feature LOCK TIGHT (2Ch) ‘The LOCK TIGHT (2Ch) command prevents locked blocks from being unlocked and al- so prevents unlocked blocks from being locked. When this command is issued, the UNLOCK (23h) and LOCK (2Ah) commands are disabled. This provides an additional level of protection against inadvertent PROGRAM and ERASE operations to locked blocks. ‘To implement LOCK TIGHT in all of the locked blocks in the device, verify that WP# is HIGH and then issue the LOCK TIGHT (2Ch) command. When a PROGRAM or ERASE operation is issued to a locked block that has also been locked tight, R/B# goes LOW for ‘LBSY. The PROGRAM or ERASE operation does not complete. The READ STATUS (70h) command reports bit 7 as 0, indicating that the block is protected. PROGRAM and ERASE operations complete successfully to blocks ‘that were not locked at the time the LOCK TIGHT command was issued. Alter the LOCK TIGHT command is issued, the command cannot be disabled via a soft- ware command, The only ways to disable the lock tight status is to power cycle the device. When the lock tight status is disabled, all of the blocks become locked, the same as if the LOCK (2Ah) command had been issued. ‘The LOCK TIGHT (2Ch) command is disabled if LOCK is LOW at power-on. Figure 59: LOCK TIGHT Operation Lock wre ae /_\ ae \ wee \_/ ox 2ch Lock TIGHT command pee r) Tio aaleg ncaaMicron Confidential and Proprietary aan cron 2Gb: x8, x16 NAND Flash Memory Block Lock Feature Figure 62: BLOCK LOCK Flowchart CPowerup) Power-up with <~ — Power-up with Tock mgt Oc Co a ~~ (defaut) Entire NAND Flash BLOCK LOCK function _—______ array locked disabled Lock nsHT cmd vith WPe and Took HGH Entire NAND Flash array locked tight UNLOCK cmd with Invert area bh UNLOCK cid ith invert area bit =0 werrow| Unlocked range wen tow | Locked range >100n# oF eens or UNLOCK cima ity mn a invert area bit= 0 Lock cms | ocked range LOCK emé | Untocked range UNLOCK Cm with invert area bt >} Unlocked range [UNLOCK cml with invert area bi Locked range UNLOCK cna Wwithinver' ares | Lock TIGHT cma Lock Tis cma be ‘with WP ana with Wand Unlocked range Locked tight range Locked tight range. Unlocked range Unlocked range Locked-tight range @ Ter Talo nc rareMicron Confidential and Proprietary " 2Gb: x8, x16 NAND Flash Memory a cron One-Time Programmable (OTP) Operations OTP DATA PROGRAM (80h-10h) ‘The OTP DATA PROGRAM (80h-10h) command is used to write data to the pages within the OTP area, An entire page can be programmed at one time, or a page can be partially programmed up to eight times. Only the OTP area allows up to eight partial-page pro- grams. The rest of the blocks support only four partial-page programs. There is no ERASE operation for OTP pages. PROGRAM PAGE enables programming into an offset of an OTP page using two bytes of the column address (CA(12:0)). The command is compatible with the RANDOM DATA INPUT (85h) command. The PROGRAM PAGE command will not execute if the OTP area has been protected. To use the PROGRAM PAGE command, issue the 80h command. Issue n address cycles. ‘The first two address cycles are the column address. For the remaining cycles, select a page in the range of 02h-00h through 1Fh-00h. Next, write from 1-2112 bytes of data. After data input is complete, issue the 10h command. The internal control logic auto- matically executes the proper programming algorithm and controls the necessary tim- ing for programming and verification, R/B# goes LOW for the duration of the array programming time (‘PROG). The READ STATUS (70h) command is the only valid command for reading status in OTP operation mode. Bit 5 of the status register reflects the state of R/B#. When the device is ready, read bit 0 of the status register to determine whether the operation passed or failed (see Status Operations). Each OTP page can be programmed to 8 partial-page programming, uw Tiong ncaadicron Micron Confidential and Proprietary 2Gb: x8, x16 NAND Flash Memory One-Time Programmable (OTP) Operations Figure 64: OTP DATA PROGRAM Operation with RANDOM DATA INPUT (After Entering OTP Opera- tion Mode) ae /\ ee wy fo LS” Wi ™ n Ll. we \ SAT ADDN ANU NS NDB IDNA LT NS lve, moe wa re EEE) -CXI DED oot Care OTP DATA PROTECT (80h-10) The OTP areais protected on a block basis. To protect a block, set the device to OTP protect mode, then issue the PROGRAM PAGE (80h-10h) command and write OTP ad- dress 00h, 00h, 00h, 00h. To set the device to OTP protect mode, issue the SI TURE (EFh) command to 90h (feature address) and write 03h to PI, followed by three cycles of 00h to P2-P4, After the data is protected, it cannot be programmed further. When the OTP areas pro- tected, the pages within the area are no longer programmable and cannotbe unprotected. To use the PROGRAM PAGE command to protect the OTP area, issue the 80h com- mand, followed by n address cycles, write 00h data, data cycle of 00h, followed by the 10h command. (An example of the address sequence is shown in the following figure.) If an OTP DATA PROGRAM command is issued after the OTP area has been protected, R/ Bf will go LOW for ‘OBSY. ‘The READ STATUS (70h) command is the only valid command for reading status in OTP operation mode. Bit 5 of the status register reflects the state of R/B#. ‘When the device is ready, read bit 0 of the status register to determine whether the oper- ation passed or failed (see Status Operations) % Tiong ncaaMicron Confidential and Proprietary aan cron 2Gb: x8, x16 NAND Flash Memory One-Time Programmable (OTP) Operations OTP DATA READ (00h-30h) To read data from the OTP area, set the device to OTP operation mode, then issue the PAGE READ (00h-30h) command. Data can be read from OTP pages within the OTP area whether the area is protected or not. To use the PAGE READ command for reading data from the OTP area, issue the 00h command, and then issue five address cycles: for the first two cycles, the column ad- dress; and for the remaining address cycles, select a page in the range of 02h-00h-00h through 1Fh-00h-00h. Lastly, issue the 30h command. The PAGE READ CACHE MODE command is not supported on OTP pages. R/B# goes LOW (‘R) while the data is moved from the OTP page to the data register. The READ STATUS (70h) command is the only valid command for reading statu in OTP operation mode. Bit 5 of the status register reflects the state of R/B# (see Status Opera- tions) Normal READ operation timings apply to OTP read accesses. Additional pages within the OTP area can be selected by repeating the OTP DATA READ command. ‘The PAGE READ command is compatible with the RANDOM DATA OUTPUT (05h-F0h) command. Only data on the current page can be read, Pulsing RE# outputs data sequentially. Figure 66: OTP DATA READ vox new / \Ls, u 0h Tal\ Ca OTP, {add 1X add 2X pagetX 00% OTP address susy KI Note: 1. The OTP page must be within the 02h-1Fh range. 8 Tiong ncaaMicron Confidential and Proprietary aan cron 2Gb: x8, x16 NAND Flash Memory Two-Plane Operations Two-Plane Operations Each NAND Flash logical unit (LUN) is divided into multiple physical planes. Each plane contains a cache register and a data register independent of the other planes. The planes are addressed via the low-order block address bits. Specific details are provided in Device and Array Organization. ‘Two-plane operations make better use of the NAND Flash arrays on these physical planes by performing concurrent READ, PROGRAM, or ERASE operations on multiple planes, significantly improving system performance. Two-plane operations must be of the same type across the planes; for example, itis not possible to perform a PROGRAM operation on one plane with an ERASE operation on another. ‘When issuing two-plane program or erase operations, use the READ STATUS (70h) com- mand and check whether the previous operation(s) failed. If the READ STATUS (70h) command indicates that an error occurred (FAIL = 1 and/or FAILC = 1), use the READ STATUS ENHANCED (78h) command to determine which plane operation failed. 9 ‘Two-plane commands require multiple, five-cycle addresses, one address per operation- al plane. Fora given two-plane operation, these addresses are subject to the following requirements: + The LUN address bit(s) must be identical for all of the issued addresses. ‘The plane select bit, BA(6], must be different for each issued address. + The page address bits, PA(5:0], must be identical for each issued address. ‘The READ STATUS (70h) command should be used following two-plane program page and erase block operations on a single die (LUN). r) Tiong ncaaMicron Confidential and Proprietary aan cron 2Gb: x8, x16 NAND Flash Memory Two-Plane Operations Figure 69: TWO-PLANE PAGE READ with RANDOM DATA READ ca tik tt “a IA Vinny ‘BRT aT THE) a) EB- CG) [ —}- no Ta i ne IVI IV von 1-66) ees HE) {fas [ones —$§$ Figure 70: TWO-PLANE PROGRAM PAGE ‘oasy ‘eros vy tt i vox Geir Ga [Tw r) (60) (are i) [sy (l) ——) — (as) — 2 eriedicron Micron Confidential and Proprietary 2Gb: x8, x16 NAND Flash Memory Two-Plane Operations Figure 72: TWO-PLANE PROGRAM PAGE CACHE MODE spasy vox —€) realest) 7) (e S _ ‘stplane 1 ‘easy ee ox 1605) —(fataresaata pat) (7) (oa) {renin nat) —(53) ‘stplane 2nd plane 1 2 spasy prog new om (a) reTaata nok) (1%) ‘st plane 2nd plane 2 94dicron Ree vox vox nae Ree vox Micron Confidential and Proprietary 2Gb: x8, x16 NAND Flash Memory Two-Plane Operations }: TWO-PLANE INTERNAL DATA MOVE with TWO-PLANE RANDOM DATA READ SL. LPS | Cy (ea i NGO aro GeO Baoan | [)~Ge) ation Beef} ‘seplane source 2nd-plane source Data from Teeplane source 2nd-plane source addres] 1 DVN US Data from 1] aneipiane source ata utout |) 05h) Address ees). (£03) (ata aut 5 Ind-plane source column address spasy WY Data from 2nd-plane source tom new column address ~- cots JT] sePlane destination \/ si) (aaaress (S aay(i) (si) (ares eyed) foh)-{ satus) 2nd-plane destination 96Micron Confidential and Proprietary aan cron 2Gb: x8, x16 NAND Flash Memory ‘Two-Plane Operations Figure 76: TWO-PLANE BLOCK ERASE we VV ONS VO V wm pe cy ee : es a onto Tone Figure 77: TWO-PLANE/MULTIPLE-DIE READ STATUS Cycle cee ce wee tar ace *WHR fREA vox Aare 8 Ge % TenMicron Confidential and Proprietary aan cron 2Gb: x8, x16 NAND Flash Memory Error Management Error Management Each NAND Flash die (LUN) is specified to have a minimum number of valid blocks (NVB) of the total available blocks. This means the die (LUNs) could have blocks that, are invalid when shipped from the factory. An invalid block is one that contains at least one page that has more bad bits than can be corrected by the minimum required ECC. Additional blocks can develop with use. However, the total number of available blocks per die (LUN) will not fall below NVB during the endurance life of the product. Although NAND Flash memory devices could contain bad blocks, they can be used quite reliably in systems that provide bad block management and error-correction algo- rithms. This type of software environment ensures data integrity. Internal circuitry isolates each block from other blocks, so the presence of a bad block does not affect the operation of the rest of the NAND Flash array. NAND Flash devices are shipped from the factory erased. The factory identifies invalid blocks before shipping by attempting to program the bad block mark into every loca- tion in the first page of each invalid block. It may not be possible to program every location with the bad block mark. However, the first spare area location in each bad block is guaranteed to contain the bad block mark. This method is compliant with ONFI Factory Defect Mapping requirements. See the following table for the first spare area location and the bad block mark. System software should check the first spare area location on the first page of each block prior to performing any PROGRAM or ERASE operations on the NAND Flash de- vice. A bad block table can then be created, enabling system software to map around these areas. Factory testing is performed under worst-case conditions. Because invalid blocks could be marginal, it may not be possible to recover this information if the block is erased. Over time, some memory locations may fail to program or erase properly. In order to ensure that data is stored properly over the life of the NAND Flash device, the following precautions are required: + Always check status after a PROGRAM ot ERASE operation + Under typical conditions, use the minimum required ECC (see table below) + Use bad block management and wear-leveling algorithms ‘The first block (physical block address 00h) for each CE# is guaranteed to be valid with ECC when shipped from the factory. Table 18: Error Management Details [Description Requirement Minimum number of valid blocks (NVB) per LUN [2008 [Total available blocks per LUN 2048 First spare area location x8: byte 2048 x16: word 1024 [Bad-block mark x8: 00h x16: 0000h [Minimum required ECC a-bit ECC per 528 bytes oT a adicron Micron Confidential and Proprietary 2Gb: x8, x16 NAND Flash Memory Internal ECC and Spare Area Mapping for ECC Internal ECC and Spare Area Mapping for ECC Internal ECC enables 5-bit detection and 4-bit error correction in 512 bytes (x8) or 256 ‘words (x16) of the main area and 4 bytes (x8) or 2 words (x16) of metadata I in the spare area, The metadata II area, which consists of two bytes (x8) and one word (x16), is not ECC protected. During the busy time for PROGRAM operations, internal ECC generates arity bits when error detection is complete. During READ operations the device executes the internal ECC engine (5-bit detection and 4-bit error correction). When the READ operaton is complete, read status bit 0 must be checked to determine whether errors larger than four bits have occurred. Following the READ STATUS command, the device must be returned to read mode by issuing the 00h command. Limitations of internal ECC include the spare area, defined in the figures below, and ECC parity areas thal cannot be written to. Each ECC user area (referred to as main and spare) must be written within one partial-page program so that the NAND device can calculate the proper ECC parity. The number of partial-page programs within a page cannot exceed four. Figure 78: Spare Area Mapping (x8) Max Byte | Min Byte ‘Address | Address |ECC Protected| Area_[Description iFFh | 00h Yes | Main 0 [User data arth | 20h Yes | Main 1 Juser data seh | 400 Yes | Main2 User data rF6h_|_ 600h yes__| Main3 [User data goth | 80h No Reserved sozh | 802h No User metadata i so7h | soah Yes | Spare o JUser metadata! sorh_| _80ah Yes __ | Spare 0 [Ecc for mainispare 0 ith | 810h No. Reserved si3h | 812h No User metadata i si7h | sian Yes | Spare t JUser metadata! BadGlok | ECC | User Data sirh_| 18h Yes Spare 1 |ECC for main/spare 1 intormation! ivieteant) 21h | 820 No Reserved 2bytes | sbytes | sbytes 82h | 82h No User metadata i 27h | a2an Yes | Spare 2 JUser metadata! 32Fh_|_828h yes __| Spare 2 [ECC for mainispare 2 31h | 830 No User data 32h | 832h No User metadata i 837h | a34h Yes | Spare 3 JUser metadata | s3fh_| 838h Yes _| Spare 3 [ECC for mainispare 3 702 eoMicron Confidential and Proprietary dicron 2Gb: x8, x16 NAND Flash Memory Electrical Specifications Electrical Specifications Stresses greater than those listed can cause permanent damage to the device. This is stress rating only, and functional operation of the device at these or any other condi- tions above those indicated in the operational sections of this specification is not guaranteed. Exposure to absolute maximum rating conditions for extended periods can affect reliability, Table 13: Absolute Maximum Ratings Voltage on any pin relative to V, [Parameter/Condition ‘Symbol Min ‘Max Unit Voltage input fav Vw 06 24 Vv 33v =06) 46 Vv \Vecsupply voltage [1.8V Vee =06 24 Vv B3v =06 46 Vv Storage temperature Tore = 150 *e Short dreuit output current, WOs = = 5 mA Table 20: Recommended Opera [Parameter/Condition Typ | Max | Unit Operating temperature [Commercial = 70 *€ Industral = 5 *C \Vecsupply voltage [18V | 135 Vv av 33 36 Vv [Ground supply voltage 0 ° Vv Table 21: Valid Blocks [Parameter | Symbol | Device Min Max Unit | Notes Valid block nye | Mr2sr26 | 2008 2048 Blocks | 1.2 number Notes: 1. Invalid blocks are blocks that contain one or more bad bits. The device may contain bad blocks upon shipment. Additional bad blocks may develop over time; however, the total number of available blocks will not drop below NVB during the endurance life of the device. Do not erase or program blocks marked invalid by the factory 2. Block OOh (the frst block) is guaranteed to be valid with ECC when shipped from the factory. 70g ween aieagnnc racemeMicron Confidential and Proprietary 2Gb: x8, x16 NAND Flash Memory GA CIOMN Electrical Specifications - DC Characteristics and Operating Conditions Electrical Specifications - DC Characteristics and Operating Conditions Table 24: DC Characteristics and Operating Conditions (3.3V) Parameter ‘Conditions Symbol | Min | Typ | Max | Unit | Notes Sequential READ current ['RC='RC (MIN); CE#=Vis| lec = 25 35 mA lout PROGRAM current = ke = 25 35 mA [ERASE current = Tees = 25 35 mA [Standby current (TTL) Isat = = 1 mA [Standby current (CMOS) ae = 10 50 pA [Staggered power-up cur- Rise time I = = |Toperdie| ma 1 rent Line capacitance = 0.1pF Input leakage current Vin= 0V to Vee ly = = #10 HA [Output leakage current Vour = OV to Vee ho. = = #10 A Input high voltage VOI7:0}, VOL15:0}, Vin [08xVec| = [veces] Vv Ef, CLE, ALE, WER, REA, wee Input low voltage, all in- = Vi 03 = foaxvee |v puts [Output high volage Ton = 4008 Vou [0.67 xVec]__— = Vv. 3 [output low voltage lot = 2.1mA Vou = = om Vv 3 [output low current Vou =0.4V. lou (ven [8 10 = mA 2 Notes: 1, Measurements taken with Ims averaging intervals and begins after Vec reaches Vec(MIN). 2. lox (RBH) may need to be relaxed if R/B pull-down strength is not set to full. 3. Vou and Voy may need to be relaxed if VO drive strength is not set to full 706 Seen aieagn ncaaMicron Confidential and Proprietary 2Gb: x8, x16 NAND Flash Memory GA CIOMN Electrical specifications - AC Characteristics and Operating Conditions Electrical Specifications - AC Characteristics and Operating Conditions Table 26: AC Characteri ies: Command, Data, and Address Input (3.3V) Note 1 applies to all Parameter Symbol Min Max Unit Notes [ALE to data start ‘ADL 70 = ns 2 [ALE hold time ‘ALH 5 = as [ALE setup time Tals: 10 = as [CE# hold time *cH 5 = ns [CLE hold time cH 5 = ns [CLE setup time tcis 10 = As [CE# setup time ts 15 = ns Data hold time *DH 5 = as Data setup time °Ds 7 = ns WRITE cycle time we 20 = ns WE# pulse width HIGH ‘WH 7 = As WEH pulse width we, 10 = AS [Wi transition to WEW LOW ww 100 = as Notes: 1. Operating mode timings meet ONFI timing mode 5 parameters. 2. Timing for ‘ADL begins in the address cycle, on the final rising edge of WE, and ends with the first rising edge of WEF for data input. Table 27: AC Characteristics: Command, Data, and Address Input (1.8V) Note 1 applies to all Parameter Symbol Min Max Unit Notes [ALE to data start *ADL 70 = ns 2 [ALE hold time *ALH 5 = ns [ALE setup time *ALS 10 = ns [CE# hold time ‘cH 5 = ns [CLE hold time *cuH 5 = ng [CLE setup time tas 10 = ns [Cé# setup time ws 20 = ns Data hold time "DH 5 = ns Data setup time ‘Ds 10 = As [WRITE cycle time ‘we 25 = ne 2 WE# pulse width HIGH ‘WH 10 = ns 2 WE# pulse width ‘we 2 = ns 2 WP transition to WE# LOW ww 100) = ns Notes: 1, Operating mode timings meet ONFI timing mode 4 parameters. 2, Timing for ADL begins in the address cycle on the final rising edge of WE#, and ends with the first rising edge of WE# for data input. FOB Se eieagn ncdicron Micron Confidential and Proprietary 2Gb: x8, x16 NAND Flash Memory Electrical Specifications - AC Characteristics and Operating Conditions Table 29: AC Characteristics: Normal Operation (1.8V) (Continued) Note 1 applies to all Parameter. ‘Symbol min Max Unit | Notes IRE# HIGH to output High-Z *RHZ = 5 ns 2 RE# LOW to output hold TRLOH 3 = ns RE# pulse width RP 2 = ns Ready to REW LOW RR 20 = ns Reset time (READ/PROGRAM/ERASE) 'RST = 5/107500 us 3 WE HIGH to busy ‘we = 100 ns [WE HIGH to RE¥ LOW WHR 80 = 0s Notes: AC characteristics may need to be relaxed if /O drive strength is not set to full. Transition is measured #200mV from steady-state voltage with load. This parameter is sampled and not 100% tested The first time the RESET (FFh) command is issued while the device is ile, the device will be busy for a maximum of 1ms. Thereafter, the device is busy for a maximum of Sys. TO Se aiaag nc aMicron Confidential and Proprietary aan cron 2Gb: x8, x16 NAND Flash Memory Asynchronous Interface Timing Asynchronous Interface Timing Diagrams Figure 80: RESET Operation cue cer ‘we wee \ Ma test Ree vor) Frh RESET command Figure 81: READ STATUS Cycle tar cue sas TH tes cee js wer Ree vorr.0) Don’t care Tig SeeingMicron Confidential and Proprietary " 2Gb: x8, x16 NAND Flash Memory a cron Asynchronous Interface Timing Diagrams Figure 84: READ PAGE cue faa C "LARA ALS ce| ut wes yvvF vox {oon (565 Gal Rew Row Rew )—( oh Pauty-(Doup ‘oT RDY 4 Don't Care pam 114 Seesmic tinMicron Confidential and Proprietary aan cron 2Gb: x8, x16 NAND Flash Memory Asynchronous Interface Timing Diagrams Figure 86: RANDOM DATA READ wet | tN sw q we oJ sen wt | = wox—Cpe-Papt)—{ sh aaa Xagaa X £9 eae Column dadress M ROY TeenaMicron Confidential and Proprietary dicron 2Gb: x8, x16 NAND Flash Memory Asynchronous Interface Timing Diagrams Figure 88: READ PAGE CACHE RANDOM POU 1 [Doone care sean Tig weenMicron Confidential and Proprietary dicron 2Gb: x8, x16 NAND Flash Memory Asynchronous Interface Timing Diagrams Figure 91: PROGRAM PAGE Operation with CE# “Don’t Care” aX AX. vox) addres 5 cle Bata} [input Date | [neat Cc) (— ‘ 4 NG ) Don't care Figure 92: PROGRAM PAGE Operation with RANDOM DATA INPUT ae { ce n ee : 720 Se anar mome EEMicron Confidential and Proprietary aan cron 2Gb: x8, x16 NAND Flash Memory Asynchronous Interface Timing Diagrams Figure 95: INTERNAL DATA MOVE. [Zp oenccae Figure 96: INTERNAL DATA MOVE (85h-10h) with Internal ECC Enabled vor. om (FEED CEN C 6a ENE Fan X Sanur Ym ‘Source adress “SR bit 0= 0 READ successful Days is optional Destinats SR bit 0 = O READ successful Sheit = OnEAD cer SRbt 1 ZOREAD enor Tag aeonsMicron Confidential and Proprietary aan cron 2Gb: x8, x16 NAND Flash Memory Revision History Revision History Rev. H, Production - 9/10 + From preliminary to production status Rev. G, Preliminary - 8/10 + Corrected errors in bytes 44-63 in Parameter Page Data Structure Table Rev. F, Preliminary - 6/10 + Added block endurance info back in to Parameter Page Data Structure Table Rev. E, Advance - 5/10 + Added part numbers to document + Removed Endurance spec from Features and Parameter Page Data Structure Table + Updated values in Parameter Page Data Structure Table + Corrected commands in OTP operations + Replaced Status Register Definition table with the correct one for ECC Rev. D, Advance - 3/10 + Updated value for byte 113 to O1h; value for byte 114 to OEh in Parameter Page Data Structure Tables + Updated note 6 in Electrical Specifications ~ Program/Erase Characteristics to say. "disabled" + Fixed note typo in Features Rev. C, Advance - 1/10 + Removed unsupported part numbers from Parameter Page Data Structure Tables and added new ones + Removed Boot Block Rev. B, Advance - 9/09 + Updated "Internal Data Move with Intemal ECC Enabled” graphic spec from 'R to ‘ECC + Updated “Internal Data Move with Random Data Input with Internal ECC Enabled" graphic spec from 'R to RE + Updated Boot Block Operation to include dual-plane restrictions + Added 'RCBSY spec to Electrical Specifications - Program/Erase Characteristics Added note for PROG and 'PROG_ECC specifications to Flectrical Specifications - Pro- gram/Erase Characteristics + Moved note from ‘RHW to 'RHZ in AC Characteristics and Operating Conditions Rev. A, Advance - 7/09 + Initial release 2g Ne ainagancmee