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Li et al., 2022 - Google Patents

Going through the life cycle of faults in clouds: Guidelines on fault handling

Li et al., 2022

Document ID
6818684780354904404
Author
Li X
Yu G
Chen P
Chen H
Chen Z
Publication year
Publication venue
2022 IEEE 33rd International Symposium on Software Reliability Engineering (ISSRE)

External Links

Snippet

Faults are the primary culprits of breaking the high availability of cloud systems, even leading to costly outages. As the scale and complexity of clouds increase, it becomes extraordinarily difficult to understand, detect and diagnose faults. During outages, engineers …
Continue reading at ieeexplore.ieee.org (other versions)

Classifications

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