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Chiang et al., 2004 - Google Patents

Reflow and burn-in of a Sn-20In-0.8 Cu ball grid array package with a Au/Ni/Cu pad

Chiang et al., 2004

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Document ID
6162100751932248472
Author
Chiang M
Chang S
Chuang T
Publication year
Publication venue
Journal of electronic materials

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Snippet

The intermetallic compounds formed after reflow and burn-in testing of a Sn-20In-0.8 Cu solder ball grid array (BGA) package are investigated. Along with the formation of the Cu 6 (Sn 0.78 In 0.22) 5 precipitates (IM1) in the solder matrix, scallop-shaped intermetallic …
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