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WO2016139179A3 - Verfahren und vorrichtung zum messen von im wesentlichen in zwei dimensionen ausgedehntem messgut - Google Patents

Verfahren und vorrichtung zum messen von im wesentlichen in zwei dimensionen ausgedehntem messgut Download PDF

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Publication number
WO2016139179A3
WO2016139179A3 PCT/EP2016/054223 EP2016054223W WO2016139179A3 WO 2016139179 A3 WO2016139179 A3 WO 2016139179A3 EP 2016054223 W EP2016054223 W EP 2016054223W WO 2016139179 A3 WO2016139179 A3 WO 2016139179A3
Authority
WO
WIPO (PCT)
Prior art keywords
measured
radiation
dimensions
measuring device
substantially extends
Prior art date
Application number
PCT/EP2016/054223
Other languages
English (en)
French (fr)
Other versions
WO2016139179A2 (de
Inventor
Frank Blecher
Mathias Klein
Original Assignee
BST ProControl GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by BST ProControl GmbH filed Critical BST ProControl GmbH
Publication of WO2016139179A2 publication Critical patent/WO2016139179A2/de
Publication of WO2016139179A3 publication Critical patent/WO2016139179A3/de

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/86—Investigating moving sheets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0691—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of objects while moving
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8901—Optical details; Scanning details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N22/00—Investigating or analysing materials by the use of microwaves or radio waves, i.e. electromagnetic waves with a wavelength of one millimetre or more
    • G01N22/04—Investigating moisture content
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/34—Paper
    • G01N33/346—Paper sheets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/86—Investigating moving sheets
    • G01N2021/8609—Optical head specially adapted
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/86—Investigating moving sheets
    • G01N2021/8609—Optical head specially adapted
    • G01N2021/8618—Optical head specially adapted with an optically integrating part, e.g. hemisphere
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/86—Investigating moving sheets
    • G01N2021/8663—Paper, e.g. gloss, moisture content

Landscapes

  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Medicinal Chemistry (AREA)
  • Food Science & Technology (AREA)
  • Electromagnetism (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)

Abstract

Die Erfindung betrifft ein Verfahren zum Messen von im Wesentlichen in zwei Dimensionen ausgedehntem Messgut (7) mit einem dissonanten Wechselwirkungsraum (1, 1), in welchen das Messgut eingeführt wird und in welchen elektromagnetische Strahlung eingebracht wird. Der Wechselwirkungsraum wird gebildet durch einen ersten Körper (1) und einen zweiten Körper (2). Ein Teil der Strahlung innerhalb des dissonanten Wechselwirkungsraumes der Messvorrichtung ändert durch diffuse Reflektion und / oder Brechung mehrfach die Richtung, wobei das Messgut (7) von einem Teil der Strahlung mehrfach durchdrungen wird und die Strahlung mit dem Messgut (7) wechselwirkt. Durch die Wechselwirkung der Strahlung mit dem Messgut wird mindestens ein Signal gewonnen, aus dem eine oder mehrere Materialeigenschaften des Messguts (7) abgeleitet werden. Die Erfindung betrifft ferner eine Messvorrichtung. Das erfindungsgemäße Verfahren und die erfindungsgemäße Messvorrichtung gestatten eine hochgenaue Messung von Materialeigenschaften eines Messguts 7.
PCT/EP2016/054223 2015-03-02 2016-02-29 Verfahren und vorrichtung zum messen von im wesentlichen in zwei dimensionen ausgedehntem messgut WO2016139179A2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102015102997.9 2015-03-02
DE102015102997.9A DE102015102997A1 (de) 2015-03-02 2015-03-02 Verfahren und Vorrichtung zum Messen von im Wesentlichen in zwei Dimensionen ausgedehntem Messgut

Publications (2)

Publication Number Publication Date
WO2016139179A2 WO2016139179A2 (de) 2016-09-09
WO2016139179A3 true WO2016139179A3 (de) 2016-10-27

Family

ID=55446794

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/EP2016/054223 WO2016139179A2 (de) 2015-03-02 2016-02-29 Verfahren und vorrichtung zum messen von im wesentlichen in zwei dimensionen ausgedehntem messgut

Country Status (2)

Country Link
DE (1) DE102015102997A1 (de)
WO (1) WO2016139179A2 (de)

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB899855A (en) * 1959-01-12 1962-06-27 Nash Paul Improvements in inspection of sheet materials by photo-electric means
US3854044A (en) * 1972-03-14 1974-12-10 Ici Ltd A method and apparatus for measuring a transmission spectrum of a film
GB1381878A (en) * 1970-11-26 1975-01-29 Lippke P Apparatus for detecting irregularities in moving webs of material
US4052615A (en) * 1976-07-30 1977-10-04 Industrial Nucleonics Corporation Spherical cavity method and apparatus for measuring a sheet material property using infrared radiation
DE2714397A1 (de) * 1976-04-05 1977-10-13 Industrial Nucleonics Corp Verfahren und vorrichtung fuer messungen an duennen filmen mit spiegelnden oberflaechen unter verwendung von infrarotstrahlung
US5355083A (en) * 1988-11-16 1994-10-11 Measurex Corporation Non-contact sensor and method using inductance and laser distance measurements for measuring the thickness of a layer of material overlaying a substrate
US20090200280A1 (en) * 2006-08-03 2009-08-13 Matteo Piantoni Device for laser cutting a continuous strip

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3793524A (en) 1972-09-05 1974-02-19 Measurex Corp Apparatus for measuring a characteristic of sheet materials
US4904928A (en) 1988-12-09 1990-02-27 E. I. Du Pont De Nemours And Company Measurement apparatus and method utilizing multiple resonant modes of microwave energy
US5615005A (en) * 1995-01-23 1997-03-25 Ugts, Inc. Gemstone evaluation system
AU9315498A (en) * 1997-10-10 1999-05-03 Northeast Robotics Llc Imaging method and system with elongate inspection zone

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB899855A (en) * 1959-01-12 1962-06-27 Nash Paul Improvements in inspection of sheet materials by photo-electric means
GB1381878A (en) * 1970-11-26 1975-01-29 Lippke P Apparatus for detecting irregularities in moving webs of material
US3854044A (en) * 1972-03-14 1974-12-10 Ici Ltd A method and apparatus for measuring a transmission spectrum of a film
DE2714397A1 (de) * 1976-04-05 1977-10-13 Industrial Nucleonics Corp Verfahren und vorrichtung fuer messungen an duennen filmen mit spiegelnden oberflaechen unter verwendung von infrarotstrahlung
US4052615A (en) * 1976-07-30 1977-10-04 Industrial Nucleonics Corporation Spherical cavity method and apparatus for measuring a sheet material property using infrared radiation
US5355083A (en) * 1988-11-16 1994-10-11 Measurex Corporation Non-contact sensor and method using inductance and laser distance measurements for measuring the thickness of a layer of material overlaying a substrate
US20090200280A1 (en) * 2006-08-03 2009-08-13 Matteo Piantoni Device for laser cutting a continuous strip

Also Published As

Publication number Publication date
DE102015102997A1 (de) 2016-09-08
WO2016139179A2 (de) 2016-09-09

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