WO2014103997A1 - 感光性樹脂組成物、硬化膜の製造方法、硬化膜、有機el表示装置および液晶表示装置 - Google Patents
感光性樹脂組成物、硬化膜の製造方法、硬化膜、有機el表示装置および液晶表示装置 Download PDFInfo
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- WO2014103997A1 WO2014103997A1 PCT/JP2013/084444 JP2013084444W WO2014103997A1 WO 2014103997 A1 WO2014103997 A1 WO 2014103997A1 JP 2013084444 W JP2013084444 W JP 2013084444W WO 2014103997 A1 WO2014103997 A1 WO 2014103997A1
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- 239000011342 resin composition Substances 0.000 title claims abstract description 108
- 238000004519 manufacturing process Methods 0.000 title claims description 18
- 239000004973 liquid crystal related substance Substances 0.000 title claims description 16
- 150000001875 compounds Chemical class 0.000 claims abstract description 116
- 239000000758 substrate Substances 0.000 claims abstract description 89
- -1 quinonediazide compound Chemical class 0.000 claims abstract description 56
- 229920000642 polymer Polymers 0.000 claims abstract description 33
- 238000011161 development Methods 0.000 claims abstract description 24
- 239000002253 acid Substances 0.000 claims abstract description 23
- UMGDCJDMYOKAJW-UHFFFAOYSA-N thiourea group Chemical group NC(=S)N UMGDCJDMYOKAJW-UHFFFAOYSA-N 0.000 claims abstract description 8
- 239000002904 solvent Substances 0.000 claims description 40
- 238000000034 method Methods 0.000 claims description 37
- 125000004432 carbon atom Chemical group C* 0.000 claims description 35
- 125000000217 alkyl group Chemical group 0.000 claims description 27
- 125000002887 hydroxy group Chemical group [H]O* 0.000 claims description 21
- 239000011229 interlayer Substances 0.000 claims description 21
- 125000004429 atom Chemical group 0.000 claims description 17
- 125000004433 nitrogen atom Chemical group N* 0.000 claims description 16
- 229910052757 nitrogen Inorganic materials 0.000 claims description 15
- 230000008569 process Effects 0.000 claims description 14
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 claims description 12
- 125000004435 hydrogen atom Chemical group [H]* 0.000 claims description 12
- 125000004573 morpholin-4-yl group Chemical group N1(CCOCC1)* 0.000 claims description 12
- ISWSIDIOOBJBQZ-UHFFFAOYSA-N phenol group Chemical group C1(=CC=CC=C1)O ISWSIDIOOBJBQZ-UHFFFAOYSA-N 0.000 claims description 11
- 239000007787 solid Substances 0.000 claims description 11
- 125000000962 organic group Chemical group 0.000 claims description 10
- 125000003566 oxetanyl group Chemical group 0.000 claims description 10
- 125000003700 epoxy group Chemical group 0.000 claims description 9
- 125000004122 cyclic group Chemical group 0.000 claims description 6
- 238000001312 dry etching Methods 0.000 claims description 5
- 125000005647 linker group Chemical group 0.000 claims description 5
- 229920001187 thermosetting polymer Polymers 0.000 claims description 5
- 125000001183 hydrocarbyl group Chemical group 0.000 claims 1
- 239000000126 substance Substances 0.000 abstract description 19
- 230000001747 exhibiting effect Effects 0.000 abstract 1
- 239000010408 film Substances 0.000 description 137
- 239000000203 mixture Substances 0.000 description 39
- 239000000243 solution Substances 0.000 description 16
- 238000010438 heat treatment Methods 0.000 description 13
- 150000002430 hydrocarbons Chemical group 0.000 description 13
- 239000007864 aqueous solution Substances 0.000 description 12
- FFUAGWLWBBFQJT-UHFFFAOYSA-N hexamethyldisilazane Chemical compound C[Si](C)(C)N[Si](C)(C)C FFUAGWLWBBFQJT-UHFFFAOYSA-N 0.000 description 12
- 239000010410 layer Substances 0.000 description 12
- 238000000576 coating method Methods 0.000 description 11
- 230000000052 comparative effect Effects 0.000 description 11
- 239000004094 surface-active agent Substances 0.000 description 11
- NIXOWILDQLNWCW-UHFFFAOYSA-M Acrylate Chemical compound [O-]C(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-M 0.000 description 10
- 125000002947 alkylene group Chemical group 0.000 description 10
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 10
- 229910052753 mercury Inorganic materials 0.000 description 10
- 230000015572 biosynthetic process Effects 0.000 description 9
- 125000006165 cyclic alkyl group Chemical group 0.000 description 9
- 239000011521 glass Substances 0.000 description 9
- OTTZHAVKAVGASB-UHFFFAOYSA-N hept-2-ene Chemical compound CCCCC=CC OTTZHAVKAVGASB-UHFFFAOYSA-N 0.000 description 9
- NIXOWILDQLNWCW-UHFFFAOYSA-N 2-Propenoic acid Natural products OC(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 8
- CERQOIWHTDAKMF-UHFFFAOYSA-N Methacrylic acid Chemical compound CC(=C)C(O)=O CERQOIWHTDAKMF-UHFFFAOYSA-N 0.000 description 8
- SECXISVLQFMRJM-UHFFFAOYSA-N N-Methylpyrrolidone Chemical compound CN1CCCC1=O SECXISVLQFMRJM-UHFFFAOYSA-N 0.000 description 8
- 238000006243 chemical reaction Methods 0.000 description 8
- 229920005989 resin Polymers 0.000 description 8
- 239000011347 resin Substances 0.000 description 8
- 239000006087 Silane Coupling Agent Substances 0.000 description 7
- WYURNTSHIVDZCO-UHFFFAOYSA-N Tetrahydrofuran Chemical group C1CCOC1 WYURNTSHIVDZCO-UHFFFAOYSA-N 0.000 description 7
- 239000011248 coating agent Substances 0.000 description 7
- 238000004132 cross linking Methods 0.000 description 7
- 239000010936 titanium Substances 0.000 description 7
- IAZDPXIOMUYVGZ-UHFFFAOYSA-N Dimethylsulphoxide Chemical compound CS(C)=O IAZDPXIOMUYVGZ-UHFFFAOYSA-N 0.000 description 6
- 125000001931 aliphatic group Chemical group 0.000 description 6
- 239000002585 base Substances 0.000 description 6
- 229910052799 carbon Chemical group 0.000 description 6
- 238000001723 curing Methods 0.000 description 6
- 125000002883 imidazolyl group Chemical group 0.000 description 6
- 239000000463 material Substances 0.000 description 6
- 229910052750 molybdenum Inorganic materials 0.000 description 6
- 125000004430 oxygen atom Chemical group O* 0.000 description 6
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 6
- 125000005936 piperidyl group Chemical group 0.000 description 6
- 125000001424 substituent group Chemical group 0.000 description 6
- BQTPKSBXMONSJI-UHFFFAOYSA-N 1-cyclohexylpyrrole-2,5-dione Chemical compound O=C1C=CC(=O)N1C1CCCCC1 BQTPKSBXMONSJI-UHFFFAOYSA-N 0.000 description 5
- YLQBMQCUIZJEEH-UHFFFAOYSA-N Furan Chemical group C=1C=COC=1 YLQBMQCUIZJEEH-UHFFFAOYSA-N 0.000 description 5
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 5
- 229910004205 SiNX Inorganic materials 0.000 description 5
- 239000011733 molybdenum Substances 0.000 description 5
- 239000010409 thin film Substances 0.000 description 5
- 229910052719 titanium Inorganic materials 0.000 description 5
- UAJRSHJHFRVGMG-UHFFFAOYSA-N 1-ethenyl-4-methoxybenzene Chemical compound COC1=CC=C(C=C)C=C1 UAJRSHJHFRVGMG-UHFFFAOYSA-N 0.000 description 4
- ZADXFVHUPXKZBJ-UHFFFAOYSA-N 2-[(4-ethenylphenyl)methoxymethyl]oxirane Chemical compound C1=CC(C=C)=CC=C1COCC1OC1 ZADXFVHUPXKZBJ-UHFFFAOYSA-N 0.000 description 4
- 229910052581 Si3N4 Inorganic materials 0.000 description 4
- PPBRXRYQALVLMV-UHFFFAOYSA-N Styrene Chemical compound C=CC1=CC=CC=C1 PPBRXRYQALVLMV-UHFFFAOYSA-N 0.000 description 4
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 4
- 150000008064 anhydrides Chemical class 0.000 description 4
- 125000003118 aryl group Chemical group 0.000 description 4
- 238000004140 cleaning Methods 0.000 description 4
- 229920001577 copolymer Polymers 0.000 description 4
- JHIVVAPYMSGYDF-UHFFFAOYSA-N cyclohexanone Chemical compound O=C1CCCCC1 JHIVVAPYMSGYDF-UHFFFAOYSA-N 0.000 description 4
- 150000001990 dicarboxylic acid derivatives Chemical class 0.000 description 4
- 125000001664 diethylamino group Chemical group [H]C([H])([H])C([H])([H])N(*)C([H])([H])C([H])([H])[H] 0.000 description 4
- LZCLXQDLBQLTDK-UHFFFAOYSA-N ethyl 2-hydroxypropanoate Chemical compound CCOC(=O)C(C)O LZCLXQDLBQLTDK-UHFFFAOYSA-N 0.000 description 4
- XLLIQLLCWZCATF-UHFFFAOYSA-N ethylene glycol monomethyl ether acetate Natural products COCCOC(C)=O XLLIQLLCWZCATF-UHFFFAOYSA-N 0.000 description 4
- 238000011156 evaluation Methods 0.000 description 4
- VOZRXNHHFUQHIL-UHFFFAOYSA-N glycidyl methacrylate Chemical compound CC(=C)C(=O)OCC1CO1 VOZRXNHHFUQHIL-UHFFFAOYSA-N 0.000 description 4
- CATSNJVOTSVZJV-UHFFFAOYSA-N heptan-2-one Chemical compound CCCCCC(C)=O CATSNJVOTSVZJV-UHFFFAOYSA-N 0.000 description 4
- NGAZZOYFWWSOGK-UHFFFAOYSA-N heptan-3-one Chemical compound CCCCC(=O)CC NGAZZOYFWWSOGK-UHFFFAOYSA-N 0.000 description 4
- 230000007246 mechanism Effects 0.000 description 4
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 4
- 238000012545 processing Methods 0.000 description 4
- 230000009257 reactivity Effects 0.000 description 4
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 4
- 238000004528 spin coating Methods 0.000 description 4
- 238000003786 synthesis reaction Methods 0.000 description 4
- WGTYBPLFGIVFAS-UHFFFAOYSA-M tetramethylammonium hydroxide Chemical compound [OH-].C[N+](C)(C)C WGTYBPLFGIVFAS-UHFFFAOYSA-M 0.000 description 4
- VZCYOOQTPOCHFL-UHFFFAOYSA-N trans-butenedioic acid Natural products OC(=O)C=CC(O)=O VZCYOOQTPOCHFL-UHFFFAOYSA-N 0.000 description 4
- ZRDYULMDEGRWRC-UHFFFAOYSA-N (4-hydroxyphenyl)-(2,3,4-trihydroxyphenyl)methanone Chemical compound C1=CC(O)=CC=C1C(=O)C1=CC=C(O)C(O)=C1O ZRDYULMDEGRWRC-UHFFFAOYSA-N 0.000 description 3
- HTQNYBBTZSBWKL-UHFFFAOYSA-N 2,3,4-trihydroxbenzophenone Chemical compound OC1=C(O)C(O)=CC=C1C(=O)C1=CC=CC=C1 HTQNYBBTZSBWKL-UHFFFAOYSA-N 0.000 description 3
- ZWEHNKRNPOVVGH-UHFFFAOYSA-N 2-Butanone Chemical compound CCC(C)=O ZWEHNKRNPOVVGH-UHFFFAOYSA-N 0.000 description 3
- OCKQMFDZQUFKRD-UHFFFAOYSA-N 2-[(3-ethenylphenyl)methoxymethyl]oxirane Chemical compound C=CC1=CC=CC(COCC2OC2)=C1 OCKQMFDZQUFKRD-UHFFFAOYSA-N 0.000 description 3
- WXYSZTISEJBRHW-UHFFFAOYSA-N 4-[2-[4-[1,1-bis(4-hydroxyphenyl)ethyl]phenyl]propan-2-yl]phenol Chemical compound C=1C=C(C(C)(C=2C=CC(O)=CC=2)C=2C=CC(O)=CC=2)C=CC=1C(C)(C)C1=CC=C(O)C=C1 WXYSZTISEJBRHW-UHFFFAOYSA-N 0.000 description 3
- LSNNMFCWUKXFEE-UHFFFAOYSA-M Bisulfite Chemical compound OS([O-])=O LSNNMFCWUKXFEE-UHFFFAOYSA-M 0.000 description 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 3
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 3
- XEKOWRVHYACXOJ-UHFFFAOYSA-N Ethyl acetate Chemical compound CCOC(C)=O XEKOWRVHYACXOJ-UHFFFAOYSA-N 0.000 description 3
- VZCYOOQTPOCHFL-OWOJBTEDSA-N Fumaric acid Chemical compound OC(=O)\C=C\C(O)=O VZCYOOQTPOCHFL-OWOJBTEDSA-N 0.000 description 3
- WMFOQBRAJBCJND-UHFFFAOYSA-M Lithium hydroxide Chemical compound [Li+].[OH-] WMFOQBRAJBCJND-UHFFFAOYSA-M 0.000 description 3
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 3
- ZMXDDKWLCZADIW-UHFFFAOYSA-N N,N-Dimethylformamide Chemical compound CN(C)C=O ZMXDDKWLCZADIW-UHFFFAOYSA-N 0.000 description 3
- 239000004793 Polystyrene Substances 0.000 description 3
- KWYUFKZDYYNOTN-UHFFFAOYSA-M Potassium hydroxide Chemical compound [OH-].[K+] KWYUFKZDYYNOTN-UHFFFAOYSA-M 0.000 description 3
- OFOBLEOULBTSOW-UHFFFAOYSA-N Propanedioic acid Natural products OC(=O)CC(O)=O OFOBLEOULBTSOW-UHFFFAOYSA-N 0.000 description 3
- DNIAPMSPPWPWGF-UHFFFAOYSA-N Propylene glycol Chemical compound CC(O)CO DNIAPMSPPWPWGF-UHFFFAOYSA-N 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 3
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 3
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 3
- 150000001252 acrylic acid derivatives Chemical class 0.000 description 3
- 230000001476 alcoholic effect Effects 0.000 description 3
- 239000003513 alkali Substances 0.000 description 3
- 229910052782 aluminium Inorganic materials 0.000 description 3
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 3
- 150000001491 aromatic compounds Chemical class 0.000 description 3
- 238000007334 copolymerization reaction Methods 0.000 description 3
- 239000010949 copper Substances 0.000 description 3
- 229910052802 copper Inorganic materials 0.000 description 3
- SWXVUIWOUIDPGS-UHFFFAOYSA-N diacetone alcohol Chemical compound CC(=O)CC(C)(C)O SWXVUIWOUIDPGS-UHFFFAOYSA-N 0.000 description 3
- 150000002148 esters Chemical class 0.000 description 3
- 238000005530 etching Methods 0.000 description 3
- 125000000816 ethylene group Chemical group [H]C([H])([*:1])C([H])([H])[*:2] 0.000 description 3
- 125000005842 heteroatom Chemical group 0.000 description 3
- 238000007654 immersion Methods 0.000 description 3
- 239000007788 liquid Substances 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 238000002156 mixing Methods 0.000 description 3
- 239000003607 modifier Substances 0.000 description 3
- 239000000178 monomer Substances 0.000 description 3
- 150000002989 phenols Chemical class 0.000 description 3
- 229920002223 polystyrene Polymers 0.000 description 3
- 125000004805 propylene group Chemical group [H]C([H])([H])C([H])([*:1])C([H])([H])[*:2] 0.000 description 3
- 125000004309 pyranyl group Chemical group O1C(C=CC=C1)* 0.000 description 3
- 238000012360 testing method Methods 0.000 description 3
- 150000003527 tetrahydropyrans Chemical group 0.000 description 3
- BPSIOYPQMFLKFR-UHFFFAOYSA-N trimethoxy-[3-(oxiran-2-ylmethoxy)propyl]silane Chemical compound CO[Si](OC)(OC)CCCOCC1CO1 BPSIOYPQMFLKFR-UHFFFAOYSA-N 0.000 description 3
- UYBDKTYLTZZVEB-UHFFFAOYSA-N (2,3,4,5,6-pentahydroxyphenyl)-phenylmethanone Chemical compound OC1=C(O)C(O)=C(O)C(O)=C1C(=O)C1=CC=CC=C1 UYBDKTYLTZZVEB-UHFFFAOYSA-N 0.000 description 2
- NFNNWCSMHFTEQD-UHFFFAOYSA-N (2-hydroxyphenyl)-(2,3,4,5,6-pentahydroxyphenyl)methanone Chemical compound OC1=CC=CC=C1C(=O)C1=C(O)C(O)=C(O)C(O)=C1O NFNNWCSMHFTEQD-UHFFFAOYSA-N 0.000 description 2
- SSLASPHAKUVIRG-UHFFFAOYSA-N (2-methylcyclohexyl) prop-2-enoate Chemical compound CC1CCCCC1OC(=O)C=C SSLASPHAKUVIRG-UHFFFAOYSA-N 0.000 description 2
- YSBPNMOAQMQEHE-UHFFFAOYSA-N (2-methyloxiran-2-yl)methyl 2-methylprop-2-enoate Chemical compound CC(=C)C(=O)OCC1(C)CO1 YSBPNMOAQMQEHE-UHFFFAOYSA-N 0.000 description 2
- MWMWRSCIFDZZGW-UHFFFAOYSA-N (2-oxooxolan-3-yl) prop-2-enoate Chemical compound C=CC(=O)OC1CCOC1=O MWMWRSCIFDZZGW-UHFFFAOYSA-N 0.000 description 2
- RSHKWPIEJYAPCL-UHFFFAOYSA-N (3-ethyloxetan-3-yl)methyl 2-methylprop-2-enoate Chemical compound CC(=C)C(=O)OCC1(CC)COC1 RSHKWPIEJYAPCL-UHFFFAOYSA-N 0.000 description 2
- KETQAJRQOHHATG-UHFFFAOYSA-N 1,2-naphthoquinone Chemical compound C1=CC=C2C(=O)C(=O)C=CC2=C1 KETQAJRQOHHATG-UHFFFAOYSA-N 0.000 description 2
- 229940105324 1,2-naphthoquinone Drugs 0.000 description 2
- KBPLFHHGFOOTCA-UHFFFAOYSA-N 1-Octanol Chemical compound CCCCCCCCO KBPLFHHGFOOTCA-UHFFFAOYSA-N 0.000 description 2
- HNAGHMKIPMKKBB-UHFFFAOYSA-N 1-benzylpyrrolidine-3-carboxamide Chemical compound C1C(C(=O)N)CCN1CC1=CC=CC=C1 HNAGHMKIPMKKBB-UHFFFAOYSA-N 0.000 description 2
- CNJRPYFBORAQAU-UHFFFAOYSA-N 1-ethoxy-2-(2-methoxyethoxy)ethane Chemical compound CCOCCOCCOC CNJRPYFBORAQAU-UHFFFAOYSA-N 0.000 description 2
- JOLQKTGDSGKSKJ-UHFFFAOYSA-N 1-ethoxypropan-2-ol Chemical compound CCOCC(C)O JOLQKTGDSGKSKJ-UHFFFAOYSA-N 0.000 description 2
- LIPRQQHINVWJCH-UHFFFAOYSA-N 1-ethoxypropan-2-yl acetate Chemical compound CCOCC(C)OC(C)=O LIPRQQHINVWJCH-UHFFFAOYSA-N 0.000 description 2
- ARXJGSRGQADJSQ-UHFFFAOYSA-N 1-methoxypropan-2-ol Chemical compound COCC(C)O ARXJGSRGQADJSQ-UHFFFAOYSA-N 0.000 description 2
- XLPJNCYCZORXHG-UHFFFAOYSA-N 1-morpholin-4-ylprop-2-en-1-one Chemical compound C=CC(=O)N1CCOCC1 XLPJNCYCZORXHG-UHFFFAOYSA-N 0.000 description 2
- HIDBROSJWZYGSZ-UHFFFAOYSA-N 1-phenylpyrrole-2,5-dione Chemical compound O=C1C=CC(=O)N1C1=CC=CC=C1 HIDBROSJWZYGSZ-UHFFFAOYSA-N 0.000 description 2
- SDJHPPZKZZWAKF-UHFFFAOYSA-N 2,3-dimethylbuta-1,3-diene Chemical compound CC(=C)C(C)=C SDJHPPZKZZWAKF-UHFFFAOYSA-N 0.000 description 2
- CPEXFJVZFNYXGU-UHFFFAOYSA-N 2,4,6-trihydroxybenzophenone Chemical compound OC1=CC(O)=CC(O)=C1C(=O)C1=CC=CC=C1 CPEXFJVZFNYXGU-UHFFFAOYSA-N 0.000 description 2
- OJVAMHKKJGICOG-UHFFFAOYSA-N 2,5-hexanedione Chemical compound CC(=O)CCC(C)=O OJVAMHKKJGICOG-UHFFFAOYSA-N 0.000 description 2
- SMZOUWXMTYCWNB-UHFFFAOYSA-N 2-(2-methoxy-5-methylphenyl)ethanamine Chemical compound COC1=CC=C(C)C=C1CCN SMZOUWXMTYCWNB-UHFFFAOYSA-N 0.000 description 2
- XNDCKNKAZCKUNN-UHFFFAOYSA-N 2-(oxetan-3-yl)ethyl 2-methylprop-2-enoate Chemical compound CC(=C)C(=O)OCCC1COC1 XNDCKNKAZCKUNN-UHFFFAOYSA-N 0.000 description 2
- HZAXFHJVJLSVMW-UHFFFAOYSA-N 2-Aminoethan-1-ol Chemical compound NCCO HZAXFHJVJLSVMW-UHFFFAOYSA-N 0.000 description 2
- JFWFAUHHNYTWOO-UHFFFAOYSA-N 2-[(2-ethenylphenyl)methoxymethyl]oxirane Chemical compound C=CC1=CC=CC=C1COCC1OC1 JFWFAUHHNYTWOO-UHFFFAOYSA-N 0.000 description 2
- JESXATFQYMPTNL-UHFFFAOYSA-N 2-ethenylphenol Chemical compound OC1=CC=CC=C1C=C JESXATFQYMPTNL-UHFFFAOYSA-N 0.000 description 2
- MPAGVACEWQNVQO-UHFFFAOYSA-N 3-acetyloxybutyl acetate Chemical compound CC(=O)OC(C)CCOC(C)=O MPAGVACEWQNVQO-UHFFFAOYSA-N 0.000 description 2
- QMYGFTJCQFEDST-UHFFFAOYSA-N 3-methoxybutyl acetate Chemical compound COC(C)CCOC(C)=O QMYGFTJCQFEDST-UHFFFAOYSA-N 0.000 description 2
- YEJRWHAVMIAJKC-UHFFFAOYSA-N 4-Butyrolactone Chemical compound O=C1CCCO1 YEJRWHAVMIAJKC-UHFFFAOYSA-N 0.000 description 2
- BRPSWMCDEYMRPE-UHFFFAOYSA-N 4-[1,1-bis(4-hydroxyphenyl)ethyl]phenol Chemical compound C=1C=C(O)C=CC=1C(C=1C=CC(O)=CC=1)(C)C1=CC=C(O)C=C1 BRPSWMCDEYMRPE-UHFFFAOYSA-N 0.000 description 2
- ZMFWEWMHABZQNB-UHFFFAOYSA-N 6-acetyloxyhexyl acetate Chemical compound CC(=O)OCCCCCCOC(C)=O ZMFWEWMHABZQNB-UHFFFAOYSA-N 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- KAKZBPTYRLMSJV-UHFFFAOYSA-N Butadiene Chemical compound C=CC=C KAKZBPTYRLMSJV-UHFFFAOYSA-N 0.000 description 2
- SOGAXMICEFXMKE-UHFFFAOYSA-N Butylmethacrylate Chemical compound CCCCOC(=O)C(C)=C SOGAXMICEFXMKE-UHFFFAOYSA-N 0.000 description 2
- XXRCUYVCPSWGCC-UHFFFAOYSA-N Ethyl pyruvate Chemical compound CCOC(=O)C(C)=O XXRCUYVCPSWGCC-UHFFFAOYSA-N 0.000 description 2
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 2
- SIKJAQJRHWYJAI-UHFFFAOYSA-N Indole Chemical compound C1=CC=C2NC=CC2=C1 SIKJAQJRHWYJAI-UHFFFAOYSA-N 0.000 description 2
- RRHGJUQNOFWUDK-UHFFFAOYSA-N Isoprene Chemical compound CC(=C)C=C RRHGJUQNOFWUDK-UHFFFAOYSA-N 0.000 description 2
- BAPJBEWLBFYGME-UHFFFAOYSA-N Methyl acrylate Chemical compound COC(=O)C=C BAPJBEWLBFYGME-UHFFFAOYSA-N 0.000 description 2
- VVQNEPGJFQJSBK-UHFFFAOYSA-N Methyl methacrylate Chemical compound COC(=O)C(C)=C VVQNEPGJFQJSBK-UHFFFAOYSA-N 0.000 description 2
- 239000002202 Polyethylene glycol Substances 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- CDBYLPFSWZWCQE-UHFFFAOYSA-L Sodium Carbonate Chemical compound [Na+].[Na+].[O-]C([O-])=O CDBYLPFSWZWCQE-UHFFFAOYSA-L 0.000 description 2
- 239000004115 Sodium Silicate Substances 0.000 description 2
- UIIMBOGNXHQVGW-UHFFFAOYSA-M Sodium bicarbonate Chemical compound [Na+].OC([O-])=O UIIMBOGNXHQVGW-UHFFFAOYSA-M 0.000 description 2
- LCXXNKZQVOXMEH-UHFFFAOYSA-N Tetrahydrofurfuryl methacrylate Chemical compound CC(=C)C(=O)OCC1CCCO1 LCXXNKZQVOXMEH-UHFFFAOYSA-N 0.000 description 2
- 239000007983 Tris buffer Substances 0.000 description 2
- ALVGSDOIXRPZFH-UHFFFAOYSA-N [(1-diazonioimino-3,4-dioxonaphthalen-2-ylidene)hydrazinylidene]azanide Chemical compound C1=CC=C2C(=N[N+]#N)C(=NN=[N-])C(=O)C(=O)C2=C1 ALVGSDOIXRPZFH-UHFFFAOYSA-N 0.000 description 2
- JOBBTVPTPXRUBP-UHFFFAOYSA-N [3-(3-sulfanylpropanoyloxy)-2,2-bis(3-sulfanylpropanoyloxymethyl)propyl] 3-sulfanylpropanoate Chemical compound SCCC(=O)OCC(COC(=O)CCS)(COC(=O)CCS)COC(=O)CCS JOBBTVPTPXRUBP-UHFFFAOYSA-N 0.000 description 2
- 229940022663 acetate Drugs 0.000 description 2
- 150000001335 aliphatic alkanes Chemical class 0.000 description 2
- 150000001408 amides Chemical class 0.000 description 2
- 125000000732 arylene group Chemical group 0.000 description 2
- 150000007514 bases Chemical class 0.000 description 2
- 125000003785 benzimidazolyl group Chemical group N1=C(NC2=C1C=CC=C2)* 0.000 description 2
- 125000001164 benzothiazolyl group Chemical group S1C(=NC2=C1C=CC=C2)* 0.000 description 2
- QUKGYYKBILRGFE-UHFFFAOYSA-N benzyl acetate Chemical compound CC(=O)OCC1=CC=CC=C1 QUKGYYKBILRGFE-UHFFFAOYSA-N 0.000 description 2
- PXKLMJQFEQBVLD-UHFFFAOYSA-N bisphenol F Chemical compound C1=CC(O)=CC=C1CC1=CC=C(O)C=C1 PXKLMJQFEQBVLD-UHFFFAOYSA-N 0.000 description 2
- 238000009835 boiling Methods 0.000 description 2
- OBNCKNCVKJNDBV-UHFFFAOYSA-N butanoic acid ethyl ester Natural products CCCC(=O)OCC OBNCKNCVKJNDBV-UHFFFAOYSA-N 0.000 description 2
- DKPFZGUDAPQIHT-UHFFFAOYSA-N butyl acetate Chemical compound CCCCOC(C)=O DKPFZGUDAPQIHT-UHFFFAOYSA-N 0.000 description 2
- XUPYJHCZDLZNFP-UHFFFAOYSA-N butyl butanoate Chemical compound CCCCOC(=O)CCC XUPYJHCZDLZNFP-UHFFFAOYSA-N 0.000 description 2
- BTMVHUNTONAYDX-UHFFFAOYSA-N butyl propionate Chemical compound CCCCOC(=O)CC BTMVHUNTONAYDX-UHFFFAOYSA-N 0.000 description 2
- FFOPEPMHKILNIT-UHFFFAOYSA-N butyric acid isopropyl ester Natural products CCCC(=O)OC(C)C FFOPEPMHKILNIT-UHFFFAOYSA-N 0.000 description 2
- 150000001732 carboxylic acid derivatives Chemical class 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 238000006482 condensation reaction Methods 0.000 description 2
- 125000000113 cyclohexyl group Chemical group [H]C1([H])C([H])([H])C([H])([H])C([H])(*)C([H])([H])C1([H])[H] 0.000 description 2
- LJZJMIZQMNDARW-UHFFFAOYSA-N decan-3-yl 2-methylprop-2-enoate Chemical compound CCCCCCCC(CC)OC(=O)C(C)=C LJZJMIZQMNDARW-UHFFFAOYSA-N 0.000 description 2
- 150000001993 dienes Chemical class 0.000 description 2
- SBZXBUIDTXKZTM-UHFFFAOYSA-N diglyme Chemical compound COCCOCCOC SBZXBUIDTXKZTM-UHFFFAOYSA-N 0.000 description 2
- 125000003438 dodecyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 2
- 238000005401 electroluminescence Methods 0.000 description 2
- 239000003822 epoxy resin Substances 0.000 description 2
- MTZQAGJQAFMTAQ-UHFFFAOYSA-N ethyl benzoate Chemical compound CCOC(=O)C1=CC=CC=C1 MTZQAGJQAFMTAQ-UHFFFAOYSA-N 0.000 description 2
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 description 2
- 229940116333 ethyl lactate Drugs 0.000 description 2
- 229940117360 ethyl pyruvate Drugs 0.000 description 2
- LYCAIKOWRPUZTN-UHFFFAOYSA-N ethylene glycol Natural products OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 description 2
- 239000001530 fumaric acid Substances 0.000 description 2
- 238000005227 gel permeation chromatography Methods 0.000 description 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 2
- 229910052737 gold Inorganic materials 0.000 description 2
- 239000010931 gold Substances 0.000 description 2
- FUZZWVXGSFPDMH-UHFFFAOYSA-N hexanoic acid Chemical compound CCCCCC(O)=O FUZZWVXGSFPDMH-UHFFFAOYSA-N 0.000 description 2
- 125000000717 hydrazino group Chemical group [H]N([*])N([H])[H] 0.000 description 2
- WGCNASOHLSPBMP-UHFFFAOYSA-N hydroxyacetaldehyde Natural products OCC=O WGCNASOHLSPBMP-UHFFFAOYSA-N 0.000 description 2
- 230000006872 improvement Effects 0.000 description 2
- 229910010272 inorganic material Inorganic materials 0.000 description 2
- 239000011147 inorganic material Substances 0.000 description 2
- GJRQTCIYDGXPES-UHFFFAOYSA-N isobutyl acetate Chemical compound CC(C)COC(C)=O GJRQTCIYDGXPES-UHFFFAOYSA-N 0.000 description 2
- 125000000959 isobutyl group Chemical group [H]C([H])([H])C([H])(C([H])([H])[H])C([H])([H])* 0.000 description 2
- HJOVHMDZYOCNQW-UHFFFAOYSA-N isophorone Chemical compound CC1=CC(=O)CC(C)(C)C1 HJOVHMDZYOCNQW-UHFFFAOYSA-N 0.000 description 2
- JMMWKPVZQRWMSS-UHFFFAOYSA-N isopropyl acetate Chemical compound CC(C)OC(C)=O JMMWKPVZQRWMSS-UHFFFAOYSA-N 0.000 description 2
- VZCYOOQTPOCHFL-UPHRSURJSA-N maleic acid Chemical compound OC(=O)\C=C/C(O)=O VZCYOOQTPOCHFL-UPHRSURJSA-N 0.000 description 2
- 239000011976 maleic acid Substances 0.000 description 2
- 239000011159 matrix material Substances 0.000 description 2
- 125000005395 methacrylic acid group Chemical group 0.000 description 2
- BDAGIHXWWSANSR-UHFFFAOYSA-N methanoic acid Natural products OC=O BDAGIHXWWSANSR-UHFFFAOYSA-N 0.000 description 2
- HSDFKDZBJMDHFF-UHFFFAOYSA-N methyl 3-ethoxypropanoate Chemical compound CCOCCC(=O)OC HSDFKDZBJMDHFF-UHFFFAOYSA-N 0.000 description 2
- 125000001570 methylene group Chemical group [H]C([H])([*:1])[*:2] 0.000 description 2
- 150000002763 monocarboxylic acids Chemical class 0.000 description 2
- 125000004108 n-butyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 2
- ZWRUINPWMLAQRD-UHFFFAOYSA-N nonan-1-ol Chemical compound CCCCCCCCCO ZWRUINPWMLAQRD-UHFFFAOYSA-N 0.000 description 2
- JFNLZVQOOSMTJK-KNVOCYPGSA-N norbornene Chemical compound C1[C@@H]2CC[C@H]1C=C2 JFNLZVQOOSMTJK-KNVOCYPGSA-N 0.000 description 2
- WWZKQHOCKIZLMA-UHFFFAOYSA-N octanoic acid Chemical compound CCCCCCCC(O)=O WWZKQHOCKIZLMA-UHFFFAOYSA-N 0.000 description 2
- 125000002971 oxazolyl group Chemical group 0.000 description 2
- RPQRDASANLAFCM-UHFFFAOYSA-N oxiran-2-ylmethyl prop-2-enoate Chemical compound C=CC(=O)OCC1CO1 RPQRDASANLAFCM-UHFFFAOYSA-N 0.000 description 2
- 125000000466 oxiranyl group Chemical group 0.000 description 2
- PGMYKACGEOXYJE-UHFFFAOYSA-N pentyl acetate Chemical compound CCCCCOC(C)=O PGMYKACGEOXYJE-UHFFFAOYSA-N 0.000 description 2
- 239000005011 phenolic resin Substances 0.000 description 2
- LYKRPDCJKSXAHS-UHFFFAOYSA-N phenyl-(2,3,4,5-tetrahydroxyphenyl)methanone Chemical compound OC1=C(O)C(O)=CC(C(=O)C=2C=CC=CC=2)=C1O LYKRPDCJKSXAHS-UHFFFAOYSA-N 0.000 description 2
- XNGIFLGASWRNHJ-UHFFFAOYSA-N phthalic acid Chemical compound OC(=O)C1=CC=CC=C1C(O)=O XNGIFLGASWRNHJ-UHFFFAOYSA-N 0.000 description 2
- 125000003367 polycyclic group Chemical group 0.000 description 2
- 229920000647 polyepoxide Polymers 0.000 description 2
- 229920001223 polyethylene glycol Polymers 0.000 description 2
- 239000003505 polymerization initiator Substances 0.000 description 2
- 238000006116 polymerization reaction Methods 0.000 description 2
- 229920001296 polysiloxane Polymers 0.000 description 2
- 239000011148 porous material Substances 0.000 description 2
- BWHMMNNQKKPAPP-UHFFFAOYSA-L potassium carbonate Chemical compound [K+].[K+].[O-]C([O-])=O BWHMMNNQKKPAPP-UHFFFAOYSA-L 0.000 description 2
- 230000001737 promoting effect Effects 0.000 description 2
- YKYONYBAUNKHLG-UHFFFAOYSA-N propyl acetate Chemical compound CCCOC(C)=O YKYONYBAUNKHLG-UHFFFAOYSA-N 0.000 description 2
- LLHKCFNBLRBOGN-UHFFFAOYSA-N propylene glycol methyl ether acetate Chemical compound COCC(C)OC(C)=O LLHKCFNBLRBOGN-UHFFFAOYSA-N 0.000 description 2
- 230000001681 protective effect Effects 0.000 description 2
- 125000003373 pyrazinyl group Chemical group 0.000 description 2
- 125000004076 pyridyl group Chemical group 0.000 description 2
- 125000000719 pyrrolidinyl group Chemical group 0.000 description 2
- 125000005493 quinolyl group Chemical group 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 150000003377 silicon compounds Chemical class 0.000 description 2
- 229910052814 silicon oxide Inorganic materials 0.000 description 2
- NTHWMYGWWRZVTN-UHFFFAOYSA-N sodium silicate Chemical compound [Na+].[Na+].[O-][Si]([O-])=O NTHWMYGWWRZVTN-UHFFFAOYSA-N 0.000 description 2
- 229910052911 sodium silicate Inorganic materials 0.000 description 2
- 238000006467 substitution reaction Methods 0.000 description 2
- KDYFGRWQOYBRFD-UHFFFAOYSA-N succinic acid Chemical compound OC(=O)CCC(O)=O KDYFGRWQOYBRFD-UHFFFAOYSA-N 0.000 description 2
- 229910052717 sulfur Inorganic materials 0.000 description 2
- 125000004434 sulfur atom Chemical group 0.000 description 2
- SJMYWORNLPSJQO-UHFFFAOYSA-N tert-butyl 2-methylprop-2-enoate Chemical compound CC(=C)C(=O)OC(C)(C)C SJMYWORNLPSJQO-UHFFFAOYSA-N 0.000 description 2
- 229940073455 tetraethylammonium hydroxide Drugs 0.000 description 2
- LRGJRHZIDJQFCL-UHFFFAOYSA-M tetraethylazanium;hydroxide Chemical compound [OH-].CC[N+](CC)(CC)CC LRGJRHZIDJQFCL-UHFFFAOYSA-M 0.000 description 2
- 125000000335 thiazolyl group Chemical group 0.000 description 2
- 238000005406 washing Methods 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- KMYZNTFNKDSVBQ-UHFFFAOYSA-N (2,2,4,4-tetrafluorooxetan-3-yl)methyl 2-methylprop-2-enoate Chemical compound CC(=C)C(=O)OCC1C(F)(F)OC1(F)F KMYZNTFNKDSVBQ-UHFFFAOYSA-N 0.000 description 1
- XIHNYWVUDCUJSS-UHFFFAOYSA-N (2,2,4,4-tetrafluorooxetan-3-yl)methyl prop-2-enoate Chemical compound C(C=C)(=O)OCC1C(OC1(F)F)(F)F XIHNYWVUDCUJSS-UHFFFAOYSA-N 0.000 description 1
- IPYCLNNYAJFTRF-UHFFFAOYSA-N (2,2,4-trifluorooxetan-3-yl)methyl 2-methylprop-2-enoate Chemical compound CC(=C)C(=O)OCC1C(F)OC1(F)F IPYCLNNYAJFTRF-UHFFFAOYSA-N 0.000 description 1
- ZEBSRRUJBHTDPG-UHFFFAOYSA-N (2,2,4-trifluorooxetan-3-yl)methyl prop-2-enoate Chemical compound C(C=C)(=O)OCC1C(OC1F)(F)F ZEBSRRUJBHTDPG-UHFFFAOYSA-N 0.000 description 1
- PAVQOFIOWZTBJP-UHFFFAOYSA-N (2,2-difluorooxetan-3-yl)methyl 2-methylprop-2-enoate Chemical compound CC(=C)C(=O)OCC1COC1(F)F PAVQOFIOWZTBJP-UHFFFAOYSA-N 0.000 description 1
- ZTAVRFMHGDRNQR-UHFFFAOYSA-N (2,2-difluorooxetan-3-yl)methyl prop-2-enoate Chemical compound C(C=C)(=O)OCC1C(OC1)(F)F ZTAVRFMHGDRNQR-UHFFFAOYSA-N 0.000 description 1
- QWRVAXMLZCMVSL-UHFFFAOYSA-N (2,4,6-trihydroxyphenyl)-(3,4,5-trihydroxyphenyl)methanone Chemical compound OC1=CC(O)=CC(O)=C1C(=O)C1=CC(O)=C(O)C(O)=C1 QWRVAXMLZCMVSL-UHFFFAOYSA-N 0.000 description 1
- LLXVXPPXELIDGQ-UHFFFAOYSA-N (2,5-dioxopyrrolidin-1-yl) 3-(2,5-dioxopyrrol-1-yl)benzoate Chemical compound C=1C=CC(N2C(C=CC2=O)=O)=CC=1C(=O)ON1C(=O)CCC1=O LLXVXPPXELIDGQ-UHFFFAOYSA-N 0.000 description 1
- JKHVDAUOODACDU-UHFFFAOYSA-N (2,5-dioxopyrrolidin-1-yl) 3-(2,5-dioxopyrrol-1-yl)propanoate Chemical compound O=C1CCC(=O)N1OC(=O)CCN1C(=O)C=CC1=O JKHVDAUOODACDU-UHFFFAOYSA-N 0.000 description 1
- PVGATNRYUYNBHO-UHFFFAOYSA-N (2,5-dioxopyrrolidin-1-yl) 4-(2,5-dioxopyrrol-1-yl)butanoate Chemical compound O=C1CCC(=O)N1OC(=O)CCCN1C(=O)C=CC1=O PVGATNRYUYNBHO-UHFFFAOYSA-N 0.000 description 1
- VLARLSIGSPVYHX-UHFFFAOYSA-N (2,5-dioxopyrrolidin-1-yl) 6-(2,5-dioxopyrrol-1-yl)hexanoate Chemical compound O=C1CCC(=O)N1OC(=O)CCCCCN1C(=O)C=CC1=O VLARLSIGSPVYHX-UHFFFAOYSA-N 0.000 description 1
- ZDROXNKXVHPNBJ-UHFFFAOYSA-N (2,6-dihydroxyphenyl)-(2,3,4-trihydroxyphenyl)methanone Chemical compound OC1=C(O)C(O)=CC=C1C(=O)C1=C(O)C=CC=C1O ZDROXNKXVHPNBJ-UHFFFAOYSA-N 0.000 description 1
- DIBYQTLCOMYUAP-UHFFFAOYSA-N (2-hydroxy-4-methylphenyl)-(2,3,4-trihydroxyphenyl)methanone Chemical compound OC1=CC(C)=CC=C1C(=O)C1=CC=C(O)C(O)=C1O DIBYQTLCOMYUAP-UHFFFAOYSA-N 0.000 description 1
- KIJJAQMJSXOBIE-UHFFFAOYSA-N (2-methylcyclohexyl) 2-methylprop-2-enoate Chemical compound CC1CCCCC1OC(=O)C(C)=C KIJJAQMJSXOBIE-UHFFFAOYSA-N 0.000 description 1
- CBAZJHNEFIPCQJ-UHFFFAOYSA-N (2-methyloxetan-3-yl)methyl prop-2-enoate Chemical compound CC1OCC1COC(=O)C=C CBAZJHNEFIPCQJ-UHFFFAOYSA-N 0.000 description 1
- HOSJNFCDDCLEBM-UHFFFAOYSA-N (2-phenyloxetan-3-yl)methyl 2-methylprop-2-enoate Chemical compound CC(=C)C(=O)OCC1COC1C1=CC=CC=C1 HOSJNFCDDCLEBM-UHFFFAOYSA-N 0.000 description 1
- CVNOAESOWRUEFV-UHFFFAOYSA-N (2-phenyloxetan-3-yl)methyl prop-2-enoate Chemical compound C=CC(=O)OCC1COC1C1=CC=CC=C1 CVNOAESOWRUEFV-UHFFFAOYSA-N 0.000 description 1
- WYTZZXDRDKSJID-UHFFFAOYSA-N (3-aminopropyl)triethoxysilane Chemical compound CCO[Si](OCC)(OCC)CCCN WYTZZXDRDKSJID-UHFFFAOYSA-N 0.000 description 1
- PYEYLPDXIYOCJK-UHFFFAOYSA-N (3-ethyloxetan-3-yl)methyl prop-2-enoate Chemical compound C=CC(=O)OCC1(CC)COC1 PYEYLPDXIYOCJK-UHFFFAOYSA-N 0.000 description 1
- HWZREQONUGCFIT-UHFFFAOYSA-N (3-hydroxyphenyl)-(2,3,4-trihydroxyphenyl)methanone Chemical compound OC1=CC=CC(C(=O)C=2C(=C(O)C(O)=CC=2)O)=C1 HWZREQONUGCFIT-UHFFFAOYSA-N 0.000 description 1
- RYNQKSJRFHJZTK-UHFFFAOYSA-N (3-methoxy-3-methylbutyl) acetate Chemical compound COC(C)(C)CCOC(C)=O RYNQKSJRFHJZTK-UHFFFAOYSA-N 0.000 description 1
- PSGCQDPCAWOCSH-UHFFFAOYSA-N (4,7,7-trimethyl-3-bicyclo[2.2.1]heptanyl) prop-2-enoate Chemical compound C1CC2(C)C(OC(=O)C=C)CC1C2(C)C PSGCQDPCAWOCSH-UHFFFAOYSA-N 0.000 description 1
- FVHMFMMVURPZFE-UHFFFAOYSA-N (4-hydroxy-3-methoxyphenyl)-(2,3,4-trihydroxyphenyl)methanone Chemical compound C1=C(O)C(OC)=CC(C(=O)C=2C(=C(O)C(O)=CC=2)O)=C1 FVHMFMMVURPZFE-UHFFFAOYSA-N 0.000 description 1
- PJMXUSNWBKGQEZ-UHFFFAOYSA-N (4-hydroxyphenyl) 2-methylprop-2-enoate Chemical compound CC(=C)C(=O)OC1=CC=C(O)C=C1 PJMXUSNWBKGQEZ-UHFFFAOYSA-N 0.000 description 1
- WNHHRXSVKWWRJY-UHFFFAOYSA-N (5-methyl-5-bicyclo[2.2.1]hept-2-enyl)methanol Chemical compound C1C2C(C)(CO)CC1C=C2 WNHHRXSVKWWRJY-UHFFFAOYSA-N 0.000 description 1
- QYGBYAQGBVHMDD-XQRVVYSFSA-N (z)-2-cyano-3-thiophen-2-ylprop-2-enoic acid Chemical compound OC(=O)C(\C#N)=C/C1=CC=CS1 QYGBYAQGBVHMDD-XQRVVYSFSA-N 0.000 description 1
- MCVKQPXDZUEQQX-UHFFFAOYSA-N 1,1,1',1'-tetramethyl-3,3'-spirobi[2h-indene] Chemical compound C12=CC=CC=C2C(C)(C)CC11C2=CC=CC=C2C(C)(C)C1 MCVKQPXDZUEQQX-UHFFFAOYSA-N 0.000 description 1
- 125000002030 1,2-phenylene group Chemical group [H]C1=C([H])C([*:1])=C([*:2])C([H])=C1[H] 0.000 description 1
- 125000001989 1,3-phenylene group Chemical group [H]C1=C([H])C([*:1])=C([H])C([*:2])=C1[H] 0.000 description 1
- 125000001140 1,4-phenylene group Chemical group [H]C1=C([H])C([*:2])=C([H])C([H])=C1[*:1] 0.000 description 1
- QWOZZTWBWQMEPD-UHFFFAOYSA-N 1-(2-ethoxypropoxy)propan-2-ol Chemical compound CCOC(C)COCC(C)O QWOZZTWBWQMEPD-UHFFFAOYSA-N 0.000 description 1
- BLLFPKZTBLMEFG-UHFFFAOYSA-N 1-(4-hydroxyphenyl)pyrrole-2,5-dione Chemical compound C1=CC(O)=CC=C1N1C(=O)C=CC1=O BLLFPKZTBLMEFG-UHFFFAOYSA-N 0.000 description 1
- USRJNCZFXRJTNN-UHFFFAOYSA-N 1-(furan-2-yl)propan-2-yl prop-2-enoate Chemical compound C=CC(=O)OC(C)CC1=CC=CO1 USRJNCZFXRJTNN-UHFFFAOYSA-N 0.000 description 1
- XTWPKMFMPBGNKR-UHFFFAOYSA-N 1-[(4-hydroxyphenyl)methyl]pyrrole-2,5-dione Chemical compound C1=CC(O)=CC=C1CN1C(=O)C=CC1=O XTWPKMFMPBGNKR-UHFFFAOYSA-N 0.000 description 1
- NCFIKBMPEOEIED-UHFFFAOYSA-N 1-acridin-9-ylpyrrole-2,5-dione Chemical compound O=C1C=CC(=O)N1C1=C(C=CC=C2)C2=NC2=CC=CC=C12 NCFIKBMPEOEIED-UHFFFAOYSA-N 0.000 description 1
- MKRBAPNEJMFMHU-UHFFFAOYSA-N 1-benzylpyrrole-2,5-dione Chemical compound O=C1C=CC(=O)N1CC1=CC=CC=C1 MKRBAPNEJMFMHU-UHFFFAOYSA-N 0.000 description 1
- DURPTKYDGMDSBL-UHFFFAOYSA-N 1-butoxybutane Chemical compound CCCCOCCCC DURPTKYDGMDSBL-UHFFFAOYSA-N 0.000 description 1
- AKYYGBUVZFGJNI-UHFFFAOYSA-N 1-cyclohexyl-3-(2-morpholin-4-ylethyl)thiourea Chemical compound C1CCCCC1NC(=S)NCCN1CCOCC1 AKYYGBUVZFGJNI-UHFFFAOYSA-N 0.000 description 1
- JZHGRUMIRATHIU-UHFFFAOYSA-N 1-ethenyl-3-methylbenzene Chemical compound CC1=CC=CC(C=C)=C1 JZHGRUMIRATHIU-UHFFFAOYSA-N 0.000 description 1
- RRQYJINTUHWNHW-UHFFFAOYSA-N 1-ethoxy-2-(2-ethoxyethoxy)ethane Chemical compound CCOCCOCCOCC RRQYJINTUHWNHW-UHFFFAOYSA-N 0.000 description 1
- LMAUULKNZLEMGN-UHFFFAOYSA-N 1-ethyl-3,5-dimethylbenzene Chemical compound CCC1=CC(C)=CC(C)=C1 LMAUULKNZLEMGN-UHFFFAOYSA-N 0.000 description 1
- BPIUIOXAFBGMNB-UHFFFAOYSA-N 1-hexoxyhexane Chemical compound CCCCCCOCCCCCC BPIUIOXAFBGMNB-UHFFFAOYSA-N 0.000 description 1
- FENFUOGYJVOCRY-UHFFFAOYSA-N 1-propoxypropan-2-ol Chemical compound CCCOCC(C)O FENFUOGYJVOCRY-UHFFFAOYSA-N 0.000 description 1
- IMQFZQVZKBIPCQ-UHFFFAOYSA-N 2,2-bis(3-sulfanylpropanoyloxymethyl)butyl 3-sulfanylpropanoate Chemical compound SCCC(=O)OCC(CC)(COC(=O)CCS)COC(=O)CCS IMQFZQVZKBIPCQ-UHFFFAOYSA-N 0.000 description 1
- VBSNQEZPXZKHGV-UHFFFAOYSA-N 2,3-diethoxybicyclo[2.2.1]hept-5-ene Chemical compound C1C2C=CC1C(OCC)C2OCC VBSNQEZPXZKHGV-UHFFFAOYSA-N 0.000 description 1
- HMBHAQMOBKLWRX-UHFFFAOYSA-N 2,3-dihydro-1,4-benzodioxine-3-carboxylic acid Chemical compound C1=CC=C2OC(C(=O)O)COC2=C1 HMBHAQMOBKLWRX-UHFFFAOYSA-N 0.000 description 1
- WFDBQLSDFKLLEC-UHFFFAOYSA-N 2,3-dimethoxybicyclo[2.2.1]hept-5-ene Chemical compound C1C2C=CC1C(OC)C2OC WFDBQLSDFKLLEC-UHFFFAOYSA-N 0.000 description 1
- 150000003923 2,5-pyrrolediones Chemical class 0.000 description 1
- GNCWGJBWFNIEFN-UHFFFAOYSA-N 2-(2,2,4,4-tetrafluorooxetan-3-yl)ethyl 2-methylprop-2-enoate Chemical compound CC(=C)C(=O)OCCC1C(F)(F)OC1(F)F GNCWGJBWFNIEFN-UHFFFAOYSA-N 0.000 description 1
- DNVBWKQXWBFLEB-UHFFFAOYSA-N 2-(2,2,4,4-tetrafluorooxetan-3-yl)ethyl prop-2-enoate Chemical compound C(C=C)(=O)OCCC1C(OC1(F)F)(F)F DNVBWKQXWBFLEB-UHFFFAOYSA-N 0.000 description 1
- ARTPUKRPLFYMBC-UHFFFAOYSA-N 2-(2,2,4-trifluorooxetan-3-yl)ethyl 2-methylprop-2-enoate Chemical compound CC(=C)C(=O)OCCC1C(F)OC1(F)F ARTPUKRPLFYMBC-UHFFFAOYSA-N 0.000 description 1
- BKUCBQKVLFQKCK-UHFFFAOYSA-N 2-(2,2-difluorooxetan-3-yl)ethyl 2-methylprop-2-enoate Chemical compound CC(=C)C(=O)OCCC1COC1(F)F BKUCBQKVLFQKCK-UHFFFAOYSA-N 0.000 description 1
- DLSHFKONUOJZRD-UHFFFAOYSA-N 2-(2,2-difluorooxetan-3-yl)ethyl prop-2-enoate Chemical compound FC1(OCC1CCOC(C=C)=O)F DLSHFKONUOJZRD-UHFFFAOYSA-N 0.000 description 1
- OAYXUHPQHDHDDZ-UHFFFAOYSA-N 2-(2-butoxyethoxy)ethanol Chemical compound CCCCOCCOCCO OAYXUHPQHDHDDZ-UHFFFAOYSA-N 0.000 description 1
- WMDZKDKPYCNCDZ-UHFFFAOYSA-N 2-(2-butoxypropoxy)propan-1-ol Chemical compound CCCCOC(C)COC(C)CO WMDZKDKPYCNCDZ-UHFFFAOYSA-N 0.000 description 1
- FPZWZCWUIYYYBU-UHFFFAOYSA-N 2-(2-ethoxyethoxy)ethyl acetate Chemical compound CCOCCOCCOC(C)=O FPZWZCWUIYYYBU-UHFFFAOYSA-N 0.000 description 1
- YDUGRFYVCNHEJD-UHFFFAOYSA-N 2-(2-ethyloxetan-3-yl)ethyl 2-methylprop-2-enoate Chemical compound CCC1OCC1CCOC(=O)C(C)=C YDUGRFYVCNHEJD-UHFFFAOYSA-N 0.000 description 1
- XXXFZKQPYACQLD-UHFFFAOYSA-N 2-(2-hydroxyethoxy)ethyl acetate Chemical compound CC(=O)OCCOCCO XXXFZKQPYACQLD-UHFFFAOYSA-N 0.000 description 1
- SBASXUCJHJRPEV-UHFFFAOYSA-N 2-(2-methoxyethoxy)ethanol Chemical compound COCCOCCO SBASXUCJHJRPEV-UHFFFAOYSA-N 0.000 description 1
- BJINVQNEBGOMCR-UHFFFAOYSA-N 2-(2-methoxyethoxy)ethyl acetate Chemical compound COCCOCCOC(C)=O BJINVQNEBGOMCR-UHFFFAOYSA-N 0.000 description 1
- TWXBKGHMBGYDQI-UHFFFAOYSA-N 2-(2-phenyloxetan-3-yl)ethyl prop-2-enoate Chemical compound C=CC(=O)OCCC1COC1C1=CC=CC=C1 TWXBKGHMBGYDQI-UHFFFAOYSA-N 0.000 description 1
- DJCYDDALXPHSHR-UHFFFAOYSA-N 2-(2-propoxyethoxy)ethanol Chemical compound CCCOCCOCCO DJCYDDALXPHSHR-UHFFFAOYSA-N 0.000 description 1
- XYVAYAJYLWYJJN-UHFFFAOYSA-N 2-(2-propoxypropoxy)propan-1-ol Chemical compound CCCOC(C)COC(C)CO XYVAYAJYLWYJJN-UHFFFAOYSA-N 0.000 description 1
- HIXDQWDOVZUNNA-UHFFFAOYSA-N 2-(3,4-dimethoxyphenyl)-5-hydroxy-7-methoxychromen-4-one Chemical compound C=1C(OC)=CC(O)=C(C(C=2)=O)C=1OC=2C1=CC=C(OC)C(OC)=C1 HIXDQWDOVZUNNA-UHFFFAOYSA-N 0.000 description 1
- VCWMHBBURFAUMN-UHFFFAOYSA-N 2-(3-ethyloxetan-3-yl)ethyl prop-2-enoate Chemical compound C=CC(=O)OCCC1(CC)COC1 VCWMHBBURFAUMN-UHFFFAOYSA-N 0.000 description 1
- JAHNSTQSQJOJLO-UHFFFAOYSA-N 2-(3-fluorophenyl)-1h-imidazole Chemical compound FC1=CC=CC(C=2NC=CN=2)=C1 JAHNSTQSQJOJLO-UHFFFAOYSA-N 0.000 description 1
- OEPOKWHJYJXUGD-UHFFFAOYSA-N 2-(3-phenylmethoxyphenyl)-1,3-thiazole-4-carbaldehyde Chemical compound O=CC1=CSC(C=2C=C(OCC=3C=CC=CC=3)C=CC=2)=N1 OEPOKWHJYJXUGD-UHFFFAOYSA-N 0.000 description 1
- PTBAHIRKWPUZAM-UHFFFAOYSA-N 2-(oxiran-2-yl)ethyl 2-methylprop-2-enoate Chemical compound CC(=C)C(=O)OCCC1CO1 PTBAHIRKWPUZAM-UHFFFAOYSA-N 0.000 description 1
- CBKJLMZJKHOGEQ-UHFFFAOYSA-N 2-(oxiran-2-yl)ethyl prop-2-enoate Chemical compound C=CC(=O)OCCC1CO1 CBKJLMZJKHOGEQ-UHFFFAOYSA-N 0.000 description 1
- GOXQRTZXKQZDDN-UHFFFAOYSA-N 2-Ethylhexyl acrylate Chemical compound CCCCC(CC)COC(=O)C=C GOXQRTZXKQZDDN-UHFFFAOYSA-N 0.000 description 1
- XNWFRZJHXBZDAG-UHFFFAOYSA-N 2-METHOXYETHANOL Chemical compound COCCO XNWFRZJHXBZDAG-UHFFFAOYSA-N 0.000 description 1
- WYGWHHGCAGTUCH-UHFFFAOYSA-N 2-[(2-cyano-4-methylpentan-2-yl)diazenyl]-2,4-dimethylpentanenitrile Chemical compound CC(C)CC(C)(C#N)N=NC(C)(C#N)CC(C)C WYGWHHGCAGTUCH-UHFFFAOYSA-N 0.000 description 1
- RIACPSCHTTZGON-UHFFFAOYSA-N 2-[2-(1,1,2,2,2-pentafluoroethyl)oxetan-3-yl]ethyl 2-methylprop-2-enoate Chemical compound CC(=C)C(=O)OCCC1COC1C(F)(F)C(F)(F)F RIACPSCHTTZGON-UHFFFAOYSA-N 0.000 description 1
- WFSMVVDJSNMRAR-UHFFFAOYSA-N 2-[2-(2-ethoxyethoxy)ethoxy]ethanol Chemical compound CCOCCOCCOCCO WFSMVVDJSNMRAR-UHFFFAOYSA-N 0.000 description 1
- FMVOPJLFZGSYOS-UHFFFAOYSA-N 2-[2-(2-ethoxypropoxy)propoxy]propan-1-ol Chemical compound CCOC(C)COC(C)COC(C)CO FMVOPJLFZGSYOS-UHFFFAOYSA-N 0.000 description 1
- WAEVWDZKMBQDEJ-UHFFFAOYSA-N 2-[2-(2-methoxypropoxy)propoxy]propan-1-ol Chemical compound COC(C)COC(C)COC(C)CO WAEVWDZKMBQDEJ-UHFFFAOYSA-N 0.000 description 1
- BROIUIXXYUQBTD-UHFFFAOYSA-N 2-[2-(trifluoromethyl)oxetan-3-yl]ethyl 2-methylprop-2-enoate Chemical compound CC(=C)C(=O)OCCC1COC1C(F)(F)F BROIUIXXYUQBTD-UHFFFAOYSA-N 0.000 description 1
- BULSFYDUQQDBAH-UHFFFAOYSA-N 2-[2-(trifluoromethyl)oxetan-3-yl]ethyl prop-2-enoate Chemical compound C(C=C)(=O)OCCC1C(OC1)C(F)(F)F BULSFYDUQQDBAH-UHFFFAOYSA-N 0.000 description 1
- DJNMUNZDHCXGMC-UHFFFAOYSA-N 2-[3-(2-hydroxyethyl)-2-bicyclo[2.2.1]hept-5-enyl]ethanol Chemical compound C1C2C=CC1C(CCO)C2CCO DJNMUNZDHCXGMC-UHFFFAOYSA-N 0.000 description 1
- POAOYUHQDCAZBD-UHFFFAOYSA-N 2-butoxyethanol Chemical compound CCCCOCCO POAOYUHQDCAZBD-UHFFFAOYSA-N 0.000 description 1
- NQBXSWAWVZHKBZ-UHFFFAOYSA-N 2-butoxyethyl acetate Chemical compound CCCCOCCOC(C)=O NQBXSWAWVZHKBZ-UHFFFAOYSA-N 0.000 description 1
- LKZBECSAUQZYDI-UHFFFAOYSA-N 2-decan-3-yloxyethyl prop-2-enoate Chemical compound C(C=C)(=O)OCCOC(CCCCCCC)CC LKZBECSAUQZYDI-UHFFFAOYSA-N 0.000 description 1
- ZNQVEEAIQZEUHB-UHFFFAOYSA-N 2-ethoxyethanol Chemical compound CCOCCO ZNQVEEAIQZEUHB-UHFFFAOYSA-N 0.000 description 1
- SVONRAPFKPVNKG-UHFFFAOYSA-N 2-ethoxyethyl acetate Chemical compound CCOCCOC(C)=O SVONRAPFKPVNKG-UHFFFAOYSA-N 0.000 description 1
- JGIHBNAOWIOPJC-UHFFFAOYSA-N 2-ethylbicyclo[2.2.1]hept-5-ene-3-carboxylic acid Chemical compound C1C2C=CC1C(CC)C2C(O)=O JGIHBNAOWIOPJC-UHFFFAOYSA-N 0.000 description 1
- WDQMWEYDKDCEHT-UHFFFAOYSA-N 2-ethylhexyl 2-methylprop-2-enoate Chemical compound CCCCC(CC)COC(=O)C(C)=C WDQMWEYDKDCEHT-UHFFFAOYSA-N 0.000 description 1
- 125000000954 2-hydroxyethyl group Chemical group [H]C([*])([H])C([H])([H])O[H] 0.000 description 1
- SSVKYZDOIWXDIO-UHFFFAOYSA-N 2-methylbicyclo[2.2.1]hept-5-ene-3-carboxylic acid Chemical compound C1C2C=CC1C(C)C2C(O)=O SSVKYZDOIWXDIO-UHFFFAOYSA-N 0.000 description 1
- WHFKYDMBUMLWDA-UHFFFAOYSA-N 2-phenoxyethyl acetate Chemical compound CC(=O)OCCOC1=CC=CC=C1 WHFKYDMBUMLWDA-UHFFFAOYSA-N 0.000 description 1
- YEYKMVJDLWJFOA-UHFFFAOYSA-N 2-propoxyethanol Chemical compound CCCOCCO YEYKMVJDLWJFOA-UHFFFAOYSA-N 0.000 description 1
- QMAQLCVJIYANPZ-UHFFFAOYSA-N 2-propoxyethyl acetate Chemical compound CCCOCCOC(C)=O QMAQLCVJIYANPZ-UHFFFAOYSA-N 0.000 description 1
- QCAHUFWKIQLBNB-UHFFFAOYSA-N 3-(3-methoxypropoxy)propan-1-ol Chemical compound COCCCOCCCO QCAHUFWKIQLBNB-UHFFFAOYSA-N 0.000 description 1
- QOXOZONBQWIKDA-UHFFFAOYSA-N 3-hydroxypropyl Chemical group [CH2]CCO QOXOZONBQWIKDA-UHFFFAOYSA-N 0.000 description 1
- SJECZPVISLOESU-UHFFFAOYSA-N 3-trimethoxysilylpropan-1-amine Chemical compound CO[Si](OC)(OC)CCCN SJECZPVISLOESU-UHFFFAOYSA-N 0.000 description 1
- SGJZXXPWUDGJSV-UHFFFAOYSA-N 4,6-bis[2-(4-hydroxyphenyl)propan-2-yl]benzene-1,3-diol Chemical compound C=1C(C(C)(C)C=2C=CC(O)=CC=2)=C(O)C=C(O)C=1C(C)(C)C1=CC=C(O)C=C1 SGJZXXPWUDGJSV-UHFFFAOYSA-N 0.000 description 1
- OSWFIVFLDKOXQC-UHFFFAOYSA-N 4-(3-methoxyphenyl)aniline Chemical compound COC1=CC=CC(C=2C=CC(N)=CC=2)=C1 OSWFIVFLDKOXQC-UHFFFAOYSA-N 0.000 description 1
- JLBJTVDPSNHSKJ-UHFFFAOYSA-N 4-Methylstyrene Chemical compound CC1=CC=C(C=C)C=C1 JLBJTVDPSNHSKJ-UHFFFAOYSA-N 0.000 description 1
- NBLFJUWXERDUEN-UHFFFAOYSA-N 4-[(2,3,4-trihydroxyphenyl)methyl]benzene-1,2,3-triol Chemical compound OC1=C(O)C(O)=CC=C1CC1=CC=C(O)C(O)=C1O NBLFJUWXERDUEN-UHFFFAOYSA-N 0.000 description 1
- FNFYXIMJKWENNK-UHFFFAOYSA-N 4-[(2,4-dihydroxyphenyl)methyl]benzene-1,3-diol Chemical compound OC1=CC(O)=CC=C1CC1=CC=C(O)C=C1O FNFYXIMJKWENNK-UHFFFAOYSA-N 0.000 description 1
- NYIWTDSCYULDTJ-UHFFFAOYSA-N 4-[2-(2,3,4-trihydroxyphenyl)propan-2-yl]benzene-1,2,3-triol Chemical compound C=1C=C(O)C(O)=C(O)C=1C(C)(C)C1=CC=C(O)C(O)=C1O NYIWTDSCYULDTJ-UHFFFAOYSA-N 0.000 description 1
- IGFDWQYZRPDQQY-UHFFFAOYSA-N 4-[2-[3-[2-[2,4-dihydroxy-5-[2-(4-hydroxyphenyl)propan-2-yl]phenyl]propan-2-yl]phenyl]propan-2-yl]-6-[2-(4-hydroxyphenyl)propan-2-yl]benzene-1,3-diol Chemical compound C=1C(C(C)(C)C=2C=C(C=CC=2)C(C)(C)C=2C(=CC(O)=C(C=2)C(C)(C)C=2C=CC(O)=CC=2)O)=C(O)C=C(O)C=1C(C)(C)C1=CC=C(O)C=C1 IGFDWQYZRPDQQY-UHFFFAOYSA-N 0.000 description 1
- UNDXPKDBFOOQFC-UHFFFAOYSA-N 4-[2-nitro-4-(trifluoromethyl)phenyl]morpholine Chemical compound [O-][N+](=O)C1=CC(C(F)(F)F)=CC=C1N1CCOCC1 UNDXPKDBFOOQFC-UHFFFAOYSA-N 0.000 description 1
- ZTTAAQJJJPFTLZ-UHFFFAOYSA-N 4-[7-hydroxy-4-(4-hydroxyphenyl)-2-methyl-3,4-dihydrochromen-2-yl]benzene-1,3-diol Chemical compound C12=CC=C(O)C=C2OC(C)(C=2C(=CC(O)=CC=2)O)CC1C1=CC=C(O)C=C1 ZTTAAQJJJPFTLZ-UHFFFAOYSA-N 0.000 description 1
- WFCQTAXSWSWIHS-UHFFFAOYSA-N 4-[bis(4-hydroxyphenyl)methyl]phenol Chemical compound C1=CC(O)=CC=C1C(C=1C=CC(O)=CC=1)C1=CC=C(O)C=C1 WFCQTAXSWSWIHS-UHFFFAOYSA-N 0.000 description 1
- WTQZSMDDRMKJRI-UHFFFAOYSA-N 4-diazoniophenolate Chemical class [O-]C1=CC=C([N+]#N)C=C1 WTQZSMDDRMKJRI-UHFFFAOYSA-N 0.000 description 1
- PXXXJBOIZODWGE-UHFFFAOYSA-N 4-hydroxy-4-methylhexan-2-one Chemical compound CCC(C)(O)CC(C)=O PXXXJBOIZODWGE-UHFFFAOYSA-N 0.000 description 1
- SXIFAEWFOJETOA-UHFFFAOYSA-N 4-hydroxy-butyl Chemical group [CH2]CCCO SXIFAEWFOJETOA-UHFFFAOYSA-N 0.000 description 1
- FUGYGGDSWSUORM-UHFFFAOYSA-N 4-hydroxystyrene Chemical compound OC1=CC=C(C=C)C=C1 FUGYGGDSWSUORM-UHFFFAOYSA-N 0.000 description 1
- JAGRUUPXPPLSRX-UHFFFAOYSA-N 4-prop-1-en-2-ylphenol Chemical compound CC(=C)C1=CC=C(O)C=C1 JAGRUUPXPPLSRX-UHFFFAOYSA-N 0.000 description 1
- SSIZVBOERWVGFR-UHFFFAOYSA-N 5-(oxiran-2-yl)pentyl 2-methylprop-2-enoate Chemical compound CC(=C)C(=O)OCCCCCC1CO1 SSIZVBOERWVGFR-UHFFFAOYSA-N 0.000 description 1
- CYKONRWVCOIAHL-UHFFFAOYSA-N 5-(oxiran-2-yl)pentyl prop-2-enoate Chemical compound C=CC(=O)OCCCCCC1CO1 CYKONRWVCOIAHL-UHFFFAOYSA-N 0.000 description 1
- NNWNNQTUZYVQRK-UHFFFAOYSA-N 5-bromo-1h-pyrrolo[2,3-c]pyridine-2-carboxylic acid Chemical compound BrC1=NC=C2NC(C(=O)O)=CC2=C1 NNWNNQTUZYVQRK-UHFFFAOYSA-N 0.000 description 1
- LLNJETIYJIMHAV-UHFFFAOYSA-N 5-ethoxybicyclo[2.2.1]hept-2-ene Chemical compound C1C2C(OCC)CC1C=C2 LLNJETIYJIMHAV-UHFFFAOYSA-N 0.000 description 1
- AOAYPXDNINXAQH-UHFFFAOYSA-N 5-ethylbicyclo[2.2.1]hept-2-ene-5-carboxylic acid Chemical compound C1C2C(CC)(C(O)=O)CC1C=C2 AOAYPXDNINXAQH-UHFFFAOYSA-N 0.000 description 1
- IEAJQNJSHYCMEK-UHFFFAOYSA-N 5-methoxy-2,5-dimethylhexanoic acid Chemical compound COC(C)(C)CCC(C)C(O)=O IEAJQNJSHYCMEK-UHFFFAOYSA-N 0.000 description 1
- RCDOWRWNYHNLLA-UHFFFAOYSA-N 5-methoxybicyclo[2.2.1]hept-2-ene Chemical compound C1C2C(OC)CC1C=C2 RCDOWRWNYHNLLA-UHFFFAOYSA-N 0.000 description 1
- ZAVRBAGOQPJLCD-UHFFFAOYSA-N 5-methylbicyclo[2.2.1]hept-2-en-5-ol Chemical compound C1C2C(C)(O)CC1C=C2 ZAVRBAGOQPJLCD-UHFFFAOYSA-N 0.000 description 1
- PCBPVYHMZBWMAZ-UHFFFAOYSA-N 5-methylbicyclo[2.2.1]hept-2-ene Chemical compound C1C2C(C)CC1C=C2 PCBPVYHMZBWMAZ-UHFFFAOYSA-N 0.000 description 1
- JIHFJSOMLKXSSQ-UHFFFAOYSA-N 5-methylbicyclo[2.2.1]hept-2-ene-5-carboxylic acid Chemical compound C1C2C(C)(C(O)=O)CC1C=C2 JIHFJSOMLKXSSQ-UHFFFAOYSA-N 0.000 description 1
- ZTUXPCHXGIBVJU-UHFFFAOYSA-N 6-(furan-2-yl)-2-methylhex-1-en-3-one Chemical compound CC(=C)C(=O)CCCC1=CC=CO1 ZTUXPCHXGIBVJU-UHFFFAOYSA-N 0.000 description 1
- IAEDLGNYFJXAQC-UHFFFAOYSA-N 6-(furan-2-yl)-6-methylhept-1-en-3-one Chemical compound C=CC(=O)CCC(C)(C)C1=CC=CO1 IAEDLGNYFJXAQC-UHFFFAOYSA-N 0.000 description 1
- PPEXFZCDQFHINE-UHFFFAOYSA-N 6-(furan-2-yl)hex-1-en-3-one Chemical compound C=CC(=O)CCCC1=CC=CO1 PPEXFZCDQFHINE-UHFFFAOYSA-N 0.000 description 1
- FYYIUODUDSPAJQ-UHFFFAOYSA-N 7-oxabicyclo[4.1.0]heptan-4-ylmethyl 2-methylprop-2-enoate Chemical compound C1C(COC(=O)C(=C)C)CCC2OC21 FYYIUODUDSPAJQ-UHFFFAOYSA-N 0.000 description 1
- COCLLEMEIJQBAG-UHFFFAOYSA-N 8-methylnonyl 2-methylprop-2-enoate Chemical compound CC(C)CCCCCCCOC(=O)C(C)=C COCLLEMEIJQBAG-UHFFFAOYSA-N 0.000 description 1
- LVGFPWDANALGOY-UHFFFAOYSA-N 8-methylnonyl prop-2-enoate Chemical compound CC(C)CCCCCCCOC(=O)C=C LVGFPWDANALGOY-UHFFFAOYSA-N 0.000 description 1
- LPEKGGXMPWTOCB-UHFFFAOYSA-N 8beta-(2,3-epoxy-2-methylbutyryloxy)-14-acetoxytithifolin Natural products COC(=O)C(C)O LPEKGGXMPWTOCB-UHFFFAOYSA-N 0.000 description 1
- QTBSBXVTEAMEQO-UHFFFAOYSA-M Acetate Chemical compound CC([O-])=O QTBSBXVTEAMEQO-UHFFFAOYSA-M 0.000 description 1
- HRPVXLWXLXDGHG-UHFFFAOYSA-N Acrylamide Chemical compound NC(=O)C=C HRPVXLWXLXDGHG-UHFFFAOYSA-N 0.000 description 1
- 229920000178 Acrylic resin Polymers 0.000 description 1
- 239000004925 Acrylic resin Substances 0.000 description 1
- NLHHRLWOUZZQLW-UHFFFAOYSA-N Acrylonitrile Chemical compound C=CC#N NLHHRLWOUZZQLW-UHFFFAOYSA-N 0.000 description 1
- VHUUQVKOLVNVRT-UHFFFAOYSA-N Ammonium hydroxide Chemical class [NH4+].[OH-] VHUUQVKOLVNVRT-UHFFFAOYSA-N 0.000 description 1
- BVKZGUZCCUSVTD-UHFFFAOYSA-M Bicarbonate Chemical class OC([O-])=O BVKZGUZCCUSVTD-UHFFFAOYSA-M 0.000 description 1
- BDJPTLNJYXWDDX-UHFFFAOYSA-N C(C(=C)C)(=O)OCC1C(OC1)C.C(C(=C)C)(=O)OCC1COC1 Chemical compound C(C(=C)C)(=O)OCC1C(OC1)C.C(C(=C)C)(=O)OCC1COC1 BDJPTLNJYXWDDX-UHFFFAOYSA-N 0.000 description 1
- QRASYPBGBVMVOS-UHFFFAOYSA-N C(C)(=O)O.C(C)(=O)OCCC.C(COCCO)O Chemical compound C(C)(=O)O.C(C)(=O)OCCC.C(COCCO)O QRASYPBGBVMVOS-UHFFFAOYSA-N 0.000 description 1
- 229920002574 CR-39 Polymers 0.000 description 1
- 239000005635 Caprylic acid (CAS 124-07-2) Substances 0.000 description 1
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical group [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- VEXZGXHMUGYJMC-UHFFFAOYSA-M Chloride anion Chemical compound [Cl-] VEXZGXHMUGYJMC-UHFFFAOYSA-M 0.000 description 1
- IEPRKVQEAMIZSS-UHFFFAOYSA-N Di-Et ester-Fumaric acid Natural products CCOC(=O)C=CC(=O)OCC IEPRKVQEAMIZSS-UHFFFAOYSA-N 0.000 description 1
- IEPRKVQEAMIZSS-WAYWQWQTSA-N Diethyl maleate Chemical compound CCOC(=O)\C=C/C(=O)OCC IEPRKVQEAMIZSS-WAYWQWQTSA-N 0.000 description 1
- 239000004593 Epoxy Substances 0.000 description 1
- OTMSDBZUPAUEDD-UHFFFAOYSA-N Ethane Chemical compound CC OTMSDBZUPAUEDD-UHFFFAOYSA-N 0.000 description 1
- VGGSQFUCUMXWEO-UHFFFAOYSA-N Ethene Chemical compound C=C VGGSQFUCUMXWEO-UHFFFAOYSA-N 0.000 description 1
- JIGUQPWFLRLWPJ-UHFFFAOYSA-N Ethyl acrylate Chemical compound CCOC(=O)C=C JIGUQPWFLRLWPJ-UHFFFAOYSA-N 0.000 description 1
- 239000005977 Ethylene Substances 0.000 description 1
- KMTRUDSVKNLOMY-UHFFFAOYSA-N Ethylene carbonate Chemical compound O=C1OCCO1 KMTRUDSVKNLOMY-UHFFFAOYSA-N 0.000 description 1
- YCKRFDGAMUMZLT-UHFFFAOYSA-N Fluorine atom Chemical compound [F] YCKRFDGAMUMZLT-UHFFFAOYSA-N 0.000 description 1
- WOBHKFSMXKNTIM-UHFFFAOYSA-N Hydroxyethyl methacrylate Chemical compound CC(=C)C(=O)OCCO WOBHKFSMXKNTIM-UHFFFAOYSA-N 0.000 description 1
- JVTAAEKCZFNVCJ-UHFFFAOYSA-N Lactic Acid Natural products CC(O)C(O)=O JVTAAEKCZFNVCJ-UHFFFAOYSA-N 0.000 description 1
- XUCQQLCBOJJVRF-UHFFFAOYSA-N Lepalone Chemical compound CC(=C)C(=O)CCC=1C=COC=1 XUCQQLCBOJJVRF-UHFFFAOYSA-N 0.000 description 1
- 229920000106 Liquid crystal polymer Polymers 0.000 description 1
- 239000004977 Liquid-crystal polymers (LCPs) Substances 0.000 description 1
- CERQOIWHTDAKMF-UHFFFAOYSA-M Methacrylate Chemical compound CC(=C)C([O-])=O CERQOIWHTDAKMF-UHFFFAOYSA-M 0.000 description 1
- WRQNANDWMGAFTP-UHFFFAOYSA-N Methylacetoacetic acid Chemical compound COC(=O)CC(C)=O WRQNANDWMGAFTP-UHFFFAOYSA-N 0.000 description 1
- GYCMBHHDWRMZGG-UHFFFAOYSA-N Methylacrylonitrile Chemical compound CC(=C)C#N GYCMBHHDWRMZGG-UHFFFAOYSA-N 0.000 description 1
- FXHOOIRPVKKKFG-UHFFFAOYSA-N N,N-Dimethylacetamide Chemical compound CN(C)C(C)=O FXHOOIRPVKKKFG-UHFFFAOYSA-N 0.000 description 1
- CTQNGGLPUBDAKN-UHFFFAOYSA-N O-Xylene Chemical compound CC1=CC=CC=C1C CTQNGGLPUBDAKN-UHFFFAOYSA-N 0.000 description 1
- LQPRQPVOVUPDSO-UHFFFAOYSA-N OC1C2C=CC(C1O)C2.OCCC2C1C=CC(C2)C1 Chemical compound OC1C2C=CC(C1O)C2.OCCC2C1C=CC(C2)C1 LQPRQPVOVUPDSO-UHFFFAOYSA-N 0.000 description 1
- CBENFWSGALASAD-UHFFFAOYSA-N Ozone Chemical compound [O-][O+]=O CBENFWSGALASAD-UHFFFAOYSA-N 0.000 description 1
- DIQMPQMYFZXDAX-UHFFFAOYSA-N Pentyl formate Chemical compound CCCCCOC=O DIQMPQMYFZXDAX-UHFFFAOYSA-N 0.000 description 1
- 239000004952 Polyamide Substances 0.000 description 1
- 239000004962 Polyamide-imide Substances 0.000 description 1
- 239000004695 Polyether sulfone Substances 0.000 description 1
- 239000004697 Polyetherimide Substances 0.000 description 1
- 239000004642 Polyimide Substances 0.000 description 1
- 239000004734 Polyphenylene sulfide Substances 0.000 description 1
- XTXRWKRVRITETP-UHFFFAOYSA-N Vinyl acetate Chemical compound CC(=O)OC=C XTXRWKRVRITETP-UHFFFAOYSA-N 0.000 description 1
- BZHJMEDXRYGGRV-UHFFFAOYSA-N Vinyl chloride Chemical compound ClC=C BZHJMEDXRYGGRV-UHFFFAOYSA-N 0.000 description 1
- IAXXETNIOYFMLW-COPLHBTASA-N [(1s,3s,4s)-4,7,7-trimethyl-3-bicyclo[2.2.1]heptanyl] 2-methylprop-2-enoate Chemical compound C1C[C@]2(C)[C@@H](OC(=O)C(=C)C)C[C@H]1C2(C)C IAXXETNIOYFMLW-COPLHBTASA-N 0.000 description 1
- YCWINENYANGRAA-UHFFFAOYSA-N [1-oxo-1-(oxolan-2-ylmethoxy)propan-2-yl] 2-methylprop-2-enoate Chemical compound CC(=C)C(=O)OC(C)C(=O)OCC1CCCO1 YCWINENYANGRAA-UHFFFAOYSA-N 0.000 description 1
- OHRFHGAUSMKRCU-UHFFFAOYSA-N [2-(1,1,2,2,2-pentafluoroethyl)oxetan-3-yl]methyl 2-methylprop-2-enoate Chemical compound CC(=C)C(=O)OCC1COC1C(F)(F)C(F)(F)F OHRFHGAUSMKRCU-UHFFFAOYSA-N 0.000 description 1
- GSVDAPOIBBPGHO-UHFFFAOYSA-N [2-(1,1,2,2,2-pentafluoroethyl)oxetan-3-yl]methyl prop-2-enoate Chemical compound C(C=C)(=O)OCC1C(OC1)C(C(F)(F)F)(F)F GSVDAPOIBBPGHO-UHFFFAOYSA-N 0.000 description 1
- FARWYUGFTNOIPS-UHFFFAOYSA-N [2-(trifluoromethyl)oxetan-3-yl]methyl 2-methylprop-2-enoate Chemical compound CC(=C)C(=O)OCC1COC1C(F)(F)F FARWYUGFTNOIPS-UHFFFAOYSA-N 0.000 description 1
- NXPNOQRYNHVYJE-UHFFFAOYSA-N [2-(trifluoromethyl)oxetan-3-yl]methyl prop-2-enoate Chemical compound C(C=C)(=O)OCC1C(OC1)C(F)(F)F NXPNOQRYNHVYJE-UHFFFAOYSA-N 0.000 description 1
- IGHHPVIMEQGKNE-UHFFFAOYSA-N [3-(hydroxymethyl)-2-bicyclo[2.2.1]hept-5-enyl]methanol Chemical compound C1C2C=CC1C(CO)C2CO IGHHPVIMEQGKNE-UHFFFAOYSA-N 0.000 description 1
- 239000003377 acid catalyst Substances 0.000 description 1
- 230000004913 activation Effects 0.000 description 1
- 125000002723 alicyclic group Chemical group 0.000 description 1
- 229910000288 alkali metal carbonate Inorganic materials 0.000 description 1
- 150000008041 alkali metal carbonates Chemical class 0.000 description 1
- 150000008044 alkali metal hydroxides Chemical class 0.000 description 1
- 125000003342 alkenyl group Chemical group 0.000 description 1
- 125000005907 alkyl ester group Chemical group 0.000 description 1
- XYLMUPLGERFSHI-UHFFFAOYSA-N alpha-Methylstyrene Chemical compound CC(=C)C1=CC=CC=C1 XYLMUPLGERFSHI-UHFFFAOYSA-N 0.000 description 1
- 235000011114 ammonium hydroxide Nutrition 0.000 description 1
- 150000004945 aromatic hydrocarbons Chemical class 0.000 description 1
- 150000008378 aryl ethers Chemical class 0.000 description 1
- 238000004380 ashing Methods 0.000 description 1
- 239000012298 atmosphere Substances 0.000 description 1
- 125000005872 benzooxazolyl group Chemical group 0.000 description 1
- 125000004541 benzoxazolyl group Chemical group O1C(=NC2=C1C=CC=C2)* 0.000 description 1
- AOJOEFVRHOZDFN-UHFFFAOYSA-N benzyl 2-methylprop-2-enoate Chemical compound CC(=C)C(=O)OCC1=CC=CC=C1 AOJOEFVRHOZDFN-UHFFFAOYSA-N 0.000 description 1
- 229940007550 benzyl acetate Drugs 0.000 description 1
- GCTPMLUUWLLESL-UHFFFAOYSA-N benzyl prop-2-enoate Chemical compound C=CC(=O)OCC1=CC=CC=C1 GCTPMLUUWLLESL-UHFFFAOYSA-N 0.000 description 1
- FYGUSUBEMUKACF-UHFFFAOYSA-N bicyclo[2.2.1]hept-2-ene-5-carboxylic acid Chemical compound C1C2C(C(=O)O)CC1C=C2 FYGUSUBEMUKACF-UHFFFAOYSA-N 0.000 description 1
- WXNRYSGJLQFHBR-UHFFFAOYSA-N bis(2,4-dihydroxyphenyl)methanone Chemical compound OC1=CC(O)=CC=C1C(=O)C1=CC=C(O)C=C1O WXNRYSGJLQFHBR-UHFFFAOYSA-N 0.000 description 1
- IGKOKEBHGRCHSR-UHFFFAOYSA-N bis(3,4,5-trihydroxyphenyl)methanone Chemical compound OC1=C(O)C(O)=CC(C(=O)C=2C=C(O)C(O)=C(O)C=2)=C1 IGKOKEBHGRCHSR-UHFFFAOYSA-N 0.000 description 1
- CQEYYJKEWSMYFG-UHFFFAOYSA-N butyl acrylate Chemical compound CCCCOC(=O)C=C CQEYYJKEWSMYFG-UHFFFAOYSA-N 0.000 description 1
- 238000005266 casting Methods 0.000 description 1
- 239000003054 catalyst Substances 0.000 description 1
- 230000003197 catalytic effect Effects 0.000 description 1
- 239000001913 cellulose Substances 0.000 description 1
- 229920002678 cellulose Polymers 0.000 description 1
- 229940075419 choline hydroxide Drugs 0.000 description 1
- HNEGQIOMVPPMNR-IHWYPQMZSA-N citraconic acid Chemical compound OC(=O)C(/C)=C\C(O)=O HNEGQIOMVPPMNR-IHWYPQMZSA-N 0.000 description 1
- 229940018557 citraconic acid Drugs 0.000 description 1
- 239000000306 component Substances 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 239000000805 composite resin Substances 0.000 description 1
- 239000007859 condensation product Substances 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 239000003431 cross linking reagent Substances 0.000 description 1
- LDHQCZJRKDOVOX-NSCUHMNNSA-N crotonic acid Chemical compound C\C=C\C(O)=O LDHQCZJRKDOVOX-NSCUHMNNSA-N 0.000 description 1
- XLJMAIOERFSOGZ-UHFFFAOYSA-M cyanate Chemical compound [O-]C#N XLJMAIOERFSOGZ-UHFFFAOYSA-M 0.000 description 1
- OIWOHHBRDFKZNC-UHFFFAOYSA-N cyclohexyl 2-methylprop-2-enoate Chemical compound CC(=C)C(=O)OC1CCCCC1 OIWOHHBRDFKZNC-UHFFFAOYSA-N 0.000 description 1
- MSPIWBYBMMBCEX-UHFFFAOYSA-N cyclohexyl bicyclo[2.2.1]hept-2-ene-5-carboxylate Chemical compound C1C(C=C2)CC2C1C(=O)OC1CCCCC1 MSPIWBYBMMBCEX-UHFFFAOYSA-N 0.000 description 1
- KBLWLMPSVYBVDK-UHFFFAOYSA-N cyclohexyl prop-2-enoate Chemical compound C=CC(=O)OC1CCCCC1 KBLWLMPSVYBVDK-UHFFFAOYSA-N 0.000 description 1
- 125000004956 cyclohexylene group Chemical group 0.000 description 1
- 125000004979 cyclopentylene group Chemical group 0.000 description 1
- NHAQFLFLZGBOBG-UHFFFAOYSA-N decan-3-yl prop-2-enoate Chemical compound CCCCCCCC(CC)OC(=O)C=C NHAQFLFLZGBOBG-UHFFFAOYSA-N 0.000 description 1
- 238000000354 decomposition reaction Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- ATCZONOLUJITKL-UHFFFAOYSA-N dicyclohexyl bicyclo[2.2.1]hept-5-ene-2,3-dicarboxylate Chemical compound C1=CC2CC1C(C(=O)OC1CCCCC1)C2C(=O)OC1CCCCC1 ATCZONOLUJITKL-UHFFFAOYSA-N 0.000 description 1
- ZEFVHSWKYCYFFL-UHFFFAOYSA-N diethyl 2-methylidenebutanedioate Chemical compound CCOC(=O)CC(=C)C(=O)OCC ZEFVHSWKYCYFFL-UHFFFAOYSA-N 0.000 description 1
- IEPRKVQEAMIZSS-AATRIKPKSA-N diethyl fumarate Chemical compound CCOC(=O)\C=C\C(=O)OCC IEPRKVQEAMIZSS-AATRIKPKSA-N 0.000 description 1
- 125000004177 diethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 description 1
- WYACBZDAHNBPPB-UHFFFAOYSA-N diethyl oxalate Chemical compound CCOC(=O)C(=O)OCC WYACBZDAHNBPPB-UHFFFAOYSA-N 0.000 description 1
- 229940019778 diethylene glycol diethyl ether Drugs 0.000 description 1
- XXJWXESWEXIICW-UHFFFAOYSA-N diethylene glycol monoethyl ether Chemical compound CCOCCOCCO XXJWXESWEXIICW-UHFFFAOYSA-N 0.000 description 1
- 229940075557 diethylene glycol monoethyl ether Drugs 0.000 description 1
- UYAAVKFHBMJOJZ-UHFFFAOYSA-N diimidazo[1,3-b:1',3'-e]pyrazine-5,10-dione Chemical compound O=C1C2=CN=CN2C(=O)C2=CN=CN12 UYAAVKFHBMJOJZ-UHFFFAOYSA-N 0.000 description 1
- 238000007598 dipping method Methods 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- GMSCBRSQMRDRCD-UHFFFAOYSA-N dodecyl 2-methylprop-2-enoate Chemical compound CCCCCCCCCCCCOC(=O)C(C)=C GMSCBRSQMRDRCD-UHFFFAOYSA-N 0.000 description 1
- ODQWQRRAPPTVAG-GZTJUZNOSA-N doxepin Chemical compound C1OC2=CC=CC=C2C(=C/CCN(C)C)/C2=CC=CC=C21 ODQWQRRAPPTVAG-GZTJUZNOSA-N 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- RTZKZFJDLAIYFH-UHFFFAOYSA-N ether Substances CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 1
- 150000002170 ethers Chemical class 0.000 description 1
- CKSRFHWWBKRUKA-UHFFFAOYSA-N ethyl 2-ethoxyacetate Chemical compound CCOCC(=O)OCC CKSRFHWWBKRUKA-UHFFFAOYSA-N 0.000 description 1
- GFUIDHWFLMPAGY-UHFFFAOYSA-N ethyl 2-hydroxy-2-methylpropanoate Chemical compound CCOC(=O)C(C)(C)O GFUIDHWFLMPAGY-UHFFFAOYSA-N 0.000 description 1
- ZANNOFHADGWOLI-UHFFFAOYSA-N ethyl 2-hydroxyacetate Chemical compound CCOC(=O)CO ZANNOFHADGWOLI-UHFFFAOYSA-N 0.000 description 1
- SUPCQIBBMFXVTL-UHFFFAOYSA-N ethyl 2-methylprop-2-enoate Chemical compound CCOC(=O)C(C)=C SUPCQIBBMFXVTL-UHFFFAOYSA-N 0.000 description 1
- FJAKCEHATXBFJT-UHFFFAOYSA-N ethyl 2-oxobutanoate Chemical compound CCOC(=O)C(=O)CC FJAKCEHATXBFJT-UHFFFAOYSA-N 0.000 description 1
- BHXIWUJLHYHGSJ-UHFFFAOYSA-N ethyl 3-ethoxypropanoate Chemical compound CCOCCC(=O)OCC BHXIWUJLHYHGSJ-UHFFFAOYSA-N 0.000 description 1
- IJUHLFUALMUWOM-UHFFFAOYSA-N ethyl 3-methoxypropanoate Chemical compound CCOC(=O)CCOC IJUHLFUALMUWOM-UHFFFAOYSA-N 0.000 description 1
- FKIRSCKRJJUCNI-UHFFFAOYSA-N ethyl 7-bromo-1h-indole-2-carboxylate Chemical compound C1=CC(Br)=C2NC(C(=O)OCC)=CC2=C1 FKIRSCKRJJUCNI-UHFFFAOYSA-N 0.000 description 1
- XYIBRDXRRQCHLP-UHFFFAOYSA-N ethyl acetoacetate Chemical compound CCOC(=O)CC(C)=O XYIBRDXRRQCHLP-UHFFFAOYSA-N 0.000 description 1
- 239000012467 final product Substances 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- 229910052731 fluorine Inorganic materials 0.000 description 1
- 239000011737 fluorine Substances 0.000 description 1
- 235000019253 formic acid Nutrition 0.000 description 1
- 125000000524 functional group Chemical group 0.000 description 1
- 150000004820 halides Chemical class 0.000 description 1
- 125000005843 halogen group Chemical group 0.000 description 1
- 230000005525 hole transport Effects 0.000 description 1
- 238000006460 hydrolysis reaction Methods 0.000 description 1
- 125000004029 hydroxymethyl group Chemical group [H]OC([H])([H])* 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 229920000554 ionomer Polymers 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- MLFHJEHSLIIPHL-UHFFFAOYSA-N isoamyl acetate Chemical compound CC(C)CCOC(C)=O MLFHJEHSLIIPHL-UHFFFAOYSA-N 0.000 description 1
- 229940119545 isobornyl methacrylate Drugs 0.000 description 1
- 150000002576 ketones Chemical class 0.000 description 1
- 239000004310 lactic acid Substances 0.000 description 1
- 235000014655 lactic acid Nutrition 0.000 description 1
- FPYJFEHAWHCUMM-UHFFFAOYSA-N maleic anhydride Chemical compound O=C1OC(=O)C=C1 FPYJFEHAWHCUMM-UHFFFAOYSA-N 0.000 description 1
- HNEGQIOMVPPMNR-NSCUHMNNSA-N mesaconic acid Chemical compound OC(=O)C(/C)=C/C(O)=O HNEGQIOMVPPMNR-NSCUHMNNSA-N 0.000 description 1
- FQPSGWSUVKBHSU-UHFFFAOYSA-N methacrylamide Chemical compound CC(=C)C(N)=O FQPSGWSUVKBHSU-UHFFFAOYSA-N 0.000 description 1
- YSGBMDFJWFIEDF-UHFFFAOYSA-N methyl 2-hydroxy-3-methylbutanoate Chemical compound COC(=O)C(O)C(C)C YSGBMDFJWFIEDF-UHFFFAOYSA-N 0.000 description 1
- BDJSOPWXYLFTNW-UHFFFAOYSA-N methyl 3-methoxypropanoate Chemical compound COCCC(=O)OC BDJSOPWXYLFTNW-UHFFFAOYSA-N 0.000 description 1
- 229940057867 methyl lactate Drugs 0.000 description 1
- CWKLZLBVOJRSOM-UHFFFAOYSA-N methyl pyruvate Chemical compound COC(=O)C(C)=O CWKLZLBVOJRSOM-UHFFFAOYSA-N 0.000 description 1
- LVHBHZANLOWSRM-UHFFFAOYSA-N methylenebutanedioic acid Natural products OC(=O)CC(=C)C(O)=O LVHBHZANLOWSRM-UHFFFAOYSA-N 0.000 description 1
- HNEGQIOMVPPMNR-UHFFFAOYSA-N methylfumaric acid Natural products OC(=O)C(C)=CC(O)=O HNEGQIOMVPPMNR-UHFFFAOYSA-N 0.000 description 1
- 239000011259 mixed solution Substances 0.000 description 1
- 150000002762 monocarboxylic acid derivatives Chemical class 0.000 description 1
- 125000001280 n-hexyl group Chemical group C(CCCCC)* 0.000 description 1
- 125000001624 naphthyl group Chemical group 0.000 description 1
- 125000004957 naphthylene group Chemical group 0.000 description 1
- 239000012299 nitrogen atmosphere Substances 0.000 description 1
- 229920003986 novolac Polymers 0.000 description 1
- 229960002446 octanoic acid Drugs 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 239000003960 organic solvent Substances 0.000 description 1
- FOKLVOHHYNATHU-UHFFFAOYSA-N oxan-2-ylmethyl 2-methylprop-2-enoate Chemical compound CC(=C)C(=O)OCC1CCCCO1 FOKLVOHHYNATHU-UHFFFAOYSA-N 0.000 description 1
- ZADZUSCZHASNAH-UHFFFAOYSA-N oxetan-3-ylmethyl prop-2-enoate Chemical compound C=CC(=O)OCC1COC1 ZADZUSCZHASNAH-UHFFFAOYSA-N 0.000 description 1
- AHHWIHXENZJRFG-UHFFFAOYSA-N oxetane Chemical compound C1COC1 AHHWIHXENZJRFG-UHFFFAOYSA-N 0.000 description 1
- 238000000059 patterning Methods 0.000 description 1
- 230000035515 penetration Effects 0.000 description 1
- PNJWIWWMYCMZRO-UHFFFAOYSA-N pent‐4‐en‐2‐one Natural products CC(=O)CC=C PNJWIWWMYCMZRO-UHFFFAOYSA-N 0.000 description 1
- QIWKUEJZZCOPFV-UHFFFAOYSA-N phenyl 2-methylprop-2-enoate Chemical compound CC(=C)C(=O)OC1=CC=CC=C1 QIWKUEJZZCOPFV-UHFFFAOYSA-N 0.000 description 1
- WLVPQQDEYVVXJF-UHFFFAOYSA-N phenyl bicyclo[2.2.1]hept-2-ene-5-carboxylate Chemical compound C1C(C=C2)CC2C1C(=O)OC1=CC=CC=C1 WLVPQQDEYVVXJF-UHFFFAOYSA-N 0.000 description 1
- WRAQQYDMVSCOTE-UHFFFAOYSA-N phenyl prop-2-enoate Chemical compound C=CC(=O)OC1=CC=CC=C1 WRAQQYDMVSCOTE-UHFFFAOYSA-N 0.000 description 1
- 125000004437 phosphorous atom Chemical group 0.000 description 1
- 229910052698 phosphorus Inorganic materials 0.000 description 1
- 239000000049 pigment Substances 0.000 description 1
- 238000001020 plasma etching Methods 0.000 description 1
- 229920002493 poly(chlorotrifluoroethylene) Polymers 0.000 description 1
- 229920003207 poly(ethylene-2,6-naphthalate) Polymers 0.000 description 1
- 229920002492 poly(sulfone) Polymers 0.000 description 1
- 229920003050 poly-cycloolefin Polymers 0.000 description 1
- 229920000058 polyacrylate Polymers 0.000 description 1
- 229920002647 polyamide Polymers 0.000 description 1
- 229920002312 polyamide-imide Polymers 0.000 description 1
- 229920001230 polyarylate Polymers 0.000 description 1
- 229920001707 polybutylene terephthalate Polymers 0.000 description 1
- 239000004417 polycarbonate Substances 0.000 description 1
- 229920000515 polycarbonate Polymers 0.000 description 1
- 239000005023 polychlorotrifluoroethylene (PCTFE) polymer Substances 0.000 description 1
- 229920006393 polyether sulfone Polymers 0.000 description 1
- 229920001601 polyetherimide Polymers 0.000 description 1
- 239000011112 polyethylene naphthalate Substances 0.000 description 1
- 229920000139 polyethylene terephthalate Polymers 0.000 description 1
- 239000005020 polyethylene terephthalate Substances 0.000 description 1
- 229920001721 polyimide Polymers 0.000 description 1
- 238000001955 polymer synthesis method Methods 0.000 description 1
- 229920000098 polyolefin Polymers 0.000 description 1
- 229920000069 polyphenylene sulfide Polymers 0.000 description 1
- 229920001451 polypropylene glycol Polymers 0.000 description 1
- 229920001343 polytetrafluoroethylene Polymers 0.000 description 1
- 239000004810 polytetrafluoroethylene Substances 0.000 description 1
- 229910000028 potassium bicarbonate Inorganic materials 0.000 description 1
- 235000015497 potassium bicarbonate Nutrition 0.000 description 1
- 239000011736 potassium bicarbonate Substances 0.000 description 1
- 229910000027 potassium carbonate Inorganic materials 0.000 description 1
- 235000011181 potassium carbonates Nutrition 0.000 description 1
- TYJJADVDDVDEDZ-UHFFFAOYSA-M potassium hydrogencarbonate Chemical compound [K+].OC([O-])=O TYJJADVDDVDEDZ-UHFFFAOYSA-M 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- FZYCEURIEDTWNS-UHFFFAOYSA-N prop-1-en-2-ylbenzene Chemical compound CC(=C)C1=CC=CC=C1.CC(=C)C1=CC=CC=C1 FZYCEURIEDTWNS-UHFFFAOYSA-N 0.000 description 1
- HJWLCRVIBGQPNF-UHFFFAOYSA-N prop-2-enylbenzene Chemical compound C=CCC1=CC=CC=C1 HJWLCRVIBGQPNF-UHFFFAOYSA-N 0.000 description 1
- ILPVOWZUBFRIAX-UHFFFAOYSA-N propyl 2-oxopropanoate Chemical compound CCCOC(=O)C(C)=O ILPVOWZUBFRIAX-UHFFFAOYSA-N 0.000 description 1
- HUAZGNHGCJGYNP-UHFFFAOYSA-N propyl butyrate Chemical compound CCCOC(=O)CCC HUAZGNHGCJGYNP-UHFFFAOYSA-N 0.000 description 1
- RUOJZAUFBMNUDX-UHFFFAOYSA-N propylene carbonate Chemical compound CC1COC(=O)O1 RUOJZAUFBMNUDX-UHFFFAOYSA-N 0.000 description 1
- 229940116423 propylene glycol diacetate Drugs 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 150000003254 radicals Chemical class 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 229920006395 saturated elastomer Polymers 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 229920002050 silicone resin Polymers 0.000 description 1
- 229910000030 sodium bicarbonate Inorganic materials 0.000 description 1
- 235000017557 sodium bicarbonate Nutrition 0.000 description 1
- 229910000029 sodium carbonate Inorganic materials 0.000 description 1
- 235000019795 sodium metasilicate Nutrition 0.000 description 1
- 230000003595 spectral effect Effects 0.000 description 1
- 239000007921 spray Substances 0.000 description 1
- 239000010421 standard material Substances 0.000 description 1
- 238000003756 stirring Methods 0.000 description 1
- 125000000547 substituted alkyl group Chemical group 0.000 description 1
- 239000001384 succinic acid Substances 0.000 description 1
- 229920003002 synthetic resin Polymers 0.000 description 1
- 239000000057 synthetic resin Substances 0.000 description 1
- BZBMBZJUNPMEBD-UHFFFAOYSA-N tert-butyl bicyclo[2.2.1]hept-2-ene-5-carboxylate Chemical compound C1C2C(C(=O)OC(C)(C)C)CC1C=C2 BZBMBZJUNPMEBD-UHFFFAOYSA-N 0.000 description 1
- ISXSCDLOGDJUNJ-UHFFFAOYSA-N tert-butyl prop-2-enoate Chemical compound CC(C)(C)OC(=O)C=C ISXSCDLOGDJUNJ-UHFFFAOYSA-N 0.000 description 1
- 238000001029 thermal curing Methods 0.000 description 1
- ZEMGGZBWXRYJHK-UHFFFAOYSA-N thiouracil Chemical group O=C1C=CNC(=S)N1 ZEMGGZBWXRYJHK-UHFFFAOYSA-N 0.000 description 1
- LDHQCZJRKDOVOX-UHFFFAOYSA-N trans-crotonic acid Natural products CC=CC(O)=O LDHQCZJRKDOVOX-UHFFFAOYSA-N 0.000 description 1
- KEROTHRUZYBWCY-UHFFFAOYSA-N tridecyl 2-methylprop-2-enoate Chemical compound CCCCCCCCCCCCCOC(=O)C(C)=C KEROTHRUZYBWCY-UHFFFAOYSA-N 0.000 description 1
- XOALFFJGWSCQEO-UHFFFAOYSA-N tridecyl prop-2-enoate Chemical compound CCCCCCCCCCCCCOC(=O)C=C XOALFFJGWSCQEO-UHFFFAOYSA-N 0.000 description 1
- JLGLQAWTXXGVEM-UHFFFAOYSA-N triethylene glycol monomethyl ether Chemical compound COCCOCCOCCO JLGLQAWTXXGVEM-UHFFFAOYSA-N 0.000 description 1
- 229910021642 ultra pure water Inorganic materials 0.000 description 1
- 239000012498 ultrapure water Substances 0.000 description 1
- 238000001771 vacuum deposition Methods 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
- 238000001039 wet etching Methods 0.000 description 1
- 230000037303 wrinkles Effects 0.000 description 1
- 239000008096 xylene Substances 0.000 description 1
- 229910052727 yttrium Inorganic materials 0.000 description 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/022—Quinonediazides
- G03F7/023—Macromolecular quinonediazides; Macromolecular additives, e.g. binders
- G03F7/0233—Macromolecular quinonediazides; Macromolecular additives, e.g. binders characterised by the polymeric binders or the macromolecular additives other than the macromolecular quinonediazides
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/022—Quinonediazides
- G03F7/0226—Quinonediazides characterised by the non-macromolecular additives
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/12—Active-matrix OLED [AMOLED] displays
- H10K59/124—Insulating layers formed between TFT elements and OLED elements
Definitions
- the present invention relates to a photosensitive resin composition (hereinafter sometimes simply referred to as “photosensitive resin composition” or “composition of the present invention”). Moreover, it is related with the manufacturing method of the cured film using the said photosensitive resin composition, the cured film formed by hardening
- Organic EL display devices, liquid crystal display devices, and the like are provided with a patterned interlayer insulating film.
- a photosensitive resin composition is widely used because the number of steps for obtaining a required pattern shape is small and sufficient flatness is obtained (for example, patents). References 1-3).
- JP-A-5-165214 JP 2008-256974 A Japanese Patent Laid-Open No. 8-62847
- the photosensitive resin composition constituting the interlayer insulating film is adhesion to the substrate.
- the substrate itself is made of a plurality of types of materials
- the interlayer insulating film material formed on the surface of the wiring substrate is also provided with adhesion to the types of substrates.
- the interlayer insulating film is exposed to a resist stripping solution used for forming a pattern of the transparent electrode film after forming the interlayer insulating film and NMP (N-methylpyrrolidone) used for forming the liquid crystal alignment film.
- Patent Document 3 1-cyclohexyl-3- (2-morpholinoethyl) -2-thiourea is blended in a photosensitive composition. Although it is disclosed that adhesion in etching with a hydrochloric acid-based etchant is improved, it is difficult to achieve both adhesion to various substrates at the time of development and when used as a cured film. I understood. Moreover, since the photosensitive composition disclosed in Patent Document 3 is not high in resistance (chemical resistance) to chemicals such as a stripping solution and NMP, display defects are likely to occur in a liquid crystal display device, and improvement is required. It was.
- the present invention aims to solve the above-mentioned problems, and is a cured photosensitive resin composition having excellent adhesion to various substrates in the state of development and cured film, and excellent chemical resistance.
- the purpose is to provide goods. Furthermore, it aims at providing the manufacturing method of a cured film using such a photosensitive resin composition, a cured film, an organic electroluminescence display, and a liquid crystal display device.
- the photosensitive resin composition contains a polymer containing a repeating unit having an acid group and a repeating unit having a crosslinkable group, and a coordination atom in one molecule.
- a compound having a structure containing and a thiourea structure By including a compound having a structure containing and a thiourea structure, the adhesion to various substrates in the state of developing the photosensitive resin composition and when the photosensitive resin composition is a cured film is improved, It has been found that the chemical resistance is improved when the photosensitive resin composition is used for an interlayer insulating film, and the present invention has been completed.
- the above problem has been solved by the following means ⁇ 1>, preferably ⁇ 2> to ⁇ 17>.
- R 1 represents a group containing at least one nitrogen atom
- A represents a divalent linking group
- R 2 represents an organic group.
- R 1 is represented by —NR 3 R 4 (R 3 and R 4 are each an organic group and may be bonded to each other to form a ring).
- R 1 in the general formula (S) is a 5-membered or 6-membered cyclic group.
- ⁇ 6> The photosensitive resin composition according to any one of ⁇ 3> to ⁇ 5>, wherein R 1 in the general formula (S) is a morpholino group.
- R 1 in the general formula (S) is a morpholino group.
- ⁇ 8> The photosensitive resin composition according to any one of ⁇ 1> to ⁇ 7>, wherein the structural unit (a1) is a repeating unit having a carboxyl group and / or a phenolic hydroxyl group.
- the structural unit (a2) is selected from the group consisting of an epoxy group, an oxetanyl group, and a group represented by —NH—CH 2 —O—R (R represents a hydrogen atom or an alkyl group having 1 to 20 carbon atoms).
- the blending amount of the component (B) in the photosensitive resin composition is more than 10 mass% and 40 mass% or less with respect to the total solid content in the photosensitive resin composition, ⁇ 1> to ⁇ 9>
- ⁇ 11> The photosensitive resin composition according to any one of ⁇ 1> to ⁇ 10>, wherein the photosensitive resin composition is a positive photosensitive resin composition.
- ⁇ 12> (1) A step of applying the photosensitive resin composition according to any one of ⁇ 1> to ⁇ 11> on a substrate, (2) a step of removing the solvent from the applied photosensitive resin composition; (3) A step of exposing the photosensitive resin composition from which the solvent has been removed with actinic rays, (4) a step of developing the exposed photosensitive resin composition with an aqueous developer, and (5) a post-baking step of thermosetting the developed photosensitive resin composition; The manufacturing method of the cured film containing this.
- ⁇ 13> The method for producing a cured film according to ⁇ 12>, which includes (6) a step of exposing the entire surface of the developed photosensitive resin composition after the developing step and before the post-baking step.
- ⁇ 14> The method for producing a cured film according to ⁇ 12> or ⁇ 13>, including a step of performing dry etching on a substrate having a cured film obtained by thermosetting in the post-baking step.
- ⁇ 15> A cured film formed by the method for producing a cured film according to any one of ⁇ 12> to ⁇ 14>.
- ⁇ 16> The cured film according to ⁇ 15>, which is an interlayer insulating film.
- ⁇ 17> An organic EL display device or a liquid crystal display device having the cured film according to ⁇ 15> or ⁇ 16>.
- the present invention it is possible to provide a photosensitive resin composition that is excellent in adhesion to various substrates in the state of development and as a cured film and excellent in chemical resistance.
- the contents of the present invention will be described in detail.
- “to” is used to mean that the numerical values described before and after it are included as a lower limit value and an upper limit value.
- the description that does not indicate substitution and non-substitution includes not only those having no substituent but also those having a substituent.
- the “alkyl group” includes not only an alkyl group having no substituent (unsubstituted alkyl group) but also an alkyl group having a substituent (substituted alkyl group).
- the organic EL element in the present invention refers to an organic electroluminescence element.
- the composition of the present invention comprises (A) (a1) a repeating unit having an acid group, (a2) a polymer containing a repeating unit having a crosslinkable group, (B) a quinonediazide compound, and (C) in one molecule. And a compound having a structure containing a coordination atom and a thiourea structure (hereinafter also referred to as component (C)).
- component (C) a compound having a structure containing a coordination atom and a thiourea structure.
- the inventor of the present application contains (A) a polymer containing (a1) a repeating unit having an acid group and (a2) a repeating unit having a crosslinkable group and (C) component in the photosensitive resin composition.
- the adhesion to various substrates is improved and the photosensitive resin composition is used for an interlayer insulating film. It has been found that chemical resistance is also improved. Although this mechanism is not clear, by introducing the repeating unit (a2) having a crosslinkable group into the polymer (A), the crosslinkable group and the component (C) interact with each other, and the component (C) As a result of more adsorbing to the substrate, it is presumed that the adhesion to various substrates is improved during development of the photosensitive resin composition and when the photosensitive resin composition is used as a cured film.
- the crosslink density when the photosensitive resin composition is a cured film is improved.
- the chemical resistance is improved when the photosensitive resin composition is used for an interlayer insulating film. Is done. Therefore, when the said (C) component is contained in the photosensitive resin composition, it is estimated that chemical resistance improves compared with the case where the said (C) component is not contained in the photosensitive resin composition. Is done.
- the composition of the present invention can be preferably applied to a positive photosensitive resin composition.
- the repeating unit having an acid group is a carboxyl group and / or A repeating unit having a phenolic hydroxyl group is preferred.
- the repeating unit (a2) having a crosslinkable group includes an epoxy group, an oxetanyl group, and —NH—CH 2 —O—R (R is a hydrogen atom or an alkyl group having 1 to 20 carbon atoms).
- a polymer becomes a main component of the component except the solvent of the composition of this invention, and it is preferable to occupy 60 mass% or more of a total solid.
- the polymer (A) is, for example, a compound (a1-1) that provides a carboxyl group-containing structural unit as a repeating unit having an acid group (a1) in the presence of a polymerization initiator in a solvent (hereinafter referred to as “(a1-1 And (a2) a compound that gives an epoxy group-containing structural unit as a repeating unit having a crosslinkable group (hereinafter, sometimes referred to as “(a2) compound”). Can be manufactured. Further, (a1) a hydroxyl group-containing unsaturated compound that gives a hydroxyl group-containing structural unit (hereinafter sometimes referred to as “(a1-2) compound”) is further added as a repeating unit having an acid group, can do.
- the compound (a3) (a structural unit other than the structural unit derived from the compounds (a1) and (a2)) is given.
- a saturated compound) can be further added to form a copolymer.
- Examples of the compound (a1-1) include unsaturated monocarboxylic acid, unsaturated dicarboxylic acid, unsaturated dicarboxylic acid anhydride, poly [carboxylic acid] mono [(meth) acryloyloxyalkyl] ester, Examples thereof include mono (meth) acrylates of polymers having a hydroxyl group, unsaturated polycyclic compounds having a carboxyl group, and anhydrides thereof.
- Examples of unsaturated monocarboxylic acids include acrylic acid, methacrylic acid, crotonic acid and the like;
- Examples of the unsaturated dicarboxylic acid include maleic acid, fumaric acid, citraconic acid, mesaconic acid, itaconic acid, etc .
- examples of the unsaturated dicarboxylic acid anhydride include, for example, anhydrides of the compounds exemplified as the above dicarboxylic acid;
- Examples of acid mono [(meth) acryloyloxyalkyl] esters include succinic acid mono [2- (meth) acryloyloxyethyl], phthalic acid mono [2- (meth) acryloyloxyethyl] and the like;
- Examples of mono (meth) acrylates of polymers having a hydroxyl group and a hydroxyl group include ⁇ -carboxypolycaprolactone mono (meth) acrylates; unsaturated polycyclic compounds having a carboxyl
- monocarboxylic acids and dicarboxylic anhydrides are preferable, and acrylic acid, methacrylic acid, and maleic anhydride are more preferable from the viewpoint of copolymerization reactivity, solubility in an alkaline aqueous solution, and availability.
- acrylic acid, methacrylic acid, and maleic anhydride are more preferable from the viewpoint of copolymerization reactivity, solubility in an alkaline aqueous solution, and availability.
- These (a1-1) compounds may be used alone or in admixture of two or more.
- the proportion of the compound (a1-1) used is 5 to 5 based on the sum of the compound (a1-1) and the compound (a2) (optional (a1-2) compound and (a3) compound as necessary). 30% by mass is preferable, and 7 to 25% by mass is more preferable.
- Examples of the compound (a1-2) include a (meth) acrylic acid ester having a hydroxyl group, a phenolic hydroxyl group-containing unsaturated compound represented by the following formula (3), and the like.
- R 17 is a hydrogen atom or an alkyl group having 1 to 4 carbon atoms.
- R 18 to R 22 are each independently a hydrogen atom, a hydroxyl group or an alkyl group having 1 to 4 carbon atoms.
- Y is a single bond, —COO—, or —CONH—.
- p is an integer of 0 to 3. However, at least one of R 18 to R 22 is a hydroxyl group.
- Examples of the (meth) acrylic acid ester having a hydroxyl group include hydroxymethyl (meth) acrylate, 2-hydroxyethyl (meth) acrylate, 3-hydroxypropyl (meth) acrylate, 4-hydroxybutyl (meth) acrylate, and polyethylene glycol.
- Examples of the phenolic hydroxyl group-containing unsaturated compound represented by the above formula (3) include compounds represented by the following formulas (3-1) to (3-5) according to the definitions of Y and p. .
- q is an integer of 1 to 3.
- R 17 to R 22 have the same meaning as in the above formula (3).
- R 17 to R 22 have the same meaning as in the above formula (3).
- r is an integer of 1 to 3.
- R 17 to R 22 have the same meaning as in the above formula (3).
- R 17 to R 22 have the same meaning as in the above formula (3).
- R 17 to R 22 have the same meanings as in the above formula (3).
- 2-hydroxyethyl methacrylate 4-hydroxyphenyl methacrylate, o-hydroxystyrene, p-hydroxystyrene, and ⁇ -methyl-p-hydroxystyrene are preferable. These compounds may be used alone or in combination of two or more.
- the proportion of the (a1-2) compound used is 5 to 5 based on the sum of the (a1-2) compound, the (a2) compound, and the (a1-1) compound (optional (a3) compound if necessary). 30% by mass is preferable, and 7 to 25% by mass is more preferable.
- the crosslinkable group in the compound (a2) is not particularly limited as long as it is a group that causes a curing reaction by heat treatment.
- Preferred embodiments of the structural unit having a crosslinkable group include an epoxy group, an oxetanyl group, a group represented by —NH—CH 2 —O—R (R is a hydrogen atom or an alkyl group having 1 to 20 carbon atoms) and ethylene.
- the component (A) preferably includes a structural unit containing at least one of an epoxy group and an oxetanyl group.
- the unsaturated compound having an epoxy group examples include glycidyl acrylate, glycidyl methacrylate, glycidyl ⁇ -ethyl acrylate, glycidyl ⁇ -n-propyl acrylate, glycidyl ⁇ -n-butyl acrylate, acrylate-3, 4-epoxybutyl, methacrylic acid-3,4-epoxybutyl, acrylic acid-3,4-epoxycyclohexylmethyl, methacrylic acid-3,4-epoxycyclohexylmethyl, ⁇ -ethylacrylic acid-3,4-epoxycyclohexylmethyl O-vinyl benzyl glycidyl ether, m-vinyl benzyl glycidyl ether, p-vinyl benzyl glycidyl ether, compounds containing an alicyclic epoxy skeleton described in paragraph Nos. 0031 to
- glycidyl methacrylate, 2-methylglycidyl methacrylate, -6,7-epoxyheptyl methacrylate, o-vinylbenzyl glycidyl ether, m-vinylbenzyl glycidyl ether, p-vinylbenzyl glycidyl ether, 3, methacrylate 4-Epoxycyclohexyl is preferred from the viewpoint of improving the copolymerization reactivity and the solvent resistance of the cured film.
- Examples of the unsaturated compound having an oxetanyl group include 3- (acryloyloxymethyl) oxetane, 3- (acryloyloxymethyl) -2-methyloxetane, 3- (acryloyloxymethyl) -3-ethyloxetane, 3- ( Acryloyloxymethyl) -2-trifluoromethyloxetane, 3- (acryloyloxymethyl) -2-pentafluoroethyloxetane, 3- (acryloyloxymethyl) -2-phenyloxetane, 3- (acryloyloxymethyl) -2, 2-difluorooxetane, 3- (acryloyloxymethyl) -2,2,4-trifluorooxetane, 3- (acryloyloxymethyl) -2,2,4,4-tetrafluorooxetane, 3- (2-acryloyloxy) Ethyl) oxetane, 3- 2-acrylo
- (a2) compounds may be used alone or in admixture of two or more.
- specific examples of the radical polymerizable monomer used for forming a structural unit having an oxetanyl group include, for example, JP-A-2001-330953 Examples include (meth) acrylic acid esters having an oxetanyl group described in paragraphs 0011 to 0016, and the contents thereof are incorporated in the present specification.
- R is a hydrogen atom or an alkyl group having 1 to 20 carbon atoms
- R is preferably an alkyl group having 1 to 9 carbon atoms
- An alkyl group having 1 to 4 carbon atoms is more preferable.
- the alkyl group may be a linear, branched or cyclic alkyl group, but is preferably a linear or branched alkyl group.
- More preferable examples of the unsaturated compound having a group represented by —NH—CH 2 —O—R include compounds represented by the following general formula (a2-30).
- R 1 represents a hydrogen atom or a methyl group
- R 2 represents a hydrogen atom or an alkyl group having 1 to 20 carbon atoms.
- R 2 is preferably an alkyl group having 1 to 9 carbon atoms, and more preferably an alkyl group having 1 to 4 carbon atoms.
- the alkyl group may be a linear, branched or cyclic alkyl group, but is preferably a linear or branched alkyl group.
- Specific examples of R 2 include a methyl group, an ethyl group, an n-butyl group, an i-butyl group, a cyclohexyl group, and an n-hexyl group. Of these, i-butyl, n-butyl and methyl are preferred.
- the proportion of the compound (a2) used is preferably 5 to 70% by mass and more preferably 20 to 65% by mass based on the total of the compound (a1) and the compound (a2).
- A2 By making the usage-amount of a compound into the said range, the cured film which has the outstanding solvent resistance etc. can be formed.
- the compound (a3) is not particularly limited as long as it is an unsaturated compound other than the compounds (a1) and (a2).
- Examples of the compound (a3) include methacrylic acid chain alkyl ester, methacrylic acid cyclic alkyl ester, acrylic acid chain alkyl ester, acrylic acid cyclic alkyl ester, methacrylic acid aryl ester, acrylic acid aryl ester, unsaturated dicarboxylic acid diester, Bicyclo unsaturated compound, maleimide compound, unsaturated aromatic compound, conjugated diene, tetrahydrofuran skeleton, furan skeleton, tetrahydropyran skeleton, pyran skeleton, unsaturated compound containing skeleton represented by the following formula (4), and other unsaturated compounds Compounds and the like.
- R 23 is a hydrogen atom or a methyl group. s is an integer of 1 or more.
- chain alkyl esters of methacrylic acid include, for example, methyl methacrylate, ethyl methacrylate, n-butyl methacrylate, sec-butyl methacrylate, t-butyl methacrylate, 2-ethylhexyl methacrylate, isodecyl methacrylate, and n-methacrylate.
- Examples include lauryl, tridecyl methacrylate, and n-stearyl methacrylate.
- cyclic alkyl ester of methacrylic acid examples include cyclohexyl methacrylate, 2-methylcyclohexyl methacrylate, tricyclo [5.2.1.0 2,6 ] decane-8-yl methacrylate, and tricyclomethacrylate [5.2.1]. .0 2,6] decan-8-yl oxy ethyl, and isobornyl methacrylate.
- acrylic acid chain alkyl esters examples include methyl acrylate, ethyl acrylate, n-butyl acrylate, sec-butyl acrylate, t-butyl acrylate, 2-ethylhexyl acrylate, isodecyl acrylate, and n-acrylate.
- acrylic acid chain alkyl esters examples include lauryl, tridecyl acrylate, and n-stearyl acrylate.
- acrylic acid cyclic alkyl ester examples include cyclohexyl acrylate, 2-methylcyclohexyl acrylate, tricyclo [5.2.1.0 2,6 ] decan-8-yl acrylate, and tricyclo [5.2.1.0 2,6. Decan-8-yloxyethyl acrylate, isobornyl acrylate and the like.
- methacrylic acid aryl ester examples include phenyl methacrylate and benzyl methacrylate.
- acrylic acid aryl ester examples include phenyl acrylate and benzyl acrylate.
- Examples of the unsaturated dicarboxylic acid diester include diethyl maleate, diethyl fumarate, diethyl itaconate and the like.
- bicyclo unsaturated compound examples include bicyclo [2.2.1] hept-2-ene, 5-methylbicyclo [2.2.1] hept-2-ene, and 5-ethylbicyclo [2.2.1].
- maleimide compounds include N-phenylmaleimide, N-cyclohexylmaleimide, N-benzylmaleimide, N- (4-hydroxyphenyl) maleimide, N- (4-hydroxybenzyl) maleimide, N-succinimidyl-3-maleimidobenzoate, N-succinimidyl-4-maleimidobutyrate, N-succinimidyl-6-maleimidocaproate, N-succinimidyl-3-maleimidopropionate, N- (9-acridinyl) maleimide and the like.
- unsaturated aromatic compound examples include styrene, ⁇ -methylstyrene, m-methylstyrene, p-methylstyrene, vinyltoluene, p-methoxystyrene and the like.
- conjugated diene examples include 1,3-butadiene, isoprene, 2,3-dimethyl-1,3-butadiene and the like.
- Examples of the unsaturated compound containing a tetrahydrofuran skeleton include tetrahydrofurfuryl methacrylate, 2-methacryloyloxy-propionic acid tetrahydrofurfuryl ester, 3- (meth) acryloyloxytetrahydrofuran-2-one, and the like.
- Examples of unsaturated compounds containing a furan skeleton include 2-methyl-5- (3-furyl) -1-penten-3-one, furfuryl (meth) acrylate, 1-furan-2-butyl-3-ene- 2-one, 1-furan-2-butyl-3-methoxy-3-en-2-one, 6- (2-furyl) -2-methyl-1-hexen-3-one, 6-furan-2- Yl-hex-1-en-3-one, acrylic acid-2-furan-2-yl-1-methyl-ethyl ester, 6- (2-furyl) -6-methyl-1-hepten-3-one, etc. Is mentioned.
- Examples of unsaturated compounds containing a tetrahydropyran skeleton include (tetrahydropyran-2-yl) methyl methacrylate, 2,6-dimethyl-8- (tetrahydropyran-2-yloxy) -oct-1-en-3-one 2-methacrylic acid tetrahydropyran-2-yl ester, 1- (tetrahydropyran-2-oxy) -butyl-3-en-2-one, and the like.
- Examples of unsaturated compounds containing a pyran skeleton include 4- (1,4-dioxa-5-oxo-6-heptenyl) -6-methyl-2-pyran, 4- (1,5-dioxa-6-oxo -7-octenyl) -6-methyl-2-pyran and the like.
- Examples of other unsaturated compounds include acrylonitrile, methacrylonitrile, vinyl chloride, vinylidene chloride, acrylamide, methacrylamide, vinyl acetate, acryloylmorpholine, p-vinylbenzyl 2,3-epoxypropyl ether, and the like.
- (a3) compounds it has a methacrylic acid chain alkyl ester, a methacrylic acid cyclic alkyl ester, a maleimide compound, a tetrahydrofuran skeleton, a furan skeleton, a tetrahydropyran skeleton, a pyran skeleton, and a skeleton represented by the above formula (4).
- Unsaturated compounds, unsaturated aromatic compounds and acrylic acid cyclic alkyl esters are preferred.
- the use ratio of the compound (a3) is preferably 0 to 70% by mass, more preferably 0 to 50% by mass based on the total of the (a1) compound and the (a3) compound (and any (a2) compound). . (A3) By making the use ratio of a compound into the said range, the cured film excellent in solvent resistance etc. can be formed.
- a molecular weight modifier may be added to the (A) polymer.
- the molecular weight modifier is not particularly limited, and examples thereof include pentaerythritol tetrakis (3-mercaptopropionate), trimethylolpropane tris (3-mercaptopropionate), and ⁇ -methylstyrene dimer. Only one type of molecular weight regulator may be used, or two or more types may be used in combination.
- the use ratio of the molecular weight modifier is preferably 0.5 to 10% by mass, more preferably 1 to 5% by mass in the polymer (A).
- the polymer (A) used in the present invention is particularly preferably an acrylic polymer containing the (a1) repeating unit having an acid group and the (a2) repeating unit having a crosslinkable group.
- (B) quinonediazide compound used in the composition of the present invention a 1,2-quinonediazide compound that generates a carboxylic acid upon irradiation with radiation can be used.
- a condensate of a phenolic compound or an alcoholic compound (hereinafter referred to as “mother nucleus”) and 1,2-naphthoquinonediazidesulfonic acid halide can be used.
- mother nucleus examples include trihydroxybenzophenone, tetrahydroxybenzophenone, pentahydroxybenzophenone, hexahydroxybenzophenone, (polyhydroxyphenyl) alkane, and other mother nuclei.
- trihydroxybenzophenone examples include 2,3,4-trihydroxybenzophenone and 2,4,6-trihydroxybenzophenone.
- examples of tetrahydroxybenzophenone include 2,2 ′, 4,4′-tetrahydroxybenzophenone, 2,3,4,3′-tetrahydroxybenzophenone, 2,3,4,4′-tetrahydroxybenzophenone, 2,3 , 4,2′-tetrahydroxy-4′-methylbenzophenone, 2,3,4,4′-tetrahydroxy-3′-methoxybenzophenone, and the like.
- pentahydroxybenzophenone examples include 2,3,4,2 ′, 6′-pentahydroxybenzophenone.
- Examples of hexahydroxybenzophenone include 2,4,6,3 ′, 4 ′, 5′-hexahydroxybenzophenone and 3,4,5,3 ′, 4 ′, 5′-hexahydroxybenzophenone.
- Examples of (polyhydroxyphenyl) alkanes include bis (2,4-dihydroxyphenyl) methane, bis (p-hydroxyphenyl) methane, tris (p-hydroxyphenyl) methane, 1,1,1-tris (p-hydroxy).
- Phenyl) ethane bis (2,3,4-trihydroxyphenyl) methane, 2,2-bis (2,3,4-trihydroxyphenyl) propane, 1,1,3-tris (2,5-dimethyl-) 4-hydroxyphenyl) -3-phenylpropane, 4,4 ′-[1- [4- [1- [4-hydroxyphenyl] -1-methylethyl] phenyl] ethylidene] bisphenol, bis (2,5-dimethyl) -4-hydroxyphenyl) -2-hydroxyphenylmethane, 3,3,3 ', 3'-tetramethyl-1,1'-spirobiindene -5,6,7,5 ', 6', 7'-hexanol, 2,2,4-trimethyl-7,2 ', 4'-trihydroxyflavan and the like.
- mother nuclei examples include 2-methyl-2- (2,4-dihydroxyphenyl) -4- (4-hydroxyphenyl) -7-hydroxychroman, 1- [1- (3- ⁇ 1- (4 -Hydroxyphenyl) -1-methylethyl ⁇ -4,6-dihydroxyphenyl) -1-methylethyl] -3- (1- (3- ⁇ 1- (4-hydroxyphenyl) -1-methylethyl ⁇ -4 , 6-dihydroxyphenyl) -1-methylethyl) benzene, 4,6-bis ⁇ 1- (4-hydroxyphenyl) -1-methylethyl ⁇ -1,3-dihydroxybenzene, and the like.
- 1,2-naphthoquinone diazide sulfonic acid halide 1,2-naphthoquinone diazide sulfonic acid chloride is preferable.
- 1,2-naphthoquinone diazide sulfonic acid chloride examples include 1,2-naphthoquinone diazide-4-sulfonic acid chloride, 1,2-naphthoquinone diazide-5-sulfonic acid chloride, and the like. Of these, 1,2-naphthoquinonediazide-5-sulfonic acid chloride is more preferred.
- condensation reaction In the condensation reaction of the phenolic compound or alcoholic compound (mother nucleus) and 1,2-naphthoquinonediazide sulfonic acid halide, preferably 30 to 85 moles relative to the number of OH groups in the phenolic compound or alcoholic compound. %, More preferably 1,2-naphthoquinonediazide sulfonic acid halide corresponding to 50 to 70 mol% can be used.
- the condensation reaction can be carried out by a known method.
- 1,2-quinonediazide compound examples include 1,2-naphthoquinonediazidesulfonic acid amides in which the ester bond of the mother nucleus exemplified above is changed to an amide bond, such as 2,3,4-triaminobenzophenone-1,2 -Naphthoquinonediazide-4-sulfonic acid amide is also preferably used.
- the proportion of the (B) quinonediazide compound used in the photosensitive resin composition is preferably 5 to 100% by mass with respect to the total solid content in the photosensitive resin composition, and is more than 10% by mass and 40% by mass or less. More preferably, it is more than 12 mass% and 40 mass% or less.
- composition of the present invention contains a compound having a structure containing a coordination atom and a thiourea structure in one molecule. It is presumed that such a basic site (for example, a structure containing a coordination atom) contained in the component (C) promotes the crosslinking reaction of the cured film.
- the coordination atom is, for example, an inorganic material constituting the base substrate to which the composition of the present invention is applied, for example, a silicon compound such as silicon, silicon oxide, or silicon nitride, gold, copper, molybdenum, titanium, aluminum, or the like.
- An atom capable of forming a coordination bond with the metal is preferable.
- a nitrogen atom, an oxygen atom, a sulfur atom, and a phosphorus atom are more preferable, and a nitrogen atom or an oxygen atom is particularly preferable.
- the structure containing a coordination atom is preferably a structure containing at least one nitrogen atom, and more preferably a structure containing 1 to 3 nitrogen atoms.
- the structure containing a coordination atom include, for example, morpholino group, hydrazino group, pyridyl group, imidazolyl group, quinolyl group, piperidyl group, pyrrolidinyl group, pyrazonyl group, oxazolyl group, thiazolyl group, benzooxazolyl group, Examples thereof include a benzimidazolyl group, a benzthiazolyl group, a pyrazinyl group, and a diethylamino group.
- morpholino group, piperidyl group, imidazolyl group and diethylamino group are preferable, morpholino group, piperidyl group and imidazolyl group are more preferable, and morpholino group is more preferable.
- a component (C) By using such a component (C), the interaction between the composition of the present invention and the base substrate can be strengthened, and the adhesion to various substrates in the state of development and cured film is improved. I think that.
- a cured film having a higher crosslinking density is formed by promoting the reaction between the acid group and the crosslinking group of the polymer contained in the composition of the present invention. Used for forming a pattern of a transparent electrode film after the formation of an interlayer insulating film or a liquid crystal alignment film. It is considered that the resistance to NMP can be improved.
- the component (C) is preferably a compound containing at least one nitrogen atom as a coordination atom, and more preferably a compound represented by the following general formula (S).
- General formula (S) (In general formula (S), R 1 represents a group containing at least one nitrogen atom, A represents a divalent linking group, and R 2 represents an organic group.)
- R 1 represents a group containing at least one nitrogen atom, preferably a group containing 1 to 3 nitrogen atoms, and more preferably a group represented by —NR 3 R 4 .
- R 1 preferably contains 1 to 10 carbon atoms and 1 to 3 heteroatoms including a nitrogen atom and / or an oxygen atom.
- examples of the hetero atom include a nitrogen atom, an oxygen atom, and a sulfur atom, and a nitrogen atom and an oxygen atom are preferable.
- R 1 is preferably a cyclic group, more preferably a 5-membered or 6-membered cyclic group.
- R 3 and R 4 each represents an organic group.
- R 3 and R 4 are each preferably a group having 1 to 3 carbon atoms.
- R 3 and R 4 may be bonded to each other to form a ring, and preferably form a ring.
- R 3 and R 4 are bonded to each other to form a 5-membered or 6-membered ring. Is preferably formed.
- R 1 Preferred embodiments of R 1 include the following embodiments. (1) An embodiment in which R 1 is a group represented by —NR 3 R 4 and R 3 and R 4 are bonded to each other to form a ring, or R 3 and R 4 are each , A linear, branched or cyclic aliphatic hydrocarbon group. (2) Embodiment in which R 1 is a group represented by —NR 3 R 4 and R 3 and R 4 are bonded to each other to form a 5-membered or 6-membered ring, or R 3 and R 4 Are each a linear or branched aliphatic hydrocarbon group having 1 to 4 carbon atoms.
- R 1 is a group represented by —NR 3 R 4 , and R 3 and R 4 are bonded to each other to form two or more heteroatoms (at least one is a nitrogen atom and the rest are oxygen atoms or A mode in which a 5-membered ring or a 6-membered ring is formed, or a straight-chain aliphatic hydrocarbon group having 1 to 4 carbon atoms, each of R 3 and R 4 The aspect which is.
- R 1 examples include, for example, morpholino group, hydrazino group, pyridyl group, imidazolyl group, quinolyl group, piperidyl group, pyrrolidinyl group, pyrazonyl group, oxazolyl group, thiazolyl group, benzoxazolyl group, benzimidazolyl group, A benzthiazolyl group, a pyrazinyl group, a diethylamino group, etc. are mentioned.
- morpholino group piperidyl group, imidazolyl group and diethylamino group are preferable, morpholino group, piperidyl group and imidazolyl group are more preferable, and morpholino group is more preferable.
- R 2 represents an organic group.
- the organic group is preferably a hydrocarbon group or a group consisting of a hydrocarbon group and at least one of —O— and —C ( ⁇ O) —, and in particular, an aliphatic hydrocarbon group or an aliphatic group.
- a group consisting of a hydrocarbon group and at least one combination of —O— and —C ( ⁇ O) — is more preferred.
- R 2 preferably has 1 to 20 carbon atoms, and more preferably 1 to 10 carbon atoms.
- R 2 preferably has a hydrocarbon group at the terminal. When R 2 has a hydrocarbon group at the terminal, the hydrophobicity is further improved, and the effects of the present invention are more effectively exhibited.
- R 2 is an alkyl group having 1 to 20 carbon atoms or an aryl group having 6 to 12 carbon atoms, or a group composed of these and at least one combination of —O— and —C ( ⁇ O) —. Further preferred. These groups may have a substituent, and examples of the substituent include a halogen atom.
- R 2 is an alkyl group, a linear or branched alkyl group having 1 to 8 carbon atoms or a cyclic alkyl group is preferable.
- R 2 is a cyclic alkyl group, a 5-membered or 6-membered cyclic alkyl group is preferred.
- R 2 is an aryl group, a phenyl group and a naphthyl group are exemplified, and a phenyl group is more preferable.
- R 2 include the following embodiments. (1) A mode of being a straight-chain alkylene group having 1 to 4 carbon atoms (preferably 2 or 3). (2) Aspect of being a 5- or 6-membered cyclic alkyl group (3) an aliphatic hydrocarbon group having 1 to 10 carbon atoms (preferably 2 to 4 carbon atoms), and —O— and —C ( ⁇ O) An embodiment in which the group is a combination of-and the terminal is a hydrocarbon group
- A represents a divalent linking group, such as a hydrocarbon group having 1 to 20 carbon atoms, —O—, —S—, —NR—, —CO—, —COO—, —NRCO—, —SO 2 — and the like. Examples thereof include a divalent group or a divalent group composed of a combination of these groups.
- R represents a hydrogen atom or an alkylene group having 1 to 4 carbon atoms. Of these, hydrocarbon groups having 1 to 20 carbon atoms are preferable, hydrocarbon groups having 1 to 10 carbon atoms are more preferable, and hydrocarbon groups having 2 to 6 carbon atoms are more preferable.
- Examples of the hydrocarbon group include an alkylene group and an arylene group, and an alkylene group is preferable.
- the alkylene group is preferably a linear or branched alkylene group, and more preferably a linear alkylene group.
- Examples of the alkylene group include a methylene group, an ethylene group, a propylene group, a cyclohexylene group, and a cyclopentylene group.
- Examples of the arylene group include a 1,2-phenylene group, a 1,3-phenylene group, a 1,4-phenylene group, and a naphthylene group.
- a methylene group, an ethylene group, and a propylene group are particularly preferable, and an ethylene group or a propylene group is more preferable.
- Preferred embodiments of A include the following embodiments. (1) An embodiment in which the alkyl group is a linear or branched alkyl group having 1 to 4 carbon atoms, a 5- or 6-membered cyclic alkyl group, or a phenyl group.
- the compound represented by the general formula (S) is exemplified as a particularly preferable embodiment in which the preferred embodiment of R 1 , the preferred embodiment of R 2 , and the preferred embodiment of A are combined.
- the compound represented by the general formula (S) is represented by the general formula (S1).
- General formula (S1) (In general formula (S1), R 2 represents an organic group, and A represents a divalent linking group.) R 2 has the same meaning as R 2 in formula (S), and the preferred range is also the same. A is synonymous with A in the formula (S), and the preferred range is also the same.
- the following embodiments are preferable. (1) An embodiment in which A is a linear alkylene group having 1 to 4 carbon atoms, and R 2 is a linear, branched, or cyclic alkyl group. (2) A mode in which A is an alkylene group having 2 or 3 carbon atoms, and R 2 is a linear, branched or cyclic alkyl group having 2 to 6 carbon atoms.
- the molecular weight of the component (C) is preferably 150 to 1000, more preferably 200 to 500.
- the composition of the present invention preferably contains component (C) in a proportion of 0.001 to 10 parts by mass, and in a proportion of 0.003 to 7.5 parts by mass with respect to 100 parts by mass of the total solid content. Is more preferable, and it is more preferable to include it in a proportion of 0.005 to 5 parts by mass. (C) Only 1 type may be sufficient as a component and 2 or more types may be sufficient as it. In the case of two or more types, the total is preferably in the above range.
- the composition of the present invention includes a silane coupling agent, a surfactant, Optional components such as an adhesion aid, a heat resistance improver, and a heat-sensitive acid generator can be contained. These optional components may be used alone or in combination of two or more. Details of these compounds can be referred to the descriptions in paragraph numbers 0201 to 0224 of JP2012-88459A, the contents of which are incorporated herein.
- the silane coupling agent used in the composition of the present invention preferably contains an alkoxysilane compound.
- an alkoxysilane compound is used, the adhesion between the film formed from the composition used in the present invention and the substrate can be further improved, or the properties of the film formed from the composition used in the present invention can be adjusted. it can.
- the alkoxysilane compound that can be used in the composition of the present invention includes an inorganic material as a base material, for example, a silicon compound such as silicon, silicon oxide, or silicon nitride, a metal such as gold, copper, molybdenum, titanium, or aluminum, and an insulating film. It is preferable that it is a compound which improves adhesiveness.
- silane coupling agents include ⁇ -aminopropyltrimethoxysilane, ⁇ -aminopropyltriethoxysilane, ⁇ -glycidoxypropyltrialkoxysilane, ⁇ -glycidoxypropylalkyldialkoxysilane, and ⁇ -methacryloxy.
- ⁇ -glycidoxypropyltrialkoxysilane and ⁇ -methacryloxypropyltrialkoxysilane are more preferable, ⁇ -glycidoxypropyltrialkoxysilane is more preferable, and 3-glycidoxypropyltrimethoxysilane is more preferable. Further preferred. These can be used alone or in combination of two or more.
- R 1 is a hydrocarbon group having 1 to 20 carbon atoms having no reactive group
- R 2 is an alkyl group having 1 to 3 carbon atoms or a phenyl group
- n is an integer of 1 to 3 It is. Specific examples thereof include the following compounds.
- Ph is a phenyl group.
- the content of the alkoxysilane compound in the composition of the present invention is preferably 0.1 to 30 parts by mass, more preferably 0.5 to 20 parts by mass with respect to 100 parts by mass of the total solid content in the photosensitive composition. .
- the surfactant used in the composition of the present invention is not particularly limited, and for example, those described in paragraph numbers 0201 to 0205 of JP2012-8859A can be used. Only one surfactant may be used, or two or more surfactants may be used in combination, but two or more surfactants are preferably used in combination.
- the content of the surfactant in the composition of the present invention is preferably 0.01 to 1 part by mass, and 0.05 to 0.5 part by mass with respect to 100 parts by mass of the total solid content in the photosensitive composition. More preferred.
- composition of the present invention may further contain a solvent.
- a solvent that uniformly dissolves essential components and optional components and does not react with each component is used.
- solvents for example, ethylene glycol monomethyl ether, ethylene glycol monoethyl ether, ethylene glycol mono-n-propyl ether from the viewpoint of solubility of each component, reactivity with each component, ease of film formation, and the like.
- Ethylene glycol mono-n-butyl ether diethylene glycol monomethyl ether, diethylene glycol monoethyl ether, diethylene glycol mono-n-propyl ether, diethylene glycol mono-n-butyl ether, triethylene glycol monomethyl ether, triethylene glycol monoethyl ether, propylene glycol monomethyl ether , Propylene glycol monoethyl ether, propylene glycol mono-n-propyl ether, propylene glycol Non-n-butyl ether, dipropylene glycol monomethyl ether, dipropylene glycol monoethyl ether, dipropylene glycol mono-n-propyl ether, dipropylene glycol mono-n-butyl ether, tripropylene glycol monomethyl ether, tripropylene glycol monoethyl ether (Poly) alkylene glycol monoalkyl ethers such as
- ethers such as diethylene glycol dimethyl ether, diethylene glycol methyl ethyl ether, diethylene glycol diethyl ether, tetrahydrofuran; Ketones such as methyl ethyl ketone, cyclohexanone, 2-heptanone, 3-heptanone, diacetone alcohol (4-hydroxy-4-methylpentan-2-one), 4-hydroxy-4-methylhexane-2-one; Diacetates such as propylene glycol diacetate, 1,3-butylene glycol diacetate, and 1,6-hexanediol diacetate; Lactic acid alkyl esters such as methyl lactate and ethyl lactate; Ethyl acetate, n-propyl acetate, i-propyl acetate, n-butyl acetate, i-butyl acetate, n-pentyl formate, i-pentyl acetate, n-butyl
- solvents from the viewpoint of solubility, pigment dispersibility, coatability, etc., propylene glycol monomethyl ether, propylene glycol monoethyl ether, ethylene glycol monomethyl ether acetate, propylene glycol monomethyl ether acetate, propylene glycol monoethyl ether acetate, 3-methoxybutyl acetate, diethylene glycol dimethyl ether, diethylene glycol methyl ethyl ether, cyclohexanone, 2-heptanone, 3-heptanone, 1,3-butylene glycol diacetate, 1,6-hexanediol diacetate, ethyl lactate, 3-methoxypropionic acid Ethyl, methyl 3-ethoxypropionate, ethyl 3-ethoxypropionate, 3-methyl-3-methoxybutylpropionate, n-acetate Chill acetate i- butyl, formic acid n- amyl
- a high boiling point solvent such as diethyl, ⁇ -butyrolactone, ethylene carbonate, propylene carbonate, ethylene glycol monophenyl ether acetate may be used in combination.
- the said high boiling point solvent can use single or 2 types or more.
- the content of the solvent is not limited, the total concentration of each component excluding the solvent of the photosensitive resin composition is 5 to 50% by mass from the viewpoint of the coating property and stability of the obtained photosensitive resin composition.
- the amount is preferably 10 to 40% by mass.
- the solid content concentration (components other than the solvent in the composition solution) can be set to any concentration (for example, 5 depending on the purpose of use, a desired film thickness value, etc.). To 50 mass%).
- a more preferable solid content concentration varies depending on a method of forming a film on the substrate, which will be described later.
- the composition solution thus prepared can be used after being filtered using a Millipore filter or the like having a pore diameter of about 0.5 ⁇ m.
- the composition of the present invention can be prepared by mixing each component at a predetermined ratio and by any method, and stirring and dissolving.
- the resin composition can be prepared by mixing each component in a predetermined ratio after preparing each solution in advance in the above-described solvent.
- the composition solution prepared as described above can be used after being filtered using, for example, a filter having a pore size of 0.2 ⁇ m.
- the method for producing a cured film of the present invention preferably includes the following steps (1) to (5).
- substrate (2) A step of removing the solvent from the applied photosensitive resin composition; (3) The process of exposing the photosensitive resin composition from which the solvent was removed with actinic rays; (4) A step of developing the exposed photosensitive resin composition with an aqueous developer; (5) A post-baking step of thermosetting the developed photosensitive resin composition.
- Each step will be described below in order.
- the coating step (1) it is preferable to apply the composition of the present invention on a substrate to form a wet film containing a solvent.
- substrate cleaning such as alkali cleaning or plasma cleaning
- the method for treating the substrate surface with hexamethyldisilazane is not particularly limited, and examples thereof include a method in which the substrate is exposed to hexamethyldisilazane vapor.
- the substrate include inorganic substrates, resins, and resin composite materials.
- the inorganic substrate examples include glass, quartz, silicone, silicon nitride, and a composite substrate in which molybdenum, titanium, aluminum, copper, or the like is vapor-deposited on such a substrate.
- the resins include polybutylene terephthalate, polyethylene terephthalate, polyethylene naphthalate, polybutylene naphthalate, polystyrene, polycarbonate, polysulfone, polyethersulfone, polyarylate, allyl diglycol carbonate, polyamide, polyimide, polyamideimide, polyetherimide, poly Fluorine resins such as benzazole, polyphenylene sulfide, polycycloolefin, norbornene resin, polychlorotrifluoroethylene, liquid crystal polymer, acrylic resin, epoxy resin, silicone resin, ionomer resin, cyanate resin, crosslinked fumaric acid diester, cyclic polyolefin, aromatic Made of synthetic resin such as aromatic ether, maleimide
- the coating method on the substrate is not particularly limited, and for example, a slit coating method, a spray method, a roll coating method, a spin coating method, a casting coating method, a slit and spin method, or the like can be used. Furthermore, it is also possible to apply a so-called pre-wet method as described in JP-A-2009-145395.
- the wet film thickness when applied is not particularly limited, and can be applied with a film thickness according to the application, but it is usually used in the range of 0.5 to 10 ⁇ m.
- the solvent removal step (2) the solvent is removed from the coated film by reducing pressure (vacuum) and / or heating to form a dry coating film on the substrate.
- reducing pressure vacuum
- heating to form a dry coating film on the substrate.
- the heating conditions for the solvent removal step are preferably 70 to 130 ° C. and about 30 to 300 seconds. When the temperature and time are in the above ranges, the pattern adhesiveness is better and the residue tends to be further reduced.
- the substrate provided with the coating film is irradiated with an actinic ray having a predetermined pattern.
- the photoacid generator is decomposed to generate an acid.
- the acid-decomposable group contained in the coating film component is hydrolyzed to produce a carboxyl group or a phenolic hydroxyl group.
- an exposure light source using actinic light a low-pressure mercury lamp, a high-pressure mercury lamp, an ultrahigh-pressure mercury lamp, a chemical lamp, an LED light source, an excimer laser generator, etc.
- g-line (436 nm), i-line (365 nm), Actinic rays having a wavelength of 300 nm to 450 nm, such as 405 nm), can be preferably used.
- irradiation light can also be adjusted through spectral filters, such as a long wavelength cut filter, a short wavelength cut filter, and a band pass filter, as needed.
- the exposure amount is preferably 1 to 500 mj / cm 2 .
- various types of exposure machines such as a mirror projection aligner, a stepper, a scanner, a proximity, a contact, a microlens array, and a laser exposure can be used.
- PEB Post Exposure Bake
- the temperature for performing PEB is preferably 30 ° C. or higher and 130 ° C. or lower, more preferably 40 ° C. or higher and 110 ° C. or lower, and particularly preferably 50 ° C. or higher and 100 ° C. or lower.
- the acid-decomposable group in the present invention has low activation energy for acid decomposition and is easily decomposed by an acid derived from an acid generator by exposure to generate a carboxyl group or a phenolic hydroxyl group, PEB is not necessarily performed.
- a positive image can also be formed by development.
- a polymer having a liberated carboxyl group or phenolic hydroxyl group is developed using an alkaline developer.
- a positive image is formed by removing an exposed area containing a resin composition having a carboxyl group or a phenolic hydroxyl group that is easily dissolved in an alkaline developer.
- the developer used in the development step preferably contains a basic compound.
- Examples of the basic compound include alkali metal hydroxides such as lithium hydroxide, sodium hydroxide and potassium hydroxide; alkali metal carbonates such as sodium carbonate and potassium carbonate; alkalis such as sodium bicarbonate and potassium bicarbonate Metal bicarbonates; ammonium hydroxides such as tetramethylammonium hydroxide, tetraethylammonium hydroxide and choline hydroxide; aqueous solutions such as sodium silicate and sodium metasilicate can be used.
- An aqueous solution obtained by adding an appropriate amount of a water-soluble organic solvent such as methanol or ethanol or a surfactant to the alkaline aqueous solution can also be used as a developer.
- Preferred examples of the developer include 0.4% aqueous solution, 0.5% aqueous solution, 0.7% aqueous solution and 2.38% aqueous solution of tetraethylammonium hydroxide.
- the pH of the developer is preferably 10.0 to 14.0.
- the development time is preferably 30 to 500 seconds, and the development method may be either a liquid piling method or a dipping method. After development, washing with running water is usually performed for 30 to 300 seconds to form a desired pattern.
- a rinsing step can also be performed after development. In the rinsing step, the developed substrate and the development residue are removed by washing the developed substrate with pure water or the like.
- a known method can be used as the rinsing method. For example, shower rinse and dip rinse can be mentioned.
- the acid-decomposable group is thermally decomposed to generate a carboxyl group or a phenolic hydroxyl group, and then crosslinked with a crosslinkable group, a crosslinking agent or the like.
- a cured film can be formed.
- This heating is performed using a heating device such as a hot plate or an oven at a predetermined temperature, for example, 180 to 250 ° C. for a predetermined time, for example, 5 to 90 minutes on the hot plate, 30 to 120 minutes for the oven. It is preferable to By proceeding with such a crosslinking reaction, it is possible to form a protective film and an interlayer insulating film that are superior in heat resistance, hardness, and the like.
- post-baking can be performed after baking at a relatively low temperature (addition of a middle baking process).
- middle baking it is preferable to post-bake at a high temperature of 200 ° C. or higher after heating at 90 to 150 ° C. for 1 to 60 minutes.
- middle baking and post-baking can be heated in three or more stages. The taper angle of the pattern can be adjusted by devising such middle baking and post baking.
- These heating methods can use well-known heating methods, such as a hotplate, oven, and an infrared heater.
- the entire surface of the patterned substrate was re-exposed with actinic rays (post-exposure), and then post-baked to generate an acid from the photoacid generator present in the unexposed portion, thereby performing a crosslinking step. It can function as a catalyst to promote, and can accelerate the curing reaction of the film.
- the preferred exposure amount in the case of including a post-exposure step preferably 100 ⁇ 3,000mJ / cm 2, particularly preferably 100 ⁇ 500mJ / cm 2.
- the cured film obtained from the composition of the present invention can also be used as a dry etching resist.
- dry etching processes such as ashing, plasma etching, and ozone etching can be performed as the etching process.
- the cured film of the present invention is a cured film obtained by curing the composition of the present invention.
- the cured film of the present invention can be suitably used as an interlayer insulating film.
- the cured film of this invention is a cured film obtained by the formation method of the cured film of this invention.
- an interlayer insulating film having excellent transparency and high transparency even when baked at a high temperature can be obtained. Since the interlayer insulating film using the composition of the present invention has high transparency and excellent cured film properties, it is useful for applications of organic EL display devices and liquid crystal display devices.
- the organic EL display device and the liquid crystal display device reference can be made to paragraphs 0209 to 0210 and FIGS. 1 and 2 of JP2011-209681A, the contents of which are incorporated herein.
- GPC-101 manufactured by Showa Denko KK
- ⁇ Preparation of photosensitive resin composition Dissolve and mix (A) component, (B) component, (C) component, silane coupling agent and surfactant in a solvent until the solid content ratio is 32% so that the solid content ratio shown in the following table is obtained. Then, the mixture was filtered through a polytetrafluoroethylene filter having a diameter of 0.2 ⁇ m to obtain photosensitive resin compositions of various examples and comparative examples.
- ⁇ (A) component> The polymers P-1 to P-11 described above were used.
- ⁇ (B) component> B-1: 4,4 ′-[1- [4- [1- [4-hydroxyphenyl] -1-methylethyl] phenyl] ethylidene] bisphenol (1.0 mol) and 1,2-naphthoquinonediazide-5 -Condensation product with sulfonic acid chloride (3.0 mol)
- B-3 2,3,4,4′-tetrahydroxybenzophenone (1.0 mol) and 1,2-naphthoquinonediazide-5-sulfonic acid ester (2.44) Mole)
- Silane coupling agent D-1 3-Glycidoxypropyltrimethoxysilane (KBM-403, manufactured by Shin-Etsu Chemical Co., Ltd.)
- W-1 Silicone-based surfactant (“SH 8400 FLUID” manufactured by Toray Dow Corning Co., Ltd.)
- W-2 Fluorosurfactant FTX-218 (manufactured by Neos Co., Ltd.)
- 10 cm ⁇ 0.5 mm) is exposed to hexamethyldisilazane (HMDS) vapor for 30 seconds, and each photosensitive resin composition solution is applied using a spin coater so that the dry film thickness becomes 3 ⁇ m.
- HMDS hexamethyldisilazane
- the whole surface was exposed using an ultra-high pressure mercury lamp so that the integrated irradiation amount was 300 mJ / cm 2 (energy intensity: 20 mW / cm 2 , i-line), and then the substrate was heated in an oven at 230 ° C. for 30 minutes. Thus, a cured film was obtained.
- the cured film was cut using a cutter at intervals of 1 mm vertically and horizontally, and a tape peeling test (100 mask loss cut method: conforming to JIS 5600) was performed using a scotch tape. The adhesion between the cured film and the substrate was evaluated from the area of the cured film transferred to the back surface of the tape. The results are shown in the following table.
- ⁇ Hardened film adhesion Ti> After exposing a glass substrate (10 cm ⁇ 10 cm ⁇ 0.5 mm) on which a Ti (titanium) thin film was formed under hexamethyldisilazane (HMDS) vapor for 30 seconds and then spin-coating each photosensitive resin composition And a pre-baking on a hot plate at 90 ° C. for 2 minutes to volatilize the solvent to form a photosensitive resin composition layer having a thickness of 3 ⁇ m.
- HMDS hexamethyldisilazane
- the whole surface was exposed using an ultra-high pressure mercury lamp so that the integrated irradiation amount was 300 mJ / cm 2 (energy intensity: 20 mW / cm 2 , i-line), and then the substrate was heated in an oven at 230 ° C. for 30 minutes. Thus, a cured film was obtained.
- the cured film was cut using a cutter at intervals of 1 mm vertically and horizontally, and a tape peeling test (100 mask loss cut method: conforming to JIS 5600) was performed using a scotch tape. The adhesion between the cured film and the substrate was evaluated from the area of the cured film transferred to the back surface of the tape. The results are shown in the following table.
- SiNx> A glass substrate (10 cm ⁇ 10 cm ⁇ 0.5 mm) on which a SiNx (silicon nitride) thin film was formed was exposed to hexamethyldisilazane (HMDS) vapor for 30 seconds, and then each photosensitive resin composition was spin-coated. Then, the solvent was volatilized by pre-baking on a hot plate at 90 ° C. for 2 minutes to form a photosensitive resin composition layer having a thickness of 3 ⁇ m.
- HMDS hexamethyldisilazane
- the whole surface was exposed using an ultra-high pressure mercury lamp so that the integrated irradiation amount was 300 mJ / cm 2 (energy intensity: 20 mW / cm 2 , i-line), and then the substrate was heated in an oven at 230 ° C. for 30 minutes. Thus, a cured film was obtained.
- the cured film was cut using a cutter at intervals of 1 mm vertically and horizontally, and a tape peeling test (100 mask loss cut method: conforming to JIS 5600) was performed using a scotch tape. The adhesion between the cured film and the substrate was evaluated from the area of the cured film transferred to the back surface of the tape. The results are shown in the following table.
- HMDS hexamethyldisilazane
- each photosensitive resin composition is spin-coated on the substrate, and then pre-baked on a hot plate at 90 ° C./120 seconds to volatilize the solvent.
- a photosensitive resin composition layer having a thickness of 3.0 ⁇ m was formed.
- exposure was performed so that the integrated irradiation amount was 300 mJ / cm 2 (energy intensity: 20 mW / cm 2 , i-line), and this substrate was heated in an oven at 230 ° C./30 minutes, Furthermore, it heated at 230 degreeC / 2 hours in oven.
- the film thickness (T1) of the obtained cured film was measured. And after immersing the board
- the results are shown in the table below. A smaller value is preferable, and A and B are at a level causing no problem in practical use. A: Less than 2% B: 2% or more and less than 3% C: 3% or more and less than 4% D: 4% or more and less than 6% E: 6% or more
- the film thickness (T1) of the obtained cured film was measured. And after immersing the board
- the results are shown in the table below. A smaller value is preferable, and A and B are at a level causing no problem in practical use. A: Less than 2% B: 2% or more and less than 3% C: 3% or more and less than 4% D: 4% or more and less than 6% E: 6% or more
- the composition of the present invention comprises (A) (a1) a repeating unit having an acid group, (a2) a polymer containing a repeating unit having a crosslinkable group, (B) a quinonediazide compound, and (C)
- A (a1) a repeating unit having an acid group
- a2 a polymer containing a repeating unit having a crosslinkable group
- B a quinonediazide compound
- C In one molecule, since it contains a compound having a structure containing a coordination atom and a thiourea structure, it has excellent adhesion to various substrates in the state of development and as a cured film, The resist stripping solution and NMP were also excellent in resistance (chemical resistance).
- Comparative Example 1 since the component (C) was not used, the adhesion of the cured film to various substrates, the adhesion to various substrates during development, and the chemical resistance were inferior to those of the Examples.
- Comparative Example 2 a compound different from the compound (C-1) only in that S was replaced with O was used. However, the adhesion of the cured film to various substrates and the adhesion to various substrates during development were different from those of the compound (C-1). It was significantly inferior to Example 12 using (C-1). In Comparative Example 3, a compound different from the compound (C-1) only in that NH was replaced with O was used.
- Comparative Example 5 a compound different from the compound (C-1) only in that R 1 was replaced from a morpholino group to an aryl group was used, but the adhesion of the cured film to various substrates and the adhesion to various substrates at the time of development were used. The properties and chemical resistance were greatly inferior to those of Example 12 using the compound (C-1).
- Comparative Example 6 a compound having a thiouracil structure was used as the component (C). However, since the compound does not contain a structure containing a coordination atom, the adhesion of the cured film to various substrates, during development The adhesion to various substrates and chemical resistance were greatly inferior.
- Comparative Example 7 the polymer containing the repeating unit (a2) having a crosslinkable group was not used as the component (A), and the adhesion and chemical resistance of the cured film to various substrates were greatly inferior.
- Comparative Example 8 as the component (A), a polymer containing (a1) a repeating unit having an acid group and (a2) a repeating unit having a crosslinkable group was not used, and a phenol resin (novolak resin) was used. Since it was used, the adhesion of the cured film to various substrates and the chemical resistance were greatly inferior.
- the photosensitive resin composition of Comparative Example 8 uses a polymer that does not contain a crosslinkable group, that is, a phenol resin, it is crosslinked as in the photosensitive resin composition of the examples. Since the functional group and the component (C) do not interact, for example, when the developer (TMAH) touches a substrate such as Mo, Ti, or SiNx, the surface of the substrate is modified and partially dissolved. As a result of the penetration of the developer into the interface between the substrate and the cured film, the adhesion to the substrate in the state when developing the photosensitive resin composition and when the photosensitive resin composition is a cured film is reduced.
- TMAH developer
- An organic EL display device using a TFT was manufactured by the following method (for example, refer to FIG. 1 of JP 2011-209681 A).
- a bottom gate type TFT 1 was formed on a glass substrate 6, and an insulating film 3 made of Si 3 N 4 was formed so as to cover the TFT 1.
- a contact hole (not shown) is formed in the insulating film 3, and then a wiring 2 (height 1.0 ⁇ m) connected to the TFT 1 through the contact hole is formed on the insulating film 3. .
- the wiring 2 is used to connect the TFT 1 to the organic EL element formed between the TFTs 1 or in a later process.
- the flattening layer 4 was formed on the insulating film 3 in a state where the unevenness due to the wiring 2 was embedded.
- the planarizing film 4 is formed on the insulating film 3 by spin-coating the photosensitive resin composition of Example 8 on a substrate, pre-baking on a hot plate (90 ° C. ⁇ 2 minutes), and then applying high pressure from above the mask. After irradiating i-line with 100 mJ / cm 2 using a mercury lamp, a pattern was formed by developing with an alkaline aqueous solution, and heat treatment was performed at 220 ° C. for 60 minutes.
- the applicability when applying the photosensitive resin composition was good, and no wrinkles or cracks were observed in the cured film obtained after exposure, development and baking. Furthermore, the average level difference of the wiring 2 was 500 nm, and the thickness of the prepared planarizing film was 2000 nm.
- a bottom emission type organic EL element was formed on the obtained flattening film 4.
- a first electrode 5 made of ITO was formed on the planarizing film 4 so as to be connected to the wiring 2 through the contact hole 7.
- a resist was applied, prebaked, exposed through a mask having a desired pattern, and developed.
- pattern processing was performed by wet etching using an ITO etchant.
- the resist pattern was stripped using a resist stripping solution (mixed solution of monoethanolamine and DMSO).
- the first electrode thus obtained corresponds to the anode of the organic EL element.
- an insulating layer 8 having a shape covering the periphery of the first electrode was formed.
- the photosensitive resin composition of Example 1 was used, and the insulating film 8 was formed by the same method as described above. By providing this insulating layer, it is possible to prevent a short circuit between the first electrode and the second electrode formed in the subsequent process.
- a hole transport layer, an organic light emitting layer, and an electron transport layer were sequentially deposited through a desired pattern mask in a vacuum deposition apparatus.
- a second electrode made of Al was formed on the entire surface above the substrate.
- substrate was taken out from the vapor deposition machine, and it sealed by bonding together using the glass plate for sealing, and an ultraviolet curable epoxy resin.
- a liquid crystal display device is manufactured according to a conventional method using the photosensitive resin composition of Example 1 of the present invention as the interlayer insulating film 17. did.
- liquid crystal display device When a driving voltage was applied to the obtained liquid crystal display device, it was found that the liquid crystal display device showed good display characteristics and high reliability.
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Abstract
Description
さらに詳しくは、液晶表示装置、有機EL表示装置、集積回路素子、固体撮像素子などの電子部品の平坦化膜、保護膜や層間絶縁膜の形成に好適な、感光性樹脂組成物およびそれを用いた硬化膜の製造方法に関する。
特に、配線基板は、基板自体が複数種類の材料からなるため、その表面に形成される層間絶縁膜材料も、複数種類の基板に対する密着性が設けられるようになっている。
また、前記層間絶縁膜は、層間絶縁膜形成後の透明電極膜のパターン形成に使用されるレジストの剥離液や、液晶配向膜形成時に使用されるNMP(N-メチルピロリドン)に曝されることとなるため、これらの層間絶縁膜に用いられる一般的な薬品に対する十分な耐性が必要となる。
ここで、本願発明者が従来技術について鋭意検討を行ったところ、例えば特許文献3には、感光性組成物中に1-シクロヘキシル-3-(2-モルホリノエチル)-2-チオウレアを配合することにより、塩酸系のエッチャントによるエッチングにおける密着性が改良されることが開示されているが、現像時および硬化膜としたときの状態での各種基板に対する密着性を両立させることは困難であることが分かった。また、特許文献3に開示された感光性組成物は、剥離液やNMPなどの薬品に対する耐性(耐薬品性)が高くないことから、液晶表示装置における表示不具合が起こりやすく、改善が求められていた。
具体的には、以下の解決手段<1>により、好ましくは、<2>~<17>により、上記課題は解決された。
<1>(A)(a1)酸基を有する繰り返し単位と、(a2)架橋性基を有する繰り返し単位を含む重合体、
(B)キノンジアジド化合物、および
(C)1分子内に、配位原子を含む構造とチオウレア構造とを有する化合物
を含有する感光性樹脂組成物。
<2>前記(C)成分が、前記配位原子として窒素原子を少なくとも1つ以上含む化合物である、<1>に記載の感光性樹脂組成物。
<3>前記(C)成分が、下記一般式(S)で表される化合物である、<1>または<2>に記載の感光性樹脂組成物。
一般式(S)
<4>前記一般式(S)中、R1が、-NR3R4(R3およびR4は、それぞれ、有機基であり、互いに結合して環を形成していてもよい)で表される基である、<3>に記載の感光性樹脂組成物。
<5>前記一般式(S)中、R1が、5員環または6員環の環状基である、<3>または<4>に記載の感光性樹脂組成物。
<6>前記一般式(S)中、R1が、モルホリノ基である、<3>~<5>のいずれかに記載の感光性樹脂組成物。
<7>前記一般式(S)中、R2の末端に炭化水素基を有する、<3>~<6>のいずれかに記載の感光性樹脂組成物。
<8>前記構成単位(a1)が、カルボキシル基および/またはフェノール性水酸基を有する繰り返し単位である、<1>~<7>のいずれかに記載の感光性樹脂組成物。
<9>前記構成単位(a2)が、エポキシ基、オキセタニル基および-NH-CH2-O-R(Rは水素原子または炭素数1~20のアルキル基)で表される基よりなる群から選ばれた少なくとも1つを含む構成単位を含有する、<1>~<8>のいずれかに記載の感光性樹脂組成物。
<10>前記感光性樹脂組成物中の前記成分(B)の配合量が、前記感光性樹脂組成物中の全固形分に対し10質量%を超え40質量%以下である、<1>~<9>のいずれかに記載の感光性樹脂組成物。
<11>前記感光性樹脂組成物が、ポジ型感光性樹脂組成物である、<1>~<10>のいずれかに記載の感光性樹脂組成物。
<12>(1)<1>~<11>のいずれかに記載の感光性樹脂組成物を基板上に塗布する工程、
(2)塗布された感光性樹脂組成物から溶剤を除去する工程、
(3)溶剤が除去された感光性樹脂組成物を活性光線により露光する工程、
(4)露光された感光性樹脂組成物を水性現像液により現像する工程、および、
(5)現像された感光性樹脂組成物を熱硬化するポストベーク工程、
を含む硬化膜の製造方法。
<13>前記現像工程後、前記ポストベーク工程前に、(6)現像された感光性樹脂組成物を全面露光する工程を含む、<12>に記載の硬化膜の製造方法。
<14>前記ポストベーク工程で熱硬化して得られた硬化膜を有する基板に対し、ドライエッチングを行う工程を含む、<12>または<13>に記載の硬化膜の製造方法。
<15><12>~<14>のいずれかに記載の硬化膜の製造方法により形成された硬化膜。
<16>層間絶縁膜である、<15>に記載の硬化膜。
<17><15>または<16>に記載の硬化膜を有する有機EL表示装置または液晶表示装置。
本発明の組成物は、(A)(a1)酸基を有する繰り返し単位と、(a2)架橋性基を有する繰り返し単位を含む重合体、(B)キノンジアジド化合物、および(C)1分子内に、配位原子を含む構造とチオウレア構造とを有する化合物(以下、(C)成分ともいう。)を含有する。
本願発明者は、感光性樹脂組成物中に、(a1)酸基を有する繰り返し単位と(a2)架橋性基を有する繰り返し単位を含む(A)重合体および(C)成分を含有させることにより、感光性樹脂組成物の現像時および感光性樹脂組成物を硬化膜としたときの状態での各種基板に対する密着性が向上するとともに、感光性樹脂組成物を層間絶縁膜用途に用いた場合の耐薬品性も向上することを見出した。
このメカニズムは定かではないが、前記(A)重合体に(a2)架橋性基を有する繰り返し単位を導入することにより、架橋性基と前記(C)成分が相互作用して、(C)成分がより基板に吸着するようになる結果、感光性樹脂組成物の現像時および感光性樹脂組成物を硬化膜としたときの状態での各種基板に対する密着性が向上すると推定される。また、このメカニズムも定かではないが、前記(A)重合体に(a2)架橋性基を有する繰り返し単位を導入することによる、感光性樹脂組成物を硬化膜としたときの架橋密度の向上に加えて、前記(C)成分に含まれる配位原子を含む構造が硬化膜の架橋反応を促進する結果、感光性樹脂組成物を層間絶縁膜用途に用いた場合の耐薬品性が向上すると推定される。したがって、感光性樹脂組成物中に前記(C)成分を含有させた場合には、感光性樹脂組成物中に前記(C)成分を含有させない場合と比較して、耐薬品性が向上すると推定される。本発明の組成物は、ポジ型感光性樹脂組成物に好ましく適用することができる。
本発明で用いる(A)(a1)酸基を有する繰り返し単位と、(a2)架橋性基を有する繰り返し単位を含む重合体において、(a1)酸基を有する繰り返し単位は、カルボキシル基および/またはフェノール性水酸基を有する繰り返し単位であることが好ましい。また、(a2)架橋性基を有する繰り返し単位は、エポキシ基、オキセタニル基、-NH-CH2-O-R(Rは水素原子または炭素数1~20のアルキル基)で表される基よりなる群から選ばれた少なくとも1つを含む構成単位を含有することが好ましい。
(A)重合体は、本発明の組成物の溶剤を除く成分の主成分となるものであり、全固形分の60質量%以上を占めることが好ましい。
(a1-1)化合物としては、不飽和モノカルボン酸、不飽和ジカルボン酸、不飽和ジカルボン酸の無水物、多価カルボン酸のモノ〔(メタ)アクリロイルオキシアルキル〕エステル、両末端にカルボキシル基と水酸基とを有するポリマーのモノ(メタ)アクリレート、カルボキシル基を有する不飽和多環式化合物及びその無水物等が挙げられる。
不飽和ジカルボン酸としては、例えばマレイン酸、フマル酸、シトラコン酸、メサコン酸、イタコン酸等;不飽和ジカルボン酸の無水物としては、例えば上記ジカルボン酸として例示した化合物の無水物等;多価カルボン酸のモノ〔(メタ)アクリロイルオキシアルキル〕エステルとしては、例えばコハク酸モノ〔2-(メタ)アクリロイルオキシエチル〕、フタル酸モノ〔2-(メタ)アクリロイルオキシエチル〕等;両末端にカルボキシル基と水酸基とを有するポリマーのモノ(メタ)アクリレートとしては、例えばω-カルボキシポリカプロラクトンモノ(メタ)アクリレート等;カルボキシル基を有する不飽和多環式化合物及びその無水物としては、例えば5-カルボキシビシクロ[2.2.1]ヘプト-2-エン、5,6-ジカルボキシビシクロ[2.2.1]ヘプト-2-エン、5-カルボキシ-5-メチルビシクロ[2.2.1]ヘプト-2-エン、5-カルボキシ-5-エチルビシクロ[2.2.1]ヘプト-2-エン、5-カルボキシ-6-メチルビシクロ[2.2.1]ヘプト-2-エン、5-カルボキシ-6-エチルビシクロ[2.2.1]ヘプト-2-エン、5,6-ジカルボキシビシクロ[2.2.1]ヘプト-2-エン無水物等が挙げられる。
(a1-2)化合物としては、水酸基を有する(メタ)アクリル酸エステル、下記式(3)で表されるフェノール性水酸基含有不飽和化合物等が挙げられる。
(a2)化合物における架橋性基は、加熱処理で硬化反応を起こす基であれば特に限定はされない。好ましい架橋性基を有する構成単位の態様としては、エポキシ基、オキセタニル基、-NH-CH2-O-R(Rは水素原子または炭素数1~20のアルキル基)で表される基およびエチレン性不飽和基よりなる群から選ばれた少なくとも1つを含む構成単位が挙げられ、エポキシ基、オキセタニル基、および、-NH-CH2-O-R(Rは水素原子または炭素数1~20のアルキル基)で表される基、エチレン性不飽和基よりなる群から選ばれた少なくとも1種であることが好ましい。その中でも、本発明に用いられる組成物は、前記(A)成分が、エポキシ基およびオキセタニル基のうち少なくとも1つを含む構成単位を含むことが好ましい。
エポキシ基を有する不飽和化合物としては、例えば、アクリル酸グリシジル、メタクリル酸グリシジル、α-エチルアクリル酸グリシジル、α-n-プロピルアクリル酸グリシジル、α-n-ブチルアクリル酸グリシジル、アクリル酸-3,4-エポキシブチル、メタクリル酸-3,4-エポキシブチル、アクリル酸-3,4-エポキシシクロヘキシルメチル、メタクリル酸-3,4-エポキシシクロヘキシルメチル、α-エチルアクリル酸-3,4-エポキシシクロヘキシルメチル、o-ビニルベンジルグリシジルエーテル、m-ビニルベンジルグリシジルエーテル、p-ビニルベンジルグリシジルエーテル、特許第4168443号公報の段落番号0031~0035に記載の脂環式エポキシ骨格を含有する化合物などが挙げられ、これらの内容は本願明細書に組み込まれる。
オキシラニル基を有する不飽和化合物としては、例えばアクリル酸グリシジル、メタクリル酸グリシジル、メタクリル酸2-メチルグリシジル、α-エチルアクリル酸グリシジル、α-n-プロピルアクリル酸グリシジル、α-n-ブチルアクリル酸グリシジル、アクリル酸3,4-エポキシブチル、メタクリル酸3,4-エポキシブチル、アクリル酸6,7-エポキシヘプチル、メタクリル酸6,7-エポキシヘプチル、α-エチルアクリル酸-6,7-エポキシヘプチル、o-ビニルベンジルグリシジルエーテル、m-ビニルベンジルグリシジルエーテル、p-ビニルベンジルグリシジルエーテル、メタクリル酸3,4-エポキシシクロへキシルメチル等が挙げられる。これらのうち、メタクリル酸グリシジル、メタクリル酸2-メチルグリシジル、メタクリル酸-6,7-エポキシヘプチル、o-ビニルベンジルグリシジルエーテル、m-ビニルベンジルグリシジルエーテル、p-ビニルベンジルグリシジルエーテル、メタクリル酸3,4-エポキシシクロヘキシルが、共重合反応性及び硬化膜の耐溶媒性等の向上の観点から好ましい。
また、前記オキセタニル基を有する不飽和化合物の他にも、オキセタニル基を有する構成単位を形成するために用いられるラジカル重合性単量体の具体例としては、例えば、特開2001-330953号公報の段落番号0011~0016に記載のオキセタニル基を有する(メタ)アクリル酸エステルなどが挙げられ、これらの内容は本願明細書に組み込まれる。
一般式(a2-3)
R2は、炭素数1~9のアルキル基が好ましく、炭素数1~4のアルキル基がさらに好ましい。また、アルキル基は、直鎖、分岐または環状のアルキル基のいずれであってもよいが、好ましくは、直鎖または分岐のアルキル基である。
R2の具体例としては、メチル基、エチル基、n-ブチル基、i-ブチル基、シクロヘキシル基、およびn-ヘキシル基を挙げることができる。中でもi-ブチル基、n-ブチル基、メチル基が好ましい。
[(a3)化合物]
(a3)化合物は、上記の(a1)化合物及び(a2)化合物以外の不飽和化合物であれば特に制限されるものではない。(a3)化合物としては、例えばメタクリル酸鎖状アルキルエステル、メタクリル酸環状アルキルエステル、アクリル酸鎖状アルキルエステル、アクリル酸環状アルキルエステル、メタクリル酸アリールエステル、アクリル酸アリールエステル、不飽和ジカルボン酸ジエステル、ビシクロ不飽和化合物、マレイミド化合物、不飽和芳香族化合物、共役ジエン、テトラヒドロフラン骨格、フラン骨格、テトラヒドロピラン骨格、ピラン骨格、下記式(4)で表される骨格を含む不飽和化合物及びその他の不飽和化合物等が挙げられる。
分子量調整剤の使用割合としては(A)重合体中で、0.5~10質量%が好ましく、1~5質量%がより好ましい。
本発明に用いられる(A)重合体は、特に、前記(a1)酸基を有する繰り返し単位と、前記(a2)架橋性基を有する繰り返し単位を含むアクリル重合体であることが好ましい。
(A)重合体の合成は、特開2012-88549号公報の段落番号0067~0073の記載を参酌でき、かかる内容は本願明細書に組み込まれる。
本発明の組成物に用いられる(B)キノンジアジド化合物としては、放射線の照射によりカルボン酸を発生する1,2-キノンジアジド化合物を用いることができる。1,2-キノンジアジド化合物としては、フェノール性化合物又はアルコール性化合物(以下、「母核」と称する)と1,2-ナフトキノンジアジドスルホン酸ハライドとの縮合物を用いることができる。
テトラヒドロキシベンゾフェノンとしては、例えば2,2',4,4'-テトラヒドロキシベンゾフェノン、2,3,4,3'-テトラヒドロキシベンゾフェノン、2,3,4,4'-テトラヒドロキシベンゾフェノン、2,3,4,2'-テトラヒドロキシ-4'-メチルベンゾフェノン、2,3,4,4'-テトラヒドロキシ-3'-メトキシベンゾフェノン等が挙げられる。
ペンタヒドロキシベンゾフェノンとしては、例えば2,3,4,2',6'-ペンタヒドロキシベンゾフェノン等が挙げられる。
ヘキサヒドロキシベンゾフェノンとしては、例えば2,4,6,3',4',5'-ヘキサヒドロキシベンゾフェノン、3,4,5,3',4',5'-ヘキサヒドロキシベンゾフェノン等が挙げられる。
(ポリヒドロキシフェニル)アルカンとしては、例えばビス(2,4-ジヒドロキシフェニル)メタン、ビス(p-ヒドロキシフェニル)メタン、トリス(p-ヒドロキシフェニル)メタン、1,1,1-トリス(p-ヒドロキシフェニル)エタン、ビス(2,3,4-トリヒドロキシフェニル)メタン、2,2-ビス(2,3,4-トリヒドロキシフェニル)プロパン、1,1,3-トリス(2,5-ジメチル-4-ヒドロキシフェニル)-3-フェニルプロパン、4,4'-〔1-〔4-〔1-〔4-ヒドロキシフェニル〕-1-メチルエチル〕フェニル〕エチリデン〕ビスフェノール、ビス(2,5-ジメチル-4-ヒドロキシフェニル)-2-ヒドロキシフェニルメタン、3,3,3',3'-テトラメチル-1,1'-スピロビインデン-5,6,7,5',6',7'-ヘキサノール、2,2,4-トリメチル-7,2',4'-トリヒドロキシフラバン等が挙げられる。
その他の母核としては、例えば2-メチル-2-(2,4-ジヒドロキシフェニル)-4-(4-ヒドロキシフェニル)-7-ヒドロキシクロマン、1-[1-(3-{1-(4-ヒドロキシフェニル)-1-メチルエチル}-4,6-ジヒドロキシフェニル)-1-メチルエチル]-3-(1-(3-{1-(4-ヒドロキシフェニル)-1-メチルエチル}-4,6-ジヒドロキシフェニル)-1-メチルエチル)ベンゼン、4,6-ビス{1-(4-ヒドロキシフェニル)-1-メチルエチル}-1,3-ジヒドロキシベンゼン等が挙げられる。
本発明の組成物は、1分子内に、配位原子を含む構造とチオウレア構造とを有する化合物を含む。このような(C)成分に含まれる塩基性部位(例えば配位原子を含む構造)が硬化膜の架橋反応を促進すると推定される。
ここで配位原子とは、例えば、本発明の組成物が塗布される下地基板を構成する無機物、例えば、シリコン、酸化シリコン、窒化シリコン等のシリコン化合物、金、銅、モリブデン、チタン、アルミニウム等の金属と配位結合を形成できる原子が好ましい。具体的には、窒素原子、酸素原子、硫黄原子、リン原子がより好ましく、窒素原子または酸素原子が特に好ましい。
また、配位原子を含む構造は、窒素原子を少なくとも1つ以上含む構造が好ましく、窒素原子を1~3つ含む構造がより好ましい。
配位原子を含む構造の具体例としては、例えば、モルホリノ基、ヒドラジノ基、ピリジル基、イミダゾリル基、キノリル基、ピペリジル基、ピロリジニル基、ピラゾニル基、オキサゾリル基、チアゾリル基、ベンゾオキサゾリル基、ベンズイミダゾリル基、ベンズチアゾリル基、ピラジニル基、ジエチルアミノ基などが挙げられる。中でも、モルホリノ基、ピペリジル基、イミダゾリル基、ジエチルアミノ基が好ましく、モルホリノ基、ピペリジル基、イミダゾリル基がより好ましく、モルホリノ基がさらに好ましい。
このような(C)成分を用いることにより、本発明の組成物と下地基板との相互作用を強化させることができ、現像時および硬化膜としたときの状態での各種基板に対する密着性が向上すると考えられる。
さらに、ポストベーク工程において、本発明の組成物に含まれる重合体の酸基と架橋基の反応を促進させることにより、より架橋密度が高い硬化膜が形成するため、層間絶縁膜の用途で使用される薬品、具体的には、層間絶縁膜が曝される薬品、特に、層間絶縁膜形成後の透明電極膜のパターン形成に使用されるレジストの剥離液や、液晶配向膜形成時に使用されるNMPに対する耐性を向上させることができると考えられる。
一般式(S)
R1は、1~10の炭素原子と、窒素原子および/または酸素原子を含む1~3つのヘテロ原子を含むことが好ましい。この場合のヘテロ原子としては、窒素原子、酸素原子、硫黄原子が挙げられ、窒素原子、酸素原子が好ましい。R1は環状基であることが好ましく、5員環または6員環の環状基であることがより好ましい。
R3およびR4は、それぞれ、有機基を表す。有機基としては、アルキル基、アルケニル基、または、これらと、-O-、-S-および-N-の少なくとも1つの組み合わせからなる基が好ましい。R3およびR4は、それぞれ、炭素数1~3の基であることが好ましい。R3およびR4は、互いに結合して、環を形成していてもよく、環を形成していることが好ましく、特に、R3とR4が互いに結合して5員環または6員環を形成していることが好ましい。
(1)R1が-NR3R4で表される基であり、R3とR4が互いに結合して環を形成している態様、または、R3とR4が、ぞれぞれ、直鎖、分岐または環状の脂肪族炭化水素基である態様。
(2)R1が-NR3R4で表される基であり、R3とR4が互いに結合して5員環または6員環を形成している態様、または、R3とR4が、ぞれぞれ、炭素数1~4の直鎖または分岐の脂肪族炭化水素基である態様。
(3)R1が-NR3R4で表される基であり、R3とR4が互いに結合して2つ以上のヘテロ原子(少なくとも1つは窒素原子であり、残りは酸素原子または窒素原子が好ましい)を含む、5員環または6員環を形成している態様、または、R3とR4が、ぞれぞれ、炭素数1~4の直鎖の脂肪族炭化水素基である態様。
また、R2は、末端に炭化水素基を有することが好ましい。R2が末端に炭化水素基を有することにより、疎水性がより向上し、本発明の効果がより効果的に発揮される。
具体的に、R2は、炭素数1~20のアルキル基または炭素数6~12のアリール基、または、これらと-O-および-C(=O)-の少なくとも1つの組み合わせからなる基がさらに好ましい。これらの基は置換基を有していてもよく、置換基としてはハロゲン原子が例示される。
R2がアルキル基である場合、炭素数1~8の直鎖または分岐のアルキル基、または、環状アルキル基が好ましい。R2が環状アルキル基である場合、5員環または6員環の環状アルキル基が好ましい。
R2がアリール基である場合、フェニル基およびナフチル基が例示され、フェニル基がより好ましい。
(1)炭素数1~4(好ましくは2または3)の直鎖のアルキレン基である態様。
(2)5員環または6員環の環状アルキル基である態様
(3)炭素数1~10(好ましくは2~4)の脂肪族炭化水素基と、-O-および-C(=O)-の組み合わせからなる基である態様であって、末端が炭化水素基である態様
アルキレン基としては、例えば、メチレン基、エチレン基、プロピレン基、シクロへキシレン基、シクロペンチレン基等が例示される。アリーレン基としては、例えば、1,2-フェニレン基、1,3-フェニレン基、1,4-フェニレン基、ナフチレン基等が例示される。本発明では特に、メチレン基、エチレン基、プロピレン基が好ましく、エチレン基またはプロピレン基がより好ましい。
(1)炭素数1~4の直鎖または分岐のアルキル基、5員環または6員環の環状アルキル基、または、フェニル基である態様。
一般式(S1)
R2は、前記式(S)におけるR2と同義であり、好ましい範囲も同様である。
Aは、前記式(S)におけるAと同義であり、好ましい範囲も同様である。
特に、一般式(S1)において、以下の態様が好ましい。
(1)Aは炭素数1~4の直鎖のアルキレン基であり、R2は、直鎖、分岐、または環状のアルキル基である態様。
(2)Aは炭素数2または3のアルキレン基であり、R2は、炭素数2~6の直鎖、分岐、または環状のアルキル基である態様。
本発明の組成物は、全固形分100質量部に対し、(C)成分を0.001~10質量部の割合で含むことが好ましく、0.003~7.5質量部の割合で含むことがより好まく、0.005~5質量部の割合で含むことがさらに好ましい。(C)成分は1種類のみでもよいし、2種類以上であってもよい。2種類以上の場合は、その合計が上記範囲であることが好ましい。
本発明の組成物は、前記(A)重合体、(B)キノンジアジド化合物、(C)成分に加え、本発明の効果を損なわない範囲で必要に応じて、シランカップリング剤、界面活性剤、接着助剤、耐熱性向上剤、感熱性酸発生剤等の任意成分を含有できる。これらの任意成分は、単独で使用してもよいし2種以上を混合して使用してもよい。これらの化合物の詳細は、特開2012-88459号公報の段落番号0201~0224の記載を参酌でき、これらの内容は本願明細書に組み込まれる。
本発明の組成物に用いられるシランカップリング剤としては、アルコキシシラン化合物を含有していることが好ましい。アルコキシシラン化合物を用いると、本発明に用いられる組成物により形成された膜と基板との密着性をより向上できたり、本発明に用いられる組成物により形成された膜の性質を調整することができる。本発明の組成物に用いることができるアルコキシシラン化合物は、基材となる無機物、例えば、シリコン、酸化シリコン、窒化シリコン等のシリコン化合物、金、銅、モリブデン、チタン、アルミニウム等の金属と絶縁膜との密着性を向上させる化合物であることが好ましい。具体的には、公知のシランカップリング剤等も有効である。
シランカップリング剤としては、例えば、γ-アミノプロピルトリメトキシシラン、γ-アミノプロピルトリエトキシシラン、γ-グリシドキシプロピルトリアルコキシシラン、γ-グリシドキシプロピルアルキルジアルコキシシラン、γ-メタクリロキシプロピルトリアルコキシシラン、γ-メタクリロキシプロピルアルキルジアルコキシシラン、γ-クロロプロピルトリアルコキシシラン、γ-メルカプトプロピルトリアルコキシシラン、β-(3,4-エポキシシクロヘキシル)エチルトリアルコキシシラン、ビニルトリアルコキシシランが挙げられる。これらのうち、γ-グリシドキシプロピルトリアルコキシシランやγ-メタクリロキシプロピルトリアルコキシシランがより好ましく、γ-グリシドキシプロピルトリアルコキシシランがさらに好ましく、3-グリシドキシプロピルトリメトキシシランがよりさらに好ましい。これらは1種単独または2種以上を組み合わせて使用することができる。
(R1)4-n-Si-(OR2)n
一般式中、R1は反応性基を有さない炭素数1~20の炭化水素基であり、R2は炭素数1~3のアルキル基又はフェニル基であり、nは1~3の整数である。
具体例として以下の化合物をあげることができる。
本発明の組成物に用いられる界面活性剤としては、特に限定されず、例えば、特開2012-88459号公報の段落番号0201~0205に記載されたものを用いることができる。界面活性剤は、1種のみを用いてもよく、2種以上を併用するようにしてもよいが、2種以上を併用することが好ましい。
本発明の組成物における界面活性剤の含有量は、感光性組成物中の全固形分100質量部に対して、0.01~1質量部が好ましく、0.05~0.5質量部がより好ましい。
本発明の組成物は、さらに溶剤を含有していてもよい。本発明に用いられる溶剤としては、必須成分及び任意成分を均一に溶解し、各成分と反応しないものが用いられる。
メチルエチルケトン、シクロヘキサノン、2-ヘプタノン、3-ヘプタノン、ジアセトンアルコール(4-ヒドロキシ-4-メチルペンタン-2-オン)、4-ヒドロキシ-4-メチルヘキサン-2-オン等のケトン類;
プロピレングリコールジアセテート、1,3-ブチレングリコールジアセテート、1,6-ヘキサンジオールジアセテート等のジアセテート類;
乳酸メチル、乳酸エチル等の乳酸アルキルエステル類;
酢酸エチル、酢酸n-プロピル、酢酸i-プロピル、酢酸n-ブチル、酢酸i-ブチル、ぎ酸n-ペンチル、酢酸i-ペンチル、プロピオン酸n-ブチル、3-メチル-3-メトキシブチルプロピオネート、酪酸エチル、酪酸n-プロピル、酪酸i-プロピル、酪酸n-ブチル、ヒドロキシ酢酸エチル、エトキシ酢酸エチル、3-メトキシプロピオン酸メチル、3-メトキシプロピオン酸エチル、3-エトキシプロピオン酸メチル、3-エトキシプロピオン酸エチル、ピルビン酸メチル、ピルビン酸エチル、ピルビン酸n-プロピル、アセト酢酸メチル、アセト酢酸エチル、2-ヒドロキシ-2-メチルプロピオン酸エチル、2-ヒドロキシ-3-メチル酪酸メチル、2-オキソ酪酸エチル等の他のエステル類;
トルエン、キシレン等の芳香族炭化水素類;
N-メチルピロリドン、N,N-ジメチルホルムアミド、N,N-ジメチルアセトアミド等のアミド類等が挙げられる。
本発明の組成物は、各成分を所定の割合でかつ任意の方法で混合し、撹拌溶解することによって調製することができる。例えば、各成分を、それぞれ予め上述した溶剤に溶解させた溶液とした後、これらを所定の割合で混合して樹脂組成物を調製することもできる。以上のように調製した組成物溶液は、例えば孔径0.2μmのフィルター等を用いてろ過した後に、使用に供することもできる。
次に、本発明の硬化膜の製造方法を説明する。
本発明の硬化膜の製造方法は、以下の(1)~(5)の工程を含むことが好ましい。
(1)本発明の組成物を基板上に塗布する工程;
(2)塗布された感光性樹脂組成物から溶剤を除去する工程;
(3)溶剤が除去された感光性樹脂組成物を活性光線により露光する工程;
(4)露光された感光性樹脂組成物を水性現像液により現像する工程;
(5)現像された感光性樹脂組成物を熱硬化するポストベーク工程。
以下に各工程を順に説明する。
上記の基板としては、無機基板、樹脂、樹脂複合材料などが挙げられる。
無機基板としては、例えばガラス、石英、シリコーン、シリコンナイトライド、および、それらのような基板上にモリブデン、チタン、アルミ、銅などを蒸着した複合基板が挙げられる。
樹脂としては、ポリブチレンテレフタレート、ポリエチレンテレフタレート、ポリエチレンナフタレート、ポリブチレンナフタレート、ポリスチレン、ポリカーボネート、ポリスルホン、ポリエーテルスルホン、ポリアリレート、アリルジグリコールカーボネート、ポリアミド、ポリイミド、ポリアミドイミド、ポリエーテルイミド、ポリベンズアゾール、ポリフェニレンサルファイド、ポリシクロオレフィン、ノルボルネン樹脂、ポリクロロトリフルオロエチレン等のフッ素樹脂、液晶ポリマー、アクリル樹脂、エポキシ樹脂、シリコーン樹脂、アイオノマー樹脂、シアネート樹脂、架橋フマル酸ジエステル、環状ポリオレフィン、芳香族エーテル、マレイミドーオレフィン、セルロース、エピスルフィド化合物等の合成樹脂からなる基板が挙げられる。
これらの基板は、上記の形態のまま用いられる場合は少なく、通常、最終製品の形態によって、例えばTFT素子のような多層積層構造が形成されている。
基板への塗布方法は特に限定されず、例えば、スリットコート法、スプレー法、ロールコート法、回転塗布法、流延塗布法、スリットアンドスピン法等の方法を用いることができる。さらに、特開2009-145395号公報に記載されているような、所謂プリウェット法を適用することも可能である。
塗布したときのウエット膜厚は特に限定されるものではなく、用途に応じた膜厚で塗布することができるが、通常は0.5~10μmの範囲で使用される。
活性光線による露光光源としては、低圧水銀灯、高圧水銀灯、超高圧水銀灯、ケミカルランプ、LED光源、エキシマレーザー発生装置などを用いることができ、g線(436nm)、i線(365nm)、h線(405nm)などの波長300nm以上450nm以下の波長を有する活性光線が好ましく使用できる。また、必要に応じて長波長カットフィルター、短波長カットフィルター、バンドパスフィルターのような分光フィルターを通して照射光を調整することもできる。露光量は好ましくは1~500mj/cm2である。
露光装置としては、ミラープロジェクションアライナー、ステッパー、スキャナー、プロキシミティ、コンタクト、マイクロレンズアレイ、レーザー露光、など各種方式の露光機を用いることができる。
酸触媒の生成した領域において、上記の加水分解反応を加速させるために、露光後加熱処理:Post Exposure Bake(以下、「PEB」ともいう。)を行うことができる。PEBにより、酸分解性基からのカルボキシル基またはフェノール性水酸基の生成を促進させることができる。PEBを行う場合の温度は、30℃以上130℃以下であることが好ましく、40℃以上110℃以下がより好ましく、50℃以上100℃以下が特に好ましい。
ただし、本発明における酸分解性基は、酸分解の活性化エネルギーが低く、露光による酸発生剤由来の酸により容易に分解し、カルボキシル基またはフェノール性水酸基を生じるため、必ずしもPEBを行うことなく、現像によりポジ画像を形成することもできる。
現像工程で使用する現像液には、塩基性化合物が含まれることが好ましい。塩基性化合物としては、例えば、水酸化リチウム、水酸化ナトリウム、水酸化カリウムなどのアルカリ金属水酸化物類;炭酸ナトリウム、炭酸カリウムなどのアルカリ金属炭酸塩類;重炭酸ナトリウム、重炭酸カリウムなどのアルカリ金属重炭酸塩類;テトラメチルアンモニウムヒドロキシド、テトラエチルアンモニウムヒドロキシド、コリンヒドロキシド等のアンモニウムヒドロキシド類;ケイ酸ナトリウム、メタケイ酸ナトリウムなどの水溶液を使用することができる。また、上記アルカリ類の水溶液にメタノールやエタノールなどの水溶性有機溶剤や界面活性剤を適当量添加した水溶液を現像液として使用することもできる。
好ましい現像液として、テトラエチルアンモニウムヒドロキシドの0.4%水溶液、0.5%水溶液、0.7%水溶液、2.38%水溶液を挙げる事ができる。
現像液のpHは、好ましくは10.0~14.0である。
現像時間は、好ましくは30~500秒間であり、また、現像の手法は液盛り法、ディップ法等の何れでもよい。現像後は、流水洗浄を、通常、30~300秒間行い、所望のパターンを形成させることができる。
現像の後に、リンス工程を行うこともできる。リンス工程では、現像後の基板を純水などで洗うことで、付着している現像液除去、現像残渣除去を行う。リンス方法は公知の方法を用いることができる。例えばシャワーリンスやディップリンスなどを挙げる事ができる。
ポストベークの前に、比較的低温でベークを行った後にポストベークすることもできる(ミドルベーク工程の追加)。ミドルベークを行う場合は、90~150℃で1~60分加熱した後に、200℃以上の高温でポストベークすることが好ましい。また、ミドルベーク、ポストベークを3段階以上の多段階に分けて加熱する事もできる。このようなミドルベーク、ポストベークの工夫により、パターンのテーパー角を調整することができる。これらの加熱は、ホットプレート、オーブン、赤外線ヒーターなど、公知の加熱方法を使用することができる。
なお、ポストベークに先立ち、パターンを形成した基板に活性光線により全面再露光(ポスト露光)した後、ポストベークすることにより未露光部分に存在する光酸発生剤から酸を発生させ、架橋工程を促進する触媒として機能させることができ、膜の硬化反応を促進することができる。ポスト露光工程を含む場合の好ましい露光量としては、100~3,000mJ/cm2が好ましく、100~500mJ/cm2が特に好ましい。
本発明の硬化膜は、本発明の組成物を硬化して得られた硬化膜である。
本発明の硬化膜は、層間絶縁膜として好適に用いることができる。また、本発明の硬化膜は、本発明の硬化膜の形成方法により得られた硬化膜であることが好ましい。
本発明の組成物により、絶縁性に優れ、高温でベークされた場合においても高い透明性を有する層間絶縁膜が得られる。本発明の組成物を用いてなる層間絶縁膜は、高い透明性を有し、硬化膜物性に優れるため、有機EL表示装置や液晶表示装置の用途に有用である。有機EL表示装置および液晶表示装置の詳細については、特開2011-209681号公報の段落番号0209~0210および図1、2の記載を参酌でき、これらの内容は本願明細書に組み込まれる。
以下の合成例において、共重合体の重量平均分子量Mwの測定は下記の装置および条件のもと、ゲルパーミエーションクロマトグラフィー(GPC)によった。
装置:GPC-101(昭和電工(株)製)
カラム:GPC-KF-801、GPC-KF-802、GPC-KF-803およびGPC-KF-804を結合
移動相:テトラヒドロフラン
検出器:示差屈折計
標準物質:単分散ポリスチレン
(P-1の合成)
冷却管及び攪拌機を備えたフラスコに、2,2’-アゾビス-(2,4-ジメチルバレロニトリル)7質量部とジエチレングリコールエチルメチルエーテル200質量部とを仕込んだ。引き続き、メタクリル酸12質量部、メタクリル酸グリシジル50質量部、N-シクロヘキシルマレイミド4質量部、メタクリル酸テトラヒドロフルフリル15質量部、アクリロイルモルホリン5質量部、3-(2-メタクリロイルオキシエチル)オキセタン8質量部及びペンタエリスリトールテトラキス(3-メルカプトプロピオネート)2質量部を仕込んで窒素置換した後、ゆるやかに撹拌を始めた。溶液の温度を70℃に上昇させ、反応溶液温度が70℃に達した時点で重合開始とした。その後、重合開始から30分後にN-シクロヘキシルマレイミド3質量部、1時間後にN-シクロヘキシルマレイミド3質量部を反応溶液に滴下した。その後、3時間保持することによって共重合体(P-1)を含む重合体溶液を得た。共重合体P-1のポリスチレン換算重量平均分子量(Mw)は9,000、分子量分布(Mw/Mn)は2.0であった。
下記表に記載の固形分比となるように、(A)成分、(B)成分、(C)成分、シランカップリング剤および界面活性剤を溶剤に固形分濃度32%になるまで溶解混合し、口径0.2μmのポリテトラフルオロエチレン製フィルターで濾過して、各種実施例および比較例の感光性樹脂組成物を得た。
上述したP-1~P-11の重合体を用いた。
<(B)成分>
B-1:4,4’-[1-[4-[1-[4-ヒドロキシフェニル]-1-メチルエチル]フェニル]エチリデン]ビスフェノール(1.0モル)と1,2-ナフトキノンジアジド-5-スルホン酸クロリド(3.0モル)との縮合物
B-2:1,1,1-トリ(p-ヒドロキシフェニル)エタン(1.0モル)と1,2-ナフトキノンジアジド-5-スルホン酸クロリド(2.0モル)との縮合物
B-3:2,3,4,4’-テトラヒドロキシベンゾフェノン(1.0モル)と1,2-ナフトキノンジアジド-5-スルホン酸エステル(2.44モル)
D-1:3-グリシドキシプロピルトリメトキシシラン(KBM-403、信越化学工業(株)製)
W-1:シリコーン系界面活性剤((株)東レ・ダウコーニング製の「SH 8400 FLUID」)
W-2:フッ素系界面活性剤 FTX-218((株)ネオス製)
基板の一方の面の半分の領域(10cm×5cm)にMo(モリブデン)薄膜が成膜され、同じ面のもう半分の領域(10cm×5cm)にSiNx薄膜が成膜されたガラス基板(10cm×10cm×0.5mm)を、ヘキサメチルジシラザン(HMDS)蒸気下に30秒曝し、各感光性樹脂組成物溶液を、スピンコーターを用いて乾燥膜厚が3μmとなるように塗布した後、90℃で2分ホットプレート上でプリベークして溶剤を揮発させた。その後、10μmライン/10μmスペースを再現することのできるマスクを介して、超高圧水銀灯を用いて積算照射量40mJ/cm2(エネルギー強度:20mW/cm2、i線)露光した後、アルカリ現像液(0.4質量%のテトラメチルアンモニウムヒドロキシド水溶液)で、23℃、60秒間現像した後、超純水で1分間リンスした。得られた基板を光学顕微鏡で観察し、10μmライン/10μmスペースのパターンの欠け、剥がれをMo部とSiNx部を観察した。その結果を下記表に示した。剥がれが少ないほど好ましく、AまたはBが好ましい。
A:欠け、剥がれが全くない
B:欠け、剥がれが30%以下
C:欠け、剥がれが30%を超え60%以下
D:欠け、剥がれが60%を超え100%以下
Mo(モリブデン)薄膜が成膜されたガラス基板(10cm×10cm×0.5mm)を、ヘキサメチルジシラザン(HMDS)蒸気下に30秒曝し、その後、各感光性樹脂組成物をスピンコートした後、90℃で2分ホットプレート上でプリベークして溶剤を揮発させ、膜厚3μmの感光性樹脂組成物層を形成した。続いて超高圧水銀灯を用いて積算照射量が300mJ/cm2(エネルギー強度:20mW/cm2、i線)となるように全面露光し、その後、この基板をオーブンにて230℃で30分加熱して硬化膜を得た。
次に、硬化膜にカッターを用いて、縦横に1mmの間隔で切り込みを入れ、スコッチテープを用いてテープ剥離試験(100マスクロスカット法:JIS5600に準拠)を行った。テープ裏面に転写された硬化膜の面積から硬化膜と基板間の密着性を評価した。その結果を下記表に示した。数値としては小さいほど下地基板との密着性が高く、AまたはBが好ましい。
A:転写された面積が1%未満
B:転写された面積が1%以上5%未満
C:転写された面積が5%以上10%未満
D:転写された面積が10%以上50%未満
E:転写された面積が50%以上
Ti(チタン)薄膜が成膜されたガラス基板(10cm×10cm×0.5mm)を、ヘキサメチルジシラザン(HMDS)蒸気下に30秒曝し、その後、各感光性樹脂組成物をスピンコートした後、90℃で2分ホットプレート上でプリベークして溶剤を揮発させ、膜厚3μmの感光性樹脂組成物層を形成した。続いて超高圧水銀灯を用いて積算照射量が300mJ/cm2(エネルギー強度:20mW/cm2、i線)となるように全面露光し、その後、この基板をオーブンにて230℃で30分加熱して硬化膜を得た。
次に、硬化膜にカッターを用いて、縦横に1mmの間隔で切り込みを入れ、スコッチテープを用いてテープ剥離試験(100マスクロスカット法:JIS5600に準拠)を行った。テープ裏面に転写された硬化膜の面積から硬化膜と基板間の密着性を評価した。その結果を下記表に示した。数値としては小さいほど下地基板との密着性が高く、AまたはBが好ましい。
A:転写された面積が1%未満
B:転写された面積が1%以上5%未満
C:転写された面積が5%以上10%未満
D:転写された面積が10%以上50%未満
E:転写された面積が50%以上
SiNx(窒化シリコン)薄膜が成膜されたガラス基板(10cm×10cm×0.5mm)を、ヘキサメチルジシラザン(HMDS)蒸気下に30秒曝し、その後、各感光性樹脂組成物をスピンコートした後、90℃で2分ホットプレート上でプリベークして溶剤を揮発させ、膜厚3μmの感光性樹脂組成物層を形成した。続いて超高圧水銀灯を用いて積算照射量が300mJ/cm2(エネルギー強度:20mW/cm2、i線)となるように全面露光し、その後、この基板をオーブンにて230℃で30分加熱して硬化膜を得た。
次に、硬化膜にカッターを用いて、縦横に1mmの間隔で切り込みを入れ、スコッチテープを用いてテープ剥離試験(100マスクロスカット法:JIS5600に準拠)を行った。テープ裏面に転写された硬化膜の面積から硬化膜と基板間の密着性を評価した。その結果を下記表に示した。数値としては小さいほど下地基板との密着性が高く、AまたはBが好ましい。
A:転写された面積が1%未満
B:転写された面積が1%以上5%未満
C:転写された面積が5%以上10%未満
D:転写された面積が10%以上50%未満
E:転写された面積が50%以上
ガラス基板を、ヘキサメチルジシラザン(HMDS)蒸気下に30秒曝し、該基板に各感光性樹脂組成物をスピンコートした後、90℃/120秒ホットプレート上でプリベークして溶剤を揮発させ、膜厚3.0μmの感光性樹脂組成物層を形成した。続いて超高圧水銀灯を用いて積算照射量が300mJ/cm2(エネルギー強度:20mW/cm2、i線)となるように露光し、この基板をオーブンにて230℃/30分間加熱した後、さらにオーブンにて230℃/2時間加熱した。
得られた硬化膜の膜厚(T1)を測定した。そして、この硬化膜が形成された基板を80℃に温度制御された剥離液(モノエタノールアミンとジメチルスルホキシド(DMSO)との混合液)中に10分間浸漬させた後、浸漬後の硬化膜の膜厚(t1)を測定し、浸漬による膜厚変化率{|t1-T1|/T1}×100〔%〕を算出した。結果を下記表に示す。小さいほど好ましく、A、Bが実用上問題のないレベルである。
A:2%未満
B:2%以上3%未満
C:3%以上4%未満
D:4%以上6%未満
E:6%以上
ガラス基板を、ヘキサメチルジシラザン(HMDS)蒸気下に30秒曝し、該基板に各感光性樹脂組成物をスピンコートした後、90℃/120秒ホットプレート上でプリベークして溶剤を揮発させ、膜厚3.0μmの感光性樹脂組成物層を形成した。続いて超高圧水銀灯を用いて積算照射量が300mJ/cm2(エネルギー強度:20mW/cm2、i線)となるように露光し、この基板をオーブンにて230℃/30分間加熱した後、さらにオーブンにて230℃/2時間加熱した。
得られた硬化膜の膜厚(T1)を測定した。そして、この硬化膜が形成された基板を80℃に温度制御されたNMP中に10分間浸漬させた後、浸漬後の硬化膜の膜厚(t1)を測定し、浸漬による膜厚変化率{|t1-T1|/T1}×100〔%〕を算出した。結果を下記表に示す。小さいほど好ましく、A、Bが実用上問題のないレベルである。
A:2%未満
B:2%以上3%未満
C:3%以上4%未満
D:4%以上6%未満
E:6%以上
比較例1では、前記(C)成分を用いていないため、硬化膜の各種基板に対する密着性、現像時の各種基板に対する密着性および耐薬品性が実施例よりも劣っていた。
比較例2では、前記化合物(C-1)においてSがOに置き換わった点だけが異なる化合物を用いたが、硬化膜の各種基板に対する密着性および現像時の各種基板に対する密着性が、前記化合物(C-1)を用いた実施例12よりも大きく劣っていた。
比較例3では、前記化合物(C-1)においてNHがOに置き換わった点だけが異なる化合物を用いたが、硬化膜の各種基板に対する密着性および現像時の各種基板に対する密着性が、前記化合物(C-1)を用いた実施例12よりも大きく劣っていた。
比較例4では、前記化合物(C-1)においてR1がモルホルノ基からシクロヘキシル基に置き換わった点だけが異なる化合物を用いたが、硬化膜の各種基板に対する密着性、現像時の各種基板に対する密着性および耐薬品性が、前記化合物(C-1)を用いた実施例12よりも大きく劣っていた。
比較例5では、前記化合物(C-1)においてR1がモルホルノ基からアリール基に置き換わった点だけが異なる化合物を用いたが、硬化膜の各種基板に対する密着性、現像時の各種基板に対する密着性および耐薬品性が前記化合物(C-1)を用いた実施例12よりも大きく劣っていた。
比較例6では、前記(C)成分としてチオウラシル構造を有する化合物を用いたが、かかる化合物には、配位原子を含む構造が含有されていないため、硬化膜の各種基板に対する密着性、現像時の各種基板に対する密着性および耐薬品性が大きく劣っていた。
比較例7では、前記(A)成分として、(a2)架橋性基を有する繰り返し単位を含む重合体を用いておらず、硬化膜の各種基板に対する密着性および耐薬品性が大きく劣っていた。
比較例8では、前記(A)成分として、(a1)酸基を有する繰り返し単位と、(a2)架橋性基を有する繰り返し単位を含む重合体を用いておらず、フェノール樹脂(ノボラック樹脂)を用いたため、硬化膜の各種基板に対する密着性および耐薬品性が大きく劣っていた。このメカニズムは定かではないが、比較例8の感光性樹脂組成物は、架橋性基を含有しない重合体、すなわちフェノール樹脂を用いているため、実施例の感光性樹脂組成物のように、架橋性基と前記(C)成分が相互作用しないため、例えばMo、Ti、SiNxなどの基板に対して現像液(TMAH)が触れた場合、基板の表面が改質されて一部溶解してしまい、基板と硬化膜との界面に現像液が浸透してしまう結果、感光性樹脂組成物の現像時および感光性樹脂組成物を硬化膜としたときの状態での基板に対する密着性が低下してしまったと推定される。また、このメカニズムも定かではないが、比較例8の感光性樹脂組成物は、架橋性基を含有しない重合体を用いているため、架橋性基を有する繰り返し単位を含む重合体を用いた実施例のように、硬化膜としたときの架橋密度を向上させることができない結果、感光性樹脂組成物を層間絶縁膜用途に用いた場合の耐薬品性が低下してしまったと推定される。
TFTを用いた有機EL表示装置を以下の方法で作製した(例えば、特開2011-209681号公報の図1参照)。
ガラス基板6上にボトムゲート型のTFT1を形成し、このTFT1を覆う状態でSi3N4から成る絶縁膜3を形成した。次に、この絶縁膜3に、ここでは図示を省略したコンタクトホールを形成した後、このコンタクトホールを介してTFT1に接続される配線2(高さ1.0μm)を絶縁膜3上に形成した。この配線2は、TFT1間又は、後の工程で形成される有機EL素子とTFT1とを接続するためのものである。
特許第3321003号公報の図1及び図2に記載のアクティブマトリクス型液晶表示装置において、層間絶縁膜17を本発明実施例1の感光性樹脂組成物を用い、その他は定法に従って液晶表示装置を作製した。
Claims (17)
- (A)(a1)酸基を有する繰り返し単位と、(a2)架橋性基を有する繰り返し単位を含む重合体、
(B)キノンジアジド化合物、および
(C)1分子内に、配位原子を含む構造とチオウレア構造とを有する化合物
を含有する感光性樹脂組成物。 - 前記(C)成分が、前記配位原子として窒素原子を少なくとも1つ以上含む化合物である、請求項1に記載の感光性樹脂組成物。
- 前記一般式(S)中、R1が、-NR3R4(R3およびR4は、それぞれ、有機基であり、互いに結合して環を形成していてもよい)で表される基である、請求項3に記載の感光性樹脂組成物。
- 前記一般式(S)中、R1が、5員環または6員環の環状基である、請求項3または4に記載の感光性樹脂組成物。
- 前記一般式(S)中、R1が、モルホリノ基である、請求項3~5のいずれか1項に記載の感光性樹脂組成物。
- 前記一般式(S)中、R2の末端に炭化水素基を有する、請求項3~6のいずれか1項に記載の感光性樹脂組成物。
- 前記構成単位(a1)が、カルボキシル基および/またはフェノール性水酸基を有する繰り返し単位である、請求項1~7のいずれか1項に記載の感光性樹脂組成物。
- 前記構成単位(a2)が、エポキシ基、オキセタニル基および-NH-CH2-O-R(Rは水素原子または炭素数1~20のアルキル基)で表される基よりなる群から選ばれた少なくとも1つを含む構成単位を含有する、請求項1~8のいずれか1項に記載の感光性樹脂組成物。
- 前記感光性樹脂組成物中の前記成分(B)の配合量が、前記感光性樹脂組成物中の全固形分に対し10質量%を超え40質量%以下である、請求項1~9のいずれか1項に記載の感光性樹脂組成物。
- 前記感光性樹脂組成物が、ポジ型感光性樹脂組成物である、請求項1~10のいずれか1項に記載の感光性樹脂組成物。
- (1)請求項1~11のいずれか1項に記載の感光性樹脂組成物を基板上に塗布する工程、
(2)塗布された感光性樹脂組成物から溶剤を除去する工程、
(3)溶剤が除去された感光性樹脂組成物を活性光線により露光する工程、
(4)露光された感光性樹脂組成物を水性現像液により現像する工程、および、
(5)現像された感光性樹脂組成物を熱硬化するポストベーク工程、
を含む硬化膜の製造方法。 - 前記現像工程後、前記ポストベーク工程前に、(6)現像された感光性樹脂組成物を全面露光する工程を含む、請求項12に記載の硬化膜の製造方法。
- 前記ポストベーク工程で熱硬化して得られた硬化膜を有する基板に対し、ドライエッチングを行う工程を含む、請求項12または13に記載の硬化膜の製造方法。
- 請求項12~14のいずれか1項に記載の硬化膜の製造方法により形成された硬化膜。
- 層間絶縁膜である、請求項15に記載の硬化膜。
- 請求項15または16に記載の硬化膜を有する有機EL表示装置または液晶表示装置。
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JP2014554443A JP5992059B2 (ja) | 2012-12-26 | 2013-12-24 | 感光性樹脂組成物、硬化膜の製造方法、硬化膜、有機el表示装置および液晶表示装置 |
CN201380067676.6A CN104871089B (zh) | 2012-12-26 | 2013-12-24 | 感光性树脂组合物、硬化膜的制造方法、硬化膜、有机el显示装置及液晶显示装置 |
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US10497899B2 (en) | 2017-07-17 | 2019-12-03 | Wuhan China Star Optoelectronics Semiconductor Display Technology Co., Ltd. | Hardening film and method of manufacturing the same, flexible AMOLED display device |
CN107415333A (zh) * | 2017-07-17 | 2017-12-01 | 武汉华星光电半导体显示技术有限公司 | 硬化膜及其制备方法、柔性amoled显示装置 |
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JP3361624B2 (ja) * | 1994-08-17 | 2003-01-07 | 富士フイルムアーチ株式会社 | ポジ型感光性組成物 |
JP2000275841A (ja) * | 1999-03-26 | 2000-10-06 | Fuji Photo Film Co Ltd | ポジ型フォトレジスト組成物 |
CN100585496C (zh) * | 2004-10-12 | 2010-01-27 | 日产化学工业株式会社 | 含有硫原子的形成光刻用防反射膜的组合物 |
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JP5814012B2 (ja) * | 2011-01-19 | 2015-11-17 | 富士フイルム株式会社 | 感光性樹脂組成物、及びパターンの製造方法 |
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Publication number | Publication date |
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KR101758115B1 (ko) | 2017-07-14 |
JP5992059B2 (ja) | 2016-09-14 |
TWI610129B (zh) | 2018-01-01 |
TW201426173A (zh) | 2014-07-01 |
KR20150084918A (ko) | 2015-07-22 |
CN104871089B (zh) | 2020-01-14 |
CN104871089A (zh) | 2015-08-26 |
JPWO2014103997A1 (ja) | 2017-01-12 |
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