USD350490S - Semiconductor wafer testing apparatus - Google Patents
Semiconductor wafer testing apparatus Download PDFInfo
- Publication number
- USD350490S USD350490S US29/006,815 US681593F USD350490S US D350490 S USD350490 S US D350490S US 681593 F US681593 F US 681593F US D350490 S USD350490 S US D350490S
- Authority
- US
- United States
- Prior art keywords
- semiconductor wafer
- testing apparatus
- wafer testing
- view
- ornamental design
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Description
FIG. 1 is a top, front and right side perspective view of a semiconductor wafer testing apparatus showing my new design;
FIG. 2 is a top plan view;
FIG. 3 is a front elevational view;
FIG. 4 is a left side elevational view;
FIG. 5 is a right side elevational view;
FIG. 6 is a rear elevational view; and,
FIG. 7 is a bottom plan view thereof.
Claims (1)
- The ornamental design for semiconductor wafer testing apparatus, as shown and described.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4-29499 | 1992-10-08 | ||
| JP2949992 | 1992-10-08 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| USD350490S true USD350490S (en) | 1994-09-13 |
Family
ID=70916512
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US29/006,815 Expired - Lifetime USD350490S (en) | 1992-10-08 | 1993-04-07 | Semiconductor wafer testing apparatus |
Country Status (1)
| Country | Link |
|---|---|
| US (1) | USD350490S (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| USD383683S (en) * | 1996-04-25 | 1997-09-16 | Tokyo Electron Limited | Wafer prober |
| USD935424S1 (en) * | 2019-05-06 | 2021-11-09 | Lam Research Corporation | Semiconductor wafer processing tool |
| USD989144S1 (en) * | 2021-05-14 | 2023-06-13 | Hitachi High-Tech Corporation | Apparatus for evaluating semiconductor substrate |
| USD989831S1 (en) * | 2021-05-14 | 2023-06-20 | Hitachi High-Tech Corporation | Apparatus for evaluating semiconductor substrate |
| USD989830S1 (en) * | 2021-05-14 | 2023-06-20 | Hitachi High-Tech Corporation | Semiconductor substrate transfer apparatus |
| USD990538S1 (en) * | 2021-02-05 | 2023-06-27 | Syskey Technology Co., Ltd. | Miniaturized semiconductor manufacturing device |
-
1993
- 1993-04-07 US US29/006,815 patent/USD350490S/en not_active Expired - Lifetime
Non-Patent Citations (1)
| Title |
|---|
| Fully Automatic Wafer Prober Model 785, Tokyo Electron Limited, p. 2. |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| USD383683S (en) * | 1996-04-25 | 1997-09-16 | Tokyo Electron Limited | Wafer prober |
| USD935424S1 (en) * | 2019-05-06 | 2021-11-09 | Lam Research Corporation | Semiconductor wafer processing tool |
| USD990538S1 (en) * | 2021-02-05 | 2023-06-27 | Syskey Technology Co., Ltd. | Miniaturized semiconductor manufacturing device |
| USD989144S1 (en) * | 2021-05-14 | 2023-06-13 | Hitachi High-Tech Corporation | Apparatus for evaluating semiconductor substrate |
| USD989831S1 (en) * | 2021-05-14 | 2023-06-20 | Hitachi High-Tech Corporation | Apparatus for evaluating semiconductor substrate |
| USD989830S1 (en) * | 2021-05-14 | 2023-06-20 | Hitachi High-Tech Corporation | Semiconductor substrate transfer apparatus |
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