USD1035600S1 - Semiconductor test fixture - Google Patents

Description

FIG. 1 is a top perspective view of a semiconductor test fixture showing my new design;

FIG. 2 is a bottom perspective view thereof;

FIG. 3 is a top plan view thereof;

FIG. 4 is a bottom plan view thereof;

FIG. 5 is a front elevational view thereof;

FIG. 6 is a rear elevational view thereof;

FIG. 7 is a left side elevational view thereof;

FIG. 8 is a right side elevational view thereof;

FIG. 9 is an exploded perspective view thereof;

FIG. 10 is a cross-sectional view taken along lines 10-10 of FIG. 3 ; and,

FIG. 11 is a cross-sectional view taken along lines 11-11 of FIG. 3 .

The even dashed broken lines in the drawings are for the purpose of illustrating environmental structure and form no part of the claimed design.

Claims (1)

CLAIM
1. The ornamental design for a semiconductor test fixture, as shown and described.

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