US6683486B2 - Low voltage shifter with latching function - Google Patents
Low voltage shifter with latching function Download PDFInfo
- Publication number
- US6683486B2 US6683486B2 US10/114,221 US11422102A US6683486B2 US 6683486 B2 US6683486 B2 US 6683486B2 US 11422102 A US11422102 A US 11422102A US 6683486 B2 US6683486 B2 US 6683486B2
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
- H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
- H03K3/353—Generators characterised by the type of circuit or by the means used for producing pulses by the use, as active elements, of field-effect transistors with internal or external positive feedback
- H03K3/356—Bistable circuits
- H03K3/356104—Bistable circuits using complementary field-effect transistors
- H03K3/356113—Bistable circuits using complementary field-effect transistors using additional transistors in the input circuit
- H03K3/356147—Bistable circuits using complementary field-effect transistors using additional transistors in the input circuit using pass gates
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
- H03K3/01—Details
- H03K3/012—Modifications of generator to improve response time or to decrease power consumption
Definitions
- This invention relates to semiconductor devices, and more particularly, to a low voltage level shifter circuit.
- Low voltage signaling is attractive to designers since it dramatically reduces the power consumption requirements and leads to decreased electromigration in the conductors of the integrated circuit. With reduced electromigration, the chances of developing voids and shorts in the conductors are greatly reduced. Furthermore, lower power consumption also leads to decreased electrical noise, as less charge is dumped on the ground and power buses at any given time.
- FIG. 1 depicts a conventional low voltage buffer and latch 100 .
- the circuit comprises an input buffer stage 110 coupled to a latch stage 112 .
- Low voltage input at input port QRWD may swing from 0V to 1V, which is lower than the full internal device voltage, V DD .
- Output voltage at output port SRWD may range from 0V to 2V.
- ENB enable signal
- the circuit drives and latches the data at the input read-write data port, RWD.
- ENB goes low, the circuit is disabled and the data at QRWD is latched.
- the invention relates, in one embodiment, to a method for implementing a low voltage level shifter circuit with an embedded latch on a signal line having thereon low voltage signals.
- the low voltage signals have a voltage level that is below the full internal device voltage, V dd .
- the low voltage level shifter circuit is configured to latch the low voltage input signal and output a voltage signal with a voltage range that is higher than the voltage range associated with the low voltage input signal.
- the method includes coupling the input node to the first portion of the signal line.
- the input node is coupled to an input stage of the level shifter circuit.
- the input stage is configured to receive the low voltage signal on the signal line.
- the input stage is also coupled to a level shifting stage that is configured to output a set of level shifting stage control signals responsive to the low voltage input signal.
- the level shifter control signals are coupled to a latching stage, the latching stage being coupled to the input stage.
- the latching stage is arranged to latch the low voltage input signal received at the input stage.
- the method further includes coupling the output node to the level shifting stage.
- the output node is also coupled to the second portion of the signal line to output a higher voltage level signal.
- the invention in another embodiment, relates to a method, for implementing a low voltage level shifter circuit with an embedded latch on a signal line having thereon low voltage signals.
- the method includes receiving the first low voltage signal using an input stage of the level shifter circuit, the input stage being coupled to the input node.
- the method includes forming, using a level shifting stage of the low voltage level shifter circuit, a set of control signals responsive to the low voltage input signal.
- the voltage range associated with the control signals is higher than the voltage range of the low voltage level input signal.
- latching the low voltage input signal within a latching stage of the low voltage level shifter circuit.
- the method further includes outputting an output voltage signal from the level shifting stage control signals. The voltage range associated with the output signal is higher than the voltage range of the low voltage input signal.
- the invention in another embodiment, relates to a method for implementing a low voltage repeater circuit with an embedded latch, configured to be coupled to a signal line having thereon low voltage signals.
- the low voltage levels have a voltage level below V dd .
- the method includes coupling an input node to the first portion of the signal line to receive a first low voltage input signal.
- the input node is also coupled to an input stage of the repeater circuit, the input stage being configured to receive the first low voltage signal on the signal line.
- the input stage is coupled to a level shifting and latching stage that is arranged to latch the first low voltage input signal and output a set of level shifting stage control signals responsive to the first low voltage signal.
- the level shifting and latching stage boosts the output control signals, causing the voltage range associated with the set of level shifting stage control signals to be higher than the voltage range of the first low voltage signal.
- the method further includes coupling the level shifting and latching stage to the output stage of the repeater circuit.
- the output stage is configured to output a low voltage level signal and is coupled to an output node, which is coupled to the second portion of the signal line.
- FIG. 1 illustrates a conventional low voltage latch and buffer circuit that may be found in a typical integrated circuit.
- FIG. 2 a shows, according to one embodiment of the present invention, a simplified low voltage level shifter circuit with a latching function.
- FIG. 2 b shows, according to one embodiment of the present invention and in greater detail, a low voltage level shifter circuit with a latching function.
- FIG. 3 shows an alternative embodiment of the invention.
- FIG. 4 a demonstrates a repeater application of the low voltage level shifter configuration shown in FIG. 2 a.
- FIG. 4 b shows the timing diagrams of the repeater circuit shown in FIG. 4 a.
- FIG. 5 depicts, according to an alternative embodiment of the invention, a repeater application of the low voltage level shifter configuration shown in FIG. 3 .
- the present invention relates generally to improving the performance of low voltage integrated circuits.
- a low voltage level shifter that has the ability to latch low voltage data with reduced power dissipation.
- various configurations are disclosed as being suitable candidates for shifting and latching low voltage data.
- the low voltage level shifter circuits are employed in repeater applications to latch and efficiently transmit low voltage level data, with reduced power dissipation, electrical noise and/or electromigration.
- FIG. 2 a illustrates, in accordance with one embodiment of the invention, a block diagram of a low voltage level shifter circuit 200 .
- the circuit comprises of an input stage 210 , a level shifting stage 220 and a latching stage 230 .
- the input signal at QRWD is optionally coupled to input stage 210 , passed to the level shifting stage 220 , and then to the latching stage 230 .
- the level shifting stage 220 outputs a high voltage signal to node SRWD in response to a low voltage signal from the input stage.
- the low voltage signal has a voltage level that is below the full internal device voltage V dd .
- the high voltage output signal has a voltage range of about V dd , which is higher than the low voltage input range.
- the level shifting stage output control signal activates the latching stage 230 .
- the latching stage 230 is configured to latch the low voltage input signal received at the input stage.
- FIG. 2 b illustrates, in greater detail and in accordance with one embodiment of the invention, a low voltage level shifter 200 with a latching function.
- the input stage comprises two field effect transistors (FETs) 212 and 214 , connected in parallel, whose gates are connected to a power source with a voltage level that is at least a threshold voltage V th higher than the input voltage V QRWD . This is done to ensure that the transistors are turned on to allow the input voltage signal to pass through to transistors 222 and 224 in the level shifting stage.
- the gate voltage of transistors 212 and 214 can be a signal having 2 logical states. When the signal is at logic level ‘0’, the level shifter is disabled and tri-stated from signal QRWD. When the signal is at logic level ‘1’, the level shifter is enabled and receives the signal QRWD.
- the level shifting stage 220 low voltage input signals are shifted to a higher voltage range. Depending on the input signal received, the level shifting stage outputs either a logical low voltage (e.g. 0 V) or logical high voltage (e.g. 2 V), and transmits the output signal to the latching stage 230 .
- a logical low voltage e.g. 0 V
- logical high voltage e.g. 2 V
- FET 224 is represented as a low threshold n-type FET (the low threshold characteristic indicated by the circle surrounding the transistor symbol), such is not a requirement as long as the threshold voltage is lower than the upper power rail (e.g. 1 V) of the low voltage input at QRWD.
- low threshold FETs may have a threshold voltage of about 0.4 to 0.5 V, which is lower than typical FETs that may have a threshold voltage of 0.6 to 0.7 V.
- the transistors in the latching stage 230 latch the input signal at the port QRWD, hence reducing standby current leakage and power dissipation. Accordingly, a low voltage level shifter circuit with the ability to latch low voltage data is formed.
- a low input signal (e.g. 0 V) is applied at the global data port QRWD.
- the signal passes through transistors 212 and 214 in the input stage to transistors 222 and 224 in the level shifting stage.
- the n-type FET 224 is turned off, and the p-type FET 222 is turned on, thereby passing the signal to the latching stage 230 .
- the transistor 222 is operated with a power level V dd , which represents the full internal voltage at which the circuit operates.
- V dd is higher than the low input voltage but may be equal or lower than the external voltage level supplied to the integrated circuit.
- the input voltage at QRWD has a range of 0 to 1 V
- V dd has a range of 0 to 2 V.
- the logical low input voltage is inverted and raised approximately to a high voltage level (e.g. 2 V) and passed to the latching stage.
- p-type FET 232 is turned off by the high signal at node A, and n-type FETs 234 and 236 are turned on. Since FETs 234 and 236 are conducting, the voltage levels at nodes XRT and XRB are pulled down to logical low voltage level (e.g. 0V), therein latching the logical low input voltage transmitted from QRWD.
- logical low voltage level e.g. 0V
- a logical low input signal at QRWD causes a shifted logical high V dd output to appear at the output port SRWD, and the logical low input signal at QRWD to be latched.
- n-type FETs 234 and 236 are turned off, and p-type FET 238 is turned on, therein coupling the node XRB to a high V dd and latching the high voltage input signal at QRWD.
- FET 232 is connected between nodes A and XRT, to maintain FET 222 in its off state when the FET 238 is turned on by a logical low signal applied at node A.
- FET 238 is removed from the circuit 200 , forming yet another embodiment of the invention 300 .
- the circuit comprises of similar input stage 310 , level shifting stage 320 and latching stage 330 .
- a logical high input signal e.g. 1 V
- a logical low signal e.g. 0 V
- FIG. 4 a illustrates, in accordance with one aspect of the present invention, a low voltage repeater circuit 400 which employs a low voltage level shifter with an embedded latch.
- the level shifter circuit latches the input signal and boosts the low voltage input signal into control signals having a greater voltage range to control the output transistors 422 and 424 in the output stage 420 .
- the low voltage shifter with the embedded latch is implemented by the circuit 200 discussed in connection with FIG. 2 a .
- the output of the tri-state buffer 412 in the input stage 410 is coupled to the input port QRWD of the level shifting and latching stage 200 .
- the tri-state buffer 412 is capable of receiving a low voltage signal at port RWD and is controlled by enable signal ENB and its complement ENBc.
- the buffer enable signal ENB and its complement ENBc are optional and may be tied high and low respectively without affecting the functionality of the circuit.
- FETs 422 and 424 are represented in the drawing as low threshold n-FETs, such is not a requirement as long as the threshold voltage of these transistors is lower than the upper power rail of the low voltage input at RWD.
- the tri-state buffer 412 In operation, when the control signal ENB is high, the tri-state buffer 412 passes a low voltage signal at port RWD to port QRWD of the level shifting and latching stage 200 . When the enable signal ENB is low, the tri-state buffer 412 is deactivated and the low voltage data at port QRWD is latched. Reference may be made back to FIG. 2 for specific details pertaining to the operation of the level shifting and latching circuit 200 in response to the input voltage signal at QRWD.
- the circuit 200 latches the signal and outputs a low signal of about 0 V at node A, which turns FET 424 off and FET 422 on, therein coupling the output port SRWD to a low voltage source Vlow (e.g. 1 V).
- Vlow e.g. 1 V
- FIG. 4 b timing diagrams of the signals at repeater input node QRWD (V QRWD ), level shifting and latching circuit output node A (V A ) and repeater output node SRWD (V SRWD ) are shown in FIG. 4 b.
- V QRWD level shifting and latching circuit output node A
- V SRWD repeater output node SRWD
- FIG. 4 b When the low voltage input at QRWD goes high, the signal at node A goes low and the output signal at node SRWD is raised to a low voltage logical high signal of about 1V.
- a logical low signal at the input node QRWD will cause a high voltage of about 2V at node A and a logical low signal at the output node SRWD.
- the circuit depicted in FIG. 4 a functions as a repeater which latches and passes a low voltage signal at port RWD to port SRWD.
- the enable signal ENB is preferably valid before the data arrives at the repeater input port RWD to
- FIG. 5 illustrates an alternative embodiment of the present invention, showing an exemplary configuration of a repeater application employing the low voltage level shifter circuit 300 with an embedded latch shown in FIG. 3 .
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Abstract
Description
Claims (21)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/114,221 US6683486B2 (en) | 2002-04-02 | 2002-04-02 | Low voltage shifter with latching function |
DE10315050A DE10315050B4 (en) | 2002-04-02 | 2003-04-02 | Low voltage level converter with latching function |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/114,221 US6683486B2 (en) | 2002-04-02 | 2002-04-02 | Low voltage shifter with latching function |
Publications (2)
Publication Number | Publication Date |
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US20030184358A1 US20030184358A1 (en) | 2003-10-02 |
US6683486B2 true US6683486B2 (en) | 2004-01-27 |
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US10/114,221 Expired - Fee Related US6683486B2 (en) | 2002-04-02 | 2002-04-02 | Low voltage shifter with latching function |
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US (1) | US6683486B2 (en) |
DE (1) | DE10315050B4 (en) |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20040021509A1 (en) * | 2002-04-17 | 2004-02-05 | Virtual Silicon Technologies, Inc., A Delaware Corporation | Circuitry to provide a low power input buffer |
US20050270079A1 (en) * | 2004-06-03 | 2005-12-08 | Kuo-Ji Chen | Input buffer structure with single gate oxide |
US20070197265A1 (en) * | 2006-02-22 | 2007-08-23 | Samsung Electronics Co., Ltd. | Level shifters and level shifting methods for suppressing current flow and generating fixed output values |
US7804350B1 (en) | 2009-04-22 | 2010-09-28 | Semiconductor Components Industries, Llc | Level shifting using cross-coupled cascode transistors |
US20120313684A1 (en) * | 2011-06-10 | 2012-12-13 | Orise Technology Co., Ltd. | Wide range level shift system |
US20170255219A1 (en) * | 2016-03-07 | 2017-09-07 | Sii Semiconductor Corporation | Output circuit |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005184774A (en) * | 2003-11-28 | 2005-07-07 | Matsushita Electric Ind Co Ltd | Level shift circuit |
CN109428587B (en) * | 2017-08-31 | 2023-10-27 | 恩智浦美国有限公司 | Level shifter standby unit |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
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US5510731A (en) * | 1994-12-16 | 1996-04-23 | Thomson Consumer Electronics, S.A. | Level translator with a voltage shifting element |
US5825205A (en) * | 1994-08-09 | 1998-10-20 | Kabushiki Kaisha Toshiba | Level-shift circuit for driving word lines of negative gate erasable type flash memory |
US6011421A (en) * | 1996-12-20 | 2000-01-04 | Samsung Electronics, Co., Ltd. | Scalable level shifter for use in semiconductor memory device |
US6094083A (en) * | 1997-12-24 | 2000-07-25 | Nec Corporation | Voltage converting buffer circuit capable of realizing high speed flip-flop action in the flip-flop circuit |
US6445226B2 (en) * | 2000-05-18 | 2002-09-03 | Nec Corporation | Output circuit converting an internal power supply potential into an external supply potential in a semiconductor apparatus |
Family Cites Families (7)
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US5136190A (en) * | 1991-08-07 | 1992-08-04 | Micron Technology, Inc. | CMOS voltage level translator circuit |
US5408147A (en) * | 1993-09-07 | 1995-04-18 | National Semiconductor Corporation | VCC translator circuit |
JP3227946B2 (en) * | 1993-11-12 | 2001-11-12 | ソニー株式会社 | Level conversion circuit |
JP3625851B2 (en) * | 1993-12-28 | 2005-03-02 | 沖電気工業株式会社 | Level shifter circuit |
EP1139567B1 (en) * | 2000-03-27 | 2006-02-08 | Kabushiki Kaisha Toshiba | Level converter circuit |
DE10120672C2 (en) * | 2001-04-27 | 2003-03-20 | Infineon Technologies Ag | Data register with integrated signal level conversion |
JP3813538B2 (en) * | 2001-11-28 | 2006-08-23 | 富士通株式会社 | Level shifter |
-
2002
- 2002-04-02 US US10/114,221 patent/US6683486B2/en not_active Expired - Fee Related
-
2003
- 2003-04-02 DE DE10315050A patent/DE10315050B4/en not_active Expired - Fee Related
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5825205A (en) * | 1994-08-09 | 1998-10-20 | Kabushiki Kaisha Toshiba | Level-shift circuit for driving word lines of negative gate erasable type flash memory |
US5510731A (en) * | 1994-12-16 | 1996-04-23 | Thomson Consumer Electronics, S.A. | Level translator with a voltage shifting element |
US6011421A (en) * | 1996-12-20 | 2000-01-04 | Samsung Electronics, Co., Ltd. | Scalable level shifter for use in semiconductor memory device |
US6094083A (en) * | 1997-12-24 | 2000-07-25 | Nec Corporation | Voltage converting buffer circuit capable of realizing high speed flip-flop action in the flip-flop circuit |
US6445226B2 (en) * | 2000-05-18 | 2002-09-03 | Nec Corporation | Output circuit converting an internal power supply potential into an external supply potential in a semiconductor apparatus |
Cited By (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20040021509A1 (en) * | 2002-04-17 | 2004-02-05 | Virtual Silicon Technologies, Inc., A Delaware Corporation | Circuitry to provide a low power input buffer |
US6844770B2 (en) * | 2002-04-17 | 2005-01-18 | Virtual Silicon Technology, Inc. | Circuitry to provide a low power input buffer |
USRE41982E1 (en) * | 2002-04-17 | 2010-12-07 | Mcmanus Michael J | Circuitry to provide a low power input buffer |
US20050270079A1 (en) * | 2004-06-03 | 2005-12-08 | Kuo-Ji Chen | Input buffer structure with single gate oxide |
US7173472B2 (en) * | 2004-06-03 | 2007-02-06 | Taiwan Semiconductor Manufacturing Co., Ltd. | Input buffer structure with single gate oxide |
US20070197265A1 (en) * | 2006-02-22 | 2007-08-23 | Samsung Electronics Co., Ltd. | Level shifters and level shifting methods for suppressing current flow and generating fixed output values |
US7881756B2 (en) * | 2006-02-22 | 2011-02-01 | Samsung Electronics Co., Ltd. | Level shifters and level shifting methods for suppressing current flow and generating fixed output values |
US7804350B1 (en) | 2009-04-22 | 2010-09-28 | Semiconductor Components Industries, Llc | Level shifting using cross-coupled cascode transistors |
US20120313684A1 (en) * | 2011-06-10 | 2012-12-13 | Orise Technology Co., Ltd. | Wide range level shift system |
US8669802B2 (en) * | 2011-06-10 | 2014-03-11 | Orise Technology Co., Ltd. | Wide range level shift system |
US20170255219A1 (en) * | 2016-03-07 | 2017-09-07 | Sii Semiconductor Corporation | Output circuit |
US10078343B2 (en) * | 2016-03-07 | 2018-09-18 | Ablic Inc. | Output circuit |
Also Published As
Publication number | Publication date |
---|---|
DE10315050A1 (en) | 2003-11-27 |
DE10315050B4 (en) | 2009-04-23 |
US20030184358A1 (en) | 2003-10-02 |
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