US3546459A - Single-crystal,drifted semi-conductor radiation detector having a bore therethrough - Google Patents
Single-crystal,drifted semi-conductor radiation detector having a bore therethrough Download PDFInfo
- Publication number
- US3546459A US3546459A US624086A US3546459DA US3546459A US 3546459 A US3546459 A US 3546459A US 624086 A US624086 A US 624086A US 3546459D A US3546459D A US 3546459DA US 3546459 A US3546459 A US 3546459A
- Authority
- US
- United States
- Prior art keywords
- crystal
- drifted
- bore
- semi
- conductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000013078 crystal Substances 0.000 title description 39
- 239000004065 semiconductor Substances 0.000 title description 23
- 230000005855 radiation Effects 0.000 title description 5
- 239000000463 material Substances 0.000 description 12
- 238000000034 method Methods 0.000 description 10
- 230000002093 peripheral effect Effects 0.000 description 6
- 230000000694 effects Effects 0.000 description 5
- 239000010931 gold Substances 0.000 description 5
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 4
- 229910052737 gold Inorganic materials 0.000 description 4
- 239000007788 liquid Substances 0.000 description 3
- 238000007747 plating Methods 0.000 description 3
- 239000000843 powder Substances 0.000 description 3
- 229910052732 germanium Inorganic materials 0.000 description 2
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 2
- 230000002285 radioactive effect Effects 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- WHXSMMKQMYFTQS-UHFFFAOYSA-N Lithium Chemical compound [Li] WHXSMMKQMYFTQS-UHFFFAOYSA-N 0.000 description 1
- 238000001730 gamma-ray spectroscopy Methods 0.000 description 1
- 229910052744 lithium Inorganic materials 0.000 description 1
- 229910003002 lithium salt Inorganic materials 0.000 description 1
- 159000000002 lithium salts Chemical class 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000012266 salt solution Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 239000000243 solution Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 230000008016 vaporization Effects 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
- H10F30/20—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
- H10F30/29—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to radiation having very short wavelengths, e.g. X-rays, gamma-rays or corpuscular radiation
- H10F30/292—Bulk-effect radiation detectors, e.g. Ge-Li compensated PIN gamma-ray detectors
- H10F30/2925—Li-compensated PIN gamma-ray detectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D99/00—Subject matter not provided for in other groups of this subclass
Definitions
- the present invention relates to a method of producing a semi-conductor detector, in general, and to drifted semiconductor detectors, in particular.
- a trapezoidshaped single-crystal is produced from the germanium, for instance, with an end face of about 10 cm. and a length of 5 cm. This crystal is equipped with a bore. The shape and size of the bore depends upon different factors.
- a gold plating or the like is applied and, thus, a first electrode is formed.
- the face of the bore is covered, for instance, with a lithiumsalt-solution. This cover forms then the second electrode.
- Non-drifted zones which may occur at the edge of the body, do not play a large role generally. They can be easily and simply polished off, however,
- FIG. 1 is a perspective front view of a single-crystal, by example, constituting a first embodiment of the present invention
- FIG. 2 is a perspective front view of a second embodiment of the present invention.
- FIG. 3 is a top plan view of the crystal disclosed in FIG. 2.
- the single-crystal 1 has a bore 2 which is completely bored through the single-crystal 1 passing through two substantially opposite end surface portions 1a of the crystal, and a gold plating is applied to the outer later peripheral surface 3 of the trapezoid, which surface 3 substantially surrounds the bore 2, and which gold plating constitutes a first electrode.
- the inner face of the bore 2 has a cover 4 of for instance, a lithium-salt solution. This cover 4 constitutes then a second electrode.
- Terminals 5 and 6 are arranged and connected by leads to the cover of the outer later peripheral surface 3 and to the cover 4 of the bore 2, respectively. By applying a voltage between the terminals 5 and 6, the crystal 1 is drifted.
- the crystal 1' is of cylindrical configuration, and is equipped with a bore 2 passing completely through both end surfaces 1a, which bore has a metallic cover 7, for instance with gold (Au).
- the outer surface 3' is covered with a layer 8' of lithium, which is preferably applied by vaporizing.
- the direction of drifting is indicated by the arrow 9, though a drifting in opposite direction is possible.
- Terminals 5' and 6 are connected by means of leads with the cover 7' of the body 2' and with the layer 8' of the outer surface 3.
- Si-crystal can also be used instead of a germanium crystal.
- the substance to be measured is inserted into the bore.
- One covers thereby a range reaching nearly the entire space angle 411-.
- a tube can be guided through the bore of the crystal, through which tube a radioactive powder formed, liquid or gaseous medium flows.
- the present invention includes also the following measure:
- a bore-drifted semi-conductor in accordance with the present invention is defined as a semi-conductor having a bore completely passing therethrough and through two substantially opposite end surface portions,
- a method of producing a drifted semi-conductor detector of increased sensitive volume comprising the steps of producing a single-crystal
- said single-crystal including an outer lateral peripheral surface substantially surrounding said inner bore face, forming said outer lateral peripheral surface as a first electrode
- said step of boring through said single-crystal is performed by boring in a direction substantially parallel to said longitudinal dimension of said single-crystal.
- a method measuring radio-activities by means of a semi-conductor detector having a bore increased sensitive volume comprising the steps of passing the material to be measured selectively in gase ous, liquid or powder form and in solid form, respectively, through a bore of a bore-drifted semiconductor detector, said bore-drifted semi-conductor having a bore completely passing through two opposite end surface portions of said semi-conductor and an outer lateral peripheral surface substantially surrounding said bore, said bore defining an inner surface, said semi-conductor being a semi-conductor drifted from one of said surfaces to the other, whereby an appreciable increase of sensitivity and the possibility of measuring weak radio-activities is provided, and
- a drifted semi-conductor detector of increased sensi tive volume comprising a single-crystal having two substantially opposite end surface portions with a bore extending completely through said single-crystal through said two substantially opposite end surface portions, and
- said single-crystal being drifted substantially radially relative to said bore.
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Light Receiving Elements (AREA)
- Measurement Of Radiation (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
AT262566A AT261766B (de) | 1966-03-18 | 1966-03-18 | Verfahren zum Herstellen eines gedrifteten Halbleiterdetektors |
Publications (1)
Publication Number | Publication Date |
---|---|
US3546459A true US3546459A (en) | 1970-12-08 |
Family
ID=3537590
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US624086A Expired - Lifetime US3546459A (en) | 1966-03-18 | 1967-03-17 | Single-crystal,drifted semi-conductor radiation detector having a bore therethrough |
Country Status (6)
Country | Link |
---|---|
US (1) | US3546459A (de) |
AT (1) | AT261766B (de) |
CH (1) | CH457630A (de) |
DE (1) | DE1614317A1 (de) |
FR (1) | FR1514734A (de) |
GB (1) | GB1115939A (de) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4056726A (en) * | 1975-10-01 | 1977-11-01 | Princeton Gamma-Tech, Inc. | Coaxial gamma ray detector and method therefor |
US4163240A (en) * | 1977-03-21 | 1979-07-31 | The Harshaw Chemical Company | Sensitive silicon pin diode fast neutron dosimeter |
US4214253A (en) * | 1977-06-13 | 1980-07-22 | General Electric Company | Radiation detector |
WO2014143072A1 (en) * | 2013-03-15 | 2014-09-18 | Canberra Industries, Inc. | SMALL ANODE GERMANIUM (SAGe) WELL RADIATION DETECTOR SYSTEM AND METHOD |
US10048389B1 (en) | 2017-04-19 | 2018-08-14 | Mirion Technologies (Canberra), Inc. | Centroid contact radiation detector system and method |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2118846A1 (en) * | 1970-12-22 | 1972-08-04 | Radiotechnique Compelec | Semiconductor detector for radiation - having separated semiconducting zones of opposite type on base material |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US1863843A (en) * | 1925-01-07 | 1932-06-21 | Union Switch & Signal Co | Process of preparing metal for use in unidirectional current carrying devices |
US2945955A (en) * | 1955-11-12 | 1960-07-19 | Atomic Energy Authority Uk | Apparatus for detecting radioactive particle emission |
US3005100A (en) * | 1956-06-12 | 1961-10-17 | Theos J Thompson | Nuclear scintillation monitor |
US3225198A (en) * | 1961-05-16 | 1965-12-21 | Hughes Aircraft Co | Method of measuring nuclear radiation utilizing a semiconductor crystal having a lithium compensated intrinsic region |
US3378414A (en) * | 1962-11-02 | 1968-04-16 | Ass Elect Ind | Method for producing p-i-n semiconductors |
-
1966
- 1966-03-18 AT AT262566A patent/AT261766B/de active
-
1967
- 1967-03-15 CH CH382567A patent/CH457630A/de unknown
- 1967-03-15 DE DE19671614317 patent/DE1614317A1/de active Pending
- 1967-03-16 FR FR99060A patent/FR1514734A/fr not_active Expired
- 1967-03-17 US US624086A patent/US3546459A/en not_active Expired - Lifetime
- 1967-03-20 GB GB12913/67A patent/GB1115939A/en not_active Expired
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US1863843A (en) * | 1925-01-07 | 1932-06-21 | Union Switch & Signal Co | Process of preparing metal for use in unidirectional current carrying devices |
US2945955A (en) * | 1955-11-12 | 1960-07-19 | Atomic Energy Authority Uk | Apparatus for detecting radioactive particle emission |
US3005100A (en) * | 1956-06-12 | 1961-10-17 | Theos J Thompson | Nuclear scintillation monitor |
US3225198A (en) * | 1961-05-16 | 1965-12-21 | Hughes Aircraft Co | Method of measuring nuclear radiation utilizing a semiconductor crystal having a lithium compensated intrinsic region |
US3378414A (en) * | 1962-11-02 | 1968-04-16 | Ass Elect Ind | Method for producing p-i-n semiconductors |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4056726A (en) * | 1975-10-01 | 1977-11-01 | Princeton Gamma-Tech, Inc. | Coaxial gamma ray detector and method therefor |
US4163240A (en) * | 1977-03-21 | 1979-07-31 | The Harshaw Chemical Company | Sensitive silicon pin diode fast neutron dosimeter |
US4214253A (en) * | 1977-06-13 | 1980-07-22 | General Electric Company | Radiation detector |
WO2014143072A1 (en) * | 2013-03-15 | 2014-09-18 | Canberra Industries, Inc. | SMALL ANODE GERMANIUM (SAGe) WELL RADIATION DETECTOR SYSTEM AND METHOD |
US9269847B2 (en) | 2013-03-15 | 2016-02-23 | Canberra Industries, Inc. | Small anode germanium (SAGe) well radiation detector system and method |
US10048389B1 (en) | 2017-04-19 | 2018-08-14 | Mirion Technologies (Canberra), Inc. | Centroid contact radiation detector system and method |
Also Published As
Publication number | Publication date |
---|---|
AT261766B (de) | 1968-05-10 |
FR1514734A (fr) | 1968-02-23 |
CH457630A (de) | 1968-06-15 |
GB1115939A (en) | 1968-06-06 |
DE1614317A1 (de) | 1970-07-02 |
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