US11105567B2 - Thermal management assembly comprising bulk graphene material - Google Patents
Thermal management assembly comprising bulk graphene material Download PDFInfo
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- US11105567B2 US11105567B2 US14/431,123 US201314431123A US11105567B2 US 11105567 B2 US11105567 B2 US 11105567B2 US 201314431123 A US201314431123 A US 201314431123A US 11105567 B2 US11105567 B2 US 11105567B2
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- management assembly
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- bulk graphene
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Images
Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
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- B32B15/00—Layered products comprising a layer of metal
- B32B15/04—Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F28—HEAT EXCHANGE IN GENERAL
- F28F—DETAILS OF HEAT-EXCHANGE AND HEAT-TRANSFER APPARATUS, OF GENERAL APPLICATION
- F28F21/00—Constructions of heat-exchange apparatus characterised by the selection of particular materials
- F28F21/02—Constructions of heat-exchange apparatus characterised by the selection of particular materials of carbon, e.g. graphite
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/0201—Thermal arrangements, e.g. for cooling, heating or preventing overheating
- H05K1/0203—Cooling of mounted components
- H05K1/0209—External configuration of printed circuit board adapted for heat dissipation, e.g. lay-out of conductors, coatings
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- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F28—HEAT EXCHANGE IN GENERAL
- F28F—DETAILS OF HEAT-EXCHANGE AND HEAT-TRANSFER APPARATUS, OF GENERAL APPLICATION
- F28F21/00—Constructions of heat-exchange apparatus characterised by the selection of particular materials
- F28F21/08—Constructions of heat-exchange apparatus characterised by the selection of particular materials of metal
- F28F21/089—Coatings, claddings or bonding layers made from metals or metal alloys
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/36—Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
- H01L23/373—Cooling facilitated by selection of materials for the device or materials for thermal expansion adaptation, e.g. carbon
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- H—ELECTRICITY
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
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- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/36—Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
- H01L23/373—Cooling facilitated by selection of materials for the device or materials for thermal expansion adaptation, e.g. carbon
- H01L23/3735—Laminates or multilayers, e.g. direct bond copper ceramic substrates
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- H—ELECTRICITY
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- H01L23/3736—Metallic materials
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- H—ELECTRICITY
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- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
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- H05K3/4602—Manufacturing multilayer circuits characterized by a special circuit board as base or central core whereon additional circuit layers are built or additional circuit boards are laminated
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- B—PERFORMING OPERATIONS; TRANSPORTING
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- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
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- B32B2307/30—Properties of the layers or laminate having particular thermal properties
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
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- H05K2201/032—Materials
- H05K2201/0323—Carbon
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/0058—Laminating printed circuit boards onto other substrates, e.g. metallic substrates
- H05K3/0061—Laminating printed circuit boards onto other substrates, e.g. metallic substrates onto a metallic substrate, e.g. a heat sink
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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Definitions
- the present invention relates to a thermal management assembly that can be used to transfer heat away from a heat source; an assembly having the thermal management assembly in contact with the heat source; and methods of manufacturing such assemblies.
- the present invention relates to a thermal management assembly comprising bulk graphene materials.
- New electronic devices are constantly becoming more powerful and more compact.
- High power components including RF/microwave electronics, diode laser, light emitting diode (LED), insulated gate bipolar transistors (IGBT), central processing units (CPU), etc.
- RF/microwave electronics diode laser, light emitting diode (LED), insulated gate bipolar transistors (IGBT), central processing units (CPU), etc.
- LED light emitting diode
- IGBT insulated gate bipolar transistors
- CPU central processing units
- New capabilities are constrained by the ability of designers to remove heat in a cost-effective manner. Generally, every 10° C. increase in chip junction temperature cuts the life of the device in half.
- thermal management products are typically constructed of either copper (Cu) or aluminum (Al). But good thermal management and heat dissipation requires that the semiconductor die is bonded directly to the heat spreader, and conventional materials do not match the coefficient of thermal expansion of semiconductors. When directly bonded for optimum thermal management, thermal stress can impact the life of the assembly. Low coefficient of thermal expansion materials such as tungsten copper (WCu), molybdenum copper (MoCu), and aluminum silicon carbide (AlSiC) were developed to reduce the thermal stress between heat spreader and semiconductor die. To achieve necessary dielectric performance, aluminum nitride (AlN) and beryllium oxide (BeO) are also common choices as substrate materials for microelectronics.
- AlN aluminum nitride
- BeO beryllium oxide
- U.S. Pat. No. 5,296,310 discloses a hybrid structural device of a high thermal conductivity material sandwiched between a pair of face sheets comprising a metal or matrix-reinforced metal.
- the core material can be a highly oriented pyrolytic graphite (HOPG), compression annealed pyrolytic graphite (CAPG), synthetic diamond, composites using these materials, or the like.
- HOPG highly oriented pyrolytic graphite
- CAG compression annealed pyrolytic graphite
- synthetic diamond composites using these materials, or the like.
- U.S. Pat. No. 6,215,661 discloses a heat spreader comprising an L-shaped plate of thermal pyrolytic graphite encapsulated in aluminum.
- 5,958,572 discloses a heat spreading substrate comprising an insert of thermal pyrolytic graphite (“TPG”), a diamond like-carbon, or other similar material having a plurality of vias formed within to optimize heat flow transfer through the plurality of vias.
- TPG thermal pyrolytic graphite
- diamond like-carbon or other similar material having a plurality of vias formed within to optimize heat flow transfer through the plurality of vias.
- TPG Thermal pyrolytic graphite
- TC1050® available from Momentive Performance Materials
- TPG is an advanced thermal management material serving military and aerospace industries for over a decade.
- TPG is formed via a two-step process that provides well-aligned graphene planes to provide a material with superior thermal conductivity (e.g., greater than 1500 W/m-K).
- TC1050® available from Momentive Performance Materials
- TPG can provide four times the cooling power at 1 ⁇ 4th the weight of copper.
- Bulk graphene material is a relatively soft material, due to its weak Van de Waals force between the graphene layers.
- heat spreaders comprising bulk graphene are formed by encapsulating bulk graphene into a metal casing, such as aluminum, copper, etc. via a diffusion bonding process. Such a process is described in U.S. Pat. No. 6,661,317.
- the encapsulated bulk graphene composite parts behave like solid metal and can be further machined, plated, or bonded to other components to meet various customers' requirement.
- a typical manufacturing process is illustrated in FIGS. 1A-1C .
- a bulk graphene-metal composite 100 can be formed by (A) disposing a bulk graphene core 112 between metal face sheets 110 a and 110 b , (B) subjecting the assemble to a diffusion bonding process; and (C) machining the composite to provide a structure of a desired shape.
- Encapsulated bulk graphene composites such as cold plates, heat spreaders, thermal straps, etc.
- bulk graphene-metal composites have been successfully implemented into the cooling systems in satellites, avionics, and phased array radars, which can take full advantage of its high thermal performance, high durability, and light weight.
- the present invention provides a thermal management assembly comprising a metal-based thermal bond disposed between a bulk graphene core material and a surrounding metal or ceramic substrate.
- the metal-based interlayer comprises a material that is reactive with the graphene to form a carbide.
- the metal-based interlayer provides an interface with the bulk graphene core that allows for excellent thermal conductivity and low thermal resistance.
- the present invention provides a thermal management assembly that exhibits low thermal interface resistance.
- the present invention can even provide a thermal interface that is orders of magnitude lower than conventional thermal interface assemblies.
- the present invention provides a thermal management assembly comprising a first substrate; a second substrate; a bulk graphene material disposed between the first and second substrates; and a thermal bond disposed between (a) a first surface of the bulk graphene layer and the first substrate, and (b) a second surface of the bulk graphene layer and the second substrate, the thermal bonds comprising a metal-based material comprising an agent that is reactive with the graphene to form a carbide.
- the present invention provides a thermal management assembly comprising a bulk graphene core material having a first surface and a second surface opposite the first surface; a first outer layer disposed on the first surface of the core material; and a second outer layer disposed on the second surface of the core material; wherein the first outer layer and the second outer layer are independently formed from a metal-based material comprising an agent that is reactive with graphene to form a carbide.
- the thermal management assembly can have a thermal interface resistance of less than 10 ⁇ 10 ⁇ 6 K-m 2 /W; less than 8 ⁇ 10 ⁇ 6 K-m 2 /W; less than 5 ⁇ 10 ⁇ 6 K-m 2 /W; less than 2 ⁇ 10 ⁇ 6 K-m 2 /W; less than 1 ⁇ 10 ⁇ 6 K-m 2 /W; less than 0.5 ⁇ 10 ⁇ 6 K-m 2 /W; even less than 0.1 ⁇ 10 ⁇ 6 K-m 2 /W.
- FIGS. 1A-1C illustrates a heat spreader comprising bulk graphene encapsulated by metal via a diffusion bonding process
- FIG. 2 is a cross-sectional view of a thermal management assembly in accordance with an embodiment of the present invention
- FIG. 3 is cross-sectional view of another embodiment of a thermal management assembly in accordance with aspects of the present invention.
- FIG. 4 is a graph illustrating the through plane thermal conductivity of a thermal management assembly in accordance with an embodiment of the invention.
- FIG. 5 is a graph illustrating the thermal interface resistance of a thermal management assembly in accordance with the an embodiment of the present invention at different bulk graphene loadings.
- FIG. 6 is a graph illustrating the thermal resistance of thermal management assemblies formed by different manufacturing methods.
- the present invention provides a thermal management assembly comprising a bulk graphene core material and a metal-based coating layer disposed on surfaces of the graphene layer.
- the metal-based coating comprises a material that is reactive with graphene to form a carbide.
- the metal-based coating provides an interface with the bulk graphene core that allows for excellent thermal conductivity and low thermal resistance.
- the thermal management assembly can comprise a structure comprising a bulk graphene core having the metal-based coating layer disposed on the surfaces of the bulk graphene material.
- a thermal management assembly comprises the metal-based coating disposed between a bulk graphene core material and outer metal or ceramic substrates.
- thermal management assembly refers to a thermal management device or a heat transfer device comprising a high thermal conductivity material for dissipating or removing heat from a heat source.
- a thermal management assembly can include, but is not limited to, heat spreaders, heat sinks, cold plates, etc.
- the metal-based coating layer comprising a material that is reactive with graphene to form a carbide may also be referred to herein as a “thermal bond layer.”
- the metal-based coating layer can also be referred to as an interlayer disposed between a surface of the graphene core material and a substrate.
- FIG. 2 illustrates an embodiment of a thermal management assembly in accordance with aspects and embodiments of the invention.
- Thermal management assembly 200 comprises a bulk graphene core 210 disposed between substrates 220 and 230 .
- the thermal management assembly 200 comprises thermal bond layers 240 and 250 disposed at the interface between the substrates and the bulk graphene core.
- Thermal bond layers 240 and 250 are metal-based coating interlayers comprising an additive or agent that can react with graphene to produce a carbide surface.
- the layers 240 and 250 are also referred to as “interlayers”, “interface layers” or “filler”.
- the bulk graphene core can be formed from a plurality of graphene layers being parallel to each other of at most 1 degree per mm in thickness.
- the term “bulk graphene” encompasses materials such as pyrolytic graphite (“PG”), thermal pyrolytic graphite (“TPG”), highly oriented pyrolytic graphite (“HOPG”), compression annealed pyrolytic graphite (“CAPG”), etc.
- bulk graphene may also refer to graphite materials consisting of crystallites of considerable size, the crystallites being highly aligned or oriented with respect to each other and having well ordered carbon layers or a high degree of preferred crystallite orientation.
- Bulk graphene material mostly comprises carbon atoms arranged in hexagonal patterns within each plane.
- the bulk graphene material comprises at least 3000 graphene layers, the graphene layers being parallel to each other at an angle of at most 1 degree per mm in thickness.
- the graphene layers are at an angle between 0.001 degree and 1 degree per mm in thickness.
- the thickness of the bulk graphene is more than 1 um and size at least 1 mm ⁇ 1 mm. It exhibits high thermal conductivity, usually higher than 1000 W/m-K.
- the bulk graphene has an in-plane (a-b direction) thermal conductivity greater than 1000 W/m-K; greater than 1100 W/m-K; greater than 1200 W/m-K; even greater than 1500 W/m-K. In one embodiment, the bulk graphene has a thermal conductivity of from about 1000 W/m-K to about 1800 W/m-K; from about 1100 W/m-K to about 1700 W/m-K; even from about 1200 W/m-K to about 1500 W/m-K.
- the bulk graphene and thermal management assembly can also exhibit excellent through-plane thermal conductivity.
- the bulk graphene and/or thermal management assembly has a through-plane thermal conductivity of from about 200 W/m-K to about 1200 W/m-K; from about 400 W/m-K to about 1000 W/m-K; even from about 500 W/m-K to about 800 W/m-K.
- through-plane thermal conductivity of from about 200 W/m-K to about 1200 W/m-K; from about 400 W/m-K to about 1000 W/m-K; even from about 500 W/m-K to about 800 W/m-K.
- the bulk graphene can be provided in any suitable form.
- the bulk graphene is provided as a sheet.
- the bulk graphene core can have any size or thickness as desired for a particular purpose or intended use.
- the core can have a thickness of from about 0.001 mm to about 1 mm, 1 mm to about 5 mm; from about 1.5 mm to about 4 mm; even from about 2 to about 3 mm.
- the core layer can have a thickness of from about 25% to about 95% of the total thickness of the thermal management assembly; from about 35% to about 90% of the total thickness of the thermal management assembly; from about 40% to about 80% of the total thickness of the thermal management assembly; even from about 50% to about 75% of the total thickness of the thermal management assembly.
- numerical values can be combined to form new and non-disclosed ranges.
- the core can be configured as desired for a particular purpose or intended application.
- the bulk graphene core is disposed in the assembly such that graphene planes are oriented substantially parallel to the substrates.
- the bulk graphene is disposed in the assembly such that the graphene planes are oriented perpendicular to the substrates.
- the graphene layers 212 are oriented perpendicular to the plane of the substrates.
- the bulk graphene core can be provided with vias.
- the loading density of the vias may range from less than 0.01% area of occupation to approximately 40% area of occupation. In another embodiment the via loading density may be from about 0.1% to about 20%.
- the spacing of the vias may range from about 0.5 to about 125 mm. In another embodiment, the spacing of the vias may range from about 1 to about 25 mm.
- a bulk graphene material with vias is described in U.S. Patent Publication No. 2010/0326645, which is incorporated herein by reference in its entirety.
- the substrate layers can be formed from any suitable metal or ceramic material as desired for a particular purpose or intended application.
- suitable metals for the substrate layer include, but are not limited to, copper, aluminum, tungsten, molybdenum, nickel, iron, tin, silver, gold, beryllium or alloys of two or more thereof.
- suitable ceramics include, but are not limited to, silicon nitride, silicon carbide, aluminum nitride, aluminum oxide, beryllium oxide, boron nitride, etc.
- the first and second substrates can be made from the same or different metal or ceramic materials.
- the thickness of the substrates can be selected as desired for a particular purpose or intended application. The thicknesses can be the same or different. In one embodiment, the substrates may each have a thickness of from about 2 microns to about 2 mm.
- the assembly of FIG. 2 shows substrates 220 and 230 , it will be appreciated that the assembly can include one or more additional substrates overlying the substrates 220 and 230 .
- the additional substrates can be formed from the same or different materials as substrates 220 or 230 .
- the thermal management assembly comprises a metal-based coating disposed on opposing surfaces of the core.
- the metal-based material can serve as an outer layer or a layer for bonding the core layer to the substrates.
- the metal-based coating layer comprises an agent that can form a carbide with graphene at a sufficiently high temperature.
- the metal-based coating material has a lower melting temperature than either the bulk graphene or the substrates.
- the metal-based coating material has a thermal conductivity of about 20 W/m-K or greater.
- the metal-based coating material can comprise any suitable metal or alloy including, but not limited to, silver, silver-copper, tin, lead, combinations of two or more thereof, etc., that melts and bonds to the surrounding metal or ceramic substrate at an elevated temperature lower than the substrate melting temperature.
- the activating agent comprises a material that forms a carbide with graphene at a sufficiently high temperature.
- the activating agent is chosen from titanium, zirconium, chromium, hafnium, aluminum, tantalum, iron, silicon, or a combination of two or more thereof.
- suitable metal-based coatings that can be used to bond bulk graphene to various materials include but are not limited to Al, Si, Fe, Al—Si, Fe—Si, Ag—Cu—Ti, Ti—Ni, Ni—Pd—Ti, Sn—Ti, Sn—Al, TiH 2 , Sn—Ag—Ti, or a combination of two or more thereof.
- the metal-based coating material has a composition different than the composition of the substrate layers.
- FIG. 3 illustrates another embodiment of a thermal management assembly in accordance with aspects of the invention.
- thermal management assembly 300 comprises a bulk graphene core 310 having a first surface 312 and a second surface 314 , a first outer layer 320 disposed on the first surface of the core, and a second outer layer 330 disposed on the second surface of the core.
- the core layer has the graphene layers 316 oriented perpendicular or parallel to the plane of the outer layers.
- the first and second outer layers are formed from a metal-based coating material.
- the metal-based coating material can be formed from an alloy comprising an agent that is reactive with the graphene to form a carbide.
- any of the materials that can be used as the interface material described above can be used to form the first and second outer layers.
- the metal-based coating layers can have a thickness of from about 0.01 mm to about 2 mm; from about 0.02 mm to about 1 mm; even from about 0.05 mm to about 0.5 mm.
- numerical values can be combined to form new and non-disclosed ranges.
- the assembly of FIG. 3 can be used alone as a thermal management assembly or can be further modified to include one or more substrates in the assembly.
- a substrate could be disposed adjacent to the first outer layer 320 .
- the assembly 300 could be modified by providing a first substrate adjacent to the first outer layer 320 , and a second substrate adjacent to outer layer 330 to provide a thermal management assembly similar to that shown in FIG. 2 .
- the thermal management assembly exhibits good thermal conductivity.
- the thermal management assembly has a through-plane thermal conductivity of from about 200 W/m-K to about 1200 W/m-K; from about 400 W/m-K to about 1100 W/m-K; from about 500 W/m-K to about 1000 W/m-K; even from about 600 W/m-K to about 800 W/m-K.
- the thermal management assembly can have a relatively low thermal interface resistance.
- the thermal management assembly has a thermal interface resistance of less than 10 ⁇ 10 ⁇ 6 K-m 2 /W; less than 8 ⁇ 10 ⁇ 6 K-m 2 /W; less than 5 ⁇ 10 ⁇ 6 K-m 2 /W; less than 2 ⁇ 10 ⁇ 6 K-m 2 /W; less than 1 ⁇ 10 ⁇ 6 K-m 2 /W; less than 0.5 ⁇ 10 ⁇ 6 K-m 2 /W; even less than 0.1 ⁇ 10 ⁇ 6 K-m 2 /W.
- the thermal management assembly has a thermal interface resistance of from about 0.1 ⁇ 10 ⁇ 6 K-m 2 /W to about 1 ⁇ 10 ⁇ 6 K-m 2 /W; from about 0.2 ⁇ 10 ⁇ 6 K-m 2 /W to about 0.8 ⁇ 10 ⁇ 6 K-m 2 /W; even from about 0.3 ⁇ 10 ⁇ 6 K-m 2 /W to about 0.6 ⁇ 10 ⁇ 6 K-m 2 /W.
- a thermal interface resistance of from about 0.1 ⁇ 10 ⁇ 6 K-m 2 /W to about 1 ⁇ 10 ⁇ 6 K-m 2 /W; from about 0.2 ⁇ 10 ⁇ 6 K-m 2 /W to about 0.8 ⁇ 10 ⁇ 6 K-m 2 /W; even from about 0.3 ⁇ 10 ⁇ 6 K-m 2 /W to about 0.6 ⁇ 10 ⁇ 6 K-m 2 /W.
- a thermal management assembly can be formed by disposing a bulk graphene core material between two substrate layers and joining the substrate layers via the metal-based coating material.
- the metal-based coating material can be applied to opposing surfaces of the bulk graphene material, and the substrate material can be disposed on the surfaces of the bulk graphene comprising the metal-based coating material, the assembly can be subjected to joining under vacuum at a temperature above the melting temperature of the metal-based coating material and below the melting temperature of the core or the substrates.
- the present invention provides a thermal management assembly with good thermal conductivity and, in one embodiment, a low thermal interface resistance. Due to the differences in electronic and vibrational properties in different materials, when an energy carrier attempts to traverse the interface, it scatters at the interface. For thermal management assemblies comprising layers formed from different thermal management materials a poor thermal interface can contribute to interface scattering. Theoretically the thermal resistance through multiple layers can be presented as:
- a poor interface can add a significant resistance to the heat flow and, thus, offset or even override the benefit of using the high thermal conductivity materials such as bulk graphene.
- the interface between bulk graphene and Cu showed high resistance due to lack of reaction and diffusion, which can result in an overall thermal conductivity lower than that of Cu.
- the diffusion bonding process exhibits issues of high complexity, high cost, application difficulty to ceramics and high temperature metals, and high interface resistance.
- Brazing and soldering on the other hand, rely on a molten filler metal to wet the mating surfaces of a joint, leading to the formation of metallurgical bonds.
- the metallic property of the brazing/soldering bond provides the continuity of high concentration of energy carriers (electrons), and, thus, renders a highly thermal conductive bond which can be referred to herein as a “thermal bond”.
- Typical brazing or soldering fillers at molten format do not wet bulk graphene and do not spread freely to fill the gaps between bulk graphene and substrates. Such assemblies still exhibit relatively high thermal interface resistance due to the thermal barrier between bulk graphene and braze or solder.
- bulk graphene heat spreaders employing a metal-based interlayer between the core and the substrates with an agent that is reactive with graphene to form a carbide layer can provide an interface layer that bonds the core to the substrate and exhibits extremely low interface thermal resistance.
- the thermal management assembly can be sized and shape as desired for a particular purpose or intended use.
- the thermal management assembly can be used in an apparatus to aid in the thermal management of the apparatus.
- the thermal management assembly can be disposed adjacent a heat generating component in an apparatus and can dissipate the heat from heat generating component.
- the thermal management assembly can be used in devices in electronics such as computers, semiconductors, or any device where heat transfer between components is needed.
- the electronic component includes a semiconductor chip as a heat producing component.
- the heat producing component can be a chip carrier, an area array package, a chip scale package, or other semiconductor packaging structure.
- the semiconductor chip itself is the heat producing component.
- the hot device can be any hot device including, but not limited to, light emitting diodes, laser diodes, power amplifiers, MMIC's, IGBT's, etc.
- Composites are formed comprising two copper (Cu) substrates and a bulk graphene board disposed between the two metal layers.
- the bulk graphene material was thermal pyrolytic graphite.
- the bulk graphene board is oriented perpendicular to the Cu substrates so that the high thermal conductive path of the bulk graphene is aligned with the heat flow that comes through the layered structure.
- Ag—Cu with Ti additives is used to join the Cu and the bulk graphene at 850° C. under vacuum.
- the prepared samples have a construction similar to the embodiment depicted in FIG. 2 .
- the thickness of the bulk graphene ranged from 37% to 87% of the total thickness of the composite.
- the thermal conductivity of the composites is evaluated by Netzsch NanoFlash LFA 447.
- the overall thermal conductivity of the bulk graphene composite can be calculated as:
- FIG. 3 shows that the measured through-plane thermal conductivity with various bulk graphene loading matches the calculated value, indicating an excellent thermal bond between Cu and bulk graphene by employing the metal-based interlayer with the activating agent.
- the thermal resistance can be estimated by comparing the difference between the theoretical and experimental thermal conductivity, according to the following formula:
- R int t total k experimental - t total k theoretical where k is the thermal conductivity and t is the total thickness.
- FIG. 4-5 illustrates the thermal resistance of the composites formed according to aspects of the present invention.
- the present invention can provide composites with extremely low thermal resistance in the range of 10 ⁇ 7 K-m 2 /W, and that the resistance is independent of the amount of bulk graphene loading.
- FIG. 6 compares the thermal resistance of these composites to those in accordance with aspects of the invention, and illustrates that the comparative composites have a thermal resistance at least an order of magnitude higher than the composites formed in accordance with aspects of the present invention.
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Abstract
Description
where t is the thickness of individual layer and k is the corresponding thermal conductivity.
where, kc, km, kg are the thermal conductivity of composite, encapsulation material, and bulk graphene, respectively; and Vm, Vg are the volume (thickness) percentage of the substrate and bulk graphene, respectively.
where k is the thermal conductivity and t is the total thickness.
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US20220377912A1 (en) * | 2021-05-18 | 2022-11-24 | Mellanox Technologies, Ltd. | Process for laminating graphene-coated printed circuit boards |
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US12004308B2 (en) * | 2021-05-18 | 2024-06-04 | Mellanox Technologies, Ltd. | Process for laminating graphene-coated printed circuit boards |
US12163228B2 (en) | 2021-05-18 | 2024-12-10 | Mellanox Technologies, Ltd. | CVD system with substrate carrier and associated mechanisms for moving substrate therethrough |
US12221695B2 (en) | 2021-05-18 | 2025-02-11 | Mellanox Technologies, Ltd. | CVD system with flange assembly for facilitating uniform and laminar flow |
US11849536B1 (en) | 2022-10-12 | 2023-12-19 | Lunar Energy, Inc. | Gantry for thermal management |
US11889662B1 (en) * | 2022-10-12 | 2024-01-30 | Lunar Energy, Inc. | Thermal interface sandwich |
US11997812B2 (en) | 2022-10-12 | 2024-05-28 | Lunar Energy, Inc. | Cover for sealing a power module |
WO2024263886A1 (en) * | 2023-06-23 | 2024-12-26 | Momentive Performance Materials Quartz, Inc. | Thermal leveler blank for integration with thermal management |
Also Published As
Publication number | Publication date |
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WO2014052282A1 (en) | 2014-04-03 |
US20150253089A1 (en) | 2015-09-10 |
EP2901826A4 (en) | 2016-06-15 |
EP2901826B1 (en) | 2020-12-16 |
JP6529433B2 (en) | 2019-06-12 |
CN104813751A (en) | 2015-07-29 |
JP2015532531A (en) | 2015-11-09 |
EP2901826A1 (en) | 2015-08-05 |
CN104813751B (en) | 2019-12-31 |
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