TWM649878U - Integrated circuit test device - Google Patents

Abstract

The new model includes an operation mode switch, an input potential switch, a bipolar normally closed relay, an output voltage monitoring unit, a power unit and a status light unit that are electrically connected to a first IC connection port under test and a first Two IC connection ports to be tested, and the first IC connection port to be tested and the second IC connection port to be tested are connected in parallel; the first IC connection port to be tested has a plurality of conductive pads, and the second IC connection port to be tested is It has a plurality of conductive jacks; the status light unit generates an operation mode light signal according to an operation mode signal generated by the operation mode switch, and generates a potential level according to an input potential signal generated by the input potential switch. Light signal; an IC under test can be electrically connected to the first IC under test connection port or the second IC under test connection port to be detected.

Description

Integrated circuit test equipment

An integrated circuit testing device, particularly an integrated circuit testing device for communication interface.

In an industrial environment, most electrical equipment in factories need to use communication interfaces to communicate with each other, and these communication interfaces need to be maintained and repaired regularly to ensure that the communication and transmission signals between machines are normal. However, currently, the way to test communication interfaces is relatively crude, so detection is difficult and inefficient. For example, when testing whether the integrated circuit (IC) of the RS422/RS485 communication interface is operating normally, we currently face the following difficulties in testing:

1. The current test method is to insert the RS422/RS485 integrated circuit on the breadboard, and the component tester manually operates the breadboard to set up the circuit, such as setting up the power cord and input line (A, B) on the breadboard. , DATA), output lines (A, B, R), and after the test circuit generates the test signal to the RS422/RS485 communication interface, the output signal (A, B, R) is it normal? The process of manually setting up circuits on the breadboard is too cumbersome and prone to wiring errors. Therefore, detection is difficult and the detection efficiency is low.

2. Currently, breadboards only support the placement of dual in-line package (DIP) ICs, so the RS422/RS485 communication interface uses Surface Mount Device (SMD) ICs. When doing this, an additional adapter board needs to be set up on the breadboard before the SMD IC can be electrically connected to the circuit on the breadboard and tested. In this case, the communication interface measurement that requires an additional adapter board may be too inconvenient to use.

3. Furthermore, the above-mentioned breadboard only has an oscilloscope or a three-purpose electric meter to express the measurement results, so it cannot provide the following analysis information:

(a). It is impossible to intuitively tell whether the current RS422/RS485 integrated circuit operates in driving mode (also called transmitting mode) or receiving mode.

(b). It is impossible to intuitively distinguish whether the potential logic of the test signal currently input to the RS422/RS485 integrated circuit is high potential (H) or low potential (L).

In view of the above problems, the present invention provides an integrated circuit testing device. The integrated circuit testing device includes: an IC connection unit to be tested, having a first IC connection port to be tested and a second IC connection port to be tested; wherein the first IC connection port to be tested has a plurality of conductive pads chip, the second IC connection port to be tested has a plurality of conductive jacks; wherein the first IC connection port to be tested and the second IC connection port to be tested are connected in parallel; an operation mode switch is electrically connected to the first The IC connection port under test and the second IC connection port under test generate an operation mode signal; an input potential switch electrically connects the first IC connection port under test and the second IC connection port under test to generate an input Potential signal; a differential signal input port for receiving a differential signal; a bipolar normally closed relay, electrically connected between the differential signal input port and the IC connection unit to be tested, and electrically connected to the first IC to be tested The test IC connection port and the second test IC connection port; an output voltage monitoring unit, electrically connected to the first test IC connection port and the second test IC connection port; a power unit, electrically connected to the first test IC connection port The test IC connection port and the second IC connection port to be tested are electrically connected to the operation mode switch, the input potential switch and the output voltage monitoring unit respectively, and provide a power signal; a status light unit is electrically connected to the third An IC connection port to be tested, the second IC connection port to be tested, the operation mode switch, the input potential switch, the bipolar normally closed relay and the power unit, and separately An operating mode light signal is generated according to the operating mode signal, and a potential high and low light signal is generated according to the input potential signal.

The integrated circuit test device of the present invention is a self-contained test device, so the user can electrically connect an integrated circuit (IC) under test to the first IC under test connection port or the second IC under test connection port It can be used directly in the port, and users do not need to spend time building the IC test circuit on the breadboard as in the previous technology. For example, when the IC under test is a surface mount IC, the IC under test can be adhered to the conductive pads of the first IC under test connection port. When the IC under test is a plug-in IC, the IC The IC under test can be inserted into the conductive jacks of the connection port of the second IC under test. In this way, the IC under test connection unit can directly accept the plug-in or surface-mounted RS422/RS485 IC under test for testing, thereby overcoming the difficulty of requiring an additional adapter board in the previous technology. Furthermore, according to the operating mode light signal and the potential high and low light signal displayed by the status light unit, the user can clearly and intuitively distinguish the operating mode of the IC under test being tested, such as the RS422/RS485. Whether the IC under test operates in a driving mode (also called a transmitting mode) or a receiving mode, and whether the input potential signal input to the IC under test is a high potential (H) mode or a low potential (L) mode. Based on the above advantages, the new integrated circuit testing device of the present invention can help users improve the efficiency of testing whether the IC under test is operating normally, and improve the overall efficiency of industrial inspection of many types of IC under test.

1: Carrier board

8:Power light

10: IC connection unit under test

11: The first IC connection port under test

12: Second IC port under test

20:Power unit

30: Operation mode switch

31:Power contact

32: middle end

33: Ground contact

40: Input potential switch

41: High potential end

42: Intermediate logical end

43: Low potential end

50: Differential signal input port

60: Bipolar normally closed relay

61:Control terminal

70: Output voltage monitoring unit

71: Output voltage selection switch

71A: First differential signal terminal

71B: Second differential signal terminal

71M: Middle meter terminal

71R: Logic end

72: Electric meter

73:Output terminal

80: Status light unit

81: First differential signal light

82: Second differential signal light

83: Logic output light

84: Receive mode LED light

85: Drive mode light

86: Enable low potential lamp

87: Enable high potential lamp

88:Low potential LED light

89:High potential LED light

100: IC to be tested

101: Logic output pin

102: Enable low potential pin

103: Enable high potential pin

104: Logic input pin

105: Ground pin

106: First differential signal pin

107: Second differential signal pin

108:Power pin

110:Conductive gasket

120: Conductive jack

GND: ground terminal

Figure 1 is a block diagram of the new integrated circuit testing device.

Figure 2 is an appearance view of the integrated circuit testing device of the present invention.

Figure 3 is a circuit diagram of the integrated circuit testing device of the present invention.

Figure 4 is a schematic diagram of the pins of an IC under test tested by the integrated circuit test device of the present invention.

Referring to Figures 1 and 2, the present invention provides an integrated circuit (Integrated Circuit; IC) testing device. The integrated circuit testing device includes an IC connection unit 10 to be tested, a power unit 20, An operation mode switch 30 , an input potential switch 40 , a differential signal input port 50 , a bipolar normally closed relay 60 , an output voltage monitoring unit 70 and a status light unit 80 .

The IC under test connection unit 10 has a first IC under test connection port 11 and a second IC under test connection port 12 . The first IC connection port 11 to be tested has a plurality of conductive pads 110 , and the second IC connection port 12 to be tested has a plurality of conductive jacks 120 . The conductive pads 110 are for a Surface-Mount Device (SMD) integrated circuit to be adhered, and the conductive jacks 120 are for a straight-in integrated circuit to be inserted, wherein the straight-in IC is It is called a dual in-line package (Dual In-line Package; DIP) IC. When an IC 100 under test is electrically connected to the conductive pads 110 of the first IC connection port 11 or the conductive jacks 120 of the second IC connection port 12 , the present invention can detect Test IC100. Furthermore, the power unit 20 , the operation mode switch 30 , the input potential switch 40 , the bipolar normally closed relay 60 , the output voltage monitoring unit 70 and the status light unit 80 are respectively connected in parallel to the first IC under test. The connection port 11 and the second IC under test connection port 12. The user can electrically connect the IC under test 100 that he wants to test to the corresponding first IC under test connection port 11 or the IC according to whether the IC under test 100 is of a plug-in or surface-mounted design. The second IC under test is connected to port 12.

In one embodiment, the first IC connection port 11 under test has eight conductive pads 110 , and the second IC connection port 12 also has eight conductive jacks 120 . The IC under test 100 supported by the IC under test connection unit 10 is an integrated circuit chip with an RS422/RS485 communication interface, and is, for example, the SNX5176B series, DS96176CN, SP481E, SP485E, MAX3471, LTC285X series, etc., and meets the pin definitions in the following table Bits of any RS422/RS485 integrated circuit:

The eight conductive pads 110 of the first IC connection port 11 under test and the eight conductive jacks 120 of the second IC connection port 12 are designed to be connected to the IC connection unit 10 The corresponding positions in are electrically connected to the 8 pins of the IC100 under test listed in Table 1. In addition, the operation mode switching switch 30 , the input potential switching switch 40 and the output voltage monitoring unit 70 are respectively electrically connected to the IC connection unit 10 under test. The operation mode switch 30 generates an operation mode signal to the IC connection unit 10 under test, and the input potential switch 40 generates an input potential signal to the IC connection unit 10 under test.

The differential signal input port 50 is used to receive a differential signal generated by an external device, and the differential signal input port 50 sends the differential signal to the bipolar normally closed relay 60 . The bipolar normally closed relay 60 is electrically connected between the differential signal input port 50 and the IC connection unit 10 under test.

The power unit 20 is electrically connected to an external power source to receive a power signal from the external power source, and the power unit 20 is electrically connected to the IC connection unit 10 to be tested, the operation mode switch 30 , the input potential switch 40 and the The output voltage monitoring unit 70 is used to provide the power signal to the IC connection unit 10 under test, the operation mode switch 30 , the input potential switch 40 and the output voltage monitoring unit 70 . In one embodiment, the power signal supplied by the power unit 20 is a 5 volt (Volt; V) power signal.

The status light unit 80 is electrically connected to the IC connection unit 10 to be tested, the power unit 20, the operation mode switch 30, the input potential switch 40 and the bipolar normally closed relay 60, respectively. And the status light unit 80 generates an operation mode light signal according to the operation mode signal and a potential high and low light signal according to the input potential signal.

When the IC under test connection unit 10 is electrically connected to the IC under test 100 , the power unit 20 provides the power signal to the IC under test 100 , the operation mode switch 30 outputs the operation mode signal to the IC under test 100 , and the input The potential switching switch 40 outputs the input potential signal to the IC 100 under test, and the bipolar normally closed relay 60 sends the differential signal received by the differential signal input port 50 to the IC 100 under test. In this way, the IC 100 under test can be tested by the present invention to generate and output an output voltage. The output voltage monitoring unit 70 senses the output voltage generated by the IC 100 under test to generate and display a voltage value.

The integrated circuit testing device of the present invention is a self-contained testing device. A user of the present invention can directly use the present invention to test the IC 100 under test by electrically connecting the IC 100 under test in the IC under test connection unit 10 . Therefore, the user does not need to spend time building the IC by himself as in the previous technology. Test the circuit on a breadboard. Moreover, as mentioned above, the IC under test connection unit 10 can accept in-line or surface-mounted RS422/RS485 ICs under test for electrical connection. Therefore, this new model overcomes the need for an additional adapter board for electrical connection in the previous technology. Difficulties with surface mount ICs under test. Furthermore, according to the operating mode light signal and the potential high and low light signal displayed by the status light unit 80 of the present invention, the user can clearly and intuitively identify the operating mode of the IC 100 under test being tested, such as RS422 / Whether the IC 100 under test of RS485 will operate in driving mode (also called transmitting mode) or receiving mode, and whether the input potential signal input to the IC under test is in high potential (H) mode or low potential (L) mode model. Based on the above advantages, the new integrated circuit testing device of the present invention can help users improve the efficiency of testing whether the IC under test is operating normally, and improve the overall efficiency of industrial inspection of many types of IC under test.

Please refer to FIG. 2 and FIG. 3 together. In an embodiment of the present invention, the aforementioned IC connection unit 10 under test, the power unit 20, the operation mode switch 30, and the input potential switch 40. The differential signal input port 50 , the bipolar normally closed relay 60 , the output voltage monitoring unit 70 and the status light unit 80 are all arranged on a carrier board 1 .

As shown in FIG. 3 , the first IC under test connection port 11 and the second IC under test connection port 12 receive the pins of the IC under test 100 and are connected to each other in parallel on the line. The first IC under test connection port 11 and the second under test IC connection port 12 receive the pins electrically connected to the IC under test 100 in the same arrangement, so whether the IC under test 100 is electrically connected to the first IC under test The connection port 11 or the second IC under test connection port 12 and the IC under test 100 can be electrically connected to other components of the present invention in the same manner. In the examples shown in FIGS. 2 and 3 , the IC under test 100 is inserted into the second IC connection port 12 , but the IC 100 under test is not inserted into the first IC connection port 11 .

Please refer to Figures 3 and 4. As mentioned above, preferably, the IC 100 under test includes a logic output pin 101, a consistent low-potential pin 102, a consistent high-potential pin 103, and a logic output pin 101. Input pin 104, a ground pin 105, a first differential signal pin 106, a second differential signal pin 107 and a power pin 108.

When the IC under test 100 is electrically connected to the first IC under test connection port 11 or the second IC under test connection port 12, the pins of the IC under test 100 will have the following electrical connection mode: the enable low potential The pin 102 and the enable high potential pin 103 are electrically connected to the operation mode switch 30 to receive the operation mode signal, and the enable low potential pin 102 and the enable high potential pin 103 are also electrically connected to this state. Lamp unit 80. The logic input pin 104 is electrically connected to the input level switch 40 to receive the input level signal, and the logic input pin 104 is also electrically connected to the status light unit 80 . The ground pin 105 is electrically connected to a ground terminal GND. The first differential signal pin 106 and the second differential signal pin 107 of the IC under test are respectively electrically connected to the bipolar normally closed relay 60 to receive the differential signal, and the first differential signal pin 106 and the second differential signal pin 107 are also electrically connected to the status light unit 80 respectively. The power pins 108 are respectively electrically connected to the power unit 20 to receive the power signal, and the power pins 108 are also electrically connected to the status light unit 80 . The logic output pin 101 of the IC under test, the first difference The dynamic signal pin 106 and the second differential signal pin 107 are respectively electrically connected to the output voltage monitoring unit 70, and the output voltage monitoring unit 70 senses the logic output pin 101 of the IC 100 under test. Output voltage to generate and display the voltage value.

In addition, the differential signal input from the differential signal input port 50 includes a first differential signal and a second differential signal, and the potentials of the first differential signal and the second differential signal are different. Moreover, the status light unit 80 includes a power light 8, a first differential signal light 81, a second differential signal light 82, a logic output light 83, a receiving mode LED light 84, a driving mode light 85, A uniform energy low potential lamp 86, a uniform energy high potential lamp 87, a low potential LED lamp 88 and a high potential LED lamp 89. Preferably, the power light 8, the first differential signal light 81, the second differential signal light 82, the logic output light 83, the driving mode light 85, the enable low potential light 86 and the enable The high potential lamps 87 are all LED lamps. Moreover, each of the power lamp 8, the first differential signal lamp 81, the second differential signal lamp 82, the logic output lamp 83, the driving mode lamp 85, the enabled low potential lamp 86, the enabled high voltage lamp The cathodes of the potential lamp 87 and the high potential LED lamp 89 are electrically connected to the ground terminal GND. Each of the power light 8, the first differential signal light 81, the second differential signal light 82, the logic output light 83, the receiving mode LED light 84, the driving mode light 85, and the enabling low potential light 86 The anodes of the enabled high-potential lamp 87, the low-potential LED lamp 88 and the high-potential LED lamp 89 are respectively planned to be connected in series with a buffer resistor before further electrically connecting to other components of the present invention to protect the LED lamps from being damaged. Overvoltage damage.

The first differential signal lamp 81 and the first differential signal pin 106 of the IC 100 under test are electrically connected to the bipolar normally closed relay 60 . When the first differential signal pin 106 receives the first differential signal from the bipolar normally closed relay 60 , the first differential signal lamp 81 also receives the first differential signal and lights up. The second differential signal light 82 and the second differential signal pin 107 of the IC 100 under test are electrically connected to the bipolar normally closed relay 60 . When the second differential signal pin 107 receives the second differential signal from the bipolar normally closed relay 60 , the second differential signal lamp 82 also receives the second differential signal and lights up.

The power lamp 8 is electrically connected to the power unit 20 with the power pin 108 of the IC 100 under test. When the power pin 108 receives the power signal from the power unit 20, the power lamp 8 also receives the power signal from the power unit 20. The power signal lights up.

The logic output lamp 83 is electrically connected to the output voltage monitoring unit 70 with the logic output pin 101 of the IC 100 under test. When the logic output pin 101 outputs the output voltage, the logic output lamp 83 also receives the output. lights up due to voltage.

Further, the operation mode switch 30 includes a power contact 31, an intermediate terminal 32 and a ground contact 33. The power contact 31 is electrically connected to the power unit 20, and the ground contact 33 is electrically connected to the ground terminal GND. The anode of the receiving mode LED lamp 84 is electrically connected to the power unit 20 , and the cathode of the receiving mode LED lamp 84 is electrically connected to the intermediate end 32 of the operating mode switch 30 . The anode of the driving mode lamp 85 is electrically connected to a control terminal 61 of the bipolar normally closed relay 60 and the intermediate terminal 32 of the operation mode switch 30 . In other words, the intermediate terminal 32 of the operation mode switch 30 is also electrically connected to the control terminal 61 of the bipolar normally closed relay 60 . Moreover, the enabled high-potential lamp 87 is electrically connected to the enabled low-potential lamp 86, the intermediate terminal 32 of the operation mode switch 30, the enabled low-potential pin 102 of the IC under test 100 and the enabled high-potential terminal. Feet103.

In this way, when the operation mode switch 30 conducts the intermediate terminal 32 and the ground contact 33, the power signal flows from the power unit 20 through the reception mode LED light 84 to the ground contact 33 to cause the reception Mode LED 84 lights up. In other words, the above can be regarded as the intermediate terminal 32 of the operation mode switch 30 outputs the operation mode signal to cause the reception mode LED light 84 to light up, and the operation mode light signal turns on the reception mode LED light 84 . Furthermore, the driving mode lamp 85 will not light up due to a short circuit due to the ground terminal GND being directly electrically connected to the ground contact 33 . Also due to the short circuit, the intermediate terminal 32 of the operating mode switch 30 will not generate any signal to the control terminal 61 of the bipolar normally closed relay 60, and the enabled low potential lamp 86 and the enabled high potential The lamp 87 will not be energized and will be extinguished. Thereby, the bipolar normally closed relay 60 can be switched on when the control terminal 61 does not receive any signal. It is turned on to transmit the first differential signal and the second differential signal of the differential signal to the first differential signal pin and the second differential signal pin of the IC under test respectively. In this way, the present invention can inform the user of the IC 100 under test by turning on the receiving mode LED light 84 and turning off the driving mode light 85, the enabling low potential light 86 and the enabling high potential light 87. is in a receive mode. Under this receiving mode, the present invention supplies the first differential signal and the second differential signal to the IC 100 under test through the bipolar normally closed relay 60, so that the IC 100 under test receives the first differential signal and the second differential signal. The second differential signal is used to perform related electrical tests on the IC 100 under test.

On the contrary, when the operation mode switch 30 turns on the intermediate terminal 32 and the power contact 31, the receiving mode LED lamp 84 is directly electrically connected to the intermediate terminal 32 by the power contact 31 and is short-circuited and extinguished, and the driving mode LED light 84 is turned off. The lamp 85 is no longer illuminated by a short circuit. In other words, the above can be regarded as the intermediate terminal 32 of the operation mode switch 30 outputs the operation mode signal to cause the drive mode light 85 to light up, and the operation mode light signal turns on the drive mode light 85 . Moreover, the intermediate terminal 32 generates a driving mode signal to the control terminal 61 of the bipolar normally closed relay 60, so that the bipolar normally closed relay 60 stops conducting the first circuit when receiving the driving mode signal from the control terminal 61. The differential signal and the second differential signal are sent to the first differential signal pin and the second differential signal pin of the IC under test. The intermediate end 32 also generates an enable potential signal to the enable low potential pin 102 and the enable high potential pin 103 of the IC under test 100, and the enable low potential lamp 86 and the enable high potential lamp 87 A consistent energy potential light signal is generated according to the enabling potential signal. In other words, because the enabled low-potential lamp 86 and the enabled high-potential lamp 87 are at the same potential, they will light up at the same time when they receive the enabled potential signal. In this way, the present invention can inform the user through the driving mode light 85 that lights up, the enabling low potential light 86 and the enabling high potential light 87 that light up together, and the receiving mode LED light 84 that goes out. The IC 100 under test is now in a driving mode. Under this driving mode, the IC 100 under test will output its own signals from the first differential signal pin 106 and the second differential signal pin 107 , so the present invention will use the bipolar normally closed relay 60 Automatically stop supplying the first differential signal and the second differential signal to the IC 100 under test to avoid interfering with the IC 100 under test from the first differential signal. The output of the differential signal pin 106 and the second differential signal pin 107 . The signals output by the IC under test 100 from the first differential signal pin 106 and the second differential signal pin 107 can still be sensed through the electrically connected output voltage monitoring unit 70 .

The aforementioned operating mode light signal generated by the present invention refers to the receiving mode LED light 84 or the driving mode light 85 lit by the status light unit 80, and the aforementioned operating mode switch 30 generates the receiving mode LED light 84 or the driving mode light 85. The operation mode signal is a signal formed when the intermediate end 32 of the operation mode switch 30 selects to conduct the power contact 31 or the ground contact 33 .

In addition, the input level switching switch 40 includes a high potential terminal 41 , an intermediate logic terminal 42 and a low potential terminal 43 . The high potential terminal 41 is electrically connected to the power unit 20 , the low potential terminal 43 is electrically connected to the ground terminal GND, and the intermediate logic terminal 42 is electrically connected to the logic input pin 104 of the IC 100 under test. Furthermore, the anode of the low-potential LED lamp 88 is electrically connected to the power unit 20 , and the cathode of the low-potential LED lamp 88 is electrically connected to the intermediate logic terminal 42 of the input potential switching switch 40 . The anode of the high potential LED lamp 89 and the intermediate logic terminal 42 of the input potential switch 40 are electrically connected to the logic input pin 104 of the IC 100 under test. The cathode of the high potential LED lamp 89 is electrically connected to the ground terminal GND.

In this way, when the input potential switch 40 turns on the intermediate logic terminal 42 and the low potential terminal 43, the power signal will flow from the power unit 20 through the low potential LED lamp 88 and then directly pass through the input potential switch. The low potential terminal 43 of 40 flows to the ground terminal GND. Therefore, the low-potential LED light 88 will light up, the high-potential LED light 89 will be short-circuited and extinguished, and the logic input pin 104 of the IC under test 100 will also be in a low-potential state due to the short circuit. In other words, the above can be regarded as the intermediate logic terminal 42 of the input potential switching switch 40 outputs the input potential signal to cause the low-potential LED light 88 to light up, and the potential high and low light signals light up the low-potential LED light 88 .

When the input potential switching switch 40 turns on the intermediate logic terminal 42 and the high potential terminal 41, the power signal will directly flow from the power unit 20 through the high potential terminal 41 and the intermediate logic terminal 42, causing the low potential to The LED lamp 88 is extinguished by a short circuit, and the high-potential LED lamp 89 is stopped from being illuminated by a short circuit. The logic input pin 104 of the IC under test 100 directly receives the power signal from the power unit 20 and is in a high potential state. In other words, the above can be regarded as the intermediate logic terminal 42 of the input potential switch 40 outputs the input potential signal to cause the high-potential LED light 89 to light up, and the high-potential light signal causes the high-potential LED light 89 to light up. . The user of the present invention can easily know whether the logic input pin 104 of the IC 100 under test is in a low potential state or a high potential state by watching the on and off states of the low potential LED light 88 and the high potential LED light 89 .

In this embodiment, the operation mode switch 30 and the input potential switch 40 are both dip switches. The user of the present invention can easily operate the operation mode switch 30 and the input level switch 40 and watch the corresponding light signals to know the current status of the IC 100 under test.

Further, the output voltage monitoring unit 70 includes an output voltage selection switch 71 , an electric meter 72 and an output terminal 73 . The output terminal 73 is electrically connected to the first differential signal pin 106, the second differential signal pin 107 and the logic output pin 101 of the IC 100 under test respectively, and the output terminal 73 outputs the first differential signal pin 106, the second differential signal pin 107, and the logic output pin 101. The signal, the second differential signal and the output voltage of the IC under test are sent to another external device, such as an oscilloscope, to facilitate the user to use more analysis tools to monitor changes in the voltage waveform generated by the IC under test 100 . Moreover, the electric meter 72 has a display screen, and the display screen is disposed on the carrier board 1 to display the value of the measured voltage.

The output voltage selection switch 71 has an intermediate meter terminal 71M, a first differential signal terminal 71A, a second differential signal terminal 71B and a logic terminal 71R. The first differential signal terminal 71A is electrically connected to the first differential signal pin 106, the second differential signal terminal 71B is electrically connected to the second differential signal pin 107, and the logic terminal 71R is electrically connected to the logic output Pin 101. The electric meter 72 is electrically connected to the middle electric meter terminal 71M of the output voltage selection switch 71 .

When the output voltage selection switch 71 turns on the intermediate meter terminal 71M and the logic terminal 71R, the electricity meter 72 senses the output voltage through the output voltage selection switch 71 to generate and display the voltage. value. When the output voltage selection switch 71 conducts the intermediate meter terminal 71M and the first differential signal terminal 71A, the electricity meter 72 senses the voltage of the first differential signal through the output voltage selection switch 71 and displays the voltage corresponding to the first differential signal. The voltage value of the differential signal. When the output voltage selection switch 71 conducts the intermediate meter terminal 71M and the second differential signal terminal 71B, the electricity meter 72 senses the voltage of the second differential signal through the output voltage selection switch 71 and displays the voltage corresponding to the second differential signal. 2. The voltage value of the differential signal. In this way, the user of the present invention can select the voltage value sensed by the electric meter 72 by operating the output voltage selection switch 71, and such an easy switching method helps the user to efficiently measure the voltage to be measured. Various electrical response values of IC100. In this embodiment, the output voltage selection switch 71 is a rotary switch. The user can rotate the output voltage selection switch 71 to selectively conduct the first differential signal terminal 71A, the second differential signal terminal 71B or It is from the logic terminal 71R to the electric meter 72 that the potential is measured.

Please see the information in the table below:

The potential information defined in Table 2 and Table 3 are the potential information of the IC 100 under test in the conventional RS422/RS485 integrated circuit in driving mode and receiving mode respectively. According to the background information provided in Tables 2 and 3, when the user electrically connects the IC under test 100 to the IC under test connection unit 10, the actual test situation of the present invention is as follows:

Scenario 1: The user turns down the operation mode switch 30 and the input potential switch 40, and turns the output voltage selection switch 71 to the first differential signal terminal 71A. At this time, the power lamp 8, the first The differential signal light 81, the driving mode light 85, the enabled low-potential light 86, the enabled high-potential light 87 and the high-potential LED light 89 light up, and the second differential signal light 82, the logic output The lamp 83, the receiving mode LED lamp 84 and the low potential LED lamp 88 are turned off. Moreover, the electric meter 72 of the output voltage monitoring unit 70 displays a voltage value of 3.4V (high potential). The user can easily know the test situation of Situation 1 through the on and off of each light signal, and easily and efficiently read the voltage result output by the IC 100 under test through the meter 72 .

Scenario 2: The user keeps turning down the operation mode switch 30 and the input potential switch 40, and turns the output voltage selection switch 71 to the second differential signal terminal 71B. At this time, the power lamp 8, the third A differential signal light 81, the driving mode light 85, the enabled low-potential light 86, the enabled high-potential light 87 and the high-potential LED light 89 light up, and the second differential signal light 82, the logic The output lamp 83, the receiving mode LED lamp 84 and the low potential LED lamp 88 are turned off. Furthermore, the electric meter 72 of the output voltage monitoring unit 70 displays a voltage value of 0.5V (low potential). In other words, when the operation mode switch 30 and the input potential switch 40 remain turned down, the conditions for testing the IC 100 under test in the present invention do not change, although the first differential signal lamp 81 is still at a high potential. is on, the second differential signal light 82 is still at a low potential and goes out. The difference from the first situation is that in the second situation, the electric meter 72 measures and displays the potential of the second differential signal pin 107 of the IC 100 under test, and it can be seen that it is in a low potential state.

Scenario 3: The user turns down the operation mode switch 30, turns up the input potential switch 40, and turns the output voltage selector switch 71 to the first differential signal terminal 71A. At this time, the power light 8, the The second differential signal light 82, the driving mode light 85, the enabled low-potential light 86, the enabled high-potential light 87 and the low-potential LED light 88 light up, and the first differential signal light 81, the The logic output light 83, the reception mode LED light 84 and the high potential LED light 89 are turned off. Furthermore, the electric meter 72 of the output voltage monitoring unit 70 displays a voltage value of 0.5V (low potential). In other words, the second differential signal lamp 82 is at a high potential and lights up, the first differential signal lamp 81 is at a low potential and is extinguished, and the electric meter 72 measures and displays the first differential signal of the IC 100 under test. The potential of the signal pin 106 is shown to be in a low potential state.

Scenario 4: The user keeps turning down the operation mode switch 30, turns up the input potential switch 40, and turns the output voltage selection switch 71 to the second differential signal terminal 71B. At this time, the power light 8, The second differential signal light 82, the driving mode light 85, the enabled low-potential light 86, the enabled high-potential light 87 and the low-potential LED light 88 light up, and the first differential signal light 81, The logic output light 83, the receiving mode LED light 84 and the high potential LED light 89 are turned off. Moreover, the electric meter 72 of the output voltage monitoring unit 70 displays a voltage value of 3.4V (high potential). In other words, the second differential signal lamp 82 continues to be at a high potential and lights up, the first differential signal lamp 81 continues to be at a low potential and goes out, and the electric meter 72 measures and displays the second voltage of the IC 100 under test. The potential of the differential signal pin 107, and it can be seen that it is in a high potential state.

The above situations 1 to 4 are completely consistent with the potential results defined in Table 2. It can be seen that the integrated circuit testing device of the present invention can be used to accurately test the operating status of the driving mode of the IC 100 under test. Further, the user can perform the following tests on the receiving mode of the IC100 under test:

Scenario 5: The differential signal input to the IC 100 under test is a voltage greater than or equal to 0.2V. That is to say, the first differential signal input to the first differential signal pin 106 is equal to the voltage input to the first differential signal pin 106 . The second differential signal of the second differential signal pin 107 has a voltage difference of at least 0.2V. and the user Turn the operation mode switch 30 up, turn the input potential switch 40 down, and turn the output voltage selection switch 71 to the logic terminal 71R. At this time, the power light 8, the logic output light 83, and the reception mode LED light 84 and the high-potential LED light 89 light up, and the first differential signal light 81, the second differential signal light 82, the driving mode light 85, the enabled low-potential light 86, and the enabled high-potential light 87 and the low potential LED light 88 go out. Moreover, the electric meter 72 of the output voltage monitoring unit 70 displays a voltage value of 3.4V (high potential). In other words, through the matching of the resistances corresponding to the first differential signal lamp 81 and the second differential signal lamp 82, the first differential signal lamp 81 and the second differential signal lamp 82 will not be in the receiving mode. lights up. The enabled low potential lamp 86 and the enabled high potential lamp 87 will be extinguished because they are at a low potential. Moreover, the logic output light 83 lights up because the logic output pin 101 is at a high potential. The electric meter 72 measures and displays the potential of the logic output pin 101 of the IC 100 under test, and it can be seen that it is at a high potential. condition.

Scenario 6: The differential signal input to the IC 100 under test is a voltage less than or equal to -0.2V. That is to say, the first differential signal input to the first differential signal pin 106 is equal to the voltage input to the first differential signal pin 106 . The second differential signal of the second differential signal pin 107 has a voltage difference of -0.2V at most. And the user keeps turning up the operation mode switch 30, turns down the input level switch 40, and turns the output voltage selection switch 71 to the logic terminal 71R. At this time, the power light 8 and the reception mode LED light 84 and the high-potential LED light 89 lights up, and the first differential signal light 81, the second differential signal light 82, the logic output light 83, the driving mode light 85, the enabled low-potential light 86, the The high potential lamp 87 is enabled and the low potential LED lamp 88 is turned off. Furthermore, the electric meter 72 of the output voltage monitoring unit 70 displays a voltage value of 0.0V (low potential). In other words, the logic output light 83 is turned off because the logic output pin 101 is at a low potential. The electric meter 72 measures and displays the potential of the logic output pin 101 of the IC 100 under test, and it can be seen that it is in a low potential state. .

The above situations 5 and 6 are completely consistent with the potential results defined in Table 3. It can be seen that the integrated circuit testing device of the present invention can be used to accurately test the operating status of the receiving mode of the IC 100 under test.

1: Carrier board

8:Power light

11: The first IC connection port under test

12: Second IC port under test

20:Power unit

30: Operation mode switch

31:Power contact

33: Ground contact

40: Input potential switch

41: High potential end

43: Low potential end

50: Differential signal input port

60: Bipolar normally closed relay

71: Output voltage selection switch

71A: First differential signal terminal

71B: Second differential signal terminal

71R: Logic end

72: Electric meter

73:Output terminal

81: First differential signal light

82: Second differential signal light

83: Logic output light

84: Receive mode LED light

85: Drive mode light

86: Enable low potential lamp

87: Enable high potential lamp

88:Low potential LED light

89:High potential LED light

100: IC to be tested

110:Conductive gasket

Claims (10)

An integrated circuit testing device, including: an IC connection unit to be tested, having a first IC connection port to be tested and a second IC connection port to be tested; wherein the first IC connection port to be tested has a plurality of conductive pads chip, the second IC connection port to be tested has a plurality of conductive jacks; wherein the first IC connection port to be tested and the second IC connection port to be tested are connected in parallel; An operation mode switch is electrically connected to the first IC connection port under test and the second IC connection port under test to generate an operation mode signal; An input potential switching switch electrically connects the first IC connection port under test and the second IC connection port under test to generate an input potential signal; a differential signal input port for receiving a differential signal; A bipolar normally closed relay is electrically connected between the differential signal input port and the IC connection unit under test, and is electrically connected between the first IC connection port under test and the second IC connection port under test; an output voltage monitoring unit electrically connected to the first IC connection port to be tested and the second IC connection port to be tested; A power unit, electrically connected to the first IC connection port to be tested and the second IC connection port to be tested, electrically connected to the operation mode switch, the input potential switch and the output voltage monitoring unit respectively, and providing a power signal ; A status light unit electrically connected to the first IC connection port to be tested, the second IC connection port to be tested, the operation mode switch, the input potential switch, the bipolar normally closed relay and the power unit, and respectively An operating mode light signal is generated according to the operating mode signal, and a potential high and low light signal is generated according to the input potential signal. The integrated circuit testing device as claimed in claim 1, wherein when an integrated circuit (IC) under test is electrically connected to the conductive pads of the first IC under test connection port or the second IC under test is connected When the conductive jacks of the port are connected, the power unit provides the power signal to the IC under test, the operation mode switch outputs the operation mode signal to the IC under test, and the input potential switch outputs the input potential signal to the To the IC under test, the bipolar normally closed relay sends the differential signal received by the differential signal input port to the IC under test; Wherein, the output voltage monitoring unit senses an output voltage generated by the IC under test to generate and display a voltage value. The integrated circuit testing device as described in claim 2, wherein the IC under test connection unit is the IC under test that is connected to RS422/RS485 for power supply, and the IC under test includes a logic output pin, a consistent low-potential contact pin, a consistent high potential pin, a logic input pin, a ground pin, a first differential signal pin, a second differential signal pin and a power pin; Wherein, when the IC under test connection unit is electrically connected to the IC under test, the power pins of the IC under test are electrically connected to the power unit to receive the power signal; the power pins are electrically connected to the status light unit; The ground pin of the IC under test is electrically connected to a ground terminal; the logic input pin of the IC under test is electrically connected to the input potential switch to receive the input potential signal; the logic input pin is also electrically connected to the status light unit; the enable low-potential pin and the enable high-potential pin of the IC under test are electrically connected to the operation mode switch to receive the operation mode signal; the enable low-potential pin and the enable high-potential pin The pin is electrically connected to the status light unit; the first differential signal pin and the second differential signal pin of the IC under test are electrically connected to the bipolar normally closed relay respectively to receive the differential signal; the first differential signal pin is electrically connected to the bipolar normally closed relay. The dynamic signal pin and the second differential signal pin are electrically connected to the status light unit respectively; the logic output pin of the IC under test, the first differential signal pin and the second differential signal pin are respectively The output voltage monitoring unit is electrically connected; the output voltage monitoring unit senses the output voltage output by the logic output pin of the IC under test to generate and display the voltage value. The integrated circuit testing device as claimed in claim 3, wherein the differential signal includes a first differential signal and a second differential signal, and the first differential signal and the second differential signal have different potentials. ; Among them, the status light unit includes: A first differential signal lamp electrically connected to the first differential signal pin of the IC under test and the bipolar normally closed relay; wherein, when the first differential signal pin receives from the bipolar normally closed relay When the first differential signal is received, the first differential signal light lights up; A second differential signal light electrically connected to the second differential signal pin of the IC under test and the bipolar normally closed relay; wherein, when the first differential signal pin receives from the bipolar normally closed relay When the second differential signal is detected, the second differential signal light lights up; A power light electrically connected to the power pin of the IC under test and the power unit; wherein, when the power pin receives the power signal from the power unit, the power light lights up; A logic output light is electrically connected to the logic output pin of the IC under test and the output voltage monitoring unit; wherein, when the logic output pin outputs the output voltage, the logic output light lights up. The integrated circuit testing device as described in claim 3, wherein the operation mode switch includes a power contact, an intermediate terminal and a ground contact, the power contact is electrically connected to the power unit, and the ground contact is electrically connected the ground terminal; Among them, the status light unit includes: A receiving mode LED lamp includes an anode and a cathode; wherein, the anode is electrically connected to the power unit, and the cathode is electrically connected to the intermediate end of the operation mode switch; A driving mode light electrically connected to the bipolar normally closed relay and the intermediate end of the operation mode switch; Wherein, when the operation mode switching switch conducts the intermediate terminal and the ground contact, the operation mode switching switch outputs the operation mode signal to cause the receiving mode LED light to light up, and the operating mode light signal lights up the receiving mode LED light. , and when the operation mode switch connects the intermediate terminal and the power contact, the operation mode switch outputs the operation mode signal to cause the drive mode light to light up, and the operation mode light signal lights up the drive mode light. The integrated circuit testing device as claimed in claim 5, wherein the status light unit includes: Consistent energy low potential lamp; A consistent high-potential lamp is electrically connected to the enabled low-potential lamp, the intermediate terminal of the operation mode switch, the enabled low-potential pin and the enabled high-potential pin of the IC under test; Wherein, when the operation mode switch switches on the intermediate terminal and the power contact, the enabled low potential pin and the enabled high potential pin of the IC under test receive the intermediate terminal of the operation mode switch. A consistent energy potential signal is generated, and the enabled low potential lamp and the enabled high potential lamp generate a consistent energy potential light signal according to the enabled potential signal. The integrated circuit testing device as claimed in claim 5, wherein the intermediate terminal of the operation mode switch is electrically connected to the bipolar normally closed relay; Wherein, when the operation mode switch switches on the intermediate terminal and the power contact, the intermediate terminal generates a drive mode signal to the bipolar normally closed relay, causing the bipolar normally closed relay to stop conducting the differential signal to the the first differential signal pin and the second differential signal pin of the IC under test; Wherein, when the operation mode switching switch conducts the intermediate terminal and the ground contact, the intermediate terminal does not generate the drive mode signal to the bipolar normally closed relay, causing the bipolar normally closed relay to conduct the differential signal to the The first differential signal pin and the second differential signal pin of the IC under test. The integrated circuit testing device as claimed in claim 3, wherein the input potential switching switch includes a high potential end, an intermediate logic end and a low potential end, the high potential end is electrically connected to the power unit, and the low potential end is electrically connected to the power unit. Connect the ground terminal, and the intermediate logic terminal is electrically connected to the logic input pin of the IC under test; Among them, the status light unit includes: A low-potential LED lamp includes an anode and a cathode; wherein, the anode of the low-potential LED lamp is electrically connected to the power unit, and the cathode of the low-potential LED lamp is electrically connected to the intermediate logic end of the input potential switching switch; A high-potential LED lamp includes an anode and a cathode; wherein, the anode of the high-potential LED lamp and the intermediate logic terminal of the input potential switch are connected in parallel with the logic input pin of the IC under test, and the high-potential LED The cathode of the lamp is electrically connected to the ground terminal; Wherein, when the input potential switching switch conducts the intermediate logic terminal and the low potential terminal, the input potential switching switch outputs the input potential signal to light up the low potential LED light, and the potential high and low light signals light up the low potential LED light. starts, and when the input potential switching switch turns on the intermediate logic terminal and the high potential terminal, the input potential switching switch outputs the input potential signal to light up the high potential LED light, and the potential high and low light signals are the high potential LED The lights come on. The integrated circuit testing device as described in claim 4, wherein the output voltage monitoring unit includes: an output voltage selection switch having an intermediate meter terminal, a first differential signal terminal, a second differential signal terminal and a Logic terminal, the first differential signal terminal is electrically connected to the first differential signal pin, the second differential signal terminal is electrically connected to the second differential signal pin, and the logic terminal is electrically connected to the logic output pin ; An electric meter electrically connected to the middle electric meter terminal of the output voltage selection switch; Wherein, when the output voltage selection switch turns on the intermediate electric meter terminal and the logic terminal, the electric meter senses the output voltage through the output voltage selection switch to generate and display the voltage value; When the output voltage selection switch turns on the intermediate meter terminal and the first differential signal terminal, the electricity meter senses the voltage of the first differential signal through the output voltage selection switch and displays the voltage corresponding to the first differential signal. voltage value; When the output voltage selection switch turns on the intermediate meter terminal and the second differential signal terminal, the electricity meter senses the voltage of the second differential signal through the output voltage selection switch and displays the voltage corresponding to the second differential signal. voltage value. The integrated circuit testing device as claimed in claim 4, wherein the output voltage monitoring unit includes: An output terminal is electrically connected to the first differential signal pin, the second differential signal pin and the logic output pin of the IC under test respectively, and outputs the first differential signal, the second differential signal signal and the output voltage of the IC under test.

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