CN110597231B - Logic control assembly test board - Google Patents
Logic control assembly test board Download PDFInfo
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- CN110597231B CN110597231B CN201910912404.0A CN201910912404A CN110597231B CN 110597231 B CN110597231 B CN 110597231B CN 201910912404 A CN201910912404 A CN 201910912404A CN 110597231 B CN110597231 B CN 110597231B
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- 238000012360 testing method Methods 0.000 title claims abstract description 88
- 238000004088 simulation Methods 0.000 claims abstract description 59
- 238000004891 communication Methods 0.000 claims abstract description 25
- 238000000034 method Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 4
- 238000011056 performance test Methods 0.000 description 2
- 230000001012 protector Effects 0.000 description 2
- 238000010998 test method Methods 0.000 description 2
- 230000015556 catabolic process Effects 0.000 description 1
- 238000012790 confirmation Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0208—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the configuration of the monitoring system
- G05B23/0213—Modular or universal configuration of the monitoring system, e.g. monitoring system having modules that may be combined to build monitoring program; monitoring system that can be applied to legacy systems; adaptable monitoring system; using different communication protocols
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B2219/00—Program-control systems
- G05B2219/20—Pc systems
- G05B2219/24—Pc safety
- G05B2219/24065—Real time diagnostics
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
- Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Automation & Control Theory (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The invention discloses a logic control component test board, which relates to the technical field of logic control component test and comprises a test panel and a circuit module; the circuit module comprises a power supply circuit module, a discrete quantity input module, a discrete quantity output module, a sensor signal simulation circuit module, a load simulation circuit module and a communication module; the power supply circuit is externally connected with a 220VAC power supply through an XS1 interface; the discrete quantity input module, the discrete quantity output module, the sensor signal simulation circuit module, the load simulation circuit module and the communication module are respectively and electrically connected with the power circuit module; the discrete quantity input module, the discrete quantity output module and the communication module are electrically connected with the test panel through an XS2 interface; the sensor signal simulation circuit module and the load simulation circuit module are electrically connected with the test panel. The invention discloses a logic control component test board, which provides a special PN:7701032 logic controls the test equipment for component performance testing.
Description
Technical Field
The invention relates to the technical field of logic control component test equipment, in particular to a logic control component test board.
Background
The test of the existing logic control assembly is simply carried out by wiring on a UUT socket, then various needed signals are externally connected, and complete test equipment is not provided.
Disclosure of Invention
Aiming at the prior art, the invention provides a logic control component test board which is specially used for PN:7701032 logic control component performance testing.
The invention is realized by the following technical scheme: the logic control assembly test board comprises a machine body, a test panel arranged on the machine body and a circuit module arranged in the machine body; the circuit module comprises a power supply circuit module, a discrete quantity input module, a discrete quantity output module, a sensor signal simulation circuit module, a load simulation circuit module and a communication module; the power supply circuit is externally connected with a 220VAC power supply through an XS1 interface; the discrete quantity input module, the discrete quantity output module, the sensor signal simulation circuit module, the load simulation circuit module and the communication module are respectively and electrically connected with the power circuit module; the discrete quantity input module, the discrete quantity output module and the communication module are electrically connected with the test panel through an XS2 interface; the sensor signal simulation circuit module and the load simulation circuit module are electrically connected with the test panel.
Further, the sensor signal analog circuit module comprises a US sensor analog circuit and a DP sensor analog circuit; the US sensor analog circuit comprises a first US sensor analog circuit and a second US sensor analog circuit; the first US sensor simulation circuit is electrically connected with the power circuit module through an XS3 interface and is electrically connected with the test panel through an XS3 interface and an XS2 interface; the second US sensor simulation circuit is electrically connected with the power circuit module through an XS2 interface and is electrically connected with the test panel through an XS4 interface and an XS2 interface.
Further, the first US sensor analog circuit includes a voltage sensor, a first six-pin band switch, a second six-pin band switch, and a five-way voltage input circuit; five paths of voltage input circuits are connected in parallel and are electrically connected with the power circuit module through a sliding resistor RP 1; the first six-pin band switch is characterized in that 5 contact pins respectively correspond to the five voltage input circuits, and the other contact pin is grounded; the first hexagonal band switch is connected to the input end of the voltage sensor; the output end of the voltage sensor is connected with a second six-pin wave band switch, and the other end of the second six-pin wave band switch is connected with a test panel; the five voltage input circuits are used for adjusting input voltage through resistors, and the input currents of the five voltage input circuits are respectively as follows: 0mA, 4mA, 8mA, 16mA and 20mA; the second US sensor analog circuit has the same structure as the first US sensor analog circuit.
Further, the DP sensor analog circuit comprises a first four-pin band switch, a second four-pin band switch, a resistor R19, a resistor R20 and a resistor R21; the first four-pin wave band switch and the second four-pin wave band switch are respectively connected with the test panel through XS 2; the input end of the resistor R19 is electrically connected with the power supply voltage circuit, the other end of the resistor R19 is sequentially connected with the resistor R20 and the resistor R21 in series, and the resistor R21 is grounded; one contact pin of the first four-pin band switch is grounded, the other three contact pins are sequentially connected with the output end of the resistor R19, the output end of the resistor R20 and the output end of the resistor R21, and the voltages input by the three contact pins are 5.5V, 0.5V and 0V respectively; one contact pin of the second four-pin band switch is grounded, and the other three contact pins are connected to the output end of the resistor R21.
Further, the load simulation circuit module comprises three paths of Toilet load simulation circuits which are connected in parallel, and the Toilet load simulation circuits are respectively externally connected with a load; each Toilet load analog circuit comprises a first resistor, a second resistor and a light emitting diode; the current is loaded at two ends of the first resistor, the positive electrode end of the first resistor is connected with the test panel through an XS2 interface, and the negative electrode end is externally connected with a load; one end of the second resistor is connected with the test panel through an XS2 interface, and the other end of the second resistor is connected with the light-emitting diode and then grounded.
Further, the discrete magnitude input module comprises 8 paths of discrete magnitude input control switches.
Further, the discrete quantity output module comprises 2 paths of discrete quantity output indicator lamps, namely WWSP Lamp and SERVICE PANEL INOP Lamp, and the rest indicator lamps on the test table are all power supply indicators.
Further, the power circuit module comprises a G1 power chip and a G2 power chip which are respectively externally connected with a 220VAC power supply, an adjustable resistor is connected on the G1 power chip in parallel, and the G1 power chip outputs 20.5-32.2 VDC/5A direct current; the G2 power chip outputs 12VDC/1A direct current; the output end of the G1 power supply chip is provided with a voltmeter; the sensor signal analog circuit module is connected with 12VDC/1A direct current; the discrete quantity input module, the discrete quantity output module, the load simulation circuit module and the communication module are all connected with direct current of 20.5-32.2 VDC/5A.
Further, the communication module comprises ARINC429 communication and CAN communication which are electrically connected with the test panel through XS2 interfaces respectively.
Compared with the prior art, the invention has the following advantages:
(1) The logic control component test board provided by the invention provides PN:7701032 special test equipment for the logic control component, and staff can effectively complete various performance tests of the logic control component through various control switches on the test panel.
(2) The logic control assembly test board provided by the invention adopts two paths of US sensor analog circuits and one path of DP sensor analog circuits to simulate the output signals of the US sensor and the DP sensor of UUT, and is also provided with a grounding signal to simulate the fault detection of the output short circuit of the sensor.
Drawings
FIG. 1 is a schematic diagram of a test panel according to the present invention;
FIG. 2 is a circuit diagram of a power circuit module of the present invention;
FIGS. 3 and 4 are circuit diagrams of the present invention;
FIG. 5 is a first US sensor analog circuit of the present invention;
FIG. 6 is a functional block diagram of the present invention;
Wherein: 1-voltage/current meter, 2-power supply control switch, 3-communication interface, 4-discrete quantity input control switch, 5-discrete quantity output indicator lamp, 6-load simulation test interface and 7-sensor signal simulation test interface
Detailed Description
The present invention will be described in further detail with reference to examples, but embodiments of the present invention are not limited thereto.
In the following embodiments, the voltage sensor is a wibro voltage sensor, and different input voltages are selected through a band switch.
The invention is suitable for the performance test of the logic control component, in particular for PN:7701032 logic control component performance testing.
The test board disclosed by the invention can be matched with the three-purpose meter FLUKE45 and the ARINC429 board card for use, wherein the three-purpose meter FLUKE45 can be used for testing voltage levels of a load simulation circuit and a sensor signal simulation circuit. When the sensor signal analog circuit is tested, a red meter pen of the three-purpose meter FLUKE45 is connected with a current+ test hole, a black meter pen is connected with the current+ test hole, and a voltage meter display value V/10 is the mA signal value output by the sensor; when the Load simulation circuit is tested, the meter pen is connected with the Load Current of the test hole+, the black meter pen is connected with the Load Current of the test hole, and the voltage meter display value V/10 is the Load Current A (ampere).
As shown in fig. 1 to 6, the logic control component test stand includes a test panel and a circuit module; the circuit module comprises a power supply circuit module, a discrete quantity input module, a discrete quantity output module, a sensor signal simulation circuit module, a load simulation circuit module and a communication module; the power supply circuit is externally connected with a 220VAC power supply through an XS1 interface; the discrete quantity input module, the discrete quantity output module, the sensor signal simulation circuit module, the load simulation circuit module and the communication module are respectively and electrically connected with the power circuit module; the discrete quantity input module, the discrete quantity output module and the communication module are electrically connected with the test panel through an XS2 interface; the sensor signal simulation circuit module and the load simulation circuit module are electrically connected with the test panel.
As shown in fig. 1, the test panel comprises a voltmeter/ammeter 1, a power supply control switch 2, a communication interface 3, a discrete quantity input control switch 4, a discrete quantity output indicator lamp 5, a load simulation test interface 6 and a sensor signal simulation test interface 7; the voltmeter/ammeter 1 and the power control switch 2 are electrically connected with the power circuit module; the communication interface 3 is electrically connected with the communication module; the discrete quantity input control switch 4 is electrically connected with the discrete quantity input module; the discrete quantity output indicator lamp 5 is electrically connected with the discrete quantity output module, and the load simulation test interface 6 is electrically connected with the load simulation circuit module; the sensor signal simulation test interface 7 is electrically connected with the sensor signal simulation circuit module.
The power circuit module comprises a G1 power chip and a G2 power chip which are respectively externally connected with a 220VAC power supply, wherein an adjustable resistor is connected in parallel with the G1 power chip, and the G1 power chip outputs 20.5-32.2 VDC/5A direct current; the G2 power chip outputs 12VDC/1A direct current; the output end of the G1 power supply chip is provided with a voltmeter; the sensor signal analog circuit module is connected with 12VDC/1A direct current; the discrete quantity input module, the discrete quantity output module, the load simulation circuit module and the communication module are all connected with direct current of 20.5-32.2 VDC/5A. And a double-pole double-throw switch is arranged between the G1 power chip, the G2 power chip and the XS1 interface, and the switch of the G1 power chip and the switch of the G2 power chip are controlled. The adjustable resistor KP2 can be connected between the 220VAC input end and the V+ output end of the G1 power chip, and the output voltage of the G1 power chip can be realized by adjusting the access resistance of the adjustable resistor. The output end of the G1 power chip is also provided with a protector F1, and the passing current of the breakdown protector is less than 3A and used for protecting a test piece to be tested. As the rated current of the logic control component is not more than 3A when the logic control component works normally, when the current exceeds 3A, the logic control component is indicated to have faults, and at the moment, the fuse acts and the power supply is cut off.
The voltmeter is characterized in that connecting points are further arranged at two ends of the voltmeter and used for being externally connected with a voltage testing instrument and used for detecting and calibrating the voltmeter of the test bench.
The circuit module is also provided with a current calibration circuit; the current calibration circuit comprises an ammeter and a single-pole double-throw switch S2; the input end of the ammeter is connected with the power circuit module through an XS2 interface, and the output end of the ammeter is connected with the single-pole double-throw switch; the two ends of the single-pole double-throw switch are provided with connection points, a current testing instrument can be externally connected, and the output end of the single-pole double-throw switch is grounded. And detecting and calibrating the built-in ammeter through an external ammeter testing instrument, so that the ammeter is accurately displayed.
Correspondingly, the test panel is provided with a current calibration interface and a voltage calibration interface which are used for accessing a current test instrument and a voltage test instrument to calibrate the voltmeter and the ammeter.
The sensor signal simulation circuit module comprises a US sensor simulation circuit and a DP sensor simulation circuit; the US sensor analog circuit comprises a first US sensor analog circuit and a second US sensor analog circuit; the first US sensor simulation circuit is electrically connected with the power circuit module through an XS3 interface and is electrically connected with the test panel through an XS3 interface and an XS2 interface; the second US sensor simulation circuit is electrically connected with the power circuit module through an XS2 interface and is electrically connected with the test panel through an XS4 interface and an XS2 interface.
The first US sensor analog circuit comprises a voltage sensor, a first six-pin band switch, a second six-pin band switch and a five-way voltage input circuit; five paths of voltage input circuits are connected in parallel and are electrically connected with the power circuit module through a sliding resistor RP 1; the first six-pin band switch is characterized in that 5 contact pins respectively correspond to the five voltage input circuits, and the other contact pin is grounded; the first hexagonal band switch is connected to the input end of the voltage sensor; the output end of the voltage sensor is connected with a second six-pin wave band switch, and the other end of the second six-pin wave band switch is connected with a test panel; the five voltage input circuits are used for adjusting input voltage through resistors, and the input currents of the five voltage input circuits are respectively as follows: 0mA, 4mA, 8mA, 16mA and 20mA; the second US sensor analog circuit has the same structure as the first US sensor analog circuit.
The DP sensor analog circuit comprises a first four-pin wave band switch, a second four-pin wave band switch, a resistor R19, a resistor R20 and a resistor R21; the first four-pin wave band switch and the second four-pin wave band switch are respectively connected with the test panel through XS 2; the input end of the resistor R19 is electrically connected with the power supply voltage circuit, the other end of the resistor R19 is sequentially connected with the resistor R20 and the resistor R21 in series, and the resistor R21 is grounded; one contact pin of the first four-pin band switch is grounded, the other three contact pins are sequentially connected with the output end of the resistor R19, the output end of the resistor R20 and the output end of the resistor R21, and the voltages input by the three contact pins are 5.5V, 0.5V and 0V respectively; one contact pin of the second four-pin band switch is grounded, and the other three contact pins are connected to the output end of the resistor R21.
The load simulation circuit module comprises three paths of Toilet load simulation circuits which are connected in parallel, and the Toilet load simulation circuits are respectively externally connected with a load; each Toilet load analog circuit comprises a first resistor, a second resistor and a light emitting diode; the current is loaded at two ends of the first resistor, the positive electrode end of the first resistor is connected with the test panel through an XS2 interface, and the negative electrode end is externally connected with a load; one end of the second resistor is connected with the test panel through an XS2 interface, and the other end of the second resistor is connected with the light-emitting diode and then grounded.
The discrete quantity input module comprises 8 paths of discrete quantity input control switches.
The discrete quantity output module comprises 8 paths of discrete quantity output indicator lamps.
The interface definition of the test panel is shown in table 1:
TABLE 1
Wherein, the switch description is as shown in table 2:
| Switch | Description of the invention |
| 220VAC | 220VAC power switch |
| LCM | 28VDC power switch for tested piece |
| FCU1～FCU3 | FCU power supply control switch |
| Current calibration | External ammeter calibration change-over switch |
| System area switch | Discrete quantity input control switch |
| US#1/#2Current Select | US sensor analog signal selection switch |
| DP Voltage Select | DP sensor analog signal selector switch |
TABLE 2
Wherein, the indicator light description is as shown in table 3:
| Indicating lamp | Description of the invention |
| Power area indicator lamp | Various power on indication |
| 28V Power | Power indication for various sensors |
| 28V Power OUTPUT | Toilet load output indication |
TABLE 3 Table 3
The test method of the test bench disclosed in the above embodiment is as follows:
s1) preparation before testing
S11): the front panel 220VAC switch is thrown down. The 220VAC power supply of the workshop is connected to the test bench through a 220VAC power cable.
S12): the front panel 220VAC power switch is thrown up, and the switch is thrown down after the confirmation indicator lamp and the gauge head are lighted.
S13): the tested piece is connected to the test bench through the test cable.
S2) testing
The front panel 220VAC power switch is thrown and then tested according to the test procedure on the CMM manual.
S3) completion of test
S31): the front panel 220VAC power switch is thrown down.
S32): and (5) disconnecting all the connecting lines and storing the equipment according to the regulations.
The foregoing description is only a preferred embodiment of the present invention, and is not intended to limit the present invention in any way, and any simple modification, equivalent variation, etc. of the above embodiment according to the technical matter of the present invention fall within the scope of the present invention.
Claims (5)
1. The logic control assembly test board comprises a test panel and a circuit module; the method is characterized in that: the circuit module comprises a power supply circuit module, a discrete quantity input module, a discrete quantity output module, a sensor signal simulation circuit module, a load simulation circuit module and a communication module; the power supply circuit is externally connected with a 220VAC power supply through an XS1 interface; the discrete quantity input module, the discrete quantity output module, the sensor signal simulation circuit module, the load simulation circuit module and the communication module are respectively and electrically connected with the power circuit module; the discrete quantity input module, the discrete quantity output module and the communication module are electrically connected with the test panel through an XS2 interface; The sensor signal simulation circuit module and the load simulation circuit module are electrically connected with the test panel; the sensor signal simulation circuit module comprises a US sensor simulation circuit and a DP sensor simulation circuit; the US sensor analog circuit comprises a first US sensor analog circuit and a second US sensor analog circuit; the first US sensor simulation circuit is electrically connected with the power circuit module through an XS3 interface and is electrically connected with the test panel through an XS3 interface and an XS2 interface; the second US sensor simulation circuit is electrically connected with the power circuit module through an XS2 interface and is electrically connected with the test panel through an XS4 interface and an XS2 interface; The first US sensor analog circuit comprises a voltage sensor, a first six-pin band switch, a second six-pin band switch and a five-way voltage input circuit; five paths of voltage input circuits are connected in parallel and are electrically connected with the power circuit module through a sliding resistor RP 1; the first six-pin band switch is characterized in that 5 contact pins respectively correspond to the five voltage input circuits, and the other contact pin is grounded; the first six-pin band switch is connected to the input end of the voltage sensor; the output end of the voltage sensor is connected with a second six-pin wave band switch, and the other end of the second six-pin wave band switch is connected with a test panel; the five voltage input circuits are used for adjusting input voltage through resistors, and the input currents of the five voltage input circuits are respectively as follows: 0mA, 4mA, 8mA, 16mA and 20mA; The second US sensor analog circuit has the same structure as the first US sensor analog circuit; the DP sensor analog circuit comprises a first four-pin wave band switch, a second four-pin wave band switch, a resistor R19, a resistor R20 and a resistor R21; the first four-pin wave band switch and the second four-pin wave band switch are respectively connected with the test panel through XS 2; the input end of the resistor R19 is electrically connected with the power supply voltage circuit, the other end of the resistor R19 is sequentially connected with the resistor R20 and the resistor R21 in series, and the resistor R21 is grounded; one contact pin of the first four-pin band switch is grounded, the other three contact pins are sequentially connected with the output end of the resistor R19, the output end of the resistor R20 and the output end of the resistor R21, and the voltages input by the three contact pins are 5.5V, 0.5V and 0V respectively; One contact pin of the second four-pin band switch is grounded, and the other three contact pins are connected to the output end of the resistor R21; the load simulation circuit module comprises three paths of Toilet load simulation circuits which are connected in parallel, and the Toilet load simulation circuits are respectively externally connected with a load; each Toilet load analog circuit comprises a first resistor, a second resistor and a light emitting diode; the current is loaded at two ends of the first resistor, the positive electrode end of the first resistor is connected with the test panel through an XS2 interface, and the negative electrode end is externally connected with a load; one end of the second resistor is connected with the test panel through an XS2 interface, and the other end of the second resistor is connected with the light-emitting diode and then grounded.
2. The logic control assembly test stand of claim 1, wherein: the discrete quantity input module comprises 8 paths of discrete quantity input control switches.
3. The logic control assembly test stand of claim 1, wherein: the discrete quantity output module comprises 2 paths of discrete quantity output indicator lamps.
4. The logic control component test stand according to any one of claims 1 to 3, wherein: the power circuit module comprises a G1 power chip and a G2 power chip which are respectively externally connected with a 220VAC power supply, wherein an adjustable resistor is connected in parallel with the G1 power chip, and the G1 power chip outputs 20.5-32.2 VDC/5A direct current; the G2 power chip outputs 12VDC/1A direct current; the output end of the G1 power supply chip is provided with a voltmeter; the sensor signal analog circuit module is connected with 12VDC/1A direct current; and the discrete quantity input module, the discrete quantity output module, the load simulation circuit module and the communication module are all connected with direct current of 20.5-32.2 VDC/5A.
5. The logic control component test stand according to any one of claims 1 to 3, wherein: the communication module comprises ARINC429 communication and CAN communication which are electrically connected with the test panel through XS2 interfaces respectively.
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| CN112130065A (en) * | 2020-10-28 | 2020-12-25 | 四川海特高新技术股份有限公司 | A test system for proximity switch electronic components |
| CN112462743B (en) * | 2020-11-30 | 2024-07-02 | 贵州航天风华实业有限公司 | Intelligent distribution box controller testing system |
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| CN207114725U (en) * | 2017-09-12 | 2018-03-16 | 四川海特高新技术股份有限公司 | Proximity switch control assembly testboard |
| CN210199578U (en) * | 2019-09-25 | 2020-03-27 | 四川海特高新技术股份有限公司 | Logic control assembly test bench |
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| RU112788U1 (en) * | 2010-12-20 | 2012-01-20 | Федеральное государственное автономное образовательное учреждение высшего профессионального образования "ЮЖНЫЙ ФЕДЕРАЛЬНЫЙ УНИВЕРСИТЕТ" | INTERFACE DEVICE |
| CN203385441U (en) * | 2013-05-28 | 2014-01-08 | 成都华太航空科技有限公司 | Fire alarm detection assembly test board |
| CN205982648U (en) * | 2016-08-31 | 2017-02-22 | 四川海特高新技术股份有限公司 | Multi -functional receiver control panel testboard |
| CN205992175U (en) * | 2016-08-31 | 2017-03-01 | 四川海特高新技术股份有限公司 | Area temperature controller testboard |
| CN209055844U (en) * | 2018-11-12 | 2019-07-02 | 四川海特高新技术股份有限公司 | GCU Generator Control Unit detector |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN207114725U (en) * | 2017-09-12 | 2018-03-16 | 四川海特高新技术股份有限公司 | Proximity switch control assembly testboard |
| CN210199578U (en) * | 2019-09-25 | 2020-03-27 | 四川海特高新技术股份有限公司 | Logic control assembly test bench |
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