M393791 t *：》 - 五、新型說明： 【新型所屬之技術領域】 本創作係關於-種光檢測裝置，尤指一種用於測試機 台的光檢測裝置，有效減少待測發光元件與測試機台之間 的接線數量。 【先前技術】 為控管該電子相關產品的良率，會於電子產品製作過 程中加入品管步驟。由於現在電路板元件密度高，以人工 進行大量之測試品管並不可行，因此所謂測試機台即因應 而生。 請參閱第七圖所示，係一種用於檢測高元件密度電路 板的測試機台（1 〇)，其包有： 一測試主機（11)，其内設有主機板（圖中未示），並於 其上設有一端子板（111)及穿設於該端子板（11”之複數排 端子座，各排端子座係包含有高密度的金屬端子（112);及 一治具底座（12)，係設於該測試主機（彳彳）上方，又該 &具底座（12)上穿設有對應包含有複數測試探針（彳2彳），測 忒探針（121)底端係與該測試主機（I”的金屬端子（1彳2)以 線路對應連接，而上端則與待測電路板的元件接觸。 當電路板置放於該治具底座（1 2)上並與複數對應的測 試探針（121)接觸，該測試主機（11)主機板會將測試訊號輸 出至治具底座（12)部份測試探針（121)，再由其它的測試探 ’十（121)獲得-¾路板反應訊號，依據該些反應訊號判斷電路 3 ivuyj/91 * * ^ ^ 零件疋否正確，因此該測試機台可大量地檢測電路板正 常否。 目則測試機台大多應用於測試電路板電子元件，但是 目刖有許多電路板上的發光元件必須過品管測試因此目 則的測4機台必須加$光檢測裝s，以滿足此測試需求。 因此上述測試機台（1〇)再進一步於該治具底座上 v说有一治具上板（60)，該治具上板（60)上穿設有複數光檢 測器（61卜以分別對應設置在該下方治具底座（12)上的待 _測5式電路板（13)之複數|_ED(131);又該治具上板（60)再設 有複數光檢測裝置（50)，以分別與複數光檢測器（6彳）連接。 请配合參閱第八圖所示，各光檢測裝置（5〇)單一輸入端設 有一組對應輸出端，其中一輸出端負責輸出光強度的對應 電壓值，另一輸出端則是輸出光顏色的對應電壓值。若以 具有8輸入端的光檢測裝置（5〇)來說，則必須包含有16輸 出端，而各光檢測裝置（50)的輸出端必須對應連接至測試 機台（彳1)的金屬端子（112)。如此，各光檢測裝置（5〇)會將 • 光檢測器（61)感測到複數LED(131)的光檢測訊號，轉換為 電壓數值後輸出至測試主機（彳彳），令光檢測主機（1彳）内的 主機板判斷各LED(131)的亮度值或發光顏色，以進行 LED(1 31)是否正常作動或良劣的測試。 然而，誠如以上測試機台（1 〇)的架構欲檢測一具有51 2 顆LED(1 31)的電路板（13)，則必須準備64台光檢測裝置 (50)，此外必須要有1 025條接線連接64台光檢測裝置（5〇) 輸出端（1024支）及接地端（1支）與測試機台的治具底座 (1 2)。雖然該測试機台（1 〇)的測試主機（11)可擴充數排端子 4 ΓΜ393791 X · Λ 座，但每排端子座及其相對應之控制電子電路成本相當昂 貴，因此隨著電路板（13)上LED(131)數量愈多，除了必須 使用大量的金屬端子（112)供治具底座（12)的測試探針（121) 連接以外’又必須使用另一部份金屬端子（11 2)來與複數光 檢測裝置（50)連接，因此將造成金屬端子數量超過測試機 台的最大數量，而無法進行測試；再者，縱使大型測試機 台的測試主機（1 1)可容納較多端子座以提供更多金屬端子 (112)，但一千多條接線的連接程序亦相當繁複且不能出 φ 錯，使得測試機台應用於大量檢測LED(131)效率不彰，且 成本又高，確實必須尋求更有效的解方案。 【新型内容】 有鑑於上述既有測試機台的缺點，本創作主要目的係 提供一種應用於測試機台的光檢測裝置，能大幅縮減待測 發光裝置與測試機台接線數量。 欲達上述目的所使用的主要技術手段係令該光檢測裝 φ 置包含有： 複數光檢測子機群組，而各光檢測子機群組係由複數 光檢測子機串接而成，且各光檢測子機係設定一獨立位 址，並包含有複數光檢測器，而各光檢測器係供設置於該 治具底座上各待測發光源位置；及 一光檢測主機，係供測試機台的治具底座連接，並與 各光檢測子機群組的其中單一光檢測子機連接，且配合定 址方式令特《光檢測子機群組其中一光檢測子機的一光檢 測器回傳其所檢測之電訊號。 5 M393791 上述本創作的光檢測裝置係主要將複數光檢測子機串 聯成複數個光檢測子機群組，令該光檢測主機以定址方式 選擇特定光檢測子機的多工器回傳特定光檢測器的檢測訊 號，達到檢測發光元件的效果；因此本創作應用於該測試 機台上，該測試機台只須與光檢測主機溝通光檢測子機位 址與檢測訊號傳輸，故其兩者之間接線數量能大幅縮減。 【實施方式】 • 胃參閱第一圖所示’本創作光檢測裝置係配合使用於 一測試機台（10)，該測試機台（10)包含有一測試主機⑴）、 一治具底座（12)及-治具上板⑽），其中該治具底座（12)上 提供複數測試探針（121)，供與待測物電路板（13)的電子元 件連接，由測試主機⑴）透過該治具底座（12)的測試探針 (121)提供測試訊號至電路板，以測試電路板（I”上電子元 件的良劣、本創作的光檢測裝置（2〇)係與該測試主機⑴） •的金屬端子（112)連接’令測試機台_可對具複數發光源 •的電子裝置進行檢測，如電路板（13)或TFT LCD面板等 等以電路板（13)為例，其上設有呈矩陣設置的led(131)， 虽該電路板（13)設於該治具底座（12)上，則該led(13<1)即 與治具底座（12)上對應測試探針（121)連接，由於測試探針 (121)與測試主機（11)的金屬端子（112>對應連接該測試 主機（11)即可提供測試電源至治具底座（12),再由治具底 座（12)將測試電源提供予電路板（13)上的各LED(i3i)，再 配合本創作的光檢測裝置（2〇)檢測LED(131)的發光狀態， 進而判斷各LED(131)的優劣。 6 M393791 。月配合參閱第二圖所示，本創作光檢測裝置（2〇)係包 s有一光檢測主機（21)及複數光檢測子機（3〇)，其中該光 檢測主機（21)及檢測光檢測子機（3〇)係疊設於測試治具底 座（12)的治具上板（6〇)，請配合參閱第三圖所示該光檢 測主機（21)係包含有： 一微處理器（22)，係透過一外部訊號連接器（23)連接至 *該測試主機1)對應金屬端子（圖中未示），由測試主機（彳Ί) 透過該外部訊號連接器（23)將檢測命令至傳送至微處理器 (22) ; ° 一類比數位轉換器（24)，係連接該微處理器（22)的輸出 端，其輸出端係透過一電壓訊號輸出端子（25)連接至該測 試機台（10)之測試主機（1彳）對應金屬端子（112)，以傳送光 檢測訊號至該該測試機台；及 複數位址連接器（26) ’係連接至該微處理器（22)的輸出 端及輸入端，係供對應的光檢測子機（30)連接；於本實施 例係包含有八個位址連接器（26)。 ^ 至於複數光檢測子機（30)則可相互串接構成複數個光 檢測子機群組（3)’於本實施例中係包含八個光檢測子機群 組（3)，各光檢測子機群組（3)再對應連接至光檢測主機（21) 的位址連接|§(26)’請配合參閱第四圖所示，各檢測光檢 測子機（30)則進一步包含有： 複數光檢測器（31 )，用以將光訊號轉換為對應的電訊 號，並裝設於該治具上板（60); 一多工器（32)，係包含有複數輸入端、至少二訊號端 及複數定址輸入端，其中複數輸入端係連接至對應光檢測 7 M393791 . · » 位址，而第三位元組則是用以定義該光檢測子機的特定光 輸出用。 因此，當該致能光檢測子機群組的其中一光檢測子 機（30)固定位址符合第二位元組時，其多工器（32)會進一步 取得第三位元組，並判斷及切換至對應該第三位元組的光 訊號輸入端，並將光訊號透過光感應器（31)轉換為數位訊 、號後輸出至位址連接器（34)，因此該光檢測主機（21)即會取 .得致能光檢測子機群組（3)回傳該待測位址的數位訊號，之 φ 後該光檢測主機（21)會將該數位訊號進行分析，再由該類 比數位轉換器（24)將數位訊號轉換為電壓值，並輸出至該 測試機台（1 0)的測試主機（11 )，令該光檢測主機（彳])取得特 疋LED( 1 31)的發光狀態。舉例來說，若測試機台（彳〇)欲測 試該電路板（131)之其中一綠光|_ED的顏色是否正常，則經 由上述檢測過程後，測試主機（彳彳）於判斷光檢測主機（2彳）回 傳的電壓值為1 _9V時，落在綠色對應的電壓值範圍内，即 判斷該LED(131)檢測通過；反之，則判斷該LED(131)不 鲁通過。此外’該測試機台（10)亦可測試LED(131)發光亮度。 上述綠光對應的電屋值及其他不同顏色光的對應電壓值， 均可由微處理器（22)設定。而測試主機（彳1)則可以依據不同 顏色光的對應電壓值判斷檢測結果通過或是不通過。 综上述所述’本創作光檢測裝置係主要將複數光檢測 子機（30)串聯，令該光檢測主機（21)以定址方式鎖定特定光 檢測子機（30)的多工器（32)回傳檢測訊號，達到檢測發光元 件的效果；因此應用於測試機台（1 〇)上，該測試機台（1 〇)只 須與光檢測主機（21)溝通光檢測子機（3〇)位址與檢測訊號傳 9 M393791 輸，故其之間接線數量能大幅縮減。進一步舉例說明之， 若以9位元待測位址配合8個輸入端的多工器之實施 例來看，本創作一次可用於檢測512個LED(131)，若測試 機台（10)與光檢測主機（21)之間以並列連接，則最多也只要 14條接線（9條位址線、1致能選擇線、2條接地線及兩條 訊號線），相較目前既有1025條接線，足足可省下1〇11條 •接線，確實能夠縮減接線程序，而更能避免檢測機台需量 擴充裝設金屬端子的情形。且能大量節省測試機台的測試 ^ 點選擇板數量，而節省昂貴的費用。 請參閱第五圖所示’係為本創作光檢測主機（21 a)的另 一較佳實施例，即該光檢測主機（21 a)亦兼具有光檢測功 能，即進一步包含有： 複數光檢測器（27) ’用以將光訊號轉換為對應的電訊 號； 一多工器（2 8)’係包含有複數輸入端、至少二訊號端 及一固定位址，其中複數輸入端係連接至對應光檢測器 φ (27);於本實施例中該多工器（28)係整合複數光檢測器（27) 於其中’即包含有8個光輸入端，而光輸入端則配合光纖 設置在至待測發光元件上，以接收光訊號；又，該多工器 包含有二訊號端，並配合MC通訊協定；及 一切換器（29)，係連接串接於該多工器（28)的至少二訊 號端與微處理器（22)之間。 當測試機台（10)欲使用該光檢測主機（21a)的光檢測功 能’使用者先將切換器（29)閉合，令該多工器（28)的至少二 訊號端與該微處理器（22)連接，則其檢測機台（10)輸出的檢 M393791 . · . 測命令中即指定該光檢測主機（21a)的固定位址為待測位 址，因此光檢測主機（21a)微處理器（22)判斷待測位址的第 一位元組即將此一固定位址透過切換器（29)輸出至多工器 (28)，再由多工器（28)依據第三位元組判斷並切換至對應的 光檢測器（27)，並將轉換得到的數位訊號回傳至微處理器 (22)，由微處理器（22)將其輸出至類比數位轉換器（24)，轉 換為對應的電壓值後再經由輸出端子（25)連接至測試主機 的量測電路上，如此該測試主機即可獲得該待測位址的發 光狀嘘。因此，本實施例的光檢測主機可直接量測少量 元件的電路板或少量測點的TFT LCD。 此外，本創作的光檢測子機亦可單獨使用，並直接連 接至檢測主機’請參閱第六圖所示，係為光檢測子機（3〇a) 的第二較佳實施例，其進一步包含有： ☆ 了微處理器（35)，係連接至該多卫器（32)的至少二訊號 為並透過夕卜部訊號輸出端子（36)與該測試主機對應金 屬端子連接； ;、貞比數位轉換器（37)，係連接至該微處理器（35)的輸 端，並透過-電廢訊號輸出端子（38)供該測試主機連接； 一切換器（39) 至少二訊號端之間 器（32)連接。 係串接於微處理器（35)與多工器（32)的 以決定該微處理器（35)是否與該多工 切換器1 子機（3Ga)欲單獨進行檢測時，使用者先將 盆（）開啟’令微處理器（35)與該多q(32)連接並 將，、中-位址連接器(34)經由測試治具與測試主機連接。 而冽4主機輸出待測位址的第二位元組是對應該光檢測子 機位址，則該光檢測子機的多工器（32)於判斷符合後即依 據該待測位址的第三位元組選擇並切換至對應的光輸入 X山 ，並將該光輸入端的光訊號轉換為數位訊號後輸出至微 處理器（35) ’該微處S||(35)將其數位訊號透過該類比數位 轉換器（37)轉換為電隸經由治具輸出至測試主機，因此 試主機即可判斷待游位址對應LED元件的發光狀態， 邊到獨立使用的目的。 【圖式簡單說明】 第一圖 圖。 第 -— '圖· 第 圖· 第 四 E! · 圃 方 塊圖 〇 第 五 团 · 圖· 圖 〇 第 六 S3 · 圃· 圖 〇 第 七 回 · 圆· 構 示意 圖 〇 第八圖 :係本創作光檢測裝置用於一測試機台示意 係本創作光檢測裝置的連接架構圖。 係本創作光檢測主機的方塊圖。 係本創作光檢測主機與單一光檢測子機連接 係本創作光檢敎機第二較佳實施例的方塊 糸本匐作光檢測子機第二較佳實施例的方塊 係既有檢測高元件密度電路板的測試機台結 測裝置 係第七圖測試機台與複數光檢 M393791 1 · ·M393791 t *:》 - V. New description: [New technical field] This creation is about a kind of light detection device, especially a light detection device for testing machine, which effectively reduces the light-emitting components and testers to be tested. The number of wires between the stations. [Prior Art] In order to control the yield of the electronic related product, a quality control step is added in the electronic product manufacturing process. Since the density of the components of the circuit board is high now, it is not feasible to manually perform a large number of test tubes, so the so-called test machine is born. Referring to Figure 7, there is a test machine (1 〇) for detecting high component density boards, which includes: a test host (11) with a motherboard (not shown) And having a terminal plate (111) and a plurality of terminal blocks disposed on the terminal plate (11", each row of terminal blocks comprising a high-density metal terminal (112); and a fixture base ( 12) is disposed above the test host (彳彳), and the & base (12) is provided with a corresponding test probe (彳2彳), and the bottom end of the test probe (121) The metal terminal (1彳2) of the test host (I) is connected by a line, and the upper end is in contact with the component of the circuit board to be tested. When the circuit board is placed on the fixture base (12) and The corresponding test probe (121) is contacted, and the test host (11) motherboard outputs the test signal to the test probe base (12) part of the test probe (121), and then the other test probes (10) Obtaining a -3⁄4 board response signal, based on the response signals, judging that the circuit 3 ivuyj/91 * * ^ ^ part is correct, so The test machine can detect the circuit board in a large amount. The test machine is mostly used to test the electronic components of the circuit board, but there are many light-emitting components on the circuit board that must pass the quality test. It is necessary to add $ light detection device s to meet this test requirement. Therefore, the above test machine (1〇) further has a fixture upper plate (60) on the fixture base, and the fixture upper plate (60) The upper surface is provided with a plurality of photodetectors (61b corresponding to the plurality of circuit boards (13) to be placed on the lower fixture base (12) |_ED (131); (60) A plurality of photodetecting devices (50) are further provided to be respectively connected to the plurality of photodetectors (6彳). As shown in the eighth figure, each photodetecting device (5〇) has a set of single input terminals. Corresponding output, one of the outputs is responsible for outputting the corresponding voltage value of the light intensity, and the other output is the corresponding voltage value of the output light color. If the light detecting device (5〇) having 8 inputs is included, it must be included There are 16 outputs, and the output of each photodetector (50) must It should be connected to the metal terminal (112) of the test machine (彳1). Thus, each photodetector (5〇) will sense the photodetection signal of the complex LED (131) by the photodetector (61). After the voltage value is output to the test host (彳彳), the motherboard in the light detection host (1彳) judges the brightness value or the illuminating color of each LED (131) to check whether the LED (1 31) is normally operated or good. Inferior test. However, as the above test machine (1 〇) architecture is to detect a circuit board (13) with 51 2 LEDs (1 31), 64 photodetectors (50) must be prepared. There must be 1,025 wiring connections to 64 light detection devices (5 〇) output terminals (1024) and ground terminals (1) and the test fixture base (1 2). Although the test machine (11) of the test machine (1 可) can expand the row of terminals 4 ΓΜ 393791 X · Λ, each terminal block and its corresponding control electronics are quite expensive, so with the board (13) The larger the number of upper LEDs (131), besides having to use a large number of metal terminals (112) for the test probe (121) connection of the fixture base (12), another part of the metal terminal must be used (11 2) to connect with the complex light detecting device (50), so the number of metal terminals exceeds the maximum number of test machines, and the test cannot be performed; in addition, even if the test host (1 1) of the large test machine can accommodate Multi-terminal block to provide more metal terminals (112), but the connection procedure of more than one thousand wires is quite complicated and can not be φ wrong, making the test machine used for a large number of detection LEDs (131) inefficient, and cost High, it is indeed necessary to seek a more effective solution. [New content] In view of the shortcomings of the above-mentioned existing testing machine, the main purpose of this creation is to provide a light detecting device applied to the testing machine, which can greatly reduce the number of wirings of the light-emitting device to be tested and the testing machine. The main technical means for achieving the above purpose is to cause the photodetecting device to include: a plurality of photodetecting subgroups, and each photodetecting subgroup is connected in series by a plurality of photodetecting sub-machines, and Each photodetecting device sets an independent address and includes a plurality of photodetectors, and each photodetector is disposed on each of the fixtures to be tested on the fixture base; and a photodetecting host is provided for testing The fixture base of the machine is connected, and is connected with a single light detecting sub-unit of each photo detecting sub-group, and cooperates with the addressing mode to make a photodetector of one photo detecting sub-group of the photo detecting sub-group Return the electrical signal it detected. 5 M393791 The above-mentioned photodetection device mainly combines a plurality of photodetection sub-machines into a plurality of photodetection sub-groups, so that the photo-detecting host selects a multiplexer of a specific photo-detecting sub-machine to return a specific light by addressing. The detection signal of the detector reaches the effect of detecting the light-emitting element; therefore, the creation is applied to the test machine, and the test machine only needs to communicate with the light detection host to transmit the light detection device address and the detection signal, so both of them The number of wires between them can be greatly reduced. [Embodiment] • The stomach is referred to the first figure. The present photodetecting device is used in conjunction with a testing machine (10). The testing machine (10) includes a test host (1)) and a fixture base (12). And a fixture upper plate (10), wherein the fixture base (12) provides a plurality of test probes (121) for connection with electronic components of the circuit board (13) to be tested, and the test host (1) transmits the The test probe (121) of the fixture base (12) provides a test signal to the circuit board to test the goodness of the electronic components on the circuit board (I", the photodetection device of the present invention (2〇) and the test host (1) • The metal terminal (112) is connected to the 'testing machine' to detect electronic devices with multiple illumination sources, such as a circuit board (13) or a TFT LCD panel, etc., using a circuit board (13) as an example. There is a led (131) arranged in a matrix, and although the circuit board (13) is disposed on the fixture base (12), the led (13<1) is corresponding to the test fixture base (12). The pin (121) is connected, and the test probe (121) is connected to the metal terminal (112> of the test host (11). The host (11) can provide the test power supply to the fixture base (12), and then the test power supply is provided to the LEDs (i3i) on the circuit board (13) by the fixture base (12), together with the light detection of the creation. The device (2〇) detects the light-emitting state of the LED (131), and then judges the advantages and disadvantages of each LED (131). 6 M393791. For the month fit, as shown in the second figure, the photo-detecting device (2〇) has a light. The detecting host (21) and the plurality of light detecting sub-machines (3〇), wherein the light detecting host (21) and the detecting light detecting device (3〇) are stacked on the fixture upper plate of the test fixture base (12) (6〇), please refer to the third picture shown in the figure. The optical detection host (21) includes: a microprocessor (22) connected to the test host through an external signal connector (23). Corresponding to the metal terminal (not shown), the test host (彳Ί) transmits the detection command to the microprocessor (22) through the external signal connector (23); ° an analog converter (24) Connecting the output end of the microprocessor (22), the output end of which is connected to the test machine through a voltage signal output terminal (25) (10) The test host (1彳) corresponds to the metal terminal (112) to transmit the light detection signal to the test machine; and the complex address connector (26) is connected to the microprocessor (22) The output end and the input end are connected to the corresponding photodetecting slave (30); in this embodiment, there are eight address connectors (26). ^ As for the complex photo detecting sub-machines (30), they can be connected to each other. In the embodiment, a plurality of photodetection sub-groups (3) are included, and each photodetection sub-group (3) is further connected to the photo-detection host. (21) Address connection|§(26)' Please refer to the fourth figure. Each detection light detector (30) further includes: a complex photodetector (31) for converting the optical signal Corresponding electrical signal is installed on the fixture upper plate (60); a multiplexer (32) includes a plurality of input terminals, at least two signal terminals and a plurality of address input terminals, wherein the plurality of input terminals are connected To the corresponding light detection 7 M393791 . · » address, and the third byte is used to define the specificity of the light detector For light output. Therefore, when one of the light detecting sub-machines (30) of the group of enabled photodetecting sub-machines meets the second byte, the multiplexer (32) further obtains the third byte, and Judging and switching to the optical signal input corresponding to the third byte, and converting the optical signal into a digital signal through the optical sensor (31), and outputting to the address connector (34), so the light detecting host (21) will take the optical detection sub-machine group (3) to return the digital signal of the address to be tested, after the φ, the optical detection host (21) will analyze the digital signal, and then The analog-to-digital converter (24) converts the digital signal into a voltage value and outputs it to the test host (11) of the test machine (10), so that the light detection host (彳) obtains the characteristic LED (1 31) The state of illumination. For example, if the test machine (彳〇) wants to test whether the color of one of the green light |_ED of the circuit board (131) is normal, after the above detection process, the test host (彳彳) determines the light detection host. (2彳) When the voltage value of the return is 1 _9V, it falls within the range of the voltage value corresponding to green, that is, it is judged that the LED (131) passes the detection; otherwise, it is judged that the LED (131) is not passed. In addition, the test machine (10) can also test the brightness of the LED (131). The electric house value corresponding to the green light and the corresponding voltage value of other different color lights can be set by the microprocessor (22). The test host (彳1) can judge whether the test result passes or fails according to the corresponding voltage value of different color lights. In view of the above, the present photodetecting device mainly connects a plurality of photodetecting sub-machines (30) in series, so that the photodetecting host (21) locks the multiplexer (32) of the specific photodetecting sub-machine (30) in an address manner. The detection signal is returned to achieve the effect of detecting the light-emitting element; therefore, it is applied to the test machine (1 〇), and the test machine (1 〇) only needs to communicate with the light detection host (21) to detect the light detector (3 〇) The address and the detection signal are transmitted 9 M393791, so the number of wires can be greatly reduced. For further example, if the octet-to-be-tested address is combined with the multiplexer of the eight input terminals, the present invention can be used to detect 512 LEDs (131) at a time, if the test machine (10) and the light When the detection host (21) is connected in parallel, at most 14 wires (9 address lines, 1 enable line, 2 ground lines and two signal lines), compared with 1025 lines at present. It can save 1〇11 wiring, and it can really reduce the wiring procedure, and it can avoid the situation that the detection machine needs to expand and install the metal terminal. And it can save a lot of test on the test machine. The number of points is selected, and the cost is saved. Referring to FIG. 5, another preferred embodiment of the present invention is a photo-detecting host (21a). The photo-detecting host (21a) also has a light detecting function, which further includes: The photodetector (27) is configured to convert the optical signal into a corresponding electrical signal; a multiplexer (28) includes a plurality of input terminals, at least two signal terminals, and a fixed address, wherein the plurality of input terminals are Connected to the corresponding photodetector φ (27); in the embodiment, the multiplexer (28) is integrated with a plurality of photodetectors (27) in which 'there are 8 optical inputs, and the optical input is matched The optical fiber is disposed on the light-emitting component to be tested to receive the optical signal; further, the multiplexer includes a second signal end and cooperates with the MC communication protocol; and a switch (29) connected in series with the multiplexer (28) between at least two signal terminals and the microprocessor (22). When the test machine (10) wants to use the light detecting function of the light detecting host (21a), the user first closes the switch (29), so that at least two signal terminals of the multiplexer (28) and the microprocessor (22) Connection, the detection machine (10) outputs the detection M393791. The test command specifies that the fixed address of the light detection host (21a) is the address to be tested, so the light detection host (21a) micro The processor (22) determines that the first byte of the address to be tested outputs the fixed address to the multiplexer (28) through the switch (29), and then the third bit by the multiplexer (28) Judging and switching to the corresponding photodetector (27), and transmitting the converted digital signal to the microprocessor (22), which is output by the microprocessor (22) to the analog digital converter (24), converting After the corresponding voltage value is connected to the measurement circuit of the test host via the output terminal (25), the test host can obtain the illumination state of the address to be tested. Therefore, the photodetecting host of the present embodiment can directly measure a circuit board of a small number of components or a TFT LCD of a small number of measuring points. In addition, the photodetection sub-machine of the present invention can also be used alone and directly connected to the detection host. Please refer to the sixth embodiment, which is a second preferred embodiment of the photodetection sub-machine (3〇a), which further The method includes: ☆ a microprocessor (35), wherein at least two signals connected to the multi-guard (32) are connected to a metal terminal corresponding to the test host through an external signal output terminal (36); A digital converter (37) is connected to the output of the microprocessor (35) and is connected to the test host via an electrical waste signal output terminal (38); a switch (39) is between at least two signal terminals (32) connected. When serially connected to the microprocessor (35) and the multiplexer (32) to determine whether the microprocessor (35) and the multiplexer 1 sub-machine (3Ga) are to be separately detected, the user first The basin () is turned on to cause the microprocessor (35) to be connected to the plurality of q (32) and the medium-address connector (34) is connected to the test host via the test fixture. And the second byte of the 冽4 host outputting the address to be tested is the corresponding light detecting slave address, and then the multiplexer (32) of the light detecting device is determined according to the address to be tested. The third byte selects and switches to the corresponding optical input X mountain, and converts the optical signal of the optical input into a digital signal and outputs it to the microprocessor (35) 'The micro-S||(35) digitizes it The signal is converted into electricity by the analog-to-digital converter (37) and output to the test host via the fixture. Therefore, the test host can determine the illumination state of the LED element corresponding to the address to be used, and the purpose of independent use. [Simple description of the diagram] The first picture. No. - '图·第图·四E! · 圃 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 〇 The light detecting device is used for a test machine to indicate the connection structure diagram of the present photodetecting device. A block diagram of the creative light detection host. The second preferred embodiment of the present invention is a block detection system. The second preferred embodiment of the present invention is a block detection system. The test machine of the density board is connected to the test machine. The seventh test machine and the complex optical inspection M393791 1 · ·
【主要元件符號說明】 (10)測試機台 (111)端子板 (12) 治具底座 (13) 電路板 (20)光檢測裝置 (22)微處理器 (24)類比數位轉換器 (26) 位址連接器 (28)多工器 (3)光檢測子機群組 (31)光檢測器 (33)位址輸入單元 (35)微處理器 (27) 類比數位轉換器 (39)切換器 (60)治具上板[Main component symbol description] (10) Test machine (111) terminal board (12) Fixture base (13) Circuit board (20) Light detecting device (22) Microprocessor (24) Analog digital converter (26) Address Connector (28) Multiplexer (3) Optical Detection Subgroup (31) Photo Detector (33) Address Input Unit (35) Microprocessor (27) Analog Digital Converter (39) Switch (60) Fixture board
(11)測試主機 (112)金屬端子 (121)測試探針 (131)LED (21 )(21 a)光檢測主機 (23)外部訊號連接器 (25)電壓訊號輸出端子 (27)光檢測器 (29) 切換器 (30) (30a)光檢測子機 (32)多工器 (34)位址連接器 (36)外部訊號輸出端子 (38)電壓訊號輪出端子 (5 0)光檢測裝置 (61)光檢測器 13(11) Test host (112) Metal terminal (121) Test probe (131) LED (21) (21 a) Light detection host (23) External signal connector (25) Voltage signal output terminal (27) Light detector (29) Switch (30) (30a) Optical detector (32) Multiplexer (34) Address connector (36) External signal output terminal (38) Voltage signal wheel output terminal (50) Light detecting device (61) Photodetector 13