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TWI813241B - Probe contact - Google Patents

Probe contact Download PDF

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Publication number
TWI813241B
TWI813241B TW111112937A TW111112937A TWI813241B TW I813241 B TWI813241 B TW I813241B TW 111112937 A TW111112937 A TW 111112937A TW 111112937 A TW111112937 A TW 111112937A TW I813241 B TWI813241 B TW I813241B
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TW
Taiwan
Prior art keywords
plunger
protrusion
movable
contact
movable plunger
Prior art date
Application number
TW111112937A
Other languages
Chinese (zh)
Other versions
TW202246779A (en
Inventor
白承夏
Original Assignee
南韓商李諾工業股份有限公司
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Publication of TW202246779A publication Critical patent/TW202246779A/en
Application granted granted Critical
Publication of TWI813241B publication Critical patent/TWI813241B/en

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733Geometry aspects
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716Elastic
    • G01R1/06722Spring-loaded
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/073Multiple probes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/06711Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733Geometry aspects
    • G01R1/06738Geometry aspects related to tip portion
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/06Measuring leads; Measuring probes
    • G01R1/067Measuring probes
    • G01R1/073Multiple probes
    • G01R1/07307Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Geometry (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

Disclosed is a probe contact for electrical connection between a first terminal and a second terminal. The probe contact comprising a stationary plunger which comprises a first main body having a first end to come into contact with the first terminal, and a first protrusion protruding transversely to a longitudinal direction of the first main body, a plurality of movable plungers which comprises a second main body having a first end to come into contact with the second terminal and a second end being in electric contact with the stationary plunger, and a second protrusion protruding transversely to a longitudinal direction of the second main body, and are disposed to relatively slide independently of each other in the longitudinal direction of the second main body; and a spring which is provided between the first protrusion and the second protrusion.

Description

探針接點 Probe contacts

本揭露是有關於一種用於對待測試物體的電性特性進行測試的探針接點。 The present disclosure relates to a probe contact used for testing the electrical characteristics of an object to be tested.

為對待測試物體的電性特性進行測試,探針接點可對測試電路板的第一端子與待測試物體的第二端子進行電性連接。 In order to test the electrical characteristics of the object to be tested, the probe contacts can electrically connect the first terminal of the test circuit board and the second terminal of the object to be tested.

專利文件1中已揭露一種探針接點,所述探針接點包括:第一柱塞;第二柱塞及第三柱塞,設置於第一柱塞的兩側且能夠移動滑動;第一彈簧,設置於第一柱塞與第二柱塞之間且具有小的直徑;以及第二彈簧,設置於第一柱塞與第三柱塞之間且具有容納第一彈簧的大的直徑。 Patent document 1 has disclosed a probe contact, which includes: a first plunger; a second plunger and a third plunger, which are disposed on both sides of the first plunger and capable of moving and sliding; a spring disposed between the first plunger and the second plunger and having a small diameter; and a second spring disposed between the first plunger and the third plunger and having a large diameter to accommodate the first spring .

[專利文件1]日本專利第5629611號。 [Patent document 1] Japanese Patent No. 5629611.

由於第一彈簧及第二彈簧分別容許第二柱塞與第三柱塞獨立地操作,因此專利文件1中揭露的探針接點具有自適應性地應對測試端子的各種形狀的優點,但由於結構複雜而具有增加製造成本的缺點。特別地,具有此種結構的探針接點具有以下問題:很難將探針接點製造得很小以應用於具有精細節距端子的待 測試物體。 Since the first spring and the second spring allow the second plunger and the third plunger to operate independently, the probe contact disclosed in Patent Document 1 has the advantage of adaptively responding to various shapes of test terminals. However, due to The complex structure has the disadvantage of increasing manufacturing costs. In particular, probe contacts having such a structure have the following problem: it is difficult to make the probe contacts small enough to be applied to devices with fine pitch terminals. Test object.

本揭露的一個態樣是提供一種探針接點,所述探針接點具有簡單的結構且可製造得很小。 One aspect of the present disclosure is to provide a probe contact that has a simple structure and can be manufactured very small.

根據本揭露的各種實施例,提供一種探針接點。用於在第一端子與第二端子之間進行電性連接的探針接點包括:靜止柱塞,包括第一主體及第一突起,所述第一主體具有與第一端子進行接觸的第一端,所述第一突起與第一主體的縱向方向橫交地突出;多個活動柱塞,包括第二主體及第二突起,所述第二主體具有與第二端子進行接觸的第一端及與靜止柱塞進行電性接觸的第二端,所述第二突起與第二主體的縱向方向橫交地突出,且所述多個活動柱塞被設置成在所述第二主體的縱向方向上彼此獨立地相對滑動;以及彈簧,設置於第一突起與第二突起之間。 According to various embodiments of the present disclosure, a probe contact is provided. The probe contact for electrically connecting the first terminal and the second terminal includes: a stationary plunger including a first body and a first protrusion, the first body having a third portion in contact with the first terminal. At one end, the first protrusion protrudes transversely to the longitudinal direction of the first body; a plurality of movable plungers includes a second body and a second protrusion, and the second body has a first protrusion in contact with the second terminal. end and a second end in electrical contact with the stationary plunger, the second protrusion protrudes transversely to the longitudinal direction of the second body, and the plurality of movable plungers are disposed on the second body. sliding relative to each other independently in the longitudinal direction; and a spring disposed between the first protrusion and the second protrusion.

只有在測試期間受到按壓的活動柱塞可滑動移動。 Only the movable plunger that is pressed during the test can slide and move.

所述多個活動柱塞各自可包括第一耦合部,所述第一耦合部的第二端耦合至靜止柱塞的第二端且能夠相對於靜止柱塞的第二端滑動移動,所述靜止柱塞可包括第二耦合部,所述第二耦合部設置於所述靜止柱塞的第二端且耦合至第一耦合部,第一耦合部及第二耦合部中的一者在其耦合表面上可包括至少一個支撐突起,且第一耦合部及第二耦合部中的另一者可包括支撐凹槽,以將所述至少一個支撐突起可分離地嵌入於所述支撐凹槽中。 Each of the plurality of movable plungers may include a first coupling portion having a second end coupled to and slidably movable relative to the second end of the stationary plunger, the The stationary plunger may include a second coupling portion disposed at a second end of the stationary plunger and coupled to the first coupling portion, one of the first coupling portion and the second coupling portion disposed therebetween. At least one support protrusion may be included on the coupling surface, and the other one of the first coupling part and the second coupling part may include a support groove, so that the at least one support protrusion is detachably embedded in the support groove. .

第二突起可在測試期間對彈簧的端部部分施加在縱向方向上相對於所述彈簧的中心而言不平衡的力,並可在彈簧中引 起屈曲變形。 The second protrusion can exert an unbalanced force on the end portion of the spring in the longitudinal direction with respect to the center of said spring during testing and can induce in the spring cause buckling deformation.

第二主體的形狀可為板狀的,且第二突起可在寬度方向上自第二主體的一側突出。 The shape of the second body may be plate-like, and the second protrusion may protrude from one side of the second body in a width direction.

活動柱塞的第二突起可在縱向方向上關於所述彈簧的中心對稱地定位。 The second protrusion of the movable plunger may be positioned symmetrically in the longitudinal direction about the center of the spring.

活動柱塞的第二突起可在彼此相反的方向上突出。 The second protrusions of the movable plunger may project in opposite directions to each other.

第二主體的形狀可為板狀的,第二突起可包括在寬度方向上自所述第二主體的相對的側突出的一對突起,且所述一對突起可被形成為在縱向方向上具有彼此不同的高度。 The shape of the second body may be plate-like, the second protrusions may include a pair of protrusions protruding from opposite sides of the second body in a width direction, and the pair of protrusions may be formed in a longitudinal direction. have different heights from each other.

第二主體的形狀可為板狀的,且第二突起可在厚度方向上自所述第二主體的一個表面突出。 The shape of the second body may be plate-like, and the second protrusion may protrude from one surface of the second body in a thickness direction.

第二突起可包括與彈簧的端部部分進行接觸的傾斜表面。 The second protrusion may include an inclined surface that contacts an end portion of the spring.

靜止柱塞的第一主體可包括引導軌,所述多個活動柱塞與所述引導軌嚙合,且活動柱塞的第二主體可包括引導凹槽,所述引導凹槽沿縱向方向凹陷且置於所述引導軌上。 The first body of the stationary plunger may include a guide rail with which the plurality of movable plungers are engaged, and the second body of the movable plunger may include a guide groove that is recessed in the longitudinal direction and Place on the guide rail.

引導軌可包括沿縱向方向在所述引導軌的相對的側上延伸且在厚度方向上突出的引導壁。 The guide rail may include guide walls extending in a longitudinal direction on opposite sides of the guide rail and protruding in a thickness direction.

提供一種支撐具有上述配置中的一者的探針接點的測試插座。 A test socket is provided that supports probe contacts having one of the above configurations.

1:探針接點 1: Probe contact

2:測試電路板 2: Test the circuit board

3:待測試物體 3: Object to be tested

11:靜止柱塞 11:Static plunger

12、42、52、62、72、82:活動柱塞 12, 42, 52, 62, 72, 82: movable plunger

12-1、42-1、52-1、62-1、72-1、82-1:第一活動柱塞 12-1, 42-1, 52-1, 62-1, 72-1, 82-1: first movable plunger

12-2、42-2、52-2、62-2、72-2、82-2:第二活動柱塞 12-2, 42-2, 52-2, 62-2, 72-2, 82-2: Second movable plunger

13:彈簧 13:Spring

21:第一端子 21:First terminal

31:第二端子 31: Second terminal

32:非端子部分 32: Non-terminal part

111:第一主體 111:First subject

112:第一突起 112:The first protrusion

113:靜止接觸部 113: Stationary contact part

114:第一耦合部 114: First coupling part

115:開口 115:Open your mouth

116:內壁 116:Inner wall

121、421、521、621、721、821:第二主體 121, 421, 521, 621, 721, 821: Second subject

122、422、522、622-1、622-2:第二突起 122, 422, 522, 622-1, 622-2: Second protrusion

123:活動接觸部 123:Activity Contact Department

124:第二耦合部 124: Second coupling part

423、523、623-1、623-2:第三突起 423, 523, 623-1, 623-2: The third protrusion

722、822:第一接觸端部部分 722, 822: First contact end part

723、823:第二接觸端部部分 723, 823: Second contact end part

1141:引導軌 1141:Guide rail

1141a:緊固凹槽 1141a: Fastening groove

1142:引導壁 1142:Guide wall

1241、4241:引導凹槽 1241, 4241: Guide groove

1241a:緊固突起 1241a: Fastening protrusion

1242:軌道支撐件 1242:Track supports

1244:鉤 1244:hook

1246:延伸凹槽 1246:Extended groove

7221、8221:第一尖端 7221, 8221: first tip

7222、8222:第二尖端 7222, 8222: Second tip

7223:第一中間尖端 7223:First intermediate tip

7231、8231:第三尖端 7231, 8231: The third tip

7232、8232:第四尖端 7232, 8232: The fourth tip

7233:第二中間尖端 7233:Second intermediate tip

A-A、B-B:線 A-A, B-B: line

P1、P2:點 P1, P2: points

藉由結合附圖閱讀實施例的以下說明,以上及/或其他態樣將變得顯而易見且更易於理解,在附圖中:圖1是根據本揭露第一實施例的探針接點的立體圖。 The above and/or other aspects will become apparent and easier to understand by reading the following description of the embodiments in conjunction with the accompanying drawings, in which: FIG. 1 is a perspective view of a probe contact according to a first embodiment of the present disclosure. .

圖2是圖1所示探針接點的分解立體圖。 FIG. 2 is an exploded perspective view of the probe contact shown in FIG. 1 .

圖3是探針接點的側視圖。 Figure 3 is a side view of the probe contact.

圖4是沿圖2的線A-A及線B-B截取的剖視圖。 FIG. 4 is a cross-sectional view taken along lines A-A and B-B of FIG. 2 .

圖5是示出圖4中第一活動柱塞與第二活動柱塞獨立滑動操作的剖視圖。 FIG. 5 is a cross-sectional view showing the independent sliding operation of the first movable plunger and the second movable plunger in FIG. 4 .

圖6是示出圖4中第一活動柱塞與第二活動柱塞同時滑動操作的剖視圖。 FIG. 6 is a cross-sectional view showing the simultaneous sliding operation of the first movable plunger and the second movable plunger in FIG. 4 .

圖7示出球柵陣列(ball grid array,BGA)型第二端子與第一活動柱塞及第二活動柱塞之間的接觸狀態。 FIG. 7 shows the contact state between the ball grid array (BGA) type second terminal and the first movable plunger and the second movable plunger.

圖8示出襯墊型(pad-type)第二端子與第一活動柱塞及第二活動柱塞之間的接觸狀態。 FIG. 8 shows the contact state between the pad-type second terminal and the first and second movable plungers.

圖9示出根據本揭露第二實施例的活動柱塞。 Figure 9 shows a movable plunger according to a second embodiment of the present disclosure.

圖10示出根據本揭露第三實施例的多個活動柱塞。 Figure 10 shows a plurality of movable plungers according to a third embodiment of the present disclosure.

圖11示出應用圖10的活動柱塞的探針接點。 Figure 11 shows a probe contact utilizing the movable plunger of Figure 10.

圖12示出根據本揭露第四實施例的多個活動柱塞。 Figure 12 shows a plurality of movable plungers according to a fourth embodiment of the present disclosure.

圖13示出根據本揭露第五實施例的多個活動柱塞。 Figure 13 shows a plurality of movable plungers according to a fifth embodiment of the present disclosure.

圖14示出根據本揭露第六實施例的多個活動柱塞。 Figure 14 shows a plurality of movable plungers according to a sixth embodiment of the present disclosure.

下面,將參照附圖詳細闡述本揭露的實施例。 Below, embodiments of the present disclosure will be explained in detail with reference to the accompanying drawings.

圖1是根據本揭露第一實施例的探針接點1的立體圖,圖2是圖1所示探針接點1的分解立體圖,圖3是探針接點1的側視圖,圖4是沿圖2的線A-A及線B-B截取的剖視圖,圖5是示出圖4中第一活動柱塞12-1與第二活動柱塞12-2獨立滑動操作的剖視圖,且圖6是示出圖4中第一活動柱塞12-1與第二活動柱塞12-2同時滑動操作的剖視圖。 Figure 1 is a perspective view of the probe contact 1 according to the first embodiment of the present disclosure. Figure 2 is an exploded perspective view of the probe contact 1 shown in Figure 1. Figure 3 is a side view of the probe contact 1. Figure 4 is A cross-sectional view taken along lines A-A and B-B of FIG. 2 , FIG. 5 is a cross-sectional view showing the independent sliding operation of the first movable plunger 12 - 1 and the second movable plunger 12 - 2 in FIG. 4 , and FIG. 6 is a cross-sectional view showing The cross-sectional view of the first movable plunger 12-1 and the second movable plunger 12-2 in simultaneous sliding operation is shown in Figure 4.

探針接點1可平行於測試方向被支撐於平板型測試插座(未示出)上。探針接點1可包括自測試插座的頂表面及底表面部分地突出的相對的端部部分。在測試期間,待測試物體3的第二端子31可按壓探針接點1的自頂表面或底表面突出的一個端部部分。在此種情況下,探針接點1可例如對測試電路板2的第一端子21與待測試物體3(例如半導體)的第二端子31進行電性連接。 The probe contact 1 can be supported on a flat-type test socket (not shown) parallel to the test direction. The probe contacts 1 may include opposing end portions partially protruding from the top and bottom surfaces of the test socket. During testing, the second terminal 31 of the object under test 3 may press one end portion of the probe contact 1 protruding from the top or bottom surface. In this case, the probe contact 1 can, for example, electrically connect the first terminal 21 of the test circuit board 2 and the second terminal 31 of the object to be tested 3 (for example, a semiconductor).

參照圖1至圖6,探針接點1可包括:靜止柱塞11,具有與測試電路板2的第一端子21進行接觸的第一端;多個活動柱塞12,具有與待測試物體3的第二端子31進行接觸的第一端;以及彈簧13,設置於靜止柱塞11與活動柱塞12之間並提供彈性。 Referring to FIGS. 1 to 6 , the probe contact 1 may include: a stationary plunger 11 having a first end that contacts the first terminal 21 of the test circuit board 2 ; a plurality of movable plungers 12 having contacts with the object to be tested. The first end of the second terminal 31 of 3 makes contact; and the spring 13 is provided between the stationary plunger 11 and the movable plunger 12 and provides elasticity.

靜止柱塞11可包括第一主體111及一對第一突起112,所述一對第一突起112在與第一主體111的縱向方向橫交的方向上自第一主體111突出。 The stationary plunger 11 may include a first body 111 and a pair of first protrusions 112 protruding from the first body 111 in a direction transverse to a longitudinal direction of the first body 111 .

靜止柱塞11可由導電材料製成,並藉由微機電系統(microelectromechanical systems,MEMS)或模具製造。 The stationary plunger 11 can be made of conductive material and manufactured by microelectromechanical systems (MEMS) or molds.

第一主體111可包括設置於其第一端以與第一端子21進行接觸的靜止接觸部113、以及設置於其第二端的第一耦合部114。 The first body 111 may include a stationary contact part 113 provided at a first end thereof for contacting the first terminal 21 , and a first coupling part 114 provided at a second end thereof.

第一耦合部114可包括嵌入於活動柱塞12的引導凹槽1241中的引導軌1141、以及自引導軌1141的側壁突出的引導壁1142。 The first coupling part 114 may include a guide rail 1141 embedded in the guide groove 1241 of the movable plunger 12 , and a guide wall 1142 protruding from a side wall of the guide rail 1141 .

引導軌1141的形狀是板狀的,且厚度可等於或厚於活動柱塞12的引導凹槽1241的寬度。引導軌1141形成有緊固凹槽1141a,緊固凹槽1141a在引導軌1141的在寬度方向上的兩個表面上凹陷。緊固凹槽1141a可與形成於活動柱塞12的軌道支撐件1242上的緊固突起1241a可分離地嚙合。 The shape of the guide rail 1141 is plate-like, and the thickness may be equal to or thicker than the width of the guide groove 1241 of the movable plunger 12 . The guide rail 1141 is formed with fastening grooves 1141a which are recessed on both surfaces of the guide rail 1141 in the width direction. The fastening groove 1141a may be detachably engageable with a fastening protrusion 1241a formed on the track support 1242 of the movable plunger 12.

引導壁1142不僅防止置於引導軌1141上的活動柱塞12在滑動移動時在寬度方向上分離,且亦引導活動柱塞12滑動移動。 The guide wall 1142 not only prevents the movable plunger 12 placed on the guide rail 1141 from being separated in the width direction during sliding movement, but also guides the movable plunger 12 from sliding movement.

第一主體111可包括沿縱向方向形成於靜止接觸部113與第一耦合部114之間的開口115。 The first body 111 may include an opening 115 formed between the stationary contact part 113 and the first coupling part 114 in a longitudinal direction.

如圖2所示,開口115可形成為在厚度方向上穿透第一主體111。開口115具有與引導軌1141交界的內壁116,以使得設置於活動柱塞12的第二耦合部124中的一對鉤1244(稍後將闡述)可被鉤住並耦合至內壁116。開口115可提供當活動柱塞12滑動時所述一對鉤1244能夠在其中活動的空間。 As shown in FIG. 2 , the opening 115 may be formed to penetrate the first body 111 in the thickness direction. The opening 115 has an inner wall 116 that interfaces with the guide rail 1141 so that a pair of hooks 1244 (to be explained later) provided in the second coupling portion 124 of the movable plunger 12 can be hooked and coupled to the inner wall 116 . The opening 115 may provide a space in which the pair of hooks 1244 can move as the movable plunger 12 slides.

根據替代實施例,開口115可形成為在第一主體111的兩側上凹陷預定深度。 According to an alternative embodiment, the opening 115 may be formed to be recessed to a predetermined depth on both sides of the first body 111 .

所述一對第一突起112可與縱向方向橫交地自第一主體111的兩側突出。 The pair of first protrusions 112 may protrude from both sides of the first body 111 transversely to the longitudinal direction.

靜止柱塞11可自第一突起112部分地嵌入於彈簧13中,直至第二端部部分。 The stationary plunger 11 can be partially embedded in the spring 13 from the first protrusion 112 to the second end portion.

活動柱塞12可包括彼此表面接觸地進行交疊的第一活動柱塞12-1與第二活動柱塞12-2。活動柱塞12可包括三或更多個柱塞。 The movable plunger 12 may include a first movable plunger 12-1 and a second movable plunger 12-2 that overlap each other in surface contact. Movable plunger 12 may include three or more plungers.

每一活動柱塞12可包括第二主體121以及在與第二主體121的縱向方向橫交的方向上自第二主體121突出的一對第二突起122。 Each movable plunger 12 may include a second body 121 and a pair of second protrusions 122 protruding from the second body 121 in a direction transverse to a longitudinal direction of the second body 121 .

活動柱塞12可由導電材料製成,並藉由MEMS或模具製造。 The movable plunger 12 can be made of conductive material and manufactured by MEMS or molding.

第二主體121可包括設置於其第一端以與第二端子31進行接觸的活動接觸部123、以及設置於其第二端的第二耦合部124。 The second body 121 may include a movable contact part 123 provided at a first end thereof for contacting the second terminal 31 , and a second coupling part 124 provided at a second end thereof.

第二耦合部124可與靜止柱塞11的第一耦合部114以90度角度交叉並耦合至靜止柱塞11的第一耦合部114。 The second coupling portion 124 may cross and be coupled to the first coupling portion 114 of the stationary plunger 11 at an angle of 90 degrees.

第二耦合部124可包括沿縱向方向朝向第二主體121的第二端部部分凹陷的引導凹槽1241。 The second coupling part 124 may include a guide groove 1241 that is recessed toward the second end portion of the second body 121 in the longitudinal direction.

第二耦合部124可包括由引導凹槽1241分離的一對軌道支撐件1242。所述一對軌道支撐件1242可分別與靜止柱塞11的引導軌1141的兩個表面進行接觸,並實現電性連接。 The second coupling portion 124 may include a pair of rail supports 1242 separated by a guide groove 1241 . The pair of rail supports 1242 can respectively contact two surfaces of the guide rail 1141 of the stationary plunger 11 and achieve electrical connection.

所述一對軌道支撐件1242可分別包括位於其自由端部部分的所述一對鉤1244。 The pair of track supports 1242 may each include the pair of hooks 1244 at free end portions thereof.

所述一對鉤1244可面向彼此突出,且鉤掛至靜止柱塞11的開口115的內壁116。所述一對鉤1244可防止彼此耦合嚙合的靜止柱塞11與所述多個活動柱塞12在滑動期間分離。 The pair of hooks 1244 may protrude toward each other and hook to the inner wall 116 of the opening 115 of the stationary plunger 11 . The pair of hooks 1244 can prevent the stationary plunger 11 and the plurality of movable plungers 12 that are coupled and engaged with each other from being separated during sliding.

所述一對鉤1244可朝向引導凹槽1241的內側突出。隨著引導凹槽1241變得越來越窄,所述一對鉤1244的突出長度受到更多限制。因此,無法確保所述一對鉤1244可靠地鉤掛至開口115的內壁。在所述一對軌道支撐件1242的寬度方向上延伸的延伸凹槽1246可形成於所述一對軌道支撐件1242與所述一對鉤1244之間。 The pair of hooks 1244 may protrude toward the inside of the guide groove 1241 . As the guide groove 1241 becomes narrower, the protruding length of the pair of hooks 1244 is more limited. Therefore, it is impossible to ensure that the pair of hooks 1244 are reliably hooked to the inner wall of the opening 115 . An extension groove 1246 extending in the width direction of the pair of rail supports 1242 may be formed between the pair of rail supports 1242 and the pair of hooks 1244 .

引導凹槽1241的寬度可等於或大於靜止柱塞11的引導軌1141的厚度。 The width of the guide groove 1241 may be equal to or greater than the thickness of the guide rail 1141 of the stationary plunger 11 .

所述一對第二突起122可與第二主體121的縱向方向橫交地自第二主體121的兩側突出。所述一對第二突起122可支撐彈簧13的第二端,藉此與對彈簧13的第一端進行支撐的靜止柱塞11的第一突起112一起對彈簧13進行限制。 The pair of second protrusions 122 may protrude from both sides of the second body 121 transversely to the longitudinal direction of the second body 121 . The pair of second protrusions 122 can support the second end of the spring 13 , thereby constraining the spring 13 together with the first protrusion 112 of the stationary plunger 11 that supports the first end of the spring 13 .

第一活動柱塞12-1及第二活動柱塞12-2可自第二突起122部分地嵌入於彈簧13中,直至鉤1244所位於的第二端。 The first movable plunger 12-1 and the second movable plunger 12-2 may be partially embedded in the spring 13 from the second protrusion 122 to the second end where the hook 1244 is located.

第一活動柱塞12-1與第二活動柱塞12-2可彼此獨立地滑動操作。換言之,當第二端子31僅壓靠第一活動柱塞12-1時,第二活動柱塞12-2可能不會滑動移動。另一方面,當第二端子31 僅壓靠第二活動柱塞12-2時,第一活動柱塞12-1可能不會滑動移動。此外,當第二端子31壓靠第一活動柱塞12-1及第二活動柱塞12-2二者時,第一活動柱塞12-1及第二活動柱塞12-2皆可滑動移動。 The first movable plunger 12-1 and the second movable plunger 12-2 can slide and operate independently of each other. In other words, when the second terminal 31 is only pressed against the first movable plunger 12-1, the second movable plunger 12-2 may not slide. On the other hand, when the second terminal 31 When only pressed against the second movable plunger 12-2, the first movable plunger 12-1 may not slide and move. In addition, when the second terminal 31 is pressed against both the first movable plunger 12-1 and the second movable plunger 12-2, both the first movable plunger 12-1 and the second movable plunger 12-2 can slide. Move.

稍後將對第一活動柱塞12-1與第二活動柱塞12-2彼此獨立地滑動操作的詳細結構進行闡述。 The detailed structure of the first movable plunger 12-1 and the second movable plunger 12-2 to slide and operate independently of each other will be explained later.

彈簧13夾置於彼此交叉且彼此耦合的靜止柱塞11與所述多個活動柱塞12之間,換言之,彈簧13位於第一突起112與第二突起122之間,藉此提供彈性。在測試期間,靜止柱塞11或所述多個活動柱塞12在受到第一端子21或第二端子31按壓時滑動移動。在此種情況下,第一突起112或第二突起122可對彈簧13進行壓縮。 The spring 13 is sandwiched between the stationary plunger 11 and the plurality of movable plungers 12 that cross each other and are coupled to each other. In other words, the spring 13 is located between the first protrusion 112 and the second protrusion 122, thereby providing elasticity. During the test, the stationary plunger 11 or the plurality of movable plungers 12 slides and moves when pressed by the first terminal 21 or the second terminal 31 . In this case, the first protrusion 112 or the second protrusion 122 can compress the spring 13 .

彈簧13可提供1克力(gf)至10克力範圍(此並不受限定)內的彈性。 The spring 13 can provide elasticity in the range of 1 gram force (gf) to 10 gf (this is not limited).

所述一對第一突起112與所述一對第二突起122可分別支撐彈簧13的兩端,藉此對彈簧13進行限制。 The pair of first protrusions 112 and the pair of second protrusions 122 can support two ends of the spring 13 respectively, thereby restricting the spring 13 .

以下,將參照圖3至圖5詳細闡述所述多個活動柱塞12的獨立滑動結構及操作。 Hereinafter, the independent sliding structure and operation of the plurality of movable plungers 12 will be explained in detail with reference to FIGS. 3 to 5 .

參照圖4,引導軌1141形成有在其兩個表面上凹陷的緊固凹槽1141a,且耦合至引導軌1141的軌道支撐件1242包括嵌入於緊固凹槽1141a的緊固突起1241a。 Referring to FIG. 4 , the guide rail 1141 is formed with fastening grooves 1141a recessed on both surfaces thereof, and the track support 1242 coupled to the guide rail 1141 includes a fastening protrusion 1241a embedded in the fastening groove 1141a.

緊固凹槽1141a與緊固突起1241a可形成為具有平緩的 斜坡,以使得緊固凹槽1141a與緊固突起1241a可在測試期間輕易地自受到第二端子31按壓的嚙合狀態釋放,且在彈簧13的彈性恢復時再次彼此嚙合。 The fastening groove 1141a and the fastening protrusion 1241a may be formed to have gentle ramp, so that the fastening groove 1141a and the fastening protrusion 1241a can be easily released from the engagement state pressed by the second terminal 31 during testing, and engage with each other again when the elasticity of the spring 13 is restored.

參照圖5,當第二端子31僅受到第一活動柱塞12-1壓靠時,第二活動柱塞12-2可能不會滑動操作。換言之,未被施加壓力的第二活動柱塞12-2可能不會藉由緊固凹槽1141a與緊固突起1241a之間的嚙合來滑動操作以支撐負載。另一方面,當壓力僅施加至第二活動柱塞12-2時,第一活動柱塞12-1可能不會滑動操作。 Referring to FIG. 5 , when the second terminal 31 is only pressed by the first movable plunger 12 - 1 , the second movable plunger 12 - 2 may not slide. In other words, the second movable plunger 12-2 to which pressure is not applied may not slide to support the load through the engagement between the fastening groove 1141a and the fastening protrusion 1241a. On the other hand, when pressure is applied only to the second movable plunger 12-2, the first movable plunger 12-1 may not slide to operate.

參照圖6,第二端子31壓靠第一活動柱塞12-1及第二活動柱塞12-2二者,第一活動柱塞12-1及第二活動柱塞12-2皆可滑動操作。 Referring to Figure 6, the second terminal 31 is pressed against both the first movable plunger 12-1 and the second movable plunger 12-2, and both the first movable plunger 12-1 and the second movable plunger 12-2 can slide. operate.

根據替代實施例,引導軌1141的緊固凹槽1141a及軌道支撐件1242的緊固突起1241a可省略。在此種情況下,第一活動柱塞12-1及第二活動柱塞12-2可與軌道支撐件1242嚙合並由軌道支撐件1242支撐。 According to an alternative embodiment, the fastening groove 1141a of the guide rail 1141 and the fastening protrusion 1241a of the rail support 1242 may be omitted. In this case, the first movable plunger 12-1 and the second movable plunger 12-2 may be engaged with and supported by the track support 1242.

圖7及圖8示出第一活動柱塞12-1及第二活動柱塞12-2與球柵陣列(BGA)型第二端子31及襯墊型第二端子31的接觸狀態。 7 and 8 illustrate the contact state of the first movable plunger 12-1 and the second movable plunger 12-2 with the ball grid array (BGA) type second terminal 31 and the pad type second terminal 31.

參照圖7,BGA型第二端子31並非平的而是半球形的,且因此向下移動並首先與第一活動柱塞12-1進行接觸。然後,第二端子31進一步向下移動,且亦與第二活動柱塞12-2進行接觸。 Referring to FIG. 7 , the BGA type second terminal 31 is not flat but hemispherical, and therefore moves downward and first comes into contact with the first movable plunger 12 - 1 . Then, the second terminal 31 further moves downward and also comes into contact with the second movable plunger 12-2.

參考圖8,襯墊型第二端子31可設置於與周圍的非端子部分32相同的平面上。在此種情況下,隨著第二端子31向下移動,第一活動柱塞12-1與非端子部分32進行接觸,且第二活動柱塞12-2與第二端子31進行接觸。 Referring to FIG. 8 , the pad-type second terminal 31 may be disposed on the same plane as the surrounding non-terminal portion 32 . In this case, as the second terminal 31 moves downward, the first movable plunger 12-1 comes into contact with the non-terminal part 32, and the second movable plunger 12-2 comes into contact with the second terminal 31.

在傳統的探針接點中,第一活動柱塞及第二活動柱塞二者作為一個單一本體同時移動,且因此第二活動柱塞的尖端(tip)並未用足夠的力按壓襯墊型第二端子。因此,測試的可靠性降低。此外,傳統的探針接點分別需要兩個獨立的彈簧來使該些活動柱塞獨立滑動,藉此使得傳統探針接點的製造困難並增加了成本。 In a conventional probe contact, both the first movable plunger and the second movable plunger move simultaneously as a single body, and therefore the tip of the second movable plunger does not press the pad with enough force. type second terminal. Therefore, the reliability of the test is reduced. In addition, the traditional probe contacts require two independent springs to enable the movable plungers to slide independently, thereby making the manufacturing of the traditional probe contacts difficult and increasing the cost.

圖9示出根據本揭露第二實施例的活動柱塞42。 Figure 9 shows a movable plunger 42 according to a second embodiment of the present disclosure.

參照圖9,多個活動柱塞42可包括彼此表面接觸地進行交疊的第一活動柱塞42-1與第二活動柱塞42-2。所述多個活動柱塞42可包括三或更多個活動柱塞。以下,將省略對與根據第一實施例的第一活動柱塞12-1及第二活動柱塞12-2相同的結構的重複描述。 Referring to FIG. 9 , the plurality of movable plungers 42 may include a first movable plunger 42 - 1 and a second movable plunger 42 - 2 that overlap and are in surface contact with each other. The plurality of movable plungers 42 may include three or more movable plungers. Hereinafter, repeated description of the same structure as the first movable plunger 12-1 and the second movable plunger 12-2 according to the first embodiment will be omitted.

第一活動柱塞42-1可包括在與第二主體421的縱向方向橫交的方向上自其一個表面突出的第二突起422。 The first movable plunger 42 - 1 may include a second protrusion 422 protruding from one surface thereof in a direction transverse to the longitudinal direction of the second body 421 .

第二活動柱塞42-2可包括在與第二主體421的縱向方向橫交的方向上自其一個表面突出的第三突起423。 The second movable plunger 42-2 may include a third protrusion 423 protruding from one surface thereof in a direction transverse to the longitudinal direction of the second body 421.

第二突起422與第三突起423可在相反的方向上突出。 The second protrusion 422 and the third protrusion 423 may protrude in opposite directions.

第二突起422及第三突起423可包括在第二主體421的縱向方向上延伸的引導凹槽4241。當第一活動柱塞42-1與第二活 動柱塞42-2單獨或同時滑動移動時,第二突起422及第三突起423可對彈簧13的位於相反方向上的兩個點P1及P2進行按壓。 The second protrusion 422 and the third protrusion 423 may include a guide groove 4241 extending in the longitudinal direction of the second body 421 . When the first movable plunger 42-1 and the second movable plunger 42-1 When the moving plunger 42 - 2 slides and moves alone or simultaneously, the second protrusion 422 and the third protrusion 423 can press the two points P1 and P2 of the spring 13 in opposite directions.

因此,當第二端子(參見圖7中的「31」)在測試期間壓靠第一活動柱塞42-1時,第二突起422可在縱向方向上相對於彈簧13的中心而言以偏置的方式對彈簧13的點P1進行按壓。因此,彈簧13首先在支撐於第二突起422上的點P1處受到按壓,可能相對於彈簧13的中心軸線發生屈曲變形。因此,第一活動柱塞42-1受到按壓並滑動移動,而第二活動柱塞42-2並未受到按壓且不滑動移動。 Therefore, when the second terminal (see "31" in Figure 7) is pressed against the first movable plunger 42-1 during testing, the second protrusion 422 can be offset in the longitudinal direction relative to the center of the spring 13. Press the point P1 of the spring 13 in a positioning manner. Therefore, the spring 13 is first pressed at the point P1 supported on the second protrusion 422 and may buckle and deform relative to the central axis of the spring 13 . Therefore, the first movable plunger 42-1 is pressed and slides, but the second movable plunger 42-2 is not pressed and does not slide.

以此種方式,與根據第一實施例的第一活動柱塞12-1及第二活動柱塞12-2的結構(即緊固凹槽1141a與緊固突起1241a之間的嚙合結構)分別獨立地或相組合地,彈簧13的點可在縱向方向上相對於彈簧13的中心而言以偏置的方式受到按壓。 In this way, it is different from the structure of the first movable plunger 12-1 and the second movable plunger 12-2 according to the first embodiment (ie, the engagement structure between the fastening groove 1141a and the fastening protrusion 1241a). Independently or in combination, the points of the spring 13 may be pressed in an offset manner in the longitudinal direction relative to the center of the spring 13 .

圖10示出根據本揭露第三實施例的多個活動柱塞52,且圖11示出應用圖10的活動柱塞52的探針接點1。 FIG. 10 shows a plurality of movable plungers 52 according to a third embodiment of the present disclosure, and FIG. 11 shows a probe contact 1 using the movable plungers 52 of FIG. 10 .

參照圖10及圖11,所述多個活動柱塞52可包括彼此表面接觸地進行交疊的第一活動柱塞52-1與第二活動柱塞52-2。活動柱塞52可包括三或更多個活動柱塞。以下,將省略對與根據第一實施例的第一活動柱塞12-1及第二活動柱塞12-2相同的結構的重複描述。 Referring to FIGS. 10 and 11 , the plurality of movable plungers 52 may include a first movable plunger 52 - 1 and a second movable plunger 52 - 2 that overlap and are in surface contact with each other. The movable plunger 52 may include three or more movable plungers. Hereinafter, repeated description of the same structure as the first movable plunger 12-1 and the second movable plunger 12-2 according to the first embodiment will be omitted.

第一活動柱塞52-1可包括在與第二主體521的縱向方向橫交的第一方向上自其一側突出的第二突起522。 The first movable plunger 52 - 1 may include a second protrusion 522 protruding from one side thereof in a first direction transverse to the longitudinal direction of the second body 521 .

第二活動柱塞52-2可包括在與第二主體521的縱向方向橫交、與第一方向相反的第二方向上自其一側突出的第三突起523。 The second movable plunger 52-2 may include a third protrusion 523 protruding from one side thereof in a second direction transverse to the longitudinal direction of the second body 521 and opposite to the first direction.

第二突起522與第三突起523可在縱向方向上關於彈簧13的中心對稱地設置。當第一活動柱塞52-1與第二活動柱塞52-2單獨或同時滑動移動時,第二突起522及第三突起523可分別對彈簧13的位於相反方向上的兩個點P1及P2進行按壓。 The second protrusion 522 and the third protrusion 523 may be disposed symmetrically about the center of the spring 13 in the longitudinal direction. When the first movable plunger 52-1 and the second movable plunger 52-2 slide and move individually or simultaneously, the second protrusion 522 and the third protrusion 523 can respectively move the two points P1 and P1 in opposite directions of the spring 13. P2 performs compression.

因此,當在彼此相反的方向上突出的第二突起522與第三突起523向彈簧13的點施加在縱向方向上相對於彈簧13的中心而言不平衡的力時,第一活動柱塞52-1及第二活動柱塞52-2可引起彈簧13的屈曲變形。 Therefore, when the second protrusion 522 and the third protrusion 523 protruding in opposite directions to each other exert an unbalanced force in the longitudinal direction with respect to the center of the spring 13 to the point of the spring 13, the first movable plunger 52 -1 and the second movable plunger 52-2 can cause the buckling deformation of the spring 13.

圖12示出根據本揭露第四實施例的多個活動柱塞62。 Figure 12 shows a plurality of movable plungers 62 according to a fourth embodiment of the present disclosure.

參照圖12,所述多個活動柱塞62可包括彼此表面接觸地進行交疊的第一活動柱塞62-1與第二活動柱塞62-2。所述多個活動柱塞62可包括三或更多個活動柱塞。以下,將省略對與根據第一實施例的第一活動柱塞12-1及第二活動柱塞12-2相同的結構的重複描述。 Referring to FIG. 12 , the plurality of movable plungers 62 may include a first movable plunger 62 - 1 and a second movable plunger 62 - 2 that overlap and are in surface contact with each other. The plurality of movable plungers 62 may include three or more movable plungers. Hereinafter, repeated description of the same structure as the first movable plunger 12-1 and the second movable plunger 12-2 according to the first embodiment will be omitted.

第一活動柱塞62-1可包括在與第二主體621的縱向方向橫交的方向上自其相對的側突出的一對第二突起622-1與第二突起622-2。 The first movable plunger 62-1 may include a pair of second protrusions 622-1 and 622-2 protruding from opposite sides thereof in a direction transverse to the longitudinal direction of the second body 621.

第二活動柱塞62-2可包括在與第二主體621的縱向方向橫交的方向上自其相對的側突出的一對第三突起623-1與第三 突起623-2。 The second movable plunger 62-2 may include a pair of third protrusions 623-1 and a third protrusion 623-1 protruding from opposite sides thereof in a direction transverse to the longitudinal direction of the second body 621. Protuberance 623-2.

所述一對第二突起622-1與第二突起622-2在彼此相反的方向上突出,且相對於第二主體621的長度方向而言具有不同的長度。 The pair of second protrusions 622-1 and 622-2 protrude in opposite directions to each other and have different lengths relative to the length direction of the second body 621.

所述一對第三突起623-1與第三突起623-2在彼此相反的方向上突出,且相對於第二主體621的長度方向而言具有不同的長度。 The pair of third protrusions 623-1 and 623-2 protrude in opposite directions to each other and have different lengths relative to the length direction of the second body 621.

此外,相對於第二主體621的長度方向而言,彼此相鄰的第二突起622-1與第三突起623-1可具有不同的長度,且彼此相鄰的第二突起622-2與第三突起623-2可具有不同的長度。換言之,第二突起622-1及第三突起623-2可在相對的位置處與彈簧13的端部部分接觸。此時,第二突起622-2及第三突起623-1可在相對的位置處與彈簧13的端部部分間隔開。 In addition, with respect to the length direction of the second body 621, the second protrusions 622-1 and the third protrusions 623-1 that are adjacent to each other may have different lengths, and the second protrusions 622-2 and the third protrusions that are adjacent to each other may have different lengths. The three protrusions 623-2 may have different lengths. In other words, the second protrusion 622-1 and the third protrusion 623-2 may contact the end portion of the spring 13 at opposite positions. At this time, the second protrusion 622-2 and the third protrusion 623-1 may be spaced apart from the end portion of the spring 13 at opposite positions.

因此,當第二端子31在測試期間僅壓靠第一活動柱塞62-1時,第二突起622-1可相對於彈簧13的中心而言對彈簧13的端部部分施加不平衡的力。因此,彈簧13首先在由第二突起622-1支撐的部分處受到壓縮,而相對的部分受到提升,藉此引起相對於彈簧13的中心軸線的屈曲變形。因此,第一活動柱塞62-1受到按壓並滑動移動,而第二活動柱塞62-2未受到按壓且不滑動移動。 Therefore, when the second terminal 31 is pressed only against the first movable plunger 62-1 during testing, the second protrusion 622-1 may exert an unbalanced force on the end portion of the spring 13 relative to the center of the spring 13 . Therefore, the spring 13 is first compressed at the portion supported by the second protrusion 622 - 1 and the opposite portion is lifted, thereby causing buckling deformation relative to the central axis of the spring 13 . Therefore, the first movable plunger 62-1 is pressed and slides, but the second movable plunger 62-2 is not pressed and does not slide.

圖13示出根據本揭露第五實施例的多個活動柱塞72。 Figure 13 shows a plurality of movable plungers 72 according to a fifth embodiment of the present disclosure.

參照圖13,所述多個活動柱塞72可包括彼此表面接觸地進行交疊的第一活動柱塞72-1與第二活動柱塞72-2。所述多個 活動柱塞72可包括三或更多個活動柱塞。以下,將省略對與根據第一實施例的第一活動柱塞12-1及第二活動柱塞12-2相同的結構的重複描述。 Referring to FIG. 13 , the plurality of movable plungers 72 may include a first movable plunger 72 - 1 and a second movable plunger 72 - 2 that overlap and are in surface contact with each other. the plurality of The movable plunger 72 may include three or more movable plungers. Hereinafter, repeated description of the same structure as the first movable plunger 12-1 and the second movable plunger 12-2 according to the first embodiment will be omitted.

第一活動柱塞72-1可包括設置於第二主體721的一個端部部分處的第一接觸端部部分722,以與第二端子31進行接觸。 The first movable plunger 72 - 1 may include a first contact end portion 722 provided at one end portion of the second body 721 to make contact with the second terminal 31 .

第一接觸端部部分722可包括在第二主體721的寬度方向上延伸的第一尖端7221、延伸達第二主體721的一半寬度的第二尖端7222、以及設置於第一尖端7221與第二尖端7222之間的第一中間尖端7223。 The first contact end portion 722 may include a first tip 7221 extending in the width direction of the second body 721, a second tip 7222 extending to half the width of the second body 721, and a second tip 7222 disposed between the first tip 7221 and the second tip 7222. A first intermediate tip 7223 between the tips 7222.

第一尖端7221可自寬度方向上的一側朝向中間向下傾斜,且第二尖端7222可自寬度方向上的另一側朝向中間向下傾斜。第一中間尖端7223可設置於在第一尖端7221與第二尖端7222之間形成的V形凹槽中。 The first tip 7221 may be inclined downward toward the middle from one side in the width direction, and the second tip 7222 may be inclined downward toward the middle from the other side in the width direction. The first intermediate tip 7223 may be disposed in a V-shaped groove formed between the first tip 7221 and the second tip 7222.

第二活動柱塞72-2可包括設置於第二主體721的一個端部部分處的第二接觸端部部分723,以與第二端子31進行接觸。 The second movable plunger 72 - 2 may include a second contact end portion 723 provided at one end portion of the second body 721 to make contact with the second terminal 31 .

第二接觸端部部分723可包括在第二主體721的寬度方向上延伸的第三尖端7231、延伸達第二主體721的一半寬度的第四尖端7232、以及設置於第三尖端7231與第四尖端7232之間的第二中間尖端7233。 The second contact end portion 723 may include a third tip 7231 extending in the width direction of the second body 721, a fourth tip 7232 extending to half the width of the second body 721, and a third tip 7231 and a fourth tip 7232 disposed between the third tip 7231 and the fourth tip 7232. A second intermediate tip 7233 between the tips 7232.

第三尖端7231可自寬度方向上的一側朝向中間向下傾斜,第四尖端7232可自寬度方向上的另一側朝向中間向下傾斜,且第二中間尖端7233可設置於在第三尖端7231與第四尖端7232 之間形成的V形凹槽中。 The third tip 7231 may be inclined downward toward the middle from one side in the width direction, the fourth tip 7232 may be inclined downward toward the middle from the other side in the width direction, and the second middle tip 7233 may be disposed at the third tip 7231 and fourth tip 7232 in the V-shaped groove formed between them.

如上所述,所述多個活動柱塞72包括六個接觸點,以藉此提高測試可靠性,且藉由將第二端子31嵌入V形凹槽中以藉此對硬的第二端子31進行測試來實施所述測試。 As mentioned above, the plurality of movable plungers 72 include six contact points to thereby improve test reliability, and by embedding the second terminal 31 into the V-shaped groove to thereby strengthen the hard second terminal 31 Conduct tests to implement said tests.

圖14示出根據本揭露第六實施例的多個活動柱塞82。 Figure 14 shows a plurality of movable plungers 82 according to a sixth embodiment of the present disclosure.

參照圖14,所述多個活動柱塞82可包括彼此表面接觸地進行交疊的第一活動柱塞82-1與第二活動柱塞82-2。所述多個活動柱塞82可包括三或更多個活動柱塞。以下,將省略對與根據第一實施例的第一活動柱塞12-1及第二活動柱塞12-2相同的結構的重複描述。 Referring to FIG. 14 , the plurality of movable plungers 82 may include a first movable plunger 82 - 1 and a second movable plunger 82 - 2 that overlap and are in surface contact with each other. The plurality of movable plungers 82 may include three or more movable plungers. Hereinafter, repeated description of the same structure as the first movable plunger 12-1 and the second movable plunger 12-2 according to the first embodiment will be omitted.

第一活動柱塞82-1可包括設置於第二主體821的一個端部部分處的第一接觸端部部分822,以與第二端子31進行接觸。 The first movable plunger 82 - 1 may include a first contact end portion 822 provided at one end portion of the second body 821 to make contact with the second terminal 31 .

第一接觸端部部分822可包括自第二主體821的寬度方向上的第一側朝向第二側向下傾斜的第一尖端8221、以及平行於第一尖端8221向下傾斜的第二尖端8222。 The first contact end portion 822 may include a first tip 8221 inclined downward from a first side in the width direction of the second body 821 toward a second side, and a second tip 8222 inclined downward parallel to the first tip 8221 .

第一尖端8221高於第二尖端8222,藉此在第二主體821的縱向方向上形成高度差。 The first tip 8221 is higher than the second tip 8222, thereby forming a height difference in the longitudinal direction of the second body 821.

第二活動柱塞82-2可包括設置於第二主體821的一個端部部分處的第二接觸端部部分823,以與第二端子31進行接觸。 The second movable plunger 82 - 2 may include a second contact end portion 823 provided at one end portion of the second body 821 to make contact with the second terminal 31 .

第二接觸端部部分823可包括自第二主體821的寬度方向上的第二側朝向第一側向下傾斜的第三尖端8231、以及平行於第三尖端8231向下傾斜的第四尖端8232。 The second contact end portion 823 may include a third tip 8231 that is inclined downward from the second side in the width direction of the second body 821 toward the first side, and a fourth tip 8232 that is inclined downward parallel to the third tip 8231 .

第三尖端8231高於第四尖端8232,藉此在第二主體821的縱向方向上形成高度差。 The third tip 8231 is higher than the fourth tip 8232, thereby forming a height difference in the longitudinal direction of the second body 821.

如上所述,所述多個活動柱塞82包括傾斜且在縱向方向上具有彼此不同的高度的第一尖端8221與第二尖端8222以及傾斜且在縱向方向上具有彼此不同的高度的第三尖端8231與第四尖端8232,藉此在測試期間使用傾斜的或高度不同的部分來推出異物(例如,錫(Sn))。 As described above, the plurality of movable plungers 82 include first and second tips 8221 and 8222 that are inclined and have different heights from each other in the longitudinal direction, and a third tip that is inclined and have different heights from each other in the longitudinal direction. 8231 and a fourth tip 8232, whereby inclined or highly different portions are used to push out foreign objects (eg, tin (Sn)) during testing.

根據本揭露,儘管探針接點具有簡單的結構(即,在單個彈簧結構中設置形成一對且獨立操作來與測試端子進行接觸的柱塞),探針接點亦能夠自適應性地應對測試端子的各種形狀,藉此降低成本並使得製造很小的探針接點成為可能。 According to the present disclosure, although the probe contact has a simple structure (ie, a pair of plungers are provided in a single spring structure and operate independently to make contact with the test terminal), the probe contact can adaptively respond to Various shapes of test terminals, thereby reducing costs and making it possible to manufacture very small probe contacts.

在前述說明中,已參照具體實施例闡述了本揭露的優點。然而,對於此項技術中具有通常知識者而言將顯而易見,可在不背離隨附申請專利範圍中所界定的揭露內容的範圍的條件下作出各種潤飾及變化。因此,本說明及圖式需要被解釋為本揭露的實例,而非對本揭露的限制。所有此種可能的潤飾皆應在本揭露的範圍內作出。 In the foregoing description, advantages of the present disclosure have been set forth with reference to specific embodiments. However, it will be apparent to one of ordinary skill in the art that various modifications and changes can be made without departing from the scope of the disclosure as defined in the appended claims. Accordingly, the description and drawings need to be construed as examples of the disclosure and not as limitations of the disclosure. All such possible modifications are intended to be made within the scope of this disclosure.

11:靜止柱塞 11:Static plunger

12:活動柱塞 12: Movable plunger

12-1:第一活動柱塞 12-1:The first movable plunger

12-2:第二活動柱塞 12-2: Second movable plunger

13:彈簧 13:Spring

111:第一主體 111:First subject

112:第一突起 112:The first protrusion

113:靜止接觸部 113: Stationary contact part

114:第一耦合部 114: First coupling part

115:開口 115:Open your mouth

116:內壁 116:Inner wall

121:第二主體 121:Second subject

122:第二突起 122:Second protrusion

123:活動接觸部 123:Activity Contact Department

124:第二耦合部 124: Second coupling part

1141:引導軌 1141:Guide rail

1141a:緊固凹槽 1141a: Fastening groove

1142:引導壁 1142:Guide wall

1241:引導凹槽 1241:Guide groove

1241a:緊固突起 1241a: Fastening protrusion

1242:軌道支撐件 1242:Track supports

1244:鉤 1244:hook

1246:延伸凹槽 1246:Extended groove

Claims (12)

一種用於在第一端子與第二端子之間進行電性連接的探針接點,包括:靜止柱塞,包括第一主體及第一突起,所述第一主體具有與所述第一端子進行接觸的第一端,所述第一突起與所述第一主體的縱向方向橫交地突出;多個活動柱塞,包括第二主體及第二突起,所述第二主體具有與所述第二端子進行接觸的第一端及與所述靜止柱塞進行電性接觸的第二端,所述第二突起與所述第二主體的縱向方向橫交地突出,且所述多個活動柱塞被設置成在所述第二主體的所述縱向方向上彼此獨立地相對滑動;以及彈簧,設置於所述第一突起與所述第二突起之間,其中只有在測試期間受到按壓的所述活動柱塞滑動移動。 A probe contact for electrical connection between a first terminal and a second terminal, including: a stationary plunger, including a first body and a first protrusion, the first body having a connection with the first terminal The first end for making contact, the first protrusion protrudes transversely to the longitudinal direction of the first body; a plurality of movable plungers includes a second body and a second protrusion, the second body has a The first end of the second terminal makes contact and the second end makes electrical contact with the stationary plunger, the second protrusion protrudes transversely to the longitudinal direction of the second body, and the plurality of movable A plunger is arranged to slide relative to each other independently in the longitudinal direction of the second body; and a spring is arranged between the first protrusion and the second protrusion, wherein only the first protrusion is pressed during the test. The movable plunger moves slidingly. 如請求項1所述的探針接點,其中所述多個活動柱塞各自包括第一耦合部,所述活動柱塞的所述第一耦合部的第二端耦合至所述靜止柱塞的第二端且能夠相對於所述靜止柱塞的所述第二端滑動移動,所述靜止柱塞包括第二耦合部,所述靜止柱塞的所述第二耦合部設置於所述靜止柱塞的所述第二端且耦合至所述活動柱塞的所述第一耦合部,所述活動柱塞的所述第一耦合部及所述靜止柱塞的所述第二耦合部中的一者在其耦合表面上包括至少一個支撐突起,且 所述活動柱塞的所述第一耦合部及所述靜止柱塞的所述第二耦合部中的另一者包括支撐凹槽,以將所述至少一個支撐突起可分離地嵌入於所述支撐凹槽中。 The probe contact of claim 1, wherein each of the plurality of movable plungers includes a first coupling portion, and a second end of the first coupling portion of the movable plunger is coupled to the stationary plunger. The second end of the stationary plunger is slidably movable relative to the second end of the stationary plunger, the stationary plunger includes a second coupling portion, and the second coupling portion of the stationary plunger is disposed on the stationary plunger. The second end of the plunger is coupled to the first coupling portion of the movable plunger, the first coupling portion of the movable plunger, and the second coupling portion of the stationary plunger. One of includes at least one support protrusion on its coupling surface, and The other one of the first coupling portion of the movable plunger and the second coupling portion of the stationary plunger includes a support groove to detachably embed the at least one support protrusion in the in the support groove. 如請求項1所述的探針接點,其中所述第二突起在測試期間對所述彈簧的端部部分施加在所述第二主體的所述縱向方向上相對於所述彈簧的中心而言不平衡的力,並在所述彈簧中引起屈曲變形。 The probe contact of claim 1, wherein the second protrusion exerts on the end portion of the spring in the longitudinal direction of the second body relative to the center of the spring during testing. unbalanced forces and cause buckling deformation in the spring. 如請求項1所述的探針接點,其中所述第二主體的形狀是板狀的,且所述第二突起在寬度方向上自所述第二主體的一側突出。 The probe contact according to claim 1, wherein the second body is plate-like in shape, and the second protrusion protrudes from one side of the second body in the width direction. 如請求項4所述的探針接點,其中所述活動柱塞的所述第二突起在所述第二主體的所述縱向方向上關於所述彈簧的中心對稱地定位。 The probe joint of claim 4, wherein the second protrusion of the movable plunger is positioned symmetrically about the center of the spring in the longitudinal direction of the second body. 如請求項1所述的探針接點,其中所述活動柱塞的所述第二突起在彼此相反的方向上突出。 The probe contact of claim 1, wherein the second protrusions of the movable plunger protrude in opposite directions to each other. 如請求項1所述的探針接點,其中所述第二主體的形狀是板狀的,所述第二突起包括在寬度方向上自所述第二主體的相對的側突出的一對突起,且所述一對突起被形成為在所述第二主體的所述縱向方向上具有彼此不同的高度。 The probe contact of claim 1, wherein the second body is plate-like in shape, and the second protrusion includes a pair of protrusions protruding from opposite sides of the second body in the width direction. , and the pair of protrusions are formed to have different heights from each other in the longitudinal direction of the second body. 如請求項1所述的探針接點,其中 所述第二主體的形狀是板狀的,且所述第二突起在厚度方向上自所述第二主體的一個表面突出。 A probe contact as claimed in claim 1, wherein The second body is plate-like in shape, and the second protrusion protrudes from one surface of the second body in a thickness direction. 如請求項8所述的探針接點,其中所述第二突起包括與所述彈簧的端部部分進行接觸的傾斜表面。 The probe contact of claim 8, wherein the second protrusion includes an inclined surface in contact with an end portion of the spring. 如請求項1所述的探針接點,其中所述靜止柱塞的所述第一主體包括引導軌,所述多個活動柱塞與所述引導軌嚙合,且所述活動柱塞的所述第二主體包括引導凹槽,所述引導凹槽沿所述第二主體的所述縱向方向凹陷且置於所述引導軌上。 The probe joint of claim 1, wherein the first body of the stationary plunger includes a guide rail, the plurality of movable plungers are engaged with the guide rail, and all of the movable plungers are engaged with the guide rail. The second body includes a guide groove recessed along the longitudinal direction of the second body and disposed on the guide rail. 如請求項10所述的探針接點,其中所述引導軌包括沿第一主體的縱向方向在所述引導軌的相對的側上延伸且在厚度方向上突出的引導壁。 The probe joint of claim 10, wherein the guide rail includes guide walls extending on opposite sides of the guide rail along the longitudinal direction of the first body and protruding in the thickness direction. 一種測試插座,支撐如請求項1至請求項11中的任一項所述的探針接點。 A test socket supports the probe contact according to any one of claims 1 to 11.
TW111112937A 2021-04-21 2022-04-01 Probe contact TWI813241B (en)

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JP2024511510A (en) 2024-03-13
TW202246779A (en) 2022-12-01

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