TWI785478B - Fingerprint sensing device - Google Patents
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- TWI785478B TWI785478B TW110102833A TW110102833A TWI785478B TW I785478 B TWI785478 B TW I785478B TW 110102833 A TW110102833 A TW 110102833A TW 110102833 A TW110102833 A TW 110102833A TW I785478 B TWI785478 B TW I785478B
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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本發明是有關於一種指紋感測裝置,且特別是有關於一種可防濕及抗靜電放電(Electrostatic Discharge,ESD)的指紋感測裝置。The present invention relates to a fingerprint sensing device, and in particular to a fingerprint sensing device capable of preventing moisture and resisting Electrostatic Discharge (ESD).
指紋辨識功能可支援多種應用,提昇使用者體驗並增加附加價值,為目前業界的重點開發項目之一。為了提高指紋辨識度,在現有的指紋感測裝置中,需要使用有機材料來堆疊足夠的厚度,以利微透鏡聚焦及光線的準直化,目的是為了得到更清晰的指紋影像。然而,有機材料本身有高吸濕的特性,會增加對導線的腐蝕風險,甚至造成指紋感測裝置作動異常。The fingerprint recognition function can support a variety of applications, enhance user experience and increase added value, and is currently one of the key development projects in the industry. In order to improve fingerprint recognition, in existing fingerprint sensing devices, organic materials need to be stacked with sufficient thickness to facilitate the focusing of microlenses and collimation of light, in order to obtain clearer fingerprint images. However, the organic material itself has high moisture absorption characteristics, which will increase the risk of corrosion to the wires, and even cause abnormal operation of the fingerprint sensing device.
此外,現有的指紋感測裝置為單板電路架構,且無設置金屬框架,故尚缺乏抗ESD的保護結構。In addition, the existing fingerprint sensing device has a single-board circuit structure without a metal frame, so it still lacks an anti-ESD protection structure.
本發明提供一種指紋感測裝置,可防濕及抗ESD。The invention provides a fingerprint sensing device which can prevent moisture and resist ESD.
本發明的一個實施例提出一種指紋感測裝置,具有感測區、操作區及周邊區,其中操作區位於感測區與周邊區之間。指紋感測裝置包括:基板;感測元件,位於感測區;操作元件,位於操作區;第一訊號線,位於周邊區;第一平坦層,位於基板上,且具有第一溝槽,其中第一溝槽重疊第一訊號線;第一絕緣層,位於第一平坦層上以及第一溝槽中,且具有第一開口,其中第一開口位於第一溝槽中;以及第一遮光層,位於第一絕緣層上,且通過第一開口連接第一訊號線。An embodiment of the present invention provides a fingerprint sensing device, which has a sensing area, an operating area and a peripheral area, wherein the operating area is located between the sensing area and the peripheral area. The fingerprint sensing device includes: a substrate; a sensing element, located in the sensing area; an operating element, located in the operating area; a first signal line, located in the peripheral area; a first flat layer, located on the substrate, and has a first groove, wherein The first trench overlaps the first signal line; the first insulating layer is located on the first planar layer and in the first trench, and has a first opening, wherein the first opening is located in the first trench; and a first light-shielding layer , located on the first insulating layer, and connected to the first signal line through the first opening.
在本發明的一實施例中,上述的操作元件包括驅動元件及測試元件。In an embodiment of the present invention, the above-mentioned operating element includes a driving element and a testing element.
在本發明的一實施例中,上述的第一平坦層包括有機材料。In an embodiment of the present invention, the above-mentioned first planar layer includes organic materials.
在本發明的一實施例中,上述的第一絕緣層包括無機材料。In an embodiment of the present invention, the above-mentioned first insulating layer includes inorganic materials.
在本發明的一實施例中,上述的第一開口重疊第一訊號線。In an embodiment of the present invention, the above-mentioned first opening overlaps the first signal line.
在本發明的一實施例中,上述的金屬層包括鋁層、鉬層、鈦層或其組合。In an embodiment of the present invention, the aforementioned metal layer includes an aluminum layer, a molybdenum layer, a titanium layer or a combination thereof.
在本發明的一實施例中,上述的第一訊號線為接地線或直流電源線。In an embodiment of the present invention, the above-mentioned first signal line is a ground line or a DC power line.
在本發明的一實施例中,上述的第一平坦層還具有第二溝槽,第二溝槽位於第一溝槽與操作元件之間;第一絕緣層還具有第二開口,第二開口位於第二溝槽中;且第一遮光層位於第二開口中。In an embodiment of the present invention, the above-mentioned first flat layer further has a second groove, and the second groove is located between the first groove and the operating element; the first insulating layer also has a second opening, and the second opening located in the second groove; and the first light shielding layer located in the second opening.
在本發明的一實施例中,上述的指紋感測裝置於第一遮光層上還依序包括第三平坦層、第二絕緣層以及第二遮光層,其中:第三平坦層具有第三溝槽,第三溝槽重疊第一溝槽;第二絕緣層具有第三開口,第三開口位於第三溝槽中;且第二遮光層通過第三開口連接第一遮光層。In an embodiment of the present invention, the above-mentioned fingerprint sensing device further includes a third flat layer, a second insulating layer, and a second light-shielding layer in sequence on the first light-shielding layer, wherein: the third flat layer has a third groove groove, the third groove overlaps the first groove; the second insulating layer has a third opening, and the third opening is located in the third groove; and the second light-shielding layer is connected to the first light-shielding layer through the third opening.
在本發明的一實施例中,上述的第一平坦層還具有第二溝槽,第二溝槽位於第一溝槽與操作元件之間,第一絕緣層還具有第二開口,第二開口位於第二溝槽中,且第一遮光層位於第二開口中。In an embodiment of the present invention, the above-mentioned first flat layer further has a second groove, the second groove is located between the first groove and the operating element, the first insulating layer further has a second opening, and the second opening It is located in the second groove, and the first light shielding layer is located in the second opening.
在本發明的一實施例中,上述的指紋感測裝置於第二遮光層上還依序包括第四平坦層、第三絕緣層、第五平坦層、第四絕緣層、第三遮光層以及微透鏡結構,其中:第四平坦層、第三絕緣層以及第五平坦層具有第四溝槽,第四溝槽重疊第三溝槽;第四絕緣層具有第四開口,第四開口位於第四溝槽中;且第三遮光層通過第四開口連接第二遮光層。In an embodiment of the present invention, the above-mentioned fingerprint sensing device further includes a fourth planar layer, a third insulating layer, a fifth planar layer, a fourth insulating layer, a third light-shielding layer and The microlens structure, wherein: the fourth flat layer, the third insulating layer and the fifth flat layer have a fourth groove, and the fourth groove overlaps the third groove; the fourth insulating layer has a fourth opening, and the fourth opening is located on the first In the four grooves; and the third light-shielding layer is connected to the second light-shielding layer through the fourth opening.
在本發明的一實施例中,上述的第三遮光層具有第三通孔,且微透鏡結構設置於第三通孔中。In an embodiment of the present invention, the above-mentioned third light shielding layer has a third through hole, and the microlens structure is disposed in the third through hole.
在本發明的一實施例中,上述的第三遮光層包括金屬層及透明氧化物層。In an embodiment of the present invention, the above-mentioned third light-shielding layer includes a metal layer and a transparent oxide layer.
在本發明的一實施例中,上述的指紋感測裝置,還包括第二訊號線,且於第一遮光層上還依序包括第三平坦層、第二絕緣層以及第二遮光層,其中:第一訊號線位於第二訊號線與操作元件之間;第一平坦層還具有第五溝槽,第五溝槽重疊第二訊號線;第一絕緣層還具有第五開口,第五開口位於第五溝槽中;第三平坦層具有第六溝槽,第六溝槽重疊第五溝槽;第二絕緣層具有第六開口,第六開口位於第五開口中;且第二遮光層通過第六開口連接第二訊號線。In an embodiment of the present invention, the above-mentioned fingerprint sensing device further includes a second signal line, and further includes a third flat layer, a second insulating layer, and a second light-shielding layer in sequence on the first light-shielding layer, wherein : the first signal line is located between the second signal line and the operating element; the first flat layer also has a fifth groove, and the fifth groove overlaps the second signal line; the first insulating layer also has a fifth opening, and the fifth opening located in the fifth groove; the third planar layer has a sixth groove, the sixth groove overlaps the fifth groove; the second insulating layer has a sixth opening, and the sixth opening is located in the fifth opening; and the second light-shielding layer The second signal line is connected through the sixth opening.
在本發明的一實施例中,上述的第一遮光層包括金屬層及透明氧化物層。In an embodiment of the present invention, the above-mentioned first light-shielding layer includes a metal layer and a transparent oxide layer.
在本發明的一實施例中,上述的第二遮光層包括金屬層及透明氧化物層。In an embodiment of the present invention, the above-mentioned second light-shielding layer includes a metal layer and a transparent oxide layer.
在本發明的一實施例中,上述的第二訊號線為接地線或直流電源線。In an embodiment of the present invention, the above-mentioned second signal line is a ground line or a DC power line.
在本發明的一實施例中,上述的指紋感測裝置適用於顯示裝置,其中感測元件位於顯示裝置與基板之間。In an embodiment of the present invention, the above-mentioned fingerprint sensing device is suitable for a display device, wherein the sensing element is located between the display device and the substrate.
為讓本發明的上述特徵和優點能更明顯易懂,下文特舉實施例,並配合所附圖式作詳細說明如下。In order to make the above-mentioned features and advantages of the present invention more comprehensible, the following specific embodiments are described in detail together with the accompanying drawings.
圖1A是本發明一實施例的指紋感測裝置100的上視示意圖。圖1B是圖1A之指紋感測裝置100的感測區SA的區域I的放大示意圖。圖1C是沿圖1B的剖面線A-A’所作的剖面示意圖。圖1D是圖1A之指紋感測裝置100的周邊區PA的區域II的放大示意圖。圖1E是沿圖1A的剖面線B-B’所作的剖面示意圖。圖1F是沿圖1A的剖面線C-C’所作的剖面示意圖。為了使圖式的表達較為簡潔,圖1A省略了第一平坦層PL1、第二平坦層PL2以及第一遮光層BM1。FIG. 1A is a schematic top view of a
以下,請同時參照圖1A至圖1F,以清楚地理解指紋感測裝置100的整體結構。指紋感測裝置100具有感測區SA、操作區MA及周邊區PA,其中操作區MA位於感測區SA與周邊區PA之間。指紋感測裝置100包括基板110、感測元件120、操作元件130、第一訊號線SL1、第一平坦層PL1、第一絕緣層BP1以及第一遮光層BM1。感測元件120位於基板110上,且位於感測區SA。操作元件130位於基板110上,且位於操作區MA。第一訊號線SL1位於基板110上,且位於周邊區PA。第一平坦層PL1位於基板110上,且具有第一溝槽T1,其中第一溝槽T1重疊第一訊號線SL1。第一絕緣層BP1位於第一平坦層PL1上以及第一溝槽T1中,且具有第一開口OP1,其中第一開口OP1位於第一溝槽T1中。第一遮光層BM1位於第一絕緣層BP1上,且通過第一開口OP1連接第一訊號線SL1。In the following, please refer to FIG. 1A to FIG. 1F to clearly understand the overall structure of the
承上述,在本發明的一實施例的指紋感測裝置100中,利用第一溝槽T1來分隔第一平坦層PL1,並藉由設置於第一平坦層PL1的上方與側面的第一絕緣層BP1來阻絕水氣,能夠防止第一平坦層PL1吸收水氣,從而降低水氣對操作元件130造成的影響。另外,第一遮光層BM1連接第一訊號線SL1可導出靜電,而能夠對指紋感測裝置100提供抗ESD保護。Based on the above, in the
以下,配合圖1A至圖1F,繼續說明指紋感測裝置100的各個元件與膜層的實施方式,但本發明不以此為限。Hereinafter, with reference to FIG. 1A to FIG. 1F , the implementation of each element and film layer of the
請參照圖1A,基板110可以是透明基板或非透明基板,其材質可以是石英基板、玻璃基板、高分子基板或其他適當材質,但本發明不以此為限。基板110上可設置用以形成例如訊號線、驅動元件、測試元件、開關元件、儲存電容等的各種膜層。Referring to FIG. 1A , the
指紋感測裝置100的操作區MA可以位於感測區SA的周邊。舉例而言,在本實施例中,操作區MA可以圍繞感測區SA,但本發明不以此為限。在一些實施例中,操作區MA可以位於感測區SA的一側。操作區MA中主要設置操作元件130,操作元件130可以包括驅動元件131、132以及測試元件133,但本發明不以此為限。舉例而言,在本實施例中,驅動元件131、132可以分別包括閘極驅動電路(Gate on Array),而測試元件133可以包括用於測試例如感測元件120的測試電路,例如,測試元件133可以包括由多個薄膜電晶體構成的測試電路。The operating area MA of the
指紋感測裝置100的周邊區PA可以位於操作區MA的外圍。舉例而言,在本實施例中,操作區MA圍繞感測區SA,且周邊區PA圍繞操作區MA,但本發明不以此為限。在一些實施例中,操作區MA僅位於感測區SA的一側,且周邊區PA可以圍繞在感測區SA以及操作區MA的外圍。周邊區PA可以包含晶片接合區IC,晶片接合區IC例如可用於設置晶片。The peripheral area PA of the
請同時參照圖1B以及圖1C,指紋感測裝置100的感測區SA是指紋感測裝置100的主要感測區域,且感測區SA中可以設置多個感測元件120。舉例而言,在本實施例中,感測元件120可以包括第一電極121、感測層122以及第二電極123。Please refer to FIG. 1B and FIG. 1C at the same time, the sensing area SA of the
在一些實施例中,第一電極121可以位於基板110上。在一些實施例中,第一電極121與基板110之間可以設置例如與第一電極121電性連接的開關元件以及其他絕緣層。第一電極121的材質例如是鉬、鋁、鈦、銅、金、銀或其他導電材料或上述兩種以上之材料的堆疊。在一些實施例中,感測層122設置於第一電極121上。感測層122的材質例如是富矽氧化物(Silicon-rich oxide,SRO)或其他合適的材料。在一些實施例中,第二電極123位於感測層122上,使得感測層122被夾於第一電極121與第二電極123之間。第二電極123的材質較佳為透明導電材料,例如是銦錫氧化物、銦鋅氧化物、鋁錫氧化物、鋁鋅氧化物、銦鎵鋅氧化物或其他合適的氧化物或者是上述至少二者之堆疊層。In some embodiments, the
在本實施例中,第一平坦層PL1位於第一電極121與第二電極123之間,且指紋感測裝置100還可以包括第二平坦層PL2,第二平坦層PL2可覆蓋第二電極123,但本發明不限於此。在一些實施例中,第一平坦層PL1具有多個孔洞TH,且第二電極123共形地(conformally)形成於第一平坦層PL1上,使得第二電極123相應地形成有多個凹部ST。舉例而言,第一平坦層PL1以及第二平坦層PL2的材質可以包括有機材料,例如壓克力(acrylic)材料、矽氧烷(siloxane)材料、聚醯亞胺(polyimide)材料、環氧樹脂(epoxy)材料或上述材料的疊層,但本發明不限於此。In this embodiment, the first flat layer PL1 is located between the
在本實施例中,第一絕緣層BP1位於第二平坦層PL2與第一遮光層BM1之間。在感測區SA,第一遮光層BM1可以具有多個通孔V1,且多個通孔V1分別重疊感測元件120的第二電極123的多個凹部ST。如此一來,感測元件120便可接收通過通孔V1的光線而進行感測。In this embodiment, the first insulating layer BP1 is located between the second planar layer PL2 and the first light shielding layer BM1. In the sensing area SA, the first light shielding layer BM1 may have a plurality of through holes V1 , and the plurality of through holes V1 respectively overlap the plurality of recesses ST of the
請同時參照圖1A以及圖1D至圖1F,在本實施例中,第一平坦層PL1、第二平坦層PL2、第一絕緣層BP1以及第一遮光層BM1可以從感測區SA延伸經過操作區MA,並延伸至周邊區PA。第一平坦層PL1以及第二平坦層PL2可以具有第一溝槽T1,且第一溝槽T1位於周邊區PA。在一些實施例中,第一溝槽T1於基板110的正投影落入第一訊號線SL1於基板110的正投影內。Please refer to FIG. 1A and FIG. 1D to FIG. 1F at the same time. In this embodiment, the first planar layer PL1, the second planar layer PL2, the first insulating layer BP1 and the first light-shielding layer BM1 can extend from the sensing area SA through the operation area MA, and extends to the surrounding area PA. The first planar layer PL1 and the second planar layer PL2 may have a first trench T1, and the first trench T1 is located in the peripheral area PA. In some embodiments, the orthographic projection of the first trench T1 on the
第一絕緣層BP1可以延伸進入第一溝槽T1中,並包覆第一平坦層PL1以及第二平坦層PL2的側壁。第一絕緣層BP1的第一開口OP1可以重疊第一訊號線SL1,而暴露出第一訊號線SL1,使得第一遮光層BM1可以通過第一開口OP1連接第一訊號線SL1。在本實施例中,第一絕緣層BP1的材質可以包括無機材料,例如氧化矽、氮化矽、氮氧化矽或上述材料的疊層,但本發明不限於此。The first insulating layer BP1 may extend into the first trench T1 and cover sidewalls of the first planar layer PL1 and the second planar layer PL2 . The first opening OP1 of the first insulating layer BP1 can overlap the first signal line SL1 to expose the first signal line SL1 , so that the first light shielding layer BM1 can be connected to the first signal line SL1 through the first opening OP1 . In this embodiment, the material of the first insulating layer BP1 may include inorganic materials, such as silicon oxide, silicon nitride, silicon oxynitride or a stack of the above materials, but the invention is not limited thereto.
在本實施例中,第一遮光層BM1例如可以包括金屬層以及透明氧化物層,其中金屬層可位於第一絕緣層BP1與透明氧化物層之間,但本發明不限於此。上述金屬層的材質可以包括導電性良好的金屬,例如鋁、鉬、鈦等金屬。在一些實施例中,上述金屬層也可以具有單層結構或多層結構,多層結構例如鋁層、鉬層、鈦層之組合,例如鋁層、鉬層、鈦層中任意兩層或更多層的疊層,可視需要進行組合與變化。舉例而言,上述金屬層可以包括依續堆疊的鈦層、鋁層以及鈦層或是依續堆疊的鉬層、鋁層以及鉬層,但本發明不以此為限。上述透明氧化物層的材質可以包括反射率低的透明氧化物,例如鉬鉭氧化物(MoTaOx),但本發明不以此為限。In this embodiment, the first light shielding layer BM1 may include, for example, a metal layer and a transparent oxide layer, wherein the metal layer may be located between the first insulating layer BP1 and the transparent oxide layer, but the invention is not limited thereto. The material of the metal layer may include metals with good electrical conductivity, such as aluminum, molybdenum, titanium and other metals. In some embodiments, the above-mentioned metal layer may also have a single-layer structure or a multi-layer structure, such as a combination of an aluminum layer, a molybdenum layer, and a titanium layer, such as any two or more layers of an aluminum layer, a molybdenum layer, and a titanium layer The stacked layers can be combined and changed as required. For example, the above metal layer may include a sequentially stacked titanium layer, aluminum layer and titanium layer or a sequentially stacked molybdenum layer, aluminum layer and molybdenum layer, but the invention is not limited thereto. The material of the transparent oxide layer may include a transparent oxide with low reflectivity, such as molybdenum tantalum oxide (MoTaOx), but the invention is not limited thereto.
在本實施例中,第一訊號線SL1可以是接地線,但本發明不限於此。在一些實施例中,第一訊號線SL1也可以是具有強電壓的直流電源線,視實際的設計需求而定。第一訊號線SL1的材質可以是導電性良好的金屬或合金,例如:金、銀、銅、鋁、鈦、鉬或其組合等,但本發明不以此為限。In this embodiment, the first signal line SL1 may be a ground line, but the invention is not limited thereto. In some embodiments, the first signal line SL1 may also be a DC power line with strong voltage, depending on actual design requirements. The material of the first signal line SL1 can be a metal or alloy with good electrical conductivity, such as gold, silver, copper, aluminum, titanium, molybdenum or a combination thereof, but the present invention is not limited thereto.
以下,繼續說明本發明的另一實施例。圖2A是本發明一實施例的指紋感測裝置100A的上視示意圖。圖2B是沿圖2A的剖面線D-D’所作的剖面示意圖。圖2C是沿圖2A的剖面線E-E’所作的剖面示意圖。為了使圖式的表達較為簡潔,圖2A省略了第一平坦層PL1、第二平坦層PL2以及第一遮光層BM1。以下,配合圖2A至圖2C,繼續說明指紋感測裝置100A的各個元件與膜層的實施方式,且沿用1A至圖1F的實施例中所採用的元件標號與相關內容,但本發明不以此為限。Hereinafter, another embodiment of the present invention will be described continuously. FIG. 2A is a schematic top view of a
與圖1A至圖1F所示的指紋感測裝置100相比,如圖2A至圖2C所示的指紋感測裝置100A中的結構的不同之處在於:第一平坦層PL1以及第二平坦層PL2還具有第二溝槽T2,第二溝槽T2位於第一溝槽T1與操作元件130之間。另外,第一絕緣層BP1具有第一開口OP1以及第二開口OP2,第二開口OP2位於第二溝槽T2中,且第一遮光層BM1位於第一開口OP1以及第二開口OP2中。Compared with the
在本實施例中,第一遮光層BM1通過第一開口OP1連接第一訊號線SL1,以對指紋感測裝置100A提供抗ESD保護。另外,第二開口OP2可以暴露出第一平坦層PL1下方的膜層,且第一遮光層BM1可以接觸第一平坦層PL1下方的膜層,使得第二溝槽T2中的第一絕緣層BP1以及第一遮光層BM1可以阻絕水氣進入第一平坦層PL1以及第二平坦層PL2中。由於第二溝槽T2中的第一絕緣層BP1以及第一遮光層BM1可以更近距離地包覆操作元件130(包括驅動元件131、132以及測試元件133)旁的第一平坦層PL1以及第二平坦層PL2,因此,能夠更近距離地防止水氣進入操作元件130周圍的第一平坦層PL1以及第二平坦層PL2中。In this embodiment, the first light shielding layer BM1 is connected to the first signal line SL1 through the first opening OP1 to provide anti-ESD protection for the
圖3A是本發明一實施例的指紋感測裝置100B的上視示意圖。圖3B是圖3A之指紋感測裝置100B的感測區SA的區域III的放大示意圖。圖3C是沿圖3B的剖面線F-F’所作的剖面示意圖。圖3D是圖3A之指紋感測裝置100B的周邊區PA的區域IV的放大示意圖。圖3E是沿圖3A的剖面線G-G’所作的剖面示意圖。圖3F是沿圖3A的剖面線H-H’所作的剖面示意圖。為了使圖式的表達較為簡潔,圖3A省略了第一平坦層PL1、第二平坦層PL2、第一絕緣層BP1、第一遮光層BM1、第三平坦層PL3以及第二遮光層BM2。以下,配合圖3A至圖3F,繼續說明指紋感測裝置100B的各個元件與膜層的實施方式,且沿用1A至圖1F的實施例中所採用的元件標號與相關內容,但本發明不以此為限。FIG. 3A is a schematic top view of a
與圖1A至圖1F所示的指紋感測裝置100相比,如圖3A至圖3F所示的指紋感測裝置100B中的結構的不同之處在於:指紋感測裝置100B於第一遮光層BM1上還依序包括第三平坦層PL3、第二絕緣層BP2以及第二遮光層BM2,其中第三平坦層PL3具有第三溝槽T3,且第三溝槽T3重疊第一溝槽T1。第二絕緣層BP2具有第三開口OP3,且第三開口OP3位於第三溝槽T3中。第二遮光層BM2通過第三開口OP3連接第一遮光層BM1。Compared with the
請同時參照圖3A至圖3C,在本實施例中,第二遮光層BM2於感測區SA可以具有多個通孔V2,且通孔V2分別重疊第一遮光層BM1中的通孔V1。如此一來,通孔V1以及通孔V2可以調控感測元件120的收光角度,使感測元件120具有良好的指紋影像品質,從而使指紋感測裝置100B具有良好的指紋辨識度。Please refer to FIG. 3A to FIG. 3C at the same time. In this embodiment, the second light shielding layer BM2 may have a plurality of through holes V2 in the sensing area SA, and the through holes V2 overlap the through holes V1 in the first light shielding layer BM1 respectively. In this way, the through hole V1 and the through hole V2 can adjust the light-receiving angle of the
在本實施例中,第二遮光層BM2的材質可以包括金屬、黑色樹脂或石墨等遮光材料、或上述遮光材料的疊層。舉例而言,在一些實施例中,第二遮光層BM2可以包括金屬層以及透明氧化物層的疊層,其中金屬層的材質可以包括導電性良好的金屬,例如鋁、鉬、鈦等金屬或其疊層,透明氧化物層的材質可以包括反射率低的透明氧化物,例如鉬鉭氧化物(MoTaOx)。在一些實施例中,第二遮光層BM2可以包括黑色樹脂或石墨等非導電性材料。In this embodiment, the material of the second light-shielding layer BM2 may include light-shielding materials such as metal, black resin or graphite, or a stack of the above-mentioned light-shielding materials. For example, in some embodiments, the second light-shielding layer BM2 may include a stack of a metal layer and a transparent oxide layer, wherein the material of the metal layer may include metals with good electrical conductivity, such as aluminum, molybdenum, titanium and other metals or For the laminate, the material of the transparent oxide layer may include a transparent oxide with low reflectivity, such as molybdenum tantalum oxide (MoTaOx). In some embodiments, the second light shielding layer BM2 may include non-conductive materials such as black resin or graphite.
請同時參照圖3A以及圖3D至圖3F,在本實施例中,第三平坦層PL3位於第一遮光層BM1與第二絕緣層BP2之間,且第二絕緣層BP2位於第三平坦層PL3與第二遮光層BM2之間。第三平坦層PL3、第二絕緣層BP2以及第二遮光層BM2可以從感測區SA延伸經過操作區MA,並延伸至周邊區PA。第三平坦層PL3的材質可以包括有機材料,例如壓克力(acrylic)材料、矽氧烷(siloxane)材料、聚醯亞胺(polyimide)材料、環氧樹脂(epoxy)材料或上述材料的疊層,但本發明不限於此。第二絕緣層BP2的材質可以包括無機材料,例如氧化矽、氮化矽、氮氧化矽或上述材料的疊層,但本發明不限於此。Please refer to FIG. 3A and FIG. 3D to FIG. 3F at the same time. In this embodiment, the third flat layer PL3 is located between the first light-shielding layer BM1 and the second insulating layer BP2, and the second insulating layer BP2 is located on the third flat layer PL3. and the second light-shielding layer BM2. The third planarization layer PL3, the second insulation layer BP2, and the second light shielding layer BM2 may extend from the sensing area SA through the operation area MA, and extend to the peripheral area PA. The material of the third flat layer PL3 may include organic materials, such as acrylic materials, siloxane materials, polyimide materials, epoxy materials or a combination of the above materials. layer, but the present invention is not limited thereto. The material of the second insulating layer BP2 may include inorganic materials, such as silicon oxide, silicon nitride, silicon oxynitride or a stack of the above materials, but the invention is not limited thereto.
在本實施例中,第二絕緣層BP2可以延伸進入第三溝槽T3中,並完全包覆第三平坦層PL3的側壁,以阻絕水氣進入第三平坦層PL3。第三開口OP3至少暴露出第一遮光層BM1於第一溝槽T1內的部分,以便第二遮光層BM2通過第三開口OP3接觸第一遮光層BM1。In this embodiment, the second insulating layer BP2 may extend into the third trench T3 and completely cover the sidewall of the third planar layer PL3 to prevent moisture from entering the third planar layer PL3 . The third opening OP3 at least exposes a portion of the first light shielding layer BM1 in the first trench T1 so that the second light shielding layer BM2 contacts the first light shielding layer BM1 through the third opening OP3.
圖4A是本發明一實施例的指紋感測裝置100C的上視示意圖。圖4B是沿圖4A的剖面線J-J’所作的剖面示意圖。圖4C是沿圖4A的剖面線K-K’所作的剖面示意圖。為了使圖式的表達較為簡潔,圖4A省略了第一平坦層PL1、第二平坦層PL2、第一遮光層BM1、第三平坦層PL3以及第二遮光層BM2。以下,配合圖4A至圖4C,繼續說明指紋感測裝置100C的各個元件與膜層的實施方式,且沿用3A至圖3F的實施例中所採用的元件標號與相關內容,但本發明不以此為限。FIG. 4A is a schematic top view of a
與圖3A至圖3F所示的指紋感測裝置100B相比,如圖4A至圖4C所示的指紋感測裝置100C中的結構的不同之處在於:第一平坦層PL1以及第二平坦層PL2還具有第二溝槽T2,第二溝槽T2位於第一溝槽T1與操作元件130之間。另外,第一絕緣層BP1還具有第二開口OP2,第二開口OP2位於第二溝槽T2中,且第一遮光層BM1位於第二開口中OP2。Compared with the
在本實施例中,第二溝槽T2可二度分隔第一平坦層PL1以及第二平坦層PL2,且第二溝槽T2中的第一絕緣層BP1以及第一遮光層BM1可以阻絕水氣進入第一平坦層PL1以及第二平坦層PL2中。由於第二溝槽T2中的第一絕緣層BP1以及第一遮光層BM1可以更近距離地包覆操作元件130(包括驅動元件131、132以及測試元件133)旁的第一平坦層PL1以及第二平坦層PL2,因此,能夠更近距離地降低水氣對操作元件130造成的影響。In this embodiment, the second trench T2 can separate the first planar layer PL1 and the second planar layer PL2 twice, and the first insulating layer BP1 and the first light-shielding layer BM1 in the second trench T2 can block moisture into the first planar layer PL1 and the second planar layer PL2. Since the first insulating layer BP1 and the first light-shielding layer BM1 in the second trench T2 can cover the first flat layer PL1 and the first flat layer PL1 next to the operating element 130 (including the driving
圖5A是本發明一實施例的指紋感測裝置100D的上視示意圖。圖5B是圖5A之指紋感測裝置100D的感測區SA的區域V的放大示意圖。圖5C是沿圖5B的剖面線L-L’所作的剖面示意圖。圖5D是沿圖5A的剖面線M-M’所作的剖面示意圖。圖5E是沿圖5A的剖面線N-N’所作的剖面示意圖。為了使圖式的表達較為簡潔,圖5A省略了第一平坦層PL1、第二平坦層PL2、第一絕緣層BP1、第一遮光層BM1、第三平坦層PL3、第二絕緣層BP2、第二遮光層BM2、第四平坦層PL4、第三絕緣層BP3、第五平坦層PL5、第三遮光層BM3以及微透鏡結構ML。以下,配合圖5A至圖5E,繼續說明指紋感測裝置100D的各個元件與膜層的實施方式,且沿用3A至圖3F的實施例中所採用的元件標號與相關內容,但本發明不以此為限。FIG. 5A is a schematic top view of a
與圖3A至圖3F所示的指紋感測裝置100B相比,如圖圖5A至圖5E所示的指紋感測裝置100D中的結構的不同之處在於:指紋感測裝置100D於第二遮光層BM2上還依序包括第四平坦層PL4、第三絕緣層BP3、第五平坦層PL5、第四絕緣層BP4、第三遮光層BM3以及微透鏡結構ML,其中第四平坦層PL4、第三絕緣層BP3以及第五平坦層PL5具有第四溝槽T4,第四溝槽T4重疊第三溝槽T3。第四絕緣層BP4具有第四開口OP4,第四開口OP4位於第四溝槽T4中。第三遮光層BM3通過第四開口OP4連接第二遮光層BM2。Compared with the
請同時參照圖5A至圖5C,在本實施例中,第三遮光層BM3於感測區SA可以具有多個通孔V3,通孔V3分別重疊第二遮光層BM2中的通孔V2,且通孔V3中可以設置微透鏡結構ML。微透鏡結構ML可以是中心厚度較邊緣厚度大的透鏡結構,例如對稱雙凸透鏡、非對稱雙凸透鏡、平凸透鏡或凹凸透鏡。微透鏡結構ML可以提升光準直,使散射光或折射光所導致之漏光及混光的問題能夠降低,進而提高圖像解像力。如此一來,來自外界的光線可以先通過微透鏡結構ML、通孔V2以及通孔V1提升準直度,再進入感測元件120,以使感測元件120可以取得品質良好的指紋影像,從而使指紋感測裝置100D具有良好的指紋辨識度。Please refer to FIG. 5A to FIG. 5C at the same time. In this embodiment, the third light shielding layer BM3 may have a plurality of through holes V3 in the sensing area SA, and the through holes V3 respectively overlap the through holes V2 in the second light shielding layer BM2, and A microlens structure ML may be disposed in the via hole V3. The microlens structure ML may be a lens structure with a thicker center than an edge, such as a symmetrical bi-convex lens, an asymmetric bi-convex lens, a plano-convex lens or a concave-convex lens. The microlens structure ML can improve light collimation, reduce light leakage and light mixing caused by scattered light or refracted light, and improve image resolution. In this way, the light from the outside can first pass through the microlens structure ML, the through hole V2 and the through hole V1 to improve the collimation, and then enter the
在本實施例中,第三遮光層BM3的材質可以包括金屬、黑色樹脂或石墨等遮光材料、或上述遮光材料的疊層。舉例而言,在一些實施例中,第三遮光層BM3可以包括金屬層以及透明氧化物層的疊層,其中金屬層的材質可以包括導電性良好的金屬,例如鋁、鉬、鈦等金屬或其疊層,透明氧化物層的材質可以包括反射率低的透明氧化物,例如鉬鉭氧化物(MoTaOx)。在一些實施例中,第三遮光層BM3可以包括黑色樹脂或石墨等非導電性材料。In this embodiment, the material of the third light-shielding layer BM3 may include light-shielding materials such as metal, black resin or graphite, or a stack of the above-mentioned light-shielding materials. For example, in some embodiments, the third light-shielding layer BM3 may include a laminated layer of a metal layer and a transparent oxide layer, wherein the material of the metal layer may include a metal with good electrical conductivity, such as aluminum, molybdenum, titanium or other metals. For the laminate, the material of the transparent oxide layer may include a transparent oxide with low reflectivity, such as molybdenum tantalum oxide (MoTaOx). In some embodiments, the third light shielding layer BM3 may include non-conductive materials such as black resin or graphite.
請同時參照圖5A以及圖5D至圖5E,在本實施例中,第四平坦層PL4位於第二遮光層BM2與第三絕緣層BP3之間;且第三絕緣層BP3位於第四平坦層PL4與第五平坦層PL5之間。在一些實施例中,指紋感測裝置100D還可以包括紅外線遮蔽層IR,紅外線遮蔽層IR可位於第三絕緣層BP3與第五平坦層PL5之間。第四平坦層PL4、第三絕緣層BP3、紅外線遮蔽層IR以及第五平坦層PL5可以從感測區SA延伸經過操作區MA,並延伸至周邊區PA。Please refer to FIG. 5A and FIG. 5D to FIG. 5E at the same time. In this embodiment, the fourth flat layer PL4 is located between the second light-shielding layer BM2 and the third insulating layer BP3; and the third insulating layer BP3 is located between the fourth flat layer PL4 and the fifth planar layer PL5. In some embodiments, the
第四平坦層PL4以及第五平坦層PL5的材質可以包括有機材料,例如壓克力(acrylic)材料、矽氧烷(siloxane)材料、聚醯亞胺(polyimide)材料、環氧樹脂(epoxy)材料或上述材料的疊層,但本發明不限於此。第三絕緣層BP3以及第四絕緣層BP4的材質可以包括無機材料,例如氧化矽、氮化矽、氮氧化矽或上述材料的疊層,但本發明不限於此。紅外線遮蔽層IR可以阻擋紅外線進入,以避免強光環境下破壞指紋影像。紅外線遮蔽層IR的材質包括例如綠色色阻。The material of the fourth flat layer PL4 and the fifth flat layer PL5 may include organic materials, such as acrylic material, siloxane material, polyimide material, epoxy resin (epoxy) materials or stacks of the above materials, but the invention is not limited thereto. The material of the third insulating layer BP3 and the fourth insulating layer BP4 may include inorganic materials, such as silicon oxide, silicon nitride, silicon oxynitride or a stack of the above materials, but the present invention is not limited thereto. The infrared shielding layer IR can block the infrared rays from entering, so as to avoid destroying the fingerprint image under strong light environment. The material of the infrared shielding layer IR includes, for example, green color resist.
在本實施例中,第四絕緣層BP4可以延伸進入第四溝槽T4中,並完全包覆第四平坦層PL4、第三絕緣層BP3、紅外線遮蔽層IR以及第五平坦層PL5的側壁,以阻絕水氣進入第四平坦層PL4以及第五平坦層PL5。第四開口OP4至少暴露出第二遮光層BM2於第三溝槽T3內的部分,以便第三遮光層BM3通過第四開口OP4接觸第二遮光層BM2。In this embodiment, the fourth insulating layer BP4 may extend into the fourth trench T4, and completely cover the side walls of the fourth planar layer PL4, the third insulating layer BP3, the infrared shielding layer IR, and the fifth planar layer PL5, To prevent moisture from entering the fourth flat layer PL4 and the fifth flat layer PL5 . The fourth opening OP4 exposes at least a portion of the second light shielding layer BM2 in the third trench T3, so that the third light shielding layer BM3 contacts the second light shielding layer BM2 through the fourth opening OP4.
圖6A是本發明一實施例的指紋感測裝置100E的上視示意圖。圖6B是沿圖6A的剖面線P-P’所作的剖面示意圖。圖6C是沿圖6A的剖面線Q-Q’所作的剖面示意圖。為了使圖式的表達較為簡潔,圖6A省略了第一平坦層PL1、第二平坦層PL2、第一遮光層BM1、第三平坦層PL3以及第二遮光層BM2。以下,配合圖6A至圖6C,繼續說明指紋感測裝置100E的各個元件與膜層的實施方式,且沿用圖1A至圖1F的實施例中所採用的元件標號與相關內容,但本發明不以此為限。FIG. 6A is a schematic top view of a
與圖1A至圖1F所示的指紋感測裝置100相比,如圖6A至圖6C所示的指紋感測裝置100E中的結構的不同之處在於:指紋感測裝置100E還包括第二訊號線SL2,且指紋感測裝置100E於第一遮光層BM1上還依序包括第三平坦層PL3、第二絕緣層BP2以及第二遮光層BM2。第一訊號線SL1位於第二訊號線SL2與操作元件130之間。第一平坦層PL1以及第二平坦層PL2還具有第五溝槽T5,第五溝槽T5重疊第二訊號線SL2。第一絕緣層BP1還具有第五開口OP5,第五開口OP5位於第五溝槽T5中。第三平坦層PL3具有第六溝槽T6,第六溝槽T6重疊第五溝槽T5。第二絕緣層BP2具有第六開口OP6,且第六開口OP6位於第五開口OP5中。第二遮光層BM2通過第六開口OP6連接第二訊號線SL2。Compared with the
在本實施例中,第二遮光層BM2的材質可以包括金屬、黑色樹脂或石墨等遮光材料、或上述遮光材料的疊層。舉例而言,在一些實施例中,第二遮光層BM2可以包括金屬層以及透明氧化物層的疊層,其中金屬層的材質可以包括導電性良好的金屬,例如鋁、鉬、鈦等金屬或其疊層,透明氧化物層的材質可以包括反射率低的透明氧化物,例如鉬鉭氧化物(MoTaOx)。在一些實施例中,第二遮光層BM2可以包括黑色樹脂或石墨等非導電性材料。In this embodiment, the material of the second light-shielding layer BM2 may include light-shielding materials such as metal, black resin or graphite, or a stack of the above-mentioned light-shielding materials. For example, in some embodiments, the second light-shielding layer BM2 may include a stack of a metal layer and a transparent oxide layer, wherein the material of the metal layer may include metals with good electrical conductivity, such as aluminum, molybdenum, titanium and other metals or For the laminate, the material of the transparent oxide layer may include a transparent oxide with low reflectivity, such as molybdenum tantalum oxide (MoTaOx). In some embodiments, the second light shielding layer BM2 may include non-conductive materials such as black resin or graphite.
在本實施例中,第二訊號線SL2可以是接地線,但本發明不限於此。在一些實施例中,第二訊號線SL2也可以是具有強電壓的直流電源線,視實際的設計需求而定。第二訊號線SL2的材質可以是導電性良好的金屬或合金,例如:金、銀、銅、鋁、鈦、鉬或其組合等,但本發明不以此為限。In this embodiment, the second signal line SL2 may be a ground line, but the invention is not limited thereto. In some embodiments, the second signal line SL2 may also be a DC power line with strong voltage, depending on actual design requirements. The material of the second signal line SL2 can be a metal or alloy with good conductivity, such as gold, silver, copper, aluminum, titanium, molybdenum or a combination thereof, but the present invention is not limited thereto.
請同時參照圖6A至圖6C,在本實施例中,第一絕緣層BP1可以先延伸進入第一溝槽T1中,再延伸進入第五溝槽T5中,也就是說,第一絕緣層BP1可以完全包覆第一平坦層PL1以及第二平坦層PL2。另外,第一遮光層BM1可以延伸至第一溝槽T1中與第一訊號線SL1連接即可,而不再繼續延伸至第五溝槽T5。Please refer to FIG. 6A to FIG. 6C at the same time. In this embodiment, the first insulating layer BP1 can first extend into the first trench T1, and then extend into the fifth trench T5, that is, the first insulating layer BP1 The first flat layer PL1 and the second flat layer PL2 may be completely covered. In addition, the first light-shielding layer BM1 may extend to the first trench T1 to be connected to the first signal line SL1 instead of extending to the fifth trench T5.
在本實施例中,第三平坦層PL3位於第一遮光層BM1與第二絕緣層BP2之間,且第二絕緣層BP2位於第三平坦層PL3與第二遮光層BM2之間。第三平坦層PL3、第二絕緣層BP2以及第二遮光層BM2可以從感測區SA延伸經過操作區MA,並延伸至周邊區PA。第三平坦層PL3的材質可以包括有機材料,例如壓克力(acrylic)材料、矽氧烷(siloxane)材料、聚醯亞胺(polyimide)材料、環氧樹脂(epoxy)材料或上述材料的疊層,但本發明不限於此。第二絕緣層BP2的材質可以包括無機材料,例如氧化矽、氮化矽、氮氧化矽或上述材料的疊層,但本發明不限於此。In this embodiment, the third planar layer PL3 is located between the first light shielding layer BM1 and the second insulating layer BP2, and the second insulating layer BP2 is located between the third planar layer PL3 and the second light shielding layer BM2. The third planarization layer PL3, the second insulation layer BP2, and the second light shielding layer BM2 may extend from the sensing area SA through the operation area MA, and extend to the peripheral area PA. The material of the third flat layer PL3 may include organic materials, such as acrylic materials, siloxane materials, polyimide materials, epoxy materials or a combination of the above materials. layer, but the present invention is not limited thereto. The material of the second insulating layer BP2 may include inorganic materials, such as silicon oxide, silicon nitride, silicon oxynitride or a stack of the above materials, but the invention is not limited thereto.
第二絕緣層BP2可以延伸進入第六溝槽T6中,並完全包覆第三平坦層PL3的側壁,以阻絕水氣進入第三平坦層PL3。在一些實施例中,第二絕緣層BP2還可以沿著第一絕緣層BP1的上表面延伸進入第五開口OP5中。此外,第二絕緣層BP2的第六開口OP6可以重疊第五開口OP5,而暴露出第二訊號線SL2,因此,第二遮光層BM2可以通過第六開口OP6連接第二訊號線SL2。當第二遮光層BM2為導電材料時,第二遮光層BM2能夠經由第二訊號線SL2導出靜電,從而對指紋感測裝置100E提供抗ESD保護。The second insulating layer BP2 may extend into the sixth trench T6 and completely cover the sidewalls of the third planar layer PL3 to prevent moisture from entering the third planar layer PL3 . In some embodiments, the second insulating layer BP2 may also extend into the fifth opening OP5 along the upper surface of the first insulating layer BP1. In addition, the sixth opening OP6 of the second insulating layer BP2 can overlap the fifth opening OP5 to expose the second signal line SL2 , therefore, the second light shielding layer BM2 can connect to the second signal line SL2 through the sixth opening OP6 . When the second light-shielding layer BM2 is made of conductive material, the second light-shielding layer BM2 can conduct static electricity through the second signal line SL2 , so as to provide anti-ESD protection for the
在本實施例中,第一遮光層BM1以及第二遮光層BM2中至少一者可以包括金屬層以及透明氧化物層的疊層,其中金屬層可位於第一絕緣層BP1或第二絕緣層BP2與透明氧化物層之間。上述金屬層的材質可以包括導電性良好的金屬,例如鋁、鉬、鈦等金屬。在一些實施例中,上述金屬層也可以具有單層結構或多層結構,多層結構例如上述導電金屬中任意兩層或更多層的疊層,可視需要進行組合與變化。舉例而言,上述金屬層可以包括依續堆疊的鈦層、鋁層以及鈦層或是依續堆疊的鉬層、鋁層以及鉬層,但本發明不以此為限。上述透明氧化物層的材質可以包括反射率低的透明氧化物,例如鉬鉭氧化物(MoTaOx),但本發明不以此為限。In this embodiment, at least one of the first light-shielding layer BM1 and the second light-shielding layer BM2 may include a stack of a metal layer and a transparent oxide layer, wherein the metal layer may be located on the first insulating layer BP1 or the second insulating layer BP2 between the transparent oxide layer. The material of the metal layer may include metals with good electrical conductivity, such as aluminum, molybdenum, titanium and other metals. In some embodiments, the above-mentioned metal layer may also have a single-layer structure or a multi-layer structure. The multi-layer structure, for example, a stack of any two or more layers of the above-mentioned conductive metal, may be combined and changed as required. For example, the above metal layer may include a sequentially stacked titanium layer, aluminum layer and titanium layer or a sequentially stacked molybdenum layer, aluminum layer and molybdenum layer, but the invention is not limited thereto. The material of the transparent oxide layer may include a transparent oxide with low reflectivity, such as molybdenum tantalum oxide (MoTaOx), but the invention is not limited thereto.
圖7是本發明一實施例的顯示設備10的剖面示意圖。以下,配合圖7繼續說明顯示設備10的各個元件與膜層的實施方式,且沿用圖1A至圖1F的實施例中所採用的元件標號與相關內容,但本發明不以此為限。FIG. 7 is a schematic cross-sectional view of a
顯示設備10包括指紋感測裝置100F以及顯示裝置200,其中指紋感測裝置100F適用於顯示裝置200,以為顯示設備10提供指紋辨識的功能。指紋感測裝置100F的結構可類似於前述的指紋感測裝置100、100A、100B、100C、100D、100E,因此,指紋感測裝置100F可具有良好的防濕及抗ESD功能。The
在一些實施例中,指紋感測裝置100F可設置於顯示裝置200的背側,使得上述實施例中的感測元件120可位於顯示裝置200與基板110之間,但本發明不限於此。顯示裝置200例如可以包括畫素陣列基板210與蓋基板220,且畫素陣列基板210可位於指紋感測裝置100F與蓋基板220之間。In some embodiments, the
在本實施例中,當手指F靠近蓋基板220時,畫素陣列基板210中發出的光線LR可被手指F反射至指紋感測裝置100F中的感測元件120。由於通孔V1、通孔V2或微透鏡結構ML具有光準直效果,因此,光線LR被手指F反射所產生的反射光可準直地進入感測元件120中,使得感測元件120能夠感測出清晰的指紋紋峰/紋谷訊號,從而得到品質良好的指紋影像。In this embodiment, when the finger F approaches the
綜上所述,本發明的指紋感測裝置利用溝槽來分隔平坦層,並藉由平坦層與絕緣層的有機材料/無機材料疊構來阻絕水氣,能夠防止有機材料吸收水氣,以避免水氣影響操作元件的性質。另外,遮光層連接訊號線可以導出靜電,而能夠對指紋感測裝置提供抗ESD保護。In summary, the fingerprint sensing device of the present invention uses grooves to separate the flat layer, and blocks water vapor through the organic material/inorganic material stack of the flat layer and the insulating layer, which can prevent the organic material from absorbing water vapor, thereby Avoid moisture affecting the properties of the operating elements. In addition, the light-shielding layer connected to the signal line can discharge static electricity, so as to provide anti-ESD protection for the fingerprint sensing device.
雖然本發明已以實施例揭露如上,然其並非用以限定本發明,任何所屬技術領域中具有通常知識者,在不脫離本發明的精神和範圍內,當可作些許的更動與潤飾,故本發明的保護範圍當視後附的申請專利範圍所界定者為準。Although the present invention has been disclosed above with the embodiments, it is not intended to limit the present invention. Anyone with ordinary knowledge in the technical field may make some changes and modifications without departing from the spirit and scope of the present invention. The scope of protection of the present invention should be defined by the scope of the appended patent application.
10:顯示設備 100、100A、100B、100C、100D、100E、100F:指紋感測裝置 110:基板 120:感測元件 121:第一電極 122:感測層 123:第二電極 130:操作元件 131:驅動元件 132:驅動元件 133:測試元件 200:顯示裝置 210:畫素陣列基板 220:蓋基板 A-A’、B-B’、C-C’、D-D’、E-E’、F-F’、G-G’、H-H’、J-J’、K-K’、L-L’、M-M’、N-N’、P-P’、Q-Q’:剖面線 BM1:第一遮光層 BM2:第二遮光層 BM3:第三遮光層 BP1:第一絕緣層 BP2:第二絕緣層 BP3:第三絕緣層 BP4:第四絕緣層 F:手指 I、II、III、IV、V:區域 IC:晶片接合區 IR:紅外線遮蔽層 LR:光線 MA:操作區 ML:微透鏡結構 OP1:第一開口 OP2:第二開口 OP3:第三開口 OP4:第四開口 OP5:第五開口 OP6:第六開口 PA:周邊區 PL1:第一平坦層 PL2:第二平坦層 PL3:第三平坦層 PL4:第四平坦層 PL5:第五平坦層 SA:感測區 SL1:第一訊號線 SL2:第二訊號線 ST:凹部 T1:第一溝槽 T2:第二溝槽 T3:第三溝槽 T4:第四溝槽 T5:第五溝槽 T6:第六溝槽 TH:孔洞 V1、V2、V3:通孔10:Display device 100, 100A, 100B, 100C, 100D, 100E, 100F: fingerprint sensing device 110: Substrate 120: sensing element 121: the first electrode 122: Sensing layer 123: second electrode 130: Operating elements 131: drive element 132: drive element 133: Test element 200: display device 210:Pixel array substrate 220: cover substrate A-A', BB', CC', D-D', E-E', F-F', G-G', H-H', J-J', K-K', L-L', M-M', N-N', P-P', Q-Q': hatching BM1: the first shading layer BM2: Second shading layer BM3: The third shading layer BP1: The first insulating layer BP2: Second insulating layer BP3: The third insulating layer BP4: The fourth insulating layer F: finger I, II, III, IV, V: Areas IC: Wafer Bonding Area IR: Infrared shielding layer LR: light MA: operating area ML: microlens structure OP1: first opening OP2: second opening OP3: the third opening OP4: fourth opening OP5: fifth opening OP6: sixth opening PA: Peripheral Area PL1: the first flat layer PL2: second flat layer PL3: third flat layer PL4: fourth flat layer PL5: fifth flat layer SA: sensing area SL1: the first signal line SL2: Second signal line ST: Concave T1: first groove T2: second groove T3: the third groove T4: fourth groove T5: fifth groove T6: sixth groove TH: hole V1, V2, V3: through holes
圖1A是本發明一實施例的指紋感測裝置100的上視示意圖。
圖1B是圖1A之指紋感測裝置100的感測區SA的區域I的放大示意圖。
圖1C是沿圖1B的剖面線A-A’所作的剖面示意圖。
圖1D是圖1A之指紋感測裝置100的周邊區PA的區域II的放大示意圖。
圖1E是沿圖1A的剖面線B-B’所作的剖面示意圖。
圖1F是沿圖1A的剖面線C-C’所作的剖面示意圖。
圖2A是本發明一實施例的指紋感測裝置100A的上視示意圖。
圖2B是沿圖2A的剖面線D-D’所作的剖面示意圖。
圖2C是沿圖2A的剖面線E-E’所作的剖面示意圖。
圖3A是本發明一實施例的指紋感測裝置100B的上視示意圖。
圖3B是圖3A之指紋感測裝置100B的感測區SA的區域III的放大示意圖。
圖3C是沿圖3B的剖面線F-F’所作的剖面示意圖。
圖3D是圖3A之指紋感測裝置100B的周邊區PA的區域IV的放大示意圖。
圖3E是沿圖3A的剖面線G-G’所作的剖面示意圖。
圖3F是沿圖3A的剖面線H-H’所作的剖面示意圖。
圖4A是本發明一實施例的指紋感測裝置100C的上視示意圖。
圖4B是沿圖4A的剖面線J-J’所作的剖面示意圖。
圖4C是沿圖4A的剖面線K-K’所作的剖面示意圖。
圖5A是本發明一實施例的指紋感測裝置100D的上視示意圖。
圖5B是圖5A之指紋感測裝置100D的感測區SA的區域V的放大示意圖。
圖5C是沿圖5B的剖面線L-L’所作的剖面示意圖。
圖5D是沿圖5A的剖面線M-M’所作的剖面示意圖。
圖5E是沿圖5A的剖面線N-N’所作的剖面示意圖。
圖6A是本發明一實施例的指紋感測裝置100E的上視示意圖。
圖6B是沿圖6A的剖面線P-P’所作的剖面示意圖。
圖6C是沿圖6A的剖面線Q-Q’所作的剖面示意圖。
圖7是本發明一實施例的顯示設備10的剖面示意圖。FIG. 1A is a schematic top view of a
100:指紋感測裝置100: Fingerprint sensing device
110:基板110: Substrate
120:感測元件120: sensing element
131:驅動元件131: drive element
B-B’:剖面線B-B': hatching
BM1:第一遮光層BM1: the first shading layer
BP1:第一絕緣層BP1: The first insulating layer
MA:操作區MA: operating area
OP1:第一開口OP1: first opening
PA:周邊區PA: Peripheral Area
PL1:第一平坦層PL1: the first flat layer
PL2:第二平坦層PL2: second flat layer
SA:感測區SA: sensing area
SL1:第一訊號線SL1: The first signal line
T1:第一溝槽T1: first groove
V1:通孔V1: Through hole
Claims (21)
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US17/355,202 US12106598B2 (en) | 2020-08-17 | 2021-06-23 | Fingerprint sensing device |
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TW110110148A TWI759153B (en) | 2020-08-17 | 2021-03-22 | Fingerprint sensing module |
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