TWI776665B - Alignment mechanism and bonding machine using the alignment mechanism - Google Patents
Alignment mechanism and bonding machine using the alignment mechanism Download PDFInfo
- Publication number
- TWI776665B TWI776665B TW110132946A TW110132946A TWI776665B TW I776665 B TWI776665 B TW I776665B TW 110132946 A TW110132946 A TW 110132946A TW 110132946 A TW110132946 A TW 110132946A TW I776665 B TWI776665 B TW I776665B
- Authority
- TW
- Taiwan
- Prior art keywords
- alignment
- substrate
- carrier
- pins
- bearing
- Prior art date
Links
Images
Landscapes
- Die Bonding (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Wire Bonding (AREA)
Abstract
Description
本發明有關於一種鍵合對準機構,尤指一種應用在鍵合機台的對準機構,主要在載台的周圍設置複數個針腳,可快速且準確的對位複數個基板,以對經過對位的基板進行鍵合。The present invention relates to a bonding alignment mechanism, in particular to an alignment mechanism applied to a bonding machine. A plurality of pins are mainly arranged around the carrier, which can quickly and accurately align a plurality of substrates, so as to align a plurality of substrates. The aligned substrates are bonded.
積體電路技術的發展已經成熟,且目前電子產品朝向輕薄短小、高性能、高可靠性與智能化的趨勢發展。電子產品中的晶片會對電子產品的性能產生重要影響,其中前述性能部分相關於晶片的厚度。舉例來說,厚度較薄的晶片可以提高散熱效率、增加機械性能、提升電性以及減少封裝的體積及重量。The development of integrated circuit technology has matured, and electronic products are currently developing towards the trend of light, thin, short, high performance, high reliability and intelligence. The wafer in an electronic product can have a significant impact on the performance of the electronic product, which is partly related to the thickness of the wafer. For example, thinner chips can improve heat dissipation efficiency, increase mechanical performance, improve electrical properties, and reduce package size and weight.
於半導體製程中,通常會在晶片的背面(即下表面)進行基板減薄製程、通孔蝕刻製程與背面金屬化製程。然而,在進行基板減薄的過程中,當基板的厚度過薄(例如,低於或等於150微米)時,可能會導致晶圓破片或使晶圓發生彎曲變形,從而使得晶片無法使用並降低晶片良率。In the semiconductor manufacturing process, the substrate thinning process, the via etching process and the backside metallization process are usually performed on the back surface (ie, the lower surface) of the wafer. However, in the process of substrate thinning, when the thickness of the substrate is too thin (for example, less than or equal to 150 microns), it may cause wafer breakage or bending deformation of the wafer, making the wafer unusable and reducing the wafer yield.
因此,在進行基板減薄製程前會先進行鍵合製程,主要透過黏合層連接將晶圓與載體(例如,藍寶石玻璃)鍵合,並於完成基板減薄製程後,進行解鍵合製程,以將晶圓與載體分離。Therefore, before the substrate thinning process is performed, a bonding process is performed, and the wafer is bonded to the carrier (eg, sapphire glass) mainly through the bonding of the adhesive layer, and after the substrate thinning process is completed, a debonding process is performed to bond the The wafer is separated from the carrier.
在鍵合製程中需要使用鍵合機台先對準晶圓及載體,而後對層疊的晶圓及載體進行鍵合。然而,現有的鍵合機台多數僅能適用於特定尺寸的晶圓,而且在鍵合過程中可能因為壓合力量不當、壓合板並非水平或其他因素,導致基板與載體之間的黏合層具有鍵合氣泡,以及使得鍵合後之晶圓的總厚度變異(TTV)不佳。In the bonding process, a bonding machine needs to be used to align the wafer and the carrier first, and then bond the stacked wafers and the carrier. However, most of the existing bonding machines can only be applied to wafers of a certain size, and during the bonding process, the bonding layer between the substrate and the carrier may have poor bonding force due to improper pressing force, non-level pressing plate or other factors. Bonding bubbles, and poor total thickness variation (TTV) of the wafer after bonding.
為了解決先前技術所面臨的問題,本發明一種新穎的鍵合機台,在使用時可依據基板的大小更換不同尺寸的承載針腳,使得本發明所述的鍵合機台可用以對準多種尺寸的基板,並在完成對準步驟之後進行基板的鍵合。In order to solve the problems faced by the prior art, the present invention is a novel bonding machine, which can be used to replace bearing pins of different sizes according to the size of the substrate, so that the bonding machine of the present invention can be used to align various sizes substrates, and the bonding of the substrates is performed after the alignment steps are completed.
本發明的一目的,在於提出一種鍵合對準機構,主要包括一載台、複數個承載針腳及一第一對準針腳,其中複數個承載針腳及第一對準針腳設置在載台的周圍,並延伸至載台的承載面。An object of the present invention is to provide a bonding alignment mechanism, which mainly includes a carrier, a plurality of bearing pins and a first alignment pin, wherein the plurality of carrier pins and the first alignment pins are arranged around the carrier , and extends to the bearing surface of the stage.
承載針腳可相對於載台的承載面升降,並用以承載一第一基板。第一對準針腳朝向複數個承載針腳,其中第一對準針腳與複數個對準針腳分別位於載台的中心線的兩側。第一對準針腳可相對於載台的承載面升降,並靠近或遠離承載面上的對準區域。當第一對準針腳朝複數的承載針腳的方向位移時,將會接觸及推抵承載針腳承載的第一基板,並使得第一基板對準承載面的對準區域。The carrying pins can lift up and down relative to the carrying surface of the carrier, and are used for carrying a first substrate. The first alignment stitch faces the plurality of bearing pins, wherein the first alignment stitch and the plurality of alignment stitches are located on two sides of the center line of the carrier, respectively. The first alignment pins can be raised and lowered relative to the bearing surface of the carrier, and approach or move away from the alignment area on the bearing surface. When the first alignment pins are displaced in the direction of the plurality of bearing pins, they will contact and push against the first substrate carried by the bearing pins, so that the first substrate is aligned with the alignment area of the bearing surface.
複數的第二對準針腳平均分布在載台的周圍,可相對於載台的承載面升降,並靠近或遠離承載面的對準區域。第二對準針腳朝對準區域位移一段距離後,可將一第二基板放置在第二對準針腳上。而後第二對準針腳會繼續朝對準區域移動,並接觸及對抵承載的第二基板,使得第二基板對準第一基板及對準區域。The plurality of second alignment pins are evenly distributed around the carrier, can be raised and lowered relative to the carrier surface of the carrier, and are close to or away from the alignment area of the carrier surface. After the second alignment pins are displaced toward the alignment area by a distance, a second substrate can be placed on the second alignment pins. Then, the second alignment pins will continue to move toward the alignment area, and contact and abut the second substrate carried, so that the second substrate is aligned with the first substrate and the alignment area.
在完成第一基板及第二基板的對準動作後,第二對準針腳會相對於載台的承載面下降,並逐漸遠離承載面的對準區域,以將第二基板放置在第一基板上。透過本發明所述的鍵合對準機構可快速且準確的對準第一基板及第二基板,並對經過對準的第一基板及第二基板進行鍵合。After the alignment of the first substrate and the second substrate is completed, the second alignment pins will descend relative to the carrier surface of the stage and gradually move away from the alignment area of the carrier surface to place the second substrate on the first substrate superior. Through the bonding alignment mechanism of the present invention, the first substrate and the second substrate can be quickly and accurately aligned, and the aligned first substrate and the second substrate can be bonded.
本發明的一目的,在於提出一種鍵合對準機構,可依據第一基板及第二基板的尺寸,更換不同長度的承載針腳,並調整第一對準針腳及第二對準針腳的升降及移動範圍。因此本發明所述的鍵合對準機構可廣泛的使用在多種不同尺寸的第一及第二基板,並完成第一基板及第二基板的對位。An object of the present invention is to provide a bonding alignment mechanism, which can replace bearing pins with different lengths according to the size of the first substrate and the second substrate, and adjust the lifting and lowering of the first alignment pins and the second alignment pins. range of movement. Therefore, the bonding alignment mechanism of the present invention can be widely used in the first and second substrates of various sizes, and can complete the alignment of the first substrate and the second substrate.
本發明的一目的,在於提出一種鍵合對準機構,其中第一對準針腳及第二對準針腳分別連接一驅動單元。驅動單元包括一導軌、一連接座及一驅動桿體,其中連接座設置在導軌上,而驅動桿體位於連接座的下方並接觸連接座。驅動桿體伸長時會推動連接座,並帶動連接座沿著導軌位移。An object of the present invention is to provide a bonding alignment mechanism, wherein the first alignment pin and the second alignment pin are respectively connected to a driving unit. The driving unit includes a guide rail, a connecting base and a driving rod body, wherein the connecting base is arranged on the guide rail, and the driving rod body is located below the connecting base and contacts the connecting base. When the driving rod body is extended, it will push the connecting seat and drive the connecting seat to move along the guide rail.
此外連接座的上方可設置一限位單元,用以限制連接座上升的最大高度,並限制連接座連接的第一及第二對準針腳上升的最大高度,及朝承載面的對準區域移動的最大距離,使得第一及第二對準針腳適用於對位多種不同尺寸的基板。In addition, a limit unit can be arranged above the connection seat to limit the maximum height of the connection seat, and the maximum height of the first and second alignment pins connected by the connection seat, and the movement toward the alignment area of the bearing surface. The maximum distance makes the first and second alignment pins suitable for aligning substrates of various sizes.
本發明的一目的,在於提出一種鍵合機台,包括一第一腔體、一第二腔體、一壓合單元及一鍵合對準機構,其中壓合單元設置在第一腔體上,而鍵合對準機構則設置在第二腔體上。第一腔體面對第二腔體,當第一腔體連接第二腔體時,可以在第一腔體及第二腔體之間形成一密閉空間,並可抽出密閉空間內的氣體,使得密閉空間為低壓或真空狀態。An object of the present invention is to provide a bonding machine, which includes a first cavity, a second cavity, a pressing unit and a bonding alignment mechanism, wherein the pressing unit is arranged on the first cavity , and the bonding alignment mechanism is arranged on the second cavity. The first cavity faces the second cavity. When the first cavity is connected to the second cavity, a closed space can be formed between the first cavity and the second cavity, and the gas in the closed space can be extracted. Make the closed space a low pressure or vacuum state.
壓合單元面對鍵合對準機構,可朝鍵合對準機構的載台位移,並壓合載台上層疊的第一基板及第二基板,以完成第一基板及第二基板的鍵合。The pressing unit faces the bonding alignment mechanism, can be displaced toward the carrier of the bonding alignment mechanism, and presses the first substrate and the second substrate stacked on the carrier to complete the bonding of the first substrate and the second substrate combine.
為了達到上述的目的,本發明提出一種鍵合對準機構,包括:一載台,包括一承載面,並於承載面上定義一對準區域;複數個升降單元,設置在載台的周圍;複數個承載針腳,分別連接複數個升降單元,並透過複數個升降單元帶動複數個承載針腳相對於載台的承載面升降,其中複數個承載針腳用以承載一第一基板;一第一驅動單元,設置在載台的周圍;一第一對準針腳,連接第一驅動單元,透過第一驅動單元驅動第一對準針腳相對於載台的承載面升降,並驅動第一對準針腳靠近或遠離承載面的對準區域,其中第一對準針腳用以推抵放置在承載針腳的第一基板,使得第一基板對準對準區域;複數個第二驅動單元,設置在載台的周圍;及複數個第二對準針腳,連接第二驅動單元,其中第二對準針腳用以承載一第二基板,而第二驅動單元則用以驅動第二對準針腳相對於載台的承載面升降,並驅動第二對準針腳靠近或遠離承載面的對準區域,以推抵第二基板,使得第二基板對準第一基板。In order to achieve the above purpose, the present invention proposes a bonding alignment mechanism, comprising: a carrier, including a bearing surface, and defining an alignment area on the bearing surface; a plurality of lifting units arranged around the carrier; A plurality of bearing pins are respectively connected with a plurality of lifting units, and the plurality of bearing pins are moved up and down relative to the bearing surface of the carrier through the plurality of lifting units, wherein the plurality of bearing pins are used to carry a first substrate; a first driving unit , arranged around the carrier; a first alignment pin is connected to the first drive unit, and the first alignment pin is driven up and down relative to the bearing surface of the carrier through the first drive unit, and drives the first alignment pin to approach or an alignment area away from the bearing surface, wherein the first alignment pins are used to push against the first substrate placed on the bearing pins, so that the first substrate is aligned with the alignment area; a plurality of second driving units are arranged around the carrier ; and a plurality of second alignment pins connected to the second driving unit, wherein the second alignment pins are used to carry a second substrate, and the second driving unit is used to drive the second alignment pins to carry relative to the carrier The surface is lifted up and down, and the second alignment pins are driven close to or away from the alignment area of the bearing surface to push against the second substrate, so that the second substrate is aligned with the first substrate.
本發明提供一種鍵合機台,包括:一第一腔體;一第二腔體,面對第一腔體,其中第一腔體連接第二腔體時,於第一腔體及第二腔體之間形成一密閉空間;一壓合單元,連接第一腔體;一鍵合對準機構,設置於第二腔體,並面對壓合單元,包括:一載台,包括一承載面,並於承載面上定義一對準區域;複數個升降單元,設置在載台的周圍;複數個承載針腳,分別連接複數個升降單元,並透過複數個升降單元帶動複數個承載針腳相對於載台的承載面升降,其中複數個承載針腳用以承載一第一基板;一第一驅動單元,設置在載台的周圍;一第一對準針腳,連接第一驅動單元,其中第一驅動單元用以驅動第一對準針腳相對於載台的承載面升降,並驅動第一對準針腳靠近或遠離承載面的對準區域,以推抵承載針腳承載的第一基板,使得第一基板對準對準區域;複數個第二驅動單元,設置在載台的周圍;及複數個第二對準針腳,連接第二驅動單元,其中第二對準針腳用以承載一第二基板,而驅動單元則用以驅動第二對準針腳相對於載台的承載面升降,並驅動第二對準針腳靠近或遠離承載面的對準區域,以推抵第二基板,使得第二基板對準第一基板。The present invention provides a bonding machine, comprising: a first cavity; a second cavity facing the first cavity, wherein when the first cavity is connected to the second cavity, the first cavity and the second cavity A closed space is formed between the cavities; a pressing unit is connected to the first cavity; a key alignment mechanism is arranged in the second cavity and faces the pressing unit, including: a carrier, including a bearing and define an alignment area on the bearing surface; a plurality of lifting units are arranged around the carrier; a plurality of bearing pins are respectively connected to the plurality of lifting units, and through the plurality of lifting units, the plurality of bearing pins are driven relative to each other. The bearing surface of the carrier moves up and down, wherein a plurality of bearing pins are used to carry a first substrate; a first driving unit is arranged around the carrier; a first alignment pin is connected to the first driving unit, wherein the first driving unit The unit is used to drive the first alignment pins to move up and down relative to the bearing surface of the carrier, and to drive the first alignment pins to be close to or away from the alignment area of the carrier surface, so as to push against the first substrate carried by the carrier pins, so that the first substrate an alignment area; a plurality of second driving units arranged around the carrier; and a plurality of second alignment pins connected to the second driving units, wherein the second alignment pins are used to carry a second substrate, and The driving unit is used to drive the second alignment pins to move up and down relative to the bearing surface of the carrier, and drive the second alignment pins to approach or move away from the alignment area of the carrier surface to push against the second substrate to align the second substrate the first substrate.
所述的鍵合對準機構及鍵合機台,其中載台包括複數個溝槽朝向承載面或對準區域的中心,而承載針腳、第一對準針腳及第二對準針腳分別位於複數個溝槽內。The bonding alignment mechanism and the bonding machine, wherein the carrier includes a plurality of grooves facing the center of the bearing surface or the alignment area, and the carrier pins, the first alignment pins and the second alignment pins are respectively located in the plurality of in a groove.
所述的鍵合對準機構及鍵合機台,其中承載針腳包括一承載部及一第一對準部,承載部用以承載第一基板,而第一對準部則凸出承載部,並用以接觸及對準第一基板。In the bonding alignment mechanism and the bonding machine, the bearing pin includes a bearing portion and a first alignment portion, the bearing portion is used for bearing the first substrate, and the first alignment portion protrudes from the bearing portion, and used for contacting and aligning the first substrate.
所述的鍵合對準機構及鍵合機台,其中第二對準針腳未連接第二驅動單元的一端包括一凸出部,用以承載第二基板。In the bonding alignment mechanism and the bonding machine, one end of the second alignment pin which is not connected to the second driving unit includes a protruding portion for carrying the second substrate.
所述的鍵合對準機構及鍵合機台,其中第一驅動單元及第二驅動單元包括:一導軌,相對於載台的承載面傾斜;一連接座,連接導軌,其中連接座連接第一對準針腳或第二對準針腳;及一驅動桿體,連接連接座、第一對準針腳或第二對準針腳,驅動桿體用以帶動連接座沿著滑軌位移,使得第一對準針腳或第二對準針腳相對於載台的承載面升降,並靠近或遠離對準區域。Said bonding alignment mechanism and bonding machine, wherein the first driving unit and the second driving unit include: a guide rail, inclined relative to the bearing surface of the carrier; a connecting seat, connecting the guide rail, wherein the connecting seat is connected to the first an alignment pin or a second alignment pin; and a driving rod body, which is connected to the connecting seat, the first alignment pin or the second alignment pin, and the driving rod body is used to drive the connection seat to move along the slide rail, so that the first alignment pin The alignment pins or secondary alignment pins are raised and lowered relative to the loading surface of the stage and approach or away from the alignment area.
所述的鍵合機台,包括:一第一驅動裝置連接第一腔體,並用以驅動第一腔體靠近或遠離第二腔體;及一第二驅動裝置連接壓合單元,並用以驅動壓合單元靠近或遠離載台,使得壓合單元壓合放置在載台上層疊的第一基板及第二基板。The bonding machine includes: a first drive device connected to the first cavity and used to drive the first cavity to approach or away from the second cavity; and a second drive device connected to the pressing unit and used to drive The pressing unit is close to or far from the carrier, so that the pressing unit presses the first substrate and the second substrate stacked on the carrier.
所述的鍵合機台及鍵合機台,包括一拿取裝置用以夾持第一基板及第二基板,並將第一基板及第二基板放置在鍵合對準機構上,其中拿取裝置包括複數個第一對位單元,而鍵合對準機構則包括複數的第二對位單元位於載台的周圍,並透過第一對位單元及第二對位單元對位拿取裝置及載台。The bonding machine and the bonding machine include a pick-up device for clamping the first substrate and the second substrate, and placing the first substrate and the second substrate on the bonding alignment mechanism, wherein the pick-up device is used to hold the first and second substrates. The pickup device includes a plurality of first alignment units, and the bonding alignment mechanism includes a plurality of second alignment units located around the carrier, and the first alignment unit and the second alignment unit align the pickup device. and stage.
請參閱圖1,為本發明鍵合對準機構一實施例的立體示意圖。如圖所示,鍵合對準機構10包括一載台11、複數個升降單元13、複數個承載針腳14、一第一驅動單元15、一第一對準針腳16、複數個第二驅動單元17及複數個第二對準針腳18,其中升降單元13、第一驅動單元15及第二驅動單元17設置在載台11的周圍,並分別連接承載針腳14、第一對準針腳16及第二對準針腳18。Please refer to FIG. 1 , which is a three-dimensional schematic diagram of an embodiment of the bonding alignment mechanism of the present invention. As shown in the figure, the
載台11包括一承載面111,用以承載基板。此外可進一步在承載面111上定義一對準區域113,其中對準區域113可以是承載面111的中央區域,例如承載面111可為圓形,而對準區域113則是位於承載面111內較小的圓,且承載面111及對準區域113的圓心重疊。在進行對準步驟時,一第一基板121及一第二基板123可分別對準或重疊對準區域113,使得第二基板123對準並重疊第一基板121。The
各個升降單元13分別連接各個承載針腳14,並用以驅動各個承載針腳14相對於載台11的承載面111升降。具體而言,承載針腳14可為長條狀,其中承載針腳14的一端連接升降單元13。Each
在本發明一實施例中,如圖2及圖5所示,承載針腳14包括一承載部141及一第一對準部143,其中承載部141位於承載針腳14未連接升降單元13的一端,且第一對準部143則凸出承載部141。承載針腳14透過承載部141承載第一基板121,並透過第一對準部143對位承載的第一基板121,詳細的對準方式會在後續的實施例中說明。In an embodiment of the present invention, as shown in FIG. 2 and FIG. 5 , the
具體而言,承載針腳14未連接升降單元13的一端設置一缺口142,以在承載針腳14的一端形成承載部141,而未設置缺口142的承載針腳14則為第一對準部143,其中第一對準部143的高度大於承載部141。此外第一對準部143朝向承載部141的一端可設置一倒角或圓角,使得未準確地放置在承載部141的第一基板121,由第一對準部143滑落至承載部141。在本發明另一實施例中,亦可於承載針腳14的上表面設置一凸起部,並以該凸起部作為第一對準部143。Specifically, a
在本發明一實施例中,如圖2所示,升降單元13包括一導軌131、一連接座133及一驅動桿體135,其中導軌131垂直載台11的承載面111。連接座133連接導軌131,而驅動桿體135則位於連接座133下方,並接觸連接座133。In an embodiment of the present invention, as shown in FIG. 2 , the
當驅動桿體135伸長或縮短時,會帶動或推動連接座133沿著導軌131位移,使得連接座133連接的承載針腳14相對於載台11的承載面111升降,例如驅動桿體135可以是氣壓缸,並透過馬達驅動氣壓缸升降。When the
第一驅動單元15連接第一對準針腳16,用以驅動第一對準針腳16相對於載台11的承載面111升降,並驅動第一對準針腳16靠近或遠離承載面111的對準區域113,其中第一對準針腳16為長條狀。The
在本發明一實施例中,載台11的承載面111可為圓形,其中複數個升降單元13及第一驅動單元15分別位於承載面111的直徑或中心線的兩側,而複數個承載針腳14及第一對準針腳16分別位於承載面111的直徑中心線的兩側。In an embodiment of the present invention, the bearing
在實際應用時,升降單元13可驅動承載針腳14升起,並將第一基板121放置在承載針腳14的承載部141。而後第一驅動單元15會驅動第一對準針腳16相對於載台11的承載面111升起,並靠近承載面111的對準區域113。第一對準針腳16會接觸並推抵放置在承載針腳14的承載部141上的第一基板121,並朝複數個承載針腳14的第一對準部143的方向推抵第一基板121。承載針腳14的第一對準部143及第一對準針腳16都會接觸第一基板121的外緣,使得第一基板121對準承載面111的對準區域113。In practical application, the lifting
在完成第一基板121的對位後,第一驅動單元15會驅動第一對準針腳16相對於載台11的承載面111下降,並遠離承載面111的對準區域113。而後升降單元13會驅動承載針腳14相對於載台11的承載面111下降,並將第一基板121放置在載台11的承載面111及/或對準區域113上。After the alignment of the
在本發明一實施例中,複數個升降單元13可同步驅動各個承載針腳14下降,將第一基板121平放在載台11的承載面111及/或對準區域113上。在本發明一實施例中,其中一個升降單元13可先驅動連接的承載針腳14下降,使得第一基板121斜放在載台11的承載面111。當第一基板121接觸載台11的承載面111後,其他的升降單元13才會驅動連接的承載針腳14下降,以將第一基板121放置在載台11的承載面111及/或對準區域113。In an embodiment of the present invention, the plurality of lifting
第二驅動單元17連接第二對準針腳18,用以驅動第二對準針腳18相對於載台11的承載面111升降,並靠近或遠離承載面111的對準區域113。在本發明一實施例中,載台11的承載面111可為圓形,而複數個第二驅動單元17則平均分布在載台11的承載面111周圍,例如相鄰的第二驅動單元17及/或第二對準針腳18的距離及/或角度相同,並用以承載及對準第二基板123。The
如圖3及圖6所示,未連接第二驅動單元17的第二對位針腳18的一端具有一凸出部181,其中凸出部181凸出第二對位針腳18的一端,並用以承載一第二基板123。具體而言,凸出部181可設置在第二對位針腳18一端的中間區域,並於凸出部181的上方形成一第一缺口183,而凸出部181的下方則形成一第二缺口185。As shown in FIG. 3 and FIG. 6 , one end of the
第二基板123位於第一缺口183內,並透過凸出部181承載第二基板123。第一基板121則位於第二缺口185內,其中第二基板123及第一基板121分別位於凸出部181的上下兩側。例如第一基板121為晶圓,而第二基板123為載板。The
在實際應用時,第二驅動單元17用以驅動第二對準針腳18相對於載台11的承載面111升起,並靠近承載面111的對準區域113,使得第一基板121位於第二對準針腳18的凸出部181下方。In practical application, the
將第二基板123放置在第二對位針腳18的凸出部181上,並以凸出部181承載第二基板123。第二驅動單元17會繼續驅動第二對位針腳18朝對準區域113位移,使得各個第二對位針腳18的一端接觸並對位第二基板123,例如以凸出部181上方的第一缺口183內的第一對位針腳18接觸並推抵第二基板123,使得第二基板123對準承載面111的對準區域113及/或第一基板121。The
在本發明一實施例中,凸出部181上方的第二對準針腳18上可設置一倒角或圓角,使得未準確地放置在凸出部181的第二基板123滑落至凸出部181。此外凸出部181的底部可為斜面,例如凸出部181的底部的斜面與載台11的承載面111之間的夾角小於90度,以避免第二對準針腳18靠近或遠離承載面111的對準區域113時,碰觸到已完成對位的第一基板121。In an embodiment of the present invention, a chamfer or a rounded corner may be provided on the second alignment pins 18 above the protruding
當第二基板123對準承載面111的對準區域113及/或第一基板121後,第二驅動單元17會驅動第二對準針腳18相對於載台11的承載面111下降,並遠離承載面111的對準區域113,以將第二基板123放置在第一基板121上。After the
在本發明另一實施例中,其中一個第二驅動單元17可以先驅動連接的第二對準針腳18下降並遠離對準區域113,使得第二基板123傾斜放置在第一基板121上。而後其他的第二驅動單元17會驅動連接的第二對準針腳18下降並遠離對準區域113,將第二基板123放置在第一基板121上,以避免將第二基板123放置在第一基板121之間的黏合層內產生殘留的氣體。In another embodiment of the present invention, one of the
在本發明一實施例中,如圖3及圖4所示,第一驅動單元15及第二驅動單元17可具有相同的構造。以第二驅動單元17為例進行說明,第二驅動單元17包括一導軌171、一連接座173及一驅動桿體175,其中導軌171相對於載台11的承載面111傾斜,例如導軌171的延伸線與載台11的承載面111的延伸線之間的夾角小於90度。連接座173連接導軌171,而驅動桿體175則接觸連接座173、第一對準針腳16或第二對準針腳18,例如位於連接座173的下方。In an embodiment of the present invention, as shown in FIG. 3 and FIG. 4 , the
當驅動桿體175伸長或縮短時,將會帶動或推動連接座173沿著導軌171位移。由於導軌171相對於載台11的承載面111傾斜,使得連接座173連接的第二對準針腳18會相對於載台11的承載面111升降,並靠近或遠離承載面111的對準區域113,例如驅動桿體175可以是氣壓缸,並透過馬達驅動氣壓缸升降。When the driving
在本發明一實施例中,第二驅動單元17可包括一固定架177,其中固定架177包括一底部1771、一頂部1773及一傾斜部1775,底部1771及頂部1773相面對,而傾斜部1775則連接頂部1773及底部1771。傾斜部1775具有一斜面相對於載台的承載面111傾斜,而導軌171設置在傾斜部1775的斜面上。In an embodiment of the present invention, the
此外頂部1773上可設置一限位單元179,其中限位單元179用以限制連接座173及第二對位針腳18的位移範圍,例如限位單元179可為螺絲,並穿過頂部1773上的螺孔,並用以限制連接座173及第二對位針腳18位移的最高位置。具體而言,當連接座173接觸限位單元179時,驅動桿體175便無法繼續驅動連接座173沿著導軌171向上位移,以達到限制連接座173的位移範圍的目的。當限位單元179凸出頂部1773的下表面的長度較大時,連接座173及第二對位針腳18位移的最高位置會較低。In addition, a
在本發明一實施例中,驅動桿體175接觸連接座173的一端可設置一滾輪1751,而連接座173接觸或面對驅動桿體175的表面則可設置一線軌或凹槽,其中滾輪1751則位於線軌或凹槽內。透過滾輪1751的設置,有利於驅動桿體175及連接座173相對位移,使得連接座173及第二對位針腳18靠近或遠離承載面11的對準區域113。In an embodiment of the present invention, a
在本發明一實施例中,載台11的承載面111上可設置複數個溝槽115,而承載針腳14、第一對準針腳16及第二對準針腳18則設置在各個溝槽115內,可沿著溝槽115相對於承載面111升降,並沿著溝槽115相對於承載面111的對準區域113位移。此外載台11的承載面111為圓形,而溝槽115、承載針腳14、第一對準針腳16及第二對準針腳18則朝向承載面111的中心或圓心。In an embodiment of the present invention, a plurality of
請參閱圖7,為本發明鍵合機台一實施例的立體透視示意圖。請配合參閱圖1,鍵合機台20包括一第一腔體21、一第二腔體23、一壓合單元25及一鍵合對準機構10,其中壓合單元25連接第一腔體21,而鍵合對準機構10則設置在第二腔體23上,且壓合單元25面對鍵合對準機構10。Please refer to FIG. 7 , which is a three-dimensional perspective schematic diagram of an embodiment of a bonding machine of the present invention. Please refer to FIG. 1 , the
第一腔體21面對第二腔體23,其中第一腔體21連接第二腔體23時,會在第一腔體21及第二腔體23之間形成一密閉空間。而後可透過一抽氣裝置抽出密閉空間內的氣體,使得第一腔體21及第二腔體23之間的密閉空間為低壓狀態。此外當第一腔體21連接第二腔體23時,壓合單元25亦會靠近鍵合對準機構10的載台11。The
在本發明一實施例中,鍵合機台20可包括一第一驅動裝置271及一第二驅動裝置273,其中第一驅動裝置271連接第一腔體21,並用以驅動第一腔體21靠近或遠離第二腔體23。第二驅動裝置273連接壓合單元25,例如第二驅動裝置273可設置在第一腔體21上,並連接及帶動壓合單元25相對於第一腔體21位移,使得壓合單元25靠近或遠離鍵合對準機構10的載台11。In an embodiment of the present invention, the
具體而言,當鍵合對準機構10完成第一基板121及第二基板123的對位後,第二驅動裝置273會驅動壓合單元25靠近鍵合對準機構10的載台11,並以壓合單元25壓合放置在載台11上層疊設置的第一基板121及第二基板123。此外,載台11及/或壓合單元25內可設置一加熱裝置,並透過加熱裝置加熱被載台11及壓合單元25壓合的第一基板121及第二基板123,使得第一基板121及第二基板123之間的黏合層黏合兩個基板,以完成第一基板121及第二基板123的鍵合。Specifically, after the
在實際應用時,可透過圖8所示的拿取裝置30,其中拿取裝置30用以拿取第一基板121及第二基板123,並將第一基板121及第二基板123放置在鍵合對準機構10上。具體而言,拿取裝置30可包括至少一白努力吸盤,並透過吸附的方式拿取第一基板121或第二基板123。In practical application, the picking
此外,拿取裝置30可包括複數個第一對位單元31,而鍵合對準機構10可包括複數個第二對位單元19,其中第二對位單元19位於載台11的周為,並透過第一對位單元31及第二對位單元19對位拿取裝置30及鍵合對準機構10的載台11,以將第一基板121及第二基板123放置在載台11上的固定位置。例如第一對位單元31可為凸出部,而第二對準單元19可為凹部,其中第一對位單元31用以插入第二對位單元19。In addition, the picking
以上所述者,僅為本發明之一較佳實施例而已,並非用來限定本發明實施之範圍,即凡依本發明申請專利範圍所述之形狀、構造、特徵及精神所為之均等變化與修飾,均應包括於本發明之申請專利範圍內。The above description is only a preferred embodiment of the present invention, and is not intended to limit the scope of the present invention. Modifications should be included within the scope of the patent application of the present invention.
10:鍵合對準機構
11:載台
111:承載面
113:對準區域
115:溝槽
121:第一基板
123:第二基板
13:升降單元
131:導軌
133:連接座
135:驅動桿體
14:承載針腳
141:承載部
142:缺口
143:第一對準部
15:第一驅動單元
16:第一對準針腳
17:第二驅動單元
171:導軌
173:連接座
175:驅動桿體
1751:滾輪
177:固定架
1771:底部
1773:頂部
1775:傾斜部
179:限位單元
18:第二對準針腳
181:凸出部
183:第一缺口
185:第二缺口
19:第二對位單元
20:鍵合機台
21:第一腔體
23:第二腔體
25:壓合單元
271:第一驅動裝置
273第二驅動裝置
30:拿取裝置
31:第一對位單元10: Bonding Alignment Mechanism
11: Carrier
111: Bearing surface
113: Alignment area
115: Groove
121: The first substrate
123: Second substrate
13: Lifting unit
131: Rails
133: Connector
135: Drive rod body
14: Bearing pins
141: Bearing Department
142: Notch
143: First Alignment Section
15: The first drive unit
16: The first alignment pin
17: Second drive unit
171: Rails
173: Connector
175: Drive rod body
1751: Roller
177:Fixed frame
1771: Bottom
1773: Top
1775: Slope
179: Limit unit
18: Second alignment pin
181: Projection
183: First Gap
185: Second Gap
19: Second alignment unit
20: Bonding machine
21: The first cavity
23: Second cavity
25: Press unit
271:
[圖1]為本發明鍵合對準機構一實施例的立體示意圖。[FIG. 1] is a three-dimensional schematic diagram of an embodiment of the bonding alignment mechanism of the present invention.
[圖2]為本發明鍵合對準機構的升降單元及承載針腳一實施例的立體示意圖。FIG. 2 is a perspective view of an embodiment of the lifting unit and the bearing pins of the bonding alignment mechanism of the present invention.
[圖3]為本發明鍵合對準機構的第二驅動單元及第二對準針腳一實施例的立體示意圖。3 is a perspective view of an embodiment of the second driving unit and the second alignment pins of the bonding alignment mechanism of the present invention.
[圖4]為本發明鍵合對準機構的第一驅動單元及第一對準針腳一實施例的立體示意圖。4 is a perspective view of an embodiment of the first driving unit and the first alignment pins of the bonding alignment mechanism of the present invention.
[圖5]本發明鍵合對準機構的承載針腳承載第一基板一實施例的剖面示意圖。[ Fig. 5 ] A schematic cross-sectional view of an embodiment of the carrier pin of the bonding alignment mechanism of the present invention carrying the first substrate.
[圖6]為本發明鍵合對準機構的第二對準針腳承載第二基板一實施例的剖面示意圖。6 is a schematic cross-sectional view of an embodiment of the second alignment pin of the bonding alignment mechanism of the present invention carrying the second substrate.
[圖7]為本發明鍵合機台一實施例的立體透視圖。[ Fig. 7 ] is a perspective perspective view of an embodiment of a bonding machine of the present invention.
[圖8]為本發明鍵合對準機構的拿取裝置一實施例的立體示意圖。FIG. 8 is a perspective view of an embodiment of a pickup device for the bonding alignment mechanism of the present invention.
10:鍵合對準機構 10: Bonding Alignment Mechanism
11:載台 11: Carrier
111:承載面 111: Bearing surface
113:對準區域 113: Alignment area
115:溝槽 115: Groove
121:第一基板 121: The first substrate
13:升降單元 13: Lifting unit
14:承載針腳 14: Bearing pins
15:第一驅動單元 15: The first drive unit
16:第一對準針腳 16: The first alignment pin
17:第二驅動單元 17: Second drive unit
18:第二對準針腳 18: Second alignment pin
19:第二對位單元 19: Second alignment unit
Claims (10)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW110132946A TWI776665B (en) | 2021-09-03 | 2021-09-03 | Alignment mechanism and bonding machine using the alignment mechanism |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW110132946A TWI776665B (en) | 2021-09-03 | 2021-09-03 | Alignment mechanism and bonding machine using the alignment mechanism |
Publications (2)
Publication Number | Publication Date |
---|---|
TWI776665B true TWI776665B (en) | 2022-09-01 |
TW202312337A TW202312337A (en) | 2023-03-16 |
Family
ID=84958003
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW110132946A TWI776665B (en) | 2021-09-03 | 2021-09-03 | Alignment mechanism and bonding machine using the alignment mechanism |
Country Status (1)
Country | Link |
---|---|
TW (1) | TWI776665B (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI863654B (en) * | 2023-10-26 | 2024-11-21 | 天虹科技股份有限公司 | Wafer holding device having function of positioning wafer |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW201947673A (en) * | 2018-05-16 | 2019-12-16 | 大陸商長江存儲科技有限責任公司 | A system and a method for wafer bonding alignment compensation |
TW202002146A (en) * | 2018-06-29 | 2020-01-01 | 大陸商上海微電子裝備(集團)股份有限公司 | Manipulator, bonding cavity, wafer bonding system and bonding method reducing the process of aligning the carrier wafer and the device wafer in the bonding cavity |
TW202040635A (en) * | 2014-12-10 | 2020-11-01 | 日商尼康股份有限公司 | Substrate stacking device and substrate stacking method |
TWM609527U (en) * | 2020-11-24 | 2021-03-21 | 天虹科技股份有限公司 | Alignment mechanism of bonding machine |
TW202118639A (en) * | 2014-02-03 | 2021-05-16 | 奧地利商Ev集團E塔那有限公司 | Method and device for bonding substrates |
-
2021
- 2021-09-03 TW TW110132946A patent/TWI776665B/en active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TW202118639A (en) * | 2014-02-03 | 2021-05-16 | 奧地利商Ev集團E塔那有限公司 | Method and device for bonding substrates |
TW202040635A (en) * | 2014-12-10 | 2020-11-01 | 日商尼康股份有限公司 | Substrate stacking device and substrate stacking method |
TW201947673A (en) * | 2018-05-16 | 2019-12-16 | 大陸商長江存儲科技有限責任公司 | A system and a method for wafer bonding alignment compensation |
TW202002146A (en) * | 2018-06-29 | 2020-01-01 | 大陸商上海微電子裝備(集團)股份有限公司 | Manipulator, bonding cavity, wafer bonding system and bonding method reducing the process of aligning the carrier wafer and the device wafer in the bonding cavity |
TWM609527U (en) * | 2020-11-24 | 2021-03-21 | 天虹科技股份有限公司 | Alignment mechanism of bonding machine |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI863654B (en) * | 2023-10-26 | 2024-11-21 | 天虹科技股份有限公司 | Wafer holding device having function of positioning wafer |
Also Published As
Publication number | Publication date |
---|---|
TW202312337A (en) | 2023-03-16 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP4574251B2 (en) | Manufacturing method of semiconductor device | |
JP7023590B2 (en) | Semiconductor chip pickup and mounting equipment | |
KR101515181B1 (en) | Wafer bonder having holder and wafer bonding method | |
TWI776665B (en) | Alignment mechanism and bonding machine using the alignment mechanism | |
JP4664150B2 (en) | Semiconductor device manufacturing method and semiconductor manufacturing apparatus | |
JP2022114399A (en) | Die bonding apparatus and semiconductor device manufacturing method | |
TWI779702B (en) | Die ejector and die bonding apparatus including the same | |
TWM622888U (en) | Substrate alignment mechanism and bonding machine using the same | |
TWI769957B (en) | Substrate bonding mechanism | |
TW202218029A (en) | Alignment mechanism and alignment method of bonding machine | |
CN215988691U (en) | Substrate alignment mechanism and bonding machine table applying same | |
CN216528754U (en) | Wafer Bonding Mechanism | |
TWM626383U (en) | Substrate Bonding Mechanism | |
CN115763338A (en) | Alignment mechanism and bonding machine table using same | |
US11869792B2 (en) | Alignment mechanism and alignment method of bonding machine | |
KR102455166B1 (en) | Vacuum chuck and driving method of vacuum chuck | |
JP2014239090A (en) | Pickup system | |
TWI819616B (en) | Bonding machine with movable suction modules | |
TW202114037A (en) | Substrate processing apparatus | |
TWI818552B (en) | Bonding machine for improving alignment accuracy | |
CN219513059U (en) | Chip packaging jig | |
CN220774296U (en) | Plate cooling device and stripping platform with same | |
CN217062043U (en) | Bonding apparatus with adjustment function | |
TWM631936U (en) | Bonding equipment with movable suction module | |
US20240006196A1 (en) | Bonding machine for warped substrates |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
GD4A | Issue of patent certificate for granted invention patent |