TWI673113B - Glue dispensing apparatus - Google Patents
Glue dispensing apparatus Download PDFInfo
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- TWI673113B TWI673113B TW107131088A TW107131088A TWI673113B TW I673113 B TWI673113 B TW I673113B TW 107131088 A TW107131088 A TW 107131088A TW 107131088 A TW107131088 A TW 107131088A TW I673113 B TWI673113 B TW I673113B
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- dispensing
- substrate
- platform
- release paper
- roller
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Classifications
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C—APPARATUS FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C5/00—Apparatus in which liquid or other fluent material is projected, poured or allowed to flow on to the surface of the work
- B05C5/02—Apparatus in which liquid or other fluent material is projected, poured or allowed to flow on to the surface of the work the liquid or other fluent material being discharged through an outlet orifice by pressure, e.g. from an outlet device in contact or almost in contact, with the work
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/6715—Apparatus for applying a liquid, a resin, an ink or the like
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05B—SPRAYING APPARATUS; ATOMISING APPARATUS; NOZZLES
- B05B13/00—Machines or plants for applying liquids or other fluent materials to surfaces of objects or other work by spraying, not covered by groups B05B1/00 - B05B11/00
- B05B13/02—Means for supporting work; Arrangement or mounting of spray heads; Adaptation or arrangement of means for feeding work
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C—APPARATUS FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C11/00—Component parts, details or accessories not specifically provided for in groups B05C1/00 - B05C9/00
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C—APPARATUS FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C13/00—Means for manipulating or holding work, e.g. for separate articles
- B05C13/02—Means for manipulating or holding work, e.g. for separate articles for particular articles
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67121—Apparatus for making assemblies not otherwise provided for, e.g. package constructions
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67126—Apparatus for sealing, encapsulating, glassing, decapsulating or the like
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67144—Apparatus for mounting on conductive members, e.g. leadframes or conductors on insulating substrates
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67259—Position monitoring, e.g. misposition detection or presence detection
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies
- H01L24/741—Apparatus for manufacturing means for bonding, e.g. connectors
- H01L24/745—Apparatus for manufacturing wire connectors
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/74—Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies
- H01L24/78—Apparatus for connecting with wire connectors
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Coating Apparatus (AREA)
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Application Of Or Painting With Fluid Materials (AREA)
Abstract
本發明點膠裝置包含一輸送裝置;至少一基板,藉由該輸送裝置沿著一預定方向移動;一點膠平台,位於所述輸送裝置的下方;以及一抗汙裝置,耦合該點膠平台,用於提供一隔離紙於所述基板與所述點膠平台之間。所述基板係為一導線架型式的基板。點膠裝置另包含一膠體噴頭,位於所述輸送裝置上方,用來將一流體膠質材料,施加至所述基板上。 The dispensing device of the present invention includes a conveying device; at least one substrate is moved along a predetermined direction by the conveying device; a dispensing platform is located below the conveying device; and an antifouling device is coupled to the dispensing platform For providing an isolation paper between the substrate and the dispensing platform. The substrate is a lead frame type substrate. The dispensing device further includes a colloidal spray head, which is located above the conveying device, and is used to apply a fluid colloidal material to the substrate.
Description
本發明涉及半導體後段封裝製程技術領域,特別是涉及一種點膠裝置,可以避免膠體殘留在點膠平台上產生的汙染問題。 The invention relates to the technical field of semiconductor back-end packaging processes, and in particular to a dispensing device, which can avoid the problem of pollution caused by colloid remaining on a dispensing platform.
半導體後段封裝製程中,當晶片與基板之間的焊線(bonding wire)完成後,後續需再進行封膠處理,以樹脂成型模料(resin molding compound)將晶片與基板模封,使其與外界環境隔離,達到保護晶片之目的。 In the semiconductor back-end packaging process, after the bonding wire between the wafer and the substrate is completed, subsequent sealing treatment is required, and the wafer and the substrate are molded with a resin molding compound so that they are bonded to the substrate. The external environment is isolated to achieve the purpose of protecting the chip.
然而,封膠過程中常因樹脂成型模料的壓力導致亂線(mold wire sweep)、不正常的開路(open)或短路(short),使得良率降低。因此,在焊線和封膠製程之間通常還會導入點膠製程,先將膠體點在焊線處,待膠體固化後再進行後續的封膠製程。 However, during the sealing process, mold wire molds often cause mold wire sweeps, abnormal open circuits, or short circuits, which reduces the yield. Therefore, a dispensing process is usually introduced between the welding line and the sealing process. The colloid is first placed on the welding line, and the subsequent sealing process is performed after the colloid is cured.
過去的點膠設備應用在導線架(leadframe)型式的基板時,往往會造成膠體殘留在點膠平台上,汙染到下一片基板。由此可知,該技術領域仍需要一種改良的點膠設備,以解決上述先前技藝的不足。 In the past, when the dispensing equipment was applied to a leadframe type substrate, the gel often remained on the dispensing platform and contaminated the next substrate. It can be seen that there is still a need for an improved dispensing equipment in the technical field to solve the above-mentioned shortcomings of the prior art.
本發明的主要目的在提供一種改良的點膠裝置,可以避免膠體殘留在點膠平台上產生的汙染問題。 The main purpose of the present invention is to provide an improved dispensing device, which can avoid the problem of pollution caused by colloid remaining on the dispensing platform.
根據本發明一實施例,本發明點膠裝置包含一輸送裝置;至少一基板,藉由該輸送裝置沿著一預定方向移動;一點膠平台,位於所述輸送裝置的下方;以及一抗汙裝置,耦合該點膠平台,用於提供一隔離紙於所述基板與所 述點膠平台之間。根據本發明一實施例,所述基板係為一導線架型式的基板。點膠裝置另包含一膠體噴頭,位於所述輸送裝置上方,用來將一流體膠質材料,施加至所述基板上。例如,所述隔離紙係為一無塵紙。 According to an embodiment of the present invention, the dispensing device of the present invention includes a conveying device; at least one substrate is moved along a predetermined direction by the conveying device; a dispensing platform is located below the conveying device; and an antifouling Device coupled to the dispensing platform for providing an isolation paper between the substrate and the substrate As described in the dispensing platform. According to an embodiment of the present invention, the substrate is a lead frame type substrate. The dispensing device further includes a colloidal spray head, which is located above the conveying device, and is used to apply a fluid colloidal material to the substrate. For example, the release paper is a dust-free paper.
根據本發明一實施例,所述輸送裝置包含一平行雙軌結構,其中間有一空隙,所述基板僅僅在兩側緣有與所述平行雙軌結構接觸,而所述基板的中間部位則是懸空的。所述點膠平台升起,經由所述空隙支撐住所述基板,並將所述基板頂起,脫離與所述平行雙軌結構的接觸,配合所述基板上方的卡固件固定住所述基板,以方便定位。 According to an embodiment of the present invention, the conveying device includes a parallel dual-track structure with a gap in between, the substrate is in contact with the parallel dual-track structure only on both side edges, and the middle portion of the substrate is suspended . The dispensing platform rises, supports the substrate through the gap, and lifts the substrate out of contact with the parallel dual-track structure, and fixes the substrate with a clip above the substrate to facilitate Positioning.
根據本發明一實施例,所述抗汙裝置包含一隔離紙儲存及輸送單元,耦合至所述點膠平台的一側,而所述隔離紙置於所述隔離紙儲存及輸送單元內,透過滾輪及導引機構,傳送至所述點膠平台的上表面。所述隔離紙儲存及輸送單元與所述點膠平台之間設置有一過渡銜接平台,使得所述隔離紙能順利的滑送至所述點膠平台的上表面,而不會發生卡紙現象。所述抗汙裝置另包含一置換單元,用來將所述隔離紙從所述點膠平台的上表面卸除。 According to an embodiment of the present invention, the anti-fouling device includes a release paper storage and conveying unit coupled to one side of the dispensing platform, and the release paper is placed in the release paper storage and conveying unit and transmitted through The roller and the guide mechanism are transmitted to the upper surface of the dispensing platform. A transitional connection platform is provided between the release paper storage and conveying unit and the dispensing platform, so that the release paper can smoothly slide to the upper surface of the dispensing platform without paper jams. The antifouling device further includes a replacement unit for removing the release paper from the upper surface of the dispensing platform.
根據本發明另一實施例,所述抗汙裝置包含一第一滾輪,套有一捲隔離紙,其一端連接一第二滾輪。所述第一滾輪與所述第二滾輪係以相同轉速及相同轉動方向操作,使得所述隔離紙朝一預定方向捲動。點膠時,所述點膠平台先頂住所述第一滾輪與所述第二滾輪之間的所述隔離紙,然後再頂起所述基板。由於所述點膠平台的上表面被所述隔離紙覆蓋住,故可以達到抗污的效果。 According to another embodiment of the present invention, the antifouling device includes a first roller, a sleeve of insulation paper is sleeved on one end, and a second roller is connected to one end thereof. The first roller and the second roller are operated at the same rotation speed and the same rotation direction, so that the release paper is rolled in a predetermined direction. When dispensing, the dispensing platform first supports the release paper between the first roller and the second roller, and then lifts the substrate. Since the upper surface of the dispensing platform is covered by the release paper, an antifouling effect can be achieved.
為讓本發明之上述目的、特徵及優點能更明顯易懂,下文特舉較佳實施方式,並配合所附圖式,作詳細說明如下。然而如下之較佳實施方式與圖式僅供參考與說明用,並非用來對本發明加以限制者。 In order to make the above-mentioned objects, features, and advantages of the present invention more comprehensible, the preferred embodiments are hereinafter described in detail with reference to the accompanying drawings. However, the following preferred embodiments and drawings are for reference and description only, and are not intended to limit the present invention.
1,1a‧‧‧點膠裝置 1,1a‧‧‧dispensing device
10‧‧‧施作空間 10‧‧‧ Casting space
11‧‧‧控制電腦 11‧‧‧Control computer
12‧‧‧升降機構 12‧‧‧ Lifting mechanism
100‧‧‧設備本體 100‧‧‧ Equipment body
101,101a~101c‧‧‧基板 101, 101a ~ 101c‧‧‧ substrate
102‧‧‧進料站 102‧‧‧Feeding Station
104‧‧‧軌道 104‧‧‧ track
105‧‧‧預定方向 105‧‧‧ scheduled direction
106‧‧‧膠體噴頭 106‧‧‧ colloidal nozzle
107‧‧‧流體膠質材料 107‧‧‧ fluid colloidal material
108‧‧‧出料站 108‧‧‧Discharging station
110‧‧‧進料匣 110‧‧‧feed box
120‧‧‧點膠平台 120‧‧‧ Dispensing Platform
120a‧‧‧上表面 120a‧‧‧upper surface
121‧‧‧真空氣孔 121‧‧‧Vacuum air hole
122‧‧‧卡固件 122‧‧‧Card Firmware
123‧‧‧過渡銜接平台 123‧‧‧Transitional connection platform
200‧‧‧抗汙裝置 200‧‧‧Anti-fouling device
210‧‧‧隔離紙儲存及輸送單元 210‧‧‧Isolated paper storage and conveying unit
211‧‧‧隔離紙 211‧‧‧Isolation paper
212‧‧‧滾輪 212‧‧‧roller
220‧‧‧置換單元 220‧‧‧ Replacement Unit
301‧‧‧晶片墊 301‧‧‧ Wafer Mat
310a‧‧‧表面 310a‧‧‧ surface
302‧‧‧引腳 302‧‧‧pin
310‧‧‧晶片 310‧‧‧Chip
312‧‧‧焊線 312‧‧‧welding wire
400‧‧‧抗汙裝置 400‧‧‧Anti-fouling device
410‧‧‧第一滾輪 410‧‧‧The first roller
411‧‧‧隔離紙 411‧‧‧Isolation paper
420‧‧‧第二滾輪 420‧‧‧Second Roller
所附圖式係提供用以方便對本發明更進一步的了解,其構成本說明書的一部分。所附圖式與說明書內容一同闡述之本發明實施例,有助於解釋本發明的原理原則。在圖式中:第1圖為依據本發明一實施例所繪示的點膠裝置示意圖。 The drawings are provided to facilitate a further understanding of the present invention and constitute a part of this specification. The embodiments of the present invention described in the drawings and the description are helpful for explaining the principle and principle of the present invention. In the drawings: FIG. 1 is a schematic diagram of a dispensing device according to an embodiment of the present invention.
第2圖為依據本發明另一實施例所繪示的點膠裝置示意圖。 FIG. 2 is a schematic diagram of a dispensing device according to another embodiment of the present invention.
第3圖為基板進行點膠處理時的側視示意圖。 FIG. 3 is a schematic side view of the substrate during the dispensing process.
在下文中,將參照附圖說明細節,該些附圖中之內容亦構成說明書細節描述的一部份,並且以可實行該實施例之特例描述方式來繪示。下文實施例已描述足夠的細節俾使該領域之一般技藝人士得以具以實施。當然,亦可採行其他的實施例,或是在不悖離文中所述實施例的前提下作出任何結構性、邏輯性、及電性上的改變。因此,下文之細節描述不應被視為是限制,反之,其中所包含的實施例將由隨附的申請專利範圍來加以界定。 In the following, the details will be described with reference to the drawings, and the contents of these drawings also form a part of the detailed description of the description, and are shown in a special case description manner in which this embodiment can be implemented. The following examples have been described in sufficient detail to enable those of ordinary skill in the art to implement them. Of course, other embodiments may be adopted, or any structural, logical, and electrical changes may be made without departing from the embodiments described in the text. Therefore, the following detailed description should not be considered as a limitation. On the contrary, the embodiments contained therein will be defined by the scope of the accompanying patent application.
本發明披露一種用於半導體後段封裝製程的自動化點膠裝置及系統,特別適合應用在導線架型式的基板,可以有效避免膠體殘留在點膠平台上,汙染到下一片基板。 The invention discloses an automatic dispensing device and system for a semiconductor back-end packaging process, which is particularly suitable for being applied to a lead frame type substrate, and can effectively prevent gel from remaining on the dispensing platform and contaminating the next substrate.
第1圖為依據本發明一實施例所繪示的點膠裝置示意圖。如第1圖所示,本發明點膠裝置1可以包括一設備本體100,其定義出一密閉的施作空間10。根據本發明一實施例,點膠製程可以在設備本體100的施作空間10內進行,但不限於此。根據本發明一實施例,所述點膠製程係指在半導體後段封裝製程的焊線和封膠製程之間的點膠製程,但不限於此。 FIG. 1 is a schematic diagram of a dispensing device according to an embodiment of the present invention. As shown in FIG. 1, the dispensing device 1 of the present invention may include a device body 100 which defines a closed application space 10. According to an embodiment of the present invention, the dispensing process may be performed in the application space 10 of the device body 100, but is not limited thereto. According to an embodiment of the present invention, the dispensing process refers to a dispensing process between a bonding wire and a sealing process of a semiconductor back-end packaging process, but is not limited thereto.
根據本發明一實施例,點膠裝置1可以包括一連結至設備本體100的 進料站102,而裝有複數待加工零件或基板101的進料匣(magazine)110係先載入進料站102,再透過機械手臂(圖未示)將基板101轉移至一輸送裝置,例如軌道104上,並在軌道104上沿著一預定方向105水平輸送移動,經過點膠處理後,最後進入出料站108,準備進入下一道處理步驟,例如,固化或封膠處理。 According to an embodiment of the present invention, the dispensing device 1 may include a A feeding station 102, and a magazine 110 containing a plurality of parts to be processed or the substrate 101 is first loaded into the feeding station 102, and then the substrate 101 is transferred to a conveying device by a robot arm (not shown), For example, it moves on the track 104 and moves horizontally along a predetermined direction 105 on the track 104. After the dispensing process, it finally enters the discharge station 108 and is ready to enter the next processing step, such as curing or sealing.
根據本發明一實施例,基板101可以是導線架型式的基板,但不限於此。例如,導線架型式的基板101可以包括,但不限於,用來承載晶片310的晶片墊(die pad)301、引腳(lead)302及連結引腳302及晶片310的焊線(bonding wires)312。晶片墊301可以包括一下凹結構,但不限於此。根據本發明實施例,晶片墊301的表面301a還可以經過表面粗化處理,使得後續施加的膠體可以與基板101更加緊密接合。 According to an embodiment of the present invention, the substrate 101 may be a lead frame type substrate, but is not limited thereto. For example, the leadframe-type substrate 101 may include, but is not limited to, a die pad 301, a lead 302, and bonding wires connecting the pins 302 and the wafer 310 for carrying the wafer 310. 312. The wafer pad 301 may include a concave structure, but is not limited thereto. According to the embodiment of the present invention, the surface 301a of the wafer pad 301 may also be subjected to a surface roughening treatment, so that the subsequently applied colloid can be more closely bonded to the substrate 101.
在第1圖中,為簡化說明,在軌道104上僅例示有三個導線架型式的基板101a~101c,其中基板101c已完成點膠處理,基板101b正準備進行點膠處理,而基板101a尚未進行點膠處理。根據本發明一實施例,軌道104可以是平行雙軌結構,其中間有一空隙,故基板101a~101c僅僅在兩側緣有與軌道104接觸,而基板101a~101c的中間部位可以是懸空的。 In FIG. 1, for the sake of simplicity, only three leadframe substrates 101 a to 101 c are exemplified on the track 104, wherein the substrate 101 c has completed the dispensing process, the substrate 101 b is preparing to perform the dispensing process, and the substrate 101 a has not yet been performed. Dispensing. According to an embodiment of the present invention, the track 104 may be a parallel dual-track structure with a gap in the middle. Therefore, the substrates 101a to 101c are in contact with the track 104 only on both side edges, and the middle portions of the substrates 101a to 101c may be suspended.
當準備進行點膠處理的基板101b到達預定位置時,位於基板101b正下方的點膠平台120將會藉由升降機構12升起,經由軌道104中間的空隙支撐住基板101b,並且可以將基板101b稍微頂起,脫離與軌道104的接觸,配合基板101b上方的卡固件122固定住基板101b,以方便機械及視覺定位。 When the substrate 101b to be dispensed reaches the predetermined position, the dispensing platform 120 located directly below the substrate 101b will be raised by the lifting mechanism 12 to support the substrate 101b through the gap in the middle of the track 104, and the substrate 101b can be lifted. Slightly lift up and release from contact with the track 104, and fix the substrate 101b with the fixing member 122 above the substrate 101b to facilitate mechanical and visual positioning.
在固定住基板101b後,此時位於基板101b及軌道104上方的膠體噴頭106即可將流體膠質材料107,例如樹脂或UV膠等,施加至基板101b上的預定位置,例如,晶片墊301的下凹結構內,並可以覆蓋部分的焊線312。然而,由於晶片墊301與引腳302會有些許中空區域,故當膠體噴頭106噴灑樹脂至基板101b上時很可能會飛濺到下方的點膠平台120的上表面120a,進而汙染到下一片基板 101a。 After the substrate 101b is fixed, the colloidal spray head 106 located above the substrate 101b and the track 104 can apply a fluid colloidal material 107, such as resin or UV glue, to a predetermined position on the substrate 101b, for example, the wafer pad 301 The recessed structure can cover a part of the bonding wire 312. However, since the wafer pad 301 and the lead 302 may have a small hollow area, when the colloidal nozzle 106 sprays resin on the substrate 101b, it is likely to splash onto the upper surface 120a of the dispensing platform 120 below, and contaminate the next substrate. 101a.
為了解決這樣的問題,本發明點膠裝置1另包括一抗汙裝置(anti-stain device)200,包括一隔離紙儲存及輸送單元210,耦合至點膠平台120的一側。複數張隔離紙211係存放於隔離紙儲存及輸送單元210內,並一張張以控制電腦11設定好的時間間隔透過隔離紙儲存及輸送單元210內的滾輪212及導引機構,傳送至點膠平台120的上表面120a。隔離紙儲存及輸送單元210與點膠平台120的一側可以設置一過渡銜接平台123,使得隔離紙211可以順利的滑送至點膠平台120的上表面120a,而不會發生卡紙現象。 In order to solve such a problem, the dispensing device 1 of the present invention further includes an anti-stain device 200 including an isolation paper storage and conveying unit 210 coupled to one side of the dispensing platform 120. A plurality of sheets of release paper 211 are stored in the release paper storage and conveying unit 210, and are conveyed to the point through the roller 212 and the guide mechanism in the release paper storage and conveying unit 210 at a time interval set by the control computer 11. The upper surface 120 a of the rubber platform 120. A transition linking platform 123 can be provided on one side of the isolation paper storage and conveying unit 210 and the dispensing platform 120, so that the isolation paper 211 can smoothly slide to the upper surface 120a of the dispensing platform 120 without paper jams.
根據本發明一實施例,隔離紙211可以是前端或前站用於隔離堆疊在一起的各基板之間的無塵紙。原本這些無塵紙在基板被取出置入進料匣110後就會被廢棄不用,但在本發明中則可以將這些無塵紙回收再利用,達到製程改善及降低成本的功效。 According to an embodiment of the present invention, the separation paper 211 may be a dust-free paper at a front end or a front station for separating the substrates stacked together. Originally, these dust-free papers will be discarded after the substrate is taken out and placed in the receiving box 110, but in the present invention, these dust-free papers can be recycled and reused to achieve the effect of improving the process and reducing costs.
根據本發明一實施例,點膠平台120可以設置有複數個真空氣孔121,當隔離紙211滑送至點膠平台120的上表面120a後,可以透過真空氣孔121抽真空將隔離紙211吸附在點膠平台120的上表面120a,然後才將位於基板101b正下方的點膠平台120升起,經由軌道104中間的空隙支撐住基板101b,並且將基板101b稍微頂起,脫離與軌道104的接觸,另配合基板101b上方的卡固件122固定住基板101b,以達到定位。 According to an embodiment of the present invention, the dispensing platform 120 may be provided with a plurality of vacuum air holes 121. After the release paper 211 is slid to the upper surface 120a of the dispensing platform 120, the vacuum paper can be evacuated through the vacuum air holes 121 to adsorb the release paper 211 on The upper surface 120a of the dispensing platform 120 is then raised. The dispensing platform 120 located directly below the substrate 101b is raised to support the substrate 101b through the gap in the middle of the track 104, and the substrate 101b is slightly lifted out of contact with the track 104. In addition, the base plate 101b is fixed with the fixing member 122 above the base plate 101b to achieve positioning.
在固定住基板101b後,此時位於基板101b上方的膠體噴頭106即可將流體膠質材料107,例如樹脂或UV膠等,施加至基板101b上的預定位置,例如,晶片墊301的下凹結構內,並可以覆蓋部分的焊線312。由於基板101b底部僅接觸到隔離紙211,故飛濺出的膠體不會接觸到下方的點膠平台120的上表面120a,如此達到抗污的效果。 After the substrate 101b is fixed, the colloidal spray head 106 located above the substrate 101b can apply a fluid colloid material 107, such as resin or UV glue, to a predetermined position on the substrate 101b, for example, the recessed structure of the wafer pad 301 Inside and can cover part of the bonding wire 312. Since the bottom of the substrate 101b is only in contact with the release paper 211, the splashed colloid will not contact the upper surface 120a of the dispensing platform 120 below, thus achieving the anti-fouling effect.
當基板101b完成點膠處理後,點膠平台120下降,基板101b重新與軌 道104接觸,而此時位於點膠平台120的上表面120a上的隔離紙211因為有真空吸力的關係,也會隨著點膠平台120下降。在去真空後,此受到汙染的隔離紙211,再透過一置換單元220從點膠平台120的上表面120a卸除。卸除後的隔離紙211可以放置在一回收區內。根據本發明實施例,上述置換單元220可以是一拋料夾爪裝置或機械手臂,但不限於此。然後,隔離紙儲存及輸送單元210會重新再裝載新的隔離紙211到點膠平台120的上表面120a,並進行下一片基板101a的點膠處理。 After the substrate 101b is finished with the dispensing process, the dispensing platform 120 is lowered, and the substrate 101b is again on the track. The channel 104 is in contact, and the release paper 211 located on the upper surface 120 a of the dispensing platform 120 at this time will also descend with the dispensing platform 120 because of the relationship of vacuum suction. After the vacuum is removed, the contaminated release paper 211 is removed from the upper surface 120 a of the dispensing platform 120 through a replacement unit 220. The removed release paper 211 can be placed in a recycling area. According to the embodiment of the present invention, the replacement unit 220 may be a throwing jaw device or a robot arm, but is not limited thereto. Then, the release paper storage and conveying unit 210 reloads a new release paper 211 to the upper surface 120a of the dispensing platform 120, and performs the dispensing process for the next substrate 101a.
請參閱第2圖及第3圖,其中第2圖為依據本發明另一實施例所繪示的點膠裝置示意圖,其中相同的區域、元件或材料仍沿用相同的符號來表示,第3圖為基板進行點膠處理時的側視示意圖。如第2圖所示,點膠裝置1a同樣可以包括一設備本體100,其定義出一密閉的施作空間10。根據本發明一實施例,點膠製程可以在設備本體100的施作空間10內進行,但不限於此。根據本發明一實施例,所述點膠製程係指在半導體後段封裝製程的焊線和封膠製程之間的點膠製程,但不限於此。 Please refer to FIG. 2 and FIG. 3, wherein FIG. 2 is a schematic view of a dispensing device according to another embodiment of the present invention, in which the same regions, components or materials are still represented by the same symbols, and FIG. 3 A schematic side view of a substrate when dispensing is performed. As shown in FIG. 2, the dispensing device 1 a may also include a device body 100, which defines a closed application space 10. According to an embodiment of the present invention, the dispensing process may be performed in the application space 10 of the device body 100, but is not limited thereto. According to an embodiment of the present invention, the dispensing process refers to a dispensing process between a bonding wire and a sealing process of a semiconductor back-end packaging process, but is not limited thereto.
根據本發明一實施例,點膠裝置1a可以包括一連結至設備本體100的進料站102,而裝有複數待加工零件或基板101的進料匣110係先載入進料站102,再透過機械手臂(圖未示)將基板101轉移至一輸送裝置,例如軌道104上,並在軌道104上沿著一預定方向105水平輸送移動,經過點膠處理後,最後進入出料站108,準備進入下一道處理步驟,例如,固化或封膠處理。 According to an embodiment of the present invention, the dispensing device 1a may include a feeding station 102 connected to the device body 100, and a feeding box 110 containing a plurality of parts or substrates 101 to be processed is first loaded into the feeding station 102, and then The robot 101 (not shown) transfers the substrate 101 to a conveying device, such as a track 104, and horizontally conveys and moves along a predetermined direction 105 on the track 104. After the dispensing process, it finally enters the discharge station 108. Ready for the next processing step, such as curing or sealing.
根據本發明一實施例,基板101可以是導線架型式的基板,但不限於此。例如,導線架型式的基板101可以包括,但不限於,用來承載晶片310的晶片墊301、引腳302及連結引腳302及晶片310的焊線312。晶片墊301可以包括一下凹結構,但不限於此。根據本發明一實施例,晶片墊301的表面301a還可以經過表面粗化處理,使得後續施加的膠體可以與基板101更加緊密接合。 According to an embodiment of the present invention, the substrate 101 may be a lead frame type substrate, but is not limited thereto. For example, the leadframe-type substrate 101 may include, but is not limited to, a wafer pad 301, a pin 302, and a bonding wire 312 that connects the pin 302 and the wafer 310 to the wafer 310. The wafer pad 301 may include a concave structure, but is not limited thereto. According to an embodiment of the present invention, the surface 301a of the wafer pad 301 may also be subjected to a surface roughening treatment, so that the subsequently applied colloid can be more closely bonded to the substrate 101.
在第2圖中,為簡化說明,在軌道104上僅例示有三個導線架型式的基板101a~101c,其中基板101c已完成點膠處理,基板101b正準備進行點膠處理,而基板101a尚未進行點膠處理。根據本發明一實施例,軌道104可以是平行雙軌結構,其中間有一空隙,故基板101a~101c僅僅在兩側緣有與軌道104接觸,而基板101a~101c的中間部位則是懸空的。 In FIG. 2, for the sake of simplicity, only three leadframe-type substrates 101 a to 101 c are exemplified on the track 104. The substrate 101 c has completed the dispensing process, the substrate 101 b is preparing to perform the dispensing process, and the substrate 101 a has not yet been processed. Dispensing. According to an embodiment of the present invention, the track 104 may be a parallel dual-track structure with a gap in the middle, so the substrates 101a to 101c are in contact with the track 104 only on the two side edges, and the middle portions of the substrates 101a to 101c are suspended.
根據本發明一實施例,點膠裝置1a另包括一抗汙裝置400,包括一第一滾輪410,套有一捲隔離紙411,其一端連接一第二滾輪420,使隔離紙411位於基板101b與點膠平台120之間。根據本發明一實施例,第一滾輪410與第二滾輪420可以連接至一傳動馬達(圖未示)。第一滾輪410與第二滾輪420係以控制電腦11設定好的相同轉速及相同轉動方向(例如均以順時針或逆時針方向轉動)操作,使得隔離紙411可以朝一預定方向捲動。 According to an embodiment of the present invention, the dispensing device 1a further includes an antifouling device 400, including a first roller 410, a sleeve of paper 411 covered, and one end of which is connected to a second roller 420, so that the paper 411 is located on the substrate 101b and Dispensing platform 120. According to an embodiment of the present invention, the first roller 410 and the second roller 420 may be connected to a transmission motor (not shown). The first roller 410 and the second roller 420 are operated at the same rotation speed and the same rotation direction set by the control computer 11 (for example, both rotate clockwise or counterclockwise), so that the release paper 411 can be rolled in a predetermined direction.
如第2圖及第3圖所示,當準備進行點膠處理的基板101b到達預定位置時,位於基板101b正下方的點膠平台120將會藉由升降機構12升起,經由軌道104中間的空隙支撐住基板101b,並且可以將基板101b稍微頂起,脫離與軌道104的接觸,配合基板101b上方的卡固件122固定住基板101b,以方便機械及視覺定位。此時,第一滾輪410與第二滾輪420暫時不轉動,而點膠平台120先頂住第一滾輪410與第二滾輪420之間的隔離紙411,然後再頂起基板101b。 As shown in FIGS. 2 and 3, when the substrate 101b to be subjected to the dispensing process reaches a predetermined position, the dispensing platform 120 located directly below the substrate 101b will be raised by the lifting mechanism 12 and passed through the middle of the track 104. The gap supports the substrate 101b, and the substrate 101b can be slightly lifted out of contact with the track 104, and the substrate 101b is fixed with the latch 122 above the substrate 101b to facilitate mechanical and visual positioning. At this time, the first roller 410 and the second roller 420 do not rotate temporarily, and the dispensing platform 120 first presses against the release paper 411 between the first roller 410 and the second roller 420, and then lifts the substrate 101b.
在固定住基板101b後,位於基板101b上方的膠體噴頭106即可將流體膠質材料107,例如樹脂或UV膠等,施加至基板101b上的預定位置,例如,晶片墊301的下凹結構內,並可以覆蓋部分的焊線312。由於基板101b底部僅接觸到隔離紙211,故飛濺出的膠體不會接觸到下方的點膠平台120的上表面120a,如此達到抗污的效果。 After the substrate 101b is fixed, the colloidal shower head 106 located above the substrate 101b can apply a fluid colloid material 107, such as resin or UV glue, to a predetermined position on the substrate 101b, for example, in the recessed structure of the wafer pad 301. And can cover part of the bonding wire 312. Since the bottom of the substrate 101b is only in contact with the release paper 211, the splashed colloid will not contact the upper surface 120a of the dispensing platform 120 below, thus achieving the anti-fouling effect.
當基板101b完成點膠處理後,點膠平台120下降,基板101b重新與軌道104接觸,而受到汙染的隔離紙411部分透過第一滾輪410與第二滾輪420以控制 電腦11設定好的相同轉速及相同轉動方向操作,從點膠平台120的上表面120a卸除,並移入新的隔離紙411部分到點膠平台120的上表面120a,再進行下一片基板101a的點膠處理。 After the substrate 101b finishes the dispensing process, the dispensing platform 120 descends, the substrate 101b comes into contact with the track 104 again, and the part of the contaminated release paper 411 passes through the first roller 410 and the second roller 420 to control The computer 11 is set to operate at the same rotation speed and rotation direction, remove from the upper surface 120a of the dispensing platform 120, and move a new release paper 411 to the upper surface 120a of the dispensing platform 120, and then perform the next substrate 101a. Dispensing.
從以上詳細說明可知,本發明點膠裝置包含一輸送裝置;至少一基板,藉由該輸送裝置沿著一預定方向移動;一點膠平台,位於所述輸送裝置的下方;以及一抗汙裝置,耦合該點膠平台,用於提供一隔離紙於所述基板與所述點膠平台之間。根據本發明一實施例,所述基板係為一導線架型式的基板。點膠裝置另包含一膠體噴頭,位於所述輸送裝置上方,用來將一流體膠質材料,施加至所述基板上。例如,所述隔離紙係為一無塵紙。 It can be known from the above detailed description that the dispensing device of the present invention includes a conveying device; at least one substrate is moved along a predetermined direction by the conveying device; a dispensing platform is located below the conveying device; and an antifouling device Is coupled to the dispensing platform for providing an isolation paper between the substrate and the dispensing platform. According to an embodiment of the present invention, the substrate is a lead frame type substrate. The dispensing device further includes a colloidal spray head, which is located above the conveying device, and is used to apply a fluid colloidal material to the substrate. For example, the release paper is a dust-free paper.
根據本發明一實施例,所述輸送裝置包含一平行雙軌結構,其中間有一空隙,所述基板僅僅在兩側緣有與所述平行雙軌結構接觸,而所述基板的中間部位則是懸空的。所述點膠平台升起,經由所述空隙支撐住所述基板,並將所述基板頂起,脫離與所述平行雙軌結構的接觸,配合所述基板上方的卡固件固定住所述基板,以方便定位。 According to an embodiment of the present invention, the conveying device includes a parallel dual-track structure with a gap in between, the substrate is in contact with the parallel dual-track structure only on both side edges, and the middle portion of the substrate is suspended . The dispensing platform rises, supports the substrate through the gap, and lifts the substrate out of contact with the parallel dual-track structure, and fixes the substrate with a clip above the substrate to facilitate Positioning.
根據本發明一實施例,所述抗汙裝置包含一隔離紙儲存及輸送單元,耦合至所述點膠平台的一側,而所述隔離紙置於所述隔離紙儲存及輸送單元內,透過滾輪及導引機構,傳送至所述點膠平台的上表面。所述隔離紙儲存及輸送單元與所述點膠平台之間設置有一過渡銜接平台,使得所述隔離紙能順利的滑送至所述點膠平台的上表面,而不會發生卡紙現象。所述抗汙裝置另包含一置換單元,用來將所述隔離紙從所述點膠平台的上表面卸除。 According to an embodiment of the present invention, the anti-fouling device includes a release paper storage and conveying unit coupled to one side of the dispensing platform, and the release paper is placed in the release paper storage and conveying unit and transmitted through The roller and the guide mechanism are transmitted to the upper surface of the dispensing platform. A transitional connection platform is provided between the release paper storage and conveying unit and the dispensing platform, so that the release paper can smoothly slide to the upper surface of the dispensing platform without paper jams. The antifouling device further includes a replacement unit for removing the release paper from the upper surface of the dispensing platform.
根據本發明另一實施例,所述抗汙裝置包含一第一滾輪,套有一捲隔離紙,其一端連接一第二滾輪。所述第一滾輪與所述第二滾輪係以相同轉速及相同轉動方向操作,使得所述隔離紙朝一預定方向捲動。點膠時,所述點膠平台先頂住所述第一滾輪與所述第二滾輪之間的所述隔離紙,然後再頂起所述 基板。由於所述點膠平台的上表面被所述隔離紙覆蓋住,故可以達到抗污的效果。 According to another embodiment of the present invention, the antifouling device includes a first roller, a sleeve of insulation paper is sleeved on one end, and a second roller is connected to one end thereof. The first roller and the second roller are operated at the same rotation speed and the same rotation direction, so that the release paper is rolled in a predetermined direction. When dispensing, the dispensing platform first abuts the release paper between the first roller and the second roller, and then lifts up the Substrate. Since the upper surface of the dispensing platform is covered by the release paper, an antifouling effect can be achieved.
以上所述僅為本發明之較佳實施例,凡依本發明申請專利範圍所做之均等變化與修飾,皆應屬本發明之涵蓋範圍。 The above description is only a preferred embodiment of the present invention, and all equivalent changes and modifications made in accordance with the scope of patent application of the present invention shall fall within the scope of the present invention.
Claims (15)
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
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TW107131088A TWI673113B (en) | 2018-09-05 | 2018-09-05 | Glue dispensing apparatus |
CN201811239079.8A CN110877001A (en) | 2018-09-05 | 2018-10-23 | Glue dispensing device |
US16/192,823 US20200075364A1 (en) | 2018-09-05 | 2018-11-16 | Glue dispensing apparatus |
JP2018233249A JP2020038954A (en) | 2018-09-05 | 2018-12-13 | Adhesive dispensing apparatus |
KR1020180161109A KR20200028279A (en) | 2018-09-05 | 2018-12-13 | Glue dispensing apparatus |
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TW107131088A TWI673113B (en) | 2018-09-05 | 2018-09-05 | Glue dispensing apparatus |
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TWI673113B true TWI673113B (en) | 2019-10-01 |
TW202010574A TW202010574A (en) | 2020-03-16 |
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TW107131088A TWI673113B (en) | 2018-09-05 | 2018-09-05 | Glue dispensing apparatus |
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KR (1) | KR20200028279A (en) |
CN (1) | CN110877001A (en) |
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CN114042607A (en) * | 2021-10-15 | 2022-02-15 | 芜湖华族环境技术股份有限公司 | Movable glue dispensing and overturning device for PTC heating body |
Citations (3)
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WO2009089586A1 (en) * | 2008-01-17 | 2009-07-23 | Ra Corporation Pty Ltd | Notepad forming method and apparatus therefor |
CN101740352A (en) * | 2008-11-26 | 2010-06-16 | 日东电工株式会社 | Dicing die-bonding film and process for producing semiconductor device |
CN206821127U (en) * | 2017-03-15 | 2017-12-29 | 东莞市明骏智能科技有限公司 | One step prepares the preparation facilities and production line of the integral heat dissipation structure for sealing liquid metal |
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2018
- 2018-09-05 TW TW107131088A patent/TWI673113B/en not_active IP Right Cessation
- 2018-10-23 CN CN201811239079.8A patent/CN110877001A/en not_active Withdrawn
- 2018-12-13 KR KR1020180161109A patent/KR20200028279A/en not_active Application Discontinuation
- 2018-12-13 JP JP2018233249A patent/JP2020038954A/en active Pending
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2009089586A1 (en) * | 2008-01-17 | 2009-07-23 | Ra Corporation Pty Ltd | Notepad forming method and apparatus therefor |
CN101740352A (en) * | 2008-11-26 | 2010-06-16 | 日东电工株式会社 | Dicing die-bonding film and process for producing semiconductor device |
CN206821127U (en) * | 2017-03-15 | 2017-12-29 | 东莞市明骏智能科技有限公司 | One step prepares the preparation facilities and production line of the integral heat dissipation structure for sealing liquid metal |
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JP2020038954A (en) | 2020-03-12 |
TW202010574A (en) | 2020-03-16 |
KR20200028279A (en) | 2020-03-16 |
CN110877001A (en) | 2020-03-13 |
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