TWI582434B - Probe device - Google Patents

Description

Probe device

The present invention relates to a probe device, and more particularly to a low impedance probe device.

Referring to FIG. 1 , the existing test probe 1 is removably disposed in a probe hole 200 of a test socket 100 for electrically connecting a to-be-tested contact 300 and a receiving contact 400. The test probe 1 includes a housing member 11 that is disposed through the probe bore 200, an upper contact member 12, a lower contact member 13, and an elastic member 14. The elastic member 14 is compressively deformably disposed in the housing member 11, and the upper contact member 12 and the lower contact member 13 are respectively connected to the two ends, and are used for the contact point 300 to be tested and the receiving contact point. The pitch of 400 buffers the distance between the upper and lower contacts 12, 13.

In use, the test socket 100 is disposed above the receiving contact 400, and the lower contact 13 contacts the receiving contact 400, and the contact to be tested 400 contacts the upper contact 12, according to the The distance between the contact 300 to be tested and the receiving contact 400, the upper and lower contacts 12, 13 respectively cooperate to compress the elastic member 14, along the contact to be tested 300, the upper contact 12, the housing The component 11, the lower contact 13 and the receiving contact 400 form an electrical path for testing.

However, the test probe 1 contains a composition of too many components, and the excessive components will cause an increase in the impedance of the electrical path, reducing the speed of signal transmission.

In view of the above, it is an object of the present invention to provide a probe device that can reduce impedance.

The probe device of the present invention is disposed in a probe hole of a test socket for electrically connecting a to-be-tested contact and a receiving contact, the probe device includes a spring probe, and a spring probe is disposed on the probe Conductive parts inside the needle. The spring probe is disposed in the probe hole and includes a spirally surrounding and compressively deformable compression portion, and two contact portions respectively integrally connected to the two ends of the compression portion, the two contact portions being capable of respectively The contact to be tested is in contact with the receiving contact. The conductive member is confined in a compression portion of the spring probe, and the conductive member forms an electrical path with the spring probe to reduce impedance.

The beneficial effect of the invention is that the compression portion and the contact portion of the spring probe are integrated, the number of components is reduced, and the conductive member is directly disposed in the spring probe and formed with the spring probe. The electrical path can greatly reduce the impedance generated during the test and speed up the signal transmission.

100‧‧‧ test seat

200‧‧‧ probe hole

300‧‧‧Contact points to be tested

400‧‧‧ Receiving contacts

5‧‧‧ probe device

6‧‧‧spring probe

61‧‧‧Compression Department

62‧‧‧Contacts

7‧‧‧Electrical parts

71‧‧‧Flange

D1‧‧‧ first length

D2‧‧‧ second length

1 is a cross-sectional view showing the structure of a conventional test probe; FIG. 2 is a cross-sectional view showing a first embodiment of the probe device of the present invention; and FIG. 3 is a cross-sectional view for explaining the first embodiment. FIG. 4 is a cross-sectional view showing the specifications of a spring probe and a conductive member in the first embodiment; FIG. 5 and FIG. 6 are cross-sectional views for explaining the first embodiment. Fig. 7 is a cross-sectional view showing a second embodiment of the probe device of the present invention; and Fig. 8 is a cross-sectional view showing a third embodiment of the probe device of the present invention.

The detailed description of the preferred embodiments of the present invention will be apparent from the detailed description of the preferred embodiments.

Referring to FIG. 2, a first embodiment of the probe device 5 of the present invention is disposed in a probe hole 200 of a test socket 100 for electrically connecting a to-be-tested contact 300 and a receiving contact 400. The device 5 includes a spring probe 6 and a conductive member 7 disposed in the spring probe 6. The spring probe 6 is disposed in the probe hole 200 and includes a spirally and compressively deformable compression portion 61, and two contact portions 62 integrally formed integrally with the two ends of the compression portion 61. The two contacts The portion 62 can be in contact with the to-be-tested contact 300 and the receiving contact 400, respectively. In this embodiment, the diameter of the compression portion 61 of the spring probe 6 is tapered downward, thereby positioning the conductive member 7 to prevent the conductive member 7 from falling out of the spring probe 6, and the conductive member The material of 7 is selected from conductive metals. It should be noted that, in this embodiment, the contact portion 62 of the spring probe 6 is disposed along the axis of the spring probe 6.

Referring to FIG. 3, in use, the test socket 100 is disposed between the receiving contact 400 and the to-be-tested contact 300, and the two contact portions 62 of the spring probe 6 are respectively connected to the receiving contact. The 400 contacts the contact 300 to be tested, so that the receiving contact 400, the spring probe 6, and the contact to be tested 300 form an electrical path. As described above, the conductive member 7 is made of a conductive metal, so that the conductive member 7 is also electrically connected to the spring probe 6, since the current is moved by the shortest path, and the arrangement of the conductive member 7 is compared In the case where the conductive member 7 is not provided, a shorter path is provided for the current to move, thereby greatly reducing the impedance generated during the test and speeding up the signal transmission.

Referring to FIGS. 3 and 4, it is to be noted that, in this embodiment, the conductive member 7 has a single diameter, and as shown in FIG. 4, the conductive member 7 has a first length D1, and the spring probe 6 is The compression portion 61 has a second length D2 that is not greater than the second length D2. Thereby, it can be avoided that the arrangement of the conductive member 7 affects the compression action of the spring probe 6 during the test.

Referring to Figure 5, a second implementation of the probe device 5 of the present invention For example, the difference from the first embodiment is that the conductive member 7 may be in the form of at least one flange portion 71 formed in the radial direction thereof. As shown in FIG. 5, the number of the flange portions 71 is one, and is formed at the end edge of the conductive member 7, and as shown in FIG. 6, the number of the flange portions 71 of the conductive member 7 is two, and is formed. At both ends of the conductive member 7. The design of the flange portion 71 can be clamped on the inner edge of the spring probe 6, and the limiting action can also be generated to prevent the conductive member 7 from falling off by the spring probe 6, so that the compression portion of the spring probe 6 The diameter of 61 can also be an upwardly tapered state. Further, as shown in Fig. 7, the flange portion 71 may be formed at a central position of the conductive member 7, and the diameter of the compressed portion 61 of the spring probe 6 is the position corresponding to the flange portion 71 of the conductive member 7. And formed a gradual decline. Thereby, in addition to the function of the limit position, the tapering of the compression portion 61 of the spring probe 6 ensures that the spring probe 6 is in contact with the conductive member 7 to be electrically connected.

Referring to Figure 8, the third embodiment of the probe device 5 of the present invention differs from the second embodiment in that, in this embodiment, the contact portion 62 of the spring probe 6 is eccentrically disposed. With this design, in addition to achieving the aforementioned effects, the distance between the contact portions 62 of two adjacent spring probes 6 can be reduced, thereby responsive to different test objects.

In summary, the present invention has an integrated design of the compression portion 61 and the contact portion 62 of the spring probe 6, thereby reducing the number of components, and then cooperating with the conductive member 7 directly in the spring probe 6 and The spring probe 6 forms an electrical path, providing a shorter path for current to move, which can greatly reduce the impedance generated during the test and speed up the signal transmission. In addition, the contact portion 62 of the spring probe 6 can be disposed along the axis or eccentrically to improve the versatility of the probe device of the present invention.

The above is only the preferred embodiment of the present invention, and the scope of the invention is not limited thereto, that is, the simple equivalent changes and modifications made by the scope of the invention and the description of the invention are All remain within the scope of the invention patent.

100‧‧‧ test seat

200‧‧‧ probe hole

300‧‧‧Contact points to be tested

400‧‧‧ Receiving contacts

5‧‧‧ probe device

6‧‧‧spring probe

61‧‧‧Compression Department

62‧‧‧Contacts

7‧‧‧Electrical parts

Claims (9)

A probe device is disposed in a probe hole of a test socket for electrically connecting a to-be-tested contact and a receiving contact, the probe device comprising: a spring probe disposed in the probe hole And comprising a spirally surrounding and compressiblely deformable compression portion, and two contact portions respectively integrally connected to the two ends of the compression portion, the two contact portions being respectively capable of contacting the contact to be tested and the receiving contact And a conductive member disposed in the spring probe and limited to the compression portion of the spring probe, the conductive member having a single diameter and forming an electrical path with the spring probe to reduce impedance; wherein the spring probe The diameter of the compression portion of the needle is tapered downward to support the conductive member, so that the conductive member is confined inside the spring probe. The probe device of claim 1, wherein the conductive member has a first length, and the spring portion has a second length, the first length, at a maximum compression amount thereof, the first length Not greater than the second length. A probe device is disposed in a probe hole of a test socket for electrically connecting a to-be-tested contact and a receiving contact, the probe device comprising: a spring probe disposed in the probe hole And comprising a spirally surrounding and compressiblely deformable compression portion, and two contact portions respectively integrally connected to the two ends of the compression portion, the two contact portions being respectively capable of contacting the contact to be tested and the receiving contact And a conductive member disposed in the spring probe and limited to the compression portion of the spring probe, the conductive member being selected from the conductive metal and forming an electrical path with the spring probe to reduce impedance; The conductive member is formed with at least one flange portion along a radial direction thereof for locking the flange portion of the inner edge of the spring probe to limit the conductive member to the inside of the spring probe. The probe device according to claim 3, wherein the flange portion is formed at an end edge of the conductive member. The probe device according to claim 3, wherein the flange portion is formed at a central position of the conductive member. The probe device according to claim 3, wherein the diameter of the compression portion of the spring probe is tapered to correspond to the position of the flange portion of the conductive member. The probe device of claim 1 or 3, wherein the contact portion of the spring probe is disposed along an axis of the spring probe. The probe device of claim 1 or 3, wherein the contact portion of the spring probe is eccentrically disposed. The probe device according to claim 1 or 3, wherein the conductive member is made of a conductive metal.