TWI427175B - Anode plate and sputtering apparatus including the same - Google Patents
Anode plate and sputtering apparatus including the same Download PDFInfo
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- TWI427175B TWI427175B TW94146267A TW94146267A TWI427175B TW I427175 B TWI427175 B TW I427175B TW 94146267 A TW94146267 A TW 94146267A TW 94146267 A TW94146267 A TW 94146267A TW I427175 B TWI427175 B TW I427175B
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Description
本發明涉及一種陽極板,尤其涉及一種濺鍍裝置之陽極板。The present invention relates to an anode plate, and more particularly to an anode plate of a sputtering apparatus.
類鑽碳(Diamond-like Carbon,DLC)具有與鑽石類似之高硬度、低摩擦係數、高耐磨性能與高化學穩定性等優良特性,且相對於鑽石膜,類鑽碳膜可以於低溫下大面積成膜,其於模具、刀具、軸承、與衝壓模領域具有良好之應用前景。因此二十年來引起人們的廣泛關注與研究。Diamond-like carbon (DLC) has excellent properties similar to diamonds such as high hardness, low friction coefficient, high wear resistance and high chemical stability. Compared with diamond film, diamond-like carbon film can be used at low temperature. Large-area film formation, which has good application prospects in the fields of molds, tools, bearings, and stamping dies. Therefore, it has caused widespread concern and research for 20 years.
DLC膜一般採用濺鍍方法製得,參閱第一圖,係一種直流濺鍍DLC膜之裝置,其包括真空放電腔10,靶材11,陽極板12及真空泵14。濺鍍時,將基材13放置於陽極板12上,用真空泵14將放電腔10內抽至真空度10- 2 帕斯卡(Pa)下,再向其中沖入壓強為10~10- 2 Pa之惰性氣體,常用的為氬氣,於靶材11(陰極)與基材13(陽極)間施加高壓,使惰性氣體發生游離,產生惰性氣體電漿。由於靶材11電壓較低,氣體正離子向靶材11運動,撞擊靶材11,靶材11之原子脫落進入電漿最後沈積於位於陽極板12上之基材13表面。The DLC film is generally prepared by a sputtering method. Referring to the first figure, a device for DC-sputtering a DLC film includes a vacuum discharge chamber 10, a target 11, an anode plate 12, and a vacuum pump 14. When sputtering, the substrate 13 is placed on the anode plate 12, a vacuum pump 14 with the discharge chamber 10 evacuated to a vacuum of 10 - for 2 Pascals (Pa), where again into the pressure is 10 ~ 10 - 2 Pa of The inert gas, commonly used as argon, applies a high pressure between the target 11 (cathode) and the substrate 13 (anode) to free the inert gas to produce an inert gas plasma. Since the target 11 has a lower voltage, the gas positive ions move toward the target 11 and strike the target 11, and the atoms of the target 11 fall off into the plasma and finally deposit on the surface of the substrate 13 on the anode plate 12.
DLC膜層具有強大內應力,導致DLC膜層內應力過大之最主要因素為基材與DLC膜層之間熱膨脹係數相差太大。如鋼質基材之熱膨脹係數約為10- 6 每度(K- 1 ),而DLC屬於陶瓷材料,其膨脹係數較低,約為10- 9 K- 1 ,兩者膨脹係數相差一千倍。因此當鍍膜時由高溫降至室溫,鋼質基材收縮快而DLC膜層收縮慢,使得DLC膜層產生巨大內應力,DLC膜層易破裂而脫落。The DLC film layer has strong internal stress, and the most important factor causing excessive stress in the DLC film layer is that the thermal expansion coefficient between the substrate and the DLC film layer is too different. For example, the thermal expansion coefficient of a steel substrate is about 10 - 6 per degree (K - 1 ), while DLC is a ceramic material with a low expansion coefficient of about 10 - 9 K - 1 , and the expansion coefficients of the two are a thousand times different. . Therefore, when the coating is lowered from high temperature to room temperature, the steel substrate shrinks rapidly and the DLC film shrinks slowly, causing a large internal stress in the DLC film layer, and the DLC film layer is easily broken and falls off.
傳統之濺鍍裝置中,基材係直接擺放於陽極板上,參閱第二圖,採用此種方式濺鍍易於基材20表面形成有DLC膜層22,側面形成包覆部222。由於DLC膜層具有強大內應力,包覆部222處結構彎曲,其內應力更大,更易於產生破裂而脫落。In the conventional sputtering apparatus, the substrate is placed directly on the anode plate. Referring to the second drawing, in this manner, the DLC film layer 22 is formed on the surface of the substrate 20, and the cladding portion 222 is formed on the side. Since the DLC film layer has strong internal stress, the structure of the covering portion 222 is curved, the internal stress is larger, and the crack is more likely to occur and fall off.
有鑒於此,有必要提供一種可製得邊緣處不易脫膜之DLC膜層之陽極板,及一種包括該陽極板之DLC膜層之濺鍍裝置。In view of the above, it is necessary to provide an anode plate which can produce a DLC film layer which is not easily peeled off at the edge, and a sputtering device including the DLC film layer of the anode plate.
一種陽極板,其包括基板與擋板,該擋板設置於該基板上,用於緊貼待濺鍍之基材側面,且擋板頂部高出該基材之頂部。An anode plate comprising a substrate and a baffle disposed on the substrate for abutting against a side of the substrate to be sputtered, and the top of the baffle is raised above the top of the substrate.
一種用於濺鍍類鑽石膜之濺鍍裝置,其包括一真空放電腔及設置於該真空放電腔中之靶材、陽極板,包括基板與擋板,該擋板設置於該基板上,用於緊貼待濺鍍之基材側面,且擋板頂部高出該基材之頂部。A sputtering device for sputtering a diamond-like film, comprising a vacuum discharge chamber and a target and an anode plate disposed in the vacuum discharge chamber, comprising a substrate and a baffle, the baffle being disposed on the substrate, Adhering to the side of the substrate to be sputtered, and the top of the baffle is raised above the top of the substrate.
當基材置於該陽極板上進行濺鍍時,該擋板可防止包覆結構之產生,最終製得之DLC膜層邊緣部份不易因破裂而脫落。When the substrate is placed on the anode plate for sputtering, the baffle prevents the formation of the covering structure, and the edge portion of the finally obtained DLC film layer is not easily peeled off due to cracking.
參閱第三圖,第一實施例之陽極板300包括基板30與擋板32,基板30包括上表面302,擋板32設置於上表面302上,當待濺鍍之基材34放置於上表面302上時,擋板32緊貼基材34側面,且擋板32之厚度較基材34大,使得擋板32之頂部高出基材34頂部,優選的,擋板32之頂部高出基材34頂部約1~10微米。Referring to the third embodiment, the anode plate 300 of the first embodiment includes a substrate 30 and a baffle 32. The substrate 30 includes an upper surface 302. The baffle 32 is disposed on the upper surface 302 when the substrate 34 to be sputtered is placed on the upper surface. When the 302 is over, the baffle 32 is in close contact with the side of the substrate 34, and the thickness of the baffle 32 is larger than the substrate 34, so that the top of the baffle 32 is higher than the top of the substrate 34. Preferably, the top of the baffle 32 is higher than the base. The top of the material 34 is about 1 to 10 microns.
以下詳細說明本實施方式工作原理,參閱第四圖,當在凹形基材31內表面濺鍍DLC膜層時,由於濺鍍本身受到濺射原子多元散射方向之影響,不易得到連續且均勻覆蓋(Conformal)之DLC膜,而會發生填塞(Filling)現象,形成第四圖所示之結構,側面311上形成有DLC膜層331,底面312上形成DLC膜層312,DLC膜層331與DLC膜層332相交形成一填塞區333,由於濺鍍所得之膜層具有不連續之特性,填塞區333易於分離,從而使DLC膜層331及DLC膜層332不致脫落。The working principle of the embodiment will be described in detail below. Referring to the fourth figure, when the DLC film layer is sputtered on the inner surface of the concave substrate 31, since the sputtering itself is affected by the multi-scattering direction of the sputtering atoms, continuous and uniform coverage is not easily obtained. (Conformal) DLC film, filling phenomenon occurs, forming the structure shown in the fourth figure, the DLC film layer 331 is formed on the side surface 311, the DLC film layer 312 is formed on the bottom surface 312, the DLC film layer 331 and the DLC are formed. The film layers 332 intersect to form a packing area 333. Since the film layer obtained by sputtering has discontinuous characteristics, the packing area 333 is easily separated, so that the DLC film layer 331 and the DLC film layer 332 are not peeled off.
本實施例利用濺鍍這一特性,採用擋板32緊貼基材34側面,進行濺鍍時形成與第四圖所示類似之結構,濺鍍完成之後,分離基材與擋板,則得到如第五圖所示之結構,基材34上形成有DLC膜層36,且基材34側面無包覆結構,基材34邊緣處DLC膜層不易脫落。In this embodiment, by using the sputtering property, the baffle 32 is closely attached to the side surface of the substrate 34, and a structure similar to that shown in the fourth figure is formed during sputtering. After the sputtering is completed, the substrate and the baffle are separated, and then the structure is obtained. As shown in the fifth figure, the DLC film layer 36 is formed on the substrate 34, and the side surface of the substrate 34 has no coating structure, and the DLC film layer at the edge of the substrate 34 is not easily peeled off.
參閱第六圖,為該陽極板第二實施例之示意圖,本實施例之陽極板400與前述實施例之陽極板300不同之處在於其還包括固定板46與彈簧48。固定板46固定於表面402上,其可靠近基板40邊緣設置。擋板42設置於固定板46之間。彈簧48連接固定板46與擋板42,可使擋板42緊貼基材44側面。Referring to the sixth drawing, which is a schematic view of the second embodiment of the anode plate, the anode plate 400 of the present embodiment is different from the anode plate 300 of the foregoing embodiment in that it further includes a fixing plate 46 and a spring 48. The mounting plate 46 is secured to the surface 402 and is disposed adjacent the edge of the substrate 40. The baffle 42 is disposed between the fixed plates 46. The spring 48 connects the fixing plate 46 and the baffle 42 so that the baffle 42 abuts against the side of the substrate 44.
參閱第七圖,為陽極板第三實施例之示意圖,本實施例與第二實施例類似,不同之處在於用螺杆58取代彈簧48,固定板56上開設有與螺杆58相匹配之螺孔562,螺杆58與螺孔配合可實現使擋板52緊貼基材54側面之效果。Referring to the seventh embodiment, which is a schematic view of a third embodiment of the anode plate, the embodiment is similar to the second embodiment except that the spring 58 is replaced by a screw 58 which is provided with a screw hole matching the screw 58. 562. The screw 58 cooperates with the screw hole to achieve the effect that the baffle 52 is in close contact with the side surface of the substrate 54.
參閱第八圖,為第四實施例陽極板示意圖,與第三實施例相比不同之處在於擋板62高度為可調的,擋板62包括活動部622及固定部624及固定裝置626。固定裝置626可將活動部622及固定部624固定於一起,且固定位置可調。本實施例中,固定裝置626包括螺母6264及設置於活動部622一側上之螺栓6262。與之相應的,固定部624上開設有凹槽6242,螺栓6262穿過凹槽6242,與螺母6264配合從而將活動部622固定在固定部624上。鬆動螺母6264,使活動部622相對固定部624上下移動,再將活動部622固定,即可調節活動部622相對固定部624之高度,濺鍍時,活動部622與待濺鍍基材側面緊貼。Referring to the eighth embodiment, a schematic view of the anode plate of the fourth embodiment is different from the third embodiment in that the height of the baffle 62 is adjustable, and the baffle 62 includes a movable portion 622 and a fixing portion 624 and a fixing device 626. The fixing device 626 can fix the movable portion 622 and the fixing portion 624 together, and the fixed position can be adjusted. In this embodiment, the fixing device 626 includes a nut 6264 and a bolt 6262 disposed on one side of the movable portion 622. Correspondingly, the fixing portion 624 is provided with a groove 6242 through which the bolt 6262 passes, and cooperates with the nut 6264 to fix the movable portion 622 on the fixing portion 624. The nut 6264 is loosened, the movable portion 622 is moved up and down relative to the fixed portion 624, and the movable portion 622 is fixed, so that the height of the movable portion 622 relative to the fixed portion 624 can be adjusted. When the sputtering is performed, the movable portion 622 is tightly pressed to the side of the substrate to be sputtered. paste.
擋板高度可調,則可適用於不同高度之基材。The height of the baffle is adjustable for substrates of different heights.
當然,上述實施例中,根據基材不同之形狀,擋板也可為相應之形狀,如為弧形或圓形等。Of course, in the above embodiments, depending on the shape of the substrate, the baffle may also have a corresponding shape, such as a curved shape or a circular shape.
參閱第九圖,係包含第一實施例之陽極板300之DLC膜層濺鍍裝置示意圖,其包括放電腔70、靶材71、陽極板300及真空泵74。放電腔70上開設有氣體入口701,可用於導入放電氣體,放電氣體一般為惰性氣體,如氬氣、氪氣等。濺鍍時,將基材73置於陽極板300上,使用真空泵74將放電腔70內抽至真空度10- 2 Pa以下,再向其中充入壓強10-10- 2 Pa之放電氣體,於基材73與靶材71之間施加高壓,使放電氣體游離,產生電漿轟擊靶材71,靶材71中之原子被轟擊射出,最終會沈積於基材73表面。Referring to the ninth drawing, a schematic diagram of a DLC film layer sputtering apparatus including the anode plate 300 of the first embodiment includes a discharge chamber 70, a target 71, an anode plate 300, and a vacuum pump 74. The discharge chamber 70 is provided with a gas inlet 701 for introducing a discharge gas, and the discharge gas is generally an inert gas such as argon gas or helium gas. When sputtering, the substrate 73 was placed on anode plate 300, a vacuum pump 74 to the discharge chamber 70 evacuated to a vacuum of 10 - 2 Pa or less, to which pressure is charged 10-10-- discharge gas of 2 Pa, in A high voltage is applied between the substrate 73 and the target 71 to dissipate the discharge gas, and a plasma bombardment target 71 is generated. The atoms in the target 71 are bombarded and finally deposited on the surface of the substrate 73.
綜上所述,本發明確已符合發明專利之要件,遂依法提出專利申請。惟,以上所述僅為本發明之較佳實施方式,自不能以此限制本案之申請專利範圍。舉凡熟悉本案技藝之人士援依本發明之精神所作之等效修飾或變化,皆應涵蓋於以下申請專利範圍內。In summary, the present invention has indeed met the requirements of the invention patent, and has filed a patent application according to law. However, the above description is only a preferred embodiment of the present invention, and it is not possible to limit the scope of the patent application of the present invention. Equivalent modifications or variations made by persons skilled in the art in light of the spirit of the invention are intended to be included within the scope of the following claims.
放電腔...10,70Discharge chamber. . . 10,70
靶材...11,71Target. . . 11,71
陽極板...12Anode plate. . . 12
基材...13,20,34,44,54,73Substrate. . . 13,20,34,44,54,73
真空泵...14,74Vacuum pump. . . 14,74
DLC膜層...22,331,332,36DLC film layer. . . 22,331,332,36
包覆部...222Covering section. . . 222
基板...30,40Substrate. . . 30,40
上表面...302,402Upper surface. . . 302,402
擋板...32,42,52,62Baffle. . . 32, 42, 52, 62
凹形基材...31Concave base material. . . 31
側面...311side. . . 311
底面...312‘Bottom surface. . . 312'
填塞區...333Packing area. . . 333
固定板...46,56Fixed plate. . . 46,56
彈簧...48spring. . . 48
螺孔...562Screw hole. . . 562
螺杆...58Screw. . . 58
固定部...624Fixed part. . . 624
活動部...622Activities section. . . 622
固定裝置...626Fixtures. . . 626
螺栓...6262bolt. . . 6262
螺母...6264Nut. . . 6264
第一圖係先前技術直流濺鍍DLC膜層裝置。The first figure is a prior art DC sputter DLC film layer device.
第二圖係先前技術形成之DLC膜層示意圖。The second figure is a schematic representation of a DLC film formed by prior art.
第三圖係第一實施例之陽極板結構示意圖。The third figure is a schematic view of the structure of the anode plate of the first embodiment.
第四圖係第一實施例之陽極板結構原理示意圖。The fourth figure is a schematic diagram of the structure of the anode plate of the first embodiment.
第五圖係採用第一實施例之陽極板濺鍍之DLC膜層結構示意圖。The fifth drawing is a schematic view showing the structure of the DLC film layer which is sputtered by the anode plate of the first embodiment.
第六圖係第二實施例之陽極板結構示意圖。The sixth drawing is a schematic view showing the structure of the anode plate of the second embodiment.
第七圖係第三實施例之陽極板結構示意圖。The seventh drawing is a schematic view showing the structure of the anode plate of the third embodiment.
第八圖係第四實施例之陽極板擋板結構示意圖。The eighth drawing is a schematic view showing the structure of the anode plate baffle of the fourth embodiment.
第九圖係包括第一實施例之陽極板之DLC膜層濺鍍裝置示意圖。The ninth drawing is a schematic view of a DLC film layer sputtering apparatus including the anode plate of the first embodiment.
基板...30Substrate. . . 30
上表面...302Upper surface. . . 302
擋板...32Baffle. . . 32
基材...34Substrate. . . 34
Claims (14)
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Citations (5)
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US5538609A (en) * | 1994-07-23 | 1996-07-23 | Leybold Aktiengesellschaft | Cathodic sputtering system |
US20020008891A1 (en) * | 2000-07-10 | 2002-01-24 | Atomic Telecom | Substrate fixture for high-yield production of thin film based dense wavelength division multiplexers |
US6596138B2 (en) * | 2001-01-26 | 2003-07-22 | Seiko Epson Corporation | Sputtering apparatus |
TW574397B (en) * | 1997-06-18 | 2004-02-01 | Univ Northeastern | A method of coating edges with diamond-like carbon |
TWM248792U (en) * | 1997-03-31 | 2004-11-01 | Shinko Electric Ind Co | Device for forming bumps and device for metal plating |
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2005
- 2005-12-23 TW TW94146267A patent/TWI427175B/en not_active IP Right Cessation
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5538609A (en) * | 1994-07-23 | 1996-07-23 | Leybold Aktiengesellschaft | Cathodic sputtering system |
TWM248792U (en) * | 1997-03-31 | 2004-11-01 | Shinko Electric Ind Co | Device for forming bumps and device for metal plating |
TW574397B (en) * | 1997-06-18 | 2004-02-01 | Univ Northeastern | A method of coating edges with diamond-like carbon |
US20020008891A1 (en) * | 2000-07-10 | 2002-01-24 | Atomic Telecom | Substrate fixture for high-yield production of thin film based dense wavelength division multiplexers |
US6596138B2 (en) * | 2001-01-26 | 2003-07-22 | Seiko Epson Corporation | Sputtering apparatus |
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