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TWD227961S - 半導體檢測針 - Google Patents

半導體檢測針 Download PDF

Info

Publication number
TWD227961S
TWD227961S TW111305315F TW111305315F TWD227961S TW D227961 S TWD227961 S TW D227961S TW 111305315 F TW111305315 F TW 111305315F TW 111305315 F TW111305315 F TW 111305315F TW D227961 S TWD227961 S TW D227961S
Authority
TW
Taiwan
Prior art keywords
probe pin
semiconductor probe
semiconductor
item
design
Prior art date
Application number
TW111305315F
Other languages
English (en)
Inventor
安範模
Original Assignee
南韓商普因特工程有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 南韓商普因特工程有限公司 filed Critical 南韓商普因特工程有限公司
Publication of TWD227961S publication Critical patent/TWD227961S/zh

Links

Abstract

【物品用途】;本設計物品是一種半導體檢測針，用於通過接觸半導體晶片或半導體器件等物體來檢查物體是否有缺陷。本設計物品的材質為金屬。;【設計說明】;無。

Description

半導體檢測針
本設計物品是一種半導體檢測針，用於通過接觸半導體晶片或半導體器件等物體來檢查物體是否有缺陷。本設計物品的材質為金屬。
無。
TW111305315F 2022-04-29 2022-10-27 半導體檢測針 TWD227961S (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR30-2022-0017283 2022-04-29
KR20220017283 2022-04-29

Publications (1)

Publication Number Publication Date
TWD227961S true TWD227961S (zh) 2023-10-11

Family

ID=88875276

Family Applications (1)

Application Number Title Priority Date Filing Date
TW111305315F TWD227961S (zh) 2022-04-29 2022-10-27 半導體檢測針

Country Status (2)

Country Link
US (1) USD1051865S1 (zh)
TW (1) TWD227961S (zh)

Family Cites Families (42)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2811702A (en) * 1956-06-21 1957-10-29 Malco Tool & Mfg Co Terminal pin for printed circuit board
US4681392A (en) * 1986-04-21 1987-07-21 Bead Chain Manufacturing Company Swaged compliant connector pins for printed circuit boards
JPH03185847A (ja) * 1989-12-15 1991-08-13 Toshiba Corp ユニバーサルプローブカード
US5487684A (en) * 1992-07-01 1996-01-30 Berg Technology, Inc. Electrical contact pin for printed circuit board
USD344029S (en) * 1992-09-28 1994-02-08 Sullivan Frank K Measuring belt
KR100212169B1 (ko) * 1996-02-13 1999-08-02 오쿠보 마사오 프로브, 프로브의 제조, 그리고 프로브를 사용한 수직동작형 프로브 카드 어셈블리
US6098281A (en) * 1996-11-06 2000-08-08 Weidmuller Interface Gmbh & Co. Electrical pins and method for their insertion into apertures of a circuit board
JPH1187438A (ja) * 1997-09-03 1999-03-30 Mitsubishi Electric Corp プローブ先端のクリーニング部材ならびにクリーニング方法、および半導体ウェーハのテスト方法
KR100268414B1 (ko) * 1997-09-08 2000-11-01 윤종용 반도체 장치를 테스트하기 위한 프로브 카드
US6032994A (en) * 1998-11-25 2000-03-07 Promos Technologies Inc. Tools for positioning semiconductor chip test probes
KR100537508B1 (ko) * 2003-04-10 2005-12-19 삼성전자주식회사 저항성 팁을 구비한 반도체 탐침 제조방법
KR100785006B1 (ko) * 2005-09-03 2007-12-12 삼성전자주식회사 고분해능 저항성 팁을 구비한 반도체 탐침 및 그 제조방법
JP2010223852A (ja) * 2009-03-25 2010-10-07 Toshiba Corp 電気検査用プローブ及びその製造方法並びに半導体装置の製造方法
JP5083430B2 (ja) * 2011-03-29 2012-11-28 山一電機株式会社 コンタクトプローブ及びそれを備えた半導体素子用ソケット
US20120289102A1 (en) * 2011-05-11 2012-11-15 Tyco Electronics Corporation Contact having a profiled compliant pin
JP6011103B2 (ja) * 2012-07-23 2016-10-19 山一電機株式会社 コンタクトプローブ及びそれを備えた半導体素子用ソケット
US20140266277A1 (en) * 2013-03-18 2014-09-18 Cheng Yun Technology Co., Ltd. Semiconductor testing probe needle
JP1529602S (zh) * 2014-12-04 2015-07-27
JP1529603S (zh) * 2014-12-04 2015-07-27
JP1529609S (zh) * 2014-12-15 2015-07-27
JP1529606S (zh) * 2014-12-15 2015-07-27
JP1529607S (zh) * 2014-12-15 2015-07-27
TWD177827S (zh) * 2014-12-15 2016-08-21 歐姆龍股份有限公司 積體電路插座用探針引腳之部分
JP1529605S (zh) * 2014-12-15 2015-07-27
JP1529608S (zh) * 2014-12-15 2015-07-27
JP1529612S (zh) * 2014-12-19 2015-07-27
JP1529613S (zh) * 2014-12-19 2015-07-27
USD775984S1 (en) * 2015-03-04 2017-01-10 Omron Corporation Probe pin
JP1554473S (zh) * 2015-09-15 2016-07-25
JP1554474S (zh) * 2015-09-15 2016-07-25
JP1558740S (zh) * 2015-11-12 2016-09-12
JP1558199S (zh) * 2015-11-12 2016-09-12
JP1558200S (zh) * 2015-11-12 2016-09-12
JP1558202S (zh) * 2015-11-12 2016-09-12
US10114038B2 (en) * 2015-12-28 2018-10-30 Texas Instruments Incorporated Force biased spring probe pin assembly
JP1567318S (zh) * 2016-02-15 2017-01-23
JP1567320S (zh) * 2016-02-15 2017-01-23
JP1567322S (zh) * 2016-02-15 2017-01-23
USD811912S1 (en) * 2016-04-12 2018-03-06 Qualmax Testech, Inc. Plunger for semiconductor chip-testing probe
JP6515877B2 (ja) * 2016-06-17 2019-05-22 オムロン株式会社 プローブピン
JP6642359B2 (ja) * 2016-09-21 2020-02-05 オムロン株式会社 プローブピンおよび検査ユニット
JP1624757S (zh) * 2018-05-16 2019-02-18

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