TW202105789A - Display panel and method of fabricating the same - Google Patents
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Abstract
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本發明是有關於一種電子裝置及其製造方法,且特別是有關於一種顯示面板及其製造方法。The present invention relates to an electronic device and a manufacturing method thereof, and more particularly to a display panel and a manufacturing method thereof.
一般來說,顯示面板是由薄膜電晶體陣列基板(thin film transistor array)以及配置於其上的顯示介質層所構成。特別是,薄膜電晶體陣列基板又可分為主動區與周邊線路區,其中主動區內配置有畫素陣列,而周邊線路區內則是配置有多條導電走線(或引線)、多個接合墊(bonding pad)以及測試電晶體等等元件。通常顯示面板在製作完成之後,都會進行一系列的檢測程序以確認顯示面板的顯示品質是否符合標準。Generally speaking, a display panel is composed of a thin film transistor array substrate and a display medium layer disposed on it. In particular, the thin film transistor array substrate can be divided into an active area and a peripheral circuit area. The active area is equipped with a pixel array, and the peripheral circuit area is equipped with multiple conductive traces (or leads) and multiple Bonding pads and test transistors and other components. Usually, after the display panel is manufactured, a series of testing procedures are carried out to confirm whether the display quality of the display panel meets the standard.
一般來說,經檢測後的顯示面板需要進行切割步驟,以移除電性測試用的測試接墊。由於設置在周邊線路區的這些導電走線的配置方式(例如走線寬度與走線之間的間距)會因為產品設計(例如畫素解析度)的不同而異。因此,在切割的過程中,往往需要針對不同產品規格的顯示面板進行切割參數(例如雷射功率或刀輪的下壓深度)的調整,以確保基板的切割不會造成顯示面板的毀損。然而,隨著顯示面板的解析度不斷地提升,這些測試用的導電走線之間的間距也不斷地縮減,造成顯示面板在移除測試接墊後,這些導電走線容易在切割方向上發生電性短路。Generally, the tested display panel needs to undergo a cutting step to remove the test pads for electrical testing. Because the configuration of these conductive traces (such as trace width and spacing between traces) arranged in the peripheral circuit area will vary due to different product designs (such as pixel resolution). Therefore, during the cutting process, it is often necessary to adjust cutting parameters (such as laser power or depression depth of the cutter wheel) for display panels of different product specifications to ensure that the cutting of the substrate does not cause damage to the display panel. However, as the resolution of the display panel continues to improve, the spacing between the conductive traces used for testing has also been continuously reduced. As a result, after the display panel is removed from the test pads, these conductive traces are likely to occur in the cutting direction. Electrical short circuit.
本發明提供一種顯示面板,其生產良率較佳。The present invention provides a display panel with better production yield.
本發明提供一種顯示面板的製造方法,其切割良率較佳。The present invention provides a method for manufacturing a display panel, which has a better cutting yield.
本發明的顯示面板,包括基板、多個接合墊以及多條導電走線。基板具有基板邊緣、顯示區以及設置於基板邊緣與顯示區之間的周邊區。多個接合墊排列於基板的周邊區內。多條導電走線與這些接合墊電性連接。這些導電走線延伸於這些接合墊與基板邊緣之間,且具有多個斷開處。The display panel of the present invention includes a substrate, a plurality of bonding pads, and a plurality of conductive traces. The substrate has an edge of the substrate, a display area, and a peripheral area arranged between the edge of the substrate and the display area. A plurality of bonding pads are arranged in the peripheral area of the substrate. A plurality of conductive traces are electrically connected to the bonding pads. The conductive traces extend between the bonding pads and the edge of the substrate, and have multiple disconnections.
本發明的顯示面板的製造方法,包括進行多條導電走線的斷開步驟,使顯示面板的多個接合墊與多個測試接墊電性分離、沿著切割線進行顯示面板的基板的切割步驟以及將軟性電路板電性接合於顯示面板的這些接合墊。這些接合墊與這些測試接墊設置於顯示面板位於基板的至少一側的周邊區,且顯示面板的這些導電走線電性連接於這些接合墊與這些測試接墊之間。在完成斷開步驟後,這些導電走線分別具有多個斷開處。在基板的切割步驟中,切割線位於這些導電走線的這些斷開處與這些測試接墊之間。The manufacturing method of the display panel of the present invention includes the step of disconnecting a plurality of conductive traces, electrically separating the plurality of bonding pads of the display panel from the plurality of test pads, and cutting the substrate of the display panel along the cutting line Steps and electrically bonding the flexible circuit board to the bonding pads of the display panel. The bonding pads and the test pads are arranged in the peripheral area of the display panel on at least one side of the substrate, and the conductive traces of the display panel are electrically connected between the bonding pads and the test pads. After the disconnection step is completed, these conductive traces respectively have multiple disconnections. In the step of cutting the substrate, the cutting line is located between the disconnections of the conductive traces and the test pads.
基於上述,在本發明的一實施例的顯示面板的製造方法中,未經切割的顯示面板在連接多個接合墊與多個測試接墊之間的多條導電走線上設有多個斷開處。在基板的切割步驟中,顯示面板是沿著位於測試接墊與接合墊之間的切割線進行切割,以移除這些測試接墊。透過導電走線的這些斷開處設置在這些接合墊與切割線之間,可避免這些導電走線在切割的過程中發生電性短路,有助於提升顯示面板的切割良率。也因此,在本發明的一實施例的顯示面板中,延伸於經切割的基板邊緣與多個接合墊之間的多條導電走線分別具有這些斷開處。Based on the above, in the manufacturing method of the display panel of an embodiment of the present invention, the uncut display panel is provided with a plurality of disconnects on the conductive traces connecting the plurality of bonding pads and the plurality of test pads. Place. In the step of cutting the substrate, the display panel is cut along the cutting line between the test pads and the bonding pads to remove the test pads. These disconnections through the conductive traces are arranged between the bonding pads and the cutting lines, which can prevent the conductive traces from being electrically short-circuited during the cutting process, which helps to improve the cutting yield of the display panel. Therefore, in the display panel of an embodiment of the present invention, the plurality of conductive traces extending between the edge of the cut substrate and the plurality of bonding pads respectively have these disconnections.
本文使用的「約」、「近似」、「本質上」、或「實質上」包括所述值和在本領域普通技術人員確定的特定值的可接受的偏差範圍內的平均值,考慮到所討論的測量和與測量相關的誤差的特定數量(即,測量系統的限制)。例如,「約」可以表示在所述值的一個或多個標準偏差內,或例如±30%、±20%、±15%、±10%、±5%內。再者,本文使用的「約」、「近似」、「本質上」、或「實質上」可依量測性質、切割性質或其它性質,來選擇較可接受的偏差範圍或標準偏差,而可不用一個標準偏差適用全部性質。As used herein, "approximately", "approximately", "essentially", or "substantially" includes the stated value and the average value within the acceptable deviation range of the specific value determined by a person of ordinary skill in the art, taking into account all The measurement in question and the specific number of errors associated with the measurement (ie, the limitations of the measurement system). For example, "about" can mean within one or more standard deviations of the stated value, or, for example, within ±30%, ±20%, ±15%, ±10%, ±5%. Furthermore, "about", "approximately", "essentially", or "substantially" used in this article can be based on measurement properties, cutting properties, or other properties to select a more acceptable deviation range or standard deviation. Not one standard deviation applies to all properties.
在附圖中,為了清楚起見,放大了層、膜、面板、區域等的厚度。應當理解,當諸如層、膜、區域或基板的元件被稱為在另一元件「上」或「連接到」另一元件時,其可以直接在另一元件上或與另一元件連接,或者中間元件可以也存在。相反,當元件被稱為「直接在另一元件上」或「直接連接到」另一元件時,不存在中間元件。如本文所使用的,「連接」可以指物理及/或電性連接。再者,「電性連接」可為二元件間存在其它元件。In the drawings, the thickness of layers, films, panels, regions, etc., are exaggerated for clarity. It should be understood that when an element such as a layer, film, region, or substrate is referred to as being "on" or "connected to" another element, it can be directly on or connected to the other element, or Intermediate elements can also be present. In contrast, when an element is referred to as being "directly on" or "directly connected to" another element, there are no intervening elements. As used herein, "connection" can refer to physical and/or electrical connection. Furthermore, "electrical connection" can mean that there are other components between the two components.
此外,諸如「下」或「底部」和「上」或「頂部」的相對術語可在本文中用於描述一個元件與另一元件的關係,如圖所示。應當理解,相對術語旨在包括除了圖中所示的方位之外的裝置的不同方位。例如,如果一個附圖中的裝置翻轉,則被描述為在其它元件的「下」側的元件將被定向在其它元件的「上」側。因此,示例性術語「下」可以包括「下」和「上」的取向,取決於附圖的特定取向。類似地,如果一個附圖中的裝置翻轉,則被描述為在其它元件「下方」或「下方」的元件將被定向為在其它元件「上方」。因此,示例性術語「上面」或「下面」可以包括上方和下方的取向。In addition, relative terms such as "lower" or "bottom" and "upper" or "top" can be used herein to describe the relationship between one element and another element, as shown in the figure. It should be understood that relative terms are intended to include different orientations of the device in addition to the orientation shown in the figures. For example, if the device in one figure is turned over, elements described as being on the "lower" side of other elements will be oriented on the "upper" side of the other elements. Therefore, the exemplary term "lower" may include an orientation of "lower" and "upper," depending on the specific orientation of the drawing. Similarly, if the device in one figure is turned over, elements described as "below" or "below" other elements will be oriented "above" the other elements. Thus, the exemplary terms "above" or "below" can include an orientation of above and below.
現將詳細地參考本發明的示範性實施方式,示範性實施方式的實例說明於所附圖式中。只要有可能,相同元件符號在圖式和描述中用來表示相同或相似部分。Reference will now be made in detail to the exemplary embodiments of the present invention, and examples of the exemplary embodiments are illustrated in the accompanying drawings. Whenever possible, the same component symbols are used in the drawings and descriptions to indicate the same or similar parts.
圖1是本發明的一實施例的顯示面板的母板的俯視示意圖。圖2A至圖2D是本發明的一實施例的顯示面板的製造流程的俯視示意圖。圖3A及圖3B分別為圖2A與圖2B的顯示面板的局部區域的放大示意圖。特別說明的是,圖3A對應於圖2A的局部區域I,圖3B對應於圖2B的局部區域II。為清楚呈現起見,圖1省略了圖2A的導電走線CL與訊號線SL的繪示。FIG. 1 is a schematic top view of a motherboard of a display panel according to an embodiment of the invention. 2A to 2D are schematic top views of a manufacturing process of a display panel according to an embodiment of the invention. 3A and 3B are respectively enlarged schematic diagrams of a partial area of the display panel of FIGS. 2A and 2B. Specifically, FIG. 3A corresponds to the partial area I of FIG. 2A, and FIG. 3B corresponds to the partial area II of FIG. 2B. For the sake of clarity, FIG. 1 omits the illustration of the conductive trace CL and the signal line SL in FIG. 2A.
請參照圖2D,在本實施例中,顯示面板10C包括基板100、多個接合墊BP以及多條導電走線CL”。基板100具有基板邊緣100e、顯示區DR以及設置於基板邊緣100e與顯示區DR之間的周邊區PR。多個接合墊BP沿著一方向排列於基板100的周邊區PR。在本實施例中,所述方向可以是基板邊緣100e的延伸方向,但不以此為限。多條導電走線CL”分別與多個接合墊BP電性連接。更具體地說,位於周邊區PR內的這些導電走線CL”延伸於基板邊緣100e與這些連接墊BP之間。值得注意的是,這些導電走線CL”具有多個斷開處CLb,且這些斷開處CLb位於基板邊緣100e與多個接合墊BP之間。透過這些斷開處CLb的上述配置,可避免這些導電走線CL”在切割的過程中發生電性短路,有助於提升顯示面板10C的切割良率。2D, in this embodiment, the
進一步而言,顯示面板10C還可包括對向基板(未繪示)以及設置於基板100與對向基板之間的顯示介質層(未繪示)。在本實施例中,顯示介質層例如包括多個液晶分子。也就是說,本實施例的顯示面板10C可以是液晶顯示面板,但本發明不以此為限。根據其他實施例,顯示介質層也可包括多個發光結構。亦即,顯示面板也可以是有機發光二極體(organic light emitting diode;OLED)面板、微型發光二極體(micro light emitting diode;micro-LED)面板或次毫米發光二極體面板(mini light emitting diode;mini-LED)。在本實施例中,顯示面板10C的基板100與對向基板例如是可撓性基板,但不以此為限。Furthermore, the
應可理解的是,在本實施例中,基板100的基板邊緣100e的一側還可設有軟性電路板(flexible printed circuit board;FPCB)200,且此軟性電路板200電性接合於這些接合墊BP。在本實施例中,軟性電路板200例如是採用覆晶薄膜封裝(chip on film;COF)的傳輸電路板。也就是說,軟性電路板200可以是具有驅動晶片與傳輸線路的封裝結構,但本發明不以此為限。在其他實施例中,軟性電路板200也可以是採用捲帶式接合(tape automated bonding;TAB)技術所形成的傳輸電路板。在另一實施例中,軟性電路板200也可不具有驅動晶片。It should be understood that, in this embodiment, a flexible printed circuit board (FPCB) 200 may be further provided on one side of the
另一方面,顯示面板10C更包括多條訊號線SL,且這些訊號線SL設置於顯示區DR內並延伸至周邊區PR以電性連接多個接合墊BP。舉例而言,顯示面板10C的顯示區DR可設有多個畫素結構(未繪示),且這些畫素結構分別電性連接這些訊號線SL。換句話說,軟性電路板200所發出的驅動訊號可經由接合墊BP與訊號線SL的傳遞傳送至顯示區DR的畫素結構,以達到顯示影像畫面的效果。以下將針對顯示面板10C的製造流程進行示範性地說明。On the other hand, the
請參照圖1及圖2A至圖2D,顯示面板10C的製造方法包括:將一母板1進行切割以取得多個顯示面板10。在本實施例中,母板1具有陣列排列的多個顯示面板10。亦即,這些顯示面板10分別在方向X與方向Y上排成多排與多列,但不以此為限。在其他實施例中,為了使母板的利用率最佳化,這些顯示面板的尺寸也可不同,且並非以陣列排列的方式設置於母板上。舉例來說,在本實施例中,母板1的切割製程是以機械性切割(例如固定式刀具切割、轉動式刀輪切割或固定式刀模切割等)的方式沿著多條切割線C1與多條切割線C2來進行,且切割線C1的延伸方向相交於切割線C2的延伸方向,但本發明不以此為限。在其他實施例中,母板1的切割製程也可採用非機械性切割(例如雷射切割)的方式來進行。1 and FIGS. 2A to 2D, the manufacturing method of the
由母板1切割取得的顯示面板10具有多個測試接墊TP,且這些測試接墊TP設置於顯示面板10的基板100S的至少一側。在本實施例中,顯示面板10的基板100S具有對應於切割線C2的一側邊100Se,且這些測試接墊TP位於基板100S的此側邊100Se與多個接合墊BP之間,但不以此為限。請參照圖2A及圖3A,顯示面板10C的製造方法更包括:於多個接合墊BP與多個測試接墊TP之間形成多條導電走線CL。導電走線CL電性連接於對應的一個接合墊BP與對應的一個測試接墊TP之間。然而,本發明不限於此,根據其他實施例,導電走線也可電性連接於對應的多個接合墊BP與對應的一個測試接墊TP之間。The
進一步而言,導電走線CL具有延伸段121、連接部122與延伸段123,連接部122電性連接於延伸段121與延伸段123之間。舉例而言,在本實施例中,導電走線CL的連接部122在方向X上具有寬度W1,導電走線CL的延伸段123(或延伸段121)在方向X上具有寬度W2,且寬度W1小於寬度W2,但本發明不以此為限。在一較佳的實施例中,導電走線CL的連接部122的寬度W1與延伸段123的寬度W2的比值小於0.5。需說明的是,在本實施例中,導電走線CL的延伸段121與延伸段123在方向X上的寬度可選擇性地相同,但不以此為限。在其他實施例中,導電走線的兩延伸段在方向X上的寬度也可不相同,且都大於連接部122的寬度W1。Furthermore, the conductive trace CL has an
請繼續參照圖2A,在母板1的切割步驟完成後,進行顯示面板10的檢測步驟。舉例而言,顯示面板10的檢測步驟包括將測試機台的多個探針(probe pin)分別抵接至顯示面板10的多個測試接墊TP上以及於這些測試接墊TP之間施加至少一電壓訊號,以進行電性和/或可靠度(reliability)測試。在本實施例中,所述至少一電壓訊號可以是由測試機台的電源PS1所提供的直流電壓訊號,但不以此為限。需說明的是,圖2A中電源PS1與多個測試接墊TP的電連接方式僅作為示例性地說明之用,本發明並不以圖式揭示內容為限制。Please continue to refer to FIG. 2A, after the cutting step of the
在顯示面板10的檢測步驟完成後,如圖2B及圖3B所示,進行多條導電走線CL的斷開步驟,使這些接合墊BP與測試接墊TP電性分離。值得注意的是,在完成導電走線CL的斷開步驟後,形成具有斷開處CLb的導電走線CL’。舉例來說,導電走線CL的斷開步驟可藉由前述的測試機台來進行。不同的是,測試機台的電源PS2(或者是電源PS1)的兩端(例如高電位端與低電位端)分別電連接至接合墊BP與測試接墊TP。由於導電走線CL的連接部122的寬度W2小於延伸部123的寬度W1(或延伸部121的寬度),連接部122的電阻值(resistivity)大於延伸部123的電阻值(或延伸部121的電阻值)。也因此,當電源PS2被致能而於接合墊BP與測試接墊TP之間施加一電流Ic時,流經導電走線CL的電流Ic在通過連接部122時會產生較多的熱能,致使連接部122的溫度升高並超過其熔點。此時,導電走線CL的連接部122會斷開並形成斷開處CLb。舉例來說,用於斷開步驟的電流Ic值與檢測用的電流值的比值可介於1至5之間,但不以此為限。After the detection step of the
值得注意的是,導電走線CL斷開後所形成的導電走線CL’還具有定義斷開處CLb的端部1211與端部1231。端部1211與端部1231分別連接延伸段121與延伸段123。在本實施例中,導電走線CL’的端部1211在方向X上具有寬度W1’,且端部1211的寬度W1’(或端部1231在方向X上的寬度)小於延伸段123在方向X上的寬度W2(或延伸段121在方向X上的寬度)。It is worth noting that the conductive trace CL' formed after the conductive trace CL is disconnected also has an
請參照圖2C及圖3B,在完成導電走線CL的斷開步驟後,沿著切割線C3進行基板100S的切割步驟,以取得顯示面板10C。值得注意的是,此切割線C3是位於多條導電走線CL’的多個斷開處CLb與多個測試接墊TP之間,或者是多條導電走線CL的多個連接部122位於切割線C3與多個接合墊BP之間(如圖3A所示)。舉例來說,多個導電走線CL’的多個斷開處CLb與切割線C3之間具有最短距離d,且此最短距離d可大於等於50微米,但本發明不以此為限。換句話說,切割線C3可設置在距離斷開處CLb至少50微米的位置到測試接墊TP之間的區域內。據此,可增加基板100S的切割製程的調整裕度。從另一觀點來說,透過導電走線CL’的這些斷開處CLb設置在接合墊BP與測試接墊TP之間,可避免導電走線CL’在切割的過程中發生電性短路,有助於提升顯示面板的切割良率。Referring to FIGS. 2C and 3B, after the disconnection step of the conductive trace CL is completed, the cutting step of the
請參照圖2D,經切割後的導電走線CL”延伸於基板100的基板邊緣100e與接合墊BP之間,且具有斷開處CLb。值得注意的是,由於上述切割線C3的配置關係(如圖2C所示),經切割後的基板100的基板邊緣100e與多個斷開處CLb之間的最短距離d可大於等於50微米,但不以此為限。進一步來說,在完成基板100S的切割步驟後,還可將軟性電路板200電性接合於多個接合墊BP。舉例而言,軟性電路板200可具有多個引腳(pin),且軟性電路板200透過這些引腳與多個接合墊BP的熱壓接合而電性連接基板100上的多條訊號線SL。Referring to FIG. 2D, the cut conductive trace CL" extends between the
以下將列舉另一些實施例以詳細說明本揭露,其中相同的構件將標示相同的符號,並且省略相同技術內容的說明,省略部分請參考前述實施例,以下不再贅述。Other embodiments will be listed below to describe the disclosure in detail, wherein the same components will be marked with the same symbols, and the description of the same technical content will be omitted. For the omitted parts, please refer to the foregoing embodiments, and will not be repeated hereafter.
圖4是本發明的另一實施例的顯示面板的局部區域的俯視示意圖。圖5是圖4的顯示面板的剖視示意圖。特別說明的是,為清楚呈現起見,圖4省略了圖5的絕緣層110的繪示。請參照圖4及圖5,本實施例的顯示面板11與圖3A的顯示面板10的主要差異在於:導電走線的組成不同。具體而言,顯示面板11的導電走線CL-A具有結構上彼此分離的延伸段121A與延伸段123A以及電性連接於延伸段121A與延伸段123A之間的連接部122A。在本實施例中,形成多條導電走線CL-A的步驟可選擇性地包括於延伸段與連接部122A之間形成絕緣層110。也就是說,導電走線CL-A的連接部122A與延伸段可屬於不同的膜層。4 is a schematic top view of a partial area of a display panel according to another embodiment of the invention. FIG. 5 is a schematic cross-sectional view of the display panel of FIG. 4. In particular, for the sake of clarity, FIG. 4 omits the illustration of the insulating
舉例來說,在本實施例中,絕緣層110覆蓋導電走線CL-A的延伸段121A與延伸段123A,導電走線CL-A的連接部122A設置於絕緣層110上,且連接部122A的兩端貫穿絕緣層110以分別電性連接延伸段121A與延伸段123A。然而,本發明不限於此,在其他未示出的實施例中,導電走線的連接部也可設置於絕緣層110與基板100S之間,且兩延伸段分別貫穿絕緣層110以電性連接連接部。For example, in this embodiment, the insulating
值得一提的是,在本實施例中,導電走線CL-A的兩延伸段的電阻值可小於連接部122A的電阻值。因此,在導電走線CL-A的斷開步驟中,流經導電走線CL-A的電流在通過連接部122A時會產生較多的熱能,致使連接部122A的溫度升高並超過其熔點。此時,導電走線CL-A的連接部122A會斷開並形成斷開處(未繪示)。透過此斷開處的設置,可避免導電走線CL-A在後續的切割製程中發生電性短路,有助於提升顯示面板11的切割良率。It is worth mentioning that in this embodiment, the resistance value of the two extension sections of the conductive trace CL-A may be smaller than the resistance value of the connecting
圖6是本發明的又一實施例的顯示面板的局部區域的俯視示意圖。請參照圖6,本實施例的顯示面板12與圖3A的顯示面板10的差異在於:導電走線的連接部的配置不同。具體而言,顯示面板12的多條導電走線CL-B的多個連接部122B在接合墊BP的排列方向(例如方向X)上彼此錯開。也就是說,多條導電走線CL-B的任一者的連接部122B在方向X上可重疊於相鄰的導電走線CL-B的延伸段121B或延伸段123B。FIG. 6 is a schematic top view of a partial area of a display panel according to another embodiment of the present invention. Please refer to FIG. 6, the difference between the display panel 12 of this embodiment and the
應可理解的是,這些導電走線CL-B在斷開步驟完成後所形成的多個斷開處在方向X上也彼此錯開(未繪示)。值得一提的是,透過上述多條導電走線CL-B的多個連接部122B的錯位關係,可分散電流通過這些連接部122B時所產生的熱能,有助於進一步確保這些接合墊BP在基板100S的切割步驟完成後的電性獨立。It should be understood that the multiple disconnections formed by the conductive traces CL-B after the disconnection step is completed are also staggered in the direction X (not shown). It is worth mentioning that through the dislocation relationship of the plurality of connecting
綜上所述,在本發明的一實施例的顯示面板的製造方法中,未經切割的顯示面板在連接多個接合墊與多個測試接墊之間的多條導電走線上設有多個斷開處。在基板的切割步驟中,顯示面板是沿著位於測試接墊與接合墊之間的切割線進行切割,以移除這些測試接墊。透過導電走線的這些斷開處設置在這些接合墊與切割線之間,可避免這些導電走線在切割的過程中發生電性短路,有助於提升顯示面板的切割良率。也因此,在本發明的一實施例的顯示面板中,延伸於經切割的基板邊緣與多個接合墊之間的多條導電走線分別具有這些斷開處。In summary, in the manufacturing method of the display panel of an embodiment of the present invention, the uncut display panel is provided with a plurality of conductive traces connecting the plurality of bonding pads and the plurality of test pads. Disconnect. In the step of cutting the substrate, the display panel is cut along the cutting line between the test pads and the bonding pads to remove the test pads. These disconnections through the conductive traces are arranged between the bonding pads and the cutting lines, which can prevent the conductive traces from being electrically short-circuited during the cutting process, which helps to improve the cutting yield of the display panel. Therefore, in the display panel of an embodiment of the present invention, the plurality of conductive traces extending between the edge of the cut substrate and the plurality of bonding pads respectively have these disconnections.
1:母板
10、10C、11、12:顯示面板
100、100S:基板
100Se:側邊
100e:基板邊緣
110:絕緣層
121、121A、121B、123、123A、123B:延伸段
1211、1231:端部
122、122A、122B:連接部
200:軟性電路板
BP:接合墊
C1、C2、C3:切割線
CL、CL-A、CL-B、CL’、CL”:導電走線
CLb:斷開處
DR:顯示區
d:距離
Ic:電流
PR:周邊區
PS1、PS2:電源
SL:訊號線
TP:測試接墊
W1、W1’、W2:寬度
X、Y:方向
I、II:區域1:
圖1是本發明的一實施例的顯示面板的母板的俯視示意圖。 圖2A至圖2D是本發明的一實施例的顯示面板的製造流程的俯視示意圖。 圖3A及圖3B分別為圖2A與圖2B的顯示面板的局部區域的放大示意圖。 圖4是本發明的另一實施例的顯示面板的局部區域的俯視示意圖。 圖5是圖4的顯示面板的剖視示意圖。 圖6是本發明的又一實施例的顯示面板的局部區域的俯視示意圖。FIG. 1 is a schematic top view of a motherboard of a display panel according to an embodiment of the invention. 2A to 2D are schematic top views of a manufacturing process of a display panel according to an embodiment of the invention. 3A and 3B are respectively enlarged schematic diagrams of a partial area of the display panel of FIGS. 2A and 2B. 4 is a schematic top view of a partial area of a display panel according to another embodiment of the invention. FIG. 5 is a schematic cross-sectional view of the display panel of FIG. 4. FIG. 6 is a schematic top view of a partial area of a display panel according to another embodiment of the present invention.
10C:顯示面板 10C: Display panel
100:基板 100: substrate
100e:基板邊緣 100e: edge of substrate
200:軟性電路板 200: flexible circuit board
BP:接合墊 BP: Bonding pad
CL”:導電走線 CL”: Conductive trace
CLb:斷開處 CLb: Break
DR:顯示區 DR: display area
d:距離 d: distance
PR:周邊區 PR: Peripheral area
SL:訊號線 SL: signal line
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- 2020-01-20 TW TW109101945A patent/TWI742519B/en active
- 2020-02-27 TW TW109106499A patent/TWI709797B/en active
- 2020-03-12 TW TW109108162A patent/TWI728741B/en active
- 2020-03-18 TW TW109108999A patent/TWI714478B/en active
- 2020-03-24 TW TW109109792A patent/TWI718913B/en active
- 2020-03-24 TW TW109109750A patent/TWI770484B/en active
- 2020-03-26 TW TW109110260A patent/TWI734425B/en active
- 2020-03-30 TW TW109110879A patent/TWI724847B/en active
- 2020-06-16 TW TW109120138A patent/TWI729853B/en active
- 2020-06-22 TW TW109121042A patent/TWI742735B/en active
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Publication number | Priority date | Publication date | Assignee | Title |
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TWI859517B (en) * | 2021-10-21 | 2024-10-21 | 啟端光電股份有限公司 | Micro-light-emitting diode display panel and integrated machine |
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TWI724847B (en) | 2021-04-11 |
TW202105357A (en) | 2021-02-01 |
TWI729853B (en) | 2021-06-01 |
TWI742519B (en) | 2021-10-11 |
TWI728741B (en) | 2021-05-21 |
TWI714478B (en) | 2020-12-21 |
TW202106126A (en) | 2021-02-01 |
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TWI709797B (en) | 2020-11-11 |
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TWI718913B (en) | 2021-02-11 |
TWI734425B (en) | 2021-07-21 |
TWI742735B (en) | 2021-10-11 |
TW202105348A (en) | 2021-02-01 |
TW202105027A (en) | 2021-02-01 |
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