TW201814544A - Test fixture and test system applicable to electronic device having Universal Serial Bus Type-C receptacle, and method for performing testing on electronic device with aid of test fixture - Google Patents

Abstract

A test fixture includes a plug adaptable to a Universal Serial Bus (USB) Type-C receptacle, a switching circuit, and a control circuit. The plug can be utilized for coupling an electronic device under test. The switching circuit can be utilized for performing switching operations to enable first and second sets of communications paths within the test fixture in turn. The first and the second sets of communications paths are coupled to a first set of communications terminals of the plug and a second set of communications terminals of the plug, respectively. The control circuit can be utilized for controlling the switching operations, to allow a processing circuit to perform first and second sets testing operations on the electronic device through the first and the second sets of communications paths, respectively. A test system and a method for performing testing with aid of the test fixture are also provided.

Description

Fixture and test system applicable to electronic device with universal serial bus C-type socket and method for testing electronic device by means of fixture

The invention relates to testing of electronic devices, and more particularly to an electronic device having a universal serial bus (USB) Type-C receptacle (referred to as "USB C-type socket"). Test fixture and test system and method for testing electronic device by using the fixture.

During the factory test of an electronic device with a USB Type-C socket, an operator needs to insert a plug of a cable into the USB Type-C socket to test certain terminals of the USB Type-C socket. After completing the first test, the operator needs to pull out the plug, then turn the plug over (for example, change the state from one side of the plug to the state where the side is down), and then plug the plug again. Plug in the USB Type-C socket to test some terminals of the USB Type-C socket. After completing the second test, the operator needs to unplug the plug. In addition, for the next device under test (DUT), such as another electronic device of the same model, the operator can repeat these same actions. Some problems may arise from a test architecture based on related technologies. For example: the operator needs to turn the plug upside down, which may cause the operator to forget which side is currently tested, or the other side is not tested. Another example: inserting and removing the plug multiple times for a long time may cause poor contact of the plug, so that misjudgment is prone to occur. Therefore, a novel architecture and related methods are needed to reduce the probability of errors (such as missed tests or misjudgments) and improve test efficiency.

One object of the present invention is to provide a test fixture and a test system and a method for testing an electronic device by using the fixture to solve the above problems.

Another object of the present invention is to provide a jig and test system and a method for testing an electronic device by means of the jig, so as to reduce the cumbersome actions of the operator during the entire test process, reduce the probability of connector damage, and Reduce the test time of each device under test (DUT) and improve test efficiency.

At least one embodiment of the present invention provides a jig, wherein the jig can be applied to a universal serial bus (USB) Type-C receptacle (referred to as "USB C-type socket") One of the electronic devices. For example, the fixture may include a plug adaptable to the USB C-type socket, and further includes a switching circuit and a control circuit. The plug can be used to couple the electronic device, wherein the plug has a plurality of terminals, which are respectively located on a first side and a second side of the plug. In addition, the switching circuit can be used for switching operation to enable one of the first group of communication paths and one second group of communication paths in the fixture in turn, wherein the first group of communication paths are coupled to the plural One of the terminals is a first group of communication terminals, and the second group of communication paths is coupled to one of the plurality of terminals. In addition, the control circuit may be used to control the switching operations of the switching circuit to allow a processing circuit in a test system to perform a first set of test operations on the electronic device through the first set of communication paths, and through the first The two sets of communication paths perform a second set of test operations on the electronic device, wherein the test system includes the jig. According to some embodiments, the test system may include a personal computer (PC), and the processing circuit may include at least one processor of the personal computer. In addition, the fixture may further include: a first universal serial bus connector and a second universal serial bus connector, which are respectively used to couple the fixture to the personal computer; wherein the first set of communication paths Is coupled between the first group of communication terminals and the terminal of the first universal serial bus connector, and the second group of communication paths is coupled between the second group of communication terminals and the second universal serial bus Between the terminals of the connector.

While providing the above-mentioned jig, the present invention also correspondingly provides a method for testing the electronic device by means of the jig, wherein the method is applicable to the processing circuit. For example, the control circuit may be coupled to the personal computer through at least one interface to allow the processing circuit to use the control circuit to control the switching operations of the switching circuit. The method may include the following steps: using the control circuit to control at least one of the switching operations to enable the first set of communication paths in the fixture; and performing the electronic device through the first set of communication paths. A first set of test operations; using the control circuit to control at least one of the switching operations to enable the second set of communication paths in the fixture; and performing the electronic device through the second set of communication paths The second set of tests operates.

While providing the fixture, the present invention also provides a test system correspondingly, wherein the test system can be applied to an electronic device having a USB C-type socket. For example, the test system may include a processing circuit and a jig, wherein the processing circuit may be used to control the operation of the test system, and the jig includes a plug that is adaptable to the USB Type-C socket and another A switching circuit and a control circuit. The plug can be used to couple the electronic device, wherein the plug has a plurality of terminals, which are respectively located on a first side and a second side of the plug. In addition, the switching circuit can be used for switching operation to enable one of the first group of communication paths and one second group of communication paths in the fixture in turn, wherein the first group of communication paths are coupled to the plurality of terminals. One of the first group of communication terminals, and the second group of communication paths is coupled to one of the plurality of terminals. In addition, the control circuit can be used to control the switching operations of the switching circuit to allow the processing circuit to perform a first set of test operations on the electronic device through the first set of communication paths, and pair the electronic device through the second set of communication paths. The electronic device performs a second set of test operations.

The invention has multiple benefits; for example, compared with the related art, the fixture, test system and method of the invention can reduce the tedious actions of the operator during the entire test process, reduce the probability of plug damage, and shorten each test. Test time of the device and improve test efficiency.

The invention provides a test fixture and a test system and a method for testing an electronic device by using the fixture, wherein the electronic device has a universal serial bus (USB) Type- C receptacle, can be referred to as "USB Type C receptacle"), and can perform communication operations according to the universal serial bus (referred to as "USB") specifications. The fixture and the test system can be applied to the electronic device to reduce the movement of the operator during the entire test process, reduce the probability of plug damage, and shorten the test time of each device under test (DUT), and Improve test efficiency.

FIG. 1 is a schematic diagram of a test system 100 and an electronic device 50 according to an embodiment of the present invention. The fixture 110, the test system 100, and the electronic device 50 can be used as the fixture, the test system, and the electronic device, respectively. Device example. Since the test system 100 can test the electronic device 50 by means of the fixture 110, the electronic device 50 can be regarded as a device under test. The electronic device 50 has a USB C-type socket 52, and the USB C-type socket 52 includes a plurality of terminals such as terminals {GND, CC1, SSTX1, SSRX1, VBUS, SSRX2, SSTX2, CC2, GND}. In the USB C-type socket 52, any one of the terminals SSTX1, SSRX1, SSRX2, and SSTX2 represents two differential communication terminals for transmitting a differential pair, and the terminal VBUS represents a group of power Terminal, terminal GND represents a group of ground terminals, and terminals CC1 and CC2 are both configuration channel (CC) terminals. For example, the electronic device 50 may be an external hard disk drive, an external hard disk box, or any of various types of electronic devices.

As shown in FIG. 1, the fixture 110 includes a plug 111 that is adaptable to a USB C-type socket 52. The plug 111 can be used to couple the electronic device 50, and the plug 111 has a plurality of terminals. When the plug 111 is inserted into the USB C-type socket 52, the terminal {GND, CC1, SSTX1, SSRX1, VBUS, SSRX2, SSTX2, CC2, GND} of the plurality of terminals can be respectively coupled to the terminals of the USB C-type socket 52 {GND, CC1, SSTX1, SSRX1, VBUS, SSRX2, SSTX2, CC2, GND}. Among the plurality of terminals, any one of the terminals SSTX1, SSRX1, SSRX2, and SSTX2 represents two differential communication terminals for transmitting a differential pair, terminal VBUS represents a group of power terminals, and terminal GND represents a group of ground The terminals, and the terminals CC1 and CC2 are all configuration channel terminals, wherein the set of power terminals are coupled to each other, and the set of ground terminals are coupled to each other and connected to the ground of the fixture 110. For example, the plug 111 may be a USB Type-C plug. Since the USB C-type socket 52 and the plug 111 both look flat, the plug 111 has two sides, such as a first side (for example, the side where the terminal CC1 of the plug 111 is located) and a second side (Eg, the side where the terminal CC2 of the plug 111 is located), wherein the plurality of terminals are respectively located on the two sides. In addition, the fixture 110 further includes a switching circuit 112, a control circuit 114, an interface circuit 116, resistors Rp (1) and Rp (2), and a plurality of USB connectors such as a USB Type-B connection器 118-1 and 118-2. For example, the switching circuit 112 includes a first group of switches 112-1 and a second group of switches 112-2, wherein the first group of switches 112-1 includes switches SW1 and SW2, and the second group of switches The switch 112-2 includes switches SW3 and SW4. In this embodiment, the switches SW1, SW2, SW3, and SW4 may be transistors such as metal oxide semiconductor field effect transistors (referred to as "MOSFETs"), and the control circuit 114 may be A controller is such as a microcontroller. The interface circuit 116 may conform to any of various types of existing communication specifications, such as USB, RS-232, or I2C. In addition, the test system 100 may further include a personal computer (PC) 120. The personal computer 120 includes USB Type-A connectors 121-1 and 121-2, a processing circuit 122, and an interface. Circuit 126. The processing circuit 122 can control the operation of the test system 100. For example, the processing circuit 122 may include at least one processor of the personal computer 120 and related control circuits, and the at least one processor may execute code to control the operation of the test system 100. The interface circuit 126 may conform to any of various types of existing communication specifications, such as USB, RS-232, or I2C. For example, the interface circuits 116 and 126 can meet the same communication specifications.

According to this embodiment, the switching circuit 112 can be used to perform a switching operation to enable one of the first group of communication paths and one second group of communication paths in the fixture 110 in turn, wherein the first group of communication paths are coupled To one of the plurality of terminals, the first group of communication terminals {SSTX1, SSRX1}, and the second group of communication paths are coupled to one of the plurality of terminals, the second group of communication terminals {SSTX2, SSRX2}. For example, the first group of communication paths is coupled between the first group of communication terminals {SSTX1, SSRX1} and the terminal {SSTX, SSRX} of the USB Type B connector 118-1, and the second group of communication paths is coupled Connect between the second set of communication terminals {SSTX2, SSRX2} and the terminals {SSTX, SSRX} of the USB Type B connector 118-2. The USB B-type connectors 118-1 and 118-2 can couple the fixture 110 to the personal computer 120 through the cables 119-1 and 119-2, respectively. As shown in Figure 1, the terminals {GND, SSTX, SSRX, VBUS} of the USB B-type connector 118-1 can be coupled to the terminals {GND, SSTX, SSRX, VBUS}, and the terminals {GND, SSTX, SSRX, VBUS} of the USB B type connector 118-2 can be respectively coupled to the terminals {GND of the USB A type connector 121-2 through the cable 119-2 , SSTX, SSRX, VBUS}. In addition, the control circuit 114 can be used to control the switching operations of the switching circuit 112 to allow the processing circuit 122 to pass through the first set of communication paths (which are coupled to the cable 119-1 in this embodiment) to the electronic device 50 A first set of test operations is performed, and a second set of test operations is performed on the electronic device 50 through the second set of communication paths (which are coupled to the cable 119-2 in this embodiment). For example, the control circuit 116 may be coupled to the personal computer 120 through at least one interface (such as the interface circuits 116 and 126) to allow the processing circuit 122 to use the control circuit 114 to control the switching operations of the switching circuit 112.

As shown in Figure 1, the resistor Rp (1) is coupled between the switch SW1 and the configuration channel terminal CC1 of the plug 111, and the resistor Rp (2) is coupled between the switch SW3 and the configuration channel of the plug 111 Between the terminals CC2 and the set of power terminals VBUS of the plug 111 are respectively coupled to the switches SW2 and SW4. The first group of switches 112-1 is coupled to the power terminal VBUS of the USB B-type connector 118-1, and the second group of switches 112-2 is coupled to the power terminal VBUS of the USB B-type connector 118-2 . The control circuit 114 can control respective control terminals of the switches SW1, SW2, SW3, and SW4, such as the gates of the MOSFETs. Under the control of the control circuit 114, the first group of switches 112-1 can selectively supply power to at least one terminal on the first side among the plurality of terminals, such as the configuration channel terminal CC1 of the plug 111 and the one on the same side. Two power terminals VBUS. For example, when the control circuit 114 turns on the first group of switches 112-1, the first group of communication paths is enabled. In addition, under the control of the control circuit 114, the second group of switches 112-2 can selectively supply power to at least one terminal on the second side among the plurality of terminals, such as the configuration channel terminal CC2 of the plug 111 and the same Two power terminals VBUS on the side. For example, when the control circuit 114 turns on the second group of switches 112-2, the second group of communication paths is enabled. In addition, under the control of the control circuit 114, the first group of switches 112-1 and the second group of switches 112-2 will not be turned on at the same time.

FIG. 2 shows the implementation details of the related terminals of the architecture shown in FIG. 1 in an embodiment. The USB C-type plug 211 can be used as an example of the plug 111, and the USB C-type socket 252 can be used as the USB C-type socket 52. An example. USB Type-C Socket 252 can have pins {A1, A2, A3, A4, A5, A6, A7, A8, A9, A10, A11, A12} and {B1, B2, B3, B4, B5, B6 , B7, B8, B9, B10, B11, B12} are respectively located on the first side 252-1 and the second side 252-2 of the USB C-type socket 252. In order to facilitate understanding, the symbols in italics can represent the corresponding signal names in the USB Type-C Specification. For example: pins {A1, A2, A3, A4, A5, A6, A7, A8, A9, A10, A11, A12} can be assigned to the signals { GND, TX1 +, TX1-, V _BUS , CC1, D +, D-, SBU1, V _BUS , RX2-, RX2 +, GND }, and the pins {B1, B2, B3, B4, B5, B6, B7, B8, B9, B10, B11, B12} can be designated respectively Signal { GND, TX2 +, TX2-, V _BUS , CC2, D +, D-, SBU2, V _BUS , RX1-, RX1 +, GND }. According to this embodiment, the terminals of the socket 52 may be implemented as pins of a USB C-type socket 252. For example, among the terminals of the socket 52, the terminals SSTX1, SSRX1, SSRX2, and SSTX2 can be implemented as pins {A2, A3}, {B11, B10}, {A11, A10}, and {B2, B3}, respectively. The set of power terminals represented by VBUS can be implemented as pins {A4, A9, B4, B9}, and the set of ground terminals represented by terminal GND can be implemented as pins {A1, A12, B1, B12}, and The terminals CC1 and CC2 can be implemented as pins A5 and B5, respectively.

In addition, the USB Type C plug 211 has corresponding pins {A1, A2, A3, A4, A5, A6, A7, A8, A9, A10, A11, A12} and {B1, B2, B3, B4, B5, B8, B9, B10, B11, B12} are located on the first side 211-1 and the second side 211-2 of the USB C-type plug 211, respectively. The pins B6 and B7. According to this embodiment, the plurality of terminals of the plug 111 may be implemented as pins of a USB C-type plug 211. For example: among the plurality of terminals of the plug 111, the terminals SSTX1, SSRX1, SSRX2, and SSTX2 can be implemented as pins {A2, A3}, {B11, B10}, {A11, A10}, and {B2, B3}, The group of power terminals represented by terminal VBUS can be implemented as pins {A4, A9, B4, B9}, and the group of ground terminals represented by terminal GND can be implemented as pins {A1, A12, B1, B12}, And the terminals CC1 and CC2 can be implemented as pins A5 and B5, respectively.

FIG. 3 is a flowchart of a method 300 for testing the electronic device 50 by using the fixture 110 according to an embodiment of the present invention. The method 300 is applicable to the processing circuit 122, the personal computer 120, and the test system 100.

In step 310, the processing circuit 122 may use the control circuit 114 to control (at least one of the switching operations) at least one switching operation so that the first set of communication paths in the fixture 110 can be enabled. According to this embodiment, the processing circuit 122 can use the control circuit 114 to control the switching circuit 112 so as to enable the first group of communication paths and disable the second group of communication paths. For example, the processing circuit 122 may use the control circuit 114 to control the first group of switches 112-1 to perform one of the switching operations of the first group of switching operations to enable the first group of communication paths. The control circuit 114 may turn on the switches SW1 and SW2, and the switches SW3 and SW4 are turned off, and the first set of switching operations may include turning on the operations of the switches SW1 and SW2. For example, before entering step 310, the processing circuit 122 may use the control circuit 114 to maintain the switching circuit 112 in an off state.

In step 320, the processing circuit 122 can perform the first set of test operations (eg, write and read operations) on the electronic device 50 through the first set of communication paths. For example, after completing the first set of test operations, the processing circuit 122 may use the control circuit 114 to turn off the switching circuit 112.

In step 325, based on the test results of the first set of test operations, the processing circuit 122 can determine whether the test was successful. When the processing circuit 122 determines that the test is successful, it proceeds to step 330; otherwise, it proceeds to step 329.

In step 329, the processing circuit 122 may output a warning message. For example: a warning message may indicate that the test failed. Then, the operator knows that the electronic device 50 needs to be repaired.

In step 330, the processing circuit 122 may use the control circuit 114 to control (at least one of the switching operations) at least one switching operation so that the second set of communication paths in the fixture 110 can be enabled. According to this embodiment, the processing circuit 122 can use the control circuit 114 to control the switching circuit 112 to enable the second group of communication paths and disable the first group of communication paths. For example, the processing circuit 122 may use the control circuit 114 to control the second group of switches 112-2 to perform one of the switching operations. The second group of switching operations is enabled to enable the second group of communication paths. The control circuit 114 may turn on the switches. SW3 and SW4, and the switches SW1 and SW2 are turned off, and the second set of switching operations may include turning on the switches SW3 and SW4. For example, after completing the first set of test operations and before entering step 330, the processing circuit 122 may use the control circuit 114 to maintain the switching circuit 112 in a closed state.

In step 340, the processing circuit 122 can perform the second set of test operations (eg, write and read operations) on the electronic device 50 through the second set of communication paths. For example, after completing the second set of test operations, the processing circuit 122 may use the control circuit 114 to turn off the switching circuit 112.

In step 345, based on the test results of the second set of test operations, the processing circuit 122 can determine whether the test was successful. When the processing circuit 122 determines that the test is successful, the workflow shown in FIG. 3 ends; otherwise, it proceeds to step 349.

In step 349, the processing circuit 122 may output a warning message. For example: a warning message may indicate that the test failed. Then, the operator knows that the electronic device 50 needs to be repaired.

Based on the method 300, the present invention can reduce the operator's actions during the entire test process, reduce the probability of plug damage, shorten the test time of each device under test, and improve test efficiency. This embodiment is similar to the previous embodiment / variation and will not be repeated.

According to some embodiments, the workflow shown in Figure 3 may be changed. For example: one or more steps can be added. Another example: one or more steps can be modified or deleted.

According to an embodiment, in step 345, when the processing circuit 122 determines that the test is successful, the processing circuit 122 may output a notification message, and then the workflow shown in FIG. 3 ends. For example: a notification message can indicate that the test was successful. The operator can then perform the same test on the next device under test, such as another electronic device of the same model.

FIG. 4 shows the implementation details of the related terminals of the architecture shown in FIG. 1 in another embodiment, in which a generic type serial bus C-type plug (USB Type-C-like plug, can be referred to as “USB Type C A plug ") 411 is an example of the plug 111. Compared with the USB Type C plug 211 shown in Figure 2, the USB Type C plug 411 has corresponding pins {A1, A2, A3, A4, A5, A6, A7, A8, A9, A10, A11, A12} and {B1, B2, B3, B4, B5, B6, B7, B8, B9, B10, B11, B12} are located on the first side 411-1 and the second side 411-1 of the USB-type C-type plug 411, respectively. 2. In the USB-like C-type plug 411, pins A6 and B6 are coupled to each other, and pins A7 and B7 are coupled to each other, so as to allow an operator to freely insert the USB-like C-type plug 411 into the USB C-type socket 52 regardless of The first side 411-1 or the second side 411-2 face up. Therefore, whether the first side 411-1 or the second side 411-2 is facing upward, the signals D + and D- can be transmitted between the fixture 110 and the electronic device 50. For example, at least one communication path in the first group of communication paths and the second group of communication paths may include communication paths corresponding to the signals D + and D- . Therefore, the processing circuit 122 may perform another set of test operations (eg, write and read operations) on the electronic device 50 through the first set of communication paths and / or the second set of communication paths. The above description is only a preferred embodiment of the present invention, and all equivalent changes and modifications made in accordance with the scope of patent application of the present invention shall fall within the scope of the present invention.

50‧‧‧ electronic device

52,252‧‧‧USB Type-C Socket

100‧‧‧test system

110‧‧‧Jig

111‧‧‧Plug

112‧‧‧switching circuit

112-1‧‧‧The first group of switches

112-2‧‧‧The second group of switches

114‧‧‧Control circuit

116,126‧‧‧Interface circuit

118-1,118-2‧‧‧USB Type B connector

119-1,119-2‧‧‧ Cable

120‧‧‧PC

121-1, 121-2‧‧‧USB Type A connector

122‧‧‧Processing Circuit

211‧‧‧USB Type-C Plug

211-1, 252-1, 411-1‧‧‧ first side

211-2,252-2,411-2‧‧‧Second side

300‧‧‧ Method

310‧‧‧ Steps to control switching operation to enable the first set of communication paths

320‧‧‧Steps for the first set of test operations through the first set of communication paths

325,345‧‧‧Steps to test success

329,349‧‧‧Steps to output warning message

330‧‧‧ Steps to control switching operation to enable the second set of communication paths

340‧‧‧Steps for the second set of test operations through the second set of communication paths

411‧‧‧ USB Type-C Plug

A1, A2, A3, A4, A5, A6, A7, A8, A9, A10, A11, A12, B1, B2, B3, B4, B5, B6, B7, B8, B9, B10, B11, B12‧‧‧‧ Pin

CC1, CC2, GND, SSRX, SSRX1, SSRX2, SSTX, SSTX1, SSTX2, VBUS‧‧‧ terminals

CC1, CC2, D +, D-, GND, RX1 +, RX1-, RX2 +, RX2-, SBU1, SBU2, TX1 +, TX1-, TX2 +, TX2-, V _BUS ‧‧‧Signal

Rp (1), Rp (2) ‧‧‧ Resistors

SW1, SW2, SW3, SW4

FIG. 1 is a schematic diagram of a test system and an electronic device according to an embodiment of the present invention, wherein the test system includes a test fixture. FIG. 2 shows the implementation details of the related terminals of the architecture shown in FIG. 1 in an embodiment. FIG. 3 is a flowchart of a method for testing the electronic device by using the fixture according to an embodiment of the present invention. FIG. 4 shows the implementation details of the related terminals of the architecture shown in FIG. 1 in another embodiment.

Claims (17)

A test fixture is applicable to an electronic device having a universal serial bus (USB) Type-C receptacle. The fixture includes: adaptable ( (adaptable) a plug of a C-type socket of the universal serial bus for coupling the electronic device, wherein the plug has a plurality of terminals respectively located on a first side and a second side of the plug; Switching circuit for switching operation to enable one of the first group of communication paths and one second group of communication paths in the fixture in turn, wherein the first group of communication paths are coupled to the plurality of terminals One of the first group of communication terminals, and the second group of communication paths are coupled to one of the plurality of terminals of the second group of communication terminals; a control circuit for controlling the switching operations of the switching circuit, Allow a processing circuit in a test system to perform a first set of test operations on the electronic device through the first set of communication paths and a second set of test operations to the electronic device through the second set of communication paths Wherein the test system includes the fixture. The fixture according to item 1 of the scope of patent application, wherein the test system includes a personal computer (PC), and the processing circuit includes at least one processor of the personal computer; and the fixture further includes: A first universal serial bus connector for coupling the fixture to the personal computer, wherein the first group of communication paths is coupled to the first group of communication terminals and the first universal serial bus connector Between the terminals; and a second universal serial bus connector for coupling the fixture to the personal computer, wherein the second set of communication paths are coupled to the second set of communication terminals and the second Between the terminals of the universal serial bus connector. The fixture according to item 2 of the scope of patent application, wherein the switching circuit comprises: a first group of switches, which are coupled to a power terminal of the first universal serial bus connector for selective Ground power to at least one terminal on the first side among the plurality of terminals, wherein the first group of communication paths is enabled when the control circuit turns on the first group of switches; and a second A group switch is coupled to a power terminal of the second universal serial bus connector and is used to selectively supply power to at least one terminal on the second side among the plurality of terminals, wherein when the control circuit turns on the In the second group of switches, the second group of communication paths is enabled; wherein under the control of the control circuit, the first group of switches and the second group of switches will not be turned on at the same time. The fixture according to item 3 of the scope of patent application, wherein the at least one terminal on the first side includes a first power terminal and a first Configuration Channel (CC) terminal; The at least one terminal includes a second power terminal and a second configuration channel terminal; and the jig further includes: a first resistor coupled to one of the switches in the first group and the first configuration Between the channel terminals; and a second resistor coupled between one of the switches in the second group of switches and the second configured channel terminal. The fixture according to item 3 of the scope of patent application, wherein one of the first group of switches is coupled to the power terminal and one of the plurality of terminals of the first universal serial bus connector. Between a group of power terminals, and the group of power terminals are coupled to each other; and one of the switches of the second group of switches is coupled to the power terminal and the group of power terminals of the second universal serial bus connector between. The fixture according to item 5 of the patent application scope, further comprising: a first resistor coupled to another switch in the first group of switches and a configuration channel on the first side (Configuration Channel (CC) terminals; and a second resistor coupled between another switch in the second group of switches and a configured channel terminal on the second side. The fixture according to item 2 of the scope of patent application, wherein the control circuit is coupled to the personal computer through at least one interface to allow the processing circuit to use the control circuit to control the switching operations of the switching circuit. A method for testing the electronic device by means of a fixture described in item 7 of the scope of patent application, wherein the method is applicable to the processing circuit, and the method includes the following steps: using the control circuit to control the switching operations At least one of the switching operations is enabled to enable the first set of communication paths in the fixture; the first set of test operations is performed on the electronic device through the first set of communication paths; and the switching circuits are used to control the switching operations At least one of the switching operations is enabled to enable the second set of communication paths in the jig; and the second set of test operations is performed on the electronic device through the second set of communication paths. The method according to item 8 of the scope of patent application, wherein: the step of using the control circuit to control the at least one switching operation of the switching operations of the switching circuit to enable the first set of communication paths in the jig is another Including: using the control circuit to control a first group of switches in the switching circuit to perform one of the first group of switching operations to enable the first group of communication paths, wherein the first group of switches The connector is coupled to a power terminal of the first universal serial bus connector to selectively supply power to at least one terminal on the first side among the plurality of terminals, wherein when the control circuit is turned on When the first group of switches is enabled, the first group of communication paths is enabled; and the control circuit is used to control the at least one switching operation of the switching operations of the switching circuit to enable the second group of the jig. The steps of the communication path further include: using the control circuit to control a second group of switches in the switching circuit to perform one of the second group of switching operations to enable the second group of switching operations A communication path, wherein the second group of switches is coupled to a power terminal of the second universal serial bus connector to selectively supply power to at least one terminal on the second side among the plurality of terminals, wherein When the control circuit turns on the second group of switches, the second group of communication paths is enabled. The method according to item 8 of the scope of patent application, wherein: the step of using the control circuit to control the at least one switching operation of the switching operations of the switching circuit to enable the first set of communication paths in the jig is another Including: using the control circuit to control the switching circuit so as to enable the first group of communication paths and disable the second group of communication paths; and using the control circuit to control the switching operation of the switching circuit. The step of at least one switching operation to enable the second group of communication paths in the jig further includes: using the control circuit to control the switching circuit to enable the second group of communication paths and disable the first group of communication paths. A test system can be applied to an electronic device having a Universal Serial Bus (USB) Type-C receptacle. The test system includes: a processing circuit for controlling the The operation of the test system; and a test fixture, the fixture includes: a plug adaptable to the universal serial bus C-type socket for coupling the electronic device, The plug has a plurality of terminals, which are respectively located on a first side and a second side of the plug; a switching circuit is used for switching operation to enable one of the first group of communications in the fixture in turn Path and a second group of communication paths, wherein the first group of communication paths is coupled to one of the plurality of terminals, and the second group of communication paths is coupled to one of the plurality of terminals. A second group of communication terminals; a control circuit for controlling the switching operations of the switching circuit to allow the processing circuit to perform a first group of tests on the electronic device through the first group of communication paths A trial operation is performed, and a second set of test operations is performed on the electronic device through the second set of communication paths. The test system according to item 11 of the scope of patent application, wherein the test system includes a personal computer (PC), and the processing circuit includes at least one processor of the personal computer; and the jig further includes: A first universal serial bus connector for coupling the fixture to the personal computer, wherein the first group of communication paths is coupled to the first group of communication terminals and the first universal serial bus connector Between the terminals; and a second universal serial bus connector for coupling the fixture to the personal computer, wherein the second set of communication paths are coupled to the second set of communication terminals and the second Between the terminals of the universal serial bus connector. The test system according to item 12 of the patent application scope, wherein the switching circuit includes: a first group of switches coupled to a power terminal of the first universal serial bus connector for selective Ground power to at least one terminal on the first side among the plurality of terminals, wherein the first group of communication paths is enabled when the control circuit turns on the first group of switches; and a second A group switch is coupled to a power terminal of the second universal serial bus connector and is used to selectively supply power to at least one terminal on the second side among the plurality of terminals, wherein when the control circuit turns on the In the second group of switches, the second group of communication paths is enabled; wherein under the control of the control circuit, the first group of switches and the second group of switches will not be turned on at the same time. The test system according to item 13 of the scope of patent application, wherein the at least one terminal on the first side includes a first power terminal and a first Configuration Channel (CC) terminal; The at least one terminal includes a second power terminal and a second configuration channel terminal; and the jig further includes: a first resistor coupled to one of the switches in the first group and the first configuration Between the channel terminals; and a second resistor coupled between one of the switches in the second group of switches and the second configured channel terminal. The test system according to item 13 of the patent application scope, wherein one of the first group of switches is coupled to the power terminal and one of the plurality of terminals of the first universal serial bus connector Between a group of power terminals, and the group of power terminals are coupled to each other; and one of the switches of the second group of switches is coupled to the power terminal and the group of power terminals of the second universal serial bus connector between. The testing system according to item 15 of the patent application scope, wherein the jig further comprises: a first resistor coupled to another switch in the first group of switches and configured on one of the first sides Between configuration channel (CC) terminals; and a second resistor coupled between another switch in the second group of switches and a configuration channel terminal on the second side. The testing system according to item 12 of the patent application scope, wherein the control circuit is coupled to the personal computer through at least one interface to allow the processing circuit to use the control circuit to control the switching operations of the switching circuit.