CN107943624A - Gauge and test system and the method tested by means of the gauge - Google Patents
Gauge and test system and the method tested by means of the gauge Download PDFInfo
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- CN107943624A CN107943624A CN201611197388.4A CN201611197388A CN107943624A CN 107943624 A CN107943624 A CN 107943624A CN 201611197388 A CN201611197388 A CN 201611197388A CN 107943624 A CN107943624 A CN 107943624A
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2273—Test methods
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- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
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- Theoretical Computer Science (AREA)
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Arrangements For Transmission Of Measured Signals (AREA)
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Abstract
The present invention provides a kind of gauge and test system and the method tested by means of the gauge.The gauge includes the plug that can adapt to Universal Serial Bus c-type socket and a switching circuit and a control circuit.The plug can be used to couple electronic device to be measured.The switching circuit can be utilized for switching running, with the first group of communication path and second group of communication path in the enable in turn gauge.First group of communication path system is coupled to first group of communication terminal of the plug, and second group of communication path system is coupled to second group of communication terminal of plug.The control circuit can be used to control those switching runnings, to allow a process circuit to carry out one first group of test running to the electronic device through first group of communication path and carry out one second group of test running to the electronic device through second group of communication path.
Description
Technical field
Present invention is directed to the test of electronic device, espespecially one kind can be applied to Universal Serial Bus c-type socket
The electronic device of (Universal Serial Bus (USB) Type-C receptacle, may be simply referred to as " USB c-types socket ")
Gauge (test fixture) and test system and the method tested by means of the gauge electronic device.
Background technology
During the test of dispatching from the factory of the electronic device with a USB c-type sockets, operating personnel need to be by cable
Plug (plug) is inserted into the USB c-type sockets, is tested with some terminals for the USB c-type sockets.In completion first
After secondary test, operating personnel need to extract the plug, then by the plug turn-over (such as from the plug it is a certain it is lateral on shape
State make this into laterally under state) and the plug is inserted into the USB c-type sockets again, with for the USB c-type sockets
Some terminals are tested.After completing second to test, operating personnel need to extract the plug.In addition, it is directed to next quilt
Device (device under test, DUT) is surveyed such as with another electronic device of model, it is identical that operating personnel repeat those
Action.Test structure based on correlation technique, can produce some problems.Such as：Operating personnel need to be by the plug turn-over, this can
Operating personnel can be caused to forget test at present to which side or cause opposite side not to be tested.In another example：It is more for a long time
Secondary insertion may cause the Plug contact bad with extracting the plug, so that easily judging by accident.Therefore, it is necessary to a kind of novel
Framework and associated method, to reduce the probability of wrong (such as test leakage or erroneous judgement) generation and lift testing efficiency.
The content of the invention
It is an object of the present invention to provide a kind of gauge (test fixture) with test system and by means of this
The method that gauge tests an electronic device, to solve the above problems.
Another object of the present invention is to provide a kind of gauge and test system and one electronics is filled by means of the gauge
The method tested is put, with the machine for reducing cumbersome action of the operating personnel in whole test process, reducing connector damage
Rate and shorten the testing time of each tested device (device under test, DUT) and lift testing efficiency.
At least embodiment of the present invention provides a kind of gauge, and the wherein gauge can be applied to have a Universal Serial Bus
The one of c-type socket (Universal Serial Bus (USB) Type-C receptacle, may be simply referred to as " USB c-types socket ")
Electronic device.Such as：The gauge, which can include, can be adapted to (adaptable) in a plug (plug) for the USB c-type sockets, and separately
Include a switching circuit and a control circuit.The plug can be used to couple the electronic device, and wherein the plug has multiple terminals,
Respectively positioned at one first side of the plug and one second side.In addition, the switching circuit can be utilized for switching running, to cause in turn
One first group of communication path and one second group of communication path in energy (enable) gauge, wherein first group of communication path system
One first group of communication terminal being coupled in the plurality of terminal, and second group of communication path system is coupled in the plurality of terminal
One second group of communication terminal.In addition, the control circuit can be used to control those switching runnings of the switching circuit, to allow a survey
A process circuit in test system carries out the electronic device through first group of communication path one first group of test running and thoroughly
Cross second group of communication path and one second group of test running is carried out to the electronic device, wherein the test system includes the gauge.
According to some embodiments, which can include a personal computer (personal computer, PC), and the processing
Circuit can include an at least processor for the personal computer.In addition, the gauge can additionally comprise：One first Universal Serial Bus connects
Device and one second universal serial bus connector are connect, is respectively intended to the gauge being coupled to the personal computer；Wherein this first
Group communication path system is coupled between first group of communication terminal and the terminal of first universal serial bus connector, and should
Second group of communication path system is coupled between second group of communication terminal and the terminal of second universal serial bus connector.
The present invention while above-mentioned gauge is provided, also accordingly provide one kind by means of the gauge to the electronic device into
The method of row test, wherein this method can be applied to the process circuit.Such as：The control circuit can pass through the coupling of an at least interface
To the personal computer, to allow the process circuit to control those switchings of the switching circuit to operate using the control circuit.Should
Method can comprise the steps of：At least one switching running in those switching runnings is controlled using the control circuit, should with enable
First group of communication path in gauge；First group of test fortune is carried out to the electronic device through first group of communication path
Make；At least one switching running in those switching runnings is controlled using the control circuit, with this second group in the enable gauge
Communication path；And second group of test running is carried out to the electronic device through second group of communication path.
The present invention also accordingly provides a kind of test system, wherein the test system can while above-mentioned gauge is provided
Applied to the electronic device with a USB c-type sockets.Such as：The test system can include a process circuit and a gauge,
The wherein process circuit can be used to control the running of the test system, and the gauge includes can adapt to the USB c-type sockets
One plug, and additionally comprise a switching circuit and a control circuit.The plug can be used to couple the electronic device, and wherein the plug has
There are multiple terminals, respectively positioned at one first side of the plug and one second side.In addition, the switching circuit can be utilized for switching fortune
Make, with the one first group of communication path and one second group of communication path in the enable in turn gauge, wherein first group of communication lines
Footpath system is coupled to one first group of communication terminal in the plurality of terminal, and second group of communication path system is coupled to the plurality of terminal
In one second group of communication terminal.In addition, the control circuit can be used to control those switching runnings of the switching circuit, to allow
The process circuit carries out the electronic device through first group of communication path one first group of test running and through this second group
Communication path carries out the electronic device one second group of test running.
The present invention has multiple benefits；Such as：Compared to correlation technique, gauge of the invention, test System and method for can subtract
Cumbersome action of few operating personnel in whole test process, reduce the probability of plug damage and shorten each tested device
Testing time and lift testing efficiency.
Brief description of the drawings
Fig. 1 is the schematic diagram of a kind of test system and the electronic device according to one embodiment of the invention, the wherein test
System includes a gauge (test fixture).
Fig. 2 illustrates implementation detail of the associated terminal of framework shown in Fig. 1 in an embodiment.
Fig. 3 is a kind of method tested by means of the gauge the electronic device according to one embodiment of the invention
Flow chart.
Fig. 4 illustrates implementation detail of the associated terminal of framework shown in Fig. 1 in another embodiment.
Symbol description
50 electronic devices
52,252 USB c-type sockets
100 test systems
110 gauges
111 plugs
112 switching circuits
First group of switch of 112-1
Second group of switch of 112-2
114 control circuits
116,126 interface circuits
118-1,118-2 USB Type B connectors
119-1,119-2 cables
120 personal computers
121-1,121-2 USB A type connectors
122 process circuits
211 USB c-type plugs
The first sides of 211-1,252-1,411-1
The second sides of 211-2,252-2,411-2
300 methods
The step of 310 control switching runnings are with first group of communication path of enable
320 carry out the step of first group of test operates through first group of communication path
325,345 the step of whether being successfully tested
The step of 329,349 output alert message
The step of 330 control switching runnings are with second group of communication path of enable
340 carry out the step of second group of test operates through second group of communication path
411 class USB c-type plugs
A1,A2,A3,A4,A5,A6,
A7,A8,A9,A10,A11,A12,
B1,B2,B3,B4,B5,B6,
B7, B8, B9, B10, B11, B12 pin
CC1,CC2,GND,
SSRX,SSRX1,SSRX2,
SSTX, SSTX1, SSTX2, VBUS terminal
CC1,CC2,D+,D-,GND,
RX1+,RX1-,RX2+,RX2-,
SBU1,SBU2,
TX1+, TX1-, TX2+, TX2-, VBUS signal
Rp (1), Rp (2) resistor
SW1, SW2, SW3, SW4 switch
Embodiment
The present invention provides a kind of gauge (test fixture) with testing system and one electronics being filled by means of the gauge
The method tested is put, wherein the electronic device has a Universal Serial Bus c-type socket (Universal Serial Bus
(USB) Type-C receptacle, may be simply referred to as " USB c-types socket "), and can be according to Universal Serial Bus (referred to as
" USB ") specification carries out communication operations.The gauge can be applied to the electronic device with the test system, to reduce operating personnel
The probability and each tested device (the device under of shortening of action, reduction plug damage in whole test process
Test, DUT) testing time and lift testing efficiency.
Fig. 1 is a kind of schematic diagram of 100 and one electronic device 50 of test system according to one embodiment of the invention, wherein controlling
Tool 110, test system 100 can be respectively as the foregoing gauge, the test system and the electronic devices with electronic device 50
Example.Since test system 100 can test electronic device 50 by means of gauge 110, therefore electronic device 50 can be considered one
Tested device.Electronic device 50 has USB c-types socket 52, and USB c-types socket 52 includes multiple terminals, such as terminal
{GND,CC1,SSTX1,SSRX1,VBUS,SSRX2,SSTX2,CC2,GND}.In USB c-types socket 52, terminal SSTX1,
It is differential that any one of SSRX1, SSRX2 and SSTX2 represent be used for transmitting a differential pair (differential pair) two
Communication terminal, terminal VBUS represent one group of power supply (power) terminal, and terminal GND represents one group of ground connection (ground) terminal, and holds
Sub- CC1 and CC2 is collocation channel (Configuration Channel, CC) terminal.Such as：Electronic device 50 can be external
Any one of Winchester disk drive, external hard disk cage or various types of electronic device.
As shown in Figure 1, gauge 110, which includes, can be adapted to (adaptable) in a plug (plug) for USB c-types socket 52
111.Plug 111 can be used to couple the electronic device 50, and plug 111 has multiple terminals.When plug 111 is inserted into USB C
During type socket 52, the terminal { GND, CC1, SSTX1, SSRX1, VBUS, SSRX2, SSTX2, CC2, GND } in the plurality of terminal can
It is respectively coupled to the terminal { GND, CC1, SSTX1, SSRX1, VBUS, SSRX2, SSTX2, CC2, GND } of USB c-types socket 52.
In the plurality of terminal, any one of terminal SSTX1, SSRX1, SSRX2 and SSTX2, which are represented, to be used for transmitting the two of a differential pair
A Differential Communication terminal, terminal VBUS represent one group of power supply terminal, and terminal GND represents one group of ground terminal, and terminal CC1 with
CC2 is collocation channel terminal, and wherein this group of power end subsystem is coupled to each other, and this group of ground terminal subsystem be coupled to each other and
It is connected with the ground connection of gauge 110.Such as：Plug 111 can be USB c-types plug (USB Type-C plug).Due to USB c-types
Both socket 52 and plug 111 seem all to be planar as, therefore plug 111 has both sides (side), such as one first side (such as
Side where the terminal CC1 of plug 111) and one second side (such as side where the terminal CC2 of plug 111), wherein should
Multiple terminals are located at this both sides respectively.In addition, gauge 110 additionally comprises a switching circuit 112, a control circuit 114, interface electricity
Road 116, resistor Rp (1) and Rp (2) and multiple USB connectors such as USB Type Bs (Type-B) connector 118-1 with
118-2.Such as：Switching circuit 112 includes one first group of switch (switch) 112-1 and one second group of switch 112-2, its
In first group of switch 112-1 include switch SW1 and SW2, and second group of switch 112-2 includes switch SW3 and SW4.
In this present embodiment, switch SW1, SW2, SW3 and SW4 can be transistor such as metal oxide semiconductcor field effect transistor
(Metal Oxide Semiconductor Field Effect Transistor, may be simply referred to as " MOSFET "), and control electricity
Road 114 can be an a controller such as microcontroller.Interface circuit 116 may conform in various types of existing telecommunications metrics
Any one, such as USB, RS-232 or I2C.In addition, test system 100 can additionally comprise a personal computer (personal
Computer, PC) 120, wherein personal computer 120 includes USB A types (Type-A) connector 121-1 and 121-2, a processing
122 and one interface circuit 126 of circuit.The running of 122 controllable testing system 100 of process circuit.Such as：Process circuit 122 can
At least a processor and relevant control circuit comprising personal computer 120, and an above-mentioned at least processor can perform journey
Sequence code is to control the running of test system 100.Interface circuit 126 may conform to appointing in various types of existing telecommunications metrics
One, such as USB, RS-232 or I2C.Such as：Interface circuit 116 and 126 may conform to identical telecommunications metrics.
According to the present embodiment, switching circuit 112 can be utilized for switching running, with enable in turn (enable) gauge 110
In one first group of communication path and one second group of communication path, wherein first group of communication path system be coupled to the plurality of terminal
In one first group of communication terminal { SSTX1, SSRX1 }, and second group of communication path system be coupled in the plurality of terminal one
Second group of communication terminal { SSTX2, SSRX2 }.Such as：First group of communication path system is coupled to first group of communication terminal
Between the terminal { SSTX, SSRX } of { SSTX1, SSRX1 } and USB Type B connectors 118-1, and second group of communication path system
It is coupled between the terminal { SSTX, SSRX } of second group of communication terminal { SSTX2, SSRX2 } and USB Type B connectors 118-2.
Gauge 110 can be coupled to individual calculus by USB Type B connector 118-1 and 118-2 through cable 119-1 and 119-2 respectively
Machine 120.As shown in Figure 1, the terminal { GND, SSTX, SSRX, VBUS } of USB Type B connectors 118-1 can pass through cable 119-1
It is respectively coupled to the terminal { GND, SSTX, SSRX, VBUS } of USB A type connectors 121-1, and USB Type B connectors 118-2
Terminal { GND, SSTX, SSRX, VBUS } can pass through the terminal that cable 119-2 is respectively coupled to USB A type connectors 121-2
{GND,SSTX,SSRX,VBUS}.In addition, control circuit 114 can be used to control those switching runnings of switching circuit 112, to hold
Perhaps process circuit 122 fills electronics through first group of communication path (it is to be coupled to cable 119-1 in this present embodiment)
Put 50 carry out, one first group of test running and (it is to be coupled to cable in this present embodiment through second group of communication path
One second group of test running 119-2) is carried out to electronic device 50.Such as：Control circuit 116 can pass through an at least interface (such as
Interface circuit 116 and personal computer 120 126) is coupled to, to allow process circuit 122 using the control switching of control circuit 114
Those switching runnings of circuit 112.
As shown in Figure 1, resistor Rp (1) system is coupled between switch SW1 and the collocation channel terminal CC1 of plug 111,
Resistor Rp (2) system is coupled between switch SW3 and the collocation channel terminal CC2 of plug 111, and the group electricity of plug 111
Source terminal VBUS systems are respectively coupled to switch SW2 and SW4.First group of switch 112-1 system is coupled to USB Type B connectors
The power supply terminal VBUS of 118-1, and second group of switch 112-2 system is coupled to the power supply terminal of USB Type B connectors 118-2
VBUS.Control circuit 114 can control the respective control terminal of switch SW1, SW2, SW3 and SW4, such as those MOSFET respectively
Grid (Gate).Under the control of control circuit 114, first group of switch 112-1, which optionally powers, gives the plurality of end
Two among son positioned at an at least terminal for first side, the collocation channel terminal CC1 of such as plug 111 and positioned at the same side
Power supply terminal VBUS.Such as：When control circuit 114 opens (turn on) first group of switch 112-1, first group of communication
Path is enabled.In addition, under the control of control circuit 114, second group of switch 112-2 optionally power give it is the plurality of
It is located at an at least terminal for second side among terminal, the collocation channel terminal CC2 of such as plug 111 is with being located at the two of the same side
A power supply terminal VBUS.Such as：When control circuit 114 opens second group of switch 112-2, which is caused
Energy.In addition, under the control of control circuit 114, first group of switch 112-1 and second group of switch 112-2 will not quilts at the same time
Open.
Fig. 2 illustrates implementation detail of the associated terminal of framework shown in Fig. 1 in an embodiment, wherein USB c-types plug 211
Can be as an example of plug 111, and USB c-types socket 252 can be as an example of USB c-types socket 52.USB c-types socket 252
Can have pin (pin) { A1, A2, A3, A4, A5, A6, A7, A8, A9, A10, A11, A12 } with B1, B2, B3, B4, B5, B6,
B7, B8, B9, B10, B11, B12 }, respectively positioned at the first side 252-1 and the second side 252-2 of USB c-types socket 252.In order to just
In understanding, the symbol of italics can represent corresponding signal in USB c-types specification (USB Type-C Specification)
Title (signal name).Such as：Pin { A1, A2, A3, A4, A5, A6, A7, A8, A9, A10, A11, A12 } can respectively specify that
(assign) signal { GND, TX1+, TX1-, V are givenBUS,CC1,D+,D-,SBU1,VBUS, RX2-, RX2+, GND }, and pin B1,
B2, B3, B4, B5, B6, B7, B8, B9, B10, B11, B12 } it can respectively specify that and give signal { GND, TX2+, TX2-, VBUS,CC2,D
+,D-,SBU2,VBUS,RX1-,RX1+,GND}.According to the present embodiment, those terminals of socket 52 can be embodied as USB c-type sockets
252 pin.Such as：In those terminals of socket 52, terminal SSTX1, SSRX1, SSRX2 and SSTX2 can be embodied as respectively
Pin { A2, A3 }, { B11, B10 }, { A11, A10 } and { B2, B3 }, this group of power supply terminal representated by terminal VBUS can be real respectively
Apply as pin { A4, A9, B4, B9 }, this group of ground terminal representated by terminal GND can be embodied as respectively pin A1, A12, B1,
B12 }, and terminal CC1 and CC2 can be embodied as pin A5 and B5 respectively.
In addition, USB c-types plug 211 have corresponding pin A1, A2, A3, A4, A5, A6, A7, A8, A9, A10,
A11, A12 } and { B1, B2, B3, B4, B5, B8, B9, B10, B11, B12 }, respectively positioned at the first side of USB c-types plug 211
Pin B6 and B7 are not present in the USB c-types plug 211 of 211-1 and the second side 211-2, wherein the present embodiment.According to this implementation
Example, the plurality of terminal of plug 111 can be embodied as the pin of USB c-types plug 211.Such as：In the plurality of terminal of plug 111
In, terminal SSTX1, SSRX1, SSRX2 and SSTX2 can be embodied as respectively pin { A2, A3 }, { B11, B10 }, { A11, A10 } with
{ B2, B3 }, this group of power supply terminal representated by terminal VBUS can be embodied as pin { A4, A9, B4, B9 }, terminal GND institute's generations respectively
This group of ground terminal of table can be embodied as pin { A1, A12, B1, B12 } respectively, and terminal CC1 and CC2 can be embodied as drawing respectively
Foot A5 and B5.
Fig. 3 is a kind of method tested by means of gauge 110 electronic device 50 according to one embodiment of the invention
300 flow chart, wherein method 300 can be applied to process circuit 122, personal computer 120 and test system 100.
In step 310, process circuit 122 can control (in those switching runnings) at least one using control circuit 114
Switching running, with first group of communication path in enable gauge 110.According to the present embodiment, process circuit 122 can utilize control
Circuit 114 controls switching circuit 112, with enable first group of communication path and forbidden energy (disable) second group of communication lines
Footpath.Such as：Process circuit 122 can control first group of switch 112-1 to carry out in those switching runnings using control circuit 114
One first group of switching running, with enable first group of communication path, wherein control circuit 114 can open switch SW1 and SW2,
And (turn off) switch SW3 and SW4 is closed, and first group of switching running can include the fortune for opening switch SW1 and SW2
Make.Such as：Before entering step 310, process circuit 122 can utilize control circuit 114 to maintain switching circuit 112 to be in and close
State.
In step 320, process circuit 122 can pass through first group of communication path and this first group carried out to electronic device 50
Test running (such as：Write-in is operated with reading).Such as：After first group of test running is completed, process circuit 122 can profit
Switching circuit 112 is closed with control circuit 114.
In step 325, according to the test result of first group of test running, process circuit 122 can determine whether to test
Success.When process circuit 122 judge be successfully tested, then enter step 330；Otherwise, 329 are entered step.
In step 329,122 exportable alert message of process circuit.Such as：Alert message may indicate that test crash.In
It is that operating personnel learn that electronic device 50 needs to repair.
In step 330, process circuit 122 can control (in those switching runnings) at least one using control circuit 114
Switching running, with second group of communication path in enable gauge 110.According to the present embodiment, process circuit 122 can utilize control
Circuit 114 controls switching circuit 112, with enable second group of communication path and forbidden energy first group of communication path.Such as：Place
One second group that circuit 122 can control second group of switch 112-2 carry out in those switching runnings using control circuit 114 is managed to cut
Running is changed, with enable second group of communication path, wherein control circuit 114 can open switch SW3 and SW4 and close and switch
Device SW1 and SW2, and second group of switching running can include the running for opening switch SW3 and SW4.Such as：In complete this first
Group test running after, enter step 330 before, process circuit 122 can utilize control circuit 114 maintain switching circuit 112 at
In closed mode.
In step 340, process circuit 122 can pass through second group of communication path and this second group carried out to electronic device 50
Test running (such as：Write-in is operated with reading).Such as：After second group of test running is completed, process circuit 122 can profit
Switching circuit 112 is closed with control circuit 114.
In step 345, according to the test result of second group of test running, process circuit 122 can determine whether to test
Success.When process circuit 122 judges to be successfully tested, then the workflow shown in Fig. 3 terminates；Otherwise, 349 are entered step.
In step 349,122 exportable alert message of process circuit.Such as：Alert message may indicate that test crash.In
It is that operating personnel learn that electronic device 50 needs to repair.
Based on method 300, the present invention can reduce action of the operating personnel in whole test process, reduce plug damage
Probability and shorten the testing time of each tested device and lift testing efficiency.The present embodiment and previous embodiment/change case
It is no longer repeated for similar part.
According to some embodiments, the workflow shown in Fig. 3 can be changed.Such as：One or more steps can add.Again
Such as：One or more steps can be changed or deleted.
According to an embodiment, in step 345, when process circuit 122 judges to be successfully tested, process circuit 122 is exportable
Notification message, then the workflow shown in Fig. 3 terminate.Such as：Notification message, which may indicate that, to be successfully tested.Afterwards, operating personnel
Test that can be identical to next tested device (such as with another electronic device of model) progress.
Fig. 4 illustrates implementation detail of the associated terminal of framework shown in Fig. 1 in another embodiment, and wherein class general serial is total
Line c-type plug (USB Type-C-like plug, may be simply referred to as " class USB c-types plug ") 411 can be as the one of plug 111
Example.Compared to the USB c-types plug 211 shown in Fig. 2, class USB c-types plug 411 have corresponding pin A1, A2, A3,
A4, A5, A6, A7, A8, A9, A10, A11, A12 } and { B1, B2, B3, B4, B5, B6, B7, B8, B9, B10, B11, B12 }, respectively
Positioned at the first side 411-1 and the second side 411-2 of class USB c-types plug 411.In class USB c-types plug 411, pin A6 with
B6 is coupled to each other and pin A7 and B7 is coupled to each other, to allow operating personnel that class USB c-types plug 411 optionally is inserted into USB
C-type socket 52, but regardless of the first side 411-1 or the second side 411-2 upward.Then, no matter the first side 411-1 or the second side 411-
2 upward, and signal D+ and D- can be transmitted between gauge 110 and electronic device 50.Such as：First group of communication path with this second
At least one set of communication path in group communication path can include the communication path corresponding to signal D+ and D-.Then, process circuit
122 can pass through first group of communication path and/or second group of communication path, and another group of test running is carried out to electronic device 50
(such as：Write-in is operated with reading).
The foregoing is merely presently preferred embodiments of the present invention, all equivalent changes done according to scope of the present invention patent with
Modification, should all belong to the covering scope of the present invention.
Claims (17)
1. a kind of gauge, which can be applied to the electronic device with a Universal Serial Bus c-type socket, which includes
Have：
A plug of the Universal Serial Bus c-type socket can be adapted to, for coupling the electronic device, wherein the plug has more
A terminal, respectively positioned at one first side of the plug and one second side；
One switching circuit, for switching over running, with one first group of communication path and one second in the enable in turn gauge
Group communication path, wherein first group of communication path system are coupled to one first group of communication terminal in the plurality of terminal, and this
Two groups of communication path systems are coupled to one second group of communication terminal in the plurality of terminal；
One control circuit, for controlling those switching runnings of the switching circuit, to allow one in a test system to handle electricity
Reuter crosses first group of communication path and one first group of test running is carried out to the electronic device and passes through second group of communication path
One second group of test running is carried out to the electronic device, wherein the test system includes the gauge.
2. gauge as claimed in claim 1, it is characterised in that the test system includes a personal computer, and the processing
Circuit includes an at least processor for the personal computer；And the gauge additionally comprises：
One first universal serial bus connector, for the gauge is coupled to the personal computer, wherein first group of communication
Path system is coupled between first group of communication terminal and the terminal of first universal serial bus connector；And
One second universal serial bus connector, for the gauge is coupled to the personal computer, wherein second group of communication
Path system is coupled between second group of communication terminal and the terminal of second universal serial bus connector.
3. gauge as claimed in claim 2, it is characterised in that the switching circuit includes：
One first group of switch, is coupled to a power supply terminal of first universal serial bus connector, for optionally supplying
Electricity gives at least terminal for being located at first side among the plurality of terminal, wherein when the control circuit opens first group of switch
When, which is enabled；And
One second group of switch, is coupled to a power supply terminal of second universal serial bus connector, for optionally supplying
Electricity gives at least terminal for being located at second side among the plurality of terminal, wherein when the control circuit opens second group of switch
When, which is enabled；
Wherein under the control of the control circuit, second group of switch of first group of switch and this will not be opened at the same time.
4. gauge as claimed in claim 3, it is characterised in that at least one end attached bag positioned at first side is containing one first electricity
Source terminal and one first collocation channel terminal；At least one end attached bag positioned at second side is containing a second source terminal and one the
Two collocation channel terminals；And the gauge additionally comprises：
One first resistor device, between the switch being coupled in first group of switch and the first collocation channel terminal；With
And
One second resistance device, between the switch being coupled in second group of switch and the second collocation channel terminal.
5. gauge as claimed in claim 3, it is characterised in that the switch system in first group of switch be coupled to this
Between one group of power supply terminal in the power supply terminal and the plurality of terminal of one universal serial bus connector, and this group of power end
Subsystem is coupled to each other；And the switch system in second group of switch is coupled to second universal serial bus connector
Between the power supply terminal and this group of power supply terminal.
6. gauge as claimed in claim 5, it is characterised in that it is additionally comprised：
One first resistor device, another switch and the collocation channel positioned at first side being coupled in first group of switch
Between terminal；And
One second resistance device, another switch and the collocation channel positioned at second side being coupled in second group of switch
Between terminal.
7. gauge as claimed in claim 2, it is characterised in that the control circuit system is coupled to the individual through an at least interface
Computer, to allow the process circuit to control those switchings of the switching circuit to operate using the control circuit.
8. a kind of method that gauge by means of described in claim 7 tests the electronic device, wherein this method can answer
Include the following steps for the process circuit, and this method：
At least one switching running in those switching runnings is controlled using the control circuit, with this first group in the enable gauge
Communication path；
First group of test running is carried out to the electronic device through first group of communication path；
At least one switching running in those switching runnings is controlled using the control circuit, with this second group in the enable gauge
Communication path；And
Second group of test running is carried out to the electronic device through second group of communication path.
9. method as claimed in claim 8, it is characterised in that：
Controlling at least one switching in those switching runnings of the switching circuit to operate using the control circuit, this is controlled with enable
The step of first group of communication path in tool, additionally comprises：
One first group of switch in the switching circuit is controlled to carry out one first in those switching runnings using the control circuit
Group switching running, with enable first group of communication path, it is total to be coupled to first general serial for wherein first group of switch system
One power supply terminal of wiring connector, at least terminal for being located at first side among the plurality of terminal is given optionally to power,
Wherein when the control circuit opens first group of switch, which is enabled；And
Controlling at least one switching in those switching runnings of the switching circuit to operate using the control circuit, this is controlled with enable
The step of second group of communication path in tool, additionally comprises：
One second group of switch in the switching circuit is controlled to carry out one second in those switching runnings using the control circuit
Group switching running, with enable second group of communication path, it is total to be coupled to second general serial for wherein second group of switch system
One power supply terminal of wiring connector, at least terminal for being located at second side among the plurality of terminal is given optionally to power,
Wherein when the control circuit opens second group of switch, which is enabled.
10. method as claimed in claim 8, it is characterised in that：
Controlling at least one switching in those switching runnings of the switching circuit to operate using the control circuit, this is controlled with enable
The step of first group of communication path in tool, additionally comprises：
The switching circuit is controlled using the control circuit, with enable first group of communication path and forbidden energy second group of communication lines
Footpath；And
Controlling at least one switching in those switching runnings of the switching circuit to operate using the control circuit, this is controlled with enable
The step of second group of communication path in tool, additionally comprises：
The switching circuit is controlled using the control circuit, with enable second group of communication path and forbidden energy first group of communication lines
Footpath.
11. a kind of test system, which can be applied to the electronic device with a Universal Serial Bus c-type socket,
The test system includes：
One process circuit, for controlling the running of the test system；And
One gauge, the gauge include：
A plug of the Universal Serial Bus c-type socket can be adapted to, for coupling the electronic device, wherein the plug has more
A terminal, respectively positioned at one first side of the plug and one second side；
One switching circuit, for switching over running, with one first group of communication path and one second in the enable in turn gauge
Group communication path, wherein first group of communication path system are coupled to one first group of communication terminal in the plurality of terminal, and this
Two groups of communication path systems are coupled to one second group of communication terminal in the plurality of terminal；
One control circuit, for controlling those switching runnings of the switching circuit, to allow the process circuit to pass through this first group
Communication path the electronic device is carried out one first group of test running and through second group of communication path to the electronic device into
One second group of test running of row.
12. test system as claimed in claim 11, it is characterised in that the test system includes a personal computer, and
The process circuit includes an at least processor for the personal computer；And the gauge additionally comprises：
One first universal serial bus connector, for the gauge is coupled to the personal computer, wherein first group of communication
Path system is coupled between first group of communication terminal and the terminal of first universal serial bus connector；And
One second universal serial bus connector, for the gauge is coupled to the personal computer, wherein second group of communication
Path system is coupled between second group of communication terminal and the terminal of second universal serial bus connector.
13. test system as claimed in claim 12, it is characterised in that the switching circuit includes：
One first group of switch, is coupled to a power supply terminal of first universal serial bus connector, for optionally supplying
Electricity gives at least terminal for being located at first side among the plurality of terminal, wherein when the control circuit opens first group of switch
When, which is enabled；And
One second group of switch, is coupled to a power supply terminal of second universal serial bus connector, for optionally supplying
Electricity gives at least terminal for being located at second side among the plurality of terminal, wherein when the control circuit opens second group of switch
When, which is enabled；
Wherein under the control of the control circuit, second group of switch of first group of switch and this will not be opened at the same time.
14. test system as claimed in claim 13, it is characterised in that at least one end attached bag positioned at first side is containing one
First power supply terminal and one first collocation channel terminal；Positioned at this of second side, at least one end attached bag contains a second source terminal
With one second collocation channel terminal；And the gauge additionally comprises：
One first resistor device, between the switch being coupled in first group of switch and the first collocation channel terminal；With
And
One second resistance device, between the switch being coupled in second group of switch and the second collocation channel terminal.
15. test system as claimed in claim 13, it is characterised in that the switch system coupling in first group of switch
Between one group of power supply terminal in power supply terminal and the plurality of terminal of first universal serial bus connector, and the group
Power end subsystem is coupled to each other；And the switch system in second group of switch is coupled to second Universal Serial Bus company
Connect between the power supply terminal of device and this group of power supply terminal.
16. test system as claimed in claim 15, it is characterised in that the gauge additionally comprises：
One first resistor device, another switch and the collocation channel positioned at first side being coupled in first group of switch
Between terminal；And
One second resistance device, another switch and the collocation channel positioned at second side being coupled in second group of switch
Between terminal.
17. test system as claimed in claim 12, it is characterised in that the control circuit system is coupled to through an at least interface
The personal computer, to allow the process circuit to control those switchings of the switching circuit to operate using the control circuit.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201662408036P | 2016-10-13 | 2016-10-13 | |
| US62/408,036 | 2016-10-13 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN107943624A true CN107943624A (en) | 2018-04-20 |
Family
ID=61929008
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201611197388.4A Withdrawn CN107943624A (en) | 2016-10-13 | 2016-12-22 | Gauge and test system and the method tested by means of the gauge |
Country Status (2)
| Country | Link |
|---|---|
| CN (1) | CN107943624A (en) |
| TW (1) | TW201814544A (en) |
Cited By (1)
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| CN114528159A (en) * | 2020-11-18 | 2022-05-24 | 技嘉科技股份有限公司 | Connector testing method and connector testing jig |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI755164B (en) * | 2020-11-18 | 2022-02-11 | 技嘉科技股份有限公司 | Method for diagnosing electrical connector and connector diagnosing device |
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Also Published As
| Publication number | Publication date |
|---|---|
| TW201814544A (en) | 2018-04-16 |
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Application publication date: 20180420 |