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TW201413830A - Lift-off device and lift-off method - Google Patents

Lift-off device and lift-off method Download PDF

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Publication number
TW201413830A
TW201413830A TW102124896A TW102124896A TW201413830A TW 201413830 A TW201413830 A TW 201413830A TW 102124896 A TW102124896 A TW 102124896A TW 102124896 A TW102124896 A TW 102124896A TW 201413830 A TW201413830 A TW 201413830A
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substrate
mixed fluid
metal layer
resist layer
treatment liquid
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TW102124896A
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Chinese (zh)
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TWI534912B (en
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Tokuyasu Asaka
Junichi Itakura
Takatoshi Kinoshita
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Toho Kasei Co Ltd
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
    • H01L21/3105After-treatment
    • H01L21/311Etching the insulating layers by chemical or physical means
    • H01L21/31127Etching organic layers
    • H01L21/31133Etching organic layers by chemical means
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/6715Apparatus for applying a liquid, a resin, an ink or the like
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/027Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
    • H01L21/0271Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers
    • H01L21/0272Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers for lift-off processes

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  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
  • Photosensitive Polymer And Photoresist Processing (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)

Abstract

This lift-off apparatus is provided with: a stage, which holds a substrate, and which rotates the held substrate; a mixed fluid forming apparatus that has a gas flow channel, which has a pressurized gas flowing therein, a treatment liquid flow channel, which has a treatment liquid flowing therein, and a nozzle, which is communicated with each of the flow channels, and which jets a mixed fluid containing the treatment liquid brought into a droplet state, said treatment liquid having been formed by mixing the pressurized gas and the treatment liquid; and moving apparatus, which relatively moves the mixed fluid forming apparatus with respect to the stage. The substrate having on the surface thereof a patterned resist and a metal layer film-formed on the resist is held on the stage in a state wherein the substrate is rotated, and the mixed fluid is jetted from the nozzle to the surface of the substrate rotated on the stage, thereby peeling the resist and the metal layer, and forming a patterned metal layer on the surface of the substrate.

Description

剝離裝置及剝離方法 Peeling device and peeling method 發明領域 Field of invention

本發明係有關於藉從基板之表面去除抗蝕層而於基板之表面形成業經圖形化之金屬層的剝離裝置及其方法。 The present invention relates to a stripping apparatus and method for forming a patterned metal layer on a surface of a substrate by removing a resist layer from the surface of the substrate.

發明背景 Background of the invention

習知,在製造半導體之過程之剝離製程中,為於基板之表面形成以金屬層等形成之電路圖形而去除配置於基板上之抗蝕層的方法有使基板浸漬於藥液之方法(例如專利文獻1)。 Conventionally, in a stripping process in the process of manufacturing a semiconductor, a method of forming a circuit pattern formed of a metal layer or the like on a surface of a substrate to remove a resist layer disposed on the substrate is a method of immersing the substrate in a chemical solution (for example, Patent Document 1).

根據專利文獻1之方法,準備表面具有業經圖形化之抗蝕層及配置於抗蝕層上之金屬層的基板,使該基板浸漬於為藥液之丙酮。浸漬基板之丙酮藉由金屬層浸入至抗蝕層,使抗蝕層膨潤。藉以此膨潤效果將抗蝕層及金屬層從基板剝離,可於基板之表面形成業經圖形化之金屬層。 According to the method of Patent Document 1, a substrate having a patterned resist layer and a metal layer disposed on the resist layer is prepared, and the substrate is immersed in acetone which is a chemical liquid. The acetone impregnated into the substrate is immersed in the resist layer by the metal layer to swell the resist layer. By peeling off the resist layer and the metal layer from the substrate by this swelling effect, a patterned metal layer can be formed on the surface of the substrate.

在此種藥液浸漬式之抗蝕層去除方法中,從減少藥液之使用量之觀點,通常進行將複數基板聚集在1個藥液層來進行處理之所謂批次式處理。 In the method of removing the resist layer by the chemical liquid immersion type, a so-called batch type treatment in which a plurality of substrates are collected in one chemical liquid layer and processed is generally performed from the viewpoint of reducing the amount of the chemical liquid used.

先行技術文獻 Advanced technical literature 專利文獻 Patent literature

專利文獻1日本專利公開公報平5-136047號 Patent Document 1 Japanese Patent Laid-Open Publication No. Hei 5-136047

發明概要 Summary of invention

然而,在藥液浸漬式之抗蝕層去除方法中,亦有下述情形,前述情形係主要利用藥液引起之抗蝕層之膨潤效果,去除抗蝕層,並且採用批次式之處理方法而非將基板逐片處理之葉片式,抗蝕層之去除速度慢,去除所期量之抗蝕層耗費時間。 However, in the method of removing the resist layer by the chemical liquid immersion type, there are also cases in which the swelling effect of the resist layer caused by the chemical liquid is mainly used, the resist layer is removed, and the batch type processing method is employed. Instead of the blade type which processes the substrate piece by piece, the removal speed of the resist layer is slow, and it takes time to remove the expected amount of the resist layer.

另一方面,近來,基板之薄型化發展,而要求開發可於短時間處理此種薄基板之有效率之剝離裝置及其方法。 On the other hand, recently, the thinning of substrates has progressed, and it has been demanded to develop an efficient peeling apparatus and method thereof which can process such a thin substrate in a short time.

因而,本發明之目的在於解決上述問題,在於提供可進行有效率之抗蝕層之剝離之葉片式剝離裝置及剝離方法。 Accordingly, an object of the present invention is to solve the above problems, and to provide a vane peeling apparatus and a peeling method which can perform efficient peeling of a resist layer.

為達成上述目的,本發明如以下構成。 In order to achieve the above object, the present invention is constituted as follows.

根據本發明之第1態樣,提供一種剝離裝置,該剝離裝置包含有台、混合流體形成裝置及移動裝置,該台係保持基板,並且使所保持之基板旋轉;該混合流體形成裝置係具有供業經加壓之氣體通過之氣體流路、供處理液通過之處理液流路、連通於各個流路並且噴射藉混合業經加壓之氣體及處理液而形成之包含業經液滴化之處理液之 混合流體的噴嘴;該移動裝置係使混合流體形成裝置對台相對地移動;又,該剝離裝置係表面具有業經圖形化之抗蝕層及成膜於抗蝕層上之金屬層的基板在台上以旋轉之狀態保持,藉從噴嘴對在台上呈旋轉之狀態之基板的表面噴射混合流體,可將抗蝕層及金屬層剝離,而於基板之表面形成業經圖形化之金屬層。 According to a first aspect of the present invention, there is provided a peeling device comprising a stage, a mixed fluid forming device and a moving device, the stage holding a substrate and rotating the held substrate; the mixed fluid forming device having a gas flow path through which a pressurized gas passes, a process liquid flow path through which a treatment liquid passes, a flow path connected to each flow path, and a mixture of pressurized gas and a treatment liquid, which are formed by a liquidized solution It a nozzle for mixing fluid; the moving device moves the mixed fluid forming device relative to the table; and the peeling device has a substrate having a patterned resist layer and a metal layer formed on the resist layer on the surface The upper portion is held in a state of rotation, and the mixed fluid is ejected from the surface of the substrate which is rotated on the stage by the nozzle, whereby the resist layer and the metal layer are peeled off, and a patterned metal layer is formed on the surface of the substrate.

根據本發明之第2態樣,提供記載於第1態樣之剝離裝置,該剝離裝置係對基板之表面噴射混合流體,使混合流體撞擊基板上之金屬層,藉此,對金屬層造成損傷,而剝離抗蝕層及金屬層。 According to a second aspect of the present invention, there is provided a peeling apparatus according to the first aspect, wherein the peeling device sprays a mixed fluid on a surface of the substrate to cause the mixed fluid to strike a metal layer on the substrate, thereby causing damage to the metal layer. And peeling off the resist layer and the metal layer.

根據本發明之第3態樣,提供記載於第1態樣之剝離裝置,該剝離裝置係使用有機溶劑作為處理液。 According to a third aspect of the present invention, there is provided a peeling apparatus according to the first aspect, wherein the peeling apparatus uses an organic solvent as a treatment liquid.

根據本發明之第4態樣,提供記載於第1態樣至第3態樣之任一態樣之剝離裝置,該剝離裝置係葉片式。 According to a fourth aspect of the present invention, there is provided a peeling device according to any one of the first aspect to the third aspect, wherein the peeling device is a blade type.

根據本發明之第5態樣,提供一種剝離方法,該剝離方法包含有下述製程:(1)將表面具有業經圖形化之抗蝕層及成膜於抗蝕層上之金屬層的基板以使其旋轉之狀態保持;(2)藉將業經加壓之氣體與處理液混合,形成包含業經液滴化之處理液之混合流體;及(3)藉對呈旋轉之狀態之基板的表面噴射混合流體,剝離抗蝕層及金屬層,而於基板之表面形成業經圖形化之金屬層。 According to a fifth aspect of the present invention, there is provided a peeling method comprising the following processes: (1) a substrate having a patterned resist layer on a surface and a metal layer formed on the resist layer; (2) forming a mixed fluid containing the liquidized liquid by mixing the pressurized gas with the treatment liquid; and (3) spraying the surface of the substrate in a state of being rotated The fluid is mixed, the resist layer and the metal layer are stripped, and a patterned metal layer is formed on the surface of the substrate.

根據本發明之第6態樣,提供記載於第5態樣之剝離方法,該剝離方法係在形成金屬層之製程中,對基板之表面噴射混合流體,使混合流體撞擊基板上之金屬層,藉 此,對金屬層造成損傷,而剝離抗蝕層及金屬層。 According to a sixth aspect of the present invention, there is provided a peeling method according to the fifth aspect, wherein in the process of forming a metal layer, a mixed fluid is sprayed on a surface of the substrate to cause the mixed fluid to strike the metal layer on the substrate. borrow Thus, the metal layer is damaged, and the resist layer and the metal layer are peeled off.

根據本發明之第7態樣,提供記載於第5態樣之剝離方法,該剝離方法係使用有機溶劑作為處理液。 According to a seventh aspect of the present invention, there is provided a peeling method according to the fifth aspect, wherein the peeling method uses an organic solvent as a treatment liquid.

根據本發明之第8態樣,提供記載於第5態樣至第7態樣中任一態樣之剝離方法,該剝離方法係葉片式。 According to an eighth aspect of the present invention, there is provided a peeling method according to any one of the fifth aspect to the seventh aspect, wherein the peeling method is a blade type.

在葉片式之剝離裝置及剝離方法中,可有效率地進行抗蝕層之剝離。 In the blade type peeling device and the peeling method, peeling of the resist layer can be performed efficiently.

1‧‧‧剝離裝置 1‧‧‧ peeling device

2‧‧‧化學腔室 2‧‧‧Chemical chamber

3‧‧‧淋洗腔室 3‧‧‧Leaning chamber

4‧‧‧基板搬送裝置 4‧‧‧Substrate transport device

5‧‧‧基板 5‧‧‧Substrate

6‧‧‧握持臂 6‧‧‧Warm arm

7,8‧‧‧台 7,8‧‧

9,20‧‧‧台支撐裝置 9,20‧‧‧ support devices

10,21‧‧‧混合流體形成裝置 10,21‧‧‧ Mixed fluid forming device

11,22‧‧‧移動裝置 11,22‧‧‧Mobile devices

12,23‧‧‧第1流路 12,23‧‧‧1st flow path

13,24‧‧‧第2流路 13,24‧‧‧2nd flow path

14‧‧‧噴嘴 14‧‧‧Nozzles

15,26‧‧‧加壓氣體供給源 15,26‧‧‧Compressed gas supply

16‧‧‧處理液供給源 16‧‧‧Processing fluid supply source

17‧‧‧旋轉軸 17‧‧‧Rotary axis

18,28‧‧‧容器 18,28‧‧‧ Container

19,29‧‧‧配管 19,29‧‧‧Pipe

27‧‧‧純水供給源 27‧‧‧ pure water supply source

30‧‧‧旋轉軸 30‧‧‧Rotary axis

31‧‧‧抗蝕層 31‧‧‧Resist layer

32‧‧‧金屬層 32‧‧‧metal layer

33‧‧‧裂紋 33‧‧‧ crack

34‧‧‧電路圖形 34‧‧‧ circuit graphics

35‧‧‧毛邊 35‧‧‧Mamma

A‧‧‧匯合地點 A‧‧‧ Convergence location

B‧‧‧匯合處 B‧‧‧ Confluence

CL‧‧‧壓力上升 C L ‧‧‧ Pressure rises

P‧‧‧撞擊壓 P‧‧‧impact pressure

S1-S7‧‧‧步驟 S1-S7‧‧‧ steps

V0,VF‧‧‧速度 V 0 , V F ‧‧‧ speed

X,Y,Z‧‧‧方向 X, Y, Z‧‧ Direction

本發明之該等態樣及特徵可從與關於附加之圖式之較佳實施形態相關之下面的記述明瞭。 The above aspects and features of the present invention are set forth in the description which follows in conjunction with the preferred embodiments of the appended drawings.

圖1係本發明實施形態之剝離裝置之上視圖。 Fig. 1 is a top plan view of a peeling device according to an embodiment of the present invention.

圖2係圖1之剝離裝置具有之化學腔室內之截面圖。 Figure 2 is a cross-sectional view of the chemical chamber of the stripping device of Figure 1.

圖3係圖1之剝離裝置具有之淋洗腔室內之截面圖。 Figure 3 is a cross-sectional view of the rinsing chamber of the stripping device of Figure 1.

圖4係圖1之剝離裝置所作之剝離處理的流程圖。 Figure 4 is a flow chart showing the stripping process performed by the stripping device of Figure 1.

圖5(a)~圖5(e)係關於將抗蝕層及金屬層從基板剝離之原理之說明圖。 5(a) to 5(e) are explanatory views of the principle of peeling off the resist layer and the metal layer from the substrate.

圖6(a)~圖6(d)係關於混合流體對抗蝕層及金屬層之作用之說明圖。 6(a) to 6(d) are explanatory views of the action of the mixed fluid on the resist layer and the metal layer.

用以實施發明之形態 Form for implementing the invention

以下,依據圖式,詳細地說明本發明之實施形態。 Hereinafter, embodiments of the present invention will be described in detail based on the drawings.

圖1係本發明實施形態之剝離裝置1之上視圖。剝離裝置1包含有化學腔室2、淋洗腔室3及基板搬送裝置4。 Fig. 1 is a top view of a peeling device 1 according to an embodiment of the present invention. The peeling device 1 includes a chemical chamber 2, a rinse chamber 3, and a substrate transfer device 4.

在化學腔室2,對基板5之表面進行形成業經圖形化之金屬層之圖形化處理。在淋洗腔室3中,對在化學腔室2業經圖形化處理之基板進行去除殘留於基板5之表面之雜質的表面洗淨處理(所謂之淋洗處理)。基板搬送裝置4係從化學腔室2將基板5搬送至淋洗腔室3之裝置。基板搬送裝置4具有以前端部握持基板5之旋轉式握持臂6。握持臂6之前端構造成可在載置基板5之化學腔室2內之台7與淋洗腔室3內之台8之間的區間移動。此外,在圖1中,僅圖示說明所需之結構,關於其他之結構,權宜地省略。 In the chemical chamber 2, the surface of the substrate 5 is patterned to form a patterned metal layer. In the rinsing chamber 3, the substrate subjected to patterning in the chemical chamber 2 is subjected to a surface cleaning treatment (so-called rinsing treatment) for removing impurities remaining on the surface of the substrate 5. The substrate transfer device 4 is a device that transports the substrate 5 from the chemical chamber 2 to the rinsing chamber 3. The substrate transfer device 4 has a rotary grip arm 6 that grips the substrate 5 with a front end portion. The front end of the grip arm 6 is configured to be movable in a section between the stage 7 in the chemical chamber 2 on which the substrate 5 is placed and the stage 8 in the rinsing chamber 3. In addition, in FIG. 1, only the structure required is illustrated, and other structures are expediently omitted.

接著,就如上述構成之剝離裝置1之2個腔室、钥學腔室2及淋洗腔室3各自之內部結構作說明。 Next, the internal structure of each of the two chambers of the peeling device 1 configured as described above, the keying chamber 2, and the rinsing chamber 3 will be described.

圖2係化學腔室2內部之裝置結構之截面圖。於化學腔室2設台7、台支撐裝置9、混合流體形成裝置10、移動裝置11。 2 is a cross-sectional view showing the structure of the device inside the chemical chamber 2. A stage 7, a table support device 9, a mixed fluid forming device 10, and a moving device 11 are provided in the chemical chamber 2.

台7係將以圖中未示之搬送設備將基板5搬送至化學腔室2內之基板5載置於上面而保持的台。台支撐裝置9具有支撐台7並且以於鉛直方向延伸之旋轉軸17為中心使台7旋轉的功能。混合流體形成裝置10設於台7之上方並且藉混合對載置於台7之基板5之表面加壓的氣體(在本實施形態為N2)與處理液(在本實施形態為IPA(異丙醇)等有機溶劑)而形成包含業經液滴化之處理液之混合流體來噴射。移動裝置11係使混合流體形成裝置10移動之裝置。藉以移動裝置11將混合流體形成裝置10沿著沿基板5之表面之方向(在本實施形態為X方向)移動,可調整混合流體之噴射位 置。此外,本實施形態之業經液滴化之處理液之粒徑為例如2μm-20μm。 The stage 7 transports the substrate 5 to the stage on which the substrate 5 in the chemical chamber 2 is placed and held by a transfer device (not shown). The stage supporting device 9 has a function of supporting the table 7 and rotating the table 7 around the rotating shaft 17 extending in the vertical direction. The mixed fluid forming apparatus 10 is disposed above the stage 7 and mixes the gas (N 2 in the present embodiment) pressurized with the surface of the substrate 5 placed on the stage 7 with the treatment liquid (in the present embodiment, IPA (different) An organic solvent such as propanol) is formed by spraying a mixed fluid containing a liquidized solution. The mobile device 11 is a device that moves the mixed fluid forming device 10. The moving device 11 moves the mixed fluid forming device 10 along the direction along the surface of the substrate 5 (in the X direction in the present embodiment), so that the injection position of the mixed fluid can be adjusted. Further, the particle size of the liquidized liquid to be treated in the present embodiment is, for example, 2 μm to 20 μm.

化學腔室2內之混合流體形成裝置10具有供業經加壓之氣體通過之第1流路(氣體流路)12、供處理液通過之第2流路(處理液流路)13、連通於各流路12、13且藉混合業經加壓之氣體及處理液而形成包含業經液滴化之處理液之混合流體來噴射的噴嘴14。第1流路12連接於保有業經加壓之氣體之加壓氣體供給源15,可依需要,從加壓氣體供給源15供給業經加壓之氣體。在本實施形態中,將供給之加壓氣體之壓力設定為例如0.2MPa-0.5MPa。又,第2流路13亦同樣地連接於保有處理液之處理液供給源16,依需要,從處理液供給源16供給為處理液之有機溶劑。第1流路12之下游側端部與第2流路13之下游側端部在匯合地點A(噴嘴14之上游側端部)相交,混合流體在此匯合地點A形成。 The mixed fluid forming apparatus 10 in the chemical chamber 2 has a first flow path (gas flow path) 12 through which pressurized gas passes, a second flow path (process liquid flow path) through which the treatment liquid passes, and communication Each of the flow paths 12 and 13 is formed by mixing a pressurized gas and a treatment liquid to form a nozzle 14 that is sprayed with a mixed fluid of the liquidized liquid. The first flow path 12 is connected to a pressurized gas supply source 15 that holds a pressurized gas, and the pressurized gas can be supplied from the pressurized gas supply source 15 as needed. In the present embodiment, the pressure of the supplied pressurized gas is set to, for example, 0.2 MPa to 0.5 MPa. Further, the second flow path 13 is similarly connected to the processing liquid supply source 16 that holds the processing liquid, and if necessary, supplies the organic solvent as the processing liquid from the processing liquid supply source 16. The downstream end of the first flow path 12 and the downstream end of the second flow path 13 intersect at the meeting point A (the upstream end of the nozzle 14), and the mixed fluid is formed at the meeting point A.

又,在混合流體形成裝置10中,第1流路12及噴嘴14配置成於鉛直方向延伸。另一方面,第2流路13配置成於對第1流路12及噴嘴14之延伸方向垂直之水平方向延伸。根據此種結構,藉將供往鉛真方向下方之加壓氣體與在匯合地點A於水平方向供給之處理液混合,可形成包含業經液滴化之處理液之混合流體。在此,供至第1流路12之加壓氣體之鉛直方向速度設定成大幅大於供至第2流路13之處理液之水平方向速度。因而,混合有該等之混合流體亦以與供給加壓氣體之速度約略無異之快速的速度,從噴嘴14往鉛直方向下方噴射。 Further, in the mixed fluid forming apparatus 10, the first flow path 12 and the nozzle 14 are arranged to extend in the vertical direction. On the other hand, the second flow path 13 is disposed to extend in the horizontal direction perpendicular to the extending direction of the first flow path 12 and the nozzle 14. According to this configuration, by mixing the pressurized gas supplied to the lower side of the lead direction with the processing liquid supplied in the horizontal direction at the meeting point A, a mixed fluid containing the liquidized solution can be formed. Here, the vertical velocity of the pressurized gas supplied to the first flow path 12 is set to be substantially larger than the horizontal velocity of the processing liquid supplied to the second flow path 13. Therefore, the mixed fluid mixed with these is also ejected from the nozzle 14 in the vertical direction at a rapid speed which is approximately the same as the speed at which the pressurized gas is supplied.

又,混合流體形成裝置10之噴嘴14之位置以移動裝置11設定成從噴嘴14噴射之混合流體之噴射位置為從基板5之表面之旋轉軸17偏心之位置。 Further, the position of the nozzle 14 of the mixed fluid forming device 10 is set by the moving device 11 so that the injection position of the mixed fluid ejected from the nozzle 14 is eccentric from the rotation axis 17 of the surface of the substrate 5.

於化學腔室2內設配置成覆蓋基板5及台7之容器18、將設於容器18之底部之開口作為一端且另一端連接於處理液供給源16之配管19。容器18構造成防止從混合流體形成裝置10噴射且使用完畢之混合流體往化學腔室2之外部飛散,並且將集中之混合流體送往配管19。配管19回收以容器18集中之混合流體並且以圖中未示之過濾器裝置過濾處理液以外之成份(金屬等)之後,送至處理液供給源16。藉此,可再利用處理液,亦可再利用業經過濾之金屬。 A container 18 that covers the substrate 5 and the stage 7 is placed in the chemical chamber 2, and an opening provided at the bottom of the container 18 as one end and the other end is connected to the pipe 19 of the processing liquid supply source 16. The container 18 is configured to prevent the mixed fluid sprayed from the mixed fluid forming device 10 and to be scattered outside the chemical chamber 2, and to deliver the concentrated mixed fluid to the piping 19. The piping 19 collects the mixed fluid concentrated in the container 18 and filters the components (metal or the like) other than the processing liquid with a filter device not shown, and then sends it to the processing liquid supply source 16. Thereby, the treatment liquid can be reused, and the filtered metal can be reused.

圖3係淋洗腔室3內部之裝置結構之截面圖。如圖3所示,腔室3之內部結構與前述化學腔室2之內部結構大幅共通。具體言之,於淋洗腔室3設有台8、台支撐裝置20、混合流體形成裝置21、移動裝置22。該等台8、台支撐裝置20、混合流體形成裝置21及移動裝置22分別對應於化學腔室2內之台7、台支撐裝置9、混合流體形成裝置10及移動裝置11。由於該等結構及功能與前述相同,故省略詳細之說明,而在混合流體形成裝置21中,第1流路23與化學腔室2內之第1流路12同樣地連接於具有業經加壓之氣體(例如N2)之加壓氣體供給源26,相對於此,第2流路24與腔室2內之第2流路13不同,連接於具有純水之純水供給源27。即,形成加壓氣體與純水之混合流體作為在混合流體形成裝置21之匯合處B形成之混合流體。如此,在淋洗腔室3內之混合 流體形成裝置21與化學腔室2內之混合流體形成裝置10,噴射之混合流體之組成不同,而關於內部之流路及噴嘴之形狀則共通。 Figure 3 is a cross-sectional view showing the structure of the apparatus inside the rinsing chamber 3. As shown in FIG. 3, the internal structure of the chamber 3 is substantially in common with the internal structure of the aforementioned chemical chamber 2. Specifically, the stage 8 is provided in the rinsing chamber 3, the stage supporting device 20, the mixed fluid forming device 21, and the moving device 22. The table 8, the table supporting device 20, the mixed fluid forming device 21, and the moving device 22 correspond to the table 7, the table supporting device 9, the mixed fluid forming device 10, and the moving device 11, respectively, in the chemical chamber 2. Since the structures and functions are the same as those described above, the detailed description thereof will be omitted. In the mixed fluid forming device 21, the first flow path 23 is connected to the first flow path 12 in the chemical chamber 2 in the same manner. The pressurized gas supply source 26 of the gas (for example, N 2 ) is different from the second flow path 13 in the chamber 2, and is connected to the pure water supply source 27 having pure water. That is, a mixed fluid of pressurized gas and pure water is formed as a mixed fluid formed at the junction B of the mixed fluid forming device 21. Thus, the mixed fluid forming device 21 in the rinsing chamber 3 and the mixed fluid forming device 10 in the chemical chamber 2 have different compositions of the injected mixed fluid, and the shapes of the internal flow paths and the nozzles are common.

再者,於淋洗腔室3內設對應於化學腔室2之容器18之容器28、對應於化學腔室2之配管19之配管29。容器28由於與化學腔室2之容器18共通,故省略其說明,關於配管29,與化學腔室2之配管19不同,不與純水供給源27連接,僅將使用完畢之混合流體排放。此係因在淋洗腔室3使用之混合流體未含有處理液等應再利用之材料之故。 Further, a container 28 corresponding to the container 18 of the chemical chamber 2 and a pipe 29 corresponding to the pipe 19 of the chemical chamber 2 are provided in the elution chamber 3. Since the container 28 is common to the container 18 of the chemical chamber 2, the description thereof will be omitted. The pipe 29 is not connected to the pure water supply source 27 except for the pipe 19 of the chemical chamber 2, and only the used mixed fluid is discharged. This is because the mixed fluid used in the rinsing chamber 3 does not contain a material to be reused such as a treatment liquid.

關於包含有如上述構成之化學腔室2及淋洗腔室3之剝離裝置1所作之剝離處理的程序,使用圖4之流程圖來說明。 The procedure for the peeling treatment by the peeling device 1 including the chemical chamber 2 and the rinsing chamber 3 configured as described above will be described using a flowchart of FIG.

首先,使用圖中未示之搬送設備,將基板5搬入至化學腔室2內(步驟S1)。將所搬入之基板5如圖2所示載置、保持於化學腔室2內之台7上。 First, the substrate 5 is carried into the chemical chamber 2 by using a transfer device (not shown) (step S1). The substrate 5 loaded therein is placed and held on the stage 7 in the chemical chamber 2 as shown in Fig. 2 .

接著,使保持有基板5之台7旋轉(步驟S2)。具體言之,基板支撐裝置9以旋轉軸17為中心使台7旋轉。藉此,關於載置於台7上之基板5也以共通之旋轉軸17為中心而旋轉。 Next, the stage 7 holding the substrate 5 is rotated (step S2). Specifically, the substrate supporting device 9 rotates the stage 7 around the rotating shaft 17. Thereby, the substrate 5 placed on the stage 7 is also rotated about the common rotating shaft 17.

接著,從混合流體形成裝置10之噴嘴14對呈正旋轉之狀態之基板5噴射混合流體(步驟S3)。具體言之,藉在混合流體形成裝置10中,混合加壓氣體與處理液,形成包含業經液滴化之處理液之混合流體,該混合流體以噴嘴14作為噴射口,朝位於下方之基板5噴射。此時,包含業經液 滴化之混合流體在基板5旋轉之狀態下噴射,並且混合流體之噴射位置係從旋轉軸17偏心之位置,再者,一面以移動裝置11將混合流體形成裝置10於水平方向移動,一面進行噴射。根據此種噴射方法,可對基板5之表面全體均一地噴射包含業經液滴化之處理液的混合流體。 Next, the mixed fluid is ejected from the substrate 14 in the state of being rotated from the nozzle 14 of the mixed fluid forming device 10 (step S3). Specifically, in the mixed fluid forming device 10, the pressurized gas and the treatment liquid are mixed to form a mixed fluid containing the dropletized treatment liquid, and the mixed fluid is used as the ejection port from the nozzle 14 toward the substrate 5 located below. injection. At this time, including the meridian The dropletized mixed fluid is ejected while the substrate 5 is rotated, and the ejecting position of the mixed fluid is eccentric from the rotating shaft 17, and further, while the moving device 11 moves the mixed fluid forming device 10 in the horizontal direction, the movement is performed. injection. According to this ejection method, the mixed fluid containing the liquidized solution can be uniformly sprayed onto the entire surface of the substrate 5.

在此,就混合流體之噴射所作之基板5之圖形化方向,使用圖5來說明。如圖5(a)所示,基板5在搬入至化學腔室2內之時間點於其表面形成有業經圖形化之抗蝕層31及成膜於抗蝕層31上之金屬層32。當對此種基板5自上方噴射包含業經液滴化之處理液之混合流體時,混合流體中之業經液滴化之處理液撞擊為最外層之金屬層32,藉此,造成損傷。藉此,如圖5(b)所示,於金屬層32形成為微小之裂痕之裂紋(crack)33。當形成裂紋33時,藉由該裂紋33,混合流體可到達金屬層32內部之抗蝕層31。當混合流體到達抗蝕層31時,如圖5(c)所示,藉混合流體中之有機溶劑之膨潤作用,抗蝕層31膨潤。當抗蝕層31膨潤時,可降低基板5與抗蝕層31之接著性。在此種狀態下,當繼續進行對基板5之混合流體之噴射時,可將抗蝕層31從基板5以物理方式剝離。此時,位於抗蝕層31之周圍之金屬層32亦同時從基板5剝離。藉此,如圖5(d)所示,於基板5上僅保留直接附著於基板5之金屬層32。於此金屬層32保留稱為毛邊35之對電路圖形34不需要之金屬層部份,藉繼續噴射混合流體,可以物理方式去除此毛邊35。是故,如圖5(e)所示,可僅保留所期之電路圖形34。此外,在此,損傷之一例係就形成裂紋 33之情形作了說明,損傷之形態不限於裂紋33,在其以外之形態,亦可進行利用上述有機溶劑之膨潤作用之抗蝕層31的剝離。 Here, the patterning direction of the substrate 5 by the ejection of the mixed fluid will be described using FIG. As shown in FIG. 5(a), the substrate 5 is formed with a patterned resist layer 31 and a metal layer 32 formed on the resist layer 31 at the time of loading into the chemical chamber 2. When the mixed liquid containing the liquidized liquid is sprayed from above on the substrate 5, the liquidized liquid of the mixed fluid is hit as the outermost metal layer 32, thereby causing damage. Thereby, as shown in FIG. 5(b), a crack 33 which is a minute crack is formed in the metal layer 32. When the crack 33 is formed, the mixed fluid can reach the resist layer 31 inside the metal layer 32 by the crack 33. When the mixed fluid reaches the resist layer 31, as shown in Fig. 5(c), the resist layer 31 is swollen by the swelling action of the organic solvent in the mixed fluid. When the resist layer 31 is swollen, the adhesion between the substrate 5 and the resist layer 31 can be lowered. In this state, when the ejection of the mixed fluid to the substrate 5 is continued, the resist layer 31 can be physically peeled off from the substrate 5. At this time, the metal layer 32 located around the resist layer 31 is simultaneously peeled off from the substrate 5. Thereby, as shown in FIG. 5(d), only the metal layer 32 directly attached to the substrate 5 remains on the substrate 5. The metal layer 32 retains a portion of the metal layer that is not required for the circuit pattern 34 of the burr 35, and the burr 35 can be physically removed by continuing to spray the mixed fluid. Therefore, as shown in Fig. 5(e), only the desired circuit pattern 34 can be retained. In addition, here, one of the injuries forms a crack. In the case of 33, the form of the damage is not limited to the crack 33, and in other forms, the peeling of the resist layer 31 by the swelling action of the above organic solvent may be performed.

在此,就可剝離基板5上之抗蝕層31及金屬層32之機理,使用圖6來進一步說明。如圖6(a)所示,當藉對抗蝕層31上之金屬層32從上方以速度V0噴射混合流體,混合流體中之業經液滴化之處理液撞擊金屬層32時,如圖6(b)所示,在金屬層32及抗蝕層31,產生撞擊壓P,而產生因反射波之合力引起之在上下方向的壓力上升CL。藉此,如圖6(c)所示,業經液滴化之處理液變形成於水平方向以速度VF擴展。藉此水平方向之力作用,對金屬層32及配置於其下之抗蝕層31水平方向之剝離力可發揮效力。在本實施形態之剝離裝置1中,藉組合此水平方向之剝離力與前述混合流體中之有機溶劑引起之抗蝕層31之膨潤效果,促進抗蝕層31及金屬層32之剝離。因而,在本實施形態之剝離裝置1中,相較於主要利用藥液之抗蝕層膨潤效果來剝離抗蝕層之藥液浸漬式的抗蝕層去除方法,可減少使用之處理液之之量,並且可實現同等或更多之抗蝕層31之剝離力。 Here, the mechanism by which the resist layer 31 and the metal layer 32 on the substrate 5 can be peeled off will be further described using FIG. 6. FIG 6 (a), when the metal layer by the resist layer 31 from the top 32 to the fluid mixture injection velocity V 0, the process of the droplet of the fluid mixture of liquid already impinging metal layer 32, FIG. 6 As shown in (b), the impact pressure P is generated in the metal layer 32 and the resist layer 31, and the pressure rise C L in the vertical direction due to the resultant force of the reflected waves is generated. Thereby, as shown in FIG. 6(c), the liquidized liquid is expanded in the horizontal direction at the speed V F . Thereby, the force in the horizontal direction acts to exert a peeling force in the horizontal direction of the metal layer 32 and the resist layer 31 disposed thereunder. In the peeling device 1 of the present embodiment, the peeling force in the horizontal direction and the swelling effect of the resist layer 31 by the organic solvent in the mixed fluid are combined to promote peeling of the resist layer 31 and the metal layer 32. Therefore, in the peeling apparatus 1 of the present embodiment, the treatment liquid removing method of the chemical liquid immersion type which removes the resist layer mainly by the swelling effect of the resist layer of the chemical liquid can be used, and the treatment liquid to be used can be reduced. The amount and the peeling force of the equivalent or more resist layers 31 can be achieved.

又,上述步驟S3之混合流體之噴射在使基板5旋轉之狀態下進行。因而,以混合流體去除之金屬層32不致停留於基板5之表面,可藉因基板5之旋轉引起之離心力與使用完畢之混合流體一同飛散至基板5之周圍。即,可抑制去除之金屬層32再附著於基板5之表面。又,飛散至基板5之周圍之使用完畢的混合流體以容器18集中而回收至配管 19,而如述,混合流體所含之處理液可再利用,金屬層32亦可再利用於其他用途。如此,藉再利用使用完畢之混合流體所含之各種成份,可減低剝離裝置1之運轉成本。 Further, the ejection of the mixed fluid in the above step S3 is performed in a state where the substrate 5 is rotated. Therefore, the metal layer 32 removed by the mixed fluid does not stay on the surface of the substrate 5, and the centrifugal force caused by the rotation of the substrate 5 can be scattered to the periphery of the substrate 5 together with the used mixed fluid. That is, it is possible to suppress the removed metal layer 32 from adhering to the surface of the substrate 5. Further, the used mixed fluid scattered around the substrate 5 is collected in the container 18 and collected into the piping. 19. As described above, the treatment liquid contained in the mixed fluid can be reused, and the metal layer 32 can be reused for other purposes. Thus, by operating the various components contained in the used mixed fluid, the running cost of the peeling device 1 can be reduced.

當步驟S3之混合流體之噴射完畢後,停止混合流體之噴射,同時,停止基板5之旋轉。 After the ejection of the mixed fluid of the step S3 is completed, the ejection of the mixed fluid is stopped, and at the same time, the rotation of the substrate 5 is stopped.

以上藉實施步驟S1-S3,於基板5之表面形成業經圖形化之金屬層的圖形化處理完畢。 By performing the steps S1-S3 above, the patterning process of forming the patterned metal layer on the surface of the substrate 5 is completed.

當圖形化處理完畢後,接著,將基板5搬入至淋洗腔室3內(步驟S4)。具體言之,基板搬送裝置4以握持臂6之前端握持載置於化學腔室2內之台7之基板5。之後,藉在握持基板5之狀態下旋轉握持臂6,基板5移動至淋洗腔室3內之台5之上方。之後,如圖3所示,將基板5載置於台8上,而解除握持臂6所作之握持。 After the patterning process is completed, the substrate 5 is then carried into the rinsing chamber 3 (step S4). Specifically, the substrate transfer device 4 holds the substrate 5 of the stage 7 placed in the chemical chamber 2 at the front end of the grip arm 6. Thereafter, the grip arm 6 is rotated while holding the substrate 5, and the substrate 5 is moved above the stage 5 in the rinsing chamber 3. Thereafter, as shown in FIG. 3, the substrate 5 is placed on the stage 8, and the holding by the holding arm 6 is released.

接著,使保持有基板5之台8旋轉(步驟S5)。基板支撐裝置20藉以旋轉軸30為中心而使台8旋轉,載置於台8上之基板5也以共通之旋轉軸30為中心而旋轉。 Next, the stage 8 holding the substrate 5 is rotated (step S5). The substrate supporting device 20 rotates the table 8 around the rotating shaft 30, and the substrate 5 placed on the table 8 also rotates around the common rotating shaft 30.

然後,對呈旋轉之狀態之基板5從混合流體形成裝置21之噴嘴25噴射混合流體(步驟S6)。從淋洗腔室3之混合流體形成裝置21如前述噴射加壓氣體與純水之混合流體。當將此種混合流體噴射至呈旋轉之狀態之基板5的表面時,殘留於基板5之表面之粒子等雜質以純水之淨化作用予以洗淨,並且,從基板5之表面去除至其周圍。 Then, the substrate 5 in the rotated state is ejected from the nozzle 25 of the mixed fluid forming device 21 (step S6). The mixed fluid forming means 21 from the rinsing chamber 3 sprays a mixed fluid of pressurized gas and pure water as described above. When such a mixed fluid is sprayed onto the surface of the substrate 5 in a state of being rotated, impurities such as particles remaining on the surface of the substrate 5 are cleaned by purification of pure water, and are removed from the surface of the substrate 5 to the periphery thereof. .

當混合流體之噴射完畢後,接著,使基板5之表面乾燥(步驟S7)。具體言之,使用與混合流體噴射裝置21 不同之氣體噴射裝置(圖中未示),對呈旋轉之狀態之基板5之表面噴射業經淨化之氣體(例如N2)。藉噴射此種氣體,可使殘留於基板5之表面之液體飛散至基板5之周圍,而可使基板5之表面乾燥。飛散至基板5之周圍之液體以容器28集中,回收至配管29來排放。 After the spraying of the mixed fluid is completed, the surface of the substrate 5 is then dried (step S7). Specifically, a gas (e.g., N 2 ) is sprayed on the surface of the substrate 5 in a state of being rotated using a gas ejecting apparatus (not shown) different from the mixed fluid ejecting apparatus 21. By spraying such a gas, the liquid remaining on the surface of the substrate 5 can be scattered around the substrate 5, and the surface of the substrate 5 can be dried. The liquid scattered around the substrate 5 is concentrated in the container 28 and recovered to the piping 29 for discharge.

藉以上實施步驟S5-S7,表面形成有業經圖形化之金屬層之基板5之表面的淋洗處理完畢。 By the above steps S5-S7, the rinsing treatment of the surface of the substrate 5 on which the patterned metal layer is formed is completed.

如上述,藉實施步驟S1-S7,進行基板5之表面之圖形化處理及淋洗處理,剝離裝置1之剝離處理完畢。 As described above, by performing the steps S1 to S7, the patterning process and the rinsing process of the surface of the substrate 5 are performed, and the peeling process of the peeling device 1 is completed.

以上根據本實施形態之剝離裝置1,表面具有業經圖形化之抗蝕層31及成膜於抗蝕層31上之金屬層32之基板5在台7上以旋轉之狀態保持,並且對該基板5之表面從噴嘴14噴射藉混合業經加壓之氣體及處理液而形成之包含業經液滴化之處理液的混合流體,將抗蝕層31及金屬層32剝離,而於基板5之表面形成有業經圖形化之金屬層32(電路圖形34)。藉此,由於利用因包含混合流體中之業經液滴化之處理液引起之水平方向之剝離力的物理剝離力,可剝離抗蝕層31,故可實現可於短時間進行抗蝕層31之去除之有效率的葉片式剝離裝置1。又,相較於藥液浸漬式之抗蝕層去除方法,可減少使用之處理液之使用量。 According to the peeling apparatus 1 of the present embodiment, the substrate 5 having the patterned resist layer 31 on the surface and the metal layer 32 formed on the resist layer 31 is held on the stage 7 in a state of being rotated, and the substrate is held. The surface of the fifth surface is sprayed from the nozzle 14 by mixing the pressurized gas and the treatment liquid to form a mixed fluid containing the liquidized solution, and the resist layer 31 and the metal layer 32 are peeled off to form a surface on the substrate 5. There is a patterned metal layer 32 (circuit pattern 34). Thereby, since the resist layer 31 can be peeled off by the physical peeling force by the peeling force in the horizontal direction by the liquid-repellent liquid in the mixed fluid, the resist layer 31 can be performed in a short time. The efficient blade peeling device 1 is removed. Further, the amount of the treatment liquid to be used can be reduced as compared with the method of removing the resist layer by the chemical liquid immersion type.

又,由於藉使用有機溶劑作為處理液,可在抗蝕層31之剝離時,一併利用有機溶劑之膨潤效果,故可進行更有效率之抗蝕層31之去除。 Further, since the organic solvent is used as the treatment liquid, the swelling effect of the organic solvent can be utilized in conjunction with the peeling of the resist layer 31, so that the more efficient removal of the resist layer 31 can be performed.

又,從混合流體形成裝置10之噴嘴14噴射之混合 流體利用往鉛直方向下方以高速供給之加壓氣體的推進力,以高速撞擊基板5之表面。藉此,可有效地去除於抗蝕層31之剝離時產生之為不必要之金屬層32的毛邊35。 Further, the mixture is sprayed from the nozzle 14 of the mixed fluid forming device 10 The fluid impinges on the surface of the substrate 5 at a high speed by the propulsive force of the pressurized gas supplied at a high speed downward in the vertical direction. Thereby, the burrs 35 of the metal layer 32 which are generated when the resist layer 31 is peeled off can be effectively removed.

又,由於藉在使基板5旋轉之狀態下進行混合流體之噴射,可使以混合流體去除之金屬層32與使用完畢之混合流體一同飛散至基板5之周圍,故可抑制再附著於基板5之表面。 Further, since the mixed fluid is ejected while the substrate 5 is rotated, the metal layer 32 removed by the mixed fluid can be scattered around the substrate 5 together with the used mixed fluid, so that reattachment to the substrate 5 can be suppressed. The surface.

再者,在化學腔室2中將使用完畢之混合流體以配管19回收,過濾金屬等雜質後,送往處理液供給源16。藉此,可再利用使用完畢之混合流體所含之有機溶劑等處理液及金屬,而可減低剝離裝置1之運轉成本。 Further, in the chemical chamber 2, the used mixed fluid is recovered in the pipe 19, and impurities such as metal are filtered, and then sent to the processing liquid supply source 16. Thereby, the treatment liquid and the metal such as the organic solvent contained in the used mixed fluid can be reused, and the running cost of the peeling device 1 can be reduced.

又,藉剝離裝置1之結構採用葉片式之2腔室方式,可使實施之處理製程簡單,並且可謀求裝置全體之小型化。 Further, the structure of the peeling device 1 is a vane type two-chamber system, and the processing process to be carried out can be simplified, and the entire device can be miniaturized.

使用上述實施形態之剝離裝置1,對基板5進行剝離處理,結果,相較於藥液浸漬式之抗蝕層去除方法,可使抗蝕層31之去除速度提高5-10倍。 By using the peeling apparatus 1 of the above-described embodiment, the substrate 5 is subjected to a peeling treatment, and as a result, the removal rate of the resist layer 31 can be increased by 5 to 10 times as compared with the chemical liquid-immersed resist layer removing method.

此外,在本實施形態中,就下述情形作了說明,前述情形係於基板5之表面之圖形化處理時,藉混合業經加壓之氣體及處理液,形成包含業經液滴化之處理液之混合流體來噴射,舉例言之,亦考慮下述方法,前述方法係使用柱塞方式之泵,並且,藉噴射非液滴之高壓水(加壓氣體與純水之混合物)取代前述混合流體,主要僅以水之鉛直方向之物理力,去除抗蝕層及金屬層(以下稱為高壓方式)。 Further, in the present embodiment, a case has been described in which the above-described case is formed by mixing the pressurized gas and the treatment liquid to form a treatment liquid containing the dropletized liquid when the surface of the substrate 5 is patterned. The mixed fluid is sprayed. For example, the following method is also considered. The foregoing method uses a plunger type pump, and replaces the aforementioned mixed fluid by spraying non-droplet high-pressure water (mixture of pressurized gas and pure water). The resist layer and the metal layer (hereinafter referred to as high pressure mode) are mainly removed by the physical force of the direct direction of water.

然而,根據高壓方式,由於主要以水之鉛直方向之物理力,剝離抗蝕層31,故需將水之壓力保持在非常高。是故,在用以噴射水之噴射裝置內之接頭部份等發生漏液,或從噴射裝置內產生多量之粒子,進而有基板5或金屬層32因從噴射裝置噴射之水受到過度之損傷之情形。又,在高壓方式中噴射之水之壓力為一定時,由於抗蝕層之剝離力隨著時間逐漸減弱,故無法再有效地去除抗蝕層31。是故,為維持抗蝕層31之剝離力,需一面適宜變更水之壓力一面噴射。又,由於採用柱塞方式之泵構造,故泵構造之滑動部依使用而惡化,因此,有噴射之水之壓力減弱的情形。又,由於噴射而使用完畢之流體逕自排出,故無法再利用。 However, according to the high pressure method, since the resist layer 31 is peeled off mainly by the physical force of the vertical direction of water, the pressure of the water needs to be kept very high. Therefore, liquid leakage occurs in the joint portion or the like in the spray device for spraying water, or a large amount of particles are generated from the spray device, and the substrate 5 or the metal layer 32 is excessively damaged by the water sprayed from the spray device. The situation. Further, when the pressure of the water sprayed in the high pressure mode is constant, since the peeling force of the resist layer gradually decreases with time, the resist layer 31 cannot be effectively removed. Therefore, in order to maintain the peeling force of the resist layer 31, it is necessary to spray while appropriately changing the pressure of the water. Further, since the plunger type pump structure is employed, the sliding portion of the pump structure is deteriorated by use, and therefore the pressure of the sprayed water is weakened. Moreover, since the used fluid path is ejected by the ejection, it cannot be reused.

在高壓方式,產生如上述之問題,相對於此,由於根據本實施形態之剝離裝置1,利用包含混合流體中之業經液滴化之處理液引起之水平方向之剝離力的物理剝離力,剝離抗蝕層31,故可將噴射之流體之壓力抑制在低壓(相較於高壓方式約1/30),並且可實現與柱塞方式約略同等之剝離力,進而即使以一定壓力進行噴射,亦不致使抗蝕層31之剝離力降低而可維持。由於如此可以低壓實施圖形化處理,故可抑制對基板5或金屬層32之損傷,而亦可對應於較薄之基板5(例如厚度係150-200μm)。再者,可抑制噴射裝置內之接頭部份之漏液的發生,亦可抑制粒子之產生。又,由於使用上述結構之混合流體形成裝置10而非柱塞方式之泵構造,故無因滑動部之惡化引起之噴射流體之 壓力降低的問題。是故,可使抗蝕層31之剝離效果穩定,而可使剝離裝置1之可靠度提高。又,在剝離裝置1中,由於採用使用配管19之循環回收方式,故可再利用使用完畢之混合流體。 In the high-pressure method, as described above, the peeling device 1 according to the present embodiment is peeled off by the physical peeling force including the peeling force in the horizontal direction caused by the liquidized solution in the mixed fluid. Since the resist layer 31 can suppress the pressure of the injected fluid to a low pressure (about 1/30 of that of the high pressure method), and can achieve a peeling force equivalent to that of the plunger method, and even if the injection is performed at a certain pressure, The peeling force of the resist layer 31 is not lowered and can be maintained. Since the patterning process can be performed at a low pressure, damage to the substrate 5 or the metal layer 32 can be suppressed, and it can also correspond to a thin substrate 5 (for example, a thickness of 150-200 μm). Further, it is possible to suppress the occurrence of leakage of the joint portion in the injection device and suppress the generation of particles. Further, since the mixed fluid forming device 10 of the above configuration is used instead of the plunger type pump structure, there is no ejection fluid caused by the deterioration of the sliding portion. The problem of reduced pressure. Therefore, the peeling effect of the resist layer 31 can be stabilized, and the reliability of the peeling device 1 can be improved. Further, in the peeling device 1, since the circulation recovery method using the pipe 19 is employed, the used mixed fluid can be reused.

此外,本發明非限於上述實施形態,亦可以其他各種態樣實施。舉例言之,在本實施形態中,就對基板5噴射混合流體前不對基板5進行特別之處理的情形作了說明,但不限於此種情形,亦可於噴射混合流體前,在化學腔室2內使基板5浸漬於有機溶劑等。如此,藉使基板5等浸漬於有機溶劑等而使其預先膨潤,在接著之混合流體之噴射製程,可使混合流體之噴射之剝離力提高。藉此,可實施更有效率之剝離處理。 Further, the present invention is not limited to the above embodiment, and may be implemented in other various aspects. For example, in the present embodiment, the case where the substrate 5 is not specially treated before the mixed fluid is sprayed on the substrate 5 is described, but it is not limited to this case, and may be in the chemical chamber before the mixed fluid is sprayed. The substrate 5 is immersed in an organic solvent or the like in 2 . In this manner, the substrate 5 and the like are immersed in an organic solvent or the like to be previously swollen, and in the subsequent spraying process of the mixed fluid, the peeling force of the jet of the mixed fluid can be improved. Thereby, a more efficient peeling process can be implemented.

又,在本實施形態中,就使用N2作為加壓氣體且使用有機溶劑作為處理液之情形作了說明,但不限於此種情形。舉例言之,亦可使用惰性氣體等作為加壓氣體,使用有機溶劑以外之其他藥液或水等作為處理液。 Further, in the present embodiment, the case where N 2 is used as the pressurized gas and the organic solvent is used as the treatment liquid has been described, but the present invention is not limited thereto. For example, an inert gas or the like may be used as the pressurized gas, and other chemical liquids other than the organic solvent, water, or the like may be used as the treatment liquid.

又,在本實施形態中,不僅在圖形化處理,在淋洗處理,亦就噴射組合了加壓氣體與水之混合流體之情形作了說明,但不限於此種情形,亦可以其他之淋洗處理代替。 Further, in the present embodiment, the case where the mixed fluid of the pressurized gas and the water is combined is not described in the patterning process or the rinsing process, but the present invention is not limited to this case, and other types may be used. Wash treatment instead.

又,在本實施形態中,就剝離裝置1以化學腔室2及淋洗腔室3之2個腔室構成之情形作了說明,腔室之數不限於此,亦可以例如1個或3個以上之腔室構成。 Further, in the present embodiment, the case where the peeling device 1 is constituted by the two chambers of the chemical chamber 2 and the rinsing chamber 3 has been described, and the number of the chambers is not limited thereto, and may be, for example, one or three. More than one chamber is formed.

又,在本實施形態中,就基板搬送裝置4之搬送 形態為圖1所示之方法之情形作了說明,但不限於此種情形,亦可採用其他各種搬送形態。 Moreover, in the present embodiment, the substrate transfer device 4 is transported. The case where the form is the method shown in Fig. 1 has been described, but it is not limited to this case, and various other transfer forms may be employed.

此外,藉適宜組合上述各種實施形態中之任意之實施形態,可發揮各自具有之效果。 Further, by combining any of the above-described various embodiments as appropriate, it is possible to exhibit the respective effects.

本發明可適用於藉從基板之表面去除抗蝕層而於基板之表面形成業經圖形化之金屬層的剝離裝置及其方法。 The present invention is applicable to a peeling apparatus and a method thereof for forming a patterned metal layer on a surface of a substrate by removing a resist layer from the surface of the substrate.

本發明係一面參照附加圖式,一面與較佳之實施形態相關而充分記載,對此技術熟悉之人而言,可明白各種變形及修正。該種變形及修正只要不脫離附加之申請專利範圍之本發明之範圍,應可理解包含在其中。 The present invention is fully described in connection with the preferred embodiments, and various modifications and changes will be apparent to those skilled in the art. Such variations and modifications are to be understood as included within the scope of the invention as set forth in the appended claims.

於2012年7月12日提出之日本專利申請案No.2012-156470號之說明書、圖式及申請專利範圍之揭示內容全體參照而納入本說明書中。 The disclosure of the specification, drawings, and claims of Japanese Patent Application No. 2012-156470, filed on Jul. 12, 2012, is hereby incorporated by reference.

2‧‧‧化學腔室 2‧‧‧Chemical chamber

5‧‧‧基板 5‧‧‧Substrate

7‧‧‧台 7‧‧‧

9‧‧‧台支撐裝置 9‧‧‧ support device

10‧‧‧混合流體形成裝置 10‧‧‧ Mixed fluid forming device

11‧‧‧移動裝置 11‧‧‧Mobile devices

12‧‧‧第1流路 12‧‧‧1st flow path

13‧‧‧第2流路 13‧‧‧2nd flow path

14‧‧‧噴嘴 14‧‧‧Nozzles

15‧‧‧加壓氣體供給源 15‧‧‧Compressed gas supply

16‧‧‧處理液供給源 16‧‧‧Processing fluid supply source

17‧‧‧旋轉軸 17‧‧‧Rotary axis

18‧‧‧容器 18‧‧‧ container

19‧‧‧配管 19‧‧‧Pipe

A‧‧‧匯合地點 A‧‧‧ Convergence location

X,Y,Z‧‧‧方向 X, Y, Z‧‧ Direction

Claims (8)

一種剝離裝置,包含有:台,可保持基板,並且使所保持之基板旋轉;混合流體形成裝置,具有供業經加壓之氣體通過之氣體流路、供處理液通過之處理液流路、連通於各個流路並且噴射藉混合業經加壓之氣體及處理液而形成之包含業經液滴化之處理液之混合流體的噴嘴;及移動裝置,可使混合流體形成裝置對台相對地移動;又,表面具有業經圖形化之抗蝕層及成膜於抗蝕層上之金屬層的基板,是在台上以旋轉之狀態保持,藉由從噴嘴對在台上呈旋轉之狀態之基板的表面噴射混合流體,可將抗蝕層及金屬層剝離,而於基板之表面形成業經圖形化之金屬層。 A peeling device comprising: a table for holding a substrate and rotating the substrate to be held; a mixed fluid forming device having a gas flow path through which a pressurized gas passes, a treatment liquid flow path through which the treatment liquid passes, and communication a nozzle that includes a mixed fluid of the liquidized processing liquid formed by mixing the pressurized gas and the treatment liquid, and a moving device that allows the mixed fluid forming device to move relative to the table; a substrate having a patterned resist layer and a metal layer formed on the resist layer on the surface, which is held in a rotating state on the stage, and the surface of the substrate is rotated from the nozzle to the stage. The mixed fluid is sprayed to peel off the resist layer and the metal layer to form a patterned metal layer on the surface of the substrate. 如請求項1之剝離裝置,其中對基板之表面噴射混合流體,使混合流體撞擊基板上之金屬層,藉此對金屬層造成損傷,而剝離抗蝕層及金屬層。 The stripping device of claim 1, wherein the mixed fluid is sprayed on the surface of the substrate to cause the mixed fluid to strike the metal layer on the substrate, thereby causing damage to the metal layer and stripping the resist layer and the metal layer. 如請求項1之剝離裝置,其中處理液是使用有機溶劑。 The stripping device of claim 1, wherein the treatment liquid is an organic solvent. 如請求項1至3中任一項之剝離裝置,其為葉片式。 A peeling device according to any one of claims 1 to 3, which is of the blade type. 一種剝離方法,包含有下述製程:(1)將表面具有業經圖形化之抗蝕層及成膜於抗蝕層上之金屬層的基板以使其旋轉之狀態保持;(2)藉將業經加壓之氣體與處理液混合,形成包含業 經液滴化之處理液之混合流體;及(3)藉對呈旋轉之狀態之基板的表面噴射混合流體,剝離抗蝕層及金屬層,而於基板之表面形成業經圖形化之金屬層。 A stripping method comprising the following steps: (1) maintaining a substrate having a patterned resist layer and a metal layer formed on the resist layer in a state of being rotated; (2) The pressurized gas is mixed with the treatment liquid to form a containment industry a mixed fluid of the dropletized treatment liquid; and (3) spraying the mixed fluid on the surface of the substrate in a state of being rotated, stripping the resist layer and the metal layer, and forming a patterned metal layer on the surface of the substrate. 如請求項5之剝離方法,其中在形成金屬層之製程中,對基板之表面噴射混合流體,使混合流體撞擊基板上之金屬層,藉此對金屬層造成損傷,而剝離抗蝕層及金屬層。 The stripping method of claim 5, wherein in the process of forming the metal layer, the mixed fluid is sprayed on the surface of the substrate, causing the mixed fluid to strike the metal layer on the substrate, thereby causing damage to the metal layer, and stripping the resist layer and the metal Floor. 如請求項5之剝離方法,其中處理液是使用有機溶劑。 The stripping method of claim 5, wherein the treating liquid is an organic solvent. 如請求項5至7中任一項之剝離方法,其為葉片式。 The peeling method according to any one of claims 5 to 7, which is of the blade type.
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