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TW201410832A - Laminate and laminate manufacturing method - Google Patents

Laminate and laminate manufacturing method Download PDF

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TW201410832A
TW201410832A TW102118643A TW102118643A TW201410832A TW 201410832 A TW201410832 A TW 201410832A TW 102118643 A TW102118643 A TW 102118643A TW 102118643 A TW102118643 A TW 102118643A TW 201410832 A TW201410832 A TW 201410832A
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layer
separation layer
laminate
group
adhesive
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TW102118643A
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Chinese (zh)
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TWI591148B (en
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Koki Tamura
Hirofumi Imai
Takuya Noguchi
Atsushi Kubo
Takahiro Yoshioka
Atsushi Miyanari
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Tokyo Ohka Kogyo Co Ltd
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Abstract

The purpose of this invention is to inhibit the wafer peeling and protect a separation layer during the treatment of interest on a laminate. The solving means is the laminate of this invention, which is formed by lamination, in the order below, a substrate (11), an adhesion layer (13), a separation layer (14) which changes its property after the light absorption, and a support board (12). On the surface of the separation layer (14) not adhered to the support board (12), a protection layer (15) is further provided which at least covers the surface not overlapping the adhesion layer (13).

Description

層合體及層合體之製造方法 Laminated body and method of manufacturing the same

本發明係關於層合有基板與支撐體之層合體及層合體之製造方法。 The present invention relates to a method of producing a laminate and a laminate in which a substrate and a support are laminated.

近年來要求IC卡、行動電話等之電子機器之薄型化、小型化、輕量化等。為了滿足此等要求,對於組裝之半導體晶片亦必須使用薄型之半導體晶片。因此,半導體晶片基底之晶圓基板之厚度(膜厚)雖現狀為125μm~150μm,但次世代所用之晶片則被認為必須作成25μm~50μm。因此,為了取得上述膜厚之晶圓基板,晶圓基板之薄板化步驟則為有不可欠缺之必要性。 In recent years, electronic devices such as IC cards and mobile phones have been required to be thinner, smaller, and lighter. In order to meet these requirements, thin semiconductor wafers must also be used for assembled semiconductor wafers. Therefore, the thickness (film thickness) of the wafer substrate of the semiconductor wafer substrate is currently 125 μm to 150 μm, but the wafer used in the next generation is considered to be 25 μm to 50 μm. Therefore, in order to obtain the wafer substrate having the above film thickness, the thinning step of the wafer substrate is indispensable.

晶圓基板因薄板化而導致強度降低,故為了防止薄板化之晶圓基板破損,於製造製程中在晶圓基板與支承板貼合之狀態下自動搬送之同時,在晶圓基板上實裝電路等之構造物。且,於製造製程後,使晶圓基板從支承板分離。因此,製造製程中雖係以強固地接著晶圓基板與支承板為佳,但於製造製程後可從支承板圓滑地分離晶圓基板為佳。 Since the strength of the wafer substrate is reduced due to thinning, the wafer substrate is mounted on the wafer substrate while the wafer substrate and the support plate are bonded together in the manufacturing process in order to prevent the wafer substrate from being damaged. A structure such as a circuit. Moreover, after the manufacturing process, the wafer substrate is separated from the support plate. Therefore, in the manufacturing process, it is preferable to firmly follow the wafer substrate and the support plate, but it is preferable to smoothly separate the wafer substrate from the support plate after the manufacturing process.

在強固地接著晶圓基板與支承板時,根據接著材料,可不使實裝於晶圓基板上之構造物破損,但難以從晶圓基板分離支承板。因此,要求開發於製造製程中可實現強固地接著晶圓基板與支承板,且於製造製程後可不使實裝於晶圓基板上之元件破損進而分離之非常困難之假固定技術。 When the wafer substrate and the support plate are firmly adhered to each other, the structure mounted on the wafer substrate can be prevented from being broken by the bonding material, but it is difficult to separate the support plate from the wafer substrate. Therefore, it is required to develop a very difficult pseudo-fixing technique in which a wafer substrate and a support plate can be firmly adhered to in a manufacturing process, and the components mounted on the wafer substrate can be broken and separated after the manufacturing process.

作為對半導體晶圓貼合支撐體,且處理半導體晶圓後,分離支撐體般之半導體晶片之製造方法,已知有如專利文獻1中記載之方法。專利文獻1中記載之方法係將光穿透性之支撐體與半導體晶圓介由設置於支撐體側之光熱轉換層與接著劑層而貼合,處理半導體晶圓後,藉由從支撐體側照射放射能量而分解光熱轉換層,進而從支撐體分離半導體晶圓。 As a method of manufacturing a semiconductor wafer in which a semiconductor wafer is bonded to a semiconductor wafer and a semiconductor wafer is processed and a support is separated, a method as disclosed in Patent Document 1 is known. In the method described in Patent Document 1, the light-transmitting support and the semiconductor wafer are bonded to each other via a photothermal conversion layer and an adhesive layer provided on the support side, and the semiconductor wafer is processed by the support. The side illuminates the radiant energy to decompose the photothermal conversion layer, thereby separating the semiconductor wafer from the support.

〔先前技術文獻〕 [Previous Technical Literature] 〔專利文獻〕 [Patent Document]

[專利文獻1]日本特開2005-159155號公報(2005年6月16日公開) [Patent Document 1] Japanese Laid-Open Patent Publication No. 2005-159155 (published on June 16, 2005)

對於介由以後用以分離之分離層而將晶圓等之基材與支撐體貼合之層合體進行各種處理時,在處理之途中該分離層因藥品等而變質,而引起在處理之途中導致 剝離之問題。 When various processes are performed on a laminate in which a substrate such as a wafer and a support are bonded to each other through a separation layer to be separated later, the separation layer is deteriorated by a drug or the like during the treatment, resulting in a process leading to the process. The problem of stripping.

例如,光阻剝離步驟等中,特別係在高溫下使該層合體曝露於剝離液時,由層合體之端部端面浸透剝離液而導致晶圓剝離。 For example, in the resist stripping step or the like, in particular, when the laminate is exposed to the peeling liquid at a high temperature, the end surface of the end portion of the laminate is impregnated with the stripping liquid to cause the wafer to peel off.

處理之途中若剝離則晶圓上產生龜裂、破裂、凹凸等,故無法前進至下個步驟。 If the film is peeled off during the process, cracks, cracks, irregularities, and the like are generated on the wafer, so that it is not possible to proceed to the next step.

本發明係有鑑於此種問題所完成者,以提供對層合體施行所欲處理時,為了抑制晶圓剝離,而分離層受到保護之層合體為目的。 The present invention has been made in view of such a problem, and is intended to provide a laminate in which a separation layer is protected in order to suppress wafer peeling when a laminate is desired.

為了解決上述課題,本發明之層合體,其特徵為依基板、接著層、因吸收光而變質之分離層、支撐體之順序層合而成,在上述分離層之表面且未與上述支撐體接著之面之中,更具備至少覆蓋未與上述接著層重疊之面之保護層。 In order to solve the above problems, the laminate of the present invention is characterized in that a substrate, an adhesive layer, a separation layer which is deteriorated by absorption of light, and a support are laminated in this order, and the surface of the separation layer is not bonded to the support. Further, a protective layer covering at least the surface not overlapping the above-mentioned subsequent layer is further provided.

又,本發明之層合體之製造方法,其特徵為包含:於支撐體上形成、因吸收光而變質之分離層之分離層形成步驟;於基板上或上述分離層上形成接著層之接著層形成步驟;依上述基板、上述接著層、上述分離層、上述支撐體之順序進行層合之層合步驟;且在上述層合步驟之前,更包含保護層形成步驟,該保護層形成步驟係於上述層合步驟中使之層合時,在上述分離層之表面且未與上述支撐體接著之面之中,形成至少覆蓋與上述接著層未重 疊之面之保護層。 Further, a method for producing a laminate according to the present invention includes a step of forming a separation layer formed on a support and deteriorating by absorbing light, and forming an adhesive layer on the substrate or the separation layer. a forming step; a lamination step of laminating in the order of the substrate, the adhesive layer, the separation layer, and the support; and, before the laminating step, further comprising a protective layer forming step, wherein the protective layer forming step is When laminating in the laminating step, at least the cover and the adhesive layer are not heavy on the surface of the separation layer and not in the surface adjacent to the support. The protective layer of the stack.

依據本發明可達成在對層合體施以所欲處理時,因分離層受到保護,故可抑制晶圓剝離之效果。 According to the present invention, when the laminate is subjected to a desired treatment, since the separation layer is protected, the effect of wafer peeling can be suppressed.

10‧‧‧層合體 10‧‧‧Layer

11‧‧‧基板 11‧‧‧Substrate

12‧‧‧支承板(支撐體) 12‧‧‧Support plate (support)

13‧‧‧接著層 13‧‧‧Next layer

14‧‧‧分離層 14‧‧‧Separation layer

15‧‧‧保護層 15‧‧‧Protective layer

[圖1]展示本發明之層合體之一實施形態之層合體10之構造之圖。 Fig. 1 is a view showing the structure of a laminate 10 according to an embodiment of the laminate of the present invention.

[圖2]本發明之層合體之製造方法之一實施形態之圖。 Fig. 2 is a view showing an embodiment of a method for producing a laminate of the present invention.

<層合體> <Layer>

將本發明之層合體以一實施形態之層合體10為例,使用圖1進行說明。圖1為展示本發明之層合體之一實施形態之層合體10之構造圖。 The laminate 10 of the present invention will be described with reference to Fig. 1 by taking the laminate 10 of one embodiment as an example. Fig. 1 is a structural view showing a laminate 10 of an embodiment of the laminate of the present invention.

層合體10係依基板11、接著層13、因吸收光而變質之分離層14、支承板(支撐體)12之順序層合而成,在分離層14之表面且未與支承板接著之面之中,更具備至少覆蓋未與接著層13重疊之面之保護層15。 The laminate 10 is formed by laminating the substrate 11, the subsequent layer 13, the separation layer 14 which is degraded by absorption of light, and the support plate (support) 12, and is on the surface of the separation layer 14 and is not in contact with the support plate. Among them, the protective layer 15 covering at least the surface not overlapping the adhesive layer 13 is further provided.

由於保護層15至少覆蓋未與接著層13重疊 之分離層14之表面,於基板11之製造製程中,即使在實行光阻剝離步驟等之各種處理時,分離層14仍係受到保護遠離該處理等所使用之剝離液等之藥品,或高溫環境之熱。因此,即使對層合體10施行所欲處理時,由於分離層14受到保護,故仍可抑制基板11剝離。 Since the protective layer 15 covers at least the overlap with the adhesive layer 13 In the surface of the separation layer 14, in the manufacturing process of the substrate 11, even when various processes such as a photoresist stripping step are performed, the separation layer 14 is protected from a drug such as a peeling liquid used for the treatment or the like, or a high temperature. The heat of the environment. Therefore, even when the laminate 10 is subjected to a desired treatment, since the separation layer 14 is protected, peeling of the substrate 11 can be suppressed.

〔基板〕 [substrate]

基板11係在受到支承板12所支撐之狀態下,提供至薄化、實裝等之製程者。本實施形態中基板11雖為晶圓,但本發明之層合體所具備之基板並不限定於晶圓,亦可採用薄型薄膜基板、可撓性基板等之任意之基板。又,於基板11之接著層13側之面上亦可形成電氣電路等之電子元件之微細構造。 The substrate 11 is supplied to a process of thinning, mounting, and the like in a state of being supported by the support plate 12. In the present embodiment, the substrate 11 is a wafer. However, the substrate provided in the laminate of the present invention is not limited to the wafer, and any substrate such as a thin film substrate or a flexible substrate may be used. Further, a fine structure of an electronic component such as an electric circuit can be formed on the surface of the substrate 11 on the side of the adhesive layer 13.

〔支承板〕 [support plate]

支承板12為支撐基板11之支撐體,且具有光穿透性。因此,由層合體10之外面朝向支承板12照射光時,該光通過支承板12而到達分離層14。又,支承板12並非必須使全部之光穿透,只要係可使分離層14應吸收之(具有規定之波長)光穿過即可。 The support plate 12 is a support for supporting the substrate 11, and has light transparency. Therefore, when light is irradiated from the outer surface of the laminated body 10 toward the support plate 12, the light passes through the support plate 12 and reaches the separation layer 14. Further, the support plate 12 does not have to penetrate all of the light as long as the light which the separation layer 14 should absorb (having a predetermined wavelength) can pass.

支承板12為支撐基板11者,只要於基板11之薄化、搬送、實裝等之製程時,具有防止基板11破損或變形之必須強度即可。由以上之觀點,作為支承板12,可舉出如由玻璃、矽、丙烯酸樹脂所構成者等。 The support plate 12 is a support substrate 11 and may have a required strength to prevent the substrate 11 from being damaged or deformed during the process of thinning, transporting, or mounting the substrate 11. From the above viewpoints, examples of the support plate 12 include those made of glass, enamel, and acrylic resin.

〔分離層〕 [separation layer]

分離層14係由藉由吸收通過支承板12所照射之光而變質之材料所形成之層。本說明書中,分離層14之「變質」係意指分離層14僅受到些許外力即可破壞之狀態,或使變成分離層14與接觸之層之接著力降低之狀態之現象。因吸收光而產生之分離層14之變質之結果係分離層14喪失受到光照射前之強度或接著性。故,藉由施加些許外力(例如,提起支承板12等),分離層14受到破壞,而可容易分離支承板12與基板11。 The separation layer 14 is a layer formed of a material which is deteriorated by absorbing light irradiated through the support plate 12. In the present specification, the "deterioration" of the separation layer 14 means a state in which the separation layer 14 can be broken only by a slight external force, or a state in which the adhesion force between the separation layer 14 and the contact layer is lowered. As a result of the deterioration of the separation layer 14 due to absorption of light, the separation layer 14 loses strength or adhesion before being irradiated with light. Therefore, by applying a little external force (for example, lifting the support plate 12 or the like), the separation layer 14 is broken, and the support plate 12 and the substrate 11 can be easily separated.

又,分離層14之變質可為因吸收之光之能量所致之(發熱性或非發熱性之)分解、交聯、立體配置之變化或官能基之解離(且,伴隨於此之分離層之硬化、脫氣、收縮或膨脹)等。分離層14之變質係作為構成分離層14之材料所製之光吸收之結果而產生。故,分離層14之變質種類係可因應構成分離層14之材料種類而變化。 Further, the deterioration of the separation layer 14 may be a decomposition (cross-linking, a change in a stereo configuration, or a dissociation of a functional group due to the energy of the absorbed light (heating or non-heating) (and, along with the separation layer) Hardening, degassing, shrinking or expanding). The modification of the separation layer 14 is produced as a result of light absorption by the material constituting the separation layer 14. Therefore, the metamorphic type of the separation layer 14 can be varied depending on the kind of the material constituting the separation layer 14.

分離層14係設置於支承板12上之介由接著層13而基板11受到貼合側之表面。即,分離層14係設置於支承板12與接著層13之間。 The separation layer 14 is provided on the support plate 12 via the adhesive layer 13 and the substrate 11 is subjected to the surface on the bonding side. That is, the separation layer 14 is provided between the support plate 12 and the adhesive layer 13.

分離層14之厚度係例如以0.05~50μm為佳,以0.3~1μm為更佳。分離層14之厚度若設在0.05~50μm之範圍內,藉由短時間之光照射及低能量之光照射,即可使分離層14產生所欲之變質。又,分離層14之厚度在由生產性之觀點,以設在1μm以下之範圍內為特佳。 The thickness of the separation layer 14 is preferably 0.05 to 50 μm, more preferably 0.3 to 1 μm. When the thickness of the separation layer 14 is set in the range of 0.05 to 50 μm, the separation layer 14 can be deformed by a short-time light irradiation and low-energy light irradiation. Further, the thickness of the separation layer 14 is particularly preferably in the range of 1 μm or less from the viewpoint of productivity.

尚且,於層合體10中,亦可在分離層14與支承板12之間更形成其他之層。此時,其他之層只需係由可穿透光之材料所構成即可。藉此,可不妨礙光入射至分離層14地適宜追加可賦予層合體10較佳性質等之層。根據構成分離層14之材料種類,可使用之光之波長亦相異。因此,構成其他之層之材料並不須皆為可使光穿透者,可適宜選自可使構成分離層14之材料變質之波長之光穿透之材料。 Further, in the laminate 10, another layer may be formed between the separation layer 14 and the support plate 12. At this time, the other layers need only be composed of a material that can penetrate light. Thereby, it is possible to appropriately add a layer which can impart the preferable properties and the like of the laminate 10 without hindering the incidence of light on the separation layer 14. Depending on the type of material constituting the separation layer 14, the wavelengths of light that can be used are also different. Therefore, the materials constituting the other layers are not necessarily all those which can penetrate the light, and may be selected from materials which can penetrate light of a wavelength at which the material constituting the separation layer 14 is deteriorated.

又,分離層14係以僅由具有吸收光之構造之材料所形成者為佳,但在不損及本發明之本質特性之範圍內,亦可添加不具有吸收光之構造之材料而形成分離層14。又,分離層14上與接著層13對向側之面係以平坦(未形成凹凸)為佳,藉此,可容易地施行分離層14之形成,且即使在貼附時仍可均勻地貼附。 Further, the separation layer 14 is preferably formed of a material having a structure that absorbs light, but may be formed by adding a material having no structure for absorbing light, within a range not impairing the essential characteristics of the present invention. Layer 14. Further, it is preferable that the surface of the separation layer 14 and the opposite side of the adhesive layer 13 are flat (no unevenness is formed), whereby the formation of the separation layer 14 can be easily performed, and evenly attached even when attached. Attached.

分離層14係可使用將如以下般之構成分離層14之材料預先形成薄膜狀後貼合於支承板12者,亦可使用於支承板12上塗布構成分離層14之材料並將其固化成薄膜狀者。於支承板12上塗布構成分離層14之材料之方法係可因應構成分離層14之材料種類而適宜選自由化學氣相成長(CVD)法而成之堆積等之過往公知之方法。 The separation layer 14 may be formed by laminating a material constituting the separation layer 14 as follows, and then bonding it to the support plate 12, or applying the material constituting the separation layer 14 to the support plate 12 and curing it. Film-like. The method of applying the material constituting the separation layer 14 to the support plate 12 is preferably a conventionally known method selected from the group consisting of chemical vapor deposition (CVD) deposition, etc., depending on the type of material constituting the separation layer 14.

分離層14亦可為藉由吸收由雷射所照射之光而變質者。即,為使分離層14變質而對分離層14照射之光係亦可為由雷射所照射者。作為發射照射分離層14之光之雷射例,可舉出如YAG雷射、紅寶石雷射、玻璃雷 射、YVO4雷射、LD雷射、光纖雷射等之固體雷射、色素雷射等之液體雷射、CO2雷射、準分子雷射、Ar雷射、He-Ne雷射等之氣體雷射、半導體雷射、自由電子雷射等之雷射光、或非雷射光等。發射照射分離層14之光之雷射係可因應構成分離層14之材料而適宜選擇,選擇可照射能使構成分離層14之材料變質之波長光之雷射即可。 The separation layer 14 may also be degraded by absorbing light irradiated by the laser. That is, the light system that irradiates the separation layer 14 in order to degrade the separation layer 14 may be irradiated by a laser. Examples of the laser light that emits the light that illuminates the separation layer 14 include solid lasers such as YAG lasers, ruby lasers, glass lasers, YVO 4 lasers, LD lasers, and fiber lasers. Laser lasers such as liquid lasers, CO 2 lasers, excimer lasers, Ar lasers, He-Ne lasers, semiconductor lasers, free electron lasers, etc., or non-laser light. The laser light that emits the light that illuminates the separation layer 14 can be appropriately selected in accordance with the material constituting the separation layer 14, and a laser that can illuminate the wavelength light that can temper the material constituting the separation layer 14 can be selected.

<於其重複單位中包含具有光吸收性構造之聚合物> <Polymer having a light absorbing structure in its repeating unit>

分離層14亦可含有於其重複單位中包含具有光吸收性構造之聚合物。該聚合物係受到光之照射而變質。該聚合物之變質係藉由吸收照射於上述構造之光而產生。作為聚合物變質之結果,分離層14喪失受到光照射前之強度或接著性。因此,藉由施加些許外力(例如,提起支承板12等),分離層14受到破壞進而可容易地分離支承板12與基板11。 The separation layer 14 may also contain a polymer having a light absorbing structure in its repeating unit. The polymer is degraded by irradiation with light. The deterioration of the polymer is produced by absorbing light that is irradiated onto the above configuration. As a result of the deterioration of the polymer, the separation layer 14 loses strength or adhesion before exposure to light. Therefore, by applying a little external force (for example, lifting the support plate 12 or the like), the separation layer 14 is broken and the support plate 12 and the substrate 11 can be easily separated.

具有光吸收性之上述構造係為吸收光而使含有該構造作為重複單位之聚合物進行變質之化學構造。該構造係例如由取代或非取代之苯環、縮合環或雜環所構成之含有共軛π電子系之原子團。更詳細而言,該構造可為卡多(cardo)構造,或存在於上述聚合物之側鏈上之二苯甲酮構造、二苯基亞碸構造、二苯基碸構造(雙苯基碸構造)、二苯基構造或二苯基胺構造。 The above structure having light absorbability is a chemical structure which absorbs light and deteriorates a polymer containing the structure as a repeating unit. This structure is, for example, a group containing a conjugated π-electron system composed of a substituted or unsubstituted benzene ring, a condensed ring or a heterocyclic ring. In more detail, the configuration may be a cardo structure, or a benzophenone structure present on the side chain of the above polymer, a diphenyl fluorene structure, a diphenyl fluorene structure (diphenyl fluorene) Construction), diphenyl structure or diphenylamine structure.

上述構造係存在上述聚合物之側鏈時,該構造係可由以下之式所表示。 When the above structure is a side chain of the above polymer, the structure can be represented by the following formula.

式中,R係各自獨立為烷基、芳基、鹵素、羥基、酮基、亞碸基、碸基或N(R1)(R2)(在此,R1及R2係各自獨立為氫原子或碳數1~5之烷基)、Z為不存在、或-CO-、-SO2-、-SO-或-NH-,n為0或1~5之整數。 Wherein R is each independently alkyl, aryl, halogen, hydroxy, keto, fluorenylene, fluorenyl or N(R 1 )(R 2 ) (here, R 1 and R 2 are each independently A hydrogen atom or an alkyl group having 1 to 5 carbon atoms, Z is absent, or -CO-, -SO 2 -, -SO- or -NH-, and n is an integer of 0 or 1 to 5.

又,上述聚合物係例如,含有以下之式中由(a)~(d)之任一者所表示之重複單位,或由(e)所表示者,或於其主鏈上含有(f)之構造。 Further, the polymer may, for example, contain a repeating unit represented by any one of (a) to (d) in the following formula, or may be represented by (e) or contain (f) in its main chain. Construction.

式中,l為1以上之整數,m為0或1~2之整數,X在(a)~(e)中則係上述“化1”所示之任一式,在(f)中則係上述之“化1”所示之任一式或不存在,Y1及Y2係各自獨立為-CO-或-SO2-。l較佳為10以下之整數。 In the formula, l is an integer of 1 or more, m is an integer of 0 or 1 to 2, and X is any one of the above-mentioned "Chemical 1" in (a) to (e), and is (f) Either or none of the above-mentioned "Chemical Formula 1", Y 1 and Y 2 are each independently -CO- or -SO 2 -. l is preferably an integer of 10 or less.

作為上述“化1”中所示之苯環、縮合環及雜環之例,可舉出如苯基、取代苯基、苄基、取代苄基、萘、取代萘、蒽、取代蒽、蒽醌、取代蒽醌、吖啶、取代吖啶、偶氮苯、取代偶氮苯、Fluorime、取代Fluorime、Fluorimone、取代Fluorimone、咔唑、取代咔唑、N-烷基咔唑、二苯并呋喃、取代二苯并呋喃、菲、取代菲、芘及取代芘。例示之取代基在受到取代時,其取代基係可選自 例如烷基、芳基、鹵素原子、烷氧基、硝基、醛基、氰基、醯胺基、二烷基胺基、磺醯胺、醯亞胺、羧基、羧基酯、磺酸、磺酸酯、烷基胺基及芳基胺基。 Examples of the benzene ring, the condensed ring and the hetero ring shown in the above "Chemical Formula 1" include a phenyl group, a substituted phenyl group, a benzyl group, a substituted benzyl group, a naphthalene group, a substituted naphthalene group, an anthracene group, a substituted fluorene group, and a fluorene group.醌, substituted anthracene, acridine, substituted acridine, azobenzene, substituted azobenzene, Fluorime, substituted Fluorime, Fluorimone, substituted Fluorimone, carbazole, substituted carbazole, N-alkylcarbazole, dibenzofuran Substituting dibenzofuran, phenanthrene, substituted phenanthrene, anthracene and substituted anthracene. When the exemplified substituent is substituted, the substituent may be selected from For example, alkyl, aryl, halogen atom, alkoxy group, nitro group, aldehyde group, cyano group, decylamino group, dialkylamino group, sulfonamide, quinone imine, carboxyl group, carboxyl ester, sulfonic acid, sulfonate An acid ester, an alkylamino group and an arylamine group.

作為上述“化1”所示之取代基中,具有2個苯基之第5個取代基且Z為-SO2-時之例,可舉出如雙(2,4-二羥基苯基)碸、雙(3,4-二羥基苯基)碸、雙(3,5-二羥基苯基)碸、雙(3,6-二羥基苯基)碸、雙(4-羥基苯基)碸、雙(3-羥基苯基)碸、雙(2-羥基苯基)碸、及雙(3,5-二甲基-4-羥基苯基)碸等。 Examples of the substituent represented by the above "Chemical Formula 1" include a fifth substituent of two phenyl groups and Z is -SO 2 -, and examples thereof include bis(2,4-dihydroxyphenyl). Anthraquinone, bis(3,4-dihydroxyphenyl)anthracene, bis(3,5-dihydroxyphenyl)anthracene, bis(3,6-dihydroxyphenyl)anthracene, bis(4-hydroxyphenyl)anthracene , bis(3-hydroxyphenyl)fluorene, bis(2-hydroxyphenyl)fluorene, and bis(3,5-dimethyl-4-hydroxyphenyl)hydrazine.

作為上述“化1”中所示之取代基中,具有2個苯基之第5個取代基且Z為-SO-時之例,可舉出如雙(2,3-二羥基苯基)亞碸、雙(5-氯-2,3-二羥基苯基)亞碸、雙(2,4-二羥基苯基)亞碸、雙(2,4-二羥基-6-甲基苯基)亞碸、雙(5-氯-2,4-二羥基苯基)亞碸、雙(2,5-二羥基苯基)亞碸、雙(3,4-二羥基苯基)亞碸、雙(3,5-二羥基苯基)亞碸、雙(2,3,4-三羥基苯基)亞碸、雙(2,3,4-三羥基-6-甲基苯基)-亞碸、雙(5-氯-2,3,4-三羥基苯基)亞碸、雙(2,4,6-三羥基苯基)亞碸、雙(5-氯-2,4,6-三羥基苯基)亞碸等。 Examples of the substituent represented by the above "Chemical Formula 1" include a fifth substituent of two phenyl groups and Z is -SO-, and examples thereof include bis(2,3-dihydroxyphenyl). Azulene, bis(5-chloro-2,3-dihydroxyphenyl)arylene, bis(2,4-dihydroxyphenyl)anthracene, bis(2,4-dihydroxy-6-methylphenyl) Anthraquinone, bis(5-chloro-2,4-dihydroxyphenyl)arylene, bis(2,5-dihydroxyphenyl)anthracene, bis(3,4-dihydroxyphenyl)anthracene, Bis(3,5-dihydroxyphenyl)anthracene, bis(2,3,4-trihydroxyphenyl)anthracene, bis(2,3,4-trihydroxy-6-methylphenyl)- Bismuth, bis(5-chloro-2,3,4-trihydroxyphenyl)arylene, bis(2,4,6-trihydroxyphenyl)arylene, bis(5-chloro-2,4,6- Trishydroxyphenyl) anthracene and the like.

作為上述“化1”中所示之取代基中,具有2個苯基之第5個取代基且Z為-C(=O)-時之例,可舉出如2,4-二羥基二苯甲酮、2,3,4-三羥基二苯甲酮、2,2’,4,4’-四羥基二苯甲酮、2,2’,5,6’-四羥基二苯甲酮、2-羥基-4-甲氧基二苯甲酮、2-羥基-4-辛氧基二苯甲 酮、2-羥基-4-十二氧基二苯甲酮、2,2’-二羥基-4-甲氧基二苯甲酮、2,6-二羥基-4-甲氧基二苯甲酮、2,2’-二羥基-4,4’-二甲氧基二苯甲酮、4-胺基-2’-羥基二苯甲酮、4-二甲基胺基-2’-羥基二苯甲酮、4-二乙基胺基-2’-羥基二苯甲酮、4-二甲基胺基-4’-甲氧基-2’-羥基二苯甲酮、4-二甲基胺基-2’,4’-二羥基二苯甲酮、及4-二甲基胺基-3’,4’-二羥基二苯甲酮等。 In the case where the substituent represented by the above "Chemical Formula 1" has a fifth substituent of two phenyl groups and Z is -C(=O)-, examples thereof include 2,4-dihydroxy group Benzene, 2,3,4-trihydroxybenzophenone, 2,2',4,4'-tetrahydroxybenzophenone, 2,2',5,6'-tetrahydroxybenzophenone 2-hydroxy-4-methoxybenzophenone, 2-hydroxy-4-octyloxybenzophenone Ketone, 2-hydroxy-4-dodecylbenzophenone, 2,2'-dihydroxy-4-methoxybenzophenone, 2,6-dihydroxy-4-methoxybenzophenone Ketone, 2,2'-dihydroxy-4,4'-dimethoxybenzophenone, 4-amino-2'-hydroxybenzophenone, 4-dimethylamino-2'-hydroxyl Benzophenone, 4-diethylamino-2'-hydroxybenzophenone, 4-dimethylamino-4'-methoxy-2'-hydroxybenzophenone, 4-dimethyl Amino-2',4'-dihydroxybenzophenone, and 4-dimethylamino-3',4'-dihydroxybenzophenone and the like.

上述構造係存在於上述聚合物之側鏈時,含有上述構造之重複單位於上述聚合物中所佔有之比例係在分離層14之光之穿透率在0.001~10%之範圍內者。若調製該聚合物使該比例收在此範圍,則分離層14可充分地吸收光,而確實且迅速地變質。即,可容易地由層合體10去除支承板12,而可縮短該去除所必須之光照射時間。 When the above structure is present in the side chain of the polymer, the ratio of the repeating unit containing the above structure to the polymer is such that the light transmittance of the separation layer 14 is in the range of 0.001 to 10%. If the polymer is prepared so that the ratio is within this range, the separation layer 14 can sufficiently absorb light and deteriorate qualitatively and rapidly. That is, the support plate 12 can be easily removed from the laminate 10, and the light irradiation time necessary for the removal can be shortened.

上述構造在根據其選擇之種類,可吸收具有所欲範圍之波長之光。例如,上述構造可吸收之光波長係以100~2000nm為較佳。此範圍中,上述構造可吸收之光波長為較短波長側,例如為100~500nm。例如,上述構造較佳係藉由吸收具有約300~370nm之波長之紫外光,而可使含有該構造之聚合物變質。 The above configuration absorbs light having a wavelength of a desired range depending on the type of the selection. For example, the wavelength of the light absorbable by the above structure is preferably from 100 to 2000 nm. In this range, the wavelength of the light absorbable by the above configuration is the shorter wavelength side, for example, 100 to 500 nm. For example, the above configuration preferably deteriorates the polymer containing the structure by absorbing ultraviolet light having a wavelength of about 300 to 370 nm.

上述構造可吸收之光係例如由高壓水銀燈(波長:254nm~436nm)、KrF準分子雷射(波長:248nm)、ArF準分子雷射(波長:193nm)、F2準分子雷射(波長:157nm)、XeCl雷射(308nm)、XeF雷射 (波長:351nm)或固體UV雷射(波長:355nm)所發射之光,或g線(波長:436nm)、h線(波長:405nm)或i線(波長:365nm)等。 The light absorbing structure of the above configuration is, for example, a high pressure mercury lamp (wavelength: 254 nm to 436 nm), a KrF excimer laser (wavelength: 248 nm), an ArF excimer laser (wavelength: 193 nm), and an F 2 excimer laser (wavelength: 157 nm), XeCl laser (308 nm), XeF laser (wavelength: 351 nm) or solid UV laser (wavelength: 355 nm), or g-line (wavelength: 436 nm), h-line (wavelength: 405 nm) or i line (wavelength: 365 nm) and the like.

上述分離層14係含有包含上述構造作為重複單位之聚合物,但分離層14係亦可含有上述聚合物以外之成分。作為該成分,可舉出如填料、可塑劑、及可提高支承板12剝離性之成分等。此等成分係可適宜選自不妨害或促進上述構造所致之光之吸收及聚合物變質之過往公知之物質或材料。 The separation layer 14 contains a polymer having the above-described structure as a repeating unit, but the separation layer 14 may contain components other than the above polymer. Examples of the component include a filler, a plasticizer, and a component which can improve the peelability of the support sheet 12. These components may be suitably selected from materials or materials which are not known to hinder or promote the absorption of light and the deterioration of the polymer by the above-mentioned structure.

(無機物) (inorganic matter)

分離層14係亦由無機物所成。分離層14藉由係由無機物所構成,而變為可藉由吸受光而變質,其結果係喪失受到光照射前之強度或接著性。因此,藉由施加些許外力(例如,提起支承板12等),分離層14受到破壞,而可容易地分離支承板12與基板11。 The separation layer 14 is also made of an inorganic substance. The separation layer 14 is made of an inorganic substance and can be deteriorated by light absorption and reception, and as a result, the strength or adhesion before the light irradiation is lost. Therefore, by applying a little external force (for example, lifting the support plate 12 or the like), the separation layer 14 is broken, and the support plate 12 and the substrate 11 can be easily separated.

上述無機物只要係藉由吸收光而變質之構成即可,例如,可適宜使用選自由金屬、金屬化合物及碳所成群之1種類以上之無機物。金屬化合物係指包含金屬原子之化合物,例如可為金屬氧化物、金屬氮化物。作為此般無機物之例示,雖並未限定於此等者,但可舉出如選自由金、銀、銅、鐵、鎳、鋁、鈦、鉻、SiO2、SiN、Si3N4、TiN、及碳所成群之1種類以上之無機物。尚且,碳係指亦可包含碳之同素異形體之概念,例如可為鑽石、 富勒烯、類鑽石碳、奈米碳管等。 The inorganic material may be formed by absorbing light, and for example, an inorganic substance selected from the group consisting of a metal, a metal compound, and carbon may be suitably used. The metal compound means a compound containing a metal atom, and may be, for example, a metal oxide or a metal nitride. Examples of such inorganic substances are not limited thereto, and may be, for example, selected from the group consisting of gold, silver, copper, iron, nickel, aluminum, titanium, chromium, SiO 2 , SiN, Si 3 N 4 , TiN. And inorganic substances of one or more types in which carbon is grouped. Furthermore, carbon refers to the concept of carbon allotropes, such as diamonds, fullerenes, diamond-like carbons, carbon nanotubes, and the like.

上述無機物係根據其種類而吸收具有固有範圍之波長之光。藉由對分離層照射分離層14中使用之無機物所可吸收之範圍波長之光,而可適宜地使上述無機物變質。 The inorganic substance absorbs light having a wavelength of an intrinsic range depending on the type thereof. The inorganic substance can be suitably deteriorated by irradiating the separation layer with light of a wavelength range which can be absorbed by the inorganic substance used in the separation layer 14.

作為照射由無機物所構成之分離層14之光,因應上述無機物可吸收之波長,例如適宜使用YAG雷射、紅寶石雷射、玻璃雷射、YVO4雷射、LD雷射、光纖雷射等之固體雷射、色素雷射等之液體雷射、CO2雷射、準分子雷射、Ar雷射、He-Ne雷射等之氣體雷射、半導體雷射、自由電子雷射等之雷射光、或非雷射光即可。 As the light for irradiating the separation layer 14 composed of an inorganic substance, for example, a YAG laser, a ruby laser, a glass laser, a YVO 4 laser, an LD laser, a fiber laser or the like is preferably used in consideration of the wavelength at which the inorganic substance can be absorbed. Laser lasers such as solid lasers, pigment lasers, CO 2 lasers, excimer lasers, Ar lasers, He-Ne lasers, semiconductor lasers, free electron lasers, etc. Or non-laser light.

由無機物所構成之分離層14係可藉由例如濺鍍、化學沉積(CVD)、鍍敷、電漿CVD、旋轉塗布等之公知技術而形成於支承板12上。由無機物所構成之分離層14之厚度並無特別限定,只要可充分吸收所使用之光之膜厚即可,例如以作成0.05~10μm之膜厚為佳。又,在由構成分離層14之無機物所構成之無機膜(例如,金屬膜)之兩面或單面上預先塗布接著劑,而貼附於支承板12及基板11亦可。 The separation layer 14 composed of an inorganic material can be formed on the support plate 12 by a known technique such as sputtering, chemical deposition (CVD), plating, plasma CVD, spin coating or the like. The thickness of the separation layer 14 composed of an inorganic material is not particularly limited as long as it can sufficiently absorb the film thickness of the light to be used, and for example, it is preferably a film thickness of 0.05 to 10 μm. Further, an adhesive may be applied to both sides or one surface of an inorganic film (for example, a metal film) composed of an inorganic material constituting the separation layer 14 to be attached to the support plate 12 and the substrate 11.

尚且,在使用金屬膜作為分離層14時,依據分離層14之膜質、雷射光源之種類、雷射輸出等之條件,可能引起雷射之反射或膜之帶電等。因此,以採取藉由在分離層14之上下或任一方設置防反射膜或防帶電膜等之對策為佳。 Further, when a metal film is used as the separation layer 14, the reflection of the laser or the charging of the film may be caused depending on the film quality of the separation layer 14, the type of the laser light source, and the laser output. Therefore, it is preferable to take measures such as providing an antireflection film or an antistatic film on the upper or lower side of the separation layer 14.

<具有紅外線吸收性構造之化合物> <Compound having an infrared absorbing structure>

分離層14係亦可由具有紅外線吸收性構造之化合物所形成。該化合物係藉由吸收紅外線而變質。作為化合物變質之結果,分離層14喪失受到紅外線照射前之強度或接著性。因此,藉由施加些許外力(例如,提起支承板12等),分離層14受到破壞而可容易地分離支承板12與基板11。 The separation layer 14 may also be formed of a compound having an infrared absorbing structure. This compound is degraded by absorption of infrared rays. As a result of the deterioration of the compound, the separation layer 14 loses strength or adhesion before being irradiated with infrared rays. Therefore, by applying a little external force (for example, lifting the support plate 12 or the like), the separation layer 14 is broken and the support plate 12 and the substrate 11 can be easily separated.

作為具有紅外線吸收性構造或包含具有紅外線吸收性構造之化合物,例如可為烷、烯(乙烯、反式、順式、亞乙烯、三取代、四取代、共軛、疊烯類、環式)、炔(一取代、二取代)、單環式芳香族(苯、一取代、二取代、三取代)、醇及酚類(自由OH、分子內氫鍵、分子間氫鍵、飽和第二級、飽和第三級、不飽和第二級、不飽和第三級)、縮醛、縮酮、脂肪族醚、芳香族醚、乙烯醚、環氧乙烷環醚、過氧化物醚、酮、二烷基羰基、芳香族羰基、1,3-二酮之乙醇、o-羥基芳基酮、二烷基醛、芳香族醛、羧基(二聚物、羧基陰離子)、蟻酸酯、乙酸酯、共軛酯、非共軛酯、芳香族酯、內酯(β-、γ-、δ-)、脂肪族酸氯化物、芳香族酸氯化物、酸酐(共軛、非共軛、環式、非環式)、第一級醯胺、第二級醯胺、內醯胺、第一級胺(脂肪族、芳香族)、第二級胺(脂肪族、芳香族)、第三級胺(脂肪族、芳香族)、第一級胺鹽、第二級胺鹽、第三級胺鹽、銨離子、脂肪族 腈、芳香族腈、碳二醯亞胺、脂肪族異腈、芳香族異腈、異氰酸酯、硫氰酸酯、脂肪族異硫氰酸酯、芳香族異硫氰酸酯、脂肪族硝基化合物、芳香族硝基化合物、硝基胺、亞硝基胺、硝酸酯、亞硝酸酯、亞硝基鍵(脂肪族、芳香族、單體、二聚物)、硫醇及硫酚及硫羥酸等之硫化合物、硫羰基、亞碸、碸、氯化磺醯基、第一級磺醯胺、第二級磺醯胺、硫酸酯、碳-鹵素鍵、Si-A1鍵(A1為H、C、O或鹵素)、P-A2鍵(A2為H、C或O)、或Ti-O鍵。 As the compound having an infrared absorbing structure or containing an infrared absorbing structure, for example, it may be an alkane or an alkene (ethylene, trans, cis, vinylidene, trisubstituted, tetrasubstituted, conjugated, alkene, or cyclic). , alkyne (monosubstituted, disubstituted), monocyclic aromatic (benzene, monosubstituted, disubstituted, trisubstituted), alcohol and phenol (free OH, intramolecular hydrogen bonding, intermolecular hydrogen bonding, saturated second stage , saturated third stage, unsaturated second stage, unsaturated third stage), acetal, ketal, aliphatic ether, aromatic ether, vinyl ether, oxirane ring ether, peroxide ether, ketone, Dialkylcarbonyl, aromatic carbonyl, 1,3-diketone ethanol, o-hydroxyaryl ketone, dialkyl aldehyde, aromatic aldehyde, carboxyl (dimer, carboxyl anion), formic acid ester, acetic acid Esters, conjugated esters, non-conjugated esters, aromatic esters, lactones (β-, γ-, δ-), aliphatic acid chlorides, aromatic acid chlorides, acid anhydrides (conjugated, non-conjugated, cyclic , acyclic, first-grade guanamine, second-grade guanamine, indoleamine, first-grade amine (aliphatic, aromatic), secondary amine (aliphatic, aromatic) Tertiary amine (aliphatic, aromatic), first-grade amine salt, second-grade amine salt, tertiary amine salt, ammonium ion, aliphatic nitrile, aromatic nitrile, carbodiimide, aliphatic Nitrile, aromatic isonitrile, isocyanate, thiocyanate, aliphatic isothiocyanate, aromatic isothiocyanate, aliphatic nitro compound, aromatic nitro compound, nitroamine, nitrosamine , nitrates, nitrites, nitroso bonds (aliphatic, aromatic, monomeric, dimer), sulfur compounds such as thiols and thiophenols and thiol acids, thiocarbonyls, hydrazine, hydrazine, chlorine Sulfonyl, first-stage sulfonamide, second-stage sulfonamide, sulfate, carbon-halogen bond, Si-A 1 bond (A 1 is H, C, O or halogen), PA 2 bond (A 2 is H, C or O), or a Ti-O bond.

作為上述包含碳-鹵素鍵之構造,例如可舉出如-CH2Cl、-CH2Br、-CH2I、-CF2-、-CF3、-CH=CF2、-CF=CF2、氟化芳基、及氯化芳基等。 Examples of the structure containing the carbon-halogen bond include, for example, -CH 2 Cl, -CH 2 Br, -CH 2 I, -CF 2 -, -CF 3 , -CH=CF 2 , -CF=CF 2 . , fluorinated aryl, and aryl chloride.

作為包含上述Si-A1鍵之構造,可舉出如SiH、SiH2、SiH3、Si-CH3、Si-CH2-、Si-C6H5、SiO脂肪族、Si-OCH3、Si-OCH2CH3、Si-OC6H5、Si-O-Si、Si-OH、SiF、SiF2、及SiF3等。作為包含Si-A1鍵之構造,特別係以形成矽氧烷骨架及倍半矽氧烷骨架為佳。 Examples of the structure including the Si—Al 1 bond include SiH, SiH 2 , SiH 3 , Si—CH 3 , Si—CH 2 —, Si—C 6 H 5 , SiO aliphatic, and Si—OCH 3 . Si—OCH 2 CH 3 , Si—OC 6 H 5 , Si—O—Si, Si—OH, SiF, SiF 2 , and SiF 3 . As the structure including the Si-A 1 bond, it is particularly preferable to form a siloxane chain and a sesquiterpene skeleton.

作為包含上述P-A2鍵之構造,可舉出如PH、PH2、P-CH3、P-CH2-、P-C6H5、A3 3-P-O(A3為脂肪族或芳香族)、(A4O)3-P-O(A4為烷基)、P-OCH3、P-OCH2CH3、P-OC6H5、P-O-P、P-OH、及O=P-OH等。 Examples of the structure including the above PA 2 bond include PH, PH 2 , P-CH 3 , P-CH 2 -, PC 6 H 5 , and A 3 3 -PO (A 3 is aliphatic or aromatic). (A 4 O) 3 -PO (A 4 is an alkyl group), P-OCH 3 , P-OCH 2 CH 3 , P-OC 6 H 5 , POP, P-OH, and O=P-OH.

上述構造根據其選擇之種類,可吸收具有所欲範圍之波長之紅外線。具體上,上述構造可吸收之紅外線之波長,例如在1μm~20μm之範圍內,可較適宜吸收 2μm~15μm之範圍內。並且,上述構造為Si-O鍵、Si-C鍵及Ti-O鍵時,可在9μm~11μm之範圍內。尚且,各構造能吸收之紅外線之波長只要係該業者即可輕易理解。例如,作為各構造中之吸收帶,可參照非專利文獻:SILVERSTEIN‧BASSLER‧MORRILL著「有機化合物之光譜測量辨識法(第5版)-MS、IR、NMR、UV之併用-」(1992年發行)第146頁~第151頁之記載。 The above structure absorbs infrared rays having a wavelength of a desired range depending on the type of the selection. Specifically, the wavelength of the infrared ray absorbable by the above structure is, for example, in the range of 1 μm to 20 μm, which is suitable for absorption. Within the range of 2 μm to 15 μm. Further, when the above structure is a Si—O bond, a Si—C bond, and a Ti—O bond, it may be in the range of 9 μm to 11 μm. Moreover, the wavelength of the infrared light that each structure can absorb can be easily understood by the industry. For example, as the absorption band in each structure, reference can be made to the non-patent literature: SILVERSTEIN‧BASSLER‧MORRILL "Spectral Measurement Identification of Organic Compounds (5th Edition) - Combination of MS, IR, NMR, UV-" (1992) Issued on pages 146 to 151.

作為分離層14之形成所使用之具有紅外線吸收性構造之化合物,具有上述般構造之化合物之中,只要係可溶解於用以塗布之溶媒且可固化形成固層者,即非係受到特別限定者。然而,為可有效地使分離層14中之化合物變質,且可容易地分離支承板12與基板11,以分離層14中之紅外線吸收較大,即,對分離層14照射紅外線時之紅外線穿透率係以低為佳。具體而言,以分離層14之紅外線之穿透率低於90%為佳,紅外線之穿透率低於80%為較佳。 The compound having an infrared absorbing structure used for the formation of the separation layer 14 is not particularly limited as long as it is soluble in the solvent to be coated and can be solidified to form a solid layer. By. However, in order to effectively deteriorate the compound in the separation layer 14, and the support plate 12 and the substrate 11 can be easily separated, the infrared absorption in the separation layer 14 is large, that is, the infrared ray is worn when the separation layer 14 is irradiated with infrared rays. The permeability is preferably low. Specifically, it is preferable that the transmittance of infrared rays of the separation layer 14 is less than 90%, and the transmittance of infrared rays is preferably less than 80%.

若舉出一例進行說明,作為具有矽氧烷骨架之化合物,例如可使用下述化學式(1)所表示之重複單位及下述化學式(2)所表示之重複單位之共聚物之樹脂,或下述化學式(1)所表示之重複單位及源自丙烯酸系化合物之重複單位之共聚物之樹脂。 As an example of the compound having a oxoxane skeleton, for example, a resin of a repeating unit represented by the following chemical formula (1) and a copolymer of a repeating unit represented by the following chemical formula (2), or A resin of a repeating unit represented by the chemical formula (1) and a copolymer derived from a repeating unit of an acrylic compound.

(化學式(2)中,R1為氫、碳數10以下之烷基、碳數10以下之烷氧基) (In the chemical formula (2), R 1 is hydrogen, an alkyl group having 10 or less carbon atoms, and an alkoxy group having 10 or less carbon atoms)

其中,作為具有矽氧烷骨架之化合物,亦以上述化學式(1)所表示之重複單位及下述化學式(3)所表示之重複單位之共聚物之tert-丁基苯乙烯(TBST)-二甲基矽氧烷共聚物為較佳,以1:1地包含上述式(1)所表示之重複單位及下述化學式(3)所表示之重複單位之TBST-二甲基矽氧烷共聚物為更佳。 In the above, as a compound having a oxoxane skeleton, a tert-butyl styrene (TBST)-two copolymer of a repeating unit represented by the above chemical formula (1) and a repeating unit represented by the following chemical formula (3) The methyl methoxy olefin copolymer is preferably a TBST-dimethyl siloxane copolymer containing the repeating unit represented by the above formula (1) and the repeating unit represented by the following chemical formula (3) in a ratio of 1:1. For better.

又,作為具有倍半矽氧烷骨架之化合物,例如可使用下述化學式(4)所表示之重複單位及下述化學式(5)所表示之重複單位之共聚物之樹脂。 In addition, as the compound having a sesquiterpene oxide skeleton, for example, a resin of a copolymer of a repeating unit represented by the following chemical formula (4) and a repeating unit represented by the following chemical formula (5) can be used.

(化學式(4)中,R2為氫或碳數1以上10以下之烷基,化學式(5)中,R3為碳數1以上10以下之烷基或苯基) (In the chemical formula (4), R 2 is hydrogen or an alkyl group having 1 or more and 10 or less carbon atoms, and in the chemical formula (5), R 3 is an alkyl group having 1 or more and 10 or less carbon atoms or a phenyl group)

作為具有倍半矽氧烷骨架之化合物,除此之外,可適宜利用專利文獻3:日本特開2007-258663號公報(2007年10月4日公開)、專利文獻4:日本特開2010-120901 號公報(2010年6月3日公開)、專利文獻5:日本特開2009-263316號公報(2009年11月12日公開)及專利文獻6:日本特開2009-263596號公報(2009年11月12日公開)中揭示之各倍半矽氧烷樹脂。 As a compound having a sesquiterpene oxyalkylene skeleton, Patent Document 3: JP-A-2007-258663 (published on October 4, 2007), and Patent Document 4: JP-A-2010- 120901 Japanese Patent Publication No. 2009-263316 (published on Nov. 12, 2009) and Patent Document 6: JP-A-2009-263596 (2009-11) Each sesquiterpene oxide resin disclosed in the publication of the month of the month.

其中,作為具有倍半矽氧烷骨架之化合物,亦以下述化學式(6)所表示之重複單位及下述化學式(7)所表示之重複單位之共聚物為佳,以7:3地含有下述化學式(6)所示之重複單位及下述化學式(7)所表示之重複單位之共聚物為更佳。 In addition, the compound having a sesquiterpene oxide skeleton is preferably a copolymer of the repeating unit represented by the following chemical formula (6) and a repeating unit represented by the following chemical formula (7), and is contained in a ratio of 7:3. The copolymer of the repeating unit represented by the chemical formula (6) and the repeating unit represented by the following chemical formula (7) is more preferable.

作為具有倍半矽氧烷骨架之聚合物,可為無規構造、梯型構造及籠型構造,亦可為任意之構造。 The polymer having a sesquiterpene skeleton may be a random structure, a ladder structure or a cage structure, or may have any structure.

又,作為包含Ti-O鍵之化合物,例如可舉出,(i)四-i-丙氧基鈦、四-n-丁氧基鈦、肆(2-乙基己氧基)鈦、及鈦-i-丙氧基辛二醇鹽等之烷氧基鈦、(ii)二-i-丙氧基‧雙(乙醯基丙酮酸根)鈦、及丙烷二氧基鈦雙(乙基乙醯乙酸根)等之螯合鈦、(iii)i-C3H7O-[-Ti(O-i-C3H7)2-O-]n-i-C3H7、及n-C4H9O-[-Ti(O-n-C4H9)2-O-]n-n-C4H9等之鈦聚合物、(iv)三-n-丁氧基鈦單硬脂 酸鹽、鈦硬脂酸鹽、二-i-丙氧基鈦二異硬脂酸鹽、及(2-n-丁氧基羰基苄醯氧基)三丁氧基鈦等之醯化鈦、(v)二-n-丁氧基‧雙(三乙醇胺根)鈦等之水溶性鈦化合物等。 Further, examples of the compound containing a Ti-O bond include (i) tetra-i-propoxytitanium, tetra-n-butoxytitanium, iridium (2-ethylhexyloxy)titanium, and Titanium alkoxide such as titanium-i-propoxyoctyl glycolate, (ii) titanium di-i-propoxy bis(ethylmercaptopyruvate), and propane dioxy titanium bis (ethyl ethyl Chelating titanium, such as hydrazine acetate, (iii) iC 3 H 7 O-[-Ti(OiC 3 H 7 ) 2 -O-] n -iC 3 H 7 , and nC 4 H 9 O-[-Ti (OnC 4 H 9 ) 2 -O-] n -nC 4 H 9 such as titanium polymer, (iv) tri-n-butoxy titanium monostearate, titanium stearate, di-i- a titanium oxytitanium diisostearate, and a titanium oxide such as (2-n-butoxycarbonylbenzyloxy) tributoxytitanium or the like, (v) di-n-butoxy bis ( A water-soluble titanium compound such as triethanolamine) titanium or the like.

其中,作為包含Ti-O鍵之化合物,亦以二-n-丁氧基‧雙(三乙醇胺根)鈦(Ti(OC4H9)2[OC2H4N(C2H4OH)2]2)為佳。 Among them, as a compound containing a Ti-O bond, bis-n-butoxy‧bis(triethanolamine)titanium (Ti(OC 4 H 9 ) 2 [OC 2 H 4 N(C 2 H 4 OH)) 2 ] 2 ) is better.

上述分離層14係含有具有紅外線吸收性構造之化合物,但分離層14亦可更含有上述化合物以外之成分。作為該成分,可舉出如填料、可塑劑、及可提升支承板12之剝離性之成分等。此等成分可適宜選自不妨害或促進上述構造所致之紅外線吸收及化合物之變質之過往公知之物質或材料。 The separation layer 14 contains a compound having an infrared absorbing structure, but the separation layer 14 may further contain components other than the above compounds. Examples of the component include a filler, a plasticizer, and a component which can improve the peelability of the support sheet 12. These components may be suitably selected from materials or materials which are not known to hinder or promote the infrared absorption due to the above structure and the deterioration of the compound.

(氟碳) (fluorocarbon)

分離層14係可由氟碳所成。分離層14藉由係由氟碳所構成,而變為可藉由吸收光而變質,其結果係喪失受到光照射之前強度或接著性。因此,藉由施加些許外力(例如,提起支承板12等),分離層14受破壞,而可容易地分離支承板12與基板11。 The separation layer 14 can be made of fluorocarbon. The separation layer 14 is made of fluorocarbon and can be deteriorated by absorbing light, and as a result, the strength or adhesion before being irradiated with light is lost. Therefore, by applying a little external force (for example, lifting the support plate 12 or the like), the separation layer 14 is broken, and the support plate 12 and the substrate 11 can be easily separated.

又,由另一觀點言之,構成分離層14之氟碳係可藉由電漿CVD法而適宜地成膜。尚且,氟碳係包含CxFy(全氟碳)及CxHyFz(x、y及z為整數),但不受限於此等,例如可為CHF3、CH2F2、C2H2F2、C4F8、 C2F6、C5F8等。又,對於用以構成分離層14所使用之氟碳,因應必要亦可添加氮、氦、氬等之惰性氣體、烷、烯等之烴,及氧、二氧化碳、氫。又,亦可將此等氣體複數混合後使用(氟碳、氫、氮之混合氣體等)。又,分離層14係可由單一種之氟碳所構成,亦可由2種類以上之氟碳所構成。 Further, from another point of view, the fluorocarbon constituting the separation layer 14 can be suitably formed by a plasma CVD method. Further, the fluorocarbon system includes C x F y (perfluorocarbon) and C x H y F z (x, y and z are integers), but is not limited thereto, and may be, for example, CHF 3 or CH 2 F 2 . C 2 H 2 F 2 , C 4 F 8 , C 2 F 6 , C 5 F 8 and the like. Further, as the fluorocarbon used to constitute the separation layer 14, an inert gas such as nitrogen, helium or argon, a hydrocarbon such as an alkene or an alkene, and oxygen, carbon dioxide or hydrogen may be added as necessary. Further, these gases may be mixed and used in combination (a mixed gas of fluorocarbon, hydrogen, nitrogen, etc.). Further, the separation layer 14 may be composed of a single type of fluorocarbon or may be composed of two or more types of fluorocarbons.

氟碳係根據其種類而吸收具有固有範圍之波長之光。藉由對分離層照射分離層14中使用之氟碳可吸收之範圍波長之光,可適宜地使氟碳變質。尚且,分離層14中之光吸收率係以80%以上為佳。 Fluorocarbon absorbs light having a wavelength within an intrinsic range depending on its kind. The fluorocarbon can be suitably deteriorated by irradiating the separation layer with light of a range wavelength which can be absorbed by the fluorocarbon used in the separation layer 14. Further, the light absorptivity in the separation layer 14 is preferably 80% or more.

作為對分離層14照射之光,因應氟碳可吸收之波長,例如適宜使用YAG雷射、紅寶石雷射、玻璃雷射、YVO4雷射、LD雷射、光纖雷射等之固體雷射、色素雷射等之液體雷射、CO2雷射、準分子雷射、Ar雷射、He-Ne雷射等之氣體雷射、半導體雷射、自由電子雷射等之雷射光或非雷射光即可。作為可使氟碳變質之波長,並非受限於此等者,例如可使用600nm以下之範圍者。 As the light irradiated to the separation layer 14, depending on the wavelength at which fluorocarbon can be absorbed, for example, a solid laser such as a YAG laser, a ruby laser, a glass laser, a YVO 4 laser, an LD laser, or a fiber laser is suitably used, Laser light, non-laser light such as liquid laser, CO 2 laser, excimer laser, Ar laser, He-Ne laser, etc., laser laser, semiconductor laser, etc. Just fine. The wavelength at which the fluorocarbon can be deteriorated is not limited thereto, and for example, a range of 600 nm or less can be used.

(紅外線吸收物質) (infrared absorbing material)

分離層14亦可含有紅外線吸收物質。分離層14藉由含有紅外線吸收物質而構成,而變為可藉由吸收光而變質,其結果係喪失受到光照射前之強度或接著性。因此,藉由施加些許外力(例如,提起支承板12等),分離層14受到破壞,而可容易地分離支承板12與基板11。 The separation layer 14 may also contain an infrared absorbing material. The separation layer 14 is formed by containing an infrared absorbing material, and can be deteriorated by absorbing light, and as a result, the strength or adhesion before being irradiated with light is lost. Therefore, by applying a little external force (for example, lifting the support plate 12 or the like), the separation layer 14 is broken, and the support plate 12 and the substrate 11 can be easily separated.

紅外線吸收物質只要係藉由吸受紅外線而變質之構成即可,可適宜使用例如碳黑、鐵粒子、或鋁粒子。紅外線吸收物質係根據其種類而吸收具有固有範圍之波長之光。藉由對分離層14照射分離層14中使用之紅外線吸收物質可吸收之範圍波長之光,而可使紅外線吸收物質適宜地變質。 The infrared absorbing material may be configured to be deteriorated by absorption of infrared rays, and for example, carbon black, iron particles, or aluminum particles can be suitably used. The infrared absorbing material absorbs light having a wavelength of an intrinsic range depending on the kind thereof. The infrared absorbing material can be suitably deteriorated by irradiating the separation layer 14 with light of a range wavelength which can be absorbed by the infrared absorbing material used in the separation layer 14.

〔接著層〕 [Next layer]

接著層13係為將基板11接著固定於支承板12之同時,覆蓋基板11之表面進行保護之構成。故,接著層在基板11之加工或搬送時,則有必要具有可維持基板11對於支承板12之固定、及被覆基板11之應保護之面的接著性及強度。另一方面,在基板11對於支承板12之固定變得不需要時,則必須係可從基板11容易地剝離或除去。 Next, the layer 13 is configured to cover the surface of the substrate 11 while the substrate 11 is subsequently fixed to the support plate 12. Therefore, in the processing or transport of the substrate 11 , it is necessary to maintain the adhesion and strength of the substrate 11 to be fixed to the support plate 12 and the surface to be protected by the substrate 11 . On the other hand, when the fixing of the substrate 11 to the support plate 12 becomes unnecessary, it is necessary to be easily peeled off or removed from the substrate 11.

因此,接著層13係由通常具有強固之接著性,藉由某種處理而使接著性降低,或對特定之溶劑具有可溶性之接著劑所構成。接著層13之厚度例如係以1~200μm為佳,以10~150μm為更佳。接著層13係可藉由將如以下所示般之接著材料以旋轉塗布法般之過往公知之方法塗布於基板11上而形成。 Therefore, the adhesive layer 13 is composed of an adhesive which is generally strong in adhesion, which is improved in adhesion by a certain treatment, or which is soluble in a specific solvent. The thickness of the layer 13 is preferably, for example, 1 to 200 μm, more preferably 10 to 150 μm. Next, the layer 13 can be formed by applying a material as described below to the substrate 11 by a conventionally known method such as spin coating.

作為接著劑,例如丙烯酸系、酚醛系、萘醌系、烴系、聚醯亞胺系等之該領域中公知之各種接著劑皆可使用作為構成本發明之接著層13之接著劑。以下,說明關於本實施形態中之接著層13所含有之樹脂之組成。 As the adhesive, various adhesives known in the art such as acrylic, phenolic, naphthoquinone, hydrocarbon, or polyimine can be used as an adhesive constituting the adhesive layer 13 of the present invention. Hereinafter, the composition of the resin contained in the adhesive layer 13 in the present embodiment will be described.

作為接著層13所含有之樹脂,只要係具備接著性者即可,例如可舉出烴樹脂、丙烯酸-苯乙烯系樹脂、馬來醯亞胺系樹脂等,或將此等組合者等。 The resin to be contained in the adhesive layer 13 may be, for example, a hydrocarbon resin, an acrylic-styrene resin, a maleic imine resin, or the like, or a combination thereof.

(烴樹脂) (hydrocarbon resin)

烴樹脂為具有烴骨架,且將單體組成物聚合而成之樹脂。作為烴樹脂,可舉出如環烯烴系聚合物(以下,亦有稱之為「樹脂(A)」之情況),以及選自由萜烯樹脂、松香系樹脂及石油樹脂所成群之至少1種樹脂(以下,亦有稱為「樹脂(B)」之情況)等,但並非受於此。 The hydrocarbon resin is a resin having a hydrocarbon skeleton and polymerizing the monomer composition. Examples of the hydrocarbon resin include a cycloolefin polymer (hereinafter also referred to as "resin (A)"), and at least one selected from the group consisting of terpene resins, rosin resins, and petroleum resins. The resin (hereinafter also referred to as "resin (B)") or the like is not limited thereto.

作為樹脂(A),亦可為將包含環烯烴系單體之單體成分予以聚合而成之樹脂。具體地可舉出如包含環烯烴系單體之單體成分之開環(共)聚合物、使包含環烯烴系單體之單體成分加成(共)聚合之樹脂等。 The resin (A) may be a resin obtained by polymerizing a monomer component containing a cycloolefin monomer. Specific examples thereof include a ring-opening (co)polymer containing a monomer component of a cycloolefin type monomer, and a resin obtained by addition (co)polymerization of a monomer component containing a cycloolefin type monomer.

作為構成樹脂(A)之單體成分所包含之前述環烯烴系單體,例如可舉出降莰烯、降莰二烯等之二環體、二環戊二烯、二羥基戊二烯等之三環體、四環十二烯等之四環體、環戊二烯三聚物等之五環體、四環戊二烯等之七環體、或此等多環體之烷基(甲基、乙基、丙基、丁基等)取代物、烯基(乙烯基等)取代物、亞烷基(乙烷基等)取代物、芳基(苯基、甲苯基、萘基等)取代物等。此等之中特別係以選自由降莰烯、四環十二烯、或此等烷基取代物所成群之降莰烯系單體為佳。 Examples of the cycloolefin-based monomer to be contained in the monomer component constituting the resin (A) include a bicyclic ring such as norbornene and norbornadiene, dicyclopentadiene, dihydroxypentadiene, and the like. a tetracyclic ring such as a tricyclic ring or a tetracyclododecene, a pentacyclic ring such as a cyclopentadiene terpolymer, a heptacyclic ring such as tetracyclopentadiene or an alkyl group of such a polycyclic ring ( Substituents such as methyl, ethyl, propyl or butyl, substituted by alkenyl (vinyl or the like), substituted by alkylene (such as ethane), or aryl (phenyl, tolyl, naphthyl, etc.) ) Substitutes, etc. Among these, a decene-based monomer selected from the group consisting of norbornene, tetracyclododecene, or an alkyl-substituted product thereof is particularly preferred.

構成樹脂(A)之單體成分亦可含有可與上述 環烯烴系單體共聚合之其他單體,例如以含有烯單體為佳。作為烯單體,例如可舉出乙烯、丙烯、1-丁烯、異丁烯、1-己烯、α-烯烴等。烯單體可為直鏈狀,亦可為分支鏈狀。 The monomer component constituting the resin (A) may also contain the above The other monomer copolymerized with the cycloolefin monomer is preferably, for example, an olefin monomer. Examples of the olefin monomer include ethylene, propylene, 1-butene, isobutylene, 1-hexene, and α-olefin. The olefin monomer may be linear or branched.

又,作為構成樹脂(A)之單體成分,由高耐熱性(低熱分解、熱重量減少性)之觀點,以含有環烯烴單體為佳。相對於構成樹脂(A)之單體成分全體之環烯烴單體之比例,以5莫耳%以上為佳,10莫耳%以上為較佳,20莫耳%以上為更佳。又,相對於構成樹脂(A)之單體成分全體之環烯烴單體之比例,雖並無特別限定,由溶解性及溶液中之經時安定性之觀點,以80莫耳%以下為佳,70莫耳%以下為較佳。 Further, the monomer component constituting the resin (A) is preferably a cycloolefin monomer from the viewpoint of high heat resistance (low thermal decomposition and thermogravimetric reduction). The ratio of the cycloolefin monomer to the entire monomer component constituting the resin (A) is preferably 5 mol% or more, more preferably 10 mol% or more, and still more preferably 20 mol% or more. In addition, the ratio of the cycloolefin monomer to the entire monomer component constituting the resin (A) is not particularly limited, and is preferably 80 mol% or less from the viewpoint of solubility and stability over time in the solution. 70 mol% or less is preferred.

又,作為構成樹脂(A)之單體成分,亦可含有直鏈狀或分支鏈狀之烯單體。相對於構成樹脂(A)之單體成分全體之烯單體之比例,由溶解性及柔軟性之觀點,以10~90莫耳%為佳,20~85莫耳%為較佳,30~80莫耳%為更佳。 Further, the monomer component constituting the resin (A) may contain a linear or branched olefin monomer. The ratio of the olefin monomer to the entire monomer component constituting the resin (A) is preferably from 10 to 90 mol%, more preferably from 20 to 85 mol%, from the viewpoint of solubility and flexibility. 80% of the moles is better.

尚且,樹脂(A)係例如使由環烯烴系單體與烯單體所構成之單體成分聚合而成之樹脂般,以不具有極性基之樹脂因可抑制在高溫下之氣體產生而為佳。 In addition, the resin (A) is, for example, a resin obtained by polymerizing a monomer component composed of a cycloolefin monomer and an olefin monomer, and a resin having no polar group can suppress generation of gas at a high temperature. good.

聚合單體成分時之聚合方法或聚合條件等,並無特別限制,依循常法適宜設定即可。 The polymerization method, polymerization conditions, and the like in the case of polymerizing the monomer component are not particularly limited, and may be appropriately set according to a usual method.

可作為樹脂(A)使用之市售品,例如可舉出聚塑膠公司製之「TOPAS」、三井化學公司製之 「APEL」、日本Zeon公司製之「ZEONOR」及「ZEONEX」、JSR公司製之「ARTON」等。 A commercially available product which can be used as the resin (A), for example, "TOPAS" manufactured by Polyplastics Co., Ltd., and manufactured by Mitsui Chemicals Co., Ltd. "APEL", "ZEONOR" and "ZEONEX" manufactured by Zeon Corporation of Japan, and "ARTON" manufactured by JSR Corporation.

樹脂(A)之玻璃轉移點(Tg)係以60℃以上為佳,70℃以上為特佳。樹脂(A)之玻璃轉移點若為60℃以上時,可更加抑制接著劑層合體曝露於高溫環境時接著劑層之軟化。 The glass transition point (Tg) of the resin (A) is preferably 60 ° C or higher, and particularly preferably 70 ° C or higher. When the glass transition point of the resin (A) is 60 ° C or more, the softening of the adhesive layer when the adhesive laminate is exposed to a high temperature environment can be further suppressed.

樹脂(B)為選自由萜烯系樹脂、松香系樹脂及石油樹脂所成群之至少1種樹脂。具體而言,萜烯系樹脂係例如可舉出萜烯樹脂、萜烯酚樹脂、變性萜烯樹脂、氫化萜烯樹脂、氫化萜烯酚樹脂等。松香系樹脂係例如可舉出松香、松香酯、氫化松香、氫化松香酯、聚合松香、聚合松香酯、變性松香等。石油樹脂係例如可舉出脂肪族或芳香族石油樹脂、氫化石油樹脂、變性石油樹脂、脂環族石油樹脂、薰草酮‧茚石油樹脂等。此等之中以氫化萜烯樹脂、氫化石油樹脂為較佳。 The resin (B) is at least one resin selected from the group consisting of terpene resins, rosin resins, and petroleum resins. Specifically, examples of the terpene-based resin include a terpene resin, a terpene phenol resin, a denatured terpene resin, a hydrogenated terpene resin, and a hydrogenated terpene phenol resin. Examples of the rosin-based resin include rosin, rosin ester, hydrogenated rosin, hydrogenated rosin ester, polymerized rosin, polymerized rosin ester, and denatured rosin. Examples of the petroleum resin include aliphatic or aromatic petroleum resins, hydrogenated petroleum resins, denatured petroleum resins, alicyclic petroleum resins, and xanthones and hydrazine petroleum resins. Among these, a hydrogenated terpene resin or a hydrogenated petroleum resin is preferred.

樹脂(B)之軟化點並無特別限定,以80~160℃為佳。樹脂(B)之軟化點若在80℃以上時,可更加抑制接著劑層合體曝露於高溫環境時之軟化,且不會產生接著不良。另一方面,樹脂(B)之軟化點在160℃以下時,剝離接著劑層合體時之剝離速度則成為良好者。 The softening point of the resin (B) is not particularly limited, and is preferably 80 to 160 °C. When the softening point of the resin (B) is at least 80 ° C, the softening of the adhesive laminate when exposed to a high temperature environment can be further suppressed, and no defects are caused. On the other hand, when the softening point of the resin (B) is 160 ° C or lower, the peeling speed at the time of peeling off the adhesive laminate is good.

樹脂(B)之分子量並無特別限定,以300~3000為佳。樹脂(B)之分子量若在300以上時,則成為耐熱性充分者,且高溫環境下之脫氣量亦變少。另一方面,樹脂(B)之分子量若在3000以下時,剝離接著劑 層合體時之剝離速度則成為良好者。尚且,本實施形態之樹脂(B)之分子量係意指以凝膠滲透層析法(GPC)所測量之以聚苯乙烯換算之分子量者。 The molecular weight of the resin (B) is not particularly limited, and is preferably from 300 to 3,000. When the molecular weight of the resin (B) is 300 or more, the heat resistance is sufficient, and the amount of degassing in a high temperature environment is also small. On the other hand, when the molecular weight of the resin (B) is 3,000 or less, the release agent is peeled off. The peeling speed at the time of the laminate is good. Further, the molecular weight of the resin (B) of the present embodiment means a molecular weight in terms of polystyrene measured by gel permeation chromatography (GPC).

尚且,作為樹脂,亦可使用將樹脂(A)與樹脂(B)混合者。藉由混合,耐熱性及剝離速度皆成為良好者。例如,作為樹脂(A)與樹脂(B)之混合比例,以(A):(B)=80:20~55:45(質量比)由於剝離速度、高溫環境時之熱耐性及柔軟性優良,故為佳。 Further, as the resin, a resin (A) and a resin (B) may be used in combination. By mixing, heat resistance and peeling speed are all good. For example, as a mixing ratio of the resin (A) and the resin (B), (A): (B) = 80: 20 to 55: 45 (mass ratio) is excellent in heat resistance and flexibility at a peeling speed and a high temperature environment. Therefore, it is better.

(嵌段共聚物) (block copolymer)

可構成本發明之層合體所具備之接著層之嵌段共聚物係為2種以上單體單位連續結合之嵌段部位進行結合之聚合物,亦有稱為嵌段共聚物之情況。 The block copolymer which can comprise the adhesive layer which consists of the laminated body of this invention is a polymer which couple|bonds the block site which the two or more monomer unit continuously couples, and is also called a block copolymer.

作為嵌段共聚物,可使用各種嵌段共聚物,例如可使用苯乙烯-異丁烯-苯乙烯嵌段共聚物(SIS)、苯乙烯-丁二烯-苯乙烯嵌段共聚物(SBS)、苯乙烯-丁二烯-丁烯-苯乙烯嵌段共聚物(SBBS)、苯乙烯-乙烯-丁烯-苯乙烯嵌段共聚物(SEBS)、苯乙烯-乙烯-丙烯-苯乙烯嵌段共聚物(苯乙烯-異丁烯-苯乙烯嵌段共聚物)(SEPS)、苯乙烯-乙烯-乙烯-丙烯-苯乙烯嵌段共聚物(SEEPS)等。 As the block copolymer, various block copolymers can be used, and for example, styrene-isobutylene-styrene block copolymer (SIS), styrene-butadiene-styrene block copolymer (SBS), benzene can be used. Ethylene-butadiene-butene-styrene block copolymer (SBBS), styrene-ethylene-butylene-styrene block copolymer (SEBS), styrene-ethylene-propylene-styrene block copolymer (Styrene-isobutylene-styrene block copolymer) (SEPS), styrene-ethylene-ethylene-propylene-styrene block copolymer (SEEPS), and the like.

可構成本發明之層合體所具備之接著層之嵌段共聚物中亦可鍵結至少1個含官能基之原子團。此般嵌段共聚物係例如可藉由對公知之嵌段共聚物使用變性劑使 該含官能基之原子團至少1個鍵結而得。 The block copolymer which can constitute the adhesive layer provided in the laminate of the present invention may also bond at least one functional group-containing atomic group. Such a block copolymer can be made, for example, by using a denaturant for a known block copolymer. The functional group-containing atomic group is obtained by bonding at least one.

含官能基之原子團係指包含1個以上官能基之原子團。作為本發明中含有官能基之原子團所包含之官能基,例如可舉出胺基、酸酐基(較佳為無水馬來酸基)、醯亞胺基、胺基甲酸乙酯基、環氧基、醯胺基、羥基、羧基、矽醇基、及烷氧基矽烷基(該烷氧基係以碳數1~6為佳)。本發明中,嵌段共聚物為彈性體且具有產生極性之官能基。本發明中,藉由含有具有至少1個含官能基之原子團之嵌段共聚物,可提升接著劑組成物之柔軟性及接著性。 The functional group-containing atomic group means an atomic group containing one or more functional groups. The functional group contained in the atomic group containing a functional group in the present invention may, for example, be an amine group, an acid anhydride group (preferably an anhydrous maleic acid group), an oxime imido group, an amino carboxylate group or an epoxy group. And a mercapto group, a hydroxyl group, a carboxyl group, a decyl alcohol group, and an alkoxyalkyl group (the alkoxy group is preferably a carbon number of 1 to 6). In the present invention, the block copolymer is an elastomer and has a functional group that generates polarity. In the present invention, the flexibility and adhesion of the adhesive composition can be improved by containing a block copolymer having at least one functional group-containing atomic group.

嵌段共聚物係以二嵌段共聚物或三嵌段共聚物為佳,以三嵌段共聚物為較佳。又,亦可組合使用二嵌段共聚物與三嵌段共聚物。藉此,可將使用接著劑組成物所形成之接著層之220℃下之損失係數(tan σ)作成1.1以下之最佳值。 The block copolymer is preferably a diblock copolymer or a triblock copolymer, and a triblock copolymer is preferred. Further, a diblock copolymer and a triblock copolymer may also be used in combination. Thereby, the loss coefficient (tan σ) at 220 ° C of the adhesive layer formed using the adhesive composition can be made into an optimum value of 1.1 or less.

又,嵌段共聚物係以包含苯乙烯基為佳,主鏈之兩末端係以苯乙烯基為更佳。其係由於藉由使熱安定性高之苯乙烯嵌段於兩末端,而可展示高耐熱性。 Further, the block copolymer is preferably a styrene group, and more preferably a styrene group at both ends of the main chain. This is because high heat resistance can be exhibited by blocking styrene blocks having high thermal stability at both ends.

嵌段共聚物之苯乙烯基含有量係以10重量%以上、65重量%以下為佳,以13重量%以上、45重量%以下為更佳。藉此,可將使用接著劑組成物所形成之接著層之23℃下之楊氏模數作成0.1GPa以上之最佳值。 The styrene group content of the block copolymer is preferably 10% by weight or more and 65% by weight or less, more preferably 13% by weight or more and 45% by weight or less. Thereby, the Young's modulus at 23 ° C of the adhesive layer formed using the adhesive composition can be made to be an optimum value of 0.1 GPa or more.

並且,嵌段共聚物之重量平均分子量係以50,000以上、150,000以下為佳,以60,000以上、 120,000以下為更佳。藉此,可將使用接著劑組成物所形成之接著層之220℃下之儲藏彈性率(G’)作成1×105Pa以下之最佳值。 Further, the weight average molecular weight of the block copolymer is preferably 50,000 or more and 150,000 or less, more preferably 60,000 or more and 120,000 or less. Thereby, the storage modulus (G') at 220 ° C of the adhesive layer formed using the adhesive composition can be made into an optimum value of 1 × 10 5 Pa or less.

又,嵌段共聚物之苯乙烯基含有量若在13重量%以上、50重量%以下,且嵌段共聚物之重量平均分子量在50,000以上、150,000以下時,因對烴系溶劑之溶解性優良,故較佳。藉此,在去除藉由此接著劑組成物所形成之接著層時,可使用烴系溶劑容易且迅速地去除。 In addition, when the styrene group content of the block copolymer is 13% by weight or more and 50% by weight or less, and the weight average molecular weight of the block copolymer is 50,000 or more and 150,000 or less, the solubility in the hydrocarbon solvent is excellent. Therefore, it is better. Thereby, when the adhesive layer formed by the adhesive composition is removed, the hydrocarbon-based solvent can be easily and quickly removed.

並且,嵌段共聚物係以氫化物為佳。若為氫化物,則對熱之安定性更加提升,且不容易引起分解或聚合等之變質。又,由對烴系溶劑之溶解性及對光阻溶劑之耐性之觀點,亦為較佳。 Further, the block copolymer is preferably a hydride. If it is a hydride, the stability to heat is further improved, and it is not easy to cause deterioration of decomposition or polymerization. Further, it is also preferable from the viewpoints of solubility in a hydrocarbon solvent and resistance to a photoresist solvent.

又,嵌段共聚物係以含有玻璃轉移點為23℃以下之單元為佳。嵌段共聚物藉由含有玻璃轉移點為23℃以下之單元,可將使用接著劑組成物所形成之接著層之23℃下之楊氏模數作成0.1GPa以上之最佳值。 Further, the block copolymer is preferably one having a glass transition point of 23 ° C or less. The block copolymer can have an Young's modulus at 23 ° C of an adhesive layer formed using the adhesive composition as an optimum value of 0.1 GPa or more by containing a unit having a glass transition point of 23 ° C or less.

嵌段共聚物係亦可混合複數之種類。即,本發明之接著劑組成物亦可包含複數種類之嵌段共聚物。複數種類之嵌段共聚物之中之至少一個係以包含苯乙烯基為佳。並且,複數種類之嵌段共聚物中之至少一個中,苯乙烯基含有量若在10重量%以上、65重量%以下之範圍,且複數種類之嵌段共聚物中至少一個中,重量平均分子量若在50,000以上、150,000以下之範圍,即為本發明之範疇。又,本發明之接著劑組成物中,包含複數種類之嵌段 共聚物時,混合結果、苯乙烯基之含有量亦可調整成為上述之範圍。 The block copolymer may also be a mixture of plural types. That is, the adhesive composition of the present invention may also comprise a plurality of types of block copolymers. It is preferred that at least one of the plurality of types of block copolymers contains a styrene group. Further, in at least one of the plurality of types of block copolymers, the styryl group content is in the range of 10% by weight or more and 65% by weight or less, and at least one of the plurality of kinds of block copolymers, the weight average molecular weight If it is in the range of 50,000 or more and 150,000 or less, it is the scope of the present invention. Further, the adhesive composition of the present invention comprises a plurality of blocks In the case of the copolymer, the mixing result and the content of the styrene group can be adjusted to the above range.

(丙烯酸-苯乙烯系樹脂) (acrylic-styrene resin)

作為丙烯酸-苯乙烯系樹脂,例如可舉出使用苯乙烯或苯乙烯之衍生物,與(甲基)丙烯酸酯等作為單體聚合而成之樹脂。 The acrylic-styrene-based resin may, for example, be a resin obtained by polymerizing a monomer such as styrene or styrene and a (meth) acrylate.

作為(甲基)丙烯酸酯,例如可舉出由鏈式構造所構成之(甲基)丙烯酸烷基酯、具有脂肪族環之(甲基)丙烯酸酯、具有芳香族環之(甲基)丙烯酸酯。作為由鏈式構造所構成之(甲基)丙烯酸烷基酯,可舉出具有碳數15~20之烷基之丙烯酸系長鏈烷基酯、具有碳數1~14之烷基之丙烯酸系烷基酯等。作為丙烯酸系長鏈烷基酯,可舉出烷基為n-十五基、n-十六基、n-十七基、n-十八基、n-十九基、n-二十基等之丙烯酸或甲基丙烯酸之烷基酯。尚且,該烷基亦可為分支狀。 Examples of the (meth) acrylate include (meth)acrylic acid alkyl ester composed of a chain structure, (meth) acrylate having an aliphatic ring, and (meth)acrylic acid having an aromatic ring. ester. Examples of the alkyl (meth)acrylate composed of a chain structure include an acrylic long-chain alkyl ester having an alkyl group having 15 to 20 carbon atoms, and an acrylic acid having an alkyl group having 1 to 14 carbon atoms. Alkyl esters and the like. As the acrylic long-chain alkyl ester, an alkyl group is an n-pentadecyl group, an n-hexadecyl group, an n-heptadecyl group, an n-octadecyl group, an n-n-19 group, and an n-tetradecyl group. An alkyl ester of acrylic acid or methacrylic acid. Still, the alkyl group may also be branched.

作為具有碳數1~14之烷基之丙烯酸系烷基酯,可舉出如既存之丙烯酸系接著劑所使用之公知丙烯酸系烷基酯。例如,烷基為由甲基、乙基、丙基、丁基、2-乙基己基、異辛基、異壬基、異癸基、十二基、月桂基、十三基等所構成之丙烯酸或甲基丙烯酸之烷基酯。 The acrylic alkyl ester having an alkyl group having 1 to 14 carbon atoms may, for example, be a known acrylic alkyl ester used in an existing acrylic adhesive. For example, an alkyl group is composed of a methyl group, an ethyl group, a propyl group, a butyl group, a 2-ethylhexyl group, an isooctyl group, an isodecyl group, an isodecyl group, a dodecyl group, a lauryl group, a thirteen group, or the like. An alkyl ester of acrylic acid or methacrylic acid.

作為具有脂肪族環之(甲基)丙烯酸酯,可舉出如環己基(甲基)丙烯酸酯、環戊基(甲基)丙烯酸酯、1-金剛烷基(甲基)丙烯酸酯、降莰基(甲基)丙烯 酸酯、異莰基(甲基)丙烯酸酯、三環癸基(甲基)丙烯酸酯、四環十二基(甲基)丙烯酸酯、二環戊基(甲基)丙烯酸酯等,以異莰基甲基丙烯酸酯、二環戊基(甲基)丙烯酸酯為較佳。 Examples of the (meth) acrylate having an aliphatic ring include cyclohexyl (meth) acrylate, cyclopentyl (meth) acrylate, 1-adamantyl (meth) acrylate, and hydrazine. (meth) propylene Acid ester, isodecyl (meth) acrylate, tricyclodecyl (meth) acrylate, tetracyclododecyl (meth) acrylate, dicyclopentyl (meth) acrylate, etc. Mercapto methacrylate and dicyclopentyl (meth) acrylate are preferred.

作為具有芳香族環之(甲基)丙烯酸酯,並非係受到特別限定者,作為芳香族環,例如可舉出苯基、苄基、甲苯基、茬基、聯苯基、萘基、蒽基、苯氧基甲基、苯氧基乙基等。又,芳香族環亦可具有碳數1~5之鏈狀或分支狀之烷基。具體而言,以苯氧基乙基丙烯酸酯為佳。 The (meth) acrylate having an aromatic ring is not particularly limited, and examples of the aromatic ring include a phenyl group, a benzyl group, a tolyl group, a fluorenyl group, a biphenyl group, a naphthyl group, and a fluorenyl group. , phenoxymethyl, phenoxyethyl and the like. Further, the aromatic ring may have a chain or branched alkyl group having 1 to 5 carbon atoms. Specifically, phenoxyethyl acrylate is preferred.

(馬來醯亞胺系樹脂) (Malay ylide resin)

作為馬來醯亞胺系樹脂,例如可舉出如,將作為單體之N-甲基馬來醯亞胺、N-乙基馬來醯亞胺、N-n-丙基馬來醯亞胺、N-異丙基馬來醯亞胺、N-n-丁基馬來醯亞胺、N-異丁基馬來醯亞胺、N-sec-丁基馬來醯亞胺、N-tert-丁基馬來醯亞胺、N-n-戊基馬來醯亞胺、N-n-己基馬來醯亞胺、N-n-庚基馬來醯亞胺、N-n-辛基馬來醯亞胺、N-月桂基馬來醯亞胺、N-硬脂酸基馬來醯亞胺等之具有烷基之馬來醯亞胺、N-環丙基馬來醯亞胺、N-環丁基馬來醯亞胺、N-環戊基馬來醯亞胺、N-環己基馬來醯亞胺、N-環庚基馬來醯亞胺、N-環辛基馬來醯亞胺等之具有脂肪族烴基之馬來醯亞胺、N-苯基馬來醯亞胺、N-m-甲基苯基馬來醯亞胺、N-o-甲基苯基馬來醯亞胺、N-p-甲基苯基馬來醯亞胺 等之具有芳基之芳香族馬來醯亞胺等予以聚合而得之樹脂。 Examples of the maleic imine-based resin include, for example, N-methyl maleimide, N-ethyl maleimide, and Nn-propyl maleimide as monomers. N-isopropylmaleimide, Nn-butylmaleimide, N-isobutylmaleimide, N-sec-butylmaleimide, N-tert-butyl Maleidin, Nn-pentylmaleimide, Nn-hexylmaleimide, Nn-heptylmaleimide, Nn-octylmaleimide, N-lauryl horse An alkylene-containing maleimide, N-cyclopropylmaleimide, N-cyclobutylmaleimide, etc., such as imine, N-stearic acid, maleimide, etc. An aliphatic hydrocarbon group such as N-cyclopentylmaleimide, N-cyclohexylmaleimide, N-cycloheptylmaleimide, N-cyclooctylmaleimide, etc.醯imine, N-phenylmaleimide, Nm-methylphenylmaleimide, No-methylphenylmaleimide, Np-methylphenylmaleimide A resin obtained by polymerizing an aromatic maleic imine or the like having an aryl group.

例如,亦可將下述化學式(8)所表示之重複單位及下述化學式(9)所表示之重複單位之共聚物之環烯烴共聚物使用作為接著成分之樹脂。 For example, a cyclic olefin copolymer of a copolymer represented by the following chemical formula (8) and a repeating unit represented by the following chemical formula (9) may be used as a resin.

(化學式(9)中,n為0或1~3之整數)。 (In the chemical formula (9), n is an integer of 0 or 1 to 3).

作為此般環烯烴共聚物,可使用如APL 8008T、APL 8009T、及APL 6013T(皆為三井化學公司製)等。 As such a cyclic olefin copolymer, for example, APL 8008T, APL 8009T, and APL 6013T (all manufactured by Mitsui Chemicals, Inc.) and the like can be used.

尚且,以使用光硬化性樹脂(例如,UV硬化性樹脂)以外之樹脂形成接著層13為佳。而此係由於光硬化性樹脂在接著層13之剝離或除去後,會有作為殘渣殘留於基板11之微小凹凸之周邊之情況。尤其,以可溶解於特定之溶劑之接著劑作為構成接著層13之材料為佳。而此係由於可不對基板11施加物理性之力,即可藉由使接著層13溶解於溶劑而除去。在除去接著層13時,即使係從強度已降低之基板11,亦不使基板11破損或變形而可容易地去除接著層13。 Further, it is preferable to form the adhesive layer 13 using a resin other than a photocurable resin (for example, a UV curable resin). On the other hand, after the photocurable resin is peeled off or removed from the adhesive layer 13, the residue may remain as a residue around the minute unevenness of the substrate 11. In particular, it is preferred to use a binder which is soluble in a specific solvent as the material constituting the adhesive layer 13. On the other hand, since the physical force can be applied to the substrate 11, the adhesive layer 13 can be removed by dissolving it in a solvent. When the adhesive layer 13 is removed, the adhesive layer 13 can be easily removed without breaking or deforming the substrate 11 from the substrate 11 having reduced strength.

作為形成上述分離層、接著層時之稀釋溶劑,例如可舉出,己烷、庚烷、辛烷、壬烷、甲基辛烷、癸烷、十一烷、十二烷、十三烷等之直鏈狀之烴、碳數3至15之分支狀烴、p-薄荷烷、o-薄荷烷、m-薄荷烷、二苯基薄荷烷、1,4-萜二醇、1,8-萜二醇、莰烷、降莰烷、蒎烷、側柏烷、calane、長葉烯、香葉醇、橙花醇、沈香醇、檸檬醛、香茅醇、薄荷醇、異薄荷醇、新薄荷醇、α-萜品醇、β-萜品醇、γ-萜品醇、萜品烯-1-醇、萜品烯-4-醇、乙酸二氫乙烯松香酯、1,4-桉油酚、1,8-桉油酚、莰醇、香旱芹酮、芝香酮、側柏酮、樟腦、d-薴烯、1-薴烯、茴香帖等之萜烯系溶劑;γ-丁內酯等之內酯類;丙酮、甲基乙基酮、環己酮(CH)、甲基-n-戊基酮、甲基異戊基酮、2-庚酮等之酮類;乙二醇、二乙二醇、丙二醇、二丙二醇等之多元醇類;乙二醇單乙酸酯、二乙二醇單乙酸酯、丙二醇單乙酸酯、或二丙二醇單乙酸酯等之具有酯鍵之化合物、前述多元醇類或前述具有酯鍵之化合物之單甲基醚、單乙基醚、單丙基醚、單丁基醚等之單烷基醚或單苯基醚等之具有醚鍵之化合物等之多元醇類之衍生物(此等之中亦以丙二醇單甲基醚乙酸酯(PGMEA)、丙二醇單甲基醚(PGME)為佳);二噁烷般之環式醚類,或乳酸甲酯、乳酸乙酯(EL)、乙酸甲酯、乙酸乙酯、乙酸丁酯、甲氧基丁基乙酸酯、丙酮酸甲酯、丙酮酸乙酯、甲氧基丙酸甲酯、乙氧基丙酸乙酯等之酯類;茴香醚、乙基苄基醚、甲苯酚基甲基醚、二苯基醚、二苄基 醚、苯乙醚、丁基苯基醚等之芳香族系有機溶劑、縮合多環式烴等。 Examples of the diluent solvent for forming the separation layer and the subsequent layer include hexane, heptane, octane, decane, methyl octane, decane, undecane, dodecane, tridecane, and the like. a linear hydrocarbon, a branched hydrocarbon having 3 to 15 carbon atoms, p-menthane, o-menthane, m-menthane, diphenylmethane, 1,4-decanediol, 1,8- Decylene glycol, decane, norbornane, decane, oxane, calane, longene, geraniol, nerol, linalool, citral, citronellol, menthol, isomenthol, new Menthol, α-terpineol, β-terpineol, γ-terpineol, terpinene-1-ol, terpinene-4-ol, dihydroethylene rosin acetate, 1,4-anthracene oil a terpene solvent such as phenol, 1,8-nonyl phenol, decyl alcohol, humulone, citricone, thuja ketone, camphor, d-pinene, 1-decene, fennel, etc.; γ-butyl Lactones such as lactones; ketones such as acetone, methyl ethyl ketone, cyclohexanone (CH), methyl-n-amyl ketone, methyl isoamyl ketone, 2-heptanone; Polyols such as alcohol, diethylene glycol, propylene glycol, dipropylene glycol, etc.; ethylene glycol monoacetate, diethylene glycol monoacetate a compound having an ester bond such as propylene glycol monoacetate or dipropylene glycol monoacetate; a monomethyl ether, a monoethyl ether, a monopropyl ether or a monobutyl group of the aforementioned polyol or a compound having the above ester bond; a derivative of a polyhydric alcohol such as a monoalkyl ether or a monophenyl ether or the like having an ether bond, etc. (such as propylene glycol monomethyl ether acetate (PGMEA), propylene glycol monomethyl Ethyl ether (PGME) is preferred; dioxane-like cyclic ethers, or methyl lactate, ethyl lactate (EL), methyl acetate, ethyl acetate, butyl acetate, methoxybutyl acetate Ester, methyl pyruvate, ethyl pyruvate, methyl methoxypropionate, ethyl ethoxy propionate, etc.; anisole, ethyl benzyl ether, cresyl methyl ether, diphenyl Ether, dibenzyl An aromatic organic solvent such as ether, phenethyl ether or butylphenyl ether, or a condensed polycyclic hydrocarbon.

縮合多環式烴係指2個以上之單環可互相單供給一個各自之環之邊之縮合環之烴,亦已使用2個單環經縮合而成之烴為佳。 The condensed polycyclic hydrocarbon means a hydrocarbon in which two or more monocyclic rings can be supplied to each other in a condensed ring of the respective rings, and it is preferred to use two monocyclic condensed hydrocarbons.

作為此般烴,可舉出5員環及6員環之組合,或2個6員環之組合。作為組合有5員環及6員環之烴,例如可舉出茚、戊搭烯、二氫茚、四氫茚等,作為組合有2個6員環之烴,例如可舉出萘、四氫萘(teralin)及十氫萘(decalin)等。 As such a hydrocarbon, a combination of a 5-member ring and a 6-member ring, or a combination of two 6-member rings may be mentioned. Examples of the hydrocarbon in which a 5-membered ring and a 6-membered ring are combined include hydrazine, pentene, indoline, and tetrahydroanthracene. Examples of the hydrocarbon having two 6-membered rings are combined, and examples thereof include naphthalene and tetrahydrogen. Terenain and decalin.

〔保護層〕 〔The protective layer〕

保護層15係在分離層14之表面且未與支承板12接著之面之中至少覆蓋未與接著層13重疊之面者。保護層15係可保護分離層14免於例如因光阻剝離處理(光阻剝離步驟)等之高溫且長時間之藥品處理,或於其後施行在高溫(例如260℃)下之加熱處理步驟所導致之分離層14之變質。 The protective layer 15 is on the surface of the separation layer 14 and does not cover at least the surface that is not overlapped with the adhesive layer 13 among the faces of the support plate 12. The protective layer 15 protects the separation layer 14 from a high-temperature and long-time drug treatment such as a photoresist stripping treatment (photoresist stripping step), or a heat treatment step at a high temperature (for example, 260 ° C) thereafter. The resulting separation layer 14 is deteriorated.

保護層15所覆蓋分離層14之面只要係包含在分離層14之表面且未與支承板12接著之面之中之至少未與接著層13重疊之面即可。 The surface of the separation layer 14 covered by the protective layer 15 may be any surface that is included on the surface of the separation layer 14 and that is not overlapped with the adhesion layer 13 in at least the surface of the support sheet 12.

即,本實施形態中,保護層15係亦可覆蓋在分離層14之表面且未與支承板12接著之面中與接著層13重疊之面。但,本發明之層合體所具備之保護層並非 係受限於此種形態,亦可在分離層之表面且未與支撐體接著之面中單僅覆蓋未與接著層重疊之面。於任一之構成中,由於在至少分離層之表面且未與支撐體(支承板)接著之面中至少覆蓋未與接著層重疊之面,故可保護分離層免於因光阻剝離處理等之高溫且長時間之藥品處理所導致之變質。 That is, in the present embodiment, the protective layer 15 may cover the surface of the separation layer 14 and not overlap the surface of the support layer 12 with the adhesion layer 13. However, the protective layer of the laminate of the present invention is not It is limited to such a form, and it is also possible to cover only the surface which is not overlapped with the subsequent layer on the surface of the separation layer and the surface which is not in contact with the support. In any of the configurations, since at least the surface of the separation layer and the surface which is not adjacent to the support (support plate) are covered with at least the surface which is not overlapped with the adhesion layer, the separation layer can be protected from the photoresist peeling treatment or the like. The deterioration caused by high temperature and long-term drug treatment.

作為形成保護層15之材料,可因應對層合體10施行之處理適宜選擇。即,適宜選擇對於該處理中使用之藥品、施行該處理之環境具有耐性之材料即可。例如,若係將層合體10提供至高溫且長時間之光阻剝離步驟時,選擇對該步驟中使用之剝離液具有耐性者即可。 The material for forming the protective layer 15 can be appropriately selected for the treatment to be performed by the laminate 10. That is, it is preferable to select a material which is resistant to the drug used in the treatment and the environment in which the treatment is performed. For example, if the laminate 10 is supplied to a high temperature and long time photoresist peeling step, it is sufficient to select resistance to the stripping liquid used in the step.

作為形成保護層15之材料之具體例,例如可舉出接著劑。其係因為可提高與接著層13之接著性。 Specific examples of the material for forming the protective layer 15 include an adhesive. This is because the adhesion to the adhesive layer 13 can be improved.

保護層15係以接著劑構成時,該接著劑係亦可為與構成接著層13之接著劑為相同組成者。作為構成接著層13之接著劑係如上述般,因係選擇對於剝離液等具有耐藥品性者,若以此般接著劑形成保護層15,即可良好地保護分離層14。 When the protective layer 15 is formed of an adhesive, the adhesive may be the same composition as the adhesive constituting the adhesive layer 13. As the above-mentioned adhesive agent constituting the adhesive layer 13, as described above, since the chemical resistance to the peeling liquid or the like is selected, if the protective layer 15 is formed by the above-described adhesive, the separation layer 14 can be favorably protected.

又,構成保護層15之接著劑亦係與構成接著層13之接著劑為相異組成者。但,即使此種接著劑,仍以成為構成接著層13之接著劑之候補者之接著劑為更佳。作為構成接著層13之接著劑係如上述般,因係可選自由對剝離液等具有耐藥品性者,若以成為此般接著劑之候補者之接著劑形成保護層15,即可良好地保護分離層 14。 Further, the adhesive constituting the protective layer 15 is also a composition different from the adhesive constituting the adhesive layer 13. However, even if such an adhesive is used, it is more preferable as an adhesive which is a candidate for the adhesive constituting the adhesive layer 13. As the above-mentioned adhesive agent constituting the adhesive layer 13, as described above, it is possible to form a protective layer 15 by using an adhesive which is a candidate for the above-mentioned adhesive, since it is preferable to have a chemical resistance to a peeling liquid or the like. Protective separation layer 14.

作為構成保護層15之材料之具體例,例如可舉出嵌段共聚物、環烯烴系聚合物等。此等可單獨使用,亦可將複數種類混合使用。嵌段共聚物及環烯烴系聚合物之說明係依上述接著層13中實行之各成分之說明為準。 Specific examples of the material constituting the protective layer 15 include a block copolymer and a cycloolefin polymer. These may be used alone or in combination of plural types. The description of the block copolymer and the cycloolefin polymer is based on the description of each component carried out in the above-mentioned subsequent layer 13.

保護層15之膜之厚度,例如以1~10μm為佳。保護層15之膜之厚度藉由在1μm以上,可使保護層15良好地承受高溫且長時間之各種藥品處理。保護層15之膜之厚度藉由在10μm以下,在從層合體分離基板11之步驟中,可良好地分離基板11。 The thickness of the film of the protective layer 15 is preferably, for example, 1 to 10 μm. By the thickness of the film of the protective layer 15 being 1 μm or more, the protective layer 15 can be favorably subjected to high-temperature and long-time treatment of various chemicals. The thickness of the film of the protective layer 15 is preferably 10 μm or less, and the substrate 11 can be well separated in the step of separating the substrate 11 from the laminate.

<層合體之製造方法> <Method of Manufacturing Laminated Body>

其次,使用圖2說明關於本發明之層合體之製造方法。圖2為展示本發明之層合體之製造方法之一實施形態圖。 Next, a method of manufacturing the laminate of the present invention will be described using FIG. Fig. 2 is a view showing an embodiment of a method for producing a laminate of the present invention.

如上述般,本發明之層合體所具備之保護層係在分離層之表面且未與支撐體接著之面中至少包含未與接著層重疊之面即可,例如,亦可為在分離層之表面且未與支撐體接著之面中覆蓋與接著層重疊之面者,又,亦可在分離層之表面且未與支撐體接著之面中單僅覆蓋未與接著層重疊之面,本實施形態中,如層合體10所示,係說明關於製造在分離層之表面且未與支撐體接著之面中亦覆蓋與接著層重疊之面者之情況。 As described above, the protective layer provided in the laminate of the present invention may be on the surface of the separation layer and may not include at least a surface which is not overlapped with the subsequent layer, and may be, for example, in the separation layer. The surface is not covered with the surface of the support layer, and the surface overlapping the adhesion layer may be covered on the surface of the separation layer, and the surface not overlapped with the adhesion layer may be covered only on the surface of the separation layer. In the form, as shown in the laminate 10, the case where the surface of the separation layer is produced and the surface which is not overlapped with the support body is also covered with the surface of the adhesion layer is described.

本發明之層合體之製造方法之一實施形態係 包含:於支承板12上形成因吸收光而變質之分離層14之分離層形成步驟;於基板11上形成接著層13之接著層形成步驟;依基板11、接著層13、分離層14、支承板12之順序進行層合之層合步驟;且在層合步驟之前更包含於上述層合步驟中使其層合時,在上述分離層14之表面且未與支承板12接著之面之中,形成至少覆蓋未與接著層13重疊之面之保護層的保護層15形成步驟。 One embodiment of the method for producing a laminate of the present invention The method includes the steps of: forming a separation layer on the support plate 12 to form a separation layer 14 which is deteriorated by absorbing light; forming an adhesion layer on the substrate 11 to form an adhesion layer 13; and the substrate 11, the adhesion layer 13, the separation layer 14, and the support The laminating step of laminating the sheets 12; and further including laminating in the laminating step before the laminating step, on the surface of the separating layer 14 and not in the vicinity of the supporting plate 12 A protective layer 15 forming step of forming a protective layer covering at least the surface not overlapping the adhesive layer 13 is formed.

〔分離層形成步驟〕 [Separation layer forming step]

分離層形成步驟係指如圖2所示般地在支承板12上形成因吸收光而變質之分離層14之步驟。作為分離層形成步驟之具體方法,例如,在以氟碳形成分離層14時,可舉出使用電漿CVD法之方法。 The separation layer forming step refers to a step of forming a separation layer 14 which is deteriorated by absorption of light on the support plate 12 as shown in FIG. As a specific method of the separation layer forming step, for example, when the separation layer 14 is formed of fluorocarbon, a method using a plasma CVD method can be mentioned.

〔接著層形成步驟〕 [Next layer formation step]

接著層形成步驟係在基板11上形成接著層13。如圖2所示般,於基板11上旋轉塗布以前述烴系樹脂為主成分且溶解於溶劑中之接著劑。且,可舉出藉由使溫度上昇並進行階段性烘烤而使接著劑固化,形成接著層13之步驟為例。尚且,本發明之層合體之製造方法中之接著層形成步驟只要係在基板上或分離層上形成接著層即可。即,可如本實施形態般地在基板11上形成接著層13,亦可在分離層上形成接著層。在分離層上形成接著層之形態時,在分離層之面且未接觸支撐層之面中,在未形成接著層而 露出之面上形成後述之保護層即可。 The layer forming step is followed by forming an adhesive layer 13 on the substrate 11. As shown in FIG. 2, an adhesive containing the hydrocarbon-based resin as a main component and dissolved in a solvent is spin-coated on the substrate 11. Further, an example in which the adhesive layer is cured by stepwise baking and the adhesive layer is cured to form the adhesive layer 13 is exemplified. Further, the adhesive layer forming step in the method for producing a laminate of the present invention may be carried out by forming an adhesive layer on the substrate or on the separation layer. That is, the adhesive layer 13 may be formed on the substrate 11 as in the present embodiment, or an adhesive layer may be formed on the separation layer. When the form of the adhesion layer is formed on the separation layer, in the surface of the separation layer and not in contact with the support layer, the adhesion layer is not formed. The protective layer described later may be formed on the exposed surface.

〔保護層形成步驟〕 [Protective layer forming step]

保護層形成步驟係指在層合步驟中使之層合時,在分離層14之表面且未與支承板12接著之面之中形成至少覆蓋未與接著層13重疊之面之保護層15之步驟。如圖2所示,可舉出在形成於支承板12上之分離層14上,旋轉塗布以前述嵌段共聚物或烴樹脂為主成分且溶解於溶劑之保護劑。其後,藉由使溫度上昇且進行階段性烘烤而使保護劑固化而形成保護層15之步驟為一例。又,保護層15亦可藉由形成接著層13所使用之接著劑而形成。 The protective layer forming step means that the protective layer 15 covering at least the surface not overlapping the adhesive layer 13 is formed on the surface of the separation layer 14 and not in the subsequent surface of the support layer 12 when laminating in the laminating step. step. As shown in Fig. 2, a protective agent containing a block copolymer or a hydrocarbon resin as a main component and dissolved in a solvent is spin-coated on the separation layer 14 formed on the support plate 12. Thereafter, the step of forming the protective layer 15 by curing the protective agent by raising the temperature and performing the stepwise baking is an example. Further, the protective layer 15 can also be formed by forming an adhesive used for the adhesive layer 13.

〔層合步驟〕 [Lamination step]

層合步驟係指依基板11、接著層13、分離層14、支承板12之順序進行層合之步驟。作為層合步驟之具體方法,如圖2所示,可舉出將在基板11上之形成有保護層15之面與支承板12之形成有接著層13之面予以貼合,在真空下以烘烤且壓著而進行層合之方法。 The laminating step refers to a step of laminating in the order of the substrate 11, the subsequent layer 13, the separation layer 14, and the support plate 12. As a specific method of the laminating step, as shown in FIG. 2, the surface on which the protective layer 15 is formed on the substrate 11 and the surface of the support plate 12 on which the adhesive layer 13 is formed are bonded together, and under vacuum A method of laking and pressing to laminate.

尚且,本發明之層合體之製造方法只要係依基板、接著層、分離層、支撐體之順序進行層合,且保護層係至少可保護分離層與接著層未重疊之部分,則不特別限定各步驟之順序。 Further, the method for producing the laminate of the present invention is not particularly limited as long as it is laminated in the order of the substrate, the adhesive layer, the separation layer, and the support, and the protective layer is at least a portion that does not overlap the separation layer and the adhesion layer. The order of the steps.

〔實施例〕 [Examples] 〔實施例1〕 [Example 1] (接著劑組成物之調製) (modulation of the composition of the adhesive)

使作為接著劑樹脂之聚塑膠公司製之「TOPAS(商品名)8007X10、環烯烴共聚物、Mw=95,000、Mw/Mn=1.9、降莰烯:乙烯=35:65(莫耳比)」100重量份溶解於主溶劑之十氫萘800重量份中。其次,以相對於接著劑樹脂100重量份而言,以使熱聚合禁止劑1重量份、乙酸丁酯20重量份般地添加放入有熱聚合禁止劑之乙酸丁酯溶液。藉此而取得接著劑組成物。 "TOPAS (trade name) 8007X10, cyclic olefin copolymer, Mw = 95,000, Mw / Mn = 1.9, norbornene: ethylene = 35:65 (mr ratio)", manufactured by Polyplastics Co., Ltd., which is an adhesive resin. The parts by weight are dissolved in 800 parts by weight of decalin in the main solvent. Then, a butyl acetate solution containing a thermal polymerization inhibitor was added in an amount of 1 part by weight of the thermal polymerization inhibitor and 20 parts by weight of butyl acetate, based on 100 parts by weight of the adhesive resin. Thereby, an adhesive composition is obtained.

(製程) (Process)

在流量400sccm、壓力700mTorr、高頻率電力2500W及成膜溫度240℃之條件下,藉由使用C4F8作為反應氣體之CVD法,將分離層之氟碳膜(厚度1μm)形成於支撐體(12吋玻璃基板、厚度700μm)上(分離層形成步驟),於其上塗布上述接著劑組成物並以220℃進行3分鐘之烘烤而形成膜厚3μm之保護層(保護層形成步驟)。於12吋矽晶圓上旋轉塗布主溶劑為280重量份之上述接著劑組成物,並以100℃、160℃、200℃加熱各3分鐘而形成接著劑層(膜厚50μm)(接著層形成步驟),在真空下220℃、4000Kg之條件下施行3分鐘與玻璃支撐體之貼合而作成層合體(層合步驟)。 The fluorocarbon film (thickness: 1 μm) of the separation layer was formed on the support by a CVD method using C 4 F 8 as a reaction gas under the conditions of a flow rate of 400 sccm, a pressure of 700 mTorr, a high frequency power of 2,500 W, and a film formation temperature of 240 ° C. (12-inch glass substrate, thickness: 700 μm) (separation layer forming step), the above-mentioned adhesive composition was applied thereon, and baked at 220 ° C for 3 minutes to form a protective layer having a film thickness of 3 μm (protective layer forming step) . The above-mentioned adhesive composition was spin-coated on a 12-inch wafer to 280 parts by weight of the above-mentioned adhesive composition, and heated at 100 ° C, 160 ° C, and 200 ° C for 3 minutes to form an adhesive layer (film thickness: 50 μm) (subsequent layer formation). Step), bonding to a glass support was carried out for 3 minutes under vacuum at 220 ° C and 4000 Kg to form a laminate (laminating step).

(耐藥品性評價) (drug resistance evaluation)

將晶圓研削至40μm,並實行對各種剝離液‧有機溶劑之耐藥品性評價。剝離液係使用NMP(N-甲基-2-吡咯啶酮)、DMSO(二甲基亞碸)、以及東京應化工業股份有限公司製之剝離液之Stripper 104及Stripper 106(皆為商品名)。評價條件係展示於表1中。又,以目視進行外觀檢査、以及以顯微鏡從玻璃側、基板側觀察端部之結果,將無剝離等之不良情形者評為「○」,將有不良情形者評為「×」。 The wafer was ground to 40 μm, and the evaluation of the chemical resistance of various stripping liquids and organic solvents was carried out. For the stripping liquid, NMP (N-methyl-2-pyrrolidone), DMSO (dimethyl sulfonium), and Stripper 104 and Stripper 106 of the stripping liquid manufactured by Tokyo Chemical Industry Co., Ltd. are used (all are trade names). ). The evaluation conditions are shown in Table 1. In addition, the visual inspection was performed visually, and the end of the end portion was observed from the glass side and the substrate side by the microscope, and those having no peeling or the like were rated as "○", and those having problems were evaluated as "x".

本實施例之層合體在高溫、長時間之剝離液浸漬試驗中,其結果係皆未產生任何問題。 The laminate of this example was subjected to a high-temperature, long-time peeling liquid immersion test, and the results did not cause any problems.

(加熱處理評價) (heat treatment evaluation)

將上述耐藥品性評價後之層合體分別在260℃之N2環境下進行30分鐘加熱處理。其後,由目視進行外觀檢査、以及以顯微鏡從玻璃側、基板側觀察端部之結果,將無剝離之不良情形者評為「○」,將有不良情形者評為「×」。 The laminate after the evaluation of the chemical resistance was heat-treated in an N 2 atmosphere at 260 ° C for 30 minutes. Then, the visual inspection was performed visually, and the result of observing the end portion from the glass side and the substrate side by the microscope was evaluated as "○" in the case of no peeling, and as "X" in the case of a problem.

(分離評價) (separation evaluation)

分別對上述加熱處理評價後之層合體,由層合體支撐體側,使具有532nm波長之雷射,朝向分離層進行照射。其結果係將可與支撐體分離者評為「○」,無法分離者評為「×」。 The laminate after the evaluation of the heat treatment described above was irradiated with a laser beam having a wavelength of 532 nm from the side of the laminate support body toward the separation layer. As a result, those who can be separated from the support are rated as "○", and those who cannot be separated are rated as "X".

〔實施例2~13、比較例1~4〕 [Examples 2 to 13 and Comparative Examples 1 to 4]

除了變更塗布於支撐體(玻璃)之接著劑樹脂、塗布於基板(晶圓)之接著劑樹脂、及此等之膜厚為如以下之表1所示者以外,其他係與實施例1進行相同操作並同樣地評價耐藥品性等。其結果係如表1所示。 Except that the adhesive resin applied to the support (glass) and the adhesive resin applied to the substrate (wafer) were changed, and the film thicknesses thereof were as shown in Table 1 below, the other methods were carried out in the same manner as in Example 1. The same operation and similar evaluation of chemical resistance and the like. The results are shown in Table 1.

尚且,表1中之APEL8008T、Septon2004、HG252、TOPAS6017之詳細內容係如以下所示。 Further, the details of APEL8008T, Septon2004, HG252, and TOPAS6017 in Table 1 are as follows.

APEL8008T(三井化學公司製):環十二烯:乙烯=20:80(莫耳比)、分子量100,000 APEL8008T (manufactured by Mitsui Chemicals, Inc.): cyclododecene: ethylene = 20:80 (mole ratio), molecular weight 100,000

Septon2004(Kuraray公司製):SEPS:聚苯乙烯-聚(乙烯/丙烯)嵌段)-聚苯乙烯、苯乙烯含有量18重量%、分子量94,000 Septon 2004 (manufactured by Kuraray Co., Ltd.): SEPS: polystyrene-poly(ethylene/propylene) block) - polystyrene, styrene content 18% by weight, molecular weight 94,000

HG252(Kuraray公司製):SEEPS-OH:聚苯乙烯-聚(乙烯-乙烯/丙烯)嵌段-聚苯乙烯末端羥基變性、苯乙烯含有量28重量%、分子量67000 HG252 (manufactured by Kuraray Co., Ltd.): SEEPS-OH: polystyrene-poly(ethylene-ethylene/propylene) block-polystyrene terminal hydroxyl group denaturation, styrene content 28% by weight, molecular weight 67000

TOPAS6017(聚塑膠公司製):降莰烯:乙烯=58:42(莫耳比)、分子量82,000 TOPAS6017 (made by Polyplastics Co., Ltd.): decene: ethylene = 58:42 (mole ratio), molecular weight 82,000

又,比較例1~4中,評價耐藥品性之結果,在高溫、長時間之剝離液浸漬試驗中,全部皆發生剝離,於矽上產生凹凸。並且,在260℃之N2環境下之加熱處理步驟後晶圓破裂,而無法分離玻璃。 Further, in Comparative Examples 1 to 4, as a result of evaluation of chemical resistance, in the peeling liquid immersion test at a high temperature and for a long period of time, all of them were peeled off, and irregularities were generated on the crucible. Further, the wafer was broken after the heat treatment step in the N 2 environment at 260 ° C, and the glass could not be separated.

〔實施例14〕 [Example 14]

於12吋玻璃上與實施例1相同條件下以電漿CVD法形成氟碳膜(厚度1μm),於其上將與實施例1相同之接著劑組成物從晶圓之端部滴入3mm並同時旋轉塗布。其後,以與實施例1相同之條件進行加熱,確認膜厚為3μm。其以後之製程係與實施例1同樣地進行,並進行評價。其結果,確認並無由剝離液及有機溶劑所造成之耐藥 品性之問題。 A fluorocarbon film (thickness: 1 μm) was formed on a 12-inch glass under the same conditions as in Example 1 by plasma CVD, and the same electrode composition as in Example 1 was dropped from the end of the wafer to 3 mm. Spin coating at the same time. Thereafter, heating was carried out under the same conditions as in Example 1 to confirm that the film thickness was 3 μm. The subsequent processes were carried out in the same manner as in Example 1 and evaluated. As a result, it was confirmed that there was no resistance caused by the stripping solution and the organic solvent. The question of character.

〔產業上之可利用性〕 [Industrial Applicability]

本發明之層合體及層合體之製造方法係可適宜利用於例如已微細化之半導體裝置之製造步驟中。 The method for producing a laminate and a laminate of the present invention can be suitably used, for example, in a manufacturing step of a semiconductor device which has been miniaturized.

10‧‧‧層合體 10‧‧‧Layer

11‧‧‧基板 11‧‧‧Substrate

12‧‧‧支承板(支撐體) 12‧‧‧Support plate (support)

13‧‧‧接著層 13‧‧‧Next layer

14‧‧‧分離層 14‧‧‧Separation layer

15‧‧‧保護層 15‧‧‧Protective layer

Claims (8)

一種層合體,其特徵為依基板、接著層、因吸收光而變質之分離層、支撐體之順序層合而成,在上述分離層之表面且未與上述支撐體接著之面之中,更具備至少覆蓋未與上述接著層重疊之面之保護層。 A laminate characterized in that a substrate, an adhesive layer, a separation layer which is deteriorated by absorption of light, and a support are laminated in this order, and on the surface of the separation layer and not in contact with the support body, A protective layer covering at least a surface that is not overlapped with the above-described subsequent layer is provided. 如請求項1之層合體,其中上述保護層係選自由嵌段共聚物及環烯烴系聚合物所成群之1種。 The laminate according to claim 1, wherein the protective layer is selected from the group consisting of a block copolymer and a cycloolefin polymer. 如請求項1或2之層合體,其中上述保護層係為在上述分離層之表面且未與上述支撐體接著之面之中,覆蓋與上述接著層重疊之面者。 The laminate according to claim 1 or 2, wherein the protective layer is on a surface of the separation layer and not in contact with the support, and covers a surface overlapping the laminate. 如請求項1或2之層合體,其中上述保護層係為在上述分離層之表面且未與上述支撐體接著之面之中、僅覆蓋未與上述接著層重疊之面者。 The laminate according to claim 1 or 2, wherein the protective layer is a surface which is on the surface of the separation layer and which is not in contact with the support, and covers only a surface which is not overlapped with the subsequent layer. 如請求項1~4中任一項之層合體,其中上述保護層係由接著劑所構成者。 The laminate according to any one of claims 1 to 4, wherein the protective layer is composed of an adhesive. 如請求項5之層合體,其中構成上述保護層之接著劑係與構成上述接著層之接著劑為相同組成者。 The laminate according to claim 5, wherein the adhesive constituting the protective layer is the same as the adhesive constituting the adhesive layer. 如請求項5之層合體,其中構成上述保護層之接著劑係與構成上述接著層之接著劑為相異組成者。 The laminate of claim 5, wherein the adhesive constituting the protective layer and the adhesive constituting the adhesive layer are different compositions. 一種層合體之製造方法,其特徵為包含:於支撐體上形成因吸收光而變質之分離層之分離層形成步驟、於基板上或上述分離層上形成接著層之接著層形成步驟、 依上述基板、上述接著層、上述分離層、上述支撐體之順序進行層合之層合步驟;且在上述層合步驟之前更包含保護層形成步驟;該保護層形成步驟係於上述層合步驟中使其層合時,在上述分離層之表面且未與上述支撐體接著之面之中,形成至少覆蓋未與上述接著層重疊之面之保護層。 A method for producing a laminate comprising: a separation layer forming step of forming a separation layer which is deteriorated by absorbing light on a support; a subsequent layer formation step of forming an adhesion layer on the substrate or the separation layer, a laminating step of laminating in accordance with the substrate, the adhesive layer, the separation layer, and the support; and further comprising a protective layer forming step before the laminating step; the protective layer forming step is performed in the laminating step When laminating them, a protective layer covering at least the surface not overlapping the above-mentioned subsequent layer is formed on the surface of the separation layer and not in contact with the support.
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