TW201409043A - Composite material receiving unit for electronic components and test equipment using the same - Google Patents
Composite material receiving unit for electronic components and test equipment using the same Download PDFInfo
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- 239000002131 composite material Substances 0.000 title claims abstract description 54
- 238000012360 testing method Methods 0.000 title claims description 80
- 230000007246 mechanism Effects 0.000 claims abstract description 95
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- 239000000463 material Substances 0.000 claims abstract description 12
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Abstract
Description
本發明係提供一種可易於擴增收置不同測試等級之料盤,以便利因應測試等級分類,並有效縮減機體的體積,而提升收料效能及節省空間之複合收料單元。 The invention provides a composite receiving unit which can easily expand and store trays of different test grades, so as to facilitate classification of test grades and effectively reduce the volume of the body, thereby improving the receiving efficiency and saving space.
在現今,電子元件測試分類機係依電子元件之測試結果而作不同等級分類收置,請參閱第1圖,係為習知測試分類機之示意圖,其係於機台10上設有供料裝置11與複數個收料裝置12A、12B、12C、12D、12E、12F、12G,以及複數個測試裝置13與輸送裝置14,該供料裝置11係設有至少一盛裝複數個待測電子元件之料盤111,各收料裝置12A、12B、12C、12D、12E、12F、12G係分別設有至少一料盤121A、121B、121C、121D、121E、121F、121G,用以盛裝不同等級完測之電子元件,例如第1至7等級完測之電子元件,複數個測試裝置13係分別設有具測試座132之測試電路板131,用以測試電子元件,輸送裝置14係設有至少一可作第一、二、三方向(如X-Y-Z方向)位移之取放器141,用以於供料裝置11、各收料裝置12A、12B、12C、12D、12E、12F、12G及各測試裝置13間移載待測/完測之電子元件;於使用時,輸送裝置14係控制取放器141於供料裝置11之料盤111上取出待測之電子元件15,並移載置入於測試裝置13之測試座132內而執行測試作業,於測試完畢後,輸送裝置14再控制取放器141於測試座132內取出完測之電子元件15,並依測試結果,而移載至其一收料裝置12A、12B、12C、12D、12E、12F、12G分類收置,例如電子元件15之測試結果被判斷為第1等級之良品電子元件,輸送裝置14即將完測之電子元件15移載至收料裝置12A之料盤121A上收置;惟,測試分類機雖配置有複數個收料裝置12A、 12B、12C、12D、12E、12F、12G,用以分類收置不同等級之電子元件,但由於電子元件之測試品質日趨嚴謹,使得測試等級已由複數個等級逐漸細分增加至十多種等級,例如良品、不良品、次級品、外觀瑕疵...等,若業者欲因應收置第一至十多種不同等級之電子元件,而於機台10上水平增設十多個收料裝置,勢必使機體不斷向兩側擴充,以致機體相當龐大,造成佔用空間且不利廠房空間配置之缺失,但若不增設十多個收料裝置,則無法因應擴增之測試等級,造成測試等級受限而無法提升測試品質之缺失。 Nowadays, the electronic component test sorting system is classified according to the test results of the electronic components. Please refer to FIG. 1 , which is a schematic diagram of a conventional test sorting machine, which is provided with a feeding on the machine 10 . The device 11 and the plurality of receiving devices 12A, 12B, 12C, 12D, 12E, 12F, 12G, and the plurality of testing devices 13 and the conveying device 14, the feeding device 11 is provided with at least one electronic component to be tested The trays 111, each of the receiving devices 12A, 12B, 12C, 12D, 12E, 12F, and 12G are respectively provided with at least one tray 121A, 121B, 121C, 121D, 121E, 121F, 121G for loading different grades. The electronic component is measured, for example, the electronic component of the first to seventh levels, and the plurality of test devices 13 are respectively provided with a test circuit board 131 having a test socket 132 for testing the electronic component, and the conveying device 14 is provided with at least one The pick and place device 141 capable of being displaced in the first, second and third directions (such as the XYZ direction) is used for the feeding device 11, the receiving devices 12A, 12B, 12C, 12D, 12E, 12F, 12G and the testing devices 13 transfer electronic components to be tested/tested; in use, transport The 14-series control pick-and-placer 141 takes out the electronic component 15 to be tested on the tray 111 of the feeding device 11, and transfers it into the test socket 132 of the testing device 13 to perform a test operation. After the test is completed, the transport is performed. The device 14 then controls the pick-and-place device 141 to take out the tested electronic component 15 in the test socket 132, and according to the test result, transfer to a receiving device 12A, 12B, 12C, 12D, 12E, 12F, 12G. For example, the test result of the electronic component 15 is judged as the good grade electronic component of the first level, and the electronic component 15 of the delivery device 14 is transferred to the tray 121A of the receiving device 12A for storage; however, the test sorter Although a plurality of receiving devices 12A are arranged, 12B, 12C, 12D, 12E, 12F, 12G are used to classify and store electronic components of different grades. However, due to the increasingly stringent test quality of electronic components, the test level has been gradually subdivided from multiple levels to more than ten levels. For example, good products, defective products, secondary products, and appearance. . . If the manufacturer wants to collect more than ten different receiving devices on the machine 10 in response to the electronic components of the first to ten different levels, it is bound to expand the body to both sides, resulting in a relatively large body. It takes up space and is not suitable for the lack of space configuration. However, if more than ten receiving devices are not installed, it will not be able to respond to the test level of amplification, resulting in limited test levels and the lack of test quality.
本發明之目的一,係提供一種電子元件複合收料單元,包含收納匣、承盤機構及移盤機構,收納匣係為直立多層式匣體,用以承置複數個可盛裝不同等級完測電子元件之料盤,承盤機構係設有可作至少一方向位移之承盤器,承盤器依收料作業所需而位移對應於收納匣之其一料盤,用以承置料盤,移盤機構係設有可作至少一方向位移之移盤器,移盤器依收料作業所需將收納匣中之其一料盤移載至承盤機構之承盤器上,而供輸送裝置之移料器將完測之電子元件移載至料盤上分類收置;藉此,複合收料單元可便利擴增複數個收置不同等級完測電子元件之料盤,而便利因應不同測試作業需求,達到提升收料效能之實用效益。 A first object of the present invention is to provide a composite receiving unit for an electronic component, comprising a storage compartment, a retaining mechanism and a shifting mechanism, wherein the storage cassette is an upright multi-layered body for carrying a plurality of different grades. The tray of the electronic component, the retaining mechanism is provided with a retainer for at least one direction displacement, and the retainer is displaced according to the receiving operation to correspond to a tray of the storage cassette for receiving the tray The shifting mechanism is provided with a shifting device that can be displaced in at least one direction, and the shifting device transfers the one of the receiving trays to the retainer of the retaining mechanism according to the receiving operation, and The feeder of the conveying device transfers the completed electronic components to the tray for sorting and storage; thereby, the composite receiving unit can conveniently amplify a plurality of trays for collecting electronic components of different levels, and facilitate the response. Different test operation requirements, to achieve the practical benefits of improving the receipt efficiency.
本發明之目的二,係提供一種電子元件複合收料單元,其中,該複合收料單元之收納匣可容置複數個盛裝不同等級完測電子元件之料盤,移盤機構係依測試結果於收納匣處抽換不同料盤,並移載至承盤機構處,供便利收置不同等級之完測電子元件,進而複合收料單元易於增設複數個料盤且不佔空間,並有效縮減機體的體積,達到節省空間之實用效益。 The object of the present invention is to provide an electronic component composite receiving unit, wherein the storage unit of the composite receiving unit can accommodate a plurality of trays for different levels of electronic components, and the shifting mechanism is based on the test result. The storage trays are replaced with different trays and transferred to the tray-receiving mechanism for convenient collection of different levels of finished electronic components. The composite receiving unit is easy to add a plurality of trays and does not occupy space, and effectively reduces the body. The volume achieves the practical benefit of saving space.
本發明之目的三,係提供一種電子元件複合收料單元,其係設有至少一可暫置複數個不同等級完測電子元件之暫置器,輸送裝置之取放器可將不同等級完測之電子元件先暫置於暫置器後,即離開位移至其他裝置處繼續執行移料作業,當移盤器將收納匣 之一料盤移載至承盤器上,輸送裝置之取放器即於暫置器上將相對應料盤收置等級之完測電子元件全部揀取移載至料盤上分類收置,毋須視取放器每次移載之電子元件測試等級,而反覆費時移出/移入收納匣之料盤,以有效縮減收料作業時間,達到提升收料效能之實用效益。 The third object of the present invention is to provide an electronic component composite receiving unit, which is provided with at least one temporary device for temporarily setting a plurality of different levels of measuring electronic components, and the pick-and-place device of the conveying device can complete different levels of testing. The electronic components are temporarily placed after the temporary device, that is, the displacement is moved to other devices to continue the loading operation, and when the shifting device is to be stored, One of the trays is transferred to the tray holder, and the pick-and-place device of the conveying device picks up the electronic components of the corresponding measuring trays on the temporary device and transfers them to the tray for sorting and storage. It is not necessary to remove the electronic component test level of the pick-and-place device for each transfer, and it is time-shifted/moved into the tray of the storage tray to effectively reduce the receiving operation time and achieve the practical benefit of improving the receiving efficiency.
本發明之目的四,係提供一種應用電子元件複合收料單元之測試設備,包含機台、供料裝置、收料裝置、測試裝置、輸送裝置及中央控制裝置,供料裝置係配置於機台上,並用以容納至少一待測之電子元件,收料裝置係配置於機台上,並設有收料單元及複合收料單元,收料單元係設有至少一盛裝相同等級完測電子元件之料盤,複合收料單元係設有收納匣、移盤機構及承盤機構,用以便利擴增複數個收置不同等級完測電子元件之料盤,測試裝置係設有具測試座之測試電路板,用以測試電子元件,輸送裝置係配置於機台上,並用以移載電子元件,中央控制裝置係用以控制及整合各裝置作動,以執行自動化作業,達到提升測試生產效能及利於廠房空間配置之實用效益。 A fourth object of the present invention is to provide a test apparatus for applying a composite receiving unit of an electronic component, comprising a machine table, a feeding device, a receiving device, a testing device, a conveying device and a central control device, wherein the feeding device is disposed on the machine platform. And for accommodating at least one electronic component to be tested, the receiving device is disposed on the machine table, and is provided with a receiving unit and a composite receiving unit, wherein the receiving unit is provided with at least one finished electronic component of the same level The material tray, the composite receiving unit is provided with a storage tray, a shifting mechanism and a tray mechanism for facilitating the amplification of a plurality of trays for collecting electronic components of different levels, and the test device is provided with a test socket. a test circuit board for testing electronic components, a transport device disposed on the machine table for transferring electronic components, and a central control device for controlling and integrating the operations of the devices to perform automated operations to improve test production efficiency and Conducive to the practical benefits of plant space allocation.
為使 貴審查委員對本發明作更進一步之瞭解,茲舉一較佳實施例並配合圖式,詳述如后:請參閱第2、3圖,係為本發明電子元件複合收料單元20之第一實施例,其包含收納匣21、承盤機構22及移盤機構23,該收納匣21係為直立多層式匣體,用以承置複數個可盛裝不同等級完測電子元件之料盤,於本實施例中,收納匣21係固設於機台30上,而於內部設有複數層支撐架211,用以分別承置可盛裝不同等級完測電子元件之料盤24,又各層支撐架211係相通收納匣21之至少一側外部,以供各料盤24輸出至承盤機構22;承盤機構22係設有作至少一方向位移之承盤器,用以承置收納匣21輸出之各料盤24,並設有可驅動承盤器位移之動力結構,於本實施例中,承盤機構22係位於收納匣21之側方,承盤器可為承板221,承盤機構22係於機台3 0設有可驅動承板221作第三方向位移之動力結構,該動力結構係設有可為馬達222之驅動源,馬達222驅動至少一傳動器,傳動器係用以帶動承板221作第三方向位移,於本實施例中,傳動器係設有一由馬達222驅動之螺桿螺座組,螺桿螺座組經由至少一連動件而帶動承板221作第三方向位移,亦或傳動器可設有一由馬達222驅動之皮帶輪組,皮帶輪組係傳動一螺桿螺座組,並以螺桿螺座組帶動承板221作第三方向位移,於本實施例中,傳動器係設有一由馬達222驅動之皮帶輪組223,皮帶輪組223係傳動一螺桿螺座組224,並以螺桿螺座組224連結帶動承板221作第三方向位移,使承板221可位移至收納匣21之各層支撐架211側方,用以承置輸出之各料盤24,另承盤機構22係設有至少一可輔助承板221平穩位移之導桿225;移盤機構23係設有作至少一方向位移之移盤器,用以將收納匣21中之各料盤24移載至承盤機構22之承盤器上,更進一步,移盤機構23之移盤器可為夾具或拉桿等,並設有可驅動移盤器作至少一方向位移之驅動結構,移盤機構23可裝配於收納匣21之側方或各層支撐架211之周側,亦或裝配於承盤機構22之承盤器上,於本實施例中,移盤機構23係裝配於承盤機構22之承板221上,移盤器係設有二夾爪231A、231B,夾爪231A之內側凸設有二推塊2311A、2312A,並於推塊2311A之一側設有可彈性位移之頂抵件2313A,於本實施例中,係於推塊2311A與頂抵件2313A間設有可為彈簧2314A之彈性件,夾爪231B之內側凸設有二推塊2311B、2312B,並於推塊2311B之一側設有可彈性位移之頂抵件2313B,於本實施例中,係於推塊2311B與頂抵件2313B間設有可為彈簧2314B之彈性件,由於承板221可作第三方向位移,移盤器可利用承板221之帶動而作第三方向位移至收納匣21之各料盤24側方,進而移盤機構23之驅動結構僅需帶動移盤器作第一方向位移,將收納匣21之各料盤24移載至承板221 上,該驅動結構係設有可驅動移盤器作第一方向位移的驅動器,於本實施例中,驅動器係設有可為馬達232之驅動源,馬達232係驅動至少一傳動組,傳動組可帶動二夾爪231A、231B作第一方向位移,於本實施例中,傳動組係設有一由馬達232驅動之第一皮帶輪組2331,第一皮帶輪組2331係傳動一呈第二方向配置之軸桿2332,軸桿2332之兩端係分別帶動呈第一方向配置之第二皮帶輪組2333、2334,二第二皮帶輪組2333、2334分別連結帶動二夾爪231A、231B作第一方向位移,以便於收納匣21內取出任一料盤24,並移載至承盤機構22之承板221上,使各料盤24收置不同等級完測之電子元件,另移盤機構23係於承板221與二夾爪231A、231B間分別設有滑移器,用以輔助二夾爪231A、231B平穩位移,於本實施例中,滑移器係於承板221與二夾爪231A、231B間分別設有可相互配合之滑軌234A、234B與滑座235A、235B,又移盤機構23係於承板221上設有至少一限位部件,用以限位料盤,於本實施例中,係於承板221上凹設有限位槽2211,用以限位料盤,並設有至少一可為限位桿236之限位件,用以限位料盤,另移盤機構23設有至少一可調整定位料盤位置之定位器,於本實施例中,定位器係設有一為壓缸237之驅動源,用以驅動至少一凸伸出承板221上之推桿238作第二方向位移,使推桿238頂推料盤靠置於限位槽2211之內面定位,另複合收料單元20更包含設有至少一可暫置不同等級完測電子元件之暫置器,暫置器可為暫置盤,於本實施例中,係於收納匣21之頂面設有暫置盤212,用以暫置不同等級完測之電子元件。 In order to make the present invention further understand the present invention, a preferred embodiment and a drawing will be described in detail as follows: Please refer to Figures 2 and 3 for the electronic component composite receiving unit 20 of the present invention. The first embodiment includes a storage tray 21, a tray mechanism 22, and a shifting mechanism 23, which is an upright multi-layered body for receiving a plurality of trays capable of holding different levels of electronic components. In this embodiment, the storage cassette 21 is fixed on the machine table 30, and a plurality of layers of support frames 211 are disposed therein for respectively receiving the trays 24 for carrying different levels of the completed electronic components, and the layers. The support frame 211 is connected to the outside of at least one side of the storage cassette 21 for outputting the trays 24 to the tray mechanism 22; the tray mechanism 22 is provided with a tray for displacement in at least one direction for receiving the storage cassettes. 21 output of each tray 24, and is provided with a power structure that can drive the displacement of the tray. In this embodiment, the tray mechanism 22 is located on the side of the storage cassette 21, and the tray holder can be the carrier plate 221 The disk mechanism 22 is attached to the machine table 3 0 is provided with a power structure that can drive the bearing plate 221 for displacement in a third direction. The power structure is provided with a driving source that can be a motor 222, and the motor 222 drives at least one actuator, and the transmission is used to drive the carrier plate 221 as the first In the embodiment, the actuator is provided with a screw screw seat driven by the motor 222. The screw screw seat group drives the carrier plate 221 for displacement in a third direction via at least one linkage member, or the actuator can be A pulley set driven by a motor 222 is provided. The pulley set drives a screw base set, and the screw base is used to drive the carrier plate 221 for displacement in a third direction. In this embodiment, the actuator is provided with a motor 222. The driven pulley set 223, the pulley set 223 is driven by a screw socket set 224, and the screw base set 224 is coupled to the driven carrier plate 221 for displacement in the third direction, so that the carrier plate 221 can be displaced to the support brackets of the storage jaws 21 The side of the 211 is for receiving the output trays 24, and the other tray mechanism 22 is provided with at least one guide rod 225 for assisting the plate member 221 to be smoothly displaced; the shifting mechanism 23 is provided for at least one direction displacement. Transfer device for housing 匣 21 Each tray 24 is transferred to the tray holder of the tray mechanism 22. Further, the tray of the tray mechanism 23 can be a clamp or a tie rod, etc., and is provided with a driveable tray for at least one direction displacement. The driving structure, the shifting mechanism 23 can be mounted on the side of the storage cassette 21 or on the circumferential side of each layer of the support frame 211, or on the tray holder of the tray mechanism 22. In this embodiment, the tray mechanism 23 is It is mounted on the bearing plate 221 of the retaining mechanism 22, and the shifting device is provided with two clamping jaws 231A, 231B. The inner side of the clamping jaw 231A is convexly provided with two pushing blocks 2311A, 2312A, and is disposed on one side of the pushing block 2311A. The elastically displaceable abutting member 2313A is provided with an elastic member which is a spring 2314A between the push block 2311A and the top abutting member 2313A. The inner side of the clamping jaw 231B is convexly provided with two pushing blocks 2311B and 2312B. And one side of the push block 2311B is provided with an elastically displaceable abutting member 2313B. In this embodiment, an elastic member which can be a spring 2314B is disposed between the push block 2311B and the top abutting member 2313B. 221 can be displaced in the third direction, and the tray can be displaced by the carrier plate 221 to the tray 2 of the storage cassette 21 in the third direction. 4 side, and then the driving structure of the shifting mechanism 23 only needs to drive the shifter for the first direction displacement, and the trays 24 of the storage cassette 21 are transferred to the carrier plate 221 The drive structure is provided with a drive for driving the shifter for the first direction. In this embodiment, the drive is provided with a drive source that can be a motor 232, and the motor 232 drives at least one drive set, the drive set. The second clamping jaws 231A, 231B can be driven to be displaced in the first direction. In the embodiment, the transmission group is provided with a first pulley set 2331 driven by a motor 232, and the first pulley set 2331 is driven in a second direction. The shaft 2332 and the two ends of the shaft 2332 respectively drive the second pulley sets 2333 and 2334 arranged in the first direction, and the second pulley sets 2333 and 2334 respectively connect the two clamping jaws 231A and 231B for the first direction displacement. In order to take out any tray 24 in the storage cassette 21, and transfer it to the carrier plate 221 of the tray mechanism 22, so that each tray 24 can be assembled with electronic components of different grades, and the other tray mechanism 23 is in the bearing. A slipper is disposed between the plate 221 and the two clamping jaws 231A, 231B for assisting the smooth displacement of the two clamping jaws 231A, 231B. In this embodiment, the slipper is attached to the carrier plate 221 and the two clamping jaws 231A, 231B. Between each other, there are mutually compatible slide rails 234A, 234B and a slide seat 2 35A, 235B, and the shifting mechanism 23 is provided with at least one limiting member on the carrier plate 221 for limiting the tray. In the embodiment, the limiting plate 2211 is recessed on the bearing plate 221 for use. The limiting tray is provided with at least one limiting member which can be a limiting rod 236 for limiting the tray, and the other shifting mechanism 23 is provided with at least one positioner for adjusting the position of the positioning tray. In the embodiment, the positioner is provided with a driving source for the pressure cylinder 237 for driving at least one of the push rods 238 protruding from the receiving plate 221 for the second direction displacement, so that the push rod 238 pushes the tray to be placed The inner surface of the limiting slot 2211 is further disposed, and the composite receiving unit 20 further includes at least one temporary device capable of temporarily setting different levels of electronic components, and the temporary device can be a temporary disk. In this embodiment, A temporary disk 212 is disposed on the top surface of the storage cassette 21 for temporarily setting electronic components of different levels to be tested.
請參閱第4圖,於使用時,輸送裝置40可將完測不同等級(如第5至9等級)之複數個電子元件51~55先移載置入於暫置盤212,使輸送裝置40於每次移載不同等級完測之電子元件51~55時,不用等待盛裝相對應等級電子元件之各料盤 24A~24E移出/移入收納匣21,而可將各電子元件51~55暫置於暫置盤212後,即迅速離開位移至其他裝置處執行下一動作,進而更加節省收料作業時間,該承盤機構22係控制馬達222驅動皮帶輪組223作動,皮帶輪組223即傳動螺桿螺座組224,令螺桿螺座組224之螺桿帶動承板221及移盤機構23作第三方向位移,使移盤機構23之二夾爪231A、231B先位於收納匣21之側方適當位置,移盤機構23係控制馬達232驅動第一皮帶輪組2331作動,第一皮帶輪組2331經由軸桿2332而傳動二第二皮帶輪組2333、2334,各第二皮帶輪組2333、2334係分別帶動二夾爪231A、231B作第一方向位移至收納匣21之前、後方;請參閱第5、6圖,由於收納匣21係立式設有多層支撐架211,不僅便利擴增複數個收置不同等級完測電子元件之料盤,以因應不同測試作業需求而提升收料效能,並有效縮減機體的體積而節省空間,本發明可視收料作業所需,而控制移盤機構23移載收納匣21之各料盤至承盤機構22上,以收置不同等級完測之電子元件,例如欲收置暫置盤212內之複數個第6等級完測電子元件52時,該承盤機構22係控制馬達222驅動皮帶輪組223作動,皮帶輪組223即傳動螺桿螺座組224,令螺桿螺座組224帶動承板221及移盤機構23作第三方向位移,使二夾爪231A、231B之各推塊2311A、2311B分別位於料盤24B之一側方,移盤機構23可控制馬達232驅動第一皮帶輪組2331作動,第一皮帶輪組2331經由軸桿2332傳動二第二皮帶輪組2333、2334,各第二皮帶輪組2333、2334分別帶動二夾爪231A、231B作第一方向位移,令二夾爪231A、231B之各推塊2311A、2311B以頂抵件2313A、2313B頂推料盤24B之一側,並壓縮彈簧2314A、2314B,進而將料盤24B拉出收納匣21,並移載至承板221之限位槽2211上,當二夾爪231A、231B將料盤24B移載 頂抵於限位桿236時,二夾爪231A、231B之頂抵件2313A、2313B即可壓縮彈簧2314A、2314B作一緩衝,使二夾爪231A、231B可確實將料盤24B移載至預設位置,接著控制壓缸237驅動推桿238作第二方向位移頂推料盤24B靠置限位槽2211之內面定位;請參閱第7圖,於承板221承載料盤24B後,承盤機構22可控制馬達222經皮帶輪組223而驅動螺桿螺座組224,令螺桿螺座組224帶動承板221及移盤機構23作第三方向位移至暫置盤212之側方,輸送裝置40即於暫置盤212上將複數個第6等級之完測電子元件52全部揀取移載至料盤24B上分類收置,以縮減收料作業時間;請參閱第8圖,於收料完畢後,承盤機構22係控制馬達222經皮帶輪組223而驅動螺桿螺座組224,令螺桿螺座組224帶動承板221、移盤機構23及已盛裝完測電子元件52之料盤24B作第三方向位移,令料盤24B對應於收納匣21之第二層支撐架211處,接著移盤機構23係控制壓缸237帶動推桿238作第二方向位移而脫離料盤24B,並控制馬達232驅動第一皮帶輪組2331作動,第一皮帶輪組2331經由軸桿2332傳動二第二皮帶輪組2333、2334,各第二皮帶輪組2333、2334分別帶動二夾爪231A、231B作第一方向位移,令二夾爪231A、231B之各推塊2312A、2312B頂推料盤24B,將料盤24B推移至收納匣21之支撐架211上收置,進而完成收料作業。 Referring to FIG. 4, in use, the transport device 40 can transfer a plurality of electronic components 51-55 of different levels (such as the 5th to 9th grades) to the temporary tray 212 to make the transport device 40. Each time you transfer the electronic components 51~55 of different grades, you do not have to wait for each tray of the corresponding grade electronic components. 24A~24E are removed/moved into the storage cassette 21, and the electronic components 51~55 can be temporarily placed on the temporary tray 212, and then the displacement is quickly moved to other devices to perform the next action, thereby further saving the collection operation time. The disk holding mechanism 22 controls the motor 222 to drive the pulley set 223 to operate, and the pulley set 223 is the transmission screw base set 224, so that the screw of the screw screw seat set 224 drives the carrier plate 221 and the shifting mechanism 23 to be displaced in the third direction, so that the shifting mechanism The second jaws 231A, 231B of the disk mechanism 23 are first positioned at the side of the storage cassette 21, and the shifting mechanism 23 controls the motor 232 to drive the first pulley set 2331 to operate. The first pulley set 2331 is driven by the shaft 2332. The second pulley sets 2333 and 2334 are respectively driven by the second clamp sets 231A and 231B to move the first clamps 231A and 231B to the front and rear of the storage cassette 21 in the first direction. Referring to Figures 5 and 6, the storage unit 21 is accommodated. The vertical type is provided with a multi-layer support frame 211, which not only facilitates the expansion of a plurality of trays for collecting electronic components of different levels, but also improves the receiving efficiency according to the requirements of different test operations, and effectively reduces the volume of the body and saves space. For the visual storage operation, the control shifting mechanism 23 transfers the trays of the storage cassette 21 to the tray mechanism 22 to collect electronic components of different levels, for example, to accommodate the temporary tray 212. When the plurality of 6th level completes the electronic component 52, the retaining mechanism 22 controls the motor 222 to drive the pulley set 223 to operate, and the pulley set 223 is the drive screw base set 224, so that the screw base set 224 drives the carrier plate 221 and The shifting mechanism 23 is displaced in the third direction such that the push blocks 2311A, 2311B of the two jaws 231A, 231B are respectively located on one side of the tray 24B, and the shifting mechanism 23 can control the motor 232 to drive the first pulley set 2331 to operate. The first pulley set 2331 drives the second pulley sets 2333, 2334 via the shaft 2332, and the second pulley sets 2333, 2334 respectively drive the two clamping jaws 231A, 231B to be displaced in the first direction, so that the two clamping jaws 231A, 231B are respectively The pushing blocks 2311A, 2311B push the one side of the tray 24B with the abutting members 2313A, 2313B, and compress the springs 2314A, 2314B, and then pull the tray 24B out of the receiving jaw 21 and transfer it to the limiting slot of the carrier plate 221 On 2211, when the two jaws 231A, 231B transfer the tray 24B When the top is pressed against the limiting rod 236, the topping members 2313A, 2313B of the two clamping jaws 231A, 231B can be used as a buffer for the compression springs 2314A, 2314B, so that the two clamping jaws 231A, 231B can reliably transfer the tray 24B to the pre-load. Positioning, and then controlling the pressure cylinder 237 to drive the push rod 238 to position the inner surface of the second direction displacement pushing tray 24B against the limiting groove 2211; see Figure 7, after the carrier plate 221 carries the tray 24B, The disk mechanism 22 can control the motor 222 to drive the screw screw seat set 224 via the pulley set 223, so that the screw screw seat set 224 drives the carrier plate 221 and the shifting mechanism 23 to be displaced in the third direction to the side of the temporary disk 212, and the conveying device 40, on the temporary tray 212, a plurality of the sixth level of the completed electronic components 52 are picked up and transferred to the tray 24B for sorting and collecting, so as to reduce the receiving work time; please refer to Figure 8, in the receipt After completion, the retaining mechanism 22 controls the motor 222 to drive the screw base set 224 via the pulley set 223, so that the screw base set 224 drives the carrier plate 221, the shifting mechanism 23, and the tray 24B that has been loaded with the electronic component 52. Displacement in the third direction, so that the tray 24B corresponds to the second layer support frame 211 of the storage cassette 21, and then moves The mechanism 23 controls the pressure cylinder 237 to drive the push rod 238 to displace the tray 24B in the second direction, and controls the motor 232 to drive the first pulley set 2331 to act. The first pulley set 2331 drives the second pulley set 2333 via the shaft 2332. 2334, each of the second pulley sets 2333, 2334 respectively drives the two clamping jaws 231A, 231B to be displaced in the first direction, so that the pushing blocks 2312A, 2312B of the two clamping jaws 231A, 231B push the tray 24B to change the tray 24B. The support frame 211 of the storage cassette 21 is housed to complete the receiving operation.
請參閱第9圖,係為本發明電子元件複合收料單元20A之第二實施例,其包含收納匣25A、承盤機構26A及移盤機構27A,該收納匣25A係為直立多層式匣體,用以承置複數個可盛裝不同等級完測電子元件之料盤,於本實施例中,收納匣25A係固設於機台30上,而於內部設有複數層支撐架251A,用以分別承置可盛裝不同等級完測電子元件之料盤28A,各層支撐架251A係相通收納匣25A之兩側外部,使移盤機 構27A可由收納匣25A之一側將各料盤28A朝另一側移載輸出至承盤機構26A;承盤機構26A係位於收納匣25A之一側方,並設有作至少一方向位移之承盤器,用以承置收納匣25A輸出之各料盤28A,承盤器可為承板261A,承盤機構26A並設有可驅動承盤器位移之動力結構,於本實施例中,動力結構係設有可為馬達262A之驅動源,馬達262A驅動至少一傳動器,傳動器係用以帶動承板261A作第三方向位移,於本實施例中,傳動器係設有一由馬達262A驅動之螺桿螺座組263A,螺桿螺座組263A經由連動件264A帶動承板261A作第三方向位移,使承板261A可位移至收納匣25A之各層支撐架251A側方,以承置輸出之各料盤28A;移盤機構27A係設有可作至少一方向位移之移盤器,用以將收納匣25A中之各料盤28A移載至承盤機構26A之承盤器上,更進一步,移盤機構27A係設有可驅動移盤器位移之驅動結構,於本實施例中,移盤機構27A係位於收納匣25A之另一側方,移盤器係為夾具271A,移盤機構27A並設有可驅動移盤器作第一、三方向位移之驅動結構,驅動結構包含第一驅動器及第二驅動器,用以分別帶動移盤器作第三、一方向位移,其中,第一驅動器係設有可為第一馬達272A之第一驅動源,第一馬達272A係驅動至少一第一傳動組,第一傳動組係用以帶動第二驅動器及夾具271A作第三方向位移,於本實施例中,第一傳動組係設有可由第馬達272A驅動之螺桿螺座組273A,螺桿螺座組273A係傳動可裝配第二驅動器之活動板274A作第三方向位移,第二驅動器係設有可為第二馬達275A之第二驅動源,第二馬達275A係驅動至少一第二傳動組,第二傳動組係設有可由第二馬達275A驅動之皮帶輪組276A,皮帶輪組276A係傳動可連結夾具271A之活動桿277A作第一方向位移,進而夾具271A可利用第一、二驅動器分別驅動作第三、一方向位移,以便移動至收納匣25A之各層支撐架251A側方,並將收納匣25A內之任一料盤28A移 載至承盤機構26A之承板261A上,使各料盤28A收置不同等級完測之電子元件,另複合收料單元20A更包含設有至少一可暫置不同等級完測電子元件之暫置器,暫置器可為暫置盤,於本實施例中,係於收納匣25A之頂面設有暫置盤252A,用以暫置不同等級完測之電子元件。 Please refer to FIG. 9 , which is a second embodiment of the electronic component composite receiving unit 20A of the present invention, which comprises a storage cassette 25A, a tray mechanism 26A and a shifting mechanism 27A. The storage cassette 25A is an upright multi-layered body. In the present embodiment, the storage cassette 25A is fixed on the machine table 30, and a plurality of layers of support frames 251A are disposed inside, for mounting a plurality of trays for different types of electronic components. The trays 28A can be respectively installed to hold the electronic components of different grades, and the support frames 251A of the respective layers are connected to the outside of the two sides of the 匣25A, so that the shifting machine is The structure 27A can transfer the respective trays 28A to the other side to the retaining mechanism 26A from one side of the storage cassette 25A; the retaining mechanism 26A is located on one side of the housing cassette 25A and is provided with at least one direction displacement. The tray holder is configured to receive the trays 28A of the output of the storage cassette 25A. The tray holder can be the carrier plate 261A, and the tray mechanism 26A is provided with a power structure for driving the displacement of the tray holder. In this embodiment, The power structure is provided with a driving source for the motor 262A, and the motor 262A drives at least one actuator. The actuator is used to drive the carrier plate 261A for displacement in a third direction. In this embodiment, the actuator is provided with a motor 262A. The driven screw socket set 263A, the screw screw seat set 263A drives the bearing plate 261A to be displaced in the third direction via the linking member 264A, so that the bearing plate 261A can be displaced to the side of each layer of the support frame 251A of the storage cassette 25A to receive the output. Each of the trays 28A; the shifting mechanism 27A is provided with a shifting device that can be displaced in at least one direction for transferring the trays 28A of the receiving cassettes 25A to the tray holder of the retaining mechanism 26A, further The shifting mechanism 27A is provided with a driving structure capable of driving the displacement of the shifting device, In the embodiment, the shifting mechanism 27A is located on the other side of the storage cassette 25A, and the tray shifter is a clamp 271A. The shifting mechanism 27A is provided with a driving structure capable of driving the tray to be displaced in the first and third directions. The driving structure includes a first driver and a second driver for respectively driving the tray to perform a third and one direction displacement, wherein the first driver is provided with a first driving source which is a first motor 272A, and the first motor 272A The first transmission group is configured to drive the second driver and the clamp 271A for the third direction displacement. In this embodiment, the first transmission group is provided with a screw screw that can be driven by the first motor 272A. The seat set 273A, the screw base set 273A is configured to be equipped with the second drive movable plate 274A for the third direction displacement, the second drive is provided with the second drive source of the second motor 275A, and the second motor 275A is driven. At least one second transmission set, the second transmission set is provided with a pulley set 276A that can be driven by the second motor 275A, and the pulley set 276A is coupled to the movable rod 277A of the clamp 271A for the first direction displacement, and the clamp 271A can be utilized. , Two drivers are driven in a third, a direction of displacement, to move the cassette to the storage layers 25A of the support frame 251A side and accommodated within any cassette 25A a shift tray 28A It is carried on the carrier plate 261A of the retaining mechanism 26A, so that each tray 28A houses electronic components of different levels of completion, and the composite receiving unit 20A further includes at least one temporary electronic component for different levels of measurement. In this embodiment, a temporary disk 252A is disposed on the top surface of the storage cassette 25A for temporarily setting electronic components of different levels to be tested.
請參閱第10圖,於使用時,輸送裝置40可將完測不同等級(如第5至9等級)之複數個電子元件51~55移載置入於暫置盤252A,當欲將暫置盤252A內之複數個第5等級完測電子元件51收置於料盤281A時,承盤機構26A係控制馬達262A驅動螺桿螺座組263A,並以螺桿螺座組263A經連動件264A帶動承板261A作第三方向位移至收納匣25A之料盤281A側方,移盤機構27A係控制第一馬達272A驅動螺桿螺座組273A,並以螺桿螺座組273A經活動板274A而帶動第二驅動器及夾具271A作第三方向位移,使夾具271A位於收納匣25A之料盤281A另一側方,接著控制第二馬達275A驅動皮帶輪組276A,皮帶輪組276A經活動桿277A驅動夾具271A作第一方向位移伸入於收納匣25A中,將料盤281A移載至承板261A上;請參閱第11圖,於承板261A承載料盤281A後,移盤機構27A係控制第二馬達275A驅動皮帶輪組276A,皮帶輪組276A經活動桿277A驅動夾具271A作第一方向位移而退出收納匣25A,承盤機構26A可控制馬達262A驅動螺桿螺座組263A,螺桿螺座組263A經連動件264A帶動承板261A及料盤281A作第三方向位移至暫置盤252A之側方,輸送裝置40即可將暫置盤252A上複數個第5等級之完測電子元件51全部揀取移載至料盤281A上分類收置;請參閱第12圖,承盤機構26A係控制馬達262A驅動螺桿螺座組263A,螺桿螺座組263A經連動件264A帶動承板261A及已盛裝第5等級完測電子元件51之料盤281A作第三方向位移至收納匣25A之支撐架251A側 方,移盤機構27A係控制第一馬達272A驅動螺桿螺座組273A,螺桿螺座組273A經活動板274A而帶動第二驅動器及夾具271A作第三方向位移至收納匣25A之支撐架251A另一側方,接著控制第二馬達275A驅動皮帶輪組276A,皮帶輪組276A經活動桿277A驅動夾具271A作第一方向位移將承板261A上之料盤281A移載至收納匣25A之支撐架251A收置,進而完成收料作業。 Referring to FIG. 10, in use, the transport device 40 can transfer a plurality of electronic components 51-55 of different levels (such as the 5th to 9th grades) to the temporary storage tray 252A. When the plurality of fifth-level electronic component 51 in the disk 252A is placed on the tray 281A, the disk-retaining mechanism 26A controls the motor 262A to drive the screw-spindle group 263A, and the screw-threaded block group 263A is driven by the link member 264A. The plate 261A is displaced in the third direction to the side of the tray 281A of the storage cassette 25A. The shift mechanism 27A controls the first motor 272A to drive the screw socket set 273A, and drives the second screw 273A via the movable plate 274A. The driver and the clamp 271A are displaced in the third direction so that the clamp 271A is located on the other side of the tray 281A of the storage cassette 25A, and then the second motor 275A is driven to drive the pulley set 276A. The pulley set 276A is driven by the movable lever 277A to drive the clamp 271A as the first. The directional displacement extends into the receiving pocket 25A, and the tray 281A is transferred to the carrier plate 261A. Referring to FIG. 11, after the carrier plate 261A carries the tray 281A, the shifting mechanism 27A controls the second motor 275A to drive the pulley. Group 276A, pulley set 276A is driven by the movable rod 277A The 271A is displaced in the first direction and exits the receiving cassette 25A. The retaining mechanism 26A can control the motor 262A to drive the screw base set 263A. The screw base set 263A drives the bearing plate 261A and the tray 281A to move in the third direction via the linking member 264A. On the side of the temporary tray 252A, the transport device 40 can pick up and transfer all of the plurality of fifth-level electronic components 51 of the temporary platter 252A to the tray 281A for sorting and storage; see Figure 12, The disk holding mechanism 26A controls the motor 262A to drive the screw socket set 263A, and the screw socket set 263A drives the carrier plate 261A via the linking member 264A and the tray 281A that has been loaded with the fifth-level measuring electronic component 51 for displacement in the third direction.匣25A support frame 251A side The shifting mechanism 27A controls the first motor 272A to drive the screw socket set 273A. The screw base set 273A drives the second actuator and the clamp 271A to move the third drive and the clamp 271A to the support frame 251A of the storage cassette 25A via the movable plate 274A. One side, then controlling the second motor 275A to drive the pulley set 276A, the pulley set 276A is driven by the movable lever 277A to drive the clamp 271A for the first direction displacement, and the tray 281A on the carrier 261A is transferred to the support frame 251A of the storage cassette 25A. Set, and then complete the receiving operation.
請參閱第13、14圖,係為應用複合收料單元20第一實施例之測試分類機,包含機台30、輸送裝置40、供料裝置60、收料裝置70及測試裝置80,該供料裝置60係裝配於機台30上,並設有至少一可盛裝待測電子元件之料盤61;該收料裝置70係裝配於機台30上,並設有至少一相同上述複合收料單元之複合收料單元20(請配合參閱第2、3圖),於本實施例中,收料裝置70係設有複數個收料單元71及複合收料單元20,各收料單元71係設有至少一料盤711,用以盛裝相同等級完測之電子元件,複合收料單元20係包含收納匣21、承盤機構22及移盤機構23,收納匣21係立式設有複數個可盛裝不同等級完測電子元件之料盤24,承盤機構22係設有可作至少一方向位移之承盤器,承盤器依收料作業所需而位移對應於收納匣21之其一料盤24,用以承置料盤24,移盤機構23係設有可作至少一方向位移之移盤器,移盤器依收料作業所需將收納匣21中之其一料盤24移載至承盤機構22之承盤器上,而供輸送裝置40將完測之電子元件移載至料盤24上分類收置,另複合收料單元20更包含設有至少一可暫置不同等級完測電子元件之暫置器,更進一步,暫置器可獨立裝配於收納匣21上,亦或以收料單元71之料盤711作為暫置器,於本實施例中,係於收納匣21之頂面設有可為暫置盤212之暫置器,用以暫置不同等級完測之電子元件;該測試裝置80係設有具測試座82之測試電路板81,用以測試電子元件,以及設有可壓抵電子元件之壓接機構83,並以測試器(圖未示出)將測試結果 傳輸至中央控制裝置(圖未示出),由中央控制裝置控制各裝置作動,更進一步,測試裝置80可裝配於機台30上,亦或裝配於直立機架90上,於本實施例中,測試分類機係於機台30上設有具複數層容置空間91之直立機架90,其各層容置空間91可供裝配測試裝置80;該輸送裝置40係配置於機台30上,用以於供料裝置60、收料裝置70、複合收料單元20及測試裝置80間移載電子元件,於本實施例中,係設有載料機構及第一、二移料機構,載料機構係設有至少一載台41,用以承置電子元件,第一移料機構係設有至少一第一取放器42,用以於供料裝置60、收料裝置70、複合收料單元20及載台41間移載待測/完測之電子元件,第二移料機構係設有至少一第二取放器43,用以於載台41及各測試裝置80間移載待測/完測之電子元件,另於機台30上設有至少一空盤裝置100,該空盤裝置100係用以收置供料裝置60之空料盤61,並將空料盤61補充於收料裝置70,用以接續盛裝完測之電子元件。 Please refer to FIGS. 13 and 14 for the test sorting machine of the first embodiment of the composite receiving unit 20, including the machine table 30, the conveying device 40, the feeding device 60, the receiving device 70 and the testing device 80. The material device 60 is mounted on the machine table 30, and is provided with at least one tray 61 for holding electronic components to be tested; the receiving device 70 is mounted on the machine table 30, and is provided with at least one of the same composite receipts In the present embodiment, the receiving device 70 is provided with a plurality of receiving units 71 and a composite receiving unit 20, and each receiving unit 71 is connected to the composite receiving unit 20 of the unit (please refer to the figures 2 and 3). At least one tray 711 is provided for accommodating the electronic components of the same level, and the composite receiving unit 20 includes a storage cassette 21, a tray mechanism 22 and a shifting mechanism 23, and the storage cassette 21 is provided with a plurality of vertical units. The tray 24 can be installed with different levels of electronic components. The tray mechanism 22 is provided with a tray for displacement in at least one direction. The displacement of the tray according to the receiving operation corresponds to one of the storage cassettes 21 a tray 24 for receiving the tray 24, the tray mechanism 23 being provided for displacement in at least one direction The tray, the tray shifter transfers one of the trays 24 of the storage cassette 21 to the tray holder of the tray mechanism 22, and the conveying device 40 transfers the completed electronic components to the tray. The tray 24 is separately disposed, and the composite receiving unit 20 further includes at least one temporary device capable of temporarily setting different levels of the completed electronic components. Further, the temporary device can be independently assembled on the storage cassette 21, Or the tray 711 of the receiving unit 71 is used as a temporary device. In this embodiment, a temporary device that can be a temporary tray 212 is disposed on the top surface of the receiving cassette 21 for temporarily setting different levels of completion. The test device 80 is provided with a test circuit board 81 having a test socket 82 for testing electronic components, and a crimping mechanism 83 for pressing the electronic components, and is provided with a tester (not shown) ) test results It is transmitted to a central control device (not shown), and the central control device controls the operation of each device. Further, the test device 80 can be mounted on the machine table 30 or mounted on the upright frame 90, in this embodiment. The test sorting machine is provided with an upright frame 90 having a plurality of accommodating spaces 91 on the machine table 30, and each layer accommodating space 91 is provided for assembling the test device 80; the transport device 40 is disposed on the machine table 30, The utility model is used for transferring electronic components between the feeding device 60, the receiving device 70, the composite receiving unit 20 and the testing device 80. In the embodiment, the loading mechanism and the first and second feeding mechanisms are provided. The material mechanism is provided with at least one loading platform 41 for receiving electronic components, and the first moving material mechanism is provided with at least one first pick and place device 42 for feeding the feeding device 60, the receiving device 70, and the composite receiving device. The electronic component to be tested/tested is transferred between the material unit 20 and the stage 41, and the second material moving mechanism is provided with at least one second pick-and-place unit 43 for transferring between the stage 41 and each test device 80. The electronic component to be tested/completed is further provided with at least one empty disk device 100 on the machine table 30, and the empty disk device 100 is used The empty tray 61 of the feeding device 60 is housed, and the empty tray 61 is replenished to the receiving device 70 for successively holding the electronic components that have been completed.
請參閱第15圖,於使用時,輸送裝置40之第一取放器42係於供料裝置60之料盤61處取出待測之電子元件51,並移載至載台41處,載台41係作第一方向位移將待測之電子元件51載送至第二取放器43之側方,第二取放器43係於載台41上取出待測之電子元件51;請參閱第16、17圖(請配合參閱第4~8圖),第二取放器43係將待測之電子元件51移載置入於測試裝置80之測試座82中,測試裝置80之壓接機構83下壓測試座82內之電子元件51執行測試作業,並以測試器將測試結果傳輸至中央控制裝置,由於直立機架90係以第三方向配置數層測試裝置80,使得第二取放器43可以較短位移行程而於各層測試裝置80間移載取放電子元件,於測試完畢後,第二取放器43係於測試裝置80之測試座82取出完測之電子元件51,並移載置入於載台41上,載台41載送完測之電子元件51至第一取放器42之側方,第一取放器42即於載台41上取出完測之電子元件51,並移載至收料裝置70處, 由於收料裝置70係設有收料單元71及複合收料單元20,第一取放器42可依測試結果,將完測之電子元件51移載至收料單元71或複合收料單元20,若完測之電子元件51為測試等級數量較少之第5等級時,第一取放器42可將完測之電子元件51移載暫置於複合收料單元20之暫置盤212上,進而暫置盤212可暫時盛裝複數個不同等級(如第5至9等級)完測之電子元件51~55,當欲收置暫置盤212內之複數個第6等級完測電子元件52時,承盤機構22可帶動二夾爪231A、231B位移對應於收納匣21之料盤24B,移盤機構23即控制二夾爪231A、231B作第一方向位移將料盤24B拉出收納匣21,並移載至承板221上,輸送裝置40之第一取放器42即於暫置盤212上將複數個第6等級之完測電子元件52全部揀取移載至料盤24B上分類收置,以縮減收料作業時間,於收料完畢後,承盤機構22係載送料盤24B對應於收納匣21之第二層支撐架211處,移盤機構23則將料盤24B推移至收納匣21之支撐架211上收置,進而完成收料作業。 Referring to FIG. 15, in use, the first pick-and-place unit 42 of the transport device 40 takes out the electronic component 51 to be tested at the tray 61 of the feeding device 60, and transfers it to the stage 41. 41 is a first direction displacement to carry the electronic component 51 to be tested to the side of the second pick and place unit 43, and the second pick and place unit 43 is attached to the stage 41 to take out the electronic component 51 to be tested; 16 and 17 (please refer to FIGS. 4-8), the second pick-and-place device 43 is configured to transfer the electronic component 51 to be tested into the test socket 82 of the testing device 80, and the crimping mechanism of the testing device 80 83. The electronic component 51 in the test stand 82 performs the test operation, and transmits the test result to the central control device by the tester. Since the vertical stand 90 is configured with the plurality of layers of the test device 80 in the third direction, the second pick and place is performed. The device 43 can transfer the electronic components to and from the test devices 80 with a short displacement stroke. After the test, the second pick-and-place 43 is taken out from the test socket 82 of the test device 80 to take out the electronic components 51. The transfer is placed on the stage 41, and the stage 41 carries the measured electronic component 51 to the side of the first pick-and-place unit 42, first End 42 is put out an electronic component that is measured in 51 of the 41 stage, and transfer means to receipt at 70, Since the receiving device 70 is provided with the receiving unit 71 and the composite receiving unit 20, the first pick-and-place unit 42 can transfer the completed electronic component 51 to the receiving unit 71 or the composite receiving unit 20 according to the test result. If the electronic component 51 is in the fifth level with a small number of test levels, the first pick-and-place unit 42 can temporarily transfer the completed electronic component 51 to the temporary tray 212 of the composite receiving unit 20. And the temporary disk 212 can temporarily hold a plurality of different levels (such as the 5th to 9th levels) of the completed electronic components 51-55, and when the plurality of 6th level completed electronic components 52 in the temporary disk 212 are to be received. The retaining mechanism 22 can drive the two clamping jaws 231A, 231B to displace the tray 24B corresponding to the receiving jaw 21, and the shifting mechanism 23 controls the two jaws 231A, 231B to be displaced in the first direction to pull the tray 24B out of the container. 21, and transferred to the carrier plate 221, the first pick-and-place device 42 of the transport device 40, on the temporary storage tray 212, all of the sixth level of the finished electronic component 52 is picked and transferred to the tray 24B. The collection and storage are performed to reduce the collection operation time. After the receipt is completed, the tray mechanism 22 carries the feed tray 24B corresponding to the second of the storage cassette 21 At the layer support frame 211, the shifting mechanism 23 moves the tray 24B onto the support frame 211 of the storage cassette 21 to complete the receiving operation.
10‧‧‧機台 10‧‧‧ machine
11‧‧‧供料裝置 11‧‧‧Feeding device
111‧‧‧料盤 111‧‧‧Tray
12A、12B、12C、12D、12E、12F、12G‧‧‧收料裝置 12A, 12B, 12C, 12D, 12E, 12F, 12G‧‧‧ receiving devices
121A、121B、121C、121D、121E、121F、121G‧‧‧料盤 121A, 121B, 121C, 121D, 121E, 121F, 121G‧‧‧
13‧‧‧測試裝置 13‧‧‧Testing device
131‧‧‧測試電路板 131‧‧‧Test circuit board
132‧‧‧測試座 132‧‧‧ test seat
14‧‧‧輸送裝置 14‧‧‧Conveyor
141‧‧‧取放器 141‧‧‧ picker
15‧‧‧電子元件 15‧‧‧Electronic components
20、20A‧‧‧複合收料單元 20, 20A‧‧‧Composite receiving unit
21‧‧‧收納匣 21‧‧‧ Included 匣
211‧‧‧支撐架 211‧‧‧Support frame
212‧‧‧暫置盤 212‧‧‧ temporary disk
22‧‧‧承盤機構 22‧‧‧Receiving institutions
221‧‧‧承板 221‧‧‧ board
2211‧‧‧限位槽 2211‧‧‧Limited slot
222‧‧‧馬達 222‧‧‧ motor
223‧‧‧皮帶輪組 223‧‧‧ Pulley set
224‧‧‧螺桿螺座組 224‧‧‧ Screw screw set
225‧‧‧導桿 225‧‧‧guides
23‧‧‧移盤機構 23‧‧‧Transfer Mechanism
231A‧‧‧夾爪 231A‧‧‧claw
2311A、2312A‧‧‧推塊 2311A, 2312A‧‧‧ push block
2313A‧‧‧頂抵件 2313A‧‧‧Parts
2314A‧‧‧彈簧 2314A‧‧ Spring
231B‧‧‧夾爪 231B‧‧‧claw
2311B、2312B‧‧‧推塊 2311B, 2312B‧‧‧ push block
2313B‧‧‧頂抵件 2313B‧‧‧Parts
2314B‧‧‧彈簧 2314B‧‧ Spring
232‧‧‧馬達 232‧‧‧Motor
2331‧‧‧第一皮帶輪組 2331‧‧‧First pulley set
2332‧‧‧軸桿 2332‧‧‧ shaft
2333、2334‧‧‧第二皮帶輪組 2333, 2334‧‧‧Second pulley set
234A、234B‧‧‧滑軌 234A, 234B‧‧‧ slide rails
235A、235B‧‧‧滑座 235A, 235B‧‧‧ slide
236‧‧‧限位桿 236‧‧‧Limited rod
237‧‧‧壓缸 237‧‧‧pressure cylinder
238‧‧‧推桿 238‧‧‧Put
24、24A~24E‧‧‧料盤 24, 24A~24E‧‧‧ tray
25A‧‧‧收納匣 25A‧‧‧ Included 匣
251A‧‧‧支撐架 251A‧‧‧Support frame
252A‧‧‧暫置盤 252A‧‧‧ temporary disk
26A‧‧‧承盤機構 26A‧‧‧Receiving agency
261A‧‧‧承板 261A‧‧‧ board
262A‧‧‧馬達 262A‧‧ motor
263A‧‧‧螺桿螺座組 263A‧‧‧ screw screw set
264A‧‧‧連動件 264A‧‧‧ linkages
27A‧‧‧移盤機構 27A‧‧‧Shifting mechanism
271A‧‧‧夾具 271A‧‧‧ fixture
272A‧‧‧第一馬達 272A‧‧‧First motor
273A‧‧‧螺桿螺座組 273A‧‧‧ Screw Screw Set
274A‧‧‧活動板 274A‧‧‧ activity board
275A‧‧‧第二馬達 275A‧‧‧second motor
276A‧‧‧皮帶輪組 276A‧‧‧ Pulley set
277A‧‧‧活動桿 277A‧‧‧ activity pole
28A、281A‧‧‧料盤 28A, 281A‧‧‧ tray
30‧‧‧機台 30‧‧‧ machine
40‧‧‧輸送裝置 40‧‧‧Conveyor
41‧‧‧載台 41‧‧‧ stage
42‧‧‧第一取放器 42‧‧‧First pick and place
43‧‧‧第二取放器 43‧‧‧Second pick and place
51~55‧‧‧電子元件 51~55‧‧‧Electronic components
60‧‧‧供料裝置 60‧‧‧Feeding device
61‧‧‧料盤 61‧‧‧Tray
70‧‧‧收料裝置 70‧‧‧Receiving device
71‧‧‧收料單元 71‧‧‧Receiving unit
711‧‧‧料盤 711‧‧‧Tray
80‧‧‧測試裝置 80‧‧‧Testing device
81‧‧‧測試電路板 81‧‧‧Test circuit board
82‧‧‧測試座 82‧‧‧ test seat
83‧‧‧壓接機構 83‧‧‧Crimping mechanism
90‧‧‧直立機架 90‧‧‧Upright rack
91‧‧‧容置空間 91‧‧‧ accommodating space
100‧‧‧空盤裝置 100‧‧‧ empty disk device
第1圖:習知電子元件測試分類機之示意圖。 Figure 1: Schematic diagram of a conventional electronic component test sorter.
第2圖:本發明複合收料單元第一實施例之前視圖。 Figure 2: Front view of a first embodiment of the composite receiving unit of the present invention.
第3圖:本發明複合收料單元第一實施例之俯視圖。 Figure 3 is a plan view of a first embodiment of the composite receiving unit of the present invention.
第4圖:複合收料單元第一實施例之使用示意圖(一)。 Figure 4: Schematic diagram of the use of the first embodiment of the composite receiving unit (1).
第5圖:複合收料單元第一實施例之使用示意圖(二)。 Figure 5: Schematic diagram of the use of the first embodiment of the composite receiving unit (2).
第6圖:複合收料單元第一實施例之使用示意圖(三)。 Figure 6: Schematic diagram of the use of the first embodiment of the composite receiving unit (3).
第7圖:複合收料單元第一實施例之使用示意圖(四)。 Figure 7: Schematic diagram of the use of the first embodiment of the composite receiving unit (4).
第8圖:複合收料單元第一實施例之使用示意圖(五)。 Figure 8: Schematic diagram of the use of the first embodiment of the composite receiving unit (5).
第9圖:本發明複合收料單元第二實施例之前視圖。 Figure 9 is a front elevational view of a second embodiment of the composite receiving unit of the present invention.
第10圖:複合收料單元第二實施例之使用示意圖(一)。 Figure 10: Schematic diagram of the use of the second embodiment of the composite receiving unit (1).
第11圖:複合收料單元第二實施例之使用示意圖(二)。 Figure 11: Schematic diagram of the use of the second embodiment of the composite receiving unit (2).
第12圖:複合收料單元第二實施例之使用示意圖(三)。 Figure 12: Schematic diagram of the use of the second embodiment of the composite receiving unit (3).
第13圖:複合收料單元應用於測試分類機之俯視圖。 Figure 13: The top view of the composite receiving unit applied to the test sorter.
第14圖:複合收料單元應用於測試分類機之前視圖。 Figure 14: The composite receiving unit is applied to the test classifier front view.
第15圖:本發明測試分類機之使用示意圖(一)。 Figure 15: Schematic diagram of the use of the test sorter of the present invention (1).
第16圖:本發明測試分類機之使用示意圖(二)。 Figure 16: Schematic diagram of the use of the test sorter of the present invention (2).
第17圖:本發明測試分類機之使用示意圖(三)。 Figure 17: Schematic diagram of the use of the test sorter of the present invention (3).
20‧‧‧複合收料單元 20‧‧‧Composite receiving unit
21‧‧‧收納匣 21‧‧‧ Included 匣
211‧‧‧支撐架 211‧‧‧Support frame
212‧‧‧暫置盤 212‧‧‧ temporary disk
22‧‧‧承盤機構 22‧‧‧Receiving institutions
221‧‧‧承板 221‧‧‧ board
222‧‧‧馬達 222‧‧‧ motor
223‧‧‧皮帶輪組 223‧‧‧ Pulley set
224‧‧‧螺桿螺座組 224‧‧‧ Screw screw set
225‧‧‧導桿 225‧‧‧guides
23‧‧‧移盤機構 23‧‧‧Transfer Mechanism
231A‧‧‧夾爪 231A‧‧‧claw
2311A‧‧‧推塊 2311A‧‧‧ push block
2313A‧‧‧頂抵件 2313A‧‧‧Parts
2314A‧‧‧彈簧 2314A‧‧ Spring
231B‧‧‧夾爪 231B‧‧‧claw
2311B‧‧‧推塊 2311B‧‧‧ push block
2313B‧‧‧頂抵件 2313B‧‧‧Parts
2314B‧‧‧彈簧 2314B‧‧ Spring
232‧‧‧馬達 232‧‧‧Motor
2332‧‧‧軸桿 2332‧‧‧ shaft
2333、2334‧‧‧第二皮帶輪組 2333, 2334‧‧‧Second pulley set
234A、234B‧‧‧滑軌 234A, 234B‧‧‧ slide rails
235A、235B‧‧‧滑座 235A, 235B‧‧‧ slide
236‧‧‧限位桿 236‧‧‧Limited rod
237‧‧‧壓缸 237‧‧‧pressure cylinder
238‧‧‧推桿 238‧‧‧Put
24‧‧‧料盤 24‧‧‧Tray
30‧‧‧機台 30‧‧‧ machine
Claims (10)
Priority Applications (1)
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TW101129911A TWI454715B (en) | 2012-08-17 | 2012-08-17 | Electronic components composite receiving unit and its application of the test equipment |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW101129911A TWI454715B (en) | 2012-08-17 | 2012-08-17 | Electronic components composite receiving unit and its application of the test equipment |
Publications (2)
Publication Number | Publication Date |
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TW201409043A true TW201409043A (en) | 2014-03-01 |
TWI454715B TWI454715B (en) | 2014-10-01 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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TW101129911A TWI454715B (en) | 2012-08-17 | 2012-08-17 | Electronic components composite receiving unit and its application of the test equipment |
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TW (1) | TWI454715B (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI557413B (en) * | 2015-06-05 | 2016-11-11 | Hon Tech Inc | Test equipment for electronic components testing equipment for anti - noise devices and their application |
TWI748508B (en) * | 2020-06-08 | 2021-12-01 | 鴻勁精密股份有限公司 | Workpiece positioner and operating apparatus using the same |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0695125B2 (en) * | 1988-07-22 | 1994-11-24 | 三菱電機株式会社 | Semiconductor device test equipment |
CN100554952C (en) * | 2005-08-03 | 2009-10-28 | 鸿劲科技股份有限公司 | IC testing machine |
US7825650B2 (en) * | 2006-12-15 | 2010-11-02 | Verigy (Singapore) Ptd. Ltd. | Automated loader for removing and inserting removable devices to improve load time for automated test equipment |
TWI394172B (en) * | 2008-12-19 | 2013-04-21 | Hon Tech Inc | Automatic test sorting machine |
TWI418810B (en) * | 2010-03-26 | 2013-12-11 | Hon Tech Inc | Testing machine for multi-layer electronic elements |
-
2012
- 2012-08-17 TW TW101129911A patent/TWI454715B/en active
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI557413B (en) * | 2015-06-05 | 2016-11-11 | Hon Tech Inc | Test equipment for electronic components testing equipment for anti - noise devices and their application |
TWI748508B (en) * | 2020-06-08 | 2021-12-01 | 鴻勁精密股份有限公司 | Workpiece positioner and operating apparatus using the same |
Also Published As
Publication number | Publication date |
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TWI454715B (en) | 2014-10-01 |
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