201130726 六、發明說明： 【發明所屬之技術領域】 本發明係提供一種可易於増設取放器，並迅速調整各取放器 之χ — γ軸向間距’以利取放電子元件，而大幅提 作業便利性之檢測機。 【先前技術】201130726 VI. Description of the Invention: [Technical Field] The present invention provides a device for easily arranging a pick and place device and quickly adjusting the 轴向-γ axial spacing of each pick and place device to facilitate the placement of electronic components. A test machine for the convenience of work. [Prior Art]
按，請參閱第1圖，係為坊間電子元件測試分類機之示意圖 ’其係於機台之前方設有供料裝置10及收料裝置2〇，並於機 台之J方設有複數侧試裝置3 Q，該供料裝置i Q係設有至少 谷置槽之料盤1 1，用以盛裝複數個待測之電子元件，收料 裝亦設有複數個具容置槽之料盤2 1 ’用以盛裝不同等級 而測試裳置3 Q則設有具複數個測試座3 2之 二，ffl 21 ’ H則試電子元件，另於機台上設有輸送裝置 、目d二二供、收料裝置1 0、20及測試襄置30間移載待 元件’該輸送農置4 ◦係於收料裝置2 0與測試 ^供、收tim4 送待測/完測之電子元件，並 4 2、1之第一、2 〇與載具4 1間設有具複數個取放器 及於㊉w t ί 4 2 ’収移載制/完測之電子元件，以 巧41間設有具取放器川之第二移料 久容置二子元件，由於料盤11、21 二移料臂4 2、U之各取;距不同’即必須使第一、 調整，以便於料盤]·!、9 n42l、43l可作γ軸向間距 電子元件；請#_2^座3 2處取放待測/完測之 機架42 2上設料=為例，其係於 軸向皮帶輪並於Γζ 動架4 2 5，己J-具Y軸向滑槽4 2 5 1之掣 Μ Η滑置，滑1供-滑動架4 2 6之凸榫 動架4 2 6之㈣係裝配有第二取放器4 2 1 , ·** t 3 201130726 B，並於背面裝設有傳動架42 7，且 4 2 6間設有相配合之2軸向滑執4 27與滑動架 2，另於機架4 2 2之背面3d1，向滑座4 2 6 位於機架4 2 2前面之γ轴向’用以驅動- 1 A、4 2 i 軸向間係以;器=器i Ξ件二達4 2 3 C驅動Y轴向皮帶輪組4 ^ 二 軸向位移， φ，而驅動滑動架4 2 6以凸榫4 2 6 1 軸向位移，使滑動架4 2 6帶動第!刪 1 2 1 Β么目，於第—取放器4 2 i讀γ轴向位移 “ •u辟一取放器4 2 1 A、4 2 1 6之¥軸向間距；惟，兮ί-移Press, please refer to Figure 1, which is a schematic diagram of the electronic component test sorting machine. It is provided with the feeding device 10 and the receiving device 2〇 before the machine, and has multiple sides on the J side of the machine. The test device 3 Q is provided with a tray 1 1 for at least a trough, for holding a plurality of electronic components to be tested, and the receiving device is also provided with a plurality of trays with receiving slots. 2 1 'Used to hold different grades and test skirts 3 Q is equipped with a plurality of test sockets 3 2 nd, ffl 21 'H test electronic components, and a conveyor on the machine, head d 2 The feeding and receiving device 10, 20 and the test device 30 transfer the component to be placed. The conveying device 4 is connected to the receiving device 20 and the electronic component for testing and receiving the tim4 for testing/finishing. And the first 2, 2 〇 and the carrier 4 1 are provided with a plurality of pick-and-place devices and electronic components for receiving/completed at 10 w t ί 4 2 ' The second transfer material with the pick-and-place device has a long time to accommodate the two sub-components, because the trays 11, 21 and the two transfer arms 4, U are taken separately; the distance is different, that is, the first, the adjustment must be made to facilitate the tray] · !, 9 n42l, 43l can be used as γ axial spacing electronic components; please #_2^座3 2 pick up and place the rack to be tested / finished measuring 42 2 on the material = for example, it is tied to the axial pulley Γζ moving frame 4 2 5, J-with Y-axis chute 4 2 5 1 掣Μ Η sliding, sliding 1 supply - sliding frame 4 2 6 convex turret 4 2 6 (4) is equipped with the first The second pick-and-place device 4 2 1 , ·** t 3 201130726 B, and the drive frame 42 7 is mounted on the back side, and the 4 2 6 is provided with a matching 2 axial slide 4 27 and the carriage 2, On the back side 3d1 of the frame 4 2 2 , the y-axis 'in the front of the frame 4 2 2 to the carriage 4 2 6 is used to drive the - 1 A, 4 2 i axial direction; the device = the device i Two up to 2 2 3 C drive Y-axis pulley set 4 ^ two-axis displacement, φ, while the drive carriage 4 2 6 is displaced axially by the tenon 4 2 6 1 , so that the carriage 4 2 6 drives the first! 2 1 Β目目, in the first - pick and place device 4 2 i read γ axial displacement " • u open a pick and place device 4 2 1 A, 4 2 1 6 ¥ axial spacing; only, 兮ί-shift
料臂4 2雖可使第-、二取放器4 2工A ^以J 距調整及Z軸向升降位移，但第一、二取放器4 J ，z軸向升降位移係用以取放電子 4 u ，，、42_距調整，於第一不=器4巧 、4 21B之Y軸向間距調整設計上，該移料臂4 2&以 馬達4 2 3 C驅動γ軸向皮帶輪組4 2 8 ^ 動第二取放器4 2 ! B作單一Y軸向位移， =勢下二業者欲於第—移料臂4 2上增設X軸向平行排列$ 放電子元件作業之產能時，即必須使各列取放器 、目丨I ^轴向離之調整，以因應不同料盤之容置槽間距及各 ί=:使第一、二取放器421Α、42ΐβ作單- f雨調整讀無法增⑦可作χ軸向間賴整之取放器，造成取 放電子元件作業產能受限之缺失。 故，如何設計-種級增設取放^，並可迅速輕各取放器 iX:Y#向間距而便利取放電子元件，以提升檢測產能及作i 便利性之檢測機，即為業者研發之標的。 、 【發明内容】 201130726Although the material arm 4 2 can adjust the displacement of the first and second pick-and-place devices 4 and the Z-axis, the axial displacement of the first and second pick-and-place devices 4 J and z can be taken. The discharge electrons 4 u , , , 42_ distance adjustment, in the first non-device 4 Qiao, 4 21B Y-axis spacing adjustment design, the moving arm 4 2 & motor 4 2 3 C drive γ axial pulley Group 4 2 8 ^ The second pick-and-placer 4 2 ! B is a single Y-axis displacement, and the second operator wants to add the X-axis parallel arrangement on the first-transfer arm 4 2 to the capacity of the electronic component operation. At that time, it is necessary to adjust the column pick-and-place device and the I ^ axial direction to meet the spacing of the receiving grooves of different trays and the respective ί=: making the first and second pick-and-place units 421Α, 42ΐβ single- f Rain adjustment can not be increased by 7 can be used as a pick-and-place device between the axial direction, resulting in the lack of capacity of the pick-and-place electronic components. Therefore, how to design - the type of additional pick-and-place ^, and quickly and easily pick and place the device iX: Y# convenient to pick and place electronic components to improve the detection capacity and the convenience of the detection machine, that is, for the research and development of the industry The subject matter. , [Summary of the Invention] 201130726
本發明之目的一，係提供一種電子元件之檢測機，係於機台 上配置有供料裝置、收料裝置、檢測裝置及輸送襄置，該供料裝 置係容納複數個待測之電子元件，收料裝置係容納複數個不同^ 級完測之電子元件，檢測裝置係用以檢測電子元件，該輸送裝置 係於檢測裝置ϋ林設有至載具，該储翻以於供、 收料裝置及檢測裝置間載送待測/完測之電子元件，另設有至少 一具複數個取放器之移料臂，各移料臂係設有複式螺紋變距機 構，用以調整各取放器之χ_γ軸向間距，而可於供料裝置、收 料裝置:檢測裝置及載具間移麟測/完測之電子元件；藉此， 可易於增設取放器，並迅速調整各取放器之間距而便利取放電子 元件，達到大幅提升檢測產能之實用效益。 本發明之目的二，係提供一種電子元件之檢測機，該輸送裝 置之複式螺紋變距機構係設有又軸向驅動源及γ軸向驅動源，該 X軸向驅動源係用以驅動至少一具左、右螺紋之X軸向螺桿，並 於X軸向螺桿上螺合二可作反向位移之X軸向驗，且於各乂轴 向螺座上裝配取放器，而Υ軸向驅動源係用以驅動至少一具左、 右螺紋之Υ軸向螺桿，並於γ㈣螺桿上螺合二可作反如立移之 Υ軸向螺座，錄各γ軸向職上裝配較[使得複式螺紋變 ^機構可迅速帶動各取放器作χ — γ軸向間距織，而縮短作業 時間，達到大幅提升檢測產能之實用效益。 明之目的三，係提供一種電子元件之檢測機，該輸送裝 不式螺紋變距機構係於二X軸向螺座上分別穿少一 =，而於二Υ軸向螺座上則分別穿設至少二向 使各χ軸向桿件之兩端與各γ軸向桿件之兩端作上下交錯設置， =會交錯處裝設有配置座，柯於各配置座上裝配有取放器， 效只。於增轴向取放器，達到大幅提升檢測產能之實用 【實施方式】 眘,H Ϊ審查委員對本發明作更進—步之瞭解，茲舉一較佳 實訑例並配合圖式，詳述如后·· 請參閱第4圖，本發明檢測機係於機台上配置有供料裝置 201130726 5 Ο、收料裝置6 〇、空匣裝置7 0、檢測裝置8 0及輸送裝置 9 0 ’該供料裝置5 〇係設有至少一料盤5 01，該料盤5 01 係具有複數個容置槽5 〇 2，用以承置待測之電子元件，該收料 裝置6 0係設有至少一料盤6 〇1，料盤6 01則具有複數個容 置槽6 0 2 ’用以承置完測之電子元件，於本實施例中，係設有 複數個料盤6 〇1，用以承置不同等級完測之電子元件，空匣裝 置7 0係用以收置供料裝置5 〇之空料盤，並將空料盤補充於收 料裝置6 0，用以盛裝完測之電子元件，該檢測裝置8 〇係可為 電子元件之電性檢測、外觀檢測或其他相關之檢測，本實施例為 電性檢測時，該檢測裝置8 〇係設有具測試座8 2之測試電路板 81，該測試座8 2可為常開型測試座或常閉型測試座，於本實 施例中，該測試電路板81上係配置有g個常開型測試座8 2， 用以同步執行9個電子元件之檢測作業，並以檢測器⑽未示出） 將檢測結果傳輸至中央控制單元（圖未示出），由巾央控制 ^各裝置作動，該輸送裝置9 〇包含有至少—載具及至少二移= ^該載具可採活動式或固定式設計，於本實施财 =0係於檢測裝置8 Q之前方設有可似軸向 ，g 9,1，第-載具9 1係設有複數個定位槽9丄i，例如^ = 採X — Y軸向排列之定位槽911，用 有9個 以及於檢測裝置8 0之後方亦設有一可作電：兀件’ 92 ’第二載具92係設有複數個定位槽92° j二載具 採X —Y軸向排列之定位槽9 2 1，用以哉…—、’，列如設有9個 另該輸送裝置9⑽於供料裝置5 第之電子元件， X-Y-Z軸向位移之第-移料臂93、第用間設有可作 件，於第-載具91與檢測裝置8〇間設待測之電子元 之第二移料臂g 5 ,用以移载待測之電 —2軸向位移 之 而於各 载具 與第二載具9 2間設有可作γ~ζ軸向位=牛，=檢測裝置8 0 用以移載完測之電子元件，於第二載且Q之第二移料臂θ β， 有可作X-Υ-Ζ軸向位移之第四移^，收料裝置6 0間設 電子元件，該輸送裝置9 0可視移載電_ 用以移载完測 移料臂上設有固定式取放器或變距式取放^件:業所需，而於. 201130726 9 1、9 2之各定位槽9 1 1、9 2 ]的γ X, 於檢測裝置8 0之各測試座8 2的}灿:Υ軸向間距係相對 中，該第二移料臂9 5及第三移料臂q β^，間距，於本實施例 式之取放器9 5 1、9 6 1，而供、收料設置複數侧定 槽5 0 2、6 0 2的Χ-Υ軸向間距，因電:$容【 可能不同於第-、二載具9 1、9 2之定^ ί電子件，而 X — Y軸向間距，於本實施例中，該第一:ί 1、9 21的 臂9 7係可分別設置複數個變距式^取 ^9 3及第四移料 配合不同電子元件進行取放作業。 Q 9 31、9 71，以 請參閱第4、5、6、7圖，由於笛 9 7之設計她於本實酬中，細^移^；；=臂^、 該第-移料臂9 3係設有移載機構9 3 Q ^機^ ’ 複數個取放器9 3 1，並於移載機構9 3 複式螺紋變距機構’以帶動其似―γ ，架9 3 2上裝配 紋變距機構係於機架9 3 2之下方設移，該複式螺 動源，該X軸向驅動源係狀驅動至=驅動源及Υ軸向驅 螺桿，於本實施例中，該X軸向驅動源係為軸向 用以驅動一具左、右螺紋之X軸向螺梅 °馬達9 3 3 9 3 4之中間位置係穿設-固設於機架g 4 ’該X軸向螺桿 A，並於左、右螺紋處分別螺合一χ車由向螺座9 =置3益 座9 3 5Α及二X軸向螺座9 3 ft >久担* 士 再於配置 ==3 4驅動二X軸向螺 3 6:器:iix 位移’以調整各取放器9 3 1之X轴向間距，又該 13 8，該¥軸向螺桿9 3二中間=亦ί 叹於配置座9 3 5A ’且與又軸向螺桿9 3 4作上下錯 轴向螺座 b,j 二Y軸向螺座9 3 9位移時，可使二丫軸向螺! 201130726 y A，基準件’而作γ轴向之反向位移以調整各取放器 轴向間距，另於二χ軸向_9 3 6上分別穿設有一 =向#件9 4 〇 ’並於二γ麵螺座9 3 9上分別穿設有一χ 件9 4/，該二，向桿件9 4 〇之兩端及二桿件 q π 呈上下父錯配置’並於各交錯處裝設一配置座 -X軸⑽ϊίΐΤίί9 J5B上裝配有-取放器9 3 1，當 螺座9 3 6帶動二Y轴向桿件9 4 〇作X軸向位移，以 ί 9 3 9帶動二X軸向桿件9 4 1作丫軸向位移 動各配置座9 3 5 B及其上之各取放器9 3 1作J ❹得複式螺紋變距機構可易於增設取放器9 3 i， 9個取放器9 3 1之X—Y軸向間距，再者，本實 A、q 9 = 9 3 6、各¥軸向螺座9 3 9及各配置座9 3 5 ί裝西 壓缸之z軸向驅動源，再於 移P電子元3件使各取放器9 3 1可獨立執行Z軸向位 9 3 0係以::取::9二用時’第-移料臂9 3之移載機構 •上方，並:=ί仏:==。5〇之料盤5〇1 =Ζ9Λ4:動屯二以 〇再帶動各配置座9 3 ^f _移’使二Υ軸向桿件9 4 向:位移，而Y轴向螺桿9 3 8、則=放向之 二取放器9 3 1作γ轴向μ— ▼動一7轴向螺座9 3 9及 時帶動二X軸向桿件=軸向螺座9 3 9亦同 件9 4 i再帶動各配置:以==移，使二X轴向桿 軸向之向内位移，進而可調# 八之各取放器9 31作γ 而了調整縮8小各取放器9 3 1之Χ-γ轴向u 201130726 間距，移载機構9 3 0再帶動各取放器9 31作Z軸向办狡、 於料盤5 01上取出待測之電子元件1〇 〇。 ，以 請參閱第1〇、11圖，當第一移料臂9 3之複 。 9 3玉取出待測之電子元件！〇 〇後，移載機構g 3 = 取放器9 31位移至第一載具91處，由於供料裝置5 置槽5 0 2的X-Y軸向離因不職子元件而不同 ^ 91之定位槽91 1的X-Y軸向間距，該第一移料 ; 整;大各取放器9 3 kX，向間距，於調整巧= 達9 3 3及Y軸向馬達9 3 7分別驅動球向螺 向螺桿9 3 8反向旋轉作動，使得X軸向螺桿9、3 4 轴向螺座9 3 6及裝配於上之二取放器 二而二x軸向螺座9 3 6則同時帶動二 9 二¥軸向桿件9 4 0再帶動各配2 ydbB及其上之各取放器931作X軸向之向外她 可帶動二作向螺座9 3 9及裝配於上:丄:2 向之向外位移’二¥軸向螺座9 3 9亦同時ΐ動！ 再册二:两番41作丫轴向之向外位移’使二Χ軸向桿件9 41 ，動各配置座9 3 5 Β及其上之各取放器 4 1 放SIC取放器93lix-d ^作〜向位移將待測之電子 1 〇 0:二5具^1係承載待測之電子元件 9 5 1即於第一载且9 移動臂9 5之各取放器 1 0 0 ;請參閱第位槽9 1 1中取出待測之電子元件 將待測之電子，第二移動臂9 5之各取放器9 5 1係 中，各測ί座8 ^執〇 測裝置8 0之各測試座8 2 此時，該第測結果傳輸至中央控制單元，A first object of the present invention is to provide a detecting device for an electronic component, which is provided with a feeding device, a receiving device, a detecting device and a conveying device, and the feeding device is for accommodating a plurality of electronic components to be tested. The receiving device is configured to accommodate a plurality of different electronic components that are tested, and the detecting device is used for detecting electronic components. The conveying device is provided in the detecting device, the forest is provided to the carrier, and the storage device is used for feeding and receiving materials. The device and the detecting device carry the electronic component to be tested/tested, and at least one moving arm of the plurality of pick and place devices is provided, and each of the moving arms is provided with a double thread changing mechanism for adjusting each放 γ γ axial spacing, and can be used in the feeding device, receiving device: detecting device and the electronic components between the measuring device and the measuring device; thereby, it is easy to add a pick and place device, and quickly adjust each The distance between the amplifiers is convenient for picking and placing electronic components, which achieves the practical benefit of greatly improving the detection capacity. A second object of the present invention is to provide a detecting device for an electronic component, wherein the multi-thread pitch changing mechanism of the conveying device is provided with an axial driving source and a γ-axis driving source, and the X-axis driving source is used to drive at least An X-axis screw with left and right threads, and screwed on the X-axis screw for X-axis axial inspection of reverse displacement, and a pick-and-placer for each axial screw seat, and the shaft The drive source is used to drive at least one of the left and right threaded axial screws, and the two screws on the γ (four) screw can be used as the reverse axial displacement screw, and the γ axial assembly is recorded. [Making the multi-thread change mechanism can quickly drive each pick-and-place device for χ-γ axial spacing weaving, which shortens the working time and achieves the practical benefit of greatly improving the detection capacity. The purpose of the invention is to provide an electronic component detecting device, wherein the non-thread-changing mechanism of the transporting device is respectively worn on the two X-axis screw seats, and is respectively worn on the two-axis axial screw seats. At least two directions are arranged at both ends of each axial rod member and the two ends of each γ-axis rod member are arranged up and down, and a locating seat is arranged at the staggered portion, and a pick-and-place device is arranged on each of the arranging seats. Effective only. Yuzeng Axle pick and place device, which is a practical way to greatly improve the detection capacity [Implementation] Shen, H Ϊ Review Committee to make a more in-depth understanding of the present invention, a better example and with the diagram, detailed For example, referring to Fig. 4, the detecting machine of the present invention is equipped with a feeding device 201130726 5 Ο, a receiving device 6 〇, an empty device 70, a detecting device 80, and a conveying device 90. The feeding device 5 is provided with at least one tray 510, and the tray 511 has a plurality of accommodating grooves 5 〇 2 for accommodating the electronic components to be tested, and the receiving device 60 is provided. There is at least one tray 6 〇1, and the tray 6 01 has a plurality of accommodating grooves 2020 for receiving the completed electronic components. In this embodiment, a plurality of trays 6 〇1 are provided. For the electronic components of different levels to be tested, the open device 70 is used to receive the empty tray of the feeding device 5, and the empty tray is replenished to the receiving device 60 for filling. The electronic component, the detecting device 8 can be an electrical detection, an appearance detection or other related detection of the electronic component, this embodiment During the electrical detection, the detecting device 8 is provided with a test circuit board 81 having a test socket 82. The test socket 8 2 can be a normally open test socket or a normally closed test socket. In this embodiment, the test device 8 The test circuit board 81 is provided with g normally open type test sockets 8 2 for synchronously performing the detection operations of the nine electronic components, and transmitting the detection results to the central control unit by the detector (10) (Fig. The device is controlled by the towel control device, and the transport device 9 includes at least a carrier and at least two shifts. ^ The carrier can be used in a movable or fixed design. The detecting device 8 Q is provided with an axial direction, g 9,1, and the first carrier 9 1 is provided with a plurality of positioning grooves 9丄i, for example, a positioning groove 911 which is axially arranged by X-Y. There are 9 and the detection device 80 is also provided with a power supply: the '92' second carrier 92 is provided with a plurality of positioning grooves 92 ° j two carriers are arranged X-Y axially The positioning groove 9 2 1 is used for 哉...—, ', if there are 9 other conveying devices 9 (10) in the feeding device 5, the electronic component, XYZ axial position The moving first-transfer arm 93 and the first use room are provided with a movable member, and the second transfer arm g 5 of the electronic component to be tested is disposed between the first carrier 91 and the detecting device 8 for loading and waiting Measured electric - 2 axial displacement between the respective carrier and the second carrier 9 2 can be used as γ ~ ζ axial position = cattle, = detection device 80 is used to transfer the completed electronic components, In the second load and the second transfer arm θ β of Q, there is a fourth shift which can be used for X-Υ-Ζ axial displacement, and electronic components are arranged between the receiving devices 60, and the transport device 90 can be visually transferred. Electric _ used to transfer the test transfer arm with a fixed pick-and-place device or variable pitch pick-and-place tool: required by industry, and in 201130726 9 1, 9 2 each positioning slot 9 1 1, 9 γ X of 2 ] is opposite to the axial distance of each test seat 8 2 of the detecting device 80, and the second moving arm 9 5 and the third moving arm q β^ are spaced apart The pick-and-place device of the present embodiment is 9 5 1 and 9 6 1, and the Χ-Υ axial spacing of the plurality of side slots 5 0 2, 6 0 2 is set for the supply and receiving, because the electricity: $ 容 [may be different The first and second carriers 9 1 and 9 2 are electronic components, and the X-Y axial spacing is the first in the embodiment. : ί 1, 9 21 arm 9 7 series can be set to a plurality of variable distance type ^ ^ 3 and the fourth transfer material with different electronic components for pick and place operations. Q 9 31, 9 71, please refer to the pictures of Figures 4, 5, 6, and 7. Because of the design of the flute 9 7 she is in the actual remuneration, fine ^ ^ ^;; = arm ^, the first - transfer arm 9 The 3 series is provided with a transfer mechanism 9 3 Q ^ machine ^ 'plural number of pick and place devices 9 3 1, and in the transfer mechanism 9 3 double thread pitch changing mechanism 'to drive its like γ, frame 9 3 2 on the assembly pattern The variable pitch mechanism is disposed below the frame 923, the multiple slewing source, the X-axis drive source is driven to the = drive source and the Υ axial drive screw. In this embodiment, the X-axis The intermediate position of the driving source is axially driven to drive a left and right threaded X-axis screw motor 9 3 3 9 3 4 - fixed to the frame g 4 'the X-axis screw A, and screwed together at the left and right threads, respectively, a car from the screw seat 9 = set 3 beneficial seat 9 3 5 Α and two X-axis screw seat 9 3 ft > long-term * 士再在Configuration == 3 4 drive two X-axis screw 3 6: device: iix displacement 'to adjust the X-axis spacing of each pick-and-placer 9 3 1 , and then 13 8 , the ¥ axial screw 9 3 two middle = also 叹 sigh Seat 9 3 5A 'and with the axial screw 9 3 4 up and down the wrong axial screw b, j two Y axial screw seat 9 3 9 position In the case of the second axial snail! 201130726 y A, the reference member's the reverse displacement of the γ-axis to adjust the axial spacing of each pick-and-placer, and the second y-axis _9 3 6 There is a = 9 〇 ' and a γ 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 9 Parent error configuration 'and a configuration seat at each stagger-X axis (10) ϊίΐΤίί9 J5B is equipped with a pick-and-placer 9 3 1, when the screw seat 9 3 6 drives the two Y-axis rods 9 4 X axis Displacement, with ί 9 3 9 driving the two X-axis rods 9 4 1 as the 丫 axial position movement of each of the arranging seats 9 3 5 B and each of the pick-and-placers 9 3 1 for J ❹ multi-thread pitch changing mechanism It is easy to add the X-Y axial spacing of the pick-and-placer 9 3 i, the 9 pick-and-placers 9 3 1 , and further, the real A, q 9 = 9 3 6 , each ¥ axial screw seat 9 3 9 and Each configuration seat 9 3 5 ί is equipped with a z-axis drive source of the west pressure cylinder, and then the P-electron element 3 is moved so that each pick-and-placer 9 3 1 can independently perform the Z-axis position 9 3 0 system to: : 9 when used 'the first transfer arm 9 3 transfer mechanism · above, and: = 仏 : ==. 5〇's tray 5〇1=Ζ9Λ4: move the second and then drive each of the lands 9 3 ^f _ move 'to make the two axial rods 9 4 direction: displacement, and Y axis screw 9 3 8 Then = to the second pick and place device 9 3 1 for γ axis μ - ▼ move a 7 axial screw seat 9 3 9 timely drive two X axial rods = axial screw seat 9 3 9 also the same piece 9 4 i then drive each configuration: with == shift, the two X-axis rods are axially displaced inward, and then adjustable #八之 pick and place devices 9 31 for γ and adjusted to reduce 8 small pick-and-place devices 9 3 After 1 Χ-γ axis u 201130726 spacing, the transfer mechanism 9 3 0 drives each pick-and-placer 9 31 for Z-axis operation, and takes out the electronic component 1 待 to be tested on the tray 501. , please refer to Figures 1 and 11, when the first transfer arm 9 3 is restored. 9 3 jade take out the electronic components to be tested! After that, the transfer mechanism g 3 = the pick-up device 9 31 is displaced to the first carrier 91, because the XY axial direction of the feeding device 5 is 50 2 2 is different from the inactive sub-components. The XY axial spacing of the slot 91 1 , the first moving material; the entire; the large pick and place 9 3 kX, the spacing, the adjustment of the smart = 9 3 3 and the Y-axis motor 9 3 7 respectively drive the ball to the snail Reverse rotation of the screw 9 3 8 so that the X-axis screw 9, 3 4 axial screw seat 9 3 6 and the upper two pick-and-placer two and the two x-axis screw seat 9 3 6 simultaneously drive two 9 2 ¥ axial rod 9 4 0 and then drive each 2 ydbB and each pick-and-placer 931 on the X-axis outwards. She can drive the two to the screw seat 9 3 9 and assemble it on: 丄: 2 Displace the outward direction 'two ¥ axial screw seat 9 3 9 also shakes at the same time! Book 2: Two 41s for the axial displacement of the shaft 'to make the two axial rods 9 41 , move each of the seats 9 3 5 Β and each of the pickers 4 1 to put the SIC pick and place 93lix -d ^ to the displacement of the electron to be tested 1 〇 0: two 5 ^ 1 system carrying the electronic component to be tested 9 5 1 is the first carrier and 9 moving arm 9 5 of each pick and place 1 0 0 Please refer to the first slot 9 1 1 to take out the electronic components to be tested, the electrons to be tested, and the second moving arm 9 5 in each of the pick-and-placers 9 5 1 system, each measuring device 8 ^ detecting device 8 0 of each test stand 8 2 At this point, the measurement result is transmitted to the central control unit.
戰具9 1則復位承9載下-待測之電子元件工工〇 ; U 201130726 之檢測作業完畢後，由於第-载 方’該第二移動臂9!之各取放器9 5丄則移動m 9 ^The warfare 9 1 is reset to 9 under the load - the electronic component work to be tested; U 201130726 after the test operation is completed, because the first carrier 'the second moving arm 9! Move m 9 ^
之上方，並取巧下:f測之電子元件110，此時，第三移動臂 9 6之各取放ϋ 9 6 1係位移至檢職置8 Q 測==完測之電子心◦以 第15圖’第二移動’9 6之各取放器9 6工俜 件i 0 ◦移載放置於第二载具9 2之定位槽=== 二移動臂9 5之各取放器9 51則將下—待測 f ^ 移載置入於檢測裝置8 Q之各測試座8 2内 二以 業;請參閱第i 6、1 7圖’第二载具9 2係 件i 0 0 ’第四移動臂9 7之移載機構9 7 〇戰“ :η位移至第二載=2之上方，並利用複式螺 具9 2之定位槽9 2 1的X —Υ轴向間距，移載機“ 7 J 動各取放II 9 7 1作Z轴向位移，而於第二载具9 2上取出完= j子το件1 〇〇 1參閱第丄8、」9圖’之後，第四移動臂 9 7之移載機構9 7 0係帶動各取放器9 7丄位移至收料裝 6 0^料盤6◦1* ’再利用複式螺紋變距機構驅動調整縮^各 取放器9 71之X-Y軸向間距’以對應於料盤6 i之容 6 0 2的X-Y軸向間距’移載機構9 7 Q則帶動各取放^ 9 71作Z軸向位移，並依檢測結果（如良品電子元件、^ 電子元件或次級品電子元件），而直接將完測之電子元件 入於料盤6 0 1之紗置槽6 0 2中，喊成分類收置作業。 據此，本發明可易於增設取放器，並迅速調整各取放器之χ -Υ軸向間距’ _取放電子元件，而大幅提升檢測產能^ 便利性’實為實雜及進步性之設計，然未見有相同之^ 品及刊物公開，從而允符發明專利申請要件，爰依法 。 【圖式簡單說明】 胃 第1圖：習式應用於檢測機各裝置之配置示意圖。 第2圖：習式移料裝置之外觀圖。 201130726 第3圖：習式移料裝置之側視圖。 第4圖.本發明檢測機各裝置之配置示意圖。 第5圖：本發明第一移料臂之俯視圖。 第6圖：本發明第一移料臂之前視圖。 第7圖：本發明第一移料臂之側視圖。 第8圖：本發明檢測機之使用示意圖（一）。 第9圖：係第一移料臂調整縮小各取放器間距之使用示意圖。 第10圖：本發明檢測機之使用示意圖（二）。Above, and deftly: f measured electronic component 110, at this time, the third moving arm 96 of each pick and place ϋ 9 6 1 system displacement to the inspection position 8 Q test == finished electronic heart ◦ Figure 15 'Second movement' 9 6 pick-and-placer 9 6 workpiece i 0 ◦ Transfer placed in the second carrier 9 2 positioning groove === 2 moving arm 9 5 each pick-and-placer 9 51 Then, the lower-to-be-tested f^ transfer is placed in each of the test stands 8 2 of the detecting device 8 Q; please refer to the figure i 6,7 7 'the second carrier 9 2 series i 0 0 ' The transfer mechanism of the fourth moving arm 9 7 fights ": η displacement to the top of the second load = 2, and uses the X-axis axial spacing of the positioning groove 9 2 1 of the compound screw 9 2 to transfer The machine "7 J moves each access II 9 7 1 for Z-axis displacement, and the second carrier 9 2 for removal = j sub-τ ο1 1 〇〇 1 after the 丄8, "9 map", the first Four moving arm 9 7 transfer mechanism 9 7 0 drive each pick and place 9 7 丄 displacement to the receiving device 6 0 ^ tray 6 ◦ 1 * 'reuse the double thread variable pitch mechanism to drive the adjustment The XY axial spacing of the actuators 9 71 is XY axial spacing corresponding to the capacity of the tray 6 i 'transfer mechanism 9 7 Q Then, each of the pick-and-places 9 71 is used for Z-axis displacement, and according to the detection result (such as good electronic components, ^ electronic components or secondary electronic components), the completed electronic components are directly placed into the tray 6 0 1 The yarn is placed in the slot 6 0 2 and shouted into a sorting and collecting operation. Accordingly, the present invention can easily add a pick and place device, and quickly adjust the χ-Υ axial spacing of each pick and place ' _ pick and place electronic components, and greatly improve the detection capacity ^ convenience 'is practical and progressive Design, but did not see the same products and publications open, thus allowing the invention patent application requirements, 爰 legal. [Simple description of the schema] Stomach Figure 1: Schematic diagram of the configuration of the device used in the detector. Figure 2: Appearance of the conventional material transfer device. 201130726 Fig. 3: Side view of the conventional shifting device. Fig. 4 is a schematic view showing the configuration of each device of the detecting machine of the present invention. Figure 5: Top view of the first transfer arm of the present invention. Figure 6: Front view of the first transfer arm of the present invention. Figure 7: Side view of the first transfer arm of the present invention. Figure 8: Schematic diagram of the use of the detector of the present invention (1). Figure 9: Schematic diagram of the use of the first transfer arm to adjust and reduce the spacing of each pick and place. Figure 10: Schematic diagram of the use of the detector of the present invention (2).
第11圖：係第一移料臂調整放大各取放器間距之使用示意圖。 第12圖：本發明檢測機之使用示意圖（三）。 第13圖：本發明檢測機之使用示意圖（四）。 第14圖：本發明檢測機之使用示意圖（五）。 第1 5圖：本發明檢測機之使用示意圖（六）。 第1 6圖：本發明檢測機之使用示意圖（七）。 第17圖：係第二移料臂調整放大各取放器間距之使用示意圖。 第1 8圖：本發明檢測機之使用示意圖（八）。 第19圖：係第二移料臂調整縮小各取放器間距之使用示意圖。 【主要元件符號說明】 〔習式〕 供料裝置：1 〇 料盤：1 1 收料裝置：2 0 料盤：21 測試裝置：3 0 測試電路板：31 測試座：3 2Figure 11: Schematic diagram of the use of the first transfer arm to adjust the magnification of each pick and place. Figure 12: Schematic diagram of the use of the detector of the present invention (3). Figure 13: Schematic diagram of the use of the detector of the present invention (4). Figure 14: Schematic diagram of the use of the detector of the present invention (5). Figure 15: Schematic diagram of the use of the detector of the present invention (6). Figure 16: Schematic diagram of the use of the detector of the present invention (7). Figure 17: Schematic diagram of the use of the second transfer arm to adjust the magnification of each pick and place. Figure 18: Schematic diagram of the use of the detector of the present invention (8). Figure 19: Schematic diagram of the use of the second transfer arm to adjust and reduce the spacing of each pick and place. [Main component symbol description] [Apprentice] Feeding device: 1 料 Tray: 1 1 Receiving device: 2 0 Tray: 21 Test device: 3 0 Test circuit board: 31 Test stand: 3 2
载具：4 1 取放器：4 21 第二取放器：4 21B 第一馬達：42 3A 第三馬達：4 2 3 C γ軸向滑槽：4 2 5 1 輸送裝置：4 0 第一移料臂：4 2 第一取放器：4 21 A 機架：4 2 2 第二馬達：4 2 3 B 第一Z軸向皮帶輪組：424A 第二Z轴向皮帶輪組：424B 掣動架：4 2 5 201130726 滑動架：4 2 β Ζ轴向滑座：4 2 6 2 Ζ軸向滑軌：4 2 7 1 第二移料臂：4 3 〔本發明〕 供料裝置：5 0 谷置槽.5 〇 2 收料裝置：6 〇 容置槽·· 6 0 2 空匣裝置：7 0 檢測裝置：8 〇 測試座：8 2 輸送裝置：9 0 定位槽：91 1 定位槽：9 21 移載機構：9 3 0 機架：9 3 2 X軸向螺桿：9 3 4 X轴向螺座：9 3 6 鲁 Υ軸向螺桿：9 3 8 Υ軸向桿件：9 4 〇 第二移料臂：9 5 第三移料臂：9 Θ 第四移料臂：9 7 取放器：9 71 電子元件：1〇 〇、11〇 &榫：4 2 6 1 傳動架：4 2 7 γ軸向皮帶輪組：4 2 8 取放器：4 31 料盤：5 01 料盤：6 〇1 測試電路板：81 第—載具：91 第二載具：9 2 第一移料臂：9 3 取放器：9 31 X轴向馬達：9 3 3 配置座：935Α、935Β γ軸向馬達：9 3 7 Υ軸向螺座：9 3 9 X軸向桿件·· 9 4 1 取放器：9 51 取放器：9 61 移载機構：9 7 0Vehicle: 4 1 Pick and place: 4 21 Second pick and place: 4 21B First motor: 42 3A Third motor: 4 2 3 C γ Axial chute: 4 2 5 1 Conveying device: 4 0 First Transfer arm: 4 2 First pick and place: 4 21 A Rack: 4 2 2 Second motor: 4 2 3 B First Z-axis pulley set: 424A Second Z-axis pulley set: 424B turret :4 2 5 201130726 Sliding frame: 4 2 β Ζ Axial slide: 4 2 6 2 Ζ Axial slide: 4 2 7 1 Second transfer arm: 4 3 [Invention] Feeding device: 5 0 Valley Slotting.5 〇2 Receiving device: 6 〇 置 · · 6 0 2 Open device: 7 0 Detecting device: 8 〇 Test stand: 8 2 Conveying device: 9 0 Locating groove: 91 1 Locating groove: 9 21 Transfer mechanism: 9 3 0 Rack: 9 3 2 X Axial screw: 9 3 4 X Axial screw seat: 9 3 6 Rough axial screw: 9 3 8 Υ Axial rod: 9 4 〇 Two transfer arms: 9 5 Third transfer arm: 9 Θ Fourth transfer arm: 9 7 Pick and place: 9 71 Electronic components: 1〇〇, 11〇&榫:4 2 6 1 Transmission frame: 4 2 7 γ axial pulley set: 4 2 8 Pick and place: 4 31 Tray: 5 01 Tray: 6 〇 1 Test circuit board: 81 — Vehicle: 91 Second Vehicle: 9 2 First Transfer Arm: 9 3 Pick and Place: 9 31 X Axial Motor: 9 3 3 Mounting Block: 935Α, 935Β γ Axial Motor: 9 3 7 Υ Axis To the screw seat: 9 3 9 X Axial rod ·······································