TW201347973A - Conductive film laminate, touch panel, wiring board, electronic device, transparent two-sided adhesive sheet, transparent adhesive sheet - Google Patents
Conductive film laminate, touch panel, wiring board, electronic device, transparent two-sided adhesive sheet, transparent adhesive sheet Download PDFInfo
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- TW201347973A TW201347973A TW102116622A TW102116622A TW201347973A TW 201347973 A TW201347973 A TW 201347973A TW 102116622 A TW102116622 A TW 102116622A TW 102116622 A TW102116622 A TW 102116622A TW 201347973 A TW201347973 A TW 201347973A
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Classifications
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J133/00—Adhesives based on homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by only one carboxyl radical, or of salts, anhydrides, esters, amides, imides, or nitriles thereof; Adhesives based on derivatives of such polymers
- C09J133/04—Homopolymers or copolymers of esters
- C09J133/06—Homopolymers or copolymers of esters of esters containing only carbon, hydrogen and oxygen, the oxygen atom being present only as part of the carboxyl radical
- C09J133/08—Homopolymers or copolymers of acrylic acid esters
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B15/00—Layered products comprising a layer of metal
- B32B15/04—Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J7/00—Adhesives in the form of films or foils
- C09J7/20—Adhesives in the form of films or foils characterised by their carriers
- C09J7/29—Laminated material
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F3/00—Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
- G06F3/01—Input arrangements or combined input and output arrangements for interaction between user and computer
- G06F3/03—Arrangements for converting the position or the displacement of a member into a coded form
- G06F3/041—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means
- G06F3/044—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means
- G06F3/0445—Digitisers, e.g. for touch screens or touch pads, characterised by the transducing means by capacitive means using two or more layers of sensing electrodes, e.g. using two layers of electrodes separated by a dielectric layer
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/22—Secondary treatment of printed circuits
- H05K3/28—Applying non-metallic protective coatings
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B2307/00—Properties of the layers or laminate
- B32B2307/40—Properties of the layers or laminate having particular optical properties
- B32B2307/412—Transparent
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B2457/00—Electrical equipment
- B32B2457/08—PCBs, i.e. printed circuit boards
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J2203/00—Applications of adhesives in processes or use of adhesives in the form of films or foils
- C09J2203/326—Applications of adhesives in processes or use of adhesives in the form of films or foils for bonding electronic components such as wafers, chips or semiconductors
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J2301/00—Additional features of adhesives in the form of films or foils
- C09J2301/30—Additional features of adhesives in the form of films or foils characterized by the chemical, physicochemical or physical properties of the adhesive or the carrier
- C09J2301/314—Additional features of adhesives in the form of films or foils characterized by the chemical, physicochemical or physical properties of the adhesive or the carrier the adhesive layer and/or the carrier being conductive
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J2400/00—Presence of inorganic and organic materials
- C09J2400/10—Presence of inorganic materials
- C09J2400/16—Metal
- C09J2400/163—Metal in the substrate
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/01—Dielectrics
- H05K2201/0104—Properties and characteristics in general
- H05K2201/0108—Transparent
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/07—Electric details
- H05K2201/0753—Insulation
- H05K2201/0769—Anti metal-migration, e.g. avoiding tin whisker growth
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/12—Using specific substances
- H05K2203/122—Organic non-polymeric compounds, e.g. oil, wax or thiol
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Organic Chemistry (AREA)
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Human Computer Interaction (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Laminated Bodies (AREA)
- Adhesives Or Adhesive Processes (AREA)
- Non-Metallic Protective Coatings For Printed Circuits (AREA)
Abstract
Description
本發明是有關於一種導電膜積層體、觸控面板、配線基板、電子裝置、透明雙面黏著片、透明黏著片。 The present invention relates to a conductive film laminate, a touch panel, a wiring substrate, an electronic device, a transparent double-sided adhesive sheet, and a transparent adhesive sheet.
自先前以來,絕緣基板表面上配置有金屬配線之配線基板廣泛用於電子構件、半導體元件中。作為構成金屬配線之金屬,常使用導電性高之銀、銅,這些金屬存在容易產生離子遷移之問題,特別是於銀中明顯表現出該問題。 A wiring board in which metal wiring is disposed on the surface of an insulating substrate has been widely used for electronic components and semiconductor elements. As the metal constituting the metal wiring, silver or copper having high conductivity is often used, and these metals are liable to cause ion migration, and this problem is particularly apparent in silver.
作為防止此種金屬之離子遷移(ion migration)的方法,提出了於聚合物層導入吸附金屬離子之化合物的方法(專利文獻1)。 As a method of preventing ion migration of such a metal, a method of introducing a compound that adsorbs metal ions into a polymer layer has been proposed (Patent Document 1).
然而,近年來,於各種領域中開始廣泛使用液晶顯示器(Liquid Crystal Display,LCD)等之顯示裝置、或與觸控面板等之顯示裝置組合使用之輸入裝置。於這些顯示裝置或輸入裝置之製造等中,於貼合光學構件之用途中使用黏著片。 However, in recent years, display devices such as liquid crystal displays (LCDs) or input devices used in combination with display devices such as touch panels have been widely used in various fields. In the manufacture of these display devices or input devices, an adhesive sheet is used for the purpose of bonding optical members.
作為影像顯示方式之趨勢,觸控面板式之影像顯示方式持續受到關注,特別是靜電電容方式之觸控面板得到普及。靜電電容方式之觸控面板具有積層有許多構件之構成,以貼合構件之目的而使用黏著片。例如可列舉具有蓋玻璃/黏著片/導電膜/玻璃基板之積層構成的靜電電容方式之觸控面板。 As a trend of image display mode, the touch panel type image display mode has continued to receive attention, and in particular, the electrostatic capacitance type touch panel has been popularized. The capacitive touch panel has a structure in which a plurality of members are laminated, and an adhesive sheet is used for the purpose of bonding the members. For example, a capacitive touch panel having a laminate of a cover glass, an adhesive sheet, a conductive film, and a glass substrate can be cited.
作為黏著片,例如於專利文獻2中揭示了一種包含規定 單體成分之共聚物的透明黏著片,記載了若包含(甲基)丙烯酸羥基烷基酯((E)成分)作為共聚物之單體成分,則可防止白化(段落0040)。 As an adhesive sheet, for example, Patent Document 2 discloses an inclusion regulation. In the transparent adhesive sheet of the copolymer of the monomer component, it is described that when a hydroxyalkyl (meth)acrylate ((E) component) is contained as a monomer component of the copolymer, whitening can be prevented (paragraph 0040).
[先前技術文獻] [Previous Technical Literature]
[專利文獻] [Patent Literature]
[專利文獻1]日本專利特開2008-192850號公報 [Patent Document 1] Japanese Patent Laid-Open Publication No. 2008-192850
[專利文獻2]日本專利特開2011-074308號公報 [Patent Document 2] Japanese Patent Laid-Open No. 2011-074308
另一方面,於近年來,由於半導體積體電路或晶片零件等之小型化,金屬配線之微細化不斷發展。因此,配線基板中之金屬配線之寬度及間隔進一步狹小化,變得更容易產生由於離子遷移所造成之電路之斷線。於此種狀況下,要求配線基板中之包含銀之金屬配線間的絕緣可靠性更進一步提高。 On the other hand, in recent years, miniaturization of metal integrated circuits and wafer components has progressed in miniaturization of metal wiring. Therefore, the width and interval of the metal wiring in the wiring substrate are further narrowed, and the disconnection of the circuit due to ion migration is more likely to occur. Under such circumstances, the insulation reliability between the metal wirings including silver in the wiring substrate is required to be further improved.
本發明者將專利文獻1中所揭示之導入有含硫醇化合物等之與金屬離子形成有機金屬鹽之化合物的聚合物層設置於含銀之金屬配線上,對其絕緣可靠性進行研究。其結果,於金屬配線間確 認配線間電阻之顯著降低,其離子遷移抑制效果並不能滿足現在所要求之水準,必需進一步之改良。 The inventors of the present invention have placed a polymer layer containing a compound containing a thiol compound or the like and a metal ion-forming organometallic salt on a metal wiring containing silver, and studied the insulation reliability thereof. As a result, it is true in the metal wiring It is recognized that the resistance of the wiring closet is significantly reduced, and the ion migration suppression effect does not satisfy the current level, and further improvement is required.
特別是於近年來,隨著電子零件之小型化,迫切期望進一步提高金屬配線之積體度、使金屬配線所具有之配線區域之面積更狹窄。於此種狀況下,於利用如網版印刷這樣的製程之配線設計中,變得難以追隨其積體化,不得不選擇如奈米粒子墨水這樣的印刷步驟、或如濺鍍、離子鍍、真空蒸鍍這樣的成膜步驟。然而,於此種獲得高積體度之步驟中,難以獲得均質的厚膜,或者需要於工業上無法容許之時間,因此造成配線厚度變薄。其結果,於產生離子遷移這樣的環境中,與由於配線間之短路所造成之電氣可靠性欠缺相比而言,變得容易產生配線內之電阻上升或斷線狀態而成為問題。 In particular, in recent years, with the miniaturization of electronic components, it is highly desirable to further increase the total thickness of the metal wiring and to make the area of the wiring region of the metal wiring narrower. Under such circumstances, in the wiring design using a process such as screen printing, it becomes difficult to follow the integration, and it is necessary to select a printing step such as nanoparticle ink, or such as sputtering, ion plating, or the like. Such a film forming step is vacuum-deposited. However, in such a step of obtaining a high degree of integration, it is difficult to obtain a homogeneous thick film, or it is required to be industrially unacceptable, and thus the wiring thickness is thinned. As a result, in an environment in which ion migration occurs, it is easy to cause a resistance increase or a disconnection state in the wiring, which is a problem due to a lack of electrical reliability due to a short circuit between wirings.
而且,近年來,由於半導體積體電路或晶片零件等之小 型化,金屬配線之微細化不斷發展。因此,配線基板中之金屬配線之寬度及間隔更加狹小化(具體而言,金屬配線間之距離(間隔)之最小值不足50 μm),變得更容易產生由於離子遷移所造成之電路之斷線或電路間之導通。特別是經常使用導電性高之銀、銅作為構成金屬配線之金屬,但這些金屬存在容易產生離子遷移之問題,特別是於銀中顯著地表現出該問題。於此種狀況下,要求配線基板中之包含銀之金屬配線間的絕緣可靠性更進一步提高。 Moreover, in recent years, small semiconductor integrated circuits or wafer parts, etc. The type and the miniaturization of metal wiring are constantly developing. Therefore, the width and interval of the metal wiring in the wiring substrate are further narrowed (specifically, the minimum distance (interval) between the metal wirings is less than 50 μm), and the circuit is broken due to ion migration. Conduction between lines or circuits. In particular, silver or copper having high conductivity is often used as the metal constituting the metal wiring. However, these metals have a problem that ion migration is likely to occur, and this problem is remarkably exhibited particularly in silver. Under such circumstances, the insulation reliability between the metal wirings including silver in the wiring substrate is required to be further improved.
本發明者將專利文獻1中所揭示之包含(E)成分之共聚物之 透明黏著片貼附於金屬配線間距離之最小值不足50 μm之附有金屬配線之基板上,對金屬配線間之絕緣可靠性進行研究。其結果,於金屬配線間確認配線間電阻之顯著降低,其離子遷移抑制效果並不滿足最近所要求之水準,必需進一步之改良。 The inventors of the present invention disclose a copolymer comprising the component (E) disclosed in Patent Document 1. The transparent adhesive sheet was attached to a substrate with a metal wiring having a minimum distance of less than 50 μm from the metal wiring line, and the insulation reliability of the metal wiring was investigated. As a result, it was confirmed that the resistance between the wirings was significantly lowered in the metal wiring, and the ion migration suppression effect did not satisfy the level required recently, and further improvement was required.
推測其原因在於:於共聚物中包含如(E)成分這樣的親水性成分。因此,若使用不含此種(E)成分之共聚物,則進行白化,失去黏著層之透明性。 It is presumed that the reason is that a hydrophilic component such as the component (E) is contained in the copolymer. Therefore, when a copolymer containing no such component (E) is used, whitening occurs and the transparency of the adhesive layer is lost.
亦即,於現有技術中,離子遷移抑制功能與防止白化多數情況下存在折衷(trade off)之關係。 That is, in the prior art, the ion migration suppressing function has a trade off relationship with the prevention of whitening in many cases.
本發明的第1實施方式之目的在於鑒於上述事實而提供 抑制來自包含銀之金屬配線的銀之離子遷移、可使金屬配線間之絕緣可靠性提高的配線基板。 The purpose of the first embodiment of the present invention is to provide in view of the above facts. A wiring board that suppresses ion migration from silver containing metal wiring of silver and improves insulation reliability between metal wirings.
另外,本發明的第1實施方式之目的亦在於提供抑制來自包含銀之導電膜的銀之離子遷移、可使導電膜間之絕緣可靠性提高、包含透明雙面黏著片之導電膜積層體。 Further, an object of the first embodiment of the present invention is to provide a conductive film laminate including a transparent double-sided adhesive sheet, which can suppress ion migration from silver containing a conductive film containing silver and improve insulation reliability between conductive films.
而且,本發明的第2實施方式之目的在於鑒於上述事實 而提供抑制包含銀之金屬配線間的銀之離子遷移、顯示優異之金屬配線間之絕緣可靠性、且透明黏著層之耐白化性優異的配線基板。 Moreover, the second embodiment of the present invention aims at the above facts. Further, a wiring board which suppresses ion migration of silver in a metal wiring line containing silver, exhibits excellent insulation reliability between metal wiring lines, and is excellent in whitening resistance of a transparent adhesive layer is provided.
而且,本發明的第2實施方式之目的亦在於提供上述配線基板中所使用之透明黏著片。 Further, an object of the second embodiment of the present invention is to provide a transparent adhesive sheet used in the above wiring board.
本發明者等人對現有技術之問題點進行了銳意研究,結 果發現於專利文獻1中所揭示之含硫醇化合物等之吸附金屬離子之化合物於聚合物層中的分散性受到影響。更具體而言,專利文獻1中所揭示之含硫醇化合物等之吸附金屬離子之化合物由於其結構而分散性低。因此,即使欲將該吸附金屬離子之化合物導入至聚合物層(樹脂層)中,亦難以於聚合物層中使該化合物均一地分散,無法獲得抑制金屬離子(特別是銀離子)之電子遷移的效果。而且,若欲將大量之該吸附金屬離子之化合物導入至聚合物層中,則吸附金屬離子之化合物於聚合物層中析出,引起聚合物之劣化,引起電氣可靠性之劣化。另外存在產生如下問題之虞:促進金屬離子之擴散加快,引起配線破壞等。 The inventors of the present invention conducted intensive research on the problems of the prior art, and concluded The dispersibility of the metal ion-absorbing compound containing a thiol compound or the like disclosed in Patent Document 1 in the polymer layer is affected. More specifically, the compound which adsorbs a metal ion such as a thiol compound disclosed in Patent Document 1 has low dispersibility due to its structure. Therefore, even if the compound for adsorbing metal ions is to be introduced into the polymer layer (resin layer), it is difficult to uniformly disperse the compound in the polymer layer, and electron migration inhibiting metal ions (especially silver ions) cannot be obtained. Effect. Further, when a large amount of the compound for adsorbing metal ions is to be introduced into the polymer layer, the compound which adsorbs the metal ions precipitates in the polymer layer, causing deterioration of the polymer and causing deterioration in electrical reliability. In addition, there are problems in that the diffusion of metal ions is accelerated, wiring damage, and the like are caused.
本發明者等基於上述知識見解,發現藉由使用如下導電膜(或金屬配線)可解決上述第1實施方式之課題,所述導電膜(或金屬配線)使用具有特定官能基、且具有對金屬離子之還原能力之化合物,且包含規定量之銀量。 Based on the above knowledge, the inventors of the present invention have found that the above-described first embodiment can be solved by using a conductive film (or metal wiring) having a specific functional group and having a pair of metals. A compound that reduces the ability of ions and contains a defined amount of silver.
亦即,本發明者等人發現藉由以下構成可解決上述第1實施方式之課題。 In other words, the inventors of the present invention have found that the above-described first embodiment can solve the problem of the first embodiment.
(1)一種導電膜積層體,其是包含透明基板、於透明 基板上所配置之包含銀之導電膜、於導電膜上所貼合之透明雙面黏著片的導電膜積層體, 導電膜之每單位面積中所含之銀量為50 μg/mm2以下, 透明雙面黏著片含有透明樹脂、以及選自由後述之式(1)~式(3)所表示之化合物所構成之群組的至少1種化合物。 (1) A conductive film laminate which is a conductive film laminate including a transparent substrate, a conductive film containing silver disposed on the transparent substrate, and a transparent double-sided adhesive sheet bonded to the conductive film, the conductive film The amount of silver contained per unit area is 50 μg/mm 2 or less, and the transparent double-sided adhesive sheet contains a transparent resin and a group selected from the group consisting of compounds represented by the formulas (1) to (3) described later. At least one compound.
(2)如(1)所述之導電膜積層體,其中,化合物選自由後述之式(4)~式(6)所表示之化合物所構成之群組。 (2) The conductive film laminate according to (1), wherein the compound is selected from the group consisting of compounds represented by the following formulas (4) to (6).
(3)如(1)或(2)所述之導電膜積層體,其中,化合物選自由後述之式(5)~式(6)所表示之化合物所構成之群組。 (3) The conductive film laminate according to (1) or (2), wherein the compound is selected from the group consisting of compounds represented by the formulas (5) to (6) which will be described later.
(4)如(1)~(3)中任一項所述之導電膜積層體,其中,化合物之總質量A與透明樹脂之總質量C之質量比(A/C)為0.0001~0.1。 (4) The conductive film laminate according to any one of (1) to (3), wherein a mass ratio (A/C) of the total mass A of the compound to the total mass C of the transparent resin is 0.0001 to 0.1.
(5)如(1)~(4)中任一項所述之導電膜積層體,其中,導電膜含有包含銀或銀合金之金屬奈米線。 (5) The conductive film laminate according to any one of (1) to (4) wherein the conductive film contains a metal nanowire comprising silver or a silver alloy.
(6)如(1)~(5)中任一項所述之導電膜積層體,其中,透明樹脂包含丙烯酸系黏著劑。 The conductive film laminate according to any one of (1), wherein the transparent resin contains an acrylic adhesive.
(7)一種觸控面板,其包含如(1)~(6)中任一項所述之導電膜積層體。 (7) A touch panel comprising the conductive film laminate according to any one of (1) to (6).
(8)一種配線基板,其包含絕緣基板、絕緣基板上所配置之包含銀之金屬配線、金屬配線上所配置之銀離子擴散抑制層,金屬配線之每單位面積中所含之銀量為50 μg/mm2以下,銀離子擴散抑制層含有絕緣樹脂、以及選自由後述之式(1)~式(3)所表示之化合物所構成之群組的至少1種化合物。 (8) A wiring board comprising an insulating substrate, a metal wiring including silver disposed on the insulating substrate, and a silver ion diffusion suppressing layer disposed on the metal wiring, wherein the amount of silver per unit area of the metal wiring is 50 In the μg/mm 2 or less, the silver ion diffusion suppression layer contains at least one compound selected from the group consisting of compounds represented by the formulas (1) to (3) described later, and an insulating resin.
(9)如(8)所述之配線基板,其中,化合物選自由後述之式(4)~式(6)所表示之化合物所構成之群組。 (9) The wiring board according to the item (8), wherein the compound is selected from the group consisting of compounds represented by the following formulas (4) to (6).
(10)如(8)或(9)所述之配線基板,其中,化合物選自由後述之式(5)~式(6)所表示之化合物所構成之群組。 (10) The wiring board according to the item (8), wherein the compound is selected from the group consisting of compounds represented by the formulas (5) to (6) which will be described later.
(11)如(8)~(10)中任一項所述之配線基板,其中,化合物之總質量A與透明樹脂之總質量B之質量比(A/B)為0.0001~0.1。 The wiring board according to any one of (8) to (10), wherein the mass ratio (A/B) of the total mass A of the compound to the total mass B of the transparent resin is 0.0001 to 0.1.
(12)一種電子裝置,其包含如(8)~(11)中任一項所述之配線基板。 (12) An electronic device comprising the wiring substrate according to any one of (8) to (11).
(13)一種透明雙面黏著片,其含有透明樹脂、以及選自後述之式(1)、式(2)及式(3)所表示之化合物群組之至少1種化合物。 (13) A transparent double-sided adhesive sheet comprising a transparent resin and at least one compound selected from the group consisting of compounds represented by the formulas (1), (2) and (3) described later.
而且,本發明者等人對現有技術之問題點進行了銳意研 究,結果發現藉由使用如下之透明黏著片可解決上述第2實施方式之課題:所述透明黏著片包含顯示出規定氧化還原電位之化合物,於規定之環境試驗中之霧度之隨時間變化為一定範圍內。 Moreover, the inventors of the present invention conducted intensive research on the problems of the prior art. As a result, it has been found that the above-described second embodiment can be solved by using a transparent adhesive sheet containing a compound exhibiting a predetermined oxidation-reduction potential and changing the haze over time in a predetermined environmental test. For a certain range.
亦即,本發明者等人發現藉由以下之構成可解決上述第2實施方式之課題。 In other words, the inventors of the present invention have found that the object of the second embodiment described above can be solved by the following configuration.
(14)一種配線基板,其包含:絕緣基板、絕緣基板上所配置之包含銀之多個金屬配線、與金屬配線直接接觸而配置於金屬配線上之透明黏著層,鄰接之金屬配線間之距離的最小值不足50 μm,透明黏著層中含有氧化還原電位為0.40 V~1.30 V之化合物、及黏著劑,透明黏著層是於後述之環境試驗中時間X顯示為12小時以下 之透明黏著層。 (14) A wiring board comprising: an insulating substrate; a plurality of metal wirings including silver disposed on the insulating substrate; and a transparent adhesive layer disposed in direct contact with the metal wiring on the metal wiring, and a distance between the adjacent metal wirings The minimum value is less than 50 μm, and the transparent adhesive layer contains a compound having an oxidation-reduction potential of 0.40 V to 1.30 V, and an adhesive. The transparent adhesive layer is in the environmental test described later, and the time X is 12 hours or less. Transparent adhesive layer.
(15)如(14)所述之配線基板,其中,化合物包含酚化合物。 (15) The wiring board according to (14), wherein the compound contains a phenol compound.
(16)如(14)或(15)所述之配線基板,其中,化合物包含氧化還原電位為0.50 V~1.20 V之酚化合物。 The wiring board according to the item (14), wherein the compound contains a phenol compound having an oxidation-reduction potential of 0.50 V to 1.20 V.
(17)如(14)~(16)中任一項所述之配線基板,其中,化合物包含選自由後述之式(1)~式(3)所表示之化合物所構成之群組之至少1種。 The wiring board according to any one of the aspects of the present invention, wherein the compound comprises at least one selected from the group consisting of compounds represented by the formulas (1) to (3) described later. Kind.
(18)如(14)~(17)中任一項所述之配線基板,其中,時間X不足6小時。 The wiring board according to any one of (14), wherein the time X is less than 6 hours.
(19)如(14)~(18)中任一項所述之配線基板,其中,鄰接之金屬配線間之距離的最小值不足40 μm。 The wiring board according to any one of (14), wherein a minimum value of a distance between adjacent metal wirings is less than 40 μm.
(20)一種透明黏著片,其至少包含透明黏著層,所述透明黏著層包含氧化還原電位為0.40 V~1.30 V之化合物與黏著劑,透明黏著層是於後述之環境試驗中時間X顯示為12小時以下之透明黏著層。 (20) A transparent adhesive sheet comprising at least a transparent adhesive layer comprising a compound having an oxidation-reduction potential of 0.40 V to 1.30 V and an adhesive, wherein the transparent adhesive layer is displayed in an environmental test described later in time X. Transparent adhesive layer for less than 12 hours.
(21)如(20)所述之透明黏著片,其中,化合物包含酚化合物。 (21) The transparent adhesive sheet according to (20), wherein the compound contains a phenol compound.
(22)如(20)或(21)所述之透明黏著片,其中,化合物包含氧化還原電位為0.50 V~1.20 V之酚化合物。 (22) The transparent adhesive sheet according to (20) or (21), wherein the compound comprises a phenol compound having an oxidation-reduction potential of 0.50 V to 1.20 V.
(23)如(20)~(22)中任一項所述之透明黏著片,其中,化合物包含選自由後述之式(1)~式(3)所表示之化合物所構 成之群組之至少1種。 (23) The transparent adhesive sheet according to any one of (20) to (22), wherein the compound comprises a compound selected from the compounds represented by the formulas (1) to (3) described later. At least one of the groups.
(24)如(20)~(23)中任一項所述之透明黏著片,其中,時間X不足6小時。 The transparent adhesive sheet according to any one of (20) to (23) wherein the time X is less than 6 hours.
(25)一種觸控面板,其包含如(14)~(19)中任一項所述之配線基板。 (25) A touch panel comprising the wiring substrate according to any one of (14) to (19).
藉由本發明的第1實施方式,可提供抑制來自包含銀之金屬配線的銀之離子遷移、可使金屬配線間之絕緣可靠性提高的配線基板。 According to the first embodiment of the present invention, it is possible to provide a wiring board capable of suppressing ion migration from silver containing metal wiring of silver and improving insulation reliability between metal wirings.
而且,藉由本發明的第1實施方式,可提供抑制來自包含銀之導電膜的銀之離子遷移、可使導電膜間之絕緣可靠性提高、包含透明雙面黏著片之導電膜積層體。 Further, according to the first embodiment of the present invention, it is possible to provide a conductive film laminate including a transparent double-sided adhesive sheet, which can suppress ion migration from silver containing a conductive film containing silver and improve insulation reliability between conductive films.
另外,藉由本發明的第2實施方式,可提供抑制包含銀之金屬配線間的銀之離子遷移、顯示優異之金屬配線間之絕緣可靠性、且透明黏著層之耐白化性優異的配線基板。 In addition, according to the second embodiment of the present invention, it is possible to provide a wiring board which is excellent in whitening resistance between the metal wirings, and excellent in whitening resistance of the transparent adhesive layer.
而且,藉由本發明的第2實施方式,可提供上述配線基板中所使用之透明黏著片。 Moreover, according to the second embodiment of the present invention, the transparent adhesive sheet used in the wiring board described above can be provided.
10、100‧‧‧配線基板 10, 100‧‧‧ wiring substrate
12、12a、12b‧‧‧絕緣基板 12, 12a, 12b‧‧‧ insulating substrate
14、14a、14b‧‧‧金屬配線 14, 14a, 14b‧‧‧ metal wiring
16、16b‧‧‧附有金屬配線之絕緣基板 16, 16b‧‧‧Insulated substrate with metal wiring
18‧‧‧銀離子擴散抑制層 18‧‧‧ Silver ion diffusion suppression layer
19‧‧‧透明黏著層 19‧‧‧Transparent adhesive layer
20‧‧‧絕緣層 20‧‧‧Insulation
30‧‧‧可撓性電路 30‧‧‧Flexible circuit
32、302‧‧‧透明基板 32, 302‧‧‧ Transparent substrate
34‧‧‧透明電極層 34‧‧‧Transparent electrode layer
36‧‧‧引線配線 36‧‧‧Lead wiring
38‧‧‧活動區域 38‧‧‧Active area
40‧‧‧非活動區域 40‧‧‧Inactive area
42、306、306a、306b‧‧‧透明雙面黏著片 42, 306, 306a, 306b‧‧‧ Transparent double-sided adhesive sheet
200‧‧‧附有絕緣層之配線基板 200‧‧‧Wiring substrate with insulating layer
300、400、600‧‧‧導電膜積層體 300, 400, 600‧‧‧ conductive film laminate
304、304a、304b‧‧‧導電膜 304, 304a, 304b‧‧‧ conductive film
306c‧‧‧表面 306c‧‧‧ surface
306d‧‧‧背面 306d‧‧‧back
500‧‧‧觸控面板構件 500‧‧‧Touch panel components
圖1是本發明的第1實施方式之配線基板之適宜實施方式的示意性剖面圖。 1 is a schematic cross-sectional view showing a preferred embodiment of a wiring board according to a first embodiment of the present invention.
圖2是本發明的第1實施方式之配線基板的其他的適宜實施 方式之示意性剖面圖。 2 is another suitable implementation of the wiring board according to the first embodiment of the present invention. A schematic cross-sectional view of the mode.
圖3是本發明的第1實施方式之附有絕緣層之配線基板之適宜實施方式之示意性剖面圖。 3 is a schematic cross-sectional view showing a preferred embodiment of a wiring board with an insulating layer according to the first embodiment of the present invention.
圖4是本發明的第1實施方式之導電膜積層體之一實施方式之示意性剖面圖。 Fig. 4 is a schematic cross-sectional view showing an embodiment of a conductive film laminate according to a first embodiment of the present invention.
圖5是本發明的第1實施方式之導電膜積層體之其他實施方式之示意性剖面圖。 Fig. 5 is a schematic cross-sectional view showing another embodiment of the conductive film laminate according to the first embodiment of the present invention.
圖6(A)是觸控面板構件之一端側之一部分平面圖,圖6(B)是沿著圖6(A)之A-A線之示意性剖面圖。 Fig. 6(A) is a partial plan view showing one end side of the touch panel member, and Fig. 6(B) is a schematic cross-sectional view taken along line A-A of Fig. 6(A).
圖7是本發明的第2實施方式之配線基板之適宜實施方式之示意性剖面圖。 Fig. 7 is a schematic cross-sectional view showing a preferred embodiment of a wiring board according to a second embodiment of the present invention.
以下,順次對本發明的第1實施方式及第2實施方式加以說明。 Hereinafter, the first embodiment and the second embodiment of the present invention will be described in order.
<<第1實施方式>> <<First embodiment>>
以下對本發明的第1實施方式之配線基板及導電膜積層體之適宜形態加以說明。 Hereinafter, suitable embodiments of the wiring board and the conductive film laminate according to the first embodiment of the present invention will be described.
首先,對本發明的第1實施方式之與現有技術比較的特徵點加以詳述。 First, the feature points of the first embodiment of the present invention which are compared with the prior art will be described in detail.
如上所述,發現於本發明的第1實施方式中,藉由控制對金屬離子具有還原能力之化合物(以後亦稱為還原性化合物)與分散還原性化合物之樹脂之相溶性、且控制導電膜(或金屬配線) 中之銀量,可獲得所期望之效果。更具體而言,藉由使用規定之還原性化合物,可使還原性化合物於樹脂中之分散性提高而抑制樹脂之劣化,以及藉由使導電膜(或金屬配線)中之銀量為規定值以下而使規定之還原性化合物之還原特性進一步提高。特別是化合物於樹脂中良好地分散,因此還原銀難以定域化,其結果難以於可見光區域具有吸收,可抑制著色或霧度之惡化。 As described above, in the first embodiment of the present invention, it is found that the compatibility of the compound having a reducing ability to metal ions (hereinafter also referred to as a reducing compound) and the resin of the dispersion reducing compound is controlled, and the conductive film is controlled. (or metal wiring) The amount of silver in the middle can achieve the desired effect. More specifically, by using a predetermined reducing compound, the dispersibility of the reducing compound in the resin can be improved to suppress deterioration of the resin, and the amount of silver in the conductive film (or metal wiring) can be made a predetermined value. The reduction characteristics of the predetermined reducing compound are further improved by the following. In particular, since the compound is well dispersed in the resin, the reduced silver is difficult to be localized, and as a result, it is difficult to absorb in the visible light region, and deterioration of coloring or haze can be suppressed.
而且,於導電膜(或金屬配線)中包含銀奈米粒子或銀奈米線之情形時,藉由控制銀量而使導電膜中之銀成分之比表面積變大,進一步提高由於還原性化合物所帶來之改善效果。 Further, when the silver film or the silver nanowire is contained in the conductive film (or metal wiring), the specific surface area of the silver component in the conductive film is increased by controlling the amount of silver, and the reducing compound is further improved. The improvement effect brought by it.
於以下中,首先對配線基板加以詳述。關於導電膜積層體,於後段中加以詳述。 In the following, the wiring board will be described in detail first. The conductive film laminate is described in detail in the following paragraph.
<配線基板> <Wiring board>
其次,參照圖式對本發明的第1實施方式之配線基板之適宜形態加以詳述。 Next, a suitable form of the wiring board according to the first embodiment of the present invention will be described in detail with reference to the drawings.
圖1表示配線基板之一實施方式之示意性剖面圖,配線基板10包含:絕緣基板12及絕緣基板12上所配置之包含金屬配線14之附有金屬配線之絕緣基板16、覆蓋金屬配線14之銀離子擴散抑制層18。 1 is a schematic cross-sectional view showing an embodiment of a wiring board including an insulating substrate 12 including a metal wiring 14 and a metal wiring 14 disposed on an insulating substrate 12 and an insulating substrate 12; Silver ion diffusion suppression layer 18.
以下對各構件(絕緣基板12、金屬配線14、銀離子擴散抑制層18)加以詳述。 Hereinafter, each member (the insulating substrate 12, the metal wiring 14, and the silver ion diffusion suppression layer 18) will be described in detail.
[絕緣基板] [Insulating substrate]
絕緣基板為絕緣性,若為可支撐金屬配線者,則其種類並無 特別限制。例如可使用有機基板、陶瓷基板、玻璃基板等。 The insulating substrate is insulative, and if it is a metal-supportable wiring, the type is not Special restrictions. For example, an organic substrate, a ceramic substrate, a glass substrate, or the like can be used.
而且,絕緣基板可為選自由有機基板、陶瓷基板、及玻璃基板所構成之群組之至少2個基板積層而成之結構。 Further, the insulating substrate may have a structure in which at least two substrates selected from the group consisting of an organic substrate, a ceramic substrate, and a glass substrate are laminated.
有機基板之材料可列舉樹脂,例如較佳的是使用熱硬化 性樹脂、熱塑性樹脂、或這些混合而成之樹脂。熱硬化性樹脂例如可列舉酚樹脂、脲樹脂、三聚氰胺樹脂、醇酸樹脂、丙烯酸樹脂、不飽和聚酯樹脂、鄰苯二甲酸二烯丙酯樹脂、環氧樹脂、矽酮樹脂、呋喃樹脂、酮樹脂、二甲苯樹脂、苯并環丁烯樹脂等。 熱塑性樹脂例如可列舉聚醯亞胺樹脂、聚苯醚樹脂、聚苯硫醚樹脂、聚芳醯胺(aramid)樹脂、液晶聚合物等。 The material of the organic substrate may be exemplified by a resin, and for example, it is preferred to use heat hardening. Resin, thermoplastic resin, or a mixture of these resins. Examples of the thermosetting resin include a phenol resin, a urea resin, a melamine resin, an alkyd resin, an acrylic resin, an unsaturated polyester resin, a diallyl phthalate resin, an epoxy resin, an anthrone resin, a furan resin, and the like. A ketone resin, a xylene resin, a benzocyclobutene resin or the like. Examples of the thermoplastic resin include a polyimide resin, a polyphenylene ether resin, a polyphenylene sulfide resin, an aramid resin, a liquid crystal polymer, and the like.
另外,有機基板之材料可使用玻璃織布、玻璃不織布、聚芳醯胺織布、聚芳醯胺不織布、芳香族聚醯胺(polyamide)織布或者於這些中含浸有上述樹脂之材料等。 Further, as the material of the organic substrate, a glass woven fabric, a glass non-woven fabric, a polyarsenide woven fabric, a polyarylamine nonwoven fabric, an aromatic polyamide woven fabric, or a material in which the above resin is impregnated may be used.
[金屬配線] [Metal wiring]
金屬配線主要包含銀。可以銀合金之形態而包含銀,於金屬配線包含銀合金之情形時,銀以外之含有金屬例如可列舉錫、鈀、金、鎳、鉻等。另外,於金屬配線中,可於不損及本發明的效果之範圍內包含黏合劑等樹脂成分或感光性化合物等,可進一步視需要包含其他成分。 The metal wiring mainly contains silver. Silver may be contained in the form of a silver alloy. When the metal wiring contains a silver alloy, examples of the metal other than silver include tin, palladium, gold, nickel, chromium, and the like. In the metal wiring, a resin component such as a binder or a photosensitive compound may be contained in a range that does not impair the effects of the present invention, and other components may be further contained as needed.
而且,較佳的是金屬配線含有包含銀或銀合金之金屬奈米線。另外,於後段對金屬奈米線加以詳述。 Moreover, it is preferred that the metal wiring contains a metal nanowire containing silver or a silver alloy. In addition, the metal nanowire is described in detail in the latter stage.
金屬配線之每單位面積中所含之銀量為50 μg/mm2以 下。藉由使銀量為上述範圍,變得可使金屬配線之膜厚及寬度變小,從而可應對高密度積體化之迫切期望。若銀量過多,則於金屬配線間變得容易產生短路。其中,銀量較佳的是30 μg/mm2以下,更佳的是15 μg/mm2以下。關於下限,並無特別限制,於金屬配線之導電特性更優異之方面而言,較佳的是0.001 μg/mm2以上,更佳的是0.005 μg/mm2以上。 The amount of silver contained per unit area of the metal wiring is 50 μg/mm 2 or less. When the amount of silver is in the above range, the thickness and width of the metal wiring can be made small, and the high-density integrated product can be expected. If the amount of silver is too large, a short circuit easily occurs between the metal wirings. Among them, the amount of silver is preferably 30 μg/mm 2 or less, more preferably 15 μg/mm 2 or less. The lower limit is not particularly limited, and is preferably 0.001 μg/mm 2 or more, and more preferably 0.005 μg/mm 2 or more, from the viewpoint of further excellent electrical conductivity of the metal wiring.
另外,於金屬配線中所含之銀量少之情形時,若產生離子遷移,則形成金屬配線之銀會溶出,因此變得容易產生金屬配線之斷線。然而,於本發明中,藉由包含規定化合物之銀離子擴散抑制層對金屬配線進行覆蓋,由此可抑制銀之離子遷移,抑制金屬配線之斷線。 In addition, when the amount of silver contained in the metal wiring is small, if ion migration occurs, silver which forms the metal wiring is eluted, and thus the disconnection of the metal wiring is likely to occur. However, in the present invention, by covering the metal wiring with the silver ion diffusion suppressing layer containing the predetermined compound, ion migration of silver can be suppressed, and disconnection of the metal wiring can be suppressed.
銀量之測定方法並無特別限制,可採用公知之方法。例 如,可藉由觀察金屬配線之剖面SEM相片進行元素分析而測定銀量。而且,可使金屬配線與硝酸等強酸接觸,使金屬配線中之銀溶解,根據所溶解之量測定銀量。而且,於使用包含銀奈米線或銀奈米粒子之分散液而製作金屬配線之情形時,可根據製作金屬配線時所使用之分散液之量,藉由計算而求出金屬配線中之銀量。 The method for measuring the amount of silver is not particularly limited, and a known method can be employed. example For example, the amount of silver can be determined by performing elemental analysis by observing a cross-sectional SEM photograph of a metal wiring. Further, the metal wiring can be brought into contact with a strong acid such as nitric acid to dissolve the silver in the metal wiring, and the amount of silver can be measured based on the amount dissolved. Further, when a metal wiring is produced by using a dispersion containing silver nanowires or silver nanoparticles, the silver in the metal wiring can be calculated by calculation based on the amount of the dispersion used in the production of the metal wiring. the amount.
而且,所謂金屬配線之每單位面積是表示金屬配線之與絕緣基板之接觸部分之每單位面積。亦即,僅僅以金屬配線與絕緣基板之接觸部分之面積為基準而進行銀量之計算。換而言之,並不與金屬配線接觸之絕緣基板表面(例如位於金屬配線間的並不與金屬配線接觸的絕緣基板表面)之面積並不被考慮在上述金屬配 線之每單位面積之計算中。因此,所謂金屬配線之每單位面積中所含之銀量是表示金屬配線與絕緣基板之接觸部分中的每單位面積(mm2)中所含之銀量。 Further, the unit area of the metal wiring is the unit area of the portion where the metal wiring is in contact with the insulating substrate. That is, the calculation of the amount of silver is performed based only on the area of the contact portion between the metal wiring and the insulating substrate. In other words, the area of the surface of the insulating substrate that is not in contact with the metal wiring (for example, the surface of the insulating substrate that is not in contact with the metal wiring between the metal wirings) is not considered in the calculation of the unit area of the above metal wiring. . Therefore, the amount of silver contained in the unit area of the metal wiring is the amount of silver contained in the unit area (mm 2 ) in the contact portion between the metal wiring and the insulating substrate.
金屬配線之寬度並無特別限制,自確保配線基板之高積 體化部及引出配線部(引線配線部)之電氣可靠性之方面而言,較佳的是0.1 μm~10000 μm,更佳的是0.1 μm~300 μm,進一步更佳的是0.1 μm~100 μm,特佳的是0.2 μm~50 μm。 The width of the metal wiring is not particularly limited, and the height of the wiring substrate is ensured. The electrical reliability of the body portion and the lead wiring portion (lead wiring portion) is preferably 0.1 μm to 10000 μm, more preferably 0.1 μm to 300 μm, still more preferably 0.1 μm to 100. Μm, particularly preferably 0.2 μm to 50 μm.
金屬配線間之間隔並無特別限制,自配線基板之高積體化之方面考慮,較佳的是0.1 μm~1000 μm,更佳的是0.1 μm~300 μm,進一步更佳的是0.1 μm~100 μm,特佳的是0.2 μm~50 μm。 The interval between the metal wirings is not particularly limited, and is preferably 0.1 μm to 1000 μm, more preferably 0.1 μm to 300 μm, still more preferably 0.1 μm from the viewpoint of high integration of the wiring substrate. 100 μm, particularly preferably 0.2 μm to 50 μm.
而且,金屬配線之形狀並無特別限制,可為任意形狀。例如可列舉直線狀、曲線狀、矩形狀、圓狀等。而且,多個金屬配線可配置為所期望之圖案(例如條紋狀)。 Further, the shape of the metal wiring is not particularly limited and may be any shape. For example, a linear shape, a curved shape, a rectangular shape, a circular shape, etc. are mentioned. Moreover, the plurality of metal wires can be configured in a desired pattern (for example, stripe shape).
金屬配線之厚度並無特別限制,自配線基板之高積體化 之方面考慮,較佳的是0.001 μm~100 μm,更佳的是0.01 μm~30 μm,進一步更佳的是0.01 μm~20 μm。 The thickness of the metal wiring is not particularly limited, and the integration of the wiring board is high. In view of the above, it is preferably 0.001 μm to 100 μm, more preferably 0.01 μm to 30 μm, still more preferably 0.01 μm to 20 μm.
於圖1中,金屬配線14可僅僅設於絕緣基板12之單面, 可設於雙面。亦即,附有金屬配線之絕緣基板16可為單面基板,可為雙面基板。於金屬配線14存在於絕緣基板12之雙面之情形時,銀離子擴散觸性層18可設於雙面。 In FIG. 1, the metal wiring 14 may be provided only on one side of the insulating substrate 12. Can be set on both sides. That is, the insulating substrate 16 with the metal wiring may be a single-sided substrate, and may be a double-sided substrate. When the metal wiring 14 is present on both sides of the insulating substrate 12, the silver ion diffusion-tapped layer 18 may be provided on both sides.
而且,於圖1中,金屬配線14列舉一層之配線結構為例子,當然並不限定於此。例如,可如圖2所示那樣,藉由使用交互積 層有多個金屬配線14a、金屬配線14b與絕緣基板12a、絕緣基板12b之附有金屬配線之絕緣基板16a(多層配線基板)而設為多層配線結構之配線基板100。 Further, in FIG. 1, the wiring structure of one layer of the metal wiring 14 is taken as an example, and of course, it is not limited to this. For example, as shown in Figure 2, by using an interactive product The wiring board 100 having a plurality of metal wirings 14a, metal wirings 14b and insulating substrates 12a, and insulating substrates 16a (multilayer wiring substrates) to which metal wirings are attached is provided as a multilayer wiring structure.
而且,可於絕緣基板中形成通孔。於絕緣基板之雙面設 有金屬配線之情形時,可藉由於該通孔內填充金屬(例如銀或銀合金)而使雙面之金屬配線導通。 Moreover, a through hole can be formed in the insulating substrate. Double-sided on the insulating substrate In the case of metal wiring, the metal wiring on both sides can be turned on by filling a metal (for example, silver or a silver alloy) in the through hole.
[銀離子擴散抑制層] [Silver ion diffusion suppression layer]
銀離子擴散抑制層是配置於附有金屬配線之絕緣基板之金屬配線側之表面、覆蓋金屬配線表面、用以抑制金屬配線間之銀之離子遷移之層。 The silver ion diffusion suppression layer is a layer that is disposed on the surface of the metal wiring side of the insulating substrate with the metal wiring, covers the surface of the metal wiring, and suppresses ion migration of silver between the metal wirings.
另外,較佳的是於銀離子擴散抑制層中實質上不含銀離子或金屬銀。若於銀離子擴散抑制層中包含過剩之銀離子或金屬銀,則存在銀離子遷移抑制效果降低之情形。 Further, it is preferable that the silver ion diffusion suppressing layer contains substantially no silver ions or metallic silver. When the silver ion diffusion suppressing layer contains excessive silver ions or metallic silver, the silver ion migration suppressing effect may be lowered.
另外,所謂實質上不含銀離子或金屬銀,是指銀離子擴散抑制層中之銀離子或金屬銀之含量為1 μmol/l以下,更佳的是0.1 μmol/l以下,最佳的是0 mol/l。 In addition, the content of silver ions or metallic silver in the silver ion diffusion suppressing layer is preferably 1 μmol/l or less, more preferably 0.1 μmol/l or less, and most preferably 0 mol/l.
銀離子擴散抑制層之厚度並無特別限制,於銀離子擴散 抑制層之離子遷移抑制能力更優異之方面而言,較佳的是5 μm~1000 μm,更佳的是10 μm~500 μm。 The thickness of the silver ion diffusion suppression layer is not particularly limited, and is diffused in silver ions. The ion transport inhibition ability of the suppression layer is more preferably 5 μm to 1000 μm, more preferably 10 μm to 500 μm.
銀離子擴散抑制層中含有絕緣樹脂、以及選自式(1)、 式(2)及式(3)所表示之化合物群組之至少1種化合物。 The silver ion diffusion suppression layer contains an insulating resin and is selected from the formula (1), At least one compound of the compound group represented by the formula (2) and the formula (3).
以下,關於絕緣樹脂、及化合物而加以詳述。 Hereinafter, the insulating resin and the compound will be described in detail.
(絕緣樹脂) (insulating resin)
藉由於銀離子擴散抑制層中包含絕緣樹脂而使絕緣樹脂覆蓋金屬配線,藉由配置於金屬配線間而確保金屬配線間之絕緣性。 The insulating resin is coated with the insulating resin in the silver ion diffusion suppressing layer to cover the metal wiring, and the insulating property between the metal wirings is ensured by being disposed between the metal wirings.
所使用之絕緣樹脂可使用公知之絕緣性樹脂,於銀離子擴散抑制層之層形成更容易之方面而言,較佳的是使用使硬化性絕緣樹脂(例如熱硬化性絕緣樹脂及光硬化性絕緣樹脂)硬化之樹脂。 The insulating resin to be used may be a known insulating resin, and it is preferable to use a curable insulating resin (for example, a thermosetting insulating resin and photocurability) in terms of facilitating formation of a layer of the silver ion diffusion inhibiting layer. Insulating resin) Hardened resin.
熱硬化性絕緣樹脂例如可列舉環氧樹脂、雙馬來醯亞胺 三嗪樹脂、聚醯亞胺樹脂、丙烯酸樹脂、酚樹脂、三聚氰胺樹脂、矽樹脂、不飽和聚酯樹脂、氰酸酯樹脂、異氰酸酯樹脂、或這些之改質樹脂等。 Examples of the thermosetting insulating resin include epoxy resin and bismaleimide. A triazine resin, a polyimide resin, an acrylic resin, a phenol resin, a melamine resin, an anthracene resin, an unsaturated polyester resin, a cyanate resin, an isocyanate resin, or a modified resin thereof.
光硬化性絕緣樹脂例如可列舉不飽和聚酯樹脂、聚酯丙烯酸酯樹脂、丙烯酸胺基甲酸酯樹脂、矽酮丙烯酸酯樹脂、環氧丙烯酸酯樹脂、或這些之改質樹脂等。 Examples of the photocurable insulating resin include an unsaturated polyester resin, a polyester acrylate resin, an urethane urethane resin, an oxime acrylate resin, an epoxy acrylate resin, or a modified resin thereof.
其他絕緣樹脂例如可列舉聚乙烯(PE)、聚丙烯(PP)、乙烯-乙酸乙烯酯共聚物(EVA)、乙烯-丙烯酸乙酯共聚物(EEA)、聚乳酸、含氟樹脂、聚醚碸樹脂、聚苯硫醚樹脂、聚醚醚酮樹脂等熱塑性樹脂。 Examples of other insulating resins include polyethylene (PE), polypropylene (PP), ethylene-vinyl acetate copolymer (EVA), ethylene-ethyl acrylate copolymer (EEA), polylactic acid, fluorine-containing resin, and polyether oxime. A thermoplastic resin such as a resin, a polyphenylene sulfide resin or a polyetheretherketone resin.
其中,於與後述之化合物之相溶性更優異之方面而言,較佳的是環氧樹脂、丙烯酸樹脂。 Among them, an epoxy resin or an acrylic resin is preferred in terms of being more excellent in compatibility with a compound to be described later.
而且,可視需要使絕緣樹脂含浸於玻璃織布、玻璃不織 布、聚芳醯胺不織布等心材中而使用。具體而言,可使用玻璃布環氧樹脂、玻璃布雙馬來醯亞胺三嗪樹脂、玻璃布聚苯醚樹脂、 聚芳醯胺不織布-環氧樹脂、聚芳醯胺不織布-聚醯亞胺樹脂等。 Moreover, the insulating resin may be impregnated into the glass woven fabric or the glass woven fabric as needed. It is used in a heart material such as cloth or polyarsenide non-woven fabric. Specifically, a glass cloth epoxy resin, a glass cloth, a bismaleimide triazine resin, a glass cloth polyphenylene ether resin, or the like can be used. Polyarylamine non-woven fabric - epoxy resin, polyarylamine non-woven fabric - polyimine resin, and the like.
另外,於絕緣樹脂為硬化性樹脂之情形時,可視需要併用硬化劑、硬化促進劑等。 Further, when the insulating resin is a curable resin, a curing agent, a curing accelerator, or the like may be used in combination as needed.
另外,絕緣樹脂可將2種以上絕緣樹脂混合使用。 Further, the insulating resin may be used in combination of two or more kinds of insulating resins.
(化合物) (compound)
藉由於銀離子擴散抑制層中包含選自式(1)、式(2)及式(3)所表示之化合物群組之至少1種化合物(以後亦簡稱為還原性化合物),可進一步抑制銀之離子遷移。 Further, silver can be further suppressed by containing at least one compound selected from the group consisting of compounds represented by formula (1), formula (2), and formula (3) (hereinafter also referred to simply as a reducing compound) in the silver ion diffusion inhibiting layer. Ion migration.
該還原性化合物起到還原銀離子之作用。亦即,即使自金屬配線中溶出銀離子,銀離子亦由於還原性化合物而還原為銀,從而抑制離子遷移。而且,若為該還原性化合物,則於銀離子擴散抑制層中之分散性優異,還原銀之定域化得到抑制,其結果可抑制銀離子擴散抑制層之黃色化(於可見光區域之吸收)。 The reducing compound functions to reduce silver ions. That is, even if silver ions are eluted from the metal wiring, the silver ions are reduced to silver by the reducing compound, thereby suppressing ion migration. In addition, in the case of the reducing compound, the dispersibility in the silver ion diffusion inhibiting layer is excellent, and the localization of the reduced silver is suppressed, and as a result, the yellowing of the silver ion diffusion suppressing layer (absorption in the visible light region) can be suppressed. .
另外,於銀離子擴散抑制層中可包含2種以上之式(1)~式(3)所表示之化合物。 Further, two or more compounds represented by the formulae (1) to (3) may be contained in the silver ion diffusion inhibiting layer.
式(1)中,R1~R5分別獨立地表示氫原子、羥基、或 可具有雜原子之烴基。其中,於離子遷移抑制能力更優異之方面而言,較佳的是氫原子、烷基、烷氧基、芳氧基、或這些基組合而成之基。 In the formula (1), R 1 to R 5 each independently represent a hydrogen atom, a hydroxyl group, or a hydrocarbon group which may have a hetero atom. Among them, a hydrogen atom, an alkyl group, an alkoxy group, an aryloxy group, or a combination of these groups is preferred from the viewpoint of more excellent ion mobility inhibition ability.
烴基中所含之雜原子之種類並無特別限制,可列舉鹵素原子、氧原子、氮原子、硫原子、硒原子、碲原子等。其中,自銀之離子遷移抑制能力優異之方面而言,較佳的是以-Y1-、-N(Ra)-、-C(=Y2)-、-CON(Rb)-、-C(=Y3)Y4-、-SOt-、-SO2N(Rc)-、鹵素原子、或這些基組合而成之基之形態而包含。 The type of the hetero atom contained in the hydrocarbon group is not particularly limited, and examples thereof include a halogen atom, an oxygen atom, a nitrogen atom, a sulfur atom, a selenium atom, and a ruthenium atom. Among them, from the viewpoint of excellent ion migration inhibition ability of silver, -Y 1 -, -N(R a )-, -C(=Y 2 )-, -CON(R b )-, -C(=Y 3 )Y 4 -, -SO t -, -SO 2 N(R c )-, a halogen atom, or a combination of these groups.
Y1~Y4各自獨立地選自由氧原子、硫原子、硒原子、及碲原子所構成之群組。其中,自操作更簡便之方面考慮,較佳的是氧原子、硫原子。t表示1~3之整數。 Y 1 to Y 4 are each independently selected from the group consisting of an oxygen atom, a sulfur atom, a selenium atom, and a ruthenium atom. Among them, oxygen atoms and sulfur atoms are preferred from the viewpoint of easier handling. t represents an integer from 1 to 3.
作為可具有雜原子之烴基,於本發明的效果更優異之方面而言,較佳的是可具有氧原子之脂肪族烴基、可具有氧原子之芳香族烴基、或這些基組合而成之基。 The hydrocarbon group which may have a hetero atom is preferably an aliphatic hydrocarbon group which may have an oxygen atom, an aromatic hydrocarbon group which may have an oxygen atom, or a combination of these groups, in terms of the effect of the present invention being more excellent. .
烴基中之碳原子數並無特別限制,於離子遷移抑制能力更優異之方面而言,較佳的是1~40,更佳的是4~20。另外,可具有氧原子之脂肪族烴基、可具有氧原子之芳香族烴基或這些基組合而成之基中所含之碳原子數之範圍亦較佳的是上述範圍。 The number of carbon atoms in the hydrocarbon group is not particularly limited, and is preferably from 1 to 40, more preferably from 4 to 20, from the viewpoint of more excellent ion mobility inhibition ability. Further, the range of the number of carbon atoms which may be contained in the aliphatic hydrocarbon group having an oxygen atom, the aromatic hydrocarbon group which may have an oxygen atom, or the combination of these groups is also preferably in the above range.
式(1)中,Z表示氫原子、醯基、或RzOC(=O)基。Rz表示脂肪族烴基或芳香族烴基。其中,於離子遷移抑制能力更優 異之方面而言,Z較佳的是氫原子。 In the formula (1), Z represents a hydrogen atom, a fluorenyl group or an RzOC(=O) group. Rz represents an aliphatic hydrocarbon group or an aromatic hydrocarbon group. Among them, the ion migration inhibition ability is better In other respects, Z is preferably a hydrogen atom.
醯基或RzOC(=O)基中所含之碳原子數並無特別限制,於離子遷移抑制能力更優異之方面而言,較佳的是2~12,更佳的是2~8。 The number of carbon atoms contained in the fluorenyl group or the RzOC(=O) group is not particularly limited, and is preferably from 2 to 12, more preferably from 2 to 8, in terms of more excellent ion mobility inhibition ability.
另外,式(1)中,R1~R5之各基中所含之碳原子數之 合計為4以上。亦即,R1~R5之至少一個為包含碳原子之基(上述脂肪族烴基、上述芳香族烴基、或這些基組合而成之基等)。 Further, in the formula (1), the total number of carbon atoms contained in each of R 1 to R 5 is 4 or more. That is, at least one of R 1 to R 5 is a group containing a carbon atom (the above aliphatic hydrocarbon group, the above aromatic hydrocarbon group, or a combination of these groups).
碳原子之合計數若為該範圍,則銀之離子遷移得到抑制,金屬配線間之絕緣可靠性提高。另外,於該效果更優異之方面而言,合計數較佳的是8以上,更佳的是10以上。另外,上限並無特別限制,自合成更容易,於絕緣樹脂中之分散性更優異之方面而言,合計數較佳的是50以下,更佳的是40以下。 When the total number of carbon atoms is in this range, ion migration of silver is suppressed, and insulation reliability between metal wirings is improved. Further, in terms of the effect being more excellent, the total number of counts is preferably 8 or more, and more preferably 10 or more. In addition, the upper limit is not particularly limited, and it is easier to synthesize from the synthesis, and the total number of the insulating resins is preferably 50 or less, and more preferably 40 or less.
另外,於化合物中,於R1~R5之僅僅一個為包含碳原子之基(例如脂肪族烴基、芳香族烴基等)之情形時,該基中之碳原子數為4以上即可。 Further, in the case where only one of R 1 to R 5 is a group containing a carbon atom (for example, an aliphatic hydrocarbon group or an aromatic hydrocarbon group), the number of carbon atoms in the group may be 4 or more.
而且,於化合物中,於R1~R5中之多個基為包含碳原子之基(例如烷基、烷氧基等)之情形時,各基中所含之碳原子數之合計為4以上即可。例如,於R1及R2為烷基、R3~R5為氫原子之情形時,R1之烷基中所含之碳原子數與R2之烷基中所含之碳原子數之合計數為4以上即可。 Further, in the case where a plurality of groups in R 1 to R 5 are a group containing a carbon atom (for example, an alkyl group, an alkoxy group or the like), the total number of carbon atoms contained in each group is 4 More than that. For example, when R 1 and R 2 are an alkyl group and R 3 to R 5 are a hydrogen atom, the number of carbon atoms contained in the alkyl group of R 1 and the number of carbon atoms contained in the alkyl group of R 2 are The total count is 4 or more.
而且,R1~R5可相互鍵結而形成環。所形成之環之種類並無特別限制,例如可列舉5員環~6員環結構。 Further, R 1 to R 5 may be bonded to each other to form a ring. The type of the ring to be formed is not particularly limited, and examples thereof include a 5-membered ring to a 6-membered ring structure.
於R1~R5中,可視需要進一步包含公知之取代基。取 代基例如可列舉鹵素原子、烷基、烯基、芳基、氰基、羥基、硝基、羧基、烷氧基、芳氧基、矽烷氧基、雜環氧基、醯氧基、胺甲醯基氧基、烷氧基羰氧基、芳氧基羰氧基、胺基、醯基胺基、胺基羰基胺基、烷氧基羰基胺基、芳氧基羰基胺基、胺磺醯胺基、烷基或芳基磺醯基胺基、巰基、烷硫基、芳硫基、雜環硫基、胺磺醯基、磺基、烷基或芳基亞磺醯基、烷基或芳基磺醯基、醯基、芳氧基羰基、烷氧基羰基、胺甲醯基、芳基或雜環偶氮基、醯亞胺基、膦基、氧膦基、氧膦基氧基、氧膦基胺基、矽烷基。 In R 1 to R 5 , a known substituent may be further included as needed. Examples of the substituent include a halogen atom, an alkyl group, an alkenyl group, an aryl group, a cyano group, a hydroxyl group, a nitro group, a carboxyl group, an alkoxy group, an aryloxy group, a decyloxy group, a heterocyclic oxy group, a decyloxy group, and an amine group. Mercaptooxy, alkoxycarbonyloxy, aryloxycarbonyloxy, amine, decylamino, aminocarbonylamino, alkoxycarbonylamino, aryloxycarbonylamino, amine sulfonium Amino, alkyl or arylsulfonylamino, fluorenyl, alkylthio, arylthio, heterocyclic thio, sulfonyl, sulfo, alkyl or arylsulfinyl, alkyl or Arylsulfonyl, fluorenyl, aryloxycarbonyl, alkoxycarbonyl, aminemethanyl, aryl or heterocyclic azo, quinone imine, phosphino, phosphinyl, phosphinyloxy , phosphinylamino, decyl.
式(2)中,R6~R8分別獨立地表示脂肪族烴基、芳香 族烴基、或這些基組合而成之基。 In the formula (2), R 6 to R 8 each independently represent an aliphatic hydrocarbon group, an aromatic hydrocarbon group, or a combination of these groups.
脂肪族烴基、芳香族烴基或這些基組合而成之基中所含之碳原子數並無特別限制,於離子遷移抑制能力更優異之方面而言,較佳的是1~40,更佳的是2~20。 The number of carbon atoms contained in the group in which the aliphatic hydrocarbon group, the aromatic hydrocarbon group or the combination of these groups is contained is not particularly limited, and is preferably from 1 to 40, more preferably from the viewpoint of more excellent ion mobility inhibition ability. It is 2~20.
式(2)中,R6~R8之各基中所含之碳原子數之合計為 6以上。若碳原子之合計數為該範圍,則銀之離子遷移得到抑制,金屬配線間之絕緣可靠性提高。另外,於該效果更優異之方面而言,合計數較佳的是8以上,更佳的是10以上。另外,上限並無特別限制,自合成更容易、於絕緣樹脂中之分散性更優異之方面而言,合計數較佳的是50以下,更佳的是40以下。 In the formula (2), the total number of carbon atoms contained in each of R 6 to R 8 is 6 or more. When the total number of carbon atoms is in this range, ion migration of silver is suppressed, and insulation reliability between metal wirings is improved. Further, in terms of the effect being more excellent, the total number of counts is preferably 8 or more, and more preferably 10 or more. In addition, the upper limit is not particularly limited, and from the viewpoint of easier synthesis and more excellent dispersibility in the insulating resin, the total number is preferably 50 or less, more preferably 40 or less.
另外,上述所謂合計,例如於R6~R8均為烷基之情形時,R6之烷基中所含之碳原子數、與R7之烷基中所含之碳原子數、與R8 之烷基中所含之碳原子數之合計數若為6以上即可。 In the above-mentioned total, for example, when R 6 to R 8 are each an alkyl group, the number of carbon atoms contained in the alkyl group of R 6 , the number of carbon atoms contained in the alkyl group of R 7 , and R The total number of carbon atoms contained in the alkyl group of 8 may be 6 or more.
另外,R6~R8中可視需要而進一步包含公知之取代基。取代基之例與上述R1~R5中所取代之取代基相同。 Further, R 6 to R 8 may further contain a known substituent as needed. Examples of the substituent are the same as the substituents substituted for the above R 1 to R 5 .
另外,R6~R8可相互鍵結而形成環。 Further, R 6 to R 8 may be bonded to each other to form a ring.
式(3)中,R9~R12分別獨立地表示可包含雜原子之烷基、可包含雜原子之芳基、或這些基組合而成之基。 In the formula (3), R 9 to R 12 each independently represent an alkyl group which may contain a hetero atom, an aryl group which may contain a hetero atom, or a group in which these groups are combined.
烷基或芳基中所含之碳原子數並無特別限制,於離子遷移抑制能力更優異之方面而言,較佳的是1~40,更佳的是2~20。 The number of carbon atoms contained in the alkyl group or the aryl group is not particularly limited, and is preferably from 1 to 40, more preferably from 2 to 20, from the viewpoint of further excellent ion mobility inhibition ability.
另外,烷基或芳基中可包含雜原子。所含有之雜原子之種類並無特別限制,可列舉鹵素原子、氧原子、氮原子、硫原子、硒原子、碲原子等。其中,於銀之離子遷移抑制能力優異之方面而言,較佳的是以-X1-、-N(Ra)-、-C(=X2)-、-CON(Rb)-、-C(=X3)X4-、-SOn-、-SO2N(Rc)-、鹵素原子、或這些基組合而成之基之形態而包含。 Further, a hetero atom may be contained in the alkyl group or the aryl group. The type of the hetero atom to be contained is not particularly limited, and examples thereof include a halogen atom, an oxygen atom, a nitrogen atom, a sulfur atom, a selenium atom, and a ruthenium atom. Among them, in terms of excellent ion mobility inhibition ability of silver, -X 1 -, -N(R a )-, -C(=X 2 )-, -CON(R b )-, -C(=X 3 )X 4 -, -SO n -, -SO 2 N(R c )-, a halogen atom, or a combination of these groups.
X1~X4分別獨立地選自由氧原子、硫原子、硒原子、及碲原子所構成之群組。其中,自操作更簡便之方面而言,較佳的是氧原子、硫原子。 X 1 to X 4 are each independently selected from the group consisting of an oxygen atom, a sulfur atom, a selenium atom, and a ruthenium atom. Among them, an oxygen atom or a sulfur atom is preferred from the viewpoint of easier handling.
上述Ra、Rb、Rc分別獨立地選自氫原子或碳數為1~20之烴基。 The above R a , R b and R c are each independently selected from a hydrogen atom or a hydrocarbon group having 1 to 20 carbon atoms.
n表示1~3之整數。 n represents an integer from 1 to 3.
式(3)中,R9~R12之各基中所含之碳原子數之合計為6以上。碳原子之合計數若為該範圍,則銀之離子遷移得到抑制, 金屬配線間之絕緣可靠性提高。另外,於該效果更優異之方面而言,合計數較佳的是8以上,更佳的是10以上。另外,上限並無特別限制,自合成更容易,於絕緣樹脂中之分散性更優異之方面而言,合計數較佳的是50以下,更佳的是40以下。 In the formula (3), the total number of carbon atoms contained in each of R 9 to R 12 is 6 or more. When the total number of carbon atoms is in this range, ion migration of silver is suppressed, and insulation reliability between metal wirings is improved. Further, in terms of the effect being more excellent, the total number of counts is preferably 8 or more, and more preferably 10 or more. In addition, the upper limit is not particularly limited, and it is easier to synthesize from the synthesis, and the total number of the insulating resins is preferably 50 or less, and more preferably 40 or less.
另外,上述所謂合計,例如於R9~R12均為烷基之情形時,R9之烷基中所含之碳原子數、與R10之烷基中所含之碳原子數、與R11之烷基中所含之碳原子數、與R12之烷基中所含之碳原子數之合計數為6以上即可。 In the above-mentioned total, for example, when R 9 to R 12 are each an alkyl group, the number of carbon atoms contained in the alkyl group of R 9 , the number of carbon atoms contained in the alkyl group of R 10 , and R The total number of carbon atoms contained in the alkyl group of 11 and the number of carbon atoms contained in the alkyl group of R 12 may be 6 or more.
另外,R9~R12可相互鍵結而形成環。 Further, R 9 to R 12 may be bonded to each other to form a ring.
(適宜形態) (suitable form)
上述式(1)~(3)所表示之化合物中,於離子遷移抑制能力更優異之方面而言,可適宜地列舉式(4)所表示之化合物。 Among the compounds represented by the above formulas (1) to (3), the compound represented by the formula (4) can be suitably used from the viewpoint of further excellent ion mobility inhibition ability.
式(4)中,Z、R1、R2、R3之定義與式(1)中之各基之定義相同。 In the formula (4), the definitions of Z, R 1 , R 2 and R 3 are the same as those of the groups in the formula (1).
式(4)中,R14及R15可分別獨立地列舉氫原子、羥基、或可 具有雜原子之烴基。 In the formula (4), R 14 and R 15 each independently represent a hydrogen atom, a hydroxyl group, or a hydrocarbon group which may have a hetero atom.
作為上述烴基,於本發明的效果更優異之方面而言,較佳的是可包含氧原子之脂肪族烴基、可包含氧原子之芳香族烴基、或這些基組合而成之基。其中,於離子遷移抑制能力更優異之方面而言,較佳的是包含3級碳原子或4級碳原子之烷基。 The hydrocarbon group is preferably an aliphatic hydrocarbon group which may contain an oxygen atom, an aromatic hydrocarbon group which may contain an oxygen atom, or a combination of these groups, in terms of the effect of the present invention being more excellent. Among them, an alkyl group containing a 3-stage carbon atom or a 4-stage carbon atom is preferred in terms of more excellent ion mobility-inhibiting ability.
另外,可具有雜原子之烴基中之碳原子數若滿足後述之必要條件則並無特別限制,較佳的是1~40,更佳的是2~20。而且,可具有氧原子之脂肪族烴基、可具有氧原子之芳香族烴基或這些基組合而成之基中所含之碳原子數之範圍亦較佳的是上述範圍。 Further, the number of carbon atoms in the hydrocarbon group which may have a hetero atom is not particularly limited as long as it satisfies the requirements described later, and is preferably from 1 to 40, more preferably from 2 to 20. Further, the range of the number of carbon atoms which may be an aliphatic hydrocarbon group having an oxygen atom, an aromatic hydrocarbon group which may have an oxygen atom, or a combination of these groups is also preferably in the above range.
特佳的是R14為碳原子數為1個~5個之烷基、R15為碳原子數為10個~20個之烷基。 Particularly preferably, R 14 is an alkyl group having 1 to 5 carbon atoms, and R 15 is an alkyl group having 10 to 20 carbon atoms.
R1、R2、R14及R15中之至少一個中所含之碳原子數為1 ~40。若碳原子數為上述範圍內,則於絕緣樹脂中之溶解性提高,銀離子擴散抑制層中之化合物之分散性提高,其結果銀之離子遷移抑制能力提高。其中,碳原子數較佳的是8~40,更佳的是10~30。 The number of carbon atoms contained in at least one of R 1 , R 2 , R 14 and R 15 is from 1 to 40. When the number of carbon atoms is in the above range, the solubility in the insulating resin is improved, and the dispersibility of the compound in the silver ion diffusion inhibiting layer is improved, and as a result, the ion mobility inhibition ability of silver is improved. Among them, the number of carbon atoms is preferably from 8 to 40, more preferably from 10 to 30.
而且,R1、R2、R14及R15之各基中所含之碳原子數之合 計為4以上。若碳原子之合計數為該範圍,則銀之離子遷移得到抑制,金屬配線間之絕緣可靠性提高。另外,於該效果更優異之方面而言,合計數較佳的是8以上,更佳的是10以上。另外,上限並無特別限制,自合成更容易,於絕緣樹脂中之分散性更優異之方面而言,合計數較佳的是50以下,更佳的是40以下。 Further, the total number of carbon atoms contained in each of R 1 , R 2 , R 14 and R 15 is 4 or more. When the total number of carbon atoms is in this range, ion migration of silver is suppressed, and insulation reliability between metal wirings is improved. Further, in terms of the effect being more excellent, the total number of counts is preferably 8 or more, and more preferably 10 or more. In addition, the upper limit is not particularly limited, and it is easier to synthesize from the synthesis, and the total number of the insulating resins is preferably 50 or less, and more preferably 40 or less.
而且,上述式(1)~式(3)所表示之化合物中,於離 子遷移抑制能力更優異之方面而言,最佳的是式(5)所表示之化合物、或式(6)所表示之化合物。 Further, among the compounds represented by the above formulas (1) to (3), The compound represented by the formula (5) or the compound represented by the formula (6) is most preferable in terms of superior sub-migration inhibition ability.
式(5)中,R31~R38分別獨立地表示氫原子、羥基、或 可包含雜原子之碳數為1~20之烴基。 In the formula (5), R 31 to R 38 each independently represent a hydrogen atom, a hydroxyl group, or a hydrocarbon group having a carbon number of 1 to 20 which may contain a hetero atom.
作為烴基之適宜例,例如可列舉-O-Ra。Ra表示可包含雜原子之碳數為1~20之烴基。於存在多個-O-Ra之情形時,這些可相同可不同。 A suitable example of the hydrocarbon group is -OR a . R a represents a hydrocarbon group having a carbon number of 1 to 20 which may contain a hetero atom. These may be the same when there are multiple -OR a cases.
作為烴基之碳數,於與絕緣樹脂之相溶性更優異之方面而言,較佳的是1~12,更佳的是1~10。 The carbon number of the hydrocarbon group is preferably from 1 to 12, more preferably from 1 to 10, from the viewpoint of being more excellent in compatibility with the insulating resin.
烴基更具體而言可列舉脂肪族烴基、芳香族烴基、或這些基組合而成之基。脂肪族烴基可為直鏈狀、分支鏈狀、環狀之任意 者。 More specifically, the hydrocarbon group may be an aliphatic hydrocarbon group, an aromatic hydrocarbon group, or a combination of these groups. The aliphatic hydrocarbon group may be linear, branched or cyclic By.
而且,R31~R38之各基之分子量之合計為24以上。其中,較佳的是35以上。另外,上限並無特別限制,於本發明的效果更優異之方面而言,較佳的是1000以下,更佳的是500以下,進一步更佳的是300以下。上述各基之分子量之合計是表示計算R31~R38之各個基之分子量,對這些進行合計而所得之值。 Further, the total molecular weight of each of R 31 to R 38 is 24 or more. Among them, it is preferably 35 or more. Further, the upper limit is not particularly limited, and is preferably 1,000 or less, more preferably 500 or less, still more preferably 300 or less in terms of the effect of the present invention being more excellent. The total of the molecular weights of the above respective groups is a value obtained by calculating the molecular weight of each of R 31 to R 38 and summing these.
而且,R31~R38可任意2個相互鍵結而形成環。 Further, R 31 to R 38 may be bonded to each other to form a ring.
另外,雜原子之定義與上述所說明之R1~R5所表示之可具有雜原子之烴基中之雜原子的定義相同。 Further, the definition of the hetero atom is the same as the definition of the hetero atom in the hydrocarbon group which may have a hetero atom represented by R 1 to R 5 described above.
作為R31~R36所表示之可包含雜原子之碳數為1~20之 烴基,於本發明的效果更優異之方面而言,較佳的是選自由可具有氧原子之脂肪族烴基(例如烷基、烯基、炔基)、可具有氧原子之芳香族烴基(例如苯基)、及這些基組合而成之基所構成之群組的碳數為1~20之基。 The hydrocarbon group having a carbon number of 1 to 20 which may contain a hetero atom represented by R 31 to R 36 is preferably selected from an aliphatic hydrocarbon group which may have an oxygen atom in terms of the effect of the present invention being more excellent ( For example, an alkyl group, an alkenyl group, or an alkynyl group, an aromatic hydrocarbon group (for example, a phenyl group) which may have an oxygen atom, and a group of groups in which these groups are combined have a carbon number of 1 to 20.
另外,較佳的是R37及R38分別獨立地表示-CH2-R40基、羥基、或可具有氧原子之脂肪族烴基。於離子遷移抑制能力更優異之方面而言,較佳的是可具有氧原子之脂肪族烴基為直鏈狀之烷基。 R40表示氫原子、脂肪族烴基、芳香族烴基、或這些基組合而成之基。 Further, it is preferred that R 37 and R 38 each independently represent a -CH 2 -R 40 group, a hydroxyl group, or an aliphatic hydrocarbon group which may have an oxygen atom. In terms of more excellent ion mobility inhibition ability, it is preferred that the aliphatic hydrocarbon group which may have an oxygen atom be a linear alkyl group. R 40 represents a hydrogen atom, an aliphatic hydrocarbon group, an aromatic hydrocarbon group, or a combination of these groups.
而且,脂肪族烴基可為直鏈狀、分支狀、或環狀之任意者。 Further, the aliphatic hydrocarbon group may be any of a linear chain, a branched chain, or a cyclic chain.
R39表示可包含雜原子之碳數為1~20之2價脂肪族烴基。2價脂肪族烴基中所含之碳原子數較佳的是1~10。例如可列 舉亞甲基、亞乙基、亞異丙基、亞丁基、亞異壬基、或亞環己基等,但本發明並不限定於這些。 R 39 represents a divalent aliphatic hydrocarbon group having 1 to 20 carbon atoms which may contain a hetero atom. The number of carbon atoms contained in the divalent aliphatic hydrocarbon group is preferably from 1 to 10. For example, a methylene group, an ethylene group, an isopropylidene group, a butylene group, an isodecylene group, or a cyclohexylene group may be mentioned, but the present invention is not limited thereto.
另外,雜原子之定義與上述所說明之R1~R5所表示之可具有雜原子之烴基中之雜原子的定義相同。 Further, the definition of the hetero atom is the same as the definition of the hetero atom in the hydrocarbon group which may have a hetero atom represented by R 1 to R 5 described above.
式(6)中,R41~R44分別獨立地表示氫原子、羥基、或 可包含雜原子之碳數為1~20之烴基。 In the formula (6), R 41 to R 44 each independently represent a hydrogen atom, a hydroxyl group, or a hydrocarbon group having a carbon number of 1 to 20 which may contain a hetero atom.
R41~R44所表示之烴基之適宜範圍與上述R31~R38所表示之烴基之適宜範圍相同。 The suitable range of the hydrocarbon group represented by R 41 to R 44 is the same as the suitable range of the hydrocarbon group represented by the above R 31 to R 38 .
而且,R41~R44之各基之分子量之合計為40以上。其中,較佳的是50以上。另外,上限並無特別限制,於本發明的效果更優異之方面而言,較佳的是1000以下,更佳的是500以下,進一步更佳的是300以下。 Further, the total molecular weight of each of R 41 to R 44 is 40 or more. Among them, it is preferably 50 or more. Further, the upper limit is not particularly limited, and is preferably 1,000 or less, more preferably 500 or less, still more preferably 300 or less in terms of the effect of the present invention being more excellent.
而且,R41~R44可任意2個相互鍵結而形成環。 Further, R 41 to R 44 may be bonded to each other to form a ring.
另外,雜原子之定義與上述所說明之R1~R5所表示之可具有雜原子之烴基中之雜原子的定義相同。 Further, the definition of the hetero atom is the same as the definition of the hetero atom in the hydrocarbon group which may have a hetero atom represented by R 1 to R 5 described above.
作為R41~R44所表示之可包含雜原子之碳數為1~20之 烴基,於本發明的效果更優異之方面而言,較佳的是選自由可具有氧原子之脂肪族烴基(例如烷基、烯基、炔基)、可具有氧原子之芳香族烴基(例如苯基)、及這些基組合而成之基所構成之群組的碳數為1~20之基。 The hydrocarbon group having a carbon number of 1 to 20 which may be a hetero atom represented by R 41 to R 44 is preferably selected from an aliphatic hydrocarbon group which may have an oxygen atom in terms of the effect of the present invention being more excellent ( For example, an alkyl group, an alkenyl group, or an alkynyl group, an aromatic hydrocarbon group (for example, a phenyl group) which may have an oxygen atom, and a group of groups in which these groups are combined have a carbon number of 1 to 20.
而且,脂肪族烴基可為直鏈狀、分支狀、或環狀之任意者。 Further, the aliphatic hydrocarbon group may be any of a linear chain, a branched chain, or a cyclic chain.
L表示可具有雜原子之2價或3價之烴基、-S-、或這些 基組合而成之基。 L represents a divalent or trivalent hydrocarbon group which may have a hetero atom, -S-, or these The basis of the combination.
作為L所表示之烴基,於本發明的效果更優異之方面而言,可列舉可具有氧原子之2價或3價之脂肪族烴基、或可具有氧原子之2價或3價之芳香族烴基。 Examples of the hydrocarbon group represented by L include an aliphatic hydrocarbon group which may have a divalent or trivalent oxygen atom, or a divalent or trivalent aromatic group which may have an oxygen atom, in terms of the effect of the present invention. Hydrocarbyl group.
脂肪族烴基或芳香族烴基中所含之碳原子數並無特別限制,脂肪族烴基較佳的是1~40,更佳的是2~20,且芳香族烴基較佳的是6~40,更佳的是6~20。 The number of carbon atoms contained in the aliphatic hydrocarbon group or the aromatic hydrocarbon group is not particularly limited, and the aliphatic hydrocarbon group is preferably from 1 to 40, more preferably from 2 to 20, and the aromatic hydrocarbon group is preferably from 6 to 40. More preferably, it is 6~20.
而且,脂肪族烴基可為直鏈狀、分支狀、或環狀之任意者。 Further, the aliphatic hydrocarbon group may be any of a linear chain, a branched chain, or a cyclic chain.
n表示2或3之整數。 n represents an integer of 2 or 3.
式(1)所表示之化合物例如可列舉以下之化合物。 The compound represented by the formula (1) is exemplified by the following compounds.
[化4]
式(4)所表示之化合物例如可列舉以下之化合物。 The compound represented by the formula (4) is exemplified by the following compounds.
[化5]
式(5)所表示之化合物例如可列舉以下之化合物。 The compound represented by the formula (5) is exemplified by the following compounds.
式(6)所表示之化合物例如可列舉以下之化合物。 The compound represented by the formula (6) is exemplified by the following compounds.
[化7]
式(2)所表示之化合物例如可列舉以下之化合物。 The compound represented by the formula (2) is exemplified by the following compounds.
式(3)所表示之化合物例如可列舉以下之化合物。 The compound represented by the formula (3) is exemplified by the following compounds.
[化11]
銀離子擴散抑制層中之上述絕緣樹脂與上述還原性化 合物之質量關係並無特別限制,於離子遷移抑制能力更優異之方面而言,還原性化合物之總質量A與絕緣樹脂之總質量B之質量比(A/B)較佳的是0.20以下,更佳的是0.10以下。下限並無特別限制,自於薄的銀離子擴散抑制層中亦獲得規定的効果之方面而言,較佳的是0.0001以上,更佳的是0.0005以上。 The above insulating resin in the silver ion diffusion suppressing layer and the above reductive The mass relationship of the compound is not particularly limited, and the mass ratio (A/B) of the total mass A of the reducing compound to the total mass B of the insulating resin is preferably 0.20 or less in terms of excellent ion migration inhibiting ability. More preferably, it is 0.10 or less. The lower limit is not particularly limited, and is preferably 0.0001 or more, and more preferably 0.0005 or more, from the viewpoint of obtaining a predetermined effect in the thin silver ion diffusion suppression layer.
另外,總質量A於包含2種以上還原性化合物之情形時表示這些化合物之合計質量。總質量B於包含2種以上絕緣樹脂之情形時表示這些樹脂之合計質量。 Further, when the total mass A is two or more kinds of reducing compounds, the total mass of these compounds is shown. The total mass B indicates the total mass of these resins in the case where two or more kinds of insulating resins are contained.
[配線基板] [Wiring substrate]
上述包含絕緣基板、金屬配線、及銀離子擴散抑制層之配線基板可用於各種用途及結構。例如可列舉電漿顯示面板用面板基板、太陽電池電極用基板、膜片配線板、觸控面板電極用基板等。 The wiring board including the insulating substrate, the metal wiring, and the silver ion diffusion suppression layer can be used for various purposes and structures. For example, a panel substrate for a plasma display panel, a solar cell electrode substrate, a membrane wiring board, and a touch panel electrode substrate can be cited.
而且,本發明的第1實施方式之配線基板較佳的是包含 於電子裝置中。所謂電子裝置是指觸控面板或膜片開關或搭載這 些之電視、行動通訊裝置、個人電腦、遊戲裝置、車載顯示裝置、網路通訊裝置、照明、顯示用發光二極體(light-emitting diode,LED)、與太陽電池控制相關之電子配線裝置、射頻識別(radio frequency identification,RFID)等無線通訊元件、或藉由半導體配線基板或有機薄膜電晶體(thin-film transistor,TFT)配線基板進行驅動控制之裝置類。 Further, the wiring board according to the first embodiment of the present invention preferably includes In an electronic device. The so-called electronic device refers to the touch panel or the diaphragm switch or carries this Televisions, mobile communication devices, personal computers, game devices, in-vehicle display devices, network communication devices, lighting, display light-emitting diodes (LEDs), electronic wiring devices related to solar cell control, A wireless communication device such as radio frequency identification (RFID) or a device for driving control by a semiconductor wiring substrate or an organic thin film transistor (TFT) wiring substrate.
(配線基板之製造方法) (Manufacturing method of wiring board)
首先,於絕緣基板上形成金屬配線之方法並無特別限制,可採用公知之方法。可代表性地列舉利用蝕刻處理之減成法、利用電解電鍍之半加成法、使用銀漿(例如含有銀奈米粒子或銀奈米線之漿料)而製作金屬配線之方法、日本專利特開2009-188360號中所揭示之使用感光材料之方法、真空蒸鍍法、濺鍍成膜法、離子鍍法等。 First, the method of forming the metal wiring on the insulating substrate is not particularly limited, and a known method can be employed. Typical examples include a subtractive method using an etching treatment, a semi-additive method using electrolytic plating, a method of producing a metal wiring using a silver paste (for example, a slurry containing silver nanoparticles or a silver nanowire), and a Japanese patent. A method of using a photosensitive material, a vacuum deposition method, a sputtering film formation method, an ion plating method, and the like disclosed in JP-A-2009-188360.
另外,銀漿是使規定粒徑之銀粒子分散於樹脂黏合劑等適當溶劑中而所得之導電性糊狀物質(漿料),用於試樣之安裝或導電處理等中。市售品例如可列舉Peltron K-3424LB(商品名、朋諾(PELNOX)股份有限公司製造)等。 In addition, the silver paste is a conductive paste-like substance (slurry) obtained by dispersing silver particles having a predetermined particle diameter in a suitable solvent such as a resin binder, and is used for mounting a sample or conducting a conductive treatment. The commercial item is, for example, Peltron K-3424LB (trade name, manufactured by PELNOX Co., Ltd.).
配線基板之製造方法並無特別限制,例如存在有將包含 上述絕緣樹脂、上述還原性化合物及溶劑之銀離子擴散抑制層形成用組成物塗佈於附有金屬配線之絕緣基板上,除去溶劑而形成銀離子擴散抑制層之方法。而且,可列舉將包含上述絕緣樹脂及上述化合物之銀離子擴散抑制層用膜直接積層於附有金屬配線之 絕緣基板上的方法。 The method of manufacturing the wiring board is not particularly limited, and for example, there are The composition for forming a silver ion diffusion suppression layer of the insulating resin, the reducing compound, and the solvent is applied onto an insulating substrate with metal wiring, and a solvent is removed to form a silver ion diffusion inhibiting layer. Further, a film for a silver ion diffusion suppression layer containing the above-mentioned insulating resin and the above compound is directly laminated on a metal wiring. A method on an insulating substrate.
自銀離子擴散抑制層之厚度之調整容易之方面而言,較佳的是利用上述塗佈之方法。 From the viewpoint of easy adjustment of the thickness of the silver ion diffusion suppressing layer, it is preferred to use the above coating method.
另外,將銀離子擴散抑制層形成用組成物塗佈於附有金 屬配線之絕緣基板上的方法並無特別限制,可採用點膠(dispense)法、網版印刷法、簾塗法、輥塗法、旋塗法、噴墨法、浸漬法等公知之方法。於更容易控制銀離子擴散抑制層之附著量之方面而言,較佳的是點膠法、網版印刷法、旋塗法、噴墨法。 Further, the composition for forming a silver ion diffusion suppression layer is coated with gold The method of the insulating substrate to be wired is not particularly limited, and a known method such as a dispensing method, a screen printing method, a curtain coating method, a roll coating method, a spin coating method, an inkjet method, or a dipping method can be employed. In terms of more easily controlling the amount of adhesion of the silver ion diffusion inhibiting layer, a dispensing method, a screen printing method, a spin coating method, or an ink jet method is preferred.
而且,於組成物中所含之絕緣樹脂為硬化性樹脂之情形時,於塗佈組成物後,可視需要實施加熱處理或曝光處理。 Further, when the insulating resin contained in the composition is a curable resin, after the composition is applied, heat treatment or exposure treatment may be performed as needed.
於實施加熱處理之情形時,其加熱溫度可根據所使用之熱硬化性樹脂而適宜選擇最合適之溫度,通常較佳的是100℃~300℃,更佳的是100℃~250℃。而且,自生產性之方面考慮,加熱時間較佳的是0.2小時~10小時,更佳的是0.5小時~5小時。 When the heat treatment is carried out, the heating temperature may be appropriately selected depending on the thermosetting resin to be used, and it is usually preferably from 100 ° C to 300 ° C, more preferably from 100 ° C to 250 ° C. Further, from the viewpoint of productivity, the heating time is preferably from 0.2 hours to 10 hours, more preferably from 0.5 hours to 5 hours.
另外,於實施曝光處理之情形時,曝光所使用之光可根據所使用之光硬化性樹脂而適宜選擇最合適之波長之光。例如可列舉紫外線、可見光等。自生產性之方面考慮,曝光時間較佳的是0.2小時~10小時,更佳的是0.5小時~5小時。 Further, in the case of performing the exposure treatment, the light used for the exposure can be appropriately selected from the light of the most suitable wavelength depending on the photocurable resin to be used. For example, ultraviolet light, visible light, etc. are mentioned. From the viewpoint of productivity, the exposure time is preferably from 0.2 hours to 10 hours, more preferably from 0.5 hours to 5 hours.
[附有絕緣層之配線基板] [Wiring board with insulation layer]
可視需要於上述所得之配線基板之銀離子擴散抑制層側之表面進一步設置絕緣層。藉由於銀離子擴散抑制層上進一步設置絕緣層,可於絕緣層上進一步設置配線而製成多層配線基板。 Further, an insulating layer may be further provided on the surface of the wiring substrate on the side of the silver ion diffusion suppressing layer which is obtained as described above. By further providing an insulating layer on the silver ion diffusion suppressing layer, wiring can be further provided on the insulating layer to form a multilayer wiring board.
更具體而言,附有絕緣層之配線基板200可如圖3所示那樣於銀離子擴散抑制層18上配置絕緣層20。 More specifically, the wiring layer 200 with the insulating layer may be provided with the insulating layer 20 on the silver ion diffusion suppression layer 18 as shown in FIG. 3 .
以下,對所使用之材料(絕緣層)加以說明,其後對製造方法之順序加以說明。 Hereinafter, the materials (insulating layers) to be used will be described, and the order of the manufacturing methods will be described later.
(絕緣層) (Insulation)
絕緣層之材料可使用公知之絕緣性材料。例如可列舉環氧樹脂、聚芳醯胺樹脂、結晶性聚烯烴樹脂、非晶形聚烯烴樹脂、含氟樹脂(聚四氟乙烯、全氟聚醯亞胺、全氟非晶形樹脂等)、聚醯亞胺樹脂、聚醚碸樹脂、聚苯硫醚樹脂、聚醚醚酮樹脂、丙烯酸酯樹脂等。 As the material of the insulating layer, a known insulating material can be used. For example, an epoxy resin, a polyarylamine resin, a crystalline polyolefin resin, an amorphous polyolefin resin, a fluorine-containing resin (polytetrafluoroethylene, perfluoropolyimine, perfluoro amorphous resin, etc.), and a poly A quinone imine resin, a polyether oxime resin, a polyphenylene sulfide resin, a polyether ether ketone resin, an acrylate resin, or the like.
而且,絕緣層可使用所謂之光學用透明黏著片(OCA)。OCA可使用市售品,例如可列舉3M股份有限公司製造之8171CL系列、8146系列等。 Further, as the insulating layer, a so-called optical transparent sheet (OCA) can be used. Commercially available products can be used for the OCA, and examples thereof include the 8171CL series and the 8146 series manufactured by 3M Co., Ltd.
而且,絕緣層可使用所謂之阻焊劑(solder resist)層。阻焊劑可使用市售品,例如可列舉太陽油墨製造股份有限公司製造之PFR800、PSR4000(商品名)、日立化成工業股份有限公司製造之SR7200G等。 Moreover, a so-called solder resist layer can be used for the insulating layer. A commercially available product can be used as the solder resist, and examples thereof include PFR800, PSR4000 (trade name) manufactured by Sun Ink Manufacturing Co., Ltd., and SR7200G manufactured by Hitachi Chemical Co., Ltd., and the like.
其中,絕緣層較佳的是包含具有環氧基或(甲基)丙烯酸酯基之樹脂。該樹脂容易與上述銀離子擴散抑制層結合,其結果絕緣層之密接性提高,其結果銀之離子遷移抑制效果進一步提高。 Among them, the insulating layer preferably contains a resin having an epoxy group or a (meth) acrylate group. This resin is easily bonded to the above-described silver ion diffusion suppressing layer, and as a result, the adhesion of the insulating layer is improved, and as a result, the effect of inhibiting the ion transport of silver is further improved.
較佳的是該樹脂為絕緣層之主成分。所謂主成分是表示該樹脂之合計相對於絕緣層之總量而言為50質量%以上,較佳的是60 質量%以上。另外,上限為100質量%。 Preferably, the resin is a main component of the insulating layer. The main component is that the total amount of the resin is 50% by mass or more based on the total amount of the insulating layer, and preferably 60. More than % by mass. Further, the upper limit is 100% by mass.
具有環氧基之樹脂可使用公知之環氧樹脂。例如可使用 縮水甘油醚型環氧樹脂、縮水甘油酯型環氧樹脂、縮水甘油胺型環氧樹脂等。 As the epoxy group-containing resin, a known epoxy resin can be used. For example, can be used A glycidyl ether type epoxy resin, a glycidyl ester type epoxy resin, a glycidylamine type epoxy resin, or the like.
具有(甲基)丙烯酸酯基之樹脂可使用公知之樹脂。例如可使用丙烯酸酯樹脂、甲基丙烯酸酯樹脂等。 As the resin having a (meth) acrylate group, a known resin can be used. For example, an acrylate resin, a methacrylate resin, or the like can be used.
(製造之順序) (order of manufacture)
於配線基板上形成絕緣層之方法並無特別限制,可採用公知之方法。例如可列舉將絕緣層膜直接層壓於配線基板上的方法、將包含構成絕緣層之成分的絕緣層形成用組成物塗佈於配線基板上的方法、將配線基板浸漬於該絕緣層形成用組成物中的方法等。 The method of forming the insulating layer on the wiring substrate is not particularly limited, and a known method can be employed. For example, a method of directly laminating an insulating layer film on a wiring board, a method of applying an insulating layer forming composition containing a component constituting the insulating layer to a wiring board, and immersing the wiring board in the formation of the insulating layer The method in the composition, and the like.
另外,上述絕緣層形成用組成物中可視需要包含溶劑。於使用包含溶劑之絕緣層形成用組成物之情形時,於將該組成物配置於配線基板上之後,可為了除去溶劑而視需要實施加熱處理。 Further, the insulating layer forming composition may optionally contain a solvent. When the composition for forming an insulating layer containing a solvent is used, after the composition is placed on the wiring board, heat treatment may be performed as needed to remove the solvent.
而且,於將絕緣層設於配線基板上之後,可視需要對絕緣層實施能量賦予(例如曝光或加熱處理)。 Further, after the insulating layer is provided on the wiring substrate, energy can be applied to the insulating layer (for example, exposure or heat treatment) as needed.
所形成之絕緣層之層厚並無特別限制,自金屬配線間之 絕緣可靠性之觀點考慮,較佳的是5 μm~50 μm,更佳的是10 μm~40 μm。 The layer thickness of the formed insulating layer is not particularly limited, since the metal wiring layer From the viewpoint of insulation reliability, it is preferably 5 μm to 50 μm, more preferably 10 μm to 40 μm.
而且,可藉由鑽孔加工或雷射加工而除去所得之附有絕 緣層之配線基板中之絕緣層之一部分,封裝半導體晶片而用作電路板。 Moreover, it can be removed by drilling or laser processing. A portion of the insulating layer in the wiring substrate of the edge layer is packaged with a semiconductor wafer and used as a circuit board.
例如於使用阻焊劑作為絕緣層之情形時,將規定之圖案狀遮罩配置於絕緣層上,賦予能量而使其硬化,將未賦予能量之區域的絕緣層除去而使金屬配線露出。其次,藉由公知之方法對所露出之金屬配線之表面進行清洗(例如使用硫酸、軟蝕刻劑、鹼、界面活性劑而進行清洗)後,將半導體晶片封裝於金屬配線表面上。 For example, when a solder resist is used as the insulating layer, a predetermined pattern mask is placed on the insulating layer, energy is applied to be cured, and the insulating layer in the region where no energy is applied is removed to expose the metal wiring. Next, the surface of the exposed metal wiring is cleaned (for example, by using sulfuric acid, a soft etchant, an alkali, or a surfactant) by a known method, and then the semiconductor wafer is packaged on the surface of the metal wiring.
而且,可於所得之絕緣層上進一步設置金屬配線。形成 金屬配線的方法並無特別限制,可使用公知之方法(鍍敷處理、濺鍍處理等)。 Further, metal wiring can be further provided on the obtained insulating layer. form The method of the metal wiring is not particularly limited, and a known method (plating treatment, sputtering treatment, or the like) can be used.
於本發明的第1實施方式中,可將於所得之附有絕緣層之配線基板中之最外層上所配置的絕緣層上進一步設有金屬配線之基板用作新的附有金屬配線之絕緣基板(內層基板),新積層數層絕緣層及金屬配線。 In the first embodiment of the present invention, the substrate on which the metal wiring is further provided on the insulating layer disposed on the outermost layer of the obtained wiring layer with the insulating layer can be used as a new insulation with metal wiring. Substrate (inner substrate), several layers of insulating layers and metal wiring.
<導電膜積層體> <Conductive film laminate>
其次,參照圖式對本發明的第1實施方式之導電膜積層體之適宜形態加以詳述。 Next, a suitable form of the conductive film laminate according to the first embodiment of the present invention will be described in detail with reference to the drawings.
圖4表示導電膜積層體之一實施方式之示意性剖面圖,導電膜積層體300包含:透明基板302、透明基板302上所配置之包含銀或銀合金之導電膜304、導電膜304上所貼合之透明雙面黏著片306。 4 is a schematic cross-sectional view showing an embodiment of a conductive film laminate. The conductive film laminate 300 includes a transparent substrate 302, a conductive film 304 containing silver or a silver alloy disposed on the transparent substrate 302, and a conductive film 304. A transparent double-sided adhesive sheet 306 is attached.
以下對各構件(透明基板302、導電膜304、透明雙面黏著片306)加以詳述。 Each member (transparent substrate 302, conductive film 304, and transparent double-sided adhesive sheet 306) will be described in detail below.
[透明基板] [Transparent substrate]
透明基板若為支撐後述之導電膜及透明雙面黏著片、且對於可見光而言透明之基板,則其種類並無特別限制。 The transparent substrate is not particularly limited as long as it is a substrate that supports a conductive film and a transparent double-sided adhesive sheet to be described later and is transparent to visible light.
作為透明基板之材料,例如除了玻璃之外,可使用高分子樹脂。高分子樹脂例如可列舉聚乙烯或聚丙烯等聚烯烴、聚對苯二甲酸乙二酯、聚對苯二甲酸丁二酯、聚萘二甲酸乙二酯、聚碳酸酯、聚醚碸、聚碸、聚芳酯、環狀聚烯烴、聚醯亞胺等。 As a material of the transparent substrate, for example, a polymer resin can be used in addition to glass. Examples of the polymer resin include polyolefins such as polyethylene and polypropylene, polyethylene terephthalate, polybutylene terephthalate, polyethylene naphthalate, polycarbonate, polyether oxime, and poly Anthracene, polyarylate, cyclic polyolefin, polyimine, and the like.
透明基板之形狀並無特別限制,可列舉板狀、膜狀等。 The shape of the transparent substrate is not particularly limited, and examples thereof include a plate shape and a film shape.
透明基板之厚度並無特別限制,於將導電膜積層體應用於觸控面板中之情形時,厚度較佳的是0.01 mm~3.0 mm,更佳的是0.05 mm~1.5 mm。 The thickness of the transparent substrate is not particularly limited. When the conductive film laminate is applied to a touch panel, the thickness is preferably 0.01 mm to 3.0 mm, more preferably 0.05 mm to 1.5 mm.
透明基板較佳的是於可見光區域具有高的透明性,較佳的是總透光率為80%以上。 The transparent substrate preferably has high transparency in the visible light region, and preferably has a total light transmittance of 80% or more.
另外,透明基板可包含下塗層等其他功能層。其他功能層例如可列舉消光劑層、保護層、耐溶劑層、抗靜電層、平滑化層、密接改良層、遮光層、抗反射層、硬塗層、應力緩和層、防霧層、防污層、被印刷層、易接著層等。這些可為單層,可積層多層。 In addition, the transparent substrate may include other functional layers such as an undercoat layer. Examples of the other functional layer include a matting agent layer, a protective layer, a solvent resistant layer, an antistatic layer, a smoothing layer, a adhesion improving layer, a light shielding layer, an antireflection layer, a hard coat layer, a stress relaxation layer, an antifogging layer, and an antifouling layer. Layer, printed layer, easy adhesion layer, and the like. These can be single layers and can be stacked in multiple layers.
[導電膜] [conductive film]
導電膜配置於上述透明基板上,主要包含銀。該導電膜於應用於觸控面板用途時,可用作觸控面板之透明電極或周邊配線(引線配線)。另外,於導電膜中,可於不損及本發明的效果的範圍內包含黏合劑等樹脂成分或感光性化合物等,可進一步視需要包含 其他成分。 The conductive film is disposed on the transparent substrate and mainly contains silver. When applied to a touch panel, the conductive film can be used as a transparent electrode or a peripheral wiring (lead wiring) of the touch panel. In addition, a resin component such as a binder or a photosensitive compound may be contained in the conductive film in a range that does not impair the effects of the present invention, and may be further included as needed. Other ingredients.
銀可以銀合金之形態而包含,於導電膜中包含銀合金之情形時,銀以外之所含有的金屬例如可列舉錫、鈀、金、鎳、鉻等。 Silver may be contained in the form of a silver alloy. When the conductive film contains a silver alloy, examples of the metal other than silver include tin, palladium, gold, nickel, chromium, and the like.
導電膜之圖案形狀並無特別限制,可如圖4所示那樣於透明基板表面上之一部分設為配線狀(圖案狀導電膜)(換而言之,可設為導電性細線)、或者可設於整個面。另外,圖案形狀可採用條紋狀等任意圖案。 The pattern shape of the conductive film is not particularly limited, and as shown in FIG. 4, a portion of the surface of the transparent substrate may be a wiring (pattern-shaped conductive film) (in other words, a conductive thin wire may be used), or Set on the entire surface. Further, the pattern shape may be any pattern such as a stripe shape.
導電膜之每單位面積中所含之銀量為50 μg/mm2以下。 藉由使銀量為上述範圍,變得可使導電膜之膜厚及寬度變小,從而可應對高密度積體化之迫切期望。若銀量過多,則變得容易於導電膜間產生短路。其中,銀量較佳的是30 μg/mm2以下,更佳的是15 μg/mm2以下。關於下限,並無特別限制,於導電膜之導電特性更優異之方面而言,較佳的是0.001 μg/mm2以上,更佳的是0.005 μg/mm2以上。 The amount of silver contained per unit area of the conductive film is 50 μg/mm 2 or less. When the amount of silver is in the above range, the film thickness and width of the conductive film can be made small, and it is possible to cope with the high expectation of high-density integration. If the amount of silver is too large, it becomes easy to cause a short circuit between the conductive films. Among them, the amount of silver is preferably 30 μg/mm 2 or less, more preferably 15 μg/mm 2 or less. The lower limit is not particularly limited, and is preferably 0.001 μg/mm 2 or more, and more preferably 0.005 μg/mm 2 or more, from the viewpoint that the conductive property of the conductive film is more excellent.
另外,於導電膜中所含之銀量少之情形時,若產生離子遷移,則形成導電膜之銀會溶出,從而變得容易產生導電膜之斷線。然而,於本發明中,藉由將包含規定化合物之透明雙面黏著片貼合於導電膜上,可抑制銀之離子遷移,抑制導電膜之斷線。 Further, when the amount of silver contained in the conductive film is small, if ion migration occurs, silver which forms the conductive film is eluted, and disconnection of the conductive film is likely to occur. However, in the present invention, by adhering a transparent double-sided adhesive sheet containing a predetermined compound to a conductive film, ion migration of silver can be suppressed, and disconnection of the conductive film can be suppressed.
銀量之測定方法並無特別限制,可採用公知之方法。例 如,可藉由觀察導電膜之剖面SEM相片進行元素分析而測定銀量。而且,可使導電膜與硝酸等強酸接觸,使導電膜中之銀溶解,根據溶解量而測定銀量。而且,於使用包含銀奈米線或銀奈米粒 子之分散液而製作導電膜之情形時,可根據製作導電膜時所使用之分散液之量,藉由計算而求出導電膜中之銀量。 The method for measuring the amount of silver is not particularly limited, and a known method can be employed. example For example, the amount of silver can be determined by performing elemental analysis by observing a cross-sectional SEM photograph of the conductive film. Further, the conductive film can be brought into contact with a strong acid such as nitric acid to dissolve the silver in the conductive film, and the amount of silver can be measured according to the amount of dissolution. Moreover, the use of silver nanowires or silver nanoparticles When a conductive film is produced by using a dispersion liquid, the amount of silver in the conductive film can be calculated by calculation based on the amount of the dispersion used in the production of the conductive film.
而且,所謂導電膜之每單位面積是表示導電膜之與透明基板之接觸部分之每單位面積。亦即,僅僅以導電膜與透明基板之接觸部分的面積為基準而進行銀量之計算。換而言之,於導電膜為圖案狀之情形時,並不與導電膜接觸之透明基板表面(例如位於導電膜間的並不與導電膜接觸之透明基板表面)之面積並不考慮在上述導電膜之每單位面積之計算之內。因此,所謂導電膜之每單位面積中所含之銀量是表示導電膜與透明基板之接觸部分的每單位面積(mm2)中所含之銀量。 Further, the unit area of the conductive film is the unit area per unit area of the contact portion of the conductive film with the transparent substrate. That is, the calculation of the amount of silver is performed based only on the area of the contact portion of the conductive film and the transparent substrate. In other words, when the conductive film is patterned, the area of the transparent substrate surface that is not in contact with the conductive film (for example, the surface of the transparent substrate that is not in contact with the conductive film between the conductive films) is not considered in the above. The calculation per unit area of the conductive film. Therefore, the amount of silver contained in the unit area of the conductive film is the amount of silver contained per unit area (mm 2 ) indicating the contact portion of the conductive film and the transparent substrate.
導電膜之厚度並無特別限制,自將導電膜積層體應用於 觸控面板中之方面考慮,較佳的是0.05 μm~100 μm,更佳的是0.1 μm~20 μm,進一步更佳的是0.1 μm~10 μm。 The thickness of the conductive film is not particularly limited since the application of the conductive film laminate In terms of the touch panel, it is preferably 0.05 μm to 100 μm, more preferably 0.1 μm to 20 μm, still more preferably 0.1 μm to 10 μm.
於將導電膜適用為觸控面板之透明電極時,較佳的是於可見光區域中具有高的透明性,較佳的是總透光率為80%以上。 When the conductive film is applied to the transparent electrode of the touch panel, it is preferable to have high transparency in the visible light region, and it is preferable that the total light transmittance is 80% or more.
於導電膜為圖案形狀(導電性細線)之情形時,導電膜 之寬度並無特別限制,自將導電膜積層體應用於觸控面板中之方面考慮,較佳的是0.1 μm~100000 μm,更佳的是1 μm~20000 μm,進一步更佳的是1 μm~10000 μm,特佳的是10 μm~300 μm。 When the conductive film is in the shape of a pattern (conductive thin wire), the conductive film The width is not particularly limited. From the viewpoint of applying the conductive film laminate to the touch panel, it is preferably 0.1 μm to 100,000 μm, more preferably 1 μm to 20,000 μm, still more preferably 1 μm. ~10000 μm, particularly preferably 10 μm~300 μm.
於導電膜為圖案形狀(導電性細線)之情形時,導電膜間之間隔並無特別限制,自將導電膜積層體應用於觸控面板中之方面考慮,最狹窄之部位較佳的是0.1 μm~500 μm,更佳的是0.1 μm ~100 μm,自視認性之觀點考慮,特佳的是0.1 μm~20 μm。 When the conductive film is in the shape of a pattern (conductive thin wire), the interval between the conductive films is not particularly limited. From the viewpoint of applying the conductive film laminate to the touch panel, the narrowest portion is preferably 0.1. Mm~500 μm, more preferably 0.1 μm ~100 μm, especially from the viewpoint of visibility, particularly preferably 0.1 μm to 20 μm.
導電膜之形成方法並無特別限制,可列舉蒸鍍法、濺鍍 法等物理性成膜法、或化學氣相沈積(chemical vapor deposition,CVD)法等化學性氣相法、塗佈含有銀奈米粒子或銀奈米線之銀漿而形成之方法、日本專利特開2009-188360號中所揭示之利用銀鹽之方法等。 The method for forming the conductive film is not particularly limited, and examples thereof include vapor deposition and sputtering. Method for forming a silver film containing silver nanoparticles or silver nanowires by a chemical vapor deposition method such as a physical film formation method or a chemical vapor deposition (CVD) method, or a Japanese patent The method of using a silver salt disclosed in Japanese Laid-Open Patent Publication No. 2009-188360, and the like.
另外,於將導電膜適用為觸控面板等之透明電極時,較 佳的是導電膜含有包含銀或銀合金之金屬奈米線(以後亦簡稱為金屬奈米線)。藉由使用該金屬奈米線,可於低溫下形成導電膜,從而提供高透過率且低電阻之透明電極。 In addition, when the conductive film is applied to a transparent electrode such as a touch panel, Preferably, the conductive film contains a metal nanowire containing silver or a silver alloy (hereinafter also referred to as a metal nanowire). By using the metal nanowire, a conductive film can be formed at a low temperature to provide a transparent electrode having high transmittance and low resistance.
(金屬奈米線) (metal nanowire)
金屬奈米線包含銀或銀合金。銀合金之種類如上所述。 The metal nanowire contains silver or a silver alloy. The types of silver alloys are as described above.
所謂金屬奈米線是指具有導電性、且具有與直徑(短軸方向長度)相比而言長軸方向長度足夠長之形狀者。可為實心纖維,可為中空纖維。 The metal nanowire refers to a shape having conductivity and having a sufficiently long length in the long axis direction as compared with the diameter (length in the short axis direction). It can be a solid fiber and can be a hollow fiber.
於導電性優異之方面而言,金屬奈米線之材料特佳的是 銀、或銀與其他金屬之合金。 In terms of excellent electrical conductivity, the material of the metal nanowire is particularly good. Silver, or an alloy of silver with other metals.
作為與銀之合金中所使用之其他金屬,可列舉鉑、鋨、鈀、銥、錫、鉍、鎳等。這些可單獨使用1種,可併用2種以上。 Examples of other metals used in the alloy with silver include platinum, rhodium, palladium, iridium, tin, iridium, nickel, and the like. These can be used alone or in combination of two or more.
金屬奈米線之平均短軸長度(有時稱為「平均短軸徑」、「平均直徑」)較佳的是5 nm~50 nm,更佳的是5 nm~25 nm,進一步特佳的是5 nm~20 nm。 The average minor axis length of the metal nanowire (sometimes referred to as "average short axis diameter" and "average diameter") is preferably 5 nm to 50 nm, more preferably 5 nm to 25 nm, and further excellent. It is 5 nm to 20 nm.
若平均短軸長度不足5 nm,則存在耐氧化性惡化、耐久性變差之現象。另一方面,若平均短軸長度超過50 nm,則存在金屬奈米線之散射變大、導電膜之霧度值變大之現象。特別是藉由使平均短軸長度為25 nm以下,可減低金屬奈米線之散射,大幅地改良(減低)導電膜之霧度值。使用霧度小之導電膜的觸控面板可消除導電膜之圖案顯現(骨架顯現),提高觸控面板之視認性。 When the average minor axis length is less than 5 nm, the oxidation resistance is deteriorated and the durability is deteriorated. On the other hand, when the average minor axis length exceeds 50 nm, the scattering of the metal nanowire becomes large, and the haze value of the conductive film becomes large. In particular, by making the average minor axis length 25 nm or less, the scattering of the metal nanowire can be reduced, and the haze value of the conductive film can be greatly improved (reduced). The touch panel using the conductive film with small haze can eliminate the pattern appearance of the conductive film (skeletal appearance) and improve the visibility of the touch panel.
金屬奈米線之平均短軸長度可使用穿透式電子顯微鏡 (transmission electron microscope,TEM;日本電子股份有限公司製造、JEM-2000FX),對300個金屬奈米線進行觀察,根據其平均值求出金屬奈米線之平均短軸長度。另外,於金屬奈米線之短軸並非圓形之情形時的短軸長度,將最長者作為短軸長度。 The average short axis length of the metal nanowire can be transmitted using a transmission electron microscope (Transmission electron microscope, TEM; manufactured by JEOL Ltd., JEM-2000FX), 300 metal nanowires were observed, and the average minor axis length of the metal nanowires was determined from the average value. Further, in the case where the short axis of the metal nanowire is not circular, the short axis length is the longest one.
金屬奈米線之平均長軸長度(有時稱為「平均長度」) 較佳的是5 μm以上,更佳的是5 μm~40 μm,進一步更佳的是5 μm~30 μm。 Average long axis length of metal nanowires (sometimes referred to as "average length") It is preferably 5 μm or more, more preferably 5 μm to 40 μm, still more preferably 5 μm to 30 μm.
若平均長軸長度不足5 μm,則存在難以形成緻密的網狀物,無法獲得充分之導電性之現象;若超過40 μm,則存在金屬奈米線過長而於製造時纏繞,於製造過程中生成凝聚物之現象。 If the average major axis length is less than 5 μm, it is difficult to form a dense network, and sufficient conductivity cannot be obtained. If it exceeds 40 μm, the metal nanowire is too long to be entangled during manufacturing. The phenomenon of condensate formation.
金屬奈米線之平均長軸長度例如可使用穿透式電子顯微鏡(transmission electron microscope,TEM;日本電子股份有限公司製造、JEM-2000FX),對300個金屬奈米線進行觀察,根據其平均值求出金屬奈米線之平均長軸長度。另外,於金屬奈米線彎曲之情形時,考慮以其為弧之圓,將根據其半徑、及曲率而算出之 值作為長軸長度。 For the average long axis length of the metal nanowire, for example, a transmission electron microscope (TEM; manufactured by JEOL Ltd., JEM-2000FX) can be used to observe 300 metal nanowires, based on the average value thereof. Find the average long axis length of the metal nanowire. In addition, when the metal nanowire is bent, consider the circle which is the arc, and calculate it according to its radius and curvature. The value is taken as the length of the long axis.
金屬奈米線之製造方法並無特別限制,可藉由任意之方 法而製作,較佳的是藉由於溶解有鹵素化合物與分散劑之溶劑中將金屬離子還原而製造。而且,自分散性、導電膜之經時穩定性之觀點考慮,較佳的是於形成金屬奈米線後,藉由常法進行除鹽處理。 The manufacturing method of the metal nanowire is not particularly limited, and may be by any means. The method is preferably produced by reducing a metal ion in a solvent in which a halogen compound and a dispersing agent are dissolved. Further, from the viewpoint of self-dispersibility and temporal stability of the conductive film, it is preferred to carry out desalting treatment by a usual method after forming a metal nanowire.
而且,金屬奈米線之製造方法可使用日本專利特開2009-215594號公報、日本專利特開2009-242880號公報、日本專利特開2009-299162號公報、日本專利特開2010-84173號公報、日本專利特開2010-86714號公報、日本專利特表2009-505358號公報等中所記載之方法。 In addition, Japanese Laid-Open Patent Publication No. 2009-215594, Japanese Patent Laid-Open No. 2009-242880, Japanese Patent Laid-Open No. 2009-299162, and Japanese Patent Laid-Open No. 2010-84173 The method described in Japanese Laid-Open Patent Publication No. 2010-86714, and the Japanese Patent Publication No. 2009-505358.
作為金屬奈米線之縱橫比,可視需要而適宜選擇,若為 10以上則並無特別限制,更佳的是50以上,進一步更佳的是100以上,進一步更佳的是5000以上,特佳的是10,000~100,000。所謂縱橫比,一般情況下是表示纖維狀物質之長邊與短邊之比(平均長軸長度/平均短軸長度之比)。 As the aspect ratio of the metal nanowire, it can be selected as needed, if 10 or more is not particularly limited, and more preferably 50 or more, still more preferably 100 or more, still more preferably 5,000 or more, and particularly preferably 10,000 to 100,000. The aspect ratio generally indicates the ratio of the long side to the short side of the fibrous material (the ratio of the average major axis length to the average minor axis length).
縱橫比之測定方法並無特別限制,可視需要而適宜選擇,例如可列舉藉由電子顯微鏡等進行測定之方法等。 The method for measuring the aspect ratio is not particularly limited, and may be appropriately selected as necessary, and examples thereof include a method of measuring by an electron microscope or the like.
於藉由電子顯微鏡測定金屬奈米線之縱橫比之情形時,可於電子顯微鏡之1視野內進行確認即可。而且,可藉由逐一分別測定金屬奈米線之平均長軸長度與平均短軸長度而估計金屬奈米線整體之縱橫比。 When the aspect ratio of the metal nanowire is measured by an electron microscope, it can be confirmed in the field of view of the electron microscope. Moreover, the aspect ratio of the entire metal nanowire can be estimated by measuring the average major axis length and the average minor axis length of the metal nanowires one by one.
另外,於金屬奈米線為管狀之情形時,作為用以算出縱橫比之直徑,使用該管之外徑。 Further, when the metal nanowire is tubular, the outer diameter of the tube is used as the diameter for calculating the aspect ratio.
(含有包含銀或銀合金之金屬奈米線的導電膜) (Conductive film containing a metal nanowire containing silver or a silver alloy)
含有包含銀或銀合金之金屬奈米線的導電膜之形成方法並無特別限制,較佳的是與上述金屬奈米線一同使用至少含有以下之組成物作為基質成分:(1)至少含有黏合劑及光聚合性組成物之感光性組成物、(2)溶膠-凝膠硬化物、或(3)至少含有高分子之組成物。 The method for forming the conductive film containing the metal nanowire containing silver or a silver alloy is not particularly limited, and it is preferred to use at least the following composition as a matrix component together with the above metal nanowire: (1) at least a binder A photosensitive composition of the agent and the photopolymerizable composition, (2) a sol-gel cured product, or (3) a composition containing at least a polymer.
另外,基質成分(導電膜中所含之除金屬奈米線及溶劑以外之所有成分)之質量與金屬奈米線之質量的質量比較佳的是0.5~15(更佳的是1.0~12、特佳的是2.0~10)。若質量比不足0.5,則存在黏合劑成分少,金屬奈米線對基板表面之密接性弱、膜強度變弱之情形;若質量比超過15,則存在導電膜之表面電阻值上升之現象。 In addition, the mass of the matrix component (all components other than the metal nanowire and the solvent contained in the conductive film) and the quality of the metal nanowire are preferably 0.5 to 15 (more preferably 1.0 to 12, Particularly good is 2.0~10). When the mass ratio is less than 0.5, the binder component is small, the adhesion of the metal nanowire to the substrate surface is weak, and the film strength is weak. When the mass ratio exceeds 15, the surface resistance value of the conductive film increases.
以下對用作基質成分之材料加以詳述。 The materials used as the matrix component are detailed below.
(黏合劑) (adhesive)
黏合劑可自作為線狀有機高分子聚合物的於分子(較佳的是以丙烯酸系共聚物、苯乙烯系共聚物為主鏈之分子)中具有至少1個促進鹼可溶性之基(例如羧基、磷酸基、磺酸基等)的鹼可溶性樹脂中適宜選擇。 The binder may have at least one base which promotes alkali solubility (for example, a carboxyl group) in a molecule (preferably an acrylic copolymer or a styrene copolymer-based molecule) as a linear organic high molecular polymer. An alkali-soluble resin such as a phosphoric acid group or a sulfonic acid group is suitably selected.
這些中較佳的是可溶於有機溶劑中且可溶於鹼性水溶液中之黏合劑,而且特佳的是具有酸解離性基、且酸解離性基由於酸之 作用而解離時變得可溶於鹼中之黏合劑。 Preferred among these are those which are soluble in an organic solvent and are soluble in an aqueous alkaline solution, and particularly preferably have an acid dissociable group and an acid dissociable group due to an acid A binder that becomes soluble in alkali when dissociated.
此處,所謂酸解離性基是表示可於酸之存在下而解離之官能基。 Here, the acid dissociable group means a functional group which can be dissociated in the presence of an acid.
於黏合劑之製造中,例如可適用利用公知之自由基聚合 法之方法。藉由自由基聚合法製造鹼可溶性樹脂時之溫度、壓力、自由基起始劑之種類及其量、溶劑之種類等聚合條件可由本領域之技術人員所容易地設定,可實驗性地決定條件。 In the manufacture of a binder, for example, a known radical polymerization can be suitably used. Method of law. The polymerization conditions such as the temperature, the pressure, the kind and amount of the radical initiator, and the kind of the solvent when the alkali-soluble resin is produced by the radical polymerization method can be easily set by those skilled in the art, and the conditions can be experimentally determined. .
線狀有機高分子聚合物較佳的是於側鏈具有羧酸之聚 合物。 The linear organic high molecular polymer preferably has a carboxylic acid group in a side chain. Compound.
作為於側鏈具有羧酸之聚合物,例如存在有如日本專利特開昭59-44615號、日本專利特公昭54-34327號、日本專利特公昭58-12577號、日本專利特公昭54-25957號、日本專利特開昭59-53836號、日本專利特開昭59-71048號之各公報中所記載之甲基丙烯酸共聚物、丙烯酸共聚物、伊康酸共聚物、巴豆酸共聚物、馬來酸共聚物、部分酯化馬來酸共聚物、於側鏈具有羧酸之酸性纖維素衍生物、於具有羥基之聚合物上加成酸酐而成者等,可進一步列舉於側鏈具有(甲基)丙烯醯基之高分子聚合物作為較佳者。 As a polymer having a carboxylic acid in a side chain, there are, for example, Japanese Patent Laid-Open No. 59-44615, Japanese Patent Publication No. Sho 54-34327, Japanese Patent Publication No. Sho 58-12577, Japanese Patent Publication No. Sho 54-25957 A methacrylic acid copolymer, an acrylic copolymer, an itaconic acid copolymer, a crotonic acid copolymer, and a Malay described in each of Japanese Patent Laid-Open Publication No. SHO 59-53836 An acid copolymer, a partially esterified maleic acid copolymer, an acid cellulose derivative having a carboxylic acid in a side chain, or an acid anhydride added to a polymer having a hydroxyl group, and the like may further be exemplified in the side chain (A) A polymer based on acrylonitrile is preferred.
這些中特佳的是(甲基)丙烯酸苄基酯/(甲基)丙烯酸共聚 物、包含(甲基)丙烯酸苄基酯/(甲基)丙烯酸/其他單體之多元共聚物。 Particularly preferred among these are benzyl (meth)acrylate/(meth)acrylic acid copolymerization. A multicomponent copolymer comprising benzyl (meth)acrylate/(meth)acrylic acid/other monomer.
可進一步列舉於側鏈具有(甲基)丙烯醯基之高分子聚合物或包含(甲基)丙烯酸/(甲基)丙烯酸縮水甘油酯/其他單體之多元共聚 物作為有用之聚合物。該聚合物可以任意量加以混合而使用。 Further, it may be further exemplified by a high molecular polymer having a (meth) acrylonitrile group in a side chain or a multicomponent copolymer containing (meth)acrylic acid/glycidyl (meth)acrylate/other monomer. As a useful polymer. The polymer can be used in any amount by mixing.
除上述以外,線狀有機高分子聚合物可列舉日本專利特 開平7-140654號公報中所記載之(甲基)丙烯酸-2-羥基丙酯/聚苯乙烯大分子單體/甲基丙烯酸苄酯/甲基丙烯酸共聚物、丙烯酸2-羥基-3-苯氧基丙酯/聚甲基丙烯酸甲酯大分子單體/甲基丙烯酸苄酯/甲基丙烯酸共聚物、甲基丙烯酸-2-羥基乙酯/聚苯乙烯大分子單體/甲基丙烯酸甲酯/甲基丙烯酸共聚物、甲基丙烯酸-2-羥基乙酯/聚苯乙烯大分子單體/甲基丙烯酸苄酯/甲基丙烯酸共聚物等。 In addition to the above, the linear organic high molecular polymer can be exemplified by Japanese patents. 2-hydroxypropyl (meth)acrylate/polystyrene macromonomer/benzyl methacrylate/methacrylic acid copolymer, 2-hydroxy-3-benzene acrylate described in Kaiping No. 7-140654 Oxypropyl propyl ester / polymethyl methacrylate macromer / benzyl methacrylate / methacrylic acid copolymer, 2-hydroxyethyl methacrylate / polystyrene macromonomer / methacrylic acid Ester/methacrylic acid copolymer, 2-hydroxyethyl methacrylate/polystyrene macromonomer/benzyl methacrylate/methacrylic acid copolymer, and the like.
鹼可溶性樹脂中之具體的結構單元適宜的是(甲基)丙烯 酸、及可與該(甲基)丙烯酸共聚之其他單體。 The specific structural unit in the alkali-soluble resin is suitably (meth) propylene. An acid, and other monomers copolymerizable with the (meth)acrylic acid.
可與(甲基)丙烯酸共聚之其他單體例如可列舉(甲基)丙 烯酸烷基酯、(甲基)丙烯酸芳基酯、乙烯系化合物等。這些化合物之烷基及芳基之氫原子可被取代基取代。 Other monomers copolymerizable with (meth)acrylic acid may, for example, be (meth) propyl An alkyl olefinate, an aryl (meth) acrylate, a vinyl compound, or the like. The alkyl and aryl hydrogen atoms of these compounds may be substituted by a substituent.
(甲基)丙烯酸烷基酯或(甲基)丙烯酸芳基酯例如可列舉(甲基)丙烯酸甲酯、(甲基)丙烯酸乙酯、(甲基)丙烯酸丙酯、(甲基)丙烯酸丁酯、(甲基)丙烯酸異丁酯、(甲基)丙烯酸戊酯、(甲基)丙烯酸己酯、(甲基)丙烯酸辛酯、(甲基)丙烯酸苯酯、(甲基)丙烯酸苄基酯、(甲基)丙烯酸甲苯基酯、(甲基)丙烯酸萘酯、(甲基)丙烯酸環己酯、(甲基)丙烯酸二環戊基酯、(甲基)丙烯酸二環戊烯基酯、(甲基)丙烯酸二環戊烯基氧基乙酯、甲基丙烯酸縮水甘油酯、甲基丙烯酸四氫糠基酯、聚甲基丙烯酸甲酯大分子單體等。這些化合物可單獨使用1種,可併用2種以上。 Examples of the alkyl (meth)acrylate or the aryl (meth)acrylate include methyl (meth)acrylate, ethyl (meth)acrylate, propyl (meth)acrylate, and butyl (meth)acrylate. Ester, isobutyl (meth)acrylate, amyl (meth)acrylate, hexyl (meth)acrylate, octyl (meth)acrylate, phenyl (meth)acrylate, benzyl (meth)acrylate Ester, tolyl (meth)acrylate, naphthyl (meth)acrylate, cyclohexyl (meth)acrylate, dicyclopentyl (meth)acrylate, dicyclopentenyl (meth)acrylate And dicyclopentenyloxyethyl (meth)acrylate, glycidyl methacrylate, tetrahydrofurfuryl methacrylate, polymethyl methacrylate macromonomer, and the like. These compounds may be used alone or in combination of two or more.
乙烯系化合物例如可列舉苯乙烯、α-甲基苯乙烯、乙烯 基甲苯、丙烯腈、乙酸乙烯酯、N-乙烯基吡咯啶酮、聚苯乙烯大分子單體、CH2=CR8R9[其中,R8表示氫原子或碳數為1~5之烷基,R9表示碳數為6~10之芳香族烴環]等。這些化合物可單獨使用1種,可併用2種以上。 Examples of the vinyl compound include styrene, α-methylstyrene, vinyltoluene, acrylonitrile, vinyl acetate, N-vinylpyrrolidone, polystyrene macromonomer, and CH 2 =CR 8 R 9 . [wherein R 8 represents a hydrogen atom or an alkyl group having 1 to 5 carbon atoms, and R 9 represents an aromatic hydrocarbon ring having 6 to 10 carbon atoms]. These compounds may be used alone or in combination of two or more.
自鹼溶解速度、膜物性等之方面而言,黏合劑之重量平 均分子量較佳的是1,000~500,000,更佳的是3,000~300,000,進一步更佳的是5,000~200,000。 The weight of the adhesive is flat in terms of alkali dissolution rate, film properties, and the like. The average molecular weight is preferably from 1,000 to 500,000, more preferably from 3,000 to 300,000, still more preferably from 5,000 to 200,000.
此處,重量平均分子量可藉由凝膠滲透色譜法而測定,使用標準聚苯乙烯校準曲線而求出。 Here, the weight average molecular weight can be measured by gel permeation chromatography and determined using a standard polystyrene calibration curve.
作為黏合劑之含量,以包含前述金屬奈米線之光聚合性 組成物的固形物之總質量為基準而言,較佳的是5質量%~90質量%,更佳的是10質量%~85質量%,進一步更佳的是20質量%~80質量%。若為上述範圍,則可兼顧顯影性與金屬奈米線之導電性。 As the content of the binder, photopolymerization including the aforementioned metal nanowire The total mass of the solid matter of the composition is preferably 5% by mass to 90% by mass, more preferably 10% by mass to 85% by mass, still more preferably 20% by mass to 80% by mass based on the total mass. When it is in the above range, both the developability and the conductivity of the metal nanowire can be considered.
(光聚合性組成物) (Photopolymerizable composition)
光聚合性組成物表示賦予導電膜藉由曝光而形成影像之功能、或者提供其起點之組成物。包含(a)加成聚合性不飽和化合物、與(b)若照射光則產生自由基之光聚合起始劑作為基本成分。 The photopolymerizable composition represents a function of imparting an image by exposure of a conductive film or providing a starting point. A photopolymerization initiator containing (a) an addition polymerizable unsaturated compound and (b) a radical generated by irradiation with light is contained as a basic component.
(a)加成聚合性不飽和化合物 (a) Addition of polymerizable unsaturated compounds
成分(a)之加成聚合性不飽和化合物(以下亦稱為「聚合性化合物」)是於自由基之存在下產生加成聚合反應而高分子化之化 合物,通常使用於分子末端具有至少一個、更佳的是二個以上、進一步更佳的是四個以上、進一步更佳的是六個以上乙烯性不飽和雙鍵之化合物。 The addition polymerizable unsaturated compound (hereinafter also referred to as "polymerizable compound") of the component (a) is an addition polymerization reaction in the presence of a radical, and is polymerized. The compound is usually used for a compound having at least one, more preferably two or more, still more preferably four or more, and still more preferably six or more ethylenically unsaturated double bonds at the molecular terminal.
這些化合物具有例如單體、預聚物亦即二聚物、三聚物或寡聚物、或這些之混合物等化學形態。 These compounds have chemical forms such as monomers, prepolymers, i.e., dimers, trimers or oligomers, or mixtures of these.
此種聚合性化合物已知有各種化合物,這些化合物可用作成分(a)。 Such a polymerizable compound is known as various compounds which can be used as the component (a).
其中,作為特佳之聚合性化合物,自膜強度之觀點考慮,特佳的是三羥甲基丙烷三(甲基)丙烯酸酯、季戊四醇四(甲基)丙烯酸酯、二季戊四醇六(甲基)丙烯酸酯、二季戊四醇五(甲基)丙烯酸酯。 Among them, as a particularly preferred polymerizable compound, trimethylolpropane tri(meth)acrylate, pentaerythritol tetra(meth)acrylate, dipentaerythritol hexa(meth)acrylic acid are particularly preferable from the viewpoint of film strength. Ester, dipentaerythritol penta (meth) acrylate.
作為成分(a)之含量,以包含前述金屬奈米線之光聚 合性組成物之固形物之總質量為基準而言,較佳的是2.6質量%~37.5質量%,更佳的是5.0質量%~20.0質量%。 As the content of the component (a), the light is contained in the above-mentioned metal nanowire The total mass of the solid matter of the conjugate composition is preferably from 2.6 mass% to 37.5% by mass, more preferably from 5.0 mass% to 20.0 mass%.
(b)光聚合起始劑 (b) Photopolymerization initiator
成分(b)之光聚合起始劑是若照射光則產生自由基之化合物。此種光聚合起始劑可列舉藉由光照射而產生最終成為酸之酸自由基之化合物、或產生其他自由基之化合物等。以下將前者稱為「光酸產生劑」,將後者稱為「光自由基產生劑」。 The photopolymerization initiator of the component (b) is a compound which generates a radical when irradiated with light. Examples of such a photopolymerization initiator include a compound which generates an acid radical which eventually becomes an acid by light irradiation, a compound which generates another radical, and the like. Hereinafter, the former is referred to as "photoacid generator", and the latter is referred to as "photoradical generator".
-光酸產生劑- - Photoacid generator -
光酸產生劑可適宜選擇而使用如下之化合物:光陽離子聚合之光起始劑、光自由基聚合之光起始劑、色素類之光消色劑、光變色劑、或微抗蝕劑等中所使用之藉由照射光化射線或放射線而 產生酸自由基之公知之化合物及這些之混合物。 The photoacid generator can be suitably selected and used as a photoinitiator photoinitiator, a photoradical polymerization photoinitiator, a dye photochromic agent, a photochromic agent, or a micro resist. Used by irradiating actinic rays or radiation Known compounds which produce acid free radicals and mixtures thereof.
此種光酸產生劑並無特別限制,可視需要而適宜選擇, 例如可列舉具有至少一個二鹵甲基或三鹵甲基之三嗪、1,3,4-噁二唑、萘醌-1,2-二疊氮基-4-磺醯基鹵化物、重氮鹽、鏻鹽、鋶鹽、錪鹽、醯亞胺磺酸鹽、肟磺酸酯、重氮二碸、二碸、鄰硝基苯甲磺酸酯等。這些中特佳的是作為產生磺酸之化合物的醯亞胺磺酸鹽、肟磺酸酯、鄰硝基苯甲磺酸酯。 The photoacid generator is not particularly limited and may be appropriately selected as needed. For example, triazine having at least one dihalomethyl group or trihalomethyl group, 1,3,4-oxadiazole, naphthoquinone-1,2-diazido-4-sulfonyl halide, heavy Nitrogen salts, cerium salts, cerium salts, cerium salts, sulfhydrazine sulfonates, sulfonium sulfonates, diazo dihydrazide, diterpene, o-nitrobenzoyl sulfonate, and the like. Particularly preferred among these are sulfimine sulfonate, oxime sulfonate, o-nitrobenzoyl sulfonate which are compounds which produce sulfonic acid.
而且,將藉由照射光化射線或放射線而產生酸自由基之基或化合物導入至樹脂之主鏈或側鏈而成的化合物例如可使用美國專利第3,849,137號說明書、德國專利第3914407號說明書、日本專利特開昭63-26653號、日本專利特開昭55-164824號、日本專利特開昭62-69263號、日本專利特開昭63-146038號、日本專利特開昭63-163452號、日本專利特開昭62-153853號、日本專利特開昭63-146029號之各公報等中所記載之化合物。 Further, a compound in which a radical or a compound which generates an acid radical by irradiation with actinic rays or radiation is introduced into a main chain or a side chain of a resin, for example, a specification of U.S. Patent No. 3,849,137 and a specification of German Patent No. 3914407 can be used. Japanese Patent Laid-Open No. 63-26653, Japanese Patent Laid-Open No. Sho 55-164824, Japanese Patent Laid-Open No. Sho 62-69263, Japanese Patent Laid-Open No. Sho 63-146038, Japanese Patent Laid-Open No. 63-163452, A compound described in each of JP-A-62-153853, JP-A-63-146029, and the like.
另外,美國專利第3,779,778號、歐洲專利第126,712號等之各說明書中所記載之化合物可用作酸自由基產生劑。 Further, the compounds described in the respective specifications of U.S. Patent No. 3,779,778 and European Patent No. 126,712 can be used as an acid radical generating agent.
上述三嗪系化合物例如可使用日本專利特開 2011-018636號公報、日本專利特開2011-254046號公報中所記載之化合物。 The above triazine-based compound can be, for example, a Japanese patent A compound described in Japanese Patent Laid-Open Publication No. 2011-254046.
於本發明中,光酸產生劑中較佳的是產生磺酸之化合 物,自高感度之觀點考慮,特佳的是如下所示之肟磺酸酯化合物。 In the present invention, it is preferred to produce a sulfonic acid compound in the photoacid generator. The oxime sulfonate compound shown below is particularly preferable from the viewpoint of high sensitivity.
[化12]
作為光酸產生劑,若使用具有1,2-二疊氮萘醌基之化合 物,則感度高且顯影性良好。 As a photoacid generator, if a compound having 1,2-diazide naphthoquinone group is used The object has high sensitivity and good developability.
自高感度之觀點考慮,光酸產生劑中較佳的是下述之化合物中D獨立為氫原子或1,2-二疊氮萘醌基者。 From the viewpoint of high sensitivity, among the photoacid generators, those in which D is independently a hydrogen atom or a 1,2-diazepinenaphthyl group are preferable.
[化13]
-光自由基產生劑- -Photoradical generator -
光自由基產生劑是具有直接吸收光或發生光增感而產生分解反應或奪氫反應(hydrogen abstraction reaction),從而產生自由基之功能的化合物。光自由基產生劑較佳的是於波長為300 nm~500 nm之區域具有吸收的化合物。 The photoradical generator is a compound having a function of directly absorbing light or generating photo-sensitization to generate a decomposition reaction or a hydrogen abstraction reaction to generate a radical. The photoradical generator is preferably a compound having absorption at a wavelength of from 300 nm to 500 nm.
此種光自由基產生劑已知有多種化合物,例如可列舉如日本專利特開2008-268884號公報中所記載之三嗪系化合物、羰基化合物、縮酮化合物、安息香化合物、吖啶化合物、有機過氧化化合物、偶氮化合物、香豆素化合物、疊氮化物、茂金屬化合物、六芳基二咪唑化合物、有機硼酸化合物、二磺酸化合物、肟酯化合物、醯基膦(氧化物)化合物。這些化合物可視需要而適宜選擇。自曝光感度之觀點考慮,這些化合物中特佳的是二苯甲酮化合物、苯乙酮化合物、六芳基二咪唑化合物、肟酯化合物、或醯基膦(氧化物)化合物。 A plurality of compounds are known, and examples thereof include a triazine compound, a carbonyl compound, a ketal compound, a benzoin compound, an acridine compound, and an organic compound described in JP-A-2008-268884. A peroxidic compound, an azo compound, a coumarin compound, an azide, a metallocene compound, a hexaaryldiimidazole compound, an organoboronic acid compound, a disulfonic acid compound, an oxime ester compound, a mercaptophosphine (oxide) compound. These compounds can be suitably selected as needed. Particularly preferred among these compounds are a benzophenone compound, an acetophenone compound, a hexaaryldiimidazole compound, an oxime ester compound, or a mercaptophosphine (oxide) compound from the viewpoint of exposure sensitivity.
光自由基產生劑例如可使用日本專利特開2011-018636 號公報、日本專利特開2011-254046號公報中所記載之光自由基產生劑。 The photoradical generator can be, for example, Japanese Patent Laid-Open No. 2011-018636 The photoradical generator described in Japanese Laid-Open Patent Publication No. 2011-254046.
光聚合起始劑可單獨使用1種,可併用2種以上,其含 量以包含金屬奈米線之光聚合性組成物之固形物之總質量為基準而言較佳的是0.1質量%~50質量%,更佳的是0.5質量%~30質量%,進一步更佳的是1質量%~20質量%。於此種數值範圍中,可於導電膜上形成包含後述之導電性區域與非導電性區域之圖案之情形時,獲得良好之感度與圖案形成性。 The photopolymerization initiator may be used alone or in combination of two or more. The amount is preferably from 0.1% by mass to 50% by mass, more preferably from 0.5% by mass to 30% by mass, based on the total mass of the solid matter of the photopolymerizable composition containing the metal nanowire, and further preferably It is 1% by mass to 20% by mass. In such a numerical range, when a pattern including a conductive region and a non-conductive region to be described later is formed on the conductive film, good sensitivity and pattern formation property are obtained.
上述成分以外之其他添加劑例如可列舉鏈轉移劑、交聯 劑、分散劑、溶劑、界面活性劑、抗氧化劑、硫化抑制劑、金屬腐蝕抑制劑、黏度調整劑、防腐劑等各種添加劑等。 Other additives other than the above components may, for example, be a chain transfer agent, cross-linking Various additives such as agents, dispersants, solvents, surfactants, antioxidants, vulcanization inhibitors, metal corrosion inhibitors, viscosity modifiers, preservatives, etc.
(鏈轉移劑) (chain transfer agent)
鏈轉移劑是用以提高光聚合性組成物之曝光感度者。此種鏈轉移劑例如可列舉N,N-二甲基胺基苯甲酸乙酯等N,N-二烷基胺基苯甲酸烷基酯、2-巰基苯并噻唑、2-巰基苯并噁唑、2-巰基苯并咪唑、N-苯基巰基苯并咪唑、1,3,5-三(3-巰基丁氧基乙基)-1,3,5-三嗪-2,4,6(1H,3H,5H)-三酮等具有雜環之巰基化合物、季戊四醇四(3-巰基丙酸酯)、季戊四醇四(3-巰基丁酸酯)、1,4-雙(3-巰基丁醯氧基)丁烷等脂肪族多官能巰基化合物等。這些化合物可單獨使用1種,可併用2種以上。 The chain transfer agent is used to increase the exposure sensitivity of the photopolymerizable composition. Examples of such a chain transfer agent include N,N-dialkylaminobenzoic acid alkyl esters such as N,N-dimethylaminobenzoic acid ethyl ester, 2-mercaptobenzothiazole, and 2-mercaptobenzoxime. Oxazole, 2-mercaptobenzimidazole, N-phenylmercaptobenzimidazole, 1,3,5-tris(3-mercaptobutoxyethyl)-1,3,5-triazine-2,4,6 a mercapto compound having a heterocyclic ring such as (1H, 3H, 5H)-trione, pentaerythritol tetrakis(3-mercaptopropionate), pentaerythritol tetrakis(3-mercaptobutyrate), 1,4-bis(3-mercaptobutyrate) An aliphatic polyfunctional thiol compound such as decyloxy)butane or the like. These compounds may be used alone or in combination of two or more.
鏈轉移劑之含量以包含前述金屬奈米線之光聚合性組 成物的固形物之總質量為基準而言,較佳的是0.01質量%~15質量%,更佳的是0.1質量%~10質量%,進一步更佳的是0.5質量%~5質量%。 The content of the chain transfer agent is a photopolymerizable group containing the aforementioned metal nanowire The total mass of the solid matter of the product is preferably from 0.01% by mass to 15% by mass, more preferably from 0.1% by mass to 10% by mass, even more preferably from 0.5% by mass to 5% by mass.
(交聯劑) (crosslinking agent)
交聯劑是藉由自由基、酸、或熱而形成化學鍵,使導電膜硬化之化合物,例如可列舉經選自羥甲基、烷氧基甲基、醯氧基甲基之至少1個基取代的三聚氰胺系化合物、胍胺系化合物、甘脲系化合物、脲系化合物、酚系化合物或酚之醚化合物、環氧系化合物、環氧丙烷系化合物、硫環氧系化合物、異氰酸酯系化合物、疊氮系化合物、具有包含甲基丙烯醯基或丙烯醯基等之乙烯性不飽和基的化合物等。於膜物性、耐熱性、耐溶劑性之方面而言,這些中特佳的是環氧系化合物、環氧丙烷系化合物、具有乙烯性不飽和基之化合物。 The crosslinking agent is a compound which forms a chemical bond by a radical, an acid, or a heat to harden the conductive film, and examples thereof include at least one selected from the group consisting of a methylol group, an alkoxymethyl group, and a decyloxymethyl group. a substituted melamine compound, a guanamine compound, a glycoluril compound, a urea compound, a phenol compound or a phenol ether compound, an epoxy compound, a propylene oxide compound, a sulfur epoxy compound, an isocyanate compound, An azide-based compound or a compound having an ethylenically unsaturated group such as a methacryl oxime group or an acryl fluorenyl group. Among these, epoxy compounds, propylene oxide compounds, and compounds having an ethylenically unsaturated group are particularly preferable in terms of film properties, heat resistance, and solvent resistance.
而且,環氧丙烷樹脂可單獨使用1種或與環氧樹脂混合使用。 特別是於與環氧樹脂併用而使用之情形時,於反應性高、使膜物性提高之觀點而言較佳。 Further, the propylene oxide resin may be used singly or in combination with an epoxy resin. In particular, when it is used in combination with an epoxy resin, it is preferable from the viewpoint of high reactivity and improvement in film physical properties.
另外,於使用具有乙烯性不飽和雙鍵基之化合物作為交聯劑之情形時,該交聯劑亦包含於聚合性化合物中,其含量應考慮包含於本發明之聚合性化合物之含量中。 Further, in the case where a compound having an ethylenically unsaturated double bond group is used as the crosslinking agent, the crosslinking agent is also contained in the polymerizable compound, and the content thereof is considered to be contained in the content of the polymerizable compound of the present invention.
作為交聯劑之含量,於將包含前述金屬奈米線之光聚合性組成物之固形物之總質量設為100質量份時,較佳的是1質量份~250質量份,更佳的是3質量份~200質量份。 When the total mass of the solid matter containing the photopolymerizable composition of the metal nanowire is 100 parts by mass, the content of the crosslinking agent is preferably from 1 part by mass to 250 parts by mass, more preferably 3 parts by mass to 200 parts by mass.
(分散劑) (Dispersant)
分散劑用以防止光聚合性組成物中之前述金屬奈米線凝聚並使其分散。分散劑若可使金屬奈米線分散而並無特別限制,可視需要而適宜選択。例如,顏料分散劑可利用市售之分散劑,特佳的是具有吸附於金屬奈米線上之性質的高分子分散劑。此種高分子分散劑例如可列舉聚乙烯吡咯啶酮、BYK系列(畢克化學(BYK Chemie)公司製造)、Solsperse系列(日本路博潤(Lubrizol)公司製造等)、Ajisper系列(味之素股份有限公司製造)等。 The dispersing agent serves to prevent the aforementioned metal nanowires in the photopolymerizable composition from agglomerating and dispersing. The dispersing agent is not particularly limited as long as it can disperse the metal nanowire, and may be appropriately selected as needed. For example, a commercially available dispersant can be used as the pigment dispersant, and a polymer dispersant having a property of adsorbing on a metal nanowire is particularly preferable. Examples of such a polymer dispersant include polyvinylpyrrolidone, BYK series (manufactured by BYK Chemie Co., Ltd.), Solsperse series (manufactured by Lubrizol Co., Ltd.), and Ajisper series (Ajinomoto). Manufacturing company, etc.).
另外,於除了金屬奈米線之製造中所使用者以外進一步另外添加作為分散劑之高分子分散劑之情形時,該高分子分散劑亦包含於黏合劑中,其含量應考慮包含於前述黏合劑之含量中。 Further, in the case where a polymer dispersant as a dispersing agent is further added in addition to the user in the production of the metal nanowire, the polymer dispersing agent is also contained in the binder, and the content thereof should be considered to be included in the aforementioned bonding. In the content of the agent.
作為分散劑之含量,相對於黏合劑100質量份而言較佳的是0.1質量份~50質量份,更佳的是0.5質量份~40質量份,特佳的 是1質量份~30質量份。 The content of the dispersant is preferably from 0.1 part by mass to 50 parts by mass, more preferably from 0.5 part by mass to 40 parts by mass, based on 100 parts by mass of the binder. It is 1 part by mass to 30 parts by mass.
藉由使分散劑之含量為0.1質量份以上,可有效地抑制分散液中之金屬奈米線之凝聚,藉由使分散劑之含量為50質量份以下,可於塗佈步驟中形成穩定之液膜,抑制塗佈不均之產生,因此較佳。 When the content of the dispersant is 0.1 part by mass or more, aggregation of the metal nanowires in the dispersion can be effectively suppressed, and by setting the content of the dispersant to 50 parts by mass or less, stable formation can be achieved in the coating step. The liquid film is preferred because it suppresses the occurrence of coating unevenness.
(溶劑) (solvent)
溶劑是用以將包含前述金屬奈米線與光聚合性組成物之組成物製成用以於基材表面形成為膜狀之塗佈液的成分,可視需要而適宜選擇。例如可列舉丙二醇單甲醚、丙二醇單甲醚乙酸酯、3-乙氧基丙酸乙酯、3-甲氧基丙酸甲酯、乳酸乙酯、3-甲氧基丁醇、水、1-甲氧基-2-丙醇、乙酸異丙酯、乳酸甲酯、N-甲基吡咯啶酮(NMP)、γ-丁內酯(GBL)、碳酸丙二酯等。該溶劑可兼作前述金屬奈米線之分散液之溶劑的至少一部分。這些溶劑可單獨使用1種,可併用2種以上。 The solvent is a component for forming a coating liquid containing the composition of the metal nanowire and the photopolymerizable composition to form a film on the surface of the substrate, and may be appropriately selected as needed. For example, propylene glycol monomethyl ether, propylene glycol monomethyl ether acetate, ethyl 3-ethoxypropionate, methyl 3-methoxypropionate, ethyl lactate, 3-methoxybutanol, water, 1-methoxy-2-propanol, isopropyl acetate, methyl lactate, N-methylpyrrolidone (NMP), γ-butyrolactone (GBL), propylene carbonate, and the like. The solvent may also serve as at least a part of the solvent of the dispersion of the aforementioned metal nanowire. These solvents may be used alone or in combination of two or more.
作為包含此種溶劑之塗佈液之固形物濃度,較佳的是以0.1質量%~20質量%之範圍而含有。 The solid content concentration of the coating liquid containing such a solvent is preferably contained in the range of 0.1% by mass to 20% by mass.
(金屬腐蝕抑制劑) (metal corrosion inhibitor)
較佳的是預先含有金屬奈米線之金屬腐蝕抑制劑。此種金屬腐蝕抑制劑並無特別限制,可視需要而適宜選擇,例如適宜的是硫醇類、唑類等。 Preferred are metal corrosion inhibitors which previously contain a metal nanowire. The metal corrosion inhibitor is not particularly limited and may be appropriately selected as needed. For example, mercaptans, azoles and the like are suitable.
藉由含有金屬腐蝕抑制劑,可發揮防銹效果,可抑制導電材料之隨時間經過所造成之導電性及透明性之降低。金屬腐蝕抑制 劑可於以適宜溶劑而溶解之狀態、或以粉末之形式而添加於感光性層形成用組成物中,或者於製作導電膜後,將其浸漬於金屬腐蝕抑制劑浴中而賦予。 By containing a metal corrosion inhibitor, the rust-preventing effect can be exhibited, and the decrease in conductivity and transparency caused by the passage of the conductive material over time can be suppressed. Metal corrosion inhibition The agent may be added to the photosensitive layer-forming composition in a state of being dissolved in a suitable solvent or in the form of a powder, or may be applied by immersing it in a metal corrosion inhibitor bath after the conductive film is formed.
於添加金屬腐蝕抑制劑之情形時,較佳的是相對於金屬奈米線而含有0.5質量%~10質量%。 When a metal corrosion inhibitor is added, it is preferably contained in an amount of 0.5% by mass to 10% by mass based on the metal nanowire.
作為其他基質,可將前述金屬奈米線之製造時所使用之作為分散劑之高分子化合物,用作構成基質之成分之至少一部分。 As another substrate, a polymer compound as a dispersing agent used in the production of the above-mentioned metal nanowire can be used as at least a part of a component constituting the matrix.
於透明導電膜之形成中,可與金屬奈米線一同使用至少含有溶膠-凝膠硬化物之組成物作為基質成分。 In the formation of the transparent conductive film, a composition containing at least a sol-gel cured product can be used as a matrix component together with the metal nanowire.
以下,對溶膠-凝膠硬化物加以詳述。 Hereinafter, the sol-gel cured product will be described in detail.
(溶膠-凝膠硬化物) (sol-gel cured)
上述溶膠-凝膠硬化物是對選自由Si、Ti、Zr及Al所構成之群組之元素的烷氧化物化合物(以下亦稱為「特定烷氧化物化合物」)進行水解及聚縮合,進一步視需要進行加熱、乾燥而所得者。 The sol-gel cured product is subjected to hydrolysis and polycondensation of an alkoxide compound (hereinafter also referred to as "specific alkoxide compound") selected from the group consisting of Si, Ti, Zr, and Al, and further If necessary, heat and dry.
於獲得容易之方面而言,特定烷氧化物化合物較佳的是下述通式(X)所表示之化合物。 The specific alkoxide compound is preferably a compound represented by the following formula (X) in terms of ease of obtaining.
M1(OR20)aR21 4-a (X) M 1 (OR 20 ) a R 21 4-a (X)
(通式(X)中,M1表示選自Si、Ti及Zr之元素,R20、R21分別獨立地表示氫原子或烴基,a表示2~4之整數) (In the formula (X), M 1 represents an element selected from the group consisting of Si, Ti and Zr, and R 20 and R 21 each independently represent a hydrogen atom or a hydrocarbon group, and a represents an integer of 2 to 4)
通式(X)中之R20及R21之各烴基較佳的是列舉烷基或 芳基。 The respective hydrocarbon groups of R 20 and R 21 in the formula (X) are preferably an alkyl group or an aryl group.
表示烷基之情形時的碳數較佳的是1~18,更佳的是1~8,進一步更佳的是1~4。而且,於表示芳基之情形時,較佳的是苯基。 The number of carbon atoms in the case of indicating an alkyl group is preferably from 1 to 18, more preferably from 1 to 8, and still more preferably from 1 to 4. Further, in the case of expressing an aryl group, a phenyl group is preferred.
烷基或芳基可具有取代基,可導入之取代基可列舉鹵素原子、胺基、烷基胺基、巰基等。 The alkyl group or the aryl group may have a substituent, and examples of the substituent which may be introduced include a halogen atom, an amine group, an alkylamine group, a fluorenyl group and the like.
另外,通式(X)所表示之化合物為低分子化合物,較佳的是分子量為1000以下。 Further, the compound represented by the formula (X) is a low molecular compound, and preferably has a molecular weight of 1,000 or less.
作為通式(X)所表示之化合物之具體例,例如於日本 專利特開2010-064474號公報等中有所記載。 Specific examples of the compound represented by the general formula (X), for example, in Japan Patent Publication No. 2010-064474 and the like are described.
於本發明中將溶膠-凝膠硬化物用作導電膜之基質之情 形時,較佳的是於特定烷氧化物化合物相對於前述金屬奈米線之比率、亦即特定烷氧化物化合物/金屬奈米線之質量比為0.25/1~30/1之範圍內使用。於上述質量比小於0.25/1之情形時,成為透明性差,同時耐磨耗性、耐熱性、耐濕熱性及耐撓曲性中之至少一個差之導電膜;另一方面,於上述質量比大於30/1之情形時,成為導電性及耐撓曲性差之導電膜。 In the present invention, a sol-gel cured product is used as a substrate for a conductive film. In the case of a shape, it is preferred to use the ratio of the specific alkoxide compound to the aforementioned metal nanowire, that is, the specific alkoxide compound/metal nanowire mass ratio is 0.25/1 to 30/1. . When the mass ratio is less than 0.25/1, the conductive film is inferior in transparency and at least one of abrasion resistance, heat resistance, moist heat resistance, and flex resistance; on the other hand, in the above mass ratio When it is larger than 30/1, it becomes a conductive film which is inferior in conductivity and flexibility.
若上述質量比為更佳的是0.5/1~20/1之範圍,進一步更佳的是1/1~15/1、最佳的是2/1~8/1之範圍,則可穩定地獲得具有高的導電性與高的透明性(總透光率及霧度),且耐磨耗性、耐熱性及耐濕熱性優異,且耐撓曲性優異之導電材料,因此較佳。 If the above mass ratio is more preferably in the range of 0.5/1 to 20/1, further preferably 1/1 to 15/1, and most preferably in the range of 2/1 to 8/1, it is stable. A conductive material having high conductivity and high transparency (total light transmittance and haze) and excellent in abrasion resistance, heat resistance, and moist heat resistance and excellent in flex resistance is preferable.
而且,於導電膜之形成中,可與金屬奈米線一同使用至 少含有高分子之組成物作為基質成分。 Moreover, in the formation of the conductive film, it can be used together with the metal nanowire to A composition containing a small amount of a polymer is used as a matrix component.
以下對所使用之高分子加以詳述。 The polymer used will be described in detail below.
高分子包含合成高分子或天然高分子,合成高分子可列 舉聚酯、聚醯亞胺、聚丙烯酸系化合物(polyacryl)、聚維尼綸(polyvinylon)、聚乙烯、聚丙烯、聚苯乙烯、聚氯乙烯、甲基丙烯酸樹脂、氟系樹脂、酚樹脂、三聚氰胺樹脂、矽酮樹脂、合成橡膠或這些之乳膠等。天然高分子可列舉纖維素系樹脂或天然橡膠等。 The polymer contains a synthetic polymer or a natural polymer, and the synthetic polymer can be listed. Polyester, polyimine, polyacryl, polyvinylon, polyethylene, polypropylene, polystyrene, polyvinyl chloride, methacrylic resin, fluorine resin, phenol resin, Melamine resin, fluorenone resin, synthetic rubber or latex of these. Examples of the natural polymer include a cellulose resin or a natural rubber.
可視需要於導電膜上設置包含保護塗層材之保護層。 A protective layer containing a protective coating material may be disposed on the conductive film as needed.
關於形成保護層之保護塗層材,例如可適用日本專利特開2011-167848號公報中所記載者。 For the protective coating material forming the protective layer, for example, those described in Japanese Laid-Open Patent Publication No. 2011-167848 can be applied.
保護塗層材可包含交聯劑、聚合起始劑、穩定劑(例如抗氧化劑及用以使產品壽命長期化之紫外線穩定劑、及用以改善保存期間之聚合抑制劑)、界面活性劑、及具有同樣之效果者。而且,保護塗層材可進一步包含防止金屬奈米線之腐蝕的腐蝕抑制劑。 The protective coating material may include a crosslinking agent, a polymerization initiator, a stabilizer (for example, an antioxidant and a UV stabilizer for prolonging the life of the product, and a polymerization inhibitor for improving storage), a surfactant, And those with the same effect. Moreover, the protective coating material may further comprise a corrosion inhibitor that prevents corrosion of the metal nanowire.
作為形成保護層之方法,若為公知之濕式塗佈方法則並 無特別限制。具體而言可列舉噴塗、棒塗、輥塗、模塗、噴墨塗佈、網版塗佈、浸塗等。 As a method of forming a protective layer, if it is a well-known wet coating method, There are no special restrictions. Specific examples thereof include spraying, bar coating, roll coating, die coating, inkjet coating, screen coating, dip coating, and the like.
於藉由保護層用塗料含浸透明導電膜而形成保護層 時,塗佈、乾燥後之保護層之膜厚若相對於塗佈前之導電膜而言過薄,則耐摩擦性、耐磨耗性、耐候性等作為保護層之功能降低;若過厚,則作為導體之接觸電阻增加。 Forming a protective layer by impregnating a transparent conductive film with a protective layer coating When the film thickness of the protective layer after application and drying is too thin with respect to the conductive film before coating, the functions of the protective layer such as abrasion resistance, abrasion resistance, and weather resistance are lowered; Then, the contact resistance as a conductor increases.
保護層用塗料之塗佈於以導電膜之膜厚為50~150 nm 之範圍而形成時,塗佈、乾燥後之膜厚較佳的是30 nm~150 nm,可考慮導電膜之膜厚以使表面電阻率、霧度等可實現規定值之方式而進行調整。其中,更佳的是40 nm~175 nm,特佳的是50 nm~150 nm。保護層用塗料之乾燥後之膜厚亦取決於透明導電膜之膜厚,但若為30 nm以上之膜厚,則存在更良好地發揮保護層之保護功能之傾向,若為150 nm以下之膜厚,則存在可確保更良好之導電性能之傾向。 The protective layer coating is applied to the conductive film to a film thickness of 50 to 150 nm. When the range is formed, the film thickness after application and drying is preferably from 30 nm to 150 nm, and the film thickness of the conductive film can be adjusted so that the surface resistivity and the haze can be adjusted to a predetermined value. Among them, 40 nm to 175 nm is preferable, and 50 nm to 150 nm is particularly preferable. The film thickness after drying of the coating material for a protective layer depends on the film thickness of the transparent conductive film. However, when the film thickness is 30 nm or more, the protective function of the protective layer is more favorably exhibited, and the thickness is preferably 150 nm or less. The film thickness has a tendency to ensure better electrical conductivity.
導電膜可根據用途而圖案化為所期望之形狀。 The conductive film can be patterned into a desired shape depending on the use.
對導電膜進行圖案化之方法並無特別限制,例如可對導電膜進行曝光、顯影。更具體而言包含圖案曝光之步驟、顯影步驟,進一步視需要包含其他步驟。 The method of patterning the conductive film is not particularly limited, and for example, the conductive film can be exposed and developed. More specifically, it includes a step of pattern exposure, a development step, and further includes other steps as needed.
於導電膜之基質為非感光性者之情形時,較佳的是藉由 下述(1)~(2)之方法而進行圖案化。 In the case where the substrate of the conductive film is non-photosensitive, it is preferred to Patterning was carried out by the following methods (1) to (2).
(1)於導電膜上設置光阻劑層,對該光阻劑層進行所期望之圖案曝光及顯影,形成該圖案狀之抗蝕劑後(蝕刻遮罩材),藉由可蝕刻之蝕刻液對導電膜進行處理的濕式製程、或如反應性離子蝕刻這樣的乾式製程而對未經抗蝕劑保護之區域的導電膜進行蝕刻而使其斷線或消失的圖案化方法。該方法例如於日本專利特表2010-507199號公報(特別是段落0212~段落0217)中有所記載。 (1) A photoresist layer is provided on the conductive film, and the photoresist layer is subjected to a desired pattern exposure and development to form the patterned resist (etch mask), which is etched by etching. A patterning method in which a liquid is subjected to a wet process for treating a conductive film or a dry process such as reactive ion etching to etch a conductive film in a region not protected by a resist to break or disappear. This method is described, for example, in Japanese Patent Laid-Open Publication No. 2010-507199 (particularly paragraphs 0212 to 0217).
(2)於導電膜上之所期望之區域,藉由噴墨方式或網版印刷方式而將光硬化性樹脂設於圖案上,對該光硬化性樹脂層進行所 期望之曝光,形成該圖案狀之抗蝕劑(蝕刻遮罩材)後,將導電膜浸漬於可蝕刻之蝕刻液中、或噴淋蝕刻液,使未經抗蝕劑保護之區域的導電膜斷線或消失的圖案化方法。 (2) The photocurable resin is provided on the pattern in a desired region on the conductive film by an inkjet method or a screen printing method, and the photocurable resin layer is applied to the photocurable resin layer. Desirable exposure, after forming the patterned resist (etching mask), immersing the conductive film in an etchable etching solution, or spraying the etching solution to make a conductive film in a region not protected by the resist A patterning method that breaks or disappears.
於利用上述(1)或(2)之方法之情形時,較佳的是於圖案化結束後,藉由常法而除去導電膜上之抗蝕劑。 In the case of using the method of the above (1) or (2), it is preferred that the resist on the conductive film is removed by a usual method after the patterning is completed.
賦予蝕刻遮罩材之方法並無特別限制,例如可列舉塗佈 法、印刷法、噴墨法等。 The method of imparting the etching mask is not particularly limited, and for example, coating is exemplified. Method, printing method, inkjet method, etc.
塗佈法並無特別限制,例如可列舉輥塗法、棒塗法、浸塗法、旋塗法、澆鑄(casting)法、模塗法、刮塗法、棒塗法、凹板塗佈法、簾塗法、噴塗法、刮刀塗佈法等。 The coating method is not particularly limited, and examples thereof include roll coating, bar coating, dip coating, spin coating, casting, die coating, knife coating, bar coating, and gravure coating. , curtain coating method, spraying method, blade coating method, and the like.
印刷法例如可列舉凸版(活版)印刷法、孔版(網版)印刷法、平版(offset)印刷法、凹版(gravure)印刷法等。另外,該步驟中所形成之抗蝕劑層可為正型抗蝕劑層可為負型抗蝕劑層。 於正型抗蝕劑層之情形時,圖案狀曝光區域變得可溶,於未曝光區域(未溶解區域)形成圖案狀之抗蝕劑層;於負型抗蝕劑層之情形時,曝光區域成為硬化之抗蝕劑層,藉由賦予溶解液而除去未曝光部、亦即未硬化部之抗蝕劑層,從而形成圖案狀之抗蝕劑層。 Examples of the printing method include a letterpress (blade) printing method, a stencil printing method, an offset printing method, a gravure printing method, and the like. In addition, the resist layer formed in this step may be a positive resist layer or a negative resist layer. In the case of a positive resist layer, the patterned exposed regions become soluble, forming a patterned resist layer in the unexposed regions (undissolved regions); in the case of a negative resist layer, exposure The region is a hardened resist layer, and a resist layer which is an unexposed portion, that is, an uncured portion is removed by applying a solution to form a patterned resist layer.
上述(1)之方法中所使用之抗蝕劑層形成用材料之種 類並無特別限制,可使用負型、正型、乾膜型等之任意者。 The material for forming a resist layer used in the method of the above (1) The class is not particularly limited, and any of a negative type, a positive type, and a dry film type can be used.
於抗蝕劑層之形成中,可適宜選擇使用市售之鹼可溶性光阻劑。例如富士軟片製造之彩色馬賽克系列、FILS系列、FIOS系列、 FMES系列、FTENS系列、FIES系列、半導體製程用各正型、負型光阻劑系列,富士藥品製造之Fuji Resist系列(其中可較佳地使用FR系列、FPPR系列、FMR系列、FDER系列等),以及安智電子材料股份有限公司(AZ Electronic Materials)製造之光阻劑系列(其中可較佳地列舉RFP系列、TFP系列、SZP系列、HKT系列、SFP系列、SR系列、SOP系列、SZC系列、CTP系列、ANR系列、P4000系列、TPM606、40XT、nXT系列等),JSR公司製造之各光阻劑等可廣泛地用於高解析度型至低解像度型中。 In the formation of the resist layer, a commercially available alkali-soluble photoresist can be suitably used. For example, the color mosaic series manufactured by Fujifilm, FILS series, FIOS series, FMES series, FTENS series, FIES series, positive and negative photoresist series for semiconductor process, Fuji Resist series manufactured by Fuji Pharmaceuticals (including FR series, FPPR series, FMR series, FDER series, etc.) And a series of photoresists manufactured by AZ Electronic Materials (including RFP series, TFP series, SZP series, HKT series, SFP series, SR series, SOP series, SZC series) , CTP series, ANR series, P4000 series, TPM606, 40XT, nXT series, etc.), various photoresists manufactured by JSR, etc. can be widely used in high-resolution type to low-resolution type.
乾膜抗蝕劑可列舉日立化成工業製造之印刷配線板用感光性膜,旭化成電子材料股份有限公司(Asahi Kasei E-materials)製造之感光性乾膜SUNFORT系列,杜邦MRC乾膜製造之FXG系列、FXR系列、FX900系列、JSF100系列、SA100系列、LDI系列、FRA系列、CM系列,富士軟片製造之Transer各系列等,可適宜地使用這些乾膜抗蝕劑。 The dry film resist includes a photosensitive film for a printed wiring board manufactured by Hitachi Chemical Co., Ltd., a photosensitive dry film SUNFORT series manufactured by Asahi Kasei E-materials, and a FXG series manufactured by DuPont MRC dry film. These dry film resists can be suitably used in the FXR series, FX900 series, JSF100 series, SA100 series, LDI series, FRA series, CM series, and Transer series manufactured by Fujifilm.
這些抗蝕劑層形成材料根據導電膜中所形成之圖案之解像度等適宜選擇即可。 These resist layer forming materials may be appropriately selected depending on the resolution of the pattern formed in the conductive film or the like.
於抗蝕劑層之形成中使用乾膜型抗蝕劑層形成材料之情形時,將預先製作之乾膜抗蝕劑之感光性抗蝕劑層轉印於所形成之導電膜之表面即可。 When a dry film type resist layer forming material is used in the formation of the resist layer, the photosensitive resist layer of the dry film resist prepared in advance may be transferred onto the surface of the formed conductive film. .
曝光步驟可使用包含光聚合起始劑之蝕刻遮罩材而於 氧濃度為5%以下進行曝光。 The exposure step can be performed using an etch mask comprising a photopolymerization initiator The exposure was carried out at an oxygen concentration of 5% or less.
而且,可利用轉印材料,藉由轉印而於目標基板上圖案 化形成導電膜。 Moreover, the transfer material can be used to pattern on the target substrate by transfer A conductive film is formed.
而且,如日本專利特開2011-167848號公報之[0147]~[0148]中所記載那樣,可藉由網版印刷將除去劑(蝕刻液)圖案塗佈於導電膜上而進行導電膜之圖案化。 Further, as described in [0147] to [0148] of JP-A-2011-167848, a pattern of a removing agent (etching liquid) can be applied to a conductive film by screen printing to perform a conductive film. Patterned.
[透明雙面黏著片] [Transparent double-sided adhesive sheet]
透明雙面黏著片是透明,且表面及背面顯示黏著性之薄片。 該薄片以其中一個顯示黏著性之面貼附於上述導電膜上的方式而積層於導電膜上。換而言之,將透明雙面黏著片貼附於包含透明基板與其上所配置之導電膜的附有導電膜之透明基板的導電膜側。 The transparent double-sided adhesive sheet is transparent and has an adhesive sheet on the front and back sides. The sheet is laminated on the conductive film in such a manner that one of the adhesive surfaces is attached to the conductive film. In other words, the transparent double-sided adhesive sheet is attached to the side of the conductive film of the transparent substrate with the conductive film on the transparent substrate and the conductive film disposed thereon.
更具體而言,於圖4中,透明雙面黏著片306之表面306c及背面306d顯示黏著性,以表面306c貼附於導電膜304上之方式將透明雙面黏著片306配置於導電膜304上。 More specifically, in FIG. 4, the surface 306c and the back surface 306d of the transparent double-sided adhesive sheet 306 are adhesive, and the transparent double-sided adhesive sheet 306 is disposed on the conductive film 304 in such a manner that the surface 306c is attached to the conductive film 304. on.
透明雙面黏著片若至少包含黏著劑層即可,可為包含於 基材之雙面配置有黏著劑層之基材之類型(附有基材之透明雙面黏著片),可為僅僅包含黏著劑層而不包含基材之類型(無基材之透明雙面黏著片)。其中,自使用透明雙面黏著片之產品之薄膜化之觀點考慮,較佳的是無基材之透明雙面黏著片。 If the transparent double-sided adhesive sheet contains at least an adhesive layer, it may be included in The type of the substrate on which the adhesive layer is disposed on both sides of the substrate (the transparent double-sided adhesive sheet with the substrate) may be of a type including only the adhesive layer and not including the substrate (transparent transparent substrate without substrate) Adhesive film). Among them, from the viewpoint of film formation of a product using a transparent double-sided adhesive sheet, a transparent double-sided adhesive sheet having no substrate is preferable.
透明雙面黏著片中包含上述還原性化合物。所含有之還 原性化合物之適宜形態如上所述。 The above-mentioned reducing compound is contained in the transparent double-sided adhesive sheet. Contained Suitable forms of the original compound are as described above.
另外,於透明雙面黏著片為附有基材之透明雙面黏著片之情形時,還原性化合物可於基材中、或黏著劑層中之任意者中含有, 可包含於基材與黏著劑層之雙方中。 Further, in the case where the transparent double-sided adhesive sheet is a transparent double-sided adhesive sheet to which a substrate is attached, the reducing compound may be contained in any one of the substrate or the adhesive layer. It can be included in both the substrate and the adhesive layer.
而且,於雙面黏著片之黏著劑層中包含上述還原性化合物之情形時,黏著劑中之還原性化合物之分散性更優異,因此即使於高溫高濕環境下放置導電膜積層體之情形時,亦未發現黏著劑層之黏著力降低。 Further, when the above-mentioned reducing compound is contained in the adhesive layer of the double-sided adhesive sheet, the dispersibility of the reducing compound in the adhesive is more excellent, and therefore, even when the conductive film laminate is placed in a high-temperature and high-humidity environment, The adhesion of the adhesive layer was also not found to decrease.
透明雙面黏著片中之還原性化合物之含量並無特別限 制,自進一步抑制還原性化合物於透明樹脂內部之析出且薄片之透明性更優異,且進一步抑制於薄片表面附近之還原性化合物之析出,進一步提高薄片與被黏著體之密接性,進一步提高電氣可靠性之方面考慮,還原性化合物之總質量A與透明樹脂之總質量C之質量比(A/C)較佳的是0.20以下,更佳的是0.10以下。下限並無特別限制,於即使是薄的透明雙面黏著片可獲得規定的效果之方面而言,較佳的是0.0001以上,更佳的是0.0005以上。 The content of the reducing compound in the transparent double-sided adhesive sheet is not particularly limited. Further, the precipitation of the reducing compound in the transparent resin is further suppressed, and the transparency of the sheet is further improved, and the precipitation of the reducing compound in the vicinity of the surface of the sheet is further suppressed, and the adhesion between the sheet and the adherend is further improved, and the electrical property is further improved. In view of reliability, the mass ratio (A/C) of the total mass A of the reducing compound to the total mass C of the transparent resin is preferably 0.20 or less, more preferably 0.10 or less. The lower limit is not particularly limited, and is preferably 0.0001 or more, and more preferably 0.0005 or more, in that a thin transparent double-sided adhesive sheet can obtain a predetermined effect.
另外,總質量A於包含2種以上還原性化合物之情形時表示這些之合計質量。總質量C於包含2種以上透明樹脂之情形時表示這些之合計質量。 Further, when the total mass A is two or more kinds of reducing compounds, the total mass of these is shown. The total mass C indicates the total mass of these when it contains two or more types of transparent resins.
透明雙面黏著片之厚度並無特別限制,自將導電膜積層 體應用於觸控面板上之方面而言,較佳的是5 μm~150 μm,更佳的是20 μm~100 μm。 The thickness of the transparent double-sided adhesive sheet is not particularly limited, since the conductive film is laminated In terms of the touch panel, it is preferably 5 μm to 150 μm, more preferably 20 μm to 100 μm.
藉由使透明雙面黏著片之厚度為20 μm以上,獲得可覆蓋所貼附之基板之階差或凹凸之效果;藉由使透明雙面黏著片之厚度為100 μm以下,獲得可充分確保透明雙面黏著片之透過率之效果。 By making the thickness of the transparent double-sided adhesive sheet 20 μm or more, the effect of covering the step or the unevenness of the attached substrate can be obtained, and the thickness of the transparent double-sided adhesive sheet can be sufficiently ensured by 100 μm or less. The effect of the transparency of the transparent double-sided adhesive sheet.
於透明雙面黏著片為附有基材之透明雙面黏著片之情 形時,黏著劑層設於基材之雙面。所使用之基材之種類並無特別限制,較佳的是使用透明基材。透明基材例如可列舉聚對苯二甲酸乙二酯膜、聚對苯二甲酸丁二酯膜、聚萘二甲酸乙二酯膜、聚乙烯膜、聚丙烯膜、玻璃紙、二乙醯纖維素膜、三乙醯纖維素膜、乙醯基纖維素丁酸酯膜、聚氯乙烯膜、聚偏二氯乙烯膜、聚乙烯醇膜、乙烯-乙酸乙烯酯共聚物膜、聚苯乙烯膜、聚碳酸酯膜、聚甲基戊烯膜、聚碸膜、聚醚醚酮膜、聚醚碸膜、聚醚醯亞胺膜、聚醯亞胺膜、氟樹脂膜、尼龍膜、丙烯酸樹脂膜等。 The transparent double-sided adhesive sheet is a transparent double-sided adhesive sheet with a substrate attached thereto. In the shape, the adhesive layer is provided on both sides of the substrate. The type of the substrate to be used is not particularly limited, and a transparent substrate is preferably used. Examples of the transparent substrate include polyethylene terephthalate film, polybutylene terephthalate film, polyethylene naphthalate film, polyethylene film, polypropylene film, cellophane, and diethylcellulose. Membrane, triacetyl cellulose membrane, ethylene glycol cellulose butyrate film, polyvinyl chloride film, polyvinylidene chloride film, polyvinyl alcohol film, ethylene-vinyl acetate copolymer film, polystyrene film, Polycarbonate film, polymethylpentene film, polyfluorene film, polyether ether ketone film, polyether ruthenium film, polyether phthalimide film, polyimine film, fluororesin film, nylon film, acrylic film Wait.
透明雙面黏著片之黏著劑層之材料並無特別限定,可使 用公知之材料。例如可使用橡膠系黏著劑、丙烯酸系黏著劑、矽酮系黏著劑、胺基甲酸酯系黏著劑等各種透明樹脂黏著劑,於透明性更優異且與上述還原性化合物之相溶性更優異之方面而言,較佳的是丙烯酸系黏著劑。 The material of the adhesive layer of the transparent double-sided adhesive sheet is not particularly limited, and Use well-known materials. For example, various transparent resin adhesives such as a rubber-based adhesive, an acrylic adhesive, an anthrone-based adhesive, and a urethane-based adhesive can be used, and the transparency is more excellent and the compatibility with the above-mentioned reducing compound is excellent. In terms of this, an acrylic adhesive is preferred.
丙烯酸系黏著劑將以(甲基)丙烯酸烷基酯之單體單元為 主骨架之丙烯酸系聚合物作為基礎聚合物。另外,(甲基)丙烯酸酯是指丙烯酸酯及/或甲基丙烯酸酯。構成丙烯酸系聚合物之主骨架的(甲基)丙烯酸烷基酯之烷基的平均碳數較佳的是1~12左右,(甲基)丙烯酸烷基酯之具體例可例示(甲基)丙烯酸甲酯、(甲基)丙烯酸乙酯、(甲基)丙烯酸丁酯、(甲基)丙烯酸-2-乙基己酯等。 The acrylic adhesive will be a monomer unit of alkyl (meth)acrylate. The acrylic polymer of the main skeleton serves as a base polymer. Further, (meth) acrylate means acrylate and/or methacrylate. The average carbon number of the alkyl group of the (meth)acrylic acid alkyl ester constituting the main skeleton of the acrylic polymer is preferably about 1 to 12, and specific examples of the (meth)acrylic acid alkyl ester can be exemplified (methyl). Methyl acrylate, ethyl (meth)acrylate, butyl (meth)acrylate, 2-ethylhexyl (meth)acrylate, and the like.
而且,透明雙面黏著片較佳的是於60℃、90%RH之條 件下靜置100小時之後的總透光率為80%以上(更佳的是85%以 上、進一步更佳的是90%以上)、霧度為1.0%以下(更佳的是0.7%以下)。 Moreover, the transparent double-sided adhesive sheet is preferably at 60 ° C, 90% RH strip The total light transmittance after standing for 100 hours is 80% or more (more preferably 85%) Further, it is more preferably 90% or more), and the haze is 1.0% or less (more preferably 0.7% or less).
而且,透明雙面黏著片之吸水率較佳的是於60℃、90%RH之條件下靜置100小時後為2.0%以下(更佳的是1.25%以下、進一步更佳的是1.0%以下)。 Further, the water absorption rate of the transparent double-sided adhesive sheet is preferably 2.0% or less (more preferably 1.25% or less, still more preferably 1.0% or less) after standing for 100 hours under conditions of 60 ° C and 90% RH. ).
吸水率之測定方法依據日本專利特開2012-11637號公報中所記載之方法。 The method for measuring the water absorption rate is based on the method described in JP-A-2012-11637.
上述透明雙面黏著片可藉由公知之方法而製造。例如於 無基材之透明雙面黏著片之情形時,可藉由如下方式而製作透明雙面黏著片:以乾燥後之厚度成為規定厚度之方式將包含還原性化合物之黏著劑組成物塗佈於分隔件(剝離襯墊(liner))上而設置黏著劑組成物之塗佈層後,對該塗佈層進行乾燥,視需要進行硬化而形成黏著劑層。 The above transparent double-sided adhesive sheet can be produced by a known method. For example, In the case of a substrate-free transparent double-sided adhesive sheet, a transparent double-sided adhesive sheet can be produced by coating an adhesive composition containing a reducing compound in a manner to have a thickness after drying to a predetermined thickness. After the coating layer of the adhesive composition is provided on a member (liner), the coating layer is dried and, if necessary, cured to form an adhesive layer.
而且,於附有基材之透明雙面黏著片之情形時,可藉由將包含還原性化合物之黏著劑組成物直接塗佈於基材表面進行乾燥而設置黏著劑層(直印法),可藉由與上述同樣地於分隔件上形成包含還原性化合物之黏著劑層之後,與基材進行轉印(貼合)而於基材上設置黏著劑層(轉印法)。 Further, in the case of a transparent double-sided adhesive sheet to which a substrate is attached, an adhesive layer (direct printing method) may be provided by directly applying an adhesive composition containing a reducing compound to the surface of the substrate to be dried. An adhesive layer containing a reducing compound is formed on the separator in the same manner as described above, and then the substrate is transferred (bonded) to form an adhesive layer on the substrate (transfer method).
而且,其他製造方法例如可列舉:於包含還原性化合物之基材表面塗佈黏著劑組成物而設置黏著劑層,製造附有基材之透明雙面黏著片的方法。 Further, as another manufacturing method, for example, a method in which an adhesive composition is applied to a surface of a substrate containing a reducing compound to form an adhesive layer, and a transparent double-sided adhesive sheet with a substrate is produced is exemplified.
另外,於圖4中,於透明基板302之其中一個表面上設 有導電膜304及透明雙面黏著片306,但並不限定於該形態。 In addition, in FIG. 4, one surface of the transparent substrate 302 is provided. The conductive film 304 and the transparent double-sided adhesive sheet 306 are provided, but the shape is not limited thereto.
例如,可如圖5所示之導電膜積層體400那樣於透明基板302之雙面上設有導電膜304a、導電膜304b及透明雙面黏著片306a、透明雙面黏著片306b。而且,如導電膜304a與導電膜304b那樣,兩者之圖案形狀可不同。另外,導電膜304a與304b均為細線狀,兩者以正交之方式而配置。 For example, a conductive film 304a, a conductive film 304b, a transparent double-sided adhesive sheet 306a, and a transparent double-sided adhesive sheet 306b may be provided on both surfaces of the transparent substrate 302 as in the conductive film laminate 400 shown in FIG. 5. Further, as with the conductive film 304a and the conductive film 304b, the pattern shapes of the two may be different. Further, the conductive films 304a and 304b are both thin and linear, and they are arranged in an orthogonal manner.
<導電膜積層體> <Conductive film laminate>
本發明的第1實施方式之導電膜積層體如上所述那樣包含:透明基板、透明基板上所配置之包含銀之導電膜、導電膜上所貼合之透明雙面黏著片。 As described above, the conductive film laminate of the first embodiment of the present invention includes a transparent substrate, a conductive film containing silver disposed on the transparent substrate, and a transparent double-sided adhesive sheet bonded to the conductive film.
另外,可視需要於上述透明雙面黏著片露出之顯示黏著性之表面上進一步貼合其他構件(例如後述之保護基板)。 Further, it is also possible to further bond another member (for example, a protective substrate to be described later) to the surface on which the transparent double-sided adhesive sheet is exposed to exhibit adhesiveness.
自可進一步抑制導電膜間之離子遷移之方面而言,導電 膜積層體例如可範圍廣泛地適用於觸控面板、顯示器用電極、電磁波遮罩、有機或無機電致發光(electroluminescence,EL)顯示器用電極、電子紙、可撓性顯示器用電極、積體型太陽電池、顯示元件、其他各種元件等中。這些中特佳的是觸控面板之引線配線部。以下,對觸控面板之引線配線部之形態加以詳述。 Conductive in terms of further inhibiting ion migration between conductive films The film laminate can be widely applied to, for example, a touch panel, an electrode for a display, an electromagnetic wave mask, an electrode for an organic or inorganic electroluminescence (EL) display, an electronic paper, an electrode for a flexible display, or an integrated solar body. In batteries, display elements, various other components, and the like. Particularly preferred of these are the lead wiring portions of the touch panel. Hereinafter, the form of the lead wiring portion of the touch panel will be described in detail.
[適宜形態] [suitable form]
於將上述之導電膜積層體使用於觸控面板中之情形時,進一步抑制導電膜間之離子遷移,因此即使於嚴酷之環境下經長時間放置後可維持其性能。 When the above-mentioned conductive film laminate is used in a touch panel, ion migration between the conductive films is further suppressed, so that the performance can be maintained even after being left for a long time in a severe environment.
近年來,推進將觸控面板適用於小型信息終端裝置中,為了確保廣的輸入區域,要求邊緣部分之寬度變窄(窄邊緣化)。通常情況下,於觸控面板之邊緣部分配置引線配線(周邊配線),為了達成窄邊緣化,必須使引線配線之寬度及引線配線間之距離更加狹小化。另一方面,若實施此種狹小化,則變得容易進行引線配線之斷線或引線配線間之短路。 In recent years, the touch panel has been promoted for use in a small information terminal device, and in order to secure a wide input area, the width of the edge portion is required to be narrow (narrow edge). In general, the lead wiring (peripheral wiring) is disposed on the edge portion of the touch panel, and in order to achieve narrow edge, it is necessary to narrow the width of the lead wiring and the distance between the lead wirings. On the other hand, when such a narrowing is performed, it becomes easy to disconnect the lead wire or short-circuit between the lead wires.
相對於此,於將上述導電膜積層體適用於引線配線部之情形(亦即,將導電膜積層體之導電膜適用為引線配線之情形)時,由於包含還原性化合物之透明雙面黏著片之功能而進一步抑制引線配線(金屬配線)之斷線或引線配線間之短路。 On the other hand, when the conductive film laminate is applied to the lead wiring portion (that is, when the conductive film of the conductive film laminate is applied as a lead wiring), the transparent double-sided adhesive sheet containing the reducing compound is used. The function is to further suppress the disconnection of the lead wiring (metal wiring) or the short circuit between the lead wirings.
以下參照圖式而更詳細地加以說明。 This will be described in more detail below with reference to the drawings.
圖6(A)是觸控面板構件之一部分平面概略圖,圖6(B)是A-A線之示意性剖面圖。圖6(A)中所示之觸控面板構件500包含觸控面板用導電膜積層體600、觸控面板用導電膜積層體600之規定位置所接合之可撓性電路30而構成。 Fig. 6(A) is a plan view schematically showing a part of the touch panel member, and Fig. 6(B) is a schematic cross-sectional view taken along line A-A. The touch panel member 500 shown in FIG. 6A is configured by a flexible circuit 30 in which a conductive film laminate 600 for a touch panel and a conductive film laminate 600 for a touch panel are bonded to each other at a predetermined position.
於觸控面板用導電膜積層體600中,於透明基板32之其中一個面之側設有透明電極層34(例如ITO層、含銀層)與透明雙面黏著片42。另外,藉由將透明基板32上所排列之多個金剛石形狀於其中一個方向上連結為直線狀的圖案而形成透明電極層34。於透明電極層34上設有電性連接之多個引線配線36。於引線配線36之末端設有未圖示之導電體,與可撓性電路30中之未圖示之端子電性連接。 In the conductive film laminate 600 for a touch panel, a transparent electrode layer 34 (for example, an ITO layer or a silver-containing layer) and a transparent double-sided adhesive sheet 42 are provided on one side of one surface of the transparent substrate 32. Further, the transparent electrode layer 34 is formed by connecting a plurality of diamond shapes arranged on the transparent substrate 32 in a linear pattern in one direction. A plurality of lead wires 36 electrically connected to each other are provided on the transparent electrode layer 34. A conductor (not shown) is provided at the end of the lead wiring 36, and is electrically connected to a terminal (not shown) of the flexible circuit 30.
於透明基板32中,於設有透明電極層34之區域中構成作為觸控面板使用者可視認、可檢測觸摸位置之感知部(感測器部)而發揮功能的活動區域38,另一方面其外側成為非活動區域40。 觸控面板之邊緣部分相當於非活動區域40。通常情況下,於非活動區域40中如上所述地存在有引線配線36或可撓性電路30。藉由於該引線配線36上以覆蓋引線配線36之方式配置透明雙面黏著片42,可進一步抑制引線配線36之斷線及引線配線36間之短路。 On the transparent substrate 32, in the region where the transparent electrode layer 34 is provided, an active area 38 that functions as a sensing unit (sensor portion) that can be detected by the touch panel user and can detect the touch position is formed. The outer side becomes an inactive area 40. The edge portion of the touch panel is equivalent to the inactive area 40. Usually, the lead wiring 36 or the flexible circuit 30 is present in the inactive area 40 as described above. By disposing the transparent double-sided adhesive sheet 42 so as to cover the lead wiring 36 on the lead wiring 36, the disconnection of the lead wiring 36 and the short circuit between the lead wirings 36 can be further suppressed.
亦即,導電膜積層體之適宜形態之一可列舉包含如下者 之觸控面板用導電膜積層體:透明基板;透明基板上所配置的發揮作為感測器之功能的電極圖案部;於透明基板上,一端與電極圖案部之電極連接,另一端與外部控制電路所連接之端子連接的包含含有銀之引線配線的端子配線部;至少於引線配線上所配置之上述透明雙面黏著片。另外,引線配線之每單位面積中所含之銀量為50 μg/mm2以下,於透明雙面黏著片中包含上述透明樹脂、及還原性化合物。 In other words, one of the suitable embodiments of the conductive film laminate includes a conductive film laminate for a touch panel: a transparent substrate; an electrode pattern portion that functions as a sensor disposed on the transparent substrate; One end of the substrate is connected to the electrode of the electrode pattern portion, and the other end is connected to a terminal connected to the external control circuit, and includes a terminal wiring portion including silver lead wiring; and the transparent double-sided adhesive sheet disposed on at least the lead wiring. In addition, the amount of silver contained in the lead wiring per unit area is 50 μg/mm 2 or less, and the transparent double-sided adhesive sheet contains the transparent resin and the reducing compound.
<<第2實施方式>> <<2th embodiment>>
以下,對本發明的第2實施方式之配線基板及透明黏著片之適宜形態加以說明。 Hereinafter, suitable embodiments of the wiring board and the transparent adhesive sheet according to the second embodiment of the present invention will be described.
首先,對本發明的第2實施方式之與現有技術相比較的特徵點加以詳述。 First, the feature points of the second embodiment of the present invention compared with the prior art will be described in detail.
如上所述,發現於本發明的第2實施方式中,藉由使用包含 具有規定氧化還原電位之化合物、且於規定之環境試驗中霧度之隨時間經過變化為一定範圍內的透明黏著層,可獲得所期望之效果。藉由使用氧化還原電位處於規定範圍內之化合物,可將透明黏著層中之銀離子還原為金屬銀,其結果可抑制離子遷移之產生。而且,於後述之環境試驗中顯示規定特性之透明黏著層比較容易與水分相互作用,其結果抑制白化,且化合物之分散性亦優異。其結果,能夠以更高之水準達成先前處於折衷關係之離子遷移抑制能力與耐白化性。 As described above, it has been found that in the second embodiment of the present invention, by using A desired adhesive layer can be obtained by a compound having a predetermined oxidation-reduction potential and a transparent adhesive layer whose haze changes within a predetermined range in a predetermined environmental test. By using a compound having an oxidation-reduction potential within a predetermined range, silver ions in the transparent adhesive layer can be reduced to metallic silver, and as a result, ion migration can be suppressed. Further, in the environmental test described later, the transparent adhesive layer exhibiting predetermined characteristics is more likely to interact with moisture, and as a result, whitening is suppressed, and the dispersibility of the compound is also excellent. As a result, ion migration inhibition ability and whitening resistance which were previously in a trade-off relationship can be achieved at a higher level.
特別是於化合物為酚化合物之情形時,化合物中之羥基部分變得容易與構成透明黏著層之材料(黏著劑)相互作用,於透明黏著層中之分散性更優異。其結果,能夠以更高之水準達成離子遷移抑制能力與耐白化性。 In particular, when the compound is a phenol compound, the hydroxyl group in the compound easily interacts with the material (adhesive) constituting the transparent adhesive layer, and the dispersibility in the transparent adhesive layer is more excellent. As a result, ion mobility inhibition ability and whitening resistance can be achieved at a higher level.
首先,對本發明的第2實施方式之透明黏著片之適宜形 態加以詳述。 First, a suitable shape of the transparent adhesive sheet of the second embodiment of the present invention State is detailed.
透明黏著片中至少包含含有氧化還原電位為0.40 V~1.30 V之化合物、及黏著劑的透明黏著層。 The transparent adhesive sheet contains at least a compound having a redox potential of 0.40 V to 1.30 V and a transparent adhesive layer of an adhesive.
以下,首先對透明黏著層中所含之各成分加以詳述。 Hereinafter, each component contained in the transparent adhesive layer will be described in detail first.
(氧化還原電位為0.40 V~1.30 V之化合物) (A compound with an oxidation-reduction potential of 0.40 V to 1.30 V)
透明黏著片之透明黏著層中包含氧化還原電位為0.40 V~1.30 V之化合物(以後亦適宜稱為還原性化合物)。該還原性化合物是所謂之電子遷移抑止劑(電子遷移抑制劑),藉由於透明黏著層中包含該還原性化合物而將透明黏著層中之銀離子還原為金屬 銀,藉此而抑制離子遷移。 The transparent adhesive layer of the transparent adhesive sheet contains a compound having an oxidation-reduction potential of 0.40 V to 1.30 V (hereinafter also referred to as a reducing compound). The reducing compound is a so-called electron transport inhibitor (electron migration inhibitor) which reduces silver ions in the transparent adhesive layer to metal by including the reducing compound in the transparent adhesive layer. Silver, thereby suppressing ion migration.
還原性化合物之氧化還原電位為0.40 V~1.30 V,其中於離子遷移抑制能力更優異之方面而言,較佳的是0.50 V~1.20 V,更佳的是0.55 V~1.1 V,進一步更佳的是0.55 V~1.0 V。 The redox potential of the reducing compound is 0.40 V to 1.30 V, and more preferably 0.50 V to 1.20 V, more preferably 0.55 V to 1.1 V, more preferably in terms of ion mobility inhibition ability. It is 0.55 V~1.0 V.
於還原性化合物之氧化還原電位不足0.40 V或超過1.30 V之情形時,離子遷移抑制能力差。 When the redox potential of the reducing compound is less than 0.40 V or exceeds 1.30 V, the ion migration inhibiting ability is poor.
另外,本發明的第2實施方式中所使用之還原性化合物之氧化還原電位之測定方法可藉由眾多文獻中所記載之方法而測定,於本發明中將藉由以下方法而測定之值定義為氧化還原電位。 Further, the method for measuring the oxidation-reduction potential of the reducing compound used in the second embodiment of the present invention can be measured by a method described in a number of documents, and in the present invention, the value defined by the following method is defined. It is an oxidation-reduction potential.
對還原性化合物1 mM、作為支持電解質之四丁基過氯酸銨0.1 M之DMF溶液進行5分鐘之Ar起泡後,藉由恆電位器(potentiostat)(BAS股份有限公司之ALS-604A)進行循環伏安法(cyclic voltammetry)測定。測定工作電極使用玻璃碳(Glassy Carbon)、相對電極使用Pt、參考電極使用飽和甘汞電極(calomel electrode)時之氧化還原電位。 After 5 minutes of Ar foaming of a reducing compound 1 mM, a tetrabutylammonium perchlorate 0.1 M DMF as a supporting electrolyte, a potentiostat (ALS-604A of BAS Co., Ltd.) was used. Cyclic voltammetry measurements were performed. The oxidation-reduction potential of the working electrode was measured using glassy carbon (Glassy Carbon), the counter electrode was Pt, and the reference electrode was a saturated calomel electrode.
還原性化合物之種類若滿足上述氧化還原電位則並無 特別限制,例如可列舉酚化合物、胺系化合物、硫系化合物、磷系化合物等。本發明的第2實施方式中之還原性化合物之氧化還原電位若為規定之範圍,則替代銀氧化而被氧化,因而獲得目標之效果。 The type of the reducing compound does not satisfy the above oxidation-reduction potential. Specific examples thereof include a phenol compound, an amine compound, a sulfur compound, and a phosphorus compound. When the redox potential of the reducing compound in the second embodiment of the present invention is within a predetermined range, it is oxidized instead of silver oxidation, and the intended effect is obtained.
其中,於透明黏著層中之分散性優異、離子遷移抑制能力更優異之方面而言,較佳的是酚化合物。更詳細而言,黏著層比較 顯示出親水性之性質,因此於構成黏著層之黏著劑之間,酚化合物中之羥基容易形成相互作用,於黏著劑中之酚化合物之分散性優異,其結果離子遷移抑制能力提高。 Among them, a phenol compound is preferred in terms of excellent dispersibility in the transparent adhesive layer and superior ion mobility inhibition ability. In more detail, the adhesion layer comparison Since the hydrophilic property is exhibited, the hydroxyl group in the phenol compound easily interacts with the adhesive constituting the adhesive layer, and the dispersibility of the phenol compound in the adhesive is excellent, and as a result, the ion migration inhibiting ability is improved.
酚化合物之種類若滿足上述氧化還原電位則並無特別 限制,例如可列舉DL-α-生育酚等。 There is no special type of phenolic compound if it meets the above redox potential. The limitation is, for example, DL-α-tocopherol or the like.
(適宜形態) (suitable form)
酚化合物之適宜形態可列舉以下之式(1A)~式(3A)所表示之化合物。若為該化合物,則與黏著劑之相溶性更優異,離子遷移抑制能力更優異。 A suitable form of the phenol compound is a compound represented by the following formula (1A) to formula (3A). When it is this compound, it is excellent in compatibility with an adhesive agent, and it is excellent in the ion migration suppression ability.
R11a~R15a各自獨立地表示氫原子、羥基、或可包含雜 原子之碳數為1~20之烴基。 R 11a to R 15a each independently represent a hydrogen atom, a hydroxyl group, or a hydrocarbon group having a carbon number of 1 to 20 which may contain a hetero atom.
作為烴基之適宜例,例如可列舉-O-R31a。R31a表示可包含雜原子之碳數為1~20之烴基。於存在多個-O-R31a之情形時,這些可相同可不同。 A suitable example of the hydrocarbon group is -OR 31a . R 31a represents a hydrocarbon group having a carbon number of 1 to 20 which may contain a hetero atom. These may be the same when there are multiple -OR 31a cases.
於與黏著劑之相溶性更優異之方面而言,烴基之碳數較佳的 是1~12,更佳的是1~10。 The carbon number of the hydrocarbon group is better in terms of being more compatible with the adhesive. It is 1~12, and more preferably 1~10.
烴基更具體而言可列舉脂肪族烴基、芳香族烴基、或這些基組合而成之基。脂肪族烴基可為直鏈狀、分支鏈狀、環狀之任意者。 More specifically, the hydrocarbon group may be an aliphatic hydrocarbon group, an aromatic hydrocarbon group, or a combination of these groups. The aliphatic hydrocarbon group may be any of a linear chain, a branched chain, and a cyclic group.
而且,R11a~R15a之各基之分子量之合計為21以上。其中,較佳的是35以上。另外,上限並無特別限制,於本發明的效果更優異之方面而言,較佳的是1000以下,更佳的是500以下,進一步更佳的是300以下。上述各基之分子量之合計是表示計算R11a~R15a之各個基之分子量,對這些分子量進行合計之值。 Further, the total molecular weight of each of R 11a to R 15a is 21 or more. Among them, it is preferably 35 or more. Further, the upper limit is not particularly limited, and is preferably 1,000 or less, more preferably 500 or less, still more preferably 300 or less in terms of the effect of the present invention being more excellent. The total of the molecular weights of the above respective groups is a value indicating the molecular weight of each of the groups of R 11a to R 15a and the total of these molecular weights.
而且,R11a~R15a可任意2個相互鍵結而形成環。例如,如R11a與R12a、R12a與R13a、R13a與R14a、或R14a與R15a等這樣鄰接之2個基可各自鍵結而形成環。所形成之環之種類並無特別限制,例如可列舉5員環~6員環結構。 Further, R 11a to R 15a may be bonded to each other to form a ring. For example, two groups such as R 11a and R 12a , R 12a and R 13a , R 13a and R 14a , or R 14a and R 15a may be bonded to each other to form a ring. The type of the ring to be formed is not particularly limited, and examples thereof include a 5-membered ring to a 6-membered ring structure.
烴基中所含之雜原子之種類並無特別限制,可列舉鹵素 原子、氧原子、氮原子、硫原子、硒原子、碲原子等。其中,於銀之離子遷移抑制能力優異之方面而言,較佳的是以-Y1-、-N(Ra)-、-C(=Y2)-、-CON(Rb)-、-C(=Y3)Y4-、-SOt-、-SO2N(Rc)-、鹵素原子、或這些基組合而成之基之形態而包含。 The type of the hetero atom contained in the hydrocarbon group is not particularly limited, and examples thereof include a halogen atom, an oxygen atom, a nitrogen atom, a sulfur atom, a selenium atom, and a ruthenium atom. Among them, in terms of excellent ion mobility inhibition ability of silver, -Y 1 -, -N(R a )-, -C(=Y 2 )-, -CON(R b )-, -C(=Y 3 )Y 4 -, -SO t -, -SO 2 N(R c )-, a halogen atom, or a combination of these groups.
Y1~Y4各自獨立地選自由氧原子、硫原子、硒原子、及碲原子所構成之群組。其中,於操作更簡便之方面而言,較佳的是氧原子、硫原子。t表示1~3之整數。 Y 1 to Y 4 are each independently selected from the group consisting of an oxygen atom, a sulfur atom, a selenium atom, and a ruthenium atom. Among them, an oxygen atom or a sulfur atom is preferred in terms of ease of handling. t represents an integer from 1 to 3.
式(1A)中,較佳的是R11a及R15a分別獨立地表示氫原 子、或可包含氧原子之碳數為1~20之烴基。於與黏著劑之相溶性更優異之方面而言,烴基之碳數較佳的是1~8,更佳的是1~4。 In the formula (1A), R 11a and R 15a each independently represent a hydrogen atom or a hydrocarbon group having an oxygen atom and having 1 to 20 carbon atoms. The carbon number of the hydrocarbon group is preferably from 1 to 8, more preferably from 1 to 4, in terms of being more excellent in compatibility with the adhesive.
可包含氧原子之烴基更具體而言可列舉可包含氧原子之脂肪族烴基、可包含氧原子之芳香族烴基、或這些基組合而成之基。 脂肪族烴基可為直鏈狀、分支鏈狀、環狀之任意者。 More specifically, the hydrocarbon group which may contain an oxygen atom may be an aliphatic hydrocarbon group which may contain an oxygen atom, an aromatic hydrocarbon group which may contain an oxygen atom, or a combination of these groups. The aliphatic hydrocarbon group may be any of a linear chain, a branched chain, and a cyclic group.
而且,烴基中可包含氧原子。於包含氧原子之情形時,可以例如-O-、-COO-等連結基之形式而包含。 Further, an oxygen atom may be contained in the hydrocarbon group. In the case of containing an oxygen atom, it may be contained in the form of a linking group such as -O- or -COO-.
較佳的是R12a及R14a分別獨立地表示氫原子、或可包含氧原子之碳數為1~10之烴基。於與黏著劑之相溶性更優異之方面而言,烴基之碳數較佳的是2~9,更佳的是3~8。 It is preferred that R 12a and R 14a each independently represent a hydrogen atom or a hydrocarbon group having 1 to 10 carbon atoms which may include an oxygen atom. The carbon number of the hydrocarbon group is preferably from 2 to 9, more preferably from 3 to 8, in terms of being more excellent in compatibility with the adhesive.
較佳的是R13a表示羥基、或可包含氧原子之碳數為1~20之烴基(例如-O-Ra)。Ra表示碳數為1~20之烴基。於與黏著劑之相溶性更優異之方面而言,R13a及Ra所表示之烴基之碳數較佳的是1~18,更佳的是1~15。 It is preferred that R 13a represents a hydroxyl group or a hydrocarbon group having a carbon number of 1 to 20 which may contain an oxygen atom (for example, -OR a ). R a represents a hydrocarbon group having 1 to 20 carbon atoms. The carbon number of the hydrocarbon group represented by R 13a and R a is preferably from 1 to 18, more preferably from 1 to 15, in terms of being more excellent in compatibility with the adhesive.
R11a~R15a可分別相互鍵結而形成環。亦即,R11a~R15a中之任意2個可相互鍵結而形成環。例如,如R11a與R12a、R12a與R13a、R13a與R14a、或R14a與R15a等這樣鄰接之2個基可分別鍵結而形成環。 R 11a to R 15a may be bonded to each other to form a ring. That is, any two of R 11a to R 15a may be bonded to each other to form a ring. For example, two groups such as R 11a and R 12a , R 12a and R 13a , R 13a and R 14a , or R 14a and R 15a may be bonded to each other to form a ring.
所形成之環之種類並無特別限制,例如可列舉5員環~6員環結構。 The type of the ring to be formed is not particularly limited, and examples thereof include a 5-membered ring to a 6-membered ring structure.
式(2A)中,R16a~R23a各自獨立地表示氫原子、羥基、 或可包含雜原子之碳數為1~20之烴基。 In the formula (2A), R 16a to R 23a each independently represent a hydrogen atom, a hydroxyl group, or a hydrocarbon group having a carbon number of 1 to 20 which may contain a hetero atom.
R16a~R23a所表示之烴基之適宜範圍與上述之R11a~R15a所表示之烴基之適宜範圍相同。 The suitable range of the hydrocarbon group represented by R 16a to R 23a is the same as the suitable range of the hydrocarbon group represented by the above R 11a to R 15a .
而且,R16a~R23a之各基之分子量之合計為24以上。其中,較佳的是35以上。另外,上限並無特別限制,於本發明的效果更優異之方面而言,較佳的是1000以下,更佳的是500以下,進一步更佳的是300以下。而且,R16a~R23a可任意2個相互鍵結而形成環。 Further, the total molecular weight of each of R 16a to R 23a is 24 or more. Among them, it is preferably 35 or more. Further, the upper limit is not particularly limited, and is preferably 1,000 or less, more preferably 500 or less, still more preferably 300 or less in terms of the effect of the present invention being more excellent. Further, R 16a to R 23a may be bonded to each other to form a ring.
R24a表示氫原子或可包含雜原子之碳數為1~20之烴基。 R 24a represents a hydrogen atom or a hydrocarbon group having a carbon number of 1 to 20 which may contain a hetero atom.
式(2A)中,較佳的是R16a、R23a及R24a分別獨立地表 示氫原子、或可包含氧原子之碳數為1~20之烴基。R16a、R23a及R24a所表示之可包含氧原子之烴基之適宜範圍與上述之R11a及R15a所表示之可包含氧原子之烴基之適宜範圍相同。 In the formula (2A), R 16a , R 23a and R 24a each independently represent a hydrogen atom or a hydrocarbon group having an oxygen atom and having 1 to 20 carbon atoms. The suitable range of the hydrocarbon group which may contain an oxygen atom represented by R 16a , R 23a and R 24a is the same as the suitable range of the hydrocarbon group which may contain an oxygen atom represented by R 11a and R 15a described above.
較佳的是R17a、R19a、R20a及R22a分別獨立地表示氫原子、或可包含氧原子之碳數為1~10之烴基。R17a、R19a、R20a及R22a所表示之可包含氧原子之烴基之適宜範圍與上述之R12a及R14a所表示之可包含氧原子之烴基之適宜範圍相同。 It is preferred that R 17a , R 19a , R 20a and R 22a each independently represent a hydrogen atom or a hydrocarbon group having 1 to 10 carbon atoms which may contain an oxygen atom. The suitable range of the hydrocarbon group which may contain an oxygen atom represented by R 17a , R 19a , R 20a and R 22a is the same as the suitable range of the hydrocarbon group which may contain an oxygen atom represented by R 12a and R 14a described above.
R18a及R21a分別獨立地表示羥基、或可包含氧原子之碳數為1~20之烴基(例如-O-Ra)。Ra表示碳數為1~20之烴基。R18a及R21a所表示之烴基之適宜範圍與上述之R13a及Ra所表示之烴基之適宜範圍相同。 R 18a and R 21a each independently represent a hydroxyl group or a hydrocarbon group having 1 to 20 carbon atoms (for example, -OR a ) which may include an oxygen atom. R a represents a hydrocarbon group having 1 to 20 carbon atoms. Suitable same appropriate range R 18a and R 21a are represented by the above-described hydrocarbon groups of R 13a and the hydrocarbon group represented by R a scope.
式(3A)中,R25a~R28a各自獨立地表示氫原子、羥基、 或可包含雜原子之碳數為1~20之烴基。 In the formula (3A), R 25a to R 28a each independently represent a hydrogen atom, a hydroxyl group, or a hydrocarbon group having a carbon number of 1 to 20 which may contain a hetero atom.
R25a~R28a所表示之烴基之適宜範圍與上述之R11a~R15a所表示之烴基之適宜範圍相同。 The suitable range of the hydrocarbon group represented by R 25a to R 28a is the same as the suitable range of the hydrocarbon group represented by the above R 11a to R 15a .
而且,R25a~R28a之各基之分子量之合計為40以上。其中,較佳的是50以上。另外,上限並無特別限制,於本發明的效果更優異之方面而言,較佳的是1000以下,更佳的是500以下,進一步更佳的是300以下。 Further, the total molecular weight of each of R 25a to R 28a is 40 or more. Among them, it is preferably 50 or more. Further, the upper limit is not particularly limited, and is preferably 1,000 or less, more preferably 500 or less, still more preferably 300 or less in terms of the effect of the present invention being more excellent.
而且,R25a~R28a可任意2個相互鍵結而形成環。 Further, R 25a to R 28a may be bonded to each other to form a ring.
L表示可具有雜原子之2價或3價之烴基、-S-、或這些基組合而成之基。於與絕緣樹脂之相溶性更優異之方面而言,2價之烴基之碳數較佳的是1~12,更佳的是1~10。 L represents a divalent or trivalent hydrocarbon group which may have a hetero atom, -S-, or a combination of these groups. The carbon number of the divalent hydrocarbon group is preferably from 1 to 12, more preferably from 1 to 10, in terms of being more excellent in compatibility with the insulating resin.
m表示2或3之整數。 m represents an integer of 2 or 3.
式(3A)中,較佳的是R25a~R28a分別獨立地表示氫原 子、或可包含氧原子之碳數為1~20之烴基。R25a~R28a所表示之可包含氧原子之烴基之適宜範圍與上述之R11a及R15a所表示之可包含氧原子之烴基之適宜範圍相同。 In the formula (3A), it is preferred that R 25a to R 28a each independently represent a hydrogen atom or a hydrocarbon group having an oxygen atom and having 1 to 20 carbon atoms. The suitable range of the hydrocarbon group which may contain an oxygen atom represented by R 25a to R 28a is the same as the suitable range of the hydrocarbon group which may contain an oxygen atom represented by R 11a and R 15a described above.
較佳的是L表示可具有氧原子之2價或3價之烴基、-S-、或這些基組合而成之基。烴基中所含之碳原子數並無特別限制,較佳的是1~40,更佳的是2~20。烴基可為直鏈狀、分支狀、環狀、或包含芳香族之形態的任意者,可列舉脂肪族烴基或芳香族烴基。另外,氧原子可以例如-O-、-COO-等連結基之形式包含於上述烴基中。 Preferably, L represents a divalent or trivalent hydrocarbon group which may have an oxygen atom, -S-, or a combination of these groups. The number of carbon atoms contained in the hydrocarbon group is not particularly limited, and is preferably from 1 to 40, more preferably from 2 to 20. The hydrocarbon group may be any of a linear form, a branched form, a cyclic form, or an aromatic form, and examples thereof include an aliphatic hydrocarbon group or an aromatic hydrocarbon group. Further, the oxygen atom may be contained in the above hydrocarbon group in the form of a linking group such as -O- or -COO-.
式(1A)中之R13a、式(2A)中之R18a及R21a之適宜 形態可列舉式(4)所表示之基。 A suitable form of R 13a in the formula (1A) and R 18a and R 21a in the formula (2A) is a group represented by the formula (4).
式(4A)*-CH2-R32a Formula (4A)*-CH 2 -R 32a
R32a表示氫原子或碳數為1~19之烴基。於與黏著劑之相溶性更優異之方面而言,R32a所表示之烴基之碳數較佳的是1~15,更佳的是1~12。*表示鍵結位置。 R 32a represents a hydrogen atom or a hydrocarbon group having 1 to 19 carbon atoms. The carbon number of the hydrocarbon group represented by R 32a is preferably from 1 to 15, more preferably from 1 to 12, in terms of being more excellent in compatibility with the adhesive. * indicates the bonding position.
還原性化合物中,於離子遷移抑制能力更優異之方面而 言,可適宜列舉式(5)所表示之化合物。 Among the reducing compounds, the ion migration inhibition ability is more excellent. In other words, a compound represented by the formula (5) can be suitably used.
式(5A)中,R11a、R14a、R15a之定義與式(1A)中之 各基之定義相同。 In the formula (5A), the definitions of R 11a , R 14a and R 15a are the same as those of the group in the formula (1A).
式(5A)中,R40a及R41a分別獨立地表示氫原子、羥基、可包含氧原子之脂肪族烴基、可包含氧原子之芳香族烴基。其中,於離子遷移抑制能力更優異之方面而言,較佳的是包含3級碳原子或4級碳原子之烷基。 In the formula (5A), R 40a and R 41a each independently represent a hydrogen atom, a hydroxyl group, an aliphatic hydrocarbon group which may contain an oxygen atom, and an aromatic hydrocarbon group which may contain an oxygen atom. Among them, an alkyl group containing a 3-stage carbon atom or a 4-stage carbon atom is preferred in terms of more excellent ion mobility-inhibiting ability.
脂肪族烴基或芳香族烴基中所含之碳原子數並無特別限制, 更佳的是2~20。特佳的是R40a是碳原子數為1個~5個之烷基、R41a是碳原子數為10個~20個之烷基。 The number of carbon atoms contained in the aliphatic hydrocarbon group or the aromatic hydrocarbon group is not particularly limited, and more preferably 2 to 20. Particularly preferably, R 40a is an alkyl group having 1 to 5 carbon atoms, and R 41a is an alkyl group having 10 to 20 carbon atoms.
較佳的是R11a、R15a、R40a及R41a中之至少一個中所含 之碳原子數為1~20。若碳原子數為上述範圍內,則於黏著劑中之溶解性提高,化合物之分散性提高,其結果銀之離子遷移抑制能力提高。其中,碳原子數較佳的是8~20,更佳的是10~18。 It is preferred that at least one of R 11a , R 15a , R 40a and R 41a has 1 to 20 carbon atoms. When the number of carbon atoms is within the above range, the solubility in the adhesive is improved, and the dispersibility of the compound is improved, and as a result, the ion mobility inhibition ability of silver is improved. Among them, the number of carbon atoms is preferably from 8 to 20, more preferably from 10 to 18.
而且,較佳的是R11a、R15a、R40a及R41a之各基中所含 之碳原子數之合計為4以上。若碳原子之合計數為該範圍,則銀之離子遷移得到抑制,金屬配線間之絕緣可靠性提高。另外,於該效果更優異之方面而言,合計數較佳的是8以上,更佳的是10以上。另外,上限並無特別限制,自合成更容易,於黏著劑中之分散性更優異之方面而言,合計數較佳的是50以下,更佳的是40以下。 Further, it is preferred that the total number of carbon atoms contained in each of R 11a , R 15a , R 40a and R 41a is 4 or more. When the total number of carbon atoms is in this range, ion migration of silver is suppressed, and insulation reliability between metal wirings is improved. Further, in terms of the effect being more excellent, the total number of counts is preferably 8 or more, and more preferably 10 or more. In addition, the upper limit is not particularly limited, and it is easier to synthesize from the synthesis, and the total number of the adhesives is preferably 50 or less, and more preferably 40 or less.
(黏著劑) (adhesive)
黏著劑並無特別限定,若為顯示黏著性之材料(例如黏著性樹脂)則可使用公知之材料。例如可使用橡膠系黏著劑、丙烯酸系黏著劑、矽酮系黏著劑、胺基甲酸酯系黏著劑等各種黏著劑,於透明性更優異且與還原性化合物之相溶性更優異之方面而言,較佳的是丙烯酸系黏著劑。 The adhesive is not particularly limited, and a known material can be used as a material exhibiting adhesiveness (for example, an adhesive resin). For example, various adhesives such as a rubber-based adhesive, an acrylic adhesive, an anthrone-based adhesive, and a urethane-based adhesive can be used, and the transparency is more excellent and the compatibility with the reducing compound is more excellent. In other words, an acrylic adhesive is preferred.
丙烯酸系黏著劑將以(甲基)丙烯酸烷基酯之單體單元為 主骨架之丙烯酸系聚合物作為基礎聚合物。另外,(甲基)丙烯酸酯是指丙烯酸酯及/或甲基丙烯酸酯。構成丙烯酸系聚合物之主骨架 的(甲基)丙烯酸烷基酯之烷基的平均碳數較佳的是1~12左右,(甲基)丙烯酸烷基酯之具體例可例示(申基)丙烯酸甲酯、(甲基)丙烯酸乙酯、(甲基)丙烯酸丁酯、(甲基)丙烯酸-2-乙基己酯等。 The acrylic adhesive will be a monomer unit of alkyl (meth)acrylate. The acrylic polymer of the main skeleton serves as a base polymer. Further, (meth) acrylate means acrylate and/or methacrylate. The main skeleton constituting the acrylic polymer The average carbon number of the alkyl group of the (meth)acrylic acid alkyl ester is preferably about 1 to 12, and specific examples of the alkyl (meth)acrylate may be exemplified by methyl (meth) acrylate and (methyl). Ethyl acrylate, butyl (meth)acrylate, 2-ethylhexyl (meth)acrylate, and the like.
透明黏著片可為僅僅包含透明黏著層的不包含基材之 類型(無基材之透明黏著片),可為於基材之至少一個主表面配置有透明黏著層之包含基材之類型(附有基材之透明黏著片。例如於基材之雙面具有黏著層之附有基材之透明雙面黏著片、僅僅於基材之單面具有黏著層之附有基材之透明單面黏著片)。其中,自使用黏著片之產品的薄膜化之觀點考慮,較佳的是無基材之透明雙面黏著片。 The transparent adhesive sheet may be a substrate containing only a transparent adhesive layer. Type (transparent adhesive sheet without substrate), which may be a type comprising a substrate with a transparent adhesive layer disposed on at least one main surface of the substrate (a transparent adhesive sheet with a substrate attached thereto, for example, on both sides of the substrate) A transparent double-sided adhesive sheet with a substrate attached to the adhesive layer, and a transparent single-sided adhesive sheet with an adhesive layer only on one side of the substrate. Among them, from the viewpoint of film formation of a product using an adhesive sheet, a transparent double-sided adhesive sheet having no substrate is preferable.
於透明黏著片為附有基材之透明黏著片之情形時,所使 用之基材之種類並無特別限制,較佳的是使用透明基材。透明基材例如可列舉聚對苯二甲酸乙二酯膜、聚對苯二甲酸丁二酯膜、聚萘二甲酸乙二酯膜、聚乙烯膜、聚丙烯膜、玻璃紙(cellophane)、二乙醯纖維素膜、三乙醯纖維素膜、乙醯基纖維素丁酸酯膜、聚氯乙烯膜、聚偏二氯乙烯膜、聚乙烯醇膜、乙烯-乙酸乙烯酯共聚物膜、聚苯乙烯膜、聚碳酸酯膜、聚甲基戊烯膜、聚碸膜、聚醚醚酮膜、聚醚碸膜、聚醚醯亞胺膜、聚醯亞胺膜、氟樹脂膜、尼龍膜、丙烯酸樹脂膜等。 When the transparent adhesive sheet is a transparent adhesive sheet with a substrate attached thereto, The type of the substrate to be used is not particularly limited, and a transparent substrate is preferably used. Examples of the transparent substrate include a polyethylene terephthalate film, a polybutylene terephthalate film, a polyethylene naphthalate film, a polyethylene film, a polypropylene film, a cellophane, and a second film. Cellulose film, triethylene glycol film, ethylene glycol cellulose butyrate film, polyvinyl chloride film, polyvinylidene chloride film, polyvinyl alcohol film, ethylene-vinyl acetate copolymer film, polyphenylene a vinyl film, a polycarbonate film, a polymethylpentene film, a polyfluorene film, a polyether ether ketone film, a polyether ruthenium film, a polyether quinone film, a polyimide film, a fluororesin film, a nylon film, Acrylic resin film, etc.
透明黏著片中所含之透明黏著層是於以下之環境試驗 中時間X顯示12小時以下之透明黏著層。其中,於透明黏著層之離子遷移抑制能力更優異之方面而言,較佳的是上述時間X不足 6小時。 The transparent adhesive layer contained in the transparent adhesive sheet is tested in the following environment. The medium time X shows a transparent adhesive layer of less than 12 hours. Among them, in terms of the ion mobility inhibition ability of the transparent adhesive layer being more excellent, it is preferable that the above time X is insufficient. 6 hours.
於上述時間X超過12小時之情形時,離子遷移抑制能力差。 When the above time X exceeds 12 hours, the ion migration inhibiting ability is poor.
作為環境試驗,首先將包含上述還原性化合物與規定之黏著劑的透明黏著層(長5 cm×寬4 cm×厚50 μm)設置於玻璃基板上,於透明黏著層上配置PET基板(50 μm)而製作評價樣品。其後,將評價樣品於65℃、95%RH之條件下放置72小時。其後,取出評價樣品,於23℃、50%RH之環境下進行放置。其後,使用村上色彩技術研究所(Murakami Color Research Laboratory)製造之「HR-100型」而測定評價樣品中之透明黏著層之霧度,測定直至霧度達到3%以下之時間X。 As an environmental test, a transparent adhesive layer (length 5 cm × width 4 cm × thickness 50 μm) containing the above-mentioned reducing compound and a predetermined adhesive was first placed on a glass substrate, and a PET substrate (50 μm) was placed on the transparent adhesive layer. ) An evaluation sample was produced. Thereafter, the evaluation sample was allowed to stand under the conditions of 65 ° C and 95% RH for 72 hours. Thereafter, the evaluation sample was taken out and placed in an environment of 23 ° C and 50% RH. Then, the haze of the transparent adhesive layer in the evaluation sample was measured using "HR-100 type" manufactured by Murakami Color Research Laboratory, and the time X until the haze reached 3% or less was measured.
透明黏著層中之上述還原性化合物之質量(A)與上述 黏著劑之質量(B)的質量比(A/B)並無特別限制,於黏著層之離子遷移抑制能力與耐白化性更優異之方面而言,較佳的是0.0001~0.20,更佳的是0.0005~0.10。 The quality (A) of the above-mentioned reducing compound in the transparent adhesive layer and the above The mass ratio (A/B) of the mass (B) of the adhesive is not particularly limited, and is preferably 0.0001 to 0.20, more preferably in terms of ion mobility inhibition ability and whitening resistance of the adhesive layer. It is 0.0005~0.10.
透明黏著片之總透光率並無特別限制,較佳的是80%以 上(更佳的是85%以上、進一步更佳的是90%以上)。 The total light transmittance of the transparent adhesive sheet is not particularly limited, and it is preferably 80%. Upper (more preferably 85% or more, and even more preferably 90% or more).
另外,總透光率可使用村上色彩技術研究所製造之「HR-100型」而測定。 In addition, the total light transmittance can be measured using "HR-100 type" manufactured by Murakami Color Technology Research Institute.
透明黏著片中之透明黏著層之厚度並無特別限制,於將 黏著片應用於觸控面板中之方面而言,較佳的是5 μm~250 μm,更佳的是20 μm~200 μm。 The thickness of the transparent adhesive layer in the transparent adhesive sheet is not particularly limited, and The adhesive sheet is preferably used in the touch panel of 5 μm to 250 μm, more preferably 20 μm to 200 μm.
藉由使透明黏著層之厚度為20 μm以上而獲得可覆蓋所貼附 之基板之階差或凹凸的效果;藉由使透明黏著層之厚度為250 μm以下而獲得可充分確保透明黏著片之透過率之效果。 Coverage can be obtained by making the thickness of the transparent adhesive layer 20 μm or more The effect of the step or the unevenness of the substrate; the effect of sufficiently ensuring the transmittance of the transparent adhesive sheet can be obtained by making the thickness of the transparent adhesive layer 250 μm or less.
上述透明黏著片可藉由公知之方法而製造。例如於無基 材之透明雙面黏著片之情形時,可藉由如下之方式而製作透明雙面黏著片:以乾燥後之厚度成為規定厚度之方式將包含上述還原性化合物及黏著劑之黏著劑組成物塗佈於分隔件(剝離襯墊)上而設置黏著劑組成物之塗佈層後,對該塗佈層進行乾燥,視需要進行硬化而形成透明黏著層。 The above transparent adhesive sheet can be produced by a known method. For example, without base In the case of a transparent double-sided adhesive sheet, a transparent double-sided adhesive sheet can be produced by coating an adhesive composition containing the above-mentioned reducing compound and an adhesive in a manner to have a thickness after drying to a predetermined thickness. After the coating layer of the adhesive composition is placed on the separator (release liner), the coating layer is dried and, if necessary, cured to form a transparent adhesive layer.
而且,附有基材之透明雙面黏著片之情形時,可藉由將包含上述還原性化合物及黏著劑之黏著劑組成物直接塗佈於基材表面進行乾燥而設置透明黏著層(直印法),可藉由與上述同樣地於分隔件上形成包含上述化合物之透明黏著層之後,與基材進行轉印(貼合)而於基材上設置透明黏著層(轉印法)。另外,於塗佈於分隔件(剝離襯墊)上之後,可藉由於塗佈面上貼附分隔件,照射紫外線而進行硬化。於此情形時,一般添加光聚合起始劑。 Further, in the case of the transparent double-sided adhesive sheet to which the substrate is attached, the transparent adhesive layer can be provided by directly applying the adhesive composition containing the above-mentioned reducing compound and the adhesive to the surface of the substrate to be dried. In the same manner as described above, a transparent adhesive layer containing the above compound is formed on the separator, and then transferred (bonded) to the substrate to form a transparent adhesive layer on the substrate (transfer method). Further, after being applied to the separator (release liner), it can be cured by irradiating ultraviolet rays by attaching a separator to the coated surface. In this case, a photopolymerization initiator is generally added.
[配線基板] [Wiring substrate]
其次,參照圖式對本發明的第2實施方式之配線基板之適宜形態加以詳述。 Next, a suitable form of the wiring board according to the second embodiment of the present invention will be described in detail with reference to the drawings.
圖7表示配線基板之一實施方式之示意性剖面圖,配線基板10包含:絕緣基板12、絕緣基板12上所配置之金屬配線14、覆蓋金屬配線14之透明黏著層19。另外,絕緣基板12與金屬配線14構成附有金屬配線之絕緣基板16。 FIG. 7 is a schematic cross-sectional view showing an embodiment of a wiring board including an insulating substrate 12, a metal wiring 14 disposed on the insulating substrate 12, and a transparent adhesive layer 19 covering the metal wiring 14. Further, the insulating substrate 12 and the metal wiring 14 constitute an insulating substrate 16 to which metal wiring is attached.
以下,對各構件(絕緣基板12、金屬配線14、透明黏著層19)加以詳述。 Hereinafter, each member (the insulating substrate 12, the metal wiring 14, and the transparent adhesive layer 19) will be described in detail.
(絕緣基板) (insulated substrate)
絕緣基板為絕緣性,若為可支撐金屬配線者,則其種類並無特別限制。例如可使用有機基板、陶瓷基板、玻璃基板等。 The insulating substrate is insulative, and the type of the insulating substrate is not particularly limited. For example, an organic substrate, a ceramic substrate, a glass substrate, or the like can be used.
而且,絕緣基板可為積層有選自由有機基板、陶瓷基板、及玻璃基板所構成之群組的至少2個基板之結構。 Further, the insulating substrate may have a structure in which at least two substrates selected from the group consisting of an organic substrate, a ceramic substrate, and a glass substrate are laminated.
有機基板之材料可列舉樹脂,例如較佳的是使用熱硬化 性樹脂、熱塑性樹脂、或這些混合而成之樹脂。熱硬化性樹脂例如可列舉酚樹脂、脲樹脂、三聚氰胺樹脂、醇酸樹脂、丙烯酸樹脂、不飽和聚酯樹脂、鄰苯二甲酸二烯丙酯樹脂、環氧樹脂、矽酮樹脂、呋喃樹脂、酮樹脂、二甲苯樹脂、苯并環丁烯樹脂等。 熱塑性樹脂例如可列舉聚醯亞胺樹脂、聚苯醚樹脂、聚苯硫醚樹脂、聚芳醯胺樹脂、液晶聚合物等。 The material of the organic substrate may be exemplified by a resin, and for example, it is preferred to use heat hardening. Resin, thermoplastic resin, or a mixture of these resins. Examples of the thermosetting resin include a phenol resin, a urea resin, a melamine resin, an alkyd resin, an acrylic resin, an unsaturated polyester resin, a diallyl phthalate resin, an epoxy resin, an anthrone resin, a furan resin, and the like. A ketone resin, a xylene resin, a benzocyclobutene resin or the like. Examples of the thermoplastic resin include a polyimide resin, a polyphenylene ether resin, a polyphenylene sulfide resin, a polyarylamine resin, a liquid crystal polymer, and the like.
另外,有機基板之材料可使用玻璃織布、玻璃不織布、聚芳醯胺織布、聚芳醯胺不織布、芳香族聚醯胺織布或者於這些中含浸有上述樹脂之材料等。 Further, as the material of the organic substrate, a glass woven fabric, a glass nonwoven fabric, a polyarsenide woven fabric, a polyarylamine nonwoven fabric, an aromatic polyamide woven fabric, or a material in which the above resin is impregnated may be used.
(金屬配線) (metal wiring)
金屬配線主要包含銀。可以銀合金之形態而包含銀,於金屬配線包含銀合金之情形時,銀以外之所含有的金屬例如可列舉錫、鈀、金、鎳、鉻等。另外,於金屬配線中,可於不損及本發明的效果之範圍內包含黏合劑等樹脂成分或感光性化合物等,可 進一步視需要包含其他成分。 The metal wiring mainly contains silver. Silver may be contained in the form of a silver alloy. When the metal wiring contains a silver alloy, examples of the metal other than silver include tin, palladium, gold, nickel, chromium, and the like. In addition, in the metal wiring, a resin component such as a binder or a photosensitive compound may be contained in a range that does not impair the effects of the present invention. Further ingredients are included as needed.
而且,較佳的是金屬配線含有包含銀或銀合金之金屬奈米線。另外,於後段對金屬奈米線加以詳述。 Moreover, it is preferred that the metal wiring contains a metal nanowire containing silver or a silver alloy. In addition, the metal nanowire is described in detail in the latter stage.
金屬配線之形成方法並無特別限制,可列舉蒸鍍法、濺 鍍法等物理性成膜法、或CVD法等化學性氣相法、塗佈含有銀奈米粒子或銀奈米線之銀漿而形成之方法、日本專利特開2009-188360號中所揭示之利用銀鹽之方法等。 The method of forming the metal wiring is not particularly limited, and examples thereof include a vapor deposition method and a sputtering method. A physical film forming method such as a plating method, or a chemical vapor phase method such as a CVD method, or a method of applying a silver paste containing silver nanoparticles or a silver nanowire, and disclosed in Japanese Patent Laid-Open Publication No. 2009-188360 The method of using silver salt and the like.
於絕緣基板上配置多個金屬配線,鄰接之金屬配線間之 距離(間隔)之最小值不足50 μm。換而言之,包含至少1處以上鄰接之金屬配線間之距離不足50 μm之部分(區域)。藉由將金屬配線間之距離設為上述範圍,可製造更高密度地積體有金屬配線之配線基板。其中,自進一步提高金屬配線之積體度之方面考慮,較佳的是鄰接之金屬配線間之距離(間隔)之最小值不足40 μm。 Having a plurality of metal wirings disposed on the insulating substrate, adjacent to the metal wiring The minimum distance (interval) is less than 50 μm. In other words, a portion (region) having a distance of at least one or more adjacent metal wirings of less than 50 μm. By setting the distance between the metal wirings to the above range, it is possible to manufacture a wiring board in which metal wiring is formed at a higher density. Among them, from the viewpoint of further increasing the total thickness of the metal wiring, it is preferable that the minimum value (distance) between the adjacent metal wirings is less than 40 μm.
而且,金屬配線間之距離之最小值滿足上述範圍即可,可為50 μm以上之距離(間隔)。 Further, the minimum value of the distance between the metal wirings may satisfy the above range, and may be a distance (interval) of 50 μm or more.
金屬配線間之平均間隔並無特別限制,自配線基板之高 積體化之方面考慮,進一步更佳的是0.1 μm~60 μm,特佳的是0.2 μm~50 μm。另外,此處所謂平均間隔是測定20處以上之任意位置之金屬配線間之間隔,對這些間隔進行算術平均所得之值。 The average interval between the metal wiring closets is not particularly limited, and the height of the wiring board is high. In terms of integration, it is further preferably 0.1 μm to 60 μm, and particularly preferably 0.2 μm to 50 μm. In addition, the average interval here is a value obtained by arithmetically averaging the intervals between the metal wirings at arbitrary positions of 20 or more.
較佳的是金屬配線之每單位面積中所含之銀量為50 μg/mm2以下。藉由使銀量為上述範圍,變得可減小金屬配線之膜厚及寬度,可應對高密度積體化之迫切期望。其中,銀量較佳的 是30 μg/mm2以下,更佳的是15 μg/mm2以下。關於下限,並無特別限制,於金屬配線之導電特性更優異之方面而言,較佳的是0.001 μg/mm2以上,更佳的是0.005 μg/mm2以上。 It is preferable that the amount of silver contained per unit area of the metal wiring is 50 μg/mm 2 or less. By setting the amount of silver to the above range, the film thickness and width of the metal wiring can be made small, and the high-density integrated product can be expected. Among them, the amount of silver is preferably 30 μg/mm 2 or less, more preferably 15 μg/mm 2 or less. The lower limit is not particularly limited, and is preferably 0.001 μg/mm 2 or more, and more preferably 0.005 μg/mm 2 or more, from the viewpoint of further excellent electrical conductivity of the metal wiring.
另外,於金屬配線中所含之銀量少之情形時,若產生離子遷移,則形成金屬配線之銀會溶出,因此變得容易產生金屬配線之斷線。然而,於本發明的第2實施方式中,藉由包含規定還原性化合物之透明樹脂層覆蓋金屬配線,由此可抑制銀之離子遷移,抑制金屬配線之斷線。 In addition, when the amount of silver contained in the metal wiring is small, if ion migration occurs, silver which forms the metal wiring is eluted, and thus the disconnection of the metal wiring is likely to occur. In the second embodiment of the present invention, the metal wiring is covered with a transparent resin layer containing a predetermined reducing compound, whereby ion migration of silver can be suppressed, and disconnection of the metal wiring can be suppressed.
銀量之測定方法並無特別限制,可採用公知之方法。例 如,可藉由觀察金屬配線之剖面SEM相片進行元素分析而測定銀量。而且,可使金屬配線與硝酸等強酸接觸,使金屬配線中之銀溶解,根據所溶解之量測定銀量。而且,於使用包含銀奈米線或銀奈米粒子之分散液而製作金屬配線之情形時,可根據製作金屬配線時所使用之分散液之量,藉由計算而求出金屬配線中之銀量。 The method for measuring the amount of silver is not particularly limited, and a known method can be employed. example For example, the amount of silver can be determined by performing elemental analysis by observing a cross-sectional SEM photograph of a metal wiring. Further, the metal wiring can be brought into contact with a strong acid such as nitric acid to dissolve the silver in the metal wiring, and the amount of silver can be measured based on the amount dissolved. Further, when a metal wiring is produced by using a dispersion containing silver nanowires or silver nanoparticles, the silver in the metal wiring can be calculated by calculation based on the amount of the dispersion used in the production of the metal wiring. the amount.
而且,所謂金屬配線之每單位面積,換而言之是表示金屬配線之與絕緣基板之接觸部分的每單位面積。亦即,僅僅以金屬配線與絕緣基板之接觸部分之面積為基準而進行銀量之計算。換而言之,並不與金屬配線接觸之絕緣基板表面(例如位於金屬配線間的並不與金屬配線接觸的絕緣基板表面)之面積並不被考慮在上述金屬配線之每單位面積之計算中。因此,所謂金屬配線之每單位面積中所含之銀量是表示金屬配線與絕緣基板之接觸部分中的每單位面積(mm2)中所含之銀量。 Further, the unit area of the metal wiring is, in other words, the unit area of the contact portion of the metal wiring with the insulating substrate. That is, the calculation of the amount of silver is performed based only on the area of the contact portion between the metal wiring and the insulating substrate. In other words, the area of the surface of the insulating substrate that is not in contact with the metal wiring (for example, the surface of the insulating substrate that is not in contact with the metal wiring between the metal wirings) is not considered in the calculation of the unit area of the above metal wiring. . Therefore, the amount of silver contained in the unit area of the metal wiring is the amount of silver contained in the unit area (mm 2 ) in the contact portion between the metal wiring and the insulating substrate.
金屬配線之寬度並無特別限制,自確保配線基板之高積 體化部及引出配線部(引線配線部)之電氣可靠性之方面考慮,較佳的是0.1 μm~10000 μm,更佳的是0.1 μm~300 μm,進一步更佳的是0.1 μm~100 μm,特佳的是0.2 μm~50 μm。 The width of the metal wiring is not particularly limited, and the height of the wiring substrate is ensured. The electrical reliability of the body portion and the lead wiring portion (lead wiring portion) is preferably 0.1 μm to 10000 μm, more preferably 0.1 μm to 300 μm, still more preferably 0.1 μm to 100 μm. Particularly preferred is 0.2 μm to 50 μm.
而且,金屬配線之形狀並無特別限制,可為任意形狀。例如可列舉直線狀、曲線狀、矩形狀、圓狀等。而且,金屬配線之配置(圖案)並無特別限制,例如可列舉條紋狀。 Further, the shape of the metal wiring is not particularly limited and may be any shape. For example, a linear shape, a curved shape, a rectangular shape, a circular shape, etc. are mentioned. Further, the arrangement (pattern) of the metal wiring is not particularly limited, and examples thereof include a stripe shape.
另外,於圖1中設有2個金屬配線14,其個數並無特別限制。 通常設有多個金屬配線。 In addition, in FIG. 1, two metal wirings 14 are provided, and the number is not specifically limited. Usually, a plurality of metal wirings are provided.
金屬配線之厚度並無特別限制,自配線基板之高積體化 之方面考慮,較佳的是0.001 μm~100 μm,更佳的是0.01 μm~30 μm,進一步更佳的是0.01 μm~20 μm。 The thickness of the metal wiring is not particularly limited, and the integration of the wiring board is high. In view of the above, it is preferably 0.001 μm to 100 μm, more preferably 0.01 μm to 30 μm, still more preferably 0.01 μm to 20 μm.
於圖7中,金屬配線14可僅僅設於絕緣基板12之單面, 可設於雙面。亦即,附有金屬配線之絕緣基板16可為單面基板,可為雙面基板。於金屬配線14存在於絕緣基板12之雙面之情形時,透明黏著層19可設於雙面。 In FIG. 7, the metal wiring 14 may be provided only on one side of the insulating substrate 12. Can be set on both sides. That is, the insulating substrate 16 with the metal wiring may be a single-sided substrate, and may be a double-sided substrate. When the metal wiring 14 is present on both sides of the insulating substrate 12, the transparent adhesive layer 19 may be provided on both sides.
而且,於圖7中,金屬配線14列舉一層之配線結構為例,當然並不限定於此。例如,可藉由使用交互積層有多個金屬配線與絕緣基板之附有金屬配線之絕緣基板(多層配線基板),而製成多層配線結構之配線基板。 Further, in FIG. 7, the metal wiring 14 is exemplified by a wiring structure of one layer, and of course, it is not limited thereto. For example, a wiring board having a multilayer wiring structure can be formed by using an insulating substrate (multilayer wiring substrate) having a plurality of metal wirings and an insulating substrate with metal wiring interposed therebetween.
而且,於絕緣基板中可形成通孔。於絕緣基板之雙面設 置金屬配線之情形時,可藉由於該通孔內填充金屬(例如銀或銀 合金)而使雙面之金屬配線導通。 Further, a through hole can be formed in the insulating substrate. Double-sided on the insulating substrate In the case of metal wiring, the through hole may be filled with a metal such as silver or silver. The alloy) turns on the metal wiring on both sides.
(金屬奈米線) (metal nanowire)
金屬奈米線包含銀或銀合金。銀合金之種類如上所述。 The metal nanowire contains silver or a silver alloy. The types of silver alloys are as described above.
所謂金屬奈米線是指具有導電性、且具有與直徑(短軸方向長度)相比而言長軸方向長度足夠長之形狀者。可為實心纖維,可為中空纖維。 The metal nanowire refers to a shape having conductivity and having a sufficiently long length in the long axis direction as compared with the diameter (length in the short axis direction). It can be a solid fiber and can be a hollow fiber.
於導電性優異之方面而言,金屬奈米線之材料特佳的是 銀、或銀與其他金屬之合金。作為與銀之合金中所使用之其他金屬,可列舉鉑、鋨、鈀、銥、錫、鉍、鎳等。這些可單獨使用1種,可併用2種以上。 In terms of excellent electrical conductivity, the material of the metal nanowire is particularly good. Silver, or an alloy of silver with other metals. Examples of other metals used in the alloy with silver include platinum, rhodium, palladium, iridium, tin, iridium, nickel, and the like. These can be used alone or in combination of two or more.
金屬奈米線之平均短軸長度(有時稱為「平均短軸徑」) 為5 nm~50 nm,更佳的是5 nm~25 nm,進一步特佳的是5 nm~20 nm。 Average short axis length of metal nanowires (sometimes referred to as "average short axis diameter") It is 5 nm to 50 nm, more preferably 5 nm to 25 nm, and further preferably 5 nm to 20 nm.
藉由使平均短軸徑為5 nm以上,而使耐氧化性提高而較佳;藉由使平均短軸徑為50 nm以下,可減低金屬奈米線之散射而較佳。特別是藉由使平均短軸長度為25 nm以下,可較大程度地減低金屬奈米線之散射而更佳。 It is preferable to increase the oxidation resistance by making the average minor axis diameter 5 nm or more, and it is preferable to reduce the scattering of the metal nanowire by making the average minor axis diameter 50 nm or less. In particular, by making the average minor axis length 25 nm or less, it is preferable to reduce the scattering of the metal nanowire to a large extent.
金屬奈米線之平均短軸徑可使用穿透式電子顯微鏡(transmission electron microscope,TEM;日本電子股份有限公司製造、JEM-2000FX),對300個金屬奈米線之短軸徑進行觀察,根據其平均值求出金屬奈米線之平均短軸徑。另外,於金屬奈米線之剖面並非圓形之情形時的短軸徑,將最長者作為短軸徑。 The average short-axis diameter of the metal nanowire can be observed by a transmission electron microscope (TEM; manufactured by JEOL Ltd., JEM-2000FX), and the short axis diameters of 300 metal nanowires are observed. The average value of the metal nanowires was determined as the average minor axis diameter. Further, the short axis diameter when the cross section of the metal nanowire is not circular is the shortest diameter.
金屬奈米線之平均長軸長度(有時稱為「平均長軸徑」) 較佳的是5 μm以上,更佳的是5 μm~40 μm,進一步更佳的是5 μm~30 μm。 Average long axis length of metal nanowires (sometimes referred to as "average long axis diameter") It is preferably 5 μm or more, more preferably 5 μm to 40 μm, still more preferably 5 μm to 30 μm.
藉由使平均長軸徑為5 μm以上,金屬奈米線彼此之間接觸而變得容易形成導電性網狀物而較佳,藉由使平均長軸徑為40 μm以下,金屬奈米線彼此之間於製造時纏繞之可能性變低而較佳。 By making the average major axis diameter 5 μm or more, the metal nanowires are brought into contact with each other to easily form a conductive mesh, and the average long axis diameter is 40 μm or less, and the metal nanowire is used. The possibility of entanglement with each other at the time of manufacture becomes lower and is preferable.
金屬奈米線之平均長軸徑例如可使用穿透式電子顯微鏡(transmission electron microscope,TEM;日本電子股份有限公司製造、JEM-2000FX),對300個金屬奈米線之長軸徑進行觀察,根據其平均值求出金屬奈米線之平均長軸徑。另外,於金屬奈米線彎曲之情形時,考慮以其為弧之圓,將根據其半徑、及曲率而算出之值作為長軸徑。 For example, a transmission electron microscope (TEM; manufactured by JEOL Ltd., JEM-2000FX) can be used to observe the long axis diameter of 300 metal nanowires. The average major axis diameter of the metal nanowires was determined from the average value. Further, in the case where the metal nanowire is bent, it is considered that the value calculated from the radius and the curvature is the major axis diameter.
金屬奈米線之製造方法並無特別限制,可藉由任意之方 法而製作,較佳的是藉由於溶解有鹵素化合物與分散劑之溶劑中將金屬離子還原而製造。而且,自分散性、導電膜之經時穩定性之觀點考慮,較佳的是於形成金屬奈米線後,藉由常法進行除鹽處理。 The manufacturing method of the metal nanowire is not particularly limited, and may be by any means. The method is preferably produced by reducing a metal ion in a solvent in which a halogen compound and a dispersing agent are dissolved. Further, from the viewpoint of self-dispersibility and temporal stability of the conductive film, it is preferred to carry out desalting treatment by a usual method after forming a metal nanowire.
而且,金屬奈米線之製造方法可使用日本專利特開2009-215594號公報、日本專利特開2009-242880號公報、日本專利特開2009-299162號公報、日本專利特開2010-84173號公報、日本專利特開2010-86714號公報、日本專利特表2009-505358號公報等中所記載之方法。 In addition, Japanese Laid-Open Patent Publication No. 2009-215594, Japanese Patent Laid-Open No. 2009-242880, Japanese Patent Laid-Open No. 2009-299162, and Japanese Patent Laid-Open No. 2010-84173 The method described in Japanese Laid-Open Patent Publication No. 2010-86714, and the Japanese Patent Publication No. 2009-505358.
作為金屬奈米線之縱橫比,可視需要而適宜選擇,若為 10以上則並無特別限制,更佳的是50以上,進一步更佳的是100以上,進一步更佳的是5000以上,特佳的是10,000~100,000。所謂縱橫比,一般情況下是表示纖維狀物質之長邊與短邊之比(平均長軸徑/平均短軸徑之比)。 As the aspect ratio of the metal nanowire, it can be selected as needed, if 10 or more is not particularly limited, and more preferably 50 or more, still more preferably 100 or more, still more preferably 5,000 or more, and particularly preferably 10,000 to 100,000. The aspect ratio generally indicates the ratio of the long side to the short side of the fibrous material (ratio of the average major axis diameter to the average minor axis diameter).
縱橫比之測定方法並無特別限制,可視需要而適宜選擇,例如可列舉藉由電子顯微鏡等進行測定之方法等。 The method for measuring the aspect ratio is not particularly limited, and may be appropriately selected as necessary, and examples thereof include a method of measuring by an electron microscope or the like.
於藉由電子顯微鏡測定金屬奈米線之縱橫比之情形時,可於電子顯微鏡之1視野內進行確認即可。而且,可藉由各個分別測定金屬奈米線之平均長軸徑與平均短軸徑而估計金屬奈米線整體之縱橫比。 When the aspect ratio of the metal nanowire is measured by an electron microscope, it can be confirmed in the field of view of the electron microscope. Further, the aspect ratio of the entire metal nanowire can be estimated by measuring the average major axis diameter and the average minor axis diameter of the metal nanowires, respectively.
另外,於金屬奈米線為管狀之情形時,作為用以算出縱橫比之直徑,使用該管之外徑。 Further, when the metal nanowire is tubular, the outer diameter of the tube is used as the diameter for calculating the aspect ratio.
(透明黏著層) (transparent adhesive layer)
透明黏著層配置於附有金屬配線之絕緣基板的金屬配線側之表面,是覆蓋金屬配線表面,用以抑制金屬配線間之銀之離子遷移之層。換而言之,透明黏著層相當於銀離子擴散抑制層。 The transparent adhesive layer is disposed on the surface of the metal wiring side of the insulating substrate with the metal wiring, and is a layer covering the surface of the metal wiring to suppress ion migration of silver between the metal wirings. In other words, the transparent adhesive layer corresponds to a silver ion diffusion inhibiting layer.
另外,較佳的是於透明黏著層中實質上不含銀離子或金屬銀。若於透明黏著層中包含過剩之銀離子或金屬銀,則存在離子遷移抑制效果降低之情形。 Further, it is preferred that the transparent adhesive layer contains substantially no silver ions or metallic silver. If excessive silver ions or metallic silver are contained in the transparent adhesive layer, there is a case where the ion migration suppressing effect is lowered.
另外,所謂實質上不含銀離子或金屬銀是指透明黏著層中之銀離子或金屬銀之含量為1 μmol/l以下,更佳的是0.1 μmol/l以 下,最佳的是0 mol/l。 In addition, the term "substantially free of silver ions or metallic silver" means that the content of silver ions or metallic silver in the transparent adhesive layer is 1 μmol/l or less, more preferably 0.1 μmol/l. The best is 0 mol/l.
於透明黏著層中含有上述還原性化合物及黏著劑。各個 成分之定義如上所述。而且,透明黏著層中之還原性化合物與黏著劑之質量比與上述透明黏著片中之還原性化合物與黏著劑之質量比相同,適宜實施方式亦相同。 The above-mentioned reducing compound and adhesive are contained in the transparent adhesive layer. each The definition of the ingredients is as described above. Further, the mass ratio of the reducing compound to the adhesive in the transparent adhesive layer is the same as the mass ratio of the reducing compound to the adhesive in the transparent adhesive sheet, and the same applies to the embodiment.
透明黏著層之厚度並無特別限制,於離子遷移抑制能力 更優異之方面而言,較佳的是5 μm~1000 μm,更佳的是10 μm~500 μm。 The thickness of the transparent adhesive layer is not particularly limited, and the ion migration inhibiting ability In a more excellent aspect, it is preferably 5 μm to 1000 μm, more preferably 10 μm to 500 μm.
透明黏著層之總透光率並無特別限制,較佳的是80%以 上(更佳的是85%以上、進一步更佳的是90%以上)。 The total light transmittance of the transparent adhesive layer is not particularly limited, and it is preferably 80%. Upper (more preferably 85% or more, and even more preferably 90% or more).
另外,總透光率可使用村上色彩技術研究所製造之「HR-100型」而測定。 In addition, the total light transmittance can be measured using "HR-100 type" manufactured by Murakami Color Technology Research Institute.
透明黏著層之製造方法並無特別限制,例如存在有將包 含還原性化合物及黏著劑之黏著層形成用組成物塗佈於附有金屬配線之絕緣基板上,視需要將溶劑除去而形成透明黏著層的方法。而且,可列舉將包含還原性化合物及黏著劑之透明黏著片直接積層(貼附)於附有金屬配線之絕緣基板上的方法。 The manufacturing method of the transparent adhesive layer is not particularly limited, for example, there is a package The adhesive layer-forming composition containing a reducing compound and an adhesive is applied onto an insulating substrate with a metal wiring, and a solvent is removed as necessary to form a transparent adhesive layer. Further, a method in which a transparent adhesive sheet containing a reducing compound and an adhesive is directly laminated (attached) to an insulating substrate with metal wiring is exemplified.
可視需要於上述所得之配線基板之透明黏著層之表面 進一步設置絕緣層。藉由於樹脂層上進一步設置絕緣層,可於該絕緣層上進一步設置金屬配線而製成多層配線基板。 It may be required to be on the surface of the transparent adhesive layer of the wiring substrate obtained above. Further provide an insulating layer. By further providing an insulating layer on the resin layer, a metal wiring can be further provided on the insulating layer to form a multilayer wiring board.
自可進一步抑制金屬配線間之離子遷移之方面而言,配 線基板例如可範圍廣泛地適用於觸控面板、顯示器用電極、電磁 波遮罩、有機或無機EL顯示器用電極、電子紙、可撓性顯示器用電極、積體型太陽電池、顯示元件、其他各種元件等中。這些中特佳的是觸控面板。亦即,配線基板較佳的是於觸控面板用途中使用。更具體而言,可較佳地列舉上述配線基板中之金屬配線成為與觸控面板電極部連接之引出配線的形態。另外,所謂觸控面板電極部例如表示於靜電電容式觸控面板中,感知靜電電容之變化之感測電極部。 In terms of further inhibiting ion migration between metal wiring lines, The wire substrate can be widely applied to, for example, a touch panel, an electrode for a display, and an electromagnetic Wave mask, electrode for organic or inorganic EL display, electronic paper, electrode for flexible display, integrated solar cell, display element, various other elements, and the like. Among these, the touch panel is particularly good. That is, the wiring substrate is preferably used in a touch panel application. More specifically, it is preferable that the metal wiring in the wiring board is a lead-out wiring that is connected to the touch panel electrode portion. In addition, the touch panel electrode portion is, for example, a sensing electrode portion that senses a change in electrostatic capacitance in a capacitive touch panel.
[實施例] [Examples]
以下,藉由實施例對本發明加以更詳細之說明,本發明並不限定於這些實施例。 Hereinafter, the present invention will be described in more detail by way of examples, but the invention is not limited to these examples.
<<第1實施方式>> <<First embodiment>>
<實施例1> <Example 1>
(透明雙面黏著片之製造) (Manufacture of transparent double-sided adhesive sheet)
丙烯酸系共聚物之製備:於具有攪拌機、寒流冷凝器、溫度計、滴液漏斗及氮氣導入口之反應容器中,將丙烯酸正丁酯91.5質量份、丙烯酸-2-羥基乙酯0.5質量份、丙烯酸8.0質量份與作為聚合起始劑之2,2'-偶氮雙異丁腈0.2份溶解於乙酸乙酯100質量份中,進行氮氣置換後,於80℃下進行8小時之聚合而獲得質量平均分子量為80萬之丙烯酸系共聚物(1)。 Preparation of acrylic copolymer: 91.5 parts by mass of n-butyl acrylate, 0.5 parts by mass of 2-hydroxyethyl acrylate, acrylic acid in a reaction vessel having a stirrer, a cold flow condenser, a thermometer, a dropping funnel and a nitrogen inlet 8.0 parts by mass and 0.2 parts of 2,2'-azobisisobutyronitrile as a polymerization initiator were dissolved in 100 parts by mass of ethyl acetate, and subjected to nitrogen substitution, followed by polymerization at 80 ° C for 8 hours to obtain mass. An acrylic copolymer (1) having an average molecular weight of 800,000.
其次,將上述丙烯酸系共聚物(1)(98質量份)與上述生育酚(2質量份)用乙酸乙酯加以稀釋而獲得樹脂固形物為30%之黏著劑組成物。 Then, the acrylic copolymer (1) (98 parts by mass) and the tocopherol (2 parts by mass) were diluted with ethyl acetate to obtain an adhesive composition having a resin solid content of 30%.
於上述黏著劑組成物100重量份中添加異氰酸酯系交聯劑(日本聚胺酯公司(Nippon Polyurethane Industry Co.,Ltd.)製造之CORONATE L-45、固形物為45%)0.7重量份而進行15分鐘之攪拌後,以乾燥後之厚度成為25 μm之方式塗佈於藉由矽酮化合物對單面進行了剝離處理之厚度為50 μm之PET膜上,於75℃下進行5分鐘之乾燥。將藉由矽酮化合物對單面進行了剝離處理之厚度為38 μm之PET膜與所得之黏著片貼合。其後,於23℃下進行5日之熟化而獲得厚度為25 μm之透明雙面黏著片(無基材之黏著片)S-1。該黏著片之總透光率為90.8%,霧度為0.6%,吸水率為1.24%。總透光率、霧度及吸水率之測定方法依據日本專利特開2012-11637號公報中所記載之方法。更具體而言藉由後段所記載之方法實施測定。 To 100 parts by weight of the above-mentioned adhesive composition, 0.7 parts by weight of an isocyanate-based crosslinking agent (CORONATE L-45 manufactured by Nippon Polyurethane Industry Co., Ltd., 45% of solid content) was added for 15 minutes. After stirring, the film was applied to a PET film having a thickness of 50 μm which was subjected to a release treatment on one side by an oxime compound after drying to a thickness of 25 μm, and dried at 75 ° C for 5 minutes. A PET film having a thickness of 38 μm which was subjected to a release treatment on one side by an anthrone compound was attached to the obtained adhesive sheet. Thereafter, aging was carried out at 23 ° C for 5 days to obtain a transparent double-sided adhesive sheet (adhesive sheet without substrate) S-1 having a thickness of 25 μm. The adhesive sheet had a total light transmittance of 90.8%, a haze of 0.6%, and a water absorption of 1.24%. The method of measuring the total light transmittance, haze, and water absorption rate is based on the method described in Japanese Laid-Open Patent Publication No. 2012-11637. More specifically, the measurement is carried out by the method described in the following paragraph.
另外,相對於透明雙面黏著片總質量而言,透明雙面黏著片中之生育酚之含量為2質量%。 Further, the content of the tocopherol in the transparent double-sided adhesive sheet was 2% by mass based on the total mass of the transparent double-sided adhesive sheet.
(透明雙面黏著片之總透光率及霧度測定) (Total transmittance and haze measurement of transparent double-sided adhesive sheets)
將所得之透明雙面黏著片S-1於60℃、90%RH之條件下放置100小時後,依序貼合PET膜、玻璃而製備試驗樣品。使用村上色彩技術研究所股份有限公司製造之「HR-100型」,測定製備出的樣品之總透光率及霧度(%)。 The obtained transparent double-sided adhesive sheet S-1 was allowed to stand under the conditions of 60 ° C and 90% RH for 100 hours, and then a PET film and glass were laminated in this order to prepare test samples. The total light transmittance and haze (%) of the prepared sample were measured using "HR-100 type" manufactured by Murakami Color Technology Research Co., Ltd.
(透明雙面黏著片之吸水率測定) (Measurement of water absorption of transparent double-sided adhesive sheets)
將100 mm×100 mm之雙面黏著片於60℃、90%RH之條件下放置100小時後,立即剝去透明雙面黏著片之單面之剝離膜,貼 合於預先秤量之150 mm×150 mm之不鏽鋼網(#250)上,進一步剝去另一個剝離膜而進行秤量(將自該重量減去該不鏽鋼網之重量的重量作為W1)。將其於105℃之條件下進行2小時之乾燥後進行秤量(將自該重量減去該不鏽鋼網之重量的重量作為W2)。藉由下述式而算出雙面黏著片之吸水率。 After placing the 100 mm × 100 mm double-sided adhesive sheet at 60 ° C and 90% RH for 100 hours, immediately peel off the single-sided release film of the transparent double-sided adhesive sheet. The weight was measured by subtracting the other peeling film from the pre-weighed 150 mm × 150 mm stainless steel mesh (#250) (the weight minus the weight of the stainless steel mesh was taken as W1). This was dried at 105 ° C for 2 hours, and then weighed (the weight from the weight minus the weight of the stainless steel mesh was taken as W2). The water absorption rate of the double-sided adhesive sheet was calculated by the following formula.
雙面黏著片之吸水率(%)=(W1-W2)/W2×100 Water absorption rate of double-sided adhesive sheet (%) = (W1-W2) / W2 × 100
<實施例2> <Example 2>
使用覆銅積層板(日立化成公司製造之MCL-E-679F、基板:玻璃環氧基板),藉由網版印刷法而製造包含L/S=200 μm/200 μm之銀配線的附有金屬配線之絕緣基板A。藉由以下之方法而製作附有金屬配線之絕緣基板A。 A copper-clad laminate (MCL-E-679F manufactured by Hitachi Chemical Co., Ltd., substrate: glass epoxy substrate) is used to produce a metal with a silver wiring of L/S = 200 μm / 200 μm by screen printing. Insulating substrate A of wiring. The insulating substrate A with metal wiring was produced by the following method.
藉由蝕刻處理將覆銅積層板之銅箔剝離後,使用網版印刷裝置,將導電性銀漿(藤倉化成製造之FA-451)通過金屬遮罩而於基板上圖案化。 After the copper foil of the copper-clad laminate was peeled off by an etching process, the conductive silver paste (FA-451 manufactured by Fujikura Kasei Co., Ltd.) was patterned on the substrate by a metal mask using a screen printing apparatus.
其後,於150℃之條件下進行30分鐘之加熱處理,使銀配線硬化而獲得銀配線之圖案為L/S=200 μm/200 μm之梳型銀配線基板(附有金屬配線之絕緣基板A)。 Thereafter, heat treatment was performed at 150 ° C for 30 minutes to cure the silver wiring, and a comb-type silver wiring substrate having a pattern of silver wiring of L/S = 200 μm / 200 μm (an insulating substrate with metal wiring) was obtained. A).
使用網版印刷而形成之銀配線剖面是下邊(相當於配線與基板接觸之邊)比上邊稍長之梯形狀。配線部之中心附近之平均厚度為16 μm,所使用之導電性銀漿中之銀成分量為70 wt%,作為 銀配線與絕緣基板之接觸部分中的銀配線自身之每單位面積中所含之銀量,將銀之比重設為10.5 g/cm3,算出為約24.2 μg/mm2。 另外,於計算上述每單位面積中所含之銀量時,以銀配線與絕緣基板接觸之部分的面積為基準而計算,並不考慮並不與銀配線接觸之絕緣基板表面(例如並不與銀配線接觸之銀配線間之絕緣基板表面)之面積。 The silver wiring cross section formed by screen printing is a trapezoidal shape in which the lower side (corresponding to the side where the wiring is in contact with the substrate) is slightly longer than the upper side. The average thickness near the center of the wiring portion is 16 μm, and the amount of silver component in the conductive silver paste used is 70 wt%, which is included in the unit area of the silver wiring itself in the contact portion between the silver wiring and the insulating substrate. The amount of silver was set to be 10.5 g/cm 3 in terms of the specific gravity of silver, and was calculated to be about 24.2 μg/mm 2 . Further, when calculating the amount of silver contained in each unit area, the area of the portion where the silver wiring is in contact with the insulating substrate is calculated, and the surface of the insulating substrate which is not in contact with the silver wiring is not considered (for example, The area of the insulating substrate surface of the silver wiring between the silver wiring contacts.
另外,銀量可根據金屬配線之剖面SEM相片之元素分析結果而算出。另外,根據藉由SEM觀察而觀察的所有銀粒子之圓相當徑(equivalent diameter)總面積與配線之剖面積率而算出之銀量,與根據所使用之導電性銀漿之使用量而算出之銀量的值大致相同。 Further, the amount of silver can be calculated from the elemental analysis result of the SEM photograph of the cross section of the metal wiring. Further, the amount of silver calculated based on the total area of the equivalent diameter of the silver particles observed by the SEM observation and the sectional area ratio of the wiring, and the amount of the conductive silver paste used were calculated. The value of silver is roughly the same.
(配線基板之製造) (Manufacture of wiring board)
於所得之附有金屬配線之絕緣基板A上,剝去相當於銀離子擴散抑制層之透明雙面黏著片S-1之其中一個單面上的剝離膜,將顯示黏著性之其中一方之表面作為積層面而進行貼合,進一步剝去透明雙面黏著片S-1之另一個單面上之剝離膜,於顯示黏著性之另一方之表面上貼合PET膜(膜厚:50 μm)而獲得配線基板。 其後,將所得之配線基板於45℃、0.5 MPa之條件下進行20分鐘之高壓釜處理。藉此獲得配線基板T-1。 On the insulating substrate A with the metal wiring obtained, the peeling film on one of the single sides of the transparent double-sided adhesive sheet S-1 corresponding to the silver ion diffusion suppressing layer is peeled off, and the surface of one of the adhesive faces is displayed. The film was laminated as a laminate, and the release film on the other side of the transparent double-sided adhesive sheet S-1 was further peeled off, and a PET film (film thickness: 50 μm) was bonded to the surface on the other side where adhesion was exhibited. The wiring board is obtained. Thereafter, the obtained wiring substrate was subjected to autoclave treatment at 45 ° C and 0.5 MPa for 20 minutes. Thereby, the wiring substrate T-1 is obtained.
關於所得之配線基板T-1,進行以下之壽命測定。 The following life measurement was performed about the obtained wiring board T-1.
(評價方法1(壽命延長效果測定)) (Evaluation method 1 (life extension effect measurement))
使用所得之配線基板,於濕度為90%、溫度為60度、電壓為 10 V之條件下進行壽命測定(使用裝置為愛斯佩克(ESPEC)股份有限公司製造之EHS-221MD)。 Use the resulting wiring substrate at a humidity of 90%, a temperature of 60 degrees, and a voltage of Life measurement was carried out under conditions of 10 V (the device used was EHS-221MD manufactured by ESPEC Co., Ltd.).
作為評價方法,首先並不使用生育酚地依照上述實施例1之順序而製造透明雙面黏著片S-0。該透明雙面黏著片S-0中不含生育酚。其後,於附有金屬配線之絕緣基板A上,剝去透明雙面黏著片S-0之其中一方之單面上之剝離膜,將顯示黏著性之其中一方之表面作為積層面而進行貼合,進一步剝去透明雙面黏著片之另一方之單面上之剝離膜,於顯示黏著性之另一方之表面上貼合PET膜(膜厚為50 μm)而獲得比較配線基板。使用所得之比較配線基板,於上述條件下進行壽命測定,測定直至銀配線間之電阻值低於1×105Ω之時間X。 As the evaluation method, the transparent double-sided adhesive sheet S-0 was first produced in the order of the above-described Example 1 without using tocopherol. The transparent double-sided adhesive sheet S-0 does not contain tocopherol. Then, on the insulating substrate A with the metal wiring, the release film on one side of one of the transparent double-sided adhesive sheets S-0 is peeled off, and the surface on which one of the adhesiveness is displayed is attached as a layer. Further, the release film on the other side of the other of the transparent double-sided adhesive sheets was further peeled off, and a PET film (having a film thickness of 50 μm) was bonded to the other surface on which adhesiveness was exhibited to obtain a comparative wiring substrate. Using the obtained comparative wiring board, the life measurement was performed under the above conditions, and the time X until the resistance value between the silver wirings was less than 1 × 10 5 Ω was measured.
其次,於上述條件下對配線基板T-1進行壽命測定,測定直至銀配線間之電阻值低於1×105Ω之時間Y。 Next, the life of the wiring board T-1 was measured under the above conditions, and the time Y until the resistance value between the silver wirings was less than 1 × 10 5 Ω was measured.
使用所得之時間X及時間Y計算壽命之改善效果(Y/X)。將結果示於表1中。 The life improvement effect (Y/X) was calculated using the obtained time X and time Y. The results are shown in Table 1.
<實施例3> <Example 3>
藉由日本專利特開2009-188360號之段落[0108]~段落[0120]中所記載之手法而製造包含L/S=50 μm/50 μm之銀配線的附有金屬配線之絕緣基板B。另外,金屬配線之每單位面積中所含之銀量為8.7 μg/mm2。 An insulating substrate B with a metal wiring including a silver wiring of L/S = 50 μm / 50 μm is manufactured by the method described in paragraphs [0108] to [0120] of JP-A-2009-188360. Further, the amount of silver contained per unit area of the metal wiring was 8.7 μg/mm 2 .
使用附有金屬配線之絕緣基板B代替附有金屬配線之絕緣基板A,除此以外依照與實施例1及實施例2同樣之順序而製作配 線基板T-2,實施上述評價方法1之評價。將結果示於表1中。 In the same manner as in the first embodiment and the second embodiment, the insulating substrate B with the metal wiring is used instead of the insulating substrate A with the metal wiring. The evaluation of the above evaluation method 1 was carried out on the wire substrate T-2. The results are shown in Table 1.
<實施例4> <Example 4>
(附有導電膜之透明基板之製造) (Manufacture of transparent substrate with conductive film)
準備相當於透明基板之包含PET基板(厚度為125 μm)之透明基板,依照以下之順序於透明基板上製作梳型電極圖案(L/S=200 μm/200 μm)之包含銀的導電膜。導電膜之每單位面積中所含之銀量可使用ICP-MS測定將該配線基板浸漬於硝酸中使其溶解而獲得之硝酸銀水溶液之濃度而算出,為0.014 μg/mm2。 另外,PET基板亦相當於絕緣基板。 A transparent substrate including a PET substrate (thickness: 125 μm) corresponding to a transparent substrate was prepared, and a silver-containing conductive film of a comb-shaped electrode pattern (L/S = 200 μm/200 μm) was formed on the transparent substrate in the following order. The amount of silver contained in the unit area of the conductive film can be calculated by measuring the concentration of the silver nitrate aqueous solution obtained by immersing the wiring board in nitric acid and dissolving it in an ICP-MS, and is 0.014 μg/mm 2 . Further, the PET substrate also corresponds to an insulating substrate.
(銀奈米線之水分散物之製作) (Production of water dispersion of silver nanowire)
-銀奈米線分散液(1)之製備- -Preparation of silver nanowire dispersion (1) -
於丙二醇370 g中溶解硝酸銀粉末60 g而製備硝酸銀溶液101。於丙二醇4.45 kg中添加聚乙烯吡咯啶酮(分子量為55,000)72.0 g,一面於容器之氣相部分通入氮氣一面升溫至90℃。將該液體作為反應溶液101。於保持通入氮氣之狀態下,向劇烈攪拌之反應溶液101中添加2.50 g之硝酸銀溶液101,進行1分鐘之加熱攪拌。另外,於該溶液中添加於丙二醇100 g中溶解有四丁基氯化銨11.8 g之溶液而製成反應溶液102。 A silver nitrate solution 101 was prepared by dissolving 60 g of silver nitrate powder in 370 g of propylene glycol. 72.0 g of polyvinylpyrrolidone (molecular weight: 55,000) was added to 4.45 kg of propylene glycol, and the temperature was raised to 90 ° C while introducing nitrogen gas into the gas phase portion of the vessel. This liquid was used as the reaction solution 101. To the vigorously stirred reaction solution 101, 2.50 g of a silver nitrate solution 101 was added while maintaining nitrogen gas, and the mixture was heated and stirred for 1 minute. Further, a solution of 11.8 g of tetrabutylammonium chloride dissolved in 100 g of propylene glycol was added to the solution to prepare a reaction solution 102.
向保持為90℃、以500 rpm之攪拌速度進行攪拌的反應溶液102中以50 cc/min之添加速度添加200 g之硝酸銀溶液101。將攪拌速度降至100 rpm,停止通入氮氣,進行15小時之加熱攪拌。向保持為90℃、以100 rpm之攪拌速度進行攪拌的該液體中,以 0.5 cc/min之添加速度添加220 g之硝酸銀溶液101,於添加結束後之2小時繼續加熱攪拌。將攪拌變更為500 rpm,添加蒸餾水1.0 kg後,冷卻至25℃而製作裝入液101。 200 g of the silver nitrate solution 101 was added to the reaction solution 102 which was kept at 90 ° C and stirred at a stirring speed of 500 rpm at an addition rate of 50 cc / min. The stirring speed was reduced to 100 rpm, the nitrogen gas was stopped, and heating and stirring was carried out for 15 hours. In the liquid which was kept at 90 ° C and stirred at a stirring speed of 100 rpm, 220 g of silver nitrate solution 101 was added at an addition rate of 0.5 cc/min, and heating and stirring were continued for 2 hours after the end of the addition. The stirring was changed to 500 rpm, 1.0 kg of distilled water was added, and the mixture was cooled to 25 ° C to prepare a charging liquid 101.
使用截留分子量為15萬之超濾模組,如下所述地實施超濾。 反覆進行將蒸餾水與1-丙醇之混合溶液(體積比為1比1)添加至裝入液101中並反覆進行裝入液101之濃縮以使最終所得的濾液之導電度成為50 μS/cm以下。進行濃縮而獲得金屬含量為0.45%之銀奈米線分散液(1)。 Ultrafiltration was carried out as described below using an ultrafiltration module having a molecular weight cutoff of 150,000. A mixed solution of distilled water and 1-propanol (volume ratio of 1 to 1) was repeatedly added to the charging liquid 101 and the concentration of the liquid 101 was repeated to make the conductivity of the finally obtained filtrate 50 μS/cm. the following. Concentration was carried out to obtain a silver nanowire dispersion (1) having a metal content of 0.45%.
關於所得之銀奈米線分散液(1)之銀奈米線,如上所述地進行而測定平均短軸長、平均長軸長。 The silver nanowire of the obtained silver nanowire dispersion (1) was measured as described above, and the average short axis length and the average major axis length were measured.
其結果,平均短軸長為28.5 nm,平均長軸長為15.2 μm。以後,記載為「銀奈米線分散液(1)」之情形時表示藉由上述方法而所得之銀奈米線分散液。 As a result, the average minor axis length was 28.5 nm, and the average major axis length was 15.2 μm. Hereinafter, when it is described as "silver nanowire dispersion (1)", the silver nanowire dispersion obtained by the above method is shown.
(導電膜之製作) (Production of conductive film)
將下述組成之烷氧化物化合物之溶液於60℃下進行1小時之攪拌而確認變均一。藉由GPC(聚苯乙烯換算)測定所得之溶膠-凝膠液之重量平均分子量(Mw),結果Mw為4,400。將溶膠-凝膠溶液2.24份與上述所製備之銀奈米線分散液(1)17.76份加以混合,進一步以蒸餾水與1-丙醇加以稀釋而獲得銀奈米線塗佈液(1)。所得之塗佈液之溶劑比率為蒸餾水:1-丙醇=60:40。藉由棒塗法以銀量成為0.015 g/m2、總固形物塗佈量成為0.120 g/m2之方式將銀奈米線塗佈液(1)塗佈於PET基板(厚度125 μm)上, 然後於120℃下進行1分鐘之乾燥而形成含有銀奈米線之導電膜1。 A solution of the alkoxide compound having the following composition was stirred at 60 ° C for 1 hour to confirm uniformity. The weight average molecular weight (Mw) of the obtained sol-gel solution was measured by GPC (polystyrene conversion), and the Mw was 4,400. 2.24 parts of the sol-gel solution and 17.76 parts of the silver nanowire dispersion (1) prepared above were mixed, and further diluted with distilled water and 1-propanol to obtain a silver nanowire coating liquid (1). The solvent ratio of the obtained coating liquid was distilled water: 1-propanol = 60:40. The silver nanowire coating liquid (1) was applied to a PET substrate (thickness 125 μm) by a bar coating method in such a manner that the amount of silver became 0.015 g/m 2 and the total solid coating amount was 0.120 g/m 2 . Then, it was dried at 120 ° C for 1 minute to form a conductive film 1 containing silver nanowires.
<烷氧化物化合物之溶液> <Solution of alkoxide compound>
.四乙氧基矽烷 5.0份 . Tetraethoxydecane 5.0 parts
(KBE-04、信越化學工業股份有限公司製造) (KBE-04, manufactured by Shin-Etsu Chemical Co., Ltd.)
(導電膜之圖案化) (patterning of conductive film)
藉由旋塗而於導電膜1上塗佈光阻劑(TMSMR-8900LB;東京應化製造),於90℃下進行60秒之煅燒。其次,使用光罩而進行圖案曝光(曝光量:12 mW/cm2、20秒),藉由顯影液(NMD-W;東京應化製造)進行顯影,加以水洗、使其乾燥後,於120℃下進行60秒之煅燒,於導電膜1上形成圖案化之光阻劑。 A photoresist (TMSMR-8900LB; manufactured by Tokyo Ohka Co., Ltd.) was applied onto the electroconductive film 1 by spin coating, and calcination was carried out at 90 ° C for 60 seconds. Next, pattern exposure was performed using a photomask (exposure amount: 12 mW/cm 2 , 20 seconds), and development was carried out by a developing solution (NMD-W; manufactured by Tokyo Chemical Industry Co., Ltd.), washed with water, and dried, and then dried at 120 Calcination was carried out for 60 seconds at ° C to form a patterned photoresist on the conductive film 1.
其次,於銀蝕刻液(SEA-2;關東化學製造)中浸漬30秒後,加以水洗而使其乾燥,對銀奈米線進行蝕刻,於導電膜1上形成非導電部。其後,使用中性剝離液(PK-SFR8120;派克公司(parker corporation)製造)而將光阻劑剝離,其後加以水洗、使其乾燥,製作圖案化為梳型電極圖案(L/S=200 μm/200 μm)之導電膜1。 Then, after immersing in a silver etching solution (SEA-2; manufactured by Kanto Chemical Co., Ltd.) for 30 seconds, it was washed with water and dried, and the silver nanowire was etched to form a non-conductive portion on the conductive film 1. Thereafter, the photoresist was peeled off using a neutral peeling liquid (PK-SFR8120; manufactured by Parker Corporation), and then washed with water and dried to prepare a pattern of a comb-shaped electrode (L/S = Conductive film 1 of 200 μm / 200 μm).
(導電膜積層體之製造) (Manufacture of conductive film laminate)
其次,於所得之附有導電膜之透明基板上,與實施例2同樣地進行而貼合透明雙面黏著片S-1,獲得導電膜積層體(相當於配線基板)T-3。 Then, on the transparent substrate with the conductive film obtained, the transparent double-sided adhesive sheet S-1 was bonded in the same manner as in Example 2 to obtain a conductive film laminate (corresponding to a wiring substrate) T-3.
(評價方法2(壽命延長效果測定)) (Evaluation method 2 (life extension effect measurement))
使用所得之導電膜積層體,於濕度為85%、溫度為85度、壓力為1.0 atm、電壓為100 V之條件下進行壽命測定(使用裝置為愛斯佩克股份有限公司製造之EHS-221MD)。 Using the obtained conductive film laminate, the life was measured under the conditions of a humidity of 85%, a temperature of 85 degrees, a pressure of 1.0 atm, and a voltage of 100 V (the device was EHS-221MD manufactured by ESPEC Co., Ltd.). ).
作為評價方法,首先不使用生育酚而依照上述實施例1之順序而製造透明雙面黏著片S-0。其後,於附有導電膜之透明基板上,剝去透明雙面黏著片S-0之其中一方之單面上之剝離膜,將顯示黏著性之其中一方之表面作為積層面而進行貼合,進一步剝去透明雙面黏著片之另一方之單面上之剝離膜,於顯示黏著性之另一方之表面上貼合PET膜(膜厚為50 μm)而獲得比較導電膜積層體。使用所得之比較導電膜積層體,於上述條件下進行壽命測定,測定直至導電膜間之電阻值上升10%之時間X。 As the evaluation method, the transparent double-sided adhesive sheet S-0 was first produced in the order of the above-described Example 1 without using tocopherol. Then, on the transparent substrate with the conductive film, the release film on one side of one of the transparent double-sided adhesive sheets S-0 is peeled off, and the surface on which one of the adhesive properties is displayed is laminated as a laminate. Further, the release film on the other side of the other side of the transparent double-sided adhesive sheet was further peeled off, and a PET film (film thickness: 50 μm) was bonded to the surface on the other side showing adhesiveness to obtain a comparative conductive film laminate. Using the obtained comparative conductive film laminate, the life measurement was performed under the above conditions, and the time X until the resistance value between the conductive films was increased by 10% was measured.
其次,使用導電膜積層體(亦相當於配線基板)T-3而於上述條件下進行壽命測定,測定導電膜間之電阻值上升10%之時間Y。 Next, the life of the conductive film laminate (also equivalent to the wiring substrate) T-3 was measured under the above conditions, and the time Y at which the resistance value between the conductive films was increased by 10% was measured.
使用所得之時間X及時間Y計算壽命之改善效果(Y/X)。 The life improvement effect (Y/X) was calculated using the obtained time X and time Y.
將實施例4中所得之配線基板之結果示於表1中。 The results of the wiring board obtained in Example 4 are shown in Table 1.
<實施例5> <Example 5>
使用以下之化合物A-1代替生育酚,除此以外依照與實施例1及實施例2同樣之順序而製作配線基板T-4,實施上述評價方法1之評價。將結果示於表1中。 The wiring board T-4 was produced in the same manner as in the first and second embodiments, except that the following compound A-1 was used instead of the tocopherol, and the evaluation of the evaluation method 1 was carried out. The results are shown in Table 1.
[化16]
<實施例6> <Example 6>
使用以下之化合物A-2代替生育酚,除此以外依照與實施例1及實施例2同樣之順序而製作配線基板T-5,實施上述評價方法1之評價。將結果示於表1中。 The wiring board T-5 was produced in the same manner as in the first embodiment and the second embodiment except that the following compound A-2 was used instead of the tocopherol, and the evaluation of the evaluation method 1 was carried out. The results are shown in Table 1.
<實施例7> <Example 7>
使用以下之化合物A-3代替生育酚,除此以外依照與實施例1及實施例2同樣之順序而製作配線基板T-6,實施上述評價方法1之評價。將結果示於表1中。 The wiring board T-6 was produced in the same manner as in the first embodiment and the second embodiment except that the following compound A-3 was used instead of the tocopherol, and the evaluation of the evaluation method 1 was carried out. The results are shown in Table 1.
[化18]
<實施例8> <Example 8>
使用以下之化合物A-4代替生育酚,除此以外依照與實施例1及實施例2同樣之順序而製作配線基板T-7,實施上述評價方法1之評價。將結果示於表1中。 The wiring board T-7 was produced in the same manner as in the first embodiment and the second embodiment except that the following compound A-4 was used instead of the tocopherol, and the evaluation of the evaluation method 1 was carried out. The results are shown in Table 1.
<實施例9> <Example 9>
將銀量自24.2 μg/mm2變更為0.011 μg/mm2,除此以外依照與實施例1及實施例5同樣之順序而製作配線基板T-8,實施上述評價方法1之評價。將結果示於表1中。 The wiring board T-8 was produced in the same manner as in the first embodiment and the fifth embodiment except that the amount of silver was changed from 24.2 μg/mm 2 to 0.011 μg/mm 2 , and the evaluation of the evaluation method 1 was carried out. The results are shown in Table 1.
<實施例10> <Example 10>
使用以下之化合物A-5代替生育酚,除此以外依照與實施例1及實施例2同樣之順序而製作配線基板T-9,實施上述評價方法1之評價。將結果示於表1中。 The wiring board T-9 was produced in the same manner as in the first embodiment and the second embodiment except that the following compound A-5 was used instead of the tocopherol, and the evaluation of the evaluation method 1 was carried out. The results are shown in Table 1.
[化20]
<實施例11> <Example 11>
使用以下之化合物A-6代替生育酚,除此以外依照與實施例1及實施例2同樣之順序而製作配線基板T-9,實施上述評價方法1之評價。將結果示於表1中。
<實施例12> <Example 12>
使用以下之化合物A-7代替生育酚,除此以外依照與實施例1及實施例2同樣之順序而製作配線基板T-10,實施上述評價方法1之評價。將結果示於表1中。 The wiring board T-10 was produced in the same manner as in the first embodiment and the second embodiment except that the following compound A-7 was used instead of the tocopherol, and the evaluation of the evaluation method 1 was carried out. The results are shown in Table 1.
[化22]
<比較例1> <Comparative Example 1>
並未使用生育酚,除此以外依照與實施例1同樣之順序而製作透明雙面黏著片S-0。 A transparent double-sided adhesive sheet S-0 was produced in the same manner as in Example 1 except that tocopherol was not used.
使用透明雙面黏著片S-0代替透明雙面黏著片S-1,除此以外依照與實施例1及實施例2同樣之順序而製作配線基板R-1,實施上述評價方法1之評價。將結果示於表1中。 The wiring board R-1 was produced in the same manner as in the first embodiment and the second embodiment except that the transparent double-sided adhesive sheet S-0 was used instead of the transparent double-sided adhesive sheet S-1, and the evaluation of the evaluation method 1 was carried out. The results are shown in Table 1.
<比較例2> <Comparative Example 2>
依照實施例2之方法,以銀配線之每單位面積中所含之銀量成為76.1 μg/mm2之方式調整金屬配線之厚度,獲得L/S=200 μm/200 μm之附有金屬配線之絕緣基板C。 According to the method of the second embodiment, the thickness of the metal wiring is adjusted so that the amount of silver contained in the unit area of the silver wiring becomes 76.1 μg/mm 2 , and the metal wiring with L/S=200 μm/200 μm is obtained. Insulating substrate C.
使用附有金屬配線之絕緣基板C代替附有金屬配線之絕緣基板A,除此以外依照與實施例1及實施例2同樣之順序而製作配線基板R-2,實施上述評價方法1之評價。將結果示於表1中。 The wiring board R-2 was produced in the same manner as in the first embodiment and the second embodiment except that the insulating substrate C with the metal wiring was used instead of the insulating substrate A with the metal wiring, and the evaluation of the evaluation method 1 was carried out. The results are shown in Table 1.
<比較例3> <Comparative Example 3>
使用抗壞血酸代替生育酚,除此以外依照與實施例1及實施例2同樣之順序而製作配線基板R-3,實施上述評價方法1之評價。將結果示於表1中。 The wiring board R-3 was produced in the same manner as in the first embodiment and the second embodiment except that the ascorbic acid was used instead of the tocopherol, and the evaluation of the evaluation method 1 was carried out. The results are shown in Table 1.
而且,所謂「剝離」是表示於評價中之加溫過程中薄片失去被覆配線之能力,由於濕熱而短路。 Further, the term "peeling" means that the sheet loses the ability to cover the wiring during the heating process during the evaluation, and is short-circuited due to moist heat.
而且,實施例4是藉由上述評價方法2而評價之結果,其他實施例及比較例是藉由上述評價方法1而評價之結果。 Further, Example 4 is the result of evaluation by the above-described evaluation method 2, and other examples and comparative examples are the results of evaluation by the above-described evaluation method 1.
如上述表1所示那樣,於使用規定化合物之實施例2~實施例12中,顯示優異之延長壽命效果,確認絕緣特性提高。 As shown in the above Table 1, in Examples 2 to 12 in which the predetermined compounds were used, the effect of prolonging the life was excellent, and the insulation properties were confirmed to be improved.
特別是根據實施例2、實施例5~實施例8、實施例10~實施例12之比較可知,於使用式(5)所表示之化合物或式(6)所表示之化合物之實施例5、實施例6、實施例10、及實施例11中,確認表現出更優異之效果。 In particular, according to the comparison between Example 2, Example 5 to Example 8, and Example 10 to Example 12, Example 5 in which the compound represented by the formula (5) or the compound represented by the formula (6) is used, In Example 6, Example 10, and Example 11, it was confirmed that the effect was more excellent.
另一方面,於銀量多之比較例2、及未使用規定化合物 之比較例3中,未確認絕緣特性大幅提高。 On the other hand, Comparative Example 2 in which the amount of silver is large, and the use of the prescribed compound In Comparative Example 3, the insulation characteristics were not confirmed to be greatly improved.
<<第2實施方式>> <<2th embodiment>>
(合成例1:透明雙面黏著片S-1之製造) (Synthesis Example 1: Production of Transparent Double-sided Adhesive Sheet S-1)
丙烯酸系共聚物之製備:於具有攪拌機、回流冷凝器、溫度計、滴液漏斗及氮氣導入口之反應容器中,將丙烯酸-2-乙基己酯50質量份、丙烯酸異莰酯25質量份、丙烯酸-2-羥基乙酯15質量份、丙烯酸2質量份溶解於乙酸乙酯100質量份中,進行氮氣置換後加溫至內溫為70℃。 Preparation of an acrylic copolymer: 50 parts by mass of 2-ethylhexyl acrylate and 25 parts by mass of isodecyl acrylate in a reaction vessel having a stirrer, a reflux condenser, a thermometer, a dropping funnel, and a nitrogen inlet; 15 parts by mass of 2-hydroxyethyl acrylate and 2 parts by mass of acrylic acid were dissolved in 100 parts by mass of ethyl acetate, and the mixture was purged with nitrogen, followed by heating to an internal temperature of 70 °C.
一面於該反應液中緩緩滴加預先溶解有2,2'-偶氮雙(2,4-二甲基戊腈)0.1份與乙酸乙酯10份之溶液,一面攪拌3小時。其後進一步加溫至內溫為80℃,一面緩緩滴加預先溶解有2,2'-偶氮雙(2,4-二甲基戊腈)0.1份與乙酸乙酯10份之溶液一面攪拌3小時,獲得質量平均分子量為40萬之丙烯酸系共聚物(P-1)。 To the reaction mixture, a solution in which 0.1 part of 2,2'-azobis(2,4-dimethylvaleronitrile) and 10 parts of ethyl acetate were dissolved in advance was gradually added dropwise, and the mixture was stirred for 3 hours. Thereafter, the mixture was further heated to an internal temperature of 80 ° C, and a solution of 0.1 part of 2,2'-azobis(2,4-dimethylvaleronitrile) and 10 parts of ethyl acetate dissolved in advance was gradually added dropwise. After stirring for 3 hours, an acrylic copolymer (P-1) having a mass average molecular weight of 400,000 was obtained.
其次,添加上述丙烯酸系共聚物(P-1)、與異氰酸酯系交聯劑(日本聚胺酯公司製造之CORONATE L-45、固形物為45%)0.7重量份而進行5分鐘之攪拌。於其中添加於乙酸乙酯/甲苯混合溶劑(乙酸乙酯/甲苯=1/1)中溶解有DL-α-生育酚(氧化還原電位為0.56 V)之溶液,進行5分鐘之攪拌而獲得相對於丙烯酸系共聚物固形物100質量份而言DL-α-生育酚為0.5質量份之黏著劑組成物。 Then, the acrylic copolymer (P-1) and 0.7 parts by weight of an isocyanate-based crosslinking agent (CORONATE L-45 manufactured by Japan Polyurethane Co., Ltd., solid content: 45%) were added and stirred for 5 minutes. A solution in which DL-α-tocopherol (redox potential: 0.56 V) was dissolved in an ethyl acetate/toluene mixed solvent (ethyl acetate/toluene=1/1) was added thereto, and stirred for 5 minutes to obtain a relative The DL-α-tocopherol was 0.5 parts by mass of the adhesive composition in terms of 100 parts by mass of the acrylic copolymer solid content.
將上述黏著劑組成物以乾燥後之厚度成為50 μm之方式塗佈於藉由矽酮化合物對單面進行了剝離處理的厚度為50 μm之PET 膜上,於75℃下進行5分鐘之乾燥。將所得之黏著片、與藉由矽酮化合物對單面進行了剝離處理之厚度為38 μm之PET膜貼合。 其後,於23℃下進行5日之熟化而獲得厚度為50 μm之透明雙面黏著片(無基材之黏著片)S-1。 The adhesive composition was applied to a PET having a thickness of 50 μm which was peeled off by one side of the ketone compound by a thickness of 50 μm after drying. The film was dried at 75 ° C for 5 minutes. The obtained adhesive sheet was bonded to a PET film having a thickness of 38 μm which was subjected to a release treatment on one side by an oxime compound. Thereafter, aging was carried out at 23 ° C for 5 days to obtain a transparent double-sided adhesive sheet (adhesive sheet without substrate) S-1 having a thickness of 50 μm.
(合成例2:透明雙面黏著片S-2之製造) (Synthesis Example 2: Production of Transparent Double-sided Adhesive Sheet S-2)
將丙烯酸-2-羥基乙酯之使用量由15質量份變更為20質量份,將丙烯酸之使用量由2質量份變更為0質量份,除此以外依照與合成例1同樣之順序而製造透明雙面黏著片S-2。 The amount of the use of the 2-hydroxyethyl acrylate was changed from 15 parts by mass to 20 parts by mass, and the amount of the acrylic acid used was changed from 2 parts by mass to 0 parts by mass, and otherwise transparent in the same manner as in Synthesis Example 1. Double-sided adhesive sheet S-2.
(合成例3:透明雙面黏著片S-3之製造) (Synthesis Example 3: Production of Transparent Double-sided Adhesive Sheet S-3)
將丙烯酸-2-羥基乙酯之使用量由15質量份變更為25質量份,將丙烯酸之使用量由2質量份變更為0質量份,除此以外依照與合成例1同樣之順序而製造透明雙面黏著片S-3。 The amount of the use of the 2-hydroxyethyl acrylate was changed from 15 parts by mass to 25 parts by mass, and the amount of the acrylic acid used was changed from 2 parts by mass to 0 parts by mass, and otherwise transparent in the same manner as in Synthesis Example 1. Double-sided adhesive sheet S-3.
(合成例4:透明雙面黏著片S-4之製造) (Synthesis Example 4: Production of Transparent Double-sided Adhesive Sheet S-4)
將丙烯酸-2-羥基乙酯之使用量由15質量份變更為30質量份,將丙烯酸之使用量由2質量份變更為0質量份,除此以外依照與合成例1同樣之順序而製造透明雙面黏著片S-4。 The amount of use of the 2-hydroxyethyl acrylate was changed from 15 parts by mass to 30 parts by mass, and the amount of the acrylic acid used was changed from 2 parts by mass to 0 parts by mass, and otherwise transparent in the same manner as in Synthesis Example 1. Double-sided adhesive sheet S-4.
(合成例5:透明雙面黏著片S-5之製造) (Synthesis Example 5: Production of Transparent Double-sided Adhesive Sheet S-5)
將丙烯酸-2-羥基乙酯之使用量由15質量份變更為25質量份,另外追加丙烯酸甲酯25質量份及丙烯酸丁酯25質量份作為單體而進行丙烯酸系共聚物之聚合,除此以外依照與合成例1同樣之順序而製造透明雙面黏著片S-5。 The amount of 2-hydroxyethyl acrylate used was changed from 15 parts by mass to 25 parts by mass, and 25 parts by mass of methyl acrylate and 25 parts by mass of butyl acrylate were added as a monomer to carry out polymerization of the acrylic copolymer. The transparent double-sided adhesive sheet S-5 was produced in the same manner as in Synthesis Example 1 except for the above.
(合成例6:透明雙面黏著片S-6之製造) (Synthesis Example 6: Production of Transparent Double-sided Adhesive Sheet S-6)
將DL-α-生育酚變更為化合物B(氧化還原電位為1.09 V),除此以外依照與合成例5同樣之順序而製造透明雙面黏著片S-7。 A transparent double-sided adhesive sheet S-7 was produced in the same manner as in Synthesis Example 5 except that the DL-α-tocopherol was changed to the compound B (the redox potential was 1.09 V).
(合成例7:透明雙面黏著片S-7之製造) (Synthesis Example 7: Production of Transparent Double-sided Adhesive Sheet S-7)
將DL-α-生育酚變更為化合物C(氧化還原電位為1.17 V),除此以外依照與合成例5同樣之順序而製造透明雙面黏著片S-7。 A transparent double-sided adhesive sheet S-7 was produced in the same manner as in Synthesis Example 5 except that the DL-α-tocopherol was changed to the compound C (the redox potential was 1.17 V).
(合成例8:透明雙面黏著片S-8之製造) (Synthesis Example 8: manufacture of transparent double-sided adhesive sheet S-8)
將DL-α-生育酚變更為化合物B(氧化還原電位為1.09 V),除此以外依照與合成例1同樣之順序而製造透明雙面黏著片S-8。 A transparent double-sided adhesive sheet S-8 was produced in the same manner as in Synthesis Example 1, except that the DL-α-tocopherol was changed to the compound B (the redox potential was 1.09 V).
(合成例9:透明雙面黏著片S-9之製造) (Synthesis Example 9: manufacture of transparent double-sided adhesive sheet S-9)
將DL-α-生育酚變更為化合物B(氧化還原電位為1.09 V),除此以外依照與合成例2同樣之順序而製造透明雙面黏著片S-9。 A transparent double-sided adhesive sheet S-9 was produced in the same manner as in Synthesis Example 2 except that the DL-α-tocopherol was changed to the compound B (the redox potential was 1.09 V).
(合成例10:透明雙面黏著片S-10之製造) (Synthesis Example 10: Production of Transparent Double-sided Adhesive Sheet S-10)
使用丙烯酸甲酯30質量份、丙烯酸丁酯70質量份、丙烯酸-2-羥基乙酯8質量份、丙烯酸2質量份代替丙烯酸-2-乙基己酯50質量份、丙烯酸異莰酯25質量份、丙烯酸-2-羥基乙酯15質量份、及丙烯酸2質量份之單體而進行丙烯酸系共聚物之聚合,除此以外依照與合成例1同樣之順序而製造透明雙面黏著片S-10。 30 parts by mass of methyl acrylate, 70 parts by mass of butyl acrylate, 8 parts by mass of 2-hydroxyethyl acrylate, 2 parts by mass of acrylic acid, 50 parts by mass of 2-ethylhexyl acrylate, and 25 parts by mass of isodecyl acrylate. A transparent double-sided adhesive sheet S-10 was produced in the same manner as in Synthesis Example 1 except that the acrylic copolymer was polymerized with 15 parts by mass of 2-hydroxyethyl acrylate and 2 parts by mass of acrylic acid. .
(合成例11:透明雙面黏著片S-11之製造) (Synthesis Example 11: Production of transparent double-sided adhesive sheet S-11)
將DL-α-生育酚變更為化合物B(氧化還原電位為1.09 V),除此以外依照與合成例10同樣之順序而製造透明雙面黏著片S-11。 A transparent double-sided adhesive sheet S-11 was produced in the same manner as in Synthesis Example 10 except that the DL-α-tocopherol was changed to the compound B (the redox potential was 1.09 V).
(合成例12:透明雙面黏著片S-12之製造) (Synthesis Example 12: Production of transparent double-sided adhesive sheet S-12)
將DL-α-生育酚變更為化合物C(氧化還原電位為1.17 V),除此以外依照與合成例10同樣之順序而製造透明雙面黏著片S-12。 A transparent double-sided adhesive sheet S-12 was produced in the same manner as in Synthesis Example 10 except that the DL-α-tocopherol was changed to the compound C (the redox potential was 1.17 V).
(合成例13:透明雙面黏著片S-13之製造) (Synthesis Example 13: Production of Transparent Double-sided Adhesive Sheet S-13)
使用丙烯酸丁酯75質量份、丙烯酸-2-羥基乙酯25質量份代替丙烯酸-2-乙基己酯50質量份、丙烯酸異莰酯25質量份、丙烯酸-2-羥基乙酯15質量份、及丙烯酸2質量份之單體而進行丙烯酸系共聚物之聚合,除此以外依照與合成例1同樣之順序而製造透 明雙面黏著片S-13。 75 parts by mass of butyl acrylate and 25 parts by mass of 2-hydroxyethyl acrylate are used instead of 50 parts by mass of 2-ethylhexyl acrylate, 25 parts by mass of isodecyl acrylate, and 15 parts by mass of 2-hydroxyethyl acrylate. And the polymerization of the acrylic copolymer was carried out in an amount of 2 parts by mass of the acrylic acid, and the same procedure as in Synthesis Example 1 was carried out. Bright double-sided adhesive sheet S-13.
(合成例14:透明雙面黏著片S-14之製造) (Synthesis Example 14: Production of Transparent Double-sided Adhesive Sheet S-14)
將DL-α-生育酚變更為化合物B(氧化還原電位為1.09 V),除此以外依照與合成例13同樣之順序而製造透明雙面黏著片S-14。 A transparent double-sided adhesive sheet S-14 was produced in the same manner as in Synthesis Example 13 except that the DL-α-tocopherol was changed to the compound B (the redox potential was 1.09 V).
(合成例15:透明雙面黏著片S-15之製造) (Synthesis Example 15: Production of Transparent Double-sided Adhesive Sheet S-15)
將DL-α-生育酚變更為化合物C(氧化還原電位為1.17 V),除此以外依照與合成例13同樣之順序而製造透明雙面黏著片S-15。 A transparent double-sided adhesive sheet S-15 was produced in the same manner as in Synthesis Example 13 except that the DL-α-tocopherol was changed to the compound C (the redox potential was 1.17 V).
(合成例16:透明雙面黏著片S-16之製造) (Synthesis Example 16: Production of Transparent Double-sided Adhesive Sheet S-16)
使用丙烯酸丁酯75質量份、丙烯酸-2-乙基己酯15質量份、丙烯酸-2-羥基乙酯6質量份、丙烯酸1.5質量份代替丙烯酸-2-乙基己酯50質量份、丙烯酸異莰酯25質量份、丙烯酸-2-羥基乙酯15質量份、及丙烯酸2質量份之單體而進行丙烯酸系共聚物之聚合,除此以外依照與合成例1同樣之順序而製造透明雙面黏著片S-16。 75 parts by mass of butyl acrylate, 15 parts by mass of 2-ethylhexyl acrylate, 6 parts by mass of 2-hydroxyethyl acrylate, and 1.5 parts by mass of acrylic acid instead of 50 parts by mass of 2-ethylhexyl acrylate, acrylic acid A transparent double-sided film was produced in the same manner as in Synthesis Example 1 except that 25 parts by mass of oxime ester, 15 parts by mass of 2-hydroxyethyl acrylate, and 2 parts by mass of acrylic acid were used to polymerize the acrylic copolymer. Adhesive sheet S-16.
(合成例17:透明雙面黏著片S-17之製造) (Synthesis Example 17: Production of Transparent Double-sided Adhesive Sheet S-17)
將DL-α-生育酚變更為化合物B(氧化還原電位為1.09 V),除此以外依照與合成例16同樣之順序而製造透明雙面黏著片S-17。 A transparent double-sided adhesive sheet S-17 was produced in the same manner as in Synthesis Example 16 except that the DL-α-tocopherol was changed to the compound B (the redox potential was 1.09 V).
(合成例18:透明雙面黏著片S-18之製造) (Synthesis Example 18: Production of transparent double-sided adhesive sheet S-18)
於反應容器中,將丙烯酸-2-乙基己酯50質量份、丙烯酸異莰 酯25質量份、丙烯酸-2-羥基乙酯15質量份、丙烯酸2質量份、作為聚合起始劑之Irgacure 651(汽巴精化股份有限公司(Ciba Specialty Chemicals Co.,Ltd)製造)0.05質量份加以混合,於氮氣置換後,藉由低壓水銀燈照射7分鐘之紫外線,獲得黏度為2000 mPa.s左右之黏著劑組成物。其後,於黏著劑組成物中添加於乙酸乙酯/甲苯混合溶劑(乙酸乙酯/甲苯=1/1)中溶解有DL-α-生育酚(氧化還原電位為0.56 V)之溶液。此時,以相對於黏著劑固形成分100質量份而言DL-α-生育酚成為0.5質量份之方式進行添加。 50 parts by mass of 2-ethylhexyl acrylate and isophthalic acid in the reaction vessel 25 parts by mass of ester, 15 parts by mass of 2-hydroxyethyl acrylate, 2 parts by mass of acrylic acid, and Irgacure 651 (manufactured by Ciba Specialty Chemicals Co., Ltd.) as a polymerization initiator The mixture was mixed, and after nitrogen substitution, the ultraviolet rays were irradiated by a low-pressure mercury lamp for 7 minutes to obtain a viscosity of 2000 mPa. Adhesive composition around s. Thereafter, a solution in which DL-α-tocopherol (redox potential: 0.56 V) was dissolved in an ethyl acetate/toluene mixed solvent (ethyl acetate/toluene=1/1) was added to the adhesive composition. In this case, DL-α-tocopherol is added in an amount of 0.5 part by mass based on 100 parts by mass of the adhesive solid content.
將所得之黏著劑組成物以乾燥後之厚度成為50 μm之方式塗佈於厚度為50 μm之PET膜上,使溶劑乾燥。將所得之黏著片、與藉由矽酮化合物對單面進行了剝離處理之厚度為38 μm之PET膜貼合,自雙面照射低壓水銀燈5分鐘,獲得透明雙面黏著片S-18。 The obtained adhesive composition was applied onto a PET film having a thickness of 50 μm so as to have a thickness of 50 μm after drying, and the solvent was dried. The obtained adhesive sheet was bonded to a PET film having a thickness of 38 μm which was subjected to a release treatment on one side by an oxime compound, and a low-pressure mercury lamp was irradiated from both sides for 5 minutes to obtain a transparent double-sided adhesive sheet S-18.
(合成例19:透明雙面黏著片S-19之製造) (Synthesis Example 19: Production of Transparent Double-sided Adhesive Sheet S-19)
將DL-α-生育酚變更為化合物B(氧化還原電位為1.09 V),除此以外依照與合成例18同樣之順序而製造透明雙面黏著片S-19。 A transparent double-sided adhesive sheet S-19 was produced in the same manner as in Synthesis Example 18 except that the DL-α-tocopherol was changed to the compound B (the redox potential was 1.09 V).
(合成例20:透明雙面黏著片S-20之製造) (Synthesis Example 20: Production of Transparent Double-sided Adhesive Sheet S-20)
將DL-α-生育酚變更為化合物C(氧化還原電位為1.17 V),除此以外依照與合成例18同樣之順序而製造透明雙面黏著片S-20。 A transparent double-sided adhesive sheet S-20 was produced in the same manner as in Synthesis Example 18 except that the DL-α-tocopherol was changed to the compound C (the redox potential was 1.17 V).
(合成例21:透明雙面黏著片S-21之製造) (Synthesis Example 21: Production of Transparent Double-sided Adhesive Sheet S-21)
於反應容器投入丙烯酸丁酯56質量份、丙烯酸環己酯13質量份、丙烯酸-4-羥基丁酯23質量份、丙烯酸-2-羥基乙酯8質量份、Irgacure 651(0.05質量份)後,於氮氣環境下一面攪拌一面照射紫外線。 After 56 parts by mass of butyl acrylate, 13 parts by mass of cyclohexyl acrylate, 23 parts by mass of 4-hydroxybutyl acrylate, 8 parts by mass of 2-hydroxyethyl acrylate, and Irgacure 651 (0.05 parts by mass) were placed in the reaction container, The ultraviolet rays were irradiated while stirring under a nitrogen atmosphere.
於其中添加相對於黏著劑固形成分100質量份而言分別為0.1質量份及0.5質量份之CORONATE L55E及DL-α-生育酚後,進行攪拌而獲得黏著劑組成物。 After adding 0.1 parts by mass and 0.5 part by mass of CORONATE L55E and DL-α-tocopherol, respectively, to 100 parts by mass of the adhesive solid component, the mixture was stirred to obtain an adhesive composition.
將上述黏著劑組成物以乾燥後之厚度成為50 μm之方式塗佈於厚度為50 μm之PET膜上,使溶劑乾燥。將所得之黏著片、與藉由矽酮化合物對單面進行了剝離處理之厚度為38 μm之PET膜貼合,自雙面照射低壓水銀燈5分鐘而獲得透明雙面黏著片S-21。 The above-mentioned adhesive composition was applied onto a PET film having a thickness of 50 μm so as to have a thickness of 50 μm after drying, and the solvent was dried. The obtained adhesive sheet was bonded to a PET film having a thickness of 38 μm which was subjected to a release treatment on one side by an anthrone compound, and a low-pressure mercury lamp was irradiated from both sides for 5 minutes to obtain a transparent double-sided adhesive sheet S-21.
(合成例22:透明雙面黏著片S-22之製造) (Synthesis Example 22: Production of transparent double-sided adhesive sheet S-22)
將DL-α-生育酚變更為化合物B(氧化還原電位為1.09 V),除此以外依照與合成例21同樣之順序而製造透明雙面黏著片S-22。 A transparent double-sided adhesive sheet S-22 was produced in the same manner as in Synthesis Example 21 except that the DL-α-tocopherol was changed to the compound B (the redox potential was 1.09 V).
(合成例23:透明雙面黏著片S-23之製造) (Synthesis Example 23: Production of Transparent Double-sided Adhesive Sheet S-23)
將DL-α-生育酚變更為化合物C(氧化還原電位為1.17 V),除此以外依照與合成例21同樣之順序而製造透明雙面黏著片S-23。 A transparent double-sided adhesive sheet S-23 was produced in the same manner as in Synthesis Example 21 except that the DL-α-tocopherol was changed to the compound C (the redox potential was 1.17 V).
(合成例24:透明雙面黏著片S-24之製造) (Synthesis Example 24: Production of Transparent Double-sided Adhesive Sheet S-24)
將化合物B之含量由0.5質量份設為0.1質量份,除此以外與合成例6同樣地進行而製造透明雙面黏著片S-24。 A transparent double-sided adhesive sheet S-24 was produced in the same manner as in Synthesis Example 6, except that the content of the compound B was changed to 0.1 part by mass.
(合成例25:透明雙面黏著片S-25之製造) (Synthesis Example 25: Production of Transparent Double-sided Adhesive Sheet S-25)
將化合物B之含量由0.5質量份設為1.0質量份,除此以外與合成例6同樣地進行而製造透明雙面黏著片S-25。 A transparent double-sided adhesive sheet S-25 was produced in the same manner as in Synthesis Example 6, except that the content of the compound B was changed to 1.0 part by mass.
(合成例26:透明雙面黏著片S-26之製造) (Synthesis Example 26: Production of transparent double-sided adhesive sheet S-26)
並未使用DL-α-生育酚,除此以外依照與合成例1同樣之順序而製造透明雙面黏著片S-26。 A transparent double-sided adhesive sheet S-26 was produced in the same manner as in Synthesis Example 1 except that DL-α-tocopherol was not used.
(合成例27:透明雙面黏著片S-27之製造) (Synthesis Example 27: Production of transparent double-sided adhesive sheet S-27)
並未使用DL-α-生育酚,除此以外依照與合成例2同樣之順序而製造透明雙面黏著片S-27。 A transparent double-sided adhesive sheet S-27 was produced in the same manner as in Synthesis Example 2 except that DL-α-tocopherol was not used.
(合成例28:透明雙面黏著片S-28之製造) (Synthesis Example 28: Production of Transparent Double-sided Adhesive Sheet S-28)
並未使用DL-α-生育酚,除此以外依照與合成例3同樣之順序而製造透明雙面黏著片S-28。 A transparent double-sided adhesive sheet S-28 was produced in the same manner as in Synthesis Example 3 except that DL-α-tocopherol was not used.
(合成例29:透明雙面黏著片S-29之製造) (Synthesis Example 29: Production of transparent double-sided adhesive sheet S-29)
並未使用DL-α-生育酚,除此以外依照與合成例4同樣之順序而製造透明雙面黏著片S-29。 A transparent double-sided adhesive sheet S-29 was produced in the same manner as in Synthesis Example 4 except that DL-α-tocopherol was not used.
(合成例30:透明雙面黏著片S-30之製造) (Synthesis Example 30: Production of Transparent Double-sided Adhesive Sheet S-30)
並未使用DL-α-生育酚,除此以外依照與合成例5同樣之順序而製造透明雙面黏著片S-30。 A transparent double-sided adhesive sheet S-30 was produced in the same manner as in Synthesis Example 5 except that DL-α-tocopherol was not used.
(合成例31:透明雙面黏著片S-31之製造) (Synthesis Example 31: Production of Transparent Double-sided Adhesive Sheet S-31)
使用化合物D(氧化還原電位為0.17 V)代替DL-α-生育酚,除此以外依照與合成例1同樣之順序而製造透明雙面黏著片S-31。 A transparent double-sided adhesive sheet S-31 was produced in the same manner as in Synthesis Example 1, except that the compound D (redox potential was 0.17 V) was used instead of DL-α-tocopherol.
[化25]
(合成例32:透明雙面黏著片S-32之製造) (Synthesis Example 32: Production of transparent double-sided adhesive sheet S-32)
使用化合物E(氧化還原電位為1.39 V)代替DL-α-生育酚,除此以外依照與合成例1同樣之順序而製造透明雙面黏著片S-32。 A transparent double-sided adhesive sheet S-32 was produced in the same manner as in Synthesis Example 1, except that the compound E (redox potential was 1.39 V) was used instead of DL-α-tocopherol.
(合成例33:透明雙面黏著片S-33之製造) (Synthesis Example 33: Production of Transparent Double-sided Adhesive Sheet S-33)
並未使用DL-α-生育酚,除此以外依照與合成例10同樣之順序而製造透明雙面黏著片S-33。 A transparent double-sided adhesive sheet S-33 was produced in the same manner as in Synthesis Example 10 except that DL-α-tocopherol was not used.
(合成例34:透明雙面黏著片S-34之製造) (Synthesis Example 34: Production of Transparent Double-sided Adhesive Sheet S-34)
並未使用DL-α-生育酚,除此以外依照與合成例13同樣之順序而製造透明雙面黏著片S-34。 A transparent double-sided adhesive sheet S-34 was produced in the same manner as in Synthesis Example 13 except that DL-α-tocopherol was not used.
(合成例35:透明雙面黏著片S-35之製造) (Synthesis Example 35: Production of Transparent Double-sided Adhesive Sheet S-35)
並未使用DL-α-生育酚,除此以外依照與合成例16同樣之順 序而製造透明雙面黏著片S-35。 DL-α-tocopherol was not used, and otherwise the same as in Synthesis Example 16 The transparent double-sided adhesive sheet S-35 is manufactured in sequence.
(合成例36:透明雙面黏著片S-36之製造) (Synthesis Example 36: Production of Transparent Double-sided Adhesive Sheet S-36)
使用丙烯酸丁酯60質量份、丙烯酸-2-乙基己酯25質量份、甲基丙烯酸甲酯15質量份代替丙烯酸-2-乙基己酯50質量份、丙烯酸異莰酯25質量份、丙烯酸-2-羥基乙酯15質量份、及丙烯酸2質量份之單體而進行丙烯酸系共聚物之聚合,並未使用DL-α-生育酚,除此以外依照與合成例1同樣之順序而製造透明雙面黏著片S-36。 60 parts by mass of butyl acrylate, 25 parts by mass of 2-ethylhexyl acrylate, 15 parts by mass of methyl methacrylate, 50 parts by mass of 2-ethylhexyl acrylate, 25 parts by mass of isodecyl acrylate, and acrylic acid The polymerization of the acrylic copolymer was carried out by using a monomer of 15 parts by mass of 2-hydroxyethyl ester and 2 parts by mass of acrylic acid, and the same procedure as in Synthesis Example 1 was carried out except that DL-α-tocopherol was not used. Transparent double-sided adhesive sheet S-36.
(合成例37:透明雙面黏著片S-37之製造) (Synthesis Example 37: Production of Transparent Double-sided Adhesive Sheet S-37)
使用丙烯酸丁酯60質量份、丙烯酸-2-乙基己酯25質量份、甲基丙烯酸甲酯15質量份代替丙烯酸-2-乙基己酯50質量份、丙烯酸異莰酯25質量份、丙烯酸-2-羥基乙酯15質量份、及丙烯酸2質量份之單體而進行丙烯酸系共聚物之聚合,除此以外依照與合成例1同樣之順序而製造透明雙面黏著片S-37。 60 parts by mass of butyl acrylate, 25 parts by mass of 2-ethylhexyl acrylate, 15 parts by mass of methyl methacrylate, 50 parts by mass of 2-ethylhexyl acrylate, 25 parts by mass of isodecyl acrylate, and acrylic acid A transparent double-sided adhesive sheet S-37 was produced in the same manner as in Synthesis Example 1 except that the acrylic copolymer was polymerized in an amount of 15 parts by mass of the -2-hydroxyethyl group and 2 parts by mass of the acrylic acid.
(合成例38:透明雙面黏著片S-38之製造) (Synthesis Example 38: Production of transparent double-sided adhesive sheet S-38)
並未使用DL-α-生育酚,除此以外依照與合成例21同樣之順序而製造透明雙面黏著片S-38。 A transparent double-sided adhesive sheet S-38 was produced in the same manner as in Synthesis Example 21 except that DL-α-tocopherol was not used.
<實施例1A> <Example 1A>
藉由網版印刷法,使用銀漿(朝日化學研究所製造之LS-450-7HL)而於PET基板上形成L/S=40 μm/40 μm之條紋狀銀配線圖案。其後,於130℃下進行30分鐘之加熱處理,使銀配線硬化而製造包含銀配線之附有金屬配線之絕緣基板。 A striped silver wiring pattern of L/S = 40 μm / 40 μm was formed on the PET substrate by a screen printing method using silver paste (LS-450-7HL manufactured by Asahi Chemical Research Institute). Thereafter, heat treatment was performed at 130 ° C for 30 minutes to cure the silver wiring, thereby producing an insulating substrate with metal wiring including silver wiring.
(配線基板之製造) (Manufacture of wiring board)
於所得之附有金屬配線之絕緣基板上,剝去透明雙面黏著片S-1之其中一方之單面上之剝離膜,將顯示黏著性之其中一方之表面作為積層面而進行貼合,進一步剝去透明雙面黏著片之另一方之單面上之剝離膜,於顯示黏著性之另一方之表面上貼合PET膜(膜厚為50 μm)而獲得配線基板。其後,將所得之配線基板於45℃、0.5 MPa之條件下進行20分鐘之高壓釜處理。藉此獲得配線基板T-1。 On the insulating substrate with the metal wiring obtained, the release film on one side of one of the transparent double-sided adhesive sheets S-1 is peeled off, and the surface on which one of the adhesiveness is displayed is laminated as a layer. Further, the release film on the other side of the other side of the transparent double-sided adhesive sheet was peeled off, and a PET film (film thickness: 50 μm) was bonded to the other surface on which adhesiveness was exhibited to obtain a wiring substrate. Thereafter, the obtained wiring substrate was subjected to autoclave treatment at 45 ° C and 0.5 MPa for 20 minutes. Thereby, the wiring substrate T-1 is obtained.
關於所得之配線基板T-1,進行以下之壽命測定。 The following life measurement was performed about the obtained wiring board T-1.
(評價方法(壽命延長效果評價)) (Evaluation method (life extension effect evaluation))
使用所得之配線基板T-1,於濕度為85%、溫度為85度、壓力為1.0 atm、電壓為15V之條件下進行壽命測定(使用裝置為愛斯佩克股份有限公司製造之EHS-221MD)。測定直至銀配線間之電阻值不足1×105Ω之時間X,依照以下基準進行評價。於實用上而言必須為A或B。 Using the obtained wiring substrate T-1, the life was measured under the conditions of a humidity of 85%, a temperature of 85 degrees, a pressure of 1.0 atm, and a voltage of 15 V (the device was EHS-221MD manufactured by ESPEC Co., Ltd.). ). The time X until the resistance value between the silver wirings was less than 1 × 10 5 Ω was measured and evaluated according to the following criteria. Practically it must be A or B.
「A」:時間X為40小時以上 "A": Time X is 40 hours or more
「B」:時間X為30小時以上且不足40小時 "B": Time X is 30 hours or more and less than 40 hours
「C」:時間X不足30小時 "C": Time X is less than 30 hours
將實施例1A中所得之配線基板之結果示於表2中。 The results of the wiring board obtained in Example 1A are shown in Table 2.
(環境試驗(白化評價)) (Environmental test (whitening evaluation))
將透明雙面黏著片S-1~透明雙面黏著片S-38切斷為規定大小(長5 cm×寬4 cm×厚50 μm),剝去其中一方之單面上之剝離 膜,將顯示黏著性之其中一方之表面作為積層面貼合於玻璃基板上,進一步剝去透明雙面黏著片之另一方之單面上之剝離膜,貼附PET基板(厚度為50 μm)而製作評價用樣品。 The transparent double-sided adhesive sheet S-1~transparent double-sided adhesive sheet S-38 is cut into a predetermined size (length 5 cm × width 4 cm × thickness 50 μm), and peeling off one side of one side is peeled off For the film, the surface of one of the adhesive layers is attached as a laminate to the glass substrate, and the release film on the other side of the transparent double-sided adhesive sheet is further peeled off, and the PET substrate (thickness: 50 μm) is attached. A sample for evaluation was produced.
將評價用樣品於65℃、95%RH之條件下放置72小時。其後,測定將評價用樣品於23℃、50%RH之條件下放置時,直至評價用樣品中之透明黏著層之霧度達到3%以下之時間,依照以下基準進行評價。於實用上而言,若為A或B則耐白化性優異。 The sample for evaluation was allowed to stand under the conditions of 65 ° C and 95% RH for 72 hours. Then, when the sample for evaluation was placed under conditions of 23 ° C and 50% RH, the time until the haze of the transparent adhesive layer in the sample for evaluation reached 3% or less was evaluated according to the following criteria. Practically, if it is A or B, it is excellent in whitening resistance.
「A」:時間X不足6小時 "A": Time X is less than 6 hours
「B」:時間X為6小時以上、12小時以下 "B": Time X is 6 hours or more and 12 hours or less
「C」:時間X超過12小時 "C": Time X exceeds 12 hours
另外,霧度是使用村上色彩技術研究所製造之「HR-100型」而測定。 In addition, the haze was measured using "HR-100 type" manufactured by Murakami Color Technology Research Institute.
<實施例2A~實施例25A、及比較例1A~比較例15A> <Example 2A to Example 25A, and Comparative Example 1A to Comparative Example 15A>
如表2所示,使用上述之透明雙面黏著片S-2~透明雙面黏著片S-38代替透明雙面黏著片S-1,藉由與實施例1A同樣之順序製造配線基板,進行壽命延長效果測定及環境試驗。將結果匯總示於表2中。 As shown in Table 2, the transparent double-sided adhesive sheet S-2 to the transparent double-sided adhesive sheet S-38 was used instead of the transparent double-sided adhesive sheet S-1, and the wiring substrate was produced in the same manner as in the example 1A. Life extension effect measurement and environmental testing. The results are summarized in Table 2.
<實施例26A> <Example 26A>
將L/S設定為30 μm/30 μm,除此以外與實施例6A同樣地製作配線基板,進行與實施例1A相同之壽命測定。 A wiring board was produced in the same manner as in Example 6A except that the L/S was set to 30 μm/30 μm, and the same life measurement as in Example 1A was performed.
表2中,「丙烯酸系共聚物之單體成分」一欄之各成分 欄中之數值表示質量份。 In Table 2, the components of the "monomer component of the acrylic copolymer" column The values in the column indicate the parts by mass.
表2中,「化合物」一欄之含量欄中之數值表示質量份。 In Table 2, the numerical values in the column of the "Compound" column indicate the parts by mass.
根據表2之結果,於相當於本發明的第2實施方式之實施例1A~實施例26A中,於白化評價及壽命延長效果評價中獲得優異之結果。 According to the results of Table 2, in Examples 1A to 26A corresponding to the second embodiment of the present invention, excellent results were obtained in the whitening evaluation and the life extension effect evaluation.
另一方面,於未使用不顯示規定之氧化還原電子之化合物、或透明黏著層不顯示規定之特性之比較例1A~比較例15A中,白化評價及壽命延長效果評價之至少一方之評價差。 On the other hand, in Comparative Examples 1A to 15A in which the compound which does not exhibit the predetermined redox electrons or the transparent adhesive layer did not exhibit the predetermined characteristics, the evaluation of at least one of the whitening evaluation and the life extension effect evaluation was poor.
10‧‧‧配線基板 10‧‧‧Wiring substrate
12‧‧‧絕緣基板 12‧‧‧Insert substrate
14‧‧‧金屬配線 14‧‧‧Metal wiring
16‧‧‧附有金屬配線之絕緣基板 16‧‧‧Insulated substrate with metal wiring
18‧‧‧銀離子擴散抑制層 18‧‧‧ Silver ion diffusion suppression layer
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