201128205 六、發明說明： 【發'明戶斤屬^^椅冷貝政^】 發明領域 本發明系有關電容式觸摸屏面板（capacitive touch screen panel ’下稱“CTSP”)之製造步驟判定不良與否之檢測 裝置及檢測方法’尤指通過利用LC共振頻移精確測量CTSP 之良品和不良品之間存在之IT〇接觸感測器電極之間微細 電容量（capacitance)之差異，從而無需CTSP專用控制器晶 片，不受不同CTSP之ITO電極圖案之影響而準確判定不良 之檢測裝置及檢測方法。 * 發明背景 一般而言，附著於手機或KIOSK等顯示畫面之上並通 過手之觸摸輸入各種按鈕或資訊之觸摸屏面板，包括電阻 膜方式和電容方式。其中，電容式觸摸屏面板CTSp—般具 有如第1圖所示之結構。其包括：位於最下端之下部接地用 薄膜110 ;其上之形成有起到接觸感測器作用之透明IT〇電 極圖案之感測器電極薄膜120 ;其上之通過粘合劑附著於 ΙΤ0電極之電介質薄膜130;最上面之保護薄膜140。根據不 同製造商，作為接觸感測器電極之ΙΤΟ電極15〇圖案之形 狀，根據其性能和專用控制器晶片之驅動方式有所不同， 而整體基本結構如上所述，尤其是，在ΙΤ〇感測器電極之間 維持電容量之方式是各製造商之共同點。即，如第2圖所 示’所有CTSP是ΙΤΟ電極之間存在之電容器和下部接地 201128205 所產生之電谷裔220之串並聯結合形態之等效電路。 若在上述結構之CTSP上附著内置如第3圖所示之專用 控制器晶片310之FPC320，則將形成觸摸屏模組形態，可完 成測量人手觸摸CTSP之位置之工作。 CTSP之工作原理如下：若人手接觸CTSP，則接觸部位 之ITO電極之間之電容量變得與初始值不同。在專用控制器 晶片310中，將利用施加於ITO電極之電信號脈衝之相位延 遲變化測量此值之變化，並利用内置於晶片31〇之演算法解 析，從而獲取手接觸於CTSP之位置資訊。因此，專用控制 器晶片之作用在觸摸屏模組之工作中起到非常重要之功 能。若改變CTSP之ITO電極圖案設計，則將改變之形態將 引起電極之間電容量之變化，從而需使用根據這些改變設 計編程之新專用控制器晶片。 各CTSP製造商完成觸摸屏模組為止之生產步驟，而先 前之電氣特性質量檢測，在CTSP或觸摸屏模組狀態，利用 專用控制器晶片完成。因此，若因CTSP之機型之變化導致 CTSP之ITO電極圖案之變化，則每次都需使用搭載不同專 用控制器晶片之檢測儀。另外，在先前利用專用控制器晶 片之方式中，無法知道左右CTSP電氣特性之ΓΓΟ感測器電 極之間之電容量。另外，因專用晶片利用信號脈衝之相位 遲延時間測量技法判定不良，因此，容易受EMI等外部環 境條件變化之影響，降低測量精度。 L 明内3 發明概要 4 201128205 本發明之目的在於克服先前技術之不足而提供一種利 用LC共振頻移之電容式觸摸屏面板之檢測裝置及其檢測方 法’其無需CTSP專用控制器晶片，不受不同CTSP之ITO電 極圖案形狀之影響而精確檢測CTSP之電氣特性，以判定不 良品。 為達到上述目的，本發明利用LC共振頻移之電容式觸 摸屏面板之檢測裝置，其特徵在於，包括：LC共振部，其 包括與CTSP之ITO感測器電極之間之電容量結合產生電氣 共振之LC共振電路；〇p放大器驅動部，連接於上述lc共振 部並振盪上述LC共振部之LC共振電路，且將共振頻率之波 形變換為矩形波；中繼部，連接於上述1匚共振部並對稱並 聯上述LC共振電路和上述CTSPiIT◦感測器電極；微電腦 連接於上述OP放大驅動部並驅動上述中繼部，通過 計算從上述OP放大器驅動部輸出之上述矩形波而測量頻率 並判定CTSP之不良與否。 在此，較佳地，上述微電腦部測量相當於在上述Lc共 振電路之C值上加上ITO電極之間電容量之Lc共振頻移並 用平均值相除獲得規格化計算值，從而根據此計算值包含 於良品之共振頻移範圍之内與否，判定CTSp之不良與否。 另外，較佳地，上述良品之共振頻移範圍，用平均值 除以LC共振頻移進行規格化之後，由用戶判斷存在於指定 良品範圍與否。 為達到上述目之，本發明利用LC共振頻移之電容式觸 摸屏面板之檢測方法，其特徵在於： 201128205 在包括與CTSP之ITO感測器電極之間之電容量結合產 生電氣共振之LC共振電路；在振盈上述lc共振電路之同 時，為使微電腦部計算頻率而變換為矩形波之〇ρ放大器驅 動部，及中繼部和微電腦部之利用LC共振頻移之電容式觸 摸屏面板之檢測裝置中，包括： 第一步，為獲得通過單純LC振盪之標準共振頻率，在 未連接CTSP和LC共振電路之狀態下，上述微電腦部通過頻 率計算測量單純LC共振電路之標準共振頻率值並保存此值； 第二步，通過上述微電腦部之信號工作之中繼部，各 按雙依次並聯CTSP之ΙΤΟ感測器電極和LC共振電路，此 時，利用上述微電腦部測量並保存ΙΤΌ電極之間之電容量加 上LC共振電路之C值所產生之共振頻移值； 第三步，通過重複上述第二步求利用上述微電腦部測 量之各CTSP之共振頻移分佈，設定良品範圍並保存於上述 微電腦部之記憶體； 第四步，上述微電腦部通過規格化計算出所保存之特 定通道之間共振頻移值並與保存在上述微電腦部之良品之 共振頻移值相比較，從而根據位於良品之共振頻移範圍與 否判定良品/不良品與否。 在此’較佳地’上述第四步測量相當於在上述Lc共振 電路之C值上加上ITO電極之間電容量之LC共振頻移並用 平均值相除獲得規格化計算值，從而根據此計算值包含於 良品之共振頻移範圍之内與否，判定CTSP之不良與否。 另外，較佳地，上述良品之共振頻移範圍，用平均值 6 201128205 除以Lc^_移進行規格化之後 ，由用戶判斷存在於指定 良品範圍與否。 I發日月利用LC共振頻移之電容式觸摸屏面板之檢測裝 置及其檢測方法具有如下優點： 因利用Lc共振頻率測量CTSP之ITO電極之間電容量 值之異常與否，因此，不受不同ITO圖案和CTSP類型之影 響，無需CTSP專用控制器晶片，即可判定CTSp之不良與否； 另外’因為採用通過電氣共振現象之檢測電路，從而 因共振現象S)有之穩定性，财靜電衝擊和外部EMI等電氣 衝擊性強，而對機械振動或溫度、濕度變化等外部環境變 化因素卻很遲鈍；而在測量過程中，因非通過計算電壓或 電流值之方式，而通過計算頻率之方式測量，從而可確保 _ U1000以上之測量精度； 另外，因可利用LC共振電路常數和共振頻率關係式， 獲得CTSP之ITO電極之間實際電容量值，從而易用於不良 分析° 圖式簡單說明 第1圖為一般CTSP各層之結構圖； 第2圖為一般CTSP之ITO電極等效電路示意圖； 第3圖為一般之已完成觸摸屏模組結構示意圖； 第4圖為本發明一實施例利用共振之CTSP檢測裝置 電路圖； 第5圖為本發明一實施例良品CTSp之各通道共振頻移 曲線圖； 201128205 第ό圖為第5圖之結果之規格化及良品範園設定曲線圖， 第7圖為不良判定實例（1)曲線圖； 第8圖為不良判定實例(2)曲線圖； 第9圖為CTSP之ΙΤΟ端子之間實際電容量測量結果曲 線圖。 【實施方式3 較佳實施例之詳細說明 本發明之上述目的、特定及其他優點，將通過如下結 合附圖對本發明較佳實施例進行詳細說明變得更加明瞭。 下面，結合附圖對本發明利用LC共振頻移之電容式觸摸屏 面板之檢測裝置及其檢測方法進行詳細說明。在本說明查 中，除特別標明的之外，附圖中之相同附圖標記表示相门 之結構。 下面，結合附圖對本發明CTSP檢測方法進行詳細說明。 首先，適用本發明檢測方法之利用LC共振之CTSP檢測 裝置之電路示於第4圖。如第4圖所示，檢測電路主要包括 LC共振部410、〇ρ放大器驅動部420、中繼部430及微電腦 部 440。 LC共振部410因一般CTSP之ΙΤΟ電極之間電容量為數 十pF之非常小之值，因此，為便於測量上述值由小於100pF 之標準電容器（capacitor)和具備數百uH之電感（inductance) 值之線圈構成LC共振電路，從而使標準共振頻率處於 600kHz~800kHz範圍值之内。 0P放大器驅動部420在振盪LC共振電路之同時，將共 8 201128205 振頻率之波形從正弦波轉換為矩形波，從而使微電腦部44〇 便於計算。 中繼部430為各按雙依次並聯LC共振電路和CTSp之 ιτο感測器電極之裝置’通過接收微電腦部44〇之信號工作。 微電腦部440通過驅動中繼部43〇並計算從〇p放大器驅 動部420輸出之共振頻率脈衝信號(矩形波）測量頻率，具有 電容量換算及判定CTSP不良與否之計算功能。 在本發明檢測裝置中，不在將LC共振部410之LC共振 電路產生之類比信號轉換為數位脈衝計算器之OP放大器驅 動部420之電路上發生干擾，而在微電腦部44〇測量時之精 度為0.1%之誤差範圍’屬於非常高之水平。 下面’將說明通過上述如第4圖所示之檢測電路，利用 共振頻移測量決定CTSP之電氣特性之Ι；Γ〇感測器電極之間 電容量之過程。 首先，通過斷開所有中繼部430，從而未將CTSP之ΙΤΟ 感測器電極連接於LC共振電路時，利用微電腦部440測量單 純共振電路之LC振盈時產生之共振頻率。 之後，通過微電腦部440之工作信號驅動中繼部430， 從而使CTSP之ΙΤΟ感測器電極，在觸摸面上為在相鄰之電 極之間，而在電子端子為以上下對稱之雙連接，即例如， 若存在10個ITO電極，首先連接1號和10號，接著連接2號和 9號，以此類推，則ITO電極之間之嗲容量加上LC共振電路 之C值產生共振頻移，而若利用微電腦部440測量此共振頻 移值，則可根據共振頻移之程度差異，一對一換算CTSP之 201128205 m>各電極之間電容量值吐述測量法不受不同CTsp^T〇 感測器電極之圖案形狀影響，從而不受⑺口類型之影響， 可適用於任何情況。另外，在測量精度方面，因非通過計 算電壓或電流值之方式，而通過計算頻率之方式測量，從 而可始終不X給測量帶來不利影響之電器干擾之影響而完 成精確之測量。 在結構方面，因利用與CTSP2IT〇電極間距相同之 PCB進行測量，從而與使用探針之探測儀不同，通過面接 觸方式避免CTSP之電極損傷，而且因通過直接測量方式測 量單元，從而測量阻抗及干擾較少。另外，即使CTSp之類 塑改變’也可通過簡單更換pCB來應對，從而不受所有CTSp 類型之影響，以低廉之費用適用於任何情況。 第5圖為本發明一實施例良品ctsp之各通道共振頻移 曲線圖；第6圖為第5圖之結果之規格化及良品範圍設定曲 線圖，第7圖為不良判定實例（丨）曲線圖；第8圖為不良判定 實例(2)曲線圖；第9圖為CTSP之ITO端子之間實際電容量測 量結果曲線圖。 下面’結合第5至9圖舉例說明檢測CTSP不良與否之實 際檢測過程。首先，利用微電腦部440測量CTSP檢測裝置 之標準共振頻率，測得680kHz。接著，測量正常CTSP樣品 之共振頻率並求其平均值。第5圖所示為其實際結果。 第5圖為利用如上所述之方法對具備32各端子之手機 用CTSP正常樣品10張，測量因對稱雙之端子間電容量移位 元之共振頻率之表示結果。第5圖中用虛線表示之通道3之 10 201128205 測量值510為在10張CTSP樣品中’將3號端子和30號端子連 接於上述檢測儀時獲得之值。其餘通道之值也與上述原理 相同。接下來是用平均值除以所測得之移位元頻率之規格 化(normalize)過程。其結果如第6圖所示。如第6圖所示，所 有結果資料都處於用虛線610表示之±1%誤差範圍之内，從 而將其設定為良品之共振頻移範圍並保存於微電腦記憶體 中。這樣設定良品之頻移範圍之後，在檢測CTSP時，與由 微電腦測量特定通道之間共振頻移並進行規格化計算保存 之良品範圍值進行比較’而若超出此良品範圍，則可判定 為不良。下面是不良判定之實例。第7和8圖為判定為不良 之CTSP樣品之結果。在第7圖中，可看出用虛線71〇表示之 兩個資料值超出良品之範圍’而在第8圖中，有多個資料值 大大超出良品之範圍。第9圖為利用LC共振電路關係式 F=^L(Cref+CP)，將第7圖之測量結果換算表示為CTSP之 實際電容量之結果。此時，用於檢測電路之LC各為 L=lmH，Cref=30pF。即，若測量共振頻移，則也可球之實 際電容量。 因此’所有資料按不同通道測量及保存，而且利用頻 率、電容量等物理量判定測量值之良/不良與否，從而可實 現生產之標準管理。 上述利用LC共振頻移之電容式觸摸屏面板之檢測裝置 及其檢測方法，具有利用LC共振頻移，不受不同IT〇圖案 和CTSP類型之影響，無需CTSP專用控制器晶片，即可判定 201128205 CTSP之不良與否之優點。 另外，因為採用通過電氣共振現象之檢查電路，從而 因共振現象固有之穩定性，具有耐靜電衝擊和外部EMI等 電氣衝擊性強’而對機械振動或溫度、濕度變化等外部環 境變化因素卻很遲鈍之優點。而在測量過程中，不是利用 電壓或電流，而是利用頻率計算測量，從而具有可確保 1 /1000以上測量精度之優點。 另外，因可利用LC共振電路常數和共振頻率關係式， 獲得CTSP之ITO電極之間實際電容量值，從而具有易用於 不良分析之優點。 上述實施例僅用以說明本發明而非限制，本領域之普 通技術人員應當理解，可以對本發明進行修改、變形或者 等同替換，而不脫離本發明之精神和範圍，其均應涵蓋在 本發明之申請專利範圍當中。 【圖式簡單說明3 第1圖為一般CTSP各層之結構圖； 第2圖為一般CTSP之ITO電極等效電路示意圖； 第3圖為一般之已完成觸摸屏模組結構示意圖； 第4圖為本發明一實施例利用LC共振之CTSp檢測裝置 電路圖； 第5圖為本發明一實施例良品CTSP之各通道共振頻移 曲線圖； 第6圖為第5圖之結果之規格化及良品範圍設定曲線圖； 第7圖為不良判定實例（1)曲線圖； 12 201128205 第8圖為不良判定實例(2)曲線圖； 第9圖為CTSP之ITO端子之間實際電容量測量結果曲 線圖。 320.. .FPC 410.. .LC共振部 420.. .0.放大器驅動部 430.. .中繼部 440.. .微電腦部 510.. .測量值 610、710...虛線 【主要元件符號說明 110···下部接地用薄膜 120···感測器電極薄膜 130.. .電介質薄膜 140.. .保護薄膜 150.. .1.O 電極 210、220...電容器 310.. .專用控制器晶片 13201128205 VI. Description of the invention: [Daily 'Ming's households ^^ chair cold Beizheng ^) FIELD OF THE INVENTION The present invention relates to a capacitive touch screen panel (hereinafter referred to as "CTSP") manufacturing steps are judged poor or not The detection device and the detection method, in particular, utilize the LC resonance frequency shift to accurately measure the difference in the capacitance between the CTSP contact sensor electrode and the defect between the defective product and the defective product, thereby eliminating the need for dedicated CTSP control. The wafer is not affected by the ITO electrode pattern of different CTSPs, and the detection device and the detection method are accurately determined. BACKGROUND OF THE INVENTION Generally, a touch screen panel that is attached to a display screen such as a mobile phone or a KIOSK and inputs various buttons or information through a touch of a hand includes a resistive film method and a capacitive method. Among them, the capacitive touch panel panel CTSp generally has the structure as shown in Fig. 1. The method comprises: a film 110 for grounding at a lowermost end; a sensor electrode film 120 formed thereon with a transparent IT 〇 electrode pattern functioning as a contact sensor; and the ITO electrode is adhered thereto by an adhesive The dielectric film 130; the uppermost protective film 140. According to different manufacturers, the shape of the 〇 electrode 15 〇 pattern as the contact sensor electrode varies according to its performance and the driving mode of the dedicated controller chip, and the overall basic structure is as described above, especially, The way in which the capacitance is maintained between the electrodes of the detector is common to all manufacturers. That is, as shown in Fig. 2, all of the CTSPs are equivalent circuits of a series connection of a capacitor existing between the electrodes and a series connection of the electric grounds of the electric ground. If the FPC 320 incorporating the dedicated controller chip 310 as shown in Fig. 3 is attached to the CTSP of the above structure, the touch panel module form will be formed, and the work of measuring the position of the human hand to touch the CTSP can be completed. The working principle of CTSP is as follows: If the human hand touches the CTSP, the capacitance between the ITO electrodes at the contact portion becomes different from the initial value. In the dedicated controller chip 310, the change in phase value is measured by the phase delay variation of the electric signal pulse applied to the ITO electrode, and the algorithm built in the chip 31〇 is used to analyze the position information of the hand contact with the CTSP. Therefore, the role of the dedicated controller chip plays a very important role in the operation of the touch screen module. If the ITO electrode pattern design of the CTSP is changed, the change in shape will cause a change in the capacitance between the electrodes, requiring the use of a new dedicated controller chip programmed according to these changes. Each CTSP manufacturer completes the production steps of the touch screen module, and the previous electrical characteristic quality inspection is performed in the state of the CTSP or touch screen module using a dedicated controller chip. Therefore, if the CTSP ITO electrode pattern changes due to changes in the CTSP model, a detector equipped with a different dedicated controller chip is required each time. In addition, in the previous method of using a dedicated controller chip, it was impossible to know the capacitance between the sensor electrodes of the left and right CTSP electrical characteristics. In addition, since the dedicated chip uses the phase delay measurement technique of the signal pulse to determine the defect, it is susceptible to changes in external environmental conditions such as EMI, and the measurement accuracy is lowered. L Mingna 3 Summary of Invention 4 201128205 The object of the present invention is to overcome the deficiencies of the prior art and to provide a detection device for a capacitive touch screen panel using LC resonance frequency shift and a detection method thereof, which do not require a CTSP dedicated controller chip, and are not different The electrical characteristics of the CTSP are accurately detected by the influence of the shape of the ITO electrode pattern of the CTSP to determine the defective product. In order to achieve the above object, the present invention utilizes a LC resonant frequency shift capacitive touch screen panel detecting apparatus, comprising: an LC resonant portion including a capacitance combined with a CTSP ITO sensor electrode to generate electrical resonance The LC resonance circuit; the 〇p amplifier drive unit is connected to the lc resonance unit and oscillates the LC resonance circuit of the LC resonance unit, and converts a waveform of a resonance frequency into a rectangular wave; and a relay unit connected to the 1匚 resonance unit And arranging the LC resonance circuit and the CTSPiIT sensor electrode symmetrically in parallel; the microcomputer is connected to the OP amplification drive unit and driving the relay unit, and measuring the frequency and determining the CTSP by calculating the rectangular wave outputted from the OP amplifier drive unit. Bad or not. Here, preferably, the microcomputer portion measures an Lc resonance frequency shift corresponding to the capacitance between the ITO electrodes on the C value of the Lc resonance circuit, and divides the average value to obtain a normalized calculation value, thereby calculating according to the calculation. The value is included in the resonance frequency shift range of the good product to determine whether the CTSp is defective or not. Further, preferably, the resonance frequency shift range of the above-mentioned good product is normalized by the LC resonance frequency shift, and then judged by the user whether it exists in the specified good product range or not. In order to achieve the above object, the present invention utilizes a method for detecting a capacitive touch screen panel of LC resonance frequency shift, which is characterized in that: 201128205 LC resonance circuit which generates electrical resonance in combination with a capacitance including an electrode of an ITO sensor of CTSP At the same time as the above-mentioned lc resonance circuit, the 〇p amplifier driving unit for converting the rectangular wave into the frequency calculated by the microcomputer unit, and the detecting device of the capacitive touch panel using the LC resonance frequency shift of the relay unit and the microcomputer unit In the first step, in order to obtain a standard resonance frequency by simple LC oscillation, the microcomputer section measures the standard resonance frequency value of the simple LC resonance circuit by frequency calculation and saves the state without connecting the CTSP and the LC resonance circuit. In the second step, through the relay part of the signal operation of the microcomputer section, the sensor electrodes and the LC resonance circuit of the CTSP are sequentially connected in parallel, and at this time, the micro-computer part is used to measure and save the between the electrodes. The capacitance plus the resonance frequency shift value generated by the C value of the LC resonance circuit; the third step, by repeating the above second step The resonant frequency shift distribution of each CTSP measured by the microcomputer unit is set and stored in the memory of the microcomputer unit. In the fourth step, the microcomputer unit calculates the resonance frequency shift value between the saved specific channels by normalization and The resonance frequency shift values of the good products stored in the above microcomputer section are compared, thereby determining whether the good/bad product is based on the resonance frequency shift range of the good product. Here, the 'preferred' fourth step measurement is equivalent to adding the LC resonance frequency shift of the capacitance between the ITO electrodes to the C value of the Lc resonance circuit and dividing by the average value to obtain a normalized calculation value, thereby The calculated value is included in the resonance frequency shift range of the good product to determine whether the CTSP is defective or not. Further, preferably, the resonance frequency shift range of the above-mentioned good product is normalized by the average value 6 201128205 divided by Lc^_ shift, and then judged by the user whether it exists in the specified good product range or not. The detection device and the detection method of the capacitive touch screen panel using the LC resonance frequency shift have the following advantages: The abnormality of the capacitance value between the ITO electrodes of the CTSP is measured by using the Lc resonance frequency, and therefore, is not different The influence of the ITO pattern and the CTSP type can determine whether the CTSp is defective or not without the CTSP dedicated controller chip. In addition, because of the detection circuit through the electrical resonance phenomenon, the stability due to the resonance phenomenon S), the electrostatic impact It has strong electrical impact with external EMI, but is slow to external environmental changes such as mechanical vibration or temperature and humidity changes. In the measurement process, the way of calculating the frequency is not by calculating the voltage or current value. Measurement, thus ensuring the measurement accuracy of _ U1000 or more; In addition, since the LC resonance circuit constant and the resonance frequency relationship can be used, the actual capacitance value between the ITO electrodes of the CTSP can be obtained, which is easy to be used for the bad analysis. Figure 1 is a structural diagram of each layer of the general CTSP; Figure 2 is a schematic diagram of the equivalent circuit of the ITO electrode of the general CTSP; FIG. 4 is a circuit diagram of a CTSP detecting device using resonance according to an embodiment of the present invention; FIG. 5 is a resonant frequency shifting curve of each channel of a good CTSp according to an embodiment of the present invention; 201128205 The figure shows the normalized and good product setting curve of the result of Fig. 5, the 7th is the bad judgment example (1) graph; the 8th figure is the bad judgment example (2) curve; the 9th figure is the CTSP曲线The actual capacitance measurement results between the terminals. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT OF THE INVENTION The detailed description of the preferred embodiments of the present invention will be understood as Hereinafter, a detecting device and a detecting method of the capacitive touch panel panel using the LC resonance frequency shift of the present invention will be described in detail with reference to the accompanying drawings. In the description of the present specification, the same reference numerals in the drawings denote the structure of the phase door, unless otherwise specified. Hereinafter, the CTSP detecting method of the present invention will be described in detail with reference to the accompanying drawings. First, a circuit of a CTSP detecting apparatus using LC resonance to which the detecting method of the present invention is applied is shown in Fig. 4. As shown in Fig. 4, the detection circuit mainly includes an LC resonance unit 410, a 放大器ρ amplifier driving unit 420, a relay unit 430, and a microcomputer unit 440. The LC resonance portion 410 has a very small value of several tens of pF due to the capacitance between the electrodes of the general CTSP. Therefore, a standard capacitor (capacitor) of less than 100 pF and an inductance of several hundred uH are easily used for measuring the above values. The coil of value constitutes the LC resonant circuit such that the standard resonant frequency is within the range of 600 kHz to 800 kHz. The 0P amplifier driving unit 420 converts the waveform of the common frequency of 201128205 from a sine wave to a rectangular wave while oscillating the LC resonance circuit, thereby making it easy for the microcomputer unit 44 to calculate. The relay unit 430 operates by receiving signals from the microcomputer unit 44 for each of the devices that alternately connect the LC resonance circuit and the CTSp sensor electrodes. The microcomputer unit 440 drives the relay unit 43 to calculate the resonance frequency pulse signal (rectangular wave) measurement frequency output from the 〇p amplifier driving unit 420, and has a calculation function of capacitance conversion and determination of whether or not the CTSP is defective. In the detecting device of the present invention, interference does not occur on the circuit of the OP amplifier driving unit 420 that converts the analog signal generated by the LC resonance circuit of the LC resonance unit 410 into a digital pulse calculator, and the accuracy in the measurement by the microcomputer unit 44 is The 0.1% error range 'is a very high level. The following will describe the process of determining the electrical characteristics of the CTSP by the resonance frequency shift measurement by the above-described detection circuit as shown in Fig. 4; the process of capacitance between the electrodes of the sensor. First, by disconnecting all the relay sections 430 so that the 感 sensor electrodes of the CTSP are not connected to the LC resonance circuit, the microcomputer unit 440 measures the resonance frequency generated when the LC resonance of the pure resonance circuit is performed. Thereafter, the relay unit 430 is driven by the operation signal of the microcomputer unit 440, so that the sensor electrodes of the CTSP are between the adjacent electrodes on the touch surface, and the electronic terminals are double-symmetrically connected above and below. That is, for example, if there are 10 ITO electrodes, first connect No. 1 and No. 10, then connect No. 2 and No. 9, and so on, the 嗲 capacity between the ITO electrodes plus the C value of the LC resonance circuit produces a resonance frequency shift. If the resonance frequency shift value is measured by the microcomputer unit 440, the degree of resonance frequency shift may be different, and the one-to-one conversion CTSP 201128205 m> the capacitance value between the electrodes is not different from the CTsp^T The shape of the sensor electrode is affected by the shape of the sensor, so that it is not affected by the type of port (7) and can be applied to any situation. In addition, in terms of measurement accuracy, it is measured by calculating the frequency by not calculating the voltage or current value, so that accurate measurement can be performed without always affecting the electrical interference that adversely affects the measurement. In terms of structure, the measurement is performed by using the same PCB as the CTSP2IT electrode, so that unlike the probe using the probe, the electrode damage of the CTSP is avoided by the surface contact method, and the impedance is measured by measuring the unit by direct measurement. Less interference. In addition, even the plastic change of CTSp can be dealt with by simply changing the pCB, so that it is not affected by all CTSp types, and can be applied to any situation at a low cost. Figure 5 is a graph showing the resonance frequency shift of each channel of a good ctsp according to an embodiment of the present invention; Figure 6 is a normalized and good range setting curve of the result of Fig. 5, and Fig. 7 is a bad judgment example (丨) curve. Fig. 8 is a graph of the poor judgment example (2); Fig. 9 is a graph showing the actual capacitance measurement results between the ITO terminals of the CTSP. The following is a combination of the fifth to ninth examples to illustrate the actual detection process for detecting the failure of CTSP. First, the microcomputer portion 440 measures the standard resonance frequency of the CTSP detecting device to measure 680 kHz. Next, the resonance frequency of the normal CTSP sample was measured and averaged. Figure 5 shows the actual results. Fig. 5 is a graph showing the results of the resonance frequency of the capacitance shifting element between the terminals of the symmetrical pair by measuring 10 samples of the normal CTSP sample for the mobile phone having 32 terminals by the method described above. 10 of the channel 3 indicated by the broken line in Fig. 5 201128205 The measured value 510 is the value obtained when the terminal No. 3 and the terminal No. 30 are connected to the above-mentioned detector in 10 CTSP samples. The values of the remaining channels are also the same as above. Next is the normalize process of dividing the average by the measured shifting element frequency. The result is shown in Fig. 6. As shown in Fig. 6, all the result data are within ±1% of the error range indicated by the broken line 610, and are set as the resonance frequency shift range of the good product and stored in the microcomputer memory. When the frequency shift range of the good product is set in this way, when the CTSP is detected, it is compared with the good value range in which the resonance frequency shift between the specific channels is measured by the microcomputer and the normalized calculation is saved, and if it exceeds the range of the good product, it can be judged as defective. . The following are examples of bad decisions. Figures 7 and 8 show the results of the CTSP samples judged to be poor. In Fig. 7, it can be seen that the two data values indicated by the broken line 71〇 are out of the range of the good product', and in Fig. 8, there are a plurality of data values which are far beyond the range of the good product. Fig. 9 is a graph showing the conversion of the measurement result of Fig. 7 as the actual capacitance of the CTSP using the LC resonance circuit relationship F = ^ L (Cref + CP). At this time, the LCs for the detection circuit are each L = lmH, Cref = 30 pF. That is, if the resonance frequency shift is measured, the actual capacitance of the ball can also be used. Therefore, all data is measured and stored in different channels, and physical quantities such as frequency and capacitance are used to determine whether the measured values are good/bad or not, so that standard management of production can be achieved. The above-mentioned detection device and detection method of the capacitive touch screen panel using the LC resonance frequency shift have the effect of utilizing the LC resonance frequency shift, and are not affected by different IT〇 patterns and CTSP types, and the CTSP dedicated controller chip can be used to determine the 201128205 CTSP. The advantage of being bad or not. In addition, since the inspection circuit that passes the electrical resonance phenomenon is used, the inherent stability of the resonance phenomenon has strong electrical shock resistance such as electrostatic shock resistance and external EMI, and the external environmental change factors such as mechanical vibration, temperature and humidity change are very high. The advantage of being dull. In the measurement process, instead of using voltage or current, it is measured by frequency calculation, which has the advantage of ensuring measurement accuracy of 1 / 1000 or more. In addition, since the actual capacitance value between the ITO electrodes of the CTSP can be obtained by using the relationship between the LC resonance circuit constant and the resonance frequency, it has an advantage that it is easy to be used for poor analysis. The above-described embodiments are only intended to illustrate the invention and are not to be construed as limiting the scope of the invention. The scope of the patent application. [Simple diagram of the figure 3 Figure 1 is a structural diagram of the general CTSP layers; Figure 2 is a schematic diagram of the equivalent circuit of the ITO electrode of the general CTSP; Figure 3 is a schematic diagram of the structure of the completed touch screen module; BRIEF DESCRIPTION OF THE DRAWINGS FIG. 5 is a circuit diagram of a CTSp detection device using LC resonance; FIG. 5 is a resonance frequency shift curve of each channel of a good CTSP according to an embodiment of the present invention; FIG. 6 is a normalization and yield range setting curve of the result of FIG. Fig. 7 is a graph of bad judgment (1); 12 201128205 Fig. 8 is a graph of bad judgment (2); Fig. 9 is a graph of actual capacitance measurement between ITO terminals of CTSP. 320.. .FPC 410.. .LC resonance unit 420..0.Amplifier drive unit 430.. Relay unit 440.. . Microcomputer unit 510.. Measurement value 610, 710... Dashed line [Main components DESCRIPTION OF REFERENCE NUMERALS 110··· Lower grounding film 120···Sensor electrode film 130.. Dielectric film 140.. Protective film 150..1.0 Electrode 210, 220... Capacitor 310.. Dedicated controller chip 13