CN102981686B - A kind of method of capacitive touch screen architecture defects detection - Google Patents
A kind of method of capacitive touch screen architecture defects detection Download PDFInfo
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- CN102981686B CN102981686B CN201210312661.9A CN201210312661A CN102981686B CN 102981686 B CN102981686 B CN 102981686B CN 201210312661 A CN201210312661 A CN 201210312661A CN 102981686 B CN102981686 B CN 102981686B
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- 238000000034 method Methods 0.000 title claims abstract description 22
- 230000007547 defect Effects 0.000 title claims abstract description 13
- 238000001514 detection method Methods 0.000 title claims abstract description 7
- 230000008859 change Effects 0.000 claims abstract description 13
- 239000011159 matrix material Substances 0.000 claims abstract description 13
- 238000012360 testing method Methods 0.000 claims description 9
- 238000005259 measurement Methods 0.000 claims description 7
- 238000004364 calculation method Methods 0.000 claims description 3
- 239000003990 capacitor Substances 0.000 description 3
- 230000008878 coupling Effects 0.000 description 3
- 238000010168 coupling process Methods 0.000 description 3
- 238000005859 coupling reaction Methods 0.000 description 3
- 238000007689 inspection Methods 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 238000004458 analytical method Methods 0.000 description 1
- 238000003491 array Methods 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 1
- 238000003672 processing method Methods 0.000 description 1
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Abstract
The present invention relates to a kind of method of capacitive touch screen architecture defects detection, this device comprises capacitance plate, capacitance plate control chip, a magnitude of voltage is first set and drives all drive wires successively, do you measure every root drive wire Drive? Line and sense wire Sense? mutual capacitance value between Line, obtain mutual capacitance value matrix as benchmark, change the driving voltage value being applied to drive wire again, drive all drive wires successively, again measure the mutual capacitance value between every root drive wire and sense wire, judge whether that defectiveness exists according to the difference Changing Pattern between twice measured value.
Description
Technical field
The present invention relates to a kind of capacitive touch screen defect inspection method, especially projecting type capacitor formula touch-screen sweep trace capacitance determining method.
Background technology
Touch-screen obtains increasing application because it is sturdy and durable, reaction velocity fast, save the advantages such as space in various electronic device field.Projection-type capacitive touch screen product becomes the mainstream product in the market at present.Its scanning theory as shown in Figure 1, the overlapping electrod-array of transverse and longitudinal is made at glass baseplate surface ITO (indium tin oxide), horizontal and vertical ITO electrode infall forms several Inductance and Capacitance, also namely two arrays of electrodes forms the two poles of the earth of electric capacity respectively, when occurring to touch, touch place adjacent electrode coupling condition changes, thus mutual capacitance value changes, by the change of scan capture to capacitance, namely obtain touch location.For the touch-screen that 4 lines, 4 alignments are formed, the electrode of line and alignment; Form the two poles of the earth of Inductance and Capacitance respectively, when the position of pixel 103 correspondence on finger touch screen, two electrode couplings near pixel 103 change, cause the change of Inductance and Capacitance 105 value, driving circuit 102 pairs of lines, also namely drive wire DriveIine100 timesharing applies drive singal successively, alignment is also that sense wire SenseIine104 senses by column, sensing signal is by operational amplifier 106 and export, and is obtained the position coordinates of touch point by the change detecting corresponding capacitance.
Need before touch-screen formed product to test its electrical specification such as capacitance, to ensure product yield.Capacitance plate device and capacitance plate control chip may existing defects and cause capacitance detecting value constant, and namely no matter have no touch, corresponding capacitance is fixed value or changes not obvious.But present stage touch-screen ITO only can test its conducting and impedance after etching, and cannot test sweep trace electric capacity.Therefore mechanical arm can only be utilized to simulate the actions such as finger carries out ruling, get ready on product to simulate the mode of operation of actual persons, then read data and process, judge that whether product is qualified.This method efficiency is low and easily produce error by external interference.
A kind of measuring technology is the mode by external capacitor in addition, by sweep trace testing capacitance, external tunable capacitor and coupling capacitance respectively parallel connection go forward side by side after row operation process and compare output, judge whether scanning capacitance value can accept by analysis result with comparing of predetermined threshold level.This method increase extra cost and extendability shortcoming.
Namely the application proposes a kind of capacitance touch screen defect inspection method that is efficient, that easily expand, detects sweep trace electric capacity.
Summary of the invention
Namely object of the present invention in order to overcome the capacitive touch screen architecture that the deficiencies in the prior art provide a kind of capacitance touch screen defect inspection method and adopt the method, can detect the capacitance profile of Projected capacitive touch screen, thus detecting touch-screen yield further.
In technical scheme of the present invention, a magnitude of voltage is first set and drives all drive wire DriveLine successively, measure the mutual capacitance value between every root drive wire DriveLine and sense wire SenseLine, obtain mutual capacitance value matrix as benchmark, change the driving voltage value being applied to drive wire DriveLine again, drive all drive wires successively, again measure the mutual capacitance value between every root drive wire DriveLine and sense wire SenseLine, judge whether that defectiveness exists according to the difference Changing Pattern between twice measured value.Namely cause the change detecting data with the change of driving voltage, and judge defect according to this change.
Capacitance touch screen is because various factors is as the open circuit, short circuit etc. of adjacent electrode, Inductance and Capacitance existing defects can be caused, thus cause capacitance detecting value correctly actual capacitance value cannot be detected, as capacitance change time, Detection capacitance value is constant or almost constant, or there is improper numerical value in detected value, as much larger than or much smaller than normal mutual capacitance value variation range, and qualified capacitance plate twice measured value difference controls usually in a zone of reasonableness.By the deviation of measurement result and the threshold value preset being compared, capacitance plate whether existing defects can be judged.
Relative to prior art, the method that the present invention proposes can control by setting program automatically, has and measures accurately, the advantages such as efficiency is high, favorable expandability.
Accompanying drawing explanation
Fig. 1 is the signal of projected capacitive screen drive principle.
The difference list of twice mutual capacitance measured value when Fig. 2 is the capacitance plate employing different driving voltage of 6*6.
Embodiment
Below in conjunction with specific embodiment, the present invention is described in detail.
For the capacitance plate of 6*6, C [x, y] drives with initial boost voltage to obtain corresponding capacitance measurement value matrix, C ' [x, y] drives the measurement capacitance obtaining correspondence, Δ C [x with new driving voltage after changing driving voltage, y]=C [x, y]-C ' [x, y], x is electrode matrix row-coordinate, y is electrode matrix row coordinates, and in Fig. 2, Tx, Rx are the pins after circuit chip package, Tx is drive end, and Rx is sense terminals.For the mutual capacitance touchscreens of a N*M, need N number of transmitting terminal Tx, be connected with alignment (i.e. sense wire) with the line (i.e. drive wire) of electrode matrix respectively with M receiving end Rx.Qualified capacitance plate twice measured value difference controls usually in a zone of reasonableness, and as Thr1 < Δ Cxy < Thr2, Thr1, Thr2 are threshold value, and its concrete numerical value is determined by practical experience and data processing method.In test practice, can first test short run touch-screen product, measure difference DELTA Cxy and be considered as continuous random variable, its Normal Distribution, analyzes distribution curve, according to choosing of fiducial interval determination threshold value.If capacitance measurement difference is not within the scope of threshold value, then think that corresponding capacitance can not accept, this deviation and other sweep trace deviations are compared, basis can be provided for subsequent technique improves.
In the method that the present invention proposes, the measurement of mutual capacitance calculation matrix is not limited to 2 times, can measure n time in practice, comprehensively analyzes n calculation matrix, thus improves test accuracy.
This method can be applicable to existing capacitive touch screen architecture, it comprises capacitance touch screen, capacitance plate control circuit and corresponding connecting circuit, control circuit can comprise driving circuit and testing circuit, the driving voltage of the configurable different size of driving circuit, capacitance plate control circuit can be independent chip, also can be integrated with the MCU of other electronic equipments, the quantity of capacitance plate control chip is not limited to 1, can expand according to demand, such as configure multiple chip for middle size or large-sized capacitance plate and realize expansion, to adapt to different demands.
Although for the capacitance plate of 6*6 in the present embodiment, be not limited to the array of 6*6, shape such as the capacitance plate of N*M (M, N are natural number) form all can with reference to the present embodiment examinations.The foregoing is only preferred embodiment of the present invention, not in order to limit the present invention, all any amendments done within the spirit and principles in the present invention, equivalent replacement and improvement etc., all should be included within protection scope of the present invention.
Claims (6)
1. the method for a capacitive touch screen architecture defects detection, described device comprises capacitance plate, capacitance plate control chip, described capacitance plate is provided with drive wire DriveLine and the sense wire SenseLine of many intersection placements, it is characterized in that, a driving voltage value is first set and drives all drive wires successively, obtain the mutual capacitance value two-dimensional matrix corresponding to mutual capacitance value between drive wire and sense wire, change driving voltage value again, drive all drive wires successively, again measure the mutual capacitance value two-dimensional matrix obtaining corresponding to mutual capacitance value between every root drive wire and sense wire, judge whether defectiveness exists corresponding capacitance according to the difference Changing Pattern between calculation matrix, described defect is the change that Detection capacitance value correctly cannot detect capacitance, when capacitance changes, Detection capacitance value is constant or almost constant, the difference of the mutual capacitance value two-dimensional matrix twice measurement obtained compares with the threshold value preset, if difference is not within the scope of threshold value, corresponding electric capacity existing defects is described.
2. the method for claim 1, is characterized in that: the measurement of described mutual capacitance value two-dimensional matrix can be n time, n > 2.
3. method as claimed in claim 1 or 2, is characterized in that: described capacitance plate control chip comprises driving circuit and the testing circuit of configurable driving voltage, and described driving circuit has adjustable driving voltage.
4. method as claimed in claim 3, is characterized in that: the number of described capacitance plate control chip can more than 1, to adapt to the demand of different size capacitance plate.
5. method as claimed in claim 3, is characterized in that: described capacitance plate control chip can also integrate with MCU.
6. method as claimed in claim 1 or 2, is characterized in that: described change driving voltage comprises boosted voltage or reduces voltage.
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| CN201210312661.9A CN102981686B (en) | 2012-08-29 | 2012-08-29 | A kind of method of capacitive touch screen architecture defects detection |
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| JP6311223B2 (en) * | 2013-06-07 | 2018-04-18 | 日本電産リード株式会社 | Inspection device, calibration method of inspection device, and inspection method |
| CN105224149B (en) * | 2014-06-06 | 2018-02-16 | 敦泰科技有限公司 | A kind of method for detecting capacitive touch screen |
| US20160154507A1 (en) * | 2014-12-01 | 2016-06-02 | Cypress Semiconductor Corporation | Systems, methods, and devices for touch event and hover event detection |
| CN106971137B (en) * | 2016-06-15 | 2024-01-12 | 柳州梓博科技有限公司 | Detection device of fingerprint sensor, fingerprint sensor and electronic equipment |
| CN106707575B (en) * | 2017-03-20 | 2020-03-10 | 厦门天马微电子有限公司 | Liquid crystal display panel and test method thereof |
| CN109684734B (en) * | 2018-12-26 | 2020-06-02 | 北京华大九天软件有限公司 | Method for checking model matrix |
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| CN101958090A (en) * | 2009-07-21 | 2011-01-26 | 上海天马微电子有限公司 | Touch detection circuit and touch detection method |
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| US8576182B2 (en) * | 2009-09-01 | 2013-11-05 | Atmel Corporation | Methods and apparatuses to test the functionality of capacitive sensors |
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| CN101958090A (en) * | 2009-07-21 | 2011-01-26 | 上海天马微电子有限公司 | Touch detection circuit and touch detection method |
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