[go: up one dir, main page]

TW200815268A - Work transferring method, electrostatic chuck device, and board joining method - Google Patents

Work transferring method, electrostatic chuck device, and board joining method Download PDF

Info

Publication number
TW200815268A
TW200815268A TW096101276A TW96101276A TW200815268A TW 200815268 A TW200815268 A TW 200815268A TW 096101276 A TW096101276 A TW 096101276A TW 96101276 A TW96101276 A TW 96101276A TW 200815268 A TW200815268 A TW 200815268A
Authority
TW
Taiwan
Prior art keywords
electrostatic chuck
workpiece
substrate
electrostatic
holding
Prior art date
Application number
TW096101276A
Other languages
Chinese (zh)
Other versions
TWI412480B (en
Inventor
Yoshikazu Ohtani
Original Assignee
Shinetsu Eng Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shinetsu Eng Co Ltd filed Critical Shinetsu Eng Co Ltd
Publication of TW200815268A publication Critical patent/TW200815268A/en
Application granted granted Critical
Publication of TWI412480B publication Critical patent/TWI412480B/en

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B65CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65GTRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
    • B65G49/00Conveying systems characterised by their application for specified purposes not otherwise provided for
    • B65G49/05Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles
    • B65G49/06Conveying systems characterised by their application for specified purposes not otherwise provided for for fragile or damageable materials or articles for fragile sheets, e.g. glass
    • B65G49/061Lifting, gripping, or carrying means, for one or more sheets forming independent means of transport, e.g. suction cups, transport frames
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67739Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
    • H01L21/67742Mechanical parts of transfer devices
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6831Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using electrostatic chucks
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B65CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65GTRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
    • B65G2249/00Aspects relating to conveying systems for the manufacture of fragile sheets
    • B65G2249/02Controlled or contamination-free environments or clean space conditions
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B65CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65GTRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
    • B65G2249/00Aspects relating to conveying systems for the manufacture of fragile sheets
    • B65G2249/04Arrangements of vacuum systems or suction cups
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B65CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
    • B65GTRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
    • B65G2249/00Aspects relating to conveying systems for the manufacture of fragile sheets
    • B65G2249/04Arrangements of vacuum systems or suction cups
    • B65G2249/045Details of suction cups suction cups

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Robotics (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)

Abstract

An electrostatic chuck device enabling even a thin work with low rigidity to be releasedly placed without causing deformation and displacement during the movement. An electrostatic chuck (2) is attached to a holding plate (1) by an attaching means (3). A work (A) is chucked and held by the attached electrostatic chuck (2). The electrostatic chuck (2) and the work (A) are integrally separated from the holding plate (1) by a separating means (4). Since the work (A) is not brought into a free state, it can be transferred to the release position without being affected by the gravity. When only the electrostatic chuck (2) is re-attached to the holding plate (1) by the attaching means (3) after the electrostatic attracting function of the electrostatic chuck (2) is stopped, the electrostatic chuck (2) is separated from the surface of the work (A) moved to the release position, and the work (A) is left at the release position and placed.

Description

200815268 九、發明說明: 【發明所屬之技術領域】 本發明關於-種基板貼合方法,例如,於液晶顯示器 (LCD)或等離子顯不器(pDp)或柔性顯示器等之平面顯示器 •之製造過程中,使用於搬送包括拆裝自如地保持貼合由CF 、 玻璃或TFT玻璃等之玻璃製基板或PES(Poly-Ether- ^啡叫等之塑膠薄膜等而成之合成樹脂製基板之基板貼 φ :機之基板組裝裝置或,這種基板等之絕緣體,導電體或 半V體晶片等之工件(被處理體)之基板搬送裝置等之工件 傳送方法以及靜電吸盤裝置和,使用其之基板貼合方法。 洋細而5,關於一種用保持板之靜電吸盤吸附保持工 件,開放該被保持之工件裝載在規定位置之工件傳送方 去’以及由保持板和吸附保持工件之靜電吸盤而成之靜電 吸盤裝置,並使用其之基板貼合方法。 【先前技術】 _ 以在’作爲重合2片基板之基板貼合機,係為由加壓板 在内部内裝電極板之絕緣性部件構成的靜電吸盤,使該爲 工件保持玻璃基板’向χγ方向使該上基板和下基板對位 * 後,減壓真空腔内,該真空腔内達到所希望之真空度時, 、 解除加壓板之靜電吸附功能,使上基板下落到下基板,使 上下基板重合後,通過使加壓板降落,加壓上下基板貼 合’直至將兩者之間隔達到規定間隙(例如,參照專利文 獻1) 〇 並且,與由靜電吸盤(靜電吸附機構)之上基板(上側基 117682.doc 200815268200815268 IX. Description of the Invention: [Technical Field] The present invention relates to a substrate bonding method, for example, a flat panel display such as a liquid crystal display (LCD) or a plasma display (pDp) or a flexible display. In the case of transporting a substrate made of a glass substrate such as CF, glass, or TFT glass, or a PES (a plastic film made of a plastic film such as Poly-Ether), the substrate is attached and detached. φ: a substrate assembly apparatus of the machine, an insulator such as a substrate, a workpiece transfer method such as a substrate transfer apparatus of a workpiece (subject to be processed) such as a conductor or a semi-V-body wafer, and an electrostatic chuck device and a substrate using the same The bonding method is as follows: 5. A method for adsorbing and holding a workpiece by using an electrostatic chuck of a holding plate, opening the workpiece to be transported at a predetermined position by the held workpiece, and forming an electrostatic chuck by holding the plate and holding the workpiece. The electrostatic chuck device and the substrate bonding method using the same. [Prior Art] _ In the case of a substrate laminating machine as a superimposed two-piece substrate, The pressure plate is internally provided with an electrostatic chuck composed of an insulating member of the electrode plate, so that the workpiece holding glass substrate aligns the upper substrate and the lower substrate in the χγ direction, and then decompresses the vacuum chamber, and the vacuum chamber reaches When the desired degree of vacuum is applied, the electrostatic adsorption function of the pressure plate is released, the upper substrate is dropped onto the lower substrate, and the upper and lower substrates are superposed, and then the pressure plate is lowered, and the upper and lower substrates are pressed together until the two are The interval reaches a prescribed gap (for example, refer to Patent Document 1) 〇 and, with an electrostatic chuck (electrostatic adsorption mechanism) above the substrate (upper side 117682.doc 200815268

板)之保持解除聯動,從該上基板之背面側噴出氣體,夢 由在上方保持板之靜電吸附面和上基板之背面之間強制灌 注該氣體,從而破壞這些靜電吸附面和基板面之緊密狀態 而剝離兩者,強制性衰減、消失兩者間之靜電吸附力,同 時,通過所灌注之氣體壓力,強制性地使向下基板(下側 基板)之降落力,即降落之加速度產生作用,由此,瞬時 地使該上基板壓接到下基板,用靜電吸附機構保持之狀態 下’上基板姿勢無變化地移動壓接到下基板,從而封止重 合上下基板(例如,參照專利文獻2)。 專利文獻1 :專利公開2001-166272號公報(第6頁,圖8) 專利文獻2:專利第m378公報(第g頁,圖 【發明内容】 然而,在以往之工件傳送方法或靜電吸盤裝置中,專利 文獻1的冑況,㈣空+,由靜電吸附功能之解除使工件 (上基板)自由降落,但由靜電吸盤之基板吸附力,即使遮 斷其電源基板吸附力也不會立即消失而是繼續作用,因 此’由於在其後的基板吸附力的降低,而發生解除之不释 定,而靜電吸附面和工件之界面局部開始剝離,最後,: 件之全面剝離而自由降落。 由此,由於工件(上基板)以最後剝離之部位為中心邊旋 轉移動’ 4自由降落’所以存在下述問題,即,在上下基 板彼此之對位發生莩Im ^ 為差冋時,在自由降落之壓力中,封 止不完全,空氣容易混。 、 進而,遠存在下述問題,即,因爲工件(上基板)對靜電 117682.doc 200815268 吸附面從先開始剝離的部位由重力而局部下垂,發生傾 斜’而且’容易因該傾斜情況而變化,所以,在自由降落 中難以修正,同時,降落在下基板之上後也難以修正,從 而無法達到規定的平行度。 • 然而,近幾年,液晶顯示器或等離子顯示器之基板大型 化之傾向中’開始製造一邊超過丨〇〇 mm之基板,但是,即 使基板大型化,也要求與小型基板同樣之平行度。尤其, φ 若基板之一邊超過1000 mm,則與該χγ方向之大小相比, 由於Z方向之間隔變爲極端小,所以,像管使這些上下基 板完全平行接近移動為理想,但是實際上非常困難。 在這種環境下,一邊超過1〇〇 mm的大型之上基板若有 微小之傾斜,則與XY方向之大小相比,2方向之間隔極端 小,所以有可能會發生事先塗佈於上下基板之相對面的任 .公方之液晶封止用密封材(環形黏接劑)或兩基板之膜面 又損傷等之障害,有根本不能期待完整之貼合的問題。 _ 而且,專利文獻2之情況,從工件(上基板)之背面侧向 與該工件之間喷射氣體進行剝離,但是,如以往所使用之 工件,右係為具有〇·7〜ι·ι 111111厚度之玻璃基板,由於面方 向之剛性比較高,所以,剝離用氣體容易均自地傳達至面 > 方向,從而由氣體可以確實地從靜電吸盤剝離。 仁疋近幾年,如移動電話或筆記本電腦,重視輕量化 之液曰日顯不器之用途增多,在這種用途,出現了工件之玻 璃厚度約為〇·5 mm以下之非常薄之顯示器,況且,使用於 、*示器之工件係爲厚度為數百um之PES(Poly-Ether- 117682.doc 200815268The holding of the plate is released, and the gas is ejected from the back side of the upper substrate, and the gas is forcibly poured between the electrostatic adsorption surface of the upper holding plate and the back surface of the upper substrate, thereby breaking the close relationship between the electrostatic adsorption surface and the substrate surface. In the state, the two are peeled off, and the electrostatic adsorption force between the two is forcibly attenuated and disappeared. At the same time, the falling force of the lower substrate (lower substrate), that is, the acceleration of the falling, is forcibly caused by the gas pressure of the gas to be poured. Thereby, the upper substrate is instantaneously pressed to the lower substrate, and the upper substrate is moved and pressed to the lower substrate without change in the state of being held by the electrostatic adsorption mechanism, thereby sealing the overlapping of the upper and lower substrates (for example, refer to the patent document) 2). Patent Document 1: Patent Publication No. 2001-166272 (page 6, FIG. 8) Patent Document 2: Patent No. m378 (p. g., FIG. [Summary of the Invention] However, in the conventional workpiece transfer method or electrostatic chuck device In the case of Patent Document 1, (4) Empty +, the workpiece (upper substrate) is freely dropped by the release of the electrostatic adsorption function, but the adsorption force of the substrate of the electrostatic chuck does not immediately disappear even if the adsorption force of the power supply substrate is blocked. Since the action continues, the release of the substrate is delayed due to the decrease in the adsorption force of the substrate, and the interface between the electrostatic adsorption surface and the workpiece starts to peel off. Finally, the part is completely peeled off and falls freely. Since the workpiece (upper substrate) is rotationally moved '4 free fall' centering on the portion where the final peeling is centered, there is a problem that the pressure at the free fall is caused when 上下Im ^ is a difference between the upper and lower substrates. In the middle, the sealing is incomplete, the air is easy to mix. Further, there is a problem that the workpiece (upper substrate) is electrostatically opposed to the electrostatic 117682.doc 200815268 The portion to be peeled off is partially sagging by gravity, and the inclination is 'and' is easily changed by the inclination. Therefore, it is difficult to correct in the free fall, and it is difficult to correct after landing on the lower substrate, so that the predetermined parallel cannot be achieved. However, in recent years, in the tendency of a substrate for a liquid crystal display or a plasma display to increase in size, it has been started to manufacture a substrate that exceeds 丨〇〇mm. However, even if the substrate is enlarged, the parallelism is required to be the same as that of the small substrate. In particular, φ, if one side of the substrate exceeds 1000 mm, the interval between the Z directions becomes extremely small compared to the size of the χ γ direction. Therefore, it is desirable for the image tube to move the upper and lower substrates completely in parallel, but it is actually very Difficulty. In such an environment, if there is a slight tilt on a large upper substrate of more than 1 mm, the interval between the two directions is extremely small compared to the size of the XY direction, so that it may be applied in advance. Any of the opposite sides of the upper and lower substrates, the liquid crystal sealing sealing material (ring adhesive) or the film surface of both substrates is damaged. In the case of Patent Document 2, the gas is ejected from the back side of the workpiece (upper substrate) to the workpiece, but it is used as before. The workpiece is a glass substrate having a thickness of 〇·7~ι·ι 111111, and the rigidity of the surface is relatively high. Therefore, the gas for separation is easily transmitted to the surface of the surface, so that the gas can be surely It has been peeled off from the electrostatic chuck. In recent years, such as mobile phones or notebook computers, the use of liquids and liquids that focus on lightweighting has increased. In this application, the thickness of the glass of the workpiece is about 〇·5 mm or less. Very thin display, and the workpiece used in the * display is a PES with a thickness of several hundred um (Poly-Ether-117682.doc 200815268)

Sulphone)等之塑膠薄膜。 這種約0.5 mm以下之玻璃基板或塑膠薄膜等之工件係, 與以往開始所使用之0.7〜1·1 mm之玻璃基板相比剛性極端 低,因此,即使噴射剝離用氣體,也由其動力工件局部擠 壓變形,在該變形部分集中剝離用氣體之流路而茂漏,有 由剩餘吸附力而不能確實地剝離工件的憂慮,同時,在該 剝離時以剝離用之氣流擠壓變形之部分被集中擴展,有局 部變形之可能性。 本發明中請求項1、4所述發明之目的為,即使係為薄且 剛性低之工件,在移動中也不會發生變形或偏移地開放裝 載。 請求項2所述之發明係,除請求項1所述之發明目的外, 其目的為,確實地保持傳送工件。 請求項3所述之發明係,除請求項丨或2所述之發明目的 外’其目的為,提高工件之剝離性。 凊求項5所述之發明係,除請求項4所述之發明目的外, 其目的為,即使係為剛性低之基板,與靜電吸附力之解除 之不穩定無關地於定位置貼合確實地進行剝離。 爲了達成上述目的,本發明之請求項丨所述之發明係, 其特徵為,將靜電吸盤形成為薄板狀或膜狀移動自如地支 撐,在該靜電吸盤靜電吸附與其相對之工件表面,在工件 被靜電吸附之狀態下,將該靜電吸盤從該吸附位置向開放 位置移動,同時,停止靜電吸盤之靜電吸附功能,只使靜 電吸盤從該開放位置朝向吸附位置反方向移動,從移動至 117682.doc 200815268 開放位置之工件之表面剝離靜電吸盤。 凊求項2所述之發明係,其特徵為,在請求項】所述之發 明之構成,再加上將上述靜電吸盤形成為薄板狀或膜狀, 相對於由剛體而成之保持板之平滑之基座面向與其正交之 方向移動自如地支撐之構成。 請求項3所述之發明係,其特徵為,在請求項丨或]所述 之發明之構成,再加上將上述靜電吸盤之靜電吸附部從與 工件之外周端部相對之部位局部變形,在與該工件之外周 端部之間局部形成剝離用間隙之構成。 並且,請求項4所述之發明係,其特徵為,相對於保持 板之工件側表面向與其正交之方向移動自如地支撐靜電吸 盤,以使靜電吸盤沿該工件側表面之狀態下,靜電吸附工 件之表面,在該工件被靜電吸附之狀態下,從該吸附位置 向開放位置移動該靜電吸盤,同時,停止該靜電吸盤之靜 電吸附功能,只將靜電吸盤從該開放位置向吸附位置反^ 向移動,從而從移動到開放位置之工件之表面剝離靜電吸 盤。 請求項5所述之發明係,其特徵為,將請求項4所述之靜 電吸盤裝置設置在一對保持板之任意一方或雙方,在這此 保持板之間作爲上述工件使兩片基板相對且拆裝自如地保 持,以一方之基板被靜電吸附之狀態下,將上述靜電吸盤 裝置之靜電吸盤從該保持板之任意一方剝離,並使該一方 之基板向另一方之基板移動,通過環形黏接劑貼合兩基 板0 117682.doc 200815268 本發明中之請求項丨所述之發明係,以黏著機構使靜電 吸盤黏贴在保持板,用該被黏貼之靜電吸盤吸附保持工 件,同時,通過用隔離機構將這些靜電吸盤和工件為一體 攸保持板隔離,工件不成爲自由狀態,不受重力等之影響 :傳送至開放位置,同時止該靜電吸盤之靜電吸附功 此後,用黏著機構只將靜電吸盤再次黏貼在保持板,從Plastic film such as Sulphone). Such a workpiece such as a glass substrate or a plastic film of about 0.5 mm or less has extremely low rigidity compared with a glass substrate of 0.7 to 1.1 mm which has been used in the past, and therefore, even if a gas for spraying is peeled off, the power is driven. The workpiece is locally pressed and deformed, and the flow path of the stripping gas is concentrated in the deformed portion, and there is a fear that the workpiece cannot be reliably peeled off by the residual adsorbing force, and at the same time, the stripping air flow is pressed and deformed at the time of peeling. Part of it is concentrated and expanded, with the possibility of local deformation. The object of the inventions of claims 1 and 4 of the present invention is that even if the workpiece is thin and has low rigidity, the load is not deformed or displaced during the movement. The invention described in claim 2 is intended to reliably maintain the transfer of the workpiece, in addition to the object of the invention described in claim 1. The invention described in claim 3 is intended to improve the peelability of the workpiece, except for the object of the invention described in claim 2 or 2. According to the invention of claim 5, in addition to the object of the invention described in claim 4, the object of the invention is that the substrate having a low rigidity is bonded to the fixed position irrespective of the instability of the release of the electrostatic adsorption force. Stripping is performed on the ground. In order to achieve the above object, the invention of claim 1 is characterized in that the electrostatic chuck is formed in a thin plate shape or a film shape and is movably supported, and the electrostatic chuck is electrostatically adsorbed on the surface of the workpiece opposite thereto, in the workpiece In the state of being electrostatically adsorbed, the electrostatic chuck is moved from the adsorption position to the open position, and the electrostatic adsorption function of the electrostatic chuck is stopped, and only the electrostatic chuck is moved from the open position toward the adsorption position in the opposite direction, and moves to 117682. Doc 200815268 The surface of the workpiece in the open position is stripped of the electrostatic chuck. The invention according to claim 2, wherein the electrostatic chuck is formed into a thin plate shape or a film shape, and the holding plate is formed of a rigid body. The smooth base is configured to be freely supported in a direction orthogonal thereto. The invention according to claim 3, characterized in that, in the configuration of the invention of the claim or the above, the electrostatic adsorption portion of the electrostatic chuck is locally deformed from a portion opposed to the outer peripheral end portion of the workpiece, A configuration in which a peeling gap is partially formed between the outer peripheral end portions of the workpiece. Further, the invention of claim 4 is characterized in that the electrostatic chuck is movably supported in a direction orthogonal thereto with respect to the workpiece side surface of the holding plate so that the electrostatic chuck is along the side surface of the workpiece, and the static electricity is electrostatically charged. Adsorbing the surface of the workpiece, moving the electrostatic chuck from the adsorption position to the open position while the workpiece is electrostatically adsorbed, and stopping the electrostatic adsorption function of the electrostatic chuck, and only inverting the electrostatic chuck from the open position to the adsorption position ^ Move to peel the electrostatic chuck from the surface of the workpiece moving to the open position. The invention according to claim 5, characterized in that the electrostatic chuck device according to claim 4 is provided on either or both of the pair of holding plates, and the two substrates are opposed to each other as the workpiece between the holding plates. Further, the electrostatic chuck of the electrostatic chuck device is peeled off from one of the holding plates while one of the substrates is electrostatically adsorbed, and the one substrate is moved to the other substrate, and the ring is passed through the ring. The invention relates to the invention of claim 2, wherein the electrostatic chuck is adhered to the holding plate by an adhesive mechanism, and the workpiece is sucked and held by the adhered electrostatic chuck, and By using the isolation mechanism to separate the electrostatic chuck and the workpiece, the workpiece is not in a free state, and is not affected by gravity or the like: it is transported to an open position, and at the same time, the electrostatic chucking function of the electrostatic chuck is stopped, and the adhesive mechanism is only used. Adhere the electrostatic chuck to the retaining plate again, from

而移動到開放位置之工件之表面剝離靜電吸盤,該工件 留在開放位置被裝載。 從而,即使係為薄且剛性低之工件,在移動中也可以不 發生變形或偏移地開放裝載。 其結果,與通過靜電吸附之解除發生靜電吸附力之解除 之不敎而工件之姿勢容易變爲不敎之以往相比,可以 在其之姿勢穩定之狀態下將工件傳送至定位置。 更且,與用以氣體之噴射壓力剝離工件之以往相比,即 使係為剛性低之工件,剝離用氣體之流路也不會集中在特 =部分,而與剛性高之卫件相同,可以確實地剝離 作性優越。 請求項2的發明係,除請求頊 八項1之發明之效果外,將靜雷 吸盤形成為薄板狀或膜狀,相 τ ^ 相對於由剛體而成之保持板之 平滑之基座面向與其正交之方向 白移動自如地支撐,以黏著 故構之作動,通過至少使靜電 ^ ^ 电及盤之靜電吸附部沿由剛體 而成之平滑之基座面弄平垣, ^ ^ 一攸而碾些基座面和靜電吸附 口Ρ之間無間隙地接觸並靜電 ^ ^ 电及附,接著以隔離機構之作 動’在工件被靜電吸附之狀 &下,從基座面剝離靜電吸 117682.doc -10- 200815268 盤,由於工件不成爲自由狀態’因此不受重力等之影響而 被傳运後,以黏著機構之作動,從該移動之工件之表面剝 離靜電吸盤’沿著基座面返回初期狀態。 從而,可以確實地保持傳送工件。 • ㈤求項3之發明係,除請求項1或2之發明效果外,從與 f件之外周端部相對之部位局部變形靜電吸盤之靜電吸附 邛,在與該工件之外周端部之間局部形成剝離用之間隙, • &而’這些靜電吸盤之靜電吸附部與工件之表面之間該剝 離用之間隙一ΤΓ :i ]丨水下子擴大,剩餘吸附力被強制地衰減而消 減0 從而,可以提高工件之剝離性。 ,求項4的發明係,相對於保持板之卫件側表面向與其 正交之方向移動自如地支樓靜電吸盤,在使靜電吸盤沿該 工件側表面之狀態之下,靜電吸附工件之表面,並通過在 工件被靜電吸附之狀態下使靜電吸盤從該吸附位置移動’ • ^工件不成爲自由狀態,因此不受重力等之影響而傳送 到開放位置,同時,停止該靜電吸盤之靜電吸附功能,只 將靜電吸盤從該開放位置朝向吸附位置反方向移動,從 ’ @ ’靜電吸盤從移動到開放位置之工件之表面剝離。 • 從而’即使為薄且剛性低之卫件’在移動中,也可以不 發生變形及偏移地開放裝載。 其結果’與由靜電吸附之解除發生靜電吸附力之解除之 不穩定而工件之姿勢易變爲不穩定的以往相比,在其姿勢 穩定之狀態之下可以將工件傳送至定位置。 八 I17682.doc 200815268 更且,與以氣體之噴射壓力剝離工件之以往相比,即 為剛性低之工件’剝離用氣體之流路也不會集中在特二吏 分’與剛性高的工件同樣,可以確實地㈣,並其工=The surface of the workpiece moved to the open position peels off the electrostatic chuck, and the workpiece is left in the open position to be loaded. Therefore, even if the workpiece is thin and has low rigidity, the load can be opened without being deformed or displaced during the movement. As a result, the workpiece can be conveyed to a fixed position in a state where the posture of the workpiece is likely to be stable as compared with the case where the posture of the workpiece is easily released by the release of the electrostatic adsorption. Further, even if it is a workpiece having a low rigidity, the flow path of the gas for peeling is not concentrated in the special portion as compared with the conventional one in which the workpiece is peeled off by the gas, and the same as the high-rigidity member, It is really good to peel off. According to the invention of claim 2, in addition to the effect of the invention of the eighth item 1, the static suction cup is formed into a thin plate shape or a film shape, and the phase τ ^ is opposite to the smooth base surface of the holding plate formed of the rigid body The direction of the orthogonal direction is freely supported by the white movement, and the action of the adhesive structure is performed by at least causing the electrostatic adsorption portion of the electrostatic electricity and the disk to be smoothed along the smooth base surface formed by the rigid body. The base surface and the electrostatic adsorption port are in contact with each other without any gaps, and are electrostatically charged and attached. Then, by the action of the isolation mechanism, the electrostatic suction 117682 is peeled off from the base surface under the condition that the workpiece is electrostatically adsorbed. Doc -10- 200815268 The disc, because the workpiece does not become free, so it is transported without being affected by gravity, etc., and the electrostatic chuck is peeled off from the surface of the moving workpiece by the action of the adhesive mechanism. Initial state. Thereby, the transfer of the workpiece can be surely maintained. (5) The invention of claim 3, wherein in addition to the effect of the invention of claim 1 or 2, the electrostatic adsorption of the electrostatic chuck is locally deformed from a portion opposite to the outer end portion of the f-piece, between the outer peripheral portion of the workpiece Partially forming the gap for peeling, • & and 'the gap between the electrostatic adsorption portion of the electrostatic chuck and the surface of the workpiece is ΤΓ :i ] 丨 the underwater sub-expansion, the residual adsorption force is forcibly attenuated and reduced by 0 Thereby, the peelability of the workpiece can be improved. According to the invention of claim 4, the electrostatic chuck of the branch is moved freely relative to the side surface of the holder of the holding plate in a direction orthogonal thereto, and the surface of the workpiece is electrostatically adsorbed while the electrostatic chuck is along the side surface of the workpiece. And the electrostatic chuck is moved from the adsorption position by the electrostatic adsorption of the workpiece. • The workpiece does not become a free state, and thus is not transmitted to the open position by the influence of gravity or the like, and at the same time, the electrostatic adsorption function of the electrostatic chuck is stopped. Only the electrostatic chuck is moved from the open position toward the adsorption position in the opposite direction, and the '@' electrostatic chuck is peeled off from the surface of the workpiece moved to the open position. • Thus, even if the guard piece that is thin and has low rigidity is moving, it can be opened and loaded without deformation or deviation. As a result, the workpiece can be transported to a fixed position in a state where the posture of the workpiece is unstable, and the position of the workpiece is unstable due to the instability of the electrostatic adsorption due to the release of the electrostatic adsorption. VIII I17682.doc 200815268 Moreover, compared with the past, when the workpiece is peeled off by the gas jet pressure, the workpiece with low rigidity is not concentrated in the flow path of the gas for the peeling. Can be sure (four), and its work =

凊求項5之發明係,除請求項4之發明效果外,一方之美 板被靜電吸附之狀態下將靜電吸盤從兩保持板之一方二 離’並使其向另一方之基板移動,通過以環形黏接劑貼合 兩基板’由於在一方之基板不成爲自由之狀態下,因此。 不受重力等之影響被傳送並正確地貼合,“,以上述環 形黏接劑之黏接力,容易將靜電吸盤從被保持之一方之= 板剝離。 i 從而’即使為剛性低之基板,也可以與靜電吸附力之解 除之不穩定無關地貼合在定位置並確實地剝離。 其結果,與由靜電吸附之解除使上基板自由降落之以往 之基板貼合機相比,可以防止兩基板彼此之對位誤差,同 時’可以確實地形成封止空間而可以防止空氣之混入,同 時,伴隨從靜電吸附面剝離上基板,完全沒有發生傾斜, 從而可以達成規定之平行度’而且,即使一邊為超過 m^n之大型基板,也可以完全防止以上基板之傾斜為起因 損傷液晶封止用密封材(環形黏接劑)或兩基板之膜面等之 障害。 更且,與以氣體之喷射壓力直接只剝離基板之以往之基 板貼合機相比,即使為剛性低之基板,剝離用氣體之流路 也不會集中在特定部分,與剛性高的工件同樣,可以確實 117682.doc • 12- 200815268 地剝離’並其工作性優越。 並且’因異物之嚙入,靜電吸盤之表面局部破壞而發生 支障也因爲保持板和薄板狀或膜狀之靜電吸盤為獨立部 件所以在叹置現场,對保持板也可以容易交換靜電吸 , ^日此維修性良好,尤其將本發明之靜電吸盤裝置使用 - ^不器等之生産線等時,可以在短時間内重新開始 生産線整體之運轉,所以不降低運轉率,而可以期待穩定 _ 之生産量。 〜 【實施方式】 表不本發明之工件傳送方法以及靜電吸盤裝置D配設 ^拆裝自㈣呆持貼合作爲工件Α、Β使嶋晶顯示 器(LCD)或等離子顯示器(pDp)或柔性顯示器之面板之玻璃 基板或塑膠薄膜基板之基板貼合機的情況。 如圖5(a)〜(c)所示,該基板貼合機配置以金屬或陶瓷等 之剛體由形成為無歪曲(撓曲)變形之厚度之平板狀之固定 • #而成之上下一對保持板1、Γ,使2片基板A、B分別拆裝 自如地保持在這些上下保持板ii,之平行面對之平滑面,' 在其周圍劃分形成之真空室8内達到規定之真空度後,將 上下保持板1、1,相對地朝向χγθ方向(在圖面水平方向)調 整移動,進行基板Α、Β彼此之對位,其後,至少使基板 A、Β中之一方從上下保持板i、丨,之平滑面剝離重合後, 進打真空室S内之真空破壞,以在兩基板A、B之内外所產 生之氣壓差加壓兩基板A、B之間直至達到規定之間隙。 進步洋細說明,如圖5(a)之實線所示,上下保持板工、 117682.doc •13· 200815268 1以升降機構(未圖示)向z方& 向(在圖面上下方向)可相對移 動地破支撐,在大氣壓之環 ^^A 衣兄中,向上下方向松開這些上 下保持板1、Γ之狀態,相對 ^ ^ 了於各個平滑面,分別配設保持 用搬迗機械手(未圖示)傳送之基板A、B。 其後,圖5(a)之兩點劃線所示 動使上下保持板1、Γ接近移動, 真空室S。 ’通過上述升降機構之作 而在這些兩者間劃分形成According to the invention of claim 5, in addition to the effect of the invention of claim 4, the electrostatic chuck is removed from one of the two holding plates and moved to the other substrate by the electrostatic adsorption state of one of the plates. The ring-shaped adhesive is bonded to the two substrates 'because the substrate is not free, so that the substrate is not free. It is conveyed and properly bonded without being affected by gravity or the like. "With the adhesive force of the above-mentioned ring-shaped adhesive, it is easy to peel the electrostatic chuck from the one that is held by the plate. i. Thus even if it is a substrate having low rigidity, It is also possible to adhere to a fixed position and to be reliably peeled off irrespective of the instability of the release of the electrostatic adsorption force. As a result, it is possible to prevent two of the conventional substrate bonding machines in which the upper substrate is freely dropped by the release of the electrostatic adsorption. The substrate is misaligned with each other, and at the same time, the sealing space can be surely formed to prevent the incorporation of air. At the same time, the upper substrate is peeled off from the electrostatic adsorption surface, and no tilt occurs at all, so that the prescribed parallelism can be achieved. In the case of a large substrate exceeding m^n, it is possible to completely prevent the inclination of the substrate from causing damage to the liquid crystal sealing sealing material (ring adhesive) or the film surfaces of the two substrates. Compared with the conventional substrate bonding machine in which the ejection pressure is directly peeled off from the substrate, even if the substrate is low in rigidity, the flow path of the gas for separation is not concentrated. The fixed part, like the workpiece with high rigidity, can be 117682.doc • 12-200815268 and it is excellent in workability. And 'Because of the foreign matter, the surface of the electrostatic chuck is partially broken and the support is also blocked because of the retaining plate and The thin plate or film-shaped electrostatic chuck is a separate component, so that it can be easily exchanged for the holding plate at the sigh site, and the maintenance is good, especially the electrostatic chuck device of the present invention is used. In the case of a production line or the like, the entire operation of the production line can be restarted in a short period of time, so that the production rate can be expected without lowering the operation rate. [Embodiment] The workpiece transfer method and the electrostatic chuck device of the present invention are shown. D is equipped with the case of a substrate bonding machine that disassembles and attaches to a glass substrate or a plastic film substrate of a workpiece, a crystal display (LCD) or a plasma display (pDp) or a flexible display panel. As shown in Fig. 5 (a) to (c), the substrate bonding machine is arranged such that a rigid body such as a metal or a ceramic is formed into a flat plate having a thickness which is free from distortion (flexure) deformation. Fixing # #上上上上保持板1,Γ, so that the two substrates A and B are detachably held in the upper and lower holding plates ii, which are parallel to the smooth surface, 'divided around them After the vacuum chamber 8 reaches a predetermined degree of vacuum, the upper and lower holding plates 1 and 1 are relatively moved in the direction of χγθ (horizontal direction in the drawing) to align the substrate Β and Β, and then at least the substrate A. One of the crucibles is separated from the upper and lower sides of the plate i, 丨, and the smooth surface is peeled and overlapped, and the vacuum in the vacuum chamber S is broken, and the two substrates A are pressurized by the difference in air pressure generated inside and outside the two substrates A and B. Between B and B, until the specified gap is reached. As shown by the solid line in Fig. 5(a), the upper and lower plates are kept, 117682.doc •13·200815268 1 is lifted (not shown) to z The square & direction (in the direction of the lower surface of the drawing) can be relatively loosely supported. In the ring of atmospheric pressure ^^A, the state of the upper and lower retaining plates 1 and Γ is released in the upward and downward directions. The smooth surface is equipped with a holding robot (not shown) The substrates A and B are sent. Thereafter, the two-dot chain line in Fig. 5(a) is moved to move the upper and lower holding plates 1, Γ close to the vacuum chamber S. 'Divided between these two by the above-mentioned lifting mechanism

接,,通過吸氣機構(未圖示)的作動,從該真空室㈣ 炙在達到規定之真空度時,通過水平移動機構(未 圖示)之作動,使上下保持板卜1,中之任一方相對於另一 方向ΧΥΘ方向㈣移動,從而,依次進行作爲保持於其之 基板a、B彼此之對位(對合)之粗對合和精對合。Then, when the vacuum chamber (4) is operated by a suction mechanism (not shown), when the predetermined degree of vacuum is reached, the horizontal movement mechanism (not shown) is actuated to hold the upper and lower plates, and Either one of the sides moves in the direction (4) with respect to the other direction, thereby sequentially performing the rough matching and the fine matching as the alignment (coincidence) of the substrates a and B held thereon.

結束這些對位後,如圖5(b)所示,將保持於上下保持板 1 1,基板A、B之任一方向另一方移動’通過夹下基板B 上之環形黏接劑(密封材)C瞬間壓接,而封止重合兩 間。 其後,如圖5⑷所示,通過上述升降機構之作動,使上 下保持板1、1向互相離開之方向移動,與此大致同時使上 述吸氣機構逆作動或用其他機構向真空室s内供給空氣或 氮,通過將該真空室S内之環境恢復到大氣壓,以在兩基 板A B内外發生之氣壓差均勻地加壓,在液晶被密封之 狀您下,壓碎到規定之間隙爲止,而完成貼合步驟。 並且,本發明之靜電吸盤裝置D係,由上述剛體而成的 上下保持板1、Γ和吸附保持基板A、B之靜電吸盤2構成。 117682.doc -14- 200815268 在圖示例中,相對於上保持板1之平滑面,向與其正交 之方向Z方向(在圖面上下方向)移動自如地支撐靜電吸盤 2,況且,在上保持板1具備,用於使該靜電吸盤2向平滑 面拉近各平滑面並拆裝自如地黏貼之黏著機構3和,用於 • 從各平滑面脫離該靜電吸盤2之隔離機構4。 • 用邊黏著機構3在上保持板1之平滑面黏貼靜電吸盤2, 以該黏貼之靜電吸盤2靜電吸附上基板A,用上述隔離機構 • 4,將這些靜電吸盤2和上基板A為一體從上保持板五向開放 位置隔離平行移動之同時,停止該靜電吸盤2之靜電吸附 功忐後,用黏著機構3只使靜電吸盤2從該開放位置向上保 持板1反方向移動,通過從移動到開放位置之上基板A之表 面剝離靜電吸盤2,從而,進行上述之基板a、貼合動 作。 上述靜電吸盤2 —體層叠以聚亞醯胺、聚醚醚酮 (PEEK)、|萘乙烯(pEN)等之絕緣性有機材料形成為平滑 • 之薄板狀或薄膜狀之電介體孔和,在其内部由絲網印刷等 被圖案化之導電性漿糊或導電而成之電極部2C。 • Λ電極邛2(與周圍絕緣形成,與用於對其施加電壓之電 源(未圖示)連接。 • 作爲其具體例’最好使用埋設2個以上之電極部2〇,例 如、,以梳齒狀埋設之雙極型之靜電吸盤。 、並且’向上下方向往復動自如地被支撐之靜電吸盤2之 〜…卩c被&制為,結束後述之隔離機構4之作動之後, 立即切斷電源連接而停止其靜電吸附功能。 117682.doc -15- 200815268 上述黏著機構3經上下保持板丨、丨,之平滑面之一方或雙 方和與其相對之靜電吸盤2之表面分別固定配置例如,永 久磁鐵或電磁鐵等之磁鐵,被該磁氣吸引之磁鐵或例 如用濺射等形成為膜狀之金屬等之磁性體3b,或分別固定 . 置磁力以外之黏著材料或機械觸控式連接機構以外之結 . 構,通過這些之磁力或黏著力,對該平滑面,上述靜電吸 盤拆裝自如地黏著。 φ i述隔離機構4 ’從上下保持板1、1,之平滑面之一方或 雙方朝向靜電吸盤2之相對面灌注例如氮氣或空氣等之氣 體或其他流體而按壓靜電吸盤2,或用氣缸等之上下往復 動之驅動體按壓靜電吸盤2,或作爲上述黏著機構3交換以 相對狀設置之磁鐵3a、3b任一方之磁極,通過使這些相對 之磁鐵3a、3b之磁極作爲相同而反彈,從而,靜電吸盤2 從該平滑面平行隔開。 以下,基於附圖説明本發明之各實施例。 • 該實施例1係為,如圖所示,在上述保持板丨之平 π面犬出ά又置埋设有上述黏著機構3之磁鐵“之由鋼鐵而 成之台座(基座),相對於其尖端表面之平滑之基座面u, 由導引機構(未圖不)等向上下方向往復動自如地支撐層叠 . 有上述黏著機構3之磁鐵扑之薄板狀或薄膜狀之靜電吸盤 2,作爲上述隔離機構4,通過從開設在上述保持板丨及台 座之内部之通氣孔4a向靜電吸盤2喷射氣體或流體,或者 使上述基座面la和靜電吸盤2之間劃分形成之密閉空間仆 之内壓上升,從而,抗拒上述黏著機構3之磁力,靜電吸 117682.doc -16· 200815268 盤2之幾乎整體從上述基座面丨a平行地脫離之情況。 而且,在上述保持板丨及台座上,設置在大氣中用於吸 附保持之吸引吸附機構5,使作爲該吸引吸附機構5形成之 多個吸引路配管連接在如真空泵等之吸引源(未圖示),同 , 時,將該吸引路作爲隔離機構4之通氣孔4a而使用。 • 另外,在圖面僅表示,通過相對於上保持板1之平滑面 向上下方向往復動自如地支撐靜電吸盤2,從而作爲工件 _ A,在吸附保持約〇·5 mm以下之剛性極爲低之上基板之表 面之狀態下移動之例,但是,因通過相對於下保持板i,之 平滑面向上下方向往復動自如地支撐靜電吸盤2,從而在 吸附保持下基板B之表面之狀態下進行移動之情況與上述 情況同樣,因此省略。 作爲固定配置在上述保持板丨之台座之磁鐵3a,使用永 久磁鐵或電磁鐵等,作爲固定配置在靜電吸盤2之相對面. 之磁鐵3b,若使用形成為薄板狀或薄膜狀之磁鐵,可以保 • 持靜電吸盤2之緩衝性或兩磁鐵3a、3b之剝離性,所以理 想。 而且,如圖2及圖3所示,作爲上述黏著機構3,通過將 — 固定配置在上述保持板1之台座之磁鐵3a和,固定配置在 - #電吸盤2之相對面之磁㈣,與各自之附近相反之磁極 之電極父互排列配置,從而,以上述隔離機構4之作動, 從上述基座面la拉開靜電吸盤2時,即使向χγθ*向發生 稍微偏移,也以由其後之黏著機構3之作動之磁力(斥力)自 動恢復到原位。 117682.doc •17- 200815268After the alignment is completed, as shown in FIG. 5(b), the other one of the substrates A and B is held in the upper and lower holding plates 1 and 1 and moved by the ring-shaped adhesive (the sealing material) on the substrate B. ) C is instantaneously crimped, and the seal is overlapped by two. Then, as shown in Fig. 5 (4), the upper and lower holding plates 1 and 1 are moved in the direction away from each other by the operation of the elevating mechanism, and the suction mechanism is reversely actuated or the other mechanism is moved into the vacuum chamber s at substantially the same time. By supplying air or nitrogen, by returning the environment in the vacuum chamber S to atmospheric pressure, the pressure difference occurring inside and outside the two substrates AB is uniformly pressurized, and when the liquid crystal is sealed, it is crushed to a predetermined gap. And complete the fitting step. Further, the electrostatic chuck device D of the present invention comprises an upper and lower holding plate 1 made of the above-mentioned rigid body, and an electrostatic chuck 2 which adsorbs and holds the substrates A and B. 117682.doc -14- 200815268 In the example of the figure, the electrostatic chuck 2 is movably supported in the direction Z (the direction in the lower direction of the drawing) orthogonal to the smooth surface of the upper holding plate 1, and, on the other hand, The holding plate 1 is provided with an adhesive mechanism 3 for detachably attaching the electrostatic chuck 2 to a smooth surface to each smooth surface, and for separating the isolation mechanism 4 of the electrostatic chuck 2 from each smooth surface. • Adhering the electrostatic chuck 2 to the smooth surface of the upper holding plate 1 by the edge bonding mechanism 3, electrostatically adsorbing the upper substrate A by the attached electrostatic chuck 2, and integrating the electrostatic chuck 2 and the upper substrate A with the above-mentioned isolation mechanism 4 After stopping the parallel movement of the upper holding plate in the five-way open position, after stopping the electrostatic attraction work of the electrostatic chuck 2, the adhesive mechanism 3 is used to move only the electrostatic chuck 2 from the open position to the upper direction of the holding plate 1 in the opposite direction. The electrostatic chuck 2 is peeled off from the surface of the substrate A at the open position, whereby the substrate a and the bonding operation described above are performed. The electrostatic chuck 2 is formed by laminating a dielectric material such as a thin plate or a film of an insulating organic material such as polyamidamine, polyetheretherketone (PEEK) or |naphthalene (pEN). A conductive paste or a conductive electrode portion 2C which is patterned by screen printing or the like. • Λ electrode 邛 2 (isolated from the surrounding and connected to a power supply (not shown) for applying a voltage thereto. • As a specific example, it is preferable to embed two or more electrode units 2 〇, for example, The electrostatic chuck of the bipolar type which is embedded in the comb-tooth shape, and the electrostatic chuck 2 which is supported by the reciprocating movement in the up-down direction is made up of, and immediately after the operation of the isolation mechanism 4 described later, The power supply connection is cut off to stop the electrostatic adsorption function. 117682.doc -15- 200815268 The above-mentioned adhesive mechanism 3 is fixedly disposed on one or both sides of the smooth surface of the upper and lower holding plates 丨, 丨, and the surface of the electrostatic chuck 2 opposed thereto, for example. a magnet such as a permanent magnet or an electromagnet, a magnet that is attracted by the magnetic gas, or a magnetic body 3b that is formed into a film-like metal by sputtering or the like, or is fixed separately. An adhesive material other than a magnetic force or a mechanical touch type A structure other than the connection mechanism, by the magnetic force or the adhesive force, the electrostatic chuck is detachably attached to the smooth surface. φ i describes the isolation mechanism 4' from the upper and lower holding plates 1, 1, One or both sides of the sliding surface are filled with a gas or other fluid such as nitrogen or air to press the electrostatic chuck 2 toward the opposite surface of the electrostatic chuck 2, or the electrostatic chuck 2 is pressed by a driving body that is reciprocated by a cylinder or the like, or as the above-mentioned adhesive The mechanism 3 exchanges the magnetic poles of any one of the magnets 3a and 3b which are opposed to each other, and rebounds by making the magnetic poles of the opposing magnets 3a and 3b the same, whereby the electrostatic chuck 2 is parallelly separated from the smooth surface. The embodiment illustrates the embodiment of the present invention. The first embodiment is characterized in that, as shown in the figure, the magnet of the adhesive mechanism 3 is embedded in the flat π-faced dog of the holding plate. The pedestal (base) is slidably supported by the guiding mechanism (not shown) in a downward direction with respect to the smooth base surface u of the tip end surface. The magnet of the above-mentioned adhesive mechanism 3 is thinned. The electrostatic chuck 2 in the form of a film or a film, as the above-described isolation mechanism 4, ejects gas or fluid from the vent hole 4a opened inside the holding plate 丨 and the pedestal to the electrostatic chuck 2, or The sealed space formed between the base surface la and the electrostatic chuck 2 is increased in internal pressure, thereby resisting the magnetic force of the adhesive mechanism 3, and electrostatically sucking 117682.doc -16·200815268 almost entirely from the base In the holding plate 丨 and the pedestal, the suction suction mechanism 5 for suction and holding in the atmosphere is provided, and the plurality of suction path pipes formed as the suction adsorption mechanism 5 are connected to each other. When a suction source (not shown) such as a vacuum pump is used, the suction path is used as the vent hole 4a of the isolation mechanism 4. • In addition, only the smooth surface of the upper holding plate 1 is shown in the drawing. The electrostatic chuck 2 is supported in a reciprocating manner in the up-and-down direction, and is moved as a workpiece_A in a state in which the rigidity of the substrate is approximately 〇·5 mm or less, which is extremely low, and the substrate is moved. The plate i is smoothly supported in the vertical direction so as to support the electrostatic chuck 2 so as to be movable while holding and holding the surface of the lower substrate B. Therefore omitted. As the magnet 3a fixedly disposed on the pedestal of the holding plate, a permanent magnet, an electromagnet or the like is used as the magnet 3b fixedly disposed on the opposite surface of the electrostatic chuck 2, and a magnet formed in a thin plate shape or a film shape can be used. It is desirable to hold the cushioning property of the electrostatic chuck 2 or the peelability of the two magnets 3a and 3b. Further, as shown in FIG. 2 and FIG. 3, as the above-mentioned adhesive mechanism 3, the magnets 3a fixed to the pedestal of the holding plate 1 are fixed to the magnetic surface (4) of the opposite surface of the -# electric chuck 2, and The electrodes of the opposite magnetic poles are arranged alternately with each other, so that when the electrostatic chuck 2 is pulled from the base surface la by the above-described isolation mechanism 4, even if a slight shift is made to χγθ*, The magnetic force (repulsive force) of the action of the adhesive mechanism 3 is automatically restored to the original position. 117682.doc •17- 200815268

而且’通過以上述黏著機構3之作動使靜電吸盤2拉到保 持板1之基座面la,從完成移動之工件(上基板)八強制剝離 時’不是把整個該靜電吸盤2之面拉近,而是,如圖1(b)局 部重要部分放大圖所示,通過先只拉近與被移動之工件A • 之外周端部A1面對之部位並進行局部變形,從而,在與該 • 工件A之外周端部A1之間局部形成剝離用間隙s丨為理想。 其次,對於使用該靜電吸盤裝置D之工件傳送方法進杆 馨 説明。 首先,如圖1(a)所示,由上述黏著機構3或吸引吸附機構 5之作動,朝向由剛體而成之保持板丨之基座面“使薄板狀 或者薄膜狀之靜電吸盤2拉近,使該靜電吸盤部2a沿著該 基座面la弄平滑後進行黏接,並將工件a靜電吸附在該靜 電吸盤2。 接著,如圖1(b)所示,以上述隔離機構4之作動,在工 件A被靜電吸附之狀態下,將靜電吸盤2從保持板丨之基座 _ 面1a拉開,並使該工件A朝向其他工件(下基板饵以平行狀 移動,由於工件A不成爲自由狀態,所以不受重力等之影 響被傳送,而由環形黏接劑C臨時固定在另一方之工 • B。 牛 並且,結束該移動之後,靜電吸盤2之電源被切斷,而 停止其靜電吸附功能。 比其稍微耽誤使上述黏著機構3或吸引吸附機構5作動, 若從該臨時固定之工件A強制拉開薄板狀或薄膜狀之靜電 吸盤2,此時之靜電吸盤2之剩餘吸附力變弱,因此,在這 117682.doc 18 200815268 些工件A和靜電吸盤2之靜電吸附部2a之間形成剝離用之間 隙S1,從該間隙81部分容易剝離靜電吸盤2之靜電吸盤部 2a 〇 與此同時,該薄板狀或薄膜狀之靜電吸盤2,由交互排 列配置相反磁極之電極之磁鐵3&、3b,相對於保持板丨之 基座面U不會向ΧΥΘ方向稍微偏移,而自動黏貼在原位置 而恢復到初期狀態。Further, 'by pulling the electrostatic chuck 2 to the base surface 1a of the holding plate 1 by the above-described adhesive mechanism 3, and forcibly peeling off from the workpiece (upper substrate) which has finished moving" is not bringing the entire surface of the electrostatic chuck 2 closer However, as shown in the enlarged view of the important part of Fig. 1(b), by directly drawing only the portion facing the workpiece A to be moved, the outer peripheral end portion A1, and locally deforming, It is preferable that a peeling gap s is formed locally between the outer peripheral end portions A1 of the workpiece A. Next, the workpiece transfer method using the electrostatic chuck device D is described. First, as shown in Fig. 1(a), the adhesion mechanism 3 or the suction suction mechanism 5 is actuated to bring the thin plate-like or film-shaped electrostatic chuck 2 closer to the base surface of the holding plate which is formed of a rigid body. The electrostatic chuck portion 2a is smoothed along the base surface la and bonded, and the workpiece a is electrostatically adsorbed to the electrostatic chuck 2. Next, as shown in Fig. 1(b), the isolation mechanism 4 is used. Actuated, in the state where the workpiece A is electrostatically adsorbed, the electrostatic chuck 2 is pulled away from the base _ surface 1a of the holding plate ,, and the workpiece A is directed toward the other workpiece (the lower substrate bait moves in parallel, since the workpiece A does not It becomes a free state, so it is transmitted without being affected by gravity or the like, and is temporarily fixed to the other side by the ring-shaped adhesive C. B. And after the movement is finished, the power of the electrostatic chuck 2 is cut off and stopped. The electrostatic adsorption function is caused by the above-mentioned adhesive mechanism 3 or the suction adsorption mechanism 5 being slightly delayed, and if the thin-plate or film-shaped electrostatic chuck 2 is forcibly pulled from the temporarily fixed workpiece A, the remaining of the electrostatic chuck 2 at this time The adsorption force is weak, so A gap S1 for peeling is formed between the workpiece A and the electrostatic adsorption portion 2a of the electrostatic chuck 2, and the electrostatic chuck portion 2a of the electrostatic chuck 2 is easily peeled off from the gap 81. At the same time, the sheet is simultaneously peeled off from the portion 81 of the 117682.doc 18 200815268. The electrostatic chuck 2 in the form of a film or a film, the magnets 3&, 3b, which are arranged by alternately arranging the electrodes of the opposite magnetic poles, are not slightly offset from the base surface U of the holding plate, but are automatically adhered to the original position and restored. In the initial state.

由此,即使係為剛性極端低之工件A,也可以與靜電吸 盤2之剩餘吸附力或靜電吸附力之解除之不穩定無關地傳 送到固定位置而確實地進行剝離。 而且’由於靜電吸盤2之靜電吸附部〜沿著由剛體而成 之保持板1之基座面1&弄為平滑,因Λ,這些靜電吸附部 2a和工件Α之表面無間隙地接觸被靜電吸附,從而可以確 實地保持工件A。 而且,從與工件A之外周端部幻面對之部位開始使靜; 吸盤2局部變形,若在與該MA之外周端部Μ間局; 形成剝離用間隙81,在這些靜電吸盤2之靜電吸附部如 工件A之表面之間’該剝離用之間隙以一下子擴大,而《Therefore, even if the workpiece A having extremely low rigidity is used, it can be transported to the fixed position regardless of the instability of the residual suction force or the electrostatic adsorption force of the electrostatic chuck 2, and the peeling can be surely performed. Further, since the electrostatic adsorption portion of the electrostatic chuck 2 is smoothed along the base surface 1& of the holding plate 1 made of a rigid body, the electrostatic adsorption portion 2a and the surface of the workpiece are in contact with each other without any gap. Adsorption, so that the workpiece A can be surely held. Further, static is started from a portion which is singularly facing the outer end portion of the workpiece A; the suction cup 2 is partially deformed, and if it is at the peripheral end portion of the outer surface of the MA, a peeling gap 81 is formed, and static electricity is applied to the electrostatic chuck 2 The adsorption portion, such as the surface of the workpiece A, 'the gap for the peeling is enlarged at a time, and

餘吸附力被強制衰減而消失,因此,可以提高卫件A 離性。 實施例2 該實施例2,如圖4(a)(b)所千,脸l、+、y 八)厅不將上述靜電吸盤2形成 比上述保持板i之基座Sla或卫件AA,纟 端部μ拆裝自如地固定在 夺,、- 仕邊保持板1,或者,將外端部: H7682.doc -19- 200815268 之一部分或全周折疊由固定子2e拆裝自如地固定在保持板 1 ’同時,通過與電流供給部2f連接向電極部2c提供電 流,在該外端部2d和靜電吸附部2a之間劃分形成可彈性變 形之可繞部2g,向上下方向往復動自如地配置該靜電吸附 b 部2a之構成,與上述圖1〜圖3所示之實施例1不同,其外 之構成與圖1〜圖3所示之實施例1相同。 圖示例的情況,經其全周以額緣狀固定靜電吸盤2之外 φ 端部2d或者經外端部2d之全周以每適當間隔點狀固定。 作爲其他之例,還可以將靜電吸盤2之平行配置之一組 外端部2d平行固定,或將平行之一組外端部2d以每適當間 隔點狀固定。 由此,在圖4所示之實施例2,可以將靜電吸盤2無導引 機構(未圖示),向上下方向往復動自如地支撐,同時,由 隔離機構4之作動從上述保持板丨之基座面&拉開靜電吸盤 2時,不會向χγθ方向偏移而恢復到原位置。 • 從而,如圖2及圖3所示,作爲黏著機構3,無需將固定 配置在上述保持板1之台座之磁鐵3&和,固定配置在靜電 吸盤2之相對面之磁鐵讣,與各自之附近相反之磁極之電 極父互排列配置,同時,代替靜電吸盤2之磁鐵扑,即使 、 @定配置例如賤射等形成為膜狀之金屬等之磁性體,也可 以向ΧΥΘ方向不能偏移地進行往復動,比上述圖i〜圖_ 示之實施例,更可以簡化上述黏著機構3之結構並有利於 謀求成本之降低。 實施例3 117682.doc -20- 200815268 如圖5(a)〜(c) ’該實施例3表示,作爲使用上述之靜電 吸盤裝置D之基板貼合機之例,儘管在上下保持板丨、丨,之 上下基座面la、la,分別配置薄板狀或薄膜狀之靜電吸盤 2,但是,只對於上基座面la向上下方向往復動自如地支 . 撐,在這些靜電吸盤2分別靜電吸附上下基板A、B,同 、 時,在進打上述之基板A、B對位後,以上述隔離機構4之 作動,在上基板A被靜電吸附之狀態下,從上基座面丄a • 拉開上方之靜電吸盤2,1使其向下基板B移動,通過環狀 黏接劑C與下基板B貼合後,由上述黏著機構3之作動,從 被貼合之上基板A強制剝離靜電吸盤2而返回到上基座面1 a的情況。 而且,在下保持板Γ之下基座面la,和靜電吸盤2之間, 配置例如黏接材料或機械觸控式連接機構或黏接劑,只要 拆裝自如地安裝這些兩者’如上述之保持板1由黏著機構3 或隔離機構4之作動,下保持板1,之靜電吸盤2則不會向上 下方向往復動。 @ 如圖6⑷、(b)所示,根據需要’在該下保持板!,之下基 = la’及下方之靜電吸盤2,分別向z(上下)方向-條直線 貝^開穿多個通孔6,在這些通孔6之内部, 7電吸盤:之表面分離已貼合完之上下基板A、B之分離機構 开::上下)方向移動自如地配設其尖端部為以絕緣材料 >成之升降銷’或通過作動控制使得例如之The residual adsorption force is forcibly attenuated and disappears, so that the detachment of the guard A can be improved. Embodiment 2 In this embodiment 2, as shown in FIG. 4(a)(b), the face l, +, y 8) does not form the electrostatic chuck 2 as the base Sla or the guard AA of the holding plate i, The end portion of the end portion is detachably attached to the holder, and the front side holding plate 1 or the outer end portion: H7682.doc -19-200815268 is folded or partially folded by the holder 2e. While holding the plate 1', a current is supplied to the electrode portion 2c by connection with the current supply portion 2f, and an elastically deformable wrapable portion 2g is formed between the outer end portion 2d and the electrostatic adsorption portion 2a, and is reciprocally movable upward and downward. The configuration of the electrostatic adsorption b portion 2a is different from that of the first embodiment shown in Figs. 1 to 3, and the configuration is the same as that of the first embodiment shown in Figs. In the case of the example shown in the figure, the end portion 2d of the φ is fixed to the outer periphery of the electrostatic chuck 2 or the entire circumference of the outer end portion 2d is fixed at a predetermined interval. As another example, one of the outer end portions 2d of the parallel arrangement of the electrostatic chucks 2 may be fixed in parallel, or one of the parallel outer end portions 2d may be fixed at an appropriate interval. Thus, in the second embodiment shown in Fig. 4, the electrostatic chuck 2 can be supported by the guide mechanism without the guide mechanism (not shown), which is reciprocally supported in the up-and-down direction, and is actuated by the isolation mechanism 4 from the holding plate. When the electrostatic chuck 2 is pulled apart, the base surface & does not shift to the home position by shifting in the direction of χγθ. • As shown in FIG. 2 and FIG. 3, as the adhesive mechanism 3, it is not necessary to fix the magnets 3& which are fixedly disposed on the pedestal of the holding plate 1, and the magnets 固定 disposed on the opposite faces of the electrostatic chuck 2, and The electrode electrodes of the opposite magnetic poles are arranged alternately with each other, and in place of the magnets of the electrostatic chuck 2, even if a magnetic body such as a metal such as a film is formed in a film shape, it is possible to shift in the direction of the x-direction. By performing the reciprocating motion, the structure of the above-described adhesive mechanism 3 can be simplified and the cost can be reduced as compared with the embodiment shown in Figs. Embodiment 3 117682.doc -20- 200815268 As shown in Fig. 5 (a) to (c), this embodiment 3 shows an example of a substrate laminator using the electrostatic chuck device D described above, although the plate is held up and down,丨, the upper surface of the base surface la, la, respectively, is arranged in a thin plate or film-like electrostatic chuck 2, but only the upper base surface la reciprocatingly supported upwardly and downwardly, and electrostatic adsorption is performed on the electrostatic chucks 2, respectively. When the upper and lower substrates A and B are aligned, after the substrates A and B are placed in alignment, the isolation mechanism 4 is actuated, and the upper substrate A is electrostatically adsorbed from the upper substrate surface. The upper electrostatic chuck 2, 1 is pulled apart to move it to the lower substrate B, and after being bonded to the lower substrate B by the annular adhesive C, the adhesive mechanism 3 is actuated to forcibly peel off from the bonded substrate A. The electrostatic chuck 2 is returned to the upper base surface 1a. Moreover, between the base surface la below the lower holding plate and the electrostatic chuck 2, for example, a bonding material or a mechanical touch connection mechanism or an adhesive is disposed, as long as the two are detachably mounted as described above. The holding plate 1 is actuated by the adhesive mechanism 3 or the isolating mechanism 4, and the lower holding plate 1 does not reciprocate in the upward and downward directions. @ As shown in Fig. 6 (4) and (b), as needed, 'hold the plate!, the lower base = la' and the lower electrostatic chuck 2, respectively, to the z (up and down) direction - a straight line Through holes 6, inside the through holes 6, 7 electric chucks: the surface separation has been adhered to the upper and lower substrates A, B of the separation mechanism is opened: up and down) directionally freely disposed at the tip end of the insulating material > into a lift pin' or by actuation control such as

他流體向上方喷射,將已貼合完之上下基:: 之靜電吸盤2之表面向上推’從而在與下基板B 117682.doc 200815268 之内面B1之間形成例如2〜3程度之微小之除電用間隙82為 理想。 由該分離機構7在下方之靜電吸盤2之表面和下基板]8之 内面B1之間形成間隙S2之大氣中或規定低真空中,向埋設 6 在該下方之靜電吸盤2之内部之2個以上之電極部仏之間, 攸南電壓電源(未圖示)施加高電壓,從在靜電吸附下基板 B時施加之狀態反復反轉電壓之極性,通過改變這些2個以The fluid is ejected upward, and the surface of the electrostatic chuck 2 that has been attached to the upper substrate is pushed up to form a slight de-energization of, for example, about 2 to 3 between the inner surface B1 of the lower substrate B 117682.doc 200815268. The gap 82 is ideal. The separation mechanism 7 is embedded in the atmosphere of the lower surface of the electrostatic chuck 2 in the atmosphere in which the gap S2 is formed between the surface of the electrostatic chuck 2 below and the inner surface B1 of the lower substrate]8 or in a predetermined low vacuum. Between the above electrode portions, a high voltage is applied to the southeast voltage source (not shown), and the polarity of the voltage is repeatedly reversed from the state applied when the substrate B is electrostatically adsorbed, and the two are changed by

φ 上之電極部2e之電壓,感應如中和殘留在上下基板A、B 之電荷之電場。 而且,在圖示例中,作爲上述靜電吸盤裝置D,使用了 上述圖1〜圖3所示之實施例i,但,雖未作爲其他例圖 示’還可以使用圖4所示之實施例2。 接著,説明使用該靜電吸盤裝置D之基板貼合機之作 動。 首先,在圖5(a)之實線所示之大氣壓狀態下,由上述黏 • 著機構3或吸引吸附機構5之作動,使薄板狀或薄膜狀之靜 電吸盤2拉近上基座面la,並沿著該上基座面^平滑地黏 接,將在該狀態下由搬送用機械手傳送之上下基板A、 B,分別通過黏貼在上保持面la之上方之靜電吸盤2和安裝 , 在下基座面1a,上之下方之靜電吸盤2靜電吸附保持。 然後,如圖5(a)之雙點劃線所示,通過上述升降機構之 作動使上下保持板1、1 ’接近移動形成真空室s,該真空室 S内達到規定之真空度後,在其狀態下將上下保持板丨、^ 向ΧΥΘ方向相對調整移動,而進行上下基板A、B之對位动 117682.doc -22- 200815268 作。 結束該對位動作後,如圖5(b)所示,通過上述隔離機構 4之作動’在上基板A被靜電吸附之狀態下,將上方之靜電 吸盤2從上基座面ia剝離,並使該上基板人朝向下基板6移 動。 β 由此’上下基板A、Β夾著環形黏接劑C瞬間被壓接,兩 者間封止後被重合。The voltage of the electrode portion 2e on φ induces an electric field that neutralizes the electric charges remaining on the upper and lower substrates A and B. Further, in the illustrated example, the above-described embodiment i shown in FIGS. 1 to 3 is used as the electrostatic chuck device D. However, although not shown as another example, the embodiment shown in FIG. 4 may be used. 2. Next, the operation of the substrate bonding machine using the electrostatic chuck device D will be described. First, in the atmospheric pressure state shown by the solid line in Fig. 5(a), the thin plate-like or film-shaped electrostatic chuck 2 is pulled closer to the upper surface by the action of the above-described adhesive mechanism 3 or the suction suction mechanism 5. And smoothly adhering along the upper base surface, and in this state, the upper and lower substrates A and B are transported by the transport robot, and are respectively attached to the electrostatic chuck 2 and attached to the upper holding surface la. On the lower base surface 1a, the electrostatic chuck 2 below the upper surface is electrostatically adsorbed and held. Then, as shown by the chain double-dashed line in Fig. 5(a), the upper and lower holding plates 1, 1 ' are moved close to each other to form a vacuum chamber s by the action of the elevating mechanism, and after the vacuum chamber S reaches a predetermined degree of vacuum, In this state, the upper and lower holding plates 丨 and ^ are relatively adjusted and moved, and the alignment of the upper and lower substrates A and B is performed 117682.doc -22-200815268. After the alignment operation is completed, as shown in FIG. 5(b), the upper electrostatic chuck 2 is peeled off from the upper base surface ia by the operation of the isolation mechanism 4 in a state where the upper substrate A is electrostatically adsorbed. The upper substrate person is moved toward the lower substrate 6. Therefore, the upper and lower substrates A and Β are pressed against each other with the ring-shaped adhesive C interposed therebetween, and the two are superposed after being sealed.

_ 在该重合步驟中,不但可以完全防止在上下基板A、B 之間流入氣體或流體,而且,對於剛性極端低之上基板 A,其上所存在之薄板狀或薄膜狀之靜電吸盤2成爲緩衝材 料,所以,存在即使對環形黏接劑c之加壓發生稍微不均 勻,也很難影響到形成於上下基板A、B之間之環形黏接 劑C或逆電流器(未圖示)等之好處。 而且在、、Ό束忒上基板A之移動之後,上方之靜電吸盤2 之電源被切斷,而停止該靜電吸附功能。 • 之後,真空室S内恢復大氣壓,由在兩基板A、b之内外 產生之氣壓差均勻加壓,以在兩基板Α、β之内外所產生 <氣壓差壓碎至規定間隙爲止而結束貼合步驟。 接者,如圖5(c)所示,由上述黏著機構域吸引吸附機構 ’ 5之作動,從通過環形黏接劑C與下基板B貼合之上基板a 拉上方之靜電吸盤2到上基座面u,開始剝離這些兩者。 此時if過真空室8内之真空度通過數十h〜數千h程 度之帕邢放電區垴,L ^ 一上方之靜電吸盤2之剩餘吸附力極端 117682.doc -23· 200815268 然而,由於以環形黏接劑c之黏接力所保持之上基板A 和上方之靜電吸盤2,其整體接觸,所以可能會很難剝 離。 因此,如上述,不是從上基板A之表面同時剝離上方之 靜電吸盤2之面整體,而是使其從與被貼合之上基板a之外 周端部A1相對之部位局部變形,若在與上基板a之外周端 部A1之間局部形成剝離用間隙,在這些靜電吸盤2之靜電 吸附部2a和上基板A之表面該剝離用間隙一下子擴大,剩 餘吸附力被強制衣減消失,因此,上方之靜電吸盤2之靜 電吸附面整體從上基板A之表面順利地剝離。 由此,即使係為剛性極端低之上基板A,也可以與上方 之靜電吸盤2之剩餘吸附力或靜電吸附力之解除之不穩定 無關地貼合在定位置並確實地進行剝離。 況且’從上基板A之表面剝離之上方之靜電吸盤2黏貼在 上基座面la,然後,通過上述升降機構之作動使上下保持 板1、1’向相互隔離之方向移動恢復到初期狀態。 在這種狀態下完成貼合之上下基板A、b的周圍,變成 大氣中或者100 Pa以上之低真空中,該環境中,如圖 6(a)(b)所示,根據需要,作爲上述分離機構7,從下保持 板1之基座面1 a’以及開穿於下方之靜電吸盤2之多個通孔6 使升降銷上升’或向上方噴射如氮氣或空氣等之氣體或其 他机體,將已貼合完之上下基板A、b從下方之靜電吸盤2 之表面上推,在與下基板B之内面B1之間形成例如2〜3 mm程度之微小之除電用間隙S2。 117682.doc -24- 200815268 在該狀態下,只要改變埋設在下方之靜電吸盤2之内部 之2個以上之電極部2〇之電壓,通過使從在下方之靜電吸 盤2黏貼有玻璃製之下基板B之狀態剝離之瞬間所發生之剝 離帶電,感應如中和殘留在上下基板A、B的電荷之電場 (详細為交流電場)。 由此,在該感應之電場部空氣等之周圍氣體的一部分被 離子化電離,即中性分子分離成正與負之電荷,所以,中 和殘迢在下基板B之電荷而作用被除電。 並且,通過上述之搬送用機械手臂傳送上下基板a、 B,向黏貼在上基座面la之上方之靜電吸盤2和,安裝於下 基座面la’上之下方之靜電吸盤2傳送並配設時,有可能進 入玻璃碎片(碎片)之可能性。 此時,伴隨上下基板A、B之靜電吸附通過將該玻璃碎 片分別嚙入靜電吸盤2之間,這些靜電吸盤2之電介體“等 之表面局部破壞而發生故障。 即使在這種情況,也對於上下基座面u、&,分別拆裝自 如地配设薄板狀或薄膜狀之靜電吸盤2,所以,存在可以 簡單交換這些靜電吸盤2而維修性出色等優點。 另外表示了,本發明之靜電吸盤裝置D配設在,拆裝自 如地保持貼合作爲工件A、B使用於液晶顯示器(lcd)或等 離子顯示器(PDP)或柔性顯示器之面板之玻璃基板或塑膠 溥膜基板之基板貼合機之情況,但不限定於此,還可以配 設在該基板貼合機以外之基板組裝裝置,或搬送基板之基 板搬送裝置,或黏接保持LCD面板用玻璃基板以外之基板 117682.doc •25- 200815268 也可以。_ In the superimposing step, not only the gas or the fluid flowing between the upper and lower substrates A and B can be completely prevented, but also the thin-plate or film-shaped electrostatic chuck 2 which is present on the substrate A is extremely low in rigidity. Since the buffer material is slightly uneven even if the pressurization of the ring-shaped adhesive c is slightly uneven, it is difficult to affect the ring-shaped adhesive C or the reverse current device (not shown) formed between the upper and lower substrates A and B. The benefits of waiting. Further, after the movement of the substrate A is completed, the power supply of the upper electrostatic chuck 2 is cut off, and the electrostatic adsorption function is stopped. • After that, the atmospheric pressure is restored in the vacuum chamber S, and the pressure difference generated between the inside and the outside of the two substrates A and b is uniformly pressurized, and the pressure difference between the inside and the outside of the two substrates Α and β is crushed to a predetermined gap. Fit step. As shown in FIG. 5(c), the adsorption mechanism '5 is attracted by the adhesive mechanism field, and the electrostatic chuck 2 is pulled up from the upper substrate a through the annular adhesive C and the lower substrate B. The base surface u starts to peel off both of them. At this time, the degree of vacuum in the vacuum chamber 8 passes through the Paschen discharge region of the range of tens h to thousands of h, and the residual adsorption force of the electrostatic chuck 2 above the L ^ is extremely 117682.doc -23· 200815268 However, The substrate A and the upper electrostatic chuck 2 are held in contact with each other by the adhesive force of the ring-shaped adhesive c, so that it may be difficult to peel off. Therefore, as described above, the entire surface of the upper electrostatic chuck 2 is not simultaneously peeled off from the surface of the upper substrate A, but is partially deformed from a portion opposed to the outer peripheral end portion A1 of the substrate a to be bonded, if A peeling gap is partially formed between the outer peripheral end portions A1 of the upper substrate a, and the peeling gap is gradually enlarged on the surfaces of the electrostatic adsorption portion 2a and the upper substrate A of the electrostatic chuck 2, and the residual adsorption force is forcibly lost. The electrostatic adsorption surface of the electrostatic chuck 2 above is smoothly peeled off from the surface of the upper substrate A as a whole. Therefore, even if the substrate A is extremely low in rigidity, it can be bonded to the fixed position and reliably peeled off irrespective of the instability of the remaining suction force or the electrostatic adsorption force of the upper electrostatic chuck 2. Further, the electrostatic chuck 2 which is peeled off from the surface of the upper substrate A is adhered to the upper base surface 1a, and then the upper and lower holding plates 1 and 1' are moved in the direction in which they are separated from each other by the operation of the elevating mechanism to return to the initial state. In this state, the periphery of the upper and lower substrates A and b is bonded to the atmosphere, or to a low vacuum of 100 Pa or more. In this environment, as shown in Fig. 6 (a) and (b), The separating mechanism 7 raises the lift pin from the base surface 1 a' of the lower holding plate 1 and the plurality of through holes 6 of the electrostatic chuck 2 that is opened below, or ejects a gas such as nitrogen or air or the like upward. The upper and lower substrates A and b are pushed up from the surface of the lower surface of the electrostatic chuck 2, and a small gap S2 for removing electricity of, for example, about 2 to 3 mm is formed between the upper substrate B and the inner surface B1 of the lower substrate B. 117682.doc -24- 200815268 In this state, the voltage of two or more electrode portions 2〇 embedded in the electrostatic chuck 2 underneath is changed, and the electrostatic chuck 2 from below is adhered to the glass. The peeling electrification which occurs at the moment of peeling off the state of the substrate B induces an electric field (specifically, an alternating electric field) which neutralizes the electric charges remaining on the upper and lower substrates A and B. As a result, a part of the surrounding gas in the induced electric field portion air or the like is ionized and ionized, that is, the neutral molecules are separated into positive and negative charges, so that the charge on the lower substrate B is neutralized and the charge is removed. Then, the upper and lower substrates a and B are transported by the transfer robot, and the electrostatic chuck 2 adhered to the upper surface of the upper base surface la and the electrostatic chuck 2 attached to the lower surface of the lower base surface la' are transported and matched. When it is set, there is a possibility of entering the glass fragments (fragments). At this time, the electrostatic adsorption accompanying the upper and lower substrates A and B causes the glass fragments to be caught between the electrostatic chucks 2, and the surface of the dielectric body of the electrostatic chuck 2 is partially broken and malfunctions. Even in this case, In addition, the electrostatic chuck 2 having a thin plate shape or a film shape is detachably attached to the upper and lower pedestal surfaces u and amps. Therefore, there is an advantage that the electrostatic chuck 2 can be easily exchanged for excellent maintainability. The electrostatic chuck device D of the invention is disposed on a substrate of a glass substrate or a plastic film substrate which is used for disassembly and assembly of the workpieces A and B for use in a liquid crystal display (LCD) or a plasma display (PDP) or a flexible display panel. In the case of a bonding machine, the present invention is not limited thereto, and may be disposed in a substrate assembly device other than the substrate bonding machine, or a substrate transfer device that transports the substrate, or a substrate 117682 other than the glass substrate for holding and holding the LCD panel. Doc •25- 200815268 Also.

更且,説明了在真空中貼合兩片基板A、B之基板貼合 機,但是不限定於此,還可以為在大氣中貼合基板A、B 之基板貼合機,在此情況,也可以獲得與上述之真空貼合 λ 機同樣作用效果。 、 而且,圖示例中,將靜電吸盤2向上下方向只相對於上 保持板1之上基座面1 a往復動自如地支撐,但是不限定於 • 此,將靜電吸盤2相對於下保持板1,之下基座面1&向2方向 移動自如地支撐,更且,使在下保持板〗,具備黏著機構3和 隔離機構4,用該站著機構3使靜電吸盤2黏貼在下保持板^ 之下基座面la,,以該被黏貼之靜電吸盤2,靜電吸附下基 板B,並用上述隔離機構4,使這些靜電吸盤2和下基板b 為一體向開放位置從下保持板丨,隔離且平行移動,同時, 2止該靜電吸盤2之靜電吸盤功能後,只將靜電吸盤2用黏 著機構3從該開放位置向下保持板i,反方向移動,通過從被 _ 移動到開放位置之下基板B之表面剝離靜電吸盤2,進行基 板A、B之貼合動作也可以。 【圖式簡單說明】 圖1係表示本發明之工件傳送方法及靜電吸盤裝置之實 - 施例1之縱斷正視圖,(a)(b)表示作動步驟順序。 圖2係沿圖1(a)之(2)_(2)線之縮小底面圖。 圖3係沿圖Ka)之(3)-(3)線之縮放大平面圖。 >圖4係表不本發明之工件傳送方法及靜電吸盤裝置之實 施例2之縱斷正視圖’⑷(b)表示作動步驟順序。 117682.doc * 26 - 200815268 圖5係表示使用本發明之工件傳送方法及靜電吸盤裝置 之貼合機之實施例3之縮小縱斷正視圖,在(a)〜(c)以步驟 順序表示基板之貼合方法。 圖6係表示除電時之縮小縱斷正視圖,(a)(b)表示作動步 驟順序。 【主要元件符號說明】Further, although the substrate bonding machine in which the two substrates A and B are bonded in a vacuum is described, the present invention is not limited thereto, and a substrate bonding machine in which the substrates A and B are bonded to the atmosphere may be used. It is also possible to obtain the same effects as the above-described vacuum bonding λ machine. Moreover, in the illustrated example, the electrostatic chuck 2 is supported reciprocally only with respect to the upper surface 1a of the upper holding plate 1 in the up-down direction, but is not limited thereto, and the electrostatic chuck 2 is held relative to the lower side. The plate 1, the lower base surface 1& is movably supported in the 2 direction, and further, the lower holding plate is provided with the adhesive mechanism 3 and the isolation mechanism 4, and the standing mechanism 3 is used to adhere the electrostatic chuck 2 to the lower holding plate. ^ Under the base surface la, with the electrostatic chuck 2 adhered, electrostatically adsorbing the lower substrate B, and using the above-mentioned isolation mechanism 4, the electrostatic chuck 2 and the lower substrate b are integrally held from the lower holding plate to the open position. After being separated and moved in parallel, at the same time, after the electrostatic chuck function of the electrostatic chuck 2 is stopped, only the electrostatic chuck 2 is held downward from the open position by the adhesive mechanism 3, and moved in the opposite direction, by moving from the _ to the open position. The surface of the lower substrate B is peeled off from the electrostatic chuck 2, and the bonding operation of the substrates A and B may be performed. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a front elevational view showing a workpiece transfer method and an electrostatic chuck device according to the present invention, and (a) and (b) are diagrams showing an operation sequence. Fig. 2 is a reduced bottom view taken along line (2)-(2) of Fig. 1(a). Figure 3 is a enlarged plan view of the line (3)-(3) along the line Ka). > Fig. 4 is a longitudinal sectional view showing the workpiece transfer method of the present invention and the electrostatic chuck device of the second embodiment. (4) (b) shows the sequence of the operation steps. 117682.doc * 26 - 200815268 Fig. 5 is a front view showing the reduced longitudinal direction of the third embodiment of the bonding machine using the workpiece transfer method and the electrostatic chuck device of the present invention, wherein the substrates are represented in steps (a) to (c). The method of fitting. Fig. 6 is a front view showing the reduction of the longitudinal direction when the power is removed, and (a) and (b) are the sequence of the operation steps. [Main component symbol description]

1 上保持板 la 基座面 Γ 下保持板 la. 基座面 2 靜電吸盤 2a 靜電吸附部 2b 電介體 2c 電極部 2d 外端部 2e 固定子 2f 電流供給部 2g 可撓部 3 黏著機構 3a 磁鐵 3b 磁性體(磁鐵) 4 隔離機構 4a 通氣孔 4b 密閉空間 117682.doc -27- 2008152681 upper holding plate la base surface Γ lower holding plate la. base surface 2 electrostatic chuck 2a electrostatic adsorption portion 2b dielectric body 2c electrode portion 2d outer end portion 2e stator 2f current supply portion 2g flexible portion 3 adhesive mechanism 3a Magnet 3b Magnetic body (magnet) 4 Isolation mechanism 4a Ventilation hole 4b Confined space 117682.doc -27- 200815268

5 6 7 A A1 B C S 51 52 吸引吸附機構 通孔 分離機構 工件(上基板) 外周端部 工件(下基板) 環形黏接劑 靜電吸盤裝置 真空室 剝離用間隙 除電用間隙5 6 7 A A1 B C S 51 52 Suction suction mechanism Through hole Separation mechanism Workpiece (upper substrate) Peripheral end part Workpiece (lower substrate) Ring adhesive Electrostatic chuck device Vacuum chamber Stripping gap Clearance gap

117682.doc 28-117682.doc 28-

Claims (1)

200815268 十、申請專利範圍: 1 · 種工件傳送方法,用保持板之靜電吸盤吸附保持工 件’開放該保持之工件並裝載在規定之位置,其特徵 為, 在上述保持板上設置黏著機構和隔離機構,該黏著機 構使靜電吸盤拉到該保持板,並使其拆裝自如地沿該保 持j,該隔離機構,從該保持板剝離靜電吸盤,用上述 鮎著機構使靜電吸盤黏貼在保持板,並以該被黏貼之靜 電吸盤吸附保持I件,同時,藉由將這些靜電吸盤與工 件為一體用上述隔離機構從保持板隔離,停止該靜電吸 盤之靜電吸.附功能後’通過用上述黏著機構只將靜電吸 盤再次黏貼在保持板,從而,留下工件褒載在 置。 2·如請求们料之卫件傳送方法,將上㈣電吸盤形成 為薄板狀或膜狀,對由剛體而成之保持板之平滑之基座 面,向與其正父之方向移動自如地支撐。 3 如請求項1或2所述之工件傳送 ^ 时上述靜電吸盤之 靜電吸附部,從與工件之外胃 y 1门細斗相對之部位局部變 形’並在與該工件之外周 隙。 门^ ^之間局部形成剝離用間 4. 一種靜電吸盤裝置,由保持板和 盤而成’其㈣為, 讀料工件之靜電吸 對上述保持板之工件側表面向與其正交之 如地支撑靜電吸盤,使靜電吸=移動1 干侧表面之狀態 117682.doc 200815268 下,靜電吸附卫件之表面,卫件被靜電吸附之狀態下將 該靜電吸盤從該吸附位置移動到開放位置,同時,停止 該靜電吸盤之靜電吸附功能,只將靜電吸盤從該開放位 置向吸附位置反方向移動,從被移動到開放位置之工件 之表面剝離靜電吸盤。 5· 一種基板貼合方法,其特徵為,在一對保持板之任意一 方或雙方具備請求項4所述之靜電吸盤裝置,在這些保 持板之間作爲上述工件使兩片基板相對並拆裝自如地保 持’在一方之基板被靜電吸附之狀態下從該保持板之任 意一方剝離上述靜電吸盤裝置之靜電吸盤,使該一方之 基板向另一方之基板移動,通過環形黏接劑貼合兩基 板0200815268 X. Patent application scope: 1 · A workpiece transfer method, which uses an electrostatic chuck of a holding plate to adsorb and hold a workpiece to open the held workpiece and load it at a predetermined position, characterized in that an adhesive mechanism and isolation are provided on the above holding plate a mechanism for pulling the electrostatic chuck to the holding plate and disassembling it freely along the holding j, the separating mechanism peeling the electrostatic chuck from the holding plate, and the electrostatic chuck is adhered to the holding plate by the squeezing mechanism And holding and holding the I piece by the adhered electrostatic chuck, and at the same time, by separating the electrostatic chuck and the workpiece from the holding plate by the above-mentioned isolation mechanism, stopping the electrostatic suction of the electrostatic chuck, and then using the above The adhesive mechanism only adheres the electrostatic chuck to the retaining plate again, thereby leaving the workpiece loaded. 2. If the method of conveying the guards is requested, the upper (four) electric suction cups are formed into a thin plate shape or a film shape, and the smooth base surface of the holding plate made of the rigid body is freely supported in the direction of the parent. . (3) The electrostatic chucking portion of the electrostatic chuck is partially deformed from a portion opposite to the stomach y1 door hopper and is outside the workpiece as the workpiece is transferred as described in claim 1 or 2. Partially forming a peeling space between the doors ^ 4. An electrostatic chuck device is formed by holding the plate and the disk. (4) is that the electrostatic attraction of the reading workpiece is perpendicular to the workpiece side surface of the holding plate. Supporting the electrostatic chuck, so that the electrostatic suction = moving 1 dry side surface state 117682.doc 200815268, the surface of the electrostatic adsorption guard, the electrostatic chuck is electrostatically adsorbed from the adsorption position to the open position, while The electrostatic adsorption function of the electrostatic chuck is stopped, and only the electrostatic chuck is moved from the open position to the adsorption position in the opposite direction, and the electrostatic chuck is peeled off from the surface of the workpiece moved to the open position. A method of bonding a substrate, characterized in that the electrostatic chuck device according to claim 4 is provided on either or both of the pair of holding plates, and the two substrates are opposed to each other as the workpiece between the holding plates. The electrostatic chuck of the electrostatic chuck device is peeled off from one of the holding plates while the substrate of one of the substrates is electrostatically adsorbed, and the substrate of the one of the substrates is moved to the other substrate, and the two substrates are bonded together by a ring-shaped adhesive. Substrate 0 117682.doc117682.doc
TW096101276A 2006-09-29 2007-01-12 Workpiece transfer method, electrostatic chuck device and substrate bonding method TWI412480B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2006/319540 WO2008041293A1 (en) 2006-09-29 2006-09-29 Work transferring method, electrostatic chuck device, and board joining method

Publications (2)

Publication Number Publication Date
TW200815268A true TW200815268A (en) 2008-04-01
TWI412480B TWI412480B (en) 2013-10-21

Family

ID=39124594

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096101276A TWI412480B (en) 2006-09-29 2007-01-12 Workpiece transfer method, electrostatic chuck device and substrate bonding method

Country Status (3)

Country Link
CN (1) CN101316777B (en)
TW (1) TWI412480B (en)
WO (1) WO2008041293A1 (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI495536B (en) * 2008-10-20 2015-08-11 Creative Tech Corp Electrostatic suction cup inspection method and electrostatic sucker device
TWI509723B (en) * 2013-05-24 2015-11-21 Lg Display Co Ltd Carrier substrate separating system and method
TWI742080B (en) * 2016-06-21 2021-10-11 日商迪思科股份有限公司 Retaining mechanism and processing device of processed object

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5706180B2 (en) * 2011-02-15 2015-04-22 常陽工学株式会社 Sealing method and apparatus
CN103094167B (en) * 2011-10-28 2016-03-30 无锡华润安盛科技有限公司 Semiconductor device pick device
JP6226563B2 (en) * 2013-05-28 2017-11-08 リンテック株式会社 Electrostatic holding device and method for removing object to be held from electrostatic holding device
JP6254795B2 (en) * 2013-09-06 2017-12-27 リンテック株式会社 Sheet sticking device and sticking method
JP5523646B1 (en) * 2013-12-04 2014-06-18 信越エンジニアリング株式会社 Bonding device manufacturing equipment
CN106927258A (en) * 2017-01-26 2017-07-07 江苏东旭亿泰智能装备有限公司 A kind of conveyer and its transfer approach for glass substrate
CN118471881A (en) * 2017-08-10 2024-08-09 东京毅力科创株式会社 Substrate processing method and substrate processing apparatus
KR20190100980A (en) * 2017-12-27 2019-08-30 캐논 톡키 가부시키가이샤 Electrostatic chuck, film forming apparatus, substrate adsorption method, film forming method and manufacturing method of electronic device
KR102421610B1 (en) * 2018-07-31 2022-07-14 캐논 톡키 가부시키가이샤 Electrostatic chuk system, film formation apparatus, suction method, film formation method, and manufacturing method of electronic device
KR102430361B1 (en) * 2018-09-21 2022-08-05 캐논 톡키 가부시키가이샤 Adsorption apparatus, apparatus for forming film, adsorption method, method for forming film, and manufacturing method of electronic device
KR102550586B1 (en) * 2018-10-31 2023-06-30 캐논 톡키 가부시키가이샤 Adsorption and alignment method, adsorption system, film forming method, film forming apparatus, and manufacturing method of electronic device
JP7488738B2 (en) 2020-09-18 2024-05-22 日機装株式会社 Vacuum lamination device and method for manufacturing laminate
JP7628441B2 (en) 2021-03-08 2025-02-10 株式会社ディスコ Chuck Table Mechanism

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06235896A (en) * 1993-02-08 1994-08-23 Ropuko:Kk Contactless pressure sticking method
JP3596127B2 (en) * 1995-12-04 2004-12-02 ソニー株式会社 Electrostatic chuck, thin plate holding device, semiconductor manufacturing device, transport method, and semiconductor manufacturing method
AU2003275604A1 (en) * 2003-10-23 2005-05-11 Shin-Etsu Engineering Co., Ltd. Method for sealing substrates while stacking
CN2715187Y (en) * 2004-02-14 2005-08-03 鸿富锦精密工业(深圳)有限公司 Substrate adhering equipment
CN100403104C (en) * 2004-04-28 2008-07-16 鸿富锦精密工业(深圳)有限公司 Substrate application method
CN100376945C (en) * 2004-06-11 2008-03-26 鸿富锦精密工业(深圳)有限公司 Substrate plying-up apparatus and substrate plying-up process
JP2005353987A (en) * 2004-06-14 2005-12-22 Canon Inc Electrostatic chuck, and device manufacturing apparatus and method therefor

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI495536B (en) * 2008-10-20 2015-08-11 Creative Tech Corp Electrostatic suction cup inspection method and electrostatic sucker device
TWI509723B (en) * 2013-05-24 2015-11-21 Lg Display Co Ltd Carrier substrate separating system and method
TWI742080B (en) * 2016-06-21 2021-10-11 日商迪思科股份有限公司 Retaining mechanism and processing device of processed object

Also Published As

Publication number Publication date
JP4043506B2 (en) 2008-02-06
JPWO2008041293A1 (en) 2010-01-28
WO2008041293A1 (en) 2008-04-10
CN101316777B (en) 2012-01-18
TWI412480B (en) 2013-10-21
CN101316777A (en) 2008-12-03

Similar Documents

Publication Publication Date Title
TW200815268A (en) Work transferring method, electrostatic chuck device, and board joining method
US9162435B2 (en) Peel-off apparatus, peel-off system, peel-off method and computer storage medium
TW201423876A (en) Semiconductor wafer mounting method and semiconductor wafer mounting apparatus
TW200813524A (en) Substrate lamination apparatus
JP5654155B1 (en) Work bonding machine
WO2006046379A1 (en) Adhesive chuck device
JP2009054746A (en) Electrostatic chuck, and electrostatic chucking method
JPWO2005109489A1 (en) Work static elimination method and apparatus
CN107428151A (en) The manufacture device of abutted equipment
JP5996566B2 (en) Work chuck device, work laminating machine, and work laminating method
KR20090082296A (en) Work transferring method, electrostatic chuck device and method for bonding substrates
US20050022938A1 (en) Apparatus for bonding substrates and method for bonding substrates
CN114193901B (en) Vacuum lamination device and method for manufacturing laminate
US20200381283A1 (en) Simultaneous bonding approach for high quality wafer stacking applications
JP4043506B1 (en) Work transfer method, electrostatic chuck apparatus, and substrate bonding method
JP2007258636A (en) Dry-etching method and its device
KR102501606B1 (en) Substrate detaching apparatus, substrate processing apparatus, and substrate detaching method
JP2011148576A (en) Sheet carrying device and film insert mold manufacturing device
JP2005351961A (en) Vacuum lamination device
KR102498153B1 (en) Substrate holding member, substrate holding apparatus, substrate processing apparatus, substrate holding method, film forming method, and manufacturing method of electronic device
WO2008041294A1 (en) Chuck device for substrate bonding machine and method of neutralizing charges on substrate
JP4836042B2 (en) Peeling device
JP2012146844A (en) Thin-film formation system
KR20170017578A (en) Substrate bonding apparatus and method of bonding the substrate
JP2017007022A (en) Carrying device and carrying method

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees