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TW200811970A - Method for connecting welding wires - Google Patents

Method for connecting welding wires Download PDF

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Publication number
TW200811970A
TW200811970A TW095132128A TW95132128A TW200811970A TW 200811970 A TW200811970 A TW 200811970A TW 095132128 A TW095132128 A TW 095132128A TW 95132128 A TW95132128 A TW 95132128A TW 200811970 A TW200811970 A TW 200811970A
Authority
TW
Taiwan
Prior art keywords
wire
wafer
bump
electronic component
wire bonding
Prior art date
Application number
TW095132128A
Other languages
English (en)
Inventor
Ming-Chun Laio
Fu-Di Tang
Yu-Lan Wei
Original Assignee
Siliconware Precision Industries Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siliconware Precision Industries Co Ltd filed Critical Siliconware Precision Industries Co Ltd
Priority to TW095132128A priority Critical patent/TW200811970A/zh
Publication of TW200811970A publication Critical patent/TW200811970A/zh

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Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/42Wire connectors; Manufacturing methods related thereto
    • H01L24/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L24/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
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    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02Bonding areas; Manufacturing methods related thereto
    • H01L2224/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L2224/05Structure, shape, material or disposition of the bonding areas prior to the connecting process of an individual bonding area
    • H01L2224/0554External layer
    • H01L2224/0555Shape
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Description

200811970 九、發明說明: -【發明所屬之技術領域】 胃 本發明係有關一種銲線連接方法,更詳而言之,係有 關一種用以電性導接複數電子元件之銲線連接方法。 【先前技術】 一般半導體封裝件中,為提供半導體晶片與基板間形 成電性連接,主要係將形成於半導體晶片主動面上之輝塾 贏打線至基板上’藉以構成該半導體晶片與基板之電性搞合 響關係。 、再者,於半導體晶片之電路設計時,為增加電流量或 為提升半導體晶片之電性品質,常需在半導體晶片之主動 面上設置接地銲墊或電源銲墊,且在同一接地銲墊或 銲墊上以二條以上之銲線電性連接至基板之接地墊接地 環)或電源墊(電源環);而為滿足在半導體晶片之單一銲墊 上打設二條以上銲線之需求,業界遂發展出長銲墊之設 _計,該長銲墊之尺寸係較一般之銲墊尺寸大約一倍以上, 如此方可提供足夠之銲墊面積以在同一銲墊上打設多條銲 線。 請參閱第1A及1B圖,係顯示接置於基板u上之半 導體晶片ίο之主動面上設有一般銲墊1〇1與長銲墊1〇2, «亥鋅墊101係用以供該半導體晶片丨〇與基板1丨間訊號傳 遞,而該長銲墊102係用以供半導體晶片1〇與基板n形 成接地或電源之電性連接,因此該基板11上係設有接地墊 (或為接地環)12,以供半導體晶片1〇之長銲墊1〇2透過多 19260 5 200811970 條銲線13而電性連接至該接地墊(接地環)12,該些鲜線u ,係利用銲線機(黯ebGnder)反覆進行打線作#,以使該 ,長銲墊102電性導接至該接地環(接地環)12。 由圖中可看出長銲墊之功效係為了連接出多條銲 線’然而’由於長料U之面積係數倍於-般銲墊,因此 於晶片面積固定下,長銲墊將佔用晶片之可用面積,使得 晶片上的鲜塾數量減少。 /、有長麵墊之晶片其總面積必須加大以容納更 夕數里之知墊,然而這卻與晶片朝小尺寸化之趨勢相違。 復請參閱第2圖,如美國專利第5,777,345號所揭露 .ί顯不另一習知之半導體封裝件示意圖,其係為多晶 片堆豐之半導體封裝件,該半導體封裝件係包括基板& 植設於該基板21上之第一晶片20a、以及植設於該第一晶 =施上之第二晶片鳥,為供該第一及第二晶片20a,2.0b 電性連,至該基板21,該第一晶片施係設有長鲜塾2〇2, •:供5亥弟二晶片20b藉由銲線23a而電性連接至該第一晶 # 20a之長知墊2〇2,再由該第—晶片2如之長銲墊2〇2 错由銲線23b電性連接至基板21。 υΓ,以長#墊進行多層晶4之電性連接,亦具有如前 述的習知缺點。 因此’如何提供—種銲線連接方法,改善前述習知技 柯所存在之缺失,實為當今崎思考之課題。 【發明内容】 ’本發明之一目的在於 鑒於以上所述習知技術之缺點 19260 6 200811970 提供一種可於單一接點上連接出複數條銲線之銲線連接方 、法。 ' 本發明之又一目的為提供一種銲線連接方法,俾增加 晶片之可用面積與節省製程成本。 本發明之另一目的為提供一種銲線連接方法,俾符合 晶片小尺寸化之趨勢。 為達上揭目的,本發明揭示一種銲線連接方法,以供 電性連接複數電子元件,係包括:先於第一電子元件之電 性接點上形成導電凸塊;自第二電子元件之電性接點上打 線至該導電凸塊;接著自該導電凸塊上打線至該第二電子 兀件,以於該導電凸塊上連接複數條銲線,且構成該第一 及苐二電子元件之電性連接。 於實施本發明之製程時,係利用打線機(Wire b〇nder) 之鲜嘴將金線熔成一球狀而形成導電凸塊(金質凸塊(Au Stud))於第一電子元件之電性接點上,並於第二電子元件之 修電=接點上形成一球型接點(ballbond),再移動該銲嘴 至導電凸塊,接著截斷該銲線以於該導電凸塊上形成一第 一縫接銲點(stitch bond),接著利甩打線機於該導電凸 塊之第一縫接銲點上形成球型接點,再移動該銲嘴至該第 =電子元件,接著截斷該銲線以形成一第二縫接銲點f而 完成該第一及第二電子元件間之打線作業。 該第一電子元件可為半導體晶片,其電性接點係為設 於該半導體晶片主動面上之銲墊,該第二電子元件可為基 板,其電性接點係為設於該基板上之接地墊(環)或電源^ 19260 7 200811970 (絃)等。另該第二電子元件亦可為導 -點係為=導線架中之接地導腳或晶片座等。-電性接 法亦之銲線連接方法之要點’本發明之銲線連接方 應用於多數電子元件間之電性連接,尤為半導體Γ 片堆豐結構中相互之電性連接, 、日曰 中$ 由^ 係包括·於稷數電子元件 -中,显㈣導I之電性接點接置導電凸塊;自該電子元件 •=於該¥電凸塊所對應之電子元件之電性接點打線至 着"¥電凸塊;接著自該導電凸塊打線至另-電子元件上, ^政該^電凸塊上連接出複數條銲線而電性連接各該電子 兀件。 於一貫施態樣中,該些電子元件係為基板、接置於該 基板上之第一晶片以及接置於該第一晶片上之第二晶片。 於第-晶片銲墊形成導電凸塊,接著自該基板打線 至該弟-晶片之導電凸塊,以形成該第一晶片與基板之電 性連接’然後再自該第二晶片打線至該第一晶片之導電凸 塊:以構成第-及第二晶片之電性連接。亦或先於該第一 及第二晶片銲塾形成導電凸塊,接著利用反向輝線技術自 該基板打線至該第-晶片之導電凸塊,以及自該第一晶片 之導電凸塊打線至該第二晶片之導電凸塊,以構成該基 板、第一及第二晶片之電性連接。 於另-^施態樣中,該複數之電子^件係分別為基 板、以及堆疊於該基板上而成複數階梯狀之半導體晶片, 係先於該底層晶片銲墊上設置導電凸塊,以自該基板之電 性接點打線至该底層晶片之導電凸塊,以及由其餘各層晶 19260 8 200811970 片打線至該底層晶片之導電凸棟,以供接置於基板上 -層晶片藉本發明之銲線連接方法達成各層晶片、以 性連接。另外,亦可於該基板以外之各層晶 -又置¥电凸塊’以利用反向銲線製程之技術電性連接 ::反:=晶片之導電凸塊’再依序由下層晶片之導電凸 二”反向銲線技術打線至上層晶片之導電凸塊,以構成 基板與堆疊其上之晶片間的電性連接。 相較於習知技術中必須以4 而造成_ y ^ 加長之銲墊連接複數銲線 方;:用:片可用面積之現象,藉由本發明之銲線連接 輝if:業集中於單-導電凸塊上,以不加長晶片 使一晶片— 塾之習知技術為了於一具加長鲜塾之晶片上保持鲜 線連接^晶片以較Α之尺寸設計,而本發明之銲 、、又運接方法,因不須設置加長之鍟 =連接多條銲線’因此晶片可朝小尺寸化之 有的’本發明之鲜線連接方法所需之製程技術,以既 之電::ΓΓ達成:無論應用於晶片與導㈣ 效益 用於夕層晶片的電性連接皆具有良好之 具節tr’本發明之鲜線連接方法可改善習知缺點並 【實二功效’實具備高度產業利用價值。 19260 9 200811970 以下係藉由特定之具體實施例說明本發明之實施方 .式,熟習此技藝之人士可由本說明書所揭示之内容輕易地 -瞭解本發明之優點與功效。 第一實施例 請簽閱第3A圖至第3D圖,係本發明之銲線連接方法 第一實施例之示意圖。 -如第3A圖所示,係將第一電子元件接置於第二電子 ;元件上,該第一電子元件為半導體晶片30,該第二電子元 參件為基板3卜該第一及第二電子元件上係設有電性接點, 如形成於该半導體晶片30主動面上之銲墊3〇1,以及形成 於該基板31上之接地墊(或接地環)32(亦可為電源墊或 電源環),且於該半導體晶片3〇之至少一銲墊3〇1上形成 導電凸塊34,該導電凸塊34可為金質凸塊(Au Stud ), 其係利用鮮線機燒結金線而成型於焊塾上。 如第3B圖所示,利用反向銲線技術(reverseb〇nd) _自基板31之接地墊(環)32上銲接銲線33a至該導電凸 塊34,使該銲線33a以接近水平之角度銲結於該導電凸塊 34。該銲線33a係為金線,其係利用一打線機(Wire b〇nder) 之銲嘴35於該基板31之接地墊(環)32上利用銲嘴35先形 成一球型接點331a ( ball bond),再移動該銲嘴至該 導電凸塊34,接著截斷該銲線33a以形成一縫接銲點332a (stitch bond),而完成自該基板31上之接地墊(環)32 至汶半$體晶片30上之導電凸塊34之打線作業。復請配 &參閱第3C圖,係為對應第3B圖之上視圖,用以顯示接 19260 10 200811970 =於第曰二電子元件(基板)上之第—電子元件(半導體晶片) 利用鲜線而相互形成電性導接。 、如弟3D圖所不,再利用—般打線作業,&自先前形 成;該‘ ι凸塊34上之縫接銲點332a上銲接銲線现至 «亥基板31之接地塾(環)32。該打線作業係於導電凸塊μ 之縫接銲點332a上絲成—球型接點 35至該基板31之接地塾(環”2,接著截斷該鮮線2 以形成另一縫接銲點33孔,而完成該第一及第二電子元件 (晶片及基板)間之重覆打線作業,如第 示該第3D圖之上相m。H 丄# 馬”、、頁 ϋ之上視圖另,由於該半導體晶片30與該基 之弟-次銲線連接係由該基板31 #丁線至該導電凸 34,藉著銲線33a以接近水平角度銲結於該導電凸塊a 而不影響後續於該導電凸塊34之銲線…之縫接鮮點 a上形成鲜線33b之製程。 ^二貫施例 _ 請參閱第4圖, 之示意圖。 係本發明之銲線連接方法第二實施例 本毛月之第一貫施例與第一實施例大致相同,盆主要 差異係在於第二實施例中,該第二電子元件係為導線架 Λ $線木41具有—晶片座411以及複數設於該晶片座 41周圍之導腳412,以 χ日日片庄 丰¥體晶片40之第一電子元件 上#^日日片座Μ1上,且於該半導體晶片4G之銲塾401 又有導電凸塊44,以利用銲線43a及銲線视先後自 4腳架之電性接點,亦即該導腳412(例如為接地導腳) 19260 11 200811970 電性連接至該半導體晶片4G之導電凸塊44 -凸塊44電性連接至導腳412。 自該¥ % ,另該導㈣之t性接點除可料料,_ 座,以利用該晶片座提供半導體晶片接地作用。 _第三實施例 外請參閱第5A圖至第5C圖’係本發明之鋒線連接方^ 弟二實施狀示意圖m性連接複數電子元件。 如第5A圖所示,該些電子元件係具有晶片承载件, 例如基板5〗、接置於該基板51上之第—晶片咖、以及為 置於該第-晶片5Ga上之第二晶片_,於該基板51、第 —晶片50 a及第二晶片50b上係分別設有接地墊51〇、箱 ,50U及銲墊501b等電性接點,且於該第—晶片5^之 鮮墊501a上設置有導電凸塊54。 、如第5B圖所示,接著,利用反向銲線作業以自未設 有導電凸塊之電子元件,打線至該導電凸塊,亦即自該基 春板51之接地墊510銲接銲線53a至該第一晶片5〇&之導^ 凸塊54。該反向銲線作業係於基板51之接地墊51〇上利 用銲嘴55先形成有一球型接點531a(ballb〇nd),再移 動该銲嘴55至該導電凸塊54,接著截斷該銲線53a以形 成缝接!干點532a ( stitch bond),而完成自該基板51之 電丨生接點(接地塾510)至該第一晶片5〇a之導電凸塊54之 打線作業。另外,該基板51之電性接點除可為接地墊外亦 可為電源墊等。 如第5C圖所示,於該第二晶片5〇b之銲墊501b上以 12 19260 200811970 銲鳴55形成一球型接點53lb’再移動該銲嘴55至該導電 凸塊54上之縫接銲點532a’以形成銲線53b,接著截斷該 銲,53b而形成另一縫接銲點532b,以形成該第二晶片5仳 至第一晶片50a之電性連接。 另外,该第一、二晶片50a,5〇b間之銲線連接亦可以 反向銲線製程之技術來達成,如第5D圖所示,可先於該 第二晶片50b之銲墊5〇ib上形成有一導電凸塊54,,當完 ,該基板51與該第一晶片術間之銲線連接後,可於縫接 銲點532a上形成球型接點531b,並由該球型接點,以 反向銲線之技術銲接銲線53b,至該第二晶片5〇b之導電凸 塊54 ,而兀成该第一、二晶片5〇a,5〇b間之打線作業。 弟四貫施例 〆、 請參閱第6圖,係應用本發明之銲線連接方法第四實 施例所形成之半導體結構之示意圖。 、 本發明之第四實施例係與第三實施例大致相同,其主 籲要差異在於該半導體結構具一基板61以及接置於該美 61上之複數層半導體晶片,包括位於底層之第一晶/ 6〇a、設於該第一晶片60a上之第二晶片6叽、以^接續設 於該第二晶片60b上之第三晶片6〇c,而形成一階梯狀之 半導體結構。該多晶片堆疊之半導體結構中,至少該第一 晶片60a之銲墊上接置有導電凸塊64。 本實施例係自該基板61之電性接點以反向銲線之技 術銲接銲線63a至該第一晶片60a之導電凸塊64,接著於 該第二晶片60b上形成球型接點65a並由該球型接點65a 19260 13 200811970 銲接銲線63b至該第一晶片60a之導電凸塊64,同樣地, 於該第三晶片60c上形成一球型接點65b,並由該球型接 •點65b銲接銲線63c至該第一晶片6〇a之導電凸塊64,而 使該第片60a所具之導電凸塊64上連接有多條婷線。 應注意的是,本實施例亦可以參照前述第三實施例之 反向銲線製程之技術電性連接各層之晶片,在此一情況下 •除了該基板61外各層之晶片均具有導電凸塊。 目此,料晶片堆疊之半導體結構可藉此銲線連接方 法電性連接各元件,其中所有的半導體晶片皆藉一正常尺 寸之電性連接塾即可同時具有複數條銲線以連接至上層及
I層之半導體晶片。此外,該多晶片之堆疊數目不以:圖 式之3層晶片為限。 M 再者说述之多晶片堆疊之丰導士雄__ 、、 2架作為晶片承載件’並得利用銲線以供堆疊於該 •腳切數層+導體晶片電㈣接至該導線架之晶片座及導 二以加長之電性連接塾連接複數銲線 成^用曰曰片可用面積之現象 方法,將打線作業集中於單 /月之#線連接 連接塾之前提下使—電性賴 加晶片之可用面積。夕以線’進而增 另外’習知技術為了於— 保持電性連接塾之數旦_/、加“性連接塾之晶片上 而本發明之銲、=二只能將晶片以較大之尺寸設計^ 連接方法,因為不須具有加長之電性連接 19260 14 200811970 墊即可便利地於單一電性連接墊上連接多條銲線,因此晶 •片可朝小尺寸化之趨勢持續發展。 • 再者,本發明之銲線連接方法所需之製程技術以既有 的機台設備即可達成,無論應用於由晶片電性連接至具導 腳之導電裝置或應用於多層晶片的電性連接皆具有良好之 效益。 ‘ 惟以上所述之具體實施例,僅係用以例釋本發明之特 • 點及功效,而非用以限定本發明之可實施範疇,在未脫離 _本發明上揭之精神與技術範疇下,任何運用本發明所揭示 内容而完成之等效改變及修飾,均仍應為下述之申請專利 範圍所涵蓋。 【圖式簡單說明】 第1A及1B圖係顯示習知技術之銲線連接方法應用於 電性連接晶片與基板, 第2圖係顯示習知技術之銲線連接方法應用於電性連 _接具多層晶片之半導體封裝件; • 第3A至第3E圖係說明本發明之銲線連接方法之第一 具體實施例; 第4圖係說明本發明之銲線連接方法之第二具體實施 例; 第5A至第5D圖係說明本發明之銲線連接方法之第三 具體實施例;以及 第6圖係說明本發明之銲線連接方法之第四具體實施 例0 15 19260 200811970 【主要元件符號說明】 Ί0 半導體晶片 -101 一般銲墊 102 長銲墊 11 基板 12 接地環 13 鲜線 21 基板 20a 第一晶片 20b 弟二晶片 202 長銲墊 23a 銲線 23b 鲜線 30 半導體晶片 31 基板 1 301 鲜塾 32 接地墊(環) 33a 銲線 331a 球型接點 332a 縫接銲點 33b 銲線 331b 球型接點 332b 縫接銲點 34 導電凸塊 200811970 35 銲嘴 ,40 半導體晶片 -401 銲墊 41 導線架 411 晶片座 412 導腳 43a 鋅線 43 b 銲線 44 導電凸塊 50a 第一晶片 501a 銲墊 50b 第二晶片 501b 鲜塾 51 基板 510 鲜線藝 1 53a 焊線 531a 球型接點 531b 球型接點 532a 缝接銲點 532b 缝接銲點 53b,53b, 銲線 54,54, 導電凸塊 55 銲嘴 60a 第一晶片 200811970 60b 弟二晶片 ^ 60c 第三晶片 -61 基板 63a 銲線 63b 銲線 63c 銲線 - 64 導電凸塊 * 65a 球型接點 • 65b 球型接點

Claims (1)

  1. 200811970 十、申請專利範圍: 以供電性連接複數電子元件,係 1. 一種銲線連接方法 包括: 點上形成導電凸塊; 點上打線至該導電凸 於第一電子元件之電性接 塊; 自第二電子元件之電性接 以及 2·
    4· 6·
    該導
    自該導電凸塊上打線至該第二電子元件c 如申請專職圍第1項之料連接方法n 電凸塊係為金質凸塊。 〃 如申請專利範圍第!項之銲線連接方法, 線係為金線。 〃 如申請專利範圍第1項之銲線連接方法,纟中,係利 用反向銲線製程,以使 —帝— _ ” 弟—书子兀件之電性接點透 過鋅線而電性連接至該導電凸塊。 2第:項之銲線連接方法,其中,該反 線係於^二電子元件之電性接點上利用打 鋥嘧石#、耸 (allbond),再移動該 駕至该^r電凸塊,接著截齡 點(wGnd)。 _〜線以形成—縫接銲 如申请專利範圍第5項之错绩、查 唄之紅線連接方法,其中,係利 用打線製程,以自該導電凸持 二士 ♦电凸塊上之缝接銲點透過銲線 而電性連接至該第二電子元件。 如申請專利範圍第6項之銲線連接方法,其中, 線製程係於該導電凸塊之缝接銲點上先形成—球型接 19260 19 200811970 以形成另一縫接銲點 再移動#嘴至該第二電子元件,接著截斷該銲線 8· 9. 如申請專利範圍第1項之銲線連接方法,其中,該第 一電子元件係為半導體晶片,其電性接點為銲塾。 如申请專利範圍第】項之銲線連接方法’其中,該第 -電子70件為基板,其電性接點為設於該基板上之接 地墊、接地環、電源墊及電源環之其中一者。 _ 10.如申請專利範圍第!項之銲線連接方法,1中,該第 3:?:為導線架,該導線架具有-晶片座及複數 口又於該晶片座周圍之導腳, 腳及晶片座。Η I其電性接點可選擇為導 u.:種銲線連接方法,以供電性連接複數電子元件,係 以及 於至少-電子元件之電性接點上接置導電凸塊; 打線未設有導電凸塊之電子元件之電性接點上 打線至该導電凸塊。 其中,該導 12·如申請專利範圍第Π項之銲線連接方法, 電凸塊係為金質凸塊。 該銲 13.如申請專利範圍第11項之銲線連接方法,其中, 線係為金線。 八 14‘:申請專利範㈣u項之銲線連接方法, =鮮線製程,以使電子元件之電性接點2 而%性連接至導電凸塊。 、在 19260 20 200811970 15. 2請專㈣_ 14項之銲線連接方法,其中,該反 二::耘係於該電子元件之電性接點上利用打線機 =先形成—球型接點(ballbQnd),再移動該鮮嘴 該導電凸塊,接著截斷該銲線以形成一縫接銲點 C stitch bond )。 _ .16.2請專·㈣u項之銲線連接方法,其中,係於 成j導電凸塊之電子元件上利用打線機之鲜嘴先形 =型接點’再移動該銲嘴至該導電凸塊,接著截 崎該鋅線而形成一縫接銲點。 如申明專利範圍第項之 電子元件係為、 其中,該些 件上7載牛以及依序堆疊於該晶片承載 件上之禝數半導體晶片,以構 18·如申請專利範17 s 夕日日片堆豐結構。 月寻利乾圍弟17項之銲線連接方法,其中 片承载件為基板及導線架之其中。 曰曰 以如申請專利範圍第17項之銲線 方 於嗲曰f啄運接方法,其中,接置 饥如件之底層晶片係具有導電凸塊。 片承:件:乾圍弟:9項之鲜線連接方法,其中,該晶 之導當Λ 、以反向鮮線製程而輝接辉線至該底層晶片 之導電凸塊。 ①曰日曰 21·如申請專利範圍第19項 層晶片之其餘晶片_接"5接方法’其中,該底 玟-種ri… 線至該導電凸塊。 包括: 接方法,以供電性連接複數電子元件,係 於至少二電子元件之電性接點上接置導電凸塊 19260 21 200811970 自未設有導電凸塊之電子元件之電性接點上利用 反向銲線製程銲接銲線至其中一電子元件之導電凸塊 上;以及 A 自前述之導電凸塊上利用反向銲線製程銲接銲線 至另一電子元件之導電凸塊上。 23·如申請專利範圍第22項之銲線連接方法,其中,該 電凸塊係為金質凸塊。 人、 24. 第22項之銲線連接方法,其中,該銲 線係為金線。 25. 如申請專利範圍第22項之銲線連接方法,其中, 呈!於該電子元件之電性接點上利用打線機 成一球型接點(ballbond),再移動該録嘴 …電凸塊’接者截斷該銲線以形成_缝接輝點 (stitch bond )。 26. ^請專利範圍第25項之銲線連接方法,其中,係利 •銲==程’以自該導電凸塊之缝接銲點上透過 27 至另—具有導電凸塊之電子元件。 ^專利乾圍第26項之銲線連接方法,其t, :鲜線製程係於該導電凸塊之縫接_點上先形成一°球 1接點,再移動銲嘴至另一 ' 荖选齡兮π成 电子兀件之導電凸塊,接 者截跅忒知線而形成另一縫接銲點。 28.如申請專利範圍第22項之銲续诘# + 带;分杜在达 貝之知線連接方法,其中,該些 件上之複數半導體晶片, 隹:於“片承载 乃以構成一多晶片堆疊結構。 22 19260 200811970 29·如申請專利範圍第28項之銲線連接方、去 片承载件為基板及導線架之其中一者。去,其中, 30.如申請專利範圍第28項之銲線連接方法, 曰曰片堆豐結構中,除該晶片承載件外,:、 兵餘各層 上分別接置有導電凸塊。 該晶 該多 晶片
    ·· 19260 23
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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI511247B (zh) * 2011-07-18 2015-12-01 Advanced Semiconductor Eng 半導體封裝結構以及半導體封裝製程
TWI725909B (zh) * 2019-09-03 2021-04-21 聯發科技股份有限公司 半導體裝置
US20220278060A1 (en) * 2020-12-07 2022-09-01 Infineon Technologies Ag Molded semiconductor package with high voltage isolation

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI511247B (zh) * 2011-07-18 2015-12-01 Advanced Semiconductor Eng 半導體封裝結構以及半導體封裝製程
TWI725909B (zh) * 2019-09-03 2021-04-21 聯發科技股份有限公司 半導體裝置
US11587853B2 (en) 2019-09-03 2023-02-21 Mediatek Inc. Semiconductor devices having a serial power system
US11942399B2 (en) 2019-09-03 2024-03-26 Mediatek Inc. Semiconductor devices having a serial power system
US20220278060A1 (en) * 2020-12-07 2022-09-01 Infineon Technologies Ag Molded semiconductor package with high voltage isolation
US11817407B2 (en) * 2020-12-07 2023-11-14 Infineon Technologies Ag Molded semiconductor package with high voltage isolation

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