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TW200734665A - Electronic component testing apparatus and electronic component testing method - Google Patents

Electronic component testing apparatus and electronic component testing method

Info

Publication number
TW200734665A
TW200734665A TW095148780A TW95148780A TW200734665A TW 200734665 A TW200734665 A TW 200734665A TW 095148780 A TW095148780 A TW 095148780A TW 95148780 A TW95148780 A TW 95148780A TW 200734665 A TW200734665 A TW 200734665A
Authority
TW
Taiwan
Prior art keywords
electronic component
component testing
ics
testing apparatus
tst
Prior art date
Application number
TW095148780A
Other languages
English (en)
Other versions
TWI313358B (zh
Inventor
Akihiko Ito
Koya Karino
Yoshihito Kobayashi
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of TW200734665A publication Critical patent/TW200734665A/zh
Application granted granted Critical
Publication of TWI313358B publication Critical patent/TWI313358B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
TW095148780A 2006-01-17 2006-12-25 Electronic component testing apparatus and electronic component testing method TW200734665A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2006/300557 WO2007083356A1 (ja) 2006-01-17 2006-01-17 電子部品試験装置及び電子部品の試験方法

Publications (2)

Publication Number Publication Date
TW200734665A true TW200734665A (en) 2007-09-16
TWI313358B TWI313358B (zh) 2009-08-11

Family

ID=38287318

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095148780A TW200734665A (en) 2006-01-17 2006-12-25 Electronic component testing apparatus and electronic component testing method

Country Status (5)

Country Link
US (1) US20100147088A1 (zh)
JP (1) JP4928470B2 (zh)
CN (1) CN101384913A (zh)
TW (1) TW200734665A (zh)
WO (1) WO2007083356A1 (zh)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI616963B (zh) * 2013-02-25 2018-03-01 泰克元有限公司 用於測試處理機的振動裝置
TWI756683B (zh) * 2019-12-26 2022-03-01 日商賽納克股份有限公司 振動裝置、搬送系統及搬送方法
TWI807327B (zh) * 2020-05-25 2023-07-01 南韓商泰克元有限公司 測試處理器及其控制方法
US11875493B2 (en) 2019-12-26 2024-01-16 Synax Co., Ltd. Vibrator unit, conveying system, and conveying method

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013053991A (ja) * 2011-09-06 2013-03-21 Seiko Epson Corp ハンドラー及び部品検査装置
KR101890900B1 (ko) 2013-05-22 2018-10-01 (주)테크윙 테스트핸들러용 진동 장치
KR101880227B1 (ko) * 2013-02-25 2018-08-17 (주)테크윙 테스트핸들러용 트랜스퍼 모듈
JP6190264B2 (ja) * 2013-12-13 2017-08-30 東芝メモリ株式会社 半導体製造装置
JP7281250B2 (ja) * 2018-05-11 2023-05-25 株式会社アドバンテスト 試験用キャリア
KR102581147B1 (ko) * 2018-07-12 2023-09-25 (주)테크윙 전자부품 재배치장치
JP2022021241A (ja) * 2020-07-21 2022-02-02 株式会社アドバンテスト 電子部品ハンドリング装置及び電子部品試験装置

Family Cites Families (14)

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Publication number Priority date Publication date Assignee Title
JPH04114886A (ja) * 1990-08-24 1992-04-15 Murata Mfg Co Ltd 電気部品収容パレット
JP3412114B2 (ja) * 1995-07-26 2003-06-03 株式会社アドバンテスト Ｉｃ試験装置
JP3376784B2 (ja) * 1995-12-01 2003-02-10 株式会社アドバンテスト Ｉｃ試験装置
JP3567803B2 (ja) * 1999-07-08 2004-09-22 日立ハイテク電子エンジニアリング株式会社 Ｉｃデバイスの試験装置
JP2002053221A (ja) * 2000-05-30 2002-02-19 Daishin:Kk ワークの除電方法及び振動式パーツフィーダ
KR100380958B1 (ko) * 2000-10-11 2003-04-23 미래산업 주식회사 수직식 핸들러의 디바이스 슬리브 자동로딩장치
US6844717B2 (en) * 2001-10-12 2005-01-18 Techwing Co., Ltd. Test handler
JP2004273497A (ja) * 2003-03-05 2004-09-30 Luminas Corp 部品の所定面を一定の方向に配置させ供給する装置
JPWO2005100944A1 (ja) * 2004-03-31 2008-03-06 株式会社アドバンテスト イメージセンサ用試験装置
WO2005121739A1 (ja) * 2004-06-08 2005-12-22 Advantest Corporation イメージセンサ用試験装置
JP4537400B2 (ja) * 2004-07-23 2010-09-01 株式会社アドバンテスト 電子部品ハンドリング装置の編成方法
US7196508B2 (en) * 2005-03-22 2007-03-27 Mirae Corporation Handler for testing semiconductor devices
US7405582B2 (en) * 2006-06-01 2008-07-29 Advantest Corporation Measurement board for electronic device test apparatus
KR101042655B1 (ko) * 2006-07-27 2011-06-20 가부시키가이샤 아드반테스트 전자부품 이송방법 및 전자부품 핸들링 장치

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI616963B (zh) * 2013-02-25 2018-03-01 泰克元有限公司 用於測試處理機的振動裝置
TWI756683B (zh) * 2019-12-26 2022-03-01 日商賽納克股份有限公司 振動裝置、搬送系統及搬送方法
US11875493B2 (en) 2019-12-26 2024-01-16 Synax Co., Ltd. Vibrator unit, conveying system, and conveying method
TWI807327B (zh) * 2020-05-25 2023-07-01 南韓商泰克元有限公司 測試處理器及其控制方法
TWI857636B (zh) * 2020-05-25 2024-10-01 南韓商泰克元有限公司 測試處理器及其控制方法

Also Published As

Publication number Publication date
WO2007083356A1 (ja) 2007-07-26
JP4928470B2 (ja) 2012-05-09
US20100147088A1 (en) 2010-06-17
JPWO2007083356A1 (ja) 2009-06-11
CN101384913A (zh) 2009-03-11
TWI313358B (zh) 2009-08-11

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