SU412556A1 - STROBOSCOPIC DEVICE FOR MEASUREMENT OF VOLTAGE OF SINGLE NANOSECOND PULSES - Google Patents

Description

one

The known stroboscopic devices for measuring the voltage of single nanosecond pulses, which contain a delay line, a selection line, strobe converters, amplifiers, expander, sync pulse generator unit, controllable delay unit, and digital voltmeter, are characterized by insufficient accuracy of measurements.

The proposed device does not have this disadvantage and differs from the known ones in that it is equipped with a pulse-to-voltage converter connected between the device input and controllable delay blocks, and the outputs of the expander amplifiers through the OR circuit with a digital voltmeter.

The drawing shows a block diagram of the proposed stroboscopic device for measuring the voltage of a single nanosecond pulse.

The device consists of a delay line 7, a selection line 2 with n selection points 2i-2 "and a distance between adjacent points A / (and a parallel, serial and parallel-serial system can be used for the selection line), n conversion blocks 3i-3 ,,, the sync pulse shaping unit 4, the pulse duration conversion into proportional frequency unit 5, the "OR 6" circuit and the digital voltmeter 7.

Conversion blocks consist of strobe converters, PI-P controlled delay blocks and a UO-UP expander amplifiers, which operate in the following way.

The measured signal through the input terminal 11 and the delay line / with the delay time of ass-1 and d-Iwax - MAXIMAL

the duration of the measured signal enters the selection line 2 and the sync pulse shaping unit 4.

Formed in block 4 sync pulse

5 through controllable delay blocks 9i-9, starts the gate converters 8i-5 ,,.

From the input terminal // the signal also enters the block 5.

At the output of block 5, the control voltage and y appears after a time of 4adt, Ti and sets the dynamic mode of operation of the blocks. The first strobe converter runs at a constant time.

  ass-1 + ass ..1 + ass - h.

which is determined by the value of t beats, the delay time of the generated sync pulse in block 4 tsan-t 1 by the delay time of triggering the gate itself

after applying the sync pulse back-3- Accordingly, the position of the first sampling point 2 on the selection line 2 is chosen so as to compensate for the delay

ZL-G;) The ad-cS shift of each subsequent strobe pulse depends on the time distance between adjacent sampling points and on the duration of the measured pulse. / (i A /; t and). Compensation of the pulse transit time to the sampling point i is performed by selecting the static mode of the blocks of the controlled delay PI-5, and the necessary reading step is set dynamically under the influence of the control voltage coming from block 5.

Block 5 does not have stringent requirements for conversion accuracy, since its error leads to the displacement of all strobe pulses and has little effect on the final measurement result.

The measured signal, the passage along the sampling line, is sequentially gated at the sampling points. In this case, the output of each

A transient pulse signal appears in the conversion unit, carrying information about the instantaneous voltage of the measured pulse at the corresponding point. The received pulses come through the OR 6 circuit to a digital pulse voltmeter 7, which measures the amplitude of the maximum spread pulse.

Present Invention

A stroboscopic device for measuring the stress of single, nanosecond pulses, comprising a delay line, a sampling line, strobe converters, amplifiers, expanders, a sync pulse shaping unit, controllable delay units and a digital voltmeter, characterized in that, in order to increase the measurement accuracy, it

equipped with a pulse-to-voltage converter connected between the input of the device and controllable delay blocks, and the outputs of the amplifiers-expanders through the OR circuit are connected to a digital voltmeter.