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SE9404083D0 - Procedure, device and circuit board for testing electronic components - Google Patents

Procedure, device and circuit board for testing electronic components

Info

Publication number
SE9404083D0
SE9404083D0 SE9404083A SE9404083A SE9404083D0 SE 9404083 D0 SE9404083 D0 SE 9404083D0 SE 9404083 A SE9404083 A SE 9404083A SE 9404083 A SE9404083 A SE 9404083A SE 9404083 D0 SE9404083 D0 SE 9404083D0
Authority
SE
Sweden
Prior art keywords
circuit board
conductors
electronic components
testing electronic
procedure
Prior art date
Application number
SE9404083A
Other languages
Swedish (sv)
Other versions
SE9404083L (en
SE505869C2 (en
Inventor
Rune Lars Aake Gustafson
Original Assignee
Ericsson Telefon Ab L M
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ericsson Telefon Ab L M filed Critical Ericsson Telefon Ab L M
Priority to SE9404083A priority Critical patent/SE505869C2/en
Publication of SE9404083D0 publication Critical patent/SE9404083D0/en
Priority to CN95196412.7A priority patent/CN1079536C/en
Priority to JP8516786A priority patent/JPH10509518A/en
Priority to AU39977/95A priority patent/AU3997795A/en
Priority to KR1019970703483A priority patent/KR100368898B1/en
Priority to FI972083A priority patent/FI972083A7/en
Priority to EP95938697A priority patent/EP0793807A1/en
Priority to CA 2205391 priority patent/CA2205391A1/en
Priority to PCT/SE1995/001407 priority patent/WO1996016338A1/en
Publication of SE9404083L publication Critical patent/SE9404083L/en
Publication of SE505869C2 publication Critical patent/SE505869C2/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

A test assembly for use in testing electronic components, preferably surface mount IC-circuit components, includes a carrier (4) by means of which a component (2) is picked-up and brought to and held against the conductors (6) on a printed circuit board (5). The printed circuit board (5) includes at least one cavity (9) underneath the contact conductors (6) in the region where the component (2) is to be held, such as to render the conductors resilient. Pressure pads (7) are placed in the cavity (9) between the bottom of the cavity and the contact conductors (6) such as to regulate the resilience of the conductors (6).
SE9404083A 1994-11-24 1994-11-24 Method and apparatus for testing electronic components SE505869C2 (en)

Priority Applications (9)

Application Number Priority Date Filing Date Title
SE9404083A SE505869C2 (en) 1994-11-24 1994-11-24 Method and apparatus for testing electronic components
PCT/SE1995/001407 WO1996016338A1 (en) 1994-11-24 1995-11-24 Method and device for testing of electronic components
KR1019970703483A KR100368898B1 (en) 1994-11-24 1995-11-24 Method and apparatus for testing electronic devices
JP8516786A JPH10509518A (en) 1994-11-24 1995-11-24 Testing method and equipment for electronic components
AU39977/95A AU3997795A (en) 1994-11-24 1995-11-24 Method and device for testing of electronic components
CN95196412.7A CN1079536C (en) 1994-11-24 1995-11-24 Method and device for testing of electronic components
FI972083A FI972083A7 (en) 1994-11-24 1995-11-24 Method and apparatus for testing electronic components
EP95938697A EP0793807A1 (en) 1994-11-24 1995-11-24 Method and device for testing of electronic components
CA 2205391 CA2205391A1 (en) 1994-11-24 1995-11-24 Method and device for testing of electronic components

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE9404083A SE505869C2 (en) 1994-11-24 1994-11-24 Method and apparatus for testing electronic components

Publications (3)

Publication Number Publication Date
SE9404083D0 true SE9404083D0 (en) 1994-11-24
SE9404083L SE9404083L (en) 1996-05-25
SE505869C2 SE505869C2 (en) 1997-10-20

Family

ID=20396108

Family Applications (1)

Application Number Title Priority Date Filing Date
SE9404083A SE505869C2 (en) 1994-11-24 1994-11-24 Method and apparatus for testing electronic components

Country Status (8)

Country Link
EP (1) EP0793807A1 (en)
JP (1) JPH10509518A (en)
KR (1) KR100368898B1 (en)
CN (1) CN1079536C (en)
AU (1) AU3997795A (en)
FI (1) FI972083A7 (en)
SE (1) SE505869C2 (en)
WO (1) WO1996016338A1 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5609489A (en) * 1994-12-21 1997-03-11 Hewlett-Packard Company Socket for contacting an electronic circuit during testing
DE59712127D1 (en) * 1996-09-27 2005-01-27 Siemens Ag Contact device for testing electrical components in placement machines
CN101153888B (en) * 2006-09-29 2011-07-27 比亚迪股份有限公司 Testing method for luminous parallel path of flexible printing circuit board

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4866374A (en) * 1984-10-12 1989-09-12 Daymarc Corporation Contactor assembly for testing integrated circuits
DE3636361C1 (en) * 1986-10-25 1988-04-14 Heraeus Gmbh W C Adapter for testing the performance of electrical components intended for surface mounting
US4754555A (en) * 1987-05-18 1988-07-05 Adcotech Corporation Apparatus for inspecting the coplanarity of leaded surface mounted electronic components

Also Published As

Publication number Publication date
WO1996016338A1 (en) 1996-05-30
KR100368898B1 (en) 2003-04-21
FI972083L (en) 1997-05-15
AU3997795A (en) 1996-06-17
SE9404083L (en) 1996-05-25
FI972083A0 (en) 1997-05-15
FI972083A7 (en) 1997-05-15
SE505869C2 (en) 1997-10-20
EP0793807A1 (en) 1997-09-10
CN1079536C (en) 2002-02-20
JPH10509518A (en) 1998-09-14
CN1166876A (en) 1997-12-03

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Legal Events

Date Code Title Description
NUG Patent has lapsed