CN101153888B - Testing method for luminous parallel path of flexible printing circuit board - Google Patents
Testing method for luminous parallel path of flexible printing circuit board Download PDFInfo
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- CN101153888B CN101153888B CN200610062970XA CN200610062970A CN101153888B CN 101153888 B CN101153888 B CN 101153888B CN 200610062970X A CN200610062970X A CN 200610062970XA CN 200610062970 A CN200610062970 A CN 200610062970A CN 101153888 B CN101153888 B CN 101153888B
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- 238000012360 testing method Methods 0.000 title claims abstract description 94
- 238000007639 printing Methods 0.000 title claims description 13
- 238000010998 test method Methods 0.000 claims abstract description 13
- 238000000034 method Methods 0.000 claims abstract description 10
- 238000013100 final test Methods 0.000 claims abstract description 5
- 230000002950 deficient Effects 0.000 claims description 17
- 238000005259 measurement Methods 0.000 claims description 15
- 239000000523 sample Substances 0.000 claims description 4
- 239000011521 glass Substances 0.000 claims description 2
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- KHPCPRHQVVSZAH-HUOMCSJISA-N Rosin Natural products O(C/C=C/c1ccccc1)[C@H]1[C@H](O)[C@@H](O)[C@@H](O)[C@@H](CO)O1 KHPCPRHQVVSZAH-HUOMCSJISA-N 0.000 abstract description 9
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- 238000011990 functional testing Methods 0.000 abstract description 3
- 230000007547 defect Effects 0.000 abstract description 2
- 238000004020 luminiscence type Methods 0.000 abstract 6
- 230000000694 effects Effects 0.000 description 3
- 238000011056 performance test Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 239000011324 bead Substances 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000035515 penetration Effects 0.000 description 1
- 238000004804 winding Methods 0.000 description 1
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Abstract
The invention discloses a test method for luminescence parallel branch of flexible printed circuit board, wherein, an on-line tester is led in by a fixture used for electrometry locating so as to complete testing; test program is set in the on-line tester so that a low voltage DC source which ensures normal luminescence of light-emitting diodes (LEDs) is connected between two shared test points; therefore, a tester can observe the luminescence status of each LED during testing and selects unqualified product according to the color and the luminescence or non-luminescence of the LEDs; finally,the tester can futher screen out unqualified products through observing the final testing image on a tester display. The method which can detect the circuit defects of each branch of luminescence partincluding falling off, rosin joint and reverse connection of components realizes zero misdetect rate and is propitious to guarantee product quality; moreover, the method can combine the two steps of the prior test method including on-line test and functional test into a single step, thereby having the advantages of simple operation, short test time and high efficiency. The method can be used for testing circuit with similar connection of components.
Description
Technical field
The present invention relates to wiring board, especially relate to a kind of testing method for luminous parallel path of flexible printing circuit board.
Background technology
Flexible print circuit board (Flexible Printed Circuit board is called for short FPC) final finished is carried out electric performance test, is one of key link that guarantees product quality.The most complicated in the FPC electric performance test is that the components and parts that carry are tested, i.e. electric performance test after the surface mount (Surface MountingTechnology is called for short SMT).The components and parts that mobile phone keyboard type FPC carries generally include patch light-emitting diode (the Light Emitting Diode of multiple color, be called for short LED), Chip-R, the little electric capacity of paster, voltage dependent resistor (VDR), Hall switch and paster magnetic bead, wherein luminous component comprises a plurality of by LED with play the parallel branch that the Chip-R of dividing potential drop effect is composed in series respectively.Traditional method of testing is: with the two ends of described parallel branch as two shared test points, adopt on-line testing machine (In Circuit Tester, abbreviation ICT) frock clamp by electrical measurement location usefulness is provided with test probe according to the circuit data in corresponding test point, and by the weak DC current of lead-in wire input, measure two voltage differences between the shared test point then, standard figures according to measurement result and setting compares, if both differences are within the deviation range that allows, the element of just judging each branch road all is certified products, and it is normal all connecting; Otherwise judging has unacceptable product or connects unusually in the element of each branch road, and show final testing result by display interfaces.The defective of this method of testing is: the LED of each branch road and the tie point of resistance can not be as test points, can not the test section or the element of certain branch road certified products whether, whether the connection of part or certain branch road is normal, comprise come off, rosin joint and reversal connection, just test result can not accurately indicate the electrical property of each element on each branch road, can only indicate the electrical property of whole elements of each branch road roughly.
Summary of the invention
Technical matters to be solved by this invention is the defective that overcomes above-mentioned prior art, proposes a kind of testing method for luminous parallel path of flexible printing circuit board, and it is bad to detect on each branch road of luminous component circuit, comprises the coming off of components and parts, rosin joint and reversal connection.
Technical matters of the present invention is solved by following technical scheme:
This testing method for luminous parallel path of flexible printing circuit board, on the on-line testing machine, carry out, earlier product is placed in the electrical measurement fixture according to pilot hole or profile groove, lay the electrical measurement fixture patrix again, set online test machine is operated in provides normal luminous DC current for LED signal mode, frock clamp by electrical measurement location usefulness is provided with test probe in the corresponding test point of LED positive and negative electrode then, and is introduced into the on-line testing machine with going between and tests.
The characteristics of this testing method for luminous parallel path of flexible printing circuit board are:
Test procedure is set in the on-line testing machine realizes continuing the external normal luminous low-voltage dc voltage of light emitting diode that makes between two shared test points:
In test process, watch the luminous situation of each LED on the product, filter out defective products according to color and the light on and off of LED;
At last, watch the final test picture of test machine display to filter out other defective productss.
Technical matters of the present invention is solved by following further technical scheme:
The described test procedure that is provided with in the on-line testing machine comprises earlier selected two shared test points, the test form is set is test LED, over and over again in setting is enough to watch duration of the luminous situation of LED with external making between the normal luminous DC voltage of LED, the electric current input LED positive and negative electrode end points, make the luminous component circuit working, so that watch LED whether normally luminous.When coming off appears in any one components and parts in the branch road, when rosin joint and reversal connection, this branch road is no current all, corresponding LED just can not be luminous.
Described to be enough to watch the duration of the luminous situation of LED be 100ms～150ms, is preferably 150ms.So that watch the luminous situation of LED, the duration is too short, is difficult to see clearly the luminous situation of LED.
Described multiplicity is 8 times～12 times, is preferably 10 times.
The described normal luminous DC voltage of LED that makes is (3V ± 10%)+0.01V, and offset 0.01V is used to compensate the voltage drop of board winding displacement.Voltage is too high, LED might be burnt out, and voltage is too low, and LED can be not luminous, considers the dividing potential drop of resistance and circuit pack, and deviation setting is 10% up and down.
The online test machine of described setting is operated in the signal mode that normal luminous DC current is provided for LED, is the zero-signal pattern, and accurate 3ma DC current is provided, and the direct current that other signal mode of on-line testing machine provides fails to be convened for lack of a quorum the LED overcurrent is damaged.
Described product being placed in the electrical measurement fixture according to pilot hole or profile groove, is that product is pasted with one of the electronic component placement that faces up.So that observe the luminous situation of LED, improve the test effect.
The described electrical measurement fixture patrix of laying is to make of transparent organic glass.So that the LED light penetration improves the test effect.
The beneficial effect that the present invention is compared with the prior art is:
Although the tie point of the LED of each branch road and resistance still can not be as test point,,
It is bad to detect on each branch road of luminous component circuit, comprises the coming off of components and parts, rosin joint and reversal connection, has realized zero false failure rate, helps guaranteeing product quality; And when on-line testing, owing to simulated LED luminous component circuit working, finish functional test simultaneously, the on-line testing of carrying out earlier that is about to conventional test methodologies is carried out two steps of functional test again and is combined into a step and finishes, and has the advantage that operating process is simple, the time is short, efficient is high.The inventive method can be applied in carries out test job in the circuit with similar connection of components.
Description of drawings
Below in conjunction with embodiment and contrast accompanying drawing the present invention is further described.
Fig. 1 is mobile phone keyboard luminous component components and parts connection diagrams;
Fig. 2 is the test synoptic diagram of the specific embodiment of the invention.
Embodiment
A kind of testing method for luminous parallel path of flexible printing circuit board
Four luminous parallel paths of flexible print circuit board as shown in Figure 1, 2 are composed in series by blue LED LED1～4 and Chip-R R1～4 respectively.The model of blue LED LED1～4 is BL-HB536G-TRB, and the model of Chip-R R1～4 is MCR01MZPJ161, resistance 160 Ω ± 5%, power 1/16W.
Adopting model is the on-line testing machine of TR518FV, tests according to following steps:
(1) earlier product is placed in the electrical measurement fixture according to pilot hole or profile groove, lay the electrical measurement fixture patrix again, set online test machine is operated in provides normal luminous DC current 3ma for LED zero-signal pattern, frock clamp by electrical measurement location usefulness is provided with test probe in LED1～corresponding test point of 4 positive and negative electrodes then, and is introduced into the on-line testing machine with going between and tests;
(2) test procedure is set and realizes continuing the normal luminous low-voltage dc voltage of the external LED of making between two shared test points in the on-line testing machine, test procedure comprises earlier selected two shared test points; The test form is set is test LED; 10 times repeatedly in setting is enough to watch the duration 150ms of LED1～4 luminous situations between the positive and negative electrode end points with external DC voltage (3V ± 10%)+0.01V input LED1～4;
(3) in test process, watch the luminous situation of each LED on the product, filter out defective products according to color and the light on and off of LED;
(4) watch the final test picture of test machine display to filter out other defective productss.
Test result is as follows:
1) defective products type
Whole LED come off, whole resistance rosin joint, and resistance rosin joint on the branch road/all the other are normal, on the branch road one the LED reversal connection/all the other are normal, on the branch road one LED model mistake/all the other are normal, on the branch road circuit disconnect/all the other are normal, on the branch road resistance come off/all the other are normal, on the branch road LED come off/all the other are normal, test result all is " defective products ", and none mistake is surveyed.
2) non-defective unit test
The light emitting diode situation is normal, and test result is " non-defective unit ", errorless survey.
The day test volume of field statistics separate unit on-line testing machine can reach 1.2 ten thousand, and single product mean test time only is 2.5 seconds, and testing efficiency promotes about 3 times.
Four luminous parallel paths of flexible print circuit board as shown in Figure 1, 2 are composed in series by blue LED LED1～4 and Chip-R R1～4 respectively.Adopt the test result of conventional test methodologies as follows:
1) defective products type
Whole LED come off, whole resistance rosin joint, and test result all is " defective products ", errorless survey;
Resistance rosin joint on the branch road/all the other are normal, on the branch road one the LED reversal connection/all the other are normal, on the branch road one LED model mistake/all the other are normal, on the branch road circuit disconnect/all the other are normal, on the branch road resistance come off/all the other are normal, on the branch road LED come off/all the other are normal, test result all is " non-defective unit ", and all mistake is surveyed.
2) non-defective unit test
Test result is " non-defective unit ", errorless survey.
The contrast of two kinds of method of testings shows: method of testing of the present invention can be with the circuit pack on any branch road of luminous component bad and components and parts all find, none mistake is surveyed; And traditional method of testing can not be checked the bad components and parts on the out branch, has all major defects of mistake survey.
Above content be in conjunction with concrete preferred implementation to further describing that the present invention did, can not assert that concrete enforcement of the present invention is confined to these explanations.For the general technical staff of the technical field of the invention, without departing from the inventive concept of the premise, can also make some simple deduction or replace, all should be considered as belonging to the scope of patent protection that the present invention is determined by claims of being submitted to.
Claims (6)
1. testing method for luminous parallel path of flexible printing circuit board, on the on-line testing machine, carry out, earlier product is placed in the electrical measurement fixture according to pilot hole or profile groove, lay the electrical measurement fixture patrix again, set online test machine is operated in provides normal luminous DC current for LED signal mode, frock clamp by electrical measurement location usefulness is provided with test probe in the corresponding test point of LED positive and negative electrode then, and with lead-in wire test point is introduced online test machine and test, and it is characterized in that:
Test procedure is set in the on-line testing machine realizes continuing the external normal luminous low-voltage dc voltage of light emitting diode that makes between two shared test points:
In test process, watch the luminous situation of each LED on the product, filter out defective products according to color and the light on and off of LED;
At last, watch the final test picture of test machine display further to filter out defective products.
2. according to the described testing method for luminous parallel path of flexible printing circuit board of claim 1, it is characterized in that:
The described test procedure that is provided with in the on-line testing machine comprises earlier selected two shared test points, the test form is set is test LED, the make normal luminous DC voltage of LED, electric current that will be external in setting is enough to watch duration of the luminous situation of LED imported between the LED positive and negative electrode end points over and over again.
3. according to the described testing method for luminous parallel path of flexible printing circuit board of claim 2, it is characterized in that:
It is described that to be enough to watch the duration of the luminous situation of LED be 100ms～150ms.
4. according to the described testing method for luminous parallel path of flexible printing circuit board of claim 3, it is characterized in that:
Described repeated number of times is 8 times～12 times.
5. according to the described testing method for luminous parallel path of flexible printing circuit board of claim 4, it is characterized in that:
Described product being placed in the electrical measurement fixture according to pilot hole or profile groove, is that product is pasted with one of the electronic component placement that faces up.
6. according to the described testing method for luminous parallel path of flexible printing circuit board of claim 5, it is characterized in that:
The described electrical measurement fixture patrix of laying is to make of transparent organic glass.
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| Application Number | Priority Date | Filing Date | Title |
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| CN200610062970XA CN101153888B (en) | 2006-09-29 | 2006-09-29 | Testing method for luminous parallel path of flexible printing circuit board |
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| CN200610062970XA CN101153888B (en) | 2006-09-29 | 2006-09-29 | Testing method for luminous parallel path of flexible printing circuit board |
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| CN101153888B true CN101153888B (en) | 2011-07-27 |
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Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN101979915A (en) * | 2010-08-05 | 2011-02-23 | 上海闻泰电子科技有限公司 | Method for improving bright uniformity of LED lamps |
| CN104656002A (en) * | 2013-11-22 | 2015-05-27 | 深圳麦逊电子有限公司 | PCB testing result unit display system and method thereof |
| CN105467232B (en) * | 2014-09-10 | 2018-04-20 | 神讯电脑(昆山)有限公司 | The test circuit of converter |
| CN104442010B (en) * | 2014-12-01 | 2016-06-22 | 珠海艾派克微电子有限公司 | Repair chip, print cartridge, printer and repair chip connective stability detection method |
| CN108253324A (en) * | 2018-02-28 | 2018-07-06 | 上扬无线射频科技扬州有限公司 | A kind of production technology and production equipment of LED flexible surface light sources |
| CN110907789B (en) * | 2019-11-25 | 2022-09-09 | 歌尔光学科技有限公司 | Device testing method, device and electronic equipment |
| CN113687210A (en) * | 2021-07-16 | 2021-11-23 | 广州市雅江光电设备有限公司 | A method, device and system for testing the welding effect of a lamp PCB board |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1166876A (en) * | 1994-11-24 | 1997-12-03 | 艾利森电话股份有限公司 | Method and device for measuring electronic components |
| CN1544953A (en) * | 2003-11-20 | 2004-11-10 | 上海交通大学 | Real-time monitoring system for fatigue status of multi-channel surface mount solder joints |
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2006
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Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1166876A (en) * | 1994-11-24 | 1997-12-03 | 艾利森电话股份有限公司 | Method and device for measuring electronic components |
| CN1544953A (en) * | 2003-11-20 | 2004-11-10 | 上海交通大学 | Real-time monitoring system for fatigue status of multi-channel surface mount solder joints |
Non-Patent Citations (2)
| Title |
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| 鲜飞.SMT测试技术.国外电子元器件 7.2001,(7),12-13. |
| 鲜飞.SMT测试技术.国外电子元器件 7.2001,(7),12-13. * |
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Assignee: SHENZHEN BYD ELECTRONIC COMPONENT Co.,Ltd. Assignor: BYD Co.,Ltd. Contract fulfillment period: 2008.4.25 to 2015.11.14 Contract record no.: 2008440000067 Denomination of invention: Testing method for luminous parallel path of flexible printing circuit board License type: Exclusive license Record date: 20080504 |
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Free format text: EXCLUSIVE LICENCE; TIME LIMIT OF IMPLEMENTING CONTACT: 2008.4.25 TO 2015.11.14 Name of requester: BIYADI ELECTRON MEMBER CO., LTD., SHENZHEN CITY Effective date: 20080504 |
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Granted publication date: 20110727 |