CN110610634B - A universal simulation method for eliminating defects in electrical control circuits of substation equipment - Google Patents
A universal simulation method for eliminating defects in electrical control circuits of substation equipment Download PDFInfo
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- CN110610634B CN110610634B CN201910867745.0A CN201910867745A CN110610634B CN 110610634 B CN110610634 B CN 110610634B CN 201910867745 A CN201910867745 A CN 201910867745A CN 110610634 B CN110610634 B CN 110610634B
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- 238000004088 simulation Methods 0.000 title claims abstract description 33
- 230000007547 defect Effects 0.000 title claims abstract description 23
- 238000000034 method Methods 0.000 title claims abstract description 12
- 238000010586 diagram Methods 0.000 claims abstract description 31
- 230000008030 elimination Effects 0.000 claims abstract description 16
- 238000003379 elimination reaction Methods 0.000 claims abstract description 16
- 230000009466 transformation Effects 0.000 claims abstract description 8
- 238000012360 testing method Methods 0.000 claims description 21
- 238000005259 measurement Methods 0.000 claims description 14
- 230000002950 deficient Effects 0.000 claims description 6
- 241001422033 Thestylus Species 0.000 claims description 5
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 4
- 230000009471 action Effects 0.000 claims description 4
- 229910052802 copper Inorganic materials 0.000 claims description 4
- 239000010949 copper Substances 0.000 claims description 4
- 230000008569 process Effects 0.000 claims description 4
- 238000003491 array Methods 0.000 claims description 3
- 238000012549 training Methods 0.000 abstract description 12
- 230000007246 mechanism Effects 0.000 description 7
- 238000012423 maintenance Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
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- G09B—EDUCATIONAL OR DEMONSTRATION APPLIANCES; APPLIANCES FOR TEACHING, OR COMMUNICATING WITH, THE BLIND, DEAF OR MUTE; MODELS; PLANETARIA; GLOBES; MAPS; DIAGRAMS
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Abstract
The invention relates to a universal defect elimination simulation method for defect elimination simulation of an electrical control loop of a power transformation device, which is characterized in that a simplified diagram of the control loop is drawn and printed on paper; the paper is arranged on the universal board, and the terminals of all elements in the simplified diagram are aligned with the holes; and identifying an element corresponding to the hole to be tested at present by using the contact of the analog multimeter and the hole, and displaying the electric quantity parameter of the element on the analog multimeter. The invention can simulate various control loops to be tested, so that the training of maintainers is more convenient.
Description
Technical Field
The invention relates to the field of power equipment testing, in particular to a universal defect elimination simulation method for an electric control loop of power transformation equipment.
Background
Circuit breakers and disconnectors are important components of electrical power systems. Modern circuit breakers and disconnectors all adopt an electrically controlled operation mode, and faults of an electric control operation mechanism of the circuit breaker and the disconnector mainly occur in a control loop. Therefore, the elimination of the defects of the control loop is an important skill of electric power maintainers in solving the faults of the circuit breakers and the isolating switches and is also a key point and a difficult point of the power transformation maintenance work. This skill is tempered to electric power maintainer main use equipment material object at present, lacks a convenient low-cost exercise device.
The visible circuit breaker and disconnecting switch operating mechanisms are mostly equipment in field operation, the electric power overhaul personnel contact equipment is limited by whether field work exists, and the exercise opportunity is less. Meanwhile, the risk of reducing the reliability and the durability of the equipment and even causing equipment failure exists when the field equipment carries out defect elimination exercise. In addition, the training is occasionally performed by using spare parts of operating mechanisms, but the models of equipment used for training are single, and the problem of training of equipment with multiple models on site is difficult to solve. Compared with the devices of various types on site, the experience accumulated by the maintainers can be called the waterwheel salary.
Disclosure of Invention
In view of this, the present invention is directed to a universal defect-eliminating simulation method for an electrical control loop of a power transformation device, which can simulate various control loops to be tested, so that the training of maintenance personnel is more convenient.
The invention is realized by adopting the following scheme: a universal defect elimination simulation method for defect elimination simulation of an electrical control loop of a power transformation device specifically comprises the following steps:
drawing a simplified diagram of the control loop and printing the simplified diagram on paper;
setting terminal parameters of each element in a corresponding control loop in a control unit in advance;
providing a universal board, wherein a plurality of copper-clad holes are formed in the universal board, arranging paper with a control circuit simplified diagram on the universal board, and aligning terminals of all elements in the simplified diagram with the holes;
providing an analog multimeter, wherein the analog multimeter comprises a gear selection switch and two meter pen interfaces;
the control unit is electrically connected with the simulation multimeter and the universal board, during testing, the control unit identifies the gear of a gear switch on the current simulation multimeter, when a test pen of the simulation multimeter breaks a piece of paper and contacts a copper-coated hole on the universal board, the control unit identifies the position of the hole measured by the test pen, judges a control loop simplified diagram corresponding to the hole measured by the test pen, outputs corresponding parameters of the current element terminal pre-stored in the control unit according to the gear of the gear switch, and displays the parameters on the simulation multimeter.
Further, the control unit identifies the hole position measured by the stylus as follows:
arranging a plurality of hole arrays on the universal plate, and arranging a plurality of terminals on the universal plate, wherein the terminals are electrically connected with the control unit; two diodes are respectively arranged on the circuit outlet of each hole, and are respectively a row representation diode and a column representation diode, the anode of each diode is connected with the hole, and the cathode of each diode is connected with a terminal; the terminals are divided into two groups, one group is terminals for representing rows, the other group is terminals for representing columns, the row of holes in the same row represents that the diodes are connected with the terminals of the same row, and the column of holes in the same column represents that the diodes are connected with the terminals of the same column; each hole is connected with a unique terminal combination;
during measurement, a stylus of the multimeter is simulated to contact the hole and then is conducted with the two diodes on the hole, the output voltage of the control unit is sent back to the control unit through the stylus of the multimeter, the two diodes on the hole and the two terminals electrically connected with the two diodes, and the control unit identifies the coordinate of the hole on the universal board according to the row and the column represented by the two terminals.
Further, the control unit presets a defect in the drawn control loop and eliminates the defect by setting a specific action of the multimeter.
Further, the testing process specifically comprises the following steps:
step S1: the control unit applies test voltage to two meter pens of the analog multimeter in turn;
step S2: the control unit scans whether holes in the universal board have high levels or not; if yes, the step S3 is entered, otherwise, the step S1 is returned to;
step S3: judging whether only one hole has a high level, namely whether two meter pens are positioned in the same hole, if so, entering a step S4, otherwise, entering a step S5;
step S4: judging whether the element in the control loop corresponding to the hole with the high level is a preset defective element, if so, prompting that the defect elimination is successful, setting the parameter of the defective element to be normal, resetting the electric quantity data of each element in the current control loop, and if not, returning to the step S1;
step S5: judging whether two holes have high levels, namely whether two meter pens are respectively positioned in the two holes, if so, reading electric quantity parameters of elements in a control loop drawn corresponding to the two holes and displaying the electric quantity parameters on an analog multimeter; otherwise, go to step S6;
step S6: and judging whether the element in the control loop corresponding to the hole with the high level is not in the element library preset by the control unit or not, if so, returning to the step S1, otherwise, modifying the state of the element stored in the yuan in the control unit and modifying related electric quantity information.
Compared with the prior art, the invention has the following beneficial effects:
1. the invention can simulate most common control loops of the operating mechanism by compiling a simplified diagram of the control loops of the operating mechanism and pasting the simplified diagram on a standard-size universal board for simulation, thereby realizing the universality of the device. The problem of use the training in kind, available equipment model is single is solved.
2. The invention only consumes one piece of printing paper when in use, has low use cost and good economical efficiency.
3. Compared with physical equipment, the testing device provided by the invention is low in manufacturing cost and small in size. When the training prop is used as a control loop training prop, a training place can be transferred to a classroom from a warehouse or a field, and students can practice with one device by hands. The problems that a training place is inflexible, people are crowded during training, and most people observe equipment and are easy to block are solved, and the training effect can be greatly improved.
Drawings
Fig. 1 is a schematic diagram of a simulation apparatus according to an embodiment of the present invention.
FIG. 2 is a schematic diagram of a testing process according to an embodiment of the present invention.
FIG. 3 is a schematic diagram of a universal board circuit according to an embodiment of the present invention.
FIG. 4 is a schematic diagram of an analog multimeter circuit according to an embodiment of the present invention.
Fig. 5 is a schematic diagram of an electric quantity parameter library preset in the control unit according to the embodiment of the present invention.
FIG. 6 is a simplified schematic diagram of a control loop according to an embodiment of the present invention.
Detailed Description
The invention is further explained below with reference to the drawings and the embodiments.
It should be noted that the following detailed description is exemplary and is intended to provide further explanation of the disclosure. Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs.
It is noted that the terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of example embodiments according to the present application. As used herein, the singular forms "a", "an" and "the" are intended to include the plural forms as well, and it should be understood that when the terms "comprises" and/or "comprising" are used in this specification, they specify the presence of stated features, steps, operations, devices, components, and/or combinations thereof, unless the context clearly indicates otherwise.
The embodiment provides a universal defect elimination simulation method for defect elimination simulation of an electrical control loop of a power transformation device, which specifically comprises the following steps:
drawing a simplified diagram of the control loop and printing on paper (as shown in fig. 6);
setting terminal parameters of each element in a corresponding control loop in a control unit in advance;
providing a universal board, wherein a plurality of copper-clad holes are formed in the universal board, arranging paper with a control circuit simplified diagram on the universal board, and aligning terminals of all elements in the simplified diagram with the holes;
providing an analog multimeter, wherein the analog multimeter comprises a gear selection switch and two meter pen interfaces;
the control unit is electrically connected with the simulation multimeter and the universal board, during testing, the control unit identifies the gear of a gear switch on the current simulation multimeter, when a test pen of the simulation multimeter breaks a piece of paper and contacts a copper-coated hole on the universal board, the control unit identifies the position of the hole measured by the test pen, judges a control loop simplified diagram corresponding to the hole measured by the test pen, outputs corresponding parameters of the current element terminal pre-stored in the control unit according to the gear of the gear switch, and displays the parameters on the simulation multimeter.
In this embodiment, the position of the hole measured by the control unit recognizing the stylus specifically is:
arranging a plurality of hole arrays on the universal plate, and arranging a plurality of terminals on the universal plate, wherein the terminals are electrically connected with the control unit; two diodes are respectively arranged on the circuit outlet of each hole, and are respectively a row representation diode and a column representation diode, the anode of each diode is connected with the hole, and the cathode of each diode is connected with a terminal; the terminals are divided into two groups, one group is terminals for representing rows, the other group is terminals for representing columns, the row of holes in the same row represents that the diodes are connected with the terminals of the same row, and the column of holes in the same column represents that the diodes are connected with the terminals of the same column; each hole is connected with a unique terminal combination;
during measurement, a stylus of the multimeter is simulated to contact the hole and then is conducted with the two diodes on the hole, the output voltage of the control unit is sent back to the control unit through the stylus of the multimeter, the two diodes on the hole and the two terminals electrically connected with the two diodes, and the control unit identifies the coordinate of the hole on the universal board according to the row and the column represented by the two terminals.
In this embodiment, the control unit presets a defect in the drawn control loop, and eliminates the defect by setting a specific action of the multimeter. Wherein, the specific action is that two meter pens are simultaneously positioned in one hole, or the time of one meter pen in one hole is longer than the preset value, or the same hole is communicated three times continuously, etc.
Preferably, as shown in fig. 1, the tools used in the present embodiment mainly include paper, a universal board, an analog multimeter, and a control unit, wherein the control unit may be a single chip or an analog circuit board. The analog multimeter is provided with a knob switch, a display screen and two meter pen interfaces; the simulation multimeter is electrically connected with the control unit, the control unit identifies the gear of the knob switch, outputs the measurement voltage to the two meter pen interfaces and displays the output result on the display screen; the universal board comprises more than one copper-clad hole and a plurality of terminals electrically connected with the control unit, and each hole is electrically connected with two terminals respectively; when one hole is connected with a meter pen of the analog multimeter, the measurement voltage output by the control unit passes through the meter pen and the hole and then returns to the control unit through the two corresponding terminals, so that the control unit can identify the currently conducted hole through the two conducted terminals; the paper provided with the simulation circuit diagram is placed above the universal plate, the element terminal to be tested in the simulation circuit diagram corresponds to the position of the hole in the universal plate, and the meter pen penetrates through the paper and is connected with the hole during measurement; the control unit is internally preset with measurement logic matched with the simulation circuit diagram, identifies the measurement mode selected by the current operator according to the gear of the simulation multimeter, judges the hole measured by the current operator according to the voltage returned by the universal plate, then gives a corresponding measurement result according to the preset measurement logic, and displays the measurement result on the simulation multimeter.
As shown in fig. 3, the holes on the universal board are arranged in an array, two diodes are arranged at the circuit outlet of each hole, the diodes are respectively a row-representation diode and a column-representation diode, the anode of each diode is connected with the hole, and the cathode is connected with the terminal; the terminals are divided into two groups, one group is terminals for representing rows, the other group is terminals for representing columns, the row of holes in the same row represents that the diodes are connected with the terminals of the same row, and the column of holes in the same column represents that the diodes are connected with the terminals of the same column; each cavity is connected with a unique terminal combination. In this example, a standard size universal board is a fixed size (e.g., a4) circuit board containing an array of multiple copper-clad vias, each of which has two diodes mounted at the exit of the via circuit. When the device is used, the simplified diagram of the elements in the operating mechanism printed on the A4 paper is pasted on the universal board, and the terminals of the elements in the simplified diagram correspond to the through hole positions on the universal board. Then use the simulation universal meter pen-shape metre that this patent provided to measure, the measurement mode is the same with using actual universal meter, with the wrong broken A4 paper of pen-shape metre make the copper contact of the cover on pen front metal part and through-hole surface can. Because the control chip can add +5V direct current voltage to the two meter pens in sequence by scanning, the meter pens prop against the hole A during measurement, the terminals corresponding to the column and the row of the hole A can detect the +5V voltage, and the control chip judges the coordinates of the measured point according to the voltage. The diodes at the outlet of each copper-clad through hole circuit can ensure that voltage is not applied to the through holes from the circuit, and further the condition that all row terminals are electrified when one hole is pressurized is avoided.
In the embodiment, the gear positions of the knob switch on the analog multimeter comprise a neutral gear, an alternating-current voltage gear, a direct-current voltage gear, a current gear and an ohmic gear.
As shown in fig. 4, two stylus interfaces on the analog multimeter are respectively connected to a reference power supply through two pull-up resistors, and the two stylus interfaces are electrically connected to the control unit. The meter pen is the same as the multimeter and comprises two meter pens, namely red and black, a meter pen interface is connected to an I/O port of a chip in the control unit through a terminal and is provided with pull-up resistors R1 and R2. After the meter pen is connected, the voltage value on the pen is controlled by the control module. When the shift chip outputs a low potential corresponding to the I/O port, the voltage of the meter pen is 0V; when outputting high potential, the voltage of the meter pen is + 5V. The chip outputs high potential to the two meter pens in turn to distinguish the red pen from the black pen. When the display screen is used, the LCD display screen is connected to the control module in a terminal-DuPont wire-terminal mode, and data required to be displayed by the control module is displayed.
In the embodiment, an emulation circuit board is used as a control unit, and a control chip (model: STM32F103ZE) is mounted on the emulation circuit board. The control chip is loaded with a control program. The control program is responsible for reading the function selection state of the analog multimeter and the measurement condition of the multimeter on the analog element on the standard-size universal board. For example, the multimeter selects a voltage range, two meter pens are measuring a terminal (X1-1) and a terminal (X1-2), then the control program judges the voltage between the terminal (X1-1) and the terminal (X1-2) according to preset logic, and the control program reads out voltage data prestored between corresponding terminals in the storage module and displays the voltage data on an LCD display screen of the multimeter.
In the embodiment, the control circuit of the equipment operating mechanism can be simulated by printing the simplified circuit diagram and pasting the simplified circuit diagram on a universal board with a standard size and utilizing a control unit to simulate the control circuit. Meanwhile, the device uses an I/O interface with an incoming resistor to model the output of a multimeter meter pen, and simultaneously realizes the scanning and positioning of the dot matrix on the universal board by means of a diode.
As shown in fig. 2, in this embodiment, the testing process specifically includes the following steps:
step S1: the control unit applies test voltage to two meter pens of the analog multimeter in turn;
step S2: the control unit scans whether holes in the universal board have high levels or not; if yes, the step S3 is entered, otherwise, the step S1 is returned to;
step S3: judging whether only one hole has a high level, namely whether two meter pens are positioned in the same hole, if so, entering a step S4, otherwise, entering a step S5;
step S4: judging whether the element in the control loop corresponding to the hole with the high level is a preset defective element, if so, prompting that the defect elimination is successful, setting the parameter of the defective element to be normal, resetting the electric quantity data of each element in the current control loop, and if not, returning to the step S1;
step S5: judging whether two holes have high levels, namely whether two meter pens are respectively positioned in the two holes, if so, reading electric quantity parameters of elements in a control loop drawn corresponding to the two holes and displaying the electric quantity parameters on an analog multimeter; otherwise, go to step S6;
step S6: and judging whether the element in the control loop corresponding to the hole with the high level is not in the element library preset by the control unit or not, if so, returning to the step S1, otherwise, modifying the state of the element stored in the control unit and modifying related electric quantity information.
Preferably, in the present embodiment, as shown in fig. 5, the control unit may be preset with a defect elimination library, a power library, a component library, and the like, but is not limited thereto.
The foregoing is directed to preferred embodiments of the present invention, other and further embodiments of the invention may be devised without departing from the basic scope thereof, and the scope thereof is determined by the claims that follow. However, any simple modification, equivalent change and modification of the above embodiments according to the technical essence of the present invention are within the protection scope of the technical solution of the present invention.
Claims (1)
1. A universal defect elimination simulation method for defect elimination simulation of an electrical control loop of a power transformation device is characterized by comprising the following steps:
drawing a simplified diagram of the control loop and printing the simplified diagram on paper;
setting terminal parameters of each element in a corresponding control loop in a control unit in advance;
providing a universal board, wherein a plurality of copper-clad holes are formed in the universal board, arranging paper with a control circuit simplified diagram on the universal board, and aligning terminals of all elements in the simplified diagram with the holes;
providing an analog multimeter, wherein the analog multimeter comprises a gear selection switch and two meter pen interfaces;
the control unit is electrically connected with the simulation multimeter and the universal board, during testing, the control unit identifies the gear of a gear switch on the current simulation multimeter, when a test pen of the simulation multimeter breaks a piece of paper and contacts a copper-coated hole on the universal board, the control unit identifies the position of the hole measured by the test pen, judges a component terminal in a control loop simplified diagram corresponding to the hole measured by the current test pen, and simultaneously outputs a corresponding parameter of the current component terminal pre-stored in the control unit according to the gear of the gear switch and displays the parameter on the simulation multimeter;
the control unit identifies the hole position measured by the meter pen, and specifically comprises the following steps:
arranging a plurality of hole arrays on the universal plate, and arranging a plurality of terminals on the universal plate, wherein the terminals are electrically connected with the control unit; two diodes are respectively arranged on the circuit outlet of each hole, and are respectively a row representation diode and a column representation diode, the anode of each diode is connected with the hole, and the cathode of each diode is connected with a terminal; the terminals are divided into two groups, one group is terminals for representing rows, the other group is terminals for representing columns, the row of holes in the same row represents that the diodes are connected with the terminals of the same row, and the column of holes in the same column represents that the diodes are connected with the terminals of the same column; each hole is connected with a unique terminal combination;
during measurement, a stylus contact hole of the multimeter is simulated, and then the stylus contact hole is conducted with the two diodes on the hole, the output voltage of the control unit is fed back to the control unit through a stylus of the multimeter, the two diodes on the hole and the two terminals electrically connected with the two diodes, and the control unit identifies the coordinate of the hole on the universal board according to the row and the column represented by the two terminals;
the control unit presets a defect in a drawn control loop and eliminates the defect by setting a specific action of the multimeter;
the testing process specifically comprises the following steps:
step S1: the control unit applies test voltage to two meter pens of the analog multimeter in turn;
step S2: the control unit scans whether holes in the universal board have high levels or not; if yes, the step S3 is entered, otherwise, the step S1 is returned to;
step S3: judging whether only one hole has a high level, namely whether two meter pens are positioned in the same hole, if so, entering a step S4, otherwise, entering a step S5;
step S4: judging whether the element in the control loop corresponding to the hole with the high level is a preset defective element, if so, prompting that the defect elimination is successful, setting the parameter of the defective element to be normal, resetting the electric quantity data of each element in the current control loop, and if not, returning to the step S1;
step S5: judging whether two holes have high levels, namely whether two meter pens are respectively positioned in the two holes, if so, reading electric quantity parameters of elements in a control loop drawn corresponding to the two holes and displaying the electric quantity parameters on an analog multimeter; otherwise, go to step S6;
step S6: and judging whether the element in the control loop corresponding to the hole with the high level is not in the element library preset by the control unit or not, if so, returning to the step S1, otherwise, modifying the state of the element stored in the control unit and modifying related electric quantity information.
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| CN201910867745.0A CN110610634B (en) | 2019-09-14 | 2019-09-14 | A universal simulation method for eliminating defects in electrical control circuits of substation equipment |
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