CN110610634A - A universal fault elimination simulation method for fault elimination simulation of electrical control loops of substation equipment - Google Patents

Abstract

The invention relates to a universal fault elimination simulation method for the fault elimination simulation of the electrical control circuit of substation equipment, drawing a simplified diagram of the control circuit and printing it on paper; and setting the paper on a universal board, and simplifying the The terminals of each component in the figure are aligned with the hole; use the analog multimeter to contact the hole to identify the component corresponding to the hole currently tested, and display the power parameter of the component on the analog multimeter. The invention can simulate various control loops that need to be tested, so that the training of maintenance personnel is more convenient.

Description

A Universal Elimination Simulation for Electrical Control Loop Emulation of Substation Equipment method

technical field

The invention relates to the field of electric equipment testing, in particular to a universal elimination simulation method for the simulation of elimination of electrical control circuits of substation equipment.

Background technique

Circuit breakers and disconnectors are important components of power systems. Modern circuit breakers and isolating switches are all operated by electrical control, and the failure of the electrical control operating mechanism mainly occurs in the control loop. Therefore, eliminating control loop defects is an important skill for electric power maintenance personnel to solve circuit breaker and isolating switch faults, and it is also the focus and difficulty of substation maintenance work. At present, electric power maintenance personnel mainly use physical equipment to practice this skill, and there is a lack of a convenient and low-cost practice device.

The operating mechanisms of circuit breakers and isolating switches that are usually visible are mostly equipment in operation on site. The access to equipment by electric maintenance personnel is limited by whether they have on-site work, and there are few opportunities for training. At the same time, there is a risk of reducing the reliability and durability of the equipment and even causing equipment failure when performing defect elimination exercises on the field equipment. In addition, there are occasional opportunities to use the spare parts of the operating mechanism for training, but the equipment used for training is often of a single model, and it is difficult to solve the training problem of many types of equipment on site. Compared with the many types of equipment on site, the experience that maintenance personnel can accumulate is a drop in the bucket.

Contents of the invention

In view of this, the object of the present invention is to propose a universal fault elimination simulation method for the electrical control circuit fault elimination simulation of substation equipment, which can simulate a variety of control circuits that need to be tested, making the training of maintenance personnel more convenient.

The present invention is realized by the following scheme: a universal fault elimination simulation method for the electrical control circuit fault elimination simulation of substation equipment, which specifically includes the following steps:

Draw a simplified diagram of the control loop and print it on paper;

The terminal parameters of each component in the corresponding control loop are set in the control unit in advance;

Provide a universal board with multiple copper-clad holes, place the paper with a simplified diagram of the control circuit on the universal board, and align the terminals of each component in the simplified diagram with the holes;

Provide an analog multimeter, which includes a gear selection switch and two test lead interfaces;

The control unit is electrically connected with the analog multimeter and the universal board. During the test, the control unit recognizes the gear position of the gear switch on the current analog multimeter. , the control unit recognizes the position of the hole measured by the test pen, and judges the component terminal in the simplified diagram of the control circuit corresponding to the hole measured by the current test pen, and at the same time outputs the current component terminal pre-stored in the control unit according to the gear position of the gear switch. The corresponding parameters are displayed on the analog multimeter.

Further, the position of the hole measured by the control unit identifying the meter pen is specifically:

A plurality of hole arrays are arranged on the universal board, and a plurality of terminals are arranged on the multi-purpose board at the same time, and the plurality of terminals are electrically connected with the control unit; two diodes are respectively arranged on the circuit outlet of each hole, respectively Rows represent diodes and columns represent diodes. The anode of each diode is connected to the hole, and the cathode is connected to the terminal; A row of holes in a row indicates that the diodes are connected to the same terminal representing the row, and a column of holes in the same column indicates that the diodes are connected to the same terminal representing the column; each hole is connected to a unique combination of terminals;

During the measurement, the test lead of the analog multimeter touches the hole, and then conducts with the two diodes on the hole, and the output voltage of the control unit passes through the test lead of the multimeter, the two diodes on the hole, and the two diodes connected electrically. The two terminals are sent back to the control unit, and the control unit recognizes the coordinates of the hole on the universal board according to the row and column represented by the two terminals.

Further, the control unit presets defects in the drawn control loop, and eliminates the defects by setting specific actions of the multimeter.

Further, the testing process specifically includes the following steps:

Step S1: the control unit applies a test voltage to the two test leads of the analog multimeter in turn;

Step S2: The control unit scans whether there is a hole on the universal board with a high level; if there is, go to step S3, otherwise return to step S1;

Step S3: Determine whether only one hole has a high level, that is, whether the two test leads are located in the same hole, if so, go to step S4, otherwise go to step S5;

Step S4: Determine whether the component in the control loop corresponding to the hole with high level is a preset defective component, if so, it will prompt that the defect is eliminated successfully, set the parameter of the defective component to normal, and reset the current control The power data of each component in the circuit, if not, return to step S1;

Step S5: Determine whether there are two holes with high level, that is, whether the two test leads are respectively located in the two holes, and if so, read the power parameters of the components in the control loop drawn corresponding to the two holes and Display on the analog multimeter; otherwise enter step S6;

Step S6: Determine whether there is a hole in the hole with a high level. The component in the control loop corresponding to the hole is not in the component library preset by the control unit. If so, return to step S1, otherwise modify the component stored in the control unit. status, and modify the related power information.

Compared with the prior art, the present invention has the following beneficial effects:

1. The present invention can simulate most common operating mechanism control circuits by compiling a simplified diagram of the control circuit of the operating mechanism and pasting it on a standard size universal board for simulation, thereby realizing the versatility of the device. It solves the problem that the available equipment models are single when using physical training.

2. The present invention consumes only one piece of printing paper each time, and has low cost and good economy.

3. Compared with physical equipment, the test device of the present invention has low manufacturing cost and small volume. When used as a control loop training tool, the training location can be transferred from the warehouse or the field to the classroom, and the trainees can practice with a device. It solves the problem that the training place is not flexible, the training is crowded, and most people are easily blocked from observing the equipment, which can greatly improve the training effect.

Description of drawings

FIG. 1 is a schematic diagram of a simulation device of an embodiment of the present invention.

Fig. 2 is a schematic diagram of the testing process of the embodiment of the present invention.

Fig. 3 is a schematic diagram of the circuit principle of the universal board according to the embodiment of the present invention.

Fig. 4 is a schematic diagram of the circuit principle of an analog multimeter according to an embodiment of the present invention.

Fig. 5 is a schematic diagram of a power parameter library preset in the control unit according to an embodiment of the present invention.

FIG. 6 is a simplified schematic diagram of a control loop of an embodiment of the present invention.

Detailed ways

The present invention will be further described below in conjunction with the accompanying drawings and embodiments.

It should be pointed out that the following detailed description is exemplary and is intended to provide further explanation to the present application. Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs.

It should be noted that the terminology used here is only for describing specific implementations, and is not intended to limit the exemplary implementations according to the present application. As used herein, unless the context clearly dictates otherwise, the singular is intended to include the plural, and it should also be understood that when the terms "comprising" and/or "comprising" are used in this specification, they mean There are features, steps, operations, means, components and/or combinations thereof.

This embodiment provides a universal fault elimination simulation method for the fault elimination simulation of electrical control loops of substation equipment, which specifically includes the following steps:

Draw a simplified diagram of the control loop and print it on paper (as shown in Figure 6);

The terminal parameters of each component in the corresponding control loop are set in the control unit in advance;

Provide a universal board with multiple copper-clad holes, place the paper with a simplified diagram of the control circuit on the universal board, and align the terminals of each component in the simplified diagram with the holes;

Provide an analog multimeter, which includes a gear selection switch and two test lead interfaces;

The control unit is electrically connected with the analog multimeter and the universal board. During the test, the control unit recognizes the gear position of the gear switch on the current analog multimeter. , the control unit recognizes the position of the hole measured by the test pen, and judges the component terminal in the simplified diagram of the control circuit corresponding to the hole measured by the current test pen, and at the same time outputs the current component terminal pre-stored in the control unit according to the gear position of the gear switch. The corresponding parameters are displayed on the analog multimeter.

In this embodiment, the position of the hole measured by the control unit identifying the probe is specifically:

A plurality of hole arrays are arranged on the universal board, and a plurality of terminals are arranged on the multi-purpose board at the same time, and the plurality of terminals are electrically connected with the control unit; two diodes are respectively arranged on the circuit outlet of each hole, respectively Rows represent diodes and columns represent diodes. The anode of each diode is connected to the hole, and the cathode is connected to the terminal; A row of holes in a row indicates that the diodes are connected to the same terminal representing the row, and a column of holes in the same column indicates that the diodes are connected to the same terminal representing the column; each hole is connected to a unique combination of terminals;

During the measurement, the test lead of the analog multimeter touches the hole, and then conducts with the two diodes on the hole, and the output voltage of the control unit passes through the test lead of the multimeter, the two diodes on the hole, and the two diodes connected electrically. The two terminals are sent back to the control unit, and the control unit recognizes the coordinates of the hole on the universal board according to the row and column represented by the two terminals.

In this embodiment, the control unit presets defects in the drawn control loop, and eliminates the defects by setting specific actions of the multimeter. The specific actions include two test leads in one hole at the same time, or a test lead in a hole for a time greater than the preset value, or connecting the same hole three times in a row, and so on.

Preferably, as shown in FIG. 1 , the tools used in this embodiment mainly include paper, a multi-purpose board, an analog multi-meter and a control unit, wherein the control unit can use a single-chip microcomputer or an analog circuit board. The analog multimeter is provided with a rotary switch, a display screen, and two test lead interfaces; the analog multimeter is electrically connected to the control unit, and the control unit recognizes the gear position of the rotary switch, and outputs a measurement voltage to the two test lead interfaces, and The output result is displayed on the display screen; the universal board includes more than one copper-clad hole and multiple terminals electrically connected to the control unit, and each hole is electrically connected to two terminals; when a hole is connected to the analog When the test leads of the multimeter are connected, the measurement voltage output by the control unit is sent back to the control unit through the corresponding two terminals through the test leads and the hole, so that the control unit can identify the current conduction hole through the two conducting terminals; The paper with the simulation circuit diagram is placed above the universal board, and the component terminals to be tested in the simulation circuit diagram on it correspond to the positions of the holes on the universal board. When measuring, the test leads pass through the paper and are connected to the holes; the control The measurement logic matching the simulation circuit diagram is preset in the unit. According to the gear position of the analog multimeter, the measurement mode selected by the current operator is recognized, and the hole measured by the current operator is judged according to the voltage returned by the multimeter, and then according to the preset measurement mode The logic gives the corresponding measurement results and displays them on the analog multimeter.

As shown in Figure 3, the holes on the universal board are arranged in an array, and the circuit outlet of each hole is provided with two diodes, the row represents the diode and the column represents the diode, and the anode of each diode is connected to the hole. The cathode is connected to the terminal; the terminals are divided into two groups, one group is the terminal used to represent the row, the other group is the terminal used to represent the column, the row of the hole in the same row represents the diode connected to the same terminal representing the row, the same A column of holes in a column representing diodes is connected to a terminal representing a column; each hole is connected to a unique combination of terminals. In this embodiment, the standard size universal board is a circuit board with a fixed size (such as A4) containing multiple arrays of copper-clad through holes, and two diodes are installed at the outlet of each through hole circuit. When in use, paste the simplified diagram of the components in the operating mechanism printed on A4 paper on the universal board, and ensure that the terminals of each component in the simplified diagram correspond to the through-hole positions on the universal board. Then use the analog multimeter pen provided by this patent to measure. The measurement method is the same as using the actual multimeter. Use the pen to break the A4 paper so that the metal part in front of the pen contacts the copper covered on the surface of the through hole. Since the control chip will scan the two test leads in order to add +5V DC voltage, and the test lead will withstand the hole A during the measurement, then the terminals corresponding to the column and row where the hole A is located can detect the +5V voltage, and the control chip will use this Determine the coordinates of the measured point. The diode at the exit of each copper-clad through-hole circuit can ensure that the voltage is not applied from the circuit to the through-hole, thereby avoiding the situation that a hole is pressurized and all row and column terminals are charged.

In this embodiment, the gear positions of the rotary switch on the analog multimeter include neutral gear, AC voltage gear, DC voltage gear, current gear, and ohm gear.

As shown in FIG. 4 , the two test lead interfaces on the analog multimeter are respectively connected to the reference power supply through two pull-up resistors, and at the same time, the two test lead interfaces are electrically connected to the control unit. The test leads are the same as the multimeter, including two red and black test leads. The test lead interface is connected to the I/O port of the chip in the control unit through the terminal, and is equipped with pull-up resistors R1 and R2. After the test lead is connected, the voltage value on the pen is controlled by the control module. When the gear chip corresponds to the I/O port to output low potential, the test lead voltage is 0V; when output high potential, the test lead voltage is +5V. The chip outputs high potentials to the two pens in turn to distinguish between red pens and black pens. When in use, the LCD display is connected to the control module through a terminal-DuPont line-terminal method, and displays the data that the control module needs to display.

In this embodiment, a simulation circuit board is used as the control unit, on which a control chip (model: STM32F103ZE) is installed. A control program is loaded in the control chip. The control program is responsible for reading the function selection status of the analog multimeter and the measurement of the "analog components" on the standard size multimeter board by the multimeter. For example, the multimeter selects the voltage range, and the two test leads are measuring the terminal (X1-1) and the terminal (X1-2), then the control program judges that the terminal (X1-1) and the terminal (X1-2) are being measured according to the preset logic. The control program will read out the voltage data between the corresponding terminals pre-stored in the storage module and display it on the LCD display of the multimeter.

In this embodiment, by printing a simplified circuit diagram and pasting it on a universal board of a standard size, and using the control unit for simulation, the control circuit of the operating mechanism of the equipment can be simulated. At the same time, this device uses the I/O interface with a resistor to simulate the output of the multimeter pen, and at the same time uses the diode to realize the scanning positioning of the dot matrix on the multimeter.

As shown in Figure 2, in this embodiment, the process of testing specifically includes the following steps:

Step S1: the control unit applies a test voltage to the two test leads of the analog multimeter in turn;

Step S2: The control unit scans whether there is a hole on the universal board with a high level; if there is, go to step S3, otherwise return to step S1;

Step S3: Determine whether only one hole has a high level, that is, whether the two test leads are located in the same hole, if so, go to step S4, otherwise go to step S5;

Step S4: Determine whether the component in the control loop corresponding to the hole with high level is a preset defective component, if so, it will prompt that the defect is eliminated successfully, set the parameter of the defective component to normal, and reset the current control The power data of each component in the circuit, if not, return to step S1;

Step S5: Determine whether there are two holes with high level, that is, whether the two test leads are respectively located in the two holes, and if so, read the power parameters of the components in the control loop drawn corresponding to the two holes and Display on the analog multimeter; otherwise enter step S6;

Step S6: Determine whether there is a hole in the hole with a high level. The component in the control loop corresponding to the hole is not in the component library preset by the control unit. If so, return to step S1, otherwise modify the state of the component stored in the control unit , and modify the related power information.

Preferably, in this embodiment, as shown in FIG. 5 , the control unit may be preset with a library for eliminating defects, a library for electric power, and a library for components, etc., but is not limited thereto.

The above is only a preferred embodiment of the present invention, and is not intended to limit the present invention to other forms. Any skilled person who is familiar with this profession may use the technical content disclosed above to change or modify the equivalent of equivalent changes. Example. However, any simple modifications, equivalent changes and modifications made to the above embodiments according to the technical essence of the present invention without departing from the content of the technical solution of the present invention still belong to the protection scope of the technical solution of the present invention.

Claims (4)

1. a kind of universal lack-eliminating simulation method for the simulation of electric control circuit of substation equipment, is characterized in that, comprises the following steps: Draw a simplified diagram of the control loop and print it on paper; The terminal parameters of each component in the corresponding control loop are set in the control unit in advance; Provide a universal board with multiple copper-clad holes, place the paper with a simplified diagram of the control circuit on the universal board, and align the terminals of each component in the simplified diagram with the holes; Provide an analog multimeter, which includes a gear selection switch and two test lead interfaces; The control unit is electrically connected with the analog multimeter and the universal board. During the test, the control unit recognizes the gear position of the gear switch on the current analog multimeter. , the control unit recognizes the position of the hole measured by the test pen, and judges the component terminal in the simplified diagram of the control circuit corresponding to the hole measured by the current test pen, and at the same time outputs the current component terminal pre-stored in the control unit according to the gear position of the gear switch. The corresponding parameters are displayed on the analog multimeter. 2. A kind of universal fault elimination simulation method for the electrical control circuit fault elimination simulation of substation equipment according to claim 1, characterized in that, the hole position measured by the control unit identification meter pen is specifically: A plurality of hole arrays are arranged on the universal board, and a plurality of terminals are arranged on the multi-purpose board at the same time, and the plurality of terminals are electrically connected with the control unit; two diodes are respectively arranged on the circuit outlet of each hole, respectively Rows represent diodes and columns represent diodes. The anode of each diode is connected to the hole, and the cathode is connected to the terminal; A row of holes in a row indicates that the diodes are connected to the same terminal representing the row, and a column of holes in the same column indicates that the diodes are connected to the same terminal representing the column; each hole is connected to a unique combination of terminals; During the measurement, the test lead of the analog multimeter touches the hole, and then conducts with the two diodes on the hole, and the output voltage of the control unit passes through the test lead of the multimeter, the two diodes on the hole, and the two diodes connected electrically. The two terminals are sent back to the control unit, and the control unit recognizes the coordinates of the hole on the universal board according to the row and column represented by the two terminals. 3. A kind of universal defect elimination simulation method for the electrical control circuit defect elimination simulation of substation equipment according to claim 1, characterized in that, the control unit presets defects in the drawn control circuit, and by setting the multimeter Specific actions to eliminate defects. 4. A kind of universal elimination simulation method for the electrical control loop elimination simulation of substation equipment according to claim 3, it is characterized in that, the process of testing specifically comprises the following steps: Step S1: the control unit applies a test voltage to the two test leads of the analog multimeter in turn; Step S2: The control unit scans whether there is a hole on the universal board with a high level; if there is, go to step S3, otherwise return to step S1; Step S3: Determine whether only one hole has a high level, that is, whether the two test leads are located in the same hole, if so, go to step S4, otherwise go to step S5; Step S4: Determine whether the component in the control loop corresponding to the hole with high level is a preset defective component, if so, it will prompt that the defect is eliminated successfully, set the parameter of the defective component to normal, and reset the current control The power data of each component in the circuit, if not, return to step S1; Step S5: Determine whether there are two holes with high level, that is, whether the two test leads are respectively located in the two holes, and if so, read the power parameters of the components in the control loop drawn corresponding to the two holes and Display on the analog multimeter; otherwise enter step S6; Step S6: Determine whether there is a hole in the hole with a high level. The component in the control loop corresponding to the hole is not in the component library preset by the control unit. If so, return to step S1, otherwise modify the component stored in the control unit. status, and modify the related power information.