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PT104140A - Elemento de inserção, tabuleiro e equipamento de teste de dispositivos electrónicos - Google Patents

Elemento de inserção, tabuleiro e equipamento de teste de dispositivos electrónicos Download PDF

Info

Publication number
PT104140A
PT104140A PT104140A PT10414008A PT104140A PT 104140 A PT104140 A PT 104140A PT 104140 A PT104140 A PT 104140A PT 10414008 A PT10414008 A PT 10414008A PT 104140 A PT104140 A PT 104140A
Authority
PT
Portugal
Prior art keywords
tray
electronic device
insertion element
test equipment
device test
Prior art date
Application number
PT104140A
Other languages
English (en)
Inventor
Akihiro Osakabe
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of PT104140A publication Critical patent/PT104140A/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

UM ELEMENTO (710) DE INSERÇÃO COMPREENDE: UM CORPO (720) DO ELEMENTO DE INSERÇÃO TENDO UM ORIFÍCIO (721) DE ACOMODAÇÃO DE DISPOSITIVO PARA ACOMODAR UM DISPOSITIVO IC; E UM SUPORTE (760) DE DISPOSITIVO PARA PRENDER O DISPOSITIVO IC ACOMODADO NO ORIFÍCIO (721) DE ACOMODAÇÃO DE DISPOSITIVO, ESTANDO O SUPORTE (760) DE DISPOSITIVO APTO A MOVER-SE FINAMENTE EM RELAÇÃO AO CORPO (720) DO ELEMENTO DE INSERÇÃO.
PT104140A 2007-11-26 2008-07-25 Elemento de inserção, tabuleiro e equipamento de teste de dispositivos electrónicos PT104140A (pt)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/072789 WO2009069190A1 (ja) 2007-11-26 2007-11-26 インサート、トレイ及び電子部品試験装置

Publications (1)

Publication Number Publication Date
PT104140A true PT104140A (pt) 2008-09-17

Family

ID=40678108

Family Applications (1)

Application Number Title Priority Date Filing Date
PT104140A PT104140A (pt) 2007-11-26 2008-07-25 Elemento de inserção, tabuleiro e equipamento de teste de dispositivos electrónicos

Country Status (6)

Country Link
JP (1) JPWO2009069190A1 (pt)
KR (1) KR101149747B1 (pt)
CN (1) CN101842712B (pt)
PT (1) PT104140A (pt)
TW (1) TWI396847B (pt)
WO (1) WO2009069190A1 (pt)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013053991A (ja) * 2011-09-06 2013-03-21 Seiko Epson Corp ハンドラー及び部品検査装置
KR101488488B1 (ko) * 2013-07-09 2015-02-02 주식회사 오킨스전자 엘이디모듈 테스트장치
TW201610444A (zh) * 2014-09-11 2016-03-16 Motech Taiwan Automatic Corp 電子元件測試模組之啓閉裝置（三）
KR101887071B1 (ko) * 2016-09-01 2018-09-10 리노공업주식회사 검사장치의 슬라이더 조작기구
CN114441928A (zh) * 2020-11-02 2022-05-06 第一检测有限公司 芯片托盘套件及芯片测试设备
KR20230114908A (ko) * 2022-01-26 2023-08-02 (주)테크윙 핸들러
CN116643065B (zh) * 2023-07-26 2023-11-07 中国电子科技集团公司第十研究所 一种模拟类模块用柔性装夹装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6369595B1 (en) * 1999-01-21 2002-04-09 Micron Technology, Inc. CSP BGA test socket with insert and method
JP4279413B2 (ja) * 1999-07-16 2009-06-17 株式会社アドバンテスト 電子部品試験装置用インサート
US6636060B1 (en) * 1999-07-16 2003-10-21 Advantest Corporation Insert for electric devices testing apparatus
JP4222442B2 (ja) * 1999-07-16 2009-02-12 株式会社アドバンテスト 電子部品試験装置用インサート
JP3711283B2 (ja) * 2002-03-06 2005-11-02 株式会社アドバンテスト インサートおよびこれを備えた電子部品ハンドリング装置
WO2004095038A1 (ja) * 2003-04-23 2004-11-04 Advantest Corporation 電子部品ハンドリング装置用インサート、トレイおよび電子部品ハンドリング装置

Also Published As

Publication number Publication date
JPWO2009069190A1 (ja) 2011-04-07
CN101842712B (zh) 2013-01-30
TWI396847B (zh) 2013-05-21
CN101842712A (zh) 2010-09-22
TW200946917A (en) 2009-11-16
WO2009069190A1 (ja) 2009-06-04
KR20100052564A (ko) 2010-05-19
KR101149747B1 (ko) 2012-06-01

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Legal Events

Date Code Title Description
BB1A Laying open of patent application

Effective date: 20080909

FC3A Refusal

Effective date: 20090422