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PH12012502219A1 - An electrical contact and testing platform - Google Patents

An electrical contact and testing platform

Info

Publication number
PH12012502219A1
PH12012502219A1 PH1/2012/502219A PH12012502219A PH12012502219A1 PH 12012502219 A1 PH12012502219 A1 PH 12012502219A1 PH 12012502219 A PH12012502219 A PH 12012502219A PH 12012502219 A1 PH12012502219 A1 PH 12012502219A1
Authority
PH
Philippines
Prior art keywords
testing platform
electrical contact
component
electrical
test machine
Prior art date
Application number
PH1/2012/502219A
Inventor
Kian Aik Cheng
Sek Hoi Chong
Original Assignee
Ismeca Semiconductor Holding Sa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ismeca Semiconductor Holding Sa filed Critical Ismeca Semiconductor Holding Sa
Publication of PH12012502219A1 publication Critical patent/PH12012502219A1/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H01R13/2457—Contacts for co-operating by abutting resilient; resiliently-mounted consisting of at least two resilient arms contacting the same counterpart
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/14—Measuring resistance by measuring current or voltage obtained from a reference source
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/40—Securing contact members in or to a base or case; Insulating of contact members
    • H01R13/405—Securing in non-demountable manner, e.g. moulding, riveting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R2201/00—Connectors or connections adapted for particular applications
    • H01R2201/20—Connectors or connections adapted for particular applications for testing or measuring purposes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Connecting Device With Holders (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

According to the present invention there is provided an electrical contact comprising three or more blades so as to facilitate the establishment of an electrical connection between at least two of the three or more blades by an electrical contact of a component. There is further provided a testing platform suitable for receiving an electrical component to be tested, wherein the testing platform comprising one or more of the aforementioned electrical contacts. There is further provided a test machine component, comprising a holder member which comprises any one of the aforementioned electrical contacts, wherein the test machine component is configured such that it can co¬ operate with a test machine.
PH1/2012/502219A 2010-09-30 2011-09-01 An electrical contact and testing platform PH12012502219A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
MYPI2010004583 2010-09-30
PCT/EP2011/065146 WO2011141582A1 (en) 2010-09-30 2011-09-01 An electrical contact and testing platform

Publications (1)

Publication Number Publication Date
PH12012502219A1 true PH12012502219A1 (en) 2013-02-04

Family

ID=44584176

Family Applications (1)

Application Number Title Priority Date Filing Date
PH1/2012/502219A PH12012502219A1 (en) 2010-09-30 2011-09-01 An electrical contact and testing platform

Country Status (8)

Country Link
EP (1) EP2622691A1 (en)
JP (1) JP2013541006A (en)
KR (1) KR20130124451A (en)
CN (1) CN103026555A (en)
PH (1) PH12012502219A1 (en)
SG (1) SG188185A1 (en)
TW (1) TWI497084B (en)
WO (1) WO2011141582A1 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2014096218A1 (en) * 2012-12-19 2014-06-26 Ismeca Semiconductor Holding Sa Device and method for limiting force
JP2015021772A (en) * 2013-07-17 2015-02-02 サンダース アンド アソシエイツ エルエルシー Quartz oscillator measurement device
JP2016090306A (en) * 2014-10-31 2016-05-23 新電元工業株式会社 Inspection probe, inspection device and inspection method
US10151774B2 (en) 2015-06-10 2018-12-11 Asm Technology Singapore Pte Ltd Electrical contact having electrical isolated members for contacting an electrical component

Family Cites Families (21)

* Cited by examiner, † Cited by third party
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JPS5666053A (en) * 1979-11-01 1981-06-04 Mitsubishi Electric Corp Fixed probing card
US4419626A (en) * 1981-08-25 1983-12-06 Daymarc Corporation Broad band contactor assembly for testing integrated circuit devices
JPS5893339A (en) * 1981-11-27 1983-06-03 デイマ−ク・コ−ポレイシヨン Interface assembly for testing integrated circuit device
EP0160775B1 (en) 1984-05-07 1989-01-11 Jacob Weitman A method of controlling an energy recovery system
JPH10148651A (en) * 1996-11-18 1998-06-02 Taiyo Yuden Co Ltd Terminal for measurement of electrical measuring equipment
WO1999008122A1 (en) 1997-08-07 1999-02-18 Yin Leong Tan Kelvin contact socket
US6069480A (en) 1997-12-31 2000-05-30 Aetrium-Fsa, Lp Kelvin contact-type testing device
EP1085327B1 (en) * 1999-09-15 2006-06-07 Capres A/S Multi-point probe
JP3066068U (en) * 1999-07-26 2000-02-18 株式会社クレスト Electric measuring device
JP4734706B2 (en) * 2000-11-01 2011-07-27 Ｊｓｒ株式会社 Electrical resistance measuring connector, circuit board electrical resistance measuring device and measuring method
JP2003232807A (en) * 2002-02-06 2003-08-22 Japan Electronic Materials Corp Laminated probe assembling apparatus, laminated probe assembling method, laminated probe and probe card
JP4195588B2 (en) * 2002-07-31 2008-12-10 株式会社日本マイクロニクス Contactor manufacturing method and contactor
WO2004086062A1 (en) * 2003-03-26 2004-10-07 Jsr Corporation Connecteur de mesure de resistances electriques, dispositif de connecteur de mesure de resistances electriques et leur procede de fabrication, dispositif de mesure de la resistance electrique de circuits substrats, et methode de mesure
CN1299342C (en) * 2003-06-09 2007-02-07 矽统科技股份有限公司 Test carrier plate
US7173442B2 (en) * 2003-08-25 2007-02-06 Delaware Capital Formation, Inc. Integrated printed circuit board and test contactor for high speed semiconductor testing
JP4396429B2 (en) * 2004-07-16 2010-01-13 Ｊｓｒ株式会社 Circuit board inspection apparatus and circuit board inspection method
US7397255B2 (en) * 2005-06-22 2008-07-08 Paricon Technology Corporation Micro Kelvin probes and micro Kelvin probe methodology
JP5033634B2 (en) * 2005-10-31 2012-09-26 株式会社日本マイクロニクス Electrical connection device
CN2874503Y (en) * 2005-12-30 2007-02-28 鸿富锦精密工业（深圳）有限公司 Chip detection circuit board
CN101059550A (en) * 2006-01-17 2007-10-24 约翰国际有限公司 Test contact system for testing integrated circuits with packages having an array of signal and power contacts
JP4574588B2 (en) * 2006-04-19 2010-11-04 ルネサスエレクトロニクス株式会社 Kelvin contact measuring device and measuring method

Also Published As

Publication number Publication date
JP2013541006A (en) 2013-11-07
SG188185A1 (en) 2013-04-30
TWI497084B (en) 2015-08-21
KR20130124451A (en) 2013-11-14
EP2622691A1 (en) 2013-08-07
WO2011141582A1 (en) 2011-11-17
TW201231978A (en) 2012-08-01
CN103026555A (en) 2013-04-03

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