CN103026555A - Electrical contact and testing platform - Google Patents

Abstract

According to the present invention there is provided an electrical contact comprising three or more blades to facilitate establishing an electrical connection between at least two of said three or more blades through the electrical contact of a component. There is also provided a test platform adapted to receive an electrical component to be tested, wherein the test platform comprises one or more of the aforementioned electrical contacts. There is also provided a testing machine component comprising a retainer member comprising any of the aforementioned electrical contacts, wherein the testing machine component is configured such that it can cooperate with the testing machine.

Description

Electrical Contacts and Test Platforms

technical field

The present invention relates to electrical contacts and test platforms, particularly but not exclusively to electrical contacts and test platforms for testing electrical components.

Background technique

Existing methods of testing electrical components involve positioning the component to be tested on a test platform. The test platform includes electrical contacts for powering the electrical components. Once powered, the performance of the electrical components is monitored. Based on the performance of the electrical component, it may be determined whether the electrical component is faulty.

To ensure successful testing of electrical components, it is required that the electrical contacts of the component be electrically connected to the electrical contacts on the test platform. The electrical component must therefore be positioned in a very specific predefined position with a specific predefined orientation. Positioning electrical components in such a specific predefined position on a test platform in said specific predefined orientation is very difficult to achieve, especially in an industrial environment where testing operations are performed at high speed and there are many moving machine parts . Locating electrical components is made more difficult due to physical variations between electrical components, such as may occur due to tooling offset during manufacturing stages.

FIGS. 1 a - f illustrate how difficult it can be to achieve the specific positioning of the electrical component 7 required to ensure electrical connection of the electrical contacts of the electrical component 7 with the electrical contacts on the test platform 1 . The test platform 1 shown in Fig. 1 comprises six electrical Kelvin (Kelvin) contacts 3a-3f. Each electrical Kelvin contact 3a-3f includes an "I" blade 5a and an opposing "L" blade 5b. During testing of the electrical component 7, the "I" blade 5a forms a signal supply terminal and the opposite "L" blade 5b forms a signal sensing terminal (or vice versa).

The electrical component 7 to be tested comprises six electrical contacts in the form of pins 9a-f. In order to enable testing of the electrical component 7, the electrical component 7 must be positioned on the platform 1 such that each pin 9a-f establishes the "I" blade 5a and Electrical connection between opposing "L" blades 5b. During testing of the electrical component 7, at each electrical contact 3a-3f, a test signal is transmitted by the "I" blade 5a (i.e. the blade forming the signal supply terminal), through the pin 9a-f, and is transmitted to the opposite In the "L" blade 5b (ie the blade forming the signal sensing terminal). At each signal sensing terminal, a test signal is sensed to determine whether the pins 9a-f transmit and/or change the test signal as expected. The performance of the electrical component 7 at each of said six pins 9a-f can thus be determined.

Figure 1(a) shows the electrical component 7 when in the specific predefined position and orientation required for testing. In this position, each pin 9a-f establishes an electrical connection between the "I" blade 5a and the opposing "L" blade 5b in each respective electrical contact 3a-3f on the test platform 1 . In this position, the electrical component 7 can be tested as previously described.

Figure 1(b) shows the electrical component 7 displaced in a first direction along the Y-axis. In this position, each of said pins 9a-f fails to establish an electrical connection between the "I" blade 5a and the opposite "L" blade 5b in each electrical contact 3a-3f on the test platform 1 . Thus, the electrical component 7 cannot be tested.

Figure 1(c) shows the electrical component 7 offset in the second direction along the Y-axis. In this position, the pins 9a-f fail to establish an electrical connection between the "I" blade 5a and the opposing "L" blade 5b in each respective electrical contact 3a-3f on the test platform 1 . Thus, the electrical component 7 cannot be tested.

Figure 1(d) shows the electrical component 7 displaced in a first direction along the X-axis. In this position, the pins 9a, 9b and 9c fail to establish an electrical connection between the "I" blade 5a and the opposing "L" blade 5b in the electrical contacts 3a, 3b and 3c on the test platform 1 . Thus, the electrical component 7 cannot be tested.

Fig. 1(e) shows the electrical component 7 displaced in a second direction along the X-axis. In this position, the pins 9c, 9d and 9f fail to establish an electrical connection between the "I" blade 5a and the opposing "L" blade 5b in the electrical contacts 3d, 3e and 3f on the test platform 1 . Thus, the electrical component 7 cannot be tested.

Figure 1(f) shows an electrical component 7 that is not positioned on the platform 1 in the correct orientation; the electrical component 7 is rotated relative to the platform 1 . In this position, the pins 9c and 9d fail to establish an electrical connection between the "I" blade 5a and the opposing "L" blade 5b in the electrical contacts 3c and 3d on the test platform 1 . Thus, the electrical component 7 cannot be tested.

Numerous measures have been taken to facilitate the establishment of an electrical connection between the blades 5 a , 5 b in the electrical contacts 3 a - f on the test platform 1 through the electrical contacts of the electrical component 7 . One such measure is illustrated in Figures 2(a)-2(f). Unlike the platform 1 illustrated in FIGS. 1(a)-1(f), the platform 10 illustrated in FIG. 2 includes six electrical contacts 30a-30f, wherein each electrical contact 30a-30f includes two parallel " 1" blades 50a, 50b. Each blade 50a, 50b has a longitudinal configuration and comprises a planar surface 51 parallel to a plane 52 of the chip 7 when the chip 7 is positioned on the platform 10 for testing.

The principles for testing the electrical components 7 are the same as those described for the platform 1 shown in FIG. 1 . Thus, it is required that the electrical component 7 to be tested is positioned such that each pin 9a-f establishes an electrical connection between said two "I" blades 50a, 50b in each respective electrical contact 30a-30f on the test platform 10. connect. During testing of the electrical component 7, at each electrical contact 30a-30f, a signal is passed from the first "I" blade 50a (which pushes the electrical signal) through the pins 9a-f and is transmitted by the second "I" " blade 50b measures (the second "I" blade 50b senses the electrical signal, or vice versa). The performance of the electrical component 7 at each of said six pins 9a-f can thus be determined.

FIG. 2( a ) shows the electrical component 7 when it is in an ideal test position on the platform 10 . In this position, each pin 9a - f establishes an electrical connection between two parallel "I" blades 50a, 50b in each respective electrical contact 30a - 30f on the test platform 10 . In this position, the electrical component 7 can be tested as previously described.

It is evident from Figures 2(d)-(f) that due to the configuration of the two "I" blades 50a, 50b in each electrical contact 30a-30f, the pins 9a-f of the electrical component 7 can successfully establish each The electrical connection between the two parallel "I" blades 50a, 50b in the electrical contacts 30a-30f, even when the electrical component 7 is offset along the X-axis (see Figures 2(d) and 2(e)) or relative to When the platform 10 rotates (see Fig. 2(f)). In particular, when the electrical component 7 is offset along the X-axis (see FIGS. 2(d) and 2(e)) or rotated relative to the platform 10 (see FIG. 2(f)), the two "I" blades 50a, Both the parallel configuration of 50b and the longitudinal configuration of each "I" blade 50a, 50b facilitate establishing an electrical connection between the two parallel "I" blades 50a, 50b in each electrical contact 30a-30f via pins 9a-f. The planar surface 51 of each blade 50a, 50b also facilitates the establishment of an electrical connection because the planar surface 51 increases the contact area available in each blade 50a, 50b that can be used to establish electrical contact with that blade 50a, 50b . Thus, even when the electrical component 7 deviates from the ideal test position, the electrical component 7 can still be tested.

However, even though the measures illustrated in FIGS. 2(a)-(f) facilitate the establishment of an electrical connection between the blades 5a, 5b of the electrical contacts 3a-f on the test platform 1 through the pins 9a-f of the electrical component 7, This measure is still not satisfactory, because when the electrical component 7 is offset along the Y axis, the pins 9a-f still fail to establish two parallel "I" blades 50a in each electrical contact 30a-30f , 50b between the electrical connection. Figures 2(b) and 2(c) illustrate the situation when the electrical component 7 is offset along the Y-axis.

Thus, providing an electrical contact 30a-f comprising two parallel "I" blades 50a, 50b, each comprising a planar surface, when the electrical component 7 is offset along the X-axis or rotated relative to the platform 10 , which is effective in facilitating the establishment of the electrical connections required for testing of the component 7 . However, such electrical contacts 30a-f do not facilitate the establishment of electrical contact between the blades 5a, 5b of the electrical contacts 3a-f on the test platform 1 via the pins 9a-f when the electrical component 7 is offset along the Y-axis. connect.

It is an object of the present invention to overcome or alleviate one or more of the aforementioned disadvantages.

Contents of the invention

According to one aspect of the present invention there is provided an electrical contact comprising three or more blades so as to facilitate establishing an electrical connection between at least two of said blades by electrical contact of the components.

According to another aspect of the present invention there is provided a test platform adapted to receive a component to be tested, wherein the test platform comprises one or more electrical contacts, each said electrical contact comprising three or more blades , thereby facilitating establishment of an electrical connection between at least two of the three or more blades by electrical contact of the components.

The electrical connection may be a Kelvin connection. For an electrical contact to form a Kelvin contact, the electrical contact of the part must electrically contact at least two of the three or more blades.

The component may be an electrical component.

The three or more blades may facilitate establishing an electrical connection between two or more of the blades through electrical contact of the components.

The electrical contact may be an electrical terminal of the component.

The three or more blades may extend longitudinally.

The three or more blades may be arranged in parallel.

Each of the three or more vanes may be an "I" vane.

At least some of the one or more electrical contacts may be arranged in the same orientation. Preferably, all of said one or more electrical contacts are arranged in the same orientation.

Each of the three or more blades may include a planar surface. The surface of the plane may be parallel to the plane of the electrical component to be tested when positioned on the test platform for testing. In use, the surface of the plane is parallel to the plane of the electrical component being tested.

The three or more vanes may be arranged to define two or more channels. Each of the two or more channels may be an isolation channel. The isolation trench may be configured to electrically isolate each of the three or more blades from each other. Some or all of the two or more channels may be isolated from each other. Each of the two or more channels may have a width between 0.1 μm-50 μm. Preferably, each of said two or more channels has a width of less than 30 μm. Most preferably, each of said two or more channels has a width of less than 20 μm.

The width of each of the three or more blades may be such that the combined width of two of the two or more isolation trenches plus the width of a single blade is less than the width of an electrical contact of the electrical component. Preferably, the width of each of the three or more blades is such that the combined width of two of the two or more isolation trenches plus the width of a single blade is smaller than the electrical The width of the electrical contacts of the part. The width of each of the three or more blades may be such that the combined width of one of the two or more isolation channels plus the width of two of the three or more blades is smaller than the electrical component The width of the electrical contacts. Preferably, the width of each of the three or more vanes is such that, after taking manufacturing tolerances into account, the combined width of one of the two or more isolation trenches plus the three or more Two of the plurality of blades have a width smaller than a width of an electrical contact of the electrical component. Each of the three or more blades may have a width of 200 μm or less. Preferably, each of the three or more blades has a width of 150 μm or less. More preferably, each of the three or more blades has a width of 100 μm or less.

Some or all of the blades may comprise conductive metal. Preferably some or all of the blades are metal coated. The metal can be a precious metal. Some or all of the blades may include gold, BeCu and/or BeNi. Some or all of the blades may be coated with gold. Some or all of the blades may be coated with BeCu or BeNi material, or any other material that exhibits a spring effect, electrical conductivity and wear resistance.

Some or all of the blades may include hardened tips. Preferably some or all of the vanes comprise tungsten. Most preferably the tips of some or all of the blades comprise tungsten.

The three or more blades may be fastened such that they are in a fixed position relative to each other. Preferably said three or more blades are fastened at the manufacturing stage so that they are in a fixed position relative to each other. The three or more blades may be molded or glued together.

The electrical contact may also include a retaining member that retains the three or more blades in a fixed position relative to each other.

According to another aspect of the present invention there is provided a test machine component comprising a retainer member comprising any of the aforementioned electrical contacts, wherein the test machine component is configured such that it can cooperate with the test machine .

The test machine component may include a plurality of electrical contacts.

The testing machine component may also comprise guide means facilitating cooperation of the testing machine component with the testing machine. For example, the guiding means may be a pin adapted to cooperate with a hole on the testing machine, or the guiding means may be a hole adapted to cooperate with a pin on the testing machine.

According to another aspect of the present invention there is provided a testing machine comprising an electrical contact according to any one of the aforementioned electrical contacts.

Description of drawings

Embodiments of the invention will now be described, by way of example only, with reference to the accompanying drawings, in which:

Figures 1a-f: Difficulties in specific positioning of electrical components on prior art test platforms in order to achieve what is required to enable testing of electrical components;

Figures 2a-f illustrate a prior art test platform comprising electrical contacts configured to facilitate establishing electrical connections required for testing of electrical components;

Figure 3 provides a top view of a test platform according to the present invention comprising electrical contacts according to the present invention;

Figures 4a-f illustrate how an electrical contact according to the present invention facilitates establishing the electrical connections required for testing of electrical components; and

Figure 5a provides a top view of a testing machine component according to the invention and Figure 5b provides an enlarged view of the electrical contacts of the testing machine component shown in Figure 5a.

Detailed ways

FIG. 3 provides a top view of a test platform 100 according to the present invention. An electrical component to be tested in the form of a chip 29 is positioned on the bench 25 of the test platform 100 .

According to the invention, the test platform 100 comprises six electrical contacts 51 a - f each supported on a stand 25 . All six electrical contacts 51 a - f are arranged in the same orientation on the platform 25 . It will be understood that the test platform 100 is not limited to having six electrical contacts; the test platform 100 may have more or fewer electrical contacts. For example, test platform 100 may include 10 electrical contacts or 4 electrical contacts.

Each electrical contact 51a-f includes three blades 71a-c. The three blades 71a-c extend longitudinally across a portion of the width "g" of the ledge 25, and the three blades 71a-c of each electrical contact 51a-f are arranged in parallel. The three blades 71a-c may be fastened to the stand 25 at the manufacturing stage such that the blades 71a-c maintain a fixed position relative to each other.

The three blades 71a-c of each electrical contact 51a-f define two isolation channels 15a, 15b. The isolation trenches 15a, 15b are configured to electrically isolate each of said three blades 71a-c from each other. In this particular example, the isolation trenches 15a, 15b each have a width "c" of 10 μm. However, it will be understood that the isolation trenches 15a, 15b may have any other suitable dimensions.

The three blades 71 a - c of each electrical contact 51 a - f each include a planar surface 13 . The planar surface 13 of each blade 71a-c is parallel to the plane 17 of the chip 29 when the chip 29 is positioned on the test platform 100 for testing. In this particular example, each of the three vanes 71a-c has a width "w". The width "w" of each vane 71a-c is such that, after accounting for manufacturing tolerances, the combined width "c" of the isolation trenches 15a, 15b plus the width of two of the three or more vanes The width "w" is smaller than the width "e" of the pins 11a-f of the electrical component 29 (ie 2w+c<e). It will be appreciated that, alternatively, the width "w" of each of said three or more vanes may be such that, after taking manufacturing tolerances into account, the combined width of two of said isolation trenches 15a, 15b "c" plus the width "w" of the individual blades 71a-c is less than the width "e" of the pins 11a-f of the electrical component 29 (ie 2c+w<e). In this particular example, each of said three vanes 71a-c has a width "w" of 100 μm, so the planar surface 13 of each vane will have a width of 100 μm. It will be understood, however, that the blades 71a-c (and thus the planar surface 13) may have any other suitable dimensions. In this particular example, the width "e" of each electrical contact 11a-f of the electrical component 29 being tested is 300 μm.

In this particular example, each of the three vanes 71a-c is coated with gold, and the tip 19 of each vane 71a-c is provided with tungsten. Tungsten hardens the tip 19 of each blade 71a-c. It will be appreciated that the blades 71a-c may be coated with any other suitable metal or not coated at all, for example the blades 71a-c may be coated with any noble metal. The blades 71a-c may comprise BeNi or BeCu or any other conductive spring material.

The chip under test 29 comprises six electrical contacts in the form of pins 11a-f. It will be understood, however, that chip 29 may include any number of pins, and thus chip 29 may have more or less than 6 pins. In Figure 3, chip 29 is shown in an ideal position for testing. In an ideal position for testing, the chip 29 is perfectly square on the stage 25 of the platform 100, and each pin 11a-f is positioned symmetrically with respect to the corresponding electrical contact 51a-f. Each of the six pins 11a-f cooperates with a corresponding electrical contact 51a-f on the platform 25 to provide any two or all three of the three blades in each electrical contact 51a-f. Electrical connection between 71a-c.

For testing of the chip 29, it is required that the chip 29 be positioned on the stage 25 such that for each electrical contact 51a-f, the pin 11a-f of the chip 29 bridges at least one of the isolation trenches 15a, 15b, thereby providing the three electrical connection between at least two of the blades 71a-c. During testing of the chip 29, one of the two paddles 71a-c electrically connected by the pins 11a-f will serve as a signal supply terminal during testing, while the other of the two paddles 71a-c will serve as a signal sensing terminal. terminals, or vice versa. During testing of the chip 29, current is passed through the pins 11a-f from the paddles 71a-c that provide the signal supply terminal(s) and voltage is sensed or measured by the paddles 71a-c that form the signal sense terminal(s). . The performance of the chip 29 at each of the six pins 11a-f can be monitored, and thus the overall performance of the chip 29 can be determined.

As shown in FIG. 3, the pins 11a-11f are shown bridging both isolation trenches 15a, 15b such that each pin 11a-11f touches three blades 71a if and when the chip 29 is positioned in the desired position for testing. -c, thus electrically connecting each of said three blades 71a-c. Thus, in the special case in which the chip 29 is positioned in an ideal position for testing, any one or both of the three blades 71a-c may be selected to provide signal supply terminals during testing of the chip 29, and Any remaining blades 71a - c may be selected to provide signal sense terminals during testing of chip 29 .

The configuration of electrical contacts 51a-f illustrated in FIG. 3 facilitates establishing the electrical connections required for testing of chip 29, as illustrated in FIGS. 4(a)-(f). Figure 4(a) shows the chip 29 in the ideal test position (as previously described with reference to Figure 3). Similar to the electrical contacts 30a-f of the prior art test platform 10 depicted in FIGS. 2(a)-(f), the electrical contacts 51a-f of the test platform 100 depicted in FIGS. 4(a)-4(f) f facilitates the pins 11a-f of the chip 29 to successfully establish an electrical connection between two of the three blades 71a-c in each electrical contact 51a-f, even when the chip 29 is offset along the X-axis (see Figures 4(d) and 4(e)) or when rotating relative to the stage 25 (see Figure 4(f)). More specifically, each blade 71a-c is configured so that it is longitudinal; the blades 71a-c of the same electrical contact 51a-f are configured so that the blades 71a-c are parallel; and each blade 71a-c is configured so that it includes The planar surface 13 then each facilitates the pins 11a-f of the chip 29 to establish the required electrical connections. For example, providing a planar surface 13 facilitates the pins 11a-f of the chip 29 to make the required electrical connections because the planar surface 13 increases the available contact area that can be used to make electrical contact with the blades 71a-c. Similarly, the longitudinal configuration of each vane 71a-c increases the dimension of the vane 71a-c along the X-axis so that even when the chip 29 is displaced along the X-axis, the pins 11a-f of the chip 29 can still contact the vanes 71a-c. c. The parallel configuration of the blades 71a-c is advantageous because it enables the required electrical connection to be established even when the chip 29 is displaced along the X-axis.

Thus, even when the chip 29 is shifted from the ideal test position along the X-axis or rotated relative to the stage 25 so that it is no longer in the ideal test position, the chip 29 can still be tested.

Advantageously, as illustrated in Figures 4b-c, the configuration of the electrical contacts 51a-f further facilitates that when the chip 29 is offset along the Y-axis, the pins 11a-f of the chip 29 establish Electrical connection between two of the three blades 71a-c. More specifically, configuring the electrical contacts 51a-f to include a third blade facilitates the pins 11a-f of the chip 29 to establish said three blades in each of the electrical contacts 51a-f when the chip 29 is offset along the Y-axis. An electrical connection between two of the blades 71a-c.

As shown in FIG. 4( b ), the chip to be tested 29 is shifted in a first direction (to the right) along the Y axis. The provision of the third blades 71a-c ensures that when the chip 29 is offset to the right along the Y-axis, the pins 11a-f of the chip 29 can still establish an electrical connection between the blades 71b and 71c of each electrical contact 5a-f. Thus, paddle 71b may be used to provide signal supply terminals during testing of chip 29 and paddle 71c may be used to provide signal sensing terminals during testing of chip 29, or vice versa. Thus, successful testing of the chip 29 can be performed despite the fact that the chip 29 has been displaced along the Y-axis from the ideal test position. As shown in FIG. 4( c ), the chip to be tested 29 is shifted in the second direction (leftward) along the Y axis. The provision of the third blades 71a-c ensures that when the chip 29 under test is shifted to the left along the Y-axis, the pins 11a-f of the chip 29 can establish an electrical connection between the blades 71a and 71b of each electrical contact 51a-c , so that the paddle 71a can be used to provide a signal supply terminal during testing of the chip 29, and the paddle 71b can provide a signal sensing terminal during testing of the chip 29, or vice versa. Successful testing of the chip 29 can thus be performed even when the chip 29 is shifted to the left along the Y-axis from its ideal test position. Thus, configuring the electrical contacts 51a-c such that they include three or more blades ensures that the chip 29 can still be tested even when it has been offset along the Y-axis, the X-axis or relative to the stage 25 or platform 100 rotate.

Figure 5a provides a top view of a testing machine component 110 according to the present invention. The testing machine component 110 includes a holder member 101 that holds the three electrical contacts 103a-c in a fixed position relative to each other. Figure 5b provides an enlarged view of the electrical contacts 103a-c. Each of said three electrical contacts 103a-c is connected to the holder member 101 by a root member 109a-i. Optionally, the three electrical contacts 103a-c may be integrated into the holder member 101 . Each of said root members 109a-i tapers from the holder member 101 to form a blade 107a-c. Each of the three electrical contacts 103a-c includes three blades 107a-c. Each blade 107a-c has a longitudinal "I" configuration and each of the three blades 107a-c is parallel. In addition, each of said three blades 107a-c comprises a planar surface 8 .

One or more of the test machine components 110 may be connected to a test machine (not shown) to define a platform on the test machine, similar to the platform 100 depicted in FIG. 3 . The holder member 101 also comprises guide means in the form of holes 105a-d. The holes 105a-d provide convenience to the user when aligning the test machine component 110 to the test machine. For example, when connecting the testing machine component 110 to the testing machine, each hole 105a-d may receive a pin or screw on the testing machine to guide and secure the retainer member 101 towards the correct position on the testing machine.

Various modifications and changes to the described embodiments of the invention will be apparent to those skilled in the art without departing from the scope of the invention as defined in the appended claims. Although the invention has been described in connection with specific preferred embodiments, it should be understood that the invention as claimed should not be unduly limited to such specific embodiments.

Claims (15)

CLAIMS 1. An electrical contact comprising three or more blades to facilitate establishing an electrical connection between at least two of said three or more blades through the electrical contact of a component. 2. The electrical contact of claim 1, wherein the three or more blades extend longitudinally. 3. An electrical contact according to claim 1 or 2, wherein said three or more blades are arranged in parallel. 4. An electrical contact according to any preceding claim, wherein some or all of the three or more blades comprise planar surfaces. 5. An electrical contact according to claim 4, wherein the planar surface is configured such that it is parallel to the plane of an electrical component operable in cooperation with the electrical contact. 6. An electrical contact according to any preceding claim, wherein said three or more blades are arranged to define two or more isolation channels, said channels being configured such that each of said three or Further blades are electrically isolated from each other. 7. The electrical contact of claim 6, wherein the width of each of said three or more blades is such that the combined width of two of said two or more isolation channels adds the width of a single blade Less than the width of an electrical contact of an electrical component. 8. An electrical contact according to any preceding claim, wherein some or all of the blades may comprise at least one of gold, noble metal, BeNi or BeCu. 9. An electrical contact according to any preceding claim, wherein some or all of the blades comprise tungsten. 10. An electrical contact according to any preceding claim, wherein the electrical contact further comprises a retaining member which retains the three or more blades in a fixed position relative to each other. 11. A test platform adapted to receive an electrical component to be tested, wherein the test platform comprises one or more electrical contacts according to any one of claims 1-10. 12. The test platform of claim 11, wherein at least some of the one or more electrical contacts are arranged in the same orientation. 13. A test machine component comprising a retainer member comprising at least one of any one of the electrical contacts according to any one of claims 1-10, wherein the test machine component is configured such that it can be connected to the Test machine collaboration. 14. A testing machine component according to claim 13, wherein the testing machine comprises a plurality of electrical contacts according to any one of claims 1-10. 15. A testing machine component according to claim 13 or 14, further comprising guide means configured to facilitate cooperation of the testing machine component with the testing machine.

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