NL191525C - Halfgeleiderinrichting omvattende een stroomkanaalgebied van een eerste geleidingstype dat wordt omsloten door een van een stuurelektrode voorzien stuurgebied van het tweede geleidingstype. - Google Patents
Halfgeleiderinrichting omvattende een stroomkanaalgebied van een eerste geleidingstype dat wordt omsloten door een van een stuurelektrode voorzien stuurgebied van het tweede geleidingstype.Info
- Publication number
- NL191525C NL191525C NL7801082A NL7801082A NL191525C NL 191525 C NL191525 C NL 191525C NL 7801082 A NL7801082 A NL 7801082A NL 7801082 A NL7801082 A NL 7801082A NL 191525 C NL191525 C NL 191525C
- Authority
- NL
- Netherlands
- Prior art keywords
- conductivity type
- control
- semiconductor device
- current conduction
- control electrode
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/76—Making of isolation regions between components
- H01L21/762—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers
- H01L21/76224—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using trench refilling with dielectric materials
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/76—Making of isolation regions between components
- H01L21/762—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers
- H01L21/76224—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using trench refilling with dielectric materials
- H01L21/76232—Dielectric regions, e.g. EPIC dielectric isolation, LOCOS; Trench refilling techniques, SOI technology, use of channel stoppers using trench refilling with dielectric materials of trenches having a shape other than rectangular or V-shape, e.g. rounded corners, oblique or rounded trench walls
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/76—Making of isolation regions between components
- H01L21/763—Polycrystalline semiconductor regions
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D12/00—Bipolar devices controlled by the field effect, e.g. insulated-gate bipolar transistors [IGBT]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/40—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00 with at least one component covered by groups H10D10/00 or H10D18/00, e.g. integration of IGFETs with BJTs
- H10D84/401—Combinations of FETs or IGBTs with BJTs
- H10D84/403—Combinations of FETs or IGBTs with BJTs and with one or more of diodes, resistors or capacitors
- H10D84/406—Combinations of FETs or IGBTs with vertical BJTs and with one or more of diodes, resistors or capacitors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/40—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00 with at least one component covered by groups H10D10/00 or H10D18/00, e.g. integration of IGFETs with BJTs
- H10D84/401—Combinations of FETs or IGBTs with BJTs
- H10D84/403—Combinations of FETs or IGBTs with BJTs and with one or more of diodes, resistors or capacitors
- H10D84/409—Combinations of FETs or IGBTs with lateral BJTs and with one or more of diodes, resistors or capacitors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D89/00—Aspects of integrated devices not covered by groups H10D84/00 - H10D88/00
- H10D89/211—Design considerations for internal polarisation
- H10D89/213—Design considerations for internal polarisation in field-effect devices
- H10D89/217—Design considerations for internal polarisation in field-effect devices comprising arrangements for charge injection in static induction transistor logic [SITL] devices
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Junction Field-Effect Transistors (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
NL9402176A NL9402176A (nl) | 1977-02-02 | 1994-12-21 | Halfgeleiderinrichting. |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1046077A JPS5396681A (en) | 1977-02-02 | 1977-02-02 | Semiconductor ic |
JP52015880A JPS5853517B2 (ja) | 1977-02-15 | 1977-02-15 | 半導体集積回路 |
JP1732777A JPS53102661A (en) | 1977-02-18 | 1977-02-18 | Semiconductor ic |
JP52019466A JPS5924549B2 (ja) | 1977-02-24 | 1977-02-24 | 半導体論理集積回路 |
Publications (3)
Publication Number | Publication Date |
---|---|
NL7801082A NL7801082A (nl) | 1978-08-04 |
NL191525B NL191525B (nl) | 1995-04-18 |
NL191525C true NL191525C (nl) | 1995-08-21 |
Family
ID=27455395
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
NL7801082A NL191525C (nl) | 1977-02-02 | 1978-01-31 | Halfgeleiderinrichting omvattende een stroomkanaalgebied van een eerste geleidingstype dat wordt omsloten door een van een stuurelektrode voorzien stuurgebied van het tweede geleidingstype. |
Country Status (5)
Country | Link |
---|---|
US (1) | US4608582A (nl) |
DE (1) | DE2804500C2 (nl) |
FR (1) | FR2379913A1 (nl) |
GB (1) | GB1600825A (nl) |
NL (1) | NL191525C (nl) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE2820913A1 (de) * | 1977-05-15 | 1978-11-23 | Zaidan Hojin Handotai Kenkyu | Integrierte halbleitervorrichtung |
FR2480505A1 (fr) * | 1980-04-14 | 1981-10-16 | Thomson Csf | Transistor a effet de champ a jonction de puissance a fonctionnement vertical et procede de fabrication |
JPS59119848A (ja) * | 1982-12-27 | 1984-07-11 | Fujitsu Ltd | 半導体装置の製造方法 |
IT1213171B (it) * | 1984-05-21 | 1989-12-14 | Ates Componenti Elettron | Transistore bipolare di potenza. |
JP2578600B2 (ja) * | 1987-04-28 | 1997-02-05 | オリンパス光学工業株式会社 | 半導体装置 |
US5066603A (en) * | 1989-09-06 | 1991-11-19 | Gte Laboratories Incorporated | Method of manufacturing static induction transistors |
US5126830A (en) * | 1989-10-31 | 1992-06-30 | General Electric Company | Cryogenic semiconductor power devices |
US5283428A (en) * | 1990-11-27 | 1994-02-01 | Canon Kabushiki Kaisha | Photoelectric converting device and information processing apparatus employing the same |
JP2689057B2 (ja) * | 1992-09-16 | 1997-12-10 | 本田技研工業株式会社 | 静電誘導型半導体装置 |
DE4423619A1 (de) | 1994-07-06 | 1996-01-11 | Bosch Gmbh Robert | Laterale Halbleiterstruktur zur Bildung einer temperaturkompensierten Spannungsbegrenzung |
FR2969815B1 (fr) * | 2010-12-27 | 2013-11-22 | Soitec Silicon On Insulator Tech | Procédé de fabrication d'un dispositif semi-conducteur |
CN111505087A (zh) * | 2014-12-18 | 2020-08-07 | 生命科技公司 | 使用大规模 fet 阵列测量分析物的方法和装置 |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US29971A (en) * | 1860-09-11 | Cotton-cleaner | ||
US3409812A (en) * | 1965-11-12 | 1968-11-05 | Hughes Aircraft Co | Space-charge-limited current triode device |
JPS526076B1 (nl) * | 1971-04-28 | 1977-02-18 | ||
JPS5217720B1 (nl) * | 1971-07-31 | 1977-05-17 | ||
US3808515A (en) * | 1972-11-03 | 1974-04-30 | Bell Telephone Labor Inc | Chopper devices and circuits |
JPS5811102B2 (ja) | 1975-12-09 | 1983-03-01 | ザイダンホウジン ハンドウタイケンキユウシンコウカイ | 半導体集積回路 |
JPS608628B2 (ja) | 1976-07-05 | 1985-03-04 | ヤマハ株式会社 | 半導体集積回路装置 |
US4115797A (en) * | 1976-10-04 | 1978-09-19 | Fairchild Camera And Instrument Corporation | Integrated injection logic with heavily doped injector base self-aligned with injector emitter and collector |
-
1978
- 1978-01-31 NL NL7801082A patent/NL191525C/nl not_active IP Right Cessation
- 1978-02-01 GB GB4100/78A patent/GB1600825A/en not_active Expired
- 1978-02-02 DE DE2804500A patent/DE2804500C2/de not_active Expired - Lifetime
- 1978-02-02 FR FR7802938A patent/FR2379913A1/fr active Granted
-
1983
- 1983-07-20 US US06/515,462 patent/US4608582A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
NL7801082A (nl) | 1978-08-04 |
FR2379913A1 (fr) | 1978-09-01 |
US4608582A (en) | 1986-08-26 |
DE2804500A1 (de) | 1978-08-03 |
NL191525B (nl) | 1995-04-18 |
GB1600825A (en) | 1981-10-21 |
FR2379913B1 (nl) | 1985-02-01 |
DE2804500C2 (de) | 1994-02-10 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
BB | A search report has been drawn up | ||
BC | A request for examination has been filed | ||
A85 | Still pending on 85-01-01 | ||
V4 | Discontinued because of reaching the maximum lifetime of a patent |
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