[go: up one dir, main page]

NL187374C - Inrichting voor het detecteren van straling. - Google Patents

Inrichting voor het detecteren van straling.

Info

Publication number
NL187374C
NL187374C NLAANVRAGE8103304,A NL8103304A NL187374C NL 187374 C NL187374 C NL 187374C NL 8103304 A NL8103304 A NL 8103304A NL 187374 C NL187374 C NL 187374C
Authority
NL
Netherlands
Prior art keywords
detecting radiation
radiation
detecting
Prior art date
Application number
NLAANVRAGE8103304,A
Other languages
English (en)
Dutch (nl)
Other versions
NL187374B (nl
NL8103304A (nl
Inventor
Arthur Marie Eugen Hoeberechts
Gerard Eduard Van Rosmalen
Original Assignee
Philips Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Nv filed Critical Philips Nv
Priority to NLAANVRAGE8103304,A priority Critical patent/NL187374C/xx
Priority to US06/358,542 priority patent/US4469945A/en
Priority to GB08219175A priority patent/GB2102201B/en
Priority to FR8211751A priority patent/FR2509531A1/fr
Priority to IE1637/82A priority patent/IE53710B1/en
Priority to IT22292/82A priority patent/IT1151909B/it
Priority to AU85690/82A priority patent/AU549417B2/en
Priority to DE19823225372 priority patent/DE3225372A1/de
Priority to ES513803A priority patent/ES513803A0/es
Priority to JP57117885A priority patent/JPS5817665A/ja
Priority to CA000406926A priority patent/CA1194195A/en
Publication of NL8103304A publication Critical patent/NL8103304A/nl
Publication of NL187374B publication Critical patent/NL187374B/xx
Application granted granted Critical
Publication of NL187374C publication Critical patent/NL187374C/xx

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04W—WIRELESS COMMUNICATION NETWORKS
    • H04W64/00—Locating users or terminals or network equipment for network management purposes, e.g. mobility management
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10—Integrated devices
    • H10F39/12—Image sensors
    • H10F39/18—Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00—Constructional details of devices covered by this subclass
    • H10F77/10—Semiconductor bodies
    • H10F77/14—Shape of semiconductor bodies; Shapes, relative sizes or dispositions of semiconductor regions within semiconductor bodies
    • H10F77/148—Shapes of potential barriers
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00—Constructional details of devices covered by this subclass
    • H10F77/95—Circuit arrangements
    • H10F77/953—Circuit arrangements for devices having potential barriers
    • H10F77/957—Circuit arrangements for devices having potential barriers for position-sensitive photodetectors, e.g. lateral-effect photodiodes or quadrant photodiodes
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04W—WIRELESS COMMUNICATION NETWORKS
    • H04W36/00—Hand-off or reselection arrangements
    • H04W36/04—Reselecting a cell layer in multi-layered cells
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00—Energy generation through renewable energy sources
    • Y02E10/50—Photovoltaic [PV] energy

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Measurement Of Radiation (AREA)
  • Light Receiving Elements (AREA)
  • Automatic Focus Adjustment (AREA)
  • Solid State Image Pick-Up Elements (AREA)
NLAANVRAGE8103304,A 1981-07-10 1981-07-10 Inrichting voor het detecteren van straling. NL187374C (nl)

Priority Applications (11)

Application Number Priority Date Filing Date Title
NLAANVRAGE8103304,A NL187374C (nl) 1981-07-10 1981-07-10 Inrichting voor het detecteren van straling.
US06/358,542 US4469945A (en) 1981-07-10 1982-03-15 Device for detecting radiation and semiconductor device for use in such a device
GB08219175A GB2102201B (en) 1981-07-10 1982-07-02 Radiation detection apparatus
FR8211751A FR2509531A1 (fr) 1981-07-10 1982-07-05 Dispositif permettant de detecter un rayonnement et dispositif semi-conducteur a appliquer a un tel dispositif
IT22292/82A IT1151909B (it) 1981-07-10 1982-07-07 Dispositivo per la rivelazione di radiazioni e dispositivo semiconduttore per l'impiego in tale dispositivo
AU85690/82A AU549417B2 (en) 1981-07-10 1982-07-07 Device for detecting radiation
IE1637/82A IE53710B1 (en) 1981-07-10 1982-07-07 Radiation detection apparatus
DE19823225372 DE3225372A1 (de) 1981-07-10 1982-07-07 Vorrichtung zum detektieren von strahlung und halbleiteranordnung zur anwendung in einer derartigen vorrichtung
ES513803A ES513803A0 (es) 1981-07-10 1982-07-08 "un dispositivo para detectar radiacion".
JP57117885A JPS5817665A (ja) 1981-07-10 1982-07-08 放射線検出装置
CA000406926A CA1194195A (en) 1981-07-10 1982-07-08 Device for detecting radiation and semiconductor device for use in such a device

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
NL8103304 1981-07-10
NLAANVRAGE8103304,A NL187374C (nl) 1981-07-10 1981-07-10 Inrichting voor het detecteren van straling.

Publications (3)

Publication Number Publication Date
NL8103304A NL8103304A (nl) 1983-02-01
NL187374B NL187374B (nl) 1991-04-02
NL187374C true NL187374C (nl) 1991-09-02

Family

ID=19837773

Family Applications (1)

Application Number Title Priority Date Filing Date
NLAANVRAGE8103304,A NL187374C (nl) 1981-07-10 1981-07-10 Inrichting voor het detecteren van straling.

Country Status (11)

Country Link
US (1) US4469945A (xx)
JP (1) JPS5817665A (xx)
AU (1) AU549417B2 (xx)
CA (1) CA1194195A (xx)
DE (1) DE3225372A1 (xx)
ES (1) ES513803A0 (xx)
FR (1) FR2509531A1 (xx)
GB (1) GB2102201B (xx)
IE (1) IE53710B1 (xx)
IT (1) IT1151909B (xx)
NL (1) NL187374C (xx)

Families Citing this family (50)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60145563A (ja) * 1984-01-05 1985-08-01 Matsushita Electric Ind Co Ltd ビデオデイスクプレ−ヤ
JPS60185230A (ja) * 1984-03-02 1985-09-20 Pioneer Electronic Corp 焦点誤差検出装置
WO1986003058A1 (en) * 1984-11-13 1986-05-22 Eastman Kodak Company A solid state light sensing device
KR870001302B1 (ko) * 1984-11-20 1987-07-11 대우중공업 주식회사 CO_2레이저 빔 프로파일(Laser Beam Profile) 측정장치
NL8501489A (nl) * 1985-05-24 1986-12-16 Philips Nv Positie-gevoelige stralingsdetector.
US4703168A (en) * 1985-07-22 1987-10-27 Princeton Applied Research Corporation Multiplexed wedge anode detector
NL8601719A (nl) * 1986-07-02 1988-02-01 Philips Nv Electronisch instelbare positiegevoelige stralingsdetector, focusfoutdetectiestelsel voorzien van een dergelijke stralingsdetector, en optische lees- en/of schrijfinrichting voorzien van een dergelijk focusfoutdetectiestelsel.
US4871914A (en) * 1987-05-05 1989-10-03 Sun Nuclear Corporation Low-cost radon detector
US5479018A (en) * 1989-05-08 1995-12-26 Westinghouse Electric Corp. Back surface illuminated infrared detector
NL8901400A (nl) * 1989-06-02 1991-01-02 Philips Nv Halfgeleiderinrichting met een stralingsgevoelig element.
IL96623A0 (en) * 1989-12-26 1991-09-16 Gen Electric Low capacitance,large area semiconductor photodetector and photodetector system
US5475618A (en) * 1993-01-28 1995-12-12 Advanced Micro Devices Apparatus and method for monitoring and controlling an ion implant device
US6046454A (en) * 1995-10-13 2000-04-04 Digirad Corporation Semiconductor radiation detector with enhanced charge collection
US5834628A (en) * 1995-11-09 1998-11-10 Consultec Scientific, Inc. Activity weighted particle size distribution system
DE102006013461B3 (de) * 2006-03-23 2007-11-15 Prüftechnik Dieter Busch AG Photodetektoranordnung, Messanordnung mit einer Photodetektoranordnung und Verfahren zum Betrieb einer Messanordnung
DE102006013460B3 (de) * 2006-03-23 2007-11-08 Prüftechnik Dieter Busch AG Photodetektoranordnung, Messanordnung mit einer Photodetektoranordnung und Verfahren zum Betrieb einer Messanordnung
US8143584B2 (en) * 2008-02-04 2012-03-27 Radon Technologies, Inc. Radon monitor
EP3029485B1 (en) 2011-02-15 2019-12-11 Basf Se Detector for optically detecting at least one object
US9001029B2 (en) 2011-02-15 2015-04-07 Basf Se Detector for optically detecting at least one object
US9040929B2 (en) 2012-07-30 2015-05-26 International Business Machines Corporation Charge sensors using inverted lateral bipolar junction transistors
JP6415447B2 (ja) 2012-12-19 2018-10-31 ビーエーエスエフ ソシエタス・ヨーロピアＢａｓｆ Ｓｅ １つ以上の物体を光学的に検出するための検出器
US9741954B2 (en) 2013-06-13 2017-08-22 Basf Se Optical detector and method for manufacturing the same
CN105452894B (zh) 2013-06-13 2019-04-30 巴斯夫欧洲公司 用于光学地检测至少一个对象的检测器
EP3008421A1 (en) 2013-06-13 2016-04-20 Basf Se Detector for optically detecting an orientation of at least one object
CN105637382B (zh) 2013-08-19 2017-08-25 巴斯夫欧洲公司 用于确定至少一种物体的位置的检测器
JP6403776B2 (ja) 2013-08-19 2018-10-10 ビーエーエスエフ ソシエタス・ヨーロピアＢａｓｆ Ｓｅ 光学検出器
KR102397527B1 (ko) 2014-07-08 2022-05-13 바스프 에스이 하나 이상의 물체의 위치를 결정하기 위한 검출기
KR102452393B1 (ko) 2014-09-29 2022-10-11 바스프 에스이 적어도 하나의 물체의 포지션을 광학적으로 결정하기 위한 방법 및 검출기 및 이를 이용한 휴먼 머신 인터페이스, 엔터테인먼트 장치, 추적 시스템, 스캐닝 시스템, 입체 시스템 및 카메라
KR102497704B1 (ko) 2014-12-09 2023-02-09 바스프 에스이 광 검출기
EP3251152B1 (en) 2015-01-30 2023-08-16 Trinamix GmbH Detector for an optical detection of at least one object
WO2016146725A1 (en) 2015-03-17 2016-09-22 Basf Se Optical data reader
EP3325917B1 (en) 2015-07-17 2020-02-26 trinamiX GmbH Detector for optically detecting at least one object
CN108141579B (zh) 2015-09-14 2020-06-12 特里纳米克斯股份有限公司 3d相机
JP2019502905A (ja) 2015-11-25 2019-01-31 トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング 少なくとも１個の物体を光学的に検出する検出器
WO2017089553A1 (en) 2015-11-25 2017-06-01 Trinamix Gmbh Detector for optically detecting at least one object
EP3440707A1 (en) 2016-04-06 2019-02-13 trinamiX GmbH Detector for optically detecting at least one object
US20210223395A1 (en) 2016-04-28 2021-07-22 Trinamix Gmbh Detector for optically detecting at least one object
JP2019515288A (ja) 2016-04-28 2019-06-06 トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング 少なくとも１個の対象物を光学的に検出するための検出器
KR102492134B1 (ko) 2016-07-29 2023-01-27 트리나미엑스 게엠베하 광학 센서 및 광학적 검출용 검출기
JP2019532517A (ja) 2016-10-25 2019-11-07 トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング 光学的に検出するための光検出器
CN109891265B (zh) 2016-10-25 2023-12-01 特里纳米克斯股份有限公司 用于光学检测至少一个对象的检测器
CN109964144B (zh) 2016-11-17 2023-07-18 特里纳米克斯股份有限公司 用于光学探测至少一个对象的检测器
US11860292B2 (en) 2016-11-17 2024-01-02 Trinamix Gmbh Detector and methods for authenticating at least one object
WO2018096083A1 (en) 2016-11-25 2018-05-31 Trinamix Gmbh Optical detector comprising at least one optical waveguide
WO2018167215A1 (en) 2017-03-16 2018-09-20 Trinamix Gmbh Detector for optically detecting at least one object
WO2018193045A1 (en) 2017-04-20 2018-10-25 Trinamix Gmbh Optical detector
CN110998223B (zh) 2017-06-26 2021-10-29 特里纳米克斯股份有限公司 用于确定至少一个对像的位置的检测器
WO2019011803A1 (en) 2017-07-10 2019-01-17 Trinamix Gmbh DETECTOR FOR OPTICALLY DETECTING AT LEAST ONE OBJECT
WO2019042956A1 (en) 2017-08-28 2019-03-07 Trinamix Gmbh DETECTOR FOR DETERMINING A POSITION OF AT LEAST ONE OBJECT
EP3676630B1 (en) 2017-08-28 2022-11-30 trinamiX GmbH Range finder for determining at least one geometric information

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2271590B1 (xx) * 1974-01-15 1978-12-01 Thomson Brandt
NL7803969A (nl) * 1978-04-14 1979-10-16 Philips Nv Opto-elektronisch fokusfout-detektiestelsel.
JPS54162989A (en) * 1978-06-15 1979-12-25 Sony Corp Solid-state pickup unit
US4228354A (en) * 1979-07-13 1980-10-14 Ari Lehto Method for detecting radiation
DE2939518A1 (de) * 1979-09-28 1981-04-16 Siemens AG, 1000 Berlin und 8000 München Monolithisch integrierte schaltung zur zeilenweisen bildabtastung
US4360732A (en) * 1980-06-16 1982-11-23 Texas Instruments Incorporated Infrared charge transfer device (CTD) system

Also Published As

Publication number Publication date
GB2102201B (en) 1985-03-06
AU549417B2 (en) 1986-01-23
IT8222292A0 (it) 1982-07-07
NL187374B (nl) 1991-04-02
IE53710B1 (en) 1989-01-18
FR2509531A1 (fr) 1983-01-14
DE3225372A1 (de) 1983-02-17
ES8308451A1 (es) 1983-08-16
NL8103304A (nl) 1983-02-01
CA1194195A (en) 1985-09-24
GB2102201A (en) 1983-01-26
FR2509531B1 (xx) 1985-05-17
IE821637L (en) 1983-01-10
AU8569082A (en) 1983-01-13
DE3225372C2 (xx) 1991-12-19
IT1151909B (it) 1986-12-24
US4469945A (en) 1984-09-04
ES513803A0 (es) 1983-08-16
JPH037148B2 (xx) 1991-01-31
JPS5817665A (ja) 1983-02-01

Similar Documents

Publication Publication Date Title
NL187374C (nl) Inrichting voor het detecteren van straling.
NL188792C (nl) Inrichting voor het verbinden van banen.
NL187504C (nl) Inrichting voor het weergeven van golfvormen.
NL7804033A (nl) Inrichting voor het verwerken van informatie.
NL7901615A (nl) Inrichting voor het waarnemen van de aanwezigheid van een voorwerp langs een lijn.
NL190883C (nl) Inrichting voor het vormen van thermische beelden.
NL191888C (nl) Inrichting voor het transporteren van verhit matriaal.
NL174988C (nl) Inrichting voor het detecteren van geioniseerde stoffen.
NL181338C (nl) Controle-inrichting voor het onderzoeken van brieven.
NL188918C (nl) Inrichting voor het detecteren van de kleurtemperatuur.
NL190983C (nl) Inrichting voor het aanhechten van labelpennen.
NL7801796A (nl) Inrichting voor het behandelen van vloeistoffen.
NL190463B (nl) Inrichting voor het detecteren van multifrequente signalen.
NL189784C (nl) Inrichting voor het afgeven van verschillende waardebonnen.
NL186492C (nl) Inrichting voor het afdichtend bevestigen van scheidingsvellen.
NL181050C (nl) Buisconstructie geschikt voor het detecteren van eventuele scheuren.
NL193780B (nl) Inrichting voor het detecteren van ultraviolette straling.
NL7807411A (nl) Inrichting voor het aansluiten van pijpen.
NL7900929A (nl) Inrichting voor het bepalen van de vertikale richting.
NL7810728A (nl) Voeler voor remstelsel en werkwijze voor het bedrijf daarvan.
BE893972A (fr) Werkwijze en inrichting voor het contactvrij meten van een draaimoment
BE891890A (nl) Inrichting voor het behandelen van gebitselementen
NL185032B (nl) Inrichting voor het dragen van bommen.
BE887715A (fr) Lijst, meer bepaald wissellijst en bevestigingsblokje voor het samenstellen van deze lijst.
NL7810852A (nl) Inrichting voor het bevestigen van plaatvormige delen.

Legal Events

Date Code Title Description
A1B A search report has been drawn up
A85 Still pending on 85-01-01
BC A request for examination has been filed
V2 Lapsed due to non-payment of the last due maintenance fee for the patent application