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IT8222292A0 - Dispositivo per la rivelazione di radiazioni e dispositivo semiconduttore per l'impiego in tale dispositivo. - Google Patents

Dispositivo per la rivelazione di radiazioni e dispositivo semiconduttore per l'impiego in tale dispositivo.

Info

Publication number
IT8222292A0
IT8222292A0 IT8222292A IT2229282A IT8222292A0 IT 8222292 A0 IT8222292 A0 IT 8222292A0 IT 8222292 A IT8222292 A IT 8222292A IT 2229282 A IT2229282 A IT 2229282A IT 8222292 A0 IT8222292 A0 IT 8222292A0
Authority
IT
Italy
Prior art keywords
radiation detection
semiconductor
semiconductor device
detection device
radiation
Prior art date
Application number
IT8222292A
Other languages
English (en)
Other versions
IT1151909B (it
Inventor
Arthur Marie Eugen Hoeberechts
Gerard Eduard Van Rosmalen
Original Assignee
Philips Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Philips Nv filed Critical Philips Nv
Publication of IT8222292A0 publication Critical patent/IT8222292A0/it
Application granted granted Critical
Publication of IT1151909B publication Critical patent/IT1151909B/it

Links

Classifications

    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04WWIRELESS COMMUNICATION NETWORKS
    • H04W64/00Locating users or terminals or network equipment for network management purposes, e.g. mobility management
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10Integrated devices
    • H10F39/12Image sensors
    • H10F39/18Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00Constructional details of devices covered by this subclass
    • H10F77/10Semiconductor bodies
    • H10F77/14Shape of semiconductor bodies; Shapes, relative sizes or dispositions of semiconductor regions within semiconductor bodies
    • H10F77/148Shapes of potential barriers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00Constructional details of devices covered by this subclass
    • H10F77/95Circuit arrangements
    • H10F77/953Circuit arrangements for devices having potential barriers
    • H10F77/957Circuit arrangements for devices having potential barriers for position-sensitive photodetectors, e.g. lateral-effect photodiodes or quadrant photodiodes
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04WWIRELESS COMMUNICATION NETWORKS
    • H04W36/00Hand-off or reselection arrangements
    • H04W36/04Reselecting a cell layer in multi-layered cells
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Measurement Of Radiation (AREA)
  • Light Receiving Elements (AREA)
  • Automatic Focus Adjustment (AREA)
  • Solid State Image Pick-Up Elements (AREA)
IT22292/82A 1981-07-10 1982-07-07 Dispositivo per la rivelazione di radiazioni e dispositivo semiconduttore per l'impiego in tale dispositivo IT1151909B (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
NLAANVRAGE8103304,A NL187374C (nl) 1981-07-10 1981-07-10 Inrichting voor het detecteren van straling.

Publications (2)

Publication Number Publication Date
IT8222292A0 true IT8222292A0 (it) 1982-07-07
IT1151909B IT1151909B (it) 1986-12-24

Family

ID=19837773

Family Applications (1)

Application Number Title Priority Date Filing Date
IT22292/82A IT1151909B (it) 1981-07-10 1982-07-07 Dispositivo per la rivelazione di radiazioni e dispositivo semiconduttore per l'impiego in tale dispositivo

Country Status (11)

Country Link
US (1) US4469945A (it)
JP (1) JPS5817665A (it)
AU (1) AU549417B2 (it)
CA (1) CA1194195A (it)
DE (1) DE3225372A1 (it)
ES (1) ES513803A0 (it)
FR (1) FR2509531A1 (it)
GB (1) GB2102201B (it)
IE (1) IE53710B1 (it)
IT (1) IT1151909B (it)
NL (1) NL187374C (it)

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JPS60145563A (ja) * 1984-01-05 1985-08-01 Matsushita Electric Ind Co Ltd ビデオデイスクプレ−ヤ
JPS60185230A (ja) * 1984-03-02 1985-09-20 Pioneer Electronic Corp 焦点誤差検出装置
WO1986003058A1 (en) * 1984-11-13 1986-05-22 Eastman Kodak Company A solid state light sensing device
KR870001302B1 (ko) * 1984-11-20 1987-07-11 대우중공업 주식회사 CO_2레이저 빔 프로파일(Laser Beam Profile) 측정장치
NL8501489A (nl) * 1985-05-24 1986-12-16 Philips Nv Positie-gevoelige stralingsdetector.
US4703168A (en) * 1985-07-22 1987-10-27 Princeton Applied Research Corporation Multiplexed wedge anode detector
NL8601719A (nl) * 1986-07-02 1988-02-01 Philips Nv Electronisch instelbare positiegevoelige stralingsdetector, focusfoutdetectiestelsel voorzien van een dergelijke stralingsdetector, en optische lees- en/of schrijfinrichting voorzien van een dergelijk focusfoutdetectiestelsel.
US4871914A (en) * 1987-05-05 1989-10-03 Sun Nuclear Corporation Low-cost radon detector
US5479018A (en) * 1989-05-08 1995-12-26 Westinghouse Electric Corp. Back surface illuminated infrared detector
NL8901400A (nl) * 1989-06-02 1991-01-02 Philips Nv Halfgeleiderinrichting met een stralingsgevoelig element.
IL96623A0 (en) * 1989-12-26 1991-09-16 Gen Electric Low capacitance,large area semiconductor photodetector and photodetector system
US5475618A (en) * 1993-01-28 1995-12-12 Advanced Micro Devices Apparatus and method for monitoring and controlling an ion implant device
US6046454A (en) * 1995-10-13 2000-04-04 Digirad Corporation Semiconductor radiation detector with enhanced charge collection
US5834628A (en) * 1995-11-09 1998-11-10 Consultec Scientific, Inc. Activity weighted particle size distribution system
DE102006013461B3 (de) * 2006-03-23 2007-11-15 Prüftechnik Dieter Busch AG Photodetektoranordnung, Messanordnung mit einer Photodetektoranordnung und Verfahren zum Betrieb einer Messanordnung
DE102006013460B3 (de) * 2006-03-23 2007-11-08 Prüftechnik Dieter Busch AG Photodetektoranordnung, Messanordnung mit einer Photodetektoranordnung und Verfahren zum Betrieb einer Messanordnung
US8143584B2 (en) * 2008-02-04 2012-03-27 Radon Technologies, Inc. Radon monitor
EP3029485B1 (en) 2011-02-15 2019-12-11 Basf Se Detector for optically detecting at least one object
US9001029B2 (en) 2011-02-15 2015-04-07 Basf Se Detector for optically detecting at least one object
US9040929B2 (en) 2012-07-30 2015-05-26 International Business Machines Corporation Charge sensors using inverted lateral bipolar junction transistors
JP6415447B2 (ja) 2012-12-19 2018-10-31 ビーエーエスエフ ソシエタス・ヨーロピアBasf Se 1つ以上の物体を光学的に検出するための検出器
US9741954B2 (en) 2013-06-13 2017-08-22 Basf Se Optical detector and method for manufacturing the same
CN105452894B (zh) 2013-06-13 2019-04-30 巴斯夫欧洲公司 用于光学地检测至少一个对象的检测器
EP3008421A1 (en) 2013-06-13 2016-04-20 Basf Se Detector for optically detecting an orientation of at least one object
CN105637382B (zh) 2013-08-19 2017-08-25 巴斯夫欧洲公司 用于确定至少一种物体的位置的检测器
JP6403776B2 (ja) 2013-08-19 2018-10-10 ビーエーエスエフ ソシエタス・ヨーロピアBasf Se 光学検出器
KR102397527B1 (ko) 2014-07-08 2022-05-13 바스프 에스이 하나 이상의 물체의 위치를 결정하기 위한 검출기
KR102452393B1 (ko) 2014-09-29 2022-10-11 바스프 에스이 적어도 하나의 물체의 포지션을 광학적으로 결정하기 위한 방법 및 검출기 및 이를 이용한 휴먼 머신 인터페이스, 엔터테인먼트 장치, 추적 시스템, 스캐닝 시스템, 입체 시스템 및 카메라
KR102497704B1 (ko) 2014-12-09 2023-02-09 바스프 에스이 광 검출기
EP3251152B1 (en) 2015-01-30 2023-08-16 Trinamix GmbH Detector for an optical detection of at least one object
WO2016146725A1 (en) 2015-03-17 2016-09-22 Basf Se Optical data reader
EP3325917B1 (en) 2015-07-17 2020-02-26 trinamiX GmbH Detector for optically detecting at least one object
CN108141579B (zh) 2015-09-14 2020-06-12 特里纳米克斯股份有限公司 3d相机
JP2019502905A (ja) 2015-11-25 2019-01-31 トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング 少なくとも1個の物体を光学的に検出する検出器
WO2017089553A1 (en) 2015-11-25 2017-06-01 Trinamix Gmbh Detector for optically detecting at least one object
EP3440707A1 (en) 2016-04-06 2019-02-13 trinamiX GmbH Detector for optically detecting at least one object
US20210223395A1 (en) 2016-04-28 2021-07-22 Trinamix Gmbh Detector for optically detecting at least one object
JP2019515288A (ja) 2016-04-28 2019-06-06 トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング 少なくとも1個の対象物を光学的に検出するための検出器
KR102492134B1 (ko) 2016-07-29 2023-01-27 트리나미엑스 게엠베하 광학 센서 및 광학적 검출용 검출기
JP2019532517A (ja) 2016-10-25 2019-11-07 トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング 光学的に検出するための光検出器
CN109891265B (zh) 2016-10-25 2023-12-01 特里纳米克斯股份有限公司 用于光学检测至少一个对象的检测器
CN109964144B (zh) 2016-11-17 2023-07-18 特里纳米克斯股份有限公司 用于光学探测至少一个对象的检测器
US11860292B2 (en) 2016-11-17 2024-01-02 Trinamix Gmbh Detector and methods for authenticating at least one object
WO2018096083A1 (en) 2016-11-25 2018-05-31 Trinamix Gmbh Optical detector comprising at least one optical waveguide
WO2018167215A1 (en) 2017-03-16 2018-09-20 Trinamix Gmbh Detector for optically detecting at least one object
WO2018193045A1 (en) 2017-04-20 2018-10-25 Trinamix Gmbh Optical detector
CN110998223B (zh) 2017-06-26 2021-10-29 特里纳米克斯股份有限公司 用于确定至少一个对像的位置的检测器
WO2019011803A1 (en) 2017-07-10 2019-01-17 Trinamix Gmbh DETECTOR FOR OPTICALLY DETECTING AT LEAST ONE OBJECT
WO2019042956A1 (en) 2017-08-28 2019-03-07 Trinamix Gmbh DETECTOR FOR DETERMINING A POSITION OF AT LEAST ONE OBJECT
EP3676630B1 (en) 2017-08-28 2022-11-30 trinamiX GmbH Range finder for determining at least one geometric information

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2271590B1 (it) * 1974-01-15 1978-12-01 Thomson Brandt
NL7803969A (nl) * 1978-04-14 1979-10-16 Philips Nv Opto-elektronisch fokusfout-detektiestelsel.
JPS54162989A (en) * 1978-06-15 1979-12-25 Sony Corp Solid-state pickup unit
US4228354A (en) * 1979-07-13 1980-10-14 Ari Lehto Method for detecting radiation
DE2939518A1 (de) * 1979-09-28 1981-04-16 Siemens AG, 1000 Berlin und 8000 München Monolithisch integrierte schaltung zur zeilenweisen bildabtastung
US4360732A (en) * 1980-06-16 1982-11-23 Texas Instruments Incorporated Infrared charge transfer device (CTD) system

Also Published As

Publication number Publication date
GB2102201B (en) 1985-03-06
AU549417B2 (en) 1986-01-23
NL187374B (nl) 1991-04-02
IE53710B1 (en) 1989-01-18
FR2509531A1 (fr) 1983-01-14
DE3225372A1 (de) 1983-02-17
ES8308451A1 (es) 1983-08-16
NL8103304A (nl) 1983-02-01
CA1194195A (en) 1985-09-24
GB2102201A (en) 1983-01-26
FR2509531B1 (it) 1985-05-17
IE821637L (en) 1983-01-10
AU8569082A (en) 1983-01-13
NL187374C (nl) 1991-09-02
DE3225372C2 (it) 1991-12-19
IT1151909B (it) 1986-12-24
US4469945A (en) 1984-09-04
ES513803A0 (es) 1983-08-16
JPH037148B2 (it) 1991-01-31
JPS5817665A (ja) 1983-02-01

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