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MX2024001198A - Dispositivo de prueba y metodo de prueba. - Google Patents

Dispositivo de prueba y metodo de prueba.

Info

Publication number
MX2024001198A
MX2024001198A MX2024001198A MX2024001198A MX2024001198A MX 2024001198 A MX2024001198 A MX 2024001198A MX 2024001198 A MX2024001198 A MX 2024001198A MX 2024001198 A MX2024001198 A MX 2024001198A MX 2024001198 A MX2024001198 A MX 2024001198A
Authority
MX
Mexico
Prior art keywords
testing
illumination device
image acquisition
light sources
relates
Prior art date
Application number
MX2024001198A
Other languages
English (en)
Inventor
Marc Flemming
Hannes Scheibe
Dominik Wiedemann
Alexander Friedl
Daniel Schoebel
Original Assignee
Zeiss Carl Vision Int Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Zeiss Carl Vision Int Gmbh filed Critical Zeiss Carl Vision Int Gmbh
Publication of MX2024001198A publication Critical patent/MX2024001198A/es

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0207—Details of measuring devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0257—Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0257—Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested
    • G01M11/0264—Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested by using targets or reference patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0278—Detecting defects of the object to be tested, e.g. scratches or dust
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8829—Shadow projection or structured background, e.g. for deflectometry
    • G01N2021/8832—Structured background, e.g. for transparent objects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8835—Adjustable illumination, e.g. software adjustable screen
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G01N2021/9583—Lenses

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Geometry (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Eye Examination Apparatus (AREA)

Abstract

La invención se refiere a un dispositivo de prueba (1) para detectar defectos en muestras de prueba transparentes (5), en particular en lentes oftalmológicas, con un dispositivo de iluminación (2) para transiluminar las muestras de prueba (5) a examinar y con un dispositivo de adquisición de imágenes (3) para obtener imágenes de la muestra de prueba (5) transiluminada por el dispositivo de iluminación (2). El dispositivo de iluminación (2) comprende una pluralidad de fuentes de luz (8) ajustables linealmente para generar un patrón de franjas (7). Para capturar el patrón de franjas (7), la duración de adquisición del dispositivo de adquisición de imágenes (3) se puede ajustar de tal manera que la luz emitida por cada una de las fuentes de luz (8) se detecte como una franja clara (19.1). Asimismo, la invención se refiere a un método de prueba para detectar un defecto en una muestra transparente.
MX2024001198A 2022-02-16 2023-02-13 Dispositivo de prueba y metodo de prueba. MX2024001198A (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP22157064.1A EP4231001A1 (en) 2022-02-16 2022-02-16 Testing device and testing method
PCT/EP2023/053464 WO2023156329A1 (en) 2022-02-16 2023-02-13 Testing device and testing method

Publications (1)

Publication Number Publication Date
MX2024001198A true MX2024001198A (es) 2024-02-12

Family

ID=80682236

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2024001198A MX2024001198A (es) 2022-02-16 2023-02-13 Dispositivo de prueba y metodo de prueba.

Country Status (5)

Country Link
US (1) US11885751B2 (es)
EP (2) EP4231001A1 (es)
CN (1) CN117677838B (es)
MX (1) MX2024001198A (es)
WO (1) WO2023156329A1 (es)

Family Cites Families (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5766345A (en) * 1980-10-09 1982-04-22 Hitachi Ltd Inspection device for defect
DE3237511A1 (de) * 1982-10-09 1984-04-12 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V., 8000 München Verfahren zur pruefung von glaserzeugnissen
JPS60119404A (ja) * 1983-12-01 1985-06-26 Nippon Sheet Glass Co Ltd 板ガラスの歪検査装置
DE3620108A1 (de) * 1986-06-14 1987-12-17 Zeiss Carl Fa Vorrichtung zum beleuchten von bauteilen aus transparentem material bei der fehlerpruefung
EP0344617B1 (en) * 1988-05-30 1995-08-02 Kabushiki Kaisha Kirin Techno System Method and apparatus for inspecting sidewalls of bottles
DE4003699A1 (de) * 1990-02-07 1991-08-22 Wild Heerbrugg Ag Verfahren und anordnung zur pruefung optischer komponenten oder systeme
NZ250042A (en) 1992-12-21 1997-01-29 Johnson & Johnson Vision Prod Robotic inspection of ophthalmic lenses
JP3185599B2 (ja) * 1995-04-17 2001-07-11 日産自動車株式会社 表面欠陥検査装置
JP3736080B2 (ja) * 1997-11-12 2006-01-18 旭硝子株式会社 透視歪の測定方法及び装置
EP1248092B1 (en) 2001-03-09 2010-09-15 Novartis AG Lens inspection
DE102004014532B3 (de) * 2004-03-23 2005-03-03 Koenig & Bauer Ag Optisches System zur Erzeugung eines beleuchteten Gebildes
EP1605241A1 (fr) 2004-06-09 2005-12-14 Automation & Robotics Appareil pour le controle des pièces transparentes ou réflechissantes
JP4613086B2 (ja) * 2005-03-25 2011-01-12 倉敷紡績株式会社 欠陥検査装置
WO2008100683A1 (en) * 2007-02-16 2008-08-21 3M Innovative Properties Company Method and apparatus for illuminating material for automated inspection
US8736677B2 (en) * 2008-08-07 2014-05-27 Kde Corporation Inspection system
DE102008064104B4 (de) * 2008-12-19 2014-06-18 Aimess Services Gmbh Vorrichtung und Verfahren zum dreidimensionalen optischen Vermessen von stark reflektierenden oder durchsichtigen Objekten
US8976250B2 (en) * 2012-05-01 2015-03-10 Apple Inc. Lens inspection system
CN102937425B (zh) * 2012-10-18 2015-04-29 北京航空航天大学 一种基于高动态条纹投射器的强反射表面三维形貌测量系统
FR3016699B1 (fr) * 2014-01-22 2016-02-12 Msc & Sgcc Procede et dispositif pour la detection notamment de defauts refractants
JP6316068B2 (ja) * 2014-03-31 2018-04-25 国立大学法人 東京大学 検査システムおよび検査方法
CN105067639B (zh) * 2015-07-20 2018-03-27 丹阳市精通眼镜技术创新服务中心有限公司 一种光栅调制的镜片疵病自动检测装置和方法
EP3588048A1 (en) * 2018-06-21 2020-01-01 Essilor International (Compagnie Generale D'optique) Method for detecting a defect in a zone of interest of an optical lens
GB2598283A (en) * 2020-07-07 2022-03-02 Eyoto Group Ltd Method and apparatus for inspecting the surface of a transparent object
US11226293B1 (en) * 2020-08-07 2022-01-18 Seagate Technology Llc Structured illumination optical inspection platform for transparent materials
CN113567342A (zh) * 2021-08-20 2021-10-29 安徽顺鼎阿泰克科技有限公司 透明物缺陷检测方法及装置

Also Published As

Publication number Publication date
US20240003829A1 (en) 2024-01-04
EP4288767B1 (en) 2024-08-21
WO2023156329A1 (en) 2023-08-24
EP4231001A1 (en) 2023-08-23
US11885751B2 (en) 2024-01-30
EP4288767A1 (en) 2023-12-13
CN117677838A (zh) 2024-03-08
CN117677838B (zh) 2025-07-08

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