KR970052554A - Wafer protective film coating equipment - Google Patents
Wafer protective film coating equipment Download PDFInfo
- Publication number
- KR970052554A KR970052554A KR1019950046843A KR19950046843A KR970052554A KR 970052554 A KR970052554 A KR 970052554A KR 1019950046843 A KR1019950046843 A KR 1019950046843A KR 19950046843 A KR19950046843 A KR 19950046843A KR 970052554 A KR970052554 A KR 970052554A
- Authority
- KR
- South Korea
- Prior art keywords
- filter
- purge
- pressure
- pipe
- needle valve
- Prior art date
Links
- 230000001681 protective effect Effects 0.000 title claims abstract description 7
- 239000007888 film coating Substances 0.000 title claims abstract description 6
- 238000009501 film coating Methods 0.000 title claims abstract description 6
- 238000010926 purge Methods 0.000 claims abstract 9
- 238000000034 method Methods 0.000 claims 3
- 235000012431 wafers Nutrition 0.000 claims 3
- 239000006227 byproduct Substances 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67253—Process monitoring, e.g. flow or thickness monitoring
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
Abstract
본 발명은 웨이퍼의 표면에 보호막을 도포하는 웨이퍼의 보호막 도포장비에 관한 것으로써, 좀더 구체적으로는 써셉터(Susceptor)에 웨이퍼를 로딩하거나, 언로딩할 때 이들의 접촉에 따라 이물질이 발생되는 것을 미연에 방지함과 동시에 배기라인에 퇴적되는 부산물을 제거할 수 있도록 한 것이다.The present invention relates to a protective film coating equipment of a wafer for applying a protective film on the surface of the wafer, and more specifically, that foreign matters are generated when the wafer is loaded or unloaded in a susceptor. In addition to preventing in advance, it is possible to remove by-products deposited on the exhaust line.
이를 위해, 배기관(6)과 N2관(5)을 퍼지시키기 위해 본체(1)의 외부로부터 인입되어 각N2관에 설치된 필터(12)의 전방으로 연결되는 N2퍼지관(18)과, 상기 본체의 외부에 위치된 N2퍼지관상에 설치되는 압력조정기(20) 및 압력게이지(21) 그리고 필터(22)와, 상기 N2퍼지관의 연결부위에 설치되어 N2가스의 취입을 제어하는 수동밸브(23)와, 상기 각 배기관 및 N2퍼지관에 설치된 필터의 전방으로 설치되는 니이들밸브(24)(26)와, 상기 필터와 니이들밸브사이에 설치되어 니이들밸브의 조작에 따른 각 반응실의 배기압력 및 N2가스의 공급압력을 나타내는 압력센서(25)(27)로 구성하여서 된 것이다.To this end, the N 2 purge pipe 18 which is introduced from the outside of the main body 1 and connected to the front of the filter 12 installed in each N 2 pipe to purge the exhaust pipe 6 and the N 2 pipe 5 and , and the pressure regulator 20 and a pressure gauge 21 and filter 22 are installed on the N 2 purge tubular positioned in the outside of the body, is installed in the connection portion of the N 2 purge tube for the acceptance of the N 2 gas A manual valve 23 for controlling, needle valves 24 and 26 installed in front of the filters installed in the exhaust pipes and the N 2 purge pipes, and between the filter and the needle valves, the hayeoseo will consist of pressure sensors (25, 27) representing the supply pressure of the exhaust pressure and the N 2 gas in each reaction chamber in accordance with the operation.
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음Since this is an open matter, no full text was included.
제2도는 본 발명이 적용된 웨이퍼의 보호막 도포장비를 나타낸 구성도.2 is a block diagram showing a protective film coating equipment of the wafer to which the present invention is applied.
Claims (4)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019950046843A KR0166855B1 (en) | 1995-12-05 | 1995-12-05 | Wafer protective film coating equipment |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1019950046843A KR0166855B1 (en) | 1995-12-05 | 1995-12-05 | Wafer protective film coating equipment |
Publications (2)
Publication Number | Publication Date |
---|---|
KR970052554A true KR970052554A (en) | 1997-07-29 |
KR0166855B1 KR0166855B1 (en) | 1999-02-01 |
Family
ID=19437884
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019950046843A KR0166855B1 (en) | 1995-12-05 | 1995-12-05 | Wafer protective film coating equipment |
Country Status (1)
Country | Link |
---|---|
KR (1) | KR0166855B1 (en) |
-
1995
- 1995-12-05 KR KR1019950046843A patent/KR0166855B1/en not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR0166855B1 (en) | 1999-02-01 |
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PA0109 | Patent application |
Patent event code: PA01091R01D Comment text: Patent Application Patent event date: 19951205 |
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